WO2018055663A1 - Imaging device and mounting device - Google Patents

Imaging device and mounting device Download PDF

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Publication number
WO2018055663A1
WO2018055663A1 PCT/JP2016/077647 JP2016077647W WO2018055663A1 WO 2018055663 A1 WO2018055663 A1 WO 2018055663A1 JP 2016077647 W JP2016077647 W JP 2016077647W WO 2018055663 A1 WO2018055663 A1 WO 2018055663A1
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WO
WIPO (PCT)
Prior art keywords
component
light source
imaging
incident light
amount
Prior art date
Application number
PCT/JP2016/077647
Other languages
French (fr)
Japanese (ja)
Inventor
秀晃 大木
聡士 大崎
芳行 深谷
Original Assignee
富士機械製造株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 富士機械製造株式会社 filed Critical 富士機械製造株式会社
Priority to PCT/JP2016/077647 priority Critical patent/WO2018055663A1/en
Priority to JP2018540247A priority patent/JP6865227B2/en
Priority to CN201680089241.5A priority patent/CN109792860B/en
Publication of WO2018055663A1 publication Critical patent/WO2018055663A1/en

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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • H05K13/081Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0813Controlling of single components prior to mounting, e.g. orientation, component geometry
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00General purpose image data processing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects

Definitions

  • the present invention relates to an imaging apparatus and a mounting apparatus.
  • Patent Document 1 describes an illumination unit having a three-stage light emitting diode group that irradiates light obliquely on a component.
  • the three-stage light emitting diode groups are attached so that the irradiation directions are at different angles.
  • an image suitable for the type and characteristics of the electronic component can be obtained by individually controlling the amount of light for each light emitting diode group.
  • Patent Document 1 does not describe control of light amount suitable for imaging such a component.
  • the present invention has been made in order to solve the above-described problems, and has as its main object to capture an image in which the external part of a component and terminals are copied while making it difficult to capture the wiring pattern.
  • the present invention adopts the following means in order to achieve the above-mentioned main object.
  • the imaging apparatus of the present invention An imaging device for imaging a component having a wiring pattern and a terminal having a flat surface, An imaging unit that images the component based on the received light; An epi-illumination light source that irradiates light in a direction along the optical axis of the imaging unit with respect to the component; A side-light source that emits light in a direction inclined from the optical axis of the imaging unit to the component; The incident light amount, which is the amount of light emitted from the incident light source and reflected by the component and received by the imaging unit, is emitted from the incident light source and reflected by the component and received by the imaging unit.
  • a light emission control unit that emits light from the incident light source and the incident light source at the time of imaging the component, so as to be smaller than an amount of side incident light that is a light amount of It is equipped with.
  • the light emission control unit causes the incident light source and the side light source to emit light during imaging of the component so that the incident light amount is smaller than the incident light amount, and the imaging unit detects the component based on the received light. Take an image.
  • the light from the incident light source is irradiated in a direction along the optical axis of the imaging unit. For this reason, the light emitted from the epi-illumination light source and reflected by the terminal having a flat surface is relatively easy to reach the imaging unit as compared with the light radiated from the epi-illumination light source and reflected from the external part of the component.
  • using the epi-illumination light source makes it easy to capture an image of a terminal having a flat surface.
  • the light emitted from the incident light source and reflected by the wiring pattern is relatively easy to reach the imaging unit.
  • the wiring pattern tends to have a low reflectance as compared with the terminal, for example, the surface is covered with an insulating film. Therefore, by making the incident light received amount smaller than the side received light amount, that is, by preventing the amount of light from the incident light source from becoming too large, it is possible to capture an image of the terminal while making the wiring pattern difficult to see. Further, light from the side light source is emitted in a direction inclined from the optical axis of the imaging unit.
  • the light emitted from the side-light source and reflected by the external part of the component is relatively easy to reach the imaging unit compared to the light emitted from the side-light source and reflected from the wiring pattern or terminal. That is, by using the side-emitting light source, it becomes easy to capture an image in which the outer portion of the component is copied. Therefore, by making the amount of incident light received greater than the amount of incident light received, that is, by making the amount of light from the side light source relatively large, it is possible to capture an image of the external part of the component while making the wiring pattern difficult to see.
  • the imaging apparatus makes it difficult to capture the wiring pattern by making the incident light received amount smaller than the incident light received amount, and copies the terminal mainly by the light from the incident light source. It is possible to capture an image in which the external part of the component is captured by light from the projecting light source. “Making the wiring pattern difficult to capture” means that the luminance value of the pixel corresponding to the wiring pattern in the image is reduced.
  • the light emission control unit may control the light emission time of the incident light source and the side light source during the imaging of the component, so that the incident light amount is less than the incident light amount. It may be small. By so doing, it is possible to control the incident light amount and the incident light amount relatively easily as compared with, for example, controlling the power supplied to the incident light source and the incident light source.
  • the light emission control unit may include the incident light source and the incident light source so that the incident light amount is 0.9 times or less of the incident light amount when imaging the component. You may make it light-emit. By doing so, the wiring pattern can be more reliably prevented from being captured.
  • the incident light received light amount may not be 0, but may be 0.1 times or more of the side incident light received amount.
  • the mounting apparatus of the present invention is An imaging device of the present invention according to any one of the aspects described above; A component holding unit capable of holding the component; A moving unit for moving the component holding unit; A mounting control unit that performs processing based on an image obtained by the imaging, and processing of controlling the component holding unit and the moving unit to mount the component on a substrate; It is equipped with.
  • the mounting apparatus of the present invention includes the imaging apparatus according to any one of the above-described aspects. Therefore, this mounting apparatus can obtain the same effect as that of the above-described imaging apparatus of the present invention, for example, an effect of capturing an image of the external part of the component and the terminal while making it difficult to capture the wiring pattern.
  • FIG. FIG. 2 is a schematic explanatory diagram of a configuration of a parts camera 40.
  • FIG. 3 is a block diagram showing a configuration relating to control of the mounting apparatus 10.
  • the flowchart of a component mounting process routine Explanatory drawing of the binary image P1 at the time of imaging the components 90 as incident light received amount ⁇ side incident received light amount. Explanatory drawing of the binary image P2 at the time of imaging the component 90 by making the incident light received amount and the side received light amount equal and both large. Explanatory drawing of the binary image P3 at the time of imaging the component 90 by making the incident light received amount and the side received light amount equal and both small.
  • FIG. 1 is a perspective view of the mounting apparatus 10
  • FIG. 2 is a schematic explanatory diagram of a configuration of a parts camera 40 provided in the mounting apparatus 10
  • FIG. 3 is a block diagram illustrating a configuration related to control of the mounting apparatus 10.
  • the left-right direction (X-axis), the front-rear direction (Y-axis), and the up-down direction (Z-axis) are as shown in FIG.
  • the mounting apparatus 10 includes a base 12, a mounting apparatus main body 14 installed on the base 12, and a reel unit 70 as a component supply apparatus mounted on the mounting apparatus main body 14.
  • the mounting apparatus main body 14 is installed to be exchangeable with respect to the base 12.
  • the mounting apparatus main body 14 includes a substrate transport device 18 that transports and holds the substrate 16, a head 24 that can move on the XY plane, and a mechanical chuck 37 that is attached to the head 24 and can move along the Z axis.
  • a parts camera 40 that images the parts gripped by the mechanical chuck 37 and a controller 60 that executes various controls are provided.
  • the substrate transfer device 18 is provided with support plates 20 and 20 extending in the left-right direction with a space between the front and rear in FIG. 1 and conveyor belts 22 and 22 provided on opposite surfaces of the support plates 20 and 20 (see FIG. 1). 1 shows only one of them).
  • the conveyor belts 22 and 22 are stretched over the drive wheels and the driven wheels provided on the left and right sides of the support plates 20 and 20 so as to be endless.
  • substrate 16 is mounted on the upper surface of a pair of conveyor belts 22 and 22, and is conveyed from the left to the right.
  • the substrate 16 is supported from the back side by a large number of support pins 23 erected.
  • the head 24 is attached to the front surface of the X-axis slider 26.
  • the X-axis slider 26 is attached to the front surface of the Y-axis slider 30 that can slide in the front-rear direction so as to be slidable in the left-right direction.
  • the Y-axis slider 30 is slidably attached to a pair of left and right guide rails 32, 32 extending in the front-rear direction.
  • a pair of upper and lower guide rails 28, 28 extending in the left-right direction are provided on the front surface of the Y-axis slider 30, and the X-axis slider 26 is attached to the guide rails 28, 28 so as to be slidable in the left-right direction.
  • the head 24 moves in the left-right direction as the X-axis slider 26 moves in the left-right direction, and moves in the front-rear direction as the Y-axis slider 30 moves in the front-rear direction.
  • the sliders 26 and 30 are driven by drive motors 26a and 30a (see FIG. 3), respectively.
  • the head 24 incorporates a Z-axis motor 34 and adjusts the height of a mechanical chuck 37 attached to a ball screw 35 extending along the Z-axis by the Z-axis motor 34. Further, the head 24 incorporates a Q-axis motor 36 (see FIG. 3) that rotates the mechanical chuck 37.
  • the mechanical chuck 37 is a mechanism capable of holding a part by gripping the part.
  • the mechanical chuck 37 includes a pair of front and rear gripping portions 38 projecting downward from the bottom surface of the main body of the mechanical chuck 37, a slider (not shown) that can slide the pair of gripping portions 38 toward and away from each other, and the slider.
  • a drive motor 39 (see FIG. 3) for driving.
  • the gripping part 38 grips a component by the gripping part 38 approaching each other by the drive motor 39.
  • the mechanical chuck 37 is moved up and down along the Z-axis direction by the Z-axis motor 34 to adjust the height of the component gripped by the grip portion 38.
  • the mechanical chuck 37 is rotated by the Q-axis motor 36, the orientation of the component gripped by the gripping portion 38 is adjusted.
  • the parts camera 40 is disposed in front of the support plate 20 on the front side of the substrate transfer device 18.
  • the parts camera 40 has an imaging range above the parts camera 40 and images the parts held by the mechanical chuck 37 from below to generate an image.
  • the parts camera 40 controls the illumination unit 41 that irradiates light to the imaging target component, the imaging unit 51 that images the component based on the received light, and the entire part camera 40.
  • An imaging control unit 52 is provided to control the illumination unit 41 that irradiates light to the imaging target component, the imaging unit 51 that images the component based on the received light, and the entire part camera 40.
  • the illumination unit 41 includes a housing 42, a connecting unit 43, an incident light source 44, a half mirror 46, and a side light source 47.
  • the housing 42 is a bowl-shaped member whose upper surface and lower surface (bottom surface) are opened in an octagonal shape.
  • the housing 42 has a shape in which the opening on the upper surface is larger than the opening on the lower surface, and the internal space tends to increase from the lower surface toward the upper surface.
  • the connecting portion 43 is a cylindrical member that connects the housing 42 and the imaging portion 51. The light emitted from the epi-illumination light source 44 and the light received by the imaging unit 51 pass through the internal space of the connection unit 43.
  • the incident light source 44 is a light source for irradiating the component held by the mechanical chuck 37 with light in a direction along the optical axis 51 a of the imaging unit 51.
  • the incident light source 44 includes a plurality of LEDs 45 that emit light toward the half mirror 46 in a direction perpendicular to the optical axis 51a.
  • the plurality of LEDs 45 are attached to the inner peripheral surface of the connecting portion 43.
  • the optical axis 51a is along the up-down direction, and the light from the LED 45 is irradiated in the horizontal direction (for example, the left-right direction).
  • the half mirror 46 is disposed inside the connecting portion 43 so as to be inclined from the optical axis 51a (for example, an inclination angle of 45 °).
  • the half mirror 46 reflects the light in the horizontal direction from the incident light source 44 upward. Therefore, the light from the LED 45 of the incident light source 44 is irradiated in the direction along the optical axis 51a of the imaging unit 51 (upward here) after being reflected by the half mirror 46. Further, the half mirror 46 transmits light from above toward the imaging unit 51.
  • the side-emitting light source 47 is a light source for irradiating light on a component held by the mechanical chuck 37 in a direction inclined from the optical axis 51a.
  • the side light source 47 includes an upper light source 47a having a plurality of LEDs 48a, a middle light source 47b having a plurality of LEDs 48b disposed below the upper light source 47a, and a plurality of LEDs 48c disposed below the middle light source 47b.
  • These LEDs 48 a to 48 c are attached to the inner peripheral surface of the housing 42.
  • Each of the LEDs 48a to 48c irradiates light in a direction inclined from the optical axis 51a (an inclination angle from the optical axis 51a is more than 0 ° and less than 90 °).
  • the LED 48a has the largest inclination angle from the optical axis 51a in the irradiation direction of the LEDs 48a to 48c, and the LED 48a emits light in a direction close to the horizontal. Further, the LED 48c has the smallest inclination angle.
  • the imaging unit 51 includes an optical system such as a lens (not shown) and an imaging element.
  • an optical system such as a lens (not shown) and an imaging element.
  • the image capturing unit 51 receives this light. Then, the imaging unit 51 photoelectrically converts the received light to generate charges corresponding to each pixel in the image, and based on the generated charges, image data that is digital data including information on each pixel is generated. Generate.
  • the imaging control unit 52 outputs a control signal to the illuminating unit 41 to control light irradiation from the illuminating unit 41, outputs a control signal to the imaging unit 51 to take an image, or captures an image.
  • the image data generated by is output to the controller 60.
  • the imaging control unit 52 controls the value of current that is applied to each of the LEDs 45, 48 a to 48 c of the illumination unit 41 and the energization time, and the light emission amount and light emission per unit time of the incident light source 44 and the side light source 47. Time can be individually controlled.
  • the imaging control unit 52 can individually control the light emission amount and the light emission time per unit time for each of the upper light source 47a, the middle light source 47b, and the lower light source 47c of the side light source 47.
  • the upper diagram is a bottom view of the component 90
  • the lower diagram is a front view of the component 90.
  • the component 90 includes a main body portion 91 and a terminal plate 92 used for connection to the substrate when the main body portion 91 is disposed on the substrate.
  • the terminal board 92 is a plate-like member whose lower surface is substantially flat.
  • the terminal board 92 has a quadrangular shape with two corners cut off when viewed from below. Of the cut-off portion, the lower left portion in the upper part of FIG.
  • terminals 93 and 94 are electrodes connected to, for example, other components or a wiring pattern on the substrate, the surface (here, the lower surface) is flat, and a conductor such as metal is exposed. Further, the terminal 93 and the terminal 94 have polarity, and the terminal 93 and the terminal 94 can be identified by the positional relationship with the notches 92a and 92b.
  • the wiring patterns 95 and 96 are wirings for conducting the terminals 93 and 94 and the inside of the main body 91, and the lower surface is flat and is mainly composed of a conductor such as metal. Further, the surface (here, the lower surface) of the wiring patterns 95 and 96 is covered with an insulating film in order to prevent a short circuit. Since the wiring patterns 95 and 96 are covered with an insulating film, the reflectance is lower than that of the terminals 93 and 94. Further, the terminal plate 92 is made of a material having a lower reflectance than the terminals 93 and 94 and the wiring patterns 95 and 96, such as black resin.
  • the parts camera 40 irradiates the lower surface of the terminal plate 92 with light from the illumination unit 41, and the imaging unit 51 receives the reflected light of the light, and images the lower surface of the terminal plate 92. Although details will be described later, the parts camera 40 performs imaging by varying the light emission amount of the illumination unit 41 between the case where the imaging target is the component 90 and the other components.
  • the controller 60 is configured as a microprocessor centered on the CPU 61, and includes a ROM 62 that stores processing programs, an HDD 63 that stores various data, a RAM 64 that is used as a work area, and external devices and electrical signals. An input / output interface 65 and the like for performing exchanges are provided, and these are connected via a bus 66.
  • the controller 60 sends drive signals to the substrate transport device 18, the drive motor 26 a of the X-axis slider 26, the drive motor 30 a of the Y-axis slider 30, the Z-axis motor 34, the Q-axis motor 36, and the drive motor 39 of the mechanical chuck 37. Output.
  • the controller 60 outputs information related to imaging conditions including control amounts of the incident light source 44 and the side illumination light source 47 at the time of imaging to the parts camera 40 and inputs image data from the parts camera 40.
  • each slider 26, 30 is equipped with a position sensor (not shown), and the controller 60 inputs position information from these position sensors while driving the drive motors 26a, 30a of each slider 26, 30. To control.
  • the reel unit 70 includes a plurality of reels 72 and is detachably attached to the front side of the mounting apparatus body 14.
  • a tape is wound around each reel 72, and components are held on the surface of the tape along the longitudinal direction of the tape. These parts are protected by a film covering the surface of the tape.
  • Such a tape is unwound from the reel toward the rear, and the film is peeled off at the feeder portion 74 so that the components are exposed.
  • the gripped portion 38 of the mechanical chuck 37 grips the exposed component, the component is held by the mechanical chuck 37 and can move with the head 24.
  • the management computer 80 is a computer that manages a production job of the mounting apparatus 10 and is connected to the controller 60 of the mounting apparatus 10 so as to be communicable.
  • the production job is information that defines which components are mounted on which substrate 16 in which order in the mounting apparatus 10 and how many substrates 16 are to be mounted with components.
  • the management computer 80 stores the production job and outputs information included in the production job to the mounting apparatus 10 as necessary.
  • the operation of the mounting apparatus 10 in particular, the process of mounting the component on the board 16 with the imaging of the component using the parts camera 40 will be described.
  • the CPU 61 of the controller 60 of the mounting apparatus 10 receives a command from the management computer 80, the CPU 61 first acquires information on the component to be mounted to be mounted from the management computer 80.
  • the CPU 61 performs a component mounting process including a process for imaging a component to be mounted and a process for placing the component on a board.
  • the CPU 61 repeatedly performs processing for acquiring information on the next component to be mounted and component mounting processing until the mounting of all the components on the substrate 16 is completed.
  • a component mounting process when the component 90 shown in FIG.
  • FIG. 4 is a flowchart illustrating an example of a component mounting process routine.
  • the component mounting process routine of FIG. 4 is stored in the HDD 63.
  • the component mounting process routine of FIG. 4 is started by the controller 60 when the component type of the next component to be mounted acquired from the management computer 80 is the component 90.
  • the CPU 61 sets the control amounts of the incident light source 44 and the incident light source 47 at the time of imaging so that the incident light amount ⁇ the side light amount (step S100).
  • the incident light amount is the amount of light emitted from the incident light source 44 and reflected by the component 90 and received by the imaging unit 51.
  • the side received light amount is the amount of light emitted from the side light source 47 and reflected by the component 90 and received by the imaging unit 51.
  • the incident light received amount and the side received light amount are respectively integrated values of the received light amount at the time of imaging (for example, the product of the received light amount per unit time and the received light time).
  • the incident light amount is smaller than the incident light amount
  • the average value of the luminance values e.g., 256 gradation luminance values
  • the luminance value is smaller than the average value of the luminance values of the respective pixels of the image when only the side light source 47 is emitted for imaging.
  • the component 90 when the component 90 is imaged, only the upper light source 47a of the side light source 47 is caused to emit light.
  • the light emission time of the incident light source 44 during imaging (referred to as the incident light emission time t1) and the light emission time of the side light source 47 (only the upper light source 47a here) (referred to as the side emission light time t2).
  • the values of the currents that the imaging unit 51 supplies to the LEDs 45 and 48a are determined in advance by experiments. For this reason, in step S100, the CPU 61 sets the incident light emission time t1 and the side light emission time t2 as t1 ⁇ t2 as control amounts of the incident light source 44 and the side light source 47.
  • the values of the incident light emission time t1 and the side light emission time t2 may be stored in advance in the HDD 63 in association with the component 90, for example, or may be included in the production job, or the CPU 61 may execute the production job. May be derived based on the information contained in.
  • step S100 When the incident light emission time t1 and the side light emission time t2 are set in step S100, the CPU 61 moves the head 24 and causes the gripping portion 38 of the mechanical chuck 37 to grip the component to be mounted supplied by the reel unit 70 (step S100). S110). Subsequently, the CPU 61 moves the head 24 to move the component held by the mechanical chuck 37 above the parts camera 40 (step S120). Then, the CPU 61 outputs a control signal to the imaging control unit 52 so as to control the illumination unit 41 with the control amounts set here in step S100 (here, the epi-illumination light emission time t1 and the side emission light emission time t2). Step S130).
  • the imaging control unit 52 causes the epi-illumination light source 44 and the side-illumination light source 47 to emit light based on the incident epi-emission time t1 and the side-emission light emission time t2, and causes the imaging unit 51 to generate an image based on the received light. Then, the part gripped by the mechanical chuck 37 is imaged. As a result, an image of the component 90 is captured under the condition that the incident light received amount ⁇ the side received light amount.
  • the imaging unit 51 generates, for example, grayscale image data in which the luminance value of each pixel is expressed in 256 gradations based on the received light.
  • the imaging control unit 52 outputs the captured image data to the controller 60.
  • the CPU 61 When image data obtained by imaging is input from the imaging control unit 52, the CPU 61 performs predetermined processing based on the image (steps S140 to S180). Specifically, the CPU 61 first binarizes the luminance value of each pixel of the obtained image data to obtain a binary image (step S140). The binarization can be performed by a known method such as a discriminant analysis method (binarization of Otsu).
  • FIG. 5 is an explanatory diagram of a binary image P1 obtained by imaging the component 90 with the incident light received amount ⁇ the side received light amount.
  • FIG. 6 is an explanatory diagram of a binary image P2 when the component 90 is imaged as a comparative example, unlike the present embodiment, with the incident light reception amount and the side light reception amount being equal and large.
  • FIG. 7 is an explanatory diagram of a binary image P3 when the component 90 is imaged as a comparative example, unlike the present embodiment, with the incident light received amount and the side received light amount being equal and both small.
  • the pixel with the smaller luminance value after binarization is represented in black
  • the pixel with the larger luminance value after binarization is represented in white.
  • the outer portion of the component 90 (here, the edge portion of the terminal plate 92 in the bottom view) and the pixels corresponding to the terminals 93 and 94 are white.
  • pixels corresponding to portions other than the edges of the terminal board 92, the wiring patterns 95 and 96, and portions other than the component 90 (background portion) are black, and the wiring patterns 95 and 96 are It is not shown.
  • a binary image can be obtained in which the wiring patterns 95 and 96 are not captured and the outer portion of the component 90 and the terminals 93 and 94 are copied. it can. The reason for this will be described.
  • the light from the incident light source 44 is irradiated in a direction along the optical axis 51a of the imaging unit 51 (here, upward).
  • the light irradiated upward from the epi-illumination light source 44 and reflected by the plane portion perpendicular to the optical axis 51a of the component 90 proceeds in the direction along the optical axis 51a (downward here) as it is. Therefore, the light irradiated from the epi-illumination light source 44 and reflected by the terminals 93 and 94 with flat surfaces is compared with the imaging unit 51 compared to the light radiated from the epi-illumination light source 44 and reflected from the outer portion of the component 90. Easy to reach.
  • the use of the epi-illumination light source 44 makes it easy to capture an image of the terminals 93 and 94 having flat surfaces.
  • the light emitted from the incident light source 44 and reflected by the wiring patterns 95 and 96 is relatively easy to reach the imaging unit 51 because the surfaces of the wiring patterns 95 and 96 are flat.
  • the surface of the wiring patterns 95 and 96 is covered with an insulating film as described above, and the reflectance is lower than that of the terminals 93 and 94.
  • the incident light receiving amount is made smaller than the side incident light receiving amount, that is, the light amount from the incident light source 44 is not increased too much, so that the wiring patterns 95 and 96 are difficult to be seen while the terminals 93 and 94 are copied.
  • Images can be taken.
  • the luminance value of the pixel corresponding to the terminals 93 and 94 is higher than the threshold value when the image is binarized.
  • the incident light reception amount is set to a small value so that the brightness value of the pixels corresponding to the wiring patterns 95 and 96 becomes small.
  • an image in which the wiring patterns 95 and 96 are not copied while the terminals 93 and 94 are copied can be obtained like the binary image P1 in FIG.
  • the value of the incident light amount and the control amount of the incident light source 44 (in this case, the incident light emission time t1) for realizing the value can be determined in advance by experiments, for example.
  • the side-emitting light source 47 (here, the upper light source 47a) is irradiated in a direction inclined from the optical axis 51a of the imaging unit 51. For this reason, the light emitted from the side light source 47 and reflected from the outer portion of the component 90 (here, the edge portion of the terminal plate 92 in the bottom view) is emitted from the side light source 47 and is connected to the wiring patterns 95 and 96 or the terminals.
  • the imaging unit 51 that is, by using the side-emitting light source 47, it becomes easy to capture an image in which the outer portion of the component 90 is captured.
  • the side received light amount larger than the incident light received amount, that is, by making the light amount from the side light source 47 relatively large, the outline of the component 90 can be copied while keeping the wiring patterns 95 and 96 difficult to be seen. Images can be taken.
  • an image captured by the imaging unit 51 here, a grayscale image having 256 gradations
  • the luminance of the pixel corresponding to the outer portion of the component 90 is higher than a threshold value when the image is binarized.
  • the side received light amount is set to a large value as the value increases.
  • an image in which the outer portion of the component 90 is copied can be obtained as in the binary image P1 of FIG.
  • Such a value of the lateral light reception amount and a control amount (here, the side light emission time t2) of the side light source 47 for realizing the value can be determined in advance by experiments, for example.
  • the outer portion of the component 90 and the terminals 93 and 94 can be copied, but the wiring patterns 95 and 96 are also easily captured. . That is, the luminance value of the pixel corresponding to the wiring patterns 95 and 96 in the image captured by the imaging unit 51 tends to increase. Therefore, like the binary image P2 in FIG. 6, pixels corresponding to the wiring patterns 95 and 96 after binarization are likely to be white. For example, when the incident light received amount and the side received light amount are equal and small, the wiring patterns 95 and 96 can be hard to be seen, but the outer portion of the component 90 and the terminals 93 and 94 are hard to be seen.
  • the luminance value of the pixel corresponding to the outer shape portion of the component 90 and the terminals 93 and 94 in the image captured by the imaging unit 51 tends to be small. Therefore, as in the binary image P3 in FIG. 7, pixels corresponding to at least one of the outer portion of the component 90 and the terminals 93 and 94 after binarization (pixels corresponding to the outer portion of the component 90 in FIG. 7). It tends to turn black.
  • illustration is omitted, for example, in contrast to the present embodiment, when imaging is performed with the incident light received amount> the side received light amount, the outer portion of the component 90 is difficult to see and the wiring patterns 95 and 96 are not shown. It becomes easy. For this reason, for example, if the captured image is binarized, the outer portion of the component 90 is not captured, and an image in which the terminals 93 and 94 and the wiring patterns 95 and 96 are captured tends to be obtained.
  • the parts camera 40 makes it difficult to capture the wiring patterns 95 and 96 by making the incident light received amount smaller than the side received light amount, and the terminal camera 40 mainly uses the light from the incident light source 44.
  • 93 and 94 can be imaged, and an image in which the outer portion of the component 90 is mainly captured by the light from the side light source 47 can be taken. Then, by binarizing the image, a binary image obtained by copying the outer portion of the component 90 and the terminals 93 and 94 without the wiring patterns 95 and 96 appearing like the binary image P1 of FIG. Can do.
  • the CPU 61 acquires information on the component 90 based on the binary image (step S150).
  • the CPU 61 detects the outer shape of the component 90, the terminals 93 and 94, the center of the component 90, and the orientation of the component 90. Specifically, the CPU 61 first detects the outer shape of the component 90 and the terminals 93 and 94 based on the binary image by pattern matching or the like. Next, the CPU 61 detects the center position of the component 90 based on the detected outer shape. Further, the CPU 61 detects the notches 92a and 92b based on the detected outer shape, and detects the orientation of the component 90 based on this.
  • the wiring patterns 95 and 96 are not shown in the binary image as shown in FIG. Therefore, for example, compared to the case where the wiring patterns 95 and 96 are shown in FIG. 6, the CPU 61 erroneously detects that the wiring patterns 95 and 96 are the outer portion of the component 90 and the terminals 93 and 94 in step S150. This can be suppressed.
  • the CPU 61 determines whether there is an abnormality in the component 90 gripped by the gripping part 38 based on the information acquired in step S150 (step S160). If there is an abnormality, the CPU 61 grips the part 90. The component 90 is discarded (step S170), and the processing after step S110 is performed. The CPU 61 determines whether there is an abnormality in the component 90 based on, for example, the outer shape of the component 90 and the shapes of the terminals 93 and 94. If there is no abnormality in step S160, the CPU 61 derives a correction amount for the mounting position and orientation of the component 90 based on the information acquired in step S150 (step S180).
  • the CPU 61 derives the correction amount of the mounting position of the component 90 on the board 16 based on the detected center position (coordinates) of the component 90. Further, based on the detected orientation of the component 90, the CPU 61 derives a driving amount of the Q-axis motor 36 (amount of rotation of the component 90) necessary for mounting the component 90 on the substrate 16 as a direction correction amount. Then, the CPU 61 places the component 90 on the substrate 16 in consideration of the derived mounting position and orientation correction amount (step S190), and ends the component mounting processing routine.
  • the CPU 61 can be prevented from erroneously detecting the wiring patterns 95 and 96 as the outer portion of the component 90 and the terminals 93 and 94 in step S150, the CPU 61 is also accurate in the processes in steps S160 and S180. Can be done well.
  • the CPU 61 performs the component mounting process performed on the components of the component types other than the component 90 in the same manner as the component mounting process routine of FIG.
  • the control amounts of the incident light source and the side light source in step S100 are predetermined for each component type, and the CPU 61 sets a control amount according to the component type to be mounted.
  • the contents of the processes in steps S150 to S180 are also predetermined for each component type, and the CPU 61 performs a process according to the component type to be mounted.
  • Information predetermined for each of these component types may be stored in advance in the HDD 63, for example, or may be included in a production job.
  • the parts camera 40 of the present embodiment corresponds to the imaging device of the present invention
  • the imaging unit 51 corresponds to the imaging unit
  • the incident light source 44 corresponds to the incident light source
  • the lateral light source 47 serves as the lateral light source.
  • the imaging control unit 52 corresponds to the light emission control unit.
  • the mechanical chuck 37 corresponds to a component holding unit
  • the X-axis slider 26 and the Y-axis slider 30 correspond to a moving unit
  • the controller 60 corresponds to a mounting control unit.
  • the imaging control unit 52 reflects the incident light when imaging the component 90 having the wiring patterns 95 and 96 and the terminals 93 and 94 having flat surfaces.
  • the incident light source 44 and the side light source 47 are caused to emit light when the component 90 is imaged so that the amount of received light is smaller than the amount of side light received. Thereby, it is possible to capture an image in which the outer portion of the component 90 and the terminals 93 and 94 are copied while making the wiring patterns 95 and 96 difficult to see.
  • the imaging control unit 52 controls the light emission time (t1, t2) of the incident light source 44 and the side light source 47 when imaging the component 90, thereby reducing the incident light amount to be smaller than the incident light amount. . Therefore, for example, the incident light amount and the incident light amount can be controlled relatively easily as compared with the case where the power supplied to the incident light source 44 and the side light source 47 is controlled.
  • the imaging control unit 52 includes pixels corresponding to the wiring patterns 95 and 96 on the low luminance side, and corresponds to the pixels corresponding to the terminals 93 and 94 and the outline portion of the component 90.
  • the epi-illumination light source 44 and the side of the epi-illumination light source 44 and the side so as to obtain predetermined epi-illumination light reception amount and side-radiation light reception amount so as to obtain an image in which the pixel to be included is included on the high luminance side (for example, the binary image P1 in FIG. 5).
  • the projecting light source 47 emits light. Therefore, by binarizing, it is possible to capture an image that can eliminate the wiring patterns 95 and 96.
  • the incident light received amount and the side incident received light amount correspond to the terminals 93 and 94 when the luminance values of the pixels are binarized and the pixels corresponding to the wiring patterns 95 and 96 are included on the low luminance side.
  • the present invention is not limited to this. If the incident light amount is smaller than the incident light amount, the predetermined pixels may be obtained. Good.
  • the imaging control unit 52 may cause the incident light source 44 and the incident light source 47 to emit light so that the incident light amount is 0.9 times or less of the incident light amount when the component 90 is imaged. By doing so, the wiring patterns 95 and 96 can be more reliably prevented from being captured.
  • the incident light received amount may be 0.8 times or less of the side received light amount, or 0.7 times or less.
  • the incident light received light amount may not be 0, but may be 0.1 times or more of the side incident light received amount.
  • the incident light received amount may be 0.3 times or more of the side received light amount, or may be 0.5 times or more.
  • the imaging control unit 52 may obtain an image in a state where the maximum value of the luminance value of the pixels corresponding to the wiring patterns 95 and 96 is smaller than the minimum value of the luminance value of the pixels corresponding to the outer shape portion of the component 90 in advance.
  • the incident light source 44 and the incident light source 47 may emit light so that the incident incident light amount and the incident incident light amount are set. By doing so, it is possible to capture an image in which the wiring patterns 95 and 96 are hardly captured so that the outer portion of the component 90 and the wiring patterns 95 and 96 can be easily distinguished based on the luminance value.
  • the imaging control unit 52 has a predetermined incident light amount and incident light amount so as to obtain an image in which the luminance values of the pixels corresponding to the wiring patterns 95 and 96 are the smallest among all the pixels.
  • the incident light source 44 and the side light source 47 may emit light. By so doing, it is possible to capture an image in which the wiring patterns 95 and 96 are more difficult to be captured.
  • the imaging control unit 52 may have a predetermined incident light amount and side incident light amount so that the wiring patterns 95 and 96 are not captured and an image in which the outer portion of the component 90 and the terminals 93 and 94 are captured can be obtained. Further, the incident light source 44 and the side light source 47 may emit light. By doing so, it is possible to obtain an image in which the wiring patterns 95 and 96 that do not require imaging are not shown.
  • the image in which the wiring patterns 95 and 96 are not shown may be, for example, a binary image in which pixels corresponding to the wiring patterns 95 and 96 are included on the low luminance side as in the above-described embodiment.
  • an image in which the luminance values of the pixels corresponding to the wiring patterns 95 and 96 can be regarded as the same as the luminance values of the surrounding pixels in other words, an image in which the pixels of the wiring patterns 95 and 96 cannot be specified even if image processing is performed.
  • the pixel corresponding to the wiring patterns 95 and 96 may be the pixel having the smallest luminance value among all the pixels, or the luminance value of the pixel corresponding to the wiring patterns 95 and 96 is 0 (black). It may be an image.
  • the imaging control unit 52 controls the incident light emission time t1 and the side light emission time t2 so that the incident light reception amount is less than the side incident light reception amount, but is not limited thereto.
  • the imaging control unit 52 determines the duty of the light emission time and the non-light emission time of the incident light source 44 and the side light source 47. The ratio may be controlled so that the incident light received amount ⁇ the side received light amount.
  • the imaging control unit 52 may control the current supplied to the incident light source 44 and the side light source 47 so that the incident light amount ⁇ the incident light amount.
  • the image captured by the imaging unit 51 is a grayscale image.
  • the CPU 61 binarizes the image in step S140 and then acquires information regarding the component 90 in step S150.
  • the present invention is not limited to this.
  • the CPU 61 may acquire information on the component 90 (for example, the outer shape of the component 90 and the shapes of the terminals 93 and 94) by performing pattern matching or edge detection on the grayscale image. Even in this case, by setting the incident light received amount ⁇ the side received light amount, the wiring patterns 95 and 96 in the grayscale image are hardly captured (the luminance value of the pixel corresponding to the wiring patterns 95 and 96 is small). Therefore, similarly to the above-described embodiment, for example, erroneous detection when the CPU 61 acquires information on the component 90 can be suppressed.
  • the image captured by the imaging unit 51 may be a color image or a binary image.
  • the imaging control unit 52 when imaging the component 90, the imaging control unit 52 emits only the upper light source 47a among the side light sources 47.
  • the present invention is not limited to this, and the upper light source 47a and the middle light source are not particularly limited. At least one of the light source 47b and the lower light source 47c may be caused to emit light.
  • the use of a light source whose inclination angle from the optical axis 51a is close to 90 ° tends to capture an image of the external part of the component 90 while the wiring patterns 95 and 96 are difficult to be seen. For this reason, it is preferable to emit light from a light source having an inclination angle closest to 90 ° (in the above-described embodiment, the upper light source 47a).
  • the component 90 is exemplified as an object to be imaged so that the incident light received amount is smaller than the side received light amount.
  • the component to be imaged is not limited to this. If the component has a wiring pattern and a terminal having a flat surface, and it is not necessary to detect the wiring pattern and it is necessary to detect the outer portion of the component and the terminal, the incident light amount ⁇ The same effect can be obtained by using the side light reception amount.
  • the component to be imaged may be a component having no polarity at a plurality of terminals.
  • the part 90 has an outer shape (an edge portion in the bottom view of the terminal plate 92) having a right-angled corner.
  • the present invention is not limited to this, and the outer shape of the component to be imaged is chamfered.
  • the shape of the part may be a slope inclined from the optical axis 51a.
  • the mounting apparatus 10 includes the mechanical chuck 37 that grips a component, but is not limited thereto as long as the component can be held.
  • the mounting apparatus 10 may include a suction nozzle that sucks and holds components instead of the mechanical chuck 37.
  • the controller 60 sets the control amounts of the incident light source 44 and the side light source 47, but the present invention is not limited to this.
  • the imaging control unit 52 may determine the control amount.
  • the present invention can be used for a mounting apparatus for mounting components on a substrate.

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Abstract

An imaging control unit 52 of a parts camera 40 of the present invention causes a light source 44 for vertical illumination and a light source 47 for side illumination to emit light when imaging a component 90 such that the amount of light received from vertical illumination is less than the amount of light received from side illumination when imaging the component 90 having wiring patterns 95, 96 and terminals 93, 94 having flat surfaces. The amount of light received from vertical illumination is the amount of light emitted from the light source 44 for vertical illumination, reflected by the component 90, and received by an imaging unit 51. Similarly, the amount of light received from side illumination is the amount of light emitted from the light source 47 for side illumination, reflected by the component 90, and received by the imaging unit 51.

Description

撮像装置及び実装装置Imaging apparatus and mounting apparatus
 本発明は、撮像装置及び実装装置に関する。 The present invention relates to an imaging apparatus and a mounting apparatus.
 従来、撮像装置としては、撮像対象である電子部品に照明手段からの光を照射して撮像を行うものが知られている。例えば、特許文献1には、部品に対して斜めに光を照射する3段の発光ダイオード群を有する照明手段が記載されている。この3段の発光ダイオード群は、照射方向がそれぞれ異なる角度になるように取り付けられている。そして、それぞれの発光ダイオード群に対して個別に光量を制御することで、電子部品の種類,特性に合った画像が得られると記載されている。 2. Description of the Related Art Conventionally, as an imaging apparatus, an apparatus that performs imaging by irradiating light from illumination means onto an electronic component that is an imaging target is known. For example, Patent Document 1 describes an illumination unit having a three-stage light emitting diode group that irradiates light obliquely on a component. The three-stage light emitting diode groups are attached so that the irradiation directions are at different angles. And it is described that an image suitable for the type and characteristics of the electronic component can be obtained by individually controlling the amount of light for each light emitting diode group.
特開2005-260268号公報JP 2005-260268 A
 ところで、配線パターンと表面が平坦な端子とを有する部品において、部品の外形部分と端子とを写した画像を撮像したい場合がある。しかし、このような部品に光を照射して部品を撮像する際に、不要な配線パターンが写ってしまうことで、例えば撮像された画像に基づく端子の検出精度が低下するなどの問題が生じる場合があった。特許文献1では、このような部品の撮像に適した光量の制御については記載されていない。 By the way, in a component having a wiring pattern and a terminal having a flat surface, there is a case where it is desired to take an image in which the outer portion of the component and the terminal are copied. However, when such a component is irradiated with light and an image of the component is captured, an unnecessary wiring pattern is captured, which causes a problem such as a decrease in terminal detection accuracy based on the captured image. was there. Patent Document 1 does not describe control of light amount suitable for imaging such a component.
 本発明は、上述した課題を解決するためになされたものであり、配線パターンを写りにくくしつつ部品の外形部分と端子とを写した画像を撮像することを主目的とする。 The present invention has been made in order to solve the above-described problems, and has as its main object to capture an image in which the external part of a component and terminals are copied while making it difficult to capture the wiring pattern.
 本発明は、上述した主目的を達成するために以下の手段を採った。 The present invention adopts the following means in order to achieve the above-mentioned main object.
 本発明の撮像装置は、
 配線パターンと表面が平坦な端子とを有する部品を撮像する撮像装置であって、
 受光した光に基づいて前記部品を撮像する撮像部と、
 前記部品に対して前記撮像部の光軸に沿う方向に光を照射する落射用光源と、
 前記部品に対して前記撮像部の光軸から傾斜した方向に光を照射する側射用光源と、
 前記落射用光源から発せられ前記部品で反射して前記撮像部に受光される光の光量である落射受光量が、前記側射用光源から発せられ前記部品で反射して前記撮像部に受光される光の光量である側射受光量よりも小さくなるように、前記部品の撮像時に前記落射用光源及び前記側射用光源を発光させる発光制御部と、
 を備えたものである。
The imaging apparatus of the present invention
An imaging device for imaging a component having a wiring pattern and a terminal having a flat surface,
An imaging unit that images the component based on the received light;
An epi-illumination light source that irradiates light in a direction along the optical axis of the imaging unit with respect to the component;
A side-light source that emits light in a direction inclined from the optical axis of the imaging unit to the component;
The incident light amount, which is the amount of light emitted from the incident light source and reflected by the component and received by the imaging unit, is emitted from the incident light source and reflected by the component and received by the imaging unit. A light emission control unit that emits light from the incident light source and the incident light source at the time of imaging the component, so as to be smaller than an amount of side incident light that is a light amount of
It is equipped with.
 この撮像装置では、発光制御部は落射受光量が側射受光量よりも小さくなるように部品の撮像時に落射用光源及び側射用光源を発光させ、撮像部は受光した光に基づいて部品の撮像を行う。ここで、落射用光源からの光は撮像部の光軸に沿う方向に照射される。そのため、落射用光源から照射され表面が平坦な端子で反射された光は、落射用光源から照射され部品の外形部分で反射された光と比べて、撮像部に比較的到達しやすい。すなわち、落射用光源を用いることで、表面が平坦な端子を写した画像を撮像しやすくなる。一方、落射用光源から照射され配線パターンで反射された光も、撮像部に比較的到達しやすい。しかし、配線パターンは、例えば表面が絶縁皮膜で覆われているなど、端子と比較して反射率が低い傾向にある。そのため、落射受光量を側射受光量よりも小さくする、すなわち落射用光源からの光量を大きくしすぎないようにすることで、配線パターンは写りにくくしつつ端子を写した画像を撮像できる。また、側射用光源からの光は撮像部の光軸から傾斜した方向に照射される。そのため、側射用光源から照射され部品の外形部分で反射された光は、側射用光源から照射され配線パターン又は端子で反射された光と比べて、撮像部に比較的到達しやすい。すなわち、側射用光源を用いることで、部品の外形部分を写した画像を撮像しやすくなる。したがって、側射受光量を落射受光量よりも大きくする、すなわち側射用光源からの光量を比較的大きくすることで、配線パターンは写りにくくしつつ部品の外形部分を写した画像を撮像できる。これに対し、例えば撮像時の落射受光量と側射受光量とが等しく且つ共に大きい場合は、部品の外形部分及び端子を写すことができるものの、配線パターンも写りやすい。また、例えば撮像時の落射受光量と側射受光量とが等しく且つ共に小さい場合は、配線パターンは写りにくくできるものの、部品の外形部分及び端子が写りにくくなりやすい。以上のように、本発明の撮像装置は、落射受光量を側射受光量よりも小さくすることで配線パターンを写りにくくしつつ、主に落射用光源からの光により端子を写し、主に側射用光源からの光により部品の外形部分を写した画像を撮像することができる。なお、「配線パターンを写りにくくする」とは、画像中の配線パターンに対応する画素の輝度値が小さくなるようにすることを意味する。 In this imaging apparatus, the light emission control unit causes the incident light source and the side light source to emit light during imaging of the component so that the incident light amount is smaller than the incident light amount, and the imaging unit detects the component based on the received light. Take an image. Here, the light from the incident light source is irradiated in a direction along the optical axis of the imaging unit. For this reason, the light emitted from the epi-illumination light source and reflected by the terminal having a flat surface is relatively easy to reach the imaging unit as compared with the light radiated from the epi-illumination light source and reflected from the external part of the component. In other words, using the epi-illumination light source makes it easy to capture an image of a terminal having a flat surface. On the other hand, the light emitted from the incident light source and reflected by the wiring pattern is relatively easy to reach the imaging unit. However, the wiring pattern tends to have a low reflectance as compared with the terminal, for example, the surface is covered with an insulating film. Therefore, by making the incident light received amount smaller than the side received light amount, that is, by preventing the amount of light from the incident light source from becoming too large, it is possible to capture an image of the terminal while making the wiring pattern difficult to see. Further, light from the side light source is emitted in a direction inclined from the optical axis of the imaging unit. For this reason, the light emitted from the side-light source and reflected by the external part of the component is relatively easy to reach the imaging unit compared to the light emitted from the side-light source and reflected from the wiring pattern or terminal. That is, by using the side-emitting light source, it becomes easy to capture an image in which the outer portion of the component is copied. Therefore, by making the amount of incident light received greater than the amount of incident light received, that is, by making the amount of light from the side light source relatively large, it is possible to capture an image of the external part of the component while making the wiring pattern difficult to see. On the other hand, for example, when the incident light incident amount and the side incident light amount at the time of image capturing are equal and large, the external part of the component and the terminal can be copied, but the wiring pattern is also easily captured. Further, for example, when the incident light received amount and the side received light amount at the time of imaging are equal and small, the wiring pattern can be difficult to be seen, but the external part of the component and the terminal are difficult to be seen. As described above, the imaging apparatus according to the present invention makes it difficult to capture the wiring pattern by making the incident light received amount smaller than the incident light received amount, and copies the terminal mainly by the light from the incident light source. It is possible to capture an image in which the external part of the component is captured by light from the projecting light source. “Making the wiring pattern difficult to capture” means that the luminance value of the pixel corresponding to the wiring pattern in the image is reduced.
 本発明の撮像装置において、前記発光制御部は、前記部品の撮像時に、前記落射用光源及び前記側射用光源の発光時間を制御することで、前記落射受光量を前記側射受光量よりも小さくしてもよい。こうすれば、例えば前記落射用光源及び前記側射用光源に供給する電力を制御する場合と比較して、比較的容易に落射受光量と側射受光量とを制御できる。 In the imaging apparatus according to the aspect of the invention, the light emission control unit may control the light emission time of the incident light source and the side light source during the imaging of the component, so that the incident light amount is less than the incident light amount. It may be small. By so doing, it is possible to control the incident light amount and the incident light amount relatively easily as compared with, for example, controlling the power supplied to the incident light source and the incident light source.
 本発明の撮像装置において、前記発光制御部は、前記部品の撮像時に、前記落射受光量が前記側射受光量の0.9倍以下となるように前記落射用光源及び前記側射用光源を発光させてもよい。こうすることで、配線パターンをより確実に写りにくくすることができる。なお、落射受光量は値0でなければよいが、側射受光量の0.1倍以上としてもよい。 In the imaging apparatus according to the aspect of the invention, the light emission control unit may include the incident light source and the incident light source so that the incident light amount is 0.9 times or less of the incident light amount when imaging the component. You may make it light-emit. By doing so, the wiring pattern can be more reliably prevented from being captured. The incident light received light amount may not be 0, but may be 0.1 times or more of the side incident light received amount.
 本発明の実装装置は、
 上述したいずれかの態様の本発明の撮像装置と、
 前記部品の保持が可能な部品保持部と、
 前記部品保持部を移動させる移動部と、
 前記撮像により得られた画像に基づく処理と、前記部品保持部及び前記移動部を制御して前記部品を基板に実装する処理と、を行う実装制御部と、
 を備えたものである。
The mounting apparatus of the present invention is
An imaging device of the present invention according to any one of the aspects described above;
A component holding unit capable of holding the component;
A moving unit for moving the component holding unit;
A mounting control unit that performs processing based on an image obtained by the imaging, and processing of controlling the component holding unit and the moving unit to mount the component on a substrate;
It is equipped with.
 本発明の実装装置は、上述したいずれかの態様の撮像装置を備えている。そのため、この実装装置は、上述した本発明の撮像装置と同様の効果、例えば配線パターンを写りにくくしつつ部品の外形部分と端子とを写した画像を撮像できる効果が得られる。 The mounting apparatus of the present invention includes the imaging apparatus according to any one of the above-described aspects. Therefore, this mounting apparatus can obtain the same effect as that of the above-described imaging apparatus of the present invention, for example, an effect of capturing an image of the external part of the component and the terminal while making it difficult to capture the wiring pattern.
実装装置10の斜視図。The perspective view of the mounting apparatus 10. FIG. パーツカメラ40の構成の概略説明図。FIG. 2 is a schematic explanatory diagram of a configuration of a parts camera 40. 実装装置10の制御に関わる構成を示すブロック図。FIG. 3 is a block diagram showing a configuration relating to control of the mounting apparatus 10. 部品実装処理ルーチンのフローチャート。The flowchart of a component mounting process routine. 落射受光量<側射受光量として部品90を撮像した場合の2値画像P1の説明図。Explanatory drawing of the binary image P1 at the time of imaging the components 90 as incident light received amount <side incident received light amount. 落射受光量と側射受光量とを等しく且つ共に大きくして部品90を撮像した場合の2値画像P2の説明図。Explanatory drawing of the binary image P2 at the time of imaging the component 90 by making the incident light received amount and the side received light amount equal and both large. 落射受光量と側射受光量とを等しく且つ共に小さくして部品90を撮像した場合の2値画像P3の説明図。Explanatory drawing of the binary image P3 at the time of imaging the component 90 by making the incident light received amount and the side received light amount equal and both small.
 本発明の実施形態を図面を参照しながら以下に説明する。図1は実装装置10の斜視図、図2は実装装置10が備えるパーツカメラ40の構成の概略説明図、図3は実装装置10の制御に関わる構成を示すブロック図である。なお、本実施形態において、左右方向(X軸)、前後方向(Y軸)及び上下方向(Z軸)は、図1に示した通りとする。 Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a perspective view of the mounting apparatus 10, FIG. 2 is a schematic explanatory diagram of a configuration of a parts camera 40 provided in the mounting apparatus 10, and FIG. 3 is a block diagram illustrating a configuration related to control of the mounting apparatus 10. In the present embodiment, the left-right direction (X-axis), the front-rear direction (Y-axis), and the up-down direction (Z-axis) are as shown in FIG.
 実装装置10は、基台12と、基台12の上に設置された実装装置本体14と、実装装置本体14に装着された部品供給装置としてのリールユニット70とを備えている。 The mounting apparatus 10 includes a base 12, a mounting apparatus main body 14 installed on the base 12, and a reel unit 70 as a component supply apparatus mounted on the mounting apparatus main body 14.
 実装装置本体14は、基台12に対して交換可能に設置されている。この実装装置本体14は、基板16を搬送したり保持したりする基板搬送装置18と、XY平面を移動可能なヘッド24と、ヘッド24に取り付けられZ軸に沿って移動可能なメカニカルチャック37と、メカニカルチャック37に把持された部品を撮像するパーツカメラ40と、各種制御を実行するコントローラ60とを備えている。 The mounting apparatus main body 14 is installed to be exchangeable with respect to the base 12. The mounting apparatus main body 14 includes a substrate transport device 18 that transports and holds the substrate 16, a head 24 that can move on the XY plane, and a mechanical chuck 37 that is attached to the head 24 and can move along the Z axis. A parts camera 40 that images the parts gripped by the mechanical chuck 37 and a controller 60 that executes various controls are provided.
 基板搬送装置18は、図1の前後に間隔を開けて設けられ左右方向に延びる支持板20,20と、両支持板20,20の互いに対向する面に設けられたコンベアベルト22,22(図1では片方のみ図示)とを備えている。コンベアベルト22,22は、支持板20,20の左右に設けられた駆動輪及び従動輪に無端状となるように架け渡されている。基板16は、一対のコンベアベルト22,22の上面に乗せられて左から右へと搬送される。この基板16は、多数立設された支持ピン23によって裏面側から支持されている。 The substrate transfer device 18 is provided with support plates 20 and 20 extending in the left-right direction with a space between the front and rear in FIG. 1 and conveyor belts 22 and 22 provided on opposite surfaces of the support plates 20 and 20 (see FIG. 1). 1 shows only one of them). The conveyor belts 22 and 22 are stretched over the drive wheels and the driven wheels provided on the left and right sides of the support plates 20 and 20 so as to be endless. The board | substrate 16 is mounted on the upper surface of a pair of conveyor belts 22 and 22, and is conveyed from the left to the right. The substrate 16 is supported from the back side by a large number of support pins 23 erected.
 ヘッド24は、X軸スライダ26の前面に取り付けられている。X軸スライダ26は、前後方向にスライド可能なY軸スライダ30の前面に、左右方向にスライド可能となるように取り付けられている。Y軸スライダ30は、前後方向に延びる左右一対のガイドレール32,32にスライド可能に取り付けられている。Y軸スライダ30の前面には、左右方向に延びる上下一対のガイドレール28,28が設けられ、このガイドレール28,28にX軸スライダ26が左右方向にスライド可能に取り付けられている。ヘッド24は、X軸スライダ26が左右方向に移動するのに伴って左右方向に移動し、Y軸スライダ30が前後方向に移動するのに伴って前後方向に移動する。なお、各スライダ26,30は、それぞれ駆動モータ26a,30a(図3参照)により駆動される。また、ヘッド24は、Z軸モータ34を内蔵し、Z軸に沿って延びるボールネジ35に取り付けられたメカニカルチャック37の高さをZ軸モータ34によって調整する。さらに、ヘッド24は、メカニカルチャック37を回転させるQ軸モータ36(図3参照)を内蔵している。 The head 24 is attached to the front surface of the X-axis slider 26. The X-axis slider 26 is attached to the front surface of the Y-axis slider 30 that can slide in the front-rear direction so as to be slidable in the left-right direction. The Y-axis slider 30 is slidably attached to a pair of left and right guide rails 32, 32 extending in the front-rear direction. A pair of upper and lower guide rails 28, 28 extending in the left-right direction are provided on the front surface of the Y-axis slider 30, and the X-axis slider 26 is attached to the guide rails 28, 28 so as to be slidable in the left-right direction. The head 24 moves in the left-right direction as the X-axis slider 26 moves in the left-right direction, and moves in the front-rear direction as the Y-axis slider 30 moves in the front-rear direction. The sliders 26 and 30 are driven by drive motors 26a and 30a (see FIG. 3), respectively. The head 24 incorporates a Z-axis motor 34 and adjusts the height of a mechanical chuck 37 attached to a ball screw 35 extending along the Z-axis by the Z-axis motor 34. Further, the head 24 incorporates a Q-axis motor 36 (see FIG. 3) that rotates the mechanical chuck 37.
 メカニカルチャック37は、部品を把持することで部品の保持が可能な機構である。メカニカルチャック37は、メカニカルチャック37の本体底面から下方に突出している前後一対の把持部38と、この一対の把持部38を互いに近接及び離間する方向にスライド可能な図示しないスライダと、このスライダを駆動する駆動モータ39(図3参照)と、を備えている。駆動モータ39により把持部38が互いに接近することで、把持部38は部品を把持する。また、Z軸モータ34によってメカニカルチャック37がZ軸方向に沿って昇降することで、把持部38に把持された部品の高さが調整される。Q軸モータ36によってメカニカルチャック37が回転することで、把持部38に把持された部品の向きが調整される。 The mechanical chuck 37 is a mechanism capable of holding a part by gripping the part. The mechanical chuck 37 includes a pair of front and rear gripping portions 38 projecting downward from the bottom surface of the main body of the mechanical chuck 37, a slider (not shown) that can slide the pair of gripping portions 38 toward and away from each other, and the slider. And a drive motor 39 (see FIG. 3) for driving. The gripping part 38 grips a component by the gripping part 38 approaching each other by the drive motor 39. Further, the mechanical chuck 37 is moved up and down along the Z-axis direction by the Z-axis motor 34 to adjust the height of the component gripped by the grip portion 38. When the mechanical chuck 37 is rotated by the Q-axis motor 36, the orientation of the component gripped by the gripping portion 38 is adjusted.
 パーツカメラ40は、基板搬送装置18の前側の支持板20の前方に配置されている。パーツカメラ40は、パーツカメラ40の上方が撮像範囲であり、メカニカルチャック37に保持された部品を下方から撮像して画像を生成する。パーツカメラ40は、図2に示すように、撮像対象の部品に対して光を照射する照明部41と、受光した光に基づいて部品を撮像する撮像部51と、パーツカメラ40全体を制御する撮像制御部52と、を備えている。 The parts camera 40 is disposed in front of the support plate 20 on the front side of the substrate transfer device 18. The parts camera 40 has an imaging range above the parts camera 40 and images the parts held by the mechanical chuck 37 from below to generate an image. As shown in FIG. 2, the parts camera 40 controls the illumination unit 41 that irradiates light to the imaging target component, the imaging unit 51 that images the component based on the received light, and the entire part camera 40. An imaging control unit 52.
 照明部41は、ハウジング42と、連結部43と、落射用光源44と、ハーフミラー46と、側射用光源47と、を備えている。ハウジング42は、上面及び下面(底面)が八角形状に開口した椀状の部材である。ハウジング42は、下面の開口よりも上面の開口の方が大きく、下面から上面に向かって内部空間が大きくなる傾向の形状をしている。連結部43は、ハウジング42と撮像部51とを連結する筒状の部材である。落射用光源44から照射される光や撮像部51に受光される光は、この連結部43の内部空間を通過する。落射用光源44は、メカニカルチャック37に保持された部品に対して撮像部51の光軸51aに沿う方向に光を照射するための光源である。落射用光源44は、ハーフミラー46に向けて光軸51aに垂直な方向に光を照射するLED45を複数有している。この複数のLED45は、連結部43の内周面に取り付けられている。本実施形態では、光軸51aは上下方向に沿っており、LED45からの光は水平方向(例えば左右方向)に照射される。ハーフミラー46は、連結部43の内部に、光軸51aから傾斜して(例えば傾斜角45°)配置されている。ハーフミラー46は、落射用光源44からの水平方向の光を上方に反射する。そのため、落射用光源44のLED45からの光は、ハーフミラー46での反射後に、撮像部51の光軸51aに沿う方向(ここでは上方向)に照射される。また、ハーフミラー46は上方からの光については撮像部51に向けて透過する。側射用光源47は、メカニカルチャック37に保持された部品に対して光軸51aから傾斜した方向に光を照射するための光源である。側射用光源47は、複数のLED48aを有する上段光源47aと、上段光源47aよりも下方に配置され複数のLED48bを有する中段光源47bと、中段光源47bよりも下方に配置され複数のLED48cを有する下段光源47cと、を備えている。これらのLED48a~48cは、ハウジング42の内周面に取り付けられている。LED48a~48cは、いずれも光軸51aから傾斜した方向(光軸51aからの傾斜角が0°超過90°未満)に光を照射する。LED48a~48cの照射方向の光軸51aからの傾斜角は、LED48aが最も大きく、LED48aは水平に近い方向に光を照射する。また、この傾斜角は、LED48cが最も小さくなっている。 The illumination unit 41 includes a housing 42, a connecting unit 43, an incident light source 44, a half mirror 46, and a side light source 47. The housing 42 is a bowl-shaped member whose upper surface and lower surface (bottom surface) are opened in an octagonal shape. The housing 42 has a shape in which the opening on the upper surface is larger than the opening on the lower surface, and the internal space tends to increase from the lower surface toward the upper surface. The connecting portion 43 is a cylindrical member that connects the housing 42 and the imaging portion 51. The light emitted from the epi-illumination light source 44 and the light received by the imaging unit 51 pass through the internal space of the connection unit 43. The incident light source 44 is a light source for irradiating the component held by the mechanical chuck 37 with light in a direction along the optical axis 51 a of the imaging unit 51. The incident light source 44 includes a plurality of LEDs 45 that emit light toward the half mirror 46 in a direction perpendicular to the optical axis 51a. The plurality of LEDs 45 are attached to the inner peripheral surface of the connecting portion 43. In this embodiment, the optical axis 51a is along the up-down direction, and the light from the LED 45 is irradiated in the horizontal direction (for example, the left-right direction). The half mirror 46 is disposed inside the connecting portion 43 so as to be inclined from the optical axis 51a (for example, an inclination angle of 45 °). The half mirror 46 reflects the light in the horizontal direction from the incident light source 44 upward. Therefore, the light from the LED 45 of the incident light source 44 is irradiated in the direction along the optical axis 51a of the imaging unit 51 (upward here) after being reflected by the half mirror 46. Further, the half mirror 46 transmits light from above toward the imaging unit 51. The side-emitting light source 47 is a light source for irradiating light on a component held by the mechanical chuck 37 in a direction inclined from the optical axis 51a. The side light source 47 includes an upper light source 47a having a plurality of LEDs 48a, a middle light source 47b having a plurality of LEDs 48b disposed below the upper light source 47a, and a plurality of LEDs 48c disposed below the middle light source 47b. A lower light source 47c. These LEDs 48 a to 48 c are attached to the inner peripheral surface of the housing 42. Each of the LEDs 48a to 48c irradiates light in a direction inclined from the optical axis 51a (an inclination angle from the optical axis 51a is more than 0 ° and less than 90 °). The LED 48a has the largest inclination angle from the optical axis 51a in the irradiation direction of the LEDs 48a to 48c, and the LED 48a emits light in a direction close to the horizontal. Further, the LED 48c has the smallest inclination angle.
 撮像部51は、図示しないレンズなどの光学系及び撮像素子を備えている。落射用光源44及び側射用光源47から発せられ撮像対象の部品で反射した後の光がハーフミラー46を透過して撮像部51に到達すると、撮像部51はこの光を受光する。そして、撮像部51は、受光した光を光電変換して画像中の各々の画素に対応する電荷を生成し、生成された電荷に基づいて各々の画素の情報を含むデジタルデータである画像データを生成する。 The imaging unit 51 includes an optical system such as a lens (not shown) and an imaging element. When the light emitted from the incident light source 44 and the side light source 47 and reflected by the component to be imaged is transmitted through the half mirror 46 and reaches the image capturing unit 51, the image capturing unit 51 receives this light. Then, the imaging unit 51 photoelectrically converts the received light to generate charges corresponding to each pixel in the image, and based on the generated charges, image data that is digital data including information on each pixel is generated. Generate.
 撮像制御部52は、照明部41に制御信号を出力して照明部41からの光の照射を制御したり、撮像部51に制御信号を出力して画像の撮像を行わせたり、撮像部51が生成した画像データをコントローラ60に出力したりする。撮像制御部52は、照明部41のLED45,48a~48cの各々に通電する電流の値及び通電時間を制御して、落射用光源44及び側射用光源47の単位時間当たりの発光量及び発光時間を個別に制御可能である。撮像制御部52は、側射用光源47の上段光源47a,中段光源47b,及び下段光源47cの各々について、単位時間当たりの発光量及び発光時間を個別に制御可能である。 The imaging control unit 52 outputs a control signal to the illuminating unit 41 to control light irradiation from the illuminating unit 41, outputs a control signal to the imaging unit 51 to take an image, or captures an image. The image data generated by is output to the controller 60. The imaging control unit 52 controls the value of current that is applied to each of the LEDs 45, 48 a to 48 c of the illumination unit 41 and the energization time, and the light emission amount and light emission per unit time of the incident light source 44 and the side light source 47. Time can be individually controlled. The imaging control unit 52 can individually control the light emission amount and the light emission time per unit time for each of the upper light source 47a, the middle light source 47b, and the lower light source 47c of the side light source 47.
 ここで、パーツカメラ40が撮像する部品の一例について図2を用いて説明する。図2に示す部品90の図のうち、上段の図は部品90の下面図であり、下段の図は部品90の正面図である。部品90は、本体部91と、本体部91を基板上に配置する際の基板との接続に用いられる端子板92と、を有している。端子板92は、下面が略平面上の板状部材である。端子板92は、下面視で2箇所の角部が切り落とされた四角形状をしている。切り落とされた部分のうち図2の上段における左下に位置する部分を切り欠き部92aと称し、右下に位置する部分を切り欠き部92bと称する。端子板92の下面には、端子93,94と、端子93に接続された配線パターン95と、端子94に接続された配線パターン96と、が配設されている。端子93,94は、例えば他の部品又は基板上の配線パターンなどと接続される電極であり、表面(ここでは下面)は平坦であり且つ金属などの導体が露出している。また、端子93及び端子94には極性があり、切り欠き部92a,92bとの位置関係によって端子93と端子94とを識別可能になっている。配線パターン95,96は、端子93,94と本体部91の内部とを導通するための配線であり、下面は平坦であり且つ金属などの導体で主に構成されている。また、配線パターン95,96の表面(ここでは下面)は、短絡を防止するために絶縁皮膜で覆われている。配線パターン95,96は、絶縁皮膜で覆われているため、端子93,94と比べて反射率が低い。また、端子板92は、例えば黒色の樹脂など、端子93,94及び配線パターン95,96と比べて反射率の低い材質で構成されている。パーツカメラ40は、端子板92の下面に照明部41からの光を照射し、その光の反射光を撮像部51が受光して、端子板92の下面を撮像する。また、詳細は後述するが、パーツカメラ40は、撮像対象がこの部品90である場合とそれ以外の部品の場合とで、照明部41の発光量を異ならせて撮像を行う。 Here, an example of a part imaged by the parts camera 40 will be described with reference to FIG. In the diagram of the component 90 shown in FIG. 2, the upper diagram is a bottom view of the component 90, and the lower diagram is a front view of the component 90. The component 90 includes a main body portion 91 and a terminal plate 92 used for connection to the substrate when the main body portion 91 is disposed on the substrate. The terminal board 92 is a plate-like member whose lower surface is substantially flat. The terminal board 92 has a quadrangular shape with two corners cut off when viewed from below. Of the cut-off portion, the lower left portion in the upper part of FIG. 2 is referred to as a notch 92a, and the lower right portion is referred to as a notch 92b. On the lower surface of the terminal plate 92, terminals 93 and 94, a wiring pattern 95 connected to the terminal 93, and a wiring pattern 96 connected to the terminal 94 are disposed. The terminals 93 and 94 are electrodes connected to, for example, other components or a wiring pattern on the substrate, the surface (here, the lower surface) is flat, and a conductor such as metal is exposed. Further, the terminal 93 and the terminal 94 have polarity, and the terminal 93 and the terminal 94 can be identified by the positional relationship with the notches 92a and 92b. The wiring patterns 95 and 96 are wirings for conducting the terminals 93 and 94 and the inside of the main body 91, and the lower surface is flat and is mainly composed of a conductor such as metal. Further, the surface (here, the lower surface) of the wiring patterns 95 and 96 is covered with an insulating film in order to prevent a short circuit. Since the wiring patterns 95 and 96 are covered with an insulating film, the reflectance is lower than that of the terminals 93 and 94. Further, the terminal plate 92 is made of a material having a lower reflectance than the terminals 93 and 94 and the wiring patterns 95 and 96, such as black resin. The parts camera 40 irradiates the lower surface of the terminal plate 92 with light from the illumination unit 41, and the imaging unit 51 receives the reflected light of the light, and images the lower surface of the terminal plate 92. Although details will be described later, the parts camera 40 performs imaging by varying the light emission amount of the illumination unit 41 between the case where the imaging target is the component 90 and the other components.
 コントローラ60は、図3に示すように、CPU61を中心とするマイクロプロセッサとして構成されており、処理プログラムを記憶するROM62、各種データを記憶するHDD63、作業領域として用いられるRAM64、外部装置と電気信号のやり取りを行うための入出力インターフェース65などを備えており、これらはバス66を介して接続されている。このコントローラ60は、基板搬送装置18、X軸スライダ26の駆動モータ26a、Y軸スライダ30の駆動モータ30a、Z軸モータ34、Q軸モータ36、及びメカニカルチャック37の駆動モータ39へ駆動信号を出力する。また、コントローラ60は、撮像時の落射用光源44及び側射用光源47の制御量などを含む撮像条件に関する情報をパーツカメラ40に出力したり、パーツカメラ40からの画像データを入力したりする。なお、図示しないが、各スライダ26,30には図示しない位置センサが装備されており、コントローラ60はそれらの位置センサからの位置情報を入力しつつ、各スライダ26,30の駆動モータ26a,30aを制御する。 As shown in FIG. 3, the controller 60 is configured as a microprocessor centered on the CPU 61, and includes a ROM 62 that stores processing programs, an HDD 63 that stores various data, a RAM 64 that is used as a work area, and external devices and electrical signals. An input / output interface 65 and the like for performing exchanges are provided, and these are connected via a bus 66. The controller 60 sends drive signals to the substrate transport device 18, the drive motor 26 a of the X-axis slider 26, the drive motor 30 a of the Y-axis slider 30, the Z-axis motor 34, the Q-axis motor 36, and the drive motor 39 of the mechanical chuck 37. Output. Further, the controller 60 outputs information related to imaging conditions including control amounts of the incident light source 44 and the side illumination light source 47 at the time of imaging to the parts camera 40 and inputs image data from the parts camera 40. . Although not shown, each slider 26, 30 is equipped with a position sensor (not shown), and the controller 60 inputs position information from these position sensors while driving the drive motors 26a, 30a of each slider 26, 30. To control.
 リールユニット70は、複数のリール72を備え、実装装置本体14の前側に着脱可能に取り付けられている。各リール72には、テープが巻き付けられ、テープの表面には、部品がテープの長手方向に沿って保持されている。これらの部品は、テープの表面を覆うフィルムによって保護されている。こうしたテープは、リールから後方に向かって巻きほどかれ、フィーダ部74においてフィルムが剥がされて部品が露出した状態となる。この露出した状態の部品をメカニカルチャック37の把持部38が把持することで、部品はメカニカルチャック37に保持されてヘッド24と共に移動可能になる。 The reel unit 70 includes a plurality of reels 72 and is detachably attached to the front side of the mounting apparatus body 14. A tape is wound around each reel 72, and components are held on the surface of the tape along the longitudinal direction of the tape. These parts are protected by a film covering the surface of the tape. Such a tape is unwound from the reel toward the rear, and the film is peeled off at the feeder portion 74 so that the components are exposed. When the gripped portion 38 of the mechanical chuck 37 grips the exposed component, the component is held by the mechanical chuck 37 and can move with the head 24.
 管理コンピュータ80は、実装装置10の生産ジョブを管理するコンピュータであり、実装装置10のコントローラ60と通信可能に接続されている。なお、生産ジョブは、実装装置10においてどの部品をどういう順番でどの基板16に装着するか、また、何枚の基板16に部品の実装を行うかなどを定めた情報である。管理コンピュータ80は、この生産ジョブを記憶しており、生産ジョブに含まれる情報を必要に応じて実装装置10に出力する。 The management computer 80 is a computer that manages a production job of the mounting apparatus 10 and is connected to the controller 60 of the mounting apparatus 10 so as to be communicable. The production job is information that defines which components are mounted on which substrate 16 in which order in the mounting apparatus 10 and how many substrates 16 are to be mounted with components. The management computer 80 stores the production job and outputs information included in the production job to the mounting apparatus 10 as necessary.
 次に、本実施形態の実装装置10の動作、特に、パーツカメラ40を用いた部品の撮像を伴って部品を基板16に実装する処理について説明する。実装装置10のコントローラ60のCPU61は、管理コンピュータ80からの指令を受けると、まず、これから実装しようとする実装対象の部品に関する情報を管理コンピュータ80から取得する。次に、CPU61は、実装対象の部品を撮像する処理や基板上に配置する処理を含む部品実装処理を行う。そして、CPU61は、基板16にすべての部品の実装を完了するまで、次の実装対象の部品に関する情報を取得する処理及び部品実装処理を繰り返し行う。以下では、特に、図2に示した部品90が実装対象の部品である場合の部品実装処理について説明する。図4は、部品実装処理ルーチンの一例を示すフローチャートである。図4の部品実装処理ルーチンは、HDD63に記憶されている。図4の部品実装処理ルーチンは、管理コンピュータ80から取得された次の実装対象の部品の部品種が部品90であった場合に、コントローラ60により開始される。 Next, the operation of the mounting apparatus 10 according to the present embodiment, in particular, the process of mounting the component on the board 16 with the imaging of the component using the parts camera 40 will be described. When the CPU 61 of the controller 60 of the mounting apparatus 10 receives a command from the management computer 80, the CPU 61 first acquires information on the component to be mounted to be mounted from the management computer 80. Next, the CPU 61 performs a component mounting process including a process for imaging a component to be mounted and a process for placing the component on a board. Then, the CPU 61 repeatedly performs processing for acquiring information on the next component to be mounted and component mounting processing until the mounting of all the components on the substrate 16 is completed. In the following, a component mounting process when the component 90 shown in FIG. 2 is a component to be mounted will be described. FIG. 4 is a flowchart illustrating an example of a component mounting process routine. The component mounting process routine of FIG. 4 is stored in the HDD 63. The component mounting process routine of FIG. 4 is started by the controller 60 when the component type of the next component to be mounted acquired from the management computer 80 is the component 90.
 図4の部品実装処理ルーチンを開始すると、CPU61は、落射受光量<側射受光量となるように撮像時の落射用光源44及び側射用光源47の制御量を設定する(ステップS100)。ここで、落射受光量とは、落射用光源44から発せられ部品90で反射して撮像部51に受光される光の光量である。同様に、側射受光量とは、側射用光源47から発せられ部品90で反射して撮像部51に受光される光の光量である。なお、落射受光量及び側射受光量は、それぞれ、撮像時の受光量の積分値(例えば単位時間当たりの受光量と受光時間との積)とする。落射受光量<側射受光量となる場合とは、換言すると、落射用光源44のみを発光させて撮像した場合の画像の各画素の輝度値(例えば256階調の輝度値)の平均値が、側射用光源47のみを発光させて撮像した場合の画像の各画素の輝度値の平均値よりも小さくなるような場合である。なお、本実施形態では、部品90を撮像する際には、側射用光源47のうち上段光源47aのみを発光させるものとした。また、本実施形態では、撮像時の落射用光源44の発光時間(落射発光時間t1と称する)と側射用光源47(ここでは上段光源47aのみ)の発光時間(側射発光時間t2と称する)とが等しい場合に落射受光量と側射受光量とが等しくなるように、撮像部51がLED45及びLED48aに通電する電流の値が予め実験によりそれぞれ定められているものとした。そのため、ステップS100では、CPU61は、落射用光源44及び側射用光源47の制御量として、t1<t2となるように落射発光時間t1及び側射発光時間t2を設定する。なお、落射発光時間t1及び側射発光時間t2の値は、例えば部品90に対応付けられて予めHDD63に記憶されていてもよいし、生産ジョブに含まれていてもよいし、CPU61が生産ジョブに含まれる情報に基づいて導出してもよい。 When the component mounting process routine of FIG. 4 is started, the CPU 61 sets the control amounts of the incident light source 44 and the incident light source 47 at the time of imaging so that the incident light amount <the side light amount (step S100). Here, the incident light amount is the amount of light emitted from the incident light source 44 and reflected by the component 90 and received by the imaging unit 51. Similarly, the side received light amount is the amount of light emitted from the side light source 47 and reflected by the component 90 and received by the imaging unit 51. The incident light received amount and the side received light amount are respectively integrated values of the received light amount at the time of imaging (for example, the product of the received light amount per unit time and the received light time). In other words, the case where the incident light amount is smaller than the incident light amount, in other words, the average value of the luminance values (e.g., 256 gradation luminance values) of each pixel of the image when only the incident light source 44 emits light. This is a case where the luminance value is smaller than the average value of the luminance values of the respective pixels of the image when only the side light source 47 is emitted for imaging. In the present embodiment, when the component 90 is imaged, only the upper light source 47a of the side light source 47 is caused to emit light. In the present embodiment, the light emission time of the incident light source 44 during imaging (referred to as the incident light emission time t1) and the light emission time of the side light source 47 (only the upper light source 47a here) (referred to as the side emission light time t2). ) Is equal to the incident light received amount and the side received light amount, the values of the currents that the imaging unit 51 supplies to the LEDs 45 and 48a are determined in advance by experiments. For this reason, in step S100, the CPU 61 sets the incident light emission time t1 and the side light emission time t2 as t1 <t2 as control amounts of the incident light source 44 and the side light source 47. Note that the values of the incident light emission time t1 and the side light emission time t2 may be stored in advance in the HDD 63 in association with the component 90, for example, or may be included in the production job, or the CPU 61 may execute the production job. May be derived based on the information contained in.
 ステップS100で落射発光時間t1及び側射発光時間t2を設定すると、CPU61は、ヘッド24を移動させ、リールユニット70によって供給される実装対象の部品をメカニカルチャック37の把持部38に把持させる(ステップS110)。続いて、CPU61は、ヘッド24を移動させてメカニカルチャック37に把持された部品をパーツカメラ40の上方へ移動させる(ステップS120)。そして、CPU61は、ステップS100で設定した制御量(ここでは落射発光時間t1及び側射発光時間t2)で照明部41を制御して撮像を行うよう、撮像制御部52に制御信号を出力する(ステップS130)。撮像制御部52は、入力した落射発光時間t1及び側射発光時間t2に基づいて落射用光源44及び側射用光源47を発光させると共に、撮像部51に受光した光に基づく画像を生成させて、メカニカルチャック37に把持された部品を撮像させる。これにより、落射受光量<側射受光量となる条件で部品90の画像が撮像される。なお、本実施形態では、撮像部51は、受光した光に基づいて、例えば各画素の輝度値を256階調で表したグレースケールの画像データを生成するものとした。撮像制御部52は、撮像された画像データをコントローラ60に出力する。 When the incident light emission time t1 and the side light emission time t2 are set in step S100, the CPU 61 moves the head 24 and causes the gripping portion 38 of the mechanical chuck 37 to grip the component to be mounted supplied by the reel unit 70 (step S100). S110). Subsequently, the CPU 61 moves the head 24 to move the component held by the mechanical chuck 37 above the parts camera 40 (step S120). Then, the CPU 61 outputs a control signal to the imaging control unit 52 so as to control the illumination unit 41 with the control amounts set here in step S100 (here, the epi-illumination light emission time t1 and the side emission light emission time t2). Step S130). The imaging control unit 52 causes the epi-illumination light source 44 and the side-illumination light source 47 to emit light based on the incident epi-emission time t1 and the side-emission light emission time t2, and causes the imaging unit 51 to generate an image based on the received light. Then, the part gripped by the mechanical chuck 37 is imaged. As a result, an image of the component 90 is captured under the condition that the incident light received amount <the side received light amount. In the present embodiment, the imaging unit 51 generates, for example, grayscale image data in which the luminance value of each pixel is expressed in 256 gradations based on the received light. The imaging control unit 52 outputs the captured image data to the controller 60.
 撮像により得られた画像データを撮像制御部52から入力すると、CPU61は、その画像に基づく所定の処理を行う(ステップS140~S180)。具体的には、CPU61は、まず、得られた画像データの各画素の輝度値を2値化して2値画像を得る(ステップS140)。2値化は、例えば判別分析法(大津の2値化)などの周知の方法で行うことができる。 When image data obtained by imaging is input from the imaging control unit 52, the CPU 61 performs predetermined processing based on the image (steps S140 to S180). Specifically, the CPU 61 first binarizes the luminance value of each pixel of the obtained image data to obtain a binary image (step S140). The binarization can be performed by a known method such as a discriminant analysis method (binarization of Otsu).
 ここで、部品90を撮像した画像データから得られた2値画像の一例について説明する。図5は、落射受光量<側射受光量として部品90を撮像した2値画像P1の説明図である。図6は、比較例として本実施形態とは異なり落射受光量と側射受光量とを等しく且つ共に大きくして部品90を撮像した場合の2値画像P2の説明図である。図7は、比較例として本実施形態とは異なり落射受光量と側射受光量とを等しく且つ共に小さくして部品90を撮像した場合の2値画像P3の説明図である。図5~7では、2値化後の輝度値が小さい側の画素を黒色で表し、2値化後の輝度値が大きい側の画素を白色で表している。 Here, an example of a binary image obtained from image data obtained by imaging the component 90 will be described. FIG. 5 is an explanatory diagram of a binary image P1 obtained by imaging the component 90 with the incident light received amount <the side received light amount. FIG. 6 is an explanatory diagram of a binary image P2 when the component 90 is imaged as a comparative example, unlike the present embodiment, with the incident light reception amount and the side light reception amount being equal and large. FIG. 7 is an explanatory diagram of a binary image P3 when the component 90 is imaged as a comparative example, unlike the present embodiment, with the incident light received amount and the side received light amount being equal and both small. In FIGS. 5 to 7, the pixel with the smaller luminance value after binarization is represented in black, and the pixel with the larger luminance value after binarization is represented in white.
 図5からわかるように、2値画像P1では、部品90の外形部分(ここでは端子板92の下面視における縁部分)及び端子93,94に対応する画素は白色になっている。一方、2値画像P1では、端子板92の縁以外の部分、配線パターン95,96、及び部品90以外の部分(背景部分)に対応する画素は黒色になっており、配線パターン95,96は写っていない。このように、落射受光量<側射受光量として部品90を撮像することで、配線パターン95,96が写らず部品90の外形部分と端子93,94とを写した2値画像を得ることができる。この理由について説明する。 As can be seen from FIG. 5, in the binary image P1, the outer portion of the component 90 (here, the edge portion of the terminal plate 92 in the bottom view) and the pixels corresponding to the terminals 93 and 94 are white. On the other hand, in the binary image P1, pixels corresponding to portions other than the edges of the terminal board 92, the wiring patterns 95 and 96, and portions other than the component 90 (background portion) are black, and the wiring patterns 95 and 96 are It is not shown. In this way, by imaging the component 90 with the incident light received amount <the side received light amount, a binary image can be obtained in which the wiring patterns 95 and 96 are not captured and the outer portion of the component 90 and the terminals 93 and 94 are copied. it can. The reason for this will be described.
 まず、落射用光源44からの光は撮像部51の光軸51aに沿う方向(ここでは上方)に照射される。これにより、落射用光源44から上方に照射され部品90のうち光軸51aに垂直な平面部分で反射された光は、そのまま光軸51aに沿う方向(ここでは下方)に進む。そのため、落射用光源44から照射され表面が平坦な端子93,94で反射された光は、落射用光源44から照射され部品90の外形部分で反射された光と比べて、撮像部51に比較的到達しやすい。すなわち、落射用光源44を用いることで、表面が平坦な端子93,94を写した画像を撮像しやすくなる。一方、落射用光源44から照射され配線パターン95,96で反射された光も、配線パターン95,96の表面が平坦であるため撮像部51に比較的到達しやすい。しかし、配線パターン95,96は、上述したように表面が絶縁皮膜で覆われており端子93,94と比較して反射率が低い。そのため、落射受光量を側射受光量よりも小さくする、すなわち落射用光源44からの光量を大きくしすぎないようにすることで、配線パターン95,96は写りにくくしつつ端子93,94を写した画像を撮像できる。なお、本実施形態では、撮像部51が撮像した画像(ここでは256階調のグレースケール画像)において、その画像を2値化する際の閾値よりも端子93,94に対応する画素の輝度値が大きく且つ配線パターン95,96に対応する画素の輝度値が小さくなる程度に、落射受光量を小さい値にしている。これにより、撮像部51が撮像した画像に基づいて、図5の2値画像P1のように、端子93,94を写しつつ配線パターン95,96を写さない画像を得ることができる。このような落射受光量の値及びその値を実現するための落射用光源44の制御量(ここでは落射発光時間t1)は、例えば実験により予め定めておくことができる。 First, the light from the incident light source 44 is irradiated in a direction along the optical axis 51a of the imaging unit 51 (here, upward). Thereby, the light irradiated upward from the epi-illumination light source 44 and reflected by the plane portion perpendicular to the optical axis 51a of the component 90 proceeds in the direction along the optical axis 51a (downward here) as it is. Therefore, the light irradiated from the epi-illumination light source 44 and reflected by the terminals 93 and 94 with flat surfaces is compared with the imaging unit 51 compared to the light radiated from the epi-illumination light source 44 and reflected from the outer portion of the component 90. Easy to reach. That is, the use of the epi-illumination light source 44 makes it easy to capture an image of the terminals 93 and 94 having flat surfaces. On the other hand, the light emitted from the incident light source 44 and reflected by the wiring patterns 95 and 96 is relatively easy to reach the imaging unit 51 because the surfaces of the wiring patterns 95 and 96 are flat. However, the surface of the wiring patterns 95 and 96 is covered with an insulating film as described above, and the reflectance is lower than that of the terminals 93 and 94. For this reason, the incident light receiving amount is made smaller than the side incident light receiving amount, that is, the light amount from the incident light source 44 is not increased too much, so that the wiring patterns 95 and 96 are difficult to be seen while the terminals 93 and 94 are copied. Images can be taken. In the present embodiment, in an image captured by the imaging unit 51 (here, a grayscale image with 256 gradations), the luminance value of the pixel corresponding to the terminals 93 and 94 is higher than the threshold value when the image is binarized. The incident light reception amount is set to a small value so that the brightness value of the pixels corresponding to the wiring patterns 95 and 96 becomes small. Thereby, based on the image picked up by the image pickup unit 51, an image in which the wiring patterns 95 and 96 are not copied while the terminals 93 and 94 are copied can be obtained like the binary image P1 in FIG. The value of the incident light amount and the control amount of the incident light source 44 (in this case, the incident light emission time t1) for realizing the value can be determined in advance by experiments, for example.
 また、側射用光源47(ここでは上段光源47a)からの光は撮像部51の光軸51aから傾斜した方向に照射される。そのため、側射用光源47から照射され部品90の外形部分(ここでは下面視における端子板92の縁部分)で反射された光は、側射用光源47から照射され配線パターン95,96又は端子93,94で反射された光と比べて、撮像部51に比較的到達しやすい。すなわち、側射用光源47を用いることで、部品90の外形部分を写した画像を撮像しやすくなる。したがって、側射受光量を落射受光量よりも大きくする、すなわち側射用光源47からの光量を比較的大きくすることで、配線パターン95,96は写りにくくしたままで部品90の外形部分を写した画像を撮像できる。なお、本実施形態では、撮像部51が撮像した画像(ここでは256階調のグレースケール画像)において、その画像を2値化する際の閾値よりも部品90の外形部分に対応する画素の輝度値が大きくなる程度に、側射受光量を大きい値にしている。これにより、撮像部51が撮像した画像に基づいて、図5の2値画像P1のように、部品90の外形部分を写した画像を得ることができる。このような側射受光量の値及びその値を実現するための側射用光源47の制御量(ここでは側射発光時間t2)は、例えば実験により予め定めておくことができる。 Further, light from the side-emitting light source 47 (here, the upper light source 47a) is irradiated in a direction inclined from the optical axis 51a of the imaging unit 51. For this reason, the light emitted from the side light source 47 and reflected from the outer portion of the component 90 (here, the edge portion of the terminal plate 92 in the bottom view) is emitted from the side light source 47 and is connected to the wiring patterns 95 and 96 or the terminals. Compared to the light reflected by 93 and 94, it is relatively easy to reach the imaging unit 51. That is, by using the side-emitting light source 47, it becomes easy to capture an image in which the outer portion of the component 90 is captured. Accordingly, by making the side received light amount larger than the incident light received amount, that is, by making the light amount from the side light source 47 relatively large, the outline of the component 90 can be copied while keeping the wiring patterns 95 and 96 difficult to be seen. Images can be taken. In the present embodiment, in an image captured by the imaging unit 51 (here, a grayscale image having 256 gradations), the luminance of the pixel corresponding to the outer portion of the component 90 is higher than a threshold value when the image is binarized. The side received light amount is set to a large value as the value increases. Thereby, based on the image imaged by the imaging unit 51, an image in which the outer portion of the component 90 is copied can be obtained as in the binary image P1 of FIG. Such a value of the lateral light reception amount and a control amount (here, the side light emission time t2) of the side light source 47 for realizing the value can be determined in advance by experiments, for example.
 これに対し、例えば撮像時の落射受光量と側射受光量とが等しく且つ共に大きい場合は、部品90の外形部分及び端子93,94を写すことができるものの、配線パターン95,96も写りやすい。すなわち撮像部51が撮像した画像における配線パターン95,96に対応する画素の輝度値が大きくなりやすい。そのため、図6の2値画像P2のように、2値化後における配線パターン95,96に対応する画素が白色になってしまいやすい。また、例えば落射受光量と側射受光量とが等しく且つ共に小さい場合は、配線パターン95,96は写りにくくできるものの、部品90の外形部分及び端子93,94が写りにくくなりやすい。すなわち撮像部51が撮像した画像における部品90の外形部分及び端子93,94に対応する画素の輝度値が小さくなりやすい。そのため、図7の2値画像P3のように、2値化後における部品90の外形部分及び端子93,94の少なくとも一方に対応する画素(図7では部品90の外形部分に対応する画素)が黒色になってしまいやすい。なお、図示は省略するが、例えば本実施形態とは逆に落射受光量>側射受光量として撮像を行った場合には、部品90の外形部分は写りにくく、且つ配線パターン95,96は写りやすくなる。そのため、例えば撮像された画像を2値化すると、部品90の外形部分は写らず端子93,94及び配線パターン95,96が写った画像になりやすい。 On the other hand, for example, when the incident light incident amount and the side incident light amount at the time of imaging are equal and large, the outer portion of the component 90 and the terminals 93 and 94 can be copied, but the wiring patterns 95 and 96 are also easily captured. . That is, the luminance value of the pixel corresponding to the wiring patterns 95 and 96 in the image captured by the imaging unit 51 tends to increase. Therefore, like the binary image P2 in FIG. 6, pixels corresponding to the wiring patterns 95 and 96 after binarization are likely to be white. For example, when the incident light received amount and the side received light amount are equal and small, the wiring patterns 95 and 96 can be hard to be seen, but the outer portion of the component 90 and the terminals 93 and 94 are hard to be seen. That is, the luminance value of the pixel corresponding to the outer shape portion of the component 90 and the terminals 93 and 94 in the image captured by the imaging unit 51 tends to be small. Therefore, as in the binary image P3 in FIG. 7, pixels corresponding to at least one of the outer portion of the component 90 and the terminals 93 and 94 after binarization (pixels corresponding to the outer portion of the component 90 in FIG. 7). It tends to turn black. Although illustration is omitted, for example, in contrast to the present embodiment, when imaging is performed with the incident light received amount> the side received light amount, the outer portion of the component 90 is difficult to see and the wiring patterns 95 and 96 are not shown. It becomes easy. For this reason, for example, if the captured image is binarized, the outer portion of the component 90 is not captured, and an image in which the terminals 93 and 94 and the wiring patterns 95 and 96 are captured tends to be obtained.
 以上のように、本実施形態のパーツカメラ40は、落射受光量を側射受光量よりも小さくすることで配線パターン95,96を写りにくくしつつ、主に落射用光源44からの光により端子93,94を写し、主に側射用光源47からの光により部品90の外形部分を写した画像を撮像することができる。そしてその画像を2値化することで、図5の2値画像P1のように、配線パターン95,96が写らず部品90の外形部分と端子93,94とを写した2値画像を得ることができる。 As described above, the parts camera 40 according to the present embodiment makes it difficult to capture the wiring patterns 95 and 96 by making the incident light received amount smaller than the side received light amount, and the terminal camera 40 mainly uses the light from the incident light source 44. 93 and 94 can be imaged, and an image in which the outer portion of the component 90 is mainly captured by the light from the side light source 47 can be taken. Then, by binarizing the image, a binary image obtained by copying the outer portion of the component 90 and the terminals 93 and 94 without the wiring patterns 95 and 96 appearing like the binary image P1 of FIG. Can do.
 ステップS140で部品90の2値画像を得ると、CPU61は、その2値画像に基づいて部品90に関する情報を取得する(ステップS150)。本実施形態では、CPU61は、部品90の外形、端子93,94、部品90の中心、及び部品90の向きを検出するものとした。具体的には、CPU61は、まず、2値画像に基づいて部品90の外形及び端子93,94をパターンマッチングなどにより検出する。次に、CPU61は、検出した外形に基づいて部品90の中心位置を検出する。また、CPU61は、検出した外形に基づいて切り欠き部92a,92bを検出し、これに基づいて部品90の向きを検出する。本実施形態では、上述した図5のように2値画像には配線パターン95,96が写っていない。そのため、例えば図6のように配線パターン95,96が写っている場合と比較して、ステップS150においてCPU61が配線パターン95,96を部品90の外形部分や端子93,94であると誤検出することを抑制できる。 When the binary image of the component 90 is obtained in step S140, the CPU 61 acquires information on the component 90 based on the binary image (step S150). In the present embodiment, the CPU 61 detects the outer shape of the component 90, the terminals 93 and 94, the center of the component 90, and the orientation of the component 90. Specifically, the CPU 61 first detects the outer shape of the component 90 and the terminals 93 and 94 based on the binary image by pattern matching or the like. Next, the CPU 61 detects the center position of the component 90 based on the detected outer shape. Further, the CPU 61 detects the notches 92a and 92b based on the detected outer shape, and detects the orientation of the component 90 based on this. In the present embodiment, the wiring patterns 95 and 96 are not shown in the binary image as shown in FIG. Therefore, for example, compared to the case where the wiring patterns 95 and 96 are shown in FIG. 6, the CPU 61 erroneously detects that the wiring patterns 95 and 96 are the outer portion of the component 90 and the terminals 93 and 94 in step S150. This can be suppressed.
 続いて、CPU61は、ステップS150で取得した情報に基づいて、把持部38に把持された部品90の異常の有無を判定し(ステップS160)、異常がある場合には把持部38に把持された部品90を廃棄して(ステップS170)、ステップS110以降の処理を行う。CPU61は、例えば部品90の外形の形状や端子93,94の形状に基づいて、部品90の異常の有無を判定する。ステップS160で異常がない場合には、CPU61は、ステップS150で取得した情報に基づいて、部品90の実装位置及び向きの補正量を導出する(ステップS180)。例えば、CPU61は、検出した部品90の中心位置(座標)に基づいて、部品90の基板16への実装位置の補正量を導出する。また、CPU61は、検出した部品90の向きに基づいて、部品90を基板16に実装する際に必要なQ軸モータ36の駆動量(部品90の回転量)を向きの補正量として導出する。そして、CPU61は、導出した実装位置及び向きの補正量を加味して部品90を基板16上に配置して(ステップS190)、部品実装処理ルーチンを終了する。上述したように、ステップS150においてCPU61が配線パターン95,96を部品90の外形部分や端子93,94であると誤検出することを抑制できるため、ステップS160,S180の処理についても、CPU61は精度良く行うことができる。 Subsequently, the CPU 61 determines whether there is an abnormality in the component 90 gripped by the gripping part 38 based on the information acquired in step S150 (step S160). If there is an abnormality, the CPU 61 grips the part 90. The component 90 is discarded (step S170), and the processing after step S110 is performed. The CPU 61 determines whether there is an abnormality in the component 90 based on, for example, the outer shape of the component 90 and the shapes of the terminals 93 and 94. If there is no abnormality in step S160, the CPU 61 derives a correction amount for the mounting position and orientation of the component 90 based on the information acquired in step S150 (step S180). For example, the CPU 61 derives the correction amount of the mounting position of the component 90 on the board 16 based on the detected center position (coordinates) of the component 90. Further, based on the detected orientation of the component 90, the CPU 61 derives a driving amount of the Q-axis motor 36 (amount of rotation of the component 90) necessary for mounting the component 90 on the substrate 16 as a direction correction amount. Then, the CPU 61 places the component 90 on the substrate 16 in consideration of the derived mounting position and orientation correction amount (step S190), and ends the component mounting processing routine. As described above, since the CPU 61 can be prevented from erroneously detecting the wiring patterns 95 and 96 as the outer portion of the component 90 and the terminals 93 and 94 in step S150, the CPU 61 is also accurate in the processes in steps S160 and S180. Can be done well.
 なお、CPU61は、部品90以外の部品種の部品に対して行われる部品実装処理を、図4の部品実装処理ルーチンと同様に行う。ただし、ステップS100における落射用光源及び側射用光源の制御量は、部品種毎に予め定められており、CPU61は実装対象の部品種に応じた制御量を設定する。例えば、部品90とは異なり配線パターンを有さず端子のみを有する部品種については、CPU61はステップS100でt1=t2に設定して、落射受光量=側射受光量となるようにしてもよい。また、ステップS150~S180の処理の内容も、部品種毎に予め定められており、CPU61は実装対象の部品種に応じた処理を行う。これらの部品種毎に予め定められた情報は、例えば予めHDD63に記憶されていてもよいし、生産ジョブに含まれていてもよい。 Note that the CPU 61 performs the component mounting process performed on the components of the component types other than the component 90 in the same manner as the component mounting process routine of FIG. However, the control amounts of the incident light source and the side light source in step S100 are predetermined for each component type, and the CPU 61 sets a control amount according to the component type to be mounted. For example, for a component type that does not have a wiring pattern and has only a terminal unlike the component 90, the CPU 61 may set t1 = t2 in step S100 so that the incident light received amount = the side received light amount. . The contents of the processes in steps S150 to S180 are also predetermined for each component type, and the CPU 61 performs a process according to the component type to be mounted. Information predetermined for each of these component types may be stored in advance in the HDD 63, for example, or may be included in a production job.
 ここで、本実施形態の構成要素と本発明の構成要素との対応関係を明らかにする。本実施形態のパーツカメラ40が本発明の撮像装置に相当し、撮像部51が撮像部に相当し、落射用光源44が落射用光源に相当し、側射用光源47が側射用光源に相当し、撮像制御部52が発光制御部に相当する。また、メカニカルチャック37が部品保持部に相当し、X軸スライダ26及びY軸スライダ30が移動部に相当し、コントローラ60が実装制御部に相当する。 Here, the correspondence between the components of the present embodiment and the components of the present invention will be clarified. The parts camera 40 of the present embodiment corresponds to the imaging device of the present invention, the imaging unit 51 corresponds to the imaging unit, the incident light source 44 corresponds to the incident light source, and the lateral light source 47 serves as the lateral light source. The imaging control unit 52 corresponds to the light emission control unit. The mechanical chuck 37 corresponds to a component holding unit, the X-axis slider 26 and the Y-axis slider 30 correspond to a moving unit, and the controller 60 corresponds to a mounting control unit.
 以上詳述した本実施形態の実装装置10のパーツカメラ40によれば、配線パターン95,96と表面が平坦な端子93,94とを有する部品90を撮像するにあたり、撮像制御部52は、落射受光量が側射受光量よりも小さくなるように、部品90の撮像時に落射用光源44及び側射用光源47を発光させる。これにより、配線パターン95,96を写りにくくしつつ部品90の外形部分と端子93,94とを写した画像を撮像することができる。 According to the parts camera 40 of the mounting apparatus 10 of the present embodiment described in detail above, the imaging control unit 52 reflects the incident light when imaging the component 90 having the wiring patterns 95 and 96 and the terminals 93 and 94 having flat surfaces. The incident light source 44 and the side light source 47 are caused to emit light when the component 90 is imaged so that the amount of received light is smaller than the amount of side light received. Thereby, it is possible to capture an image in which the outer portion of the component 90 and the terminals 93 and 94 are copied while making the wiring patterns 95 and 96 difficult to see.
 また、撮像制御部52は、部品90の撮像時に、落射用光源44及び側射用光源47の発光時間(t1,t2)を制御することで、落射受光量を側射受光量よりも小さくする。そのため、例えば落射用光源44及び側射用光源47に供給する電力を制御する場合と比較して、比較的容易に落射受光量と側射受光量とを制御できる。 In addition, the imaging control unit 52 controls the light emission time (t1, t2) of the incident light source 44 and the side light source 47 when imaging the component 90, thereby reducing the incident light amount to be smaller than the incident light amount. . Therefore, for example, the incident light amount and the incident light amount can be controlled relatively easily as compared with the case where the power supplied to the incident light source 44 and the side light source 47 is controlled.
 また、撮像制御部52は、画素の輝度値を2値化すると配線パターン95,96に対応する画素が輝度の小さい側に含まれ端子93,94に対応する画素及び部品90の外形部分に対応する画素が輝度の大きい側に含まれるような画像(例えば図5の2値画像P1)が得られるよう予め定められた落射受光量及び側射受光量となるように、落射用光源44及び側射用光源47を発光させる。そのため、2値化することで配線パターン95,96を写らなくすることができるような画像を撮像できる。 In addition, when the luminance value of the pixel is binarized, the imaging control unit 52 includes pixels corresponding to the wiring patterns 95 and 96 on the low luminance side, and corresponds to the pixels corresponding to the terminals 93 and 94 and the outline portion of the component 90. The epi-illumination light source 44 and the side of the epi-illumination light source 44 and the side so as to obtain predetermined epi-illumination light reception amount and side-radiation light reception amount so as to obtain an image in which the pixel to be included is included on the high luminance side (for example, the binary image P1 in FIG. 5). The projecting light source 47 emits light. Therefore, by binarizing, it is possible to capture an image that can eliminate the wiring patterns 95 and 96.
 なお、本発明は上述した実施形態に何ら限定されることはなく、本発明の技術的範囲に属する限り種々の態様で実施し得ることはいうまでもない。 It should be noted that the present invention is not limited to the above-described embodiment, and it goes without saying that the present invention can be implemented in various modes as long as it belongs to the technical scope of the present invention.
 例えば、上述した実施形態では、落射受光量及び側射受光量は、画素の輝度値を2値化すると配線パターン95,96に対応する画素が輝度の小さい側に含まれ端子93,94に対応する画素及び部品90の外形部分に対応する画素が輝度の大きい側に含まれるような画像が得られるよう予め定められていたが、これに限らず、落射受光量が側射受光量より小さければよい。例えば、撮像制御部52は、部品90の撮像時に、落射受光量が側射受光量の0.9倍以下となるように落射用光源44及び側射用光源47を発光させてもよい。こうすることで、配線パターン95,96をより確実に写りにくくすることができる。落射受光量は、側射受光量の0.8倍以下としてもよいし、0.7倍以下としてもよい。なお、落射受光量は値0でなければよいが、側射受光量の0.1倍以上としてもよい。また、落射受光量は、側射受光量の0.3倍以上としてもよいし、0.5倍以上としてもよい。 For example, in the embodiment described above, the incident light received amount and the side incident received light amount correspond to the terminals 93 and 94 when the luminance values of the pixels are binarized and the pixels corresponding to the wiring patterns 95 and 96 are included on the low luminance side. However, the present invention is not limited to this. If the incident light amount is smaller than the incident light amount, the predetermined pixels may be obtained. Good. For example, the imaging control unit 52 may cause the incident light source 44 and the incident light source 47 to emit light so that the incident light amount is 0.9 times or less of the incident light amount when the component 90 is imaged. By doing so, the wiring patterns 95 and 96 can be more reliably prevented from being captured. The incident light received amount may be 0.8 times or less of the side received light amount, or 0.7 times or less. The incident light received light amount may not be 0, but may be 0.1 times or more of the side incident light received amount. The incident light received amount may be 0.3 times or more of the side received light amount, or may be 0.5 times or more.
 あるいは、撮像制御部52は、配線パターン95,96に対応する画素の輝度値の最大値が部品90の外形部分に対応する画素の輝度値の最小値よりも小さい状態の画像が得られるよう予め定められた落射受光量及び側射受光量となるように、落射用光源44及び側射用光源47を発光させてもよい。こうすれば、部品90の外形部分と配線パターン95,96とを輝度値に基づいて容易に区別できる程度に配線パターン95,96を写りにくくした画像を撮像できる。この場合において、撮像制御部52は、配線パターン95,96に対応する画素の輝度値が全画素中で最も小さい状態の画像が得られるよう予め定められた落射受光量及び側射受光量となるように、落射用光源44及び側射用光源47を発光させてもよい。こうすれば、配線パターン95,96をさらに写りにくくした画像を撮像できる。 Alternatively, the imaging control unit 52 may obtain an image in a state where the maximum value of the luminance value of the pixels corresponding to the wiring patterns 95 and 96 is smaller than the minimum value of the luminance value of the pixels corresponding to the outer shape portion of the component 90 in advance. The incident light source 44 and the incident light source 47 may emit light so that the incident incident light amount and the incident incident light amount are set. By doing so, it is possible to capture an image in which the wiring patterns 95 and 96 are hardly captured so that the outer portion of the component 90 and the wiring patterns 95 and 96 can be easily distinguished based on the luminance value. In this case, the imaging control unit 52 has a predetermined incident light amount and incident light amount so as to obtain an image in which the luminance values of the pixels corresponding to the wiring patterns 95 and 96 are the smallest among all the pixels. As described above, the incident light source 44 and the side light source 47 may emit light. By so doing, it is possible to capture an image in which the wiring patterns 95 and 96 are more difficult to be captured.
 あるいは、撮像制御部52は、配線パターン95,96が写らず部品90の外形部分と端子93,94とを写した画像が得られるよう予め定められた落射受光量及び側射受光量となるように、落射用光源44及び側射用光源47を発光させてもよい。こうすれば、撮像の不要な配線パターン95,96が写っていない画像を得ることができる。なお、配線パターン95,96が写っていない画像とは、例えば、上述した実施形態のように配線パターン95,96に対応する画素が輝度の小さい側に含まれている2値画像としてもよいし、配線パターン95,96に対応する画素の輝度値がその周囲の画素の輝度値と同じとみなせる画像(換言すると、画像処理を行っても配線パターン95,96の画素を特定できない画像)としてもよいし、配線パターン95,96に対応する画素の輝度値が全画素中で最も小さい状態の画素としてもよいし、配線パターン95,96に対応する画素の輝度値が値0(黒)である画像としてもよい。 Alternatively, the imaging control unit 52 may have a predetermined incident light amount and side incident light amount so that the wiring patterns 95 and 96 are not captured and an image in which the outer portion of the component 90 and the terminals 93 and 94 are captured can be obtained. Further, the incident light source 44 and the side light source 47 may emit light. By doing so, it is possible to obtain an image in which the wiring patterns 95 and 96 that do not require imaging are not shown. The image in which the wiring patterns 95 and 96 are not shown may be, for example, a binary image in which pixels corresponding to the wiring patterns 95 and 96 are included on the low luminance side as in the above-described embodiment. Also, an image in which the luminance values of the pixels corresponding to the wiring patterns 95 and 96 can be regarded as the same as the luminance values of the surrounding pixels (in other words, an image in which the pixels of the wiring patterns 95 and 96 cannot be specified even if image processing is performed). Alternatively, the pixel corresponding to the wiring patterns 95 and 96 may be the pixel having the smallest luminance value among all the pixels, or the luminance value of the pixel corresponding to the wiring patterns 95 and 96 is 0 (black). It may be an image.
 上述した実施形態では、撮像制御部52は、落射発光時間t1及び側射発光時間t2を制御することで、落射受光量<側射受光量となるようにしたが、これに限られない。例えば、撮像制御部52は、落射発光時間t1及び側射発光時間t2すなわち連続的な発光時間を制御する代わりに、落射用光源44及び側射用光源47の発光時間と非発光時間とのデューティー比を制御して落射受光量<側射受光量となるようにしてもよい。すなわち、1回の撮像において落射用光源44及び側射用光源47が発光と非発光とを繰り返すこととし、撮像制御部52はこの発光と非発光との1サイクル中の発光時間の割合(=デューティー比)を制御して落射受光量<側射受光量となるようにしてもよい。あるいは、撮像制御部52は、落射用光源44及び側射用光源47に通電する電流を制御して落射受光量<側射受光量となるようにしてもよい。 In the above-described embodiment, the imaging control unit 52 controls the incident light emission time t1 and the side light emission time t2 so that the incident light reception amount is less than the side incident light reception amount, but is not limited thereto. For example, instead of controlling the incident light emission time t1 and the side light emission time t2, that is, the continuous light emission time, the imaging control unit 52 determines the duty of the light emission time and the non-light emission time of the incident light source 44 and the side light source 47. The ratio may be controlled so that the incident light received amount <the side received light amount. That is, it is assumed that the incident light source 44 and the side light source 47 repeat light emission and non-light emission in one imaging, and the imaging control unit 52 is a ratio of the light emission time in one cycle of this light emission and non-light emission (= (Duty ratio) may be controlled so that the incident light received amount <the side received light amount. Alternatively, the imaging control unit 52 may control the current supplied to the incident light source 44 and the side light source 47 so that the incident light amount <the incident light amount.
 上述した実施形態では、撮像部51が撮像する画像はグレースケール画像であり、CPU61はステップS140でこれを2値化してからステップS150で部品90に関する情報を取得したが、これに限られない。例えば、CPU61は、グレースケール画像に対してパターンマッチング又はエッジの検出などを行うことで部品90に関する情報(例えば部品90の外形の形状や端子93,94の形状)を取得してもよい。この場合でも、落射受光量<側射受光量とすることでグレースケール画像中の配線パターン95,96が写りにくくなる(配線パターン95,96に対応する画素の輝度値が小さくなる)。そのため、上述した実施形態と同様に、例えばCPU61が部品90に関する情報を取得する際の誤検出を抑制できる。なお、撮像部51が撮像する画像がカラー画像であったり2値画像であったりしてもよい。 In the above-described embodiment, the image captured by the imaging unit 51 is a grayscale image. The CPU 61 binarizes the image in step S140 and then acquires information regarding the component 90 in step S150. However, the present invention is not limited to this. For example, the CPU 61 may acquire information on the component 90 (for example, the outer shape of the component 90 and the shapes of the terminals 93 and 94) by performing pattern matching or edge detection on the grayscale image. Even in this case, by setting the incident light received amount <the side received light amount, the wiring patterns 95 and 96 in the grayscale image are hardly captured (the luminance value of the pixel corresponding to the wiring patterns 95 and 96 is small). Therefore, similarly to the above-described embodiment, for example, erroneous detection when the CPU 61 acquires information on the component 90 can be suppressed. Note that the image captured by the imaging unit 51 may be a color image or a binary image.
 上述した実施形態では、部品90を撮像する際には、撮像制御部52は側射用光源47のうち上段光源47aのみを発光させるものとしたが、特にこれに限らず、上段光源47a,中段光源47b,及び下段光源47cの少なくともいずれかを発光させればよい。ただし、光軸51aからの傾斜角が90°に近い光源を用いるほど、配線パターン95,96は写りにくくしたままで部品90の外形部分を写した画像を撮像できる傾向にある。そのため、最も傾斜角が90°に近い光源(上述した実子形態では上段光源47a)を発光させることが好ましい。 In the above-described embodiment, when imaging the component 90, the imaging control unit 52 emits only the upper light source 47a among the side light sources 47. However, the present invention is not limited to this, and the upper light source 47a and the middle light source are not particularly limited. At least one of the light source 47b and the lower light source 47c may be caused to emit light. However, the use of a light source whose inclination angle from the optical axis 51a is close to 90 ° tends to capture an image of the external part of the component 90 while the wiring patterns 95 and 96 are difficult to be seen. For this reason, it is preferable to emit light from a light source having an inclination angle closest to 90 ° (in the above-described embodiment, the upper light source 47a).
 上述した実施形態では、落射受光量が側射受光量よりも小さくなるようにして撮像を行う対象として部品90を例示したが、撮像対象の部品はこれに限られない。配線パターンと表面が平坦な端子とを有し、且つ配線パターンの検出が不要で部品の外形部分と端子とを検出する必要がある部品であれば、上述した実施形態と同様に落射受光量<側射受光量とすることで、同様の効果が得られる。例えば、撮像対象の部品が、部品90とは異なり複数の端子に極性がない部品であってもよい。また、部品90は外形部分(端子板92の下面視における縁部分)の形状が直角の角部になっていたが、これに限らず、撮像対象の部品は外形部分が面取りされているなど外形部分の形状が光軸51aから傾斜した斜面になっていてもよい。 In the above-described embodiment, the component 90 is exemplified as an object to be imaged so that the incident light received amount is smaller than the side received light amount. However, the component to be imaged is not limited to this. If the component has a wiring pattern and a terminal having a flat surface, and it is not necessary to detect the wiring pattern and it is necessary to detect the outer portion of the component and the terminal, the incident light amount < The same effect can be obtained by using the side light reception amount. For example, unlike the component 90, the component to be imaged may be a component having no polarity at a plurality of terminals. In addition, the part 90 has an outer shape (an edge portion in the bottom view of the terminal plate 92) having a right-angled corner. However, the present invention is not limited to this, and the outer shape of the component to be imaged is chamfered. The shape of the part may be a slope inclined from the optical axis 51a.
 上述した実施形態では、実装装置10は部品を把持するメカニカルチャック37を備えていたが、部品の保持が可能であればこれに限られない。例えば、実装装置10は、メカニカルチャック37に代えて、部品を吸着して保持する吸着ノズルを備えていてもよい。 In the above-described embodiment, the mounting apparatus 10 includes the mechanical chuck 37 that grips a component, but is not limited thereto as long as the component can be held. For example, the mounting apparatus 10 may include a suction nozzle that sucks and holds components instead of the mechanical chuck 37.
 上述した実施形態では、コントローラ60が落射用光源44及び側射用光源47の制御量を設定したが、これに限らず例えば撮像制御部52が決定してもよい。 In the above-described embodiment, the controller 60 sets the control amounts of the incident light source 44 and the side light source 47, but the present invention is not limited to this. For example, the imaging control unit 52 may determine the control amount.
 本発明は、部品を基板上に実装する実装装置に利用可能である。 The present invention can be used for a mounting apparatus for mounting components on a substrate.
 10 実装装置、12 基台、14 実装装置本体、16 基板、18 基板搬送装置、20 支持板、22 コンベアベルト、23 支持ピン、24 ヘッド、26 X軸スライダ、26a 駆動モータ、28 ガイドレール、30 Y軸スライダ、30a 駆動モータ、32 ガイドレール、34 Z軸モータ、35 ボールネジ、36 Q軸モータ、37 メカニカルチャック、38 把持部、39 駆動モータ、40 パーツカメラ、41 照明部、42 ハウジング、43 連結部、44 落射用光源、45 LED、46 ハーフミラー、47 側射用光源、47a 上段光源、47b 中段光源、47c 下段光源、48a~48c LED、51 撮像部、51a 光軸、52 撮像制御部、60 コントローラ、61 CPU、62 ROM、63 HDD、64 RAM、65 入出力インターフェース、66 バス、70 リールユニット、72 リール、74 フィーダ部、80 管理コンピュータ、90 部品、91 本体部、92 端子板、92a,92b 切り欠き部、93,94 端子、95,96 配線パターン、P1~P3 2値画像。 10 mounting device, 12 base, 14 mounting device body, 16 substrate, 18 substrate transport device, 20 support plate, 22 conveyor belt, 23 support pin, 24 head, 26 X axis slider, 26a drive motor, 28 guide rail, 30 Y-axis slider, 30a drive motor, 32 guide rail, 34 Z-axis motor, 35 ball screw, 36 Q-axis motor, 37 mechanical chuck, 38 gripping part, 39 drive motor, 40 parts camera, 41 illumination part, 42 housing, 43 connection Part, 44 incident light source, 45 LED, 46 half mirror, 47 side illumination light source, 47a upper stage light source, 47b middle stage light source, 47c lower stage light source, 48a to 48c LED, 51 imaging unit, 51a optical axis, 52 imaging control unit, 60 controllers, 61 PU, 62 ROM, 63 HDD, 64 RAM, 65 I / O interface, 66 bus, 70 reel unit, 72 reel, 74 feeder section, 80 management computer, 90 parts, 91 main body section, 92 terminal board, 92a, 92b cutout Part, 93, 94 terminals, 95, 96 wiring pattern, P1-P3 binary image.

Claims (4)

  1.  配線パターンと表面が平坦な端子とを有する部品を撮像する撮像装置であって、
     受光した光に基づいて前記部品を撮像する撮像部と、
     前記部品に対して前記撮像部の光軸に沿う方向に光を照射するための落射用光源と、
     前記部品に対して前記撮像部の光軸から傾斜した方向に光を照射するための側射用光源と、
     前記落射用光源から発せられ前記部品で反射して前記撮像部に受光される光の光量である落射受光量が、前記側射用光源から発せられ前記部品で反射して前記撮像部に受光される光の光量である側射受光量よりも小さくなるように、前記部品の撮像時に前記落射用光源及び前記側射用光源を発光させる発光制御部と、
     を備えた撮像装置。
    An imaging device for imaging a component having a wiring pattern and a terminal having a flat surface,
    An imaging unit that images the component based on the received light;
    An incident light source for irradiating the component with light in a direction along the optical axis of the imaging unit;
    A side-light source for irradiating the component with light in a direction inclined from the optical axis of the imaging unit;
    The incident light amount, which is the amount of light emitted from the incident light source and reflected by the component and received by the imaging unit, is emitted from the incident light source and reflected by the component and received by the imaging unit. A light emission control unit that emits the incident light source and the incident light source at the time of imaging the component, so as to be smaller than a side received light amount that is a light amount of
    An imaging apparatus comprising:
  2.  前記発光制御部は、前記部品の撮像時に、前記落射用光源及び前記側射用光源の発光時間を制御することで、前記落射受光量を前記側射受光量よりも小さくする、
     請求項1に記載の撮像装置。
    The light emission control unit makes the incident light reception amount smaller than the incident light reception amount by controlling the light emission time of the incident light source and the side light source during imaging of the component,
    The imaging device according to claim 1.
  3.  前記発光制御部は、前記部品の撮像時に、前記落射受光量が前記側射受光量の0.9倍以下となるように前記落射用光源及び前記側射用光源を発光させる、
     請求項1又は2に記載の撮像装置。
    The light emission control unit causes the incident light source and the incident light source to emit light so that the incident light amount is 0.9 times or less of the incident light amount when imaging the component.
    The imaging device according to claim 1 or 2.
  4.  請求項1~3のいずれか1項に記載の撮像装置と、
     前記部品の保持が可能な部品保持部と、
     前記部品保持部を移動させる移動部と、
     前記撮像により得られた画像に基づく処理と、前記部品保持部及び前記移動部を制御して前記部品を基板に実装する処理と、を行う実装制御部と、
     を備えた実装装置。
    The imaging apparatus according to any one of claims 1 to 3,
    A component holding unit capable of holding the component;
    A moving unit for moving the component holding unit;
    A mounting control unit that performs processing based on an image obtained by the imaging, and processing of controlling the component holding unit and the moving unit to mount the component on a substrate;
    Mounting device.
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