WO2018126685A1 - 溅射缝隙测量工具、磁控溅射设备 - Google Patents

溅射缝隙测量工具、磁控溅射设备 Download PDF

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Publication number
WO2018126685A1
WO2018126685A1 PCT/CN2017/096726 CN2017096726W WO2018126685A1 WO 2018126685 A1 WO2018126685 A1 WO 2018126685A1 CN 2017096726 W CN2017096726 W CN 2017096726W WO 2018126685 A1 WO2018126685 A1 WO 2018126685A1
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Prior art keywords
test platform
horizontal
horizontal test
disposed
base
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Ceased
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PCT/CN2017/096726
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English (en)
French (fr)
Inventor
康英男
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BOE Technology Group Co Ltd
Ordos Yuansheng Optoelectronics Co Ltd
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BOE Technology Group Co Ltd
Ordos Yuansheng Optoelectronics Co Ltd
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Priority to US15/756,980 priority Critical patent/US10886114B2/en
Publication of WO2018126685A1 publication Critical patent/WO2018126685A1/zh
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3476—Testing and control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/14—Measuring arrangements characterised by the use of mechanical techniques for measuring distance or clearance between spaced objects or spaced apertures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32917—Plasma diagnostics
    • H01J37/3299—Feedback systems
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
    • H01J37/3405—Magnetron sputtering
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411—Constructional aspects of the reactor
    • H01J37/3447—Collimators, shutters, apertures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3488—Constructional details of particle beam apparatus not otherwise provided for, e.g. arrangement, mounting, housing, environment; special provisions for cleaning or maintenance of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/245—Detection characterised by the variable being measured
    • H01J2237/24571—Measurements of non-electric or non-magnetic variables
    • H01J2237/24578—Spatial variables, e.g. position, distance

Definitions

  • the present disclosure relates to the field of liquid crystal product manufacturing technology, and in particular, to a sputtering gap measuring tool and a magnetron sputtering device.
  • PVD Physical Vapor Deposition
  • the glass needs to be in an upright state during film formation. At this time, the glass is attached to the quartz plate.
  • the device cavity is flanked by a floating mask, which is mainly used to control the film formation shape, thereby affecting the edge film formation area.
  • the adjustment of the film formation area is mainly achieved by adjusting the distance between the quartz plate and the floating mask. This distance is the Gap value.
  • the Gap value is directly related to the glass film formation area and the uniformity of the film. .
  • the tools currently used for PVD Gap measurement and adjustment mainly use the feeler gauge.
  • the use of the feeler gauge to adjust the Gap value has the following disadvantages:
  • the feeler gauge may be bent, which also causes errors in the measured values.
  • the feeler gauge may have insufficient range, so a new feeler gauge must be replaced before the measurement can be continued. increase cost.
  • the present disclosure provides a sputtering gap measuring tool, a magnetron sputtering device, which does not require the use of a feeler gauge, wherein the moving distance of the horizontal test platform from the first position to the second position is the abutment and the activity The distance between the plates in the horizontal direction is accurate.
  • a sputtering gap measuring tool for a magnetron sputtering apparatus the magnetron sputtering apparatus including a base for carrying a substrate and a base set A movable plate disposed on the side parallel to the base, the sputtering gap measuring tool includes:
  • a horizontal test platform for being disposed on the base, and when the horizontal test platform is in the first position, a first edge of the horizontal test platform is flush with an edge of the first side of the base;
  • a first moving structure for controlling the horizontal test platform to move in a direction close to the movable plate, and when the horizontal test platform moves to the second position, the horizontal test platform is in contact with the movable plate;
  • a distance measuring structure for measuring a moving distance of the horizontal test platform from the first position to the second position.
  • the first moving structure includes a base for being disposed on the base, the horizontal test platform is movably disposed on the base, and the distance measuring structure includes a scale disposed on a side of the base. When the horizontal test platform is in the first position, the scale value corresponding to the second edge disposed opposite to the first edge on the horizontal test platform is 0.
  • the first moving structure further includes a horizontal rotating wheel disposed on a side of the horizontal testing platform and a transmission member disposed between the horizontal testing platform and the base, wherein the transmission component is turned at the horizontal direction
  • the horizontal test platform is driven to move in the horizontal direction under the driving of the wheel.
  • the base includes a first surface on which the horizontal test platform is disposed and a second surface opposite to the first surface, and the second surface is provided with a convex portion on a first side of the base Corresponding card slot.
  • a first connecting rod disposed at a first edge of the horizontal test platform, disposed perpendicular to the horizontal test platform;
  • a second moving structure configured to control the patch to move toward the movable plate along the first connecting rod, and when the patch is in the third position, the patch contacts the movable plate ;
  • the distance measuring structure is further configured to measure a distance between the patch and the horizontal energy test platform in a vertical direction when the patch is in the third position.
  • the distance measuring structure further includes a vertical measuring ruler disposed at a first edge of the horizontal testing platform, and a scale value of the end of the vertical measuring ruler contacting the horizontal testing platform is 0, the vertical The outer side of the straight measuring ruler is located on the same plane as the side corresponding to the first edge of the horizontal test platform;
  • a second connecting rod connected to the patch and moving synchronously with the patch, the second connecting rod and the patch are at the same horizontal plane, and the second connecting rod is opposite to the horizontal testing platform Parallelly disposed, one end of the second connecting rod away from the patch is provided with a connecting portion that is in contact with the vertical measuring rule.
  • the second moving structure further includes a vertical rotating wheel disposed on the first connecting rod and a transmission member disposed between the first connecting rod and the patch, the transmission member is in the The movement of the patch is driven by the driving of the vertical wheel.
  • the base platform has a rectangular structure
  • the horizontal test platform has a rectangular structure
  • the present disclosure also provides a magnetron sputtering apparatus comprising the sputtering gap measuring tool described above.
  • the beneficial effect of the present disclosure is that the moving distance of the horizontal test platform from the first position to the second position is the distance between the base and the movable panel in the horizontal direction without using a feeler gauge. The measurement is accurate.
  • FIG. 1 is a schematic view showing the structure of a sputtering gap measuring tool in an embodiment of the present disclosure
  • FIG. 2 shows a schematic block diagram of a magnetron sputtering apparatus in accordance with an embodiment of the present disclosure.
  • the embodiment provides a sputtering gap measuring tool for a magnetron sputtering device.
  • the magnetron sputtering apparatus includes a base 10 for carrying a substrate, and a movable plate 20 disposed on the first side of the base 10 in parallel with the base 10, between the base 10 and the movable plate 20 The distance is the sputtering gap, and the sputtering gap measurement tool includes:
  • a horizontal test platform 1 disposed on the base 10 when performing measurement, and the first edge of the horizontal test platform 1 and the first side of the base 10 when the horizontal test platform 1 is in the first position The edges are flush;
  • a first moving structure for controlling movement of the horizontal test platform 1 in a direction close to the movable panel 20, and when the horizontal test platform 1 is moved to a second position, the horizontal test platform 1 is in contact with the movable panel 20 ;
  • a distance measuring structure for measuring a moving distance of the horizontal test platform 1 from the first position to the second position.
  • the moving distance of the horizontal test platform 1 from the first position to the second position is the distance between the base 10 and the movable panel 20 in the horizontal direction, and then measured by distance
  • the structure measures the moving distance of the horizontal test platform 1 from the first position to the second position, and the measurement is accurate and the service life is long.
  • the specific structure of the first moving structure may be various, as long as the movement of the horizontal test platform 1 is controlled.
  • the first moving structure includes the first mobile structure disposed on the base 10 during measurement. a base 2, the horizontal test platform 1 is movably disposed on the base 2, and the distance measuring structure includes a scale disposed on a side of the base 2 (the scale 21 in FIG. 1 , and the scale of the figure in FIG. 1 is only Schematic, in actual use, the scale 21 can be covered with the entire side of the base to meet the range requirement.
  • the horizontal test platform 1 is in the first position, the horizontal test platform 1 is opposite to the first edge.
  • the set second edge corresponds to a scale value of zero.
  • the horizontal test platform 1 is movably disposed on the base 2, and the surface of the base 2 connected to the horizontal test platform 1 is a horizontal plane to ensure the stability of horizontal placement of the horizontal test platform 1.
  • the distance measuring structure includes a scale disposed on a side of the base 2, the horizontal test platform 1 moves in a direction close to the movable panel 20, and the horizontal test platform 1 moves to the second
  • the scale value is the horizontal test platform 1
  • the moving distance from the first position to the second position that is, the horizontal distance between the base 10 and the movable panel 20.
  • the first moving structure further includes a horizontal runner 3 disposed on a side of the horizontal test platform 1, a transmission member disposed between the horizontal test platform 1 and the base 2, and the transmission
  • the horizontal test platform 1 is driven to move in the horizontal direction under the driving of the horizontal wheel 3.
  • the transmission member may have a plurality of specific structural forms.
  • the transmission member includes a transmission wheel engaged with the horizontal reel 3, a lead screw connected to the transmission wheel, and the lead screw and the lead screw The base 2 is connected.
  • the base 2 includes a first surface on which the horizontal test platform 1 is disposed and a second surface opposite to the first surface, and the second surface is provided with the base 10
  • the protrusions 101 on the first side correspond to the card slots.
  • the arrangement of the card slot facilitates the smooth placement of the base 2 on the base 10 to ensure the horizontal stability of the surface of the base 2 connected to the horizontal test platform 1.
  • the sputtering gap measuring tool further includes:
  • a first connecting rod 6 disposed at a first edge of the horizontal testing platform 1 , which is disposed perpendicular to the horizontal testing platform 1;
  • a second moving structure for controlling the patch 8 to move along the first connecting rod 6 toward the movable panel 20, and when the patch 8 is in the third position, the patch 8 is The movable panel 20 is in contact;
  • the distance measuring structure is further configured to measure a distance between the patch 8 and the horizontal test platform 1 in a vertical direction when the patch 8 is in the third position.
  • the distance between the patch 8 and the horizontal test platform 1 in the vertical direction is the distance between the base 10 and the movable panel 20 in the vertical direction, and then the patch 8 is measured by the distance measuring structure.
  • the distance between the patch 8 and the horizontal energy test platform in the vertical direction is accurate, and the measurement life is long.
  • the distance measurement structure further includes a first set on the horizontal test platform 1 a vertical measuring rule 4 of the edge, the scale of the end of the vertical measuring rule 4 contacting the horizontal test platform 1 is 0, and the outer side of the vertical measuring rule 4 and the horizontal testing platform 1 The sides corresponding to one edge are located on the same plane;
  • a second connecting rod 5 connected to the patch 8 and moving synchronously with the patch 8, the second connecting rod 5 and the patch 8 are at the same horizontal plane, and the second connecting rod 5 is
  • the horizontal test platforms 1 are arranged in parallel, and one end of the second connecting rod 5 remote from the patch 8 is provided with a connecting portion 51 that is in contact with the vertical measuring tape 4.
  • the scale on the vertical measuring rule 4 corresponding to the connecting portion 51 and the horizontal test platform 1 The sum of the distances from the upper surface to the base 10 is the distance of the sputtering slit in the vertical direction.
  • the scale value of the end of the vertical measuring rule 4 contacting the horizontal test platform 1 is a distance between the surface of the horizontal measuring platform 4 and the surface of the base 10;
  • the scale value on the vertical measuring scale 4 corresponding to the connecting portion 51 may be directly read.
  • the second moving structure further includes a vertical rotating wheel 7 disposed on the first connecting rod 6, and a transmission member disposed between the first connecting rod 6 and the patch 8.
  • the transmission member drives the patch 8 to move under the driving of the vertical wheel 7.
  • the base 10 has a rectangular structure
  • the horizontal test platform 1 has a rectangular structure
  • the vertical distance and the horizontal distance between the base 10 and the movable plate 20 can be directly measured.
  • the movable plate 20 and the base can be adjusted. The position between the stations 10.
  • the base 10 adopts a quartz plate, and the sputtering slit measuring tool is disposed on the base 10, and the card slot on the base 2 is matched with the protrusion 101 on the base 10 to ensure a sputtering gap.
  • the horizontal test platform 1 Measuring the stability of the tool, and ensuring that the horizontal test platform 1 is in the first position, that is, the scale value corresponding to the second edge of the horizontal test platform 1 opposite to the first edge is 0, and The patch 8 is placed at the lowest position; then the horizontal wheel 3 is rotated to horizontally move the horizontal test platform 1 to a preset position, and the vertical wheel 7 is rotated such that the patch 8 moves in the vertical direction to the pre-position Positioning; then, moving the movable panel 20 such that the movable panel 20 is in contact with the horizontal test platform 1 in the horizontal direction, and is in contact with the patch 8 in the vertical direction. At this time, the movable panel 20 is The distance between the bases 10 is the preset sputtering gap value.
  • the sputtering gap measuring tool of the embodiment adopts the surface fitting measurement to ensure the accuracy of the measurement value; the range of the tool is greatly increased, and the range problem of the tool is solved; the fixed sputtering gap can be measured,
  • the value can be fixed first, and then the position of the movable plate 20 can be fixed according to the value; considering the shape of the base 10, the base 2 is set according to the shape thereof, so that the sputtering gap measuring tool can be firmly integrated with the quartz plate (this In the embodiment, the base 10 is a quartz plate surface, and the level of the horizontal test platform 1 is ensured (the card slot on the base 2 cooperates with the protrusion 101 on the side of the base 10), so that the measurement can be made.
  • the process is more robust and precise, solving the problem of measurement stability.
  • FIG. 2 shows a schematic block diagram of a magnetron sputtering apparatus in accordance with an embodiment of the present disclosure.
  • the magnetron sputtering apparatus 200 includes a sputtering gap measuring tool 201 as described above.

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

一种溅射缝隙测量工具，用于磁控溅射设备（200），磁控溅射设备（200）包括用于承载基板的基台（10），和设置于基台（10）第一侧的、与基台（10）平行设置的活动板（20），基台（10）与活动板（20）之间的距离为溅射缝隙，溅射缝隙测量工具包括：水平测试平台（1），进行测量时设置于基台（10）上，且水平测试平台（1）位于第一位置时，水平测试平台（1）的第一边缘与基台（10）的第一侧的边缘平齐；第一移动结构，用于控制水平测试平台（1）向靠近活动板（20）的方向移动，在水平测试平台（1）移动到第二位置时，水平测试平台（1）与活动板（20）接触；距离测量结构，用于测量水平测试平台（1）从第一位置到第二位置的移动距离。本公开还涉及一种磁控溅射设备（200）。

Description

溅射缝隙测量工具、磁控溅射设备
相关申请的交叉引用
本申请要求于2017年1月3日在中国国家知识产权局提交的第201720004344.9号中国专利申请的优先权，其全部内容通过引用并入本文。
技术领域
本公开涉及液晶产品制作技术领域，尤其涉及一种溅射缝隙测量工具、磁控溅射设备。
背景技术
PVD(Physical Vapor Deposition-物理气相沉积)是在真空状态下进行磁控溅射的，玻璃在成膜的时候需要处在竖立状态下，此时，玻璃贴在石英板上面。设备腔体侧接有Floating Mask(活动板)，主要用于控制成膜形状，从而影响边缘成膜区域。成膜区域的调节主要是通过调节石英板与Floating Mask之间的距离来实现的，此距离即为Gap(缝隙)值，Gap值的好坏直接关系到玻璃成膜区域和均一性的好坏。
现在用于PVD Gap值测量和调整的工具主要使用塞尺，然而现在使用塞尺对Gap值进行调整有以下缺点：
(1)测量稳定性不够：石英板边缘的凸起部分会极大影响塞尺的水平放置程度，塞尺如果不能与石英板平行放置，则所测数值极有可能不准确。
(2)长时间使用以后，塞尺有可能出现弯曲，同样导致测量数值出现误差。
(3)一旦A、B数值(缝隙值中的竖直数值和水平数值)由于工艺需要进行修改，塞尺有可能出现量程不够使用的情况，则必须要更换新的塞尺才可以继续测量，增加成本。
(4)测试人员不同，则可能由于测试力度的不同而出现测量结果差异较大的问题。
发明内容
为了解决上述技术问题，本公开提供一种溅射缝隙测量工具、磁控溅射设备，无需使用塞尺，其中水平测试平台从第一位置到第二位置的移动距离即为基台和与活动板之间的、在水平方向的距离，测量准确。
为了达到上述目的，本公开采用的技术方案是：一种溅射缝隙测量工具，用于磁控溅射设备，所述磁控溅射设备包括用于承载基板的基台和设置于基台第一侧的、与所述基台平行设置的活动板，溅射缝隙测量工具包括：
水平测试平台，用于设置于所述基台上，且所述水平测试平台位于第一位置时，所述水平测试平台的第一边缘与基台的所述第一侧的边缘平齐；
第一移动结构，用于控制所述水平测试平台向靠近所述活动板的方向移动，在所述水平测试平台移动到第二位置时，所述水平测试平台与活动板接触；
距离测量结构，用于测量所述水平测试平台从所述第一位置到所述第二位置的移动距离。
进一步的，所述第一移动结构包括用于设置于基台上的底座，所述水平测试平台可移动地设置于所述底座上，所述距离测量结构包括设置于所述底座侧面的刻度，所述水平测试平台位于第一位置时，所述水平测试平台上与所述第一边缘相对设置的第二边缘对应的刻度值为0。
进一步的，所述第一移动结构还包括设置于所述水平测试平台侧面的水平转轮和设置于所述水平测试平台和所述底座之间的传动件，所述传动件在所述水平转轮的驱动下带动所述水平测试平台在水平方向上移动。
进一步的，所述底座包括设置所述水平测试平台的第一表面和与所述第一表面相背的第二表面，所述第二表面上设置有与所述基台的第一侧的凸起相对应的卡槽。
进一步的，还包括：
设置于所述水平测试平台的第一边缘的第一连接杆，其与所述水平测试平台相垂直设置；
可移动地设置于所述第一连接杆上的贴片，所述贴片与所述水平测试平台平行设置；
第二移动结构，用于控制所述贴片沿着所述第一连接杆向靠近所述活动板方向移动，在所述贴片位于第三位置时，所述贴片与所述活动板接触；
所述距离测量结构还用于测量所述贴片位于所述第三位置时，所述贴片与所述水平能测试平台在竖直方向的距离。
进一步的，所述距离测量结构还包括设置于所述水平测试平台第一边缘的竖直测尺，所述竖直测尺与所述水平测试平台接触的一端的刻度值为0，所述竖直测尺的外侧面与所述水平测试平台的第一边缘对应的侧面位于同一平面；
与所述贴片连接的、与所述贴片同步移动的第二连接杆，所述第二连接杆与所述贴片在同一水平面，且所述第二连接杆与所述水平测试平台相平行设置，所述第二连接杆远离所述贴片的一端设有与所述竖直测尺相接触的连接部。
进一步的，所述第二移动结构还包括设置于所述第一连接杆上的竖直转轮和设置于所述第一连接杆和所述贴片之间的传动件，该传动件在所述竖直转轮的驱动下带动所述贴片移动。
进一步的，所述基台为矩形结构，所述水平测试平台为矩形结构。
本公开还提供一种磁控溅射设备，包括上述所述的溅射缝隙测量工具。
本公开的有益效果是：无需使用塞尺，所述水平测试平台从所述第一位置到所述第二位置的移动距离即为基台和与活动板之间的、在水平方向的距离，测量准确。
附图说明
图1表示本公开实施例中溅射缝隙测量工具结构示意图；以及
图2表示根据本公开实施例的磁控溅射设备的示意性框图。
具体实施方式
以下结合附图对本公开的特征和原理进行详细说明，所举实施例仅用于解释本公开，并非以此限定本公开的保护范围。
如图1所示，本实施例提供一种溅射缝隙测量工具，用于磁控溅射设备， 所述磁控溅射设备包括用于承载基板的基台10，和设置于基台10第一侧的、与所述基台10平行设置的活动板20，基台10与活动板20之间的距离为溅射缝隙，溅射缝隙测量工具包括：
水平测试平台1，进行测量时设置于所述基台10上，且所述水平测试平台1位于第一位置时，所述水平测试平台1的第一边缘与基台10的所述第一侧的边缘平齐；
第一移动结构，用于控制所述水平测试平台1向靠近所述活动板20的方向移动，在所述水平测试平台1移动到第二位置时，所述水平测试平台1与活动板20接触；
距离测量结构，用于测量所述水平测试平台1从所述第一位置到所述第二位置的移动距离。
无需使用塞尺，所述水平测试平台1从所述第一位置到所述第二位置的移动距离即为基台10和与活动板20之间的、在水平方向的距离，然后通过距离测量结构测量所述水平测试平台1从所述第一位置到所述第二位置的移动距离即可，测量准确，使用寿命长。
所述第一移动结构的具体结构形式可以有多种，只要实现控制所述水平测试平台1的移动即可，本实施例中，所述第一移动结构包括测量时设置于基台10上的底座2，所述水平测试平台1可移动的设置于所述底座2上，所述距离测量结构包括设置于所述底座2侧面的刻度(图1中的刻度21，图1中刻度的表示只是示意图，实际使用中，刻度21可以布满所述底座的整个侧面，以满足量程需要)，所述水平测试平台1位于第一位置时，所述水平测试平台1上与所述第一边缘相对设置的第二边缘对应的刻度值为0。
所述水平测试平台1可移动的设置于所述底座2上，所述底座2与所述水平测试平台1连接的表面为一水平面，保证所述水平测试平台1水平放置的稳定性。
本实施例中，所述距离测量结构包括设置于所述底座2侧面的刻度，所述水平测试平台1向靠近所述活动板20的方向移动，所述水平测试平台1移动到所述第二位置时与活动板20接触，此时只需直接读出所述水平测试平台1的所述第二边缘对应的刻度值即可，该刻度值即为所述水平测试平台1从 所述第一位置到所述第二位置的移动距离，即基台10与活动板20之间的水平距离。
本实施例中，所述第一移动结构还包括设置于所述水平测试平台1侧面的水平转轮3，设置于所述水平测试平台1和所述底座2之间的传动件，所述传动件在所述水平转轮3的驱动下带动所述水平测试平台1在水平方向上移动。
所述传动件的具体结构形式可以有多种，本实施例中，所述传动件包括与所述水平转轮3咬合的传动轮，与所述传动轮连接的丝杠，所述丝杠与所底座2连接。
本实施例中，所述底座2包括设置所述水平测试平台1的第一表面和与所述第一表面相背的第二表面，所述第二表面上设置有与所述基台10的第一侧的凸起101相对应的卡槽。
所述卡槽的设置利于所述底座2平稳的设置于基台10上，保证所述底座2与所述水平测试平台1连接的表面的水平稳定性。
本实施例中，溅射缝隙测量工具还包括：
设置于所述水平测试平台1的第一边缘的第一连接杆6，其与所述水平测试平台1相垂直设置；
移动的设置于所述第一连接杆6上的贴片8，所述贴片8与所述水平测试平台1平行设置；
第二移动结构，用于控制所述贴片8沿着所述第一连接杆6向靠近所述活动板20方向移动，在所述贴片8位于第三位置时，所述贴片8与所述活动板20接触；
所述距离测量结构还用于测量所述贴片8位于所述第三位置时，所述贴片8与所述水平测试平台1在竖直方向的距离。
所述贴片8与所述水平测试平台1在竖直方向的距离即为基台10和与活动板20之间的、在竖直方向的距离，然后通过距离测量结构测量所述贴片8位于所述第三位置时，所述贴片8与所述水平能测试平台在竖直方向的距离即可，测量准确，使用寿命长。
本实施例中，所述距离测量结构还包括设置于所述水平测试平台1第一 边缘的竖直测尺4，所述竖直测尺4与所述水平测试平台1接触的一端的刻度值为0，所述竖直测尺4的外侧面与所述水平测试平台1的第一边缘对应的侧面位于同一平面；
与所述贴片8连接的、与所述贴片8同步移动的第二连接杆5，所述第二连接杆5与所述贴片8在同一水平面，且所述第二连接杆5与所述水平测试平台1相平行设置，所述第二连接杆5远离所述贴片8的一端设有与所述竖直测尺4相接触的连接部51。
所述贴片8位于所述第三位置、即所述贴片8与活动板20接触时，所述连接部51对应的所述竖直测尺4上的刻度与所述水平测试平台1的上表面到基台10的距离之和即为溅射缝隙在竖直方向上的距离。
可选的，所述竖直测尺4与所述水平测试平台1接触的一端的刻度值为所述水平测试平台1设置竖直测尺4的表面到基台10之间的距离值，在测量所述活动板20与基台10之间的竖直方向的距离时，直接读取所述连接部51对应的竖直测尺4上的刻度值即可。
本实施例中，所述第二移动结构还包括设置于所述第一连接杆6上的竖直转轮7，设置于所述第一连接杆6和所述贴片8之间的传动件，该传动件在所述竖直转轮7的驱动下带动所述贴片8移动。
本实施例中，所述基台10为矩形结构，所述水平测试平台1为矩形结构。
采用本实施例溅射缝隙测量工具可以直接测量基台10与活动板20的竖直距离和水平距离，当溅射缝隙测量值与预设的溅射缝隙值不符，可以调节活动板20与基台10之间的位置。
也可以先将所述水平测试平台1移动预设距离，然后调节活动板20与所述水平测试平台1水平方向的距离使得活动板20与基台10接触，将贴片8移动到预设位置然后调节活动板20至与所述贴片8接触，以使得溅射缝隙为预设的数值，具体如下：
本实施例中基台10采用石英板，将溅射缝隙测量工具设置于基台10上，并且使得所述底座2上的卡槽与基台10上的凸起101相配合以保证溅射缝隙测量工具的稳定性，且保证所述水平测试平台1位于第一位置，即所述水平测试平台1上与所述第一边缘相对设置的第二边缘对应的刻度值为0，并且 使得所述贴片8位于最低处；然后转动水平转轮3使得所述水平测试平台1水平移动至预设位置，转动竖直转轮7使得所述贴片8沿着竖直方向移动到预设位置；然后，移动所述活动板20，使得活动板20在水平方向与所述水平测试平台1接触，在竖直方向与所述贴片8接触，此时，所述活动板20与所述基台10之间的距离即为预设的溅射缝隙值。
本实施例溅射缝隙测量工具，采用面贴合测量，保证测量数值准确性；极大的增加了工具的量程，解决了工具的量程问题；既可以对固定好的溅射缝隙进行测量，也可以先固定好数值，然后再根据数值固定活动板20的位置；充分考虑到基台10的形状，依据其形状设置了底座2，可以使溅射缝隙测量工具整体稳固的契合在石英板(本实施例中基台10为一石英板)表面，且保证了水平测试平台1的水平(所述底座2上的卡槽与基台10一侧的凸起101相配合)，这样可以使测量的过程更加稳固和精确，解决了测量的稳固性问题。
图2示出了根据本公开实施例的磁控溅射设备的示意性框图。如图2所示，磁控溅射设备200包括如上所述的溅射缝隙测量工具201。
以上所述为本公开较佳实施例，需要说明的是，对于本领域普通技术人员来说，在不脱离本公开所述原理的前提下，还可以做出若干改进和润饰，这些改进和润饰也应视为本公开保护范围。

Claims (16)

  1. 一种溅射缝隙测量工具，用于磁控溅射设备，所述磁控溅射设备包括用于承载基板的基台和设置于基台第一侧的、与所述基台平行设置的活动板，所述溅射缝隙测量工具包括：
    水平测试平台，用于设置于所述基台上，且所述水平测试平台位于第一位置时，所述水平测试平台的第一边缘与基台的所述第一侧的边缘平齐；
    第一移动结构，用于控制所述水平测试平台向靠近所述活动板的方向移动，在所述水平测试平台移动到第二位置时，所述水平测试平台与活动板接触；
    距离测量结构，用于测量所述水平测试平台从所述第一位置到所述第二位置的移动距离。
  2. 根据权利要求1所述的溅射缝隙测量工具，其中，所述第一移动结构包括用于设置于基台上的底座，所述水平测试平台可移动地设置于所述底座上，所述距离测量结构包括设置于所述底座侧面的刻度，所述水平测试平台位于第一位置时，所述水平测试平台上与所述第一边缘相对设置的第二边缘对应的刻度值为0。
  3. 根据权利要求2所述的溅射缝隙测量工具，其中，所述第一移动结构还包括设置于所述水平测试平台侧面的水平转轮和设置于所述水平测试平台和所述底座之间的传动件，所述传动件在所述水平转轮的驱动下带动所述水平测试平台在水平方向上移动。
  4. 根据权利要求2所述的溅射缝隙测量工具，其中，所述底座包括设置所述水平测试平台的第一表面和与所述第一表面相背的第二表面，所述第二表面上设置有与所述基台的第一侧的凸起相对应的卡槽。
  5. 根据权利要求1所述的溅射缝隙测量工具，还包括：
    设置于所述水平测试平台的第一边缘的第一连接杆，其与所述水平测试平台相垂直设置；
    可移动地设置于所述第一连接杆上的贴片，所述贴片与所述水平测试平台平行设置；
    第二移动结构，用于控制所述贴片沿着所述第一连接杆向靠近所述活动板方向移动，在所述贴片位于第三位置时，所述贴片与所述活动板接触；
    所述距离测量结构还用于测量所述贴片位于所述第三位置时，所述贴片与所述水平能测试平台在竖直方向的距离。
  6. 根据权利要求5所述的溅射缝隙测量工具，其中，所述距离测量结构还包括设置于所述水平测试平台第一边缘的竖直测尺，所述竖直测尺与所述水平测试平台接触的一端的刻度值为0，所述竖直测尺的外侧面与所述水平测试平台的第一边缘对应的侧面位于同一平面；
    与所述贴片连接的、与所述贴片同步移动的第二连接杆，所述第二连接杆与所述贴片在同一水平面，且所述第二连接杆与所述水平测试平台相平行设置，所述第二连接杆远离所述贴片的一端设有与所述竖直测尺相接触的连接部。
  7. 根据权利要求5所述的溅射缝隙测量工具，其中，所述第二移动结构还包括设置于所述第一连接杆上的竖直转轮和设置于所述第一连接杆和所述贴片之间的传动件，该传动件在所述竖直转轮的驱动下带动所述贴片移动。
  8. 根据权利要求1所述的溅射缝隙测量工具，其中，所述基台为矩形结构，所述水平测试平台为矩形结构。
  9. 一种磁控溅射设备，包括用于承载基板的基台和设置于基台第一侧的、与所述基台平行设置的活动板，，所述磁控溅射设备还包括溅射缝隙测量工具，所述溅射缝隙测量工具包括：
    水平测试平台，用于设置于所述基台上，且所述水平测试平台位于第一位置时，所述水平测试平台的第一边缘与基台的所述第一侧的边缘平齐；
    第一移动结构，用于控制所述水平测试平台向靠近所述活动板的方向移动，在所述水平测试平台移动到第二位置时，所述水平测试平台与活动板接触；
    距离测量结构，用于测量所述水平测试平台从所述第一位置到所述第二位置的移动距离。
  10. 根据权利要求9所述的磁控溅射设备，其中，所述第一移动结构包括用于设置于基台上的底座，所述水平测试平台可移动地设置于所述底座上， 所述距离测量结构包括设置于所述底座侧面的刻度，所述水平测试平台位于第一位置时，所述水平测试平台上与所述第一边缘相对设置的第二边缘对应的刻度值为0。
  11. 根据权利要求10所述的磁控溅射设备，其中，所述第一移动结构还包括设置于所述水平测试平台侧面的水平转轮和设置于所述水平测试平台和所述底座之间的传动件，所述传动件在所述水平转轮的驱动下带动所述水平测试平台在水平方向上移动。
  12. 根据权利要求10所述的磁控溅射设备，其中，所述底座包括设置所述水平测试平台的第一表面和与所述第一表面相背的第二表面，所述第二表面上设置有与所述基台的第一侧的凸起相对应的卡槽。
  13. 根据权利要求9所述的磁控溅射设备，还包括：
    设置于所述水平测试平台的第一边缘的第一连接杆，其与所述水平测试平台相垂直设置；
    移动地设置于所述第一连接杆上的贴片，所述贴片与所述水平测试平台平行设置；
    第二移动结构，用于控制所述贴片沿着所述第一连接杆向靠近所述活动板方向移动，在所述贴片位于第三位置时，所述贴片与所述活动板接触；
    所述距离测量结构还用于测量所述贴片位于所述第三位置时，所述贴片与所述水平能测试平台在竖直方向的距离。
  14. 根据权利要求13所述的磁控溅射设备，其中，所述距离测量结构还包括设置于所述水平测试平台第一边缘的竖直测尺，所述竖直测尺与所述水平测试平台接触的一端的刻度值为0，所述竖直测尺的外侧面与所述水平测试平台的第一边缘对应的侧面位于同一平面；
    与所述贴片连接的、与所述贴片同步移动的第二连接杆，所述第二连接杆与所述贴片在同一水平面，且所述第二连接杆与所述水平测试平台相平行设置，所述第二连接杆远离所述贴片的一端设有与所述竖直测尺相接触的连接部。
  15. 根据权利要求13所述的磁控溅射设备，其中，所述第二移动结构还包括设置于所述第一连接杆上的竖直转轮和设置于所述第一连接杆和所述贴 片之间的传动件，该传动件在所述竖直转轮的驱动下带动所述贴片移动。
  16. 根据权利要求9所述的磁控溅射设备，其中，所述基台为矩形结构，所述水平测试平台为矩形结构。
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