WO2017092367A1 - Silicon block cleansing device - Google Patents

Silicon block cleansing device Download PDF

Info

Publication number
WO2017092367A1
WO2017092367A1 PCT/CN2016/089969 CN2016089969W WO2017092367A1 WO 2017092367 A1 WO2017092367 A1 WO 2017092367A1 CN 2016089969 W CN2016089969 W CN 2016089969W WO 2017092367 A1 WO2017092367 A1 WO 2017092367A1
Authority
WO
WIPO (PCT)
Prior art keywords
silicon block
bottom plate
hole
silicon
frame
Prior art date
Application number
PCT/CN2016/089969
Other languages
French (fr)
Chinese (zh)
Inventor
刘刚
秦榕
曹文海
高亚丽
李永红
李文强
何银凤
薛心禄
王素贤
吴良
刘言博
杨紫琪
Original Assignee
朱伯秦
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 朱伯秦 filed Critical 朱伯秦
Publication of WO2017092367A1 publication Critical patent/WO2017092367A1/en

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere

Definitions

  • the present invention relates to the field of semiconductor processing equipment, and in particular, to a silicon block cleaning apparatus.
  • pickled silicon is critical to the maintenance of product purity and surface impurities.
  • the pickling process is to fill the broken silicon block into the silicon block cleaning device, put it in the pickling equipment for pickling, acidly corrode the surface impurities, remove the surface contamination of the silicon material, and make the metal impurities on the silicon surface reach the electronic grade metal quality. Claim.
  • the existing silicon block cleaning device is a rectangular basket with a square hole at the bottom and the side, and the silicon blocks are stacked together.
  • the contact surface between the silicon block and the silicon block and between the silicon block and the cleaning basket The contact surface is not sufficiently pickled, resulting in acid spots and chromatic aberrations on the silicon block, which increases the amount of backwash of the product.
  • the invention provides a silicon block cleaning device, which changes the surface contact between the original silicon block and the cleaning device into a line contact, optimizes the polysilicon surface cleaning process, and improves the pickling efficiency and product quality of the polysilicon material.
  • the technical solution provided by the present invention is to provide a silicon block cleaning device, which includes an outer frame, the outer frame includes a bottom plate and a frame extending upward from the bottom plate, and the bottom plate and the frame surround the frame a plurality of first through holes are formed in the bottom plate, and a plurality of second through holes are formed in the frame, the first through holes and the second through holes are used for injecting a cleaning liquid; wherein
  • the device further includes a plurality of inner frames stacked on each other in the accommodating cavity, and the bottom of the inner frame is a hollow structure including a plurality of carrier bars, and the inner frame is used for loading silicon blocks.
  • the inner frame is further provided with at least one baffle, and the baffle divides the inner frame into a plurality of lattices.
  • the number of the grids is 2 to 5.
  • the bottom plate is further provided with a plurality of screw connectors protruding from the bottom plate.
  • top end of the threaded connector is spherical or hemispherical.
  • the distance between the top end of the threaded connector and the bottom plate is 4-6 mm.
  • threaded connection member and the first through hole are respectively distributed in an array on the bottom plate, and the threaded connection member and the first through hole are arranged in a staggered array.
  • the plurality of carrier strips are arranged at equal intervals.
  • the carrier strip has a width of 3 to 5 mm and a thickness of 3 to 5 mm.
  • first through hole and the second through hole are circular holes or square holes.
  • the silicon block cleaning device provided by the invention has a layered arrangement of the original cleaning device, so that the surface contact between the original silicon block and the cleaning device becomes line contact, optimizes the polysilicon surface cleaning process, and improves the pickling efficiency of the polysilicon material and
  • the quality of the product solves the problem of uneven pickling caused by the accumulation of silicon blocks, acid spots and chromatic aberration.
  • FIG. 1 is a schematic structural view of a silicon block cleaning device of the present invention
  • 2a is a schematic structural view of the inner frame of the silicon block cleaning device
  • 2b is another schematic structural view of the inner frame of the silicon block cleaning device
  • FIG. 3 is a schematic structural view of a first bottom plate of a silicon block cleaning device
  • Figure 4 is a cross-sectional view of the outer block of the silicon block cleaning device.
  • a silicon block cleaning device provided by the present invention includes an outer frame 1 and an inner frame 2 , and the outer frame includes a bottom plate 11 and a frame 12 .
  • the bottom plate 11 and the frame 12 are formed into a receiving cavity, and a plurality of inner frames 2 are stacked on each other in the receiving cavity.
  • the frame 12 is extended upward from the bottom plate 11.
  • the bottom plate is provided with a plurality of first through holes 11a
  • the frame is provided with a plurality of second through holes 12a, the first through holes 11a and
  • the second through hole 12a is used for injecting a cleaning liquid to clean the silicon block carried on the inner frame 2.
  • the cleaning liquid is a mixed solution of nitric acid and hydrofluoric acid. Therefore, in order to prevent the silicon block cleaning device from being corroded during the cleaning process, the material of the silicon block cleaning device must be resistant to corrosion and abrasion.
  • the material of the bottom plate 11 and the frame 12 is a PP material.
  • the shape of the second through hole 11a may be a circular hole or a square hole, which is not limited herein.
  • the silicon block cleaning apparatus of the present embodiment includes a plurality of inner frames 2 stacked on each other in the accommodating cavity, the inner frame 2
  • the number of the inner frame 2 can be set according to actual needs, and is not limited thereto, and is usually set to 2 to 4.
  • the material of the inner frame 2 is an acid-resistant material, for example, the material of the inner frame 2 is a PE material.
  • the bottom portion 21 of the inner frame is a hollow structure including a plurality of carrier strips 21a, and the carrier strip 21a is used to carry silicon to be cleaned.
  • the inner frame 2 may be arranged by the carrier strips 21a at equal intervals in the horizontal direction, or may be arranged by the carrier strips 21a at equal intervals in the vertical direction, or may be respectively carried by the carrier strips 21a.
  • the horizontal direction and the vertical direction are arranged at equal intervals.
  • the carrier strip 21a has a width of 3 to 5 mm and a thickness of 3 to 5 mm.
  • the shape of the carrier strip can be selected according to requirements. In order to reduce the contact area between the carrier strip and the silicon block, the silicon is made. The block cleaning is more thorough. Further, the carrier strip 21a has a cylindrical shape and a diameter of 3 to 5 mm.
  • the inner frame 2 further includes a side wall 22 corresponding to the frame 12, and the two ends of the carrier strip 21a and the side wall 22 are respectively adjacent to the bottom plate. 11 is connected at one end.
  • the side wall 22 mainly serves as a support.
  • the silicon block to be cleaned is laid on the carrier strip 21a, and then the inner frame 2 carrying the silicon block is sequentially stacked into the receiving cavity surrounded by the bottom plate 11 and the frame 12, so that the upper and lower inner frames are
  • the silicon blocks located on the carrier strip 21a in 2 are not in contact, and the unevenness of cleaning due to the accumulation of the silicon blocks is avoided.
  • the structure of the inner frame 2 stacked on the upper and lower sides may be different (as shown in FIGS. 2a and 2b), for example, the side wall of the inner frame 2 located on the upper layer. 22 may include only two sides in parallel, and the other two sides are formed as an opening, and the cleaning liquid injected from the second through hole 12a can easily flow in from the opening.
  • the inner frame 2 is further provided with at least one baffle 23, and the baffle 23 will be the inner frame 2 separated into A plurality of lattices, further, the number of the lattices is 2 to 5.
  • the baffle 23 will be the inner frame 2 separated into A plurality of lattices, further, the number of the lattices is 2 to 5.
  • the bottom plate 11 when the inner frame 2 is close to the bottom plate 11, in order to increase the contact area between the silicon block and the cleaning liquid injected into the first through hole 11a, the bottom plate 11 is further provided with A plurality of threaded connectors 11b projecting from the bottom plate 11, the top ends of the threaded connectors 11b being spherical or hemispherical.
  • the threaded connecting piece 11b and the first through hole 11a are respectively distributed in an array on the bottom plate 11, and the threaded connecting piece 11b and the first through hole 11a are arranged in a staggered array.
  • the distance between the top end of the threaded connecting member 11b and the bottom plate 11 is 4-6 mm.
  • the threaded connecting member 11b is a bolt of M10, and the length of the stud is 20 mm (a part of the rotating into the bottom plate 11 is A portion is raised on the bottom plate 11), wherein the number of the screw connectors 11b corresponds to the number of the first through holes 11a. Since the threaded connection member 11b is also in contact with the silicon block cleaning liquid, the material of the threaded connection member 11b is also an acid-resistant material, such as a PP material or a PE material.
  • the bottom plate 11 of the silicon block cleaning device has a size of 520 mm*325 mm*10 mm, and the dimensions of the frame 12 are 325 mm*80 mm*10 mm and 520 mm*80 mm*10 mm, respectively, and the diameter of the first through hole.
  • the bottom plate 11 is equidistantly disposed with 11 rows of first through holes 11a, and each of the columns is equidistantly provided with 21 first through holes 11a; correspondingly, the bottom plate 11 is equally spaced with 12 rows of threads.
  • the connecting members 11b are provided with 20 threaded connecting members 11b at equal intervals in each row.
  • the threaded connection member 11b is a bolt of M10, the length of the stud is 20 mm, the top end is spherical, and the distance between the top end and the bottom plate is 6 mm.
  • the frame 12 is provided with two rows of second through holes 12a, and the second through holes 12a have a diameter of 5 mm.
  • the silicon block cleaning device includes two inner frames 2, and the bottom of each inner frame 2 is a hollow structure formed by the carrier strips 21a, and each inner frame 2 is provided with three baffles 23, The baffle 23 divides the inner frame into four grids.
  • the diameter of the carrier strip 21a is 3 mm, and the spacing between adjacent carrier strips 21a is 10 mm.
  • a silicon block is laid on the bottom of the first inner frame 2. After the laying is completed, it is placed in the receiving cavity of the bottom plate 11 and the frame 12, and then laid on the bottom of the second inner frame 2. After the silicon blocks are laid, they are stacked on the first inner frame 2, so that two silicon blocks are formed, and the two silicon blocks are supported by the side walls 22.
  • the silicon block cleaning device is placed in a pool with an acid concentration of 10:1 (nitric acid: hydrofluoric acid) for pickling, the pickling time is 5 minutes, and then the silicon block is subjected to cold soaking and hot soaking and ultrasonication.
  • the treatment wherein the cold soaking time is 6 hours, the hot soaking and the ultrasonic treatment time is 4 hours, and finally the silicon block is dried, and the drying time is 10 hours.
  • the entire cleaning process is completed, and then the silicon block after the cleaning is sorted, and the silicon material with no color difference and smooth surface is sorted out as a finished product, and after picking up with color difference and crack, it is returned to pickling again, and finally Sorting
  • the finished product is weighed and packaged to calculate the yield.
  • the yield of the silicon block cleaning device in the present embodiment is 20% higher than the original yield, and it can be seen from the results that the silicon block obtained by the silicon block cleaning device in this embodiment is not obvious. The color difference is generated.

Abstract

A silicon block cleansing device comprises an outer frame (1). The outer frame (1) comprises a base plate (11) and a side frame (12) extending upwardly from the base plate (11). The base plate (11) and the side frame (12) are joined to form an accommodation chamber. Multiple first through holes (11a) are arranged on the base plate (11), and multiple second through holes (12a) are arranged on the side frame (12). A cleansing fluid is introduced via the first through holes (11a) and the second through holes (12a). The device further comprises multiple inner frames (2) stacked in the accommodation chamber. A bottom portion of the inner frame (2) is a grating structure formed by arranging multiple load-bearing strips (21a). The inner frame (2) is configured to carry a silicon block. By configuring a silicon block cleansing device to have a multi-layer structure, a silicon block and the cleansing device are in a line contact rather than a surface contact as disclosed in existing devices, thereby optimizing a polycrystalline silicon surface cleansing technique, increasing an acid cleansing efficiency for a polycrystalline silicon material and product quality, and solving a problem in which because silicon blocks are stacked, acid cleansing cannot be uniformly performed and thus causes an acid spot and color difference.

Description

一种硅块清洗装置Silicon block cleaning device 技术领域Technical field
本发明涉及半导体加工设备技术领域,尤其涉及一种硅块清洗装置。The present invention relates to the field of semiconductor processing equipment, and in particular, to a silicon block cleaning apparatus.
背景技术Background technique
作为多晶硅生产最后工艺中的一部分,酸洗硅对产品纯度的保持、表面杂质的处理有着至关重要的意义。酸洗工艺是将破碎好的硅块盛入硅块清洗装置中、放在酸洗设备进行酸洗,酸腐蚀表面的杂质,清除硅料表面污染,使硅表面金属杂质达到电子级表金属质量要求。As part of the final process of polysilicon production, pickled silicon is critical to the maintenance of product purity and surface impurities. The pickling process is to fill the broken silicon block into the silicon block cleaning device, put it in the pickling equipment for pickling, acidly corrode the surface impurities, remove the surface contamination of the silicon material, and make the metal impurities on the silicon surface reach the electronic grade metal quality. Claim.
目前,现有的硅块清洗装置为底部和侧面有方孔的长方形篮子,硅块堆积在一起,在酸洗硅块的过程中,硅块与硅块接触面以及硅块与清洗篮之间的接触面不能充分酸洗,从而导致硅块上出现酸斑和色差,使产品反洗量增大。At present, the existing silicon block cleaning device is a rectangular basket with a square hole at the bottom and the side, and the silicon blocks are stacked together. During the process of pickling the silicon block, the contact surface between the silicon block and the silicon block and between the silicon block and the cleaning basket The contact surface is not sufficiently pickled, resulting in acid spots and chromatic aberrations on the silicon block, which increases the amount of backwash of the product.
发明内容Summary of the invention
本发明提供一种硅块清洗装置,将原来硅块与清洗装置之间的面接触变为线接触,优化了多晶硅表面清洗工艺,提高了多晶硅料酸洗效率和产品质量。The invention provides a silicon block cleaning device, which changes the surface contact between the original silicon block and the cleaning device into a line contact, optimizes the polysilicon surface cleaning process, and improves the pickling efficiency and product quality of the polysilicon material.
本发明解决上述问题提出的技术方案为:提供一种硅块清洗装置,包括外框,所述外框包括底板以及由所述底板向上延伸的边框,所述底板与所述边框围合成一容置腔;所述底板上设有若干第一通孔,所述边框上设有若干第二通孔,所述第一通孔以及所述第二通孔用于注入清洗液;其中,所述装置还包括多个相互堆叠设置在所述容置腔内的内框,所述内框的底部为包括若干承载条排列而成的镂空结构,所述内框用于装载硅块。The technical solution provided by the present invention is to provide a silicon block cleaning device, which includes an outer frame, the outer frame includes a bottom plate and a frame extending upward from the bottom plate, and the bottom plate and the frame surround the frame a plurality of first through holes are formed in the bottom plate, and a plurality of second through holes are formed in the frame, the first through holes and the second through holes are used for injecting a cleaning liquid; wherein The device further includes a plurality of inner frames stacked on each other in the accommodating cavity, and the bottom of the inner frame is a hollow structure including a plurality of carrier bars, and the inner frame is used for loading silicon blocks.
进一步地,所述内框中还设置有至少一个挡板,所述挡板将所述内框分隔成多个格子。Further, the inner frame is further provided with at least one baffle, and the baffle divides the inner frame into a plurality of lattices.
进一步地,所述格子的数量为2~5个。Further, the number of the grids is 2 to 5.
进一步地,所述底板上还设置有多个从所述底板上凸起的螺纹连接件。Further, the bottom plate is further provided with a plurality of screw connectors protruding from the bottom plate.
进一步地,所述螺纹连接件的顶端为球形或半球形。 Further, the top end of the threaded connector is spherical or hemispherical.
进一步地,所述螺纹连接件的顶端与所述底板之间的距离为4~6mm。Further, the distance between the top end of the threaded connector and the bottom plate is 4-6 mm.
进一步地,所述螺纹连接件和所述第一通孔分别呈阵列分布在所述底板上,并且,所述螺纹连接件和所述第一通孔呈相互交错阵列排布。Further, the threaded connection member and the first through hole are respectively distributed in an array on the bottom plate, and the threaded connection member and the first through hole are arranged in a staggered array.
进一步地,所述若干承载条呈等间距排列。Further, the plurality of carrier strips are arranged at equal intervals.
进一步地,所述承载条的宽度为3~5mm,厚度为3~5mm。Further, the carrier strip has a width of 3 to 5 mm and a thickness of 3 to 5 mm.
进一步地,所述第一通孔以及所述第二通孔为圆形孔或方形孔。Further, the first through hole and the second through hole are circular holes or square holes.
本发明提供的硅块清洗装置,通过将原来的清洗装置进行分层设置,使得原来硅块与清洗装置之间的面接触变为线接触,优化多晶硅表面清洗工艺,提高多晶硅料酸洗效率和产品质量,解决了硅块堆积造成酸洗不均匀,出现酸斑和色差的问题。The silicon block cleaning device provided by the invention has a layered arrangement of the original cleaning device, so that the surface contact between the original silicon block and the cleaning device becomes line contact, optimizes the polysilicon surface cleaning process, and improves the pickling efficiency of the polysilicon material and The quality of the product solves the problem of uneven pickling caused by the accumulation of silicon blocks, acid spots and chromatic aberration.
附图说明DRAWINGS
通过结合附图进行的以下描述,本发明的实施例的上述和其它方面、特点和优点将变得更加清楚,附图中:The above and other aspects, features and advantages of the embodiments of the present invention will become more apparent from
图1为本发明硅块清洗装置结构示意图;1 is a schematic structural view of a silicon block cleaning device of the present invention;
图2a为硅块清洗装置内框结构示意图;2a is a schematic structural view of the inner frame of the silicon block cleaning device;
图2b为硅块清洗装置内框另一结构示意图;2b is another schematic structural view of the inner frame of the silicon block cleaning device;
图3为硅块清洗装置第一底板结构示意图;3 is a schematic structural view of a first bottom plate of a silicon block cleaning device;
图4为硅块清洗装置外框剖视图。Figure 4 is a cross-sectional view of the outer block of the silicon block cleaning device.
具体实施方式detailed description
以下,将参照附图来详细描述本发明的实施例。然而,可以以许多不同的形式来实施本发明,并且本发明不应该被解释为限制于这里阐述的具体实施例。相反,提供这些实施例是为了解释本发明的原理及其实际应用,从而使本领域的其他技术人员能够理解本发明的各种实施例和适合于特定预期应用的各种修改。Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings. However, the invention may be embodied in many different forms and the invention should not be construed as being limited to the specific embodiments set forth herein. Rather, these embodiments are provided to explain the principles of the invention and the application of the invention, and the various embodiments of the invention can be understood.
参照图1,本发明提供的硅块清洗装置,包括外框1以及内框2,所述外框包括底板11、边框12。所述底板11与所述边框12围合成一容置腔,多个内框2相互堆叠设置在所述容置腔内。 Referring to FIG. 1 , a silicon block cleaning device provided by the present invention includes an outer frame 1 and an inner frame 2 , and the outer frame includes a bottom plate 11 and a frame 12 . The bottom plate 11 and the frame 12 are formed into a receiving cavity, and a plurality of inner frames 2 are stacked on each other in the receiving cavity.
具体的,所述边框12由所述底板11向上延伸得到,所述底板上设有若干第一通孔11a,所述边框上设有若干第二通孔12a,所述第一通孔11a以及所述第二通孔12a用于注入清洗液,对承载于所述内框2上的硅块进行清洗。这里,所述的清洗液为硝酸、氢氟酸混合液,所以,为了防止所述硅块清洗装置在清洗过程中被腐蚀,所述硅块清洗装置的材料必须要耐腐蚀、耐磨损,进一步地,所述底板11、所述边框12的材料为PP材料。其中,所述第一通孔11a以所述第二通孔12a的形状可以为圆形孔或方形孔,这里不做限定。Specifically, the frame 12 is extended upward from the bottom plate 11. The bottom plate is provided with a plurality of first through holes 11a, and the frame is provided with a plurality of second through holes 12a, the first through holes 11a and The second through hole 12a is used for injecting a cleaning liquid to clean the silicon block carried on the inner frame 2. Here, the cleaning liquid is a mixed solution of nitric acid and hydrofluoric acid. Therefore, in order to prevent the silicon block cleaning device from being corroded during the cleaning process, the material of the silicon block cleaning device must be resistant to corrosion and abrasion. Further, the material of the bottom plate 11 and the frame 12 is a PP material. The shape of the second through hole 11a may be a circular hole or a square hole, which is not limited herein.
结合图2a、图2b,为了解决硅块堆积造成清洗不均匀的问题,本实施例中硅块清洗装置包括多个相互堆叠设置在所述容置腔内的内框2,所述内框2用于承载需要进行清洗的硅块,其中,所述内框2的数量可以根据实际需要进行设定,这里不做限定,通常设定为2~4个。所述内框2的材料为耐酸碱材料,例如,所述内框2的材料为PE材料。With reference to FIG. 2a and FIG. 2b, in order to solve the problem of uneven cleaning caused by the accumulation of silicon blocks, the silicon block cleaning apparatus of the present embodiment includes a plurality of inner frames 2 stacked on each other in the accommodating cavity, the inner frame 2 For the silicon block to be cleaned, the number of the inner frame 2 can be set according to actual needs, and is not limited thereto, and is usually set to 2 to 4. The material of the inner frame 2 is an acid-resistant material, for example, the material of the inner frame 2 is a PE material.
为了实现硅块与硅块清洗装置之间的接触方式为线接触,所述内框的底部21为包括若干承载条21a排列而成的镂空结构,所述承载条21a用于承载需要清洗的硅块;所述内框2可以由所述承载条21a沿水平方向等间距排列而成,也可以由所述承载条21a沿垂直方向等间距排列而成,还可以由所述承载条21a分别沿水平方向以及垂直方向等间距排列而成。其中,所述承载条21a的宽度为3~5mm,厚度为3~5mm,所述承载条的形状可以根据需要进行选定,为了减少所述承载条与硅块之间的接触面积,使得硅块清洗更彻底,进一步地,所述承载条21a的形状为柱形,其直径为3~5mm。In order to achieve a line contact between the silicon block and the silicon block cleaning device, the bottom portion 21 of the inner frame is a hollow structure including a plurality of carrier strips 21a, and the carrier strip 21a is used to carry silicon to be cleaned. The inner frame 2 may be arranged by the carrier strips 21a at equal intervals in the horizontal direction, or may be arranged by the carrier strips 21a at equal intervals in the vertical direction, or may be respectively carried by the carrier strips 21a. The horizontal direction and the vertical direction are arranged at equal intervals. The carrier strip 21a has a width of 3 to 5 mm and a thickness of 3 to 5 mm. The shape of the carrier strip can be selected according to requirements. In order to reduce the contact area between the carrier strip and the silicon block, the silicon is made. The block cleaning is more thorough. Further, the carrier strip 21a has a cylindrical shape and a diameter of 3 to 5 mm.
为了便于对硅块进行限位,本实施例中所述内框2还包括与所述边框12对应设置的侧壁22,所述承载条21a两端分别与所述侧壁22靠近所述底板11一端连接。其中,所述侧壁22主要是起到支撑的作用。将需要清洗的硅块铺设于所述承载条21a上,然后将承载有硅块的内框2依次堆叠放入所述底板11与所述边框12围合成的容置腔内,这样上下内框2中位于所述承载条21a上的硅块不会接触,避免了硅块堆积造成清洗不均匀。其中,为了使得从第二通孔12a注入的清洗液顺利注入,上下堆叠的内框2的结构可以不相同(如图2a、图2b所示),例如,位于上层的内框2的侧壁22可以只包括平行的两面,另两面形成为一开口,从第二通孔12a注入的清洗液就可以很容易从开口处流入。In the embodiment, the inner frame 2 further includes a side wall 22 corresponding to the frame 12, and the two ends of the carrier strip 21a and the side wall 22 are respectively adjacent to the bottom plate. 11 is connected at one end. Wherein, the side wall 22 mainly serves as a support. The silicon block to be cleaned is laid on the carrier strip 21a, and then the inner frame 2 carrying the silicon block is sequentially stacked into the receiving cavity surrounded by the bottom plate 11 and the frame 12, so that the upper and lower inner frames are The silicon blocks located on the carrier strip 21a in 2 are not in contact, and the unevenness of cleaning due to the accumulation of the silicon blocks is avoided. Wherein, in order to smoothly inject the cleaning liquid injected from the second through hole 12a, the structure of the inner frame 2 stacked on the upper and lower sides may be different (as shown in FIGS. 2a and 2b), for example, the side wall of the inner frame 2 located on the upper layer. 22 may include only two sides in parallel, and the other two sides are formed as an opening, and the cleaning liquid injected from the second through hole 12a can easily flow in from the opening.
进一步地,参阅图2a和图2b为了减少在清洗过程中硅块与硅块之间的接触,所述内框2中还设置有至少一个挡板23,所述挡板23将所述内框2分隔成 多个格子,进一步地,所述格子的数量为2~5个。在清洗的时候,将硅块铺设在这些格子中可以减少硅块与硅块之间的接触。Further, referring to FIG. 2a and FIG. 2b, in order to reduce the contact between the silicon block and the silicon block during the cleaning process, the inner frame 2 is further provided with at least one baffle 23, and the baffle 23 will be the inner frame 2 separated into A plurality of lattices, further, the number of the lattices is 2 to 5. When cleaning, laying silicon in these grids can reduce the contact between the silicon block and the silicon block.
结合图3、图4,当所述内框2接近所述底板11时,为了增加硅块与所述第一通孔11a注入的清洗液之间的接触面积,所述底板11上还设置有多个从所述底板11上凸起的螺纹连接件11b,所述螺纹连接件11b的顶端为球形或半球形。所述螺纹连接件11b和所述第一通孔11a分别呈阵列分布在所述底板11上,并且,所述螺纹连接件11b和所述第一通孔11a呈相互交错阵列排布。所述螺纹连接件11b的顶端与所述底板11之间的距离为4~6mm,进一步地,所述螺纹连接件11b为M10的螺栓,螺柱的长度为20mm(一部分旋转进入底板11中,一部分凸起于底板11上),其中,所述螺纹连接件11b的数量与所述第一通孔11a的数量相对应。由于所述螺纹连接件11b也要与硅块清洗液接触,所以,所述螺纹连接件11b的材料也要为耐酸碱材料,例如为PP材料或PE材料。Referring to FIG. 3 and FIG. 4, when the inner frame 2 is close to the bottom plate 11, in order to increase the contact area between the silicon block and the cleaning liquid injected into the first through hole 11a, the bottom plate 11 is further provided with A plurality of threaded connectors 11b projecting from the bottom plate 11, the top ends of the threaded connectors 11b being spherical or hemispherical. The threaded connecting piece 11b and the first through hole 11a are respectively distributed in an array on the bottom plate 11, and the threaded connecting piece 11b and the first through hole 11a are arranged in a staggered array. The distance between the top end of the threaded connecting member 11b and the bottom plate 11 is 4-6 mm. Further, the threaded connecting member 11b is a bolt of M10, and the length of the stud is 20 mm (a part of the rotating into the bottom plate 11 is A portion is raised on the bottom plate 11), wherein the number of the screw connectors 11b corresponds to the number of the first through holes 11a. Since the threaded connection member 11b is also in contact with the silicon block cleaning liquid, the material of the threaded connection member 11b is also an acid-resistant material, such as a PP material or a PE material.
下面通过具体实例来阐述所述硅块清洗装置的结构以及其工作原理。参阅图1至图4,所述硅块清洗装置的底板11尺寸为520mm*325mm*10mm,边框12的尺寸分别为325mm*80mm*10mm以及520mm*80mm*10mm,所述第一通孔的直径为6mm,所述底板11上等间距设置有11列第一通孔11a,每一列上等间距设置有21个第一通孔11a;对应的,所述底板11上等间距设置有12列螺纹连接件11b,每一列上等间距设置有20个螺纹连接件11b。所述螺纹连接件11b为M10的螺栓,螺柱的长度为20mm,其顶端为球形,顶端与底板之间的距离为6mm。所述边框12上设有两排第二通孔12a,所述第二通孔12a的直径为5mm。这里,所述硅块清洗装置包括两个内框2,每个内框2的底部为由承载条21a排列而成的镂空结构,每个内框2中设置有3个挡板23,所述挡板23将内框分隔成4个格子。所述承载条21a的直径为3mm,相邻承载条21a之间的间距为10mm。首先在第一个内框2的底部铺设硅块,铺设完成后将其放入所述底板11与所述边框12围合的容置腔内,然后再在第二个内框2的底部铺设硅块,铺设完成后将其堆叠放置在第一个内框2上面,这样就形成二层硅块,二层硅块之间通过侧壁22支撑。铺设完成后,将硅块清洗装置放入酸浓度为10:1(硝酸:氢氟酸)的池中进行酸洗,酸洗时间为5分钟,再对硅块进行冷浸泡和热浸泡加超声波处理,其中,冷浸泡的时间为6小时,热浸泡加超声波处理时间为4小时,最后对硅块进行干燥处理,干燥时间为10小时。这样,整个清洗过程便完成,然后对清洗完成后的硅块进行分拣,分拣出无色差、表面光滑的硅料做为成品,有色差、有裂纹的拣出后返回重新酸洗,最后对分拣 出的成品进行称重、包装,计算收率。The structure of the silicon block cleaning device and its working principle are explained below by way of specific examples. Referring to FIG. 1 to FIG. 4, the bottom plate 11 of the silicon block cleaning device has a size of 520 mm*325 mm*10 mm, and the dimensions of the frame 12 are 325 mm*80 mm*10 mm and 520 mm*80 mm*10 mm, respectively, and the diameter of the first through hole. The bottom plate 11 is equidistantly disposed with 11 rows of first through holes 11a, and each of the columns is equidistantly provided with 21 first through holes 11a; correspondingly, the bottom plate 11 is equally spaced with 12 rows of threads. The connecting members 11b are provided with 20 threaded connecting members 11b at equal intervals in each row. The threaded connection member 11b is a bolt of M10, the length of the stud is 20 mm, the top end is spherical, and the distance between the top end and the bottom plate is 6 mm. The frame 12 is provided with two rows of second through holes 12a, and the second through holes 12a have a diameter of 5 mm. Here, the silicon block cleaning device includes two inner frames 2, and the bottom of each inner frame 2 is a hollow structure formed by the carrier strips 21a, and each inner frame 2 is provided with three baffles 23, The baffle 23 divides the inner frame into four grids. The diameter of the carrier strip 21a is 3 mm, and the spacing between adjacent carrier strips 21a is 10 mm. First, a silicon block is laid on the bottom of the first inner frame 2. After the laying is completed, it is placed in the receiving cavity of the bottom plate 11 and the frame 12, and then laid on the bottom of the second inner frame 2. After the silicon blocks are laid, they are stacked on the first inner frame 2, so that two silicon blocks are formed, and the two silicon blocks are supported by the side walls 22. After the laying is completed, the silicon block cleaning device is placed in a pool with an acid concentration of 10:1 (nitric acid: hydrofluoric acid) for pickling, the pickling time is 5 minutes, and then the silicon block is subjected to cold soaking and hot soaking and ultrasonication. The treatment, wherein the cold soaking time is 6 hours, the hot soaking and the ultrasonic treatment time is 4 hours, and finally the silicon block is dried, and the drying time is 10 hours. In this way, the entire cleaning process is completed, and then the silicon block after the cleaning is sorted, and the silicon material with no color difference and smooth surface is sorted out as a finished product, and after picking up with color difference and crack, it is returned to pickling again, and finally Sorting The finished product is weighed and packaged to calculate the yield.
通过计算收率,本实施例中的硅块清洗装置得到收率比原有收率提高20%,而且,从结果可以看出,通过本实施例中的硅块清洗装置得到的硅块没有明显色差产生。By calculating the yield, the yield of the silicon block cleaning device in the present embodiment is 20% higher than the original yield, and it can be seen from the results that the silicon block obtained by the silicon block cleaning device in this embodiment is not obvious. The color difference is generated.
以上所述仅是本申请的具体实施方式,应当指出,对于本技术领域的普通技术人员来说,在不脱离本申请原理的前提下,还可以做出若干改进和润饰,这些改进和润饰也应视为本申请的保护范围。 The above description is only a specific embodiment of the present application, and it should be noted that those skilled in the art can also make several improvements and retouchings without departing from the principles of the present application. It should be considered as the scope of protection of this application.

Claims (12)

  1. 一种硅块清洗装置,包括外框,所述外框包括底板以及由所述底板向上延伸的边框,所述底板与所述边框围合成一容置腔;所述底板上设有若干第一通孔,所述边框上设有若干第二通孔,所述第一通孔以及所述第二通孔用于注入清洗液;其中,所述装置还包括多个相互堆叠设置在所述容置腔内的内框,所述内框的底部为包括若干承载条排列而成的镂空结构,所述内框用于装载硅块。A silicon block cleaning device includes an outer frame, the outer frame includes a bottom plate and a frame extending upward from the bottom plate, wherein the bottom plate and the frame surround a receiving cavity; the bottom plate is provided with a plurality of first a through hole, the frame is provided with a plurality of second through holes, wherein the first through hole and the second through hole are used for injecting a cleaning liquid; wherein the device further comprises a plurality of stacked on each other An inner frame is disposed in the cavity, and the bottom of the inner frame is a hollow structure including a plurality of carrier bars, and the inner frame is used for loading the silicon block.
  2. 根据权利要求1所述的硅块清洗装置,其中,所述内框中还设置有至少一个挡板,所述挡板将所述内框分隔成多个格子。The silicon block cleaning apparatus according to claim 1, wherein said inner frame is further provided with at least one baffle that divides said inner frame into a plurality of lattices.
  3. 根据权利要求2所述的硅块清洗装置,其中,所述格子的数量为2~5个。The silicon block cleaning apparatus according to claim 2, wherein the number of the lattices is 2 to 5.
  4. 根据权利要求1所述的硅块清洗装置,其中,所述底板上还设置有多个从所述底板上凸起的螺纹连接件。The silicon block cleaning apparatus according to claim 1, wherein said bottom plate is further provided with a plurality of screw connectors projecting from said bottom plate.
  5. 根据权利要求4所述的硅块清洗装置,其中,所述螺纹连接件的顶端为球形或半球形。The silicon block cleaning apparatus according to claim 4, wherein the tip end of the screw connector is spherical or hemispherical.
  6. 根据权利要求5所述的硅块清洗装置,其中,所述螺纹连接件的顶端与所述底板之间的距离为4~6mm。The silicon block cleaning apparatus according to claim 5, wherein a distance between a tip end of the screw connector and the bottom plate is 4 to 6 mm.
  7. 根据权利要求4所述的硅块清洗装置,其中,所述螺纹连接件和所述第一通孔分别呈阵列分布在所述底板上,并且,所述螺纹连接件和所述第一通孔呈相互交错阵列排布。The silicon block cleaning apparatus according to claim 4, wherein said screw connection member and said first through hole are respectively distributed in an array on said bottom plate, and said screw connection member and said first through hole Arranged in a staggered array.
  8. 根据权利要求1所述的硅块清洗装置,所述若干承载条呈等间距排列。The silicon block cleaning apparatus according to claim 1, wherein the plurality of carrier strips are arranged at equal intervals.
  9. 根据权利要求8所述的硅块清洗装置,所述承载条的宽度为3~5mm,厚度为3~5mm。The silicon block cleaning apparatus according to claim 8, wherein the carrier strip has a width of 3 to 5 mm and a thickness of 3 to 5 mm.
  10. 根据权利要求1所述的硅块清洗装置,所述第一通孔以及所述第二通孔为圆形孔或方形孔。The silicon block cleaning device according to claim 1, wherein the first through hole and the second through hole are circular holes or square holes.
  11. 根据权利要求5所述的硅块清洗装置,其中,所述螺纹连接件和所述第一通孔分别呈阵列分布在所述底板上,并且,所述螺纹连接件和所述第一通孔呈相互交错阵列排布。The silicon block cleaning apparatus according to claim 5, wherein said screw connection member and said first through hole are respectively distributed in an array on said bottom plate, and said screw connection member and said first through hole Arranged in a staggered array.
  12. 根据权利要求6所述的硅块清洗装置,其中,所述螺纹连接件和所述 第一通孔分别呈阵列分布在所述底板上,并且,所述螺纹连接件和所述第一通孔呈相互交错阵列排布。 The silicon block cleaning apparatus according to claim 6, wherein said screw connector and said The first through holes are respectively distributed in an array on the bottom plate, and the screw connection member and the first through hole are arranged in a staggered array.
PCT/CN2016/089969 2015-12-03 2016-07-14 Silicon block cleansing device WO2017092367A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201520995541.2 2015-12-03
CN201520995541.2U CN205264678U (en) 2015-12-03 2015-12-03 Silico briquette belt cleaning device

Publications (1)

Publication Number Publication Date
WO2017092367A1 true WO2017092367A1 (en) 2017-06-08

Family

ID=56006190

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2016/089969 WO2017092367A1 (en) 2015-12-03 2016-07-14 Silicon block cleansing device

Country Status (2)

Country Link
CN (1) CN205264678U (en)
WO (1) WO2017092367A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112893268A (en) * 2021-01-25 2021-06-04 佛山电器照明股份有限公司 Preparation method of LED lamp

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN205264678U (en) * 2015-12-03 2016-05-25 青海黄河上游水电开发有限责任公司新能源分公司 Silico briquette belt cleaning device
CN108946738B (en) * 2018-08-16 2022-04-19 青海黄河上游水电开发有限责任公司新能源分公司 Silicon block cleaning method and application
CN109877098B (en) * 2019-04-22 2022-04-15 西安奕斯伟材料科技有限公司 Container, device and method for cleaning silicon block
CN110170496A (en) * 2019-06-04 2019-08-27 山东魔方新能源科技有限公司 A kind of fuel battery double plates cleaning stack device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201625653U (en) * 2009-12-11 2010-11-10 北京有色金属研究总院 Silicon chip loading device during groove type cleaning process
CN201913087U (en) * 2010-09-29 2011-08-03 中国科学院苏州纳米技术与纳米仿生研究所 Improved structure of polyfluortetraethylene cleaning flower basket
CN205264678U (en) * 2015-12-03 2016-05-25 青海黄河上游水电开发有限责任公司新能源分公司 Silico briquette belt cleaning device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201625653U (en) * 2009-12-11 2010-11-10 北京有色金属研究总院 Silicon chip loading device during groove type cleaning process
CN201913087U (en) * 2010-09-29 2011-08-03 中国科学院苏州纳米技术与纳米仿生研究所 Improved structure of polyfluortetraethylene cleaning flower basket
CN205264678U (en) * 2015-12-03 2016-05-25 青海黄河上游水电开发有限责任公司新能源分公司 Silico briquette belt cleaning device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112893268A (en) * 2021-01-25 2021-06-04 佛山电器照明股份有限公司 Preparation method of LED lamp
CN112893268B (en) * 2021-01-25 2022-09-13 佛山电器照明股份有限公司 Preparation method of LED lamp

Also Published As

Publication number Publication date
CN205264678U (en) 2016-05-25

Similar Documents

Publication Publication Date Title
WO2017092367A1 (en) Silicon block cleansing device
KR101075171B1 (en) Side storage having gas injection block
US10665486B2 (en) Substrate carrier having drip edge configurations
US20100229796A1 (en) Manufacturing apparatus of polycrystalline silicon
CN108946738B (en) Silicon block cleaning method and application
CN107068603A (en) Substrate arrangement method and apparatus, substrate method of reseptance and device, substrate liquid processing method and device and base plate processing system
US20070169795A1 (en) Apparatus for cleaning substrates
KR101439168B1 (en) A wafer treat equipment have the wafer purging cassette removal remain fume on the wafer
JP3981393B2 (en) Chemical polishing apparatus and glass substrate manufacturing method
WO2021227479A1 (en) Method for compatibility of photovoltaic slot type machine with different products
KR101458626B1 (en) The wafer purging cassette
KR101169154B1 (en) Wafer support apparatus
CN204857685U (en) Silicon wafer disk tilting corrodes jar
US20020023660A1 (en) Ring-shaped part washing method and washing jig used in the method
CN106423348A (en) Conveniently-used test tube rack for chemicals
KR101039152B1 (en) Boat
CN220189585U (en) Bearing flower basket for silicon wafer cleaning and production line
CN207290053U (en) Steel band storage rack
US11152228B2 (en) Wafer cleaning apparatus and cleaning method using the same
CN209142695U (en) A kind of steel ball holding box
KR20070066795A (en) Inner bath in the wet station having uniform chemical flow
KR200472345Y1 (en) Jig for coating rust proofing film on workpiece
KR102646505B1 (en) Reactor of apparatus for processing substrate and apparatus for processing substrate comprising thereof
TWM536204U (en) Sheet frame
CN215799880U (en) Graphite boat and coating equipment

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 16869678

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 16869678

Country of ref document: EP

Kind code of ref document: A1