WO2016192348A1 - 一种扬声器耐温极限的测试方法和系统 - Google Patents

一种扬声器耐温极限的测试方法和系统 Download PDF

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Publication number
WO2016192348A1
WO2016192348A1 PCT/CN2015/096594 CN2015096594W WO2016192348A1 WO 2016192348 A1 WO2016192348 A1 WO 2016192348A1 CN 2015096594 W CN2015096594 W CN 2015096594W WO 2016192348 A1 WO2016192348 A1 WO 2016192348A1
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Prior art keywords
speaker
gain
test
frequency
temperature
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English (en)
French (fr)
Inventor
平慷
杨鑫峰
邱东
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Goertek Inc
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Goertek Inc
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Priority to US15/501,056 priority Critical patent/US9877127B2/en
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; ELECTRIC HEARING AIDS; PUBLIC ADDRESS SYSTEMS
    • H04R29/00—Monitoring arrangements; Testing arrangements
    • H04R29/001—Monitoring arrangements; Testing arrangements for loudspeakers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03G—CONTROL OF AMPLIFICATION
    • H03G3/00—Gain control in amplifiers or frequency changers
    • H03G3/20—Automatic control
    • H03G3/30—Automatic control in amplifiers having semiconductor devices
    • H03G3/3005—Automatic control in amplifiers having semiconductor devices in amplifiers suitable for low-frequencies, e.g. audio amplifiers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; ELECTRIC HEARING AIDS; PUBLIC ADDRESS SYSTEMS
    • H04R3/00—Circuits for transducers
    • H04R3/04—Circuits for transducers for correcting frequency response
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; ELECTRIC HEARING AIDS; PUBLIC ADDRESS SYSTEMS
    • H04R29/00—Monitoring arrangements; Testing arrangements
    • H04R29/008—Visual indication of individual signal levels
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; ELECTRIC HEARING AIDS; PUBLIC ADDRESS SYSTEMS
    • H04R3/00—Circuits for transducers
    • H04R3/007—Protection circuits for transducers

Definitions

  • the present invention relates to the field of speaker testing technology, and in particular to a test method and system for a speaker temperature limit.
  • the traditional test method is to put the speaker into the thermostat, select the test signal of a certain frequency band, and judge whether the speaker is invalid after the test signal is connected for a period of time. If the speaker still works after this period of time, increase the test signal voltage in a gradient (for example, 0.5V per test) until the speaker fails, record the failure temperature, and determine the maximum temperature that the speaker can withstand before failure. .
  • the traditional test method is to test the maximum temperature value that the speaker can withstand by increasing the temperature value of the thermostat.
  • the traditional test method determines that the temperature resistance limit of the speaker is low, and the test signal voltage is increased, and the amplitude of the whole frequency band is increased. Therefore, while generating heat, the amplitude of the speaker is affected by the temperature limit test of the speaker, which interferes with the test result; in addition, the conventional test method requires a professional temperature test device (such as a thermostat), which significantly increases the test cost.
  • the invention provides a test method and system for the temperature limit of a loudspeaker, so as to solve the problem that the existing test mode is affected by the amplitude of the speaker, the interference test result and the test cost are high.
  • the present invention provides a test method for a temperature limit of a speaker, the method comprising:
  • the speaker is tested multiple times according to a specific frequency sweep period. During each test, the control test signal maintains the gain in a frequency band lower than the gain boost frequency point, and the gain is boosted in a frequency band higher than the gain boost frequency point, and is tested and recorded.
  • the temperature of the speaker control the speaker to continue running for a period of time, to determine whether the speaker is invalid, if the speaker does not fail, the test continues until the speaker fails, recording the temperature at the time of failure;
  • the maximum temperature that can be tolerated before the speaker fails is determined based on the temperature at which the speaker fails.
  • determining a gain boosting frequency of the test signal by increasing the gain according to the resonant frequency of the speaker includes:
  • the speaker is tested multiple times, and the control test signal maintains the gain in the frequency band below the gain boost frequency point in each test, and the boost gain in the frequency band higher than the gain boost frequency point includes:
  • the gain is gradually increased on the basis of the previous gain increase for each test.
  • the method includes: selecting a sinusoidal sweep signal of 100-20 kHz as the test signal.
  • the method includes: selecting any one of 2 to 10 seconds as a sweep period.
  • the present invention also provides a test system for the temperature limit of the speaker, the system comprising:
  • test output voltage determining unit for selecting a test signal, determining a test output voltage as a rated voltage of the speaker, so that the speaker reaches a rated amplitude
  • a gain boosting frequency determining unit configured to determine a gain boosting frequency of the test signal to increase the gain according to the resonant frequency of the speaker;
  • the test unit is used for performing multiple tests on the speaker.
  • the control test signal maintains the gain in a frequency band lower than the gain boost frequency point, and the gain is increased, tested and recorded in a frequency band higher than the gain boost frequency point.
  • the temperature of the speaker control the speaker to continue running for a period of time, to determine whether the speaker is invalid, if the speaker does not fail, the test continues until the speaker fails, recording the temperature at the time of failure;
  • the highest temperature determining unit is configured to determine the highest temperature value that can be tolerated before the speaker fails according to the temperature at which the speaker fails.
  • the gain boosting frequency determining unit is specifically configured to determine a resonant frequency of the speaker, and use a resonant frequency of the speaker plus a set frequency as a test signal to increase a gain gain frequency of the gain.
  • test unit is specifically configured to gradually increase the gain on the basis of the previous gain increase in each frequency band in the frequency band higher than the gain boost frequency point.
  • test signal is a sinusoidal sweep signal of 100-20 kHz.
  • the specific sweep period is any one of 2 to 10 seconds.
  • the invention has the beneficial effects that the speaker temperature limit test method and the test system provided by the invention first use a 100-20 kHz sine sweep signal as a test signal, and determine that the output voltage is the rated voltage of the speaker, so that the speaker reaches the rated amplitude. Then, according to the resonant frequency of the speaker, the gain boosting frequency of the gain is determined, and the gain is increased at the resonance frequency of the speaker; by increasing the gain of the frequency band higher than the gain, the speaker itself generates more heat, so that the speaker itself generates more heat.
  • the temperature of the speaker rises to quickly determine the temperature limit that the speaker can withstand; by controlling the gain in the frequency band below the gain boost frequency, the speaker operates at a normal amplitude, avoiding the speaker amplitude being too large for the test.
  • the technical solution of the present invention utilizes the heat of the speaker itself for temperature testing, eliminating the need for test equipment such as a thermostat, and saving test costs, compared to the conventional test method of warming up by the thermostat.
  • FIG. 1 is a flow chart of a method for testing a temperature limit of a speaker according to an embodiment of the present invention
  • FIG. 2 is a schematic diagram of comparison of amplitudes before and after the gain of the traditional test mode test signal is increased;
  • FIG. 3 is a schematic diagram showing a comparison of amplitudes before and after test signal gain increase of a speaker temperature limit test method according to an embodiment of the present invention
  • FIG. 4 is a schematic diagram showing the initial amplitude of the speaker in the conventional test mode and the amplitude change of the speaker after the test signal is added;
  • FIG. 5 is a schematic diagram of a speaker initial amplitude and a speaker amplitude change after a test signal is added in a speaker temperature limit test method according to an embodiment of the present invention
  • FIG. 6 is a block diagram of a test system for a temperature tolerance of a speaker according to an embodiment of the present invention.
  • the core idea of the present invention is that the speaker temperature is too high is an important factor leading to speaker failure, and how to identify the reliability of the speaker at high power is an urgent problem to be solved.
  • a limitation of the traditional way of testing speaker temperature to identify speaker reliability is that the effect of speaker amplitude on test results cannot be ruled out.
  • the traditional test method uses a 100-20 kHz sweep signal as the test signal, but the traditional test method is to increase the gain in the full-band amplitude, which causes the amplitude of the speaker resonance frequency to be too large. The speaker causes damage and affects the judgment of the temperature limit.
  • the difficulty in improving the prior art is how to avoid the influence of the amplitude of the speaker when the temperature limit of the speaker is performed.
  • the traditional test method usually puts the speaker into the thermostat, and increases the temperature limit of the speaker by increasing the temperature of the thermostat. This test method increases the test cost.
  • the present invention proposes a scheme for testing with a signal variable gain.
  • the test signal is also a swept frequency signal of 100-20 kHz, but the difference is that in the embodiment of the present invention, the gain of the test signal is not the full-band equal amplitude. Varying, the gain change before and after the gain boosting frequency determined by the resonant frequency of the speaker is different, that is, the gain of the test signal in the frequency band higher than the gain boosting frequency is greater than the gain in the frequency band before the gain boosting frequency, so Avoiding the speaker amplitude at the resonant frequency beyond the safe space leads to failure, while ensuring that the speaker generates more heat in the high frequency band of the test signal, thus quickly determining the temperature tolerance of the speaker.
  • the test of the invention adjusts the speaker to the rated amplitude of normal operation, generates heat through the speaker itself, does not require special temperature-increasing equipment such as a thermostat, and also saves test cost.
  • a test method for a temperature limit of a speaker according to an embodiment of the present invention includes:
  • Step S110 selecting a test signal, determining a test output voltage as a rated voltage of the speaker, so that the speaker reaches a rated amplitude;
  • Step S120 determining a gain boosting frequency of the test signal increasing the gain according to the resonant frequency of the speaker
  • Step S130 performing multiple tests on the speaker according to a specific frequency sweep period, and controlling the test signal to maintain the gain in a frequency band lower than the gain boosting frequency point in each test, above the gain boosting frequency point.
  • the gain is increased in the frequency band, the temperature of the speaker is tested and recorded, the speaker is continuously operated for a period of time, and the speaker is judged to be invalid. If the speaker does not fail, the test continues until the speaker fails, and the temperature at the time of failure is recorded. ;
  • Step S140 determining a maximum temperature value that can be tolerated before the speaker fails according to the temperature at which the speaker fails.
  • the test method for the temperature limit of the speaker of the present invention does not increase the gain of the frequency band whose test signal frequency is less than or equal to the gain boost frequency point, and increases the frequency band higher than the gain boost frequency point.
  • the gain of the test signal thereby avoiding the speaker amplitude at the resonant frequency, may exceed the safe space resulting in failure, eliminating the effect of the speaker amplitude on the test results.
  • increasing the gain of the test signal in the high frequency band causes the speaker to generate more heat, so that it is convenient to quickly determine the temperature limit of the speaker.
  • step S110 includes: determining a resonant frequency of the speaker, and increasing the gain of the gain by using a resonant frequency of the speaker plus a set frequency, for example, 500 Hz as a test signal.
  • the gain of the test signal for the frequency band higher than the gain boost frequency point in step S120 includes: the frequency band of the test signal frequency higher than the gain boost frequency point, and the previous time for each test Gradually increase the gain based on the gain increase.
  • the gain of the test signal may be different each time. For example, in the first test, the test signal gain is increased by 1 dB and the temperature after the gain is increased by 1 dB is recorded.
  • test the performance of the speaker that is, let the speaker continue to run for a period of time (for example, 96 hours) and observe, if the speaker does not fail at this time, test again, continue to increase the gain of the test signal, the test can increase 3dB Gain or 1dB gain, then observe if the speaker has failed, so repeat the test until the speaker fails.
  • the highest value among the plurality of temperature values obtained before the failure of the speaker is determined as the temperature resistance limit of the speaker.
  • FIG. 2 is a schematic diagram of comparison of amplitudes before and after the increase of the gain of the conventional test mode test signal
  • FIG. 3 is a schematic diagram showing the comparison of the amplitudes of the test signal gain before and after the test signal gain is increased according to an embodiment of the present invention
  • FIG. 3 is a detailed description of the beneficial effects of the speaker temperature limit test method of the present invention in comparison with the conventional test method and the test method of the present invention.
  • Fig. 2a is a schematic diagram before the test signal gain is increased in the conventional test mode
  • Fig. 2b is a schematic diagram after the test signal gain is increased in the conventional test mode. Comparing Fig. 2a and Fig. 2b, it can be seen that the conventional test The increase in signal gain is increased by the full frequency band.
  • FIG. 2 is a schematic diagram illustrating that a certain frequency band in the test signal is intercepted. When the gain is increased, the full frequency band is increased, and the amplitude of each frequency point is increased.
  • FIG. 3a is a schematic diagram of the test signal gain before the increase of the test signal according to an embodiment of the present invention
  • FIG. 3b is a schematic diagram of the test signal gain after the increase of the test signal according to an embodiment of the present invention. Comparing FIG. 3a with FIG. 3b, it can be seen
  • the gain of the frequency band before the test signal gain boosting frequency is fixed, and only the gain of the frequency band after the gain boost frequency is increased. .
  • the resonance frequency of the speaker should be considered.
  • the resonance frequency plus 500 Hz is used as the gain boosting frequency for increasing the gain of the test signal, avoiding the addition of the resonance frequency before or at the resonance frequency. Large signal gains can cause speaker failures that can affect test results.
  • FIG. 3 is a schematic diagram illustrating that a certain frequency band in the test signal is taken to indicate that the conventional test signal is increased in the full frequency band when the gain is increased, and the amplitudes of the frequency points in the two frequency bands are increased differently. of.
  • FIG. 4 is a schematic diagram of the initial amplitude of the speaker and the amplitude change of the speaker after the test signal is added in the conventional test mode
  • FIG. 5 is an initial amplitude of the speaker and the test signal after adding the test signal in a method for testing the temperature tolerance of the speaker according to an embodiment of the present invention
  • Schematic diagram of the amplitude variation of the speaker the difference between the conventional test mode and the speaker temperature limit test method provided by the present invention will be described below with reference to FIG. 4 and FIG. 5, and the speaker temperature limit test method of the present invention will be specifically described.
  • curve 41 represents the amplitude of the speaker at the rated voltage
  • curve 42 represents the amplitude of the speaker when the test signal is 100 dB overall boosted by 1 dB, and it can be seen that the amplitude of the speaker is already large at the resonance frequency (for example, 700 Hz in Fig. 4). In this way, when the operation of the speaker is continued for 96 hours, the amplitude of the speaker is likely to exceed the safe amplitude, causing the speaker to be broken.
  • the resonant frequency of the speaker is about 700 Hz, that is, the speaker amplitude reaches the highest value at 700 Hz.
  • the traditional speaker temperature limit test method increases the signal amplitude in the 100-20 KHz band.
  • the technical solution of the present invention determines the gain boosting frequency when determining the rated amplitude of the speaker, and ensures that the test signal keeps the gain unchanged in the frequency band lower than the gain boosting frequency point, thereby avoiding the adverse effect of the speaker amplitude on the test result.
  • curve 51 represents the rated amplitude of the speaker at the rated voltage
  • curve 52 represents the amplitude of the speaker after the gain is increased by 1 dB in the frequency band higher than the gain boosting frequency in the 100-20 kHz test signal
  • the resonance frequency is about 700 Hz, that is, the speaker amplitude reaches the highest value at 700 Hz.
  • the signal amplitude is not increased in the 100-20 kHz band.
  • a frequency greater than the resonance frequency of 700 Hz plus 500 Hz, that is, 1200 Hz is used as the gain boosting frequency, and the gain of the test signal is increased from the gain boosting frequency of 1200 Hz, and the test signal gain is maintained before the gain boosting frequency of 1200 Hz.
  • the amplitude of the speaker with the test signal is basically consistent with the initial amplitude curve of the speaker, and after increasing the gain from 1200 Hz, the amplitude of the speaker after adding the test signal is increased, plus
  • the large test signal gain allows the speaker to generate more heat in the high frequency range of the test signal, so that the highest temperature value that can be withstood before the speaker fails can be quickly determined, making the test more accurate and reasonable.
  • the 1200 Hz is used as the gain boosting frequency of the test signal.
  • different frequencies may be selected as the gain boosting frequency according to different resonant frequencies of the speaker, for example, Select 3000Hz and 4000Hz as the gain boosting frequency to increase the gain of the test signal.
  • Select 3000Hz and 4000Hz as the gain boosting frequency to increase the gain of the test signal.
  • the gain frequency is after the resonance frequency of the speaker, so as to avoid the speaker amplitude being too large, the failure may affect the test result.
  • the sweep period can be any of 2 to 10 seconds. It should be noted that the selection of the sweep period should take into account factors such as the power of the speaker and the frequency band of the test signal. The sweep time is too long to be conducive to the concentration of the temperature, and the obtained test result may be between the actual temperature value that the speaker can withstand. There is a certain error. Therefore, in the specific implementation, 3 seconds or 4 seconds can be selected as one sweep cycle.
  • the present invention also provides a test system for the temperature limit of the speaker.
  • the speaker temperature limit test system 600 includes:
  • the test output voltage determining unit 610 is configured to select a test signal, and determine a test output voltage as a rated voltage of the speaker, so that the speaker reaches a rated amplitude;
  • a gain boosting frequency determining unit 620 configured to determine a gain boosting frequency of the test signal increasing the gain according to the resonant frequency of the speaker;
  • the testing unit 630 is configured to perform multiple tests on the speaker. During each test, the control test signal maintains the gain in a frequency band lower than the gain boosting frequency, and the gain is increased in a frequency band higher than the gain boosting frequency. Record the temperature of the speaker, control the speaker to run for a period of time, determine whether the speaker is invalid, if the speaker does not fail, the test continues until the speaker fails, recording the temperature at the time of failure;
  • the highest temperature determining unit 640 is configured to determine a maximum temperature value that can be tolerated before the speaker fails according to the temperature at which the speaker fails.
  • the gain boosting frequency determining unit 610 is specifically configured to determine the resonant frequency of the speaker, and use the resonant frequency of the speaker plus a set frequency, for example, 500 Hz as a test signal to increase the gain of the gain. .
  • the testing unit 620 is specifically configured to gradually increase the gain on the basis of the previous gain increase in each frequency band in the frequency band higher than the gain boosting frequency point.
  • the test signal is a sinusoidal swept signal of 100-20 kHz;
  • the particular sweep period is any one of 2 to 10 seconds.
  • test system for the temperature limit of the speaker of the present invention corresponds to the aforementioned test method for the temperature limit of the speaker. Therefore, the working process of the speaker temperature limit test system in this embodiment can be referred to the foregoing. The specific description of the speaker temperature limit test method part will not be repeated here.
  • the speaker temperature limit test method and test system provided by the present invention raises the gain of the frequency band higher than the gain, allows the speaker to generate more heat, and raises the temperature of the speaker, thereby determining the speaker. Temperature limit.
  • the test method of the present invention uses the heat of the speaker itself for temperature test, and saves the test cost, compared with the conventional test method for warming up by the oven.

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Abstract

本发明公开了一种扬声器耐温极限的测试方法和系统，该方法包括：选取测试信号，并确定测试输出电压，使得扬声器达到额定振幅；根据扬声器的共振频率确定出增益提升频点；对扬声器进行多次测试，每次测试时控制测试信号在低于增益提升频点的频段内保持增益不变，在高于增益提升频点的频段内提升增益，测试并记录扬声器的温度直至扬声器失效，记录失效时的温度从而确定出扬声器失效前可承受的最高温度值。本发明通过提升高于增益提升频点频段的增益，让扬声器产生更多的热量；控制低于增益提升频点频段的增益不变，避免过大的振幅的影响；相对于依靠温箱进行升温的传统方法，本发明利用扬声器自身热量进行耐温测试，节约了测试成本。

Description

一种扬声器耐温极限的测试方法和系统 技术领域
本发明涉及扬声器测试技术领域，具体涉及一种扬声器耐温极限的测试方法和系统。
发明背景
移动互联时代，消费类电子产品越来越受青睐，大量的智能设备出现在人们的日常生活中。在设备轻薄化、大功率化的趋势下，扬声器作为许多电子产品不可缺少的一部分也面临更多挑战，扬声器温度过高是导致扬声器失效的重要因素，如何确定在大功率下扬声器的可靠性是亟待解决的问题。传统测试方式是将扬声器放入温箱中，选择某一频段的测试信号，并在测试信号接入一段时间后，判断扬声器是否失效。如果在这段时间过后，扬声器仍能正常工作，则呈梯度（例如每次测试增加0.5v）地加大测试信号电压直到扬声器失效，记录失效温度，从而确定失效前扬声器可承受的最高温度值。
可见传统测试方式是通过增加温箱的温度值进而测试扬声器所能承受的最高温度值，传统的测试方式确定扬声器的耐温极限效率低下，且测试信号电压加大是全频段等幅度加大，因此在产生热量的同时会受到扬声器振幅对扬声器耐温极限测试的影响，干扰测试结果；此外，传统测试方式需要专业的升温测试设备（例如温箱）这明显增加了测试成本。
发明内容
本发明提供了一种扬声器耐温极限的测试方法和系统，以解决现有的测试方式会受到扬声器振幅影响，干扰测试结果以及测试成本较高的问题。
为达到上述目的，本发明提供了一种扬声器耐温极限的测试方法，该方法包括：
选取测试信号，将测试输出电压确定为扬声器的额定电压，使得扬声器达到额定振幅；
根据扬声器的共振频率确定出测试信号加大增益的增益提升频点；
按照特定扫频周期对扬声器进行多次测试，每次测试时控制测试信号在低于增益提升频点的频段内保持增益不变，在高于增益提升频点的频段内提升增益，测试并记录扬声器的温度，控制扬声器持续运行一段时间，判断扬声器是否失效，如果扬声器没有失效，则测试继续直至扬声器失效，记录失效时的温度；
根据扬声器失效时的温度确定出扬声器失效前可承受的最高温度值。
可选地，根据扬声器的共振频率确定出测试信号加大增益的增益提升频点包括：
确定扬声器的共振频率，以扬声器的共振频率加上设定频率作为测试信号加大增益的增益提升频点。
可选地，对扬声器进行多次测试，每次测试时控制测试信号在低于增益提升频点的频段内保持增益不变，在高于增益提升频点的频段内提升增益包括：
在高于增益提升频点的频段内，每次测试时在前一次增益加大的基础上逐步加大增益。
可选地，该方法包括：选取100-20kHz的正弦扫频信号作为测试信号。
可选地，该方法包括：选取2~10秒中的任一值作为一个扫频周期。
与上述扬声器耐温极限的测试方法相对应的，本发明还提供了一种扬声器耐温极限的测试系统，该系统包括：
测试输出电压确定单元，用于选取测试信号，将测试输出电压确定为扬声器的额定电压，使得扬声器达到额定振幅；
增益提升频点确定单元，用于根据扬声器的共振频率确定出测试信号加大增益的增益提升频点；
测试单元，用于对扬声器进行多次测试，每次测试时控制测试信号在低于增益提升频点的频段内保持增益不变，在高于增益提升频点的频段内提升增益，测试并记录扬声器的温度，控制扬声器持续运行一段时间，判断扬声器是否失效，如果扬声器没有失效，则测试继续直至扬声器失效，记录失效时的温度；
最高温度确定单元，用于根据扬声器失效时的温度确定出扬声器失效前可承受的最高温度值。
可选地，增益提升频点确定单元，具体用于确定扬声器的共振频率，以扬声器的共振频率加上设定频率作为测试信号加大增益的增益提升频点。
可选地，测试单元，具体用于在高于增益提升频点的频段内，每次测试时在前一次增益加大的基础上逐步加大的增益。
可选地，测试信号为100-20kHz的正弦扫频信号。
可选地，特定扫频周期为2~10秒中的任一值。
本发明的有益效果是：本发明提供的扬声器耐温极限测试方法和测试系统先使用100-20kHz正弦扫频信号作为测试信号，并确定输出电压为扬声器的额定电压，以使扬声器达到额定振幅，再根据扬声器的共振频率确定出增益加大的增益提升频点，避开在扬声器共振频率处加大增益；通过提升高于增益提升频点频段的增益，让扬声器自身产生更多的热量，使扬声器的温度升高，从而快速确定出扬声器可承受的温度极限；通过控制低于增益提升频点的频段内的增益不变，保证扬声器工作在正常的振幅下，避免了扬声器振幅过大对测试结果的不利影响；另外，相对于依靠温箱进行升温的传统测试方法，本发明的技术方案利用扬声器自身热量进行温度测试，省去了温箱等测试设备，节约了测试成本。
上述说明仅是本发明技术方案的概述，为了能够更清楚了解本发明的技术手段，以下特举本发明的具体实施方式。
附图简要说明
附图用来提供对本发明的进一步理解，并且构成说明书的一部分，与本发明实施例一起用于解释本发明，并不构成对本发明的限制。在附图中： 图1是本发明一个实施例的一种扬声器耐温极限测试方法流程图；
图2是传统测试方式测试信号增益加大前后变化幅度对比示意图；
图3是本发明一个实施例的一种扬声器耐温极限测试方法测试信号增益加大前后变化幅度对比示意图；
图4是传统测试方式中扬声器初始振幅以及加了测试信号后扬声器振幅变化示意图；
图5是本发明一个实施例的一种扬声器耐温极限测试方法中的扬声器初始振幅以及加了测试信号后的扬声器振幅变化示意图；
图6是本发明一个实施例的一种扬声器耐温极限的测试系统框图。
具体实施方式
本发明的核心思想是：扬声器温度过高是导致扬声器失效的重要因素，如何识别在大功率下的扬声器的可靠性是亟待解决的问题。传统测试扬声器温度识别扬声器可靠性的方式的局限性在于：不能排除扬声器振幅对测试结果的影响。确定扬声器温度极限时，传统测试方式有采用100-20kHz扫频信号作为测试信号，但是传统测试方式在测试时，是全频带等幅度加大增益，这会导致扬声器共振频率处振幅过大，对扬声器造成损伤，影响对温度极限的判断。传统测试方式要避免因扬声器振幅过大造成的影响是比较困难的，因为是通过在100-20kHz范围内等幅加大测试信号电压来使扬声器产生更多的热量，从而确定出扬声器的耐温极限，由于传统测试方式在100-20kHz频带内各频点的幅度是等幅的，而在同一个100-20kHz扫频周期内，扬声器的振幅是不一致的，扬声器振幅在共振频率处达到最大，此时如果继续增大测试信号幅度，那么扬声器振幅就会变得很大，甚至超过振动空间引起断线，最终导致测试失败。对现有技术改进的难点在于进行扬声器温度极限的时候，如何避免扬声器振幅造成的影响。另外，传统测试方式通常将扬声器放入温箱中，通过增加温箱的温度进而测试扬声器的耐温极限，这种测试方式增加了测试成本。
针对上述问题，本发明提出了一种采用信号变增益进行测试的方案，测试信号同样是100-20kHz的扫频信号，但不同点在于本发明实施例中，测试信号的增益不是全频段等幅变化的，其在由扬声器共振频率确定出的增益提升频点前后的增益变化不同，即在高于增益提升频点的频段内测试信号的增益要大于增益提升频点之前频段内的增益，如此避开扬声器振幅在共振频率处超过安全空间导致失效发生的同时，保证扬声器在测试信号的高频段产生更多的热量，从而快速确定扬声器的耐温极限。同时，本发明测试时是将扬声器调整到正常工作的额定振幅下，通过扬声器自身产生热量，不需要温箱等专门的升温设备，也节省了测试成本。
图1是本发明一个实施例的一种扬声器耐温极限测试方法流程图，参见图1，本发明一个实施例的一种扬声器耐温极限的测试方法包括：
步骤S110，选取测试信号，将测试输出电压确定为扬声器的额定电压，使得所述扬声器达到额定振幅；
步骤S120，根据所述扬声器的共振频率确定出测试信号加大增益的增益提升频点；
步骤S130，按照特定扫频周期对所述扬声器进行多次测试，每次测试时控制测试信号在低于所述增益提升频点的频段内保持增益不变，在高于所述增益提升频点的频段内提升增益，测试并记录所述扬声器的温度，控制扬声器持续运行一段时间，判断所述扬声器是否失效，如果所述扬声器没有失效，则测试继续直至所述扬声器失效，记录失效时的温度；
步骤S140，根据所述扬声器失效时的温度确定出所述扬声器失效前可承受的最高温度值。
经过图1所示的步骤，本发明的这种扬声器耐温极限的测试方法，对测试信号频率小于、等于增益提升频点的频段不加大增益，对高于增益提升频点的频段加大测试信号的增益，从而避开了扬声器振幅在共振频率处可能超过安全空间导致失效发生，排除了扬声器振幅对测试结果的影响。并且，在高频段加大测试信号的增益使得扬声器产生更多的热量，从而方便快速确定出扬声器的耐温极限。
在本发明的一个实施例中，步骤S110，包括：确定出扬声器的共振频率，以扬声器的共振频率加上设定频率例如500Hz作为测试信号加大增益的增益提升频点。
在本发明的一个实施例中，步骤S120中的对高于增益提升频点的频段加大测试信号的增益包括：对测试信号频率高于增益提升频点的频段，每次测试时在前一次增益加大的基础上逐步加大增益。具体实施时，可能需要对扬声器进行多次测试，每次加大测试信号的增益的幅度可能不同，例如，第一次测试时加大测试信号增益1dB测试并记录加大增益1dB后的温度，在该温度下，测试扬声器的性能，即让扬声器持续运行一段时间（例如96小时）并观察，如果此时扬声器未失效，则再次测试，继续加大测试信号的增益，测试时可以加大3dB增益或者1dB增益，接着观察扬声器是否失效，如此重复测试，直至扬声器失效。在扬声器失效前测试得到的多个温度值中的最高值即确定为扬声器的耐温极限。
图2是传统测试方式测试信号增益加大前后变化幅度对比示意图，图3是本发明一个实施例的一种扬声器耐温极限测试方法测试信号增益加大前后变化幅度对比示意图；以下结合图2和图3，对比传统测试方式与本发明测试方法，对本发明的扬声器耐温极限测试方法的有益效果进行具体说明。在图2中，图2a是传统测试方式中测试信号增益加大之前的示意图，图2b是传统测试方式中测试信号增益加大之后的示意图，对比图2a和图2b，可以看出，传统测试信号增益加大是全频段等幅度加大的。
需要说明的是，图2是截取了测试信号中的某一频段进行示意性说明传统测试信号在增益加大时是全频段都加大，并且每个频点加大的幅度是相同的。
在图3中，图3a是本发明一个实施例的测试信号增益加大之前的示意图，图3b是本发明一个实施例的测试信号增益加大之后的示意图，对比图3a和图3b，可以看出本发明的这种扬声器耐温极限测试方法中，测试信号增益提升频点之前的频段的增益固定不变，只提升增益提升频点之后的频段的增益。。其中，在确定测试信号增益提升频点时要考虑扬声器的共振频率，以共振频率加上500Hz作为加大测试信号增益加大的增益提升频点，避免了在共振频率之前或在共振频率处加大信号增益可能导致扬声器失效，从而影响测试结果。
需要说明的是，图3是截取了测试信号中的某一频段进行示意性说明传统测试信号在增益加大时是全频段都加大，并且两个频段内的频点加大的幅度是不同的。
图4是传统测试方式中扬声器初始振幅以及加了测试信号后扬声器振幅变化示意图，图5是本发明一个实施例的一种扬声器耐温极限测试方法中的扬声器初始振幅以及加了测试信号后的扬声器振幅变化示意图；以下结合图4和图5，对比传统测试方式与本发明提供的扬声器耐温极限测试方法之间的区别，对本发明的扬声器耐温极限测试方法进行具体说明。
在图4中，曲线41代表额定电压下扬声器的振幅，曲线42代表测试信号100-20kHz整体提升1dB时扬声器的振幅，可见在共振频率（例如图4中的700Hz）处扬声器的振幅已经很大，这样再持续运行96小时以测试扬声器的性能时，扬声器的振幅极有可能超过安全振幅，导致扬声器断线失效。具体的参见图4，扬声器的共振频率约为700Hz，即扬声器振幅在700Hz处达到最高值，传统的扬声器耐温极限测试方式，在100-20KHz频段内加大信号幅度是全频段等幅变化的，在大于等于扬声器共振频率处，如果加大信号幅度，扬声器振幅会超过安全空间（在700Hz处，扬声器振幅超过0.25mm振幅安全值，此时会发生断线），导致扬声器断线失效，影响测试结果。而本发明的技术方案在确定扬声器额定振幅时确定的增益提升频点，确保测试信号低于增益提升频点的频段内保持增益不变，从而避开了扬声器振幅对测试结果的不利影响。
参见图5，曲线51代表额定电压下扬声器的额定振幅，曲线52代表在100-20KHz测试信号下在高于增益提升频点的频段内增益加大1dB后扬声器的振幅，本实施例中扬声器的共振频率约为700Hz，即扬声器振幅在700Hz处达到最高值，根据本发明的这种扬声器耐温极限测试方法，在100-20KHz频段内加大信号幅度不是全频段等幅变化的。本实施例中，以大于共振频率700Hz加上500Hz的频点即1200Hz作为增益提升频点，从增益提升频点1200Hz处开始加大测试信号的增益，在增益提升频点1200Hz之前保持测试信号增益不变，图5中可以看出在1200Hz之前，加了测试信号的扬声器振幅与扬声器的初始振幅曲线基本吻合，而从1200Hz开始加大增益后，加了测试信号后的扬声器振幅升高，加大测试信号增益后使得在测试信号的高频段，扬声器产生更多的热量，从而能够快速确定出扬声器失效前可承受的最高温度值，使测试更准确、更合理。
需要说明的是，本发明实施例以1200Hz作为加大测试信号的增益提升频点，在本发明的其他实施例中，可以根据扬声器共振频率的不同选择不同的其他频率作为增益提升频点，例如，选择3000Hz、4000Hz作为加大测试信号增益的增益提升频点，对此不做限制。只要能够保证测试信号增益加大的增益提升频点在扬声器共振频率之后，从而避免扬声器振幅过大可能失效影响测试结果的发生即可。
在本发明的一个实施例中，扫频周期可以是2~10秒中的任一值。需要说明的是，扫频周期的选择要考虑扬声器的功率和测试信号的频段等因素，扫频时间太长不利于温度的集中，得到的测试结果与扬声器实际可耐受的温度值之间可能存在一定的误差。因此，具体实施时可以选择3秒或者4秒作为一个扫频周期。
此外，与上述扬声器耐温极限的测试方法相对应的，本发明还提供了一种扬声器耐温极限的测试系统。
图6是本发明一个实施例的一种扬声器耐温极限测试系统框图，参见图6，该扬声器耐温极限的测试系统600包括：
测试输出电压确定单元610，用于选取测试信号，将测试输出电压确定为扬声器的额定电压，使得扬声器达到额定振幅；
增益提升频点确定单元620，用于根据扬声器的共振频率确定出测试信号加大增益的增益提升频点；
测试单元630，用于对扬声器进行多次测试，每次测试时控制测试信号在低于增益提升频点的频段内保持增益不变，在高于增益提升频点的频段内提升增益，测试并记录扬声器的温度，控制扬声器持续运行一段时间，判断扬声器是否失效，如果扬声器没有失效，则测试继续直至扬声器失效，记录失效时的温度；
最高温度确定单元640，用于根据扬声器失效时的温度确定出扬声器失效前可承受的最高温度值。
在本发明的一个实施例中，增益提升频点确定单元610，具体用于确定出扬声器的共振频率，以扬声器的共振频率加上设定频率例如500Hz作为测试信号加大增益的增益提升频点。
在本发明的一个实施例中，测试单元620，具体用于在高于增益提升频点的频段内，每次测试时在前一次增益加大的基础上逐步加大增益。
在本发明的一个实施例中，测试信号为100-20kHz的正弦扫频信号；
在本发明的一个实施例中，特定扫频周期为2~10秒中的任一值。
需要说明的是，本发明的这种扬声器耐温极限的测试系统是和前述的扬声器耐温极限的测试方法相对应的，因而本实施例中的扬声器耐温极限测试系统的工作过程可以参见前述扬声器耐温极限测试方法部分的具体说明，在此不再赘述。
综上所述，本发明提供的扬声器耐温极限测试方法和测试系统通过提升高于增益提升频点频段的增益，让扬声器产生更多的热量，使扬声器的温度升高，从而确定出扬声器的温度极限。通过控制低于增益提升频点频段内测试信号的增益不变，保证扬声器工作在正常的振幅下，避免振幅过大对测试结果的影响。另外，相对于依靠温箱进行升温的传统测试方法，本发明的这种测试方法利用扬声器自身热量进行温度测试，省去了温箱等测试设备，节约了测试成本。
以上所述仅为本发明的较佳实施例而已，并非用于限定本发明的保护范围。凡在本发明的精神和原则之内所作的任何修改、等同替换、改进等，均包含在本发明的保护范围内。

Claims (10)

  1.  一种扬声器耐温极限的测试方法，其特征在于，所述扬声器耐温极限的测试方法包括：
    选取测试信号，将测试输出电压确定为扬声器的额定电压，使得所述扬声器达到额定振幅；
    根据所述扬声器的共振频率确定出测试信号加大增益的增益提升频点；
    按照特定扫频周期对所述扬声器进行多次测试，每次测试时控制测试信号在低于所述增益提升频点的频段内保持增益不变，在高于所述增益提升频点的频段内提升增益，测试并记录所述扬声器的温度，控制扬声器持续运行一段时间，判断所述扬声器是否失效，如果所述扬声器没有失效，则测试继续直至所述扬声器失效，记录失效时的温度；
    根据所述扬声器失效时的温度确定出所述扬声器失效前可承受的最高温度值。
  2. 如权利要求1所述的扬声器耐温极限的测试方法，其特征在于，所述根据所述扬声器的共振频率确定出测试信号加大增益的增益提升频点包括：
    确定所述扬声器的共振频率，以所述扬声器的共振频率加上设定频率作为测试信号加大增益的增益提升频点。
  3. 如权利要求2所述的扬声器耐温极限的测试方法，其特征在于，所述对所述扬声器进行多次测试，每次测试时控制测试信号在低于所述增益提升频点的频段内保持增益不变，在高于所述增益提升频点的频段内提升增益包括：
    在高于所述增益提升频点的频段内，每次测试时在前一次增益加大的基础上逐步加大增益。
  4. 如权利要求1所述的扬声器耐温极限的测试方法，其特征在于，该方法包括：
    选取100-20kHz的正弦扫频信号作为测试信号。
  5. 如权利要求4所述的扬声器耐温极限的测试方法，其特征在于，该方法包括：选取2~10秒中的任一值作为一个扫频周期。
  6. 一种扬声器耐温极限的测试系统，其特征在于，所述扬声器耐温极限的测试系统包括：
    测试输出电压确定单元，用于选取测试信号，将测试输出电压确定为扬声器的额定电压，使得所述扬声器达到额定振幅；
    增益提升频点确定单元，用于根据所述扬声器的共振频率确定出测试信号加大增益的增益提升频点；
    测试单元，用于对所述扬声器进行多次测试，每次测试时控制测试信号在低于所述增益提升频点的频段内保持增益不变，在高于所述增益提升频点的频段内提升增益，测试并记录所述扬声器的温度，控制扬声器持续运行一段时间，判断所述扬声器是否失效，如果所述扬声器没有失效，则测试继续直至所述扬声器失效，记录失效时的温度；
    最高温度确定单元，用于根据所述扬声器失效时的温度确定出所述扬声器失效前可承受的最高温度值。
  7. 如权利要求6所述的扬声器耐温极限的测试系统，其特征在于，所述增益提升频点确定单元，具体用于确定所述扬声器的共振频率，以所述扬声器的共振频率加上设定频率作为测试信号加大增益的增益提升频点。
  8. 如权利要求7所述的扬声器耐温极限的测试系统，其特征在于，所述测试单元，具体用于在高于所述增益提升频点的频段内，每次测试时在前一次增益加大的基础上逐步加大的增益。
  9. 如权利要求6所述的扬声器耐温极限的测试系统，其特征在于，所述测试信号为100-20kHz的正弦扫频信号。
  10. 如权利要求6所述的扬声器耐温极限的测试系统，其特征在于， 所述特定扫频周期为2~10秒中任一值。
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