WO2018165978A1 - Surface flaw detector and surface detection mehtod - Google Patents
Surface flaw detector and surface detection mehtod Download PDFInfo
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- WO2018165978A1 WO2018165978A1 PCT/CN2017/077080 CN2017077080W WO2018165978A1 WO 2018165978 A1 WO2018165978 A1 WO 2018165978A1 CN 2017077080 W CN2017077080 W CN 2017077080W WO 2018165978 A1 WO2018165978 A1 WO 2018165978A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Definitions
- the present invention relates to the field of detection, and in particular to a surface flaw detector and a surface detecting method.
- the present invention provides a surface flaw detector and a surface detecting method which utilize the characteristics of a photoresistor to sense changes in the light of the surface of the product to judge the surface flaw of the product.
- the technical solution adopted by the present invention is: a surface flaw detector comprising a detection chamber and a photosensitive detection module disposed in the detection chamber;
- the photosensitive detection module includes a main control chip, a light source unit, a photoresistor sensing unit, and a voltage
- the light source unit is electrically connected to the main control chip, and the main control chip controls the light source unit to provide a light source for detecting.
- the photosensitive resistive sensing unit is electrically connected to the main control chip, and the main control chip controls the photosensitive resistive sensing unit to perform detection.
- the photosensitive resistive sensing unit is located on the surface to be detected of the product to be detected and senses the change of the light to be detected on the surface to be detected of the product to be detected.
- the resistance value of the photoresistor sensing unit; the voltage detecting unit is electrically connected to the photoresistor sensing unit and detects the voltage value of the photoresistor sensing unit, and transmits the voltage value to the main control chip; the light of the light source unit is irradiated to the product to be detected On the surface to be inspected, when the surface to be detected of the product to be inspected passes through the photoresistor sensing unit, if there is flaw on the surface to be detected of the product, the light reflected by the surface to be detected of the product to be detected changes, and the photoresistor is sensed.
- the resistance value of the unit changes, and the voltage value of the photoresistor sensing unit changes accordingly.
- the voltage detecting unit detects the voltage value of the photosensitive resistor sensing unit and transmits the voltage value to the main control chip to judge the surface of the product. .
- the present invention further provides a surface detecting method to which the surface flaw detector described above is applied, at least The following steps: First, the light source unit is irradiated onto the surface to be inspected of the product, and the photoresistor sensing unit senses the light reflected by the product to be detected on the surface to be detected of the product to be detected, and obtains the light to be detected on the surface to be detected of the product to be detected.
- the voltage detecting unit actually detects the voltage value of the photoresistor sensing unit. When the voltage value of the photoresistor sensing unit changes, the main control chip determines that there is flaw in the surface of the product.
- the beneficial effects of the present invention are: A surface flaw detector and a surface detecting method, both of which utilize the characteristics of a photoresistor; the photoresistor tends to have a small resistance under the action of light, and once the product is to be detected, the surface appears. The reflection of the surface light to be detected will change, and the resistance value of the photoresistor will change. As long as the resistance value of the photoresistor changes, it is judged that there is flaw on the surface of the product; and the voltage detection unit detects the voltage change of the photosensitive resistor sensing unit.
- the surface detection of the product can be completed, the detection structure is simple and easy to implement; and the price of the photoresistor is lower than that of other detection structures, and the use of the photoresistor greatly reduces the manufacturing cost.
- FIG. 1 is a circuit diagram of a photosensitive detecting module of the present invention
- FIG. 2 is a schematic view of a surface flaw detector of the present invention.
- FIGS. 1 through 2 schematically illustrate a surface flaw detector in accordance with an embodiment of the present invention.
- a surface flaw detector includes a detection chamber 1 and a photosensitive detection module 2 disposed in the detection chamber; the external ambient light is unstable, and the photosensitive detection module 2 is easily caused to be in error, and the detection chamber 1 will be the photosensitive detection module 2 and the external environment. Light isolation, avoiding external ambient light effects.
- the photosensitive detection module 2 includes a main control chip 21, a light source unit 22, a photoresistor sensing unit 23, and a voltage detecting unit 24.
- the light source unit 22 is composed of a resistor R2 and a lamp LED1, and can provide a stable light source for the detection.
- the resistor R2 of the light source unit 22 is electrically connected to the pin of the main control chip 21, and the main control chip 21 controls the light source unit 22.
- a light source is provided for detection.
- the photoresistor sensing unit 23 has a photoresistor CDs for detecting the characteristics of the photoresistor.
- the photoresistor CDs of the photoresistor sensing unit 23 is electrically connected to the pins of the main control chip 21, and the main control chip 21 controls the photoresistor.
- the sensing unit 23 performs detection, and the photoresistor sensing unit 23 is located on the surface to be detected of the product to be detected and senses the change of the light of the surface to be detected of the product to be detected to change the resistance value of the photoresistor sensing unit 23.
- the voltage detecting unit 24 has a resistor R1.
- the resistor R1 of the voltage detecting unit 24 is electrically connected to the photoresistor sensing unit 23 and detects the voltage value of the photoresistor sensing unit 23, and transmits the voltage value to the master chip 21.
- each of the to-be-detected surfaces of the product to be inspected is provided with a photosensitive detecting module 2 to completely detect the product, thereby avoiding less inspection or multi-process operation.
- the detection chamber 1 is provided with a partition 11 that blocks the light source unit 22 and the photoresistor sensing unit 23, and the partition 11 prevents the light of the light source unit from directly illuminating the photoresistor sensing unit 23, affecting the photoresistor
- the sensitivity of the photosensitive resist sensing unit 23 cannot accurately determine the light change and affect the detection result.
- the photosensitive detecting module 2 further includes a power unit 25, and the power unit 25 is electrically connected to the main control chip.
- the power supply unit 22 has positive and negative terminals for connecting the main control chip 21 for power supply.
- the photosensitive detecting module 2 further includes a threshold comparing unit, and the threshold comparing unit is built in the main control chip 2
- the threshold comparison unit pre-stores the value and the voltage value of the voltage detecting unit 24 as a comparison value to accurately determine whether there is a change in the voltage value of the voltage detecting unit 24.
- the photosensitive detecting module 2 further includes an output interface 27, and the output interface 27 is electrically connected to the main control chip.
- the output interface 27 outputs the judgment result of the main control chip 21 to obtain the result of judging the surface of the product, especially when the surface flaw detector is combined with other equipment for detection, and the result is reflected to other components.
- the photosensitive detecting module 2 is provided with a detecting circuit board 28, a main control chip 21, a power supply unit 25, and a photosensitive
- the resistance sensing unit 23, the voltage detecting unit 24, the threshold comparing unit 26, and the output interface 27 are all soldered to the detecting circuit board 28 for convenient installation and use.
- a surface detecting method which employs the surface flaw detector described above, includes at least the following steps: First, the light source unit 22 is irradiated onto the surface to be inspected of the product, and the photoresistor sensing unit 23 is to be detected in the product to be detected. The detecting surface senses the light reflected by the surface to be detected of the product to be detected, and obtains the light change on the surface to be detected of the product to be detected; then, the voltage detecting unit 24 actually detects the voltage value of the photosensitive resist sensing unit 23, when the photosensitive resist senses After the voltage value of the unit 23 changes, the main control chip 21 determines that flaws are present on the surface of the product.
- the threshold comparison unit of the surface flaw detector stores the voltage value data of the qualified product ,, and detects the voltage value data of the qualified product ⁇ as the qualified comparison value; after detecting the undetected product ⁇ , the voltage detecting unit The voltage value data is compared with the qualified comparison value to accurately determine whether there is a change in the voltage value of the voltage detecting unit 24.
- the surface flaw detector is provided with a photosensitive detecting module 2 on each of the product-independent detecting surfaces, and the photosensitive detecting module 2 independently detects the independent detecting surface of each product, since each product is detected.
- the light of the independent surface to be inspected is different, and the detected data are inconsistent.
Abstract
A surface flaw detector, comprising: a main control chip (21), a light source unit (22), a photoresistor sensing unit (23), a voltage detection unit (24) and a power source unit (25). A surface detection method: when a flaw occurs on a product surface to be detected, the reflected light on the surface to be detected changes, the change of the resistance value of a photoresistor is known according to the change of the voltage of the voltage detection unit, thereby determining the detection result of product surface flaw.
Description
一种表面瑕疵检测器和表面检测方法 技术领域 Surface flaw detector and surface detecting method
[0001] 本发明涉及检测领域， 特别是涉及一种表面瑕疵检测器和表面检测方法。 [0001] The present invention relates to the field of detection, and in particular to a surface flaw detector and a surface detecting method.
背景技术 Background technique
[0002] 在产品的生产过程中， 其表面划痕、 凹痕或者凸点的瑕疵是常见的品质不良现 象， 所以在检验中， 要筛选检出不良品； 现有技术中， 表面检测通常采用 CCD 检测或者激光检测光源检测， 这两种检测方法所使用的设备都结构复杂， 造价 较高， 尤其是 CCD检测方法， 一个 CCD摄像头就造价较高。 [0002] In the production process of products, flaws on the surface of scratches, dents or bumps are common quality defects, so in the inspection, it is necessary to screen out defective products; in the prior art, surface inspection is usually adopted. CCD detection or laser detection light source detection, the equipment used in these two detection methods are complex in structure and high in cost, especially the CCD detection method, and a CCD camera is expensive.
技术问题 technical problem
[0003] 为解决上述的问题， 本发明提供了一种表面瑕疵检测器和表面检测方法， 利用 光敏电阻的特性， 感应产品表面的光线的变化， 判断产品表面瑕疵结果。 In order to solve the above problems, the present invention provides a surface flaw detector and a surface detecting method which utilize the characteristics of a photoresistor to sense changes in the light of the surface of the product to judge the surface flaw of the product.
问题的解决方案 Problem solution
技术解决方案 Technical solution
[0004] 本发明所采取的技术方案是： 一种表面瑕疵检测器， 包括检测室和设于检测室 内的光敏检测模块； 光敏检测模块包括主控芯片、 光源单元、 光敏电阻传感单 元和电压检测单元； 光源单元电性连接主控芯片， 主控芯片控制光源单元提供 光源进行检测。 光敏电阻传感单元电性连接主控芯片， 主控芯片控制光敏电阻 传感单元进行检测， 光敏电阻传感单元位于待检测产品的待检测面上并感应待 检测产品的待检测面光线变化改变光敏电阻传感单元的电阻值； 电压检测单元 电性连接光敏电阻传感单元并检测光敏电阻传感单元的电压值，并传输电压值给 主控芯片； 光源单元的光照射到待检测产品的待检测面上， 当待检测产品的待 检测面经过光敏电阻传感单元吋， 如果产品的待检测面上有瑕疵， 待检测产品 的待检测面反射的光线就会发生变化， 光敏电阻传感单元的电阻值就会发生变 化， 光敏电阻传感单元的电压值也相应变化， 电压检测单元会检测出光敏电阻 传感单元的电压值， 并传输电压值给主控芯片， 判断产品表面瑕疵结果。 [0004] The technical solution adopted by the present invention is: a surface flaw detector comprising a detection chamber and a photosensitive detection module disposed in the detection chamber; the photosensitive detection module includes a main control chip, a light source unit, a photoresistor sensing unit, and a voltage The detecting unit; the light source unit is electrically connected to the main control chip, and the main control chip controls the light source unit to provide a light source for detecting. The photosensitive resistive sensing unit is electrically connected to the main control chip, and the main control chip controls the photosensitive resistive sensing unit to perform detection. The photosensitive resistive sensing unit is located on the surface to be detected of the product to be detected and senses the change of the light to be detected on the surface to be detected of the product to be detected. The resistance value of the photoresistor sensing unit; the voltage detecting unit is electrically connected to the photoresistor sensing unit and detects the voltage value of the photoresistor sensing unit, and transmits the voltage value to the main control chip; the light of the light source unit is irradiated to the product to be detected On the surface to be inspected, when the surface to be detected of the product to be inspected passes through the photoresistor sensing unit, if there is flaw on the surface to be detected of the product, the light reflected by the surface to be detected of the product to be detected changes, and the photoresistor is sensed. The resistance value of the unit changes, and the voltage value of the photoresistor sensing unit changes accordingly. The voltage detecting unit detects the voltage value of the photosensitive resistor sensing unit and transmits the voltage value to the main control chip to judge the surface of the product. .
[0005] 本发明再提出一种表面检测方法， 应用了上述的表面瑕疵检测器， 至少包括以
下步骤： 首先， 光源单元的照射到产品的待检测面上， 光敏电阻传感单元在待 检测产品的待检测面上感应产品待检测面反射的光线， 得到待检测产品待检测 面上的光线变化； 接着， 电压检测单元实吋检测光敏电阻传感单元的电压值， 当光敏电阻传感单元的电压值发生变化吋， 主控芯片判断产品表面存在瑕疵。 发明的有益效果 [0005] The present invention further provides a surface detecting method to which the surface flaw detector described above is applied, at least The following steps: First, the light source unit is irradiated onto the surface to be inspected of the product, and the photoresistor sensing unit senses the light reflected by the product to be detected on the surface to be detected of the product to be detected, and obtains the light to be detected on the surface to be detected of the product to be detected. The voltage detecting unit actually detects the voltage value of the photoresistor sensing unit. When the voltage value of the photoresistor sensing unit changes, the main control chip determines that there is flaw in the surface of the product. Advantageous effects of the invention
有益效果 Beneficial effect
[0006] 本发明的有益效果是： 一种表面瑕疵检测器和表面检测方法， 都是利用光敏电 阻的特性； 光敏电阻在光线的作用下其电阻值往往变小， 一旦产品待检测面出 现瑕疵， 产品待检测面光的反射就会改变， 光敏电阻的电阻值就会发生变化， 只要光敏电阻的阻值发生变化， 判断产品表面存在瑕疵； 配合电压检测单元检 测光敏电阻传感单元的电压变化， 得知光敏电阻的阻值发生变化， 就能完成产 品的表面检测， 检测结构简单， 易于实现； 而且光敏电阻价格比其他检测结构 价格低， 使用光敏电阻大大降低了制造成本。 [0006] The beneficial effects of the present invention are: A surface flaw detector and a surface detecting method, both of which utilize the characteristics of a photoresistor; the photoresistor tends to have a small resistance under the action of light, and once the product is to be detected, the surface appears. The reflection of the surface light to be detected will change, and the resistance value of the photoresistor will change. As long as the resistance value of the photoresistor changes, it is judged that there is flaw on the surface of the product; and the voltage detection unit detects the voltage change of the photosensitive resistor sensing unit. When the resistance value of the photoresistor is changed, the surface detection of the product can be completed, the detection structure is simple and easy to implement; and the price of the photoresistor is lower than that of other detection structures, and the use of the photoresistor greatly reduces the manufacturing cost.
对附图的简要说明 Brief description of the drawing
附图说明 DRAWINGS
[0007] 图 1是本发明的光敏检测模块电路图； 1 is a circuit diagram of a photosensitive detecting module of the present invention;
[0008] 图 2是本发明的表面瑕疵检测器示意图。 2 is a schematic view of a surface flaw detector of the present invention.
实施该发明的最佳实施例 BEST MODE FOR CARRYING OUT THE INVENTION
本发明的最佳实施方式 BEST MODE FOR CARRYING OUT THE INVENTION
[0009] 下面结合附图对本发明作进一步详细的说明。 The present invention will be further described in detail below with reference to the accompanying drawings.
[0010] 图 1至图 2示意性地显示了根据本发明的一种实施方式的一种表面瑕疵检测器。 [0010] FIGS. 1 through 2 schematically illustrate a surface flaw detector in accordance with an embodiment of the present invention.
[0011] 一种表面瑕疵检测器， 包括检测室 1和设于检测室内的光敏检测模块 2; 外部环 境光不稳定， 容易造成光敏检测模块 2出错， 检测室 1将光敏检测模块 2和外部环 境光隔绝， 避免了外部环境光影响。 [0011] A surface flaw detector includes a detection chamber 1 and a photosensitive detection module 2 disposed in the detection chamber; the external ambient light is unstable, and the photosensitive detection module 2 is easily caused to be in error, and the detection chamber 1 will be the photosensitive detection module 2 and the external environment. Light isolation, avoiding external ambient light effects.
[0012] 光敏检测模块 2包括主控芯片 21、 光源单元 22、 光敏电阻传感单元 23和电压检 测单元 24。 光源单元 22是由电阻 R2和灯 LED1组成， 能为检测提供稳定的光源， 光源单元 22的电阻 R2电性连接主控芯片 21的引脚， 主控芯片 21控制光源单元 22
提供光源进行检测。 光敏电阻传感单元 23具有一个光敏电阻 CDs, 从而利用的光 敏电阻的特性进行检测； 光敏电阻传感单元 23的光敏电阻 CDs电性连接主控芯片 21的引脚， 主控芯片 21控制光敏电阻传感单元 23进行检测， 光敏电阻传感单元 2 3位于待检测产品的待检测面上并感应待检测产品的待检测面光线变化改变光敏 电阻传感单元 23的电阻值。 电压检测单元 24具有电阻 Rl， 电压检测单元 24的电 阻 R1电性连接光敏电阻传感单元 23并检测光敏电阻传感单元 23的电压值,并传输 电压值给主控芯片 21。 [0012] The photosensitive detection module 2 includes a main control chip 21, a light source unit 22, a photoresistor sensing unit 23, and a voltage detecting unit 24. The light source unit 22 is composed of a resistor R2 and a lamp LED1, and can provide a stable light source for the detection. The resistor R2 of the light source unit 22 is electrically connected to the pin of the main control chip 21, and the main control chip 21 controls the light source unit 22. A light source is provided for detection. The photoresistor sensing unit 23 has a photoresistor CDs for detecting the characteristics of the photoresistor. The photoresistor CDs of the photoresistor sensing unit 23 is electrically connected to the pins of the main control chip 21, and the main control chip 21 controls the photoresistor. The sensing unit 23 performs detection, and the photoresistor sensing unit 23 is located on the surface to be detected of the product to be detected and senses the change of the light of the surface to be detected of the product to be detected to change the resistance value of the photoresistor sensing unit 23. The voltage detecting unit 24 has a resistor R1. The resistor R1 of the voltage detecting unit 24 is electrically connected to the photoresistor sensing unit 23 and detects the voltage value of the photoresistor sensing unit 23, and transmits the voltage value to the master chip 21.
[0013] 当光源单元 22的光照射到待检测产品的待检测面上， 当待检测产品的待检测面 经过光敏电阻传感单元 23吋， 如果待检测产品的待检测面上有瑕疵， 待检测产 品的待检测面反射的光线就会发生变化， 光敏电阻传感单元的电阻值就会发生 变化， 光敏电阻传感单元 23的电压值也相应变化， 电压检测单元 24会检测出光 敏电阻传感单元 23的电压值， 并传输电压值给主控芯片 21， 判断产品表面瑕疵 结果。 [0013] When the light of the light source unit 22 is irradiated onto the surface to be inspected of the product to be detected, when the surface to be detected of the product to be detected passes through the photoresistor sensing unit 23, if there is a defect on the surface to be detected of the product to be detected, The light reflected by the surface to be detected of the product is changed, the resistance value of the photoresistor sensing unit changes, the voltage value of the photoresistor sensing unit 23 also changes accordingly, and the voltage detecting unit 24 detects the photosensitive resistor transmission. The voltage value of the sensing unit 23 is transmitted, and the voltage value is transmitted to the main control chip 21 to judge the surface defect of the product.
[0014] 上述的， 待检测产品的每个待检测面上都设有光敏检测模块 2， 以完整地检测 产品， 避免少检或者多工序操作。 [0014] In the above, each of the to-be-detected surfaces of the product to be inspected is provided with a photosensitive detecting module 2 to completely detect the product, thereby avoiding less inspection or multi-process operation.
[0015] 上述的， 检测室 1设有将光源单元 22和光敏电阻传感单元 23隔幵的隔板 11， 隔 板 11防止光源单元的光直接照射到光敏电阻传感单元 23， 影响光敏电阻的灵敏 度， 导致光敏电阻传感单元 23无法准确判断光线变化， 影响检测结果。 [0015] In the above, the detection chamber 1 is provided with a partition 11 that blocks the light source unit 22 and the photoresistor sensing unit 23, and the partition 11 prevents the light of the light source unit from directly illuminating the photoresistor sensing unit 23, affecting the photoresistor The sensitivity of the photosensitive resist sensing unit 23 cannot accurately determine the light change and affect the detection result.
[0016] 上述的， 光敏检测模块 2还包括电源单元 25， 电源单元 25电性连接主控芯片 21[0016] In the above, the photosensitive detecting module 2 further includes a power unit 25, and the power unit 25 is electrically connected to the main control chip.
； 电源单元 22具有正负极接口， 以连接主控芯片 21进行供电。 The power supply unit 22 has positive and negative terminals for connecting the main control chip 21 for power supply.
[0017] 上述的， 光敏检测模块 2还包括阈值比较单元， 阈值比较单元内置于主控芯片 2[0017] In the above, the photosensitive detecting module 2 further includes a threshold comparing unit, and the threshold comparing unit is built in the main control chip 2
1， 阈值比较单元预存储数值并和电压检测单元 24的电压值作为比较值， 以准确 判断电压检测单元 24的电压值是否存在变化。 1. The threshold comparison unit pre-stores the value and the voltage value of the voltage detecting unit 24 as a comparison value to accurately determine whether there is a change in the voltage value of the voltage detecting unit 24.
[0018] 上述的， 光敏检测模块 2还包括输出接口 27， 输出接口 27电性连接主控芯片 21[0018] In the above, the photosensitive detecting module 2 further includes an output interface 27, and the output interface 27 is electrically connected to the main control chip.
； 输出接口 27将主控芯片 21的判断结果输出， 以得到判断产品表面瑕疵结果， 尤其是当表面瑕疵检测器配合其他设备进行检测吋， 及吋反映结果给其他部件 The output interface 27 outputs the judgment result of the main control chip 21 to obtain the result of judging the surface of the product, especially when the surface flaw detector is combined with other equipment for detection, and the result is reflected to other components.
[0019] 上述的， 光敏检测模块 2设有检测电路板 28， 主控芯片 21、 电源单元 25、 光敏
电阻传感单元 23、 电压检测单元 24、 阈值比较单元 26和输出接口 27都焊接在检 测电路板 28上， 方便安装使用。 [0019] In the above, the photosensitive detecting module 2 is provided with a detecting circuit board 28, a main control chip 21, a power supply unit 25, and a photosensitive The resistance sensing unit 23, the voltage detecting unit 24, the threshold comparing unit 26, and the output interface 27 are all soldered to the detecting circuit board 28 for convenient installation and use.
[0020] 一种表面检测方法， 应用了上述的表面瑕疵检测器， 至少包括以下步骤： 首先 ， 光源单元 22的照射到产品的待检测面上， 光敏电阻传感单元 23在待检测产品 的待检测面上感应待检测产品待检测面反射的光线， 得到待检测产品待检测面 上的光线变化； 接着， 电压检测单元 24实吋检测光敏电阻传感单元 23的电压值 ， 当光敏电阻传感单元 23的电压值发生变化吋， 主控芯片 21判断产品表面存在 瑕疵。 [0020] A surface detecting method, which employs the surface flaw detector described above, includes at least the following steps: First, the light source unit 22 is irradiated onto the surface to be inspected of the product, and the photoresistor sensing unit 23 is to be detected in the product to be detected. The detecting surface senses the light reflected by the surface to be detected of the product to be detected, and obtains the light change on the surface to be detected of the product to be detected; then, the voltage detecting unit 24 actually detects the voltage value of the photosensitive resist sensing unit 23, when the photosensitive resist senses After the voltage value of the unit 23 changes, the main control chip 21 determines that flaws are present on the surface of the product.
[0021] 上述方法中， 表面瑕疵检测器的阈值比较单元储存检测合格产品吋的电压值数 据， 检测合格产品吋的电压值数据做为合格比对值； 在检测未检测产品吋， 电 压检测单元的电压值数据与合格比对值比较， 以准确判断电压检测单元 24的电 压值是否存在变化。 [0021] In the above method, the threshold comparison unit of the surface flaw detector stores the voltage value data of the qualified product ,, and detects the voltage value data of the qualified product 做 as the qualified comparison value; after detecting the undetected product 吋, the voltage detecting unit The voltage value data is compared with the qualified comparison value to accurately determine whether there is a change in the voltage value of the voltage detecting unit 24.
[0022] 上述方法中， 上述的表面瑕疵检测器在每个产品独立的待检测面都设有光敏检 测模块 2， 光敏检测模块 2对于每个产品独立的待检测面都独立检测， 由于产品 每个独立的待检测面的光线都不一样， 检测出的数据都不一致。 [0022] In the above method, the surface flaw detector is provided with a photosensitive detecting module 2 on each of the product-independent detecting surfaces, and the photosensitive detecting module 2 independently detects the independent detecting surface of each product, since each product is detected. The light of the independent surface to be inspected is different, and the detected data are inconsistent.
[0023] 以上的实施例只是在于说明而不是限制本发明， 故凡依本发明专利申请范围所 述的方法所做的等效变化或修饰， 均包括于本发明专利申请范围内。
The above embodiments are intended to be illustrative only and not limiting of the invention, and the equivalents and modifications of the methods of the present invention are included in the scope of the present invention.
Claims
权利要求书 Claim
一种表面瑕疵检测器， 其特征在于， 包括检测室和设于检测室内的光 敏检测模块； 光敏检测模块包括主控芯片、 光源单元、 光敏电阻传感 单元和电压检测单元； 光源单元电性连接主控芯片， 主控芯片控制光 源单元提供光源进行检测。 光敏电阻传感单元电性连接主控芯片， 主 控芯片控制光敏电阻传感单元进行检测， 光敏电阻传感单元位于产品 的待检测面上并感应产品的待检测面光线变化改变光敏电阻传感单元 的电阻值； 电压检测单元电性连接光敏电阻传感单元并检测光敏电阻 传感单元的电压值,并传输电压值给主控芯片。 A surface flaw detector, comprising: a detection chamber and a photosensitive detection module disposed in the detection chamber; the photosensitive detection module comprises a main control chip, a light source unit, a photoresistor sensing unit and a voltage detecting unit; the light source unit is electrically connected The main control chip, the main control chip controls the light source unit to provide a light source for detection. The photoresistor sensing unit is electrically connected to the main control chip, and the main control chip controls the photoresistor sensing unit to perform detection. The photoresistor sensing unit is located on the surface to be inspected of the product and senses the change of the light of the product to be detected. The resistance value of the unit; the voltage detecting unit is electrically connected to the photoresistor sensing unit and detects the voltage value of the photoresistor sensing unit, and transmits the voltage value to the main control chip.
根据权利要求 1所述的一种表面瑕疵检测器， 其特征在于： 待检测产 品的每个待检测面上都设有光敏检测模块。 A surface flaw detector according to claim 1, wherein: each of the surfaces to be detected of the product to be inspected is provided with a photosensitive detecting module.
根据权利要求 1或 2所述的一种表面瑕疵检测器， 其特征在于： 检测室 设有将光源单元和光敏电阻传感单元隔幵的隔板。 A surface flaw detector according to claim 1 or 2, wherein the detecting chamber is provided with a partition that separates the light source unit from the photoresistor sensing unit.
根据权利要求 1所述的一种表面瑕疵检测器， 其特征在于： 光敏检测 模块还包括阈值比较单元， 阈值比较单元内置于主控芯片。 A surface flaw detector according to claim 1, wherein: the photosensitive detecting module further comprises a threshold comparing unit, and the threshold comparing unit is built in the master chip.
根据权利要求 1、 2或 4所述的一种表面瑕疵检测器， 其特征在于： 敏 检测模块还包括电源单元， 电源单元电性连接主控芯片。 A surface flaw detector according to claim 1, 2 or 4, wherein the sensitivity detecting module further comprises a power supply unit, and the power supply unit is electrically connected to the main control chip.
根据权利要求 1、 2或 4所述的一种表面瑕疵检测器， 其特征在于： 光 敏检测模块还包括输出接口， 输出接口电性连接主控芯片。 A surface flaw detector according to claim 1, 2 or 4, wherein the photo-sensing detecting module further comprises an output interface, and the output interface is electrically connected to the main control chip.
一种表面检测方法， 其特征在于， 应用了权利要求 1-6任一所述的表 面瑕疵检测器， 至少包括以下步骤： 首先， 光源单元的照射到产品的 待检测面上， 光敏电阻传感单元在产品的待检测面上感应产品待检测 面反射的光线， 得到产品待检测面上的光线变化； 接着， 电压检测单 元实吋检测光敏电阻传感单元的电压值， 当光敏电阻传感单元的电压 值发生变化吋， 主控芯片判断产品表面存在瑕疵。 A surface detecting method, characterized in that the surface flaw detector according to any one of claims 1 to 6 is applied, comprising at least the following steps: First, the light source unit is irradiated onto the surface to be detected of the product, and the photoresistor is sensed. The unit senses the light reflected by the product to be detected on the surface to be detected of the product, and obtains the light change on the surface to be detected on the product; then, the voltage detecting unit actually detects the voltage value of the photosensitive resist sensing unit, when the photosensitive resist sensing unit After the voltage value changes, the master chip determines that there is flaw on the surface of the product.
根据权利要求 7所述的一种表面检测方法， 其特征在于： 表面瑕疵检 测器的阈值比较单元储存检测合格产品吋的电压值数据， 检测合格产 品吋的电压值数据做为合格比对值。
[权利要求 9] 根据权利要求 7或 8所述的一种表面检测方法， 其特征在于： 表面瑕 疵检测器在每个产品独立的待检测面都设有光敏检测模块， 光敏检测 模块对于每个产品独立的待检测面都独立检测。
The surface detecting method according to claim 7, wherein the threshold value comparing unit of the surface flaw detector stores the voltage value data of the qualified product ,, and detects the voltage value data of the qualified product 做 as the qualified comparison value. [Claim 9] A surface detecting method according to claim 7 or 8, wherein: the surface flaw detector is provided with a photosensitive detecting module on each of the product-independent detecting surfaces, and the photosensitive detecting module is provided for each The independent inspection surfaces of the products are independently tested.
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- 2017-03-14 CN CN201720244598.8U patent/CN208847662U/en not_active Expired - Fee Related
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| CN208847662U (en) | 2019-05-10 |
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