WO2018016278A1 - Procédé de mesure et d'analyse d'onde élastique et dispositif de mesure et d'analyse d'onde élastique - Google Patents

Procédé de mesure et d'analyse d'onde élastique et dispositif de mesure et d'analyse d'onde élastique Download PDF

Info

Publication number
WO2018016278A1
WO2018016278A1 PCT/JP2017/023698 JP2017023698W WO2018016278A1 WO 2018016278 A1 WO2018016278 A1 WO 2018016278A1 JP 2017023698 W JP2017023698 W JP 2017023698W WO 2018016278 A1 WO2018016278 A1 WO 2018016278A1
Authority
WO
WIPO (PCT)
Prior art keywords
waveform signal
elastic wave
analysis
measurement
waveform
Prior art date
Application number
PCT/JP2017/023698
Other languages
English (en)
Japanese (ja)
Inventor
裕久 溝田
永島　良昭
和之 中畑
Original Assignee
株式会社日立製作所
国立大学法人愛媛大学
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社日立製作所, 国立大学法人愛媛大学 filed Critical 株式会社日立製作所
Priority to JP2018528466A priority Critical patent/JP6744919B2/ja
Publication of WO2018016278A1 publication Critical patent/WO2018016278A1/fr

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/14—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object using acoustic emission techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor

Definitions

  • the present invention relates to a non-destructive inspection technique, and in particular, a method for measuring and analyzing an elastic wave emitted from an object to be inspected by acoustic emission and locating the source of the elastic wave, and an elastic wave for implementing the method
  • the present invention relates to a measurement / analysis apparatus.
  • UT is an inspection method in which an ultrasonic wave (for example, 1 to 5 MHz) is incident on a probe to be inspected with a probe containing a transducer, and the reflected wave (echo) is received by the probe.
  • an ultrasonic wave for example, 1 to 5 MHz
  • the incident wave is reflected on the back surface of the object to be inspected, and if there is a scratch inside the object to be inspected, an echo is generated at the scratch, so the reception of the echo is analyzed.
  • the presence or location of scratches can be inspected by imaging.
  • Patent Document 1 discloses a first flaw detection image from an ultrasonic waveform recorded by transmission and reception of ultrasonic waves in an ultrasonic flaw detection inspection method that inspects an object to be inspected using ultrasonic waves.
  • an ultrasonic flaw detection inspection method characterized by comprising:
  • the AE method detects and processes an elastic wave (for example, several kHz to several MHz) emitted when a subject is deformed or cracked by a sensor installed on the surface of the subject.
  • This is a technique for detecting the state (friction, deformation, damage) of the object to be inspected.
  • Piezoelectric elements such as lead zirconate titanate (PZT), lithium tantalate (LT), and lithium niobate (LN) are often used as sensors to detect acoustic waves emitted by AE (also called AE waves). .
  • Patent Document 2 Japanese Patent Application Laid-Open No. 2003-232782 discloses a defect site detection apparatus using an acoustic emission method in which sound generated at a defect site of an object to be inspected is detected by a sensor installed on the outer surface of the object to be inspected. By extracting the highest frequency component that can be extracted from the original waveform of the sound detected by the sensor using a time-frequency analysis in a certain frequency band, and then sequentially extracting the frequency component in a lower frequency band.
  • a time-frequency analysis unit that separates waveforms
  • an analysis waveform storage unit that stores a waveform of each frequency band component that has been waveform-separated by the time-frequency analysis unit, and a waveform of each frequency band component that is stored in the analysis waveform storage unit
  • An arithmetic unit that reads the propagation time of the sensor and calculates a distance between the sensor and the defective portion serving as a sound source based on the difference in the propagation time and the propagation speed in each frequency band.
  • Defective portion detecting apparatus using the acoustic emission method is characterized by comprising a waveform analyzer which is disclosed. Further, it is disclosed that a sensor is installed at least at three locations on the outer surface of the object to be inspected, and the defect portion of the object to be inspected is located based on the distance between the defect portion serving as a sound source and each sensor. ing.
  • Patent Document 1 in the ultrasonic flaw detection inspection of an inspection object, even if the inspection object is a non-homogeneous material having acoustic anisotropy, the defect position is accurately performed and the inspection time is shortened. It is supposed to be possible.
  • the ultrasonic flaw detection (UT) is an active inspection method in which an ultrasonic wave is intentionally incident on the inspection object and the echo is observed, periodic inspection of the inspection object (for example, once) / Year), but has a weak point that it is not suitable for constant observation of the object to be inspected.
  • the acoustic emission (AE) method is an inspection method that passively detects elastic waves (AE waves) emitted by the subject itself, and is therefore suitable for continuous observation of the subject.
  • AE waves elastic waves
  • the progress of deformation and microscopic destruction of the inspected object can be observed in substantially real time.
  • Patent Document 2 it is possible to perform frequency analysis without losing information on the time axis, and to clarify the position information of the defective part of the inspection object.
  • a method in which a threshold value is provided for the peak value of the AE wave and the characteristic value of the AE wave stronger than the threshold value is recorded.
  • the characteristic values of AE waves mainly include peak value (for example, maximum amplitude value), reception time, duration, ring-down count (number of vibrations exceeding the threshold within the duration), rise time (threshold value). (Elapsed time from exceeding the maximum amplitude), wave number, number of events, etc. are recorded.
  • the accuracy in positioning the defective site can be further increased by installing sensors at three or more locations on the inspection object.
  • it can be said that it is preferable to install three or more AE sensors on the object to be inspected in order to improve the accuracy of locating the AE wave generation source.
  • AE measuring instruments including AE sensors are a kind of industrial products and are also used for long-term monitoring, so of course, regular maintenance is necessary and accidental failures may occur. There is also sex. That is, in some AE sensors, it is conceivable that a non-measurable time zone occurs or erroneous AE wave measurement is performed (as a result, erroneous AE wave data is transmitted). There is a concern that such erroneous AE wave data may lead to an erroneous result when analyzing and locating the AE wave source.
  • Patent Document 2 the occurrence of an accidental error of the AE sensor (accordingly, incorrect AE wave data) is not assumed. For this reason, there is no teaching or suggestion about how to deal with or accidental errors in the AE sensor.
  • an object of the present invention is to accurately determine the position of an AE wave generation source even when an accidental error occurs in a part of a plurality of AE sensors in an AE wave measurement and analysis method.
  • An object of the present invention is to provide an elastic wave measurement and analysis method that can be performed, and an elastic wave measurement and analysis apparatus for performing the method.
  • the present invention can add the following improvements and changes to the elastic wave measurement and analysis method (I).
  • the predetermined error signal is a blank signal or an upper limit signal of the measurement range of the sensor.
  • the method further includes a sensor sorting step for sorting the plurality of sensors into active sensors and inactive sensors.
  • the method further includes an inactive sensor starting step for bringing all of the inactive sensors into an active state when the elastic wave having a predetermined characteristic value is measured by any of the active sensors.
  • the predetermined characteristic value is set by a peak value of the waveform signal.
  • the stored waveform signal data is scanned every unit measurement time, and the waveform signal stored in the unit measurement time is used for propagation analysis.
  • Vii In order to reduce the data amount of the stored waveform signal, the analysis result of the back propagation analysis step is scanned for each unit measurement time, and the waveform signal used for the analysis is the position where the elastic wave is generated.
  • An analysis result determination step for determining whether or not the waveform signal contributes to the rating Saved data deletion that deletes the saved data within the width of the unit measurement time when it is determined that the waveform signal of the scanned unit measurement time includes only the waveform signal that has not contributed to the position evaluation of the elastic wave generation A step.
  • Another aspect of the present invention is an apparatus for measuring and analyzing an elastic wave emitted from an object to be inspected and locating a source of the elastic wave, A plurality of sensors for receiving the elastic wave signal; An elastic wave measuring unit for measuring the received waveform signal; A waveform signal storage unit for storing the measured waveform signal; A waveform signal processor for reading and processing the stored waveform signal; An input / output unit that inputs measurement conditions and processing conditions of the waveform signal and outputs an input value of the conditions and an analysis result in the waveform signal processing unit, and The elastic wave measurement unit stores the waveform signal in which the waveform signal memory mechanism that temporarily stores all of the received waveform signals and the waveform signal that is stored with the unit measurement time defined by the measurement condition as one unit.
  • the waveform signal processing unit scans the waveform signal in the read time domain by scanning a waveform signal reading mechanism that reads a time domain including a waveform signal to be used for propagation analysis from the stored waveform signal.
  • a read waveform signal determination mechanism for determining whether or not the error signal is included, and a recording time portion of the predetermined error signal when it is determined that the predetermined error signal is included in the scanned waveform signal.
  • An elastic wave measuring and analyzing apparatus characterized by having:
  • the present invention can add the following improvements and changes to the elastic wave measurement and analysis apparatus (II).
  • the predetermined error signal is a blank signal or a signal at the upper limit of the measurement range of the sensor.
  • the acoustic wave measurement unit further includes a recording sensor control mechanism that sorts the plurality of sensors into active sensors and inactive sensors in order to suppress the data amount of the waveform signal to be stored.
  • the recording sensor control mechanism further has a function of controlling all of the inactive sensors to an active state when the elastic wave having a predetermined characteristic value is measured by any of the active sensors. Have.
  • the measurement time control mechanism includes the unit measurement time including the control and the unit measurement time immediately before the unit measurement time. It further has a function of additionally transferring a waveform signal measured by an inactive sensor and stored in the waveform signal memory mechanism to the waveform signal storage unit.
  • the predetermined characteristic value is a peak value of the waveform signal input and set by the input / output unit.
  • the waveform signal processing unit scans the stored waveform signal data every unit measurement time to reduce the data amount of the stored waveform signal, and stores the waveform signal in the unit measurement time.
  • the waveform signal processing unit scans the analysis result by the back propagation analysis mechanism every unit measurement time in order to reduce the data amount of the stored waveform signal, and the waveform used for the analysis It is determined whether or not the signal is a waveform signal that contributed to the position evaluation of the elastic wave generation, and the waveform signal of the scanned unit measurement time includes only the waveform signal that did not contribute to the position evaluation of the elastic wave generation. If it is determined that the stored data is deleted within the range of the unit measurement time, an analysis result determination / data deletion mechanism is further included.
  • the elastic wave generation source is located. It is possible to provide an elastic wave measurement and analysis method that is performed with high accuracy, and an elastic wave measurement and analysis device that implements the method.
  • FIG. 1A shows an example of a sudden AE waveform
  • FIG. 1B shows an example of a continuous AE waveform.
  • Sudden AE waves are AE waves that are measured in a single shot, and are often detected in response to the occurrence of cracks or crack propagation in the test object.
  • the number of sudden AE waves detected correlates with the number of cracks generated and propagated, the amplitude correlates with the crack growth length, the waveform area (energy) correlates with the crack progress area, and the frequency indicates the material of the object to be inspected. It is supposed to correlate with.
  • a continuous AE wave is a state in which the next AE wave is measured before one AE wave is attenuated.
  • Friction / wear phenomenon for example, on an engagement surface or an existing crack surface
  • the effective value of continuous AE waves correlates with the friction coefficient on the friction surface
  • the area of the waveform correlates with the amount of friction and wear
  • the frequency correlates with the material of the object to be inspected.
  • the position of the AE wave generation source can be estimated from the arrival time difference of the AE waves detected by each AE sensor.
  • one-dimensional position evaluation is possible using two AE sensors
  • two-dimensional position evaluation is possible using three AE sensors
  • third order using six AE sensors. The original position rating becomes possible.
  • computers are also commonly used for AE wave source location assessment by the AE method, and a large number of waveforms using a large number of AE sensors. Even if a signal is detected, it is considered that calculation processing is possible. However, in a calculation process by a computer, if an accidental error occurs in input data, a tremendous calculation result may be produced or the calculation itself may be disabled.
  • the AE sensor is a kind of industrial product, it is a matter of course that regular maintenance is required and an accidental failure may occur. In other words, in some AE sensors, it is conceivable that a time zone that cannot be measured accidentally occurs or an incorrect AE waveform signal is detected. As a result, it may happen that the AE method cannot be measured at the timing when the measurement is originally required.
  • the present inventors have intensively studied an elastic wave measurement and analysis method that does not particularly adversely affect the position evaluation of the AE wave generation source even if such an accidental error occurs.
  • the waveform signal transmitted from the AE sensor was mainly a blank signal or a signal at the upper limit of the measurement range of the AE sensor.
  • the present invention has been completed based on these findings.
  • FIG. 2 is a schematic diagram showing a schematic configuration of an elastic wave measurement and analysis apparatus according to the present invention.
  • an elastic wave measurement and analysis apparatus 100 is an apparatus for measuring and analyzing an elastic wave emitted from an object to be inspected and locating a source of the elastic wave.
  • a plurality of sensors 1 arranged on the surface of the body for receiving elastic waves, an elastic wave measuring unit 10 for measuring the waveform signals of the received elastic waves, a waveform signal storage unit 20 for storing the measured waveform signals, It includes a waveform signal processing unit 30 that reads and processes the stored waveform signal, and an input / output unit 40 that inputs waveform signal measurement and processing conditions and outputs various input values and analysis results.
  • the internal configuration of each part will be described later.
  • the measurement time (for example, 1 to 60 seconds) set by the measurement processing condition input mechanism 41 of the input / output unit 40 is set as one unit. And measuring and saving the measured waveform signal data for each unit measurement time.
  • FIG. 3A is a flowchart showing an example of an elastic wave measurement procedure according to the present invention
  • FIG. 3B is a chart showing an example of a waveform signal measured by each sensor
  • FIG. 3C shows stored waveform signal data. It is an example of a matrix.
  • a measurement condition input step (S101) for inputting and setting a unit measurement time as a unit of measurement by the measurement processing condition input mechanism 41 of the input / output unit 40 is performed.
  • the unit measurement time does not necessarily need to be unified for all measurement periods and all sensors, but is desirably unified from the viewpoint of simplifying calculation and processing of waveform signals performed later.
  • a waveform signal measurement step for measuring a waveform signal by each of the plurality of sensors 1 is performed.
  • the wave detected by the sensor 1 is amplified, frequency filtered, and A / D converted in the waveform signal converting mechanism 11 of the elastic wave measuring unit 10 to be converted into a waveform signal.
  • the measurement time control mechanism 14 checks whether or not the unit measurement time set in S101 has been reached while storing all the measured waveform signals in the waveform signal memory mechanism 12 that temporarily stores them. .
  • FIG. 3B in each of the plurality of sensors 1 (in this case, expressed as Ch 1, Ch ⁇ ⁇ ⁇ 2,... Ch m-1, Ch m), it is continuous along the time axis. Waveform signal measurement is performed.
  • the waveform signal storage step of transferring the waveform signal data stored in the waveform signal memory mechanism 12 to the waveform signal storage unit 20 and storing it (S103) is performed.
  • the waveform signal data is stored in such a manner that the measured sensor number and the unit measurement time (that is, the measurement time, etc.) can be discriminated.
  • the waveform signal data ⁇ m, n represents a waveform signal measured at the n-th unit measurement time by the m-th sensor.
  • the process returns to S102 to perform waveform signal measurement for the next unit measurement time.
  • the waveform signal memory mechanism 12 is a memory that can store waveform signal data for two unit measurement time or more so that the waveform signal by the next S102 is not overwritten during S103 and the previous waveform signal data is lost. It preferably has a capacity. Strictly speaking, depending on the time required to transfer and store the waveform signal in the waveform signal storage unit 20, for example, FIG. 3B shows an example of storing waveform signal data for three unit measurement times. Further, as the memory of the waveform signal memory mechanism 12, it is preferable to use a high-speed memory having a higher writing speed than the data storage mechanism (for example, hard disk) in the waveform signal storage unit 20.
  • all of the measured waveform signals are temporarily stored in the waveform signal memory mechanism 12 that temporarily stores the data, and then transferred to and stored in the waveform signal storage unit 20, so that there is no waveform signal memory mechanism 12
  • the waveform signal can be remarkably suppressed.
  • FIG. 4A is a flowchart showing an example of a procedure of waveform signal analysis in the present invention
  • FIG. 4B is a chart showing an example of a time domain including a waveform signal used for propagation analysis.
  • the measurement processing condition input mechanism 41 performs a processing condition input step (S201) for inputting and setting conditions for selecting a time domain including a waveform signal used for propagation analysis.
  • Examples of the selection condition include that a waveform signal having a peak value equal to or greater than a predetermined threshold value is measured by three or more sensors 1 within two consecutive unit measurement times. Note that S201 may be performed simultaneously with the previous S101 or may be performed at another timing.
  • the waveform signal readout mechanism 31 of the waveform signal processing unit 30 reads out the time domain including the waveform signal used for propagation analysis from the waveform signal stored in the waveform signal storage unit 20.
  • Step (S202) is performed.
  • the waveform signals measured at the (n ⁇ 1) th and nth unit measurement times are read out as the reading area i.
  • the selection of the readout region used for the propagation analysis needs to match the readout start time and the end time in the waveform signal data of each sensor, but it is not necessarily matched with the unit measurement time. However, from the viewpoint of simplifying the measurement of the waveform signal measurement time (elastic wave reception time), it is desirable to match the boundary of the unit measurement time.
  • the time-reversed waveform signal creation mechanism 34 performs a time-reversed waveform signal creation step (S205) for creating a time-reversed waveform signal by time-reversing the waveform signal data in the readout region i.
  • the waveform signal data phi m, n time reversed time-reversed waveform signal phi 'm, n denotes the waveform signal data obtained by inverting the waveform signals measured in the n-th unit measurement time sensor m-th time.
  • the back propagation analysis mechanism 35 performs a back propagation analysis step (S206) for performing back propagation analysis on the model of the object to be inspected using the time-reversed waveform signal created in S205.
  • S206 it is checked whether all the waveform signals read in S202 have been time-reversed and used for back propagation analysis.
  • the waveform signal used for propagation analysis is selected under predetermined conditions and the amount of data to be handled is reduced to the minimum necessary, the amount of processing / analysis calculation can be reduced, and the processing / analysis calculation can be performed quickly. There is an effect that it can be performed.
  • the analysis algorithm used for back propagation analysis in S206 is not particularly limited, and conventional methods (for example, finite integration method, finite element method, wave line theory, aperture synthesis method) can be used.
  • the inspected object model used for back propagation analysis is not particularly limited, and a model (for example, a CAD model) created by a conventional method can be used. For example, see Patent Document 1 (WO IV / 2014/167698).
  • the time-reversed waveform signal is treated as a wavefront traveling from the measured sensor toward the inside of the inspected object model, and when the wavefronts (time-reversed waveform signals) from each sensor are synthesized, Actually, a point where the wavefronts overlap with each other (with back calculation of time) and the peak value becomes high (the amplitude becomes large) is calculated. Then, at a certain time, these wavefronts converge at one place, and the peak value becomes the highest.
  • the converging point is the position where the elastic wave is generated, and it is possible to evaluate the position and time of the generation of the elastic wave.
  • an analysis result output step (S207) for outputting the obtained analysis result is performed.
  • S207 in addition to displaying the analysis result on the display mechanism 42, it is preferable to store the analysis result in the waveform signal storage unit 20.
  • the progress of the back propagation analysis may be displayed on the display mechanism 42.
  • AE measurement equipment including AE sensors is a type of industrial product, so some AE sensors have accidentally incapable time periods during AE wave measurement or erroneous AEs. It is conceivable that an error state occurs in which a waveform signal is detected.
  • the characteristic configuration of the elastic wave analysis process and the waveform signal processing unit 30 of the present invention when such an error state occurs will be described with reference to FIGS. 3A and 5A to 5B.
  • FIG. 5A is a flowchart showing another example of the procedure of the waveform signal analysis in the present invention
  • FIG. 5B is a chart showing another example of the time domain including the waveform signal used for the propagation analysis.
  • S201 to S202 are the same as the analysis flow described above.
  • S202 when the waveform signal measured at the (n ⁇ 1) th and nth unit measurement times is read as the read area i in accordance with the conditions set in S201, an error signal area as shown in FIG. 5B is included. Suppose it was. In this case, if the waveform signal including the error signal is processed and analyzed as it is, it may occur that a calculation result with low accuracy is obtained or the calculation itself becomes impossible.
  • the waveform signal in the readout region i is scanned by the readout waveform signal determination mechanism 32 of the waveform signal processing unit 30 to determine whether or not a predetermined error signal is included in the waveform signal.
  • a read waveform signal determination step (S203) is performed to determine whether or not. From the studies by the present inventors, a blank signal or a signal at the upper limit of the measurement range of the AE sensor can be preferably used as the predetermined error signal.
  • S204 is skipped and the process proceeds to S205 described above.
  • the present invention has a characteristic configuration of a read waveform signal determination step (S203) performed by the read waveform signal determination mechanism 32 and an adjustment waveform signal creation step (S204) performed by the waveform signal adjustment mechanism 33.
  • the elastic wave measurement and analysis method and the elastic wave measurement and analysis apparatus enable the waveform signal to be distinguished from the measured sensor number and the unit measurement time when storing the AE wave.
  • the amount of data handled is limited to the minimum necessary, so the amount of processing and analysis calculations can be reduced, and processing and analysis calculations can be performed quickly. There are advantages.
  • FIG. 6A is a schematic diagram illustrating a schematic configuration of an elastic wave measurement and analysis apparatus according to the second embodiment
  • FIG. 6B is a flowchart illustrating an example of an elastic wave measurement procedure according to the second embodiment.
  • the elastic wave measurement / analysis apparatus 200 of the second embodiment differs from the elastic wave measurement / analysis apparatus 100 of the first embodiment in the configuration of the elastic wave measurement unit 10 ′. It is the same thing.
  • the elastic wave measuring unit 10 ′ is configured to convert a plurality of sensors 1 into active sensors (active sensors, ON sensors) and inactive sensors (pause sensors, OFF) via the waveform signal generation mechanism 11.
  • the elastic wave measurement process performs S301 instead of S101 of the first embodiment as a measurement condition input step.
  • S301 is a measurement condition input step for inputting and setting conditions for classifying the plurality of sensors 1 into active sensors and inactive sensors in addition to the unit measurement time as a unit of measurement.
  • the condition for sorting active / inactive there is no particular limitation on the condition for sorting active / inactive, and it may be set as appropriate according to the type and application of the object to be inspected. For example, sorting based on time zones such as day / night, or simply skipping one sensor 1 or two sensors 1 can be considered.
  • the data amount of the waveform signal to be stored can be suppressed by performing S102 to S103.
  • S102 and S103 in the second embodiment are performed only for active sensors.
  • an AE wave having a predetermined characteristic value for example, a peak value equal to or higher than a predetermined threshold value
  • a predetermined characteristic value for example, a peak value equal to or higher than a predetermined threshold value
  • the recording sensor control mechanism 13 immediately activates all the inactive sensors to an active state when any active sensor measures an AE wave having a predetermined characteristic value. It is preferable to further have.
  • the additional function of the recording sensor control mechanism 13 for executing S302 and S302 can suppress waveform signal loss even for sudden AE waves.
  • the data of the waveform signal to be stored is restored by returning the sensor that has been urgently activated in S302 (the sensor that has been inactive) to the inactive sensor again after a predetermined time has elapsed (for example, after the elapse of three unit measurement time) The amount can be suppressed.
  • the waveform signal measured by the sensor that was urgently activated in S302 is in a blank state before the emergency activation, there is a possibility that it will be determined as a waveform signal including an error signal when used for propagation analysis later.
  • this can be dealt with by the elastic wave analysis process (particularly, the adjustment waveform signal creation step) described in the first embodiment, no particular problem occurs.
  • the elastic wave measurement / analysis apparatus of the present embodiment differs from that of the second embodiment in the functions controlled by the recording sensor control mechanism 13 of the elastic wave measurement unit 10 ', and the others are the same.
  • S301 and S102 are performed as in the second embodiment.
  • S102 in 3rd Embodiment is performed with respect to all the some sensors 1 similarly to 1st Embodiment. That is, the waveform signal measured by all of the plurality of sensors 1 is stored in the waveform signal memory mechanism 12.
  • the recording sensor control mechanism 13 in the third embodiment operates the waveform signal generation mechanism 11 to control ON / OFF of the sensor 1 in the measurement of the waveform signal when sorting the plurality of sensors 1 into active / inactive. Instead, control is performed based on whether the waveform signal stored in the waveform signal memory mechanism 12 by acting on the measurement time control mechanism 14 is transferred to the waveform signal storage unit 20 or not.
  • the present embodiment is different from the second embodiment.
  • the unit measurement time including the moment when the inactive sensor is urgently activated and the unit immediately before that During the measurement time, the waveform signal measured by the urgently activated sensor (the sensor that was inactive) and stored in the waveform signal memory mechanism 12 is additionally transferred to the waveform signal storage unit 20.
  • the waveform signal measured by all of the plurality of sensors 1 is temporarily stored in the waveform signal memory mechanism 12. Therefore, even if the inactive sensor is urgently activated, Waveform signals measured by inactive sensors before activation can be easily transferred and stored. As a result, in the present embodiment, the waveform signal data to be stored / analyzed is more accurate than in the second embodiment, and therefore the elastic wave generating source can be located more accurately.
  • the second and third embodiments have an effect that the amount of data stored in the waveform signal storage unit 20 can be suppressed as compared with the first embodiment.
  • the fourth embodiment relates to an elastic wave measurement analysis method and apparatus for reducing the amount of data stored in the waveform signal storage unit 20. This will be described with reference to FIG.
  • FIG. 7 is a schematic diagram showing a schematic configuration of the elastic wave measurement and analysis apparatus of the fourth embodiment. In FIG. 7, a part of the drawing is omitted for simplification of the drawing.
  • the elastic wave measurement and analysis apparatus 300 of the fourth embodiment shown in FIG. 7 differs from those of the first and second embodiments in the configuration of the elastic wave analysis unit 30 ′, and the others are the same. It is.
  • the elastic wave analysis unit 30 ′ uses the waveform data stored in the waveform signal storage unit 20 to store the storage data of the unit measurement time determined that the waveform signal used for the propagation analysis does not exist (the width of the unit measurement time ( It has a waveform signal data deletion mechanism 36 that deletes the unit measurement time).
  • the waveform signal data deleting mechanism 36 scans the waveform signal stored in the waveform signal storage unit 20 via the waveform signal reading mechanism 31 every unit measurement time, A stored waveform signal determination step is performed to determine whether or not a waveform signal used for propagation analysis (for example, a waveform signal having a peak value equal to or higher than a predetermined threshold) exists in the waveform signal data.
  • a waveform signal used for propagation analysis for example, a waveform signal having a peak value equal to or higher than a predetermined threshold
  • the stored waveform signal deletion step is performed to delete the signal within the unit measurement time width.
  • the waveform signal data as shown in FIG. 3B is stored in the waveform signal storage unit 20.
  • there is no waveform signal (a waveform signal having a peak value equal to or greater than a predetermined threshold) used for propagation analysis in the (n + 1) th unit measurement time.
  • all waveform signal data measured and stored in the (n + 1) th unit measurement time are deleted within the width of the unit measurement time.
  • the timing for performing the stored waveform signal determination step and the stored waveform signal deletion step is not particularly limited, and may be performed, for example, at a timing when the load of the elastic wave analysis unit 30 ′ is relatively light. Further, the stored waveform signal determination step may be performed simultaneously with S202 (waveform signal reading step) in the elastic wave analysis process.
  • the deletion of the unit measurement time does not affect the management of the AE wave measurement time. That is, according to the present embodiment, even if the waveform signal data is stored once, the amount of data can be reduced without affecting the management of the AE wave measurement time, and the load on the waveform signal storage unit 20 is reduced. Can be reduced.
  • the fifth embodiment relates to an elastic wave measurement analysis method and apparatus for reducing the amount of data stored in the waveform signal storage unit 20. This will be described with reference to FIG.
  • FIG. 8 is a schematic diagram showing a schematic configuration of the elastic wave measurement / analysis apparatus of the fifth embodiment.
  • a part of the drawing is omitted for simplification of the drawing.
  • the elastic wave measurement / analysis apparatus 400 of the fifth embodiment shown in FIG. 8 differs from that of the fourth embodiment in the configuration of the elastic wave analysis unit 30 ′′, and the others are the same.
  • the analysis unit 30 ′′ determines the waveform signal data that is unnecessary for the position evaluation of the elastic wave generation from the back propagation analysis result, and sets the waveform signal data as a unit.
  • An analysis result determination / data deletion mechanism 37 for deleting from the waveform signal storage unit 20 by the width of the measurement time (for the length of the unit measurement time) is provided.
  • the analysis result determination / data deletion mechanism 37 first scans the analysis result of the back propagation analysis step (S206) in the back propagation analysis mechanism 35 every unit measurement time, and the waveform signal used for the analysis is obtained. An analysis result determination step for determining whether or not the waveform signal contributes to the position evaluation of the elastic wave generation is performed.
  • the waveform signal that has not contributed to the position evaluation of the generation of the elastic wave is, for example, a waveform signal that has not converged to a location that is considered to be the generation position of the elastic wave as a result of synthesizing the time-reversed waveform signal (in other words, This means a waveform signal that does not contribute to an increase in amplitude at a location that is considered to be an elastic wave generation position.
  • the scanned waveform signal data of the unit measurement time includes only the waveform signal that did not contribute to the position evaluation of the elastic wave generation (not including the waveform signal that contributed to the position evaluation of the elastic wave generation). Then, a stored data deletion step is performed in which the stored data (waveform signal data stored in the scanned unit measurement time) is deleted within the width of the unit measurement time.
  • the analysis result determination step may be performed at a timing when the load on the elastic wave analysis unit 30 ′′ is relatively light. It may be performed simultaneously with S206 (back propagation analysis step) in the process.
  • the deletion of the unit measurement time does not affect the management of the AE wave measurement time. That is, according to the present embodiment, similarly to the fourth embodiment, even if the waveform signal data is stored once, the data amount can be reduced without affecting the management of the AE wave measurement time. The load on the signal storage unit 20 can be reduced.
  • the waveform signal since it is determined whether or not the waveform signal contributes to the position evaluation of the generation of elastic waves, the weak waveform signal that is difficult to distinguish from noise in the determination method based on the peak value. Even so, there is an advantage that it can be used effectively without missing. As a result, it is possible to further increase the accuracy of positioning of the elastic wave generation source.
  • the object to be inspected is a very large structure (for example, a tunnel having a length of several kilometers)
  • the entire object to be inspected is managed by a single elastic wave measuring and analyzing device. It is expected to be difficult in terms of the total number and data transfer distance.
  • the large-scale structure is divided into appropriately sized sections, and each section is assigned using a plurality of elastic wave measurement / analysis apparatuses, and the plurality of elastic wave measurement / analysis apparatuses are connected to each other. It is preferable to construct an interconnected elastic wave measuring and analyzing apparatus system.
  • 100, 200, 300, 400 ... elastic wave measurement and analysis device 1 ... sensor, 10, 10 '... elastic wave measurement unit, 11 ... waveform signal generation mechanism, 12 ... waveform signal memory mechanism, 13 ... recording sensor control mechanism, 14 ... Measurement time control mechanism, 20 ... Waveform signal storage unit, 30, 30 ', 30 "... Waveform signal processing unit, 31 ... Waveform signal read mechanism, 32 ... Readout waveform signal determination mechanism, 33 ... Waveform signal adjustment mechanism, 34 ... Time reversal waveform signal creation mechanism, 35 ... Back propagation analysis mechanism, 36 ... Waveform signal data deletion mechanism, 37 ... Analysis result judgment / data deletion mechanism, 40 ... Input / output unit, 41 ... Measurement processing condition input mechanism, 42 ... Display mechanism .

Landscapes

  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Signal Processing (AREA)
  • Engineering & Computer Science (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

L'objectif de la présente invention est de fournir un procédé et un dispositif d'analyse et de mesure d'onde élastique qui permettent de localiser précisément une source d'onde élastique, même si des erreurs inattendues surviennent dans certains capteurs parmi une pluralité de capteurs. Un procédé de mesure et d'analyse d'ondes élastiques selon la présente invention est un procédé de localisation d'une source d'onde élastique par mesure et analyse des ondes élastiques émises depuis un objet devant être inspecté au moyen d'une pluralité de capteurs disposés sur la surface de l'objet devant être inspecté, ledit procédé étant caractérisé en ce qu'il comporte : une étape de mesure des signaux de forme d'onde des ondes élastiques ; une étape de stockage temporaire des signaux de forme d'onde ; une étape d'enregistrement des signaux de forme d'onde stockés temporairement à un intervalle d'un temps de mesure unitaire prescrit ; une étape de lecture d'une région temporelle comprenant des signaux de forme d'onde devant être utilisés pour une analyse de propagation ; une étape pour déterminer si un signal d'erreur prescrit est inclus dans l'un quelconque des signaux de forme d'onde de lecture ; une étape de création d'un signal de forme d'onde ajusté à partir d'un signal de forme d'onde de lecture déterminé pour inclure le signal d'erreur par remplacement de la partie de signal d'erreur par des données factices prescrites ; une étape de création de signaux de forme d'onde temporellement inversés par inversion temporelle du signal de forme d'onde ajusté et des signaux de forme d'onde ; et une étape de conduite d'une analyse de rétropropagation sur les signaux de forme d'onde temporellement inversés dans un modèle de l'objet devant être inspecté.
PCT/JP2017/023698 2016-07-19 2017-06-28 Procédé de mesure et d'analyse d'onde élastique et dispositif de mesure et d'analyse d'onde élastique WO2018016278A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2018528466A JP6744919B2 (ja) 2016-07-19 2017-06-28 弾性波計測解析方法および弾性波計測解析装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016141137 2016-07-19
JP2016-141137 2016-07-19

Publications (1)

Publication Number Publication Date
WO2018016278A1 true WO2018016278A1 (fr) 2018-01-25

Family

ID=60993310

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2017/023698 WO2018016278A1 (fr) 2016-07-19 2017-06-28 Procédé de mesure et d'analyse d'onde élastique et dispositif de mesure et d'analyse d'onde élastique

Country Status (2)

Country Link
JP (1) JP6744919B2 (fr)
WO (1) WO2018016278A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7480086B2 (ja) 2021-03-22 2024-05-09 株式会社東芝 構造物評価システム、構造物評価装置及び構造物評価方法

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH085614A (ja) * 1994-06-17 1996-01-12 Toyota Motor Corp クラック検査装置
JPH0854379A (ja) * 1994-08-12 1996-02-27 Yukio Kagawa 画像信号処理方法及び装置
JP2003315317A (ja) * 2002-04-18 2003-11-06 Taiheiyo Cement Corp コンクリート構造物の監視システム
JP2003536071A (ja) * 2000-06-08 2003-12-02 ビ−エイイ− システムズ パブリック リミテッド カンパニ− 構造上の損傷の検出用の方法と装置
JP2004061432A (ja) * 2002-07-31 2004-02-26 Taiheiyo Cement Corp プレストレストコンクリート構造物の監視システム
WO2007080692A1 (fr) * 2006-01-12 2007-07-19 Tokyo Seimitsu Co., Ltd. Detecteur ae et procede de verification de l'etat de fonctionnement de ce detecteur ae
JP2008501951A (ja) * 2004-06-04 2008-01-24 テキサス リサーチ インターナショナル，インク． アコースティック・エミッションのリアルタイム監視用の分散型モードシステム
WO2014167698A1 (fr) * 2013-04-12 2014-10-16 株式会社 日立製作所 Procédé et dispositif d'examen par ultrasons
JP2016061701A (ja) * 2014-09-18 2016-04-25 株式会社東芝 検知システム及び検知方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6556939B1 (en) * 2000-11-22 2003-04-29 Smartsignal Corporation Inferential signal generator for instrumented equipment and processes

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH085614A (ja) * 1994-06-17 1996-01-12 Toyota Motor Corp クラック検査装置
JPH0854379A (ja) * 1994-08-12 1996-02-27 Yukio Kagawa 画像信号処理方法及び装置
JP2003536071A (ja) * 2000-06-08 2003-12-02 ビ−エイイ− システムズ パブリック リミテッド カンパニ− 構造上の損傷の検出用の方法と装置
JP2003315317A (ja) * 2002-04-18 2003-11-06 Taiheiyo Cement Corp コンクリート構造物の監視システム
JP2004061432A (ja) * 2002-07-31 2004-02-26 Taiheiyo Cement Corp プレストレストコンクリート構造物の監視システム
JP2008501951A (ja) * 2004-06-04 2008-01-24 テキサス リサーチ インターナショナル，インク． アコースティック・エミッションのリアルタイム監視用の分散型モードシステム
WO2007080692A1 (fr) * 2006-01-12 2007-07-19 Tokyo Seimitsu Co., Ltd. Detecteur ae et procede de verification de l'etat de fonctionnement de ce detecteur ae
WO2014167698A1 (fr) * 2013-04-12 2014-10-16 株式会社 日立製作所 Procédé et dispositif d'examen par ultrasons
JP2016061701A (ja) * 2014-09-18 2016-04-25 株式会社東芝 検知システム及び検知方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7480086B2 (ja) 2021-03-22 2024-05-09 株式会社東芝 構造物評価システム、構造物評価装置及び構造物評価方法

Also Published As

Publication number Publication date
JPWO2018016278A1 (ja) 2019-05-16
JP6744919B2 (ja) 2020-08-19

Similar Documents

Publication Publication Date Title
Konstantinidis et al. An investigation into the temperature stability of a guided wave structural health monitoring system using permanently attached sensors
US7917311B2 (en) Method for structural health monitoring using a smart sensor system
Saravanan et al. Damage detection in structural element through propagating waves using radially weighted and factored RMS
CA2888244C (fr) Appareil et procede de mesure ultrasonore
US20180328892A1 (en) Implementation of heterodyne effect in shm and talking shm systems
US20220050082A1 (en) Signal processing
Harvey et al. Finite element analysis of ultrasonic phased array inspections on anisotropic welds
CA2460901C (fr) Systeme et methode d'inspection d'un four industriel ou appareil semblable
Niu et al. Enhancement of unidirectional excitation of guided torsional T (0, 1) mode by linear superposition of multiple rings of transducers
He et al. An exploratory study of underwater bolted connection looseness detection using percussion and a shallow machine learning algorithm
WO2018016278A1 (fr) Procédé de mesure et d'analyse d'onde élastique et dispositif de mesure et d'analyse d'onde élastique
RU108627U1 (ru) Система ультразвуковой дефектоскопии трубопровода
Wilcox et al. Progress towards a forward model of the complete acoustic emission process
Dhutti et al. Monitoring of critical metallic assets in oil and gas industry using ultrasonic guided waves
Núñez et al. Acoustic emission
Sattarifar et al. Frequency‐bounded Delay and Sum: A modified Damage Detection Method in thin‐walled Plates
Zohora Evaluation of material crack using acoustic emission technique
Konstantinidis et al. The long term stability of guided wave structural health monitoring systems
Kim et al. The use of matching pursuit decomposition for damage detection and localization in complex structures
Chew et al. High-frequency guided waves for corrosion thickness loss monitoring
Haynes et al. Bayesian probabilistic modeling for damage assessment in a bolted frame
Balcewicz et al. Active time-reverse imaging: Defect detection by coda waves in digital concrete physics
Dodson et al. Structural health monitoring of an impulsively loaded structure using wave-propagation based instantaneous baseline
Schubert et al. Monitoring of high temperature steel pipes by ultrasonic waveguide solutions
Mirdamadi et al. Damage detection and structural health monitoring of ST-37 plate using smart materials and signal processing by artificial neural networks

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 17830798

Country of ref document: EP

Kind code of ref document: A1

ENP Entry into the national phase

Ref document number: 2018528466

Country of ref document: JP

Kind code of ref document: A

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 17830798

Country of ref document: EP

Kind code of ref document: A1