WO2015169730A1 - Procédé et capteur servant à déterminer la surface d'un objet par déflectométrie - Google Patents

Procédé et capteur servant à déterminer la surface d'un objet par déflectométrie Download PDF

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Publication number
WO2015169730A1
WO2015169730A1 PCT/EP2015/059685 EP2015059685W WO2015169730A1 WO 2015169730 A1 WO2015169730 A1 WO 2015169730A1 EP 2015059685 W EP2015059685 W EP 2015059685W WO 2015169730 A1 WO2015169730 A1 WO 2015169730A1
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WIPO (PCT)
Prior art keywords
pattern
camera
imaged
determining
image
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PCT/EP2015/059685
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German (de)
English (en)
Inventor
Klaus VEIT
Original Assignee
Isra Vision Ag
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Publication date
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Publication of WO2015169730A1 publication Critical patent/WO2015169730A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns

Definitions

  • the invention relates to a method for determining the surface of an object by means of deflectometry, in which a known, spatially in particular 2-dimensional, pattern on a specular surface of the object is optically, i. by projection or reflection, imaged and recorded with at least one camera with known imaging properties, and in which deviations of the pattern taken with the camera from the known pattern for determining the surface are evaluated, the pattern having a periodic pattern, the phase angle of the pattern is determined in pixels and deviations from the periodic structure of the pattern are used to determine the surface by determining the surface topography of the surface from the known pattern and the known imaging properties.
  • a reflecting surface is not limited to a mirror, but any smooth surface whose surface structure is suitable for reflecting an image imaged on the surface, for example by projection or simple illumination with a suitable pattern, such that this image of the pattern with possibly caused by the surface deviations (for example, in the sense of distortions) with a camera (in the sense of a color and / or brightness representation in an image receiving image sensor) is receivable.
  • the reflecting surface is also understood to mean a (spatially and / or qualitatively) partially reflecting surface.
  • known pattern and “known image properties” is meant that the pattern and / or its image, for example, in the form of a reflection or projection and the camera are calibrated to each other, so that a pixel in the image of the camera can be assigned to a point on the surface and the manner of imaging the pattern on a surface is calculable.
  • the surface can be determined from the shape of the image of the pattern in the recorded image of the camera, for example by recognizing deviations of an assumed surface shape (defect) or for the reconstruction of the surface itself.
  • a known pattern is viewed over a specular or semi-reflective surface by one or more cameras and from this the surface topography of the specular or specular surface is determined.
  • various known methods differ in how a point is uniquely determined on the pattern imaged on the surface.
  • a phase evaluation of a periodic pattern is made because it allows the highest accuracy to be achieved.
  • several phase-shifted patterns, usually four or multiples thereof, are taken in succession, because this leads to robust and easy-to-solve systems of equations.
  • the phase evaluation does not take place in the individual pattern, but in the one camera pixel of the temporally successive recorded pattern. This deflectometric surface determination method is widely used because it is very robust.
  • a major disadvantage is that multiple recordings of phase-shifted patterns are needed. For the determination of the surface according to this method, at least as much time is required that makes it possible to successively make the different recordings of the phase-shifted patterns.
  • the various phase-shifted pattern images must be generated synchronously with the image acquisition become. This also means a certain effort in the process organization.
  • a further significant disadvantage is that the smallest displacements between the camera surface and the pattern between the different pattern images of different phase lead to sometimes considerable measurement errors.
  • this method is used in the classical approach only for static objects, also because a tracking of the sensor with a moving surface of an object due to the accuracy of measurement to be achieved in practice is not feasible.
  • the effort for such a complex system for carrying the camera and pattern to a moving surface with the object would be so mechanically complicated that, for example, corresponding sensors could not be used in production environments or the cost is too high.
  • the object of the invention is therefore to suggest a simple and robust method for the determination of the reflectometric surface, which is applicable to moving objects.
  • This object is achieved in a method of the type mentioned in particular in that the object whose surface is to be determined, is moved relative to the imaged pattern and the camera and that for determining a portion of the surface of the object in a position of the Object relative to the camera and the imaged pattern only at a time recorded images of this area of the surface are evaluated with the pictured.
  • only one camera according to the invention, therefore, only one image of the pattern imaged on the surface is evaluated for a region of the surface which is detected by the image.
  • the pattern is a superimposition of in particular two, but possibly also more, patterns which are in different orthogonal or suitably chosen (non-orthogonal) angles in the 2-dimensional projection plane of the pattern extending] directions each have a periodic pattern course.
  • This has the advantage that a surface can be measured by a single camera image in two different directions with the projected pattern structure, without having to take two images with differently oriented pattern progressions in succession. Two consecutive images with differently oriented pattern progressions would lead to a significant blurring in the spatial resolution in the case of a movement of the object that is fast compared to the image acquisition frequency.
  • the inventive method can also be applied to two fast moving objects.
  • a particularly preferred way of forming the pattern for determining the surface of moving objects according to the invention provides that the superimposition of the patterns is formed by adding the patterns in each spatial point. This has the advantage, as opposed to a more common multiplicative superposition of two patterns, that low-intensity regions in one of the two patterns do not necessarily result in a weak modulation of the two patterns in the superimposed pattern. It is then also possible to evaluate the course of the superposed pattern in each case in one of the directions of the pattern profile in the same way as in the case of only one pattern in a deflectometric manner.
  • the formation of such patterns for a reflectometric determination of a surface is known from the publication Jorge L. Flores, Beethoven Bravo-Medina, Jose A.
  • the deflektometric evaluation according to the proposed invention may, for example, include a Fourier transformation of the spatial coordinates into spatial frequencies. In this Fourier-transformed space of spatial frequencies, it is possible to filter out local disturbances of the surface which have a different spatial frequency than the periodicity of the pattern.
  • Such an evaluation is, for example, from the publication M. Takeda, H. Ina, and S. Kobayashi, "Fourier transform method of fringe-pattern analysis for computer-based topography and interferometry, J. Opt. Soc., Am., 72, 156-160 (1982) and can also be used particularly advantageously according to the invention.
  • the periodic pattern pattern can be a brightness curve and / or a color gradient.
  • the pattern profile can be designed as a sinusoidal brightness profile.
  • a sinusoidal gray value curve can be used.
  • individual regions of the pattern, especially of the superimposed pattern composed of two individual patterns are marked with different superimposed patterns in different directions, with different colors is. This can be achieved, for example, by overlaying the periodic brightness curve with a periodic color gradient, wherein preferably a different periodicity is selected.
  • the same periodicity for the brightness progression and the color progression can also be selected.
  • a particularly good spatial resolution of individual pattern points can be achieved if, in the case of a pattern superimposed on two or more patterns according to the invention, the periodic color progression differs in the different directions of the individual (superimposed) patterns.
  • the difference of the periodic color gradients may be in the sequence of the different colors and / or the repetition frequency.
  • the different colors of the superimposed pattern can then be used at different positions be to identify a particular pattern point in the periodically repeating structure of the pattern.
  • a plurality of cameras record the pattern imaged on the surface.
  • a pattern that is so large in terms of area that it also covers a large surface, at least when recorded by a plurality of cameras, which - at the desired resolution - could not be detected by a camera.
  • different areas of a (large) surface are recorded by different cameras. Again, this can be done simultaneously according to the invention. For the different areas, however, the individual recordings can also take place at different times, ie not at the same time as described above.
  • two cameras simultaneously record the same area of the surface with the pattern imaged on the surface.
  • the two cameras are triggered simultaneously to trigger a recording. Since the two cameras that record the same area of the surface and the imaged pattern are calibrated to each other, a stereo deflectometry can be performed. With a camera, a relationship between the distance and the surface normal can be produced in the deflectometry, which is known to the person skilled in the art and need not be explained in detail here. If a surface is only to be inspected for surface defects during the determination of the surface area, this is sufficient. because only discontinuities must be sought in the course of the relationship between the distance and the surface normal. If the surface is actually to be measured when determining the surface topography, one of the two parameters "distance" or "surface normal" must be determined elsewhere. This can be done by stereometry, ie the determination of the same surface point with two calibrated cameras.
  • the surface is picked up without an imaged pattern and used for the determination of the surface topography, i.
  • the evaluation of the phase of the pattern a difference image of the recording with a pattern of the surface and without a pattern of the surface is carried out.
  • the recording of the surface without a pattern can be made temporally immediately before and / or after the recording of the surface with the pattern shown thereon.
  • two temporally successive images of the surface must be related to each other, which is actually disadvantageous in the case of moving objects, because the location information in the two consecutively recorded images does not exactly overshoot.
  • this combination according to the invention there is the advantage that all the structural features necessary for determining the surface topography are contained in the one image of the surface (or the plurality of simultaneously recorded images of the surface) with the imaged pattern.
  • the further, not simultaneously recorded image serves only to take into account a disturbance, in particular in the form of a brightness and / or color of the reflected light changing surface noise, as in a periodic brightness and / or color gradient of the pattern can not be distinguished, whether a fault in the periodicity of a shift of the phase, which at one point leads to a change in the brightness or color, or of a change in the surface condition, locally resulting in a change in the reflectivity of the surface, is due. If differences in the reflected light are also exhibited in the image of the surface without an imaged pattern, these effects can be eliminated from the imaged pattern image.
  • the surface without pattern before and after recording with the imaged pattern, because then the movement of an error position due to the surface condition can be reconstructed and a more accurate correlation of the images with and without imaged pattern is possible.
  • the actual phase evaluation of the structure continues to take place in the image formed on the surface according to the invention (or several such temporally recorded images, for example in stereo-deflectometry), so that the correction by the further image is the actual structure of the pattern do not affect or disturb.
  • the temporally displaced recordings merely produce a kind of background correction for the elimination of disturbances. Small shifts between the images are tolerable in this case.
  • the image is first evaluated with a pattern, without taking into account the other image (s) without pattern.
  • image without pattern color or brightness disturbances are sought.
  • the same disturbances are searched for with known methods of image processing in the image with the pattern, which are also recognizable or must be there. Because of these imperfections, both images can be spatially correlated with each other and computationally superimposed in the image analysis. Subsequently, the image can be re-evaluated with pattern taking into account the disturbances.
  • An alternative embodiment for producing images of the surface with and without pattern provides that the pattern on the surface and the unstructured illumination of the surface without pattern are produced with different colors and that different shots of the pattern and the unstructured imaged on the surface Lighting are used, which record color-selectively only the pattern or the unstructured lighting.
  • This can be done according to the invention by two cameras with corresponding color filters.
  • color-selective individual pixels of an image sensor of a digital camera can be addressed by a suitable color selection of the pattern and the unstructured illumination, which are separated by image processing of the recorded image. In both cases, the unstructured lighting and the pattern can be recorded simultaneously.
  • An inventively preferred new use of the above-described method or parts thereof provides for a determination of the particular specular or partially reflecting surface of an object, which is moved relative to a surface on the surface, ie, by projection or reflection, pattern.
  • the pattern may be, in particular for the above-described method, in particular a self-luminous static pattern. This can be done by a backlit large-area film or a screen as a pattern generating device. It is also a projection of the pattern on a preferably color neutral (white) surface, which is imaged on the surface to be examined with the camera, or produced by a direct projection onto the specular or semi-reflective surface.
  • Particularly preferred is the use of the method for determining the surface of objects which are scanned by moving relative to a camera and a pattern optically imaged on the surface, wherein the surface of the objects due to their shape and / or size so beschaff is that the surface can not be determined by taking a picture.
  • the surface may in particular be surfaces of painted or unpainted vehicle bodies or parts thereof, aircraft or aircraft parts, wind turbine wings, turbine wings, sanitary objects such as bathtubs, toilets, large cladding, for example for buildings or large machines, white goods such as eg Refrigerators, washing machines or the like. Household appliances or the like.
  • metallic or reflective surfaces act.
  • the method can also be used well in the production of web material with at least partially reflecting surface, in particular in the measurement or inspection of glass, metal sheet, ceramic produced as web material.
  • pattern (or pattern generator) and camera may also be fixedly positioned relative to the moving web.
  • an arrangement on a handling device or robot is also possible.
  • the invention also relates to a sensor for determining the surface of an object by means of deflectometry with a pattern generating device for generating a particularly static luminous pattern, comprising at least one camera for capturing an image of the pattern imaged on a specular or partially reflecting surface of the object and a processor having a computing unit, which is set up for driving the pattern generating device and the camera and for evaluating the image taken with the camera.
  • the arithmetic unit is set up to carry out the above-described method or parts thereof.
  • the sensor can have a handling device, for example a robot, with which the pattern generation device and the at least one camera can be moved relative to the surface of the object.
  • a sensor arrangement is particularly suitable for scanning large-area surfaces of objects that can not be detected with a camera image in the desired resolution.
  • the camera in another preferred embodiment, which can be combined with respect to the mobility of pattern and camera or cameras also with the above embodiment, it is possible to form the camera as a line scan camera.
  • the pattern generating means may then generate a pattern (formed as previously explained in detail) which is made narrow across the longitudinal direction of the line scan camera as compared to the length of the line scan camera.
  • Narrow in comparison to the length of the line scan camera means in particular that the pattern transverse to the longitudinal direction of the line scan camera has an extension of preferably up to 10% of the length of the line scan camera, possibly also up to 15% or 20% of the length of the line scan camera.
  • FIG. 1 shows a schematic arrangement of a sensor according to the invention in a simple embodiment
  • Fig. 2 shows an embodiment of an inventive in the context of
  • the sensor according to the invention in its basic form, which is shown very diagrammatically in FIG. 1 to illustrate the functional principle, comprises a camera 1 and a pattern 2 which is a superimposition of two patterns which in the example shown are orthogonal in each case one periodic Pattern course have.
  • the structure of the pattern will be described later with reference to FIG. 2.
  • the camera 1, which may be, for example, a conventional digital area camera but also a line scan camera, and a pattern generating device 9 generating the pattern 2 are calibrated to each other, so that a surface topography 3 of an object, its surface topography is to be determined, recorded pattern on the visual beam 4 can be assigned to a defined point of the pattern 2 on the pattern generating device 9.
  • the brightness of a pattern point is detected in the illustrated example, which can be assigned via the periodic brightness curve of the pattern 2 of a specific phase position of the pattern.
  • One possible method for evaluating this is in the publication Jorge L. Floes, Beethoven Bravo-Medina, Jose A.
  • deviations of the pattern structure on the surface 3 may indicate surface defects (for example in the deviation of a desired shape or from a smooth surface structure).
  • a defined curvature of the surface 3 can be determined because the pattern 2 is known and from the known imaging properties of the camera 1, the surface shape necessary for generating the pattern 2 shown on the surface 3 can be calculated. This type of image evaluation is also known in principle to the person skilled in the art.
  • the pattern 2 is adapted such that the features of the surface topography to be detected on the surface 3 can be reliably detected.
  • the pattern 2 has a periodic pattern pattern which is pronounced in two different directions, see above the phase position of a point of the surface 3 can be evaluated in two different directions.
  • the exemplary image 5 recorded on an optimally planar surface by the camera 1 in FIG. 2 exemplifies a two-dimensional sine-brightness curve as a gray-scale curve, which is formed by an additive superimposition of sinusoidal curves in two orthogonal directions spanning the pattern 2.
  • a two-dimensional sine-brightness curve as a gray-scale curve, which is formed by an additive superimposition of sinusoidal curves in two orthogonal directions spanning the pattern 2.
  • the particular advantage of the procedure according to the invention is that, due to the pattern having a periodic pattern course in two directions, the structural information required for determining the surface 3 by means of deflectometry is possible in a single image of the pattern depicted on the surface 3 2 to generate. As a result, an application of the method is particularly well possible even with moving objects.
  • FIG. 3 shows the receptacle 6 of the pattern 2 on the surface 3, which has a color and / or brightness-changing error 8.
  • this error 9 can be identified and identified with the error 8 in the image 6 of the pattern 2. This makes it possible to superimpose both images arithmetically and to calculate the surface aberration 8 during the evaluation of the recorded image 6 with the pattern 2 shown on the surface 3.
  • Unstructured illumination can be easily achieved, for example, by the fact that the pattern generator 9 is a screen capable of outputting a correspondingly generated pattern 2 as a static area image.
  • Another image can be, for example, simply a white or correspondingly colored screen without structure, which then leads to a recording of the image 7 of the structurelessly illuminated surface 3.
  • This has the advantage that in each case the same illumination is used in the same arrangement for generating the pattern image 6 and the image without structure 7.
  • the Lighting also a monochromatic, preferably colorless or white surface are used, on which the static pattern 6 is projected switchable.
  • the inventively proposed sensor can be designed primarily for use on a handling device or robot.
  • surfaces of even larger objects with specular or semi-reflective surfaces 3 can be scanned, e.g. Vehicle bodies or parts thereof, aircraft or aircraft parts, wind turbine blades, turbine blades, sanitary objects such as bathtubs, toilets, large panels, e.g. for buildings or large machines, white goods such as Refrigerators, washing machines or the like.
  • a second conceivable form of a sensor according to the invention is a line camera and a correspondingly extensively shaped, statically luminous pattern surface.
  • This pattern surface is formed in the same way two-dimensional, as described above, but only very narrow transversely to the line direction of the camera. Again, all the variations described above are conceivable again.
  • This form is mainly suitable for inspection or measurement of reflective or semi-reflective web material, such as glass, metal sheet, ceramic, but in principle can also be used on the handling device or robot.
  • FIG. 5 shows a picture taken with a pattern 6 imaged on the surface, with a pattern imaged on the surface.

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  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

L'invention concerne un procédé et un capteur servant à déterminer la surface (3) d'un objet par déflectométrie, lesquels permettent de représenter un motif connu (2) sur une surface (3) de l'objet et de l'enregistrer au moyen d'une caméra étalonnée (1). Les écarts du motif (2), enregistré au moyen de la caméra (1), par rapport au motif connu (2) sont évalués pour déterminer la surface, le motif (2) ayant une allure périodique, la phase du motif (2) étant déterminée en pixels et les écarts par rapport à la structure périodique du motif (2) étant utilisés pour déterminer la surface (3) par détermination de la topographie de la surface (3) à partir du motif connu (2) et des propriétés de représentation connues de la caméra étalonnée (1). Selon l'invention, l'objet est déplacé par rapport au motif représenté (2) et à la caméra (1) et, pour déterminer une région de la surface (3) de l'objet dans une position de l'objet par rapport à la caméra (1) et au motif représenté (2), seules des images (5, 6), enregistrées à un instant, de cette région de la surface (3), sont évaluées.
PCT/EP2015/059685 2014-05-05 2015-05-04 Procédé et capteur servant à déterminer la surface d'un objet par déflectométrie WO2015169730A1 (fr)

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DE102014106238.8A DE102014106238A1 (de) 2014-05-05 2014-05-05 Verfahren und Sensor zur Bestimmung der Oberfläche eines Objekts mittels Deflektometrie
DE102014106238.8 2014-05-05

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US10921118B2 (en) 2016-07-27 2021-02-16 Vehicle Service Group, Llc Hybrid 3D optical scanning system
US11619485B2 (en) 2016-07-27 2023-04-04 Vehicle Service Group, Llc Hybrid 3D optical scanning system
WO2018077356A1 (fr) * 2016-10-24 2018-05-03 Micro-Epsilon Messtechnik Gmbh & Co. Kg Plaque de référence et procédé pour calibrer et/ou vérifier un système de détection par déflectométrie
US11092432B2 (en) 2016-10-24 2021-08-17 Micro-Epsilon Messtechnik Gmbh & Co. Kg Reference plate and method for calibrating and/or checking a deflectometry sensor system
WO2019147390A3 (fr) * 2018-01-26 2020-04-02 Vehicle Hail Scan Systems, Llc Système de balayage de surface de véhicule
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US12079980B2 (en) 2018-07-24 2024-09-03 Glasstech, Inc. System and method for measuring a surface in contoured glass sheets
CN113383207A (zh) * 2018-10-04 2021-09-10 杜·普雷兹·伊萨克 光学表面编码器
US20230083039A1 (en) * 2019-06-11 2023-03-16 Micro-Epsilon Messtechnik Gmbh & Co. Kg Method and system for optically measuring an object having a specular and/or partially specular surface and corresponding measuring arrangement
US11574395B2 (en) 2020-11-25 2023-02-07 Vehicle Service Group, Llc Damage detection using machine learning
US11867630B1 (en) 2022-08-09 2024-01-09 Glasstech, Inc. Fixture and method for optical alignment in a system for measuring a surface in contoured glass sheets

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