WO2018155440A1 - Method for filming resin film, and mask - Google Patents
Method for filming resin film, and mask Download PDFInfo
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- WO2018155440A1 WO2018155440A1 PCT/JP2018/006003 JP2018006003W WO2018155440A1 WO 2018155440 A1 WO2018155440 A1 WO 2018155440A1 JP 2018006003 W JP2018006003 W JP 2018006003W WO 2018155440 A1 WO2018155440 A1 WO 2018155440A1
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- mask
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- 239000011347 resin Substances 0.000 title claims abstract description 113
- 229920005989 resin Polymers 0.000 title claims abstract description 113
- 238000000034 method Methods 0.000 title claims abstract description 38
- 239000000758 substrate Substances 0.000 claims abstract description 104
- 239000000463 material Substances 0.000 claims abstract description 97
- 239000000853 adhesive Substances 0.000 claims abstract description 34
- 230000001070 adhesive effect Effects 0.000 claims abstract description 34
- 239000007788 liquid Substances 0.000 claims abstract description 24
- 230000000379 polymerizing effect Effects 0.000 claims description 2
- 230000001678 irradiating effect Effects 0.000 claims 1
- 230000015572 biosynthetic process Effects 0.000 abstract description 14
- 239000004925 Acrylic resin Substances 0.000 description 31
- 229920000178 Acrylic resin Polymers 0.000 description 31
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 24
- 239000002313 adhesive film Substances 0.000 description 24
- 230000008016 vaporization Effects 0.000 description 15
- 238000005755 formation reaction Methods 0.000 description 13
- 229910052751 metal Inorganic materials 0.000 description 12
- 239000002184 metal Substances 0.000 description 12
- 238000009834 vaporization Methods 0.000 description 12
- 238000004519 manufacturing process Methods 0.000 description 8
- 239000002994 raw material Substances 0.000 description 7
- 239000006200 vaporizer Substances 0.000 description 7
- 239000012159 carrier gas Substances 0.000 description 6
- 239000007789 gas Substances 0.000 description 6
- 238000010438 heat treatment Methods 0.000 description 6
- 230000008021 deposition Effects 0.000 description 5
- 238000007789 sealing Methods 0.000 description 5
- 238000009281 ultraviolet germicidal irradiation Methods 0.000 description 5
- 238000001816 cooling Methods 0.000 description 4
- 239000012528 membrane Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 2
- 238000001723 curing Methods 0.000 description 2
- 229910001873 dinitrogen Inorganic materials 0.000 description 2
- 229920000139 polyethylene terephthalate Polymers 0.000 description 2
- 239000005020 polyethylene terephthalate Substances 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 238000006116 polymerization reaction Methods 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000002826 coolant Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- -1 polyethylene terephthalate Polymers 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 239000002952 polymeric resin Substances 0.000 description 1
- 238000007781 pre-processing Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/12—Organic material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/32—Processes for applying liquids or other fluent materials using means for protecting parts of a surface not to be coated, e.g. using stencils, resists
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/04—Coating on selected surface areas, e.g. using masks
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/04—Coating on selected surface areas, e.g. using masks
- C23C14/042—Coating on selected surface areas, e.g. using masks using masks
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/58—After-treatment
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/02—Details
- H05B33/04—Sealing arrangements, e.g. against humidity
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/80—Constructional details
- H10K59/87—Passivation; Containers; Encapsulations
Definitions
- One end of a resin material bypass pipe 113 (second pipe) having a valve 113V is connected to a position closer to the vaporizer 300 than the valve 112V of the resin material supply pipe 112 (first pipe).
- the other end of the resin material bypass pipe 113 (second pipe) is connected to the outside through an exhaust pipe 114, and gas can be exhausted through the resin material bypass pipe 113.
Abstract
Description
本願は、2017年2月21日に日本に出願された特願2017-030320号に基づき優先権を主張し、その内容をここに援用する。 The present invention relates to a resin film forming method capable of reducing costs and simplifying operations, and a mask having a configuration effective in forming a resin film.
This application claims priority based on Japanese Patent Application No. 2017-030320 for which it applied to Japan on February 21, 2017, and uses the content here.
まず、基板Sに対して無機保護膜形成などの前処理を施した後、成膜室内へ基板Sを移動する(SX1、SX2)。 FIG. 7 shows a process for forming a resin film using a metal mask. An acrylic resin film is illustrated as a representative example of the resin film.
First, after pre-processing such as formation of an inorganic protective film is performed on the substrate S, the substrate S is moved into the deposition chamber (SX1, SX2).
次に、図11に示すように、メタルマスクMXを介して、アクリル材料膜fを基板Sの上に形成する(SX4)。アクリル材料膜fは、基板Sを被覆する部位f1と、部位f1に連なりメタルマスクMXを被覆する部位f2と、から構成される[図11B]。 In the film forming chamber (depressurized atmosphere), as shown in FIGS. 8 to 10, a metal mask MX provided with a desired opening is placed on the film forming surface of the substrate S (SX3). Thereby, the film-forming surface of the substrate S at the position of the opening is exposed as shown in FIG.
Next, as shown in FIG. 11, an acrylic material film f is formed on the substrate S through the metal mask MX (SX4). The acrylic material film f includes a part f1 that covers the substrate S and a part f2 that continues to the part f1 and covers the metal mask MX [FIG. 11B].
このような装置では、メタルマスクMXをクリーニングする設備が必要となる。さらに、真空中でメタルマスクMXと基板を位置合わせするアライメント機構が必要となる。 Next, the acrylic material film f is irradiated with ultraviolet rays (UV) to cure the acrylic material film f to form the acrylic resin film F, and then the metal mask MX is moved in the direction of the arrow as shown in FIG. Thus, the metal mask MX is peeled from the substrate S (SX5, SX6). The metal mask MX is cleaned and reused after a single film formation or after being used a plurality of times by changing the substrate (a plurality of film formations are performed).
Such an apparatus requires equipment for cleaning the metal mask MX. Furthermore, an alignment mechanism for aligning the metal mask MX and the substrate in a vacuum is required.
本発明の第1態様に係る樹脂膜の形成方法においては、前記接着部としてUV光の照射により前記基板に対する粘着性が低下する部材を用いてもよい。
本発明の第1態様に係る樹脂膜の形成方法においては、前記樹脂材料膜の厚さが前記接着部の厚さを超えないように制御してもよい。
本発明の第1態様に係る樹脂膜の形成方法においては、前記第1工程と前記第3工程は大気圧雰囲気において行われ、前記第2工程は減圧雰囲気において行われてもよい。 The method for forming a resin film according to the first aspect of the present invention is a method for forming a patterned resin film on a substrate, wherein the mask main body overlaps a flexible (film-like) support portion and an adhesive portion. A first step (step α) in which the mask is provided so that the adhesive portion is in contact with the substrate (film formation surface) using a mask having a structure, and the substrate through the opening provided in the mask body A vaporized resin material is supplied to the (deposition surface), condensed on the substrate, a liquid resin material film is formed on the substrate, and then the resin material film and the mask are irradiated with UV light. The process (process (beta)) and the 3rd process (process (gamma)) which peels the said mask from the said board | substrate are provided at least in order.
In the method for forming a resin film according to the first aspect of the present invention, a member whose adhesiveness to the substrate is reduced by irradiation with UV light may be used as the adhesive portion.
In the method for forming a resin film according to the first aspect of the present invention, the thickness of the resin material film may be controlled so as not to exceed the thickness of the adhesive portion.
In the method for forming a resin film according to the first aspect of the present invention, the first step and the third step may be performed in an atmospheric pressure atmosphere, and the second step may be performed in a reduced pressure atmosphere.
本発明の第2態様に係るマスクにおいては、前記接着部の厚さが、前記基板上に形成される樹脂材料膜の厚さに比べて大きくてもよい。 In the mask according to the second aspect of the present invention, a liquid resin material film is formed on a substrate through an opening provided in the mask body, and then the resin material film is polymerized to form a resin film on the substrate. The mask body has a structure in which an adhesive part overlaps a flexible (film-like) support part, and the adhesive part is a member whose adhesiveness to the substrate is reduced by irradiation with UV light. is there.
In the mask according to the second aspect of the present invention, the thickness of the adhesive portion may be larger than the thickness of the resin material film formed on the substrate.
ゆえに、本発明の態様は、マスクを用いた樹脂膜の形成において、低コスト化および作業の簡単化を図ることが可能な、樹脂膜の形成方法をもたらす。 In the method for forming a resin film according to an aspect of the present invention, the operation of placing the mask on the substrate before forming the resin film and the operation of peeling the mask from the substrate after forming the resin are performed in an atmospheric pressure atmosphere. it can. Thereby, the arrangement | positioning and peeling of the mask with respect to the board | substrate in a pressure-reduced atmosphere which were essential in the conventional manufacturing method become unnecessary in the aspect of this invention.
Therefore, an aspect of the present invention provides a method for forming a resin film that can reduce costs and simplify operations in forming a resin film using a mask.
したがって、本発明の態様によれば、樹脂膜の膜厚ムラが小さく、均一な膜厚の樹脂膜を実現する。このような樹脂膜の用途としては、例えば、フレキシブルディスプレイの封止膜に好適に用いられる。 The mask according to the aspect of the present invention has a structure in which the mask body has a structure in which a flexible (film-like) support portion and an adhesive portion overlap each other, and the adhesive portion is a member whose adhesiveness to the substrate is reduced by irradiation with UV light. It is composed of Thereby, the operation | work which removes a mask from a board | substrate performed after formation of a resin film becomes easy. In addition, the phenomenon (the generation of steep convex portions as shown in FIG. 12B) that occurs when the mask is removed and the thickness of the resin film locally increases in a portion adjacent to the mask (also referred to as a mask edge) is suppressed. Is done.
Therefore, according to the aspect of the present invention, a resin film having a uniform film thickness can be realized with small film thickness unevenness. For example, the resin film is preferably used as a sealing film for a flexible display.
図1は、本発明の一実施形態に係るアクリル樹脂膜の作製工程を示すフローチャートであり、アクリル樹脂膜の形成方法は、工程SA1~工程SA7の7つの工程から構成される。
工程SA2~工程SA3はアクリル樹脂膜を形成する前にマスクを基板に配置する工程(作業)であり、工程SA6~工程SA7はアクリルを樹脂形成した後にマスクを基板から剥離する工程(作業)である。これらの作業は全て、後述する粘着フィルムマスクを用いることにより、成膜室外(大気圧雰囲気)において行うことができる。これらの2つの作業の間に位置する、工程SA4~工程SA5は基板上にアクリル樹脂膜を形成する工程(作業)であり、この作業のみ成膜室内(減圧雰囲気)において行なわれる。ゆえに、本発明の実施形態によれば、従来の製法においては必須であった、減圧雰囲気における基板に対するマスクの配置および剥離の作業が不要となる。このため、マスクを用いたアクリル樹脂膜の形成において、低コスト化および作業の簡単化を図ることが可能となる。 <Method for forming acrylic resin film>
FIG. 1 is a flowchart showing a process for producing an acrylic resin film according to an embodiment of the present invention, and the method for forming an acrylic resin film is composed of seven processes SA1 to SA7.
Steps SA2 to SA3 are steps (work) for placing the mask on the substrate before forming the acrylic resin film. Steps SA6 to SA7 are steps (work) for peeling the mask from the substrate after forming the acrylic resin. is there. All of these operations can be performed outside the deposition chamber (atmospheric pressure atmosphere) by using an adhesive film mask described later. Steps SA4 to SA5, which are located between these two operations, are steps (operations) for forming an acrylic resin film on the substrate, and only this operation is performed in the film forming chamber (reduced pressure atmosphere). Therefore, according to the embodiment of the present invention, it is not necessary to arrange and peel the mask on the substrate in a reduced pressure atmosphere, which is essential in the conventional manufacturing method. For this reason, in the formation of the acrylic resin film using the mask, it is possible to reduce the cost and simplify the operation.
図2は、本発明の実施形態において用いる粘着フィルムマスクを基板に配置する前の断面図である。図3は、粘着フィルムマスクの平面図である。図4A及び図4Bは、基板に粘着フィルムマスクを配置した状態を示す断面図である。 Hereinafter, each step (step SA1 to step SA7) shown in the flowchart of FIG. 1 will be described in detail with reference to FIGS.
FIG. 2 is a cross-sectional view before the adhesive film mask used in the embodiment of the present invention is arranged on the substrate. FIG. 3 is a plan view of the adhesive film mask. 4A and 4B are cross-sectional views showing a state in which an adhesive film mask is arranged on a substrate.
接着部MAは接着力が弱まっている、もしくは失っているので、マスクMAは容易に基板Sから剥離することができる。剥離されたマスクは廃棄される。フィルムマスクは金属マスクに比べて安価であることから、使い捨てが可能である。さらに、フィルムマスクを洗浄する必要がないので、最終的には環境負荷、コスト共に、金属マスクに比べて有利になる。
図6Aにおける矢印は、基板からマスクMAを剥離する方向を表わしている。図6Bは符号Eの領域の拡大図である。符号eaは、基板Sの被成膜面に着膜したアクリル樹脂膜の部位F1の端部である。アクリル樹脂膜の部位F1の端部とは、基板からマスクMAが剥離された際に形成された側端部を意味する。 Next, as shown in FIGS. 6A and 6B, the mask MA is peeled from the substrate S (step SA7). Step SA7 is referred to as step γ.
Since the adhesive strength of the adhesive portion MA is weakened or lost, the mask MA can be easily peeled from the substrate S. The peeled mask is discarded. Since the film mask is cheaper than the metal mask, it can be disposable. Furthermore, since it is not necessary to clean the film mask, ultimately, both the environmental burden and cost are advantageous over the metal mask.
The arrow in FIG. 6A represents the direction in which the mask MA is peeled from the substrate. FIG. 6B is an enlarged view of a region E. Reference numeral ea denotes an end portion of the portion F1 of the acrylic resin film deposited on the deposition surface of the substrate S. The end portion of the acrylic resin film portion F1 means a side end portion formed when the mask MA is peeled from the substrate.
すなわち、従来の製法ではマスクを除去した際に発生していた、マスクに隣接する部分(マスク端とも呼ぶ)における急峻な凸部の形成が、本発明の実施形態によれば著しく抑制できることが明らかとなった。
したがって、本発明の実施形態は、膜厚ムラが小さく、良好な視認性が確保される均一な膜厚が要求される、封止膜の用途に好適なマスクパターンの形成方法をもたらす。 In the acrylic resin film produced in this way, generation of steep convex portions as shown in FIG. 12B was not confirmed.
That is, it is clear that the formation of steep convex portions in the portion adjacent to the mask (also referred to as the mask edge), which occurred when the mask was removed in the conventional manufacturing method, can be remarkably suppressed according to the embodiment of the present invention. It became.
Therefore, the embodiment of the present invention provides a mask pattern forming method suitable for the use of a sealing film, which requires a uniform film thickness with small film thickness unevenness and good visibility.
本発明の一実施形態に係る粘着フィルムマスクMAは、図4Bに示すように、可撓性(フィルム状)の支持部からなるマスク本体MA1と接着部MA2とが重なった構造を有する。そして、接着部MA2は、UV光の照射によって基板に対する粘着性が低下する部材から構成されている。これにより、第一実施形態においても説明したように、アクリル樹脂膜Fを形成した後に行われる、基板Sから粘着フィルムマスクMAを除去する作業が容易となる。 <Adhesive film mask>
As shown in FIG. 4B, the adhesive film mask MA according to one embodiment of the present invention has a structure in which a mask main body MA1 composed of a flexible (film-like) support portion and an adhesive portion MA2 overlap each other. And adhesion part MA2 is comprised from the member from which the adhesiveness with respect to a board | substrate falls by irradiation of UV light. As a result, as described in the first embodiment, the operation of removing the adhesive film mask MA from the substrate S performed after the acrylic resin film F is formed is facilitated.
したがって、本発明の実施形態は、アクリル樹脂膜の膜厚ムラが小さく、良好な視認性が確保される均一な膜厚のアクリル樹脂膜を実現する。このようなアクリル樹脂膜の用途としては、例えば、有機ELディスプレイやフレキシブルディスプレイの封止膜に好適に用いられる。 Further, the presence of a member (adhesive portion MA2) whose adhesiveness with respect to the substrate S is reduced, so that when the liquid acrylic material film f is formed on the substrate S, the portion of the acrylic material film in contact with the mask due to surface tension. An increase in film thickness is suppressed. This is considered to be prominent when the contact angle of the liquid acrylic material film is large with respect to the adhesive portion MA2, or when the acrylic material film is cured and the adhesiveness of the adhesive portion MA2 is reduced at the same time. Therefore, the adhesive film mask MA according to an embodiment of the present invention induces separation of the part F1 and the part F2 of the acrylic resin film that occurs when the adhesive film mask MA is removed. As a result, the occurrence of a phenomenon in which the thickness of the resin film locally increases in a portion adjacent to the mask (also referred to as a mask edge) (occurrence of a steep convex portion) is eliminated.
Therefore, the embodiment of the present invention realizes an acrylic resin film having a uniform film thickness with small thickness unevenness of the acrylic resin film and ensuring good visibility. As an application of such an acrylic resin film, for example, it is suitably used as a sealing film for an organic EL display or a flexible display.
基板Sと接する接着材ME2の厚さは、形成されるアクリル樹脂膜の厚さより大きく設定されるとよい。これにより、「急峻な凸部」状態の発生が更に低減するので好ましい。例えば、接着材ME2の厚さがアクリル樹脂膜の厚さより大きい範囲で、アクリル樹脂膜の厚さが50nm~20μmの場合、接着部MA2の厚さが10μm~50μmである。 The adhesive film mask MA is composed of a mask body MA1 made of polyimide (PI) or polyethylene terephthalate (PET) resin, and an adhesive part MA2 made of an adhesive whose adhesiveness is reduced by irradiation with UV light. Mask main body MA1 consists of a flexible (film-like) support part.
The thickness of the adhesive ME2 in contact with the substrate S may be set larger than the thickness of the acrylic resin film to be formed. This is preferable because the occurrence of the “steep convex portion” state is further reduced. For example, when the thickness of the adhesive ME2 is larger than the thickness of the acrylic resin film and the thickness of the acrylic resin film is 50 nm to 20 μm, the thickness of the adhesive portion MA2 is 10 μm to 50 μm.
図13は、上述した本発明の一実施形態に係る粘着フィルムマスクMAを用い、基板に樹脂材料を供給することにより該基板上に液体の樹脂材料膜を形成し、樹脂材料膜を重合して樹脂膜を形成する製造装置100の一構成例である。以下では、樹脂材料膜の一例であるアクリル膜を成膜する場合について詳述する。
成膜装置100は、内部空間が減圧可能なチャンバ110と、気化した樹脂材料をチャンバ110(処理室)に供給する気化器300と、を有する。 <Acrylic resin film manufacturing equipment>
FIG. 13 shows the use of the above-described adhesive film mask MA according to one embodiment of the present invention, by supplying a resin material to the substrate, thereby forming a liquid resin material film on the substrate, and polymerizing the resin material film. It is an example of 1 structure of the
The
チャンバ110には、不図示の真空排気装置(真空排気手段、真空ポンプ等)が接続され、真空排気装置は、チャンバ110の内部空間が真空雰囲気となるように、内部空間のガスを排気できるように構成されている。 The internal space of the
An unillustrated evacuation device (evacuation means, vacuum pump, etc.) is connected to the
加温部135は、内部空間を上空間と下空間とに分割するように配置され、加温部135より上方に気化空間が形成され、下方に貯留部が形成される。 As shown in FIG. 13, the
The
Claims (6)
- 基板上にパターニングされた樹脂膜を形成する方法であって、
マスク本体が可撓性の支持部と接着部とが重なった構造を有するマスクを用い、前記基板に対して前記接着部が接するように前記マスクを設ける第1工程と、
前記マスク本体に設けた開口部を通して前記基板に気化した樹脂材料を供給し該基板上で凝縮させ、該基板上に液状の樹脂材料膜を形成した後、該樹脂材料膜と前記マスクにUV光を照射する第2工程と、
前記基板から前記マスクを剥離する第3工程と、
を少なくとも順に備える、
樹脂膜の形成方法。 A method of forming a patterned resin film on a substrate,
Using a mask having a structure in which a mask body has a structure in which a flexible support portion and an adhesive portion overlap each other, and providing the mask so that the adhesive portion is in contact with the substrate;
After the vaporized resin material is supplied to the substrate through the opening provided in the mask body and condensed on the substrate to form a liquid resin material film on the substrate, UV light is applied to the resin material film and the mask. A second step of irradiating
A third step of peeling the mask from the substrate;
At least in order,
A method for forming a resin film. - 前記接着部としてUV光の照射により前記基板に対する粘着性が低下する部材を用いる、
請求項1に記載の樹脂膜の形成方法。 Using a member whose adhesion to the substrate is reduced by irradiation with UV light as the adhesive portion,
The method for forming a resin film according to claim 1. - 前記樹脂材料膜の厚さが前記接着部の厚さを超えないように制御する、
請求項1に記載の樹脂膜の形成方法。 Control so that the thickness of the resin material film does not exceed the thickness of the adhesive portion,
The method for forming a resin film according to claim 1. - 前記第1工程と前記第3工程は大気圧雰囲気において行われ、前記第2工程は減圧雰囲気において行われる、
請求項1に記載の樹脂膜の形成方法。 The first step and the third step are performed in an atmospheric pressure atmosphere, and the second step is performed in a reduced pressure atmosphere.
The method for forming a resin film according to claim 1. - マスク本体に設けた開口部を通して基板に液状の樹脂材料膜を形成した後、該樹脂材料膜を重合させて、該基板上に樹脂膜を形成するためのマスクであって、
前記マスク本体は可撓性の支持部に接着部が重なった構造を有し、
前記接着部はUV光の照射によって前記基板に対する粘着性が低下する部材である、
マスク。 A mask for forming a resin film on the substrate by polymerizing the resin material film after forming a liquid resin material film on the substrate through an opening provided in the mask body,
The mask body has a structure in which an adhesive portion overlaps a flexible support portion,
The adhesive part is a member whose adhesiveness to the substrate is lowered by irradiation with UV light.
mask. - 前記接着部の厚さが、前記基板上に形成される樹脂材料膜の厚さに比べて大きい、
請求項5に記載のマスク。 The thickness of the adhesive portion is larger than the thickness of the resin material film formed on the substrate,
The mask according to claim 5.
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Publication number | Priority date | Publication date | Assignee | Title |
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JP2015067892A (en) * | 2013-09-30 | 2015-04-13 | 大日本印刷株式会社 | Vapor deposition mask, and organic semiconductor element manufacturing method |
JP2016166413A (en) * | 2016-03-02 | 2016-09-15 | 大日本印刷株式会社 | Vapor deposition mask, vapor deposition mask device, and production method of organic electroluminescence element |
WO2016204022A1 (en) * | 2015-06-16 | 2016-12-22 | 株式会社アルバック | Film forming method and film forming device |
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-
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