WO2016204402A1 - Procédé d'inspection de défaut de composant, et appareil associé - Google Patents

Procédé d'inspection de défaut de composant, et appareil associé Download PDF

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Publication number
WO2016204402A1
WO2016204402A1 PCT/KR2016/004634 KR2016004634W WO2016204402A1 WO 2016204402 A1 WO2016204402 A1 WO 2016204402A1 KR 2016004634 W KR2016004634 W KR 2016004634W WO 2016204402 A1 WO2016204402 A1 WO 2016204402A1
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image
dimensional
defect
component
reference image
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PCT/KR2016/004634
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English (en)
Korean (ko)
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윤준혁
김규년
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주식회사 쓰리디산업영상
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Publication of WO2016204402A1 publication Critical patent/WO2016204402A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material

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  • the present invention relates to a method and apparatus for inspecting a defect of an industrial component, and more particularly, to a method and apparatus for inspecting a defect inside a component based on a three-dimensional image and a two-dimensional transmission image of the component.
  • a conventional general method of identifying defects such as pores, cracks, and missing parts inside various industrial parts is a method of analyzing two-dimensional transmission images such as X-ray images.
  • X-ray images there is a limit in inspecting the 2D transmission image to determine whether there is a defect.
  • the technical problem to be achieved by the present invention is to improve the reliability of defect determination by comparing the two-dimensional transmission image and the defect-free reference image of the part, as well as the component that can easily generate a defect-free reference image used for defect determination.
  • an example of a component defect inspection method includes: obtaining a three-dimensional defect free image of a component; Obtaining a two-dimensional part inspection image; Generating a two-dimensional reference image from the three-dimensional defect free image based on a photographing condition including a photographing angle of the two-dimensional part inspection image; And comparing the two-dimensional component inspection image with the two-dimensional reference image to determine whether a component is defective.
  • another example of a component defect inspection method includes: obtaining a two-dimensional transmission image and a three-dimensional defect free image of a component; Determining whether there is a primary component defect based on an existence of a noise area of a predetermined size or more through image analysis of the 2D transmission image; Generating a defect-free two-dimensional reference image to contrast with all or a portion of the two-dimensional transmitted image from the three-dimensional defect free image based on photographing conditions including a photographing angle of the two-dimensional transmitted image; And comparing the 2D reference image with all or part of the 2D transmission image to determine whether there is a secondary component defect.
  • an example of a component defect inspection apparatus includes a three-dimensional image acquisition unit for acquiring a three-dimensional defect free image of a component; A two-dimensional image acquisition unit obtaining a two-dimensional transmission image of the component; A reference image generator configured to generate a two-dimensional reference image from the three-dimensional defect free image based on shooting conditions including a photographing angle of the two-dimensional transmission image; And a defect determination unit comparing the two-dimensional transmission image and the two-dimensional reference image to determine whether a component is defective.
  • the reliability of defect determination is increased by comparing the two-dimensional transmission image and the defect-free reference image.
  • a defect free reference image can be easily obtained from the 3D image to be contrasted with the 2D transmission image, it is not necessary to separately photograph and store each defect free reference image according to the photographing position or angle of the 2D transmission image.
  • FIG. 1 is a view showing an example of a method for obtaining a two-dimensional transmission image for inspection of component defects according to the present invention
  • FIG. 2 is a view showing an example of a method for obtaining a three-dimensional image for inspection of component defects according to the present invention
  • FIG. 3 is a view showing the configuration of an embodiment of a component defect inspection apparatus according to the present invention.
  • 4A to 4C are views illustrating an example of a 2D transmission image photographed for inspecting a component defect according to the present invention.
  • FIG. 5 is a view showing an example of a three-dimensional defect image photographed for inspection of component defects according to the present invention.
  • FIG. 6 is a view showing an example of a method for generating a two-dimensional reference image from a three-dimensional defect image for inspection of component defects according to the present invention
  • FIG. 7 is a diagram illustrating an example of a 2D reference image generated by the method of FIG. 6;
  • FIG. 8 is a view showing an example of an image comparison method for inspecting component defects according to the present invention.
  • FIG. 9 is a view showing another example of a method for generating a two-dimensional reference image from a three-dimensional defect image for inspection of component defects according to the present invention.
  • FIG. 10 is a diagram illustrating an example of a method of inspecting a defect for a part of a 2D transmission image by comparing with a 2D reference image
  • FIG. 11 is a flowchart illustrating an example of a method for inspecting a component defect according to the present invention
  • FIG. 12 is a flowchart illustrating an example of a method of detecting a suspected component defect region by analyzing a 2D transmission image according to the present invention
  • FIG. 13A to 13E illustrate an example of image processing results of each of the two-dimensional transmission images of FIG. 12;
  • FIG. 14 is a flowchart illustrating an example of a method of generating a 2D reference image for inspecting a component defect according to the present invention
  • 15 is a flowchart illustrating another example of a method of generating a 2D reference image for inspecting a component defect according to the present invention.
  • 16 is a flowchart illustrating another example of a component defect inspection method according to the present invention.
  • FIG. 1 is a view showing an example of a method for obtaining a two-dimensional transmission image for inspection of component defects according to the present invention.
  • the component 100 to be inspected is positioned between a radiator 110 that emits X-rays and a detector 120 that receives transmission signals such as X-rays and records them in a two-dimensional plane. .
  • the detector 120 records X-rays transmitted through the component 100 to be inspected to generate a two-dimensional transmission image (ie, an X-ray image).
  • the photographing positions or the photographing angles of the inspection target part 100 positioned between the radiator 110 and the decker 120 may be different from each other.
  • Photographing conditions such as the photographing position, the photographing angle, the brightness of the 2D transmission image, the contrast, etc. of the inspection target part 100 are used to generate a defect-free reference image for inspecting a component defect according to the present invention.
  • Photographing conditions can be identified through various conventional methods.
  • the inspection target part 100 is fixed by a fixing jig (not shown) and is located between the radiator 110 and the detector 120, and rotates the fixing jig (two or three-dimensional rotation).
  • a two-dimensional transmission image photographed at different photographing angles such as 4a to 4c may be obtained.
  • the user can directly grasp the rotation angle of the fixing jig (that is, the shooting angle) and input it through the user interface of the component defect inspection device, or the sensor can automatically measure the rotation angle of the fixing jig and provide it to the component defect inspection device. have.
  • the inspection target part 100 may have different points located between the radiator 110 and the detector 120 according to the type thereof.
  • the position of the inspection target part directly grasped by the user is input to the component defect inspection device, or various sensors measure each distance between the radiator 110, the inspection object 100, and the detector 120 to automatically inspect the component defect. It can be provided to the device.
  • the present embodiment provides an X-ray image as an example of a 2D transmission image, but is not necessarily limited thereto.
  • the 2D transmission image may be obtained through various conventional methods.
  • a 2D image may be obtained from a 3D image of the component 100 to be inspected.
  • FIG. 2 is a diagram illustrating an example of a method of obtaining a 3D image for inspection of a component defect according to the present invention.
  • the 3D image acquisition apparatus 210 captures a 3D image of the defect-free part 200.
  • the 3D image acquisition apparatus 210 acquires a 3D defect image by photographing a 3D image of the defect component 200 of the same type as the inspection target part of FIG. 1.
  • the three-dimensional defect image is used to create a reference image to determine whether there is a component defect compared to the two-dimensional transmission image of the inspection target component 100 of FIG.
  • 3D image acquisition device is a computerized tomography (CT) device or a magnetic resonance imaging (MRI) device.
  • CT computerized tomography
  • MRI magnetic resonance imaging
  • various 3D image acquisition apparatuses may be used.
  • FIG 3 is a view showing the configuration of an embodiment of a component defect inspection apparatus according to the present invention.
  • the component defect inspection apparatus 300 includes a 2D image acquisition unit 310, a 3D image acquisition unit 320, a reference image generation unit 330, and a defect determination unit 340.
  • the 2D image acquisition unit 310 receives a 2D transmission image of the inspection target part.
  • the 2D transmission image may be photographed through various conventional methods including the salping method in FIG. 1.
  • the 3D image acquisition unit 320 receives a 3D image (hereinafter, 3D flawless image) for the flawless part.
  • the 3D flawless image may be photographed through various conventional methods including the salping method in FIG. 2.
  • the reference image generator 330 generates a 2D reference image to contrast with all or part of the 2D transmission image from the 3D defect free image.
  • the reference image generator 330 generates a 2D reference image by performing a 2D simulation on the 3D flawless image. For example, when the 2D transmission image is an X-ray image and the 3D defect image is a CT image, the reference image generator 330 may perform the 3D defect image using DDR (Digitally Reconstructed Radiography) simulation. Generates a two-dimensional reference image as if it was taken with X-ray.
  • DDR Digitally Reconstructed Radiography
  • the reference image generator 330 may set a virtual X-ray photographing point to generate a 2D reference image of a desired photographing angle. For example, when there are a plurality of two-dimensional transmission images having different shooting angles for the inspection target part as shown in FIGS. 4A to 4C, the reference image generator 330 may perform the two-dimensional transmission images of FIGS. 4A to 4C. Two-dimensional reference images of different shooting angles to be contrasted with each other may be generated. A specific example of generating the reference image is illustrated in FIGS. 6 and 9.
  • the defect determiner 340 determines whether the component is defective by using the 2D transmission image and the 2D reference image. More specifically, the defect determination unit 340 may include a primary determination unit 350 that determines whether there is a primary defect through an image analysis process of the 2D transmission image, and all or part of the 2D transmission image and the 2D reference image. Comparing with the second determination unit 360 to determine whether there is a defect.
  • the defect determination method of the primary determination unit 340 will be described again with reference to FIG. 12, and the defect determination method of the secondary determination unit 370 will be described again with reference to FIGS. 8 and 10.
  • 4A to 4C are diagrams showing an example of a two-dimensional transmission image photographed for inspecting a component defect according to the present invention.
  • FIG. 5 is a diagram illustrating an example of a three-dimensional defect image photographed for component defect inspection according to the present invention.
  • the component defect inspection apparatus acquires a three-dimensional image 500 of a defective component through the method of FIG. 2.
  • Two-dimensional transmission images of the inspection target part may be photographed at different photographing angles according to inspection sites.
  • two-dimensional reference images of different defects are required for each photographing angle.
  • the component defect inspection device without the need to photograph and store the two-dimensional reference image to be contrasted with the two-dimensional transmission image in accordance with the photographing angle, the component defect inspection device easily simulates the two-dimensional reference image of the desired photographing angle through the simulation from the three-dimensional defect free image Can be generated.
  • FIG. 6 is a diagram illustrating an example of a method of generating a 2D reference image from a 3D defect image for inspecting a component defect according to the present invention
  • FIG. 7 is a 2D reference image generated by the method of FIG. 6.
  • 1 is a diagram illustrating an example.
  • the component defect inspection apparatus performs a two-dimensional simulation on a three-dimensional defect image based on shooting conditions including a photographing angle of a two-dimensional transmission image of a component to be inspected, and a two-dimensional reference image.
  • the component defect inspection apparatus sets the virtual photographing point 600 for the two-dimensional simulation of the three-dimensional flawless image based on the photographing conditions such as the photographing distance and the photographing angle of the two-dimensional transmission image.
  • the component defect inspection apparatus transmits the virtual X-ray emitted from the virtual photographing point 600 to the virtual three-dimensional component obtained by rotating the three-dimensional defect free image according to the photographing angle of the two-dimensional transmission image.
  • a two-dimensional reference image 620 is obtained by applying a two-dimensional simulation process detected by the 610.
  • the component defect inspection apparatus may adjust the brightness and contrast of the 2D reference image based on photographing conditions such as the brightness and contrast of the 2D transmission image of the inspection target part.
  • FIG. 8 is a diagram illustrating an example of an image comparison method for inspecting component defects according to the present invention.
  • the component defect inspection apparatus acquires a 2D transmission image 810 of a component to be inspected.
  • the component defect inspection apparatus generates a flawless two-dimensional reference image 800 to be contrasted with the two-dimensional transmission image 810 by using the method of FIG.
  • the component defect inspection apparatus compares the 2D transmission image 810 and the defect free 2D reference image 800 to determine whether there is a defect. For example, the component defect inspection apparatus determines that a component defect exists if there is a difference between the 2D transmission image 810 and the 2D reference image 800.
  • the component defect inspection apparatus may determine whether the component is defective by determining the identity of the image by using a vector comparison method between the two images 800 and 810. For example, a component defect inspection apparatus generates two images as gray images, and then uses a normalized cross-correlation (NCC) method to determine whether the images match by using the correlation between the pixel values of the two gray images. It can be used, represented by the equation as follows.
  • NCC normalized cross-correlation
  • f (x, y) and t (x, y) represent pixel values of coordinates (x, y) of each image
  • n is a total number of pixels
  • f ', t' is an average of pixel values of each image.
  • the values ⁇ f and ⁇ t represent standard deviations of pixel values of two images.
  • the component defect inspection apparatus may use various conventional image comparison methods.
  • FIG. 9 is a diagram illustrating another example of a method of generating a 2D reference image from a 3D defect image for inspecting a component defect according to the present invention.
  • the component defect inspection apparatus does not generate a 2D reference image to contrast with the entire 2D transmission image, but generates a 2D reference image to contrast with a part of the 2D transmission image.
  • the component defect inspection apparatus may identify a noise region having a predetermined size or more as a defect suspect region 900 through an image analysis process on a 2D transmission image of a component to be inspected, and compare it with the defect suspect region 900. Create a dimensional reference image. The method of identifying the suspected defect site is shown in FIG.
  • the component defect inspection apparatus detects the noise region identified in the 2D transmission image, that is, the 3D region of the component corresponding to the defect suspected portion 900. Since the two-dimensional transmission image is an image obtained by photographing the inspection target part 920 located between the X-ray output point 940 and the detector 910 of the radiator, the component defect inspection apparatus may include a noise region ( The 3D subregion 930 in the inspection target part formed by connecting the corresponding region 9150 of the detector corresponding to 900 and the X-ray output point 940 is identified.
  • the component defect inspection apparatus generates two-dimensional reference image by performing two-dimensional simulation only on the three-dimensional sub-region 930 of the component among the three-dimensional defect-free images rather than performing two-dimensional simulation on the entire three-dimensional defect-free image. In addition to shortening the time required for the circuit, it is possible to perform a more accurate image comparison in the noise region where the defect is suspected.
  • FIG. 10 is a diagram illustrating an example of a method for inspecting a defect of a part of a 2D transmission image by comparing with a 2D reference image.
  • the apparatus for inspecting a component defect does not compare the entire 2D transmission image of the part with the 2D reference image, but includes a 2D component inspection image including a noise region in which a defect is suspected in the 2D transmission image. 1010 and generates a two-dimensional reference image 1000 corresponding to the two-dimensional part inspection area, and then compares the two-dimensional part inspection area 1010 and the two-dimensional reference image 1000 to determine whether there is a defect. .
  • An image comparison method for determining whether there is a defect is as described with reference to FIG. 8. Referring to the present embodiment, since different portions 1005 and 1015 exist in the two images 1000 and 1010, the component defect inspection apparatus determines that there is a component defect.
  • FIG. 11 is a flowchart illustrating an example of a component defect inspection method according to the present invention.
  • the component defect inspection apparatus receives a 3D flawless image of a component without a defect and a 2D component inspection image of a component to be inspected (S1100 and S1110).
  • the two-dimensional part inspection image may be an entirety of the two-dimensional transmission image photographing the inspection target part or an image of a partial region in which a defect is suspected.
  • the component defect inspection apparatus generates a two-dimensional reference image of a defect-free image, which may be contrasted with a two-dimensional component inspection image, based on photographing conditions of the two-dimensional transmission image (S1120). Then, the component defect inspection apparatus compares the two-dimensional component inspection image with a defect-free two-dimensional reference image, and determines whether there is a defect based on whether there is a different portion (S1130).
  • FIG. 12 is a flowchart illustrating an example of a method for detecting a suspected component defect region by analyzing a two-dimensional transmission image according to the present invention
  • FIGS. 13A to 13E are image processing results of the two-dimensional transmission image of each step of FIG. 12.
  • 1 is a diagram illustrating an example.
  • the component defect inspection apparatus obtains a two-dimensional transmission image (FIG. 13A) of the inspection target component through the same method as in FIG. 1 (S1200).
  • the component defect inspection apparatus masks the component region of the two-dimensional transmission image (FIG. 13A) to remove a background region other than the component (S1210), and corrects an image including a small hole in the remaining component region.
  • FIG. 13C is generated (S1220). Closing can be used as a way to fill small holes.
  • the component defect inspection apparatus generates a noise image (FIG. 13D) obtained by subtracting the original two-dimensional transmission image (FIG. 13A) from the corrected image (FIG. 13C) (S1230). Only small holes and noise pixels remain in the noise image (FIG. 13D) generated through the subtraction between the two images.
  • the component defect inspection apparatus removes general noise not related to a defect by applying a median filter to the noise image (FIG. 13D) (S1240).
  • the component defect inspection apparatus converts the noise image (FIG. 13D) into a binary image of 0 and 1 (S1250).
  • the user may create a binary image by setting a value such as brightness of each pixel based on a predetermined threshold value to 1 when the value of the pixel is greater than the threshold value and 0 when the value is smaller than the threshold value.
  • the component defect inspection apparatus connects small island regions separated from each other in a binary image by using a label labeling technique, and then detects a region in which a single region of a single blob is larger than a predetermined size. It is determined as 1300 of FIG. 13E (S1260).
  • One or more defect suspect regions 1300 may exist in some cases, and a sub image including the suspect defect regions may be set as a two-dimensional component inspection region to be compared with a two-dimensional reference image.
  • FIG. 14 is a flowchart illustrating an example of a method of generating a 2D reference image for component defect inspection according to the present invention.
  • the component defect inspection apparatus detects photographing conditions including a photographing position, an photographing angle, and the like, of a 2D transmission image of a component to be inspected.
  • the shooting conditions are automatically detected when the 2D transmission image is taken using the method as shown in FIG. 1 and provided to the component defect inspection apparatus, or the user may directly input the shooting conditions through the user interface of the component defect inspection apparatus. .
  • the component defect inspection apparatus sets a virtual photographing point to perform a simulation on the 3D flawless image based on the photographing conditions (S1410).
  • the component defect inspection apparatus generates a 2D reference image by performing a DDR simulation or the like based on a 3D defectless image rotated by a photographing angle of a 2D transmission image at a virtual photographing point (S1420).
  • 15 is a flowchart illustrating another example of a method of generating a 2D reference image for inspecting a component defect according to the present invention.
  • the component defect inspection apparatus does not perform a simulation process for the entire 3D defect-free image but performs a simulation process only for a specific region. To this end, the component defect inspection apparatus detects a defect suspect region of the two-dimensional transmission image through the method as shown in FIG. 12, and sets the detected defect suspect region as a two-dimensional component inspection image for defect inspection.
  • the component defect inspection apparatus detects a three-dimensional region of the component corresponding to the two-dimensional component inspection image (S1500).
  • the two-dimensional part inspection image is a three-dimensional sub-region of a part that is divided by a position 915 corresponding to the two-dimensional part inspection area of the X-ray output point 940 and the detector 910 as shown in FIG. 9. Figure out.
  • the component defect inspection apparatus generates a 2D reference image by performing a simulation process only on the 3D sub-region of the component among the 3D defect images (S1520).
  • 16 is a flowchart illustrating another example of a component defect inspection method according to the present invention.
  • the component defect inspection apparatus acquires a 2D transmission image of a component to be inspected (S1600).
  • the component defect inspection apparatus performs an image analysis process as shown in FIG. 12 on the 2D transmission image to determine whether a defect suspect region exists.
  • the component defect inspection apparatus may determine the noise region having a predetermined size or more present in the 2D transmission image as the defect suspect region 1300 as illustrated in FIG. 13E.
  • the component defect inspection apparatus If there is a suspected defect area (S1620), the component defect inspection apparatus generates a defect-free two-dimensional reference image to contrast with all or a part of the two-dimensional transmission image from the three-dimensional defect free image (S1630). Since the photographing angle of the two-dimensional transmission image is different from each other depending on which part of the part is inspected, the component defect inspection apparatus uses the photographing conditions including the photographing angle of the two-dimensional transmission image and the like. A two-dimensional reference image of the same photographing angle is generated.
  • the component defect inspection apparatus compares the whole or part of the 2D transmission image with the 2D reference image to determine whether there is a defect (S1640).
  • the invention can also be embodied as computer readable code on a computer readable recording medium.
  • the computer-readable recording medium includes all kinds of recording devices in which data that can be read by a computer system is stored. Examples of computer-readable recording media include ROM, RAM, CD-ROM, magnetic tape, floppy disks, optical data storage devices, and the like.
  • the computer readable recording medium can also be distributed over network coupled computer systems so that the computer readable code is stored and executed in a distributed fashion.

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Abstract

La présente invention concerne un procédé d'inspection de défaut de composant, et un appareil associé. Un appareil d'inspection de défaut de composant acquiert une image sans défaut tridimensionnelle d'un composant et une image d'inspection bidimensionnelle de composant ; génère une image de référence bidimensionnelle à partir de l'image sans défaut tridimensionnelle sur la base de conditions de photographie comprenant l'angle de photographie de l'image d'inspection de composant bidimensionnelle ; et détermine si le composant a un défaut en comparant l'image d'inspection bidimensionnelle de composant et l'image de référence bidimensionnelle.
PCT/KR2016/004634 2015-06-17 2016-05-03 Procédé d'inspection de défaut de composant, et appareil associé WO2016204402A1 (fr)

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CN114460093A (zh) * 2022-01-29 2022-05-10 新拓三维技术(深圳)有限公司 一种航空发动机缺陷检测方法及系统

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KR102249836B1 (ko) * 2019-08-26 2021-05-10 레이디소프트 주식회사 투과영상 기반의 비파괴검사 기능을 제공하기 위한 방법 및 컴퓨터 판독 가능한 저장 매체
WO2021029625A1 (fr) * 2019-08-09 2021-02-18 레이디소프트 주식회사 Procédé d'inspection non destructive à base d'image de transmission, procédé de fourniture d'une fonction d'inspection non destructive, et dispositif associé
KR102415928B1 (ko) * 2019-08-26 2022-07-05 레이디소프트 주식회사 투과영상 기반의 비파괴검사 방법
KR102616867B1 (ko) * 2021-04-20 2024-01-03 레이디소프트 주식회사 비파괴검사 방법

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