WO2018143092A1

WO2018143092A1 - Measurement device

Info

Publication number: WO2018143092A1
Application number: PCT/JP2018/002510
Authority: WO
Inventors: 祥夫棚橋
Original assignee: パイオニア株式会社
Priority date: 2017-01-31
Filing date: 2018-01-26
Publication date: 2018-08-09

Abstract

A measurement device 100 has a MEMS mirror 4 for radiating projection light L1 while changing the radiating direction thereof, a light-receiving part 3 for receiving return light L2 reflected by a measurement object 10 included on a surface scanned by the projection light L1 radiated by the MEMS mirror 4, and an optical member 5 for reflecting the projection light L1 and the return light L2. Here, the optical member 5 reflects the projection light L1 radiated by the MEMS mirror 4 in a second period so that a region (first region) of the measurement object 10 irradiated by the projection light L1 in a first period within a first cycle and a region (second region) of the measurement object 10 irradiated by the projection light L1 radiated by the MEMS mirror 4 in a second period at least partially overlap.

Description

Measuring device

The present invention relates to a measuring device using electromagnetic waves.

Conventionally, measurement devices such as lidar (LIDAR: Laser Illuminated Detection and Ranging, Laser Imaging Detection and Ranging or LIDAR: Light Detection and Ranging) using laser light that is electromagnetic waves are known. For example, Patent Document 1 discloses a scanning measurement device capable of measuring a distance of 360 degrees in the horizontal direction by scanning pulsed measurement light toward a measurement target space.

JP 2008-111855 A

According to the scanning measurement apparatus described in Patent Document 1, it is possible to measure an object for 360 degrees in all directions. On the other hand, in an application such as obstacle detection in a vehicle, depending on the installation location or the like, there is a case where only a specific direction is a measurement target without requiring a 360-degree scanning range. In this case, it is important to improve measurement accuracy in a specific direction to be measured.

The above is one example of problems to be solved by the present invention. An object of this invention is to provide the measuring device which can improve a measurement precision suitably.

The invention according to claim 1 is a measuring device, and an irradiation unit that irradiates an electromagnetic wave while changing an irradiation direction, and an object that is irradiated with the electromagnetic wave irradiated from the irradiation unit in a first period within one cycle. The second period so that at least a part of the first area on the object and the second area that is the area on the object irradiated with the electromagnetic wave irradiated from the irradiation unit in the second period overlap. And a reflection part for reflecting the electromagnetic wave irradiated by the irradiation part.

Invention of Claim 7 is a measuring device, Comprising: The irradiation part which irradiates the electromagnetic waves radiate | emitted from the light source, The 1st reflection part which reflects the said electromagnetic waves irradiated in the 1st period, In the 2nd period A second reflecting portion that reflects the irradiated electromagnetic wave, and the second reflecting portion includes a range in which the first reflecting portion reflects the electromagnetic wave and a range in which the second reflecting portion reflects the electromagnetic wave. The electromagnetic waves are reflected such that at least a part of the electromagnetic waves overlap.

It is a block diagram which shows schematic structure of the measuring device which concerns on an Example. It is the figure which showed the cross section of the optical member typically. An example of the three-dimensional structure of the concave mirror and convex mirror which comprise an optical member is shown. It is the top view which observed the optical member from the upper part. It is the figure which showed typically a mode that projection light was irradiated with respect to the measurement object which exists far away. It is the figure which showed the optical path of the projection light at the time of changing the elevation angle of a MEMS mirror only by the predetermined angle. It is a figure showing an example of the three-dimensional structure of the concave mirror and convex mirror in a modification. The structural example of the optical member which concerns on a modification is shown. The structural example of the optical member which concerns on a modification is shown. It is the top view which observed the optical member concerning a modification from the upper part. It is the figure which showed typically a mode that projection light was irradiated with respect to the measurement object which exists in predetermined distance from a measuring device. The schematic structure of the measuring apparatus which concerns on 2nd Example is shown. It is the figure which showed typically the cross-sectional structure of the optical member in which direction was adjusted so that the front of a vehicle might be set as the scanning range of a projection light. It is the figure which showed typically the cross-section of the optical member in which direction was adjusted so that the back of a vehicle might be set as the scanning range of a projection light. It is the figure which showed typically the cross-section of the optical member at the time of rotating an optical member based on 3rd control.

In a preferred embodiment of the present invention, the measurement device is configured to irradiate an electromagnetic wave while changing the irradiation direction, and on an object irradiated with the electromagnetic wave irradiated from the irradiation unit in a first period within one cycle. In the second period, at least part of the first area overlaps with the second area that is an area on the object irradiated with the electromagnetic wave emitted from the irradiation unit in the second period. And a reflection part that reflects the electromagnetic wave irradiated by the irradiation part.

The measurement apparatus includes an irradiation unit and a reflection unit. An irradiation part irradiates electromagnetic waves, changing an irradiation direction. The reflection unit includes a first region on the object irradiated with the electromagnetic wave irradiated from the irradiation unit in the first period within one cycle, and an object irradiated with the electromagnetic wave irradiated from the irradiation unit in the second period. The electromagnetic wave irradiated by the irradiation unit in the second period is reflected so that at least a part of the second region that is the first region overlaps the second region. According to this aspect, the measuring device can preferably improve the measurement accuracy.

In one aspect of the measurement apparatus, the measurement apparatus further includes a receiving unit capable of receiving the electromagnetic wave reflected by the object included in the scanning surface by the electromagnetic wave irradiated by the irradiation unit, wherein the “scanning surface” It refers to the irradiation range (that is, the detectable range) of electromagnetic waves when the measurement apparatus is looked down on.

In another aspect of the measurement apparatus, the reflection unit includes a first reflection unit and a second reflection unit, and the irradiation unit irradiates the first reflection unit with the electromagnetic wave in the first period, In the second period, the second reflecting portion has a movable reflecting portion that irradiates the electromagnetic wave. According to this aspect, the measurement apparatus reflects the electromagnetic waves irradiated by the irradiation unit in the first period and the second period by the first reflection unit and the second reflection unit, respectively, and at least part of the first region and the second region is reflected. It can overlap suitably.

In one aspect of the measurement apparatus, the electromagnetic wave irradiated in the first period and the electromagnetic wave irradiated in the second period are irradiated at an elevation angle such that at least a part of the first region and the second region overlap. The Even in this aspect, the measuring device can suitably overlap at least a part of the first region and the second region.

In another aspect of the measuring apparatus, the electromagnetic wave reflected by the second reflecting unit has the same elevation angle as that of the electromagnetic wave reflected by the first reflecting unit when the object is more than a predetermined distance away. It is injected. According to this aspect, the measurement device can suitably overlap at least a part of the first region and the second region of the target existing at a position separated by a predetermined distance or more.

In another aspect of the measurement apparatus, the second reflection unit includes a first reflection surface and a second reflection surface, and the first reflection surface is irradiated by the irradiation unit in the second period. The electromagnetic wave is reflected on the second reflecting surface, and the second reflecting surface reflects the electromagnetic wave reflected from the first reflecting surface so that at least a part of the first region and the second region overlap each other. . As described above, the measurement apparatus can suitably improve the measurement accuracy by overlapping the first region and the second region even when the second reflection unit is configured by a plurality of reflection surfaces.

In another aspect of the measuring apparatus, the measuring apparatus includes a first optical member having the first reflecting portion and a first refracting surface, and a second optical member having the second reflecting portion and a second refracting surface. In the first period, the electromagnetic wave passes through the first refracting surface before and after being reflected by the first reflecting portion, and in the second period, the electromagnetic wave is the second The light passes through the second refracting surface before and after being reflected by the reflecting portion. Also according to this aspect, the measurement apparatus can preferably improve the measurement accuracy by overlapping the first region and the second region.

In another aspect of the measurement apparatus, the measurement apparatus further includes an adjustment mechanism that moves the reflection unit so as to change the first period and the second period in the one cycle. As a result, the measuring apparatus can suitably adjust the irradiation range in which the electromagnetic wave is irradiated outside by the adjusting mechanism.

In another aspect of the measurement apparatus, the measurement apparatus further includes a determination unit that determines an irradiation range in which the first electromagnetic wave and the second electromagnetic wave are irradiated to the outside, and the adjustment mechanism includes the irradiation range determined by the determination unit. The reflection unit is moved so that the first electromagnetic wave and the second electromagnetic wave are irradiated to the first electromagnetic wave. Thereby, the measuring apparatus can adjust suitably the irradiation range with which electromagnetic waves are irradiated outside.

In another aspect of the measurement apparatus, the determination unit determines the irradiation range based on an external input, or behavior information of a moving body on which the measurement apparatus is mounted or a ground related to a feature around the moving body. The irradiation range is determined based on the object information. According to this aspect, the measuring device can suitably determine the irradiation range of the electromagnetic wave according to the situation.

In another aspect of the measurement apparatus, the reflection unit is rotatable about an axis extending from the irradiation unit in the predetermined direction as a rotation axis, and the adjustment mechanism is configured to reflect the reflection according to a change in the irradiation direction. Rotate the part. According to this aspect, the measuring apparatus can suitably expand the irradiation range of the electromagnetic wave in the horizontal direction.

In another preferred embodiment of the present invention, an irradiation unit that irradiates an electromagnetic wave emitted from a light source, a first reflection unit that reflects the electromagnetic wave irradiated in a first period, and the irradiation that occurs in a second period A second reflecting portion that reflects electromagnetic waves, wherein the second reflecting portion is at least one of a range in which the first reflecting portion reflects the electromagnetic waves and a range in which the second reflecting portion reflects the electromagnetic waves. The electromagnetic waves are reflected so that the portions overlap. According to this aspect, the measurement apparatus can preferably improve the measurement accuracy by suitably overlapping the ranges in which the electromagnetic waves are scanned in the first period and the second period.

Hereinafter, preferred first and second embodiments of the present invention will be described with reference to the drawings.

<First embodiment>
[Device configuration]
FIG. 1 shows a schematic configuration of a measuring apparatus 100 according to the first embodiment. The measurement apparatus 100 projects infrared light (for example, wavelength 905 nm) of projection light “L1” that is an electromagnetic wave onto the measurement object 10, receives the return light “L2”, and determines the distance to the measurement object 10. measure. The measuring device 100 is a rider that is mounted on a vehicle, for example, and has a specific direction such as the front, side, or rear of the vehicle as a measurement range. In the present embodiment, the measuring apparatus 100 limits the scanning range of the projection light L1 in the horizontal direction to about 180 degrees, thereby improving the number of times of measurement per unit time (so-called frame rate) in the limited scanning range. As illustrated, the measuring device 100 includes a light source unit 1, a control unit 2, a light receiving unit 3, a MEMS mirror 4, and an optical member 5.

The light source unit 1 emits infrared projection light L1 toward the MEMS mirror 4. The MEMS mirror 4 reflects the projection light L 1 and emits it outside the measuring apparatus 100. The light receiving unit 3 is, for example, an avalanche photodiode (Avalanche PhotoDiode), and generates a detection signal corresponding to the light amount of the received return light L2 and sends it to the control unit 2. Note that “irradiation” and “emission” both indicate that light is output. In the following description, “irradiation” is mainly used in the description based on the presence of a target that is exposed to light such as a reflecting portion or an object. In the description that does not particularly presume (not conscious of) the presence of a target that is exposed to light, “emission” is used for convenience.

The MEMS mirror 4 reflects the projection light L1 incident from the light source unit 1 toward the optical member 5. The MEMS mirror 4 reflects the return light L2 incident from the optical member 5 toward the light receiving unit 3. The MEMS mirror 4 is, for example, an electrostatic drive type mirror, and the tilt (that is, the angle of optical scanning) changes within a predetermined range under the control of the control unit 2. In the present embodiment, the MEMS mirror 4 reflects the projection light L1 within a range of 360 degrees at least in the horizontal direction. The light source unit 1 and the MEMS mirror 4 are examples of the “irradiation unit” in the present invention.

The optical member 5 reflects the projection light L1 incident from the MEMS mirror 4 toward the outside of the measuring apparatus 100, and reflects the return light L2 reflected from the measurement object 10 toward the MEMS mirror 4. As will be described later, the optical member 5 has a structure that reflects the projection light L1 emitted from the MEMS mirror 4 in a range of 360 degrees in all directions so as to be scanned twice in a direction corresponding to 180 degrees as a measurement target. . A configuration example of the optical member 5 will be described later.

The control unit 2 controls the emission of the projection light L1 from the light source unit 1 and processes the detection signal supplied from the light receiving unit 3 to calculate the distance to the measurement object 10. In addition, the control unit 2 transmits a control signal related to the tilt of the MEMS mirror 4 to the MEMS mirror 4, thereby changing the irradiation direction of the projection light L 1 by the MEMS mirror 4.

[Configuration of optical member]
2A and 2B are diagrams schematically showing a cross-sectional structure of the optical member 5 that reflects the projection light L1 and the return light L2. Hereinafter, the two-dimensional coordinate axes defining the horizontal direction are the X and Y axes, the vertical coordinate axis perpendicular to the horizontal direction is the Z axis, and the positive direction of each axis is shown in FIG. Shall be defined as follows. Here, it is assumed that the azimuth of 180 degrees centered on the X-axis positive direction in the XY plane is the measurement range of the measuring apparatus 100, the X-axis positive direction side is “front side”, and the X-axis negative direction side is “back side”. Call. In addition, an angle around the Z axis (ie, yaw angle) is also called an “azimuth angle”, and an angle around the Y axis (ie, pitch angle) is also called an “elevation angle”.

As shown in FIGS. 2A and 2B, the optical member 5 includes a convex mirror 6A and a concave mirror 6B. Here, the convex mirror 6A exists on the X axis positive direction side with respect to the MEMS mirror 4 and the concave mirror 6B, and the concave mirror 6B exists on the X axis negative direction side with respect to the MEMS mirror 4 and the convex mirror 6A. The concave mirror 6B is further away from the MEMS mirror 4 on the positive side in the Z-axis direction than the convex mirror 6A. The reflective surface of the concave mirror 6B with respect to the projection light L1 and the return light L2 is the reflective surface of the convex mirror 6A. Bigger than.

2A and 2B, the projection light L1 emitted from the light source unit 1 (not shown) is incident on the MEMS mirror 4 from the Z-axis positive direction toward the Z-axis negative direction. Then, the MEMS mirror 4 rotates around the Z axis based on the control of the control unit 2 to gradually change the direction in which the projection light L1 is emitted from the MEMS mirror 4 within the 360-degree direction.

As shown in FIG. 2A, when the reflecting surface of the MEMS mirror 4 faces the front side, the projection light L1 reflected from the MEMS mirror 4 enters the convex mirror 6A. In this case, the convex mirror 6A reflects the incident projection light L1 toward the positive X-axis direction. In this case, the projection light L1 is emitted horizontally after reflection by the convex mirror 6A. That is, the elevation angle of the projection light L1 after reflection by the convex mirror 6A is 0 degree. On the other hand, the direction (that is, the azimuth angle) of the projection light L1 on the XY plane does not change before and after the reflection by the convex mirror 6A. The region of the measurement object 10 irradiated with the projection light L1 reflected by the convex mirror 6A is an example of the “first region” in the present invention.

Further, the return light L2 reflected by the measurement object 10 after being reflected by the convex mirror 6A and emitted from the measuring device 100 is incident on the convex mirror 6A. In this case, the return light L2 is reflected toward the MEMS mirror 4 by the convex mirror 6A, and further reflected by the MEMS mirror 4 in the positive Z-axis direction. Thus, the return light L2 is guided to the light receiving unit 3 (not shown).

On the other hand, as shown in FIG. 2B, when the reflection surface of the MEMS mirror 4 is directed to the back side, the projection light L1 reflected from the MEMS mirror 4 enters the concave mirror 6B. In this case, the concave mirror 6B reflects the incident projection light L1 toward the positive X-axis direction, which is an azimuth that is approximately 180 degrees different from the incident direction on the XY plane. Further, the projection light L1 reflected by the concave mirror 6B is emitted horizontally. That is, the projection light L1 reflected by the concave mirror 6B is emitted from the concave mirror 6B in parallel with the projection light L1 reflected by the convex mirror 6A shown in FIG. 2A (that is, with the same elevation angle). The region of the measurement object 10 irradiated with the projection light L1 reflected by the concave mirror 6B is an example of the “second region” in the present invention.

Further, the return light L2 reflected by the measurement object 10 after being reflected by the concave mirror 6B and emitted from the measuring device 100 is incident on the concave mirror 6B. In this case, the return light L2 is reflected by the concave mirror 6B to the MEMS mirror 4, and further reflected by the MEMS mirror 4 in the Z-axis positive direction. Thus, the return light L2 is guided to the light receiving unit 3 (not shown).

As described above, the direction in which the projection light L1 is emitted is in a range of azimuth angles of 180 degrees with the X axis positive direction as the center. When the reflective surface of the MEMS mirror 4 faces the front side (see FIG. 2A) and when the reflective surface of the MEMS mirror 4 faces the back side (see FIG. 2B), the projection is performed. The light L1 is emitted from the measuring device 100 with the same elevation angle.

The convex mirror 6A is an example of the “reflecting part” and the “first reflecting part” in the present invention, and the period in which the reflecting surface faces the front side in the rotation period of the MEMS mirror 4 is the “first period” in the present invention. Is an example. The concave mirror 6B is an example of the “reflecting portion” and the “second reflecting portion” in the present invention, and the period in which the reflecting surface faces the back side in the rotation period of the MEMS mirror 4 is the “second period” in the present invention. Is an example.

3A and 3B are diagrams illustrating an example of a three-dimensional structure of the convex mirror 6A and the concave mirror 6B.

3A and 3B, a semispherical convex mirror 6A and a concave mirror 6B having different sizes are arranged. Then, as shown in FIG. 3A, the convex mirror 6A uses the spherical outer surface as a reflection surface, and emits the projection light L1 incident from the MEMS mirror 4 to the outside of the measuring device 100. In this case, the convex mirror 6A receives all the projection light L1 reflected from the MEMS mirror 4 when the reflection surface of the MEMS mirror 4 faces the front side, and determines the azimuth angle of the projection light L1 after reflection. The arrangement, the size of the reflection surface, and the like are designed in advance so that the elevation angle becomes a predetermined angle (here, 0 degrees) without being changed. Further, the convex mirror 6 A reflects the return light L 2 incident from outside the measuring apparatus 100 to the MEMS mirror 4.

Further, as shown in FIG. 3B, the concave mirror 6B uses the spherical inner surface as a reflection surface, and emits the projection light L1 incident from the MEMS mirror 4 to the outside of the measuring device 100. In this case, for example, when the reflecting surface of the MEMS mirror 4 faces the back side, the concave mirror 6B receives all the projection light L1 reflected from the MEMS mirror 4, and the orientation of the projection light L1 before and after the reflection is The arrangement, the size of the reflecting surface, and the like are designed in advance so that the angle of elevation of the projected light L1 after reflection is a predetermined angle (here, 0 degrees). Further, the concave mirror 6 B reflects the return light L 2 incident from the outside of the measuring apparatus 100 to the MEMS mirror 4.

FIG. 4 is a plan view of the optical member 5 of FIG. 3 observed from the positive direction of the Z axis.

As shown in FIG. 4, the convex mirror 6A and the concave mirror 6B are semicircles having different radii in the XY plan view, and are close to each other with the sides forming the diameter facing each other. Then, in the XY plan view, near the center point of each semicircle of the convex mirror 6A and the concave mirror 6B, the projection light L1 traveling from the light source unit 1 to the MEMS mirror 4 and the return light L2 traveling from the MEMS mirror 4 to the light receiving unit 3 A hole 11 is formed for the passage of.

Further, in FIG. 4, a broken line arrow 8A indicates a region where the optical member 5 reflects the projection light L1 and the return light L2 when the reflection surface of the MEMS mirror 4 faces the front side (see FIG. 2A). The broken line arrow 8B indicates a region where the optical member 5 reflects the projection light L1 and the return light L2 when the reflection surface of the MEMS mirror 4 faces the back side (see FIG. 2B). A solid arrow 8C indicates a range in which light (that is, the projection light L1 and the return light L2) is transmitted and received by the measurement apparatus 100.

As shown in FIG. 4, when the projection light L1 and the return light L2 are reflected by the concave mirror 6B, the traveling direction of the light is changed by 180 degrees, so that the projection light L1 and the return light L2 are transmitted and received. The range is an azimuth range of about 180 degrees where the convex mirror 6A is formed. That is, in this case, the range of transmission / reception of the projection light L1 and the return light L2 when the reflection surface of the MEMS mirror 4 faces the front side, and the projection light L1 when the reflection surface of the MEMS mirror 4 faces the back side and The range of transmission / reception of the return light L2 overlaps. And when the reflective surface of the MEMS mirror 4 is facing the front side and when the reflective surface of the MEMS mirror 4 is facing the back side, the projection light L1 is measured with the same elevation angle from different heights. Injected from 100.

Next, a supplementary explanation will be given of the effects of this embodiment. FIG. 5 is a diagram schematically illustrating a state in which the projection light L 1 is irradiated onto the measurement target 10 existing in the distance.

As shown in FIG. 5, the projection light L1 is reflected by either the concave mirror 6B or the convex mirror 6A and then diverges with a predetermined spread angle. Further, the projection light L1 reflected by the convex mirror 6A and the projection light L1 reflected by the concave mirror 6B are emitted from the measuring apparatus 100 at the same elevation angle from a position separated by a predetermined distance in the Z-axis direction. Therefore, the irradiation range in the Z-axis direction of the projection light L1 overlaps the measurement target 10 existing in the distance. Therefore, in this case, the measuring apparatus 100 scans the same direction substantially twice by the operation of one cycle of the MEMS mirror 4. That is, in this case, the measuring apparatus 100 can double the frame rate when the projection light L1 is irradiated onto the measurement object 10 that is sufficiently far away. Then, by doubling the frame rate, measurement errors (so-called subject blur) that occur when the measuring device 100 is mounted on a vehicle during high-speed traveling or when the measurement object 10 moves fast are reduced. And the detection probability of the measurement object 10 can be improved.

As described above, the measurement apparatus 100 according to the present embodiment includes the MEMS mirror 4 that irradiates the projection light L1 while changing the irradiation direction, and the measurement target included in the scanning surface by the projection light L1 that is irradiated by the MEMS mirror 4. It has the light-receiving part 3 which receives the return light L2 reflected by the thing 10, and the optical member 5 which reflects the projection light L1 and the return light L2. Here, the optical member 5 includes a region (first region) of the measurement object 10 that is irradiated with the projection light L1 in the first period within one cycle, and a projection light L1 that is irradiated by the MEMS mirror 4 in the second period. The projection light L1 irradiated by the MEMS mirror 4 in the second period is reflected so that at least a part of the region (second region) of the measurement target object 10 irradiated with is overlapped. Thereby, the measuring device 100 can substantially improve the frame rate at the time of irradiating the projection light L1 to the measurement object 10 existing sufficiently far away.

[Modification]
Hereinafter, modified examples suitable for the first embodiment will be described. The following modifications may be applied to the first embodiment in any combination.

(Modification 1)
In addition to scanning the projection light L1 at all azimuth angles by rotating around the Z axis, the MEMS mirror 4 changes the inclination so as to scan the projection light L1 in the height direction for a predetermined angle. You may rotate.

6A and 6B are diagrams showing the optical path of the projection light L1 in each case when the MEMS mirror 4 is tilted to have different elevation angles. Here, in FIGS. 6A and 6B, the MEMS mirror 4 at the solid line position and the broken line position indicates the MEMS mirror 4 when the inclination with respect to the horizontal plane is minimum and maximum, respectively. Since the return light L2 has the same optical path as the projection light L1, the display in FIGS. 6A and 6B is omitted.

When the projection light L1 is incident on the convex mirror 6A, as shown in FIG. 6A, if the inclination of the MEMS mirror 4 with respect to the horizontal plane is different, the projection light L1 reflected by the MEMS mirror 4 is incident on the convex mirror 6A. The position is different, and the elevation angle of the projection light L1 after being reflected by the convex mirror 6A is different by “θAv”. Similarly, when the projection light L1 is incident on the concave mirror 6B, as shown in FIG. 6B, if the inclination of the MEMS mirror 4 with respect to the horizontal plane is different, the concave surface on which the projection light L1 reflected by the MEMS mirror 4 is incident. The position of the mirror 6B is different, and the elevation angle of the projection light L1 after being reflected by the concave mirror 6B is different by θBv.

As described above, the measurement apparatus 100 scans the MEMS mirror 4 while changing the elevation angle at the same azimuth, thereby scanning the projection light L1 reflected by the convex mirror 6A and the concave mirror 6B in the height direction. Can be suitably enlarged. In the example of FIG. 6, the projection light L1 reflected by the convex mirror 6A and the concave mirror 6B is irradiated by the MEMS mirror 4 in the range of angles θAv and θBv in the height direction around the horizontal direction. The MEMS mirror 4 may scan a plurality of layers by changing the elevation angle of the MEMS mirror 4 each time scanning of the azimuth angle of 360 degrees, and the azimuth angle and elevation angle of the MEMS mirror 4 are continuously set. Therefore, the spiral scanning may be performed so that the transition locus of the light emitted from the measuring apparatus 100 is spiral.

(Modification 2)
The arrangement of the convex mirror 6A and the concave mirror 6B is not limited to the arrangement in which the concave mirror 6B exists on the Z axis positive direction side with respect to the convex mirror 6A, as shown in FIG. Instead of this, the convex mirror 6A may be arranged on the Z axis positive direction side with respect to the concave mirror 6B.

FIGS. 7A and 7B are diagrams illustrating an example of a three-dimensional structure of the convex mirror 6Ax and the concave mirror 6Bx in the present modification. 7A and 7B, the convex mirror 6Ax is arranged on the positive side in the Z-axis direction with respect to the concave mirror 6Bx, and the area of the reflecting surface is larger than that of the concave mirror 6Bx.

And when the reflective surface of the MEMS mirror 4 is orient | assigned to the front side, as shown to FIG. 7 (A), the projection light L1 reflected by the MEMS mirror 4 injects into the convex-surface mirror 6Ax, and becomes an X-axis positive direction. Reflected by the convex mirror 6Ax. In this case, preferably, the azimuth angle at which the projection light L1 is emitted from the convex mirror 6Ax does not change before and after the reflection by the convex mirror 6Ax. On the other hand, when the reflection surface of the MEMS mirror 4 (not shown) is directed to the back side, as shown in FIG. 7B, the projection light L1 reflected by the MEMS mirror 4 is incident on the concave mirror 6Bx, and the positive direction of the X axis Is reflected by the concave mirror 6Bx. In this case, the azimuth angle at which the projection light L1 is emitted from the concave mirror 6Bx is approximately 180 degrees different from that before reflection by the concave mirror 6Bx. Accordingly, as in the description of FIG. 4, the range in which the projection light L1 and the return light L2 reflected by the convex mirror 6Ax are transmitted and received is the range in which the projection light L1 and the return light L2 reflected by the concave mirror 6Bx are transmitted and received. It preferably overlaps the range. Further, the projection light L1 reflected by the convex mirror 6Ax is emitted from different heights with the same elevation angle as the projection light L1 reflected by the concave mirror 6Bx.

(Modification 3)
The optical member 5 may have a refracting surface through which the projection light L1 and the return light L2 pass in addition to the convex mirror 6A and the concave mirror 6B.

FIG. 8 shows a configuration example of the optical member 5 according to this modification. In the example of FIG. 8, the optical member 5 includes a first optical member 51 and a second optical member 52. The first optical member 51 includes a convex mirror 6A whose reflective surface is in contact with the internal member of the first optical member 51, and

refractive surfaces

6E and 6F provided on the reflective surface side of the convex mirror 6A. The second optical member 52 has a concave mirror 6B whose reflective surface is in contact with the internal member of the second optical member 52, and

refractive surfaces

6C and 6D provided on the reflective surface side of the concave mirror 6B. In FIG. 8, the MEMS mirror 4 in a state where the reflecting surface is directed to the front side is indicated by a solid line, and the MEMS mirror 4 in a state where the reflecting surface is directed to the back side is indicated by a broken line. Further, it is assumed that the projection light L1 and the return light L2 are refracted by a predetermined refractive index before and after passing through the refracting surfaces 6C to 6F.

In a state where the MEMS mirror 4 is shown by a solid line, that is, in a state where the reflection surface of the MEMS mirror 4 is directed to the front side, the projection light L1 passes through the refractive surface 6E of the first optical member 51 after being reflected by the MEMS mirror 4. Then, the light enters the convex mirror 6A. Then, the projection light L1 reflected by the convex mirror 6A passes through the refractive surface 6F and is emitted out of the measuring device 100. Similarly, the return light L2, which is the return light of the projection light L1 reflected by the convex mirror 6A, passes through the refractive surface F and enters the convex mirror 6A, and again passes through the refractive surface 6E and reaches the MEMS mirror 4. To do.

On the other hand, in a state where the MEMS mirror 4 is indicated by a broken line, that is, in a state where the reflective surface of the MEMS mirror 4 is directed to the back side, the projection light L1 is reflected by the MEMS mirror 4 and then the refractive surface 6C of the second optical member 52. And enters the concave mirror 6B. Then, the projection light L1 reflected by the concave mirror 6B passes through the refractive surface 6D and is emitted out of the measuring device 100. Similarly, the return light L2, which is the return light of the projection light L1 reflected by the concave mirror 6B, passes through the refractive surface 6D and enters the concave mirror 6B, and again passes through the refractive surface 6C and reaches the MEMS mirror 4. To do.

As described above, even with the configuration of this modification, the measuring apparatus 100 emits the projection light L1 reflected by the concave mirror 6B horizontally in the X-axis positive direction in the same manner as the projection light L1 reflected by the convex mirror 6A. Can be made. In this modification, the

refractive surfaces

6E and 6F are examples of the “first refractive surface” in the present invention, and the

refractive surfaces

6C and 6D are examples of the “second refractive surface” in the present invention.

(Modification 4)
The optical member 5 may further have a reflective surface other than the convex mirror 6A and the concave mirror 6B.

FIG. 9 shows a configuration example of the optical member 5 according to this modification. In the example of FIG. 9, the optical member 5 includes a convex mirror 6G in addition to the convex mirror 6A and the concave mirror 6B. The convex mirror 6G is present on the X axis positive direction side with respect to the concave mirror 6B, and changes the elevation angle of the projection light L1 reflected by the concave mirror 6B. In FIG. 9, as in FIG. 8, the MEMS mirror 4 with the reflecting surface facing the front side is indicated by a solid line, and the MEMS mirror 4 with the reflecting surface facing the back side is indicated by a broken line. .

In the example of FIG. 9, in a state where the reflective surface of the MEMS mirror 4 is directed to the back side, the projection light L1 is reflected by the MEMS mirror 4 toward the concave mirror 6B, and then is directed to the convex mirror 6G by the concave mirror 6B. Reflected towards. Then, the projection light L1 is changed so that the elevation angle becomes 0 degrees by reflection on the convex mirror 6G. On the other hand, in a state where the reflective surface of the MEMS mirror 4 is directed to the front side, the projection light L1 is reflected by the MEMS mirror 4 toward the convex mirror 6A, and the azimuth angle remains unchanged by the reflection at the convex mirror 6A. The elevation angle is changed to 0 degrees.

As described above, according to the configuration of FIG. 9, the measuring apparatus 100 makes the elevation angle of the projection light L1 reflected by the concave mirror 6B the same as the elevation angle of the projection light L1 reflected by the convex mirror 6A. Further, it can be suitably adjusted by the convex mirror 6G. In this modification, the concave mirror 6B is an example of the “first reflective surface” in the present invention, and the convex mirror 6G is an example of the “second reflective surface” in the present invention.

(Modification 5)
In the configuration of FIG. 2 and the like, the convex mirror 6A and the concave mirror 6B are arranged so that the horizontal scanning range of the MEMS mirror 4 is divided into two. Instead of this, the optical member 5 may be configured to divide the horizontal scanning range of the MEMS mirror 4 by a division number of 3 or more.

FIG. 10 is a plan view of the optical member 5 in the modified example observed from the positive direction of the Z axis. In the configuration example of FIG. 10, the optical member 5 includes a convex mirror 6Aa, a convex mirror 6Ab, a concave mirror 6Ba, and a concave mirror 6Bb. The convex mirror 6Aa, the convex mirror 6Ab, the concave mirror 6Ba, and the concave mirror 6Bb are fan-shaped for 90 degrees of different sizes in the XY plan view, and the center point of these fan-shaped is the projection light L1. And it adjoins mutually so that it may overlap with the hole 11 through which return light L2 passes. Further, the convex mirror 6Aa, the concave mirror 6Bb, the convex mirror 6Ab, and the concave mirror 6Ba are arranged in the order of increasing the Z-axis coordinate (that is, the position away from the MEMS mirror 4), and the size of the reflecting surface is increased.

The convex mirror 6Aa is irradiated with the projection light L1 reflected by the MEMS mirror 4 and the return light L2 as its return light toward the range of the azimuth angle indicated by the broken line arrow 8Aa, and the convex mirror 6Ab is irradiated with the broken line. The projection light L1 reflected by the MEMS mirror 4 and the return light L2 that is the return light are irradiated toward the range of the azimuth angle indicated by the arrow 8Ab. The concave mirror 6Ba is irradiated with the projection light L1 reflected by the MEMS mirror 4 and the return light L2 that is the return light toward the range of the azimuth angle indicated by the broken arrow 8Ba, and the broken mirror 6Bb is irradiated with the broken arrow 8Bb. The projection light L1 reflected by the MEMS mirror 4 and the return light L2 that is the return light are irradiated toward the range of the azimuth angle indicated by.

Also, solid arrows 8Ca and 8Cb indicate ranges in which the light (that is, the projection light L1 and the return light L2) is transmitted and received by the measurement device 100. Here, the projection light L1 irradiated to the concave mirror 6Ba is reflected by the concave mirror 6Ba, so that the azimuth angle changes by 180 degrees. As a result, the projection light L1 irradiated to the concave mirror 6Ba is emitted in the range of the azimuth angle indicated by the solid line arrow 8Ca having the same azimuth as the projection light L1 irradiated to the convex mirror 6Aa. Further, the projection light L1 irradiated to the concave mirror 6Bb is reflected by the concave mirror 6Bb, whereby the azimuth angle changes by 180 degrees. As a result, the projection light L1 irradiated on the concave mirror 6Bb is emitted in the range of the azimuth angle indicated by the solid line arrow 8Cb having the same azimuth as the projection light L1 irradiated on the convex mirror 6Ab. Further, the projection light L1 reflected by the convex mirror 6Aa and the concave mirror 6Ba is emitted from the measuring device 100 from different heights with the same elevation angle. Further, the projection light L1 reflected by the convex mirror 6Ab and the concave mirror 6Bb is also emitted from the measurement apparatus 100 from different heights with the same elevation angle. Each elevation angle may be the same or different.

As described above, even with the configuration of the present modification, the measuring apparatus 100 uses the projection light L1 reflected by the concave mirror 6Ba and the concave mirror 6Bb, similarly to the projection light L1 reflected by the convex mirror 6Aa and the convex mirror 6Ab. The frame rate can be suitably improved by injecting the light to the front side.

(Modification 6)
In the example of FIG. 2 and the like, the projection light L1 reflected by the concave mirror 6B is emitted from the concave mirror 6B in parallel with the projection light L1 reflected by the convex mirror 6A (that is, by the same elevation angle). Instead, for example, when the distance to the measurement object 10 is known in advance, the projection light L1 reflected by the concave mirror 6B and the projection light L1 reflected by the convex mirror 6A are predetermined. It may be ejected at different elevation angles so that they overlap at a distance.

FIG. 11 is a diagram schematically illustrating a state in which the projection light L1 is irradiated to the measurement target 10 existing at a predetermined distance (for example, 5 m) from the measurement apparatus 100. In FIG. 11, a solid line shows the central ray of the projection light L1. In the example of FIG. 11, the projection light L1 reflected by the convex mirror 6A and the projection light L1 reflected by the concave mirror 6B are emitted from the measuring device 100 at different elevation angles from positions separated by a predetermined distance in the Z-axis direction. Is done. Then, in the vicinity of the measurement object 10, the overlap between the projection light L1 reflected by the convex mirror 6A and the projection light L1 reflected by the concave mirror 6B is maximized. In other words, in the vicinity of the measurement object 10, the central light beam of the projection light L1 reflected by the convex mirror 6A and the central light beam of the projection light L1 reflected by the convex mirror 6A overlap.

As described above, in the example of FIG. 11, the convex mirror 6A and the concave mirror 6B measure the central ray of the projection light L1 reflected by the convex mirror 6A and the central ray of the projection light L1 reflected by the convex mirror 6A. The projection light L1 is reflected by the elevation angle that overlaps in the vicinity of the object 10. Also by this, the measuring device 100 can substantially improve the frame rate when irradiating the measurement target 10 with the projection light L1.

<Second embodiment>
In the second embodiment, the optical member 5 is configured to be rotatable about an axis (Z axis) extending in a predetermined direction, and the control unit 2 extends the optical member 5 in a predetermined direction according to the traveling state of the vehicle ( By rotating around the Z axis), the scanning range by the projection light L1 (that is, the irradiation range in which the projection light L1 is irradiated to the outside) is changed.

FIG. 12 shows a schematic configuration of a measuring apparatus 100A according to the second embodiment. In addition to the light source unit 1, the control unit 2, the light receiving unit 3, the MEMS mirror 4, and the optical member 5 described in the first embodiment, the measuring device 100A includes a motor 11, a motor control unit 12, a user interface 13, and a current position. The acquisition part 14, the map information acquisition part 15, and the vehicle behavior acquisition part 16 are provided. Henceforth, the same code | symbol is attached | subjected suitably about the component similar to the measuring apparatus 100 of 2nd Example, and the description is abbreviate | omitted.

The motor 11 rotates the optical member 5 about the Z axis as a rotation axis based on the applied voltage supplied from the motor control unit 12. The motor 11 is an example of the “adjustment mechanism” in the present invention. The motor control unit 12 performs drive control of the motor 11 based on the control signal supplied from the control unit 2. The user interface 13 is a button, a touch panel, a remote controller, a voice input device, or the like for a user to operate, accepts various inputs (external inputs), and supplies input information to the control unit 2.

The current position acquisition unit 14 acquires position information indicating the current position of the vehicle. The current position acquisition unit 14 may generate position information based on an output of a self-supporting positioning device such as a gyro sensor (not shown) or / and a GPS receiver or the like, and may receive vehicle position information estimated by other devices. Also good. Further, the position information acquired by the current position acquisition unit 14 may be position information estimated with high accuracy based on information such as the distance to the measurement target 10 calculated by the control unit 2.

The map information acquisition unit 15 acquires map information around the current position of the vehicle from map information stored in a storage unit (not shown). The map information acquired by the map information acquisition unit 15 includes, for example, feature information and road information around the current position of the vehicle.

The vehicle behavior acquisition unit 16 acquires behavior information that is information related to vehicle behavior. For example, the vehicle behavior acquisition unit 16 acquires vehicle speed information, blinker information, transmission (gear) information, and the like as behavior information from a vehicle or the like using a communication protocol such as CAN (Controller Area Network).

The control unit 2, the motor control unit 12, the current position acquisition unit 14, the map information acquisition unit 15, and the vehicle behavior acquisition unit 16 may be configured by a CPU or the like. The current position acquisition unit 14, the map information acquisition unit 15, and the vehicle behavior acquisition unit 16 may be configured by a communication module that receives information from an external device.

Next, specific examples (first to third control examples) of rotation control of the optical member 5 by the control unit 2 will be described in order.

In the first control example, the control unit 2 rotates the optical member 5 by driving the motor 11 based on the input information supplied from the user interface 13. In this case, the control part 2 adjusts the scanning range by the projection light L1 based on a user's manual operation.

FIGS. 13A and 13B are diagrams schematically showing a cross-sectional structure of the optical member 5 whose direction is adjusted so that the front of the vehicle is within the scanning range of the projection light L1. In FIGS. 13A and 13B, the projection light L1 is forwarded by the convex mirror 6A or the concave mirror 6B to the front of the vehicle (here, the X-axis positive direction) regardless of which direction the MEMS mirror 4 is directed. The direction of the optical member 5 is adjusted so as to be emitted to 14A and 14B are diagrams schematically showing a cross-sectional structure of the optical member 5 whose direction is adjusted so that the rear of the vehicle is within the scanning range of the projection light L1. In FIGS. 14A and 14B, the projection light L1 is projected to the rear of the vehicle (here, the X-axis negative direction) by the convex mirror 6A or the concave mirror 6B regardless of which direction the MEMS mirror 4 is directed. The direction of the optical member 5 is adjusted so as to be emitted to

Then, for example, in a situation where the information on the front side of the vehicle is more important than the other direction, the user performs an input operation with the optical member 5 in the direction shown in FIGS. Under a situation in which information is more important than other directions, an input operation is performed in which the optical member 5 is oriented as shown in FIGS. 14 (A) and 14 (B). In this case, the user interface 13 is a switch or button for selecting either the orientation shown in FIGS. 13 (A) and (B) or the orientation shown in FIGS. 14 (A) and (B). Etc. When the control unit 2 determines that the optical member 5 needs to be directed in a direction different from the current direction based on the input information supplied from the user interface 13, the control unit 2 controls the motor 11 to rotate the optical member 5 by 180 degrees. Drive.

As described above, according to the first control, the control unit 2 can substantially improve the frame rate and determine the scanning range based on the user operation, and can suitably improve the detection accuracy for the object to be detected. it can.

In the second control, the control unit 2 uses the map information acquired from the map information acquisition unit 15 and / or the behavior information supplied from the vehicle behavior acquisition unit 16 or the like in a direction that relatively requires scanning with the projection light L1. And the direction of the optical member 5 is automatically controlled so that the projection light L1 is emitted in this direction.

For example, the control unit 2 acquires the current position information from the current position acquisition unit 14 and acquires the feature information related to the positions of the features around the current position from the map information acquisition unit 15. When the control unit 2 detects a direction in which no feature is clearly present with respect to the current position, the control unit 2 adjusts the direction of the optical member 5 so that the direction is not included in the scanning range of the projection light L1. . In another example, the control unit 2 recognizes the direction in which the vehicle is traveling (that is, whether it is forward or backward) based on the behavior information, and the recognized direction of the traveling vehicle is included in the scanning range by the projection light L1. Thus, the orientation of the optical member 5 is adjusted. In yet another example, the control unit 2 predicts that the vehicle will change lanes when the winker information is acquired as the behavior information, and changes the direction of the optical member 5 so that the rear of the vehicle is included in the scanning range by the projection light L1. adjust.

Thus, according to the second control, the control unit 2 improves the detection accuracy and the like for the object to be detected by appropriately determining the scanning range according to the situation by substantially improving the frame rate. Can be made. In the first and second controls, the control unit 2 is an example of the “determination unit” in the present invention.

In the third control, the control unit 2 emits the projection light L1 in all directions by rotating the optical member 5 according to the angle of the MEMS mirror 4 (that is, continuously changing the direction).

FIGS. 15A and 15B are diagrams schematically showing a cross-sectional structure of the optical member 5 when the optical member 5 is rotated based on the third control. In the example of FIGS. 15A and 15B, the optical member 5 is rotated in accordance with the change in the direction of the MEMS mirror 4 so that the MEMS mirror 4 is directed in the positive direction of the X axis (that is, the normal vector). The convex mirror is used in any of the cases where the X coordinate is a positive value (see FIG. 15A) and the MEMS mirror 4 is facing the negative X-axis direction (see FIG. 15B). The projection light L1 is reflected by 6A. In this case, the scanning range by the projection light L1 is not limited to the X-axis positive direction but also includes the X-axis negative direction.

Note that the rotation period of the optical member 5 is preferably within twice the scanning period of the MEMS mirror 4. In other words, the scanning speed by the MEMS mirror 4 is preferably within twice the rotational speed of the optical member 5. Here, as shown in FIG. 4, the convex mirror 6A and the concave mirror 6B each have a semicircle (that is, a fan shape with a central angle of 180 degrees) in the XY plan view. Therefore, in this case, while the MEMS mirror 4 scans the projection light L1 in all directions of 360 degrees, either the convex mirror 6A or the concave mirror 6B is always irradiated with the projection light L1. In other words, in this case, the period from when the projection light L1 is applied to one of the convex mirror 6A or the concave mirror 6B to when the projection light L1 is applied to the other of the convex mirror 6A or the concave mirror 6B is 1 by the MEMS mirror 4. Since this is longer than the scanning cycle, the projection light L1 is preferably emitted in all directions of 360 degrees during this period. On the other hand, when the rotation cycle of the optical member 5 is longer than twice the scanning cycle by the MEMS mirror 4, the projection light L1 is irradiated to one of the convex mirror 6A or the concave mirror 6B, and then the MEMS mirror 4 is 360 degrees. Before the projection light L1 is scanned in all directions, the other of the convex mirror 6A or the concave mirror 6B is irradiated with the projection light L1 (that is, the optical surface of the optical member 5 irradiated with the projection light L1 changes), and the projection light The injection direction of L1 changes by 180 degrees. Therefore, in this case, the projection light L1 cannot be scanned in all directions of 360 degrees.

Preferably, the control unit 2 may switch the execution of the third control for emitting the projection light L1 in all directions according to the vehicle or the situation around the vehicle. In other words, the control unit 2 executes the third control in a situation where omnidirectional information is required, and executes the third control in a situation where omnidirectional information is not necessary (scanning only in a predetermined direction is sufficient). do not do.

Here, the situation where information on all directions is necessary is, for example, when there are other vehicles in the vicinity, when multiple features are scattered at positions that cannot be scanned in the 180-degree scanning range, or near intersections. This applies when the vehicle is running. The situation where information on all directions is not necessary is, for example, when there is no other vehicle in the vicinity, and there is no feature only in a predetermined direction (that is, a feature or the like at a position that can be scanned in a 180-degree scanning range). Or the case where the vehicle is traveling normally during which only the traveling direction needs to be scanned.

Then, the control unit 2, for example, the current position information of the vehicle output by the current position acquisition unit 14 and the map information output by the map information acquisition unit 15 (here, the feature information regarding the positions of the features around the vehicle). Based on the above, it is determined whether or not the information of all directions is necessary. In addition, the control part 2 detects the presence or absence of other vehicles around the vehicle from, for example, sensors such as inter-vehicle communication and a camera. When the control unit 2 determines that the omnidirectional information is necessary, the control unit 2 executes the third control for emitting the projection light L1 in all the directions, and determines that the omnidirectional information is not necessary. In such a case, the third control is not executed. As a result, the control unit 2 suitably acquires omnidirectional information in a situation where omnidirectional information is required, and in a situation where omnidirectional information is not required, the control unit 2 substantially sets the frame rate in the specific azimuth to be measured. Can be improved.

Note that Modifications 1 to 5 of the first embodiment are also preferably applied to the second embodiment.

DESCRIPTION OF SYMBOLS 1 Light source part 2 Control part 3 Light-receiving part 4 MEMS mirror 5 Optical member 10 Measurement object 11 Motor 12 Motor control part 13 User interface 14 Current position acquisition part 15 Map information acquisition part 16 Vehicle behavior acquisition part 100, 100A Measuring device

Claims

An irradiator that irradiates electromagnetic waves while changing the irradiation direction;
A first region on an object irradiated with the electromagnetic wave irradiated from the irradiation unit in a first period within one cycle, and the object irradiated with the electromagnetic wave irradiated from the irradiation unit in a second period. A reflection part that reflects the electromagnetic wave irradiated by the irradiation part in the second period so that at least a part of the second area that is the upper area overlaps;
Measuring device.
The measuring device according to claim 1, further comprising a receiving unit capable of receiving the electromagnetic wave reflected by an object included in a scanning surface by the electromagnetic wave irradiated by the irradiation unit.
The reflection part has a first reflection part and a second reflection part,
The said irradiation part has a movable reflection part which irradiates the said electromagnetic wave to the said 1st reflection part in the said 1st period, and irradiates the said electromagnetic wave to the said 2 reflection part in the said 2nd period. Measuring device.
The electromagnetic wave irradiated in the first period and the electromagnetic wave irradiated in the second period are irradiated at an elevation angle such that at least a part of the first region and the second region overlap. The measuring device according to any one of the above.
The electromagnetic wave reflected by the second reflecting part is emitted at the same elevation angle as the electromagnetic wave reflected by the first reflecting part when the object is separated by a predetermined distance or more. The measuring device according to any one of the above.
The second reflecting portion has a first reflecting surface and a second reflecting surface,
The first reflection surface reflects the electromagnetic wave irradiated by the irradiation unit in the second period to the second reflection surface,
6. The second reflecting surface according to claim 3, wherein the second reflecting surface reflects the electromagnetic wave reflected from the first reflecting surface so that at least a part of the first region and the second region overlap each other. The measuring device described in 1.
A first optical member having the first reflecting portion and a first refractive surface;
A second optical member having the second reflecting portion and a second refracting surface;
In the first period, the electromagnetic wave passes through the first refracting surface before and after being reflected by the first reflecting surface, and in the second period, the electromagnetic wave is reflected by the second reflecting surface. 7. The measuring device according to claim 3, wherein the measuring device passes through the second refracting surface.
The measuring apparatus according to any one of claims 1 to 7, further comprising an adjustment mechanism that moves the reflecting section so as to change the first period and the second period in the one cycle.
A determination unit for determining an irradiation range in which the first electromagnetic wave and the second electromagnetic wave are irradiated to the outside;
The measurement device according to claim 8, wherein the adjustment mechanism moves the reflection unit so that the first electromagnetic wave and the second electromagnetic wave are irradiated to the irradiation range determined by the determination unit.
The determining unit determines the irradiation range based on an external input, or determines the irradiation range based on behavior information of a moving body on which the measurement device is mounted or on feature information about a feature around the moving body. The measuring device according to claim 9.
The reflection part is rotatable about an axis extending from the irradiation part in the predetermined direction as a rotation axis,
The measurement apparatus according to claim 8, wherein the adjustment mechanism rotates the reflection unit according to a change in the irradiation direction.
An irradiation unit for irradiating electromagnetic waves emitted from the light source;
A first reflecting part for reflecting the electromagnetic wave irradiated in the first period;
A second reflecting portion for reflecting the electromagnetic wave irradiated in the second period;
Have
The measuring device, wherein the second reflection unit reflects the electromagnetic wave so that at least a part of a range in which the first reflection unit reflects the electromagnetic wave and a range in which the second reflection unit reflects the electromagnetic wave overlap.