CN107223257B - Test method, test server and test system - Google Patents
Test method, test server and test system Download PDFInfo
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- CN107223257B CN107223257B CN201780000294.XA CN201780000294A CN107223257B CN 107223257 B CN107223257 B CN 107223257B CN 201780000294 A CN201780000294 A CN 201780000294A CN 107223257 B CN107223257 B CN 107223257B
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/96—Management of image or video recognition tasks
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/98—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns
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- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/98—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns
- G06V10/987—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns with the intervention of an operator
Abstract
The embodiment of the invention provides a test method, a test server and a test system, which are characterized in that whether a current test failure event can be matched with a pre-stored historical test failure event is determined, and when the pre-stored historical test failure event is matched, a solution adopted for solving the historical test failure event in the early stage is utilized to retest a current test item, so that manual analysis can be greatly reduced or avoided, and the aim of improving the test efficiency can be fulfilled. In addition, when it is determined that there is no historical test failure event matching the current test failure event, a solution of manual analysis can also be obtained to further ensure the test passing rate.
Description
Technical Field
The invention belongs to the technical field of testing, and particularly relates to a testing method, a testing server and a testing system.
Background
Electronic products such as fingerprint class device need carry out the volume production test of functional indicator before batch production, screens the product through the test, and the product quality is strictly guaranteed, ensures to reach market volume production requirement.
Currently, mass production tests generally adopt the following steps for detection: the production line platform carries out related test item detection after being brought into the test tool, and the functional test can be regarded as passing after all the test items pass.
However, in the conventional mass production test process, once any test item has a problem in the functional test, the test tool exits the test, which is regarded as a defective product, waits for professional technical analysis of a technician and modifies the test technical scheme, but the analysis and the modification of the technical scheme depend on the progress of manual analysis, thereby causing a problem of low test efficiency.
Disclosure of Invention
The embodiment of the invention aims to provide a test method, a test server and a test system, which are used for solving the technical problems in the prior art.
A first aspect of an embodiment of the present invention provides a test method, including: matching a current test failure event generated when the current test item fails to test according to the current test scheme with a pre-stored historical test failure event;
when a historical test failure event matched with the current test failure event exists, determining a solution corresponding to the historical test failure event, and testing the current test item again according to the solution.
Optionally, the matching, according to the current test scheme, the current test failure event generated when the test item fails to test and a pre-stored historical test failure event includes: and matching the current test log information corresponding to the current test failure event with the pre-stored historical test log information corresponding to the historical test failure event.
Optionally, the current test log information includes current test input data and current test output data of a current test scheme executed on the current test item, and the historical test log information includes historical test input data and historical test output data of a historical test scheme executed on the historical test item;
wherein, the matching according to the current test log information corresponding to the current test failure event and the pre-stored historical test log information corresponding to the historical test failure event comprises:
and respectively matching the current test input data and the current test output data of the current test failure event with the pre-stored historical test input data and historical test output data.
Optionally, the method further comprises: analyzing the current test log information according to a set data communication protocol to extract key characteristic data from the current test log information;
wherein, respectively matching the current test input data and the current test output data of the current test failure event with the pre-stored historical test input data and the pre-stored historical test output data comprises:
and respectively matching the current test key process data of the current test failure event with the pre-stored historical test key process data of the historical test failure event.
Optionally, analyzing the current log information according to a set data communication protocol to extract key feature data therefrom includes:
splitting and extracting the current log information according to a set data communication protocol to obtain a mark part and a data part; the marking part is used for identifying different current test items, and the data part is used for recording current test input data, current test output data and current test key process data.
Optionally, the determining a solution to the historical test failure event, so as to retest the current test item according to the solution includes:
and determining a solution corresponding to the historical test failure event according to the corresponding relation between the pre-stored historical test failure event and the adapted solution, so as to retest the current test item according to the solution.
Optionally, the determining, according to a pre-stored correspondence between the historical test failure event and the adapted solution, a solution to the historical test failure event includes:
and determining a solution for the historical test failure event according to a pre-stored mapping information table of the historical test failure event and the adapted solution, wherein the mapping information table is used for indicating the corresponding relation between the historical test failure event and the solution.
Optionally, the mapping information table maps one or more cases, which associate event type attributes and/or data characteristic values of the historical test failure events and corresponding solutions.
Optionally, the method further comprises:
and taking the current test failure event as a new historical test failure event so as to update the corresponding relation between the historical test failure event and the adaptive solution.
Optionally, the method further comprises:
and when no historical test failure event matched with the current test failure event exists, acquiring a solution for dealing with the current test failure event according to manual analysis of the current test failure event so as to retest the test item.
Optionally, the method further comprises:
and when the historical test failure event matched with the current test failure event does not exist, marking the current test failure event.
Optionally, obtaining a solution to the current test failure event according to the manual analysis of the current test failure event to retest the test item includes:
and manually analyzing a plurality of current test failure events of the same type in a plurality of projects to obtain a solution for dealing with the current test failure events.
Optionally, the method further comprises:
and taking the current test failure event as a new historical test failure event, and taking the solution which is acquired through the manual analysis and corresponds to the current test failure event as a new solution so as to update the corresponding relation between the historical test failure event and the adaptive solution.
Optionally, the method further comprises:
acquiring the occurrence frequency of the historical test failure events, determining whether the historical test failure events need to be manually analyzed according to the occurrence frequency, and when the historical test failure events need to be manually analyzed, taking the solutions which are acquired through the manual analysis and deal with the historical test failure events as new solutions so as to update the corresponding relation between the historical test failure events and the adapted solutions.
A second aspect of an embodiment of the present invention provides a test server, including:
the matching module is used for matching a current test failure event generated when the current test item fails to test according to the current test scheme with a pre-stored historical test failure event, and triggering the determining module when the historical test failure event matched with the current test failure event exists;
the determining module is configured to determine a solution corresponding to the historical test failure event, so as to retest the current test item according to the solution.
Optionally, the matching module is further configured to match, according to current test log information corresponding to the current test failure event and pre-stored historical test log information corresponding to the historical test failure event.
Optionally, the test server further includes: the storage module is used for storing the corresponding relation between the historical test failure events and the adaptive solutions;
optionally, the determining module is further configured to determine a solution to the historical test failure event according to a correspondence between the historical test failure event stored in advance in the storage module and the adapted solution, so as to retest the current test item according to the solution.
Optionally, the test server further includes: and the updating module is used for taking the current test failure event as a new historical test failure event so as to update the corresponding relation between the historical test failure event in the storage module and the adaptive solution.
Optionally, when there is no historical test failure event matching the current test failure event in the matching module, triggering the obtaining module; the acquisition module is used for acquiring a solution for the current test failure event according to the manual analysis of the current test failure event so as to retest the test items.
A third aspect of an embodiment of the present invention provides a test system, including: a test tool and a test server;
the testing tool is used for testing the current testing item again according to the solution;
the test server is used for matching a current test failure event generated when the current test item fails to test according to the current test scheme with a pre-stored historical test failure event, and determining a solution corresponding to the historical test failure event when the historical test failure event matched with the current test failure event exists, so that the test tool can test the current test item again according to the solution.
Optionally, the test system further comprises: and the technical support end is used for acquiring a solution for dealing with the current test failure event according to manual analysis of the current test failure event so as to retest the test item when the test server does not have a historical test failure event matched with the current test failure event.
According to the test method, the test server and the test system provided by the embodiment of the invention, whether the current test failure event can be matched with the pre-stored historical test failure event is determined, and when the pre-stored historical test failure event is matched, the current test item is retested by using the solution adopted for solving the historical test failure event in the earlier stage, so that manual analysis can be greatly reduced or avoided, and the aim of improving the test efficiency can be further achieved. In addition, when it is determined that there is no historical test failure event matching the current test failure event, a solution of manual analysis can also be obtained to further ensure the test passing rate.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without inventive exercise.
Fig. 1 is a flowchart of a testing method according to an embodiment of the present invention.
Fig. 2 is a flowchart of a testing method according to another embodiment of the present invention.
Fig. 3 is a flowchart of a testing method according to another embodiment of the present invention.
Fig. 4 is a flowchart of a testing method according to still another embodiment of the invention.
Fig. 5 is a schematic structural diagram of a test server according to an embodiment of the present invention.
Fig. 6 is a schematic structural diagram of a test system according to an embodiment of the present invention.
Fig. 7 is a diagram illustrating an exemplary data structure that satisfies a data communication protocol according to an embodiment of the present invention.
Detailed Description
In order to make the objects, features and advantages of the present invention more obvious and understandable, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The execution main body of the testing method provided by the following embodiments of the present invention may be the testing server 1, and the testing server 1 performs data interaction with the testing tool 2 at the production line end, so that the testing tool 2 at the production line end performs a retest on the current testing item in which the current testing failure event occurs. The test server 1 may also perform data interaction with the technical support end 3, so that the test tool 2 at the production line end retests the current test item in which the current test failure event occurs.
For example, the test solution applied by the test tool 2 to the test object is stored in the test server 1, and after the test solution is injected into the test tool 2 through the test server 1, the test tool 2 performs the test work on the test object. In addition, the technical support end 3 can upload a new test scheme to the test server 1 to update the stored test scheme, so that the requirement that the test scheme needs to be adjusted according to the production condition in actual production can be met, and a better test effect is achieved.
Specifically, the test procedure for performing one test item is as follows: in a test system including a test server 1, a test tool 2 at a production line end verifies performance, functions, and the like of a test object (such as a fingerprint device) by implementing a test scheme on the test object, wherein the test scheme specifies a test standard of each test item, and in a test process for a certain test item, if a test result does not meet the test standard in the test scheme, the test item fails to be tested, otherwise, the test item succeeds to be tested. For example, the test solution is injected into the test tool 2, then the test tool 2 tests the test object item by item according to the test standard in the test solution, if a certain test item is tested, the test fails without passing, at this time, the test tool 2 will suspend the test operation until a new test solution is injected into the test tool 2, and then the test tool 2 tests the test object again according to the new test solution.
When the test server 1 has a test scheme for dealing with the current test failure event, the test scheme for dealing with the current test failure event is directly obtained from the test server 1. When the test server 1 does not have a test scheme for dealing with the current test failure event and if the test is to be continued, the test server 1 packages the current test failure event and sends the current test failure event to the technical support end 3, technicians of the technical support end 3 manually analyze the current test failure event and provide a corresponding solution to return to the test server 1, then the test server 1 generates a new test scheme according to the new solution and injects the new test scheme into the test tool 2, and then the test tool 2 retests the failed test item according to the new test scheme.
Fig. 1 is a flowchart of a testing method according to an embodiment of the present invention. As shown in fig. 1, the testing method provided in this embodiment includes:
step S101, matching a current test failure event generated when the current test item fails to test with a pre-stored historical test failure event according to the current test scheme.
In this embodiment, in the test process of the test object mass production stage, a plurality of test objects may have diversified test failure events, some of the diversified test failure events may be historical test failure events that have occurred, and others may be test failure events that occur for the first time. Therefore, in this embodiment, the test server 1 stores the test failure events encountered in the test process to form historical test failure events, and when the same test failure event occurs again, if the historical test failure event can be matched, it is indicated that the test server 1 has a solution capable of processing the current test failure event, and the solution can be directly obtained from the test server 1, thereby achieving the purpose of improving the test efficiency.
In one possible implementation, any one or more of test input data, test output data, test process data, and the like in the test process are recorded by the test log information. The specific implementation manner of step S101 may be that, according to matching between current test log information corresponding to the current test failure event and pre-stored historical test log information corresponding to the historical test failure event, it is determined whether a solution for dealing with the current test failure event exists on the test server 1. When the current test log information includes test input data and test output data, in a further possible implementation manner, the specific implementation manner of step S101 may be to match the current test input data and the current test output data of the current test failure event with the pre-stored historical test input data and the pre-stored historical test output data, respectively.
Specifically, the current test log information includes current test input data and current test output data for executing the current test scenario on the current test item, and the historical test log information includes historical test input data and historical test output data for executing the historical test scenario on the historical test item. And respectively comparing the current test input data and the current test output data in the current test log information with the historical test input data and the historical test output data in the historical test log information, and judging whether a solution for dealing with the current test failure event exists on the test server 1. For example, when data alignment is performed, specifically: the method comprises the steps of firstly determining event type attributes according to data, determining a test item corresponding to a current test failure event through the event type attributes, and determining whether a test failure event occurs in one of test items such as a fingerprint image acquisition time test item, a false acceptance rate test item and a false rejection rate test item, and then determining whether a solution for the current test failure event exists according to data characteristic values. Taking the time test item for collecting fingerprint images of a plurality of test objects at the production line end as an example, although the test schemes are the same, test failure events caused by diversified reasons are likely to exist in the actual test process. For example, if the time for fingerprint contact is not enough, or the fingerprint is not pressed properly, or the number of times for collecting the fingerprint image that has not reached the set value is not enough, the test failure events may occur, and the reasons for these test failure events may be various, such as the test scheme itself is not reasonable, the test object itself has problems, and so on. It should be noted that the event type attribute in this embodiment is a fingerprint image capture time test item, and the data characteristic value refers to the time of fingerprint contact, the fingerprint pressing form, the number of times of fingerprint image capture, and the like. Therefore, in this embodiment, whether the current test failure event matches the historical test failure event is determined through the current test input data and the historical test input data, and whether the current test failure event matches the historical test failure event is determined through the current test output data and the historical test output data, so that the matching accuracy of the current test failure event and the historical test failure event is improved.
In this embodiment, an example of matching a test failure event of a false acceptance rate test item performed on a fingerprint device is specifically described.
False Acceptance Rate (FAR), also called False recognition Rate, refers to the probability of receiving an error by considering different fingerprints as the same fingerprint, which is defined as: FAR ═ number of misjudged fingerprints/total number of examined fingerprints × 100%.
The specific test scheme of the false recognition rate is as follows: the method includes the steps of firstly, importing partial images in an image library into a fingerprint device, then, sequentially comparing the rest other images in the image library with the partial images imported in advance, and if the total comparison times is N times (the total number of fingerprints to be equivalently examined) and the comparison success times is M times (the number of fingerprints to be equivalently judged), then, FAR is M/N multiplied by 100%. If the tested acceptance rate meets the test standard of the current test scheme, the success of the acceptance rate test item test is indicated, otherwise, the test fails.
Specifically, for a current test failure event of the acceptance rate test item, the log information of the current test item may record names of the current test item, such as an acceptance rate test item, all images, partial images, a total comparison number, a comparison success number, FAR, a test result (which refers to a test failure), and the like, where test input data of the current test item is, for example, all images and partial images of the image library, test output data of the current test item is, for example, FAR, a test result (which refers to a test failure), and test process data of the current test item is a total comparison number and a comparison success number.
Correspondingly, for the historical test failure event of the acceptance rate test item, the log information of the historical test item includes names of the test item, such as the acceptance rate test item, all images, partial images, total comparison times, comparison success times, FAR, test results (indicating test failure) and the like, correspondingly, the test input data of the historical test item is, for example, all images and partial images of the image library, the test output data of the historical test item is, for example, FAR, test results (indicating test failure), and the test process data of the historical test item is the total comparison times and the comparison success times.
Therefore, the test input data of the current test item, the output process data of the current test item and the test input data of the historical test item are compared one by one, and further, the test process data of the current test item and the test process data of the historical test item are compared one by one, so that the matching is completed, and whether the historical test failure event matched with the current test failure event exists or not is determined quickly and accurately.
It should be noted that, this embodiment is not limited to matching the test failure events of the acceptance rate test items, and for example, may also include matching the test failure events of the rejection rate test items, which is not described in detail again.
Step S102, when a historical test failure event matched with the current test failure event exists, determining a solution corresponding to the historical test failure event, and testing the current test item again according to the solution.
For example, after the current test failure event matches the historical test failure event, the current test failure event can be processed using the solution employed earlier to resolve the historical test failure event.
Specifically, the current test solution is updated according to the solution adopted in the previous period to solve the historical test failure event to form a new test solution, the new test solution is injected into the test tool 2, and then the test tool 2 retests the failed test item according to the new solution in the new test solution.
It should be noted that, both the stored historical test failure event and the corresponding solution may be stored in the test server 1, and for this reason, the present embodiment may further include: and continuously updating the solution implemented on the test object according to the acquired solution for processing the current test failure event, so that the practicability of the test solution is improved.
According to the testing method provided by the embodiment, whether the current testing failure event can be matched with the pre-stored historical testing failure event is determined, and when the pre-stored historical testing failure event is matched, the current testing item is retested by using the solution adopted for solving the historical testing failure event in the previous period, so that manual analysis can be greatly reduced or avoided, and the purpose of improving the testing efficiency can be further achieved.
Fig. 2 is a flowchart of a testing method according to another embodiment of the present invention. As shown in fig. 2, the test method provided by this embodiment includes:
step S201, analyzing the current test log information according to a set data communication protocol to extract key characteristic data from the current test log information.
In a possible implementation manner, the specific implementation manner of step S201 is to split and extract the current log information according to a set data communication protocol to obtain a tag portion and a data portion, where the tag portion is used to identify different current test items, and the data portion is used to record current test input data, current test output data, and current test key process data.
For example, a data communication protocol of the test log information may be set by itself, and different key feature data may be obtained by identifying different parts in the test log information, where the key feature data includes any one or more of test input data, test output data, and test process data.
Fig. 7 is a diagram illustrating an exemplary data structure that satisfies a data communication protocol according to an embodiment of the present invention. Referring to fig. 7, when a certain item of a test object is tested, the Header part is used as a Header for transmitting basic configuration information, for example, the Header part is used as a marking part for identifying different current test items, the test item is marked in begin when the test is started, the end when the test is completed is marked, the data part in source is used for marking test input data and/or test output data, the info part in source is used for marking test process data, and the source part is used as a data part of the test item. Therefore, by identifying the Header part in the test log information, the type of the current test item can be determined; by identifying a begin part in test log information, a start time node of a certain test item can be obtained; by identifying the end part in the log information of the test, the end time node of a certain test item can be obtained; by identifying the data portion, test input data or test output data for a certain test item can be acquired, and by identifying the info portion tag for a certain test item, test process data for a certain test item can be acquired.
And step S202, matching the current test key characteristic data of the current test failure event with the pre-stored historical test key characteristic data of the historical test failure event respectively.
In this embodiment, since the key feature data may include test input data, test output data, and test process data, for this reason, please refer to the above description for the matching of the feature data, which is not described herein again.
Step S203, when a historical test failure event matched with the current test failure event exists, determining a solution corresponding to the historical test failure event according to a pre-stored corresponding relation between the historical test failure event and the adapted solution, and retesting the current test item according to the solution.
For example, in the embodiment, through the pre-stored corresponding relationship between the historical test failure event and the adapted solution, when it is determined that there is a historical test failure event matching the current test failure event, the corresponding relationship may be queried in ways such as indexing, so as to quickly retrieve a new solution.
In a possible implementation manner, the specific implementation manner of step S203 is to determine a solution to the historical test failure event according to a mapping information table of the pre-stored historical test failure event and the adapted solution, where the mapping information table is used to indicate a corresponding relationship between the historical test failure event and the solution. Specifically, the present embodiment simply and conveniently reflects the correspondence between the historical test failure event and the adapted solution by establishing the mapping information table.
Further, the mapping information table maps one or more cases, which are associated with event type attributes and/or data characteristic values of the historical test failure events and corresponding solutions. For example, the test failure events of the multiple fingerprint image acquisition time test items may be caused by insufficient time for fingerprint contact, but the time for fingerprint contact of the multiple test failure events of the false acceptance rate test items is likely to be different. The case in this embodiment associates the event type attribute and/or the data characteristic value of the test failure event and the corresponding solution, so that more historical test failure events can be stored in the mapping information table as much as possible, the solution can be quickly determined according to the event type attribute and/or the data characteristic value in the test failure event, and the solution can be quickly determined on the basis of ensuring that the mapping information table has a large number of historical test failure events, thereby improving the test efficiency. Of course, the specific situation of the case in this embodiment is set according to the actual requirement.
And step S204, taking the current test failure event as a new historical test failure event so as to update the corresponding relation between the historical test failure event and the adaptive solution.
Specifically, the present embodiment uses the current test failure event as a new historical test failure event to increase the number of stored historical test failure events, so as to improve the probability of successful matching between the current test failure event and the historical test failure event. More and more historical test events can also reflect that a large number of solutions can be provided to deal with different test failure events, and when the test failure events are encountered in the later period, the corresponding solutions can be quickly extracted from the large number of solutions, so that the dependence on manual analysis is further reduced, and a large number of human resources are saved. In addition, by updating the corresponding relation between the historical test failure event and the adaptive solution, which is equivalent to increasing the sample size, the adaptive solution can be further accurately extracted from a large amount of solutions.
According to the test method provided by the embodiment, whether the historical test failure event matched with the current test failure event is stored can be quickly and accurately determined by extracting the test key characteristic data in the test log information; by means of the corresponding relation between the pre-stored historical test failure event and the adaptive solution, when the historical test failure event matched with the current test failure event is determined to exist, the corresponding relation can be inquired in an indexing mode and the like, so that a new solution is quickly retrieved, and the aim of improving the test efficiency is further fulfilled; in addition, the current test failure event is used as a new historical test failure event, so that more and more historical test failure events are stored, and the probability of successful matching of the current test failure event and the historical test failure event is improved.
Fig. 3 is a flowchart of a testing method according to another embodiment of the present invention. In this embodiment, for the embodiments shown in fig. 1 and fig. 2, a failure event of a current test item occurs, but the test server 1 does not have a corresponding solution, but needs to continue testing the current test item. As shown in fig. 3, the testing method provided by this embodiment includes:
step S301, matching the current test failure event generated when the current test item fails to test according to the current test scheme with the pre-stored historical test failure event.
It should be noted that, the implementation manner of step S301 in this embodiment is the same as the implementation manner of step S101 in the foregoing embodiment, and is not described herein again.
Step S302, when there is no historical test failure event matching with the current test failure event, obtaining a solution for the current test failure event according to manual analysis of the current test failure event so as to retest the test item.
Specifically, when the test server 1 does not have a historical test failure event matching the current test failure event, the test server 1 packages test log information corresponding to the current test failure event through a set interface and sends the test log information to the technical support 3, a technician at the technical support 3 performs manual analysis on the current test failure event and provides a corresponding solution to return to the test server 1 through the set interface, then the test server 1 generates a new test scheme according to the new solution and injects the new test scheme into the test tool 2, and then the test tool 2 retests the failed test item according to the new solution in the new test scheme.
The embodiment can also acquire a solution of manual analysis when determining that no historical test failure event matched with the current test failure event exists, so as to further ensure the test passing rate and reliability.
In a possible implementation manner, the specific implementation manner of step S302 is: and when the historical test failure event matched with the current test failure event does not exist, marking the current test failure event. It should be noted that, after step S302 is executed, obtaining a solution to the current test failure event according to the manual analysis of the marked current test failure event can be implemented to retest the test item.
Specifically, by marking the current test failure event as an unresolved test failure event, the technician at the technical support end 3 can be intuitively notified that technical analysis needs to be provided for the current test failure event, so that the time for acquiring a solution through manual analysis can be greatly shortened, and the test efficiency can be further improved.
In another possible implementation manner, the specific implementation manner of step S302 is: and manually analyzing a plurality of current test failure events of the same type in a plurality of projects to obtain a solution for dealing with the current test failure events.
For example, a plurality of production lines, i.e., a plurality of items, of different production addresses are all performing a mass production test on a plurality of test objects, if a plurality of current test failure events of the same type occur, the plurality of current test failure events of the same type are marked as a test failure event of a certain type, the technical support end 3 judges that the plurality of current test failure events are the test failure events of the same type according to the marking, and thus the technical support end 3 can perform manual analysis only once to obtain a solution for dealing with the current test failure events, and does not need to perform manual analysis on each current test failure event of the same type, thereby improving the speed of obtaining the solution for dealing with the current test failure events, and simultaneously saving labor cost. Of course, items in the present embodiment are not limited to the illustration.
According to the test method provided by the embodiment, when it is determined that no historical test failure event matched with the current test failure event exists, a solution of manual analysis can be obtained, so that the test passing rate and reliability are further ensured. In addition, by marking the current test failure event, the time of the solution obtained by manual analysis can be greatly shortened, and the test efficiency is further improved.
Fig. 4 is a flowchart of a testing method according to another embodiment of the present invention. As shown in fig. 4, the test method provided by this embodiment includes:
step S401, matching the current test failure event generated when the current test item fails to test according to the current test scheme with the pre-stored historical test failure event.
Step S402, when there is no historical test failure event matched with the current test failure event, obtaining a solution for dealing with the current test failure event according to manual analysis of the current test failure event so as to retest the test item.
It should be noted that, in this embodiment, the implementation manners of step S401 and step S402 are the same as the implementation manners of step S301 and step S302 in the foregoing embodiment, and are not described herein again.
Step S403, using the current test failure event as a new historical test failure event, and using the solution to the current test failure event obtained through the manual analysis as a new solution, so as to update the corresponding relationship between the historical test failure event and the adapted solution.
Specifically, in this embodiment, whether there is a historical test failure event matching the current test failure event or not, the current test failure event is also used as a new historical test failure event and is stored, so that more and more historical test failure events are stored, and the probability of matching the current test failure event and the historical test failure event is improved.
In this embodiment, on one hand, the pre-stored historical test failure event is continuously updated, and on the other hand, the corresponding relationship between the historical test failure event and the adapted solution, such as the mapping table, is continuously updated, so as to improve the probability of obtaining the solution for processing the current test failure event.
In this embodiment, in step S403, the solution of the historical test failure event may also be optimized or a completely new solution may be provided, and then the corresponding relationship between the historical test failure event and the adapted solution may be further updated; specifically, it may include: acquiring the occurrence frequency of the historical test failure events; determining whether manual analysis needs to be carried out on historical test failure events according to the occurrence frequency; and if the historical test failure event needs to be manually analyzed, taking the solution which is acquired through the manual analysis and corresponds to the historical test failure event as a new solution.
For example, in an actual testing process, a test failure event may be caused by a critical misjudgment condition due to an inappropriate test item threshold set in a test scheme, so that the occurrence frequency of the test failure event is high, and at this time, it is necessary to correct various test item thresholds in the test scheme to avoid the occurrence of the critical misjudgment test failure event as much as possible. In the embodiment, the occurrence frequency of the historical test failure event is acquired from the key feature data corresponding to the current test item, and if the occurrence frequency is judged to be high, the historical test failure event is determined to be manually analyzed to acquire a new solution for dealing with the historical test failure event, and meanwhile, the corresponding relation between the historical test failure event and the adapted solution is updated. The new solution may be an optimization of an existing solution on the test server 1 or a completely new solution provided after manual analysis.
Fig. 5 is a schematic structural diagram of a test server according to an embodiment of the present invention. The server may be implemented in hardware, software, or a combination of hardware and software. As shown in fig. 5, the test server 1 provided in the present embodiment includes: a matching module 11 and a determination module 12.
The matching module 11 is configured to match a current test failure event generated when a current test item fails to be tested according to a current test scheme with a pre-stored historical test failure event, and trigger the determining module 12 when the historical test failure event matching the current test failure event exists.
In a possible implementation manner, the matching module 11 is further configured to match, according to current test log information corresponding to the current test failure event and pre-stored historical test log information corresponding to the historical test failure event.
The determining module 12 is configured to determine a solution corresponding to the historical test failure event, so as to retest the current test item according to the solution.
Further, the test server further includes: the storage module is used for storing the corresponding relation between the historical test failure events and the adaptive solutions;
in a possible implementation manner, the determining module 12 is further configured to determine a solution corresponding to a historical test failure event according to a correspondence between the historical test failure event stored in advance in the storage module and the adapted solution, so as to retest the current test item according to the solution.
Further, the test server further includes: and the updating module is used for taking the current test failure event as a new historical test failure event so as to update the corresponding relation between the historical test failure event in the storage module and the adaptive solution.
Further, when there is no historical test failure event matching the current test failure event in the matching module 11, the obtaining module 13 is triggered; the obtaining module 13 is configured to obtain a solution to the current test failure event according to the manual analysis on the current test failure event so as to retest the test item.
It should be noted that the test server 1 of this embodiment may be configured to execute the technical solution of the foregoing method embodiment, and the implementation principle and the technical effect are similar, which are not described herein again.
The test server provided by this embodiment determines whether the current test failure event can be matched with the pre-stored historical test failure event, and when the pre-stored historical test failure event is matched, the current test item is retested by using the solution adopted in the previous stage to solve the historical test failure event, so that manual analysis can be greatly reduced or avoided, and the purpose of improving test efficiency can be achieved.
Fig. 6 is a schematic structural diagram of a test system according to an embodiment of the present invention. As shown in fig. 6, the test system provided in the embodiment of the present invention includes: the test server 1 and the test tool 2 of any of the above embodiments.
The test server 1 is configured to match a current test failure event generated when a current test item fails to be tested according to a current test scheme with a pre-stored historical test failure event, and determine a solution corresponding to the historical test failure event when the historical test failure event matched with the current test failure event exists, so that the test tool 2 retests the current test item according to the solution.
The testing tool 2 is used for testing the current testing item again according to the solution. For example, a test plan is implemented by the test tool 2 on a test object of the line end. The test scheme of the test tool 2 is injected by the test server 1, if a test failure event is encountered, the test tool 2 uploads the current test failure event to the test tool 2, the test tool 2 matches the pre-stored historical test failure event according to the current test failure event, when the matching is successful, a solution corresponding to the historical test failure event is obtained, then the current test scheme is updated according to the obtained new solution to form a new solution test scheme, the new test scheme is injected into the test tool 2, and then the test tool 2 retests the failed test item according to the new solution in the new test scheme.
Further, the test system further comprises: and the technical support end 3 is configured to, when there is no historical test failure event matching the current test failure event in the test server 1, obtain a solution to the current test failure event according to manual analysis on the current test failure event so as to retest the test item. For example, when there is no historical test failure event matching the current test failure event in the test server 1, the test server 1 packages the current test failure event and sends it to the technical support 3, a technician at the technical support 3 manually analyzes the current test failure event and provides a corresponding solution to return to the test server 1, then the test server 1 generates a new test solution according to the new solution and injects it into the test tool 2, and then the test tool 2 retests the failed test item according to the new solution in the new test solution.
According to the test system provided by the embodiment, whether the current test failure event can be matched with the pre-stored historical test failure event is determined, and when the pre-stored historical test failure event is matched, the current test item is retested by using the solution adopted for solving the historical test failure event in the previous period, so that manual analysis can be greatly reduced or avoided, and the purpose of improving the test efficiency can be further achieved. In addition, when it is determined that there is no historical test failure event matching the current test failure event, a solution of manual analysis can also be obtained to further ensure the test passing rate.
Finally, it should be noted that: the above embodiments are only used for illustrating the technical solutions of the embodiments of the present application, and are not limited thereto; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions in the embodiments of the present application. I.e. can be understood and implemented.
Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware. With this understanding in mind, the above-described technical solutions and/or portions thereof that contribute to the prior art may be embodied in the form of a software product that can be stored on a computer-readable storage medium including instructions for storing or transmitting information in a form readable by a computer (e.g., a computer).
As will be appreciated by one skilled in the art, embodiments of the present invention may be provided as a method, apparatus (device), or computer program product. Accordingly, embodiments of the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, embodiments of the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
Embodiments of the present invention are described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (devices) and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all such alterations and modifications as fall within the scope of the embodiments of the invention. It will be apparent to those skilled in the art that various modifications and variations can be made in the embodiments of the present invention without departing from the spirit or scope of the embodiments of the invention. Thus, if such modifications and variations of the embodiments of the present invention fall within the scope of the claims of the embodiments of the present invention and their equivalents, the embodiments of the present invention are also intended to encompass such modifications and variations.
Claims (18)
1. A method of testing, comprising:
matching a current test failure event generated when the current test item fails to test according to the current test scheme with a pre-stored historical test failure event;
when a historical test failure event matched with the current test failure event exists, determining a solution corresponding to the historical test failure event, and retesting the current test item according to the solution, wherein the method further comprises the following steps:
storing the current test failure event as a new historical test failure event;
updating a correspondence of the historical test failure event with the adapted solution when there is a historical test failure event matching the current test failure event,
and when no historical test failure event matched with the current test failure event exists, taking a solution which is acquired through manual analysis and corresponds to the current test failure event as a new solution so as to update the corresponding relation between the historical test failure event and the adaptive solution.
2. The method of claim 1, wherein matching current test failure events generated when a test item fails to test with pre-stored historical test failure events according to a current test scenario comprises: and matching the current test log information corresponding to the current test failure event with the pre-stored historical test log information corresponding to the historical test failure event.
3. The method of claim 2, wherein the current test log information includes current test input data and current test output data for performing a current test plan on the current test item, and wherein the historical test log information includes historical test input data and historical test output data for performing a historical test plan on the historical test item;
wherein, the matching according to the current test log information corresponding to the current test failure event and the pre-stored historical test log information corresponding to the historical test failure event comprises:
and respectively matching the current test input data and the current test output data of the current test failure event with the pre-stored historical test input data and historical test output data.
4. The method of claim 3, further comprising: analyzing the current test log information according to a set data communication protocol to extract key characteristic data from the current test log information;
wherein, respectively matching the current test input data and the current test output data of the current test failure event with the pre-stored historical test input data and the pre-stored historical test output data comprises:
and respectively matching the current test key process data of the current test failure event with the pre-stored historical test key process data of the historical test failure event.
5. The method of claim 4, wherein analyzing the current log information according to a set data communication protocol to extract key feature data therefrom comprises:
splitting and extracting the current log information according to a set data communication protocol to obtain a mark part and a data part; the marking part is used for identifying different current test items, and the data part is used for recording current test input data, current test output data and current test key process data.
6. The method of claim 1, wherein said determining a solution to handle the historical test failure event to retest the current test item according to the solution comprises:
and determining a solution corresponding to the historical test failure event according to the corresponding relation between the pre-stored historical test failure event and the adapted solution, so as to retest the current test item according to the solution.
7. The method according to claim 6, wherein the determining a solution to the historical test failure event according to the pre-stored correspondence between the historical test failure event and the adapted solution comprises:
and determining a solution for the historical test failure event according to a pre-stored mapping information table of the historical test failure event and the adapted solution, wherein the mapping information table is used for indicating the corresponding relation between the historical test failure event and the solution.
8. The method according to claim 7, wherein the mapping information table maps one or more cases, the cases associating event type attributes and/or data characteristic values of the historical test failure events and corresponding solutions.
9. The method of any one of claims 1 to 8, further comprising:
and when no historical test failure event matched with the current test failure event exists, acquiring a solution for dealing with the current test failure event according to manual analysis of the current test failure event so as to retest the test item.
10. The method of claim 9, further comprising:
and when the historical test failure event matched with the current test failure event does not exist, marking the current test failure event.
11. The method of claim 9, wherein obtaining a solution to the current test failure event from a manual analysis of the current test failure event to retest the test item comprises:
and manually analyzing a plurality of current test failure events of the same type in a plurality of projects to obtain a solution for dealing with the current test failure events.
12. The method of claim 9, further comprising:
acquiring the occurrence frequency of the historical test failure events, determining whether the historical test failure events need to be manually analyzed according to the occurrence frequency, and when the historical test failure events need to be manually analyzed, taking the solutions which are acquired through the manual analysis and deal with the historical test failure events as new solutions so as to update the corresponding relation between the historical test failure events and the adapted solutions.
13. A test server, comprising:
the matching module is used for matching a current test failure event generated when the current test item fails to test according to the current test scheme with a pre-stored historical test failure event, and triggering the determining module when the historical test failure event matched with the current test failure event exists; the determining module is used for determining a solution for dealing with the historical test failure event so as to retest the current test item according to the solution,
the test server further comprises: the storage module is used for storing the corresponding relation between the historical test failure events and the adaptive solutions;
wherein the test server further comprises: an update module to: storing the current test failure event as a new historical test failure event;
updating a correspondence of the historical test failure event with the adapted solution when there is a historical test failure event matching the current test failure event,
and when no historical test failure event matched with the current test failure event exists, taking a solution which is acquired through manual analysis and corresponds to the current test failure event as a new solution so as to update the corresponding relation between the historical test failure event and the adaptive solution.
14. The testing server of claim 13, wherein the matching module is further configured to match, according to current test log information corresponding to the current test failure event, with pre-stored historical test log information corresponding to the historical test failure event.
15. The test server of claim 13, further comprising: the storage module is used for storing the corresponding relation between the historical test failure events and the adaptive solutions;
the determining module is further configured to determine a solution corresponding to the historical test failure event according to a corresponding relationship between the historical test failure event pre-stored in the storage module and the adapted solution, so as to retest the current test item according to the solution.
16. The test server according to any one of claims 13 to 15, wherein the obtaining module is triggered when there is no historical test failure event in the matching module that matches the current test failure event;
the acquisition module is used for acquiring a solution for the current test failure event according to the manual analysis of the current test failure event so as to retest the test items.
17. A test system, comprising: a test tool and a test server; the test server is used for matching a current test failure event generated when the current test item fails to test according to the current test scheme with a pre-stored historical test failure event, and determining a solution corresponding to the historical test failure event when the historical test failure event matched with the current test failure event exists so that the test tool can test the current test item again according to the solution,
the testing tool is used for testing the current testing item again according to the solution;
wherein the test server is further configured to:
storing the current test failure event as a new historical test failure event;
updating a correspondence of the historical test failure event with the adapted solution when there is a historical test failure event matching the current test failure event,
and when no historical test failure event matched with the current test failure event exists, taking a solution which is acquired through manual analysis and corresponds to the current test failure event as a new solution so as to update the corresponding relation between the historical test failure event and the adaptive solution.
18. The system of claim 17, further comprising: and the technical support end is used for acquiring a solution for dealing with the current test failure event according to manual analysis of the current test failure event so as to retest the test item when the test server does not have a historical test failure event matched with the current test failure event.
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| CN111191863A (en) * | 2018-11-15 | 2020-05-22 | 鸿富锦精密电子（成都）有限公司 | Test information classification method, computer device and computer readable storage medium |
| CN111325367B (en) * | 2018-12-13 | 2023-04-07 | 英业达科技有限公司 | Test time prediction system and method thereof |
| CN110489257A (en) * | 2019-07-23 | 2019-11-22 | 广东以诺通讯有限公司 | A kind of production management method and system |
| CN111582347B (en) * | 2020-04-29 | 2023-09-12 | 北京旋极信息技术股份有限公司 | Fault diagnosis method and device |
| CN111679973B (en) * | 2020-05-25 | 2023-09-08 | 泰康保险集团股份有限公司 | Software test scheduling method, device, computer equipment and readable storage medium |
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