WO2018077222A1

WO2018077222A1 - Terahertz experiment environment monitoring system

Info

Publication number: WO2018077222A1
Application number: PCT/CN2017/107891
Authority: WO
Inventors: 邓仕发; 潘奕; 李辰; 丁庆
Original assignee: 深圳市太赫兹科技创新研究院; 华讯方舟科技有限公司
Priority date: 2016-10-31
Filing date: 2017-10-26
Publication date: 2018-05-03
Also published as: CN106647883A

Abstract

A terahertz experiment environment monitoring system comprising a temperature control circuit (10), a gas pressure detection circuit (20), a humidity detection circuit (30), and a master controller (40). By combining the temperature control circuit (10) and the master controller (40), real-time capturing, regulation, and control of temperature information of a terahertz experiment box are allowed, the temperature can be kept in an isothermal state; also, by combining the gas pressure detection circuit (20), a gas valve (60), and the master controller (40), the pressure of nitrogen gas in the terahertz experiment box is captured in real-time, regulated and controlled, and the pressure is kept constant; also, by detecting the relative humidity of the interior of the box via the humidity detection circuit (30) and by combining the temperature control circuit (10) and the gas valve (60), the humidity of the terahertz experiment box is ensured. The system can detect in real-time the temperature information, gas pressure information, and humidity information of the interior of the terahertz experiment box and also keeps the temperature information, the gas pressure information, and the humidity information in standard states, thus ensuring the accuracy of environmental parameters of the terahertz experiment box.

Description

Terahertz test environment monitoring system

Technical field

The invention relates to the field of terahertz technology, in particular to a terahertz test environment monitoring system.

Background technique

Terahertz (THz) waves are electromagnetic waves with short wavelengths and no ionizing radiation. They have great application prospects in medical, food, safety monitoring, military and other fields. Most polar molecules, such as water molecules, have a strong absorption of terahertz waves. In terahertz technology, the strong absorption characteristics of water can be used to distinguish different states of biological tissues, such as the diagnosis of the degree of damage to human burns, and product quality control, such as measuring the moisture content of food surface to determine its freshness. . Therefore, in the terahertz test and experiment, the requirements of the experimental or test environment are high, and the temperature, humidity and pressure will affect the measurement data.

The commonly used terahertz experiment box is filled with high-purity nitrogen inside the box, and the moisture inside the experiment box is discharged, so that the test results are not disturbed, and the accuracy of the experiment is ensured. At this time, the experimental environment parameters such as temperature, humidity, and air pressure in the test chamber are unknown, and the correctness of the experiment cannot be accurately determined.

Summary of the invention

Based on this, it is necessary to provide a terahertz test environment that can detect and maintain the constant temperature information, pressure information and humidity information in the terahertz test chamber to ensure the accuracy of the environmental parameters of the terahertz test chamber. surveillance system.

A terahertz test environment monitoring system, comprising:

a temperature control circuit for collecting and adjusting temperature information in the terahertz test chamber;

a gas pressure detecting circuit connected to the nitrogen tank through a gas valve for collecting the air pressure information in the terahertz test chamber;

a humidity detecting circuit for collecting humidity information in the terahertz experiment box;

The main controller is respectively connected to the temperature control circuit, the air pressure detecting circuit and the humidity detecting circuit, The main controller is configured to control the temperature control circuit to make the temperature in the terahertz test chamber constant according to the collected temperature information; and to control the air valve according to the collected air pressure information of the air pressure detecting circuit The flow of nitrogen is adjusted to maintain a constant gas pressure within the terahertz test chamber.

In one embodiment, the temperature control circuit includes a temperature acquisition module and a temperature control module;

The temperature collecting module includes a constant current source and a temperature sensor; the temperature control module includes a Peltier; and the main controller is respectively connected to the temperature sensor and the Peltier;

The constant current source provides a constant current excitation signal for the temperature sensor; the temperature sensor transmits the collected real-time temperature signal to the main controller, and the main controller controls the Parr according to the real-time temperature signal The heating or cooling of the paste makes the temperature of the terahertz chamber constant.

In one embodiment, the number of the temperature sensors is plural, and the temperature collecting module further includes a multi-way gate, a first amplifying unit, and a first analog-to-digital converter.

a plurality of the temperature sensors are connected to the multi-way selector; the multi-way selector is configured to selectively turn on the temperature sensor and the constant current source;

The first output end of the constant current source, the first amplifying unit, and the first analog-to-digital converter are electrically connected in sequence; the second output end of the constant current source is connected to the first amplifying unit, and is the first amplifying unit Provide a reference voltage reference.

In one of the embodiments, the temperature sensor is a resistive temperature sensor.

In one embodiment, the temperature control module includes a relay, a first triode, a second triode, and a first resistor;

a base of the first triode is connected to the main controller, a collector of the first triode is connected to a power source, an emitter of the first triode and the second triode Base connection

The emitters of the second triode are respectively connected to the first resistor and the main controller, the other end of the first resistor is grounded, the collector of the second triode is normally closed with the relay Contact connection

The normally open contact of the relay is connected to a power source, and the movable end of the relay is connected to the Peltier, and two ends of the relay coil are respectively connected to the main controller and the power source.

In one embodiment, the temperature control module further includes a buffer protection unit, the buffer protection unit including a second resistor, a third resistor, and a first capacitor;

The emitter of the first transistor is sequentially grounded via the second resistor, the third resistor, and the first capacitor; the common end of the second resistor and the third resistor and the base of the second transistor connection.

In one embodiment, the air pressure detecting circuit includes a pressure sensor, a constant current driving unit, a second amplifying unit, and a second analog to digital converter;

The pressure sensors are respectively connected to the input ends of the constant current driving unit and the second amplifying unit;

The output end of the second amplifying unit, the second analog-to-digital converter, the main controller, and the air valve are electrically connected in sequence.

In one embodiment, the constant current driving unit includes a constant voltage source and a fourth resistor, a first connection end of the constant voltage source is connected to an input end of the pressure sensor, and a second constant voltage source is The connecting end is respectively connected to the output end of the pressure sensor and one end of the fourth resistor; the other end of the fourth resistor and the third connecting end of the constant voltage source are grounded.

In one embodiment, the humidity detecting circuit includes a humidity sensor and a humidity signal processing unit; the humidity sensor, the humidity signal processing unit, and the main controller are electrically connected in sequence;

The humidity sensor is configured to collect a humidity signal of the terahertz test chamber, and transmit the humidity signal to the humidity processing unit for amplification processing.

In one embodiment, a display device is further included, and the display device is connected to the main controller for displaying temperature information, air pressure information and humidity information of the terahertz test chamber.

The above terahertz test environment monitoring system includes a temperature control circuit, a gas pressure detecting circuit, a humidity detecting circuit, a main controller, and a main controller. By combining the temperature control circuit and the main controller, the temperature information of the terahertz experiment box can be collected and adjusted in real time, and the temperature is kept at a constant temperature; also by combining the air pressure detecting circuit, the air valve and the main controller, The nitrogen pressure value in the Hertz chamber is collected and adjusted in real time and the pressure value is kept constant; the relative humidity inside the box is also detected by the humidity detection circuit, and the humidity value of the terahertz test chamber is ensured by combining the temperature control circuit and the gas valve. Through the system, the temperature information, the air pressure information and the humidity information related environment parameters in the terahertz test chamber can be detected in real time, and the temperature information, the air pressure information and the humidity information can be kept in the standard state, thereby ensuring the terahertz test box. accuracy.

DRAWINGS

1 is a schematic diagram of a frame of an embodiment of a terahertz test environment monitoring system;

2 is a circuit diagram of an embodiment of a temperature acquisition module;

3 is a circuit diagram of a temperature control module of an embodiment;

4 is a schematic diagram of an embodiment of a terahertz test chamber air pressure detection control circuit.

detailed description

In order to facilitate the understanding of the present invention, the present invention will be described more fully hereinafter with reference to the accompanying drawings. Preferred embodiments of the invention are shown in the drawings. However, the invention may be embodied in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the understanding of the present disclosure will be more fully understood.

All technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs, unless otherwise defined. The terminology used in the description of the present invention is for the purpose of describing particular embodiments and is not intended to limit the invention. The term "and/or" as used herein includes any and all combinations of one or more of the associated listed items.

As shown in FIG. 1 , it is a schematic diagram of a frame of a terahertz test environment monitoring system. The terahertz test environment monitoring system includes a temperature control circuit 10 , a gas pressure detecting circuit 20 , a humidity detecting circuit 30 , and a main controller 40 . The main controller 40 is connected to the temperature control circuit 10, the air pressure detecting circuit 20, and the humidity detecting circuit 30, respectively. The temperature control circuit 10 is configured to collect and adjust temperature information in the terahertz test chamber and output the collected temperature information to the main controller 40 for processing. The main controller 40 feedbacks and adjusts the temperature control circuit 10 according to the preset temperature value. The temperature inside the terahertz test chamber remains constant. The air pressure detecting circuit 20 is connected to a nitrogen tank (not shown) through a gas valve 60 for collecting the air pressure information in the terahertz test chamber; and transmitting the collected air pressure information to the main controller 40, the main controller 40 is The preset air pressure value controls the air valve, feedback controls the air valve, and regulates the nitrogen flow rate so that the air pressure in the terahertz test chamber is constant. The humidity detecting circuit 30 is configured to collect humidity information in the terahertz experimental box; and transmit the collected humidity information to the main controller 40, and the main controller 40 feedbackly controls the temperature control circuit 10 and the regulating air valve according to the preset humidity value. The flow rate, the temperature value and the humidity value in the terahertz test chamber are kept constant for a certain period of time, thereby ensuring the accuracy of the test environment in the test chamber.

In an embodiment, the temperature control circuit 10 includes a temperature acquisition module 110 and a temperature control module 120. 2 is a circuit diagram of a temperature acquisition module of an embodiment, and FIG. 3 is a temperature control mode of an embodiment. A schematic diagram of the circuit of the block. The temperature collecting module 110 includes a constant current source U1 and a temperature sensor. The temperature control module 120 includes a Peltier U5. The main controller 40 is connected to the temperature sensor and the Peltier U5, respectively. The constant current source U1 provides a constant current excitation signal for the temperature sensor; the temperature sensor transmits the collected real-time temperature signal to the main controller 40, and the main controller 40 controls the heating or cooling of the Peltier U5 according to the real-time temperature signal, so that the terahertz experiment The temperature of the box is constant.

In order to ensure uniform temperature distribution inside the test chamber, local temperature imbalance does not occur. According to the structure and volume of the box, one or more temperature sensors and a combination of Peltier U5 are used. In the present embodiment, the number of temperature sensors is two. Among them, the temperature sensor is a resistive temperature sensor. In the range of -10 to 80 °C, the resistance value varies from 1K to 2KΩ. The temperature of the terahertz test chamber can be detected by the temperature sensor of PT100 or TP1000.

Referring to FIG. 2, the temperature acquisition module 110 further includes a multiplexer U2, a first amplification unit 115, and a first analog to digital converter U3. Both temperature sensors (111, 113) are connected to a multiplexer U2. The multiplexer U2 is used to select the conduction temperature sensor (111, 113) and the constant current source U1. The first output terminal 1L of the constant current source U1, the first amplifying unit 115, and the first analog-to-digital converter U3 are electrically connected in sequence; the second output terminal 2L of the constant current source U1 is connected to the first amplifying unit 115, which is the first amplification. Unit 115 provides a reference reference voltage.

Further, the constant current source U1 having two outputs has a first output terminal 1L outputted to the X terminal of the multi-way strobe U2, and then the Y terminal of the multiplexer U2 is input to the first amplification device via the resistor R8. Unit 115. At the same time, the multi-way strobe U2 is also connected to the temperature sensor 111 and the temperature sensor 113, and directly inputs the current signal of the constant current source U1 to the temperature sensor 111 or the temperature sensor 113 as an excitation signal. Since the selected temperature sensor is a resistive temperature sensor, the resistance of the temperature sensor will change with the change of temperature. When a constant current is added as an excitation signal to the temperature sensor, the temperature of the change will be changed. The form of the value is presented, and the varying resistance is expressed in the form of a varying voltage, thereby achieving acquisition of the temperature signal.

If the number of temperature sensors is more than two, the multi-way strobe U2, according to the actual demand, will simultaneously connect the two temperature sensors to the constant current source U1, and the specific conduction mode can be based on the actual The requirements are set and are not limited to this.

The second output terminal 2L of the constant current source U1 serves as a reference signal of 0 °C. Among them, another constant current source U1 The output of the circuit is grounded via resistor R5 and resistor R6. The resistor R5 is a reference resistance of 0 ° C of the detection circuit, and a current caused by a current of the constant current source U1 flowing through the resistor R5 serves as a reference voltage of 0 ° C.

The first amplifying unit 115 includes a differential instrumentation amplifier U3, a resistor R7, a resistor R8, a resistor R9, a resistor R10, a resistor R11, a capacitor C2, a capacitor C3, and a capacitor C4. The outputs of the temperature sensor 111 and the temperature sensor 113 are connected to the common terminals of the resistor R5 and the resistor R6. The output signals of the temperature sensor 111 and the temperature sensor 113 operate in a low input range with respect to the differential instrumentation amplifier U3 in the first amplifying unit 115, and provide a certain input signal to the differential instrumentation amplifier U3 by adding a resistor R6. The common mode voltage allows the input signal to meet the input range requirements of the instrument op amp. Wherein, the resistor R9 and the capacitor C2, the resistor R10 and the capacitor C4 form a common mode filter circuit of the differential output signal of the differential instrumentation amplifier U3, and the capacitor C3 filters out the differential mode interference signal in the differential signal, and at the same time, the gain of the differential instrumentation amplifier U3 is The external resistor R11 is determined. The differential instrumentation amplifier U3 output signal is sent to the first analog-to-digital converter U3 for analog-to-digital conversion, and the converted temperature signal is transmitted to the main controller 40 through the Serial Peripheral Interface (SPI). The device 40 reads the temperature signal collected by the temperature sensor.

Referring to FIG. 3, the temperature control module 120 includes a relay K, a first transistor Q1, a second transistor Q2, and a first resistor R1. Among them, the relay K is a double-pole double-throw relay K. The first resistor R1 is a current limiting protection resistor that is damaged or burned in order to protect the current flowing through the Peltier U5 from being excessive. The base of the first transistor Q1 is connected to the main controller 40, the collector of the first transistor Q1 is connected to the power source, and the emitter of the first transistor Q1 is connected to the base of the second transistor Q2. The emitter of the second transistor Q2 is connected to the first resistor R1 and the main controller 40, the other end of the first resistor R1 is grounded, and the collector of the second transistor Q2 is connected to the normally closed contact of the relay K. The normally open contact of the relay K is connected to the power source, and the movable end of the relay K is connected to the Peltier U5, and the two ends of the relay K coil are respectively connected to the main controller 40 and the power source.

The temperature control module 120 further includes a buffer protection unit 121, and the buffer protection unit 121 includes a second resistor R2, a third resistor R3, and a first capacitor C1. The emitter of the first transistor Q1 is sequentially grounded via the second resistor R2, the third resistor R3, and the first capacitor C1; the common terminal of the second resistor R2 and the third resistor R3 is connected to the base of the second transistor Q2. .

When the main controller 40 detects the temperature signal in the terahertz test chamber, the main controller 40 compares the detected temperature signal with the preset temperature value, if the detected temperature signal is lower than the temperature set. When the value is up, the main controller 40 outputs a temperature rising control signal, and the temperature rising control signal controls the first transistor Q1 to be turned on via the resistor R12, and the temperature rising control signal second resistor R2, the third resistor R3 and the first capacitor C1 constitute After the buffer protection unit 121, the second transistor Q2 is controlled to be turned on, thereby realizing the control of the relay K, so that the Peltier U5 is loaded with the forward voltage and enters the heating state until the temperature of the terahertz test chamber reaches the pre-heat Set the temperature value and keep it at a constant temperature. If the detected actual temperature signal is higher than the preset temperature value, the main controller 40 sends a cooling control signal, and the temperature control module 120 causes the Peltier U5 to load a reverse voltage and enter the cooling state until the terahertz test. The temperature of the box reaches the preset temperature value and is kept at a constant temperature.

4 is a schematic diagram of an embodiment of a terahertz test chamber air pressure detecting control circuit. The air pressure detecting circuit 20 includes a pressure sensor 210, a constant current driving unit 220, a second amplifying unit 230, and a second analog to digital converter U7. The pressure sensor 210 is connected to the input terminals of the constant current driving unit 220 and the second amplifying unit 230, respectively. The output end of the second amplifying unit 230, the second analog-to-digital converter U7, the main controller 40, and the air valve 60 are electrically connected in sequence. The constant current driving unit 220 includes a constant voltage source U8 and a fourth resistor R4. The first connection end of the constant voltage source U8 is connected to the input end of the pressure sensor 210, and the second connection end of the constant voltage source U8 is respectively connected to the pressure sensor 210. The output end is connected to one end of the fourth resistor R4; the other end of the fourth resistor R4 and the third connection end of the constant voltage source U8 are grounded.

Wherein, the pressure sensor 210 is designed by a Wheatstone bridge. The second amplifying unit 230 includes a differential instrumentation amplifier U6, a resistor R13, a resistor R14, a resistor R15, and a capacitor C5. The resistor R13, the resistor R14 and the capacitor C5 form a filter circuit for filtering the input terminal and as a protection resistor at the input end of the differential instrumentation amplifier U6, which has a current limiting function. Capacitor C5 also has a differential mode interference signal in the cancellation differential signal.

According to the pressure sensor 210, which is in the Wheatstone bridge mode, a constant current drive is applied to the bridge, and the change in pressure will be output in the form of current. Different combinations are selected according to the parameters of the pressure sensor 210. For example, the driving current of the pressure sensor 210 is 2 mA, and when the gain resistor R15 is full-scale output, the gas pressure value is 100 psia, and the output voltage is amplified to 3.521 V. The constant current driving unit 220 composed of the constant voltage source U8 and the fourth resistor R4 will determine the actual output voltage value when the barometric pressure is 100 psia full scale output. In this embodiment, a constant voltage source U8 of 2.5V is used, and the resistance of the fourth resistor R4 is 2K ohms, that is, a driving current of 1.25 mA is generated, and the actual output power when the air pressure is 100 psia full-scale output is generated. The pressure is (3.521*1.25/2)=2.2V. The output voltage value is proportional to the air pressure value, and the corresponding air pressure value can be known by the output voltage value. The main controller 40 detects the air pressure signal in the test chamber in real time and compares it with the preset air pressure value. If the air pressure value in the terahertz test box is detected to be too high or low, the gas of the nitrogen gas valve 60 is controlled to enter. The flow rate keeps the pressure value in the terahertz test chamber stable.

Referring to FIG. 4, the humidity detecting circuit 30 includes a humidity sensor 310 and a humidity signal processing unit 320; the humidity sensor 310, the humidity signal processing unit 320, and the main controller 40 are electrically connected in sequence. The humidity sensor 310 is used to collect the humidity signal of the terahertz test chamber, and transmits the humidity signal to the humidity processing unit for amplification processing. The humidity sensor 310 transmits the collected humidity signal to the main controller 40 after being processed by the humidity processing unit. When the humidity value is too high, the accuracy of the experimental results is seriously affected. The main controller 40 compares the humidity signal collected by the real time comparison with the preset humidity value. When the humidity value is too high, the air valve 60 can be controlled by the main controller 40, the nitrogen amount can be increased by adaptation, or the Peltier U5 can be controlled by the main controller 40, and the temperature inside the box is weakly increased, thereby reducing the relative humidity, and finally The temperature value, air pressure value and humidity value in the terahertz test chamber are kept in a standard state.

Also included is a display device 50 coupled to the main controller 40 for displaying temperature information, barometric pressure information, and humidity information of the terahertz test chamber. The display device 50 can be an LED device, an LCD display device, or a PC terminal. The main controller 40 simultaneously displays the detected temperature signal, the air pressure signal and the humidity signal on the display device 50, so that the user can know the test environment parameters of the current terahertz test box, and if an abnormality occurs, it can be processed in time. At the same time, the environmental parameters of the terahertz test box can be set by the display device 50, and appropriate environmental parameters are set for different test objects.

The terahertz test environment monitoring system can perform real-time acquisition and adjustment control of the temperature information of the terahertz experimental box through the temperature control circuit 10, the Peltier U5 and the main controller 40, and maintain the temperature in a constant temperature state; The air pressure detecting circuit 20, the air valve 60 and the main controller 40 perform real-time collecting and adjusting control of the nitrogen pressure value in the terahertz experimental box and keep the pressure value constant; and detecting the relative humidity inside the box through the humidity detecting circuit 30. The temperature control circuit 10 and the air valve 60 are combined to ensure the humidity value of the terahertz test box, and at the same time, the temperature information, the air pressure information and the humidity information related environmental parameters are detected in the display device 50 in real time. Through the system, the temperature information, the air pressure information and the humidity information related environmental parameters in the terahertz test chamber can be detected and displayed in real time, and the temperature information, the air pressure information and the humidity information can be kept under the standard state, thereby ensuring the terahertz test. Box The accuracy.

The technical features of the above embodiments may be arbitrarily combined. For the sake of brevity of description, all possible combinations of the technical features in the above embodiments are not described. However, as long as there is no contradiction in the combination of these technical features, It is considered to be the range described in this specification.

The above embodiments are merely illustrative of several embodiments of the present invention, and the description thereof is more specific and detailed, but is not to be construed as limiting the scope of the invention. It should be noted that a number of variations and modifications may be made by those skilled in the art without departing from the spirit and scope of the invention. Therefore, the scope of the invention should be determined by the appended claims.

Claims

A terahertz test environment monitoring system, comprising:

a temperature control circuit for collecting and adjusting temperature information in the terahertz test chamber;

a gas pressure detecting circuit connected to the nitrogen tank through a gas valve for collecting the air pressure information in the terahertz test chamber;

a humidity detecting circuit for collecting humidity information in the terahertz experiment box;

a main controller, which is respectively connected to the temperature control circuit, the air pressure detecting circuit and the humidity detecting circuit, wherein the main controller is configured to control the temperature control circuit to make the temperature in the terahertz test box according to the collected temperature information Constantly; controlling the gas valve according to the collected air pressure information of the air pressure detecting circuit, adjusting the nitrogen flow rate to make the air pressure in the terahertz test box constant; the main controller is also used according to the preset Humidity value, feedback control temperature control circuit and regulating the flow rate of the gas valve, the humidity value in the terahertz test chamber is kept constant for a certain period of time; the temperature control circuit includes a temperature acquisition module and a temperature control module;

The temperature collecting module includes a constant current source and a temperature sensor; the temperature control module includes a Peltier; and the main controller is respectively connected to the temperature sensor and the Peltier;

The constant current source provides a constant current excitation signal for the temperature sensor; the temperature sensor transmits the collected real-time temperature signal to the main controller, and the main controller controls the Parr according to the real-time temperature signal The heating or cooling of the paste makes the temperature of the terahertz chamber constant.
The terahertz test environment monitoring system according to claim 1, wherein the number of the temperature sensors is plural, and the temperature collecting module further comprises a multi-way gate, a first amplifying unit, and a first modulus. converter,

a plurality of the temperature sensors are connected to the multi-way selector; the multi-way selector is configured to selectively turn on the temperature sensor and the constant current source;

The first output end of the constant current source, the first amplifying unit, and the first analog-to-digital converter are electrically connected in sequence; the second output end of the constant current source is connected to the first amplifying unit, and is the first amplifying unit Provide a reference voltage reference.
The terahertz test environment monitoring system according to claim 1, wherein the temperature sensor is a resistive temperature sensor.
The terahertz test environment monitoring system according to claim 1, wherein the temperature control module comprises a relay, a first triode, a second triode, and a first resistor;

a base of the first triode is connected to the main controller, a collector of the first triode is connected to a power source, an emitter of the first triode and the second triode Base connection

The emitters of the second triode are respectively connected to the first resistor and the main controller, the other end of the first resistor is grounded, the collector of the second triode is normally closed with the relay Contact connection

The normally open contact of the relay is connected to a power source, and the movable end of the relay is connected to the Peltier, and two ends of the relay coil are respectively connected to the main controller and the power source.
The terahertz test environment monitoring system according to claim 4, wherein the temperature control module further comprises a buffer protection unit, the buffer protection unit comprising a second resistor, a third resistor and a first capacitor;

The emitter of the first transistor is sequentially grounded via the second resistor, the third resistor, and the first capacitor; the common end of the second resistor and the third resistor and the base of the second transistor connection.
The terahertz test environment monitoring system according to claim 1, wherein the air pressure detecting circuit comprises a pressure sensor, a constant current driving unit, a second amplifying unit, and a second analog to digital converter;

The pressure sensors are respectively connected to the input ends of the constant current driving unit and the second amplifying unit;

The output end of the second amplifying unit, the second analog-to-digital converter, the main controller, and the air valve are electrically connected in sequence.
The terahertz test environment monitoring system according to claim 6, wherein the constant current driving unit comprises a constant voltage source and a fourth resistor, and the first connection end of the constant voltage source and the input of the pressure sensor The second connection end of the constant voltage source is respectively connected to the output end of the pressure sensor and one end of the fourth resistor; the other end of the fourth resistor and the third connection end of the constant voltage source are grounded.
The terahertz test environment monitoring system according to claim 1, wherein the humidity detecting circuit comprises a humidity sensor and a humidity signal processing unit; the humidity sensor, the humidity signal processing unit, and the main controller are electrically connected in sequence;

The humidity sensor is configured to collect a humidity signal of the terahertz test chamber, and transmit the humidity signal to the humidity processing unit for amplification processing.
The terahertz test environment monitoring system according to claim 1, further comprising a display device, wherein the display device is connected to the main controller for displaying the temperature of the terahertz test chamber Degree information, barometric pressure information and humidity information.