WO2017094566A1

WO2017094566A1 - Method for managing manufacturing apparatus for manufacturing organic electronic device

Info

Publication number: WO2017094566A1
Application number: PCT/JP2016/084639
Authority: WO
Inventors: 高史末包; 克也今西; 弘藤本; 智柚木▲脇▼; 誠吉▲崎▼
Original assignee: 株式会社住化分析センター
Priority date: 2015-11-30
Filing date: 2016-11-22
Publication date: 2017-06-08
Also published as: TW201728773A; KR20180085020A; JPWO2017094566A1; TWI759274B; KR102575102B1; JP6808642B2

Abstract

The present invention provides a method for managing a manufacturing apparatus that manufactures a high-performance organic electronic device, irrespective of the configuration of the organic electronic device or the manufacturing apparatus. The management method according to one embodiment of the present invention comprises a positioning step for positioning a substrate (2) inside the manufacturing apparatus (1), and a detection step for detecting impurities attached to the substrate (2), the impurities deriving from the materials of the organic electronic device and/or the manufacturing apparatus.

Description

Management method of manufacturing apparatus for manufacturing organic electronics device

The present invention relates to a method for managing a manufacturing apparatus for manufacturing an organic electronic device.

In recent years, a wide variety of organic electronic devices using organic thin films have been developed. In the field of organic electronics devices, “high performance” such as high efficiency, long life, high durability or high sensitivity is always required.

It is known that in order to achieve high performance of organic electronic devices, it is necessary to prevent impurities from being mixed into products during the manufacturing process. As such a technique, for example, techniques described in Patent Documents 1 to 3 have been reported.

Patent Document 1 describes an impurity detection method for detecting impurities derived from a vacuum pump connected to a vacuum chamber, and using an organic film as a detector for detecting the impurities.

Patent Document 2 discloses that when an organic EL element manufacturing apparatus having an organic film forming chamber for forming an organic layer on the surface of a substrate having a hole injection electrode formed thereon is newly assembled, or an apparatus disassembly overhaul. A method for producing an organic EL element is described in which the inside of the apparatus is cleaned with ozone gas and then the organic layer is formed.

Patent Document 3 discloses a method for manufacturing a light-emitting element having a layer containing a light-emitting organic compound between a pair of electrodes, in which a film formation material is heated and vaporized in a film formation chamber under reduced pressure. And a second step of forming a layer included in the layer containing the light-emitting organic compound in the film formation chamber, exhaust, and partial pressure of water in the film formation chamber in the mass spectrometer A method for manufacturing a light-emitting element is described in which the partial pressure of water is smaller than the average value of the partial pressure of water in the first step at the start of the second step. ing.

International Publication No. 2013/145640 pamphlet (published on March 19, 2013) Japanese Patent Publication “JP 2004-192857 (published July 8, 2004)” Japanese Patent Publication “Japanese Unexamined Patent Application Publication No. 2014-199789 (published on October 23, 2014)”

However, there is room for improvement in the conventional technology as described above.

For example, the technique described in Patent Document 1 mainly detects impurities derived from the lubricant of the vacuum pump. In addition, the technique described in Patent Document 2 aims to avoid an adverse effect caused by organic matter in the atmosphere attached to the inside of the stocker chamber. The technique described in Patent Document 3 uses moisture, oxygen, and the like as management indices. From the viewpoint of providing a method for managing a manufacturing apparatus for manufacturing a high-performance organic electronic device, these techniques may not be sufficient.

In addition, the management of the manufacturing apparatus according to the conventional technique as described above may be inappropriate due to the structure of the manufacturing apparatus.

The present invention has been made in view of the above problems, and an object of the present invention is to manage a manufacturing apparatus for manufacturing a high-performance organic electronic device regardless of the configuration of the target organic electronic device or manufacturing apparatus. Is to realize.

As a result of intensive studies to achieve the above object, the present inventors manufactured high-performance organic electronics devices by using impurities derived from materials of organic electronics devices and materials of manufacturing equipment as management indicators. The present inventors have found that a method for managing a manufacturing apparatus can be realized, and have completed the present invention. Moreover, according to this invention, the structure of the target organic electronics device or manufacturing apparatus is not limited. That is, one embodiment of the present invention has the following configuration.

[1] A method for managing a manufacturing apparatus for manufacturing an organic electronic device, comprising: an arrangement step of arranging a base material in the manufacturing apparatus; a material for the organic electronic device attached to the base material; And a detection step of detecting impurities derived from at least one of the materials.

[2] The management method according to [1], wherein the base material includes at least one of a substrate and an organic film.

[3] The management method according to [1] or [2], wherein the base material includes a material of the organic electronic device and is made of a material different from the impurity.

[4] The arrangement step described in any one of [1] to [3], wherein the arrangement step is performed at least one stage before, during and after the manufacture of the organic electronic device. Management method.

[5] The management method according to [4], wherein the organic electronic device has a multilayer film.

[6] The management method according to any one of [1] to [5], wherein the manufacturing apparatus is a manufacturing apparatus for manufacturing an organic electronic device by a vapor deposition process or a coating process.

The present invention has an effect that it is possible to provide a method for managing a manufacturing apparatus for manufacturing a high-performance organic electronic device regardless of the configuration of the target organic electronic device or manufacturing apparatus.

It is a figure which shows typically the example of the arrangement | positioning process in this management method. It is a figure which shows typically the example of the manufacturing method of an organic electronics device. It is a figure which shows the example of the impurity used as a detection target.

Embodiments of the present invention will be described in detail below. For convenience of explanation, members having the same function are denoted by the same reference numerals and description thereof is omitted. Unless otherwise specified in this specification, “A to B” representing a numerical range means “A or more (including A and greater than A) and B or less (including B and less than B)”.

[1. Management method〕
First, an overview of a management method according to an embodiment of the present invention will be described. The management method is a management method of a manufacturing apparatus that manufactures an organic electronics device, and includes an arrangement step of arranging a base material in the manufacturing apparatus, a material of the organic electronic device attached to the base material, and the manufacturing method. Detecting the impurities derived from at least one of the materials of the device.

That is, in the above management method, a contamination evaluation base material is installed in the manufacturing apparatus, taken out after a lapse of a predetermined time, and impurities adhering to the base material are analyzed. The present inventors have found that the organic electronics device has higher performance as the contamination by impurities derived from the material of the organic electronics device and the material of the manufacturing apparatus is smaller. In other words, the inventors of the present invention are not limited to the evaluation of impurities derived from lubricants, organic substances in the atmosphere, moisture, oxygen, etc. in the manufacturing method management method for manufacturing high-performance organic electronic devices. Rather, the present inventors have found that the evaluation of contamination due to impurities derived from materials of organic electronic devices and manufacturing equipment is effective. Therefore, the manufacturing apparatus can be managed based on the evaluation of contamination due to impurities derived from the material of the organic electronics device and the material of the manufacturing apparatus. In the manufacturing apparatus managed by the management method, a high-performance organic electronic device can be manufactured.

In the above management method, the type and amount of impurities serving as a management index and the type of base material can be arbitrarily determined according to the configuration of the manufacturing apparatus or organic electronics device. The configuration of is not limited. Therefore, the above management method can be applied to a wide range of manufacturing apparatuses. Moreover, based on the result obtained by contamination evaluation, the state of the manufacturing apparatus can be managed on a daily basis with a simple operation.

In this specification, “management” means, for example, evaluation of contamination due to impurities, and cleaning, repair, or update of the manufacturing apparatus, if necessary, based on the evaluation result. It means maintaining or improving the performance and the performance of the organic electronic device manufactured by the manufacturing apparatus. Moreover, such a management method can be used for research and development of manufacturing equipment, shipping inspection, and performance inspection during installation. For example, in the research and development of manufacturing equipment, efficient research and development can be performed by performing equipment management by the above management method.

According to the above management method, it is possible to determine an appropriate cleaning timing by paying attention to the amount or the presence or absence of impurities and, for example, by determining and evaluating a reference value. Cleaning in the manufacturing apparatus requires extensive work such as careful wiping with an organic solvent or repeated heating and vacuuming. Therefore, when the cleaning frequency is excessive, the manufacturing cost and the management cost increase. On the other hand, if the manufacturing apparatus is used as it is even though cleaning is necessary, a high-performance organic electronic device cannot be manufactured, resulting in poor yield. According to the management method, since the timing of cleaning can be determined without waste, the manufacturing cost and the management cost can be reduced, and a high-performance organic electronic device can be efficiently manufactured.

In addition, if the effect by the said management method can be confirmed in a specific manufacturing apparatus, the timing of washing | cleaning can be determined similarly about the same apparatus (for example, several manufacturing apparatuses which are the completely same operation methods). If a plurality of manufacturing apparatuses can be managed collectively, the cost advantage will be even greater.

Furthermore, according to the above management method, it is possible to determine the timing of overhauling the manufacturing apparatus or renewing an aging manufacturing apparatus by focusing on the amount and presence of impurities and, for example, determining a reference value and performing an evaluation. . If expensive overhauls or renewals are made on a regular basis or made by sensory judgment based on the performance of the organic electronics device, extra manufacturing and management costs can be incurred. According to the above management method, the timing of overhaul or update can be determined without waste. This is a great merit from the viewpoint of manufacturing cost and management cost.

[2. Manufacturing equipment〕
Next, a manufacturing apparatus that is a management target in the management method will be described. The production apparatus to be managed is not particularly limited as long as it is a production apparatus for producing an organic electronic device.

Examples of the organic electronic device include an organic EL, an organic solar battery, an organic transistor, and an organic memory.

The organic electronic device may be one in which a single layer organic film is formed on a substrate, or may be one in which a multilayer film is formed. According to the management method described above, impurities contained in each layer can be detected even when the organic electronic device has a multilayer film. Therefore, when the management method is applied to a manufacturing apparatus that manufactures an organic electronic device having a multilayer film, it can be evaluated which layer in the multilayer film can contain a large amount of impurities.

As the manufacturing apparatus, a manufacturing apparatus for manufacturing an organic electronic device by a vapor deposition process or a coating process can be used.

FIG. 2 is a diagram schematically showing a method for manufacturing an organic electronic device. FIG. 2A shows a manufacturing method by a vapor deposition process, and FIG. 2B shows a manufacturing method by a coating process.

First, a manufacturing method by a vapor deposition process will be described with reference to FIG. The film forming material 4 is disposed in the film forming material holding unit 3 in the manufacturing apparatus 1 (for example, in the chamber of the manufacturing apparatus). A substrate 5 is disposed on the upper part of the film forming material holding unit 3. When the film forming material 4 is heated by the heating mechanism 6, the film forming material 4 is vaporized and deposited on the substrate 5. Here, the arrow 9 schematically represents the vaporized film forming material 4 being deposited on the substrate 5. And the inside of the manufacturing apparatus 1 is made into a vacuum state by exhausting from the exhaust pipe 7 connected to the vacuum pump etc., and the film-forming material vapor-deposited on the board | substrate 5 is dried. Thereby, an organic electronic device in which the film 8 derived from the film forming material 4 is formed on the substrate 5 can be obtained.

Next, a manufacturing method using a coating process will be described with reference to FIG. Although not shown, the application process can be performed in a glove box or a clean bench. In the present specification, a glove box, a clean bench, and the like are also included in the manufacturing apparatus. In the coating process, a solution of the film forming material 4 is dropped onto the substrate 5 from the droplet discharge mechanism 10. Then, the film forming material applied on the substrate 5 is dried. Thereby, an organic electronic device in which the film 8 derived from the film forming material 4 is formed on the substrate 5 can be obtained.

[3. Arrangement process)
The management method includes an arrangement step of arranging a base material in the manufacturing apparatus. Therefore, impurities derived from at least one of the material of the organic electronics device and the material of the manufacturing apparatus can be attached to the substrate. Therefore, in the detection process to be described later, the type and / or amount of impurities that can adhere to the substrate at any stage of the manufacturing process of the organic electronics device can be evaluated.

<3-1. Base material>
The base material is a target to which the impurity is attached in order to detect the impurity. The material of the base material is not particularly limited, and may be an inorganic material, an organic material, or a mixture of an organic material and an inorganic material. The material of the substrate is preferably a material generally used in the field of organic electronics, for example.

Further, the shape of the substrate is not particularly limited, and may include a flat surface or a curved surface. For example, the base material may be a three-dimensional solid body, may be a spherical body composed of a curved surface, or may be a solid body in which a flat surface and a curved surface are mixed. The base material may be a base material that has flexibility and whose plane and curved surface can freely change. The substrate may be, for example, a substrate generally used in the organic electronics field. Further, the substrate may be a single layer or a multilayer of two or more layers.

The base material preferably includes at least one of a substrate and an organic film. That is, the base material may be a substrate or an organic film, or an organic film formed on the substrate. Since the substrate and the organic film are in a form generally used in the field of organic electronics, they are preferable for detecting impurities that may adhere in the manufacturing process of the organic electronics device.

For example, examples of the material for the substrate include silicon and glass as inorganic materials, and synthetic resin as organic materials. Specific examples of the organic substance include polyimide resin, polyester resin, liquid crystal polymer, epoxy resin, phenol resin, and fluorine resin.

Note that in this specification, an organic film means a film containing an organic substance, and the organic substance includes an aromatic hydrocarbon, a polycyclic aromatic hydrocarbon, a heteroaromatic hydrocarbon, or a heteropolycyclic aromatic hydrocarbon. Induced compounds, compounds in which rings are linked via a covalent bond, compounds containing fullerene in the skeleton, compounds containing porphyrin and phthalocyanine in the skeleton, metal complex compounds containing these structures, and those structures Examples include oligomers and polymers.

The film thickness of the organic film is not particularly limited, and may be 1 nm or less, 1 to 10 nm, 10 to 100 nm, 100 to 1000 nm, or 1 μm or more. May be. In particular, when evaluating impurities derived from a manufacturing apparatus, it is preferable to use an organic film that is as thin as possible as the substrate so that impurities contained in the organic film that is the substrate are reduced. From this viewpoint, the film thickness of the organic film as the substrate is more preferably 10 nm or less, and further preferably 1 nm or less.

Note that the above-mentioned Patent Document 1 describes that impurities cannot be detected only by a substrate, and an organic film must be used to detect impurities. This is considered that the technique described in Patent Document 1 cannot detect using a substrate because impurities derived from a lubricant are targeted for detection. On the other hand, in the case of the management method described above, since the object is to detect impurities derived from the material of the organic electronics device and the material of the manufacturing apparatus, the material of the base material is not particularly limited.

The base material preferably includes a material of the organic electronics device and is made of a material different from the impurities. Examples of the material include compounds derived from the above-described aromatic hydrocarbons, polycyclic aromatic hydrocarbons, heteroaromatic hydrocarbons or heteropolycyclic aromatic hydrocarbons, and rings are connected via a covalent bond. Compounds, compounds containing fullerene in the skeleton, compounds containing porphyrin and phthalocyanine in the skeleton, metal complex compounds containing these structures, oligomers and polymers containing these structures, and the like. Thereby, the impurities which can adhere to the material of the organic electronic device actually used can be detected. Further, by using a material different from the impurity to be detected as a base material, the impurity can be easily detected.

<3-2. Placement method>
The place where the base material is disposed is not particularly limited as long as it is within the manufacturing apparatus. As an arrangement | positioning location of a base material, the inside of the chamber of a manufacturing apparatus is mentioned, for example. In this specification, a chamber means a space in which an organic electronic device is manufactured, and is also referred to as a manufacturing room.

Moreover, the cluster type manufacturing apparatus or the inline type manufacturing apparatus has a plurality of manufacturing rooms. In this case, the substrate may be disposed in at least one of the plurality of manufacturing chambers. According to the above management method, it is possible to specify in which manufacturing chamber contamination may occur by evaluating impurities for each manufacturing chamber. Thereby, the timing of washing can be determined without waste for each manufacturing room. This is a great merit from the viewpoint of manufacturing cost.

The arrangement direction of the base material is not particularly limited, and for example, the surface of the base material to which impurities are to be attached may be the same direction, the reverse direction, the horizontal direction (vertical), or the oblique direction with respect to the gravity direction.

The time for arranging the base material is not particularly limited. From the viewpoint of more reliably attaching impurities to the substrate, the arrangement time is preferably 5 minutes or more, more preferably 10 minutes or more, further preferably 20 minutes or more, more preferably 30 minutes or more. It is particularly preferred that Further, from the viewpoint of completing the arrangement process in a short period, the arrangement time is preferably 15 hours or less, and more preferably 10 hours or less. From the viewpoint of performing management during the operation of the manufacturing apparatus, the arrangement time is particularly preferably 8 hours or less. However, the arrangement time may be changed depending on the purpose, and may be less than 5 minutes when evaluating the amount and presence of impurities in a short time, and 15 when evaluating the amount and presence of impurities over a long period of time. It can be more than hours and can be in units of days, weeks or months. For example, the placement time is 1 day, 2 days, 3 days, 4 days, 5 days, 6 days, 7 days (1 week), 8 days, 9 days, 10 days, 2 weeks, 3 weeks, 4 weeks, There may be months, two months, or three months.

The placement step is preferably performed at least one stage before, during, or after the manufacture of the organic electronic device. Thereby, the impurities which can adhere in each stage before manufacture of an organic electronic device, during manufacture, and after manufacture can be detected in the detection process mentioned below. Therefore, it can be specified at which stage of the manufacturing process of the organic electronic device that impurities can be increased. Therefore, it is possible to obtain a judgment material for determining the timing or the like for cleaning in the manufacturing apparatus. Moreover, since the timing etc. which do not need to perform the washing | cleaning in a manufacturing apparatus can also be determined, it can lead to the efficiency improvement and cost reduction of manufacture of an organic electronics device.

FIG. 1 is a diagram schematically showing an arrangement process in the management method. FIG. 1 (a) shows a case where the placement step is performed before or after the manufacture of the organic electronics device, and FIG. 1 (b) shows a case where the placement step is performed during the manufacture of the organic electronics device. Show.

When the placement step is performed before or after the manufacture of the organic electronic device, for example, as shown in FIG. 1A, the organic electronic device material (substrate and film forming material), the completed organic electronic device, etc. The base material 2 is arrange | positioned in the manufacturing apparatus 1 (for example, in the chamber of a manufacturing apparatus) in the state which is not arrange | positioned. Here, the arrow 11 schematically represents a state in which impurities adhere to the substrate 2. A shutter 12 may be provided on the upper part of the film forming material holding unit 3.

On the other hand, when the placement step is performed during the manufacture of the organic electronics device, as shown in FIG. 1 (b), the substrate 5 and the film forming material 4 are placed, the base material 2 is placed, and the above-described deposition is performed. A process or a coating process may be started.

Here, when the organic electronic device has a multilayer film as described above, any one of the multilayer films (for example, the first layer, the second layer, or the further layer) is formed. Impurities that can be deposited inside can also be detected.

According to the above management method, when manufacturing a multilayer film or manufacturing using different materials in the same manufacturing chamber, it is possible to specify at which stage contamination may occur. In addition, it can be specified which of the layers in the multilayer film can have a particularly large amount of impurities. If it cannot be determined at which stage contamination can occur, the operating costs for improving the manufacturing equipment can be significantly increased. According to the above management method, contamination can be evaluated for each stage of the manufacturing process, so that it is easy to identify a problem when the performance of the organic electronic device deteriorates. Therefore, it leads to an improvement in yield for manufacturing high-performance organic electronics devices.

In addition, the arrangement step may be performed before the manufacture of the organic electronic device when the manufacturing apparatus is newly introduced. According to the above management method, when a new manufacturing apparatus is introduced, it is possible to manage the state when the manufacturing apparatus is installed by evaluating contamination due to impurities derived from the material of the manufacturing apparatus. If the initial contamination due to impurities derived from the material of the manufacturing apparatus that may occur at the time of newly introducing the manufacturing apparatus has not been sufficiently removed, it is determined whether or not additional cleaning is necessary after trial manufacture, and manufacturing costs increase. In addition, if the initial contamination is not noticed, a high-performance organic electronic device cannot be manufactured and the yield may be deteriorated. Therefore, evaluating the initial contamination derived from the material of the manufacturing apparatus leads to improvement in yield after the introduction of the manufacturing apparatus, and prevention of re-setting operations such as cleaning and adjustment. This is a great merit from the viewpoint of manufacturing cost.

Further, when the arrangement process is performed during the manufacture of the organic electronic device, a standby time may be provided at any stage of the manufacturing process. For example, when a multilayer film is formed in a manufacturing process of an organic electronic device, a waiting time may be provided after the first layer is formed and before the formation of the second layer is started. Thereby, impurities can be sufficiently adhered during the standby time. In addition, it is possible to evaluate the influence on the adhesion of impurities and the performance of the completed organic electronic device by providing these waiting times. Based on this evaluation result, it is possible to examine at which stage in the manufacturing process it is necessary to shorten the working time.

[4. Detection process)
The management method includes a detection step of detecting impurities derived from at least one of the material of the organic electronics device and the material of the manufacturing apparatus attached to the base material. As a result, it is possible to detect impurities derived from materials of organic electronics devices and materials of the above manufacturing apparatus, not impurities derived from conventionally known vacuum pump lubricants, organic substances in the atmosphere, and moisture and oxygen. The result can be reflected in the management of the manufacturing apparatus.

<4-1. Impurity>
In the detection step, the impurity to be detected is an impurity derived from at least one of the material of the organic electronics device and the material of the manufacturing apparatus. In the present specification, “impurities derived from at least one of the material of the organic electronics device and the material of the manufacturing apparatus” means impurities derived from the lubricant of the vacuum pump, organic matter in the atmosphere, and impurities excluding moisture and oxygen. Means.

Examples of the impurities derived from the material of the organic electronics device include organic materials and inorganic materials used as the material of the organic electronics device, and derivatives of these materials. Examples of the impurities derived from the material of the organic electronic device include impurities mixed in the organic material and the inorganic material.

Examples of the organic material include aromatic hydrocarbons, polycyclic aromatic hydrocarbons, compounds derived from heteroaromatic hydrocarbons or heteropolycyclic aromatic hydrocarbons, compounds in which rings are linked via a covalent bond, Examples include compounds containing fullerene in the skeleton, compounds containing porphyrin and phthalocyanine in the skeleton, metal complex compounds containing these structures, oligomers and polymers containing these structures, and the like.

The inorganic material includes metals such as aluminum and magnesium, and metal alloys containing them. Examples of the inorganic material include lithium oxide, lithium fluoride, sodium fluoride, and potassium fluoride.

Derivatives of the above materials include decomposition products and polymers of the above organic materials and inorganic materials. Examples of the decomposition products include thermal decomposition products and hydrolysis products. Further, the derivative of the material includes a reaction product (that is, a by-product) in the reaction in which the decomposition product and the polymer are generated. For example, the derivative of the material includes an organic compound and a metal component generated from the organic material and the inorganic material.

As impurities mixed in the organic material and the inorganic material, organic materials, metals, non-metals, and organic materials that were not originally intended to be contained as organic electronics device materials, Halogen etc. are mentioned.

Impurities derived from the material of the organic electronic device include, for example, [alkali metal elements] Li, Na, K, Rb, Cs; [alkaline earth metal elements] Be, Mg, Ca, Sr, Ba; [lanthanoid elements] La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu; [actinoid element] Th, U; [transition metal element] Sc, Ti, V, Cr, Mn Fe, Co, Ni, Cu, Zn, Y, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Cd, Hf, Ta, W, Re, Os, Ir, Pt, Au; [boron group element] B, Al, Ga, In, Tl; [Carbon group element] Si, Ge, Sn, Pb; [Nictogen element] P, As, Sb, Bi; [Chalkogen element] S, Se, Te; [Halogen element] F , Cl, Br, I It may be at least one of.

Examples of the material for the production apparatus include synthetic resins, synthetic resin additives, synthetic resins and derivatives of synthetic resin additives, metal materials, ceramic materials, and glass materials.

Examples of the synthetic resin include polypropylene, polyethylene, polyacetal, fluorine resin (polytetrafluoroethylene, etc.), polyurethane, polyphenylene sulfide, polymethyl methacrylate resin, polyvinyl chloride, polyvinylidene chloride, ABS resin, polyamide and polyester. It is done.

Examples of the synthetic resin additive include a plasticizer, an antioxidant, a light stabilizer, an antistatic agent and a flame retardant added to the synthetic resin.

Examples of the plasticizer include phthalate plasticizers, adipate ester plasticizers, phosphate ester plasticizers, epoxy plasticizers, trimellitic ester plasticizers, citrate ester plasticizers, and polyester plasticizers. Agents and the like. Examples of the antioxidant include phenolic antioxidants, phosphorus antioxidants, and sulfurous antioxidants. Examples of the light stabilizer include benzotriazole light stabilizer, benzophenone light stabilizer, salicylate light stabilizer, cyanoacrylate light stabilizer, nickel light stabilizer, triazine light stabilizer, hindered amine light stabilizer. Phenolic light stabilizers, phosphoric acid light stabilizers, sulfur light stabilizers, and the like. Examples of the antistatic agent include dinonylnaphthyl sulfonic acid, glycidyl methacrylate, polyether ester amide antistatic agent, ethylene oxide-epichlorohydrin antistatic agent, polyether ester antistatic agent, polystyrene sulfonic acid antistatic agent, and Examples include quaternary ammonium base-containing acrylate polymer antistatic agents. Examples of the flame retardant include brominated flame retardants, phosphorus flame retardants, and inorganic flame retardants. Examples of the brominated flame retardant include tetrabromobisphenol A and decabromodiphenyl ether. Examples of the phosphorus flame retardant include aromatic phosphate esters, aromatic condensed phosphate esters, and halogenated phosphate esters. Examples of the inorganic flame retardant include antimony trioxide and magnesium hydroxide.

Examples of the synthetic resin and derivatives of the synthetic resin additive include the synthetic resin and a decomposition product and a polymer of the synthetic resin additive. Examples of the decomposition products include thermal decomposition products and hydrolysis products. Furthermore, the derivative includes a reaction product (that is, a by-product) in the reaction in which the decomposition product and the polymer are generated. For example, examples of the derivative include organic compounds generated from the synthetic resin and the synthetic resin additive, and inorganic substances such as inorganic salts and inorganic oxides.

The metal material means a component used for the metal material of the manufacturing apparatus. Examples of the metal material include stainless steel, aluminum, copper, nickel, and metal alloys thereof. The metal material includes plated steel and the like.

Examples of the ceramic material include alumina, zirconia, boron nitride, silicon carbide, and silicon nitride.

Examples of the glass material include silicon dioxide, boron oxide, diphosphorus pentoxide, titanium oxide, bismuth carbide, lead oxide, aluminum fluoride, zinc chloride, lithium oxide, sodium oxide, potassium oxide, magnesium oxide, calcium oxide, and strontium oxide. , Lithium chloride, zirconium oxide and the like.

FIG. 3 is a diagram showing a specific example of impurities to be detected in the detection step.

The compound shown in (a) of FIG. 3 is represented by the chemical formula C ₃₆ H ₄₄ , CAS number 677275-33-1 and is also called TBPe (2,5,8,11-tetra-tert-butylperylene).

The compound shown in FIG. 3B is represented by the chemical formula C ₃₀ H ₂₀ N ₂ , CAS No. 550378-78-4, and is also called 9,9 ′-(1,3-phenylene) bis-9H-carbazole.

The compound shown in (c) of FIG. 3 is represented by chemical formula C ₄₆ H ₄₆ N ₂ , CAS No. 1174006-36-0, and di- [4- (N, N-di-p-tolyl-amino) -phenyl. ] Also called cyclohexane.

The compound shown in FIG. 3D is represented by the chemical formula C ₁₃ H ₁₀ N ₂ , CAS No. 716-79-0.

The compound shown in (e) of FIG. 3 is represented by the chemical formula C ₁₄ H ₁₂ N ₂ .

The compound shown in (f) of FIG. 3 is represented by the chemical formula C ₁₉ H ₁₄ N ₂ , CAS No. 2622-67-5.

The compound shown in FIG. 3 (g) is represented by the chemical formula C ₄₄ H ₃₂ N ₂ , CAS No. 123847-85-8, and NPD (N, N′-bis- (1-naphthyl) -N, N′- Also referred to as bis-phenyl- (1,1′-biphenyl) -4,4′-diamine).

The compound shown in (h) of FIG. 3 is represented by chemical formula C ₅₄ H ₃₅ N ₃ , CAS No. 1141757-83-6, and TrisPCz (9,9′-diphenyl-6- (9-phenyl-9H-carbazole-) 3-yl) -9H, 9′H-3,3′-bicarbazole).

The compound shown in (i) of FIG. 3 is represented by the chemical formula C ₄₅ H ₃₀ N ₆ .

The compound shown in FIG. 3 (j) is represented by the chemical formula C ₃₉ H ₂₇ N ₃ , CAS No. 1201800-83-0, and T2T (2,4,6-tris (biphenyl-3-yl) -1,3 , 5-triazine).

The compound shown in (k) of FIG. 3 is represented by the chemical formula C ₅₆ H ₃₂ N ₆ , CAS No. 1416881-52-1 and represented by 4CzIPN (2,4,5,6-tetrakis (carbazol-9-yl) -1 , 3-dicyanobenzene).

The compound shown in (l) of FIG. 3 is represented by the chemical formula C ₅₄ H ₃₆ N ₄ , CAS No. 139092-78-7, and TCTA (4,4 ′, 4 ″ -tri-9-carbazolyltriphenylamine). ).

The compound shown in FIG. 3 (m) is represented by the chemical formula C ₂₂ H ₄₂ O ₄ , CAS No. 103-23-1, and is also called dioctyl adipate.

The compound shown in (n) of FIG. 3 is represented by the chemical formula C ₂₄ H ₃₈ O ₄ , CAS No. 117-81-7, and is also called dioctyl phthalate.

Examples of the impurities include 2-phenyl-1H-benzimidazole, phenyl- (p-tolyl) -benzimidazole, bis (2-ethylhexyl) terephthalate, 2-ethyl-1-hexanol, di-2-adipate Also included are ethylhexyl (DOA), di-2-ethylhexyl phthalate (DOP), phthalic anhydride (DOP decomposition product), and cyclic siloxane D10-12.

The portion to which the impurity to be detected adheres may be any portion on the substrate. The part to which the impurities adhere may be, for example, the surface of the substrate. When the substrate is an organic film, the portion to which the impurities adhere may be the surface of the organic film, the inside of the organic film, or the entire organic film. Depending on the pretreatment method and the measurement method described later, the analysis can be performed in stages in the thickness direction of the organic film. When the substrate is planar and there are front and back surfaces, the portion to which the impurities adhere may be either surface or both.

<4-2. Pretreatment method>
When measuring impurities, the substrate may be pretreated to recover the impurities. When a measurement method capable of directly measuring impurities is used, pretreatment does not have to be performed.

For example, as a method for recovering impurities, recovery by solvent contact, recovery by vapor contact, recovery by heat desorption, recovery by vacuum desorption, recovery by laser desorption, recovery by physical peeling, etc. may be mentioned. When performing solvent contact or vapor contact, the impurities and the organic film may or may not dissolve in the solvent. When the impurities and the organic film are dissolved in the solvent, the impurities can be recovered together with the solvent. When the impurities and the organic film are not dissolved in the solvent, the impurities and the organic film can be recovered by washing away. In the case of vapor contact, impurities can be recovered with a small amount of solvent, compared to a method of immersing and dissolving the substrate in a liquid solvent, so that contamination derived from the solvent can be reduced.

When performing solvent contact, the solvent may be water, an acid, an alkali, an organic solvent, or a mixture thereof. The solvent may be a solvent in which the organic film is dissolved, or may be a solvent in which the organic film is peeled but not dissolved. Further, from the viewpoint of recovering without changing the properties of the components contained in the organic film, the solvent is preferably a solvent that does not decompose the organic film. Furthermore, from the viewpoint of preventing the elution of impurities contained in the substrate, it is preferable to select a solvent that does not dissolve or decompose the substrate.

Examples of the organic solvent include acetonitrile, chloroform, dichloromethane, tetrahydrofuran, hexane, toluene and methanol. Further, from the viewpoint that the component to be analyzed can be evaluated as water-soluble ions, the solvent is preferably water.

Examples of the acid include hydrofluoric acid, nitric acid, hydrochloric acid, sulfuric acid, phosphoric acid, hydrogen peroxide solution, and perchloric acid. The acid may be an aqueous solution or a mixture of two or more acids. The acid concentration in the solution is preferably higher, for example, preferably 20% or more, more preferably 50% or more, and particularly preferably 60% or more.

Examples of the alkali include ammonia, sodium hydroxide, calcium hydroxide, and tetramethylammonium hydroxide. The alkali may be an aqueous solution or a mixture of two or more alkalis. The alkali concentration in the solution is preferably higher, for example, preferably 20% or more, more preferably 50% or more, and particularly preferably 60% or more.

When the vapor contact is performed, the vapor vaporized from the solvent may be brought into contact with the substrate. Specific examples of the method for vaporizing the solvent include a heating method, a depressurizing method, and a ultrasonic vibration method. Moreover, these methods can also be combined suitably.

In the heating method, the solvent may be boiled, and it is not necessary to boil as long as sufficient vapor is generated to peel or dissolve the organic film. Therefore, you may heat to the boiling point of a solvent and may heat to the temperature below a boiling point. Preferably the steam is saturated steam. The heating temperature can be appropriately determined according to the type of the solvent, but from the viewpoint of sufficiently generating steam, the temperature is preferably close to the boiling point of the solvent, and more preferably the boiling point of the solvent. For example, when the solvent is water, the heating temperature at 1 atm is preferably 80 ° C. to 100 ° C., more preferably 90 ° C. to 100 ° C., and particularly preferably 100 ° C. In the case of vapor contact, it is possible to perform the treatment at a low temperature as compared with the method of oxidizing and decomposing the organic film at a high temperature. In addition, for example, when the solvent is water, the heating time is preferably 5 minutes to 120 minutes, and more preferably 10 minutes to 30 minutes. For example, when the solvent is a low boiling point solvent such as acetonitrile, chloroform, dichloromethane, tetrahydrofuran, hexane or methanol, it is preferably 3 minutes to 60 minutes, more preferably 5 minutes to 20 minutes. For example, when the solvent is a medium boiling point solvent such as toluene, nitric acid, hydrofluoric acid, nitric acid, hydrochloric acid, hydrogen peroxide, perchloric acid, aqueous sodium hydroxide, aqueous potassium hydroxide or aqueous tetramethylammonium hydroxide It is preferably 5 minutes to 120 minutes, more preferably 10 minutes to 30 minutes. For example, when the solvent is a high boiling point solvent such as sulfuric acid or phosphoric acid, it is preferably 10 minutes to 120 minutes, and more preferably 20 minutes to 60 minutes. The heating time is preferable from the viewpoint of sufficiently generating steam.

In the method of reducing the pressure, the pressure may be reduced to a pressure at which steam is generated.

When the base material includes an organic film and a substrate, the organic film may be peeled off from the substrate while maintaining the shape of the film, or a part or all of the organic film may be dissolved. For example, the organic film may be peeled off when vapor penetrates into the organic film and reaches the interface between the organic film and the substrate to weaken the bond between the organic film and the substrate. Further, the surface of the organic film may be gradually dissolved. When the organic film is composed of a plurality of layers, the layers may be separated one by one.

The dissolved organic film may be collected together with the solvent. The peeled organic film may be collected together with the solvent, or separated from the solvent, and specifically collected as a film-like organic substance remaining on the substrate. Therefore, the solvent may also function as a recovery liquid for the organic film.

Furthermore, by changing the type of the solvent, it is possible to recover the volatile element contained as a component to be analyzed, or to recover the component according to the form (solid, liquid or gas). Moreover, the element contained as a component used as analysis object can also be collect | recovered with the form of ion. Moreover, the blank in operation can be reduced by selecting the kind of solvent.

The time for bringing the vapor into contact with the substrate may be appropriately set according to the type and vapor pressure of the solvent, the size of the substrate, and the like. From the viewpoint of sufficiently peeling or dissolving the organic film, for example, the time for contacting the vapor is preferably 30 minutes to 60 minutes, more preferably 60 minutes to 180 minutes, and 180 minutes to 480. It is particularly preferred that the minute.

In the pretreatment, the base material may be brought into contact with the steam, and the base material may be heated or cooled.

Also, for example, the peel strength of the organic film can be changed by changing conditions such as temperature and / or time when the steam is generated. For this reason, the above-mentioned pre-processing method has a possibility of being applicable to the evaluation in the depth direction (thickness direction of an organic film) of the component contained in an organic film. Therefore, only a partial region in the thickness direction of the organic film may be collected by adjusting the peel strength. Thereby, an arbitrary region in the thickness direction of the organic film can be selectively recovered. Therefore, it can analyze in steps in the thickness direction of the organic film. Therefore, for example, the content of a component present on the surface of the organic film and the content of a component present in a region close to the interface between the substrate and the organic film can be distinguished and analyzed.

In the present specification, the component existing on the surface of the organic film means a component that exists inside the organic film and that is close to the surface of the organic film and a component that is attached to the surface of the organic film. . The region inside the organic film and close to the surface of the organic film may be, for example, a region within 10 nm in the thickness direction from the surface of the organic film to the inside, or a region within 1 nm in the thickness direction. It may be a region within 0.1 nm in the thickness direction.

The direction in which steam is brought into contact with the base material is not particularly limited. The base material may be disposed in the container, and steam may be generated in the container, so that the container is filled with the steam and the base material and the steam may be brought into contact with each other. Alternatively, the vapor may be brought into contact with the substrate from a desired direction by blowing a gas containing vapor onto the substrate.

The vapor contact is preferably performed in a closed container. In this case, recovery loss can be reduced even when the component to be analyzed has volatility. The sealed container is not particularly limited as long as it can prevent the analysis target component from volatilizing into the environment outside the container. It is good also as an airtight container by using the container which has an opening part, and closing an opening part with a base material. In addition, when the vapor contact is performed in the sealed container, contamination from the operating environment can be prevented.

An example of a method for generating steam in the container will be described below. First, a solvent corresponding to the impurity to be collected or the material of the organic film is put in a container. The container which puts a solvent should just be formed with the material provided with the tolerance with respect to the said solvent (it is not melt | dissolved with a solvent). Specifically, a container formed of fluororesin or quartz is preferable because it does not contaminate the collected analysis sample. Examples of the fluororesin include polytetrafluoroethylene (PTFE), tetrafluoroethylene / perfluoroalkyl vinyl ether copolymer (PFA), polyvinylidene fluoride (PVDF), and polychlorotrifluoroethylene (PCTFE).

Next, the base material is placed in a container containing a solvent. The said base material should just be set in the position which does not contact with a liquid solvent (solvent before vaporizing). And a vapor | steam may be generated by heating a container or carrying out pressure reduction or ultrasonic vibration in a container, and a base material and a vapor | steam should be contacted.

For example, when the base material includes a substrate and an organic film, the base material may be disposed so that the surface on which the organic film is formed faces downward, and vapor may be contacted from below. Moreover, a base material may be arrange | positioned so that the surface in which the organic film was formed may face upward, and vapor | steam may be contacted from the upper side. Here, “down” means the direction of gravity, and “up” means the direction opposite to the direction of gravity. Further, the base material may be arranged so that the surface on which the organic film is formed faces in a direction perpendicular to the direction of gravity, and vapor may be contacted.

When the base is placed so that the surface on which the organic film is formed faces downward, and vapor is contacted from below, the organic film (or dissolved organic film) is dropped by gravity in the direction of gravity. You can also Further, in this case, if a solvent that is a generation source of vapor is disposed on the lower side, the peeled organic film (or a dissolved substance of the organic film) can be dropped and recovered in the solvent.

Also, the vapor may be brought into contact with only a partial region of the substrate by adjusting the area of the substrate with which the vapor is brought into contact. Thereby, the component originating in the arbitrary area | regions of a base material can be collect | recovered selectively. Therefore, impurities existing in an arbitrary region of the substrate can be selectively analyzed. For example, you may adjust the area which contacts the vapor | steam in a base material by masking areas other than the arbitrary area | region used as analysis object, and making a vapor contact.

According to the vapor contact, by adjusting the contact area and the contact strength of the vapor, it is possible to recover the component derived from the entire base material, or to recover the component derived from a partial region of the base material. it can. In addition, according to the vapor contact, it is easier to selectively recover components derived from an arbitrary region of the base material than, for example, a method of oxidizing and decomposing the base material at a high temperature.

<4-3. Measuring method>
The method for measuring the amount and presence of impurities can be appropriately selected depending on the form of the substrate and the type of impurities to be measured.

Measurement methods include liquid chromatography mass spectrometry (LC-MS), gas chromatography mass spectrometry (GC-MS), ion chromatography (IC), inductively coupled plasma mass spectrometry (ICP-MS), X-ray Photoelectron spectroscopy (XPS), X-ray diffraction (XRD), time-of-flight secondary ion mass spectrometry (TOF-SIMS), matrix-assisted laser desorption ionization time-of-flight mass spectrometry (MALDI-TOFMS), hydrogen Gas chromatography using a flame ionization detector (GC-FID), Gas chromatography using a flame photometric detector (GC-FPD), Liquid chromatography using a UV detector (LC-UV), Inductive coupling Plasma emission spectroscopy (ICP-AES), capillary electrophoresis (CE), atomic absorption spectrometry ( AS) and glow discharge optical emission spectrometry (GD-OES), and the like. The measurement method may be LC-MS / UV or GC-MS / FID combined with the above methods, or may be a measurement method using other detectors depending on the measurement object. Moreover, the said measuring method may exclude the measurement of a water contact angle.

[5. Other processes]
The management method includes a determination step of determining whether or not the amount of impurities detected by the detection step is less than or equal to a preset reference amount or greater than or equal to a preset reference amount. You may go out. It can be said that the determination step is a step of determining whether or not the detected amount of impurities is greater than the reference amount or less than the reference amount. According to the determination step, it is possible to obtain a determination material for determining whether or not a process such as cleaning is necessary to remove impurities.

The above management method may include a cleaning process for cleaning the manufacturing apparatus. According to the cleaning step, impurities can be appropriately removed in the manufacturing apparatus. The cleaning step may be performed when it is determined in the determination step that the amount of impurities is greater than or equal to a preset reference amount or greater than a reference amount. Thereby, since unnecessary cleaning is not required, an organic electronic device can be efficiently manufactured.

Further, the above-described arrangement process may be performed after the cleaning process. According to the above management method, paying attention to the increase / decrease and presence / absence of impurities in the manufacturing apparatus after cleaning, for example, by determining and evaluating a reference value, the cleaning effect is confirmed at a stage before the manufacturing apparatus is restarted. be able to. If the performance of the organic electronics device does not improve after restarting and it is judged that cleaning is inadequate even after extensive cleaning work, stop the operation of the manufacturing equipment and perform cleaning again There is a need. In this case, extra manufacturing costs and management costs can occur. According to the above management method, it is possible to prevent useless operation stop and re-cleaning. This is a great merit from the viewpoint of manufacturing cost and management cost.

The present invention is not limited to the above-described embodiments, and various modifications can be made within the scope of the claims, and embodiments obtained by appropriately combining technical means disclosed in different embodiments. Is also included in the technical scope of the present invention.

Hereinafter, the present invention will be described in more detail based on examples, but the present invention is not limited to the following examples. In the following, a vacuum deposition apparatus was used as the manufacturing apparatus.

[Example 1]
In each of the two vacuum deposition apparatuses, a 4-inch φ silicon wafer was placed as a base material. Specifically, the base material was held by a substrate holder in a chamber of a vacuum deposition apparatus. The substrate was taken out after standing for 30 minutes and after standing for 15 hours. Impurities attached to the front side of the base material (hereinafter, the front side of the base material means the surface facing the film-forming material holding unit 3 in the base material 2 of FIG. 1A) contact the organic solvent. The recovered solution was measured by LC-MS. The results are shown in Table 1. The aromatic compounds shown in (a) to (l) of FIG. 3 are detected as impurities derived from the material of the organic electronics device, and the adipic acid ester shown in (m) of FIG. The phthalate ester shown in (n) of FIG. 3 was detected.

The exact mass (Exact （Mass) of the detected compound is shown below.

Compound shown in FIG. 3 (a): 476.3443
Compound shown in FIG. 3 (b): 408.1626
Compound shown in (c) of FIG. 3: 626.3661
Compound shown in FIG. 3 (d): 194.0844
Compound shown in FIG. 3 (e): 208.1000
Compound shown in FIG. 3 (f): 270.1157
Compound shown in FIG. 3 (g): 588.2565
Compound shown in (h) of FIG. 3: 725.2831
Compound shown in FIG. 3 (i): 654.2532
Compound shown in FIG. 3 (j): 537.2205
Compound shown in FIG. 3 (k): 788.2688
Compound shown in FIG. 3 (l): 740.2940
Compound shown in FIG. 3 (m): 370.3083
Compound shown in (n) of FIG. 3: 390.2770.

From the above, it can be seen that impurities derived from the material of the organic electronics device and the material of the manufacturing apparatus can exist in the manufacturing apparatus. It is anticipated that these can affect the performance of organic electronic devices. In Example 1, the amount and type of impurities detected increased as the standing time increased.

[Example 2]
A silicon wafer having a diameter of 4 inches was placed as a base material in one vacuum deposition apparatus, and was taken out after standing for 30 minutes and standing for 15 hours. Impurities adhering to the front side of the substrate were measured by wafer heating desorption gas chromatography mass spectrometry (WTD-GC-MS). Table 2 shows the results of quantifying the amount of impurities per 1 cm ^{2 of the} silicon wafer using a hexadecane standard sample. Aromatic compounds (Nos. 1 to 4), which are impurities derived from organic electronics device materials, and additives (Nos. 5 to 12), which are impurities derived from materials for manufacturing equipment, were detected.

Also in Example 2, it can be seen that impurities derived from the material of the organic electronics device and the material of the manufacturing apparatus can exist in the manufacturing apparatus. In Example 2, the amount and type of detected impurities tended to increase as the standing time increased.

Example 3
A silicon wafer having a diameter of 4 inches was placed as a base material in one vacuum deposition apparatus, and was taken out after standing for 15 hours. Impurities adhering to the front side of the substrate were dissolved by contacting with an acid solvent, and the dissolved solution was measured by ICP-MS. Table 3 shows the results of quantifying the amount of impurities per one silicon wafer using a standard sample of each detection element.

According to the above management method, it can be seen that not only organic substances but also inorganic element components can be detected as impurities.

Example 4
A silicon wafer having a diameter of 4 inches was placed as a base material in one vacuum vapor deposition apparatus, and was left after standing for 15 hours, and this base material was evaluated as a sample for measuring the amount of impurities before cleaning the apparatus. Subsequently, an organic EL device was created using the same apparatus. After cleaning the inside of the apparatus, a 4-inch φ silicon wafer was placed as a base material in the same manner as before cleaning, taken out after standing for 15 hours, and this base material was evaluated as a sample for measuring the amount of impurities after cleaning the apparatus. An organic EL device was created again with the same apparatus. Impurities adhering to the front side of the substrate were recovered by contacting with an organic solvent, and the recovered liquid was measured by LC-MS. The total amount of impurities detected was evaluated as the degree of contamination. Note that the total amount of the impurities does not include impurities derived from the lubricant of the vacuum pump, organic substances in the atmosphere, moisture and oxygen. Moreover, the light emission lifetime LT90 (initial luminance 1000 cd / m ² ) of the organic EL device was evaluated. Table 4 shows the relative contamination degree and the relative light emission lifetime when the pre-device cleaning is 100%.

It was shown that the above management method is effective in confirming the cleaning effect.

Example 5
A 3-inch φ Si wafer was placed as a substrate in a vacuum deposition apparatus. Using the inside of the vacuum deposition apparatus, an organic EL device having a hole injection layer, a hole transport layer, a light emitting layer, a hole block layer and an electron transport layer as a multilayer film was prepared. While maintaining the film formation time of each layer and the waiting time until the next layer is formed, waiting for 60 minutes or 40 minutes intentionally before starting the formation of the next layer before and after the formation of the light emitting layer. A device with time and a device without standby time were created and evaluated for life. That is, in a device provided with a standby time, it is 60 minutes or 40 minutes after the formation of the hole transport layer and before the formation of the light emitting layer and after the formation of the light emitting layer and before the formation of the hole block layer, respectively. A waiting time of minutes was set up. In addition, a shutter was disposed between the base material and the film forming material holding unit so that the film forming material did not adhere to the base material during the film formation of each layer. The substrate thus obtained was evaluated as a sample for measuring the amount of impurities. Impurities adhering to the front side of the substrate were recovered by contacting with an organic solvent, and the recovered liquid was measured by LC-MS. The total amount of impurities detected was evaluated as the degree of contamination. Note that the total amount of the impurities does not include impurities derived from the lubricant of the vacuum pump, organic substances in the atmosphere, moisture and oxygen. The organic EL device was evaluated with a light emission lifetime LT90 (initial luminance 1000 cd / m ² ). Table 5 shows the relative contamination degree and the relative light emission lifetime when the result of waiting for 60 minutes before and after the light emitting layer is 100%.

From this result, in the above management method, when waiting times are provided at any stage of the manufacturing process of the organic electronics device, the influence on the adhesion of impurities due to the provision of these waiting times and the performance of the completed organic electronics device It can be seen that the impact on the environment can be evaluated. This evaluation result can be used for studying at which stage in the manufacturing process it is necessary to shorten the work time.

The present invention can be used mainly in the field of organic electronics devices.

1 Manufacturing equipment 2 Base material

Claims

A method for managing a manufacturing apparatus for manufacturing an organic electronic device,
An arrangement step of arranging a substrate in the manufacturing apparatus;
And a detection step of detecting impurities originating from at least one of the material of the organic electronics device and the material of the manufacturing apparatus attached to the base material.
The management method according to claim 1, wherein the base material includes at least one of a substrate and an organic film.
The management method according to claim 1 or 2, wherein the base material includes a material of the organic electronic device and is made of a material different from the impurity.
The management method according to any one of claims 1 to 3, wherein the arranging step is performed in at least one stage before, during or after the manufacture of the organic electronic device.
The management method according to claim 4, wherein the organic electronic device has a multilayer film.
The management method according to any one of claims 1 to 5, wherein the manufacturing apparatus is a manufacturing apparatus for manufacturing an organic electronic device by a vapor deposition process or a coating process.