SA519401590B1 - نظام وطريقة لفحص الإشعاع - Google Patents

نظام وطريقة لفحص الإشعاع

Info

Publication number
SA519401590B1
SA519401590B1 SA519401590A SA519401590A SA519401590B1 SA 519401590 B1 SA519401590 B1 SA 519401590B1 SA 519401590 A SA519401590 A SA 519401590A SA 519401590 A SA519401590 A SA 519401590A SA 519401590 B1 SA519401590 B1 SA 519401590B1
Authority
SA
Saudi Arabia
Prior art keywords
detected
radiation
image
column
inspection system
Prior art date
Application number
SA519401590A
Other languages
English (en)
Inventor
زهينج جيانبين
هو زياوي
لي سوكي
وانج شاوفينج
كاو يانفينج
وانج يانهوا
Original Assignee
باورسكان كمبني ليمتد
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by باورسكان كمبني ليمتد filed Critical باورسكان كمبني ليمتد
Publication of SA519401590B1 publication Critical patent/SA519401590B1/ar

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Image Processing (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

يتعلق الاختراع الحالي بنظام وطريقة لفحص إشعاع radiation inspection system (100). في هذا الطلب، يمكن لجهاز تصوير إشعاع radiation imaging apparatus (110) في نظام فحص الإشعاع radiation inspection system (100) مسح الغرض المراد كشفه عمود تلو عمود للحصول على مجموعة من الصور الممسوحة على هيئة أعمدة لغرض يراد كشفه. يتم استخدام جهاز تصوير ضوء مرئي visible light imaging apparatus (120) من أجل تصوير الغرض المراد كشفه ضوئيًا خلال فحص إشعاع radiation inspection للحصول على مجموعة من الصور الضوئية optical images الخاصة بالغرض المراد كشفه. يقوم معالج لمطابقة الصور image matching processor (130) بإنشاء علاقة بين الصور الممسوحة على هيئة أعمدة والصور الضوئية المناظرة للغرض نفسه المراد كشفه بناءً على قاعدة مطابقة محددة مسبقًا. بهذه الطريقة، عند عرض صورة إشعاع radiation image ، يمكن عرض صورة ضوئية مناظرة لها بشكل متزامن، بحيث يمكن لشخص مسؤول عن الأمن أن يحدد بسرعة الغرض المراد كشفه المناظر لصورة الإشعاع. شكل 1.
SA519401590A 2016-10-17 2019-04-16 نظام وطريقة لفحص الإشعاع SA519401590B1 (ar)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201610903882.1A CN106383132B (zh) 2016-10-17 2016-10-17 辐射检查系统和方法
PCT/CN2017/106345 WO2018072669A1 (zh) 2016-10-17 2017-10-16 辐射检查系统和方法

Publications (1)

Publication Number Publication Date
SA519401590B1 true SA519401590B1 (ar) 2022-06-01

Family

ID=57957861

Family Applications (1)

Application Number Title Priority Date Filing Date
SA519401590A SA519401590B1 (ar) 2016-10-17 2019-04-16 نظام وطريقة لفحص الإشعاع

Country Status (3)

Country Link
CN (1) CN106383132B (ar)
SA (1) SA519401590B1 (ar)
WO (1) WO2018072669A1 (ar)

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* Cited by examiner, † Cited by third party
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CN106383132B (zh) * 2016-10-17 2019-05-14 北京君和信达科技有限公司 辐射检查系统和方法
CN107680065A (zh) * 2017-11-22 2018-02-09 同方威视技术股份有限公司 辐射图像校正方法和校正装置及校正系统
CN108254395B (zh) * 2017-12-28 2023-10-13 清华大学 扫描图像校正装置、方法和移动式扫描设备
CN108227027B (zh) 2017-12-29 2020-12-01 同方威视技术股份有限公司 车载背散射检查系统
CN108805082B (zh) * 2018-06-13 2021-08-13 广东工业大学 一种视频融合方法、装置、设备及计算机可读存储介质
CN110726994B (zh) * 2018-07-17 2023-05-02 北京君和信达科技有限公司 背散射检查车相对位移测量系统
CN111612020B (zh) * 2019-02-22 2024-04-26 杭州海康威视数字技术股份有限公司 一种异常被检物的定位方法以及安检分析设备、系统
CN113791459B (zh) * 2020-05-29 2022-11-01 同方威视技术股份有限公司 安检设备调试方法、装置、安检方法和设备
CN112924939A (zh) * 2021-03-11 2021-06-08 内江瀚海智行科技有限公司 雷达无线电干扰测试中基于北斗高精度定位的数据同步分析方法
CN113947760A (zh) * 2021-12-20 2022-01-18 北京东方国信科技股份有限公司 一种绿色通道车辆的检测方法及装置
CN116311085B (zh) * 2023-05-19 2023-09-01 杭州睿影科技有限公司 一种图像处理方法、系统、装置及电子设备

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CN1455247A (zh) * 2003-01-17 2003-11-12 清华大学 一种集装箱快速在线检测方法及装置
JP4850495B2 (ja) * 2005-10-12 2012-01-11 株式会社トプコン 眼底観察装置及び眼底観察プログラム
JP5209935B2 (ja) * 2007-10-23 2013-06-12 キヤノン株式会社 Ｘ線撮影装置、ｘ線撮影装置の制御方法、プログラム及び記憶媒体
CN103163548B (zh) * 2013-03-07 2016-01-20 北京永新医疗设备有限公司 基于伽马相机的放射性物质探测方法及其装置和系统
JP5788551B1 (ja) * 2014-03-27 2015-09-30 オリンパス株式会社 画像処理装置および画像処理方法
CN105094725B (zh) * 2014-05-14 2019-02-19 同方威视技术股份有限公司 图像显示方法
CN104237959A (zh) * 2014-08-21 2014-12-24 北京辛耕普华医疗科技有限公司 对放射性物质实时动态追踪定位的方法和设备
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CN104574292B (zh) * 2014-11-26 2018-06-26 沈阳东软医疗系统有限公司 一种ct图像的校正方法和装置
CN105785464B (zh) * 2016-03-17 2018-04-13 广州市凌特电子有限公司 货柜车车身测量方法以及货柜车车身测量系统
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CN106383132B (zh) * 2016-10-17 2019-05-14 北京君和信达科技有限公司 辐射检查系统和方法

Also Published As

Publication number Publication date
CN106383132B (zh) 2019-05-14
CN106383132A (zh) 2017-02-08
WO2018072669A1 (zh) 2018-04-26

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