WO2018124861A3 - Time-of-flight mass spectrometer and component parts thereof - Google Patents

Time-of-flight mass spectrometer and component parts thereof Download PDF

Info

Publication number
WO2018124861A3
WO2018124861A3 PCT/KZ2017/000029 KZ2017000029W WO2018124861A3 WO 2018124861 A3 WO2018124861 A3 WO 2018124861A3 KZ 2017000029 W KZ2017000029 W KZ 2017000029W WO 2018124861 A3 WO2018124861 A3 WO 2018124861A3
Authority
WO
WIPO (PCT)
Prior art keywords
zonal
ion
coss
tofms
mirror
Prior art date
Application number
PCT/KZ2017/000029
Other languages
French (fr)
Russian (ru)
Other versions
WO2018124861A2 (en
Inventor
Алдан Асанович САПАРГАЛИЕВ
Original Assignee
Алдан Асанович САПАРГАЛИЕВ
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Алдан Асанович САПАРГАЛИЕВ filed Critical Алдан Асанович САПАРГАЛИЕВ
Publication of WO2018124861A2 publication Critical patent/WO2018124861A2/en
Publication of WO2018124861A3 publication Critical patent/WO2018124861A3/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/40Time-of-flight spectrometers

Abstract

The invention relates to electron analysis technology for determining the composition and structure of substances, and more particularly to the field of MR TOFMS analyzers (MR – multiple-reflection, TOFMS – time-of-flight mass spectrometer), and can be used in medicine, biology, the oil and gas industry, metallurgy, power engineering, geochemistry, hydrology, and ecology. For the purpose of enhancing the resolution of an MR TOFMS, its RS (reflection system) is provided with a number of special features, the most important of which are that: (a) a COSS (corpuscular optical subsystem) of the analysis channel comprises one or more COSS assemblies, selected from types of bi-reflective components and comprising a pair of mirrors selected from a range of mono-zonal and bi-zonal mirrors, said assembly being designed to allow selection of the size of acute angles γ1 and γ2 between the directions of the ionic output flux from one CO mirror and the input into another CO mirror, within the limits of π/4<γ1≤0 and 0≤γ1<π/4; 0≤γ2<π/4 and - π/4< γ2≤0; (b) the COSS of the analysis channel comprises one or more deflecting and correcting COE (corpuscular optical element) designed to allow S/TOF-FIP (stepped time-of-flight focusing of an ion packet according to the energy scattering of the ions in the packet), together with a mono-zonal or bi-zonal CO mirror; (c) an ion source unit is provided, comprising an energy-filtering ion flux generating source, including a source type with a "compensated difference in ion flight path length".
PCT/KZ2017/000029 2016-12-30 2017-12-29 Time-of-flight mass spectrometer and component parts thereof WO2018124861A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KZ20161219 2016-12-30
KZ2016/1219.1 2016-12-30

Publications (2)

Publication Number Publication Date
WO2018124861A2 WO2018124861A2 (en) 2018-07-05
WO2018124861A3 true WO2018124861A3 (en) 2018-08-23

Family

ID=62709611

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KZ2017/000029 WO2018124861A2 (en) 2016-12-30 2017-12-29 Time-of-flight mass spectrometer and component parts thereof

Country Status (1)

Country Link
WO (1) WO2018124861A2 (en)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201613988D0 (en) 2016-08-16 2016-09-28 Micromass Uk Ltd And Leco Corp Mass analyser having extended flight path
GB2567794B (en) 2017-05-05 2023-03-08 Micromass Ltd Multi-reflecting time-of-flight mass spectrometers
GB2563571B (en) 2017-05-26 2023-05-24 Micromass Ltd Time of flight mass analyser with spatial focussing
WO2019030471A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov Ion guide within pulsed converters
WO2019030472A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov Ion mirror for multi-reflecting mass spectrometers
US11049712B2 (en) 2017-08-06 2021-06-29 Micromass Uk Limited Fields for multi-reflecting TOF MS
EP3662502A1 (en) 2017-08-06 2020-06-10 Micromass UK Limited Printed circuit ion mirror with compensation
WO2019030477A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov Accelerator for multi-pass mass spectrometers
WO2019030476A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov Ion injection into multi-pass mass spectrometers
US11211238B2 (en) 2017-08-06 2021-12-28 Micromass Uk Limited Multi-pass mass spectrometer
GB201802917D0 (en) 2018-02-22 2018-04-11 Micromass Ltd Charge detection mass spectrometry
GB201806507D0 (en) 2018-04-20 2018-06-06 Verenchikov Anatoly Gridless ion mirrors with smooth fields
GB201807626D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201807605D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201808530D0 (en) 2018-05-24 2018-07-11 Verenchikov Anatoly TOF MS detection system with improved dynamic range
GB201810573D0 (en) 2018-06-28 2018-08-15 Verenchikov Anatoly Multi-pass mass spectrometer with improved duty cycle
WO2020071892A1 (en) * 2018-10-04 2020-04-09 Алдан Асанович САПАРГАЛИЕВ High-resolution time-of-flight mass spectrometry
GB201901411D0 (en) 2019-02-01 2019-03-20 Micromass Ltd Electrode assembly for mass spectrometer
US11842891B2 (en) 2020-04-09 2023-12-12 Waters Technologies Corporation Ion detector

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1105962A1 (en) * 1982-04-26 1984-07-30 Предприятие П/Я В-8754 Mass-spectrometric method of analyzing solids
US20090206250A1 (en) * 2006-05-22 2009-08-20 Shimadzu Corporation Parallel plate electrode arrangement apparatus and method
US20100051799A1 (en) * 2006-10-20 2010-03-04 Alexander Alekseevich Makarov Multi-channel detection
RU2554104C2 (en) * 2013-07-22 2015-06-27 Общество с ограниченной ответственностью "Научно - производственная фирма "Прогресс" Mass-spectrometer analyser of gas leak detector
RU158343U1 (en) * 2015-08-14 2015-12-27 Общество с ограниченной ответственностью "Альфа" (ООО "Альфа") DEVICE FOR TIME-SPAN MASS SPECTROMETER WITH SOURCE OF IONS WITH IONIZATION AT ATMOSPHERIC PRESSURE FOR SEPARATION AND REGISTRATION OF IONS OF ANALYZED SUBSTANCES
RU163938U1 (en) * 2015-09-22 2016-08-20 Федеральное государственное бюджетное образовательное учреждение высшего образования Чеченский государственный университет (ФГБОУ ВО "Чеченский государственный университет") VACUUM PUMP

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1105962A1 (en) * 1982-04-26 1984-07-30 Предприятие П/Я В-8754 Mass-spectrometric method of analyzing solids
US20090206250A1 (en) * 2006-05-22 2009-08-20 Shimadzu Corporation Parallel plate electrode arrangement apparatus and method
US20100051799A1 (en) * 2006-10-20 2010-03-04 Alexander Alekseevich Makarov Multi-channel detection
RU2554104C2 (en) * 2013-07-22 2015-06-27 Общество с ограниченной ответственностью "Научно - производственная фирма "Прогресс" Mass-spectrometer analyser of gas leak detector
RU158343U1 (en) * 2015-08-14 2015-12-27 Общество с ограниченной ответственностью "Альфа" (ООО "Альфа") DEVICE FOR TIME-SPAN MASS SPECTROMETER WITH SOURCE OF IONS WITH IONIZATION AT ATMOSPHERIC PRESSURE FOR SEPARATION AND REGISTRATION OF IONS OF ANALYZED SUBSTANCES
RU163938U1 (en) * 2015-09-22 2016-08-20 Федеральное государственное бюджетное образовательное учреждение высшего образования Чеченский государственный университет (ФГБОУ ВО "Чеченский государственный университет") VACUUM PUMP

Also Published As

Publication number Publication date
WO2018124861A2 (en) 2018-07-05

Similar Documents

Publication Publication Date Title
WO2018124861A3 (en) Time-of-flight mass spectrometer and component parts thereof
Boesl Time‐of‐flight mass spectrometry: introduction to the basics
Allum et al. Coulomb explosion imaging of CH3I and CH2ClI photodissociation dynamics
WO2008071921A3 (en) A co-axial time-of-flight mass spectrometer
Wienholtz et al. Towards ultrahigh-resolution multi-reflection time-of-flight mass spectrometry at ISOLTRAP
WO2015036447A3 (en) Targeted mass analysis
LaHaye et al. Persistence of uranium emission in laser-produced plasmas
Sigaud et al. A novel double-focusing time-of-flight mass spectrometer for absolute recoil ion cross sections measurements
Wiesendanger et al. The LMS-GT instrument–a new perspective for quantification with the LIMS-TOF measurement technique
CN105529240B (en) Utilize the time of-flight mass spectrometer of wide mass range space-focusing
Tonotani et al. Evaluation of multi‐turn time‐of‐flight mass spectrum of laser ionization mass nanoscope
Graham et al. Resolution and mass range performance in distance-of-flight mass spectrometry with a multichannel focal-plane camera detector
CN105225918B (en) For the electrostatic lenses of flight time mass spectrum intermediate ion beam shaping
Rolles et al. An experimental protocol for femtosecond nir/uv-xuv pump-probe experiments with free-electron lasers
Dennis et al. How Constant Momentum Acceleration Decouples Energy and Space Focusing in Distance–of–Flight and Time–of–Flight Mass Spectrometries
Wituschek et al. A simple photoionization scheme for characterizing electron and ion spectrometers
Prieto et al. Miniaturized linear time‐of‐flight mass spectrometer with pulsed extraction
Golombek et al. Generation of ultrashort keV Ar+ ion pulses via femtosecond laser photoionization
Huang et al. Two-dimensional separation in laser ionization orthogonal time-of-flight mass spectrometry
Bierstedt et al. Characterization of an airborne laser-spark ion source for ambient mass spectrometry
Kahaly et al. Detailed experimental study of ion acceleration by interaction of an ultra-short intense laser with an underdense plasma
Veryovkin et al. Ion optics of a new time-of-flight mass spectrometer for quantitative surface analysis
Johnson et al. Characterization of the ion beam focusing in a mass spectrometer using an IonCCD™ detector
JP6160472B2 (en) Time-of-flight mass spectrometer
FR2792773B1 (en) ION SOURCE FOR TIME OF FLIGHT MASS SPECTROMETER ANALYZING GASEOUS SAMPLES

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 17888394

Country of ref document: EP

Kind code of ref document: A2

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 17888394

Country of ref document: EP

Kind code of ref document: A2