WO2017179535A1 - Dispositif d'évaluation d'état d'une structure, système d'évaluation d'état et procédé d'évaluation d'état - Google Patents

Dispositif d'évaluation d'état d'une structure, système d'évaluation d'état et procédé d'évaluation d'état Download PDF

Info

Publication number
WO2017179535A1
WO2017179535A1 PCT/JP2017/014667 JP2017014667W WO2017179535A1 WO 2017179535 A1 WO2017179535 A1 WO 2017179535A1 JP 2017014667 W JP2017014667 W JP 2017014667W WO 2017179535 A1 WO2017179535 A1 WO 2017179535A1
Authority
WO
WIPO (PCT)
Prior art keywords
displacement
spatial distribution
state determination
dimensional spatial
differential
Prior art date
Application number
PCT/JP2017/014667
Other languages
English (en)
Japanese (ja)
Inventor
浩 今井
Original Assignee
日本電気株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電気株式会社 filed Critical 日本電気株式会社
Publication of WO2017179535A1 publication Critical patent/WO2017179535A1/fr

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M99/00—Subject matter not provided for in other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Definitions

  • the present invention relates to a technique for remotely determining the state of a defect or the like occurring in a structure.
  • Detecting defects such as cracks, delamination, and internal cavities in structures has been performed by visual inspection and hammering inspection by an inspector, and it is necessary for the inspector to approach the structure for inspection. For this reason, there are problems such as an increase in work cost by preparing an environment where work can be performed in the air and loss of economic opportunities by regulating traffic for setting the work environment.
  • a remote inspection method is desired.
  • Non-Patent Document 1 discloses a method for improving the detection accuracy of cracks by detecting the movement of a crack region from a moving image on the surface of a structure.
  • Patent Document 6 proposes a method of correcting an out-of-plane displacement from a displacement of a captured image in a method of measuring distortion generated on the surface of a measurement object.
  • the out-of-plane displacement is read from the side images before and after the deformation of the structure.
  • two video devices are provided, a first video device that images the surface of the structure and a second video device that images the side surface. That is, in this method, in order to photograph the side surface, another image device is required in addition to the image device that photographs the surface, and there is a problem in increasing the size and cost of the device.
  • Patent Document 7 discloses a method of illuminating pattern light and calculating a displacement from corresponding line segments between zoom-in image data and zoom-out image data.
  • pattern light illuminating means such as a projector is required to illuminate the pattern light, and the increase in size and cost of the apparatus are problems.
  • Patent Document 6 and Patent Document 7 when the apparatus is enlarged as in Patent Document 6 and Patent Document 7, for example, in the case of a bridge or the like, it is necessary to fix the imaging device or to secure an operator's scaffold in order to measure the side surface of the bridge. There is a problem that workability is deteriorated and measurement accuracy is lowered.
  • Patent Document 8 and Patent Document 9 disclose a method for obtaining the distance of a target object by superimposing and capturing two images with different optical paths using a single camera.
  • this method requires a means for performing processing for separating superimposed imaging in order to capture superimposed imaging on a single imaging device, and this processing is complicated and time consuming. It has become.
  • the present invention has been made in view of the above-described problems, and its purpose is to detect defects such as cracks, peeling, and internal cavities of a structure with high accuracy while controlling costs in a non-contact manner from a remote location. It is to make it possible.
  • the state determination apparatus of the present invention calculates a two-dimensional spatial distribution of the displacement of the image from the difference between the images of the structure surface at the first and second imaging distances, and before applying a load at the first imaging distance.
  • the first imaging distance is calculated from the two-dimensional spatial distribution of the displacement of the time-series image, and the amount of movement in the normal direction of the surface of the structure due to the load application is calculated using the first imaging distance.
  • a depth movement amount calculation unit calculates a correction amount based on the movement amount, and subtracts the correction amount from a two-dimensional spatial distribution of the displacement of the time-series image to obtain a two-dimensional spatial distribution of the displacement of the structure surface.
  • a displacement separating portion to be separated from the surface of the structure It has a two-dimensional spatial distribution and the amount of movement of the position, and the threshold value relating to the amount of movement and spatial distribution of pre-equipped was displaced, based on a comparison of, and a malfunction determination unit for specifying a defect of the structure.
  • the state determination system of the present invention calculates a two-dimensional spatial distribution of the displacement of the image from the difference between the images of the structure surface at the first and second imaging distances, and before applying a load at the first imaging distance.
  • the first imaging distance is calculated from the two-dimensional spatial distribution of the displacement of the time-series image, and the amount of movement in the normal direction of the surface of the structure due to the load application is calculated using the first imaging distance.
  • a depth movement amount calculation unit calculates a correction amount based on the movement amount, and subtracts the correction amount from a two-dimensional spatial distribution of the displacement of the time-series image to obtain a two-dimensional spatial distribution of the displacement of the structure surface.
  • Displacement separation part to be separated and the structure table An abnormality determination unit that identifies a defect of the structure based on a comparison between a two-dimensional spatial distribution of displacement and the amount of movement, and a spatial distribution of displacement provided in advance and a threshold value related to the amount of movement.
  • a two-dimensional spatial distribution of the displacement of the image is calculated from the difference between the images of the structure surface at the first and second imaging distances, and before applying the load at the first imaging distance.
  • a two-dimensional spatial distribution of the displacement of the time-series image is calculated from a difference between the image of the surface of the structure and a time-series image of the surface of the structure by applying a load, and the first two-dimensional spatial distribution of the displacement of the image
  • the moving distance in the normal direction of the surface of the structure due to the load application is calculated from the two-dimensional spatial distribution of the displacement of the time series image using the first imaging distance, and the moving distance is calculated.
  • a correction amount is calculated based on the two-dimensional spatial distribution, and the two-dimensional spatial distribution of the displacement of the structure surface is separated by subtracting the correction amount from the two-dimensional spatial distribution of the displacement of the time-series image.
  • the two-dimensional spatial distribution and the movement amount are provided in advance.
  • a threshold for the movement amount and spatial distribution of the displacement based on a comparison of, identifying a defect in the structure.
  • the state determination apparatus of the present invention calculates a two-dimensional spatial distribution of the displacement of the image from the difference between the images of the structure surface at the first and second imaging distances, and before applying a load at the first imaging distance.
  • a displacement calculation unit for calculating a two-dimensional spatial distribution of the displacement of the time-series image from a difference between the image of the surface of the structure and a time-series image of the surface of the structure by applying a load, and a two-dimensional spatial distribution of the displacement of the image
  • the first imaging distance is calculated from the two-dimensional spatial distribution of the displacement of the time-series image, and the amount of movement in the normal direction of the surface of the structure due to the load application is calculated using the first imaging distance.
  • a depth movement amount calculation unit; and an abnormality determination unit that identifies a defect of the structure based on a comparison between the movement amount and a threshold value relating to the movement amount provided in advance.
  • a two-dimensional spatial distribution of the displacement of the image is calculated from the difference between the images of the structure surface at the first and second imaging distances, and before applying the load at the first imaging distance.
  • a two-dimensional spatial distribution of the displacement of the time-series image is calculated from a difference between the image of the surface of the structure and a time-series image of the surface of the structure by applying a load, and the first two-dimensional spatial distribution of the displacement of the image
  • the moving distance in the normal direction of the surface of the structure due to the load application is calculated from the two-dimensional spatial distribution of the displacement of the time series image using the first imaging distance, and the moving distance is calculated.
  • a defect of the structure is specified based on a comparison with a threshold value relating to the movement amount provided in advance.
  • FIG. 1 is a block diagram illustrating a configuration of a state determination device according to an embodiment of the present invention.
  • the state determination device 100 calculates a two-dimensional spatial distribution of the displacement of the image from the difference between the images of the structure surface at the first and second imaging distances, and loads at the first imaging distance.
  • a displacement calculation unit 101 that calculates a two-dimensional spatial distribution of the displacement of the time-series image from the difference between the image of the structure surface before application and the time-series image of the structure surface by applying a load.
  • the first imaging distance is calculated from the two-dimensional spatial distribution of the displacement of the image
  • the amount of movement in the normal direction of the structure surface due to the load application is calculated from the two-dimensional spatial distribution of the displacement of the time-series image.
  • a depth movement amount calculation unit 102 that calculates using the first imaging distance is provided.
  • a displacement separation unit that calculates a correction amount based on the movement amount, subtracts the correction amount from a two-dimensional spatial distribution of the displacement of the time-series image, and separates the two-dimensional spatial distribution of the displacement of the structure surface. 103.
  • an abnormality that identifies a defect in the structure based on a comparison between a two-dimensional spatial distribution of displacement of the structure surface and the amount of movement, and a spatial distribution of displacement provided in advance and a threshold value related to the amount of movement.
  • the determination unit 104 is included.
  • the imaging distance on the surface of the structure and the amount of movement in the normal direction of the surface of the structure due to load application can be obtained. Furthermore, an out-of-plane displacement due to the movement of the surface of the structure in the normal direction can be obtained using the movement amount. By subtracting this out-of-plane displacement from the displacement caused by the load on the image of the structure surface, the in-plane displacement of the structure surface can be separated. According to the state determination apparatus 100, the above processing can be easily performed with good workability, and therefore, detection that distinguishes defects such as cracks, peeling, and internal cavities of the structure can be performed remotely and accurately with no contact. Is possible.
  • FIG. 2 is a block diagram illustrating a configuration of a state determination system according to the second embodiment of this invention.
  • the state determination system 10 includes a state determination device 1 and an imaging device 11.
  • the imaging device 11 captures the surface of the structure 20 before and after applying a load to the structure 20 as a time-series image on the XY plane, and inputs the captured image information to the state determination device 1.
  • the imaging device 11 also captures an image of the surface of the structure 20 at an imaging distance before applying a load and an image of the surface of the structure 20 at an imaging distance different from the imaging distance, and these images. Information is input to the state determination device 1.
  • the state determination device 1 acquires the image information as described above from the imaging device 11.
  • the structure 20 as the object to be measured has a beam-like structure supported at two points, but is not limited to this.
  • various defects 21 may exist in the structure 20.
  • FIG. 3 is a block diagram showing a configuration of the state determination device 1.
  • the state determination device 1 includes a displacement calculation unit 2, a depth movement amount calculation unit 3, a displacement separation unit 4, a differential displacement calculation unit 5, an abnormality determination unit 6, and an abnormality map creation unit 9.
  • the abnormality determination unit 6 includes a three-dimensional spatial distribution information analysis unit 7 and a time change information analysis unit 8.
  • FIG. 4 is a block diagram illustrating a configuration of the imaging device 11.
  • the imaging device 11 includes an optical path length control unit 12, a lens 13, an imaging element 14, and a processing circuit 15.
  • the lens 13, the image sensor 14, and the processing circuit 15 constitute an imaging camera.
  • the processing circuit 15 inputs an image of the surface of the structure 20 formed on the imaging surface of the imaging device 13 by the lens 13 to the state determination device 1.
  • the optical path length control unit 12 can change the optical path length (imaging distance) from the lens 13 to the surface of the structure 20 to be imaged.
  • the displacement calculation unit 2 of the state determination device 1 calculates the displacement for each (X, Y) coordinate on the XY plane of the time-series image. That is, using the frame image before the load application captured by the imaging device 11 as a reference, the displacement in the frame image at the first time after the load application is calculated from the difference between these frame images. Next, the displacement of the image before the load application is calculated for each time series image, such as the displacement of the frame image at the next time after the load application, and further the displacement of the frame image at the next time.
  • the displacement calculation unit 2 also changes the imaging distance of the surface of the structure 20 before the load is applied by the optical path length control unit 12 for each (X, Y) coordinate on the XY plane. Calculate the displacement.
  • the displacement calculation unit 2 can calculate the displacement using image correlation calculation. Further, the displacement calculating unit 2 can also represent the calculated displacement as a displacement distribution diagram having a two-dimensional spatial distribution on the XY plane.
  • the depth movement amount calculation unit 3 calculates the imaging distance before applying the load from the displacement of the image of the surface of the structure 20 having a different imaging distance. Further, the depth movement amount calculation unit 3 calculates, using the calculated imaging distance, a movement amount by which the surface of the structure 20 moves in the normal direction due to the deflection of the structure 20 from the displacement of the time-series image. To do. The depth movement amount calculation unit 3 inputs the movement amount to the displacement separation unit 4, the differential displacement calculation unit 5, and the abnormality determination unit 6.
  • the displacement separation unit 4 calculates a displacement based on the movement amount included in the displacement of the time-series image (referred to as out-of-plane displacement) using the calculated movement amount. Furthermore, the displacement separation unit 4 separates the displacement (referred to as in-plane displacement) generated on the surface of the structure 20 by subtracting the out-of-plane displacement from the displacement of the time-series image. The displacement separation unit 4 inputs the separated in-plane displacement to the differential displacement calculation unit 5 and the abnormality determination unit 6.
  • the differential displacement calculation unit 5 performs spatial differentiation on the displacement or displacement distribution diagram of the time-series image and the movement amount, and the differential displacement or the calculated differential displacement is converted into a two-dimensional differential space distribution on the XY plane. The distribution map and differential movement amount are calculated. The differential displacement calculation unit 5 inputs the calculation result to the abnormality determination unit 6.
  • the abnormality determination unit 6 determines the state of the structure 20 based on the input calculation result. That is, the abnormality determination unit 6 determines the location and type of the abnormality (defect 21) of the structure 20 from the analysis results of the three-dimensional spatial distribution information analysis unit 7 and the time change information analysis unit 8. Furthermore, the abnormality determination unit 6 inputs the determined abnormality location and type of the structure 20 to the abnormality map creation unit 9.
  • the abnormality map creation unit 9 maps the spatial distribution of the abnormal state of the structure 20 to the XY plane, records it as an abnormality map, and outputs the result.
  • the state determination device 1 can be an information device such as a PC (Personal Computer) or a server.
  • a CPU Central Processing Unit
  • HDD Hard Disk Drive
  • FIG. 5A to 5D are diagrams for explaining the relationship between various abnormal states of the structure 20 and in-plane displacement of the surface.
  • FIG. 5A is a side view of the beam-like structure 20 supported at two points.
  • the imaging device 11 is arranged to image the lower surface of the structure 20 in the imaging direction (Z direction).
  • Z direction the imaging direction
  • a compressive stress is applied to the upper surface of the structure 20 and a tensile stress is applied to the lower surface with respect to the vertical load from the upper surface of the structure 20.
  • the structure 20 may not be a beam-like structure that is supported at two points as long as the same stress is applied.
  • the stress is proportional to the strain.
  • the Young's modulus which is a proportional constant, depends on the material of the structure. Since the strain proportional to the stress is a displacement per unit length, the strain can be calculated by spatially differentiating the result calculated by the displacement separation unit 4 by the differential displacement calculation unit 5. That is, the stress field can be obtained from the result of the differential displacement calculation unit 5.
  • the displacement of the structure surface to be measured in FIGS. 5A to 5D is an in-plane displacement (X direction and Y direction) in the XY plane. Therefore, the displacement separation unit 4 uses the apparent displacement (out-of-plane displacement) based on the amount of movement of the surface of the structure 20 in the normal direction due to the load calculated by the depth movement amount calculation unit 3 as a correction amount.
  • the in-plane displacement is separated by calculating and subtracting this out-of-plane displacement.
  • a method for calculating the out-of-plane displacement will be described.
  • the normal line is referred to when the surface is a curved surface, when the surface has a plurality of small curved surfaces and forms a large curved surface as a whole, the normal line for the large curved surface is used here. Moreover, although it is called a perpendicular for the case where the surface is a plane, in the following description, it will be expressed as a normal line for simplicity.
  • FIG. 6 is a diagram for explaining the out-of-plane displacement when the lower surface of the structure is imaged (see FIG. 2) when the structure 20 is bent due to the load.
  • the amount of movement of the surface of the structure 20 in the normal direction (Z direction) is caused by the deflection of the structure and is expressed as a deflection amount ⁇ .
  • the amount of movement of the surface in the Z direction is not limited to the amount of deflection, and may include, for example, the amount of movement when the entire structure 20 sinks due to a load.
  • the imaging surface of the imaging device 14 of the imaging device 11 has a two-dimensional space of displacement of the structure surface in the X direction.
  • ⁇ x i corresponding to the in-plane displacement ⁇ x which is the distribution
  • an out-of-plane displacement ⁇ x i occurs due to the deflection amount ⁇ .
  • ⁇ y i corresponding to the in-plane displacement ⁇ y and an out-of-plane displacement ⁇ y i due to the deflection amount ⁇ are generated in the Y direction.
  • the out-of-plane displacements ⁇ x i , ⁇ y i, and in-plane displacements ⁇ x i , ⁇ y i are: L is the imaging distance, f is the lens focal length, and (x, y) is the coordinate from the imaging center of the structure surface. They are represented by Formula 1, Formula 2, Formula 3, and Formula 4, respectively.
  • the distance x from the imaging center on the surface of the structure 20 is 200 mm.
  • the external displacement ⁇ x i is 1.6 ⁇ m from Equation 1.
  • the in-plane displacement ⁇ x i of the imaging surface is 1.6 ⁇ m from Equation 3.
  • Formulas 1 and Formula 2 are combined as out-of-plane displacement vectors ⁇ i ( ⁇ x i , ⁇ y i ), and Formulas 3 and 4 are combined as in-plane displacement vectors ⁇ i ( ⁇ x i , ⁇ y i ), Formulas 5 and 6 are respectively obtained. It becomes.
  • FIG. 7 is a diagram illustrating the relationship between the out-of-plane displacement vector ⁇ i ( ⁇ x i , ⁇ y i ) and the in-plane displacement vector ⁇ i ( ⁇ x i , ⁇ y i ) expressed by Equations 5 and 6. 7, out-of-plane displacement vector ⁇ i ( ⁇ x i, ⁇ y i) the radial vector group (thin solid line arrow in FIG. 7), and its size, R (x, y) Formula from Equation 1 and Equation 2 It becomes like 7.
  • Equation 7 if the deflection amount ⁇ is constant, the magnitude thereof is a value proportional to the distance from the imaging center, and if the proportionality constant is set to k as shown in Equation 8, Equation 7 becomes Equation 9 It is expressed as follows.
  • the displacement distribution calculated by the displacement calculation unit 2 includes an out-of-plane displacement vector ⁇ i ( ⁇ x i , ⁇ y i ) (thin solid line arrow in FIG. 7) and an in-plane displacement vector ⁇ i ( ⁇ x i , ⁇ y i ). It is a measurement vector V (Vx, Vy) (dotted line arrow in FIG. 7) which is a combined vector with (a thick solid line arrow in FIG. 7).
  • V (Vx, Vy) dotted line arrow in FIG. 7
  • the magnitude of the measurement vector V (Vx, Vy) is Rmes (x, y), it is expressed as Expression 10 and Expression 11.
  • 8A and 8B are graphs showing examples of values of the magnitude R (x, y) of the out-of-plane displacement vector ⁇ i ( ⁇ x i , ⁇ y i ) given by the equations 7, 8, and 9.
  • 8A and 8B are graphs showing the magnitude R (x, y) of the out-of-plane displacement vector when the deflection amount ⁇ is 1 mm and 4 mm, respectively, and the imaging distance L before deflection of both graphs is 5000 mm.
  • the focal length f is 50 mm.
  • both graphs are similar in shape, and the larger the deflection amount ⁇ , the larger the enlargement ratio. This enlargement ratio corresponds to the proportionality constant k given by Equation 8.
  • FIG. 9 is a graph in which the magnitude Rmes (x, y) of the measurement vector V (Vx, Vy) is superimposed on the graph of FIG. 8B.
  • Rmes (x, y) is indicated by a thin solid line.
  • Rmes (x, y) is a magnitude R (x of the out-of-plane displacement vector when the magnitude R (x, y) of the out-of-plane displacement vector is larger than the in-plane displacement vector ⁇ i ( ⁇ x i , ⁇ y i ).
  • Y the enlargement rate of R (x, y) can be estimated from Rmes (x, y).
  • the enlargement ratio of R (x, y) is estimated by obtaining a proportionality constant k that minimizes the evaluation function E (k) shown in Expression 12.
  • the calculation of the enlargement factor k using Equation 12 is performed using the least square method.
  • the evaluation function E (k) may use a sum of absolute values, another sum of powers, or the like other than the square sum of the difference between Rmes (x, y) and R (x, y).
  • the displacement separation unit 4 performs an operation of converting the estimated enlargement factor k into a deflection amount ⁇ using Expression 8, and estimates an out-of-plane displacement vector.
  • the displacement separation unit 4 further extracts the in-plane displacement vector by subtracting the out-of-plane displacement vector as a correction amount from the measurement vector obtained by the displacement calculation unit 2.
  • the out-of-plane displacement is calculated, and the calculated out-of-plane displacement is subtracted from the measured displacement to calculate the in-plane displacement.
  • An example of extraction will be described.
  • a time series image obtained by imaging the lower surface of the structure 20 shown in FIG. 2 from the imaging direction shown in the drawing before and after applying the load is used.
  • the imaging distance is 5 m
  • the structure 20 is concrete having a length of 20 m, a thickness of 0.5 m, and a width of 10 m (Young's modulus is 40 GPa).
  • the region where the displacement of the image is measured is in the range of ⁇ 200 mm in both the X direction and the Y direction, with the crack portion on the surface of the structure 20 as the image center.
  • the focal length of the lens 13 of the imaging device 11 is 50 mm
  • the pixel pitch of the imaging element 14 is 5 ⁇ m
  • a pixel resolution of 250 ⁇ m is obtained at an imaging distance of 5 m.
  • the imaging device 14 of the imaging device 11 is a monochrome device having 2000 pixels horizontally and 2000 pixels vertically so that a range of 0.5 m ⁇ 0.5 m can be imaged at an imaging distance of 5 m.
  • the frame rate of the image sensor 14 is 60 Hz.
  • sub-pixel displacement estimation by quadratic curve interpolation is used so that displacement can be estimated up to 1/100 pixels so that a displacement resolution of 2.5 ⁇ m can be obtained. it can.
  • the image displacement measurement region (in the range of ⁇ 200 mm to 200 mm in both the X direction and the Y direction) is horizontal 1600 pixels and vertical 1600 pixels.
  • the calculation of Expression 1 to Expression 12 is performed for this pixel region.
  • FIG. 10A showing the displacement in the X direction
  • a displacement of ⁇ 170 ⁇ m occurs in the imaging range of ⁇ 200 mm.
  • FIG. 10B showing the displacement in the Y direction
  • a displacement of ⁇ 160 ⁇ m is linearly generated in the imaging range of ⁇ 200 mm.
  • the displacement in the X direction is a displacement in which an out-of-plane displacement is superimposed on an in-plane displacement.
  • the displacement in the Y direction is a displacement of only out-of-plane displacement.
  • the proportionality constant k that minimizes the evaluation function E (k) of Equation 12 is obtained as 0.000008 by the least square method.
  • the deflection amount ⁇ is obtained as 4 mm and becomes the output of the depth movement amount calculation unit 3.
  • the out-of-plane displacement vector ⁇ i ( ⁇ x i , ⁇ y i ) is obtained by the displacement separation unit 4.
  • the displacement separation unit 4 further subtracts the out-of-plane displacement vector ⁇ i ( ⁇ x i , ⁇ y i ) from the measurement vector V (Vx, Vy) obtained by the displacement calculation unit 2 to thereby obtain an in-plane displacement vector ⁇ i ( ⁇ x i , ⁇ y i ) are obtained, and in-plane displacements in the X direction and the Y direction are calculated from Equation 6.
  • FIGS. 11A and 11B show the output of the displacement separation unit 4.
  • FIG. 11A is a graph showing the displacement in the X direction, and a discontinuous rapid 20 ⁇ m displacement occurs in the cracked portion.
  • FIG. 11B is a graph showing the displacement in the Y direction, and the displacement is zero.
  • the out-of-plane displacement can be separated to extract the in-plane displacement of the structure surface.
  • the depth movement amount calculation unit 3 calculates the imaging distance L from the switching of the optical path length in the optical path length control unit 12 of the imaging device 11.
  • the optical path length control unit 12a of the imaging device 11a includes a parallel plate glass 12a1 and a movable mechanism 12a2.
  • the parallel flat glass 12a1 has a refractive index n and a thickness t of the lens 13 in the optical axis direction.
  • the movable mechanism 12a2 switches whether the parallel plate glass 12a1 is inserted into the optical path or not when the imaging device 11a images the surface of the structure 20.
  • FIG. 12A shows a case where the parallel flat glass 12a1 is not inserted. In this case, the imaging distance is L.
  • FIG. 12B is a case where the parallel flat glass 12a1 is inserted. At this time, the apparent optical path length variation ⁇ ′ due to the insertion of the parallel flat glass 12 a 1 is as shown in Equation 13.
  • This optical path length change amount ⁇ ′ can be handled in the same manner as the deflection amount ⁇ causing the change in the imaging distance of Equations 1 to 8. Therefore, using ⁇ ′ instead of ⁇ , a proportionality constant k that minimizes the evaluation function E (k) of Expression 12 is obtained from the displacement of the image with and without the parallel flat glass 12a1 being inserted.
  • the imaging distance L is calculated using Equation 8 from the obtained proportionality constant k, the optical path length change amount ⁇ ′ obtained from Equation 13, and the known focal length f.
  • ⁇ ′ is 4 mm according to Equation 13.
  • the proportionality constant k that minimizes the evaluation function E (k) of Equation 12 using the measurement vector V (Vx, Vy) obtained by the displacement calculation unit 2 from the displacement of the image with and without the insertion of the parallel flat glass 12a1. Is obtained by the method of least squares, and 0.000008 is obtained.
  • the optical path length control unit 12a is not limited to the parallel plate glass 12a1, and the refractive index may be changed by an element having an electrooptic effect such as liquid crystal.
  • the imaging device 11 is not limited to the imaging device 11a of FIG. 12A and FIG. 12B.
  • FIG. 13 is a diagram for explaining a state in which the optical path length is switched by the optical path length control unit 12b having a configuration different from that in FIGS. 12A and 12B.
  • the optical path length control unit 12b of the imaging device 11b (the processing circuit 15 is omitted) includes a mirror 12b1 and a movable mechanism 12b2 that moves the mirror 12b1 in the optical axis direction (Z-axis direction). Further, in the image pickup apparatus 11b, an image can be formed on the image pickup element 14 by moving the lens 13 and the image pickup element 14 in conjunction with the movable mechanism 12b2. As described above, according to the imaging device 11b, the optical path length can be changed by moving the mirror 12b1 by the movable mechanism 12b2, and thus the imaging distance L can be obtained.
  • FIG. 14 is a diagram for explaining a state in which the optical path length is switched by the optical path length control unit 12c having still another configuration.
  • the optical path length control unit 12c of the imaging device 11c (the processing circuit 15 is omitted) includes a half mirror 12c1, a mirror 12c2, and a lens 13.
  • the imaging device 11c can capture the image 2 at the imaging distance L + ⁇ ′ by the optical path length control unit 12c together with the image 1 at the imaging distance L. If the optical path does not pass through the center (optical axis) and an image is formed on a plurality of optical paths, the lens 13 has imaging characteristics as long as the image 1 and the image 2 are divided and focused on the optical axis. Is not greatly reduced, and even a general-purpose lens can be geometrically corrected by image processing.
  • the displacement calculation unit 2 of the state determination device 1 cuts out portions of the image 1 and the image 2 captured by the image sensor 14 and calculates the displacement of the image 2 with respect to the image 1.
  • the depth movement amount calculation unit 3 can obtain the imaging distance L from the displacement of the image as in FIGS. 12A-B and FIG.
  • the depth movement amount calculation unit 3 can obtain the imaging distance for each time-series image. That is, the depth movement amount calculation unit 3 can obtain the deflection amount ⁇ (movement amount) for each time series image from the imaging distance obtained for each time series image.
  • the displacement separation unit 4 can obtain an out-of-plane displacement vector using the amount of movement and the imaging distance L before applying the load.
  • the displacement separating unit 4 can also subtract the in-plane displacement vector by subtracting the out-of-plane displacement vector from the measurement vector of the time-series image acquired from the displacement calculating unit 2.
  • Non-Patent Document 2 discloses a two-lens camera configuration in which two sets of two mirrors are attached to a normal camera having a lens and an imaging element. On the other hand, in the method of FIG. 14, it is only necessary to add the half mirror 12c1 and the mirror 12c2, and the number of additional parts can be suppressed.
  • the lens has a configuration in which the optical path does not pass through the center and images a plurality of optical paths.
  • the imaging is performed by switching the optical path length by the optical path length control unit 12 provided in the imaging device 11.
  • the distance L can be obtained.
  • the state determination system 10 of the present embodiment that can measure the imaging distance together with the imaging of the time series images of the surface of the structure, the imaging distance can be easily and accurately obtained.
  • FIG. 15 is a diagram illustrating a case where the structure 20 has an inclination in the calculation method of out-of-plane displacement.
  • the coordinate with the optical axis of the imaging device 11 as the z axis and the normal of the structure surface is z.
  • Equation 14 Equation 15
  • Equation 16 Equation 16
  • Equation 19 a function obtained by substituting Equation 19 and Equation 20 into Equation 7 is obtained.
  • ⁇ is changed from 0 ° to 90 ° in increments of 0.5 °, for example, and the evaluation function E of Equation 12 is used using the function R ( ⁇ ) at each angle ⁇ .
  • the angle that minimizes the evaluation function E (k) among all the obtained k ( ⁇ ) is defined as the inclination angle.
  • the deflection amount ⁇ is obtained from the relationship between k at this inclination angle and Equation 8.
  • the out-of-plane displacement vector ⁇ i ( ⁇ x i , ⁇ y i ) can be estimated from the relationship between the obtained inclination angle and the amount of deflection ⁇ and the expressions 14, 15, 16, 17, 17, 18, and 20.
  • the displacement separation unit 4 obtains the in-plane displacement vector ⁇ i ( ⁇ x i , ⁇ y i ) by subtracting the out-of-plane displacement vector ⁇ i ( ⁇ x i , ⁇ y i ) from the measurement vector V (Vx, Vy).
  • the in-plane displacement vector ⁇ i ( ⁇ x i , ⁇ y i ) the projection onto the surface after application of the load is calculated using Expression 14, Expression 15, Expression 16, Expression 17, and Expression 18 to obtain the structure.
  • the in-plane displacement of the object can be obtained.
  • the in-plane displacement of the structure surface which is the output of the displacement separation unit 4, is replaced with the distortion of the structure surface by the differential displacement calculation unit 5. Multiplying the strain on the surface of the structure by the Young's modulus results in stress, and from this, the stress field on the surface of the structure is obtained.
  • the displacement information obtained by the displacement separation unit 4, the strain information obtained by the differential displacement calculation unit 5, and the movement amount obtained by the depth movement amount calculation unit 3 are input to the abnormality determination unit 6.
  • the abnormality determination unit 6 determines the type of defect based on the displacement information obtained by the displacement separation unit 4, the strain information obtained by the differential displacement calculation unit 5, and the movement amount obtained by the depth movement amount calculation unit 3. And identify the location. For this reason, the abnormality determination unit 6 preliminarily instructs the three-dimensional spatial distribution information analysis unit 7 and the time change information analysis unit 8 to determine a threshold value for determining a defect, a characteristic displacement corresponding to the type of defect, It has a distortion pattern.
  • the three-dimensional spatial distribution information analysis unit 7 and the time change information analysis unit 8 are shown in FIG. 5A to FIG. 5D by comparing displacement information, strain information, movement amount and the threshold value, and pattern matching with the pattern. Determine the healthy state or defects such as cracks, delamination and internal cavities.
  • FIG. 11A shows an example of in-plane displacement of the surface in the X direction of the structure due to load application when a crack along the Y direction exists. It can be seen that a 20 ⁇ m discontinuous in-plane displacement occurs in the cracked portion. Such a sudden displacement does not occur in a healthy state with no defects. Therefore, it is possible to detect a crack by confirming a displacement exceeding this by providing a threshold value for the magnitude of discontinuous displacement in advance.
  • FIG. 16A and FIG. 16B are diagrams showing the distribution of the stress field around the crack portion calculated by the differential displacement calculation unit 5 when there is a crack along the Y direction.
  • FIG. 16A since the stress direction is bent by the crack, even when tensile stress is applied to both ends of the structure in the X direction in FIG. Thus, a component in the Y direction is generated. Therefore, cracks can also be detected by detecting the presence or absence of the component in the Y direction.
  • the distribution of the stress field around the crack is known as a stress intensity factor in an elastic body showing a linear response, the information can also be used.
  • FIGS. 17A to 17D show examples of the two-dimensional displacement distribution of the displacement around the crack.
  • 17A and 17B are displacement contour lines in the horizontal direction (X direction) and the direction perpendicular to the paper surface (Y direction) in FIG. 5B, respectively.
  • the displacement contour line in the X direction has an abrupt displacement at the position of the crack. This corresponds to an abrupt displacement at the crack portion shown in FIG. 11A.
  • the density of the contour lines is sparser than in the region where there is no crack.
  • the region in which the displacement contour lines are sparse corresponds to a gentle displacement portion outside the rapid displacement at the crack portion shown in FIG. 11A. The displacement at this portion is gentler than the displacement when there is no crack.
  • FIGS. 17C and 17D show the cases where the cracks are deeper than those in FIGS. 17A and 17B, respectively.
  • the density of the displacement contour lines becomes sparser around the crack in each of the X direction and the Y direction. It is also possible to know the depth of cracks from this density information.
  • the above-described crack determination is performed by the three-dimensional spatial distribution information analysis unit 7 of the abnormality determination unit 6 of the state determination device 1 in FIG.
  • the strain in the X direction increases rapidly at the cracked portion. From this, it is possible to estimate that there is a crack at a location where a strain exceeding the threshold is detected by providing a threshold in advance in the value of strain in the X direction.
  • Each of the above threshold values can be set by a simulation using the same dimensions and materials as the structure or an experiment using a reduced model. Furthermore, an actual structure can be set from data accumulated by measuring over a long period of time.
  • the above determination can also be made by a pattern matching process as described below, without using the above numerical comparison.
  • FIGS. 17A to 17D are diagrams for explaining the pattern distribution processing of the displacement distribution by the three-dimensional spatial distribution information analysis unit 7.
  • the displacement can be represented as a displacement distribution diagram on the XY plane.
  • the three-dimensional spatial distribution information analysis unit 7 rotates and enlarges / reduces the X-direction pattern of the displacement around the crack stored in advance, and the displacement distribution diagram obtained by the displacement separation unit 4
  • the X-direction pattern of the displacement around the crack stored in advance can be created in advance by simulation or the like for each depth and width of the crack.
  • the three-dimensional spatial distribution information analysis unit 7 rotates and enlarges / reduces the pre-stored displacement around the crack in the Y direction, and the displacement distribution obtained by the displacement separation unit 4
  • the direction and depth of the crack are determined by pattern matching with the figure.
  • the Y-direction pattern of the displacement around the crack stored in advance can be created in advance by simulation or the like for each depth and width of the crack.
  • the three-dimensional spatial distribution information analysis unit 7 rotates and enlarges / reduces the previously stored differential vector field pattern around the crack, and the differential displacement calculation unit 5 obtains it.
  • the direction and depth of the crack are determined by pattern matching with a differential vector field (corresponding to a stress field).
  • the differential vector field pattern of the displacement around the crack stored in advance can be created in advance by simulation or the like for each depth and width of the crack.
  • the correlation calculation is used for the pattern matching.
  • Various other statistical calculation methods may be used for pattern matching.
  • FIG. 19A and 19B show a two-dimensional distribution of stress on the surface viewed from the imaging direction when an internal cavity as shown in FIG. 5D exists.
  • FIG. 19A is a perspective view
  • FIG. 19B is a plan view.
  • stress acts in the X direction of the figure due to the load, but the stress field bends in the hollow portion, and therefore there is a component in the Y direction of the figure in the stress.
  • FIG. 20A to 20C are diagrams showing the contour lines of the displacement of the surface and the stress field as seen from the imaging direction in the presence of the internal cavity.
  • FIG. 20A shows the contour lines of the displacement X component
  • FIG. 20A shows the contour lines of the displacement Y component.
  • FIG. 20B shows the stress field
  • FIG. 20C shows the stress field.
  • the density of contour lines of the X component of the displacement shown in FIG. 20A is reduced.
  • the contour line of the Y component of the displacement shown in FIG. 20B is a closed curve.
  • the stress field that is the differential of the displacement shown in FIG. 20C is bent at the hollow portion. Since the influence of the surface stress field becomes more prominent as the cavity portion is closer to the surface, the depth from the surface of the cavity portion can also be estimated from the bending method of the stress field.
  • the displacement pattern in the X direction of the displacement around the cavity, the displacement pattern in the Y direction of the displacement around the cavity, and the differential vector field (corresponding to the stress field) stored in advance in the three-dimensional spatial distribution information analysis unit 7 As in the case of determining a crack, applying FIG. 20A to FIG. 18A, FIG. 20B to FIG. 18B, and FIG. 20C to FIG. 18C makes it possible to determine the state of the position and depth of the internal cavity. For the pattern matching, correlation calculation is used, but other statistical calculation methods may be used.
  • FIG. 21A and 21B are diagrams for explaining the response when a load is applied to a structure having an internal cavity for a short time (referred to as impulse stimulation).
  • Impulse stimulation can be applied, for example, to a position where a load is applied.
  • FIG. 21B shows the time response of displacement at each point on the surface of A, B, and C shown in FIG. 21A in response to this impulse stimulus.
  • stress transmission is fast and the amplitude of displacement is large.
  • point C since stress is not transmitted in the internal cavity, stress is transmitted from the periphery of the cavity, so that stress transmission is slow and the displacement amplitude is small.
  • the stress transmission time and amplitude at the point B which is between the points A and C are intermediate values between the points A and C. Therefore, when the frequency distribution of the displacement distribution in the plane of the structure viewed from the imaging direction is analyzed by the time change information analysis unit 8 in the abnormality determination unit 6, the region of the internal cavity is determined from the amplitude and phase near the resonance frequency. Can be identified. Further, the internal cavity may be determined from the shift of the resonance frequency.
  • the internal cavity region can be specified by the time change information analysis unit 8.
  • the time response processing of the above displacement is performed by frequency analysis using fast Fourier transform in the time change information analysis unit 8.
  • frequency analysis various frequency analysis methods such as wavelet transform may be used.
  • 22A to 22C are diagrams showing the contour lines of the displacement of the surface and the stress field as seen from the imaging direction when there is peeling.
  • 22A shows the contour line of the X component of the displacement
  • FIG. 22B shows the contour line of the Y component of the displacement
  • FIG. 22C shows the stress field.
  • FIG. 22A shows the contour line of the X component of the displacement. Since the peeled portion is not distorted and moves in a certain direction, there is no contour line. The abnormality determination unit 6 can determine that there is peeling using this feature. In addition, since the point A in the figure is difficult to transmit stress due to tearing due to peeling, the contour lines are sparse compared to the point B which is a healthy part. The abnormality determination unit 6 may determine the peeled portion and the healthy portion using this property.
  • FIG. 22B shows the contour line of the Y component of the displacement.
  • a displacement in the Y direction occurs outside the outer periphery of the peeled portion.
  • the abnormality determination unit 6 can determine that there is peeling using this feature.
  • the stress field which is the differential of the displacement shown in FIG. 22C is 0 or a value in the vicinity thereof at the peeled portion.
  • the abnormality determination unit 6 can determine that there is peeling using this feature.
  • the displacement pattern in the X direction of the displacement around the separation, the displacement pattern in the Y direction of the displacement around the cavity, and the differential vector field (corresponding to the stress field) stored in advance in the three-dimensional spatial distribution information analysis unit 7 As in the case of determining the depth of the crack, applying FIG. 22A to FIG. 18A, FIG. 22B to FIG. 18B, and FIG. 22C to FIG.
  • correlation calculation is used, but other statistical calculation methods may be used.
  • FIG. 23 is a diagram showing a time response when a structure having delamination receives an impulse stimulus.
  • the peeled portion and the healthy portion have waveforms in which the displacement directions are opposite, that is, the phases are 180 ° different.
  • the amplitude is large.
  • the separation portion can be identified from the amplitude and phase.
  • the peeled portion may include a frequency component different from that of the entire structure. Therefore, the peeled portion may be determined from a shift in resonance frequency.
  • the frequency analysis in the time change information analysis unit 8 uses fast Fourier transform.
  • various frequency analysis methods such as wavelet transform may be used.
  • FIG. 24A and FIG. 24B are diagrams showing a state in which a structure is bent by a load.
  • FIG. 24A shows a healthy case
  • FIG. 24B shows a deteriorated case.
  • the amount of deflection becomes larger in the deteriorated state of FIG. 24B than in the healthy state of FIG. 24A.
  • a threshold value is provided for the deflection amount, and when the movement amount exceeds this threshold value, it can be determined that the deterioration has occurred.
  • This threshold value can be converted from a deflection amount when a predetermined load is applied in advance, for example, by calculating strength when designing the structure.
  • the three-dimensional spatial distribution information analysis unit 7 of the abnormality determination unit 6 compares the amount of movement with a threshold value to determine deterioration.
  • a structure bends, there is a case of not only a smooth curve drawing as shown in FIGS. 24A and 24B but also a flexure including a complicated change instead of a smooth curve.
  • FIG. 25A and FIG. 25B are examples of the above determination performed by the three-dimensional spatial distribution information analysis unit 7, and are diagrams for explaining processing in the case of performing a deflection including a complicated change in the X direction.
  • the imaging range is divided into, for example, nine areas from area A to area I.
  • the proportionality constant k that minimizes the evaluation function E (k) shown in Expression 12 for each region the amount of deflection (the amount of movement in the Z direction) in each region is calculated (FIG. 25B).
  • the amount of deflection in each region can be represented by the amount of deflection at the center of each region, for example, as shown in FIG. 25B.
  • FIG. 26 is a diagram illustrating a change in the movement amount (deflection amount) in the time from the start to the end of load application.
  • the time change of the movement amount in the region B of FIG. 25A is shown.
  • the maximum value of the movement amount can be set as the deflection amount.
  • Deterioration can be determined by comparing the amount of deflection with a threshold value. The time change of the movement amount can be recorded for each area.
  • FIG. 27 is a diagram illustrating a characteristic way of bending when there is a cavity inside the structure.
  • the method of bending when there is an internal cavity is a method of bending that causes the displacement at the surface where the internal cavity exists to be smaller than that when there is no internal cavity (distribution indicated by the broken line in the figure). Show.
  • the three-dimensional spatial distribution information analysis unit 7 can determine the presence of an internal cavity from the obtained deflection state by storing this characteristic deflection method in advance.
  • the differential displacement calculation unit 5 can obtain a differential value obtained by spatially differentiating the movement amount that is the displacement. Since the differential value of the movement amount represents the strain in the Z direction, the characteristic difference between the strain in the Z direction when there is an internal cavity and the strain when there is no internal cavity is preliminarily determined in a three-dimensional spatial distribution information analysis unit. 7, the presence of the internal cavity can be determined from the strain in the Z direction.
  • the time change information analysis unit 8 can determine deterioration such as aging from the time change of the movement amount. That is, when the structure ages, the period of change in the amount of movement when a load is applied becomes longer. Therefore, it is possible to determine that the structure has deteriorated by previously setting a threshold value for the period of change in the movement amount and when the period exceeds the threshold value. Further, it is possible to determine the deterioration in the same manner as described above by the period of change in the differential value of the movement amount.
  • FIG. 28 is a flowchart showing a state determination method of the state determination apparatus 1 of FIG.
  • the displacement calculation unit 2 includes a frame image before application of a load that serves as a reference for calculating displacement in a time-series image of the surface of the structure 20 before and after applying a load imaged by the imaging device 11. Capture the frame images after applying the load in time series. At this time, when imaging the frame image before applying the load, the imaging device 11 performs imaging at the initial imaging distance L and imaging at a distance obtained by shifting the imaging distance by ⁇ ′ by switching the optical path length control unit 12. Do. The displacement calculation unit 2 also captures these frame images.
  • the displacement calculation unit 2 calculates the displacement in the X and Y directions of the image after the load application with respect to the image before the load application as a reference in time series. Further, in the frame image before applying the load, the displacement in the X and Y directions of the image at a distance obtained by shifting the imaging distance with respect to the image at the initial imaging distance L by ⁇ ′ is also calculated.
  • the displacement calculation unit 2 may be a displacement distribution diagram (contour lines of displacement) in which the calculated two-dimensional distribution of displacement is displayed on an XY plane. Further, the displacement calculation unit 2 inputs the calculated displacement or displacement distribution diagram to the depth movement amount calculation unit 3 and the displacement separation unit 4.
  • step S2 the depth movement amount calculation unit 3 calculates the initial imaging distance L from the displacement in the X and Y directions of the image at a distance shifted by ⁇ 'with respect to the image at the initial imaging distance L. Further, the depth movement amount calculation unit 3 determines the movement amount by which the structure 20 surface moves in the normal direction due to the deflection of the structure 20 due to a load from the displacement of the time-series image calculated by the displacement calculation unit 2. Calculation is performed using the calculated imaging distance L. At this time, the depth movement amount calculation unit 3 estimates the inclination angle formed by the optical axis of the imaging device 11 and the normal line of the surface of the structure 20, and calculates the movement amount in consideration of this inclination angle. The depth movement amount calculation unit 3 inputs the calculated movement amount to the displacement separation unit 4, the differential displacement calculation unit 5, and the abnormality determination unit 6.
  • step S3 the displacement separation unit 4 calculates the out-of-plane displacement using the movement amount calculated by the depth movement amount calculation unit 3.
  • step S4 the displacement separating unit 4 subtracts the out-of-plane displacement from the displacement obtained by the displacement calculating unit 2 to separate the in-plane displacement. That is, the displacement separation unit 4 calculates the in-plane displacement in the XY direction of the surface of the structure 20 after the load is applied with respect to the reference before the load is applied. Further, the calculated two-dimensional distribution of in-plane displacement may be a displacement distribution diagram (contour lines of displacement) displayed on the XY plane. The displacement separation unit 4 inputs the calculated result to the differential displacement calculation unit 5 and the abnormality determination unit 6.
  • step S5 the differential displacement calculation unit 5 spatially differentiates the in-plane displacement or displacement distribution diagram input from the displacement separation unit 4 to calculate a differential displacement (stress value) or differential displacement distribution diagram (stress field). . Further, the differential displacement calculation unit 5 calculates a differential displacement (stress value) or a differential displacement distribution diagram (stress field) of the movement amount obtained by the depth movement amount calculation unit 3. The differential displacement calculation unit 5 inputs the calculated result to the abnormality determination unit 6.
  • steps S6, S7, S8, and S9 are steps in which the three-dimensional spatial distribution information analysis unit 7 of the abnormality determination unit 6 determines cracks, delamination, internal cavities, and deterioration that are defects in the structure.
  • the determination method will be described with reference to the above-described pattern matching method and threshold value method.
  • step S6 the three-dimensional spatial distribution information analysis unit 7 of the abnormality determination unit 6 determines the state of cracks, separation, and internal cavities from the input displacement or displacement distribution diagram in the X direction.
  • the three-dimensional spatial distribution information analysis unit 7 includes, as a database, displacement distribution patterns created in advance corresponding to cracks, internal cavities, widths and depths of separation as shown in FIGS. 18A, 20A, and 22A. ing.
  • the three-dimensional spatial distribution information analysis unit 7 performs pattern matching by rotating and enlarging / reducing these displacement distribution patterns with respect to the displacement distribution diagram in the X direction input from the displacement separation unit 4 to detect defects in the XY plane. Can be determined.
  • the three-dimensional spatial distribution information analysis unit 7 determines, for example, the continuity of the displacement based on the input displacement in the X direction. That is, as shown in FIG. 11A, the presence or absence of continuity is determined based on the presence or absence of a steep change equal to or greater than the displacement threshold. The three-dimensional spatial distribution information analysis unit 7 determines that there is a possibility that a crack or separation may exist in any part of the XY plane when there is a steep change without continuity. While the continuous flag DisC (x, y, t) is set to 1, the displacement data at a place where there is a steep change is recorded as numerical information.
  • t is the time on the time-series image of the frame image captured in step S1.
  • the abnormality determination unit 6 inputs the defect information determined by pattern matching, or the discontinuity flag DisC (x, y, t) and numerical information determined by the displacement threshold to the abnormality map creation unit 9.
  • step S7 the three-dimensional spatial distribution information analysis unit 7 of the abnormality determination unit 6 determines the state of cracks, separation, and internal cavities from the input displacement or displacement distribution diagram in the Y direction.
  • the two-dimensional spatial distribution information analysis unit 7 includes, as a database, displacement distribution patterns created in advance corresponding to cracks, internal cavities, widths and depths of separation, as shown in FIGS. 18B, 20B, and 22B. ing.
  • the three-dimensional spatial distribution information analysis unit 7 performs pattern matching on the displacement distribution diagram in the Y direction input from the displacement separation unit 4 by rotating and enlarging / reducing these displacement distribution patterns, and in the XY plane. Determine the position and type of the defect.
  • the three-dimensional spatial distribution information analysis unit 7 detects a displacement greater than a predetermined threshold value, it determines that the location is defective and sets the orthogonal flag ortho (x, y, t) to 1. At the same time, the displacement data of the location where the displacement greater than the threshold is detected is recorded as numerical information.
  • the abnormality determination unit 6 inputs the defect information determined by pattern matching, or the orthogonal flag ortho (x, y, t) and numerical information determined by displacement to the abnormality map creation unit 9.
  • step S8 the three-dimensional spatial distribution information analysis unit 7 of the abnormality determination unit 6 determines the deterioration of the structure and the state of the defect from the input movement amount in the Z direction.
  • the abnormality determination unit 6 inputs the determined deterioration and defect information to the abnormality map creation unit 9.
  • step S9 the three-dimensional spatial distribution information analysis unit 7 of the abnormality determination unit 6 determines the state of cracks, separation, and internal cavities from the input differential displacement (stress value) or differential displacement distribution diagram (stress field). .
  • the three-dimensional spatial distribution information analysis unit 7 includes, as a database, displacement distribution patterns created in advance corresponding to cracks, internal cavities, widths and depths of separation as shown in FIGS. 18C, 20C, and 22C. ing.
  • the three-dimensional spatial distribution information analysis unit 7 performs pattern matching on the differential displacement distribution diagram input from the differential displacement calculation unit 5 by rotating and enlarging / reducing these displacement distribution patterns, so that defects in the XY plane are detected. Determine the position and type.
  • the strain in the X direction increases rapidly because the differential value of the displacement diverges at the cracked portion. From this, it is possible to determine that there is a crack at a location where a strain exceeding the threshold is detected by providing a threshold value in advance for the strain value.
  • the three-dimensional spatial distribution information analysis unit 7 determines that there is a crack at the location, sets 1 to the differential value flag Diff (x, y, t), and sets the defect location. Record differential displacement data as numerical information.
  • the abnormality determination unit 6 inputs the defect information determined by pattern matching, or the differential value flag Diff (x, y, t) and numerical information determined by differential displacement to the abnormality map creation unit 9.
  • step S10 the displacement calculation unit 2 determines whether the processing of each frame image of the time series image has been completed. That is, when the number of frames of the time-series image is n, it is determined whether or not the n-th process is finished. If the number of processes is less than n (NO), the processes from step S1 are repeated. This is repeated until n sheets are completed. Note that n is not limited to the total number of frames, and can be set to an arbitrary number. When the process has finished n sheets (YES), the process proceeds to step S11.
  • step S11 the time change information analysis unit 8 of the abnormality determination unit 6 generates a displacement time response as shown in FIG. 21B or FIG. 23 from the time-series displacement or displacement distribution diagram corresponding to the n frame images.
  • the time frequency distribution (the time frequency is assumed to be f) is the amplitude A (x, y, z, f) and the phase P (x, y, z). , F).
  • the time change information analysis unit 8 determines that there is an internal cavity at a position where a phase shift occurs when the time frequency distribution has a characteristic in which the phase differs depending on the location as shown in FIG. 21B.
  • the time change information analysis unit 8 compares the period of change in the movement amount in the Z direction and the period of change in the differential value of the movement amount with a predetermined threshold of the period, thereby aging the structure. Determine.
  • the time change information analysis unit 8 inputs the above time frequency distribution calculation result and defect determination result to the abnormality map creation unit 9.
  • the abnormality map creation unit 9 creates an abnormality map (x, y, z) based on the information input in the above steps.
  • the results sent from the three-dimensional spatial distribution information analysis unit 7 and the time change information analysis unit 8 are data groups related to the point (x, y, z) on the XYZ coordinates. The state of the structure of these data is determined by the three-dimensional spatial distribution information analysis unit 7 and the time change information analysis unit 8 in the abnormality determination unit 6.
  • the abnormality map creation unit 9 can determine whether the displacement in the X direction and the differential displacement are attached, even if data loss occurs, for example, the determination in the displacement in the Y direction cannot be made. -The state of the location in the Y coordinate can be determined. Based on this determination, an abnormality map (x, y, z) can be created.
  • the defect state if the determination of the displacement in the X direction, the displacement in the Y direction, the displacement in the Z direction, and the differential displacement is different, it may be determined by majority vote. Alternatively, the item having the largest difference from the threshold value that is the criterion may be determined.
  • the abnormality map creation unit 9 can express the degree of defects based on the various numerical information described above. For example, the width and depth of a crack, the dimension of peeling, the dimension of an internal cavity, the depth from the surface, and the like can be expressed.
  • the abnormality map creation unit 9 uses the abnormality map (x, y, z) to determine the defect state of the structure performed by the three-dimensional spatial distribution information analysis unit 7 and the time change information analysis unit 8 in the abnormality determination unit 6. It can also be done when creating. That is, analysis data may be obtained from the three-dimensional spatial distribution information analysis unit 7 and the time change information analysis unit 8, and the defect map generation unit 9 may determine the defect state based on the analysis data.
  • the result output of the abnormality map creation unit 9 may be information in a form that can be directly visualized by a person with a display device, or information in a form that is read by a machine.
  • the lens focal length of the imaging device 11 is 50 mm
  • the pixel pitch is 5 ⁇ m
  • a pixel resolution of 500 ⁇ m can be obtained at an imaging distance of 5 m.
  • the image pickup device 11 has a monochrome image pickup device with horizontal 2000 pixels and vertical 2000 pixels, and can capture a 1 m ⁇ 1 m range at an image pickup distance of 5 m.
  • the frame rate of the image sensor can be 60 Hz.
  • sub-pixel displacement estimation by quadratic curve interpolation can be used so that displacement can be estimated up to 1/100 pixels and a displacement resolution of 5 ⁇ m can be obtained.
  • the following various methods can be used for subpixel displacement estimation in image correlation.
  • a smoothing filter can be used to reduce noise during differentiation in displacement differentiation.
  • ⁇ ⁇ Interpolation by quadratic surface, equiangular line, etc. may be used for subpixel displacement estimation.
  • SAD Sum of Absolute Difference
  • SSD Sud of Squared Difference
  • NCC Normalized Cross Correlation
  • ZNCC Zero-mean Normalized
  • optical flow calculation by the gradient method may be used for displacement estimation.
  • the imaging distance L and the deflection amount ⁇ obtained by the depth movement amount calculation unit 3 may be output and input as reference values to other measuring instruments or the like.
  • the lens focal length of the imaging device 11, the pixel pitch of the imaging element, the number of pixels, and the frame rate may be appropriately changed according to the measurement target.
  • a beam-like structure can correspond to a bridge, and a load can correspond to a traveling vehicle.
  • a load is applied to the beam-like structure.
  • the material exhibits the same behavior as described above in terms of material mechanics, a structure having other materials, sizes and shapes, or a load method different from loading the structure, for example, a load is suspended. It can also be applied to a load method such as lowering.
  • time-series signal of a spatial two-dimensional distribution of the surface displacement of a structure it is not limited to a time-series image, but an array-shaped laser Doppler sensor, an array-shaped strain gauge, an array-shaped vibration sensor. An array-type acceleration sensor or the like may be used. Spatial two-dimensional time-series signals obtained from these array sensors may be handled as image information.
  • distance information and inclination information for calculating out-of-plane displacement due to movement of the structure surface in the normal direction can be acquired from images obtained by imaging the structure surface before and after applying a load.
  • the amount of movement of the structure surface in the normal direction can be obtained by measuring the amount of deflection due to the load from the side surface direction of the structure.
  • the structure is a bridge or the like
  • measurement from the side surface of the bridge is extremely difficult in work, and therefore the measurement accuracy is also lowered. Since this embodiment can also solve this problem in work, the displacement of the image on the structure surface can be corrected with high accuracy.
  • deviation from a side surface direction are also unnecessary, the increase in cost can be suppressed.
  • the imaging distance on the surface of the structure and the amount of movement in the normal direction of the surface of the structure due to the load application can be obtained. Furthermore, an out-of-plane displacement due to the movement of the surface of the structure in the normal direction can be obtained using the movement amount. By subtracting this out-of-plane displacement from the displacement caused by the load on the image of the structure surface, the in-plane displacement of the structure surface can be separated. According to the state determination apparatus 100, the above processing can be easily performed with good workability, and therefore, detection that distinguishes defects such as cracks, peeling, and internal cavities of the structure can be performed remotely and accurately with no contact. Is possible.
  • a two-dimensional spatial distribution of the displacement of the image is calculated from the difference between the images of the structure surface at the first and second imaging distances, and the image of the structure surface before the load application at the first imaging distance and A displacement calculation unit that calculates a two-dimensional spatial distribution of displacement of the time-series image from a difference between the time-series images of the surface of the structure by applying a load;
  • the first imaging distance is calculated from the two-dimensional spatial distribution of the displacement of the image, and the movement amount in the normal direction of the structure surface due to the load application is calculated from the two-dimensional spatial distribution of the displacement of the time-series image.
  • a depth movement amount calculation unit that calculates using an imaging distance of 1;
  • a displacement separation unit that calculates a correction amount based on the movement amount, subtracts the correction amount from the two-dimensional spatial distribution of displacement of the time-series image, and separates the two-dimensional spatial distribution of displacement of the structure surface;
  • An abnormality determination unit that identifies a defect in the structure based on a comparison between a two-dimensional spatial distribution of the displacement of the structure surface and the amount of movement, and a spatial distribution of the displacement provided in advance and a threshold relating to the amount of movement. And a state determination device.
  • (Appendix 2) The state determination apparatus according to claim 1, wherein the depth movement amount calculation unit estimates an inclination angle of the structure from the time series image and calculates the movement amount corrected by the inclination angle.
  • (Appendix 3) A differential displacement calculating unit that calculates a two-dimensional differential spatial distribution from the two-dimensional spatial distribution of the displacement of the structure surface, wherein the abnormality determining unit is configured to differentiate the two-dimensional differential spatial distribution and a differential displacement provided in advance; The state determination device according to appendix 1 or 2, wherein a defect of the structure is specified based on a comparison with a spatial distribution.
  • (Appendix 4) The state determination apparatus according to any one of appendices 1 to 3, wherein the abnormality determination unit identifies a defect of the structure based on a temporal change in a two-dimensional spatial distribution of displacement of the structure surface.
  • (Appendix 5) The state determination apparatus according to appendix 3 or 4, wherein the abnormality determination unit specifies a defect of the structure based on a time change of the two-dimensional differential space distribution.
  • (Appendix 6) The state determination according to any one of appendices 1 to 5, wherein the abnormality determination unit identifies a defect of the structure based on a comparison between a displacement of the surface of the structure and a predetermined threshold value. apparatus.
  • Appendix 13 The state determination system according to appendix 12, wherein the imaging apparatus includes an optical path length control unit that sets the first and second imaging distances.
  • Appendix 14 The state determination system according to appendix 13, wherein the optical path length control unit sets the first and second imaging distances by changing a refractive index in the optical path or switching an optical path.
  • Appendix 19 The state determination method according to appendix 17 or 18, wherein a defect of the structure is specified based on a time change of the two-dimensional differential space distribution.
  • Appendix 20 20.
  • Appendix 21 21.
  • (Appendix 22) The state determination method according to any one of supplementary notes 15 to 21, wherein an abnormality map indicating the location and type of the defect is created based on the determination result.
  • (Appendix 24) The state determination method according to appendix 23, wherein the spatial distribution of the displacement provided in advance and the differential spatial distribution of the differential displacement provided in advance are based on information on the crack, the separation, and the internal cavity. (Appendix 25) 25.
  • a two-dimensional spatial distribution of the displacement of the image is calculated from the difference between the images of the structure surface at the first and second imaging distances, and the image of the structure surface before the load application at the first imaging distance and A displacement calculation unit that calculates a two-dimensional spatial distribution of displacement of the time-series image from a difference between the time-series images of the surface of the structure by applying a load;
  • the first imaging distance is calculated from the two-dimensional spatial distribution of the displacement of the image, and the movement amount in the normal direction of the structure surface due to the load application is calculated from the two-dimensional spatial distribution of the displacement of the time-series image.
  • a depth movement amount calculation unit that calculates using an imaging distance of 1;
  • the state determination apparatus which has an abnormality determination part which specifies the defect of the said structure based on the comparison with the threshold value regarding the said movement amount with which the said movement amount was equipped previously.
  • (Appendix 27) 27.
  • a differential displacement calculating unit configured to calculate a differential displacement of the movement amount, and the abnormality determination unit detects defects in the structure based on a comparison between the differential displacement of the movement amount and a differential displacement provided in advance.
  • a displacement separation unit is provided that calculates a correction amount based on the movement amount, subtracts the correction amount from the two-dimensional spatial distribution of the displacement of the time-series image, and separates the two-dimensional spatial distribution of the displacement of the structure surface.
  • the abnormality determining unit identifies defects of the structure based on a comparison between a two-dimensional spatial distribution of the displacement of the structure surface and a spatial distribution of the displacement provided in advance.
  • the state determination apparatus according to claim 1.
  • the differential displacement calculation unit calculates a two-dimensional differential spatial distribution from the two-dimensional spatial distribution of the displacement of the structure surface, and the abnormality determination unit calculates the differential displacement of the differential displacement provided in advance and the two-dimensional differential spatial distribution.
  • the state determination apparatus according to appendix 28 or 29, wherein a defect of the structure is specified based on a comparison with a spatial distribution.
  • Appendix 31 The state determination according to any one of appendices 26 to 30, wherein the abnormality determination unit identifies a defect of the structure based on a time change of the two-dimensional spatial distribution of the movement amount or the displacement of the structure surface. apparatus.
  • Appendix 32 32.
  • Appendix 33 33.
  • the state determination device according to any one of appendices 26 to 32, further including an abnormality map creation unit that creates an abnormality map indicating the location and type of the defect based on a determination result of the abnormality determination unit.
  • Appendix 34 Calculating the two-dimensional spatial distribution of the displacement of the image from the difference between the images of the structure surface at the first and second imaging distances; Calculating a two-dimensional spatial distribution of the displacement of the time-series image from the difference between the image of the structure surface before the load application at the first imaging distance and the time-series image of the structure surface by the load application; Calculating the first imaging distance from a two-dimensional spatial distribution of the displacement of the image; The amount of movement in the normal direction of the surface of the structure due to the application of the load is calculated from the two-dimensional spatial distribution of the displacement of the time series image using the first imaging distance,
  • a state determination method for identifying a defect in the structure based on a comparison between the movement amount and a threshold value relating to the movement amount provided in advance.
  • (Appendix 35) 35 The state determination method according to appendix 34, wherein an inclination angle of the structure is estimated from the time series image, and the movement amount corrected by the inclination angle is calculated.
  • (Appendix 36) Calculating a differential displacement of the amount of movement; 36.
  • (Appendix 37) Calculating a correction amount based on the movement amount, subtracting the correction amount from a two-dimensional spatial distribution of the displacement of the time-series image, and separating a two-dimensional spatial distribution of the displacement of the structure surface; 37.
  • a state determination method according to any one of appendices 34 to 38, wherein a defect of the structure is specified based on a temporal change in the two-dimensional spatial distribution of the movement amount or the displacement of the structure surface.
  • Appendix 40 40.
  • Appendix 41 41.
  • the state determination method according to any one of appendices 44 to 40, wherein an abnormality map indicating the location and type of the defect is created.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

L'objectif de la présente invention est de permettre une détection catégorisée précise de défauts dans une structure, tels que des fissures, un détachement ou des vides internes, à distance et dans un mode sans contact. Le dispositif d'évaluation d'état de la présente invention comprend : une unité de calcul de déplacement qui calcule, à partir de différences entre des images d'une surface de structure capturée à une première distance d'imagerie et une deuxième distance d'imagerie, une distribution spatiale bidimensionnelle de déplacements dans les images, et qui calcule, à partir d'une image de la surface de structure avant l'application d'une charge, capturée à la première distance d'imagerie, et des différences entre ladite images d'image et d'images de série temporelle de la surface de structure résultant de l'application de la charge, une distribution spatiale bidimensionnelle de déplacements dans les images de série temporelle; une unité de calcul de quantité de mouvement en profondeur qui calcule la première distance d'imagerie à partir de la distribution spatiale bidimensionnelle des déplacements entre les images, et utilise la première distance d'imagerie pour calculer une quantité de mouvement de la surface de structure, dans la direction d'une ligne perpendiculaire à celle-ci, résultant de l'application de la charge, à partir de la distribution spatiale bidimensionnelle des déplacements dans les images de série temporelle; une unité de séparation de déplacement qui sépare la distribution spatiale bidimensionnelle des déplacements de la surface de structure par calcul d'une quantité de correction sur la base de la quantité de mouvement, et soustraction de la quantité de correction à partir de la distribution spatiale bidimensionnelle des déplacements dans les images de série temporelle; et une unité d'évaluation d'anomalie qui identifie des défauts dans la structure sur la base d'une comparaison entre la distribution spatiale bidimensionnelle des déplacements de la surface de structure et la quantité de mouvement, et de seuils relatifs à la distribution spatiale des déplacements et à la quantité de mouvement, fournis à l'avance.
PCT/JP2017/014667 2016-04-15 2017-04-10 Dispositif d'évaluation d'état d'une structure, système d'évaluation d'état et procédé d'évaluation d'état WO2017179535A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016081837 2016-04-15
JP2016-081837 2016-04-15

Publications (1)

Publication Number Publication Date
WO2017179535A1 true WO2017179535A1 (fr) 2017-10-19

Family

ID=60042526

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2017/014667 WO2017179535A1 (fr) 2016-04-15 2017-04-10 Dispositif d'évaluation d'état d'une structure, système d'évaluation d'état et procédé d'évaluation d'état

Country Status (1)

Country Link
WO (1) WO2017179535A1 (fr)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019097577A1 (fr) * 2017-11-14 2019-05-23 日本電気株式会社 Système de mesure, dispositif de traitement de correction, procédé de traitement de correction et support d'enregistrement lisible par ordinateur
WO2019097579A1 (fr) * 2017-11-14 2019-05-23 日本電気株式会社 Dispositif de mesure de vibration, procédé de mesure de vibration et support d'enregistrement lisible par ordinateur
WO2019097576A1 (fr) * 2017-11-14 2019-05-23 日本電気株式会社 Système de mesure, dispositif de traitement de correction, procédé de traitement de correction et support d'informations lisible par ordinateur
WO2019097578A1 (fr) * 2017-11-14 2019-05-23 日本電気株式会社 Dispositif de détection de composante de déplacement, procédé de détection de composante de déplacement, et support d'enregistrement lisible par ordinateur
WO2019145992A1 (fr) * 2018-01-23 2019-08-01 日本電気株式会社 Dispositif de calcul de fiabilité de vibration, procédé de calcul de fiabilité de vibration et support d'enregistrement lisible par ordinateur
WO2019235409A1 (fr) * 2018-06-05 2019-12-12 日本電気株式会社 Dispositif de mesure de quantité de déplacement, procédé de mesure de quantité de déplacement, et support d'enregistrement
WO2020157973A1 (fr) * 2019-02-01 2020-08-06 日本電気株式会社 Dispositif de traitement d'images
CN113227781A (zh) * 2018-12-20 2021-08-06 株式会社岛津制作所 缺陷检查装置和缺陷检查方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007057386A (ja) * 2005-08-24 2007-03-08 Osaka Univ カメラ１台を用いたインライン３次元計測装置及び計測方法
JP2007240218A (ja) * 2006-03-07 2007-09-20 Hitachi Zosen Corp 撮影画像による変位計測時の補正方法
CN102359966A (zh) * 2011-07-29 2012-02-22 河海大学 一种混凝土表面微小裂缝的定位系统
WO2016047093A1 (fr) * 2014-09-25 2016-03-31 日本電気株式会社 Dispositif de détermination d'état et procédé de détermination d'état

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007057386A (ja) * 2005-08-24 2007-03-08 Osaka Univ カメラ１台を用いたインライン３次元計測装置及び計測方法
JP2007240218A (ja) * 2006-03-07 2007-09-20 Hitachi Zosen Corp 撮影画像による変位計測時の補正方法
CN102359966A (zh) * 2011-07-29 2012-02-22 河海大学 一种混凝土表面微小裂缝的定位系统
WO2016047093A1 (fr) * 2014-09-25 2016-03-31 日本電気株式会社 Dispositif de détermination d'état et procédé de détermination d'état

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
HIROSHI IMAI ET AL.: "In-plane/out-of-plane displacement separation in structural internal deterioration detection with monocular motion vector field analysis", T HE INSTITUTE OF ELECTRONICS , INFORMATION AND COMMUNICATION ENGINEERS 2015 NEN ENGINEERING SCIENCES SOCIETY/NOLTA SOCIETY TAIKAI KOEN RONBUNSHU, 25 August 2015 (2015-08-25) *

Cited By (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11585721B2 (en) 2017-11-14 2023-02-21 Nec Corporation Displacement component detection apparatus, displacement component detection method, and computer-readable recording medium
JPWO2019097578A1 (ja) * 2017-11-14 2020-12-03 日本電気株式会社 変位成分検出装置、変位成分検出方法、及びプログラム
WO2019097576A1 (fr) * 2017-11-14 2019-05-23 日本電気株式会社 Système de mesure, dispositif de traitement de correction, procédé de traitement de correction et support d'informations lisible par ordinateur
WO2019097578A1 (fr) * 2017-11-14 2019-05-23 日本電気株式会社 Dispositif de détection de composante de déplacement, procédé de détection de composante de déplacement, et support d'enregistrement lisible par ordinateur
US11391621B2 (en) 2017-11-14 2022-07-19 Nec Corporation Vibration measurement apparatus, vibration measurement method, and computer-readable recording medium
WO2019097577A1 (fr) * 2017-11-14 2019-05-23 日本電気株式会社 Système de mesure, dispositif de traitement de correction, procédé de traitement de correction et support d'enregistrement lisible par ordinateur
WO2019097579A1 (fr) * 2017-11-14 2019-05-23 日本電気株式会社 Dispositif de mesure de vibration, procédé de mesure de vibration et support d'enregistrement lisible par ordinateur
JPWO2019097577A1 (ja) * 2017-11-14 2020-11-26 日本電気株式会社 計測システム、補正処理装置、補正処理方法、及びプログラム
JP6996569B2 (ja) 2017-11-14 2022-02-04 日本電気株式会社 計測システム、補正処理装置、補正処理方法、及びプログラム
JPWO2019097579A1 (ja) * 2017-11-14 2020-11-26 日本電気株式会社 振動計測装置、振動計測方法、及びプログラム
JPWO2019097576A1 (ja) * 2017-11-14 2020-11-26 日本電気株式会社 計測システム、補正処理装置、補正処理方法、及びプログラム
US11519780B2 (en) 2017-11-14 2022-12-06 Nec Corporation Measurement system, correction processing apparatus, correction processing method, and computer-readable recording medium
JPWO2019145992A1 (ja) * 2018-01-23 2021-01-28 日本電気株式会社 振動信頼度算出装置、振動信頼度算出方法、及びプログラム
US11509827B2 (en) 2018-01-23 2022-11-22 Nec Corporation Vibration reliability calculation apparatus, vibration reliability calculation method, and computer readable recording medium
WO2019145992A1 (fr) * 2018-01-23 2019-08-01 日本電気株式会社 Dispositif de calcul de fiabilité de vibration, procédé de calcul de fiabilité de vibration et support d'enregistrement lisible par ordinateur
WO2019235409A1 (fr) * 2018-06-05 2019-12-12 日本電気株式会社 Dispositif de mesure de quantité de déplacement, procédé de mesure de quantité de déplacement, et support d'enregistrement
US20210239458A1 (en) * 2018-06-05 2021-08-05 Nec Corporation Displacement amount measuring device, displacement amount measuring method, and recording medium
JPWO2019235409A1 (ja) * 2018-06-05 2021-06-10 日本電気株式会社 変位量測定装置、変位量測定方法、およびプログラム
US11846498B2 (en) 2018-06-05 2023-12-19 Nec Corporation Displacement amount measuring device, displacement amount measuring method, and recording medium
CN113227781A (zh) * 2018-12-20 2021-08-06 株式会社岛津制作所 缺陷检查装置和缺陷检查方法
CN113227781B (zh) * 2018-12-20 2024-02-13 株式会社岛津制作所 缺陷检查装置和缺陷检查方法
JPWO2020157973A1 (ja) * 2019-02-01 2021-11-25 日本電気株式会社 画像処理装置
WO2020157973A1 (fr) * 2019-02-01 2020-08-06 日本電気株式会社 Dispositif de traitement d'images

Similar Documents

Publication Publication Date Title
WO2016152076A1 (fr) Dispositif d'évaluation de l'état d'une structure, système et procédé d'évaluation associés
WO2017179535A1 (fr) Dispositif d'évaluation d'état d'une structure, système d'évaluation d'état et procédé d'évaluation d'état
WO2016152075A1 (fr) Dispositif de détermination d'état de structure, système de détermination d'état, et procédé de détermination d'état
JP6652060B2 (ja) 状態判定装置および状態判定方法
Chen et al. Video camera–based vibration measurement for civil infrastructure applications
JP6485454B2 (ja) 情報処理装置
JP6954368B2 (ja) 変位成分検出装置、変位成分検出方法、及びプログラム
JP7088199B2 (ja) 状態判定装置、状態判定方法、及びプログラム
JP6813025B2 (ja) 状態判定装置、状態判定方法、及びプログラム
JP6511892B2 (ja) 構造物の状態判定装置と状態判定システムおよび状態判定方法
KR20190059639A (ko) 콘크리트 표면 균열 측정 장치 및 방법
Tan et al. Target-free vision-based approach for modal identification of a simply-supported bridge
Al‐Salih et al. Application of a digital image correlation bridge inspection methodology on geometrically complex bifurcated distortion‐induced fatigue cracking
Zhong et al. Quasi-optical coherence vibration tomography technique for damage detection in beam-like structures based on auxiliary mass induced frequency shift
JP6984747B2 (ja) 変位量測定装置、変位量測定方法、およびプログラム
Shang et al. Multi-point vibration measurement for mode identification of bridge structures using video-based motion magnification
CN110532725B (zh) 基于数字图像的工程结构力学参数识别方法及系统
US20210304417A1 (en) Observation device and observation method
JP4820998B2 (ja) 位相特異点検出方法、及び、位相特異点検出装置、並びに、プログラム
WO2020255231A1 (fr) Dispositif de mesure de déplacement, procédé de mesure de déplacement et support d'enregistrement lisible par ordinateur
WO2021181441A1 (fr) Système de détermination d'anomalie, dispositif d'imagerie et procédé de détermination d'anomalie
Besharatian et al. Benchmarking dynamic properties of structures using non-contact sensing
Dowling Three Dimensional Digital Image Correlation for Dynamic Measurements
WO2019145992A1 (fr) Dispositif de calcul de fiabilité de vibration, procédé de calcul de fiabilité de vibration et support d'enregistrement lisible par ordinateur
Li Damage and material identification using inverse analysis

Legal Events

Date Code Title Description
NENP Non-entry into the national phase

Ref country code: DE

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 17782348

Country of ref document: EP

Kind code of ref document: A1

122 Ep: pct application non-entry in european phase

Ref document number: 17782348

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: JP