WO2017187510A1 - 距離計測装置、距離計測方法、及び形状計測装置 - Google Patents
距離計測装置、距離計測方法、及び形状計測装置 Download PDFInfo
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- WO2017187510A1 WO2017187510A1 PCT/JP2016/063054 JP2016063054W WO2017187510A1 WO 2017187510 A1 WO2017187510 A1 WO 2017187510A1 JP 2016063054 W JP2016063054 W JP 2016063054W WO 2017187510 A1 WO2017187510 A1 WO 2017187510A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
- G01S17/06—Systems determining position data of a target
- G01S17/08—Systems determining position data of a target for measuring distance only
- G01S17/32—Systems determining position data of a target for measuring distance only using transmission of continuous waves, whether amplitude-, frequency-, or phase-modulated, or unmodulated
- G01S17/36—Systems determining position data of a target for measuring distance only using transmission of continuous waves, whether amplitude-, frequency-, or phase-modulated, or unmodulated with phase comparison between the received signal and the contemporaneously transmitted signal
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02007—Two or more frequencies or sources used for interferometric measurement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
- G01S17/06—Systems determining position data of a target
- G01S17/08—Systems determining position data of a target for measuring distance only
- G01S17/32—Systems determining position data of a target for measuring distance only using transmission of continuous waves, whether amplitude-, frequency-, or phase-modulated, or unmodulated
- G01S17/34—Systems determining position data of a target for measuring distance only using transmission of continuous waves, whether amplitude-, frequency-, or phase-modulated, or unmodulated using transmission of continuous, frequency-modulated waves while heterodyning the received signal, or a signal derived therefrom, with a locally-generated signal related to the contemporaneously transmitted signal
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
- G01S17/50—Systems of measurement based on relative movement of target
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/491—Details of non-pulse systems
- G01S7/4911—Transmitters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/491—Details of non-pulse systems
- G01S7/4912—Receivers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/491—Details of non-pulse systems
- G01S7/4912—Receivers
- G01S7/4917—Receivers superposing optical signals in a photodetector, e.g. optical heterodyne detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/497—Means for monitoring or calibrating
Definitions
- the present disclosure relates to a distance measurement device, a distance measurement method, and a shape measurement device, for example, a technique for measuring a distance from a light source to a measurement object in a non-contact manner.
- F FMCW (Frequency-Modulated-Continuous-Waves) method is known as a method for measuring the distance to the measurement object in a non-contact manner.
- the technique described in Patent Document 1 or 2 can be given.
- Patent Document 1 divides light emitted from a light source for measurement into two parts, irradiates the object with the optical frequency sweep period shifted from each other by a half period, and reduces the distance error due to Doppler shift caused by the vibration of the measurement object. It is disclosed.
- Patent Document 2 provides two light sources whose polarizations are orthogonal to each other, irradiates the object with the optical frequency sweep period shifted by half a period, and reduces the distance error due to Doppler shift caused by the vibration of the measurement object. It is disclosed.
- FIG. 1 is a diagram illustrating a configuration example of the FMCW system.
- a triangular wave current is injected into the semiconductor laser 101 from the oscillator (signal generator) 102 and the drive current is modulated, FM light that is temporally frequency swept at a constant modulation speed is generated.
- the FM light is divided by the beam splitter 202, a part of the output light is irradiated onto the measurement object 110, and a part is reflected by the reference mirror 201.
- the interference light of the return light and the reference light from the measurement target is detected by the light receiver 203, and the detected beat signal is analyzed by the PC 114 and displayed on the monitor (screen) 115.
- FIG. 2 is a diagram illustrating an example of the beat signal 301 observed by the light receiver. In FIG. 2, the horizontal axis of the graph is the observed beat frequency, and the vertical axis is the signal intensity.
- FIG. 3 is a diagram illustrating the principle of distance measurement.
- the time change of the optical frequency in the light receiver of the reference light 401 and the measurement light 402 is shown, the horizontal axis of the graph is time, and the vertical axis is the optical frequency.
- the beat frequency f b , the difference ⁇ t in the arrival time of the reference light 401 and the measuring light 402 at the light receiver ⁇ t, the frequency sweep width ⁇ , and the modulation period T have the relationship of Equation (1).
- the distance L to the measurement object can be expressed as shown in Expression (2) using the light velocity c in the atmosphere.
- ⁇ represents the frequency of the irradiation laser
- V represents the vibration speed of the object
- c represents the speed of light
- ⁇ represents the angle between the irradiation laser and the vibration direction of the object.
- Equation (4) a distance error proportional to the target speed is obtained.
- FIG. 4 is a diagram illustrating a conventional method for reducing the distance error due to the Doppler shift.
- the direction of receiving the Doppler shift is reversed between the upstream region (time 0 to T) and the downstream region (time T to 2T) of the frequency sweep. For this reason, as shown in Expression (5), it is possible to obtain an accurate distance by eliminating the influence of the Doppler shift from the beat frequency obtained in the upstream region and the beat frequency obtained in the downstream region.
- the Doppler shift amount is not equal between the upstream region and the downstream region, and an error remains.
- the light emitted from the measurement light source is branched into two, and the target is simultaneously irradiated with two lights whose frequency sweep period is shifted by a half period. .
- the light of the up and down regions of the frequency sweep is irradiated simultaneously, and the distance error due to the Doppler shift is reduced regardless of the vibration frequency of the object.
- the normal frequency sweep cycle is about 1 kHz.
- it is necessary to set the optical path difference of the branched light to about 100 km. That is, if an optical path difference is provided by an optical fiber, an optical fiber having a length of 100 km is required. In this case, the scale of the apparatus is too large and the usability is not good.
- Patent Document 2 two orthogonally polarized light sources whose phase of the frequency sweep period is shifted by a half period are provided, combined by a polarization beam splitter, irradiated to a measurement object, and scattered light from the measurement object is polarized again.
- the beam is separated and detected by the beam splitter, and the distance error due to the Doppler shift is reduced from each beat frequency by the equation (5).
- the present disclosure has been made in view of such a situation, and provides a technique capable of measuring the distance of a target object with high accuracy.
- the present disclosure includes a plurality of means for solving the above-described problems.
- the present disclosure is a distance measuring device that measures a distance from a light source to a measurement target, and emits a plurality of lights having different wavelengths.
- the processor calculates a frequency calculation process for calculating a peak frequency corresponding to each wavelength from the signal detected by the light receiving unit, and a Doppler shift error caused by the measurement target vibrating from the peak frequency corresponding to each wavelength.
- a distance calculation process for reducing and calculating the distance.
- the distance of the target object can be measured with high accuracy.
- FIG. 902. It is a figure which shows the schematic structural example of the distance measuring device 4 by 4th Embodiment. It is a figure which shows the example of the beat frequency detected with the light receiver. It is a flowchart for demonstrating the process (distance calculation process) which calculates distance from a detection signal. It is a figure which shows the schematic structural example of the distance measuring device 5 by 5th Embodiment. It is a figure which shows the schematic structural example of the distance measuring device 6 by 6th Embodiment.
- Embodiment of this indication discloses the technique which makes it possible to reduce the scale of a distance measuring device and to measure the distance of a target object with high precision.
- the distance measuring apparatus measures the frequency calculation processing for calculating the peak frequency corresponding to the light of each wavelength emitted from the light source unit from the signal detected by the light receiving unit, and the peak frequency corresponding to the light of each wavelength. And a distance calculation process for reducing a Doppler shift error caused by the vibration of the object and calculating a distance.
- the light source unit of the distance measuring device is configured to sweep and output a plurality of lights so that the frequency sweep periods of the plurality of lights having different wavelengths are shifted by a predetermined period.
- the distance L can be calculated by reducing the Doppler shift error based on the following equation.
- T is a modulation period
- ⁇ is a frequency sweep width
- ⁇ 1 and ⁇ 2 are wavelengths (when two lights are used).
- ⁇ t represents a time difference between the reference light and the light reflected from the measurement target
- ⁇ f1 and ⁇ f2 represent Doppler shift amounts of the respective lights
- f beat represents a beat frequency.
- FIG. 5 is a diagram illustrating a schematic configuration of the distance measuring device 1 according to the first embodiment of the present disclosure.
- the distance measuring apparatus 1 includes semiconductor lasers 101 and 103, arbitrary signal generators 102 and 104, a fiber coupler 105, a circulator 106, a fiber coupler 107, a reference mirror 108, and a collimator lens (for example, a fiber collimator). 109, a fiber coupler 111, light receivers 112 and 113, a computer (PC) 114, and a monitor 115.
- PC computer
- the PC 114 transmits the sweep waveform signal to the arbitrary signal generator 102.
- the optical frequency is swept by modulating the drive current of the semiconductor laser 101 by the arbitrary signal generator 102.
- the PC 114 transmits a sweep waveform signal to the arbitrary signal generator 104.
- the optical signal is swept by modulating the drive current of the semiconductor laser 103 by the arbitrary signal generator 104.
- the frequency of the semiconductor laser 101 and [nu 1 the frequency of the semiconductor laser 103 and [nu 2, [nu 1 and [nu 2 are different frequencies (i.e., the laser wavelength is different).
- the light emitted from the semiconductor lasers 101 and 103 is multiplexed by the fiber coupler 105.
- the combined light passes through the circulator 106 and is branched by the fiber coupler 107.
- a part of the branched light is reflected by the reference mirror 108 and becomes reference light.
- Most of the remaining branched light is applied to the space by the collimator lens 109 and is applied to a measurement object 110 (also referred to as a measurement object).
- the light reflected from the measurement object 110 passes through the collimator lens 109 again and merges with the reference light from the reference mirror 108 at the fiber coupler 107 portion, and is then guided to the fiber coupler 111 by the circulator 106, and the wavelength by the fiber coupler 111. To be separated.
- the light subjected to wavelength separation is detected by a light receiver 112 for the semiconductor laser 101 and a light receiver 113 for the semiconductor laser 103, respectively.
- Each of the light receivers 112 and 113 generates a beat signal due to interference between the reference light and the measurement light.
- FIG. 6 is a diagram illustrating an example of a signal (detection signal) detected by the distance measuring apparatus according to the first embodiment.
- FIG. 7 is a flowchart for explaining a process of calculating a distance from the detection signal (distance calculation process).
- the distance calculation process is executed by a processor (CPU or MPU) included in the computer 114. More specifically, a program (distance calculation program) for executing the distance calculation processing according to FIG. 7 is stored in a memory (not shown) of the computer 114, and the processor reads the distance calculation program from the memory. Will be executed.
- the processor of the computer 114 hereinafter simply referred to as “processor” will be described as an operation subject.
- Step 701 The processor A / D converts the signal detected by the light receiver 112 to obtain a digital signal.
- Step 702 The processor cuts out the upstream signal of the frequency sweep from the digital detection signal.
- Step 703 The processor performs FFT processing on the signal cut out in step 702.
- Step 704 The processor detects the peak frequency from the signal subjected to the FFT processing in step 703.
- Step 705 the processor A / D converts the signal detected by the light receiver 113 to obtain a digital signal.
- Step 706 The processor cuts out the upstream signal of the frequency sweep from the digital detection signal.
- Step 707 The processor performs FFT processing on the signal cut out in step 706.
- Step 708 The processor detects the peak frequency from the signal subjected to the FFT processing in Step 707.
- Step 709 The processor removes the Doppler shift from the peak frequency obtained in steps 704 and 708 and calculates an accurate distance. Details of the processing in step 709 are as follows. When the measurement target vibrates, the Doppler shift amount received by the semiconductor laser 101 is expressed by Expression (6).
- Equation (8) makes it possible to obtain an accurate distance without error.
- the distance to the measurement target from which the distance error due to the Doppler shift is removed can be calculated.
- steps 701 to 704 and the processing of steps 705 to 708 are shown to be performed in parallel, but the execution order of each step can be arbitrarily set.
- the beat frequency f b needs to be constant during the modulation period T.
- the change amount of the optical frequency is nonlinear with respect to the change amount of the injection current as a characteristic of the semiconductor laser, there is a problem that the measurement accuracy is deteriorated. Therefore, in the second embodiment, a distance measuring apparatus that performs correction using a reference interferometer having a certain optical path difference is proposed.
- FIG. 8 is a diagram illustrating a schematic configuration example of the distance measuring device 2 according to the second embodiment.
- the distance measuring device 2 shown in FIG. 8 has the same configuration as that of the distance measuring device 1 shown in FIG. The difference is that the light emitted from the semiconductor laser is branched by a fiber coupler and partially guided to a reference interferometer.
- the light irradiated from the semiconductor laser 101 is branched by the fiber coupler 801.
- One of the branched lights is guided to the fiber coupler 802.
- the light is further branched into two by the fiber coupler 802, provided with a certain optical path difference by the optical fiber 803, and then multiplexed by the fiber coupler 804 and received by the light receiver 805.
- This has the structure of a Mach-Zehnder interferometer, and the light receiver 805 generates a constant beat signal proportional to the optical path difference.
- the light emitted from the semiconductor laser 103 is branched by the fiber coupler 806.
- One of the branched lights is guided to the fiber coupler 807.
- the light is further branched into two by a fiber coupler 807, provided with a certain optical path difference by an optical fiber 808, and then multiplexed by a fiber coupler 809 and received by a light receiver 810.
- This has the structure of a Mach-Zehnder interferometer, and the light receiver 810 generates a constant beat signal proportional to the optical path difference.
- the beat frequency fb needs to be constant during the modulation period T.
- the change amount of the optical frequency is nonlinear with respect to the change amount of the injection current as a characteristic of the semiconductor laser, there is a problem that the measurement accuracy is deteriorated. Therefore, in the third embodiment, a distance measuring device that controls the injection current of the semiconductor laser to make the beat frequency constant is proposed.
- FIG. 9 is a diagram illustrating a schematic configuration example of the distance measuring device 3 according to the third embodiment.
- the distance measuring device 3 in FIG. 9 has the same configuration as that of the distance measuring device 1 in FIG. The difference is that the light emitted from the semiconductor laser is branched by the fiber coupler 901 and part of the light is guided to a feedback mechanism that controls the injection current of the semiconductor laser 101.
- the light emitted from the semiconductor laser 101 is branched by the fiber coupler 901.
- One of the branched lights is guided to a feedback mechanism (feedback circuit) 902.
- FIG. 10 is a diagram illustrating an internal configuration example of the feedback mechanism 902.
- the light from the fiber coupler 901 is further branched into two by the fiber coupler 1001, and after a certain optical path difference is provided by the optical fiber 1002, the light is again combined by the fiber coupler 1003 and received by the light receiver 1004.
- This is a structure of a Mach-Zehnder interferometer, and a constant beat signal proportional to the optical path difference is generated in the light receiver 1004.
- the beat signal and the signal from the signal oscillator 1005 are mixed by the mixer 1006, and the current signal corresponding to the difference frequency or the difference phase is added to the current signal from the arbitrary signal generator 102 by the combiner 903, thereby making the beat signal constant. It is controlled to become.
- the light irradiated from the semiconductor laser 103 is branched by the fiber coupler 904.
- One of the branched lights is guided to the feedback mechanism 905.
- the feedback mechanism 905 has the same configuration as the feedback mechanism 902 (see FIG. 10), and the beat signal is generated by adding the output current signal to the current signal from the arbitrary signal generator 104 by the combiner 906. Control to be constant.
- the distance can be measured with high accuracy by using the two light sources linearly swept in frequency and performing the same process as the process described in the first embodiment.
- FIG. 11 is a diagram illustrating a schematic configuration example of the distance measuring device 4 according to the fourth embodiment.
- the distance measuring device 4 is different from the distance measuring device 1 (see FIG. 5) having two light receivers in that there is one light receiver.
- the computer (PC) 114 transmits a sweep waveform signal to the arbitrary signal generator 102.
- the arbitrary signal generator 102 sweeps the optical frequency by modulating the drive current of the semiconductor laser 101.
- the light emitted from the laser passes through the circulator 1101 and is branched by the fiber coupler 1102. A part of the light is reflected by the reference mirror 1103 and becomes the reference light, and most of the remaining light is guided to the WDM coupler 1104.
- the computer (PC) 114 transmits a sweep waveform signal to the arbitrary signal generator 104.
- the arbitrary signal generator 104 sweeps the optical frequency by modulating the drive current of the semiconductor laser 103.
- the light emitted from the laser passes through the circulator 1105, is branched by the fiber coupler 1106, a part of the light is reflected by the reference mirror 1107, and most of the remaining light is guided to the WDM coupler 1104.
- the light combined by the WDM coupler 1104 is applied to the space by the collimator lens (fiber collimator) 109 and is applied to the measurement object 110.
- the light reflected from the measurement object 110 passes through the collimator lens 109 again, is guided to the WDM coupler 1104, and is wavelength-separated by the WDM coupler 1104.
- One light obtained by wavelength separation by the WDM coupler 1104 again passes through the fiber coupler 1102 and the circulator 1101 and is guided to the WDM coupler 1108.
- the other light obtained by wavelength separation by the WDM coupler 1104 again passes through the fiber coupler 1106 and the circulator 1105 and is guided to the WDM coupler 1108.
- the light combined by the WDM coupler 1108 is detected by the light receiver 1109, and a beat signal is generated by the interference between the reference light and the measurement light.
- a beat signal is generated by the interference between the reference light and the measurement light.
- FIG. 12 is a diagram illustrating an example of the beat frequency detected by the light receiver 1109.
- a peak frequency (beat signal detected by the light receiver) 1201 having a low beat frequency indicates a beat frequency corresponding to the semiconductor laser 101 having a small distance difference between the measurement target and the reference mirror.
- a peak frequency (beat signal detected by the light receiver) 1202 having a high frequency indicates a beat frequency corresponding to the semiconductor laser 103 having a large distance difference between the measurement target and the reference mirror.
- FIG. 13 is a flowchart for explaining a process of calculating a distance from a detection signal (distance calculation process).
- the distance calculation process is executed by a processor (CPU or MPU) included in the computer 114. More specifically, a program (distance calculation program) for executing the distance calculation processing according to FIG. 7 is stored in a memory (not shown) of the computer 114, and the processor reads the distance calculation program from the memory. Will be executed.
- the processor of the computer 114 hereinafter simply referred to as “processor” will be described as an operation subject.
- Step 1301 The processor A / D converts the signal detected by the light receiver 1109 to obtain a digital signal.
- Step 1302 The processor cuts out a signal in a region corresponding to a half cycle of the frequency sweep cycle from the digital detection signal obtained in step 1301.
- Step 1303 The processor performs FFT processing on the signal cut out in step 1302.
- Step 1304 The processor detects a lower peak frequency from the signal subjected to the FFT processing in step 1303.
- Step 1305 The processor detects the peak frequency having the higher frequency from the signal subjected to the FFT processing in step 1303. Note that the execution order of step 1304 and step 1305 may be reversed.
- Step 1306 The processor can calculate an accurate distance by removing the Doppler shift based on Equation (8) from the two peak frequencies detected in Step 1304 and Step 1305.
- FIG. 14 is a diagram illustrating a schematic configuration example of the distance measuring device 5 according to the fifth embodiment. Similar to the distance measuring device 4, the distance measuring device 5 includes one light receiver.
- the computer (PC) 114 transmits a sweep waveform signal to the arbitrary signal generator 102.
- the arbitrary signal generator 102 sweeps the optical frequency by modulating the drive current of the semiconductor laser 101.
- the computer (PC) 114 transmits a sweep waveform signal to the arbitrary signal generator 104.
- the arbitrary signal generator 104 sweeps the optical frequency by modulating the drive current of the semiconductor laser 103.
- the light output from the semiconductor laser 101 and the semiconductor laser 103 is multiplexed by the WDM coupler 1401.
- the light combined by the WDM coupler 1401 passes through the circulator 1402 and is branched by the fiber coupler 1403.
- One of the lights obtained by branching is further branched by the WDM coupler 1404 and reflected by the reference mirror 1405 for the semiconductor laser 101 and the reference mirror 1406 for the semiconductor laser 103 to become reference light.
- the other light (most of the light) obtained by branching is irradiated to the space by the collimator lens 109 and irradiated to the measurement object 110.
- the light reflected from the measurement object 110 passes through the collimator lens 109 again, is combined with the reference light from the reference mirrors 1405 and 1406 by the fiber coupler 1403, and then passes through the circulator 1402.
- the light that has passed through the circulator 1402 is detected by the light receiver 1407, and a beat signal is generated due to interference between the reference light and the measurement light.
- a beat signal is generated due to interference between the reference light and the measurement light.
- the distance to the reference mirror is different even if the same measurement target is measured.
- Beat signals can be generated at different positions.
- the subsequent processing contents are the same as those in the fourth embodiment.
- the beat frequency fb needs to be constant during the modulation period T.
- the change amount of the optical frequency is nonlinear with respect to the change amount of the injection current as a characteristic of the semiconductor laser, there is a problem that the measurement accuracy is deteriorated. Therefore, in the sixth embodiment, a distance measuring apparatus that performs correction using a reference interferometer having a certain optical path difference is proposed.
- FIG. 15 is a diagram illustrating a schematic configuration example of the distance measuring device 6 according to the sixth embodiment.
- the distance measuring device 6 in FIG. 15 has the same configuration as the distance measuring device 4 in FIG. The difference is that the light emitted from the semiconductor laser is branched by a fiber coupler and partially guided to a reference interferometer.
- the light output from the semiconductor laser 101 is branched by the fiber coupler 1501.
- One light obtained by the branching is guided to the fiber coupler 1502 and further split into two by the fiber coupler 1502.
- One of the lights further branched by the fiber coupler 1502 is guided to the optical fiber 1505.
- the other of the light further branched by the fiber coupler 1502 passes through the WDM coupler 1503, is guided to the optical fiber 1506, and a certain optical path difference is provided.
- the light that has passed through the optical fiber 1505 passes through the WDM coupler 1508, is combined by the fiber coupler 1509, and is received by the light receiver 1510.
- This is a structure of a Mach-Zehnder interferometer, and the light receiver 1510 generates a constant beat signal proportional to the optical path difference between the optical fiber 1505 and the optical fiber 1506.
- the light output from the semiconductor laser 103 is branched by the fiber coupler 1500.
- One light obtained by branching is guided to the fiber coupler 1504 and further branched into two by the fiber coupler 1504.
- One of the lights further branched by the fiber coupler 1504 is guided to the optical fiber 1507.
- the other of the light further branched by the fiber coupler 1504 passes through the WDM coupler 1503, is guided to the optical fiber 1506, and a certain optical path difference is provided.
- the light that has passed through the optical fiber 1507 passes through the WDM coupler 1508, is combined by the fiber coupler 1509, and is received by the light receiver 1510.
- This is a configuration of a Mach-Zehnder interferometer, and the light receiver 1510 generates a constant beat signal proportional to the optical path difference between the optical fiber 1506 and the optical fiber 1507.
- the seventh embodiment relates to a shape measuring device for measuring the shape of a measurement object using any one of the distance measuring devices 1 to 6 according to the first to sixth embodiments. It is.
- FIG. 16 is a diagram illustrating a schematic configuration example of the shape measuring device 7 according to the seventh embodiment, which includes any one of the distance measuring devices according to the first to sixth embodiments.
- the shape measuring device 7 includes a 3D shape measuring unit 1601, a computer (PC) 114, and a monitor 115.
- PC computer
- the 3D shape measurement unit 1601 measures the 3D shape of the measurement object 110, and includes a distance measurement unit (distance measurement device) 1602 according to any one of the first to sixth embodiments, a one-axis stage 1603, A focus lens 1604 and galvanometer mirrors 1605 and 1606 are provided.
- a distance measurement unit distance measurement device 1602 according to any one of the first to sixth embodiments
- a one-axis stage 1603 A focus lens 1604 and galvanometer mirrors 1605 and 1606 are provided.
- the laser light emitted from the collimator lens 109 of the distance measurement unit 1602 is focus-adjusted on the measurement object 110. Further, by shaking the galvanometer mirrors 1605 and 1606, the measurement surface of the measurement object 110 is scanned two-dimensionally with laser light, and the shape of the measurement object 110 is measured.
- FIG. 17 is a flowchart for explaining shape measurement processing according to the seventh embodiment.
- the shape measurement process is executed by a processor (CPU or MPU) included in the computer 114. More specifically, a program (shape measurement program) for executing the shape measurement process according to FIG. 17 is stored in a memory (not shown) of the computer 114, and the processor reads the distance calculation program from the memory. Will be executed.
- the processor of the computer 114 hereinafter simply referred to as “processor” will be described as an operation subject.
- Step 1701 The processor scans the laser scanning angle output from the distance measuring unit 1602 based on information on one coordinate point within the input specified range (for example, the user inputs referring to the size of the measurement target 110). Adjust.
- Step 1702 The processor moves the one-axis stage 1603 in the axial direction to focus on the measurement object 110 (focus adjustment).
- Step 1703 The processor executes the processing described in the distance measurement device according to the first to sixth embodiments, and measures the distance to the measurement object 110.
- Step 1704 The processor calculates 3D coordinates of the measurement target 110 from the laser scanning angle determined in step 1701 and the distance measured in step 1703.
- Step 1705 The processor determines whether all of the input designated range has been measured. If all designated ranges (all coordinate points) have been measured (YES in step 1705), the process proceeds to step 1706. If all the specified ranges have not been measured yet (NO in step 1705), the process proceeds to step 1701.
- Step 1706 The processor outputs 3D shape measurement results of all coordinate points in the specified range.
- FIG. 18 is a diagram illustrating a schematic configuration example of an inner diameter measuring device 8 according to the eighth embodiment, which includes any one of the first to sixth embodiments. It is.
- the inner diameter measuring device 8 is a device that measures the inner diameter of the inner diameter measuring object 116, and is a distance measuring unit (distance measuring device) 1802, a single axis stage 1803, and a focus according to any of the first to sixth embodiments.
- a lens 1804, a reflecting prism 1805, a rotary stage 1806, a computer (PC) 114, and a monitor 115 are provided.
- the laser light emitted from the collimator lens 109 of the distance measuring unit 1802 is focused on the inner side surface of the inner diameter measurement target 116.
- each embodiment two light sources are provided to emit light having different wavelengths, but light having different wavelengths may be emitted from one light source. . Therefore, a configuration including the semiconductor lasers 101 and 103 and the arbitrary signal generators 102 and 104 can be referred to as a “light source unit”. Further, although two lights having different wavelengths are used, three or more lights having different wavelengths may be used. In this case, three or more light sources may be used, or three or more lights may be emitted from the light source unit.
- the distance measuring device includes a frequency calculation process for calculating a peak frequency corresponding to light of each wavelength emitted from the light source unit from a signal detected by the light receiving unit, and a peak corresponding to light of each wavelength. And a distance calculation process for calculating a distance by reducing a Doppler shift error caused by the vibration of the measurement target from the frequency. By doing in this way, it becomes possible to measure highly accurate distance (distance from a light source to a measuring object).
- the light source unit of the distance measuring device is configured to sweep and output a plurality of lights so that the frequency sweep periods of the plurality of lights having different wavelengths are shifted by a predetermined period. By doing so, it is not necessary to provide a very long optical fiber (for example, a length of 100 km) in order to provide an optical path difference, and the scale of the distance measuring device can be reduced.
- the emitted light has different optical axes immediately after the emission.
- a multiplexing optical element that combines a plurality of lights into a plurality of coaxial lights is provided so that the measurement target is irradiated with the plurality of coaxial lights.
- a plurality of lights having different wavelengths can be irradiated to the same location to be measured in one measurement, the measurement throughput can be improved, and measurement errors can be reduced.
- the multiplexing optical element for example, a WDM coupler or a dichroic mirror can be used.
- a branching optical element that branches a plurality of coaxial lights is provided in the middle of the optical path from the multiplexing optical element to the measurement target. A part of the light branched by the branching optical element is guided to the reference mirror. Light other than the light guided to the reference mirror is guided to the irradiation optical element and irradiated to the measurement target.
- a fiber coupler can be used as the branching optical element, and a collimator lens can be used as the irradiation optical element.
- the light receiving unit is configured to receive the light reflected by the measurement target according to the wavelength of the emitted light. By doing so, it becomes possible to generate a beat signal due to interference between the reference light and the measurement light (reflected light from the measurement target) for each light having a different wavelength.
- the distance measurement device of the present disclosure may include a calibration interferometer that reduces errors due to nonlinearity of optical frequency sweeping in the light source unit. By doing so, it becomes possible to measure the distance with higher accuracy.
- the distance measuring device includes a feedback mechanism that generates a signal for controlling the injection current of the light source unit from a part of the light emitted from the light source unit and feeds back the signal to the light source unit. May be. By doing so, it becomes possible to measure the distance with higher accuracy.
- the distance L can be calculated by reducing the Doppler shift error based on the following equation.
- T is a modulation period
- ⁇ is a frequency sweep width
- ⁇ 1 and ⁇ 2 are wavelengths (when two lights are used).
- ⁇ t represents a time difference between the reference light and the light reflected from the measurement target
- ⁇ f1 and ⁇ f2 represent Doppler shift amounts of the respective lights
- f beat represents a beat frequency.
- the present embodiment also provides a shape measuring device and an inner diameter measuring device including the above-described distance measuring device.
- the shape measuring device includes a focus lens that focuses the light from the distance measuring device on the shape measurement target, and a mirror that scans the light whose focus is adjusted on the shape measurement target. Then, the shape measuring device measures the three-dimensional shape of the shape measuring object using the distance from the light source unit measured by the distance measuring device to the shape measuring object and the scanning angle of the light whose focus is adjusted, Outputs 3D shape measurement results.
- the inner diameter measuring device includes a focus lens that adjusts the focus of light from the distance measuring device to a shape measurement target, a rotary stage, and a reflecting prism mounted thereon. While the reflecting prism is rotated by the rotating stage, the light whose focus is adjusted is reflected by the reflecting prism at a right angle. By doing in this way, it becomes possible to measure the internal diameter of an internal diameter measurement object.
- the function executed by the processor can also be realized by a program code of software.
- a storage medium in which the program code is recorded is provided to the system or apparatus, and the computer (or CPU or MPU) of the system or apparatus reads the program code stored in the storage medium.
- the program code itself read from the storage medium realizes the functions of the above-described embodiments, and the program code itself and the storage medium storing the program code constitute the present disclosure.
- a storage medium for supplying such program code for example, a flexible disk, CD-ROM, DVD-ROM, hard disk, optical disk, magneto-optical disk, CD-R, magnetic tape, nonvolatile memory card, ROM Etc. are used.
- an OS operating system
- the computer CPU or the like performs part or all of the actual processing based on the instruction of the program code.
- the program code is stored in a storage means such as a hard disk or a memory of a system or apparatus, or a storage medium such as a CD-RW or CD-R
- the computer (or CPU or MPU) of the system or apparatus may read and execute the program code stored in the storage means or the storage medium when used.
- control lines and information lines are those that are considered necessary for the explanation, and not all control lines and information lines on the product are necessarily shown. All the components may be connected to each other.
Abstract
Description
図2は、受光器で観測されるビート信号301の例を示す図である。図2において、グラフ横軸は観測されるビート周波数であり、縦軸が信号強度である。
本開示はこのような状況に鑑みてなされたものであり、高精度に対象物体の距離を計測することを可能とする技術を提供するものである。
本明細書の記述は典型的な例示に過ぎず、本開示の請求の範囲又は適用例を如何なる意味に於いても限定するものではないことを理解する必要がある。
また、距離計測装置の光源部は、波長が異なる複数の光の周波数掃引周期が所定周期ずれるように複数の光を光周波数掃引して出力するように構成されている。
本実施形態では、さらに具体的に、下記式に基づいてドップラーシフト誤差を低減し、距離Lを算出することができる。
<距離計測装置の構成>
図5は、本開示の第1の実施形態による距離計測装置1の概略構成を示す図である。距離計測装置1は、半導体レーザ101及び103と、任意信号発生器102及び104と、ファイバカップラ105と、サーキュレータ106と、ファイバカップラ107と、参照用ミラー108と、コリメータレンズ(例えば、ファイバコリメータ)109と、ファイバカップラ111と、受光器112及び113と、コンピュータ(PC)114と、モニター115と、を備えている。
図6は、第1の実施形態による距離計測装置において検出される信号(検出信号)の例を示す図である。
プロセッサは、受光器112で検出した信号をA/D変換してデジタル信号を取得する。
プロセッサは、デジタル検出信号において、周波数掃引の上り領域の信号の切り出しを行う。
プロセッサは、ステップ702で切り出した信号をFFT処理する。
プロセッサは、ステップ703でFFT処理された信号からピーク周波数を検出する。
同様に、プロセッサは、受光器113で検出した信号をA/D変換してデジタル信号を取得する。
プロセッサは、デジタル検出信号において、周波数掃引の上り領域の信号の切り出しを行う。
プロセッサは、ステップ706で切り出した信号をFFT処理する。
プロセッサは、ステップ707でFFT処理された信号からピーク周波数を検出する。
プロセッサは、ステップ704及び708で得られたピーク周波数からドップラーシフトを除去し、正確な距離を算出する。
ステップ709の処理詳細は次のようになる。計測対象が振動した場合、半導体レーザ101が受けるドップラーシフト量は式(6)で表される。
そこで、式(8)を用いることで誤差なく正確な距離を求めることが可能となる。
上述の式(2)から距離Lを精度良く測定するためには、ビート周波数fbが変調周期Tの間、一定である必要がある。しかし、半導体レーザの特性として注入電流の変化量に対して光周波数の変化量は非線形であるため、計測精度が劣化するという課題がある。そこで、第2の実施形態では、一定の光路差を有する参照用の干渉計を用いて補正を行う、距離計測装置について提案する。
図8は、第2の実施形態による距離計測装置2の概略構成例を示す図である。図8の距離計測装置2は、図5の距離計測装置1と大部分において同じ構成を有している。相違点は、半導体レーザから照射した光をファイバカップラによって分岐して一部を参照用の干渉計に導光するところである。
そして、第1の実施形態で説明した処理と同様の処理をすることにより、高精度に距離を計測することが可能となる。
上述の式(2)から距離Lを精度良く測定するためには、ビート周波数fbが変調周期Tの間、一定である必要がある。しかし、半導体レーザの特性として注入電流の変化量に対して光周波数の変化量は非線形であるため、計測精度が劣化するという課題がある。そこで、第3の実施形態では、半導体レーザの注入電流を制御してビート周波数を一定にする、距離計測装置について提案する。
図9は、第3の実施形態による距離計測装置3の概略構成例を示す図である。図9の距離計測装置3は、図5の距離計測装置1と大部分において同じ構成を有している。相違点は、半導体レーザから照射した光をファイバカップラ901によって分岐して、一部を半導体レーザ101の注入電流を制御するフィードバック機構に導光することである。
半導体レーザ101から照射した光は、ファイバカップラ901によって分岐される。分岐された光の一方は、フィードバック機構(フィードバック回路)902に導光される。
<距離計測装置4の構成>
図11は、第4の実施形態による距離計測装置4の概略構成例を示す図である。距離計測装置4においては受光器が1つである点で、受光器を2つ備える距離計測装置1(図5参照)と異なる。
図12は、受光器1109で検出されたビート周波数の例を示す図である。図12において、ビート周波数が低いピーク周波数(受光器で検出されるビート信号)1201は、計測対象と参照ミラーまでの距離差が小さい半導体レーザ101に対応したビート周波数を示す。一方、周波数が高いピーク周波数(受光器で検出されるビート信号)1202は、計測対象と参照ミラーまでの距離差が大きい半導体レーザ103に対応したビート周波数を示す。これら2つのビート周波数を検出し、上述の式(8)に基づいて計測対象までの距離を正確に求めることができるようになる。
プロセッサは、受光器1109で検出した信号をA/D変換してデジタル信号を取得する。
プロセッサは、ステップ1301で得られたデジタル検出信号のうち周波数掃引周期の半周期分の領域の信号の切り出しを行う。
プロセッサは、ステップ1302で切り出した信号をFFT処理する。
プロセッサは、ステップ1303でFFT処理された信号から周波数の低い方のピーク周波数を検出する。
プロセッサは、ステップ1303でFFT処理された信号から周波数の高い方のピーク周波数を検出する。なお、ステップ1304とステップ1305の実行順序は逆であっても良い。
プロセッサは、ステップ1304及びステップ1305で検出された2つのピーク周波数から式(8)に基づき、ドップラーシフトを除去することにより、正確な距離を算出することができる。
<距離計測装置の構成>
図14は、第5の実施形態による距離計測装置5の概略構成例を示す図である。距離計測装置5では、距離計測装置4と同様に、受光器を1つ備える構成となっている。
この後の処理内容は第4の実施形態と同様である。
上述の式(2)から距離Lを精度良く測定するためには、ビート周波数fbが変調周期Tの間、一定である必要がある。しかし、半導体レーザの特性として注入電流の変化量に対して光周波数の変化量は非線形であるため、計測精度が劣化するという課題がある。そこで、第6の実施形態では、一定の光路差を有する参照用の干渉計を用いて補正を行う、距離計測装置について提案する。
図15は、第6の実施形態による距離計測装置6の概略構成例を示す図である。図15の距離計測装置6は、図11の距離計測装置4と大部分において同じ構成を有している。相違点は、半導体レーザから照射した光をファイバカップラによって分岐して一部を参照用の干渉計に導光することである。
その他の処理内容については第4の実施形態と同様である。
第7の実施形態は、第1乃至第6の実施形態による距離計測装置1乃至6の何れかを用いて計測対象の形状を測定するための形状測定装置に関するものである。
図16は、第7の実施形態による形状測定装置7であって、第1乃至第6の実施形態の何れか距離計測装置を備える装置の概略構成例を示す図である。
形状測定装置7は、3D形状計測部1601と、コンピュータ(PC)114と、モニター115と、を備えている。
図17は、第7の実施形態による形状計測処理を説明するためのフローチャートである。当該形状計測処理は、コンピュータ114が備えるプロセッサ(CPUやMPU)によって実行される。より具体的には、図17による形状計測処理を実行するためのプログラム(形状計測プログラム)がコンピュータ114のメモリ(図示せず)に格納されており、プロセッサが当該メモリから距離算出プログラムを読み込んで実行することになる。以下では、コンピュータ114のプロセッサ(以下、単に「プロセッサ」と称する)を動作主体として説明する。
プロセッサは、入力された指定範囲(例えば、ユーザが計測対象110の大きさを参考に入力する)内のある1つの座標点の情報に基づいて、距離計測部1602から出力されるレーザの走査角度を調整する。
プロセッサは、1軸ステージ1603を軸方向に動かして計測対象110にフォーカスを合わせる(フォーカス調整)。
プロセッサは、第1乃至第6の実施形態による距離計測装置で説明した処理を実行し、計測対象110までの距離を計測する。
プロセッサは、ステップ1701で決定したレーザの走査角度とステップ1703で計測された距離とから、計測対象110の3D座標を算出する。
プロセッサは、入力された指定範囲を全て測定したか判定する。全ての指定範囲(全ての座標点)が測定された場合(ステップ1705でYESの場合)、処理はステップ1706に移行する。まだ全ての指定範囲が測定されていない場合(ステップ1705でNOの場合)、処理はステップ1701に移行する。
プロセッサは、指定範囲の全座標点の3D形状計測結果を出力する。
図18は、第8の実施形態による内径計測装置8であって、第1乃至第6の実施形態の何れか距離計測置を備える装置の概略構成例を示す図である。
(i)各実施形態では、2つの光源を設けて波長が異なる光を出射するように構成しているが、1つの光源からは波長が異なる光を出射するようにしても良い。従って、半導体レーザ101及び103と、任意信号発生器102及び104とを含む構成を「光源部」と称することが可能である。また、波長が異なる光を2つ用いているが、波長が異なる光を3つ以上用いても良い。この場合、光源を3つ以上用いても良いし、光源部から3つ以上の光を発するようにしても良い。
本実施形態では、さらに具体的に、下記式に基づいてドップラーシフト誤差を低減し、距離Lを算出することができる。
102、104 信号発生器
106、1101、1105、1402 サーキュレータ
108、1103、1107 参照用ミラー
109 コリメータレンズ(ファイバコリメータ)
110 計測対象
112、113、203、805、810、1004、1109、1407、1510 受光器
114 コンピュータ(PC)
115 モニター
116 内径計測対象
201、1405、1406 参照用ミラー
202 ビームスプリッター
301 ビート信号
803、808、1002、1505、1506、1507 光ファイバ、
902、905 フィードバック機構(フィードバック回路)、
903、906 コンバイナー、
1005 信号発振器、
1006 ミキサー、
1104、1108、1401、1404、1503、1508 WDMカップラ、
1201、1202 受光器で検出されるビート信号
1601 3D形状計測部
1602、1802 距離計測部、
1603、1803 1軸ステージ、
1604、1804 フォーカスレンズ、
1605、1605 ガルバノミラー、
1805 反射プリズム、
1806 回転ステージ。
Claims (12)
- 光源から計測対象までの距離を計測する距離計測装置であって、
波長が異なる複数の出射光を出射する光源部と、
前記出射光を前記計測対象に照射する照射光学素子と、
前記出射光が前記計測対象で反射した反射光を受光する受光部と、
前記受光部が検出した信号を用いて前記光源から前記計測対象までの距離を算出するプロセッサと、を備え、
前記プロセッサは、
前記信号に基づいてそれぞれの波長に対応したピーク周波数を算出する周波数算出処理と、
それぞれの前記ピーク周波数に基づいて前記計測対象が振動することで生じるドップラーシフト誤差を低減し、前記距離を算出する距離算出処理と、
を実行する、距離計測装置。 - 請求項1において、
前記光源部から出射された前記複数の出射光は、出射直後は光軸が異なり、
さらに、前記複数の出射光を合波して同軸光とする合波光学素子を備え、
前記同軸光が前記計測対象に照射される、距離計測装置。 - 請求項2において、
前記合波光学素子は、WDMカップラ或いはダイクロイックミラーによって構成される、距離計測装置。 - 請求項2において、
前記同軸光を分岐させる分岐光学素子と、
参照ミラーと、をさらに備え、
前記分岐光学素子によって分岐された光の一部が、前記参照ミラーに導光され、
前記参照ミラーに導光される光以外の光が、前記照射光学素子に導光される、距離計測装置。 - 請求項4において、
前記分岐光学素子は、ファイバカップラであり、
前記照射光学素子は、コリメータレンズである、距離計測装置。 - 請求項1において、
前記受光部は、前記計測対象で反射した光を、前記出射光の波長に応じて受光する、距離計測装置。 - 請求項1において、
前記光源部は、前記波長が異なる複数の出射光の周波数掃引周期が所定周期ずれるように前記複数の出射光を光周波数掃引して出力する、距離計測装置。 - 請求項1において、さらに、
前記光源部における光周波数掃引の非線形性に起因する誤差を低減する校正用干渉計を備える、距離計測装置。 - 請求項1において、さらに、
前記光源部から出射された出射光の一部から前記光源部の注入電流を制御するための信号を生成し、当該信号を前記光源部にフィードバックするフィードバック機構を備える、距離計測装置。 - 請求項1に記載の距離計測装置と、
前記距離計測装置からの光のフォーカスを形状計測対象に合わせるフォーカスレンズと、
前記フォーカスが調整された光を前記形状計測対象の上で走査するためのミラーと、を備え、
前記プロセッサは、前記距離計測装置によって計測された前記光源部から前記形状計測対象までの距離と、前記フォーカスが調整された光の走査角度とを用いて、前記形状計測対象の3次元形状を計測し、3次元形状計測結果を出力する、形状計測装置。 - 光源から計測対象までの距離を計測する距離計測方法であって、
波長の異なる複数の出射光を出射することと、
前記出射光を前記計測対象に照射することと、
前記計測対象で反射した反射光を受光することと、
前記反射光を受光することにより得られる信号に基づいてそれぞれの波長に対応したピーク周波数を算出することと、
それぞれの前記ピーク周波数に基づいて、前記計測対象が振動することで生じるドップラーシフト誤差を低減し、前記距離を算出することと、
を含む距離計測方法。
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