WO2018045814A1 - 触控结构、其测试方法、触摸屏及显示装置 - Google Patents

触控结构、其测试方法、触摸屏及显示装置 Download PDF

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Publication number
WO2018045814A1
WO2018045814A1 PCT/CN2017/092200 CN2017092200W WO2018045814A1 WO 2018045814 A1 WO2018045814 A1 WO 2018045814A1 CN 2017092200 W CN2017092200 W CN 2017092200W WO 2018045814 A1 WO2018045814 A1 WO 2018045814A1
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WO
WIPO (PCT)
Prior art keywords
lead
touch
electrically connected
electrode
sub
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
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PCT/CN2017/092200
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English (en)
French (fr)
Inventor
王准
李必生
方振中
贺晓悦
范文金
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BOE Technology Group Co Ltd
Hefei Xinsheng Optoelectronics Technology Co Ltd
Original Assignee
BOE Technology Group Co Ltd
Hefei Xinsheng Optoelectronics Technology Co Ltd
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Priority to US15/745,134 priority Critical patent/US10288655B2/en
Publication of WO2018045814A1 publication Critical patent/WO2018045814A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • G06F3/0446—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means using a grid-like structure of electrodes in at least two directions, e.g. using row and column electrodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/54—Testing for continuity
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0416—Control or interface arrangements specially adapted for digitisers
    • G06F3/04164—Connections between sensors and controllers, e.g. routing lines between electrodes and connection pads
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/045—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means using resistive elements, e.g. a single continuous surface or two parallel surfaces put in contact

Definitions

  • the present disclosure relates to the field of display technologies, and in particular, to a touch structure, a test method thereof, a touch screen, and a display device.
  • the touch screen can be divided into an add-on touch panel, an on-cell touch panel, and an in-cell touch panel. According to the working principle, the touch screen can be divided into: resistive touch screen and capacitive touch screen.
  • connection methods of the touch electrodes and the leads there are mainly three types of connection methods of the touch electrodes and the leads.
  • the first type is to lead the lead wires from the two ends of the touch electrode, and the two lead wires are respectively electrically connected to the two terminals in the binding region; the second is to lead the lead wires from the two ends of the touch electrode, respectively.
  • the two leads are electrically connected to the same terminal in the binding area, that is, the touch electrode and the two leads form a closed loop structure; the third is to lead the lead from one end of the touch electrode, the lead and the binding area
  • the terminals inside are electrically connected.
  • the touch electrodes and the leads are formed, after the touch electrodes and the leads are formed, it is necessary to test whether the touch electrodes and the leads are broken, so as to ensure the yield of the touch screen.
  • the touch electrodes and leads of the first structure are tested for breaking, the two probes can be placed at the two terminals in the binding area, and the resistance between the two probes can be judged. Whether the touch electrode and the lead wire are broken, whether the upper surface of the touch electrode is covered with an insulating layer, does not affect the open circuit test of the touch electrode and the lead wire in the first structure.
  • the resistance between the touch electrodes and the leads is determined to be open. If the upper surface of the touch electrodes is covered with an insulating layer, the probes and the touch electrodes cannot be electrically connected, that is, the second and third structures cannot be used. The touch electrodes and leads in the middle are tested for breaking.
  • the embodiments of the present disclosure provide a touch structure, a test method thereof, a touch screen, and a display device for performing a disconnection test on any touch structure.
  • the touch structure includes: a plurality of touch driving electrodes; a plurality of touch sensing electrodes, which are cross-insulated with the plurality of touch driving electrodes; a plurality of mutually insulated first leads, and the touch driving electrodes One-to-one and electrically connected; a plurality of mutually insulated second leads are in one-to-one correspondence with the touch sensing electrodes and electrically connected; a plurality of mutually insulated third leads are connected to the touch driving electrodes Correspondingly, one end of the third lead is electrically connected to the corresponding touch driving electrode, and the other end is used as a touch driving electrode test point for testing whether there is an open circuit on the corresponding touch driving electrode and the corresponding first lead; And/or a plurality of mutually insulated fourth leads are in one-to-one correspondence with the touch sensing electrodes, one end of the fourth lead is electrically connected to the corresponding touch sensing electrode, and the other end is used as a touch sensing electrode.
  • the third lead is disposed in the same layer as the touch driving electrode; except for the outermost two touch driving electrodes, The third lead corresponding to the other touch driving electrodes is located at a gap between the touch driving electrode and the adjacent touch driving electrode; the third lead corresponding to the outermost two touch driving electrodes is located at the touch driving A gap between the electrode and the adjacent touch driving electrode or a side of the touch driving electrode away from the adjacent touch driving electrode.
  • the fourth lead is disposed in the same layer as the touch sensing electrode; except for the outermost two touch sensing electrodes, the fourth lead corresponding to the other touch sensing electrodes is located at the touch sensing electrode and the adjacent touch a gap between the sensing electrodes; a fourth lead corresponding to the outermost two touch sensing electrodes is located at a gap between the touch sensing electrode and the adjacent touch sensing electrode or is located away from the touch sensing electrode One side of the adjacent touch sensing electrode.
  • the first lead includes: a first sub-lead and a second sub-lead, wherein one end of the touch driving electrode is One end of the first sub-lead of the corresponding first lead is electrically connected, and the other end of the touch driving electrode is electrically connected to one end of the second sub-lead of the corresponding first lead, the first sub-lead The other end is electrically connected to the other end of the second sub-lead and is electrically connected to the first terminal located in the binding area.
  • the second lead includes: a third sub-lead and a fourth sub-lead; wherein one end of the touch sensing electrode is One end of the third sub-lead of the corresponding second lead is electrically connected, and the other end of the touch sensing electrode is electrically connected to one end of the fourth sub-lead of the corresponding second lead, the third sub-lead The other end is electrically connected to the other end of the fourth sub-lead and is electrically connected to the second terminal located in the binding area.
  • the touch driving electrode is electrically connected from a position electrically connected to the corresponding third lead to the corresponding first sub lead
  • the resistance of the portion between the positions of the sexual connection is R1, and a portion of the touch driving electrode from a position electrically connected to the corresponding third lead to a position electrically connected to the corresponding second sub-lead
  • the resistance is R2, the resistance of the first sub-lead is R3, the resistance of the second sub-lead is R4, and R1, R2, R3 and R4 satisfy: or a resistance of a portion of the touch sensing electrode from a position electrically connected to the corresponding fourth lead to a position electrically connected to the corresponding third sub lead is R5, and the touch sensing electrode a portion of the corresponding fourth lead electrically connected to a position electrically connected to the corresponding fourth sub-lead has a resistance R6, the third sub-lead has a resistance R7, and the fourth sub-lead
  • the resistance is
  • R1, R2, R3, and R4 satisfy: or R5, R6, R7 and R8 satisfy: or
  • one end of the first lead is electrically connected to the corresponding touch driving electrode, and the other end is located in the binding area.
  • One terminal is electrically connected.
  • One end of the second lead is electrically connected to the corresponding touch sensing electrode, and the other end is electrically connected to the second connecting terminal located in the binding area.
  • the third lead is electrically connected to one end of the corresponding touch driving electrode that is not connected to the first lead.
  • the fourth lead is electrically connected to one end of the corresponding touch sensing electrode that is not connected to the second lead.
  • the touch structure further includes: an insulating layer disposed above the touch driving electrode and the touch sensing electrode.
  • the insulating layer has a via hole penetrating the insulating layer at a position corresponding to the touch driving electrode test point and/or the touch sensing electrode test point.
  • the embodiment of the present disclosure also provides a touch screen.
  • the touch screen includes the touch structure provided by the foregoing embodiments of the present disclosure.
  • An embodiment of the present disclosure also provides a display device.
  • the display device includes the touch screen provided by the above embodiments of the present disclosure.
  • the embodiment of the present disclosure further provides a testing method for the touch structure of the above embodiments.
  • the test method includes: measuring a resistance between the touch driving electrode test point and the first terminal for the touch driving electrode to determine whether there is an open circuit on the touch driving electrode and the corresponding first lead;
  • the sensing electrode measures the resistance between the touch sensing electrode test point and the second terminal to determine whether there is an open circuit on the touch sensing electrode and the corresponding second lead.
  • determining whether there is an open circuit on the touch driving electrode and the corresponding first lead comprises: measuring the resistance as R2+R4 +R9, determining that there is an open circuit in the portion between the position of the touch driving electrode from the position electrically connected to the corresponding third lead to the position electrically connected to the corresponding first sub-lead and/or the first sub-lead
  • R9 is a resistance of the third lead
  • R9 is the resistance of the third lead
  • determining whether there is an open circuit on the touch sensing electrode and the corresponding second lead comprises: measuring the resistance as R6+R8 +R10, determining that there is an open circuit in the portion between the touch sensing electrode from a position electrically connected to the corresponding fourth lead to a position electrically connected to the corresponding third sub-lead and/or the third sub-lead
  • R10 is the resistance of the fourth lead; when the measured resistance is R5+R7+R10, determining the position of the touch sensing electrode electrically connected from the corresponding fourth lead to the corresponding fourth sub-
  • R10 is the resistance of the fourth lead; when the measured resistance is abnormal, determining the fourth lead corresponding to the touch sensing electrode There is an open circuit; the measured resistance is When it is determined that there is no open circuit on the touch sensing electrode and the
  • determining whether the touch driving electrode and the corresponding first lead have an open circuit includes: determining whether the measured resistance is abnormal; If the measured resistance is abnormal, it is determined that there is an open circuit on the touch driving electrode and/or the corresponding first lead and/or the corresponding third lead. If the measured resistance is not abnormal, the touch driving electrode and the corresponding are determined. There is no open circuit on the first lead.
  • determining whether the touch sensing electrode and the corresponding second lead have an open circuit includes: determining whether the measured resistance is abnormal; If the measured resistance is abnormal, it is determined that there is an open circuit on the touch sensing electrode and/or the corresponding second lead and/or the corresponding fourth lead. If the measured resistance is not abnormal, the touch sensing electrode and the corresponding are determined. There is no open circuit on the second lead.
  • the touch control structure, the test method thereof, the touch screen and the display device are provided in the touch control structure.
  • the touch drive electrodes are used as an example to increase the plurality of mutual correspondences with the touch drive electrodes.
  • the insulated third lead, one end of each third lead is electrically connected to the corresponding touch driving electrode, and the other end is used as a test point for testing whether the corresponding touch driving electrode and the corresponding first lead have an open circuit;
  • the two probes may be respectively placed at the test point in the third lead and the first terminal in the binding area;
  • the probe needs to be electrically connected to the touch electrode. Therefore, even if the touch electrode is covered with an insulating layer, a disconnection test can be performed.
  • This solution forms a closed loop for the touch electrode and the lead and one end of the touch electrode. It is especially advantageous to draw the structure of the leads.
  • FIG. 1 is a schematic structural diagram of a touch structure according to an embodiment of the present disclosure
  • FIG. 2 is a second schematic structural diagram of a touch structure according to an embodiment of the present disclosure
  • FIG. 3 is a third schematic structural diagram of a touch structure according to an embodiment of the present disclosure.
  • FIG. 4 is an equivalent circuit diagram of the touch driving electrodes and the corresponding first and third leads in the touch structure shown in FIG. 1;
  • FIG. 5 is an equivalent circuit diagram of the touch sensing electrodes and corresponding second and fourth leads in the touch structure shown in FIG. 2;
  • FIG. 6 is an equivalent circuit diagram of the touch driving electrode and the corresponding first and third leads in the touch structure shown in FIG. 3;
  • FIG. 7 is a flowchart of a method for testing a touch structure according to an embodiment of the present disclosure.
  • FIG. 8 is a second flowchart of a method for testing a touch structure according to an embodiment of the present disclosure
  • FIG. 9 is a third flowchart of a method for testing a touch structure according to an embodiment of the present disclosure.
  • the touch structure may include: a plurality of touch driving electrodes 1 and a plurality of touch sensing electrodes 2 disposed in a cross-insulation manner, and one-to-one correspondence with each of the touch driving electrodes 1 and electrical properties. And a plurality of mutually insulated first leads 3 and a plurality of mutually insulated second leads 4 electrically connected to the touch sensing electrodes 2 in one-to-one correspondence.
  • the touch structure may further include: a plurality of mutually insulated third leads 5 corresponding to the touch driving electrodes 1 , one end of each of the third leads 5 and a corresponding one
  • the touch driving electrode 1 is electrically connected, and the other end serves as a touch driving electrode test point for testing whether there is an open circuit on the corresponding touch driving electrode 1 and the corresponding first lead 3.
  • the touch structure may further include: a plurality of mutually insulated fourth leads 6 corresponding to the touch sensing electrodes 2, one end of each of the fourth leads 6 and a corresponding one.
  • the touch sensing electrode 2 is electrically connected, and the other end serves as a touch sensing electrode test point for testing whether there is an open circuit on the corresponding touch sensing electrode 2 and the corresponding second lead 4.
  • the two probes when each touch driving driving electrode 1 and the corresponding first lead 3 shown in FIG. 1 and FIG. 3 are tested for breaking, the two probes may be respectively placed.
  • the test point in the third lead 5 corresponding to the touch driving electrode 1 and the first terminal in the binding area electrically connected to the first lead 3 are provided.
  • the two probes when performing the disconnection test on each of the touch sensing electrodes 2 and the corresponding second leads 4 as shown in FIG. 2 and FIG. 3, the two probes may be respectively placed corresponding to the touch sensing electrodes 2 A test point in the four leads 6 and a second terminal in the bonded area that is electrically connected to the second lead 4.
  • the touch driving electrode 1 shown in FIG. 1 forms a closed loop with the corresponding first lead 3, such as
  • the touch sensing electrode 2 shown in FIG. 2 forms a closed loop with the corresponding second lead 4 and leads from the one end of the touch electrode (the first lead 3 is drawn from one end of the touch driving electrode 1 as shown in FIG. 3). It is particularly advantageous to structure the second lead 4) from one end of the touch sensing electrode 2.
  • FIG. 1 only a plurality of mutually insulated third leads 5 corresponding to the touch driving electrodes 1 may be disposed.
  • FIG. 2 only a plurality of fourth leads 6 insulated from each other may be provided in one-to-one correspondence with the touch sensing electrodes 2.
  • FIG. 3 a plurality of mutually insulated third leads 5 corresponding to the touch driving electrodes 1 and a plurality of mutually insulated fourth leads corresponding to the touch sensing electrodes 2 may be disposed. 6.
  • the disclosure is not limited herein.
  • each of the third leads and each touch may be The driving electrodes are disposed in the same layer, that is, each of the third leads and each of the touch driving electrodes are formed by the same patterning process using the same material.
  • third leads corresponding to the other touch driving electrodes may be disposed at a gap between the touch driving electrodes and the adjacent touch driving electrodes. For example, as shown in FIG. 1 , the third lead 5 corresponding to the second touch driving electrode 1 is located between the second touch driving electrode 1 and the first touch driving electrode 1 in the order from left to right. The gap.
  • the third lead corresponding to the outermost two touch driving electrodes may be disposed at a gap between the touch driving electrode and the adjacent touch driving electrode.
  • the third lead corresponding to the outermost two touch driving electrodes may be disposed on a side of the touch driving electrode away from the adjacent touch driving electrodes.
  • the disclosure is not limited herein.
  • the third lead 5 corresponding to the first touch driving electrode 1 is located at a distance of the first touch driving electrode 1 away from the second touch driving electrode 1 .
  • the third lead 5 corresponding to the fourth touch driving electrode 1 is located at a gap between the fourth touch driving electrode 1 and the third touch driving electrode 1 .
  • each of the fourth leads and the touch sensing electrodes may be disposed in the same layer, that is, each of the fourth leads and each The touch sensing electrodes are formed by the same patterning process using the same material.
  • a short circuit occurs between the touch sensing electrodes, except for the outermost two touches.
  • the fourth lead corresponding to each of the other touch sensing electrodes is disposed at a gap between the touch sensing electrode and the adjacent touch sensing electrode.
  • the fourth lead 6 corresponding to the second touch sensing electrode 2 is located between the second touch sensing electrode 2 and the first touch sensing electrode 2 in the order from left to right. The gap.
  • the fourth lead corresponding to the outermost two touch sensing electrodes may be disposed at a gap between the touch sensing electrode and the adjacent touch sensing electrode.
  • the fourth lead corresponding to the outermost two touch sensing electrodes may be disposed on a side of the touch sensing electrode away from the adjacent touch sensing electrodes.
  • the disclosure is not limited herein.
  • the fourth lead 6 corresponding to the first touch sensing electrode 2 is located at a distance of the first touch sensing electrode 2 away from the second touch sensing electrode 2 in the order from left to right.
  • the fourth lead 6 corresponding to the fourth touch sensing electrode 2 is located at a gap between the fourth touch sensing electrode 2 and the third touch sensing electrode 2 .
  • each of the third leads and the touch driving electrodes may be disposed in different layers, that is, in the film layer where each third lead is located and the film layer of each touch driving electrode.
  • An insulating layer is disposed between each of the third leads and the corresponding touch driving electrode through the via hole penetrating the insulating layer.
  • each of the fourth leads and the touch sensing electrodes may be disposed in different layers, that is, an insulating layer is disposed between the film layer of each of the fourth leads and the film layer of each of the touch sensing electrodes, and each of the fourth leads and the corresponding The touch sensing electrodes are electrically connected by via holes penetrating the insulating layer.
  • the disclosure is also not limited herein.
  • the touch structure provided by the embodiment of the present disclosure may be applied to a structure in which the touch electrode and the corresponding lead wire are connected in any manner.
  • the touch structure provided by the embodiment of the present disclosure may be the structure shown in FIG. 1 to FIG.
  • each touch driving electrode 1 forms a closed loop with the corresponding first lead 3 .
  • each touch sensing electrode 2 and the corresponding second lead shape 4 are in a closed loop, such as As shown in FIG. 3, a first lead 3 is drawn from one end of each touch driving electrode 1, and a second lead 4 is taken out from one end of each touch sensing electrode 2.
  • the touch structure provided by the embodiment of the present disclosure is not limited to the structure shown in FIG.
  • connection manner of the touch electrode and the lead wire may be other types, for example, from the two ends of the touch electrode.
  • the leads are led out, and the two leads are electrically connected to the two terminals in the binding area.
  • the disclosure is not limited herein.
  • the specific implementation manners of the above-mentioned touch structures provided by the embodiments of the present disclosure when applied to the above three structures are described in detail below through three specific examples.
  • Example 1 Each touch drive electrode forms a closed loop with a corresponding first lead.
  • the first lead 3 may include a first sub-lead 31 and a second sub-lead 32.
  • One end of each touch driving electrode 1 is electrically connected to one end of the first sub-lead 31 of the corresponding first lead 3, and the other end of each touch driving electrode 1 and the corresponding first lead 3
  • One end of the second sub-lead 32 is electrically connected to the other end of the second sub-lead 32 and is electrically connected to the first terminal 8 located in the binding region 7 .
  • each touch driving electrode 1 forms a closed loop with the corresponding first lead 3.
  • the first lead 3 and the second lead 4 are generally disposed in the same layer. Therefore, in order to avoid the problem of short circuit between each of the first lead 3 and each of the second leads 4, as shown in FIG.
  • the connection between the touch sensing electrode 2 and the corresponding second lead 4 may be respectively taken out from the two ends of each touch sensing electrode 2, and the two leads drawn respectively and the two second wires in the binding area 7 respectively The structure in which the terminal 9 is electrically connected.
  • each touch sensing electrode and the corresponding second lead may also be a structure in which a lead is taken out from one end of each touch sensing electrode, and the lead wire is electrically connected to the second connecting terminal in the binding region.
  • the connection of each touch sensing electrode to the corresponding second lead may also form a closed loop structure. The disclosure is not limited herein, and it is only necessary to ensure that each of the first leads and the second leads are insulated from each other.
  • the touch structure provided by the embodiment of the present disclosure is particularly suitable for providing an insulating layer and an insulating layer and each test point (including a touch driving electrode test point and above) of each touch driving electrode and each touch sensing electrode.
  • the corresponding position of the touch sensing electrode has a through hole penetrating the insulating layer (that is, a via having an exposed test point in the insulating layer). This is because the insulating layer covers the touch driving electrodes, which may result in the first wiring in which the two probes are not respectively placed in the binding area when the touch driving electrode and the corresponding first lead are tested for disconnection.
  • the touch structure provided by the embodiment of the present disclosure adds a plurality of mutually insulated third leads that are in one-to-one correspondence with the touch driving electrodes, and one end of each of the third leads is electrically connected to the corresponding touch driving electrode. And the other end is used as a test point for testing whether the corresponding touch drive electrode and the corresponding first lead have an open circuit, and thus, each touch drive electrode and the touch control structure provided in the embodiment of the present disclosure
  • the two probes may be respectively placed at the first terminal electrically connected to the first lead and the third lead corresponding to the touch driving electrode in the binding region. At the test point in the test, by testing the resistance between the two probes, it can be determined whether there is an open circuit for each touch drive electrode and the corresponding first lead.
  • a position where the touch driving electrode 1 and the first sub lead 31 of the corresponding first lead 3 are electrically connected is denoted by A, and the touch driving electrode 1 and the corresponding first lead 3 are The position at which the second sub-lead 32 is electrically connected is denoted by B, the position at which the touch driving electrode 1 is electrically connected to the corresponding third lead 5 is denoted as C, and the test point in the third lead 5 is marked as D,
  • the position of the first terminal 8 electrically connected to the first sub-lead 31 and the second sub-lead 32 of the first lead 3 is denoted by E, assuming that each touch driving electrode 1 is electrically connected from the corresponding third lead 5
  • the resistance between each is R4, and the resistance between each of the third leads 5, that is, the resistance between C and D is R9, so that when the two probes are respectively placed at the test point D and the first terminal E,
  • the equivalent circuit diagram between the probes is shown in Figure 4.
  • each touch sensing electrode 2 and the corresponding second lead 4 are tested for breaking, and only two probes are needed.
  • the two second terminals 9 electrically connected to the second lead 4 are respectively disposed, and the resistance between the two probes can be determined to determine whether the touch sensing electrode 2 and the corresponding second lead 4 are present. Open circuit.
  • the resistance between the two probes is measured to be very large, and the result is abnormal, it is determined that there is a break point between the touch sensing electrode 2 and the corresponding second lead 4; the resistance between the two probes is measured as When the sum of the resistance of the touch sensing electrode 2 and the corresponding resistance of the second lead 4 is determined, there is no break point between the touch sensing electrode 2 and the corresponding second lead 4.
  • the position of the point can be designed to position C where the touch driving electrode is electrically connected to the corresponding third lead.
  • the sizes of R1 and R2 can be adjusted, and after the position D of the first terminal is determined, the sizes of R3 and R4 are determined, and therefore, by adjusting the position of C, it is possible to adjust the size of. Satisfied at R1, R2, R3 and R4 or At the time, it is easy to determine the position of the breakpoint in the closed loop formed by the touch driving electrode and the corresponding first lead according to the measured magnitude of the resistance R between the two probes.
  • R1, R2, R3, and R4 can satisfy: or
  • Example 2 Each touch sensing electrode forms a closed loop with a corresponding second lead.
  • each of the second leads 4 may include: a third sub-lead 41 and a fourth sub-lead 42.
  • One end of each touch sensing electrode 2 is electrically connected to one end of the third sub-lead 41 of the corresponding second lead 4, and the other end of each touch sensing electrode 2 and the corresponding second lead 4
  • One end of the fourth sub-lead 42 is electrically connected, and the other end of the third sub-lead 41 is electrically connected to the other end of the fourth sub-lead 42 and is electrically connected to the second terminal 9 located in the binding region 7 .
  • each touch sensing electrode 2 forms a closed loop with the corresponding second lead 4.
  • the third sub-lead 41 and the fourth sub-lead 42 of the second lead 4 are electrically connected to the second terminal 9 located in the binding region 7,
  • the first lead 3 and the second lead 4 are generally disposed in the same layer. Therefore, in order to avoid the problem of short circuit between each of the first lead 3 and each of the second leads 4, as shown in FIG.
  • the connection between the touch driving electrode 1 and the corresponding first lead 3 may be respectively taken out from the two ends of each touch driving electrode 1, and the two lead wires respectively lead to the two first wires in the binding region 7 respectively.
  • the structure in which the terminal 8 is electrically connected since the third sub-lead 41 and the fourth sub-lead 42 of the second lead 4 are electrically connected to the second terminal 9 located in the binding region 7,
  • the first lead 3 and the second lead 4 are generally disposed in the same layer. Therefore, in order to avoid the problem of short circuit between each of the first lead 3 and each of the second leads 4, as shown in FIG.
  • each touch driving electrode and the corresponding first lead may also be a structure in which a lead is taken out from one end of each touch driving electrode, and the lead wire is electrically connected to the first connecting terminal in the binding region.
  • the connection of each touch driving electrode to the corresponding first lead may also form a closed loop structure. The disclosure is not limited herein, and it is only necessary to ensure that each of the first leads and the second leads are insulated from each other.
  • the touch structure provided by the embodiment of the present disclosure is particularly suitable for providing an insulating layer and an insulating layer and each test point (including a touch driving electrode) above each touch driving electrode and each touch sensing electrode.
  • the corresponding position of the pilot and/or touch sensing electrode has a through hole penetrating the insulating layer (ie, a via having an exposed test point in the insulating layer). This is because the insulating layer covers the touch sensing electrodes, which may result in the second wiring in the binding area when the two touch sensing electrodes and the corresponding second lead are tested for disconnection.
  • the touch structure provided by the embodiment of the present disclosure adds a plurality of mutually insulated fourth leads corresponding to the touch sensing electrodes, and each of the fourth leads One end is electrically connected to the corresponding touch sensing electrode, and the other end is used as a test point for testing whether the corresponding touch sensing electrode and the corresponding second lead have an open circuit, in the above touch structure provided by the embodiment of the present disclosure.
  • the two probes When each touch sensing electrode and the corresponding second lead are subjected to a disconnection test, the two probes may be respectively placed at the second terminal electrically connected to the second lead in the binding region and the touch At the test point in the fourth lead corresponding to the sensing electrode, by testing the resistance between the two probes, it can be determined whether there is an open circuit for each touch sensing electrode and the corresponding second lead.
  • the position where the touch sensing electrode 2 and the third sub-lead 41 of the corresponding second lead 4 are electrically connected is denoted by F
  • the touch sensing electrode 2 and the corresponding second lead 4 are The position at which the fourth sub-lead 42 is electrically connected is denoted by G
  • the position at which the touch sensing electrode 2 is electrically connected to the corresponding fourth lead 6 is marked as H
  • the test point in the fourth lead 6 is marked as I
  • the position of the second terminal 9 electrically connected to the third sub-lead 41 and the fourth sub-lead 42 of the second lead 4 is denoted by J, assuming that each touch-sensitive electrode 2 is electrically connected to the corresponding fourth lead 6
  • the resistance between the two is R8, and the resistance between each of the fourth leads 6 and the resistance between H and I is R10, so that when the two probes are respectively placed at the test point I and the second terminal J,
  • the equivalent circuit diagram between the probes is shown in Figure 5.
  • the touch sensing electrode 2 and the corresponding second lead 4 are tested for disconnection, the following four cases may occur: when an open circuit occurs between H and I, the resistance R between the two probes measured is very high.
  • each touch driving driving electrode 1 and the corresponding first lead 3 are subjected to a disconnection test, and only two probes are needed.
  • the two first terminals 8 electrically connected to the first lead 3 are respectively disposed, and the resistance between the two probes can be measured to determine whether the touch driving electrode 1 and the corresponding first lead 3 are present. Open circuit.
  • the resistance between the two probes is measured to be very large, and the result is abnormal, it is determined that there is a break point between the touch drive electrode 1 and the corresponding first lead 3; the resistance between the two probes is measured as When the sum of the resistance of the touch driving electrode 1 and the resistance of the corresponding first lead 3 is determined, there is no break point between the touch driving electrode 1 and the corresponding first lead 3.
  • the position of the point can be designed to design the position H of the touch sensing electrode electrically connected to the corresponding fourth lead.
  • the sizes of R5 and R6 can be adjusted, and after the position I of the first terminal is determined, the sizes of R7 and R8 are determined, and therefore, by adjusting the position of H, it is possible to adjust the size of.
  • R5, R6, R7, and R8 can satisfy: or
  • Example 3 Leading a first lead from one end of each touch driving electrode, and sensing electricity from each touch One end of the pole leads to a second lead.
  • each of the first leads 3 is electrically connected to the corresponding touch driving electrode 1 and the other end is bound to
  • the first terminal 8 in the area 7 is electrically connected, that is, the connection of each touch driving electrode 1 and the corresponding first lead 3 is a structure in which a first lead 3 is drawn from each touch driving electrode 1;
  • One end of the second lead 4 is electrically connected to the corresponding touch sensing electrode 2, and the other end is electrically connected to the second terminal 9 located in the binding area 7, that is, each touch sensing electrode 2 and the corresponding second
  • the connection of the lead 4 is from each touch The electrode 2 leads to a structure of a second lead 4.
  • each of the third leads 5 can be electrically connected to one end of the corresponding touch driving electrode 1 to which the first lead 3 is not connected. That is, one end of each touch driving electrode 1 is electrically connected to the corresponding first lead 3, and the other end is electrically connected to the corresponding third lead 5, so that for each touch driving electrode 1 and corresponding
  • two probes can be placed at the first terminal 8 in the binding region 7 and at the test point in the third lead 5, respectively, by measuring the resistance between the two probes.
  • each of the fourth leads 6 is electrically connected to one end of the corresponding touch sensing electrode 2 to which the second lead 4 is not connected, that is, each strip One end of the touch sensing electrode 2 is electrically connected to the corresponding second lead 4 , and the other end is electrically connected to the corresponding fourth lead 6 , so that each touch sensing electrode 2 and the corresponding second lead 4 are performed.
  • the second and the fourth lead terminals 9 6 test points can be tested for breaking whole touch sensing electrodes 2 and the corresponding lead 4 via a second resistance between the two measuring probes.
  • the resistance is R11
  • the resistance between each of the first leads 3, that is, the resistance between K and N is R12
  • the resistance between each of the third leads 5, that is, the resistance between M and L is R9
  • the touch structure provided by the embodiment of the present disclosure is particularly suitable for providing an insulating layer and an insulating layer and each test point (including a touch driving electrode test point and above) of each touch driving electrode and each touch sensing electrode.
  • the corresponding position of the touch sensing electrode has a through hole penetrating the insulating layer (that is, a via having an exposed test point in the insulating layer). This is because the insulating layer covers the touch driving electrodes and the respective touch sensing electrodes, which may cause the two probes to be respectively placed in the binding when the touch driving electrode and the corresponding first lead are tested for disconnection.
  • the first terminal in the area and the touch driving electrode may not be placed in the second area of the binding area when the touch sensing electrode and the corresponding second lead are tested for disconnection.
  • the terminal structure and the touch sensing electrode are provided. Based on the above, the touch structure provided by the embodiment of the present disclosure increases a plurality of mutually insulated third leads and the touch sensing electrodes respectively corresponding to the touch driving electrodes.
  • One end of the plurality of mutually insulated fourth leads, one end of each of the third leads is electrically connected to the corresponding touch driving electrode, and the other end is used as a test corresponding touch driving electrode and a corresponding first lead Whether there is an open circuit test point, one end of each fourth lead is electrically connected to the corresponding touch sensing electrode, and the other end is used as a test corresponding touch sensing electrode and the corresponding second lead is There is a test point of the open circuit, so that when each touch driving electrode and the corresponding first lead in the touch structure provided by the embodiment of the present disclosure are tested for breaking, the two probes can be respectively placed in the binding area.
  • each contact can be determined by testing the resistance between the two probes And controlling the driving electrode and the corresponding first lead to have an open circuit.
  • the two probes may be separately Passing the resistance between the two probes at a second connection terminal electrically connected to the second lead in the binding area and a test point in the fourth lead corresponding to the touch sensing electrode, It can be determined whether there is an open circuit for each of the touch sensing electrodes and the corresponding second leads.
  • the embodiment of the present disclosure further provides a test method for the touch structure, as shown in FIG. 7 , including the following steps:
  • test method may be applicable to disconnecting each touch driving electrode and its lead, each touch sensing electrode and its lead in any touch structure.
  • the method is particularly suitable for forming a closed loop for each touch driving electrode and its lead, and/or forming a closed loop for each touch sensing electrode and its lead, and each touch driving electrode and each touch sensing electrode
  • the structure covered with the insulating layer is tested for breaking; it is also particularly suitable for drawing leads from one end of each touch driving electrode, and/or leading the lead from one end of each touch sensing electrode, and each touch driving electrode
  • a disconnection test is performed on a structure in which an insulating layer is overlaid on each of the touch sensing electrodes.
  • step S701 and the execution of step S702 are not in the order.
  • Step S701 may be performed first, and then step S702 may be performed; or step S702 may be performed first, and then step S701 is performed.
  • the disclosure is not limited herein.
  • step S701 in the foregoing testing method provided by the embodiment of the present disclosure may be specifically implemented in the following manner:
  • a portion of the touch driving electrode from a position electrically connected to the corresponding third lead to a position electrically connected to the corresponding second sub-lead is determined. / or there is an open circuit on the second sub-lead, wherein R9 is the resistance of the third lead;
  • the measured resistance is When it is determined that there is no open circuit on the touch driving electrode and the corresponding first lead, wherein R9 is the resistance of the third lead.
  • step S702 in the foregoing testing method provided by the embodiment of the present disclosure may be specifically implemented in the following manner:
  • a part of the touch sensing electrode from a position electrically connected to the corresponding fourth lead to a position electrically connected to the corresponding third sub-lead is determined. / or there is an open circuit on the third sub-lead, wherein R10 is the resistance of the fourth lead;
  • a part of the touch sensing electrode from a position electrically connected to the corresponding fourth lead to a position electrically connected to the corresponding fourth sub-lead is determined. / or there is an open circuit on the fourth sub-lead, wherein R10 is the resistance of the fourth lead;
  • the measured resistance is When it is determined that there is no open circuit on the touch sensing electrode and the corresponding second lead, wherein R10 is the power of the fourth lead.
  • the step S701 in the foregoing testing method provided by the embodiment of the present disclosure may specifically include the following steps:
  • step S801 determining whether the measured resistance is abnormal; if yes, proceeding to step S802; if not, executing step S803;
  • step S702 in the foregoing testing method provided by the embodiment of the present disclosure may specifically include the following steps:
  • step S901 determining whether the measured resistance is abnormal; if yes, proceeding to step S902; if not, executing step S903;
  • the embodiment of the present disclosure further provides a touch screen, which includes the above-mentioned touch structure provided by the embodiment of the present disclosure.
  • a touch screen which includes the above-mentioned touch structure provided by the embodiment of the present disclosure.
  • the touch screen refer to the embodiment of the touch structure, and details are not described herein again.
  • the touch screen provided by the embodiment of the present disclosure may be an add on mode touch panel, or may be an On Cell Touch Panel, or may be embedded. In Cell Touch Panel.
  • the disclosure is not limited herein.
  • the embodiment of the present disclosure further provides a display device, which includes the above touch screen provided by the embodiment of the present disclosure, and the display device may be: a mobile phone, a tablet computer, a television, a display, a notebook computer, a digital photo frame, and a navigator. Any product or part that has a display function.
  • the display device reference may be made to the embodiment of the touch screen described above, and the repeated description is omitted.
  • a touch structure, a test method thereof, a touch screen and a display device are provided in the embodiment of the present disclosure.
  • a touch drive electrode is taken as an example, and a plurality of pieces corresponding to the touch drive electrodes are added.
  • a third lead insulated from each other, one end of each third lead is electrically connected to a corresponding touch driving electrode, and One end is used as a test point for testing whether the corresponding touch drive electrode and the corresponding first lead have an open circuit; thus, when each touch drive electrode and the corresponding first lead are tested for breaking, two probes can be used.
  • the pins are respectively placed at the test points in the third lead and the first terminals in the binding area; since the probes are not required to be electrically connected to the touch electrodes, even if the touch electrodes are covered with an insulating layer, A disconnect test can be performed. This is especially beneficial for structures where the touch electrodes and leads are closed loops and leads are drawn from one end of the touch electrodes.

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Abstract

一种触控结构、其测试方法、触摸屏及显示装置，在该触控结构中，以触控驱动电极（1）为例，增加设置与各触控驱动电极（1）一一对应的多条相互绝缘的第三引线（5），每条第三引线（5）的一端与对应的触控驱动电极（1）电性连接，另一端用于作为测试对应的触控驱动电极（1）和对应的第一引线（3）是否存在断路的测试点；在对每条触控驱动电极（1）和对应的第一引线（3）进行断路测试时，可以将两个探针分别置于第三引线（5）中的测试点和绑定区域内的第一接线端子处（8）。由于不需要将探针与触控电极电性连接，所以即使触控电极的上方覆盖有绝缘层，也可以进行断路测试，对于触控电极与引线形成闭合回路以及从触控电极的一端引出引线的结构而言尤其有益。

Description

触控结构、其测试方法、触摸屏及显示装置
相关申请的交叉引用
本申请要求于2016年9月12日提交的、申请号为201610819343.X的中国专利申请的优先权，其全部内容通过引用并入本申请中。
技术领域
本公开涉及显示技术领域，尤其涉及一种触控结构、其测试方法、触摸屏及显示装置。
背景技术
触摸屏按照组成结构可以分为：外挂式触摸屏(Add on Mode Touch Panel)、覆盖表面式触摸屏(On Cell Touch Panel)以及内嵌式触摸屏(In Cell Touch Panel)。触摸屏按照工作原理可以分为：电阻式触摸屏和电容式触摸屏等。
在常规的触摸屏中，触控电极与引线的连接方式主要有以下三种类型。第一种是从触控电极的两端分别引出引线，这两条引线分别与绑定区域内的两个接线端子电性连接；第二种是从触控电极的两端分别引出引线，这两条引线与绑定区域内的同一个接线端子电性连接，即触控电极与这两条引线形成闭合回路结构；第三种是从触控电极的一端引出引线，该引线与绑定区域内的接线端子电性连接。
在触摸屏的制作过程中，在形成触控电极和引线之后，需要测试触控电极和引线是否发生断路，以保证触摸屏的良率。在对第一种结构中的触控电极和引线进行断路测试时，可以将两个探针分别置于绑定区域内的两个接线端子处，通过测试两个探针之间的电阻来判断触控电极和引线是否存在断路，无论触控电极的上方是否覆盖有绝缘层，都不会影响对第一种结构中的触控电极和引线进行断路测试。在对第二种和第三种结构中的触控电极和引线进行断路测试时，需要将两个探针分别置于触控电极和绑定区域内的接线端子处，通过测试两个探针之间的电阻来判断触控电极和引线是否存在断路，若触控电极的上方覆盖有绝缘层，则无法将探针与触控电极电性连接，即无法对第二种和第三种结构中的触控电极和引线进行断路测试。
发明内容
有鉴于此，本公开实施例提供了一种触控结构、其测试方法、触摸屏及显示装置，用以能够对任何一种触控结构进行断路测试。
因此，本公开实施例提供了一种触控结构。所述触控结构包括：多条触控驱动电极；多条触控感应电极，与所述多条触控驱动电极交叉绝缘设置；多条相互绝缘的第一引线，与所述触控驱动电极一一对应且电性连接；多条相互绝缘的第二引线，与所述触控感应电极一一对应且电性连接；多条相互绝缘的第三引线，与所述触控驱动电极一一对应，所述第三引线的一端与对应的触控驱动电极电性连接，另一端作为触控驱动电极测试点，用于测试对应的触控驱动电极和对应的第一引线上是否存在断路；和/或，多条相互绝缘的第四引线，与所述触控感应电极一一对应，所述第四引线的一端与对应的触控感应电极电性连接，另一端作为触控感应电极测试点，用于测试对应的触控感应电极和对应的第二引线上是否存在断路。
在一种可能的实现方式中，在本公开实施例提供的上述触控结构中，所述第三引线与所述触控驱动电极同层设置；除最外侧的两条触控驱动电极以外，其他触控驱动电极对应的第三引线位于该触控驱动电极与相邻的触控驱动电极之间的间隙处；最外侧的两条触控驱动电极所对应的第三引线位于该触控驱动电极与相邻的触控驱动电极之间的间隙处或位于该触控驱动电极远离相邻的触控驱动电极的一侧。所述第四引线与所述触控感应电极同层设置；除最外侧的两条触控感应电极以外，其他触控感应电极对应的第四引线位于该触控感应电极与相邻的触控感应电极之间的间隙处；最外侧的两条触控感应电极所对应的第四引线位于该触控感应电极与相邻的触控感应电极之间的间隙处或位于该触控感应电极远离相邻的触控感应电极的一侧。
在一种可能的实现方式中，在本公开实施例提供的上述触控结构中，所述第一引线包括：第一子引线和第二子引线，其中，所述触控驱动电极的一端与对应的第一引线中的第一子引线的一端电性连接，所述触控驱动电极的另一端与对应的第一引线中的第二子引线的一端电性连接，所述第一子引线的另一端与所述第二子引线的另一端电性连接且均与位于绑定区域内的第一接线端子电性连接。所述第二引线包括：第三子引线和第四子引线；其中，所述触控感应电极的一端与 对应的第二引线中的第三子引线的一端电性连接，所述触控感应电极的另一端与对应的第二引线中的第四子引线的一端电性连接，所述第三子引线的另一端与所述第四子引线的另一端电性连接且均与位于绑定区域内的第二接线端子电性连接。
在一种可能的实现方式中，在本公开实施例提供的上述触控结构中，所述触控驱动电极中从与对应的第三引线电性连接的位置到与对应的第一子引线电性连接的位置之间的部分的电阻为R1，所述触控驱动电极中从与对应的第三引线电性连接的位置到与对应的第二子引线电性连接的位置之间的部分的电阻为R2，所述第一子引线的电阻为R3，所述第二子引线的电阻为R4，以及R1、R2、R3和R4满足：
Figure PCTCN2017092200-appb-000001
或
Figure PCTCN2017092200-appb-000002
所述触控感应电极中从与对应的第四引线电性连接的位置到与对应的第三子引线电性连接的位置之间的部分的电阻为R5，所述触控感应电极中从与对应的第四引线电性连接的位置到与对应的第四子引线电性连接的位置之间的部分的电阻为R6，所述第三子引线的电阻为R7，所述第四子引线的电阻为R8，以及R5、R6、R7和R8满足：
Figure PCTCN2017092200-appb-000003
或
Figure PCTCN2017092200-appb-000004
在一种可能的实现方式中，在本公开实施例提供的上述触控结构中，R1、R2、R3和R4满足：
Figure PCTCN2017092200-appb-000005
或
Figure PCTCN2017092200-appb-000006
R5、R6、R7和R8满足：
Figure PCTCN2017092200-appb-000007
或
Figure PCTCN2017092200-appb-000008
在一种可能的实现方式中，在本公开实施例提供的上述触控结构中，所述第一引线的一端与对应的触控驱动电极电性连接，另一端与位于绑定区域内的第一接线端子电性连接。所述第二引线的一端与对应的触控感应电极电性连接，另一端与位于绑定区域内的第二接线端子电性连接。
在一种可能的实现方式中，在本公开实施例提供的上述触控结构中，所述第三引线与对应的触控驱动电极中未连接所述第一引线的一端电性连接。所述第四引线与对应的触控感应电极中未连接所述第二引线的一端电性连接。
在一种可能的实现方式中，在本公开实施例提供的上述触控结构中，所述触控结构还包括：绝缘层，位于所述触控驱动电极和所述触控感应电极上方。所述绝缘层在与所述触控驱动电极测试点和/或所述触控感应电极测试点对应的位置处具有贯穿所述绝缘层的过孔。
本公开实施例还提供了一种触摸屏。所述触摸屏包括：本公开上述各实施例提供的触控结构。
本公开实施例还提供了一种显示装置。所述显示装置包括：本公开上述各实施例提供的触摸屏。
本公开实施例还提供了一种针对上述各实施例的触控结构的测试方法。所述测试方法包括：针对触控驱动电极，测量触控驱动电极测试点与第一接线端子之间的电阻，以确定该触控驱动电极和对应的第一引线上是否存在断路；针对触控感应电极，测量触控感应电极测试点与第二接线端子之间的电阻，以确定该触控感应电极和对应的第二引线上是否存在断路。
在一种可能的实现方式中，在本公开实施例提供的上述测试方法中，所述确定该触控驱动电极和对应的第一引线上是否存在断路包括：在测量出的电阻为R2+R4+R9时，确定该触控驱动电极中从与对应的第三引线电性连接的位置到与对应的第一子引线电性连接的位置之间的部分和/或第一子引线上存在断路，其中，R9为第三引线的电阻；在测量出的电阻为R1+R3+R9时，确定该触控驱动电极中从与对应的第三引线电性连接的位置到与对应的第二子引线电性连接的位置之间的部分和/或第二子引线上存在断路，其中，R9为第三引线的电阻；在测量出的电阻异常时，确定该触控驱动电极对应的第三引线上存在断路；在测量出的电阻为
Figure PCTCN2017092200-appb-000009
时，确定该触控驱动电极和对应的第一引线上不存在断路，其中，R9为第三引线的电阻。
在一种可能的实现方式中，在本公开实施例提供的上述测试方法中，所述确定该触控感应电极和对应的第二引线上是否存在断路包括：在测量出的电阻为R6+R8+R10时，确定该触控感应电极中从与对应的第四引线电性连接的位置到与对应的第三子引线电性连接的位置之间的部分和/或第三子引线上存在断路，其中，R10为第四引线的电阻；在测量出的电阻为R5+R7+R10时，确定该触控感应电极中从与对应的第四引线电性连接的位置到与对应的第四子引线电性连接的位置之间的部分和/或第四子引线上存在断路，其中，R10为第四引线的电阻；在测量出的电阻异常时，确定该触控感应电极对应的第四引线上存在断路；在测量出的电阻为
Figure PCTCN2017092200-appb-000010
时，确定该触控感应电极和对应的第二引线上不存在断路，其中，R10为第四引线的电阻。
在一种可能的实现方式中，在本公开实施例提供的上述测试方法中，所述确定该触控驱动电极和对应的第一引线上是否存在断路包括：确定测量出的电阻是否异常；如果测量出的电阻异常，则确定该触控驱动电极和/或对应的第一引线和/或对应的第三引线上存在断路，如果测量出的电阻不异常，则确定该触控驱动电极和对应的第一引线上不存在断路。
在一种可能的实现方式中，在本公开实施例提供的上述测试方法中，所述确定该触控感应电极和对应的第二引线上是否存在断路包括：确定测量出的电阻是否异常；如果测量出的电阻异常，则确定该触控感应电极和/或对应的第二引线和/或对应的第四引线上存在断路，如果测量出的电阻不异常，则确定该触控感应电极和对应的第二引线上不存在断路。
本公开实施例提供的上述触控结构、其测试方法、触摸屏及显示装置，在该触控结构中，以触控驱动电极为例，增加设置与各触控驱动电极一一对应的多条相互绝缘的第三引线，每条第三引线的一端与对应的触控驱动电极电性连接，另一端用于作为测试对应的触控驱动电极和对应的第一引线是否存在断路的测试点；这样，在对每条触控驱动电极和对应的第一引线进行断路测试时，可以将两个探针分别置于第三引线中的测试点和绑定区域内的第一接线端子处；由于不需要将探针与触控电极电性连接，所以，即使触控电极的上方覆盖有绝缘层，也可以进行断路测试，这一方案对于触控电极与引线形成闭合回路以及从触控电极的一端引出引线的结构而言尤其有益。
附图说明
图1为本公开实施例提供的触控结构的结构示意图之一；
图2为本公开实施例提供的触控结构的结构示意图之二；
图3为本公开实施例提供的触控结构的结构示意图之三；
图4为图1所示的触控结构中的触控驱动电极与对应的第一引线和第三引线的等效电路图；
图5为图2所示的触控结构中的触控感应电极与对应的第二引线和第四引线的等效电路图；
图6为图3所示的触控结构中的触控驱动电极与对应的第一引线和第三引线的等效电路图；
图7为本公开实施例提供的触控结构的测试方法的流程图之一；
图8为本公开实施例提供的触控结构的测试方法的流程图之二；
图9为本公开实施例提供的触控结构的测试方法的流程图之三。
具体实施方式
下面结合附图，对本公开实施例提供的触控结构、其测试方法、触摸屏及显示装置的具体实施方式进行详细地说明。
附图中各部件的形状和尺寸不反映其真实比例，目的只是示意说明本公开的内容。
本公开实施例提供的一种触控结构。如图1-图3所示，所述触控结构可以包括：交叉绝缘设置的多条触控驱动电极1和多条触控感应电极2、与各触控驱动电极1一一对应且电性连接的多条相互绝缘的第一引线3以及与各触控感应电极2一一对应且电性连接的多条相互绝缘的第二引线4。
如图1和图3所示，所述触控结构还可包括：与各触控驱动电极1一一对应的多条相互绝缘的第三引线5，每条第三引线5的一端与对应的触控驱动电极1电性连接，另一端作为触控驱动电极测试点，用于测试对应的触控驱动电极1和对应的第一引线3上是否存在断路。
如图2和图3所示，所述触控结构还可包括：与各触控感应电极2一一对应的多条相互绝缘的第四引线6，每条第四引线6的一端与对应的触控感应电极2电性连接，另一端作为触控感应电极测试点，用于测试对应的触控感应电极2和对应的第二引线4上是否存在断路。
本公开实施例提供的上述触控结构，在对如图1和图3所示的每条触控驱动电极1和对应的第一引线3进行断路测试时，可以将两个探针分别置于触控驱动电极1对应的第三引线5中的测试点和绑定区域内的与第一引线3电性连接的第一接线端子处。类似地，在对如图2和图3所示的每条触控感应电极2和对应的第二引线4进行断路测试时，可以将两个探针分别置于触控感应电极2对应的第四引线6中的测试点和绑定区域内的与第二引线4电性连接的第二接线端子处。由于不需要将探针与触控电极电性连接，所以即使触控电极的上方覆盖有绝缘层，也可以对触控电极及其引线进行断路测试，这一点对于触控电极与引线形成闭合回路(如图1所示的触控驱动电极1与对应的第一引线3形成闭合回路，如 图2所示的触控感应电极2与对应的第二引线4形成闭合回路)以及从触控电极的一端引出引线(如图3所示的从触控驱动电极1的一端引出第一引线3，从触控感应电极2的一端引出第二引线4)的结构而言尤其有益。
需要说明的是，在本公开实施例提供的上述触控结构中，如图1所示，可以仅设置与各触控驱动电极1一一对应的多条相互绝缘的第三引线5。或者，如图2所示，可以仅设置与各触控感应电极2一一对应的多条相互绝缘的第四引线6。或者，如图3所示，可以设置与各触控驱动电极1一一对应的多条相互绝缘的第三引线5以及与各触控感应电极2一一对应的多条相互绝缘的第四引线6。本公开在此不做限定。
优选地，在本公开实施例提供的上述触控结构中，为了避免在触控结构的形成过程中增加掩模次数，避免增加触控结构的制作工艺，可以将各第三引线与各触控驱动电极同层设置，即各第三引线与各触控驱动电极是采用相同的材料通过同一次构图工艺形成的。此时，为了避免各第三引线与除对应的触控驱动电极以外的其他触控驱动电极之间电性连接而导致各触控驱动电极之间发生短路的问题，除最外侧的两条触控驱动电极以外，可以将其他各触控驱动电极对应的第三引线设置于该触控驱动电极与相邻的触控驱动电极之间的间隙处。例如，如图1所示，按照从左至右的顺序，第二条触控驱动电极1对应的第三引线5位于第二条触控驱动电极1与第一条触控驱动电极1之间的间隙处。
可以将最外侧的两条触控驱动电极对应的第三引线设置于该触控驱动电极与相邻的触控驱动电极之间的间隙处。或者，也可以将最外侧的两条触控驱动电极对应的第三引线设置于该触控驱动电极远离相邻的触控驱动电极的一侧。本公开在此不做限定。例如，如图1所示，按照从左至右的顺序，第一条触控驱动电极1对应的第三引线5位于第一条触控驱动电极1远离第二条触控驱动电极1的一侧，最后一条触控驱动电极1即第四条触控驱动电极1对应的第三引线5位于第四触控驱动电极1与第三触控驱动电极1之间的间隙处。
同理，为了避免在触控结构的形成过程中增加掩模次数，避免增加触控结构的制作工艺，可以将各第四引线与各触控感应电极同层设置，即各第四引线与各触控感应电极是采用相同的材料通过同一次构图工艺形成的。此时，为了避免各第四引线与除对应的触控感应电极以外的其他触控感应电极之间电性连接而导致各触控感应电极之间发生短路的问题，除最外侧的两条触控感应电极以外，可 以将其他各触控感应电极对应的第四引线设置于该触控感应电极与相邻的触控感应电极之间的间隙处。例如，如图2所示，按照从左至右的顺序，第二条触控感应电极2对应的第四引线6位于第二条触控感应电极2与第一条触控感应电极2之间的间隙处。
可以将最外侧的两条触控感应电极对应的第四引线设置于该触控感应电极与相邻的触控感应电极之间的间隙处。或者，也可以将最外侧的两条触控感应电极对应的第四引线设置于该触控感应电极远离相邻的触控感应电极的一侧。本公开在此不做限定。例如，如图2所示，按照从左至右的顺序，第一条触控感应电极2对应的第四引线6位于第一条触控感应电极2远离第二条触控感应电极2的一侧，最后一条触控感应电极2即第四条触控感应电极2对应的第四引线6位于第四触控感应电极2与第三触控感应电极2之间的间隙处。
当然，在本公开实施例提供的上述触控结构中，也可以将各第三引线与各触控驱动电极异层设置，即在各第三引线所在膜层与各触控驱动电极所在膜层之间设置有绝缘层，各第三引线与对应的触控驱动电极通过贯穿绝缘层的过孔电性连接。类似地，可以将各第四引线与各触控感应电极异层设置，即在各第四引线所在膜层与各触控感应电极所在膜层之间设置有绝缘层，各第四引线与对应的触控感应电极通过贯穿绝缘层的过孔电性连接。本公开在此同样不做限定。
在具体实施时，本公开实施例提供的上述触控结构可以适用于触控电极与对应的引线采用任何一种连接方式的结构。优选地，本公开实施例提供的上述触控结构可以为如图1-图3所示的结构。如图1所示，每条触控驱动电极1与对应的第一引线3形成闭合回路，如图2所示，每条触控感应电极2与对应的第二引线形4成闭合回路，如图3所示，从每条触控驱动电极1的一端引出一条第一引线3，从每条触控感应电极2的一端引出一条第二引线4。当然，本公开实施例提供的上述触控结构并非局限于如图1-图3所示的结构，触控电极与引线的连接方式还可以为其他类型，例如，从触控电极的两端分别引出引线，这两条引线分别与绑定区域内的两个接线端子电性连接。本公开在此不做限定。下面通过三个具体的实例对本公开实施例提供的上述触控结构分别应用于上述三种结构时的具体实施方式进行详细说明。
实例一：每条触控驱动电极与对应的第一引线形成闭合回路。
在具体实施时，在本公开实施例提供的上述触控结构中，如图1所示，每条 第一引线3可以包括：第一子引线31和第二子引线32。其中，每条触控驱动电极1的一端与对应的第一引线3中的第一子引线31的一端电性连接，每条触控驱动电极1的另一端与对应的第一引线3中的第二子引线32的一端电性连接，第一子引线31的另一端与第二子引线32的另一端电性连接且均与位于绑定区域7内的第一接线端子8电性连接。这样，每条触控驱动电极1与对应的第一引线3形成闭合回路。
需要说明的是，在如图1所示的触控结构中，由于第一引线3中的第一子引线31与第二子引线32均与位于绑定区域7内的第一接线端子8电性连接，而各第一引线3与各第二引线4一般同层设置，因此，为了避免各第一引线3与各第二引线4之间发生短路的问题，如图1所示，每条触控感应电极2与对应的第二引线4的连接可以为从每条触控感应电极2的两端分别引出引线，且引出的两条引线分别与绑定区域7内的两个第二接线端子9电性连接的结构。当然，每条触控感应电极与对应的第二引线的连接也可以为从每条触控感应电极的一端引出引线，且引出的引线与绑定区域内的第二接线端子电性连接的结构。或者，每条触控感应电极与对应的第二引线的连接还可以形成闭合回路的结构。本公开在此不做限定，只需保证各第一引线与各第二引线之间相互绝缘即可。
优选地，本公开实施例提供的上述触控结构尤其适用于在各触控驱动电极和各触控感应电极的上方设置有绝缘层且绝缘层与各测试点(包括触控驱动电极测试点和/或触控感应电极)对应的位置具有贯穿绝缘层的过孔(即绝缘层中具有露出各测试点的过孔)的情况。这是由于绝缘层覆盖各触控驱动电极，会导致在对每条触控驱动电极和对应的第一引线进行断路测试时，不能将两个探针分别置于绑定区域内的第一接线端子处和触控驱动电极处。基于此，本公开实施例提供的上述触控结构，增加设置与各触控驱动电极一一对应的多条相互绝缘的第三引线，每条第三引线的一端与对应的触控驱动电极电性连接，另一端用于作为测试对应的触控驱动电极和对应的第一引线是否存在断路的测试点，这样，在对本公开实施例提供的上述触控结构中的每条触控驱动电极和对应的第一引线进行断路测试时，可以将两个探针分别置于绑定区域内的与该第一引线电性连接的第一接线端子处和与该触控驱动电极对应的第三引线中的测试点处，通过测试两个探针之间的电阻，可以确定每条触控驱动电极和对应的第一引线是否存在断路。
下面针对对本公开实施例提供的上述触控结构中的每条触控驱动电极和对 应的第一引线进行断路测试的原理进行详细说明。如图1所示，将触控驱动电极1与对应的第一引线3中的第一子引线31电性连接的位置标记为A，将触控驱动电极1与对应的第一引线3中的第二子引线32电性连接的位置标记为B，将触控驱动电极1与对应的第三引线5电性连接的位置标记为C，将第三引线5中的测试点标记为D，将与第一引线3中的第一子引线31和第二子引线32电性连接的第一接线端子8的位置标记为E，假设每条触控驱动电极1从与对应的第三引线5电性连接的位置到与对应的第一子引线31电性连接的位置之间的电阻即触控驱动电极1从C到A之间的电阻为R1，每条触控驱动电极1从与对应的第三引线5电性连接的位置到与对应的第二子引线32电性连接的位置之间的电阻即触控驱动电极从C与B之间的电阻为R2，每条第一子引线31的电阻即第一引线3从A到E之间的电阻为R3，每条第二子引线32的电阻即第一引线3从B到E之间的电阻为R4，每条第三引线5的电阻即C与D之间的电阻为R9，这样，在将两个探针分别置于测试点D处和第一接线端子E处时，两个探针之间的等效电路图如图4所示。在对触控驱动电极1和对应的第一引线3进行断路测试时，可能会出现如下四种情况：当C与D之间出现断路时，测量出的两个探针之间的电阻R非常大，结果异常；当B与C之间出现断路或者B与E之间出现断路时，测量出的两个探针之间的电阻R＝R1+R3+R9；当A与C之间出现断路或者A与E之间出现断路时，测量出的两个探针之间的电阻R＝R2+R4+R9；当不存在断路时，测量出的两个探针之间的电阻
Figure PCTCN2017092200-appb-000011
因此，通过测量两个探针之间的电阻R即可确定触控驱动电极与对应的第一引线形成的闭合回路中是否存在断路以及断点的位置。
需要说明的是，在本公开实施例提供的上述触控结构中，如图1所示，对每条触控感应电极2和对应的第二引线4进行断路测试，只需将两个探针分别置于与第二引线4电性连接的两个第二接线端子9处即可，通过测量两个探针之间的电阻即可确定触控感应电极2与对应的第二引线4是否存在断路。在测量出两个探针之间的电阻非常大，结果异常时，则确定触控感应电极2与对应的第二引线4之间存在断点；在测量出两个探针之间的电阻为触控感应电极2的电阻和对应的第二引线4的电阻之和时，则确定触控感应电极2与对应的第二引线4之间不存在断点。
优选地，在本公开实施例提供的上述触控结构中，为了便于通过测量出的两 个探针之间的电阻的大小确定触控驱动电极与对应的第一引线形成的闭合回路中的断点的位置，可以设计触控驱动电极与对应的第三引线电性连接的位置C。具体地，通过调整C的位置，可以调整R1和R2的大小，并且，在第一接线端子的位置D确定后，R3和R4的大小确定，因此，通过调整C的位置，可以调整
Figure PCTCN2017092200-appb-000012
的大小。在R1、R2、R3和R4满足
Figure PCTCN2017092200-appb-000013
或
Figure PCTCN2017092200-appb-000014
时，很容易根据测量出的两个探针之间的电阻R的大小，确定触控驱动电极与对应的第一引线形成的闭合回路中的断点的位置。
优选地，在本公开实施例提供的上述触控结构中，R1、R2、R3和R4可以满足：
Figure PCTCN2017092200-appb-000015
或
Figure PCTCN2017092200-appb-000016
实例二：每条触控感应电极与对应的第二引线形成闭合回路。
在具体实施时，在本公开实施例提供的上述触控结构中，如图2所示，每条第二引线4可以包括：第三子引线41和第四子引线42。其中，每条触控感应电极2的一端与对应的第二引线4中的第三子引线41的一端电性连接，每条触控感应电极2的另一端与对应的第二引线4中的第四子引线42的一端电性连接，第三子引线41的另一端与第四子引线42的另一端电性连接且均与位于绑定区域7内的第二接线端子9电性连接。这样，每条触控感应电极2与对应的第二引线4形成闭合回路。
需要说明的是，在如图2所示的触控结构中，由于第二引线4中的第三子引线41与第四子引线42均与位于绑定区域7内的第二接线端子9电性连接，而各第一引线3与各第二引线4一般同层设置，因此，为了避免各第一引线3与各第二引线4之间发生短路的问题，如图2所示，每条触控驱动电极1与对应的第一引线3的连接可以为从每条触控驱动电极1的两端分别引出引线，且引出的两条引线分别与绑定区域7内的两个第一接线端子8电性连接的结构。当然，每条触控驱动电极与对应的第一引线的连接也可以为从每条触控驱动电极的一端引出引线，且引出的引线与绑定区域内的第一接线端子电性连接的结构。或者，每条触控驱动电极与对应的第一引线的连接还可以形成闭合回路的结构。本公开在此不做限定，只需保证各第一引线与各第二引线之间相互绝缘即可。
优选地，本公开实施例提供的上述触控结构尤其适用于在各触控驱动电极和各触控感应电极的上方设置有绝缘层且绝缘层与各测试点(包括触控驱动电极测 试点和/或触控感应电极)对应的位置具有贯穿绝缘层的过孔(即绝缘层中具有露出各测试点的过孔)的情况。这是由于绝缘层覆盖各触控感应电极，会导致在对每条触控感应电极和对应的第二引线进行断路测试时，不能将两个探针分别置于绑定区域内的第二接线端子处和触控感应电极处；基于此，本公开实施例提供的上述触控结构，增加设置与各触控感应电极一一对应的多条相互绝缘的第四引线，每条第四引线的一端与对应的触控感应电极电性连接，另一端用于作为测试对应的触控感应电极和对应的第二引线是否存在断路的测试点，在对本公开实施例提供的上述触控结构中的每条触控感应电极和对应的第二引线进行断路测试时，可以将两个探针分别置于绑定区域内的与该第二引线电性连接的第二接线端子处和与该触控感应电极对应的第四引线中的测试点处，通过测试两个探针之间的电阻，可以确定每条触控感应电极和对应的第二引线是否存在断路。
下面针对对本公开实施例提供的上述触控结构中的每条触控感应电极和对应的第二引线进行断路测试的原理进行详细说明。如图2所示，将触控感应电极2与对应的第二引线4中的第三子引线41电性连接的位置标记为F，将触控感应电极2与对应的第二引线4中的第四子引线42电性连接的位置标记为G，将触控感应电极2与对应的第四引线6电性连接的位置标记为H，将第四引线6中的测试点标记为I，将与第二引线4中的第三子引线41和第四子引线42电性连接的第二接线端子9的位置标记为J，假设每条触控感应电极2从与对应的第四引线6电性连接的位置到与对应的第三子引线41电性连接的位置之间的电阻即触控感应电极2从H到F之间的电阻为R5，每条触控感应电极2从与对应的第四引线6电性连接的位置到与对应的第四子引线42电性连接的位置之间的电阻即触控感应电极从H与G之间的电阻为R6，每条第三子引线41的电阻即第二引线4从F到J之间的电阻为R7，每条第四子引线42的电阻即第二引线4从G到J之间的电阻为R8，每条第四引线6的电阻即H与I之间的电阻为R10，这样，在将两个探针分别置于测试点I处和第二接线端子J处时，两个探针之间的等效电路图如图5所示。在对触控感应电极2和对应的第二引线4进行断路测试时，可能会出现如下四种情况：当H与I之间出现断路时，测量出的两个探针之间的电阻R非常大，结果异常；当G与H之间出现断路或者G与J之间出现断路时，测量出的两个探针之间的电阻R＝R5+R7+R10；当F与H之间出现断路或者F与J之间出现断路时，测量出的两个探针之间的电阻R＝R6+R8+R10；当不存在断 路时，测量出的两个探针之间的电阻
Figure PCTCN2017092200-appb-000017
因此，通过测量两个探针之间的电阻R即可确定触控感应电极与对应的第二引线形成的闭合回路中是否存在断路以及断点的位置。
需要说明的是，在本公开实施例提供的上述触控结构中，如图2所示，对每条触控驱动电极1和对应的第一引线3进行断路测试，只需将两个探针分别置于与第一引线3电性连接的两个第一接线端子8处即可，通过测量两个探针之间的电阻即可确定触控驱动电极1与对应的第一引线3是否存在断路。在测量出两个探针之间的电阻非常大，结果异常时，则确定触控驱动电极1与对应的第一引线3之间存在断点；在测量出两个探针之间的电阻为触控驱动电极1的电阻和对应的第一引线3的电阻之和时，则确定触控驱动电极1与对应的第一引线3之间不存在断点。
优选地，在本公开实施例提供的上述触控结构中，为了便于通过测量出的两个探针之间的电阻的大小确定触控感应电极与对应的第二引线形成的闭合回路中的断点的位置，可以设计触控感应电极与对应的第四引线电性连接的位置H。具体地，通过调整H的位置，可以调整R5和R6的大小，并且，在第一接线端子的位置I确定后，R7和R8的大小确定，因此，通过调整H的位置，可以调整
Figure PCTCN2017092200-appb-000018
的大小。在R5、R6、R7和R8满足：
Figure PCTCN2017092200-appb-000019
或
Figure PCTCN2017092200-appb-000020
时，很容易根据测量出的两个探针之间的电阻R的大小，确定触控感应电极与对应的第二引线形成的闭合回路中的断点的位置。
优选地，在本公开实施例提供的上述触控结构中，R5、R6、R7和R8可以满足：
Figure PCTCN2017092200-appb-000021
或
Figure PCTCN2017092200-appb-000022
实例三：从每条触控驱动电极的一端引出一条第一引线，从每条触控感应电 极的一端引出一条第二引线。
在具体实施时，在本公开实施例提供的上述触控结构中，如图3所示，每条第一引线3的一端与对应的触控驱动电极1电性连接，另一端与位于绑定区域7内的第一接线端子8电性连接，即每条触控驱动电极1与对应的第一引线3的连接为从每条触控驱动电极1引出一条第一引线3的结构；每条第二引线4的一端与对应的触控感应电极2电性连接，另一端与位于绑定区域7内的第二接线端子9电性连接，即每条触控感应电极2与对应的第二引线4的连接为从每条触控感 应电极2引出一条第二引线4的结构。
在具体实施时，在本公开实施例提供的上述触控结构中，如图3所示，每条第三引线5可以与对应的触控驱动电极1未连接第一引线3的一端电性连接，即每条触控驱动电极1的一端与对应的第一引线3电性连接，另一端与对应的第三引线5电性连接，这样，在对每条触控驱动电极1和对应的第一引线3进行断路测试时，可以将两个探针分别置于绑定区域7内的第一接线端子8处和第三引线5中的测试点处，通过测量两个探针之间的电阻，能够对整条触控驱动电极1和对应的第一引线3进行断路测试；每条第四引线6与对应的触控感应电极2未连接第二引线4的一端电性连接，即每条触控感应电极2的一端与对应的第二引线4电性连接，另一端与对应的第四引线6电性连接，这样，在对每条触控感应电极2和对应的第二引线4进行断路测试时，可以将两个探针分别置于绑定区域7内的第二接线端子9处和第四引线6中的测试点处，通过测量两个探针之间的电阻，能够对整条触控感应电极2和对应的第二引线4进行断路测试。
下面针对对本公开实施例提供的上述触控结构中的每条触控驱动电极和对应的第一引线进行断路测试的原理进行详细说明。如图3所示，将触控驱动电极1与对应的第一引线3电性连接的位置标记为K，将触控驱动电极1与对应的第三引线5电性连接的位置标记为L，将第三引线5中的测试点标记为M，将与第一引线3电性连接的第一接线端子8的位置标记为N，假设每条触控驱动电极1的电阻即K与L之间的电阻为R11，每条第一引线3的电阻即K与N之间的电阻为R12，每条第三引线5的电阻即M与L之间的电阻为R9，这样，在将两个探针分别置于测试点M处和第一接线端子N处时，两个探针之间的等效电路图如图6所示。在对触控驱动电极1和对应的第一引线3进行断路测试时，可能会出现如下两种情况：当M与L之间出现断路或L与K之间出现断路(即触控驱动电极中存在断点)或K与N之间出现断路(即第一引线中存在断点)时，测量出的两个探针之间的电阻R非常大，结果异常；当不存在断路时，测量出的两个探针之间的电阻R＝R9+R11+R12。因此，通过测量两个探针之间的电阻R即可确定触控驱动电极与对应的第一引线是否存在断路以及断点的位置。
需要说明的是，对本公开实施例提供的上述触控结构中的每条触控感应电极和对应的第二引线进行断路测试的原理与上述对每条触控驱动电极和对应的第一引线进行断路测试的原理类似，重复之处不再赘述。
优选地，本公开实施例提供的上述触控结构尤其适用于在各触控驱动电极和各触控感应电极的上方设置有绝缘层且绝缘层与各测试点(包括触控驱动电极测试点和/或触控感应电极)对应的位置具有贯穿绝缘层的过孔(即绝缘层中具有露出各测试点的过孔)的情况。这是由于绝缘层覆盖各触控驱动电极和各触控感应电极，会导致在对每条触控驱动电极和对应的第一引线进行断路测试时，不能将两个探针分别置于绑定区域内的第一接线端子处和触控驱动电极处，在对每条触控感应电极和对应的第二引线进行断路测试时，不能将两个探针分别置于绑定区域内的第二接线端子处和触控感应电极处；基于此，本公开实施例提供的上述触控结构，增加设置与各触控驱动电极一一对应的多条相互绝缘的第三引线以及与各触控感应电极一一对应的多条相互绝缘的第四引线，每条第三引线的一端与对应的触控驱动电极电性连接，另一端用于作为测试对应的触控驱动电极和对应的第一引线是否存在断路的测试点，每条第四引线的一端与对应的触控感应电极电性连接，另一端用于作为测试对应的触控感应电极和对应的第二引线是否存在断路的测试点，这样，在对本公开实施例提供的上述触控结构中的每条触控驱动电极和对应的第一引线进行断路测试时，可以将两个探针分别置于绑定区域内的与该第一引线电性连接的第一接线端子处和与该触控驱动电极对应的第三引线中的测试点处，通过测试两个探针之间的电阻，可以确定每条触控驱动电极和对应的第一引线是否存在断路，在对本公开实施例提供的上述触控结构中的每条触控感应电极和对应的第二引线进行断路测试时，可以将两个探针分别置于绑定区域内的与该第二引线电性连接的第二接线端子处和与该触控感应电极对应的第四引线中的测试点处，通过测试两个探针之间的电阻，可以确定每条触控感应电极和对应的第二引线是否存在断路。
针对本公开实施例提供的上述触控结构，本公开实施例还提供了一种触控结构的测试方法，如图7所示，包括如下步骤：
S701、针对触控驱动电极，测量触控驱动电极测试点与第一接线端子之间的电阻，以确定该触控驱动电极和对应的第一引线上是否存在断路；
S702、针对触控感应电极，测量触控感应电极测试点与第二接线端子之间的电阻，以确定该触控感应电极和对应的第二引线上是否存在断路。
需要说明的是，本公开实施例提供的上述测试方法可以适用于对任何一种触控结构中的每条触控驱动电极及其引线、每条触控感应电极及其引线进行断路测 试。优选地，尤其适用于对每条触控驱动电极及其引线形成闭合回路，和/或，每条触控感应电极及其引线形成闭合回路，且各触控驱动电极和各触控感应电极的上方覆盖有绝缘层的结构进行断路测试；也特别适用于对从每条触控驱动电极的一端引出引线，和/或，从每条触控感应电极的一端引出引线，且各触控驱动电极和各触控感应电极的上方覆盖有绝缘层的结构进行断路测试。
在具体实施时，在本公开实施例提供的上述测试方法中，步骤S701的执行与步骤S702的执行没有先后顺序。可以先执行步骤S701，再执行步骤S702；或者，也可以先执行步骤S702，再执行步骤S701。本公开在此不做限定。
在具体实施时，本公开实施例提供的上述测试方法中的步骤S701具体可以通过以下方式实现：
在测量出的电阻为R2+R4+R9时，确定该触控驱动电极中从与对应的第三引线电性连接的位置到与对应的第一子引线电性连接的位置之间的部分和/或第一子引线上存在断路，其中，R9为第三引线的电阻；
在测量出的电阻为R1+R3+R9时，确定该触控驱动电极中从与对应的第三引线电性连接的位置到与对应的第二子引线电性连接的位置之间的部分和/或第二子引线上存在断路，其中，R9为第三引线的电阻；
在测量出的电阻异常时，确定该触控驱动电极对应的第三引线上存在断路；
在测量出的电阻为
Figure PCTCN2017092200-appb-000023
时，确定该触控驱动电极和对应的第一引线上不存在断路，其中，R9为第三引线的电阻。
在具体实施时，本公开实施例提供的上述测试方法中的步骤S702具体可以通过以下方式实现：
在测量出的电阻为R6+R8+R10时，确定该触控感应电极中从与对应的第四引线电性连接的位置到与对应的第三子引线电性连接的位置之间的部分和/或第三子引线上存在断路，其中，R10为第四引线的电阻；
在测量出的电阻为R5+R7+R10时，确定该触控感应电极中从与对应的第四引线电性连接的位置到与对应的第四子引线电性连接的位置之间的部分和/或第四子引线上存在断路，其中，R10为第四引线的电阻；
在测量出的电阻异常时，确定该触控感应电极对应的第四引线上存在断路；
在测量出的电阻为
Figure PCTCN2017092200-appb-000024
时，确定该触控感应电极和对 应的第二引线上不存在断路，其中，R10为第四引线的电。
在具体实施时，如图8所示，本公开实施例提供的上述测试方法中的步骤S701具体可以包括如下步骤：
S801、确定测量出的电阻是否异常；若是，则执行步骤S802；若否，则执行步骤S803；
S802、确定该触控驱动电极和/或对应的第一引线和/或对应的第三引线存在断路；
S803、确定该触控驱动电极和对应的第一引线不存在断路。
在具体实施时，如图9所示，本公开实施例提供的上述测试方法中的步骤S702具体可以包括如下步骤：
S901、确定测量出的电阻是否异常；若是，则执行步骤S902；若否，则执行步骤S903；
S902、确定该触控感应电极和/或对应的第二引线和/或对应的第四引线存在断路；
S903、确定该触控感应电极和对应的第二引线不存在断路。
需要说明的是，本公开实施例提供的上述测试方法的具体实施可以参见本公开实施例提供的上述触控结构的实施例，重复之处不再赘述。
基于同一构思，本公开实施例还提供了一种触摸屏，包括本公开实施例提供的上述触控结构，该触摸屏的实施可以参见上述触控结构的实施例，重复之处不再赘述。
在具体实施时，本公开实施例提供的上述触摸屏，可以为外挂式触摸屏(Add on Mode Touch Panel)；或者，也可以为覆盖表面式触摸屏(On Cell Touch Panel)，或者，还可以为内嵌式触摸屏(In Cell Touch Panel)。本公开在此不做限定。
基于同一构思，本公开实施例还提供了一种显示装置，包括本公开实施例提供的上述触摸屏，该显示装置可以为：手机、平板电脑、电视机、显示器、笔记本电脑、数码相框、导航仪等任何具有显示功能的产品或部件。该显示装置的实施可以参见上述触摸屏的实施例，重复之处不再赘述。
本公开实施例提供的一种触控结构、其测试方法、触摸屏及显示装置，在该触控结构中，以触控驱动电极为例，增加设置与各触控驱动电极一一对应的多条相互绝缘的第三引线，每条第三引线的一端与对应的触控驱动电极电性连接，另 一端用于作为测试对应的触控驱动电极和对应的第一引线是否存在断路的测试点；这样，在对每条触控驱动电极和对应的第一引线进行断路测试时，可以将两个探针分别置于第三引线中的测试点和绑定区域内的第一接线端子处；由于不需要将探针与触控电极电性连接，所以即使触控电极的上方覆盖有绝缘层，也可以进行断路测试。这一点对于触控电极与引线形成闭合回路以及从触控电极的一端引出引线的结构而言尤其有益。
显然，本领域的技术人员可以对本公开进行各种改动和变型而不脱离本公开的精神和范围。这样，倘若本公开的这些修改和变型属于本公开权利要求及其等同技术的范围之内，则本公开也意图包含这些改动和变型在内。

Claims (15)

  1. 一种触控结构，包括：
    多条触控驱动电极；
    多条触控感应电极，与所述多条触控驱动电极交叉绝缘设置；
    多条相互绝缘的第一引线，与所述触控驱动电极一一对应且电性连接；
    多条相互绝缘的第二引线，与所述触控感应电极一一对应且电性连接；
    多条相互绝缘的第三引线，与所述触控驱动电极一一对应，所述第三引线的一端与对应的触控驱动电极电性连接，另一端作为触控驱动电极测试点，用于测试对应的触控驱动电极和对应的第一引线上是否存在断路；和/或，
    多条相互绝缘的第四引线，与所述触控感应电极一一对应，所述第四引线的一端与对应的触控感应电极电性连接，另一端作为触控感应电极测试点，用于测试对应的触控感应电极和对应的第二引线上是否存在断路。
  2. 如权利要求1所述的触控结构，其中，
    所述第三引线与所述触控驱动电极同层设置；除最外侧的两条触控驱动电极以外，其他触控驱动电极对应的第三引线位于该触控驱动电极与相邻的触控驱动电极之间的间隙处；最外侧的两条触控驱动电极所对应的第三引线位于该触控驱动电极与相邻的触控驱动电极之间的间隙处或位于该触控驱动电极远离相邻的触控驱动电极的一侧；
    所述第四引线与所述触控感应电极同层设置；除最外侧的两条触控感应电极以外，其他触控感应电极对应的第四引线位于该触控感应电极与相邻的触控感应电极之间的间隙处；最外侧的两条触控感应电极所对应的第四引线位于该触控感应电极与相邻的触控感应电极之间的间隙处或位于该触控感应电极远离相邻的触控感应电极的一侧。
  3. 如权利要求1所述的触控结构，其中，
    所述第一引线包括：第一子引线和第二子引线，其中，所述触控驱动电极的一端与对应的第一引线中的第一子引线的一端电性连接，所述触控驱动电极的另一端与对应的第一引线中的第二子引线的一端电性连接，所述第一子引线的另一端与所述第二子引线的另一端电性连接且均与位于绑定区域内的第一接线端子电性连接；和/或，
    所述第二引线包括：第三子引线和第四子引线；其中，所述触控感应电极的一端与对应的第二引线中的第三子引线的一端电性连接，所述触控感应电极的另一端与对应的第二引线中的第四子引线的一端电性连接，所述第三子引线的另一端与所述第四子引线的另一端电性连接且均与位于绑定区域内的第二接线端子电性连接。
  4. 如权利要求3所述的触控结构，其中，
    所述触控驱动电极中从与对应的第三引线电性连接的位置到与对应的第一子引线电性连接的位置之间的部分的电阻为R1，所述触控驱动电极中从与对应的第三引线电性连接的位置到与对应的第二子引线电性连接的位置之间的部分的电阻为R2，所述第一子引线的电阻为R3，所述第二子引线的电阻为R4，
    R1、R2、R3和R4满足：
    Figure PCTCN2017092200-appb-100001
    或
    Figure PCTCN2017092200-appb-100002
    所述触控感应电极中从与对应的第四引线电性连接的位置到与对应的第三子引线电性连接的位置之间的部分的电阻为R5，所述触控感应电极中从与对应的第四引线电性连接的位置到与对应的第四子引线电性连接的位置之间的部分的电阻为R6，所述第三子引线的电阻为R7，所述第四子引线的电阻为R8，
    R5、R6、R7和R8满足：
    Figure PCTCN2017092200-appb-100003
    或
    Figure PCTCN2017092200-appb-100004
  5. 如权利要求4所述的触控结构，其中，
    R1、R2、R3和R4满足：
    Figure PCTCN2017092200-appb-100005
    或
    Figure PCTCN2017092200-appb-100006
    R5、R6、R7和R8满足：
    Figure PCTCN2017092200-appb-100007
    或
    Figure PCTCN2017092200-appb-100008
  6. 如权利要求1所述的触控结构，其中，
    所述第一引线的一端与对应的触控驱动电极电性连接，另一端与位于绑定区域内的第一接线端子电性连接；和/或，
    所述第二引线的一端与对应的触控感应电极电性连接，另一端与位于绑定区域内的第二接线端子电性连接。
  7. 如权利要求6所述的触控结构，其中，
    所述第三引线与对应的触控驱动电极中未连接所述第一引线的一端电性连接；
    所述第四引线与对应的触控感应电极中未连接所述第二引线的一端电性连接。
  8. 如权利要求1-7任一项所述的触控结构，还包括：绝缘层，位于所述触控驱动电极和所述触控感应电极上方，
    所述绝缘层在与所述触控驱动电极测试点和/或所述触控感应电极测试点对应的位置处具有贯穿所述绝缘层的过孔。
  9. 一种触摸屏，包括如权利要求1-8中任一项所述的触控结构。
  10. 一种显示装置，包括如权利要求9所述的触摸屏。
  11. 一种如权利要求1-8中任一所述的触控结构的测试方法，包括：
    针对触控驱动电极，测量触控驱动电极测试点与第一接线端子之间的电阻，以确定该触控驱动电极和对应的第一引线上是否存在断路；
    针对触控感应电极，测量触控感应电极测试点与第二接线端子之间的电阻，以确定该触控感应电极和对应的第二引线上是否存在断路。
  12. 如权利要求11所述的测试方法，其中，所述确定该触控驱动电极和对应的第一引线上是否存在断路包括：
    在测量出的电阻为R2+R4+R9时，确定该触控驱动电极中从与对应的第三引线电性连接的位置到与对应的第一子引线电性连接的位置之间的部分和/或第一子引线上存在断路，其中，R9为第三引线的电阻；
    在测量出的电阻为R1+R3+R9时，确定该触控驱动电极中从与对应的第三引线电性连接的位置到与对应的第二子引线电性连接的位置之间的部分和/或第二子引线上存在断路，其中，R9为第三引线的电阻；
    在测量出的电阻异常时，确定该触控驱动电极对应的第三引线上存在断路；
    在测量出的电阻为
    Figure PCTCN2017092200-appb-100009
    时，确定该触控驱动电极和对应的第一引线上不存在断路，其中，R9为第三引线的电阻。
  13. 如权利要求11所述的测试方法，其中，所述确定该触控感应电极和对应的第二引线上是否存在断路包括：
    在测量出的电阻为R6+R8+R10时，确定该触控感应电极中从与对应的第四引线电性连接的位置到与对应的第三子引线电性连接的位置之间的部分和/或第三子引线上存在断路，其中，R10为第四引线的电阻；
    在测量出的电阻为R5+R7+R10时，确定该触控感应电极中从与对应的第四引线电性连接的位置到与对应的第四子引线电性连接的位置之间的部分和/或第四子引线上存在断路，其中，R10为第四引线的电阻；
    在测量出的电阻异常时，确定该触控感应电极对应的第四引线上存在断路；
    在测量出的电阻为
    Figure PCTCN2017092200-appb-100010
    时，确定该触控感应电极和对应的第二引线上不存在断路，其中，R10为第四引线的电阻。
  14. 如权利要求11所述的测试方法，其中，所述确定该触控驱动电极和对应的第一引线上是否存在断路包括：
    确定测量出的电阻是否异常；
    如果测量出的电阻异常，则确定该触控驱动电极和/或对应的第一引线和/或对应的第三引线上存在断路，
    如果测量出的电阻不异常，则确定该触控驱动电极和对应的第一引线上不存在断路。
  15. 如权利要求11所述的测试方法，其中，所述确定该触控感应电极和对应的第二引线上是否存在断路包括：
    确定测量出的电阻是否异常；
    如果测量出的电阻异常，则确定该触控感应电极和/或对应的第二引线和/或对应的第四引线上存在断路，
    如果测量出的电阻不异常，则确定该触控感应电极和对应的第二引线上不存在断路。
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