WO2017104954A1 - Module de détection de lumière émise et système de gestion l'utilisant - Google Patents

Module de détection de lumière émise et système de gestion l'utilisant Download PDF

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Publication number
WO2017104954A1
WO2017104954A1 PCT/KR2016/011361 KR2016011361W WO2017104954A1 WO 2017104954 A1 WO2017104954 A1 WO 2017104954A1 KR 2016011361 W KR2016011361 W KR 2016011361W WO 2017104954 A1 WO2017104954 A1 WO 2017104954A1
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WO
WIPO (PCT)
Prior art keywords
unit
lamp unit
reflected light
sensor
detection module
Prior art date
Application number
PCT/KR2016/011361
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English (en)
Korean (ko)
Inventor
이순종
우봉주
정재훈
Original Assignee
(주)쎄미시스코
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by (주)쎄미시스코 filed Critical (주)쎄미시스코
Publication of WO2017104954A1 publication Critical patent/WO2017104954A1/fr

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    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B47/00—Circuit arrangements for operating light sources in general, i.e. where the type of light source is not relevant
    • H05B47/20—Responsive to malfunctions or to light source life; for protection
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21—LIGHTING
    • F21K—NON-ELECTRIC LIGHT SOURCES USING LUMINESCENCE; LIGHT SOURCES USING ELECTROCHEMILUMINESCENCE; LIGHT SOURCES USING CHARGES OF COMBUSTIBLE MATERIAL; LIGHT SOURCES USING SEMICONDUCTOR DEVICES AS LIGHT-GENERATING ELEMENTS; LIGHT SOURCES NOT OTHERWISE PROVIDED FOR
    • F21K9/00—Light sources using semiconductor devices as light-generating elements, e.g. using light-emitting diodes [LED] or lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details

Definitions

  • the present invention relates to an emission light detection module and a management system using the same, and more particularly, to a management system for determining and monitoring the normal operation of the lamp unit for irradiating light to an object located on the object transfer unit.
  • Printing technology is a technology that uses ink to embed text or drawings drawn on a plate onto paper or cloth. Recently, various technologies such as inkjet printing, flexo printing, gravure printing, and screen printing have been used. . Since these technologies are applied to high value-added products such as RFID systems, large display devices, thin-film solar cells, thin-film batteries, and the like, the demand for the technology is gradually increasing. In general, in the sintering apparatus using the emission light, the emission light of a constant intensity should be irradiated with the input value input by the user, and thus have the object under the same conditions.
  • the user checks from time to time to determine whether it is operating normally in response to the input value input to the lamp unit, and thus has a problem in that the overall productivity decreases due to time human resource loss.
  • the sensing unit is provided in the periphery of the lamp unit is irradiated from the lamp unit toward the object to detect the reflected light reflected by the wavelength and intensity of the reflected light lamp
  • the purpose is to check the normal operation of the unit.
  • the user can monitor the normal operation of the lamp unit as described above can reduce the loss of human resources and save time of the overall process.
  • a detection unit including a lamp unit, a first sensor for detecting the reflected light reflected from the object, and a second detector for detecting a wavelength region, and a second detector for detecting the intensity of the reflected light, and a measured value of the reflected light measured from the detection unit. It may include a determination unit for determining whether the normal output of the lamp unit by comparing with the normal output value of the lamp unit.
  • the judging unit may independently compare each of the measured values measured by the first sensor and the second sensor and the normal output value.
  • the first detector may detect the wavelength range of the reflected light at a predetermined time interval, and the second detector may detect the intensity of the reflected light at a shorter time interval than the first detector.
  • the lamp unit may be characterized in that the IPL (Intense pulsed Light) lamp for irradiating the emitted light in the form of a pulse.
  • IPL Intelligent pulsed Light
  • the sensing unit may selectively operate only one of the first sensor and the second sensor.
  • the lower portion of the lamp unit may further include an object transfer unit for transferring the object in one direction.
  • the lamp unit may be formed in plural on the vertical upper portion of the object transfer part, and the sensing unit may be formed in plural in correspondence with the lamp unit.
  • a management system for managing a plurality of the inspection module for measuring the information of the reflected light reflected after irradiating the emission light toward the object, a lamp unit for irradiating the emission light toward the object with the input value, the reflection from the object
  • a sensing unit including a first detector for sensing the reflected light to detect the wavelength range and a second detector for sensing the intensity of the reflected light, and receiving a measured value of the reflected light from the sensing unit, according to an input value
  • It may include a plurality of detection modules including a determination unit for determining whether or not the output value match, and a monitoring module for collecting the information transmitted from each of the plurality of detection modules to observe the malfunction of the lamp unit.
  • the judging unit may independently compare each of the measured values measured by the first sensor and the second sensor and the normal output value.
  • Emission light detection module and a management system using the same of the present invention for solving the above problems has the following effects.
  • the detection module and the management system using the same are provided with a sensing unit to compare the measured value with the normal output value through the wavelength and intensity of the emitted light, through which it is possible to determine whether the normal operation of the lamp unit have.
  • the detection module and the management system using the same according to the present invention are formed with a plurality of detection modules, the user can easily determine whether the normal operation of the lamp unit by monitoring them.
  • FIG. 1 is a perspective view showing the overall configuration of the lamp unit and the detection unit in the detection module and the management system using the same according to an embodiment of the present invention
  • FIG. 2 is a cross-sectional view showing a detection module for irradiating the light emitted from the lamp unit toward the object in the detection module and the management system using the same according to an embodiment of the present invention, and detecting the reflected light reflected;
  • FIG. 3 is a view illustrating spectroscopic reflection of reflected light from a first sensor in a detection module and a management system using the same according to an embodiment of the present invention
  • FIG. 4 is a graph showing parameters for emitted light generated in a lamp unit in a detection module and a management system using the same according to an embodiment of the present invention
  • FIG. 5 is a flowchart illustrating a procedure for describing a series of operations in a detection module and a management system using the same according to an embodiment of the present invention
  • FIG. 6 is a diagram illustrating a management system including a monitoring module in a detection module and a management system using the same according to an embodiment of the present invention.
  • FIG. 1 is a perspective view showing an overall configuration of an emission light detection module and a management system using the same according to an embodiment of the present invention
  • Figure 2 is an emission light detection module and a management system using the same according to an embodiment of the present invention It is shown cross section.
  • the emission light detection module includes a detection unit 200 and a determination unit 300 including a lamp unit 100, a first sensor 220, and a second detector 240.
  • the emission light detection module and the management system using the same detect the malfunction of the lamp unit 100 by sintering the object T by irradiating the emission light toward the object T.
  • the object T may be a device for sintering by irradiating the emitted light to the electroconductive ink instantaneously. Therefore, the emission light irradiated toward the object T should be irradiated with a constant wavelength and intensity, thereby managing whether the lamp unit 100 operates normally.
  • the lamp unit 100 may be formed to irradiate the emitted light toward the object T, and the emitted light may be an IPL (Intense Pulsed Light) lamp that emits the emitted light in the form of a pulse. have.
  • IPL Intelligent Pulsed Light
  • the IPL method periodically emits the composite emission light of a wide wavelength range.
  • the electroconductive ink may be sintered on the object by emitting the emission light of a specific wavelength toward the object.
  • the lamp unit 100 irradiating the emitted light uses a xenon flash lamp
  • the xenon flash lamp includes a xenon gas injected into a cylindrical quartz tube. Consists of the configuration. Xenon gas outputs light energy from the input electrical energy, and has an energy conversion rate of more than 50%.
  • xenon flash lamps are formed with metal electrodes such as tungsten to form anodes and cathodes on both sides thereof. When the lamp unit 100 having such a configuration receives power and current, the xenon gas injected therein is ionized, and sparks are generated between the anode and the cathode.
  • an arc plasma shape is generated in the lamp unit 100 while a current flows for about 1000 Adml current for 1 ms to 10 ms through the generated spark, and the emitted light of strong intensity is generated.
  • the emitted light generated here contains the emission spectrum of a wide wavelength band from ultraviolet to infrared.
  • a xenon flash lamp is described, but any type of lamp unit 100 may be used as long as the lamp unit 100 can achieve the above object.
  • the lamp unit 100 irradiates the emitted light toward the object (T), wherein the object (T) is located on the upper surface of the object transfer unit 400 to be transferred in one direction.
  • the object transfer part 400 is formed in the form of a conveyor belt (conveyor belt) is formed to transfer the object (T).
  • the lamp unit 100 irradiates the emission light to be wider than the width of the object transfer unit 400 so as to irradiate the emission light in a range encompassing the object (T) provided in the object transfer unit 400. It may be possible to irradiate the emission light to the area corresponding to the emission light to the entire object (T).
  • the detection unit 200 detects the reflected light R generated therein.
  • the detection unit 200 detects the reflected light R reflected from the object T to detect the intensity of the first sensor 220 and the reflected light R to detect a wavelength region. 240.
  • the first sensor 220 and the second sensor 240 are provided around the lamp unit 100.
  • the first sensor 220 and the second sensor 240 may be provided at a position reflected from the object T to detect the reflected light R, and are integrally formed with the lamp unit 100. It can also be.
  • the first sensor 220 detects the reflected light (R) and spectroscopy the component of the emitted light, that is, the emitted light for each wavelength, to the emission light emitted from the object (T) and the lamp unit (100). Information can be obtained, and the second sensor 240 can know information on the intensity of light through the reflected light R.
  • R reflected light
  • the information of the reflected light R measured by the sensing unit 200 is determined by the determination unit 300.
  • the determination unit 300 determines whether the lamp unit 100 is normally output by comparing the measured value from the reflected light R measured by the detection unit 200 with the normal output value of the lamp unit 100. do.
  • the lamp unit 100 corresponds to the input value for irradiating the object T
  • the output value is the normal output value.
  • the lamp unit 100 By inputting 'A', the lamp unit 100 emits the emission light corresponding to 'A' toward the object T, and the result reflected by the object T should be 'B'.
  • FIG 3 is a diagram illustrating a state in which the reflected light R is spectroscopically detected after detecting the reflected light R of the first sensor 220 according to an exemplary embodiment of the present invention.
  • the first sensor 220 may detect the reflected light R to detect a wavelength of the reflected light R. Specifically, the reflected light (R) is incident to pass through the grating (not shown) provided therein, the spectrogram is made so that the wavelength and color of the reflected light (R) can be determined.
  • the first sensor 220 may be a spectrometer.
  • the second sensor 240 may have a form of a photo diode that transforms the detected reflected light R into a voltage in proportion to the intensity of the emitted light.
  • the first sensor 220 detects the wavelength region of the reflected light R at a predetermined time interval, and the second detector 240 is shorter than the first potato in detecting the intensity of the reflected light R. Can be detected at time intervals.
  • the operation of the sensing unit 200 may operate two objects at the same time, only one of the two objects can be selectively operated to detect the information on the reflected light (R).
  • the sensing unit 200 as described above may be modified in various forms if the analysis of the emitted light is possible through qualitative analysis and quantitative analysis of the emitted light, such as a spectroscope and a photodiode.
  • the sensing unit 200 includes the first sensor 220 and the second sensor 240, and compares the measured values measured at each of the lamp unit 100 with the normal output value. It can be determined whether it operates normally.
  • the measured value measured by the first sensor 220 is a value measured by the wavelength region of the reflected light R, and the emitted light is in the correct wavelength region compared to the wavelength region of the normal output value. Determine if it is located.
  • the measured value measured by the second sensor 240 is a value of measuring the intensity of the reflected light R, and determines the intensity of the emitted light by comparing with the intensity of the normal output value.
  • the determination unit 300 independently compares the intensity and the wavelength region of the emitted light with the normal output value through the measured values measured by the sensing unit 200, respectively, to the lamp unit 100. It can be determined whether the normal operation of the.
  • the determination unit 300 compares the wavelength region detected by the first sensor 220 with the wavelength region of the normal output value, and compares the intensity of the light measured by the second sensor 240 with the intensity of the normal output value. Can be compared independently.
  • the determination unit 300 may compare the respective measured values of the first sensor 220 or the second sensor 240 independently with the normal output value, and simultaneously compare the measured values of two objects with the measured values. Can be compared.
  • the determination unit 300 compares the wavelength of the reflected light measured by the first sensor 220 with the normal output value corresponding to the input value to determine whether the lamp unit 200 is operating normally.
  • the first sensor may determine whether the lamp unit 200 operates normally by comparing the intensity of the reflected light measured by the second sensor 240 with the normal output value corresponding to the input value.
  • the measurement value of the 220 and the second sensor 240 may be simultaneously compared with the expected output value to determine whether the lamp unit 200 is in normal operation.
  • FIG. 4 is a graph showing parameters for the emitted light generated by the lamp unit 100 according to an embodiment of the present invention.
  • the intensity of the lamp unit irradiating the emitted light in an IPL manner may be specified by various parameters such as the intensity of the lamp unit irradiating the emitted light in an IPL manner, the pulp width of the lamp unit, the number of pulses of the lamp unit and the pulse gap of the lamp unit.
  • the intensity of the xenon flash lamp is less than 5 J / cm 2
  • the sintering of the electroconductive ink may not be smooth, and if the intensity exceeds 50 J / cm 2 , overload may occur.
  • the pulse width is preferably 0.1 ms to 100 ms, more preferably 5 ms to 50 ms, considering the efficiency of the sintering step.
  • the number of pulses is preferably 1 to 200 times in consideration of the efficiency of the sintering step. More preferably, it is 1 to 50 times.
  • the pulse gap of the xenon flash lamp is preferably 0.1 ms to 100 ms, more preferably 5 ms in consideration of the efficiency of the sintering step and the influence on the lifetime of the emission light sintering apparatus. It is good to be 50 ms.
  • the intensity, pulse width, number of pulses, and pulse gap of the lamp unit described above may be variously combined in various ranges depending on the type of substrate used, the composition and content of the electroconductive ink, and are not necessarily limited to the above-mentioned range.
  • FIG. 5 is a flowchart illustrating a series of operations of the detection module in the emission light detection module and the management system using the same according to an embodiment of the present invention.
  • the operation is started when the preparation for the operation of the detection module of the present invention is completed (S01).
  • the lamp unit 100 operates to irradiate the emitted light toward the object T (S03).
  • the emitted light irradiated onto the object T is reflected and sensed by the sensing unit 200 (S04).
  • the sensing unit 200 may be formed adjacent to the periphery of the lamp unit 100 or may be formed in combination.
  • the position of the detection unit 200 is preferably formed at the position where the reflected light (R) is detected.
  • the continuous inspection is performed (S07). If not, the operation is stopped and the lamp unit 100 is checked (S08).
  • the detection module and the management system using the same as a detection module for measuring whether the normal operation of the lamp unit 100 with the normal output value corresponding to the input value of the lamp unit 100,
  • the detection unit 200 detects the first detector ( The reflected light R is analyzed through the second sensor 240 and the second sensor 240.
  • the determination unit 300 may determine whether the lamp unit 100 operates normally by comparing the value measured by the reflected light R with the normal output value.
  • a plurality of the detection module as described above is provided with a monitoring module 500 to determine whether the lamp unit 100 is malfunctioning by collecting information transmitted from each.
  • FIG. 6 is a diagram illustrating the monitoring module 500 having a plurality of the determination unit 300 in the determination unit 300 and the management system using the same according to an embodiment of the present invention.
  • the monitoring module 500 is connected to at least one or more of the determination unit 300, and checks the information transmitted from the determination unit 300 in real time to the lamp unit 100 through the determination unit 300 It is possible to determine whether the normal operation of.
  • the lamp unit 100 determines whether the lamp unit 100 operates normally by using the reflected light R, and if a malfunction occurs, information is transmitted in real time so that the user can check it, and can be checked through a mobile device (not shown). Can be.
  • a notification module (not shown) for notifying a user when the measured value and the normal output value of the lamp unit do not match may be further included.
  • the emission light is irradiated according to the input value of the lamp unit, and whether the measured value actually measured corresponds to the normal output value corresponding thereto. If it does not match, you can send a notification, such as a message, to the user.
  • the emission light detection module and the management system using the same have the information about the normal output value corresponding to the value input to the lamp unit 100 and the measured value and the normal output value actually output.
  • Compared to the invention for checking the normal operation of the lamp unit 100 relates to the invention that can be monitored by providing a plurality of the lamp unit 100 and the detection unit 200.

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Optics & Photonics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

La présente invention porte sur un module de détection de lumière émise destiné à irradier une lumière émise vers un objet et puis mesurer des informations sur une lumière réfléchie qui est réfléchie par l'objet, et un système de surveillance l'utilisant, le module de détection de lumière émise comprenant : une unité de lampe destinée à irradier la lumière émise vers l'objet ; une unité de détection comprenant un premier capteur destiné à détecter la lumière réfléchie, réfléchie par l'objet de façon à réaliser une analyse spectroscopique de la lumière réfléchie par rapport à des régions de longueur d'onde, et un second capteur destiné à détecter l'intensité de la lumière réfléchie ; et une unité de détermination destinée à comparer une valeur de mesure de la lumière réfléchie mesurée par l'unité de détection avec la valeur d'une lumière normalement délivrée en sortie par l'unité de lampe, de façon à déterminer si l'unité de lampe délivre en sortie normalement une lumière.
PCT/KR2016/011361 2015-12-16 2016-10-11 Module de détection de lumière émise et système de gestion l'utilisant WO2017104954A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2015-0180310 2015-12-16
KR20150180310 2015-12-16

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WO2017104954A1 true WO2017104954A1 (fr) 2017-06-22

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20050063458A (ko) * 2003-12-22 2005-06-28 재단법인 포항산업과학연구원 디더블류티티 연성 및 취성 파단면 검출용 조명장치
JP2006302517A (ja) * 2005-04-15 2006-11-02 Doshisha 照明システムおよび照明制御方法
JP2009520194A (ja) * 2005-12-19 2009-05-21 アンスティテュ ナシオナル ドプティーク 物体検出照明システム及び方法
KR20130003493A (ko) * 2011-06-30 2013-01-09 주식회사 포스코 검사 설비 및 이를 이용한 검사 방법
KR101471984B1 (ko) * 2014-05-09 2014-12-16 주식회사 미루시스템즈 조도 조절이 가능한 발광모듈이 구비되는 검사대상물 이송장치

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20050063458A (ko) * 2003-12-22 2005-06-28 재단법인 포항산업과학연구원 디더블류티티 연성 및 취성 파단면 검출용 조명장치
JP2006302517A (ja) * 2005-04-15 2006-11-02 Doshisha 照明システムおよび照明制御方法
JP2009520194A (ja) * 2005-12-19 2009-05-21 アンスティテュ ナシオナル ドプティーク 物体検出照明システム及び方法
KR20130003493A (ko) * 2011-06-30 2013-01-09 주식회사 포스코 검사 설비 및 이를 이용한 검사 방법
KR101471984B1 (ko) * 2014-05-09 2014-12-16 주식회사 미루시스템즈 조도 조절이 가능한 발광모듈이 구비되는 검사대상물 이송장치

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