WO2016155217A1 - Method for realizing reuse of test case on top layer of chip - Google Patents

Method for realizing reuse of test case on top layer of chip Download PDF

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WO2016155217A1
WO2016155217A1 PCT/CN2015/088146 CN2015088146W WO2016155217A1 WO 2016155217 A1 WO2016155217 A1 WO 2016155217A1 CN 2015088146 W CN2015088146 W CN 2015088146W WO 2016155217 A1 WO2016155217 A1 WO 2016155217A1
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define
test case
value
header file
default
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PCT/CN2015/088146
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French (fr)
Chinese (zh)
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姚香君
戴绍新
李风志
杨萌
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山东华芯半导体有限公司
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Publication of WO2016155217A1 publication Critical patent/WO2016155217A1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

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  • the invention belongs to the field of chip verification technology of a system on chip, and particularly relates to a method for realizing reuse of a top-level test case of a chip; the method does not need to repeatedly write test code, and does not need to manually modify the test case, thereby realizing reuse of the test case. Effectively improve the top-level verification efficiency of the chip.
  • a module may be instantiated multiple times.
  • the Nand Flash controller NFC is instantiated twice in one chip, NFC0 and NFC1 respectively.
  • the two modules implement the same function. The only difference is that the base addresses they are accessed are different.
  • a module may be reused multiple times.
  • the function and implementation of each use are the same, except that the corresponding base address in the chip is different each time it is used. Therefore, when writing a top-level test case, if you write separate use cases with the same function, the code redundancy will be very large; if you share the same test case, you need to manually modify the base address of each module, although the code redundancy is reduced, but the operation It is cumbersome to use, and manual modification is also prone to human error. This is a deficiency of the prior art.
  • the present invention provides the following technical solutions:
  • a method for realizing reuse of a chip top-level test case includes the following steps:
  • step S102 determining whether the module to be tested is the default test case indicated by the default value of the definition in S1, if yes, proceeding to step S104, otherwise proceeding to step S103;
  • S301 Modify the general header file to a specific header file according to the define value specified in step S103.
  • the default value of the definition in the step S101 is NFC0.
  • the default define value is replaced with the define value to be used.
  • the invention has the beneficial effects that the method does not need to repeatedly write the test code, and does not need to manually modify the test case, thereby realizing the reuse of the test case and the automatic execution of the verification, thereby effectively improving the top-level verification efficiency of the chip.
  • the design principle of the invention is reliable and has a very broad application prospect.
  • the present invention has outstanding substantive features and significant advances as compared with the prior art, and the beneficial effects of the implementation thereof are also obvious.
  • the invention provides a method for realizing reuse of a chip top test case, comprising the following steps:
  • step S102 determining whether the module to be tested is the default test case indicated by the default value of the definition in S1, if yes, proceeding to step S104, otherwise proceeding to step S103;
  • S301 Modify the general header file to a specific header file according to the define value specified in step S103.
  • the default value of the definition in the step S101 is NFC0.
  • step S103 the default define value is replaced with the define value to be used.
  • Run the upper command script This script will specify the definition value to be used in the common header file "nfc_define.h” to determine which module will be tested.
  • the default define value is NFC0, that is, the tested module is NFC0.
  • the test case processing script is automatically called in the script.
  • This script is a script shared by all test cases. The script prepares relevant files for running specific test cases based on the name of the test case and the define parameters passed in the upper command script. The script that produces the specific header file is automatically called in the script.
  • Run a script that generates a specific header file The script automatically modifies the generic header file to a specific header file according to the define value passed from the upper command script. Or take the NFC module test as an example.
  • the script that generates the specific header file will automatically put the "nfc_define.h” header file. "#define NFC0” is deleted, and the definition “#define NFC1” is added to the "nfc_define.h” header file, so that the address of the test case operation is no longer the register address of NFC0, but is replaced by the register of NFC1. The address allows the module NFC1 to be tested.

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Debugging And Monitoring (AREA)

Abstract

A method for realizing reuse of a test case on a top layer of a chip, comprising the following steps: S101: setting a default value about define in a general header file 'nfc_define.h'; S102: judging whether a to-be-tested module is a default test case referring to the default value about the define in S1 or not, if so, going to step S104, and otherwise going to step S103; S103: assigning a value to the define required to be used in the general header file 'nfc_define.h', so as to decide the test case; S104: transferring the value about the define to a script about the test case; S201: preparing, according to a name of the test case and parameters of the define, a test file; and S301: modifying, according to the assigned value about the define in S103, the general header file into a specific header file.

Description

一种实现芯片顶层测试用例重用的方法Method for realizing reuse of chip top test case 技术领域Technical field
本发明属于片上系统的芯片验证技术领域，具体涉及一种实现芯片顶层测试用例重用的方法；采用该方法不需要重复编写测试代码，亦无需要手动修改测试用例，即可实现测试用例的重用，有效提高了芯片顶层验证效率。The invention belongs to the field of chip verification technology of a system on chip, and particularly relates to a method for realizing reuse of a top-level test case of a chip; the method does not need to repeatedly write test code, and does not need to manually modify the test case, thereby realizing reuse of the test case. Effectively improve the top-level verification efficiency of the chip.
背景技术Background technique
在现有的芯片验证中，顶层测试用例使用C语言编写，对寄存器的操作都是对预先定义的宏地址进行读写操作。根据芯片内部功能需求，某一模块可能被例化多次，比如Nand Flash控制器(NFC)在一个芯片内被例化了两次，分别为NFC0和NFC1，这两个模块实现的功能完全一样，唯一不同的是它们被访问的基地址不一样。In the existing chip verification, the top-level test case is written in C language, and the operation of the register is to read and write the predefined macro address. According to the internal functional requirements of the chip, a module may be instantiated multiple times. For example, the Nand Flash controller (NFC) is instantiated twice in one chip, NFC0 and NFC1 respectively. The two modules implement the same function. The only difference is that the base addresses they are accessed are different.
现有技术的芯片设计中，某个模块可能会被重复使用多次。对于同一模块的多次重复使用，每一次使用的功能和实现都是一样的，只是每次使用时在芯片中对应的基地址不一样。因此在编写顶层测试用例时，若分开编写功能相同的用例，代码冗余就会很大；若共用同一测试用例，则需要手动修改各个模块的基地址，虽然减小了代码冗余，但操作起来比较繁琐，而且手动修改也容易产生人为误操作。此为现有技术的不足之处。In prior art chip designs, a module may be reused multiple times. For multiple reuses of the same module, the function and implementation of each use are the same, except that the corresponding base address in the chip is different each time it is used. Therefore, when writing a top-level test case, if you write separate use cases with the same function, the code redundancy will be very large; if you share the same test case, you need to manually modify the base address of each module, although the code redundancy is reduced, but the operation It is cumbersome to use, and manual modification is also prone to human error. This is a deficiency of the prior art.
因此，提供设计一种实现芯片顶层测试用例重用的方法是非常有必要的。Therefore, it is necessary to provide a way to design a chip top-level test case reuse.
发明内容Summary of the invention
本发明的目的在于，针对上述现有技术存在的缺陷，提供设计一种实现芯片顶层测试用例重用的方法，以解决上述技术问题。SUMMARY OF THE INVENTION It is an object of the present invention to provide a method for realizing reuse of a chip top-level test case in order to solve the above-mentioned technical problems.
为实现上述目的，本发明给出以下技术方案：In order to achieve the above object, the present invention provides the following technical solutions:
一种实现芯片顶层测试用例重用的方法，包括如下步骤：A method for realizing reuse of a chip top-level test case includes the following steps:
S1：运行上层命令脚本；该步骤包括：S1: Run the upper command script; this step includes:
S101：设置通用头文件“nfc_define.h”中define的默认值；S101: setting a default value of define in the general header file "nfc_define.h";
S102：判断待测试模块是否为S1中define的默认值所指代的默认测试用例，如果是则转到步骤S104，否则转到步骤S103；S102: determining whether the module to be tested is the default test case indicated by the default value of the definition in S1, if yes, proceeding to step S104, otherwise proceeding to step S103;
S103：指定在通用头文件“nfc_define.h”中需要使用的define值，以决定所测试的用例；S103: Specify a define value to be used in the general header file "nfc_define.h" to determine the use case to be tested;
S104：将define中的值传递到测试用例脚本；S104: Pass the value in the definition to the test case script;
S2：运行测试用例处理脚本，该步骤包括：S2: Run the test case processing script, which includes:
S201：根据测试用例的名字以及define的参数，准备测试用文件； S201: Prepare a test file according to the name of the test case and the parameter of the define;
S3：运行产生特定头文件的脚本，包括如下步骤：S3: Run a script that generates a specific header file, including the following steps:
S301：根据步骤S103中指定的define值，将通用头文件修改成特定头文件。S301: Modify the general header file to a specific header file according to the define value specified in step S103.
优选地，所述步骤S101中define的默认值为NFC0。Preferably, the default value of the definition in the step S101 is NFC0.
优选地，所述步骤S103中，将默认的define值替换为需要使用的define值。Preferably, in the step S103, the default define value is replaced with the define value to be used.
优选地，所述步骤S103中，将默认的define值替换为需要使用的define值的语句为：“+define+NFC0＝0+define+NFCX＝X”，其中，X指代待检测用例的相应编号。Preferably, in the step S103, the statement that replaces the default define value with the define value to be used is: “+define+NFC0=0+define+NFCX=X”, where X refers to the corresponding to the detection use case. Numbering.
本发明的有益效果在于，本方法不需要重复编写测试代码，也不需要手动修改测试用例，即可实现测试用例的重用以及验证的自动化执行，有效提高了芯片顶层验证效率。此外，本发明设计原理可靠，具有非常广泛的应用前景。The invention has the beneficial effects that the method does not need to repeatedly write the test code, and does not need to manually modify the test case, thereby realizing the reuse of the test case and the automatic execution of the verification, thereby effectively improving the top-level verification efficiency of the chip. In addition, the design principle of the invention is reliable and has a very broad application prospect.
由此可见，本发明与现有技术相比，具有突出的实质性特点和显著地进步，其实施的有益效果也是显而易见的。Thus, it can be seen that the present invention has outstanding substantive features and significant advances as compared with the prior art, and the beneficial effects of the implementation thereof are also obvious.
具体实施方式detailed description
下面通过具体实施例对本发明进行详细阐述，以下实施例是对本发明的解释，而本发明并不局限于以下实施方式。The invention is explained in detail below by means of specific examples, which are illustrative of the invention, and the invention is not limited to the following embodiments.
本发明提供了一种实现芯片顶层测试用例重用的方法，包括如下步骤：The invention provides a method for realizing reuse of a chip top test case, comprising the following steps:
S1：运行上层命令脚本；该步骤包括：S1: Run the upper command script; this step includes:
S101：设置通用头文件“nfc_define.h”中define的默认值；S101: setting a default value of define in the general header file "nfc_define.h";
S102：判断待测试模块是否为S1中define的默认值所指代的默认测试用例，如果是则转到步骤S104，否则转到步骤S103；S102: determining whether the module to be tested is the default test case indicated by the default value of the definition in S1, if yes, proceeding to step S104, otherwise proceeding to step S103;
S103：指定在通用头文件“nfc_define.h”中需要使用的define值，以决定所测试的用例；S103: Specify a define value to be used in the general header file "nfc_define.h" to determine the use case to be tested;
S104：将define中的值传递到测试用例脚本；S104: Pass the value in the definition to the test case script;
S2：运行测试用例处理脚本，该步骤包括：S2: Run the test case processing script, which includes:
S201：根据测试用例的名字以及define的参数，准备测试用文件；S201: Prepare a test file according to the name of the test case and the parameter of the define;
S3：运行产生特定头文件的脚本，包括如下步骤：S3: Run a script that generates a specific header file, including the following steps:
S301：根据步骤S103中指定的define值，将通用头文件修改成特定头文件。S301: Modify the general header file to a specific header file according to the define value specified in step S103.
本实施例中，所述步骤S101中define的默认值为NFC0。In this embodiment, the default value of the definition in the step S101 is NFC0.
本实施例中，所述步骤S103中，将默认的define值替换为需要使用的define值。In this embodiment, in step S103, the default define value is replaced with the define value to be used.
本实施例中，所述步骤S103中，将默认的define值替换为需要使用的define值的语句为：“+define+NFC0＝0+define+NFCX＝X”，其中，X指代待检测用例的相应编号。In this embodiment, in the step S103, the statement that replaces the default define value with the define value to be used is: “+define+NFC0=0+define+NFCX=X”, where X refers to the to-be-detected use case. The corresponding number.
本实施例中，以NFC0以及NFC1为例给出三个脚本的运行具体步骤以及代码。 In this embodiment, the specific steps and codes of the three scripts are given by taking NFC0 and NFC1 as examples.
步骤：step:
1)运行上层命令脚本：该脚本执行时会指定在通用头文件“nfc_define.h”中需要使用的define值，从而决定将要测试哪个模块。默认的define值为NFC0，即测试的模块为NFC0。若要测试模块NFC1，则在运行该上层命令脚本时需要指定“+define+NFC0＝0+define+NFC1＝1”。在该脚本中会自动调用测试用例处理脚本。1) Run the upper command script: This script will specify the definition value to be used in the common header file "nfc_define.h" to determine which module will be tested. The default define value is NFC0, that is, the tested module is NFC0. To test the module NFC1, you need to specify "+define+NFC0=0+define+NFC1=1" when running the upper command script. The test case processing script is automatically called in the script.
2)运行测试用例处理脚本：该脚本为所有测试用例共用的脚本。该脚本根据测试用例的名字以及上层命令脚本传递进来的define参数，为运行特定测试用例准备相关文件。在该脚本中会自动调用产生特定头文件的脚本。2) Run the test case processing script: This script is a script shared by all test cases. The script prepares relevant files for running specific test cases based on the name of the test case and the define parameters passed in the upper command script. The script that produces the specific header file is automatically called in the script.
3)运行产生特定头文件的脚本：该脚本根据上层命令脚本传递来的define值，把通用头文件自动修改成特定头文件。还是以NFC模块测试为例，当在上层命令脚本中指定了“+define+NFC0＝0+define+NFC1＝1”时，产生特定头文件的脚本就会自动把“nfc_define.h”头文件中的“#define NFC0”删除掉，同时在“nfc_define.h”头文件中增加定义“#define NFC1”，这样测试用例操作的地址就不再是NFC0的寄存器地址，而是换成了NFC1的寄存器地址，从而就能对模块NFC1进行测试了。3) Run a script that generates a specific header file: The script automatically modifies the generic header file to a specific header file according to the define value passed from the upper command script. Or take the NFC module test as an example. When "+define+NFC0=0+define+NFC1=1" is specified in the upper command script, the script that generates the specific header file will automatically put the "nfc_define.h" header file. "#define NFC0" is deleted, and the definition "#define NFC1" is added to the "nfc_define.h" header file, so that the address of the test case operation is no longer the register address of NFC0, but is replaced by the register of NFC1. The address allows the module NFC1 to be tested.
代码：Code:
“nfc.c”"nfc.c"
wr_addr(NFC_SETTING)＝0x000148c0；Wr_addr(NFC_SETTING)=0x000148c0;
wr_addr(NFC_CTRL)＝0x0000ff00；Wr_addr(NFC_CTRL)=0x0000ff00;
“nfc_define.h”"nfc_define.h"
#ifndef_H#ifndef_H
#define_H#define_H
#define NFC0#define NFC0
#define NFC0_SETTING  0x10000000#define NFC0_SETTING 0x10000000
#define NFC0_CTRL  0x10000004#define NFC0_CTRL 0x10000004
……………………........................
#define NFC1_SETTING  0x10a00000#define NFC1_SETTING 0x10a00000
#define NFC1_CTRL  0x10a00004#define NFC1_CTRL 0x10a00004
……………………........................
#ifdef NFC0#ifdef NFC0
#define NFC_SETTING  NFC0_SETTING#define NFC_SETTING NFC0_SETTING
#define NFC_CTRL    NFC0_CTRL#define NFC_CTRL NFC0_CTRL
…………………… ........................
#endif#endif
#ifdef NFC1#ifdef NFC1
#define NFC_SETTING  NFC1_SETTING#define NFC_SETTING NFC1_SETTING
#define NFC_CTRL   NFC1_CTRL#define NFC_CTRL NFC1_CTRL
……………………........................
#endif#endif
#endif#endif
以上公开的仅为本发明的优选实施方式，但本发明并非局限于此，任何本领域的技术人员能思之的没有创造性的变化，以及在不脱离本发明原理前提下所作的若干改进和润饰，都应落在本发明的保护范围内。 The above disclosure is only a preferred embodiment of the present invention, but the present invention is not limited thereto, and any modifications and refinements made by those skilled in the art can be made without departing from the principles of the present invention. All should fall within the scope of protection of the present invention.

Claims (4)

  1. 一种实现芯片顶层测试用例重用的方法，包括如下步骤：A method for realizing reuse of a chip top-level test case includes the following steps:
    S1：运行上层命令脚本；该步骤包括：S1: Run the upper command script; this step includes:
    S101：设置通用头文件“nfc_define.h”中define的默认值；S101: setting a default value of define in the general header file "nfc_define.h";
    S102：判断待测试模块是否为S1中define的默认值所指代的默认测试用例，如果是则转到步骤S104，否则转到步骤S103；S102: determining whether the module to be tested is the default test case indicated by the default value of the definition in S1, if yes, proceeding to step S104, otherwise proceeding to step S103;
    S103：指定在通用头文件“nfc_define.h”中需要使用的define值，以决定所测试的用例；S103: Specify a define value to be used in the general header file "nfc_define.h" to determine the use case to be tested;
    S104：将define中的值传递到测试用例脚本；S104: Pass the value in the definition to the test case script;
    S2：运行测试用例处理脚本，该步骤包括：S2: Run the test case processing script, which includes:
    S201：根据测试用例的名字以及define的参数，准备测试用文件；S201: Prepare a test file according to the name of the test case and the parameter of the define;
    S3：运行产生特定头文件的脚本，包括如下步骤：S3: Run a script that generates a specific header file, including the following steps:
    S301：根据步骤S103中指定的define值，将通用头文件修改成特定头文件。S301: Modify the general header file to a specific header file according to the define value specified in step S103.
  2. 根据权利要求1所述的一种实现芯片顶层测试用例重用的方法，其特征在于：所述步骤S101中define的默认值为NFC0。The method for implementing the top-level test case reuse of the chip according to claim 1, wherein the default value of the definition in the step S101 is NFC0.
  3. 根据权利要求1或2所述的一种实现芯片顶层测试用例重用的方法，其特征在于：所述步骤S103中，将默认的define值替换为需要使用的define值。A method for realizing reuse of a chip top test case according to claim 1 or 2, wherein in the step S103, the default define value is replaced with a define value to be used.
  4. 根据权利要求3所述的一种实现芯片顶层测试用例重用的方法，其特征在于：所述步骤S103中，将默认的define值替换为需要使用的define值的语句为：“+define+NFC0＝0+define+NFCX＝X”，其中，X指代待检测用例的相应编号。 The method for implementing the top-level test case reuse of the chip according to claim 3, wherein in the step S103, the default define value is replaced by the statement of the define value to be used: "+define+NFC0= 0+define+NFCX=X”, where X refers to the corresponding number of the use case to be tested.
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