WO2018072669A1 - 辐射检查系统和方法 - Google Patents

辐射检查系统和方法 Download PDF

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Publication number
WO2018072669A1
WO2018072669A1 PCT/CN2017/106345 CN2017106345W WO2018072669A1 WO 2018072669 A1 WO2018072669 A1 WO 2018072669A1 CN 2017106345 W CN2017106345 W CN 2017106345W WO 2018072669 A1 WO2018072669 A1 WO 2018072669A1
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Prior art keywords
image
imaging
radiation
column
positional relationship
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PCT/CN2017/106345
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English (en)
French (fr)
Inventor
李苏祺
郑建斌
胡晓伟
王彦华
王少锋
曹艳锋
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北京君和信达科技有限公司
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Publication of WO2018072669A1 publication Critical patent/WO2018072669A1/zh
Priority to SA519401590A priority Critical patent/SA519401590B1/ar

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation

Definitions

  • the present invention relates to the field of radiation imaging technology, and in particular to a radiation inspection system and method.
  • the transmission imaging system is comprised of at least one radiation source, at least one set of collimators that collimate the radiation emitted by the radiation source into a fan beam, at least one array of detectors located on the other side of the scanned object, at least one set for detection
  • the moving target is composed of the scanned portion and the scanning position sensor unit.
  • Scattering imaging images an object by measuring photons scattered from the substance being detected.
  • the transmission image is an image formed by a detector that is attenuated by the object after being attenuated by the object on the other side of the object, and the transmitted signal of the radiation reflects information such as the density and thickness of the object to be illuminated, and can display the internal structure of the object;
  • the scatter image is formed by a ray signal scattered by an object with a certain depth in the direction of the detector, and the Compton scatter of the ray in the low atomic number material such as explosives or drugs is stronger, and the corresponding part is in the image signal. Stronger, this feature is an important factor in the application of backscattering technology to security applications.
  • the transmitted and scattered images are significantly different from the optical images acquired by image acquisition devices such as cameras and cameras.
  • the transmitted and scattered images can only reflect the outline of the object, and it is impossible to obtain the surface details such as the color and texture of the object in the optical image as observed by the human eye. Therefore, it is difficult for security personnel to transmit and scatter images.
  • this will adversely affect the security inspection process, especially after the vehicle-mounted scanning device completes the scanning, according to the scanned image, if the vehicle or the goods to be inspected does not have a specific identification (such as a license plate) or order.
  • a radiation inspection system for performing a radiation inspection with relative motion between objects to be detected, the system comprising: a radiation imaging device for column-by-column scanning Detecting an object to obtain a plurality of column scan images of the object to be detected, the direction of the column being substantially perpendicular to the direction of relative motion; the visible light imaging device having a fixed relative positional relationship with the radiation imaging device during the radiation inspection process for During the radiation inspection, optically imaging the detected object to obtain one or more optical images of the detected object; and an image matching processor for establishing a column scan image corresponding to the same detected object based on a predetermined matching rule and The correspondence between optical images.
  • the image matching processor may be based on a scan imaging time of the at least one column scan image and a photographing time of the optical image, or a first relative positional relationship with the detected object when the at least one column scan image is formed based on the radiation imaging apparatus and
  • the visible light imaging device establishes a correspondence relationship between the column scan image and the optical image by forming a second relative positional relationship with the detected object when the optical image is formed.
  • the image matching processor may integrate the plurality of column scan images based on the first relative positional relationship to obtain a reconstructed scan image whose imaging scale is close to the actual; and/or the image matching processor integrates the plurality of optical images based on the second relative positional relationship To obtain an imaging scale close to the actual reconstructed optical image.
  • the radiation inspection system may further include: positioning means for acquiring relative displacement data of the radiation imaging apparatus relative to the detected object at a third acquisition frequency during the radiation inspection, wherein the radiation imaging apparatus is first imaged Frequency-by-column scanning of the detected object, the visible light imaging device optically imaging the detected object at a second imaging frequency, and the image matching processor is based on one or more relative displacements acquired by the positioning device before and after the scanning imaging time of the column scanned image Data, determining a first relative positional relationship, determining a second relative positional relationship based on one or more relative displacement data acquired by the positioning device before and after the imaging time of the optical image.
  • positioning means for acquiring relative displacement data of the radiation imaging apparatus relative to the detected object at a third acquisition frequency during the radiation inspection, wherein the radiation imaging apparatus is first imaged Frequency-by-column scanning of the detected object, the visible light imaging device optically imaging the detected object at a second imaging frequency, and the image matching processor is based on one or more relative displacements acquired by the positioning device before
  • the image matching processor when the third acquisition frequency is less than the first imaging frequency, performs interpolation calculation on the plurality of relative displacement data to obtain a first relative positional relationship corresponding to each column scan image, and/or when Image matching processing when the three acquisition frequencies are equal to the first imaging frequency Determining, by the plurality of column scan images, a first relative positional relationship corresponding to the plurality of relative displacement data, and/or when the third acquisition frequency is greater than the first imaging frequency, the image matching processor is configured to the plurality of relative displacement data The extraction is performed to obtain a first relative positional relationship corresponding to each column scan image.
  • the radiation imaging device arrangement can be on a movable platform, the radiation imaging device being movable integrally with the movable platform, the positioning device can comprise an encoder, the encoder being arranged at the mobile mechanism of the movable platform.
  • the encoder in response to the radiation imaging device beginning to scan the detected object column by column, the encoder begins counting, wherein the encoder performs a count every time the movable platform moves by a predetermined distance.
  • the positioning device may acquire the relative speed of the positioning device relative to the detected object at a third acquisition frequency to obtain one or more relative speed data, and determine one or more relative displacements according to the third acquisition frequency and the relative speed data. data.
  • the visible light imaging device is a line camera for optically imaging the detected object column by column.
  • the image matching processor performs interpolation calculation on the relative displacement data to obtain each a second relative positional relationship corresponding to the optical images, and/or when the third acquisition frequency is equal to the second imaging frequency, the image matching processor determines a first relative positional relationship and a plurality of relative displacement data corresponding to the plurality of optical images One-to-one correspondence, when the third acquisition frequency is greater than the second imaging frequency, the image matching processor extracts the relative displacement data to obtain a second relative positional relationship corresponding to each optical image.
  • the visible light imaging device is an area array camera or an imaging device
  • the visible light imaging device images the reference object at the same distance from the visible light imaging device in advance to obtain a reference image
  • the image matching processor is based on the actual reference object.
  • the imaging ratio is determined by the size and the display size of the reference object in the reference image
  • the image matching processor determines the position of the lens center line of the visible light imaging device with respect to the detected object when the optical image is formed, and determines the optical based on the position and the imaging ratio.
  • the visible light imaging device is disposed at an exit position of the scanning ray of the radiation imaging device, or the visible light imaging device is disposed at a predetermined distance from the exit position of the scanning ray of the radiation imaging device.
  • the radiation inspection system may further comprise: a GPS positioning device for acquiring geographical location information of the radiation imaging device during the radiation inspection; and/or a identification identification device for identifying the detected during the radiation inspection process Identification information of the object.
  • a GPS positioning device for acquiring geographical location information of the radiation imaging device during the radiation inspection
  • a identification identification device for identifying the detected during the radiation inspection process Identification information of the object.
  • a radiation inspection method for performing a radiation inspection on a relative motion with an object to be detected, the method comprising: scanning a column by column using a radiation imaging apparatus Detecting an object to obtain a plurality of column scan images of the detected object, the direction of the column being substantially perpendicular to the direction of relative motion; during the radiation inspection process, the object to be detected is optically imaged using the visible light imaging device to obtain the detected object And one or more optical images, wherein the visible light imaging device and the radiation imaging device have a fixed relative positional relationship during the radiation inspection; establishing between the column scan image and the optical image corresponding to the same detected object based on a predetermined matching rule Correspondence.
  • the step of establishing a correspondence relationship between the column scan image and the optical image corresponding to the same detected object based on a predetermined matching rule may include: scanning imaging time and optical image based on at least one column scan image Shooting time, or based on a first relative positional relationship between the object and the detected object when the at least one column scan image is formed by the radiation imaging device and a second relative positional relationship with the object to be detected when the visible light imaging device forms the optical image The correspondence between the scanned image and the optical image.
  • the method may further comprise: integrating the plurality of column scan images based on the first relative positional relationship to obtain a reconstructed scan image whose imaging scale is close to the actual; and/or integrating the plurality of optical images based on the second relative positional relationship to obtain The imaging ratio is close to the actual reconstructed optical image.
  • the radiation imaging apparatus may scan the detected object column by column at a first imaging frequency
  • the optical image imaging apparatus may optically image the detected object at the second imaging frequency
  • the method may further include: during the radiation inspection Using the positioning device to acquire relative displacement data of the positioning device relative to the detected object at a third acquisition frequency; determining a first relative positional relationship based on one or more relative displacement data acquired by the positioning device before and after the scanning imaging time of the column scan image, A second relative positional relationship is determined based on one or more relative displacement data acquired by the positioning device before and after the imaging time of the optical image.
  • the plurality of relative displacement data are interpolated to obtain a first relative positional relationship corresponding to each column scan image, and/or when the third acquisition frequency is equal to Determining, in the first imaging frequency, a first relative positional relationship corresponding to the plurality of column scan images and a plurality of relative displacement data, and/or a plurality of relative displacements when the third acquisition frequency is greater than the first imaging frequency
  • the data is extracted to obtain a first relative positional relationship corresponding to each column scan image.
  • the visible light imaging device is a line camera for light-by-column detection of the detected object Learning imaging, when the third acquisition frequency is less than the second imaging frequency, interpolating the relative displacement data to obtain a second relative positional relationship corresponding to each optical image, and/or when the third acquisition frequency is equal to the second imaging At the frequency, determining that the first relative positional relationship corresponding to the plurality of optical images is in one-to-one correspondence with the plurality of relative displacement data, and when the third acquisition frequency is greater than the second imaging frequency, extracting the relative displacement data to obtain each optical The second relative positional relationship corresponding to the image.
  • the visible light imaging device is an area array camera or an imaging device
  • the method may include: imaging a reference object at the same distance from the visible light imaging device from the detected object in advance to obtain a reference image based on the actual size of the reference object And determining a imaging ratio of the reference object in the reference image, determining a position of the lens center line of the visible light imaging device with respect to the detected object when the optical image is formed, and determining each column image in the optical image based on the position and the imaging ratio Corresponding second relative positional relationship.
  • the radiation inspection system and method of the present invention mainly performs visible light imaging on a detected object while performing radiation imaging on the detected object, and then irradiates the radiation image obtained by the radiation scanning and the optical image obtained by visible light imaging.
  • the images correspond.
  • the optical image corresponding thereto can be synchronously displayed, so that the security personnel can quickly determine the detected object corresponding to the radiation image.
  • FIG. 1 shows a schematic block diagram of the structure of a radiation inspection system in accordance with an embodiment of the present invention.
  • Fig. 2 is a view showing the structure of a radiation imaging apparatus using transmissive radiation imaging.
  • Fig. 3 is a view showing the structure of a radiation imaging apparatus when imaging with backscattered radiation.
  • Figure 4A shows the original radiation image under direct ranging.
  • Figure 4B shows the original optical image under direct ranging.
  • Fig. 4C shows an image obtained by reconstructing the radiation image shown in Fig. 4A.
  • Fig. 4D shows an optical image after reconstruction of the optical image shown in Fig. 4B.
  • Figure 5A shows the original radiation image under indirect ranging.
  • Fig. 5B shows an image obtained by reconstructing the radiation image shown in Fig. 5A.
  • Fig. 6 shows a schematic diagram of synchronously displaying a radiation image and an optical image.
  • Fig. 7 shows a schematic diagram showing the position of a radiation imaging apparatus in a map.
  • the radiation image obtained by scanning the detected object such as a vehicle using the radiation imaging technique can only reflect the contour information of the detected object, and cannot acquire the detailed features such as the color and texture of the detected object, which makes the relevant personnel very It is difficult to match the scanned image with the actual detected object.
  • a vehicle-mounted scanning device is used to perform radiation scanning imaging of a car parked along a street, a radiation image of many vehicles is obtained. After the scanning is completed, when the radiation image is inspected, the relevant staff can only correspond to the actual vehicle according to the radiation image, which will undoubtedly affect a series of law enforcement processes such as manual inspection and post-mortem.
  • the present invention proposes a radiation inspection scheme capable of quickly determining an object to be detected corresponding to a radiation image.
  • the radiation inspection scheme of the present invention mainly performs visible light imaging on the detected object while performing radiation imaging on the detected object, and then based on a certain matching rule (may be matched based on time or relative positional relationship, and other methods may be used.
  • a certain matching rule may be matched based on time or relative positional relationship, and other methods may be used.
  • the matching manner, the specific matching process will be described in detail below, and the radiation images obtained by the radiation scanning corresponding to the same detected object are associated with the optical images obtained by visible light imaging. In this way, when the radiation image is displayed, the optical image corresponding thereto can be synchronously displayed, so that the security personnel can quickly determine the detected object corresponding to the radiation image.
  • the radiation inspection scheme of the present invention can be implemented as a radiation inspection system or as a radiation inspection method.
  • FIG. 1 shows a schematic block diagram of the structure of a radiation inspection system in accordance with an embodiment of the present invention.
  • the radiation inspection system is used between the object to be detected and Radiation inspection of the object to be inspected in the case of relative motion (the radiation inspection here mainly refers to radiation imaging).
  • the radiation inspection here mainly refers to radiation imaging.
  • the radiation inspection here mainly refers to radiation imaging.
  • the object is fixed, the radiation inspection system moves on the ground, and the scanned image is scanned through the object, such as a vehicle-mounted transmission inspection system and a vehicle-mounted backscatter inspection system.
  • mobile scanning this type of scanning can be called mobile scanning; the other is that the radiation inspection system is fixed, and the object is scanned and imaged by a radiation inspection system, such as an express vehicle inspection system, or a vehicle-mounted inspection.
  • a fixed-vehicle system can be called a fixed scan by performing scanning imaging.
  • the radiation inspection system 100 includes a radiation imaging device 110, a visible light imaging device 120, and an image matching processor 130.
  • the radiation imaging apparatus 110 is for scanning a detected object column by column to obtain a plurality of column scan images of the detected object, wherein the direction of the columns is substantially perpendicular to the direction of relative motion between the radiation imaging apparatus 110 and the detected object.
  • the radiation imaging device 110 may employ either transmissive radiation imaging or backscattered radiation imaging.
  • the radiation imaging apparatus can include a radiation source 1110, a collimator 1120, and a detector 1130.
  • Radiation source 1110 is used to generate X-rays.
  • the collimator 1120 is used for ray collimation such that the ray passes through the detection channel just to ensure complete coverage of the detector array.
  • the detector 1130 can detect the intensity of the radiation when the radiation passes through the detection channel and reach the detector position, and can convert the radiation intensity into a transmission image.
  • the radiation imaging apparatus may include a radiation source 1110, a radiation modulation device 1121, and a detector 1130 when imaging with backscattered radiation.
  • the radiation source 1110 is used to generate X-rays
  • the ray modulation device 1121 is configured to modulate the X-rays generated by the radiation source 1110 to form a spot-scanned scanning ray.
  • detector 1130 is located on either side of ray modulating device 1121 for receiving the intensity of the ray scattered from the object being detected and converting the ray intensity into a scatter image.
  • the visible light imaging device 120 has a fixed relative positional relationship with the radiation imaging device 110 during the radiation inspection process for optically imaging the detected object during the radiation inspection to obtain one or more optical images of the detected object.
  • the optical image here may be a single photo or a video containing a plurality of optical images.
  • the visible light imaging device 120 may be a camera or a camera device, and may specifically be a face array.
  • the camera can also be a line camera, and the detected object is collected according to the corresponding area array or line array acquisition method to obtain a scene image or video of the detected object.
  • a line camera an optical image of the object to be detected can be performed column by column, so that a multi-column optical image can be obtained; when the object is optically imaged using an area array camera, the imaging range of the area array camera is better.
  • one or several optical images may be obtained; in addition, the camera device may be used to acquire the video information of the detected object, and at this time, multiple opticals may be obtained.
  • the video of the image may be obtained.
  • the image matching processor 130 may match the column scan image and the optical image corresponding to the same detected object according to a predetermined matching rule to obtain a correspondence relationship between the two, and may synchronously display the matched column scan image and the optical image. It is convenient for security personnel to quickly locate the object to be inspected.
  • the image matching processor 130 can perform matching by using a plurality of matching rules.
  • two matching methods based on time matching and matching based on relative positional relationships are listed below. It should be understood that a column scan image corresponding to the same detected object and an optical image may be associated with each other in a variety of other matching manners, and details are not described herein again.
  • the image matching processor 130 can establish a correspondence relationship between the column scan image and the optical image according to the scan imaging time of the column scan image and the photographing time of the optical image.
  • the visible light imaging apparatus 120 can simultaneously perform visible light imaging on the detected object.
  • the imaging frequency of the visible light imaging device 120 may be the same as or different from the imaging frequency of the column scan image of the radiation imaging device 110.
  • the correspondence between the column scan image and the optical image can be established based on the scan imaging time of the column scan image and the photographing time of the optical image.
  • the visible light imaging device 120 may optically image the detected object by means of line scan imaging, and the imaging frequency of the visible light imaging device 120 and the imaging frequency of the column scan image of the radiation imaging device 110 may be the same, preferably, visible light imaging
  • the device 120 may be disposed at a position of the radiation imaging device 110 that emits a scanning beam, and is imaged simultaneously. In this way, the plurality of column scan images obtained based on the radiation imaging device 110 and the plurality of optical images obtained based on the visible light imaging device 120 can be directly associated in chronological order.
  • the image matching processor 130 may also form a relative image relationship with the detected object when the column scan image is formed according to the radiation imaging device 110 (which may be referred to herein as a first relative positional relationship for convenience of distinction) and when the optical image is formed by the visible light imaging device. Corresponding relationship between the column scan image and the optical image is established by a relative positional relationship with the object to be detected (herein referred to as a second relative positional relationship).
  • the radiation detecting system of the present invention may further comprise positioning means, and the first relative positional relationship and the second relative positional relationship may be acquired by the positioning means, thereby achieving matching of the column scanned image and the optical image.
  • the radiation inspection system 100 can include a positioning device 140.
  • the positioning device 140 may collect the radiation imaging device 110 relative to the detected object at a predetermined acquisition frequency (which may be a fixed frequency or a varying frequency) during the radiation imaging of the detected object by the radiation imaging device 110.
  • a predetermined acquisition frequency which may be a fixed frequency or a varying frequency
  • Relative displacement data when the positioning device 140 collects the relative displacement data, the relative positional relationship between the positioning device 140 and the radiation imaging device 110 is fixed.
  • the relative positional relationship between the visible light imaging apparatus 120 and the radiation imaging apparatus 110 is also fixed. Therefore, according to the relative displacement data of the radiation imaging device 110 acquired by the positioning device 140 with respect to the detected object, the relative displacement data of the visible light imaging device 120 with respect to the detected object can be obtained.
  • the relative displacement data of the radiation imaging device 110 acquired by the positioning device 140 with respect to the detected object may be directly used as the visible light imaging device 120 relative to the Detect relative displacement data of the object.
  • the relative displacement data of the radiation imaging device 110 acquired by the positioning device 140 with respect to the detected object may be correspondingly offset according to the distance.
  • the radiation imaging device 110, the visible light imaging device 120, and the positioning device 140 operate synchronously.
  • the synchronization refers to the synchronization of the start of the work, and the frequencies in operation may be different.
  • the positioning device 140 can directly acquire the relative displacement data of the positioning device 140 with respect to the detected object at a predetermined sampling frequency.
  • the method of direct acquisition is convenient for the mobile scanning mode, for example, the radiation imaging apparatus 110 can be integrated on a movable platform, the radiation imaging apparatus 110 can move as a whole with the mobile platform.
  • the positioning device 140 may employ an encoder that may be disposed at a moving mechanism of the movable platform.
  • the encoder can take a certain position on the ground as the coordinate origin, for example, the origin of the scanning ray book of the radiation imaging device 110 can be taken as the coordinate origin. .
  • the encoder begins counting, which corresponds to the angle at which the wheel rotates, i.e., the distance that the inspection device moves relative to the origin of the coordinate.
  • the encoder performs a count every time the vehicle moves a predetermined distance (one turn of the wheel of the vehicle).
  • the upper part is a schematic diagram of the radiation image collected by the radiation imaging apparatus 110 scanning a truck
  • the lower part is the value of the coded value collected by the encoder. Since the speed of the radiation imaging device 110 may be uneven when moving, the moving speed is slow when the truck cab is scanned as shown in the figure, and the corresponding code value may be repeated, and the original radiation image may be widened and deformed; The moving speed of the front part of the car is too fast, resulting in undersampling, the corresponding code value will jump, and the original radiation image will be narrowed and deformed.
  • the reconstruction method described below can be used for image reconstruction.
  • the upper part is an optical image obtained by the visible light imaging device 120 on the optical image of the truck, and the lower part is also the number of coded values collected by the encoder.
  • the mounting position of the visible light imaging device 120 has a certain deviation distance from the exit position of the scanning beam of the radiation imaging device 110. Therefore, the same region corresponding to the detected object in FIGS. 4A and 4B The encoded image corresponding to the radiation image and the optical image have a certain deviation.
  • the positioning device 140 may also acquire the relative speed of the positioning device 140 relative to the detected object at a predetermined sampling frequency to obtain one or more relative speed data, and then according to the sampling interval (according to the sampling frequency) and the relative speed. Data, the relative displacement data of the positioning device 140 relative to the object being detected can be determined.
  • the speed can be multiplied by the sampling interval time of the position information to obtain the distance moved during the sampling interval, and the sampling interval distance is accumulated as the relative displacement data.
  • the speed measurement period is ⁇ t
  • the upper image is a schematic diagram of the radiation image collected by the radiation imaging device 110 scanning a truck
  • the lower part is the moving speed value of the detected object collected at a certain frequency and the converted phase. For displacement data.
  • the image matching processor 130 may determine the first relative positional relationship based on the one or more relative displacement data acquired by the positioning device 140 before and after the scan imaging time of the column scan image, based on the one acquired by the positioning device 140 before and after the shooting time of the optical image. Or a plurality of relative displacement data to determine a second relative positional relationship. Thus, after the first relative positional relationship and the second relative positional relationship are determined, the column scan image having the same or similar relative positional relationship can be associated with the optical image.
  • the imaging frequency of the column scan image of the radiation imaging apparatus 110 is referred to herein as the first imaging frequency.
  • the frequency of the acquisition (direct acquisition or indirect acquisition) relative displacement data of the positioning device 140 is referred to as a third acquisition frequency.
  • the image matching processor 130 may perform interpolation calculation on the plurality of relative displacement data according to the first imaging frequency to obtain a first relative positional relationship corresponding to each column scan image.
  • the first relative positional relationship corresponding to the plurality of column scan images is in one-to-one correspondence with the plurality of relative displacement data.
  • the image matching processor 130 may extract a plurality of relative displacement data according to the first imaging frequency to obtain a first relative positional relationship corresponding to each column scan image.
  • the visible light imaging device 120 optically images the object to be detected by a line camera
  • the visible light imaging device 120 and the radiation imaging device 110 employ a line scan imaging method. Therefore, the determination of the second relative positional relationship may be the same as the determination of the first relative relationship.
  • the imaging frequency of the optical image of the visible light imaging device 120 is referred to herein as the second imaging frequency.
  • the frequency of the acquisition (direct acquisition or indirect acquisition) relative displacement data of the positioning device 140 is referred to as a third acquisition frequency.
  • the image matching processor 130 may The second imaging frequency performs interpolation calculation on the plurality of relative displacement data to obtain a second relative positional relationship corresponding to each column scan image.
  • the second relative positional relationship corresponding to the plurality of optical images is in one-to-one correspondence with the plurality of relative displacement data.
  • the image matching processor 130 may extract a plurality of relative displacement data according to the second imaging frequency to obtain a second relative positional relationship corresponding to each optical image.
  • the visible light imaging device 120 adopts an area array camera or an imaging device, since the image acquired by each acquisition cycle covers a larger range of the detected object, the optical image acquisition frequency can be reduced, and then each frame image is spliced and fused to form a final image. A panoramic image of the object and the scene.
  • the reference object at the same distance from the visible light imaging device as the object to be detected can be imaged in advance to obtain a reference image, and then the imaging ratio is determined based on the actual size of the reference object and the display size of the reference object in the reference image.
  • the imaging ratio here refers to the ratio of the size of the object in the reference image to the actual size.
  • the position of each column of the image may preferably be a scale.
  • the column scan image acquired by the radiation imaging apparatus 110 and acquired by the visible light imaging apparatus 120 may be acquired according to the first relative positional relationship and the second relative positional relationship.
  • the optical image is matched.
  • the visible light imaging device 120 when the visible light imaging device 120 is disposed at the exit position of the scanning ray of the radiation imaging device 110 (for example, as shown in FIGS. 2 and 3, the visible light imaging device 120 may be disposed at the exit position of the collimator 1120 or the ray modulation device 1121.
  • the column scan image and the optical image corresponding to the first relative positional relationship and the second relative positional relationship are directly determined to be matched.
  • the visible light imaging device When the visible light imaging device is disposed at a predetermined distance from the exit position of the scanning ray of the radiation imaging device (for example, the visible light imaging device 120 shown by the broken line in FIGS. 2 and 3), it is also necessary to determine the first relative according to the deviation position. Positional relationship and/or second relative positional relationship The whole is based on the adjusted data for matching.
  • the moving speed of the radiation imaging apparatus 110 may be uneven, and the slow moving speed may cause oversampling, and one encoding value may correspond to multiple The column scans the image, and at this time, the radiation image formed by the plurality of column scan images is compared with the actual image of the detected object, and the widening deformation occurs.
  • the radiation imaging device 110 moves too fast, it is possible that several code values correspond to one column scan image, and the radiation image formed by the plurality of column scan images is compared with the actual image of the detected object. Squeeze and deform.
  • the visible light imaging device 120 acquires an optical image of the detected object using line array acquisition
  • the above-described deformation may also exist.
  • the image matching processor 130 may integrate a plurality of column scan images based on the first relative positional relationship to obtain a reconstructed scan image whose imaging scale is close to the actual.
  • the image matching processor 130 may perform geometric reconstruction on the plurality of column scan images according to the first relative positional relationship to obtain a scanned image whose aspect ratio matches the actual object, and obtain the reconstructed corresponding position coordinates of each column of the image. value.
  • the image reconstruction process may be performed according to the coded value, and the oversampled image may be subjected to extraction or averaging processing for reconstruction, and the undersampled image may be subjected to interpolation processing for reconstruction.
  • FIG. 4C the reconstructed image of the radiation image shown in FIG. 4A is not deformed in the image, and the corresponding position code values are sequentially arranged in the order of the arithmetic progression.
  • the reconstructed image for the radiation image shown in Fig. 5A is as shown in Fig. 5B.
  • the optical image may be reconstructed using the same reconstruction method as the above-described radiation image.
  • the reconstructed image for the optical image shown in FIG. 4B is as shown in FIG. 4D.
  • an image of a plurality of image contents overlapping each other may be selected from a picture group or a video stream to perform image mosaic processing, and a visible light panoramic image having the same length as the back scattering image is obtained, and a panoramic image is obtained.
  • Image stitching can use existing feature-based matching algorithms, and can select feature points such as SIFT, FAST, and SURF. Line matching.
  • the radiation image and the optical image may be matched according to the reconstructed position coordinate value to determine the corresponding image coordinate relationship.
  • the position coordinate value between the two is not deviated, and the image is directly matched according to the position coordinate values of the two; when the camera of the visible light imaging device is not installed
  • the position coordinate value between the two has a deviation.
  • the installation position is fixed, the deviation between the position coordinate values is fixed, and the deviation value can be obtained in advance, and the matching is fixed according to the known The deviation value can be used to correspond between images.
  • the radiation inspection system 100 can also include a display 150.
  • the radiation image and optical image associated with the simultaneous display display may be displayed by display 150.
  • the display 150 can be simultaneously displayed in accordance with the display mode of FIG. In this way, the security personnel can be easily determined to quickly determine the detected object corresponding to the radiation image.
  • the reconstructed radiation image can also be directly made into a backscattered image video according to the position information, and the playback speed of the object in the video can be adjusted by referring to the position information in the visible light video to Ensure that the two videos are synchronized. It is also possible to adjust the playback speed of backscattered video and visible light video separately according to a specific playback speed to ensure synchronization.
  • the radiation inspection system may further include a GPS positioning device for acquiring geographic location information of the radiation imaging device during the radiation inspection.
  • the image matching processor 130 can bind the location information of the GPS to each column of the image.
  • the display can be added to the map module to display the dynamic position of the radiation imaging device in the map according to the GPS position information when the image and video are dynamically displayed.
  • the display 150 can display the dynamic position of the radiation imaging device according to the display manner of FIG.
  • the radiation inspection system may further include an identification recognition device for identifying identification information of the detected object during the radiation inspection.
  • the identification recognition device may take a license plate photograph and identify the vehicle to be inspected during the scanning process, and bind the license plate photo and the recognition result to the corresponding vehicle in the image.
  • the present invention also provides a radiation inspection method.
  • the radiation inspection method of the present invention can be applied to the above radiation inspection system, and only the basic steps that the radiation inspection method of the present invention can have are described below. For the details mentioned in the steps, reference can be made to the above description, here No longer.
  • the radiation inspection method of the present invention may comprise the steps of: scanning a detected object column by column using a radiation imaging device to obtain a plurality of column scan images of the detected object, the direction of the columns being substantially perpendicular to the direction of relative motion; during the radiation inspection process
  • the object to be detected is optically imaged using a visible light imaging device to obtain one or more optical images of the detected object, wherein the visible light imaging device and the radiation imaging device have a fixed relative positional relationship during the radiation inspection;
  • the matching rule establishes a correspondence relationship between the column scan image corresponding to the same detected object and the optical image.
  • the step of establishing a correspondence relationship between the column scan image and the optical image corresponding to the same detected object based on the predetermined matching rule may include: scanning imaging time based on the at least one column scan image and shooting time of the optical image, or based on Generating a column scan image and an optical image by forming a first relative positional relationship between the at least one column scan image and the detected object when the radiation imaging device forms a second relative positional relationship with the object to be detected when the visible light imaging device forms the optical image Correspondence between them.
  • the radiation inspection method of the present invention may further comprise the steps of: integrating a plurality of column scan images based on the first relative positional relationship to obtain a reconstructed scan image whose imaging ratio is close to an actual; and/or based on the second relative The positional relationship integrates multiple optical images to obtain a reconstructed optical image with an imaging ratio close to the actual.
  • the radiation imaging device scans the detected object column by column at the first imaging frequency
  • the optical image imaging device optically images the detected object at the second imaging frequency
  • the method may further include: using the positioning device during the radiation inspection process Collecting relative displacement data of the positioning device relative to the detected object at a third acquisition frequency; determining a first relative positional relationship based on the one or more relative displacement data acquired by the positioning device before and after the scanning imaging time of the column scan image, based on the positioning device
  • the second relative positional relationship is determined by one or more relative displacement data acquired before and after the imaging time of the optical image.
  • the plurality of relative displacement data may be interpolated to obtain a first relative positional relationship corresponding to each column scan image.
  • the third acquisition frequency is equal to the first imaging frequency, it may be determined that the first relative positional relationship corresponding to the plurality of column scan images is in one-to-one correspondence with the plurality of relative displacement data.
  • the plurality of relative displacement data may be extracted to obtain a first relative positional relationship corresponding to each column scan image.
  • the visible light imaging device is a line camera
  • the object to be detected can be optically imaged column by column, at this time:
  • the relative displacement data is interpolated to obtain a second relative positional relationship corresponding to each optical image
  • the relative displacement data is extracted to obtain a second relative positional relationship corresponding to each optical image.
  • the visible light imaging device is an area array camera or an imaging device
  • the visible light imaging device previously images a reference object at the same distance from the visible object imaging device as the reference image
  • the image matching processor is based on the reference object.
  • the imaging size is determined by the actual size and the display size of the reference object in the reference image
  • the image matching processor determines the position of the lens center line of the visible light imaging device with respect to the detected object when the optical image is formed, and determines based on the position and the imaging ratio The position of each column of the image in the optical image.

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Abstract

一种辐射检查系统(100)和方法。其中，辐射检查系统(100)中的辐射成像装置(110)可以逐列扫描被检测物体，以得到被检测物体的多个列扫描图像。可见光成像装置(120)用于在辐射检查过程中对被检测物体进行光学成像，以得到被检测物体的多个光学图像。图像匹配处理器(130)基于预定的匹配规则建立对应于同一被检测物体的列扫描图像和光学图像之间的对应关系。这样，在显示辐射图像时，可以同步地显示与其对应的光学图像，方便安检人员快速确定辐射图像所对应的被检测物体。

Description

辐射检查系统和方法 技术领域
本发明涉及辐射成像技术领域，特别是涉及一种辐射检查系统和方法。
背景技术
利用辐射成像对车辆及货物等大型目标进行检查已是比较成熟的安检技术，根据成像原理不同，主要有射线透射成像和射线散射成像两大类。通常，透射成像系统由至少一个辐射源、至少一组将辐射源发出的射线准直成扇形束的准直器、至少一列位于被扫描物体另一侧的探测器阵列、至少一组用于探测移动目标被扫描部分到达扫描位置传感器单元组成，国内外已有不少公司推出各类基于透射成像的车辆/货物扫描系统。散射成像是通过测量从被检测物质中散射出来的光子来对物体进行成像。
透射图像是射线穿过被检物体衰减后被位于物体另一侧的探测器探测到而形成的图像，射线的透射信号反应了被照物体的密度和厚度等信息，可显示物体的内部结构；散射图像是由被检物靠近探测器方向一定深度的物体散射出来的射线信号形成的，由于炸药、毒品等低原子序数物质中射线的康普顿散射更强，所对应的部分在图像中信号更强，这一特性是背散射技术得到安检应用的重要因素。
由于成像原理不同，透射、散射图像与摄像头、相机等可见光频段图像采集设备获取的光学图像有着显著区别。简要来说，透射、散射图像只能反映被检物的外形轮廓，无法获取光学图像中如人眼所能观察到的物体颜色、纹理等表面细节特征，因此安检人员很难将透射、散射图像与实际被检物对应起来，这会对安检过程形成不利影响，特别是车载式扫描设备完成扫描后，在被检车辆或货物没有特定标识(如车牌)或顺序的情况下，根据扫描图像来定位嫌疑物体会存在一定困难，例如利于背散射扫描设备对沿街停放的车辆进行扫描后再查图安检。被检车辆/货物图像与实际车辆不好对应，将会影响后续手工检查、事后追溯等一系列执法过程。
由此，需要一种能够快速有效地确定被检测物体的辐射成像系统。
发明内容
本发明的主要目的在于提供一种能够快速有效地确定被检测物体的辐射成像系统和方法。
根据本发明的一个方面，提供了一种辐射检查系统，用于在与被检测物体之间具有相对运动的情况下对其进行辐射检查，该系统包括：辐射成像装置，用于逐列扫描被检测物体，以得到被检测物体的多个列扫描图像，列的方向基本上垂直于相对运动的方向；可见光成像装置，在辐射检查过程中与辐射成像装置具有固定的相对位置关系，用于在辐射检查过程中，对被检测物体进行光学成像，以得到被检测物体的一个或多个光学图像；图像匹配处理器，用于基于预定的匹配规则建立对应于同一被检测物体的列扫描图像和光学图像之间的对应关系。
优选地，图像匹配处理器可以基于至少一个列扫描图像的扫描成像时间和光学图像的拍摄时间，或者基于辐射成像装置形成至少一个列扫描图像时与被检测物体之间的第一相对位置关系和可见光成像装置形成光学图像时与被检测物体之间的第二相对位置关系，建立列扫描图像和光学图像之间的对应关系。
优选地，图像匹配处理器可以基于第一相对位置关系整合多个列扫描图像，以得到成像比例接近实际的重建扫描图像；以及/或者图像匹配处理器基于第二相对位置关系整合多个光学图像，以得到成像比例接近实际的重建光学图像。
优选地，该辐射检查系统还可以包括：定位装置，用于在辐射检查过程中，以第三采集频率采集辐射成像装置相对于被检测物体的相对位移数据，其中，辐射成像装置以第一成像频率对被检测物体进行逐列扫描，可见光成像装置以第二成像频率对被检测物体进行光学成像，图像匹配处理器基于定位装置在列扫描图像的扫描成像时间前后采集的一个或多个相对位移数据，确定第一相对位置关系，基于定位装置在光学图像的拍摄时间前后采集的一个或多个相对位移数据，确定第二相对位置关系。
优选地，当第三采集频率小于第一成像频率时，图像匹配处理器对多个相对位移数据进行插值计算，以得到每个列扫描图像所对应的第一相对位置关系，以及/或者当第三采集频率等于第一成像频率时，图像匹配处理 器确定多个列扫描图像所对应的第一相对位置关系与多个相对位移数据一一对应，以及/或者当第三采集频率大于第一成像频率时，图像匹配处理器对多个相对位移数据进行抽取，以得到每个列扫描图像所对应的第一相对位置关系。
优选地，辐射成像装置设置可以在可移动平台上，辐射成像装置能够随着可移动平台整体移动，定位装置可以包括编码器，编码器设置在可移动平台的移动机构处。
优选地，响应于辐射成像装置开始逐列扫描被检测物体，编码器开始计数，其中，可移动平台每移动预定距离，编码器进行一次计数。
优选地，定位装置可以以第三采集频率采集定位装置相对于被检测物体的相对速度，以得到一个或多个相对速度数据，根据第三采集频率以及相对速度数据，确定一个或多个相对位移数据。
优选地，可见光成像装置为线阵相机，用于逐列对被检测物体进行光学成像，当第三采集频率小于第二成像频率时，图像匹配处理器对相对位移数据进行插值计算，以得到每个光学图像所对应的第二相对位置关系，以及/或者当第三采集频率等于第二成像频率时，图像匹配处理器确定多个光学图像所对应的第一相对位置关系与多个相对位移数据一一对应，当第三采集频率大于第二成像频率时，图像匹配处理器对相对位移数据进行抽取，以得到每个光学图像所对应的第二相对位置关系。
优选地，可见光成像装置为面阵相机或摄像装置，可见光成像装置预先对与被检测物体距可见光成像装置相同距离处的参照物进行成像，以得到参照图像，图像匹配处理器基于参照物的实际尺寸以及参照图像中的参照物的显示尺寸，确定成像比例，图像匹配处理器确定形成光学图像时可见光成像装置拍摄的镜头中心线相对于被检测物体的位置，并基于该位置和成像比例确定光学图像中每列图像所对应的第二相对位置关系。
优选地，可见光成像装置设置在辐射成像装置的扫描射线的出射位置，或者可见光成像装置设置在偏离辐射成像装置的扫描射线的出射位置预定距离处。
优选地，该辐射检查系统还可以包括：GPS定位设备，用于在辐射检查过程中，获取辐射成像装置的地理位置信息；和/或标识识别设备，用于在辐射检查过程中，识别被检测物体的标识信息。
根据本发明的另一个方面，还提供了一种辐射检查方法，用于在与被检测物体之间具有相对运动的情况下对其进行辐射检查，该方法包括：使用辐射成像装置逐列扫描被检测物体，以得到被检测物体的多个列扫描图像，列的方向基本上垂直于相对运动的方向；在辐射检查过程中，使用可见光成像装置对被检测物体进行光学成像，以得到被检测物体的一个或多个光学图像，其中，在辐射检查过程中可见光成像装置与辐射成像装置具有固定的相对位置关系；基于预定的匹配规则建立对应于同一被检测物体的列扫描图像和光学图像之间的对应关系。
优选地，基于预定的匹配规则建立对应于同一被检测物体的所述列扫描图像和所述光学图像之间的对应关系的步骤可以包括：基于至少一个列扫描图像的扫描成像时间和光学图像的拍摄时间，或者基于辐射成像装置形成至少一个列扫描图像时与被检测物体之间的第一相对位置关系和可见光成像装置形成光学图像时与被检测物体之间的第二相对位置关系，建立列扫描图像和光学图像之间的对应关系。
优选地，该方法还可以包括：基于第一相对位置关系整合多个列扫描图像，以得到成像比例接近实际的重建扫描图像；并且/或者基于第二相对位置关系整合多个光学图像，以得到成像比例接近实际的重建光学图像。
优选地，辐射成像装置可以以第一成像频率对被检测物体进行逐列扫描，光学图像成像装置可以以第二成像频率对被检测物体进行光学成像，该方法还可以包括：在辐射检查过程中使用定位装置以第三采集频率采集定位装置相对于被检测物体的相对位移数据；基于定位装置在列扫描图像的扫描成像时间前后采集的一个或多个相对位移数据，确定第一相对位置关系，基于定位装置在光学图像的拍摄时间前后采集的一个或多个相对位移数据，确定第二相对位置关系。
优选地，当第三采集频率小于第一成像频率时，对多个相对位移数据进行插值计算，以得到每个列扫描图像所对应的第一相对位置关系，以及/或者当第三采集频率等于第一成像频率时，确定多个列扫描图像所对应的第一相对位置关系与多个相对位移数据一一对应，以及/或者当第三采集频率大于第一成像频率时，对多个相对位移数据进行抽取，以得到每个列扫描图像所对应的第一相对位置关系。
优选地，可见光成像装置为线阵相机，用于逐列对被检测物体进行光 学成像，当第三采集频率小于第二成像频率时，对相对位移数据进行插值计算，以得到每个光学图像所对应的第二相对位置关系，以及/或者当第三采集频率等于第二成像频率时，确定多个光学图像所对应的第一相对位置关系与多个相对位移数据一一对应，当第三采集频率大于第二成像频率时，对相对位移数据进行抽取，以得到每个光学图像所对应的第二相对位置关系。
优选地，可见光成像装置为面阵相机或摄像装置，该方法该可以包括：预先对与被检测物体距可见光成像装置相同距离处的参照物进行成像，以得到参照图像，基于参照物的实际尺寸以及参照图像中的参照物的显示尺寸，确定成像比例，确定形成光学图像时可见光成像装置拍摄的镜头中心线相对于被检测物体的位置，并基于该位置和成像比例确定光学图像中每列图像所对应的第二相对位置关系。
综上，本发明的辐射检查系统和方法主要是在对被检测物体进行辐射成像的过程中，同时对被检测物体进行可见光成像，然后将通过辐射扫描得到的辐射图像和通过可见光成像得到的光学图像对应起来。这样，在显示辐射图像时，可以同步地显示与其对应的光学图像，方便安检人员快速确定辐射图像所对应的被检测物体。
附图说明
通过结合附图对本公开示例性实施方式进行更详细的描述，本公开的上述以及其它目的、特征和优势将变得更加明显，其中，在本公开示例性实施方式中，相同的参考标号通常代表相同部件。
图1示出了根据本发明一实施例的辐射检查系统的结构的示意性方框图。
图2示出了采用透射式辐射成像时辐射成像装置的结构示意图。
图3示出了采用背散射辐射成像时辐射成像装置的结构示意图。
图4A示出了直接测距下的原始辐射图像。
图4B示出了直接测距下的原始光学图像。
图4C示出了对图4A所示的辐射图像进行重建后的图像。
图4D示出了对图4B所示的光学图像进行重建后的光学图像。
图5A示出了间接测距下的原始辐射图像。
图5B示出了对图5A所示的辐射图像进行重建后的图像。
图6示出了一种同步显示辐射图像和光学图像的示意图。
图7示出了在地图中显示辐射成像装置的位置的示意图。
具体实施方式
下面将参照附图更详细地描述本公开的优选实施方式。虽然附图中显示了本公开的优选实施方式，然而应该理解，可以以各种形式实现本公开而不应被这里阐述的实施方式所限制。相反，提供这些实施方式是为了使本公开更加透彻和完整，并且能够将本公开的范围完整地传达给本领域的技术人员。
如前文所述，使用辐射成像技术对车辆等被检测物体进行扫描而得到的辐射图像只能反映被检测物体的轮廓信息，不能获取被检测物体的颜色、纹理等细节特征，这使得相关人员很难将扫描图像和实际被检测物体对应起来。例如，在使用车载式扫描设备对沿街停放的汽车进行辐射扫描成像时，会得到很多车辆的辐射图像。在扫描完成后，对辐射图像进行检查时，相关工作人员仅根据辐射图像，无法将其与实际车辆对应起来，这无疑会影响后续手工检查、事后追溯等一系列执法过程。
鉴于对上述问题的深刻认识，本发明提出了一种能够快速确定辐射图像所对应的被检测物体的辐射检查方案。
本发明的辐射检查方案主要是在对被检测物体进行辐射成像的过程中，同时对被检测物体进行可见光成像，然后基于一定的匹配规则(可以基于时间或相对位置关系进行匹配，也可以采用其它匹配方式，具体的匹配过程将在下文详细说明)，将对应于同一被检测物体的通过辐射扫描得到的辐射图像和通过可见光成像得到的光学图像对应起来。这样，在显示辐射图像时，可以同步地显示与其对应的光学图像，方便安检人员快速确定辐射图像所对应的被检测物体。
本发明的辐射检查方案可以实现为一种辐射检查系统，也可以实现为一种辐射检查方法。
图1示出了根据本发明一实施例的辐射检查系统的结构的示意性方框图。
基于辐射成像原理可知，辐射检查系统用于在与被检测物体之间具有 相对运动的情况下对被检测物体进行辐射检查(这里的辐射检查主要是指辐射成像)。这里通常有两种形成相对运动的方式：一种是被检物固定不动，辐射检查系统在地面上移动，经过被检物实现扫描成像，例如车载式透射检查系统和车载式背散射检查系统进行移动扫描，可将这类扫描方式称为移动式扫描；另一种是辐射检查系统固定不动，被检物经过辐射检查系统实现扫描成像，例如速通式车辆检查系统，或车载式检查系统固定不动车辆通过进行扫描成像，可将这类扫描方式称为固定式扫描。
参见图1，辐射检查系统100包括辐射成像装置110、可见光成像装置120以及图像匹配处理器130。
辐射成像装置110用于逐列扫描被检测物体，以得到被检测物体的多个列扫描图像，其中，列的方向基本上垂直于辐射成像装置110与被检测物体之间的相对运动的方向。
具体地，辐射成像装置110可以采用透射式辐射成像，也可以采用背散射辐射成像。
如图2所示，在采用透射式辐射成像时，辐射成像装置可以包括辐射源1110、准直器1120以及探测器1130。
辐射源1110用于产生X射线。准直器1120用于射线准直，使得射线经过检测通道之后刚好保证完全覆盖探测器阵列。探测器1130可以检测射线经过检测通道后到达探测器位置时射线的强度，并可以将射线强度转换为透射图像。
如图3所示，在采用背散射辐射成像时，辐射成像装置可以包括辐射源1110、射线调制装置1121以及探测器1130。其中，辐射源1110用于产生X射线，射线调制装置1121用于对辐射源1110产生的X射线进行调制，以形成点扫描的扫描射线。与采用透射式辐射成像不同，探测器1130位于射线调制装置1121的两侧，用来接收从被检测物体散射的射线的强度，并将射线强度转换为散射图像。
可见光成像装置120在辐射检查过程中与辐射成像装置110具有固定的相对位置关系，用于在辐射检查过程中，对被检测物体进行光学成像，以得到被检测物体的一个或多个光学图像。其中，这里的光学图像可以是一个个照片，也可以是包含多个光学图像的视频。
例如，可见光成像装置120可以是相机或摄像装置，具体可以是面阵 相机也可以是线阵相机，按相应的面阵或线阵采集方式对被检测物体进行采集，以获得被检测物体的场景图像或视频。例如，在使用线阵相机时，可以逐列地对被检测物体进行光学图像，这样可以得到多列光学图像；在使用面阵相机对被检测物体进行光学成像时，面阵相机的成像范围较大，在被检测物体数量较少或被检测物体体积较小时，可能得到一幅或几幅光学图像；另外，还可以使用摄像装置获取被检测物体的视频信息，此时可以得到包含多个光学图像的视频。
图像匹配处理器130可以基于预定的匹配规则将对应于同一被检测物体的列扫描图像和光学图像进行匹配，得到二者之间的对应关系，对于匹配的列扫描图像和光学图像，可以同步显示，方便安检人员对被检测物体进行快速定位。
这里，图像匹配处理器130可以采取多种匹配规则进行匹配，作为示例，下面列举了基于时间进行匹配和基于相对位置关系进行匹配的两种匹配方式。应该知道，本领域技术人员还可以采取多种其它的匹配方式将对应于同一被检测物体的列扫描图像和光学图像对应起来，这里不再赘述。
基于时间进行匹配
图像匹配处理器130可以根据列扫描图像的扫描成像时间和光学图像的拍摄时间，建立列扫描图像和光学图像之间的对应关系。
如上文所述，辐射成像装置110对被检测物体进行辐射成像的过程中，可见光成像装置120可以同时对被检测物体进行可见光成像。其中可见光成像装置120的成像频率可以与辐射成像装置110的列扫描图像的成像频率相同，也可以不同。根据列扫描图像的扫描成像时间和光学图像的拍摄时间，可以建立列扫描图像和光学图像之间的对应关系。
例如，可见光成像装置120可以采用线阵扫描成像的方式对被检测物体进行光学成像，并且可见光成像装置120的成像频率和辐射成像装置110的列扫描图像的成像频率可以相同，优选地，可见光成像装置120可以设置在辐射成像装置110的发射扫描射线束的位置处，并且同步成像。这样，可以将基于辐射成像装置110得到的多个列扫描图像和基于可见光成像装置120得到的多个光学图像按照时间顺序直接对应起来。
基于相对位置关系进行匹配
图像匹配处理器130也可以根据辐射成像装置110形成列扫描图像时与被检测物体之间的相对位置关系(为了便于区分，这里可以称为第一相对位置关系)和可见光成像装置形成光学图像时与被检测物体之间的相对位置关系(这里称为第二相对位置关系)，建立列扫描图像和光学图像之间的对应关系。
由此，本发明的辐射检测系统还可以包括定位装置，可以通过定位装置来获取第一相对位置关系和第二相对位置关系，从而实现列扫描图像和光学图像的匹配。
如图1所示，辐射检查系统100可以包括定位装置140。定位装置140可以在辐射成像装置110对被检测物体进行辐射成像过程中，以预定的采集频率(可以是一个固定频率，也可以是一个变化的频率)采集辐射成像装置110相对于被检测物体的相对位移数据。其中，在定位装置140采集相对位移数据时，定位装置140与辐射成像装置110之间的相对位置关系固定。
如上文所述，在辐射成像装置110对被检测物体进行辐射成像过程中，可见光成像装置120与辐射成像装置110之间的相对位置关系也固定。因此，根据定位装置140获取的辐射成像装置110相对于被检测物体的相对位移数据，就可以得到可见光成像装置120相对于被检测物体的相对位移数据。这里，在可见光成像装置120设置在辐射成像装置110的扫描射线束的出射位置时，定位装置140获取的辐射成像装置110相对于被检测物体的相对位移数据可以直接作为可见光成像装置120相对于被检测物体的相对位移数据。在可见光成像装置120设置在偏离辐射成像装置110的扫描射线束的出射位置一定距离时，可以根据该距离对定位装置140获取的辐射成像装置110相对于被检测物体的相对位移数据进行相应偏移，以得到可见光成像装置120相对于被检测物体的相对位移数据。作为优选，辐射成像装置110、可见光成像装置120以及定位装置140同步工作，这里的同步是指开始工作的时刻同步，工作中的频率可以不相同。
其中，定位装置140可以以预定的采样频率直接采集定位装置140相对于被检测物体的相对位移数据。直接采集的方法用于移动式扫描模式比较方便，例如，辐射成像装置110可以集成在可移动平台上，辐射成像装置 110能够随着可移动平台整体移动。定位装置140可以采用编码器，编码器可以设置在可移动平台的移动机构处。
以可移动平台为车辆，编码器设置在车辆的车轮轴处为例，编码器可以以地面上的某个位置为坐标原点，例如可以以辐射成像装置110的扫描射线书的出射位置为坐标原点。这样，当辐射成像装置110移动进行扫描时，编码器开始计数，其对应的是车轮旋转的角度，即对应检查设备相对坐标原点移动的距离。由此，车辆每移动预定距离(可以车辆的车轮转动一圈)，编码器就进行一次计数。
如图4A所示，上方是辐射成像装置110扫描一辆货车采集到的辐射图像示意图，下方是编码器采集到的编码值数值。由于辐射成像装置110移动时速度可能不均匀，如图所示扫描货车驾驶室时移动速度偏慢导致过采样，对应的编码值会出现重复的情况，原始辐射图像也会拉宽变形；而扫描车箱前部时移动速度偏快导致欠采样，对应的编码值会出现跳跃的情况，原始辐射图像也会压窄变形，对于这种情况可按下文介绍的重建方法进行图像重建。
如图4B所示，上方是可见光成像装置120对货车进行光学图像得到的光学图像示意图，下方同样是编码器采集得到的编码值数。其中，本实施例中来说，可见光成像装置120的安装位置与辐射成像装置110的扫描射线束的出射位置具有一定的偏离距离，因此，图4A和图4B中对应于被检测物体的同一区域的辐射图像和光学图像所对应的编码值具有一定的偏差。
另外，定位装置140也可以以预定的采样频率采集定位装置140相对于被检测物体的相对速度，以得到一个或多个相对速度数据，然后根据采样间隔(根据采样频率可以得出)以及相对速度数据，可以确定定位装置140相对于被检测物体的相对位移数据。
也就是说，可以将速度乘以位置信息的采样间隔时间，得到采样间隔时间内移动的距离，将采样间隔距离累加即为相对位移数据。例如，当测速周期为Δt时，当前测量得到的速度为vi，i＝0,1,2...为测速采样序号，则计算相对位移数据为pi＝pi-1+Δt*vi。
如图5A所示，上面图像是辐射成像装置110扫描一辆货车采集到的辐射图像示意图，下方是按一定频率采集到的被检物移动速度值以及换算得到的相 对位移数据。
图像匹配处理器130可以基于定位装置140在列扫描图像的扫描成像时间前后采集的一个或多个相对位移数据，确定第一相对位置关系，基于定位装置140在光学图像的拍摄时间前后采集的一个或多个相对位移数据，确定第二相对位置关系。由此，在确定了第一相对位置关系和第二相对位置关系后，就可以将相对位置关系相同或相近的列扫描图像和光学图像对应起来。
第一相对位置关系的确定
为了便于描述，这里将辐射成像装置110的列扫描图像的成像频率称为第一成像频率。
将定位装置140的采集(直接采集或间接采集)相对位移数据的频率称为第三采集频率。
当第三采集频率小于第一成像频率时，图像匹配处理器130可以根据第一成像频率对多个相对位移数据进行插值计算，以得到每个列扫描图像所对应的第一相对位置关系。
当第三采集频率等于第一成像频率时，多个列扫描图像所对应的第一相对位置关系与多个相对位移数据一一对应。
当第三采集频率大于第一成像频率时，图像匹配处理器130可以根据第一成像频率对多个相对位移数据进行抽取，以得到每个列扫描图像所对应的第一相对位置关系。
第二相对位置关系的确定
当可见光成像装置120采用线阵相机逐列对被检测物体进行光学成像时，由于可见光成像装置120与辐射成像装置110采用线阵扫描成像的方式。因此，第二相对位置关系的确定可以与第一相对关系的确定方式相同。
为了便于描述，这里将可见光成像装置120的光学图像的成像频率称为第二成像频率。
将定位装置140的采集(直接采集或间接采集)相对位移数据的频率称为第三采集频率。
当第三采集频率小于第二成像频率时，图像匹配处理器130可以根据 第二成像频率对多个相对位移数据进行插值计算，以得到每个列扫描图像所对应的第二相对位置关系。
当第三采集频率等于第二成像频率时，多个光学图像所对应的第二相对位置关系与多个相对位移数据一一对应。
当第三采集频率大于第二成像频率时，图像匹配处理器130可以根据第二成像频率对多个相对位移数据进行抽取，以得到每个光学图像所对应的第二相对位置关系。
当可见光成像装置120采用面阵相机或摄像装置时，由于每次采集周期获取的图像覆盖被检测物体范围更大，因此可以降低光学图像采集频率，再将各帧图像进行拼接融合，形成最终的被检物及场景的全景图像。
当相机的成像参数，如焦距等参数固定时，与相机固定距离的场景在图像中比例是固定的。因此可以预先对与被检测物体距可见光成像装置相同距离处的参照物进行成像，以得到参照图像，然后基于参照物的实际尺寸以及参照图像中的参照物的显示尺寸，确定成像比例。这里的成像比例是指参照图像中的物体尺寸与实际尺寸的比例。
在确定了成像比例后，只需要确定形成光学图像时相机的摄像头中心线相对于被检测物体的位置，就可以确定光学图像的中心相对于被检测物体的位置，根据成像比例就可以推算出光学图像每列所对应的位置。这里的参照物可以优选地是标尺。
第一相对位置关系和第二相对位置关系的匹配
在确定了第一相对位置关系和第二相对位置关系后，就可以根据第一相对位置关系和第二相对位置关系，对使辐射成像装置110获取的列扫描图像和使用可见光成像装置120获取的光学图像进行匹配。
其中，在可见光成像装置120设置在辐射成像装置110的扫描射线的出射位置时(例如，图2、图3所示，可见光成像装置120可以设置在准直器1120或射线调制装置1121的出射位置)，直接将第一相对位置关系和第二相对位置关系相对应的列扫描图像和光学图像确定为相匹配即可。
在可见光成像装置设置在偏离辐射成像装置的扫描射线的出射位置预定距离处时(例如，图2、图3中虚线部分所示的可见光成像装置120)，还需要根据偏离位置，对第一相对位置关系和/或第二相对位置关系进行调 整，基于调整后的数据进行匹配。
图像重建
如图4A所示，在辐射成像装置110对被检测物体进行辐射成像的过程中，辐射成像装置110的移动速度可能不均匀，在移动速度偏慢会导致过采样，一个编码值会对应多个列扫描图像，此时基于多个列扫描图像拼接成的辐射图像与被检测物体的实际图像相比，会出现拉宽变形。而在辐射成像装置110移动速度过快时，有可能出现几个编码值对应一个列扫描图像，此时基于多个列扫描图像拼接成的辐射图像与被检测物体的实际图像相比，会出现压窄变形。
相应地，如图4B所示，在可见光成像装置120使用线阵采集的方式获取被检测物体的光学图像时，也可能存在上述变形的情况。
因此，图像匹配处理器130可以基于第一相对位置关系整合多个列扫描图像，以得到成像比例接近实际的重建扫描图像。同时也可以基于第二相对位置关系整合多个光学图像，以得到成像比例接近实际的重建光学图像。
具体地说，图像匹配处理器130可以根据第一相对位置关系对多个列扫描图像进行几何重建以获得长宽比例与实际物体相符的扫描图像，并得到图像每列的重建后的相应位置坐标值。
例如，可根据编码值进行图像重建处理，对过采样的图像进行抽取或平均处理进行重建，对欠采样的图像进行插值处理进行重建。对于图4A所示的辐射图像进行重建后的图像如图4C所示，图像中被检物各部分不会变形，所对应的位置编码值将为等差数列顺序排列。对于图5A所示的辐射图像进行重建后的图像如图5B所示。
当可见光成像装置是线阵相机时，也可采用上述辐射图像同样的重建方法对光学图像进行重建，例如对于图4B所示的光学图像进行重建后的图像如图4D所示。
当可见光成像装置是面阵相机时，可从图片组或视频流中选取部分图像内容相互交叠的图像进行图像拼接处理，得到一幅与背散射图像长度相同的可见光全景图像，并得到全景图像每列的位置坐标值。图像拼接可采用现有的基于特征的匹配的算法，可选取SIFT，FAST，SURF等特征点进 行匹配。
在对辐射图像进行重建并对光学图像进行重建或拼接后，可根据重建后的位置坐标值，将辐射图像和光学图像进行匹配，确定对应的图像坐标关系。当可见光成像装置的相机安装在辐射成像装置射线束位置时，二者之间的位置坐标值没有偏差，直接按二者的位置坐标值将图像对应即可；当可见光成像装置的相机没有安装在辐射成像装置射线束位置时，二者之间的位置坐标值存在偏差，当安装位置固定时，位置坐标值之间的偏差是固定的，可提前对比获取偏差值，匹配时按照已知固定的偏差值进行图像间的对应即可。完成匹配后，即将辐射图像和光学图像关联起来。
关联显示
如图1所示，作为本发明的一个可选实施例，辐射检查系统100还可以包括显示器150。对于确定的相关联的辐射图像和光学图像，可以由显示器150将进行同步显示关联的辐射图像和光学图像示。例如，显示器150可以按照图6的显示方式进行同步显示。这样，可以便于安检人员快速确定辐射图像所对应的被检测物体。
另外，还可以以视频的方式同步显示辐射图像和光学图像。例如，当可见光成像装置采集到的是视频信号时，也可以将重建后的辐射图像直接按位置信息制作成背散射图像视频，视频中物体的播放速度可参考可见光视频中位置信息进行调节，以保证二者视频播放同步。也可以按特定的播放速度，分别调节背散射视频和可见光视频的播放速度，保证同步。
作为本发明的另一个可选实施例，辐射检查系统还可以包括GPS定位设备，用于在辐射检查过程中，获取辐射成像装置的地理位置信息。这样，图像匹配处理器130可以将GPS的位置信息绑定到图像每列。显示器可加入地图模块，动态显示图像和视频时，根据GPS位置信息在地图中显示辐射成像装置的动态位置，例如，显示器150可以按照图7的显示方式显示辐射成像装置的动态位置。
作为本发明的另一个可选实施例，辐射检查系统还可以包括标识识别设备，用于在辐射检查过程中，识别被检测物体的标识信息。例如，标识识别设备可以在扫描过程中对被检车辆进行车牌拍照并识别，将车牌照片和识别结果绑定至图像中相应的车辆。
至此，结合图1-图7详细说明了本发明的辐射检查系统，另外，本发明还提供了一种辐射检查方法。本发明的辐射检查方法可以适用于于上文的辐射检查系统，下面仅就本发明的辐射检查方法可以具有的基本步骤进行说明，对于步骤中述及的细节部分可以参见上文相关叙述，这里不再赘述。
本发明的辐射检查方法可以包括以下步骤：使用辐射成像装置逐列扫描被检测物体，以得到被检测物体的多个列扫描图像，列的方向基本上垂直于相对运动的方向；在辐射检查过程中，使用可见光成像装置对被检测物体进行光学成像，以得到被检测物体的一个或多个光学图像，其中，在辐射检查过程中可见光成像装置与辐射成像装置具有固定的相对位置关系；基于预定的匹配规则建立对应于同一被检测物体的所述列扫描图像和所述光学图像之间的对应关系。
其中，基于预定的匹配规则建立对应于同一被检测物体的列扫描图像和光学图像之间的对应关系的步骤可以包括：基于至少一个列扫描图像的扫描成像时间和光学图像的拍摄时间，或者基于辐射成像装置形成至少一个列扫描图像时与被检测物体之间的第一相对位置关系和可见光成像装置形成光学图像时与被检测物体之间的第二相对位置关系，建立列扫描图像和光学图像之间的对应关系。
作为一个可选实施例，本发明的辐射检查方法还可以包括以下步骤：基于第一相对位置关系整合多个列扫描图像，以得到成像比例接近实际的重建扫描图像；并且/或者基于第二相对位置关系整合多个光学图像，以得到成像比例接近实际的重建光学图像。
其中，辐射成像装置以第一成像频率对被检测物体进行逐列扫描，光学图像成像装置以第二成像频率对被检测物体进行光学成像，该方法还可以包括：在辐射检查过程中使用定位装置以第三采集频率采集定位装置相对于被检测物体的相对位移数据；基于定位装置在列扫描图像的扫描成像时间前后采集的一个或多个相对位移数据，确定第一相对位置关系，基于定位装置在光学图像的拍摄时间前后采集的一个或多个相对位移数据，确定第二相对位置关系。
当第三采集频率小于第一成像频率时，可以对多个相对位移数据进行插值计算，以得到每个列扫描图像所对应的第一相对位置关系。
当第三采集频率等于第一成像频率时，可以确定多个列扫描图像所对应的第一相对位置关系与多个相对位移数据一一对应。
当第三采集频率大于第一成像频率时，可以对多个相对位移数据进行抽取，以得到每个列扫描图像所对应的第一相对位置关系。
在可见光成像装置为线阵相机时，可以逐列对被检测物体进行光学成像，此时：
当第三采集频率小于第二成像频率时，对相对位移数据进行插值计算，以得到每个光学图像所对应的第二相对位置关系；
当第三采集频率等于第二成像频率时，确定多个光学图像所对应的第一相对位置关系与多个相对位移数据一一对应；
当第三采集频率大于第二成像频率时，对相对位移数据进行抽取，以得到每个光学图像所对应的第二相对位置关系。
另外，在可见光成像装置为面阵相机或摄像装置时，可见光成像装置预先对与被检测物体距可见光成像装置相同距离处的参照物进行成像，以得到参照图像，图像匹配处理器基于参照物的实际尺寸以及参照图像中的参照物的显示尺寸，确定成像比例，图像匹配处理器确定形成光学图像时可见光成像装置拍摄的镜头中心线相对于被检测物体的位置，并基于该位置和成像比例确定光学图像中每列图像的位置。
上文中已经参考附图详细描述了根据本发明的辐射检查系统和方法。
以上已经描述了本发明的各实施例，上述说明是示例性的，并非穷尽性的，并且也不限于所披露的各实施例。在不偏离所说明的各实施例的范围和精神的情况下，对于本技术领域的普通技术人员来说许多修改和变更都是显而易见的。本文中所用术语的选择，旨在最好地解释各实施例的原理、实际应用或对市场中的技术的改进，或者使本技术领域的其它普通技术人员能理解本文披露的各实施例。

Claims (19)

  1. 一种辐射检查系统，用于在与被检测物体之间具有相对运动的情况下对其进行辐射检查，其特征在于，包括：
    辐射成像装置，用于逐列扫描被检测物体，以得到所述被检测物体的多个列扫描图像，所述列的方向基本上垂直于所述相对运动的方向；
    可见光成像装置，在辐射检查过程中与所述辐射成像装置具有固定的相对位置关系，用于在所述辐射检查过程中，对所述被检测物体进行光学成像，以得到所述被检测物体的一个或多个光学图像；
    图像匹配处理器，用于基于预定的匹配规则建立对应于同一被检测物体的所述列扫描图像和所述光学图像之间的对应关系。
  2. 根据权利要求1所述的辐射检查系统，其特征在于，
    所述图像匹配处理器基于至少一个列扫描图像的扫描成像时间和所述光学图像的拍摄时间，或者基于所述辐射成像装置形成至少一个列扫描图像时与所述被检测物体之间的第一相对位置关系和所述可见光成像装置形成所述光学图像时与所述被检测物体之间的第二相对位置关系，建立对应于同一被检测物体的所述列扫描图像和所述光学图像之间的对应关系。
  3. 根据权利要求2所述的辐射检查系统，其特征在于，
    所述图像匹配处理器基于所述第一相对位置关系整合所述多个列扫描图像，以得到成像比例接近实际的重建扫描图像；以及/或者
    所述图像匹配处理器基于所述第二相对位置关系整合所述多个光学图像，以得到成像比例接近实际的重建光学图像。
  4. 根据权利要求2所述的辐射检查系统，其特征在于，还包括：
    定位装置，用于在所述辐射检查过程中，以第三采集频率采集所述辐射成像装置相对于所述被检测物体的相对位移数据，
    其中，所述辐射成像装置以第一成像频率对所述被检测物体进行逐列 扫描，所述可见光成像装置以第二成像频率对所述被检测物体进行光学成像，
    所述图像匹配处理器基于所述定位装置在所述列扫描图像的扫描成像时间前后采集的一个或多个相对位移数据，确定所述第一相对位置关系，基于所述定位装置在所述光学图像的拍摄时间前后采集的一个或多个相对位移数据，确定所述第二相对位置关系。
  5. 根据权利要求4所述的辐射检查系统，其特征在于，
    当所述第三采集频率小于所述第一成像频率时，所述图像匹配处理器对所述多个相对位移数据进行插值计算，以得到每个所述列扫描图像所对应的第一相对位置关系，以及/或者
    当所述第三采集频率等于所述第一成像频率时，所述图像匹配处理器确定所述多个列扫描图像所对应的第一相对位置关系与所述多个相对位移数据一一对应，以及/或者
    当所述第三采集频率大于所述第一成像频率时，所述图像匹配处理器对所述多个相对位移数据进行抽取，以得到每个所述列扫描图像所对应的第一相对位置关系。
  6. 根据权利要求4所述的辐射检查系统，其特征在于，
    所述辐射成像装置设置在可移动平台上，所述辐射成像装置能够随着所述可移动平台整体移动，
    所述定位装置包括编码器，所述编码器设置在所述可移动平台的移动机构处。
  7. 根据权利要求6所述的辐射检查系统，其特征在于，
    响应于所述辐射成像装置开始逐列扫描所述被检测物体，所述编码器开始计数，其中，所述可移动平台每移动预定距离，所述编码器进行一次计数。
  8. 根据权利要求4所述的辐射检查系统，其特征在于，
    所述定位装置以所述第三采集频率采集所述定位装置相对于所述被检测物体的相对速度，以得到一个或多个相对速度数据，根据所述第三采集频率以及所述相对速度数据，确定一个或多个所述相对位移数据。
  9. 根据权利要求4所述的辐射检查系统，其特征在于，
    所述可见光成像装置为线阵相机，用于逐列对所述被检测物体进行光学成像，
    当所述第三采集频率小于所述第二成像频率时，所述图像匹配处理器对所述相对位移数据进行插值计算，以得到每个所述光学图像所对应的第二相对位置关系，以及/或者
    当所述第三采集频率等于所述第二成像频率时，所述图像匹配处理器确定所述多个光学图像所对应的第一相对位置关系与所述多个相对位移数据一一对应，
    当所述第三采集频率大于所述第二成像频率时，所述图像匹配处理器对所述相对位移数据进行抽取，以得到每个所述光学图像所对应的第二相对位置关系。
  10. 根据权利要求4所述的辐射检查系统，其特征在于，
    所述可见光成像装置为面阵相机或摄像装置，
    所述可见光成像装置预先对与所述被检测物体距所述可见光成像装置相同距离处的参照物进行成像，以得到参照图像，
    所述图像匹配处理器基于所述参照物的实际尺寸以及所述参照图像中的参照物的显示尺寸，确定成像比例，
    所述图像匹配处理器确定形成所述光学图像时所述可见光成像装置拍摄的镜头中心线相对于所述被检测物体的位置，并基于该位置和所述成像比例确定所述光学图像中每列图像所对应的第二相对位置关系。
  11. 根据权利要求4所述的辐射检查系统，其特征在于，
    所述可见光成像装置设置在所述辐射成像装置的扫描射线的出射位置，或者
    所述可见光成像装置设置在偏离所述辐射成像装置的扫描射线的出射位置预定距离处。
  12. 根据权利要求1所述的辐射检查系统，其特征在于，还包括：
    GPS定位设备，用于在所述辐射检查过程中，获取所述辐射成像装置的地理位置信息；和/或
    标识识别设备，用于在所述辐射检查过程中，识别所述被检测物体的标识信息。
  13. 一种辐射检查方法，用于在与被检测物体之间具有相对运动的情况下对其进行辐射检查，其特征在于，包括：
    使用辐射成像装置逐列扫描被检测物体，以得到所述被检测物体的多个列扫描图像，所述列的方向基本上垂直于所述相对运动的方向；
    在辐射检查过程中，使用可见光成像装置对所述被检测物体进行光学成像，以得到所述被检测物体的一个或多个光学图像，其中，在辐射检查过程中所述可见光成像装置与所述辐射成像装置具有固定的相对位置关系；
    基于预定的匹配规则建立对应于同一被检测物体的所述列扫描图像和所述光学图像之间的对应关系。
  14. 根据权利要求13所述的辐射检查方法，其特征在于，所述基于预定的匹配规则建立对应于同一被检测物体的所述列扫描图像和所述光学图像之间的对应关系的步骤包括：
    基于至少一个列扫描图像的扫描成像时间和所述光学图像的拍摄时间，或者基于所述辐射成像装置形成至少一个列扫描图像时与所述被检测物体之间的第一相对位置关系和所述可见光成像装置形成所述光学图像时与所述被检测物体之间的第二相对位置关系，建立所述列扫描图像和所述光学图像之间的对应关系。
  15. 根据权利要求14所述的辐射检查方法，其特征在于，还包括：
    基于所述第一相对位置关系整合所述多个列扫描图像，以得到成像比例接近实际的重建扫描图像；并且/或者
    基于所述第二相对位置关系整合所述多个光学图像，以得到成像比例接近实际的重建光学图像。
  16. 根据权利要求14所述的辐射检查方法，其中，所述辐射成像装置以第一成像频率对所述被检测物体进行逐列扫描，所述光学图像成像装置以第二成像频率对所述被检测物体进行光学成像，该方法还包括：
    在辐射检查过程中使用定位装置以第三采集频率采集所述定位装置相对于所述被检测物体的相对位移数据；
    基于所述定位装置在所述列扫描图像的扫描成像时间前后采集的一个或多个相对位移数据，确定所述第一相对位置关系，基于所述定位装置在所述光学图像的拍摄时间前后采集的一个或多个相对位移数据，确定所述第二相对位置关系。
  17. 根据权利要求16所述的辐射检查方法，其特征在于，
    当所述第三采集频率小于所述第一成像频率时，对所述多个相对位移数据进行插值计算，以得到每个所述列扫描图像所对应的第一相对位置关系，以及/或者
    当所述第三采集频率等于所述第一成像频率时，确定所述多个列扫描图像所对应的第一相对位置关系与所述多个相对位移数据一一对应，以及/或者
    当所述第三采集频率大于所述第一成像频率时，对所述多个相对位移数据进行抽取，以得到每个所述列扫描图像所对应的第一相对位置关系。
  18. 根据权利要求16所述的辐射检查方法，其特征在于，
    所述可见光成像装置为线阵相机，用于逐列对所述被检测物体进行光学成像，
    当所述第三采集频率小于所述第二成像频率时，对所述相对位移数据进行插值计算，以得到每个所述光学图像所对应的第二相对位置关系，以 及/或者
    当所述第三采集频率等于所述第二成像频率时，确定所述多个光学图像所对应的第一相对位置关系与所述多个相对位移数据一一对应，
    当所述第三采集频率大于所述第二成像频率时，对所述相对位移数据进行抽取，以得到每个所述光学图像所对应的第二相对位置关系。
  19. 根据权利要求16所述的辐射检查方法，其特征在于，所述可见光成像装置为面阵相机或摄像装置，该方法还包括：
    预先对与所述被检测物体距所述可见光成像装置相同距离处的参照物进行成像，以得到参照图像；
    基于所述参照物的实际尺寸以及所述参照图像中的参照物的显示尺寸，确定成像比例；
    确定形成所述光学图像时所述可见光成像装置拍摄的镜头中心线相对于所述被检测物体的位置，并基于该位置和所述成像比例确定所述光学图像中每列图像所对应的第二相对位置关系。
PCT/CN2017/106345 2016-10-17 2017-10-16 辐射检查系统和方法 WO2018072669A1 (zh)

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