WO2015159419A1 - Flat panel display glass substrate, method for manufacturing same, and liquid crystal display - Google Patents
Flat panel display glass substrate, method for manufacturing same, and liquid crystal display Download PDFInfo
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- WO2015159419A1 WO2015159419A1 PCT/JP2014/061006 JP2014061006W WO2015159419A1 WO 2015159419 A1 WO2015159419 A1 WO 2015159419A1 JP 2014061006 W JP2014061006 W JP 2014061006W WO 2015159419 A1 WO2015159419 A1 WO 2015159419A1
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09F—DISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
- G09F9/00—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/133302—Rigid substrates, e.g. inorganic substrates
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- FIG. 4 is a diagram schematically illustrating an example of a glass plate manufacturing apparatus that performs the melting step (ST1) to the cutting step (ST7) in the present embodiment.
- the apparatus mainly includes a melting apparatus 100, a molding apparatus 200, and a cutting apparatus 300.
- the melting apparatus 100 includes a melting furnace 101, a clarification pipe (clarification tank body) 102, a stirring tank 103, and glass supply pipes 104, 105, and 106.
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Abstract
Description
これに対し、異物等の透光性を有しない内部欠陥に関しては、依然として厳しい基準が適用されており、特に液晶ディスプレイ用ガラス基板にあっては、ガラス基板中に所定のサイズを超える大きさの内部欠陥が存在する場合、不良品と判別される。 However, when the internal defect is a bubble that does not block light, a determination method that does not determine that the glass substrate is defective even if the glass substrate has an internal defect has been proposed. (See Patent Document 1).
On the other hand, strict standards are still applied to internal defects that do not have translucency, such as foreign matter, and particularly in glass substrates for liquid crystal displays, the glass substrate has a size exceeding a predetermined size. When an internal defect exists, it is determined as a defective product.
本発明者は、以上の知見に基づき、本発明を完成させた。 As a result of diligent study, the present inventor, for example, in a high-contrast liquid crystal display such as an IPS (In-Place-Switching) method, a VA (Virtical Alignment) method, etc. It has been found that the protrusions on the main surface of the substrate greatly affect the quality of the display. At this time, even if the internal defect does not have translucency, and the long side length of the internal defect exceeds 50 μm, the short side length is less than 5 μm, and the convex portion due to the internal defect is The present inventors have found that the glass substrate can be used for a high-quality display if it is not formed at a predetermined height or more on the main surface of the glass substrate. More specifically, even when the convex portion exists on the glass substrate, if the convex portion has a height of less than 0.15 μm, the convex portion is used as the surface on the device forming side. Also found that there is no problem in quality.
The present inventor completed the present invention based on the above findings.
ガラス基板であって、
長辺長さが50μmを超え、短辺長さが5μm未満である遮光性の内部欠陥と、
前記内部欠陥の位置に対応する前記ガラス基板の主表面上の位置に形成され、前記主表面からの高さが0.15μm未満である凸部と、を有するガラス基板を、フラットパネルディスプレイガラス基板として用いることを特徴とする。 That is, the glass substrate for flat panel display according to one embodiment of the present invention is
A glass substrate,
A light-shielding internal defect having a long side length of more than 50 μm and a short side length of less than 5 μm;
A glass substrate having a convex portion formed at a position on the main surface of the glass substrate corresponding to the position of the internal defect and having a height of less than 0.15 μm from the main surface, a flat panel display glass substrate It is used as.
また、内部欠陥がガラス基板の主表面近傍に存在すると、ガラス基板の主表面には凸部が形成されやすい。
特に、所定の大きさを超える遮光性の内部欠陥に起因して主表面に凸部が形成されたガラス基板は、高コントラストなディスプレイに用いられると品質面で問題が生じるとして、一律に不良品と判別されていた。しかし、長辺長さが50μmを超え、短辺長さが5μm未満である内部欠陥に起因して形成される凸部がガラス基板の主表面に存在する場合であっても、凸部のガラス基板の主表面からの高さが0.15μm未満である場合には、高コントラストなディスプレイに用いても問題が生じないことも分かった。
そこで、本発明では、従来、製品として品質上問題とならないにも関わらず、上記のような内部欠陥が存在するという理由だけで不良品として扱われていたガラス基板を製品として用いることができるようにし、ガラス基板製造の歩留まりを改善している。 If a light-blocking internal defect exists in the glass, a display quality problem may occur due to a lack of display pixels.
Further, when the internal defect exists in the vicinity of the main surface of the glass substrate, convex portions are easily formed on the main surface of the glass substrate.
In particular, glass substrates with convex portions formed on the main surface due to light-blocking internal defects exceeding a predetermined size will cause problems in terms of quality when used in high-contrast displays. It was determined. However, even if a convex portion formed due to an internal defect having a long side length of more than 50 μm and a short side length of less than 5 μm exists on the main surface of the glass substrate, the glass of the convex portion It has also been found that when the height from the main surface of the substrate is less than 0.15 μm, no problem occurs even when used for a high-contrast display.
Therefore, in the present invention, it is possible to use a glass substrate that has been treated as a defective product just because there is an internal defect as described above, even though it does not cause quality problems as a product. Thus, the yield of glass substrate manufacturing is improved.
前記凸部の前記主表面からの高さが0.10μm未満であり、
前記内部欠陥が、前記主表面から50μm未満の深さ領域に存在してもよい。
内部欠陥の長辺長さが200μm以下であり、また、短辺長さが1μm~10μmの内部欠陥は長辺長さが50μmを超える大きさであっても、肉眼では存在していることが分かりにくい。そこで、ここでは、このようなサイズの内部欠陥を有するガラス基板を対象としている。
また、前記内部欠陥の長辺長さが50μmを超え80μm未満であり、短辺長さが1μm未満であってもよい。 The internal defect has a long side length of 200 μm or less, a short side length of 1 μm or more,
The height of the convex part from the main surface is less than 0.10 μm;
The internal defect may exist in a depth region of less than 50 μm from the main surface.
The internal defect has a long side length of 200 μm or less, and an internal defect having a short side length of 1 μm to 10 μm may exist with the naked eye even if the long side length exceeds 50 μm. Confusing. Therefore, here, a glass substrate having an internal defect of such a size is targeted.
The long side length of the internal defect may be more than 50 μm and less than 80 μm, and the short side length may be less than 1 μm.
ガラス基板の主表面の凸部は、内部欠陥がガラス基板の主表面に近い部分にあるほど、主表面からの高さが大きくなり、その分、ディスプレイの品質に影響を与えやすくなる。しかし、本発明のガラス基板では、そのような場合でも、上記所定の条件を満たせば、製品として用いることができる。
また、前記内部欠陥の長辺長さが50μmを超え80μm未満であり、短辺長さが1μm未満であってもよい。 The internal defect may exist in a depth region of less than 50 μm from the main surface.
The convex portion of the main surface of the glass substrate has a higher height from the main surface as the internal defect is closer to the main surface of the glass substrate, and accordingly, the display quality is more likely to be affected. However, the glass substrate of the present invention can be used as a product even in such a case as long as the predetermined condition is satisfied.
The long side length of the internal defect may be more than 50 μm and less than 80 μm, and the short side length may be less than 1 μm.
上述のフラットパネルディスプレイ用ガラス基板を用いた液晶ディスプレイであって、
前記ガラス基板の一方の主表面にカラーフィルタ又はTFTデバイスが形成され、前記主表面側に液晶層が形成されていることを特徴とする。 A liquid crystal display according to one embodiment of the present invention is provided.
A liquid crystal display using the glass substrate for flat panel display described above,
A color filter or a TFT device is formed on one main surface of the glass substrate, and a liquid crystal layer is formed on the main surface side.
ガラス基板製造工程と、前記ガラス基板製造工程で製造されたガラス基板を検査するガラス基板検査工程と、を備え、
前記ガラス基板検査工程では、透光性を有さず、長辺長さが50μmを超え、短辺長さが5μm未満である内部欠陥を有し、前記内部欠陥の位置に対応する前記ガラス基板の主表面上の位置に形成され、前記主表面からの高さが0.15μm以上である凸部を有するガラス基板、を不良と判別することを特徴とする。
この方法によれば、透光性を有しない所定サイズを超える大きさの内部欠陥を有していても、高コントラストなフラットパネルディスプレイに用いることが可能なガラス基板を選別できる。これにより、製品歩留まりが良くなる。 A method for producing a glass substrate for a flat panel display according to another embodiment of the present invention,
A glass substrate manufacturing process, and a glass substrate inspection process for inspecting the glass substrate manufactured in the glass substrate manufacturing process,
In the glass substrate inspecting step, the glass substrate does not have translucency, has an internal defect having a long side length of more than 50 μm and a short side length of less than 5 μm, and corresponds to the position of the internal defect. A glass substrate having a convex portion which is formed at a position on the main surface and has a height from the main surface of 0.15 μm or more is determined to be defective.
According to this method, a glass substrate that can be used for a high-contrast flat panel display can be selected even if it has an internal defect with a size exceeding a predetermined size that does not have translucency. This improves the product yield.
前記内部欠陥は、線状白金であってもよい。 The internal defect may have a long side length of more than 50 μm and less than 80 μm, and a short side length of less than 1 μm.
The internal defect may be linear platinum.
図1に、本発明の一実施形態によるガラス基板1の厚み方向断面図を示す。
まず、ガラス基板1の概略を説明する。
ガラス基板1の厚さは、0.1~1.5mmであり、好ましい厚さの上限値は、1.1mm、0.7mm、0.5mmであり、最も好ましい上限値は0.4mmである。一方、好ましい厚さの下限値は、0.2mmである。
ガラス基板1のサイズは、500~2500mm×2500~3500mm(短手方向長さ×長手方向長さ)である。 (Glass substrate)
FIG. 1 shows a sectional view in the thickness direction of a
First, the outline of the
The thickness of the
The size of the
透光性を有しない内部欠陥10とは、ガラス基板1中に存在する遮光性の欠陥をいう。ガラス基板1の主表面3にその一部が現れているものは、内部欠陥10には含まれない。内部欠陥10は、本実施形態では、断面が円形又は三角形などの線状白金である。線状白金は、ガラス基板の製造時に、白金又は白金合金製の清澄槽等の装置から熔融ガラス中に落下して混入したと考えられている、細長く断面が多角形の白金異物である。ガラス基板中では、ガラス基板の製造工程中、熔融ガラスが一方向に流れることで複数の線状白金は一方向に向きを揃えている。具体的には、図1に示す細長い線状白金の長辺の向きは、後述する図4に示す成形装置200を流れるシートガラスの流れる方向(図4中の矢印方向)に揃っている。 In FIG. 1, the
The
長辺長さL2が50μmを超える大きさの内部欠陥10に起因して、主表面3に凸部7(後述)が形成されたガラス基板1は、IPS方式、VA方式の高コントラストの液晶ディスプレイ等に用いられた場合に、ディスプレイの品質(視認可能な表示ムラ、画素欠けなど)に問題を生じさせる可能性がある。しかし、そのような内部欠陥10が存在する場合であっても、その短辺長さL1が5μm未満であり、凸部の形状が15μm未満であれば、凸部が遮光性の内部欠陥に起因するものであっても、高コントラストのディスプレイに用いても品質上問題が生じない。 The
Due to the
別の好ましい態様として、内部欠陥10の形状に関して、内部欠陥10の長辺長さL2が50μmを超え80μm未満であり、短辺長さL1が1μm未満である。短辺長さL1は、例えば0.1μm以上である。この場合、凸部7の主表面からの突出高さが0.15μm未満である。このような内部欠陥10及び凸部7があっても、高コントラストのディスプレイに用いても品質上全く問題が生じない。 In the present embodiment, the
As another preferable aspect, regarding the shape of the
本願発明者は、ガラス基板の内部に遮光性の内部欠陥が存在することにより主表面に凸部が形成された場合には、内部欠陥近傍のガラスの状態が泡などの内部欠陥の場合と異なるため、ディスプレイ表示品質への影響がより顕著に現れると考えている。遮光性の内部欠陥がディスプレイ表示品質に影響する理由の一つとして、遮光性の内部欠陥が形成されガラス基板中に存在することが内部欠陥近傍のガラスの状態(例えば、密度)に微小な影響を与え、このことが上記した液晶の駆動や、凸の形状と合わさって、また、光の透過量の減少も合わさって、ディスプレイの表示品質に顕著に影響を与えること、が考えられている。
本発明は、このような品質に影響を与える内部欠陥が存在していたとしても、高コントラストの液晶ディスプレイに採用できるガラス基板を特定するものである。 In particular, the
The inventor of the present application, when a convex portion is formed on the main surface due to the presence of light-blocking internal defects inside the glass substrate, the state of the glass near the internal defects is different from the case of internal defects such as bubbles. For this reason, it is considered that the influence on the display display quality appears more remarkably. One reason why light-blocking internal defects affect display quality is that the presence of light-blocking internal defects in the glass substrate has a small effect on the state of glass near the internal defects (for example, density). It is conceivable that this, when combined with the driving of the liquid crystal and the convex shape described above, and the reduction in the amount of light transmission, significantly affect the display quality of the display.
The present invention specifies a glass substrate that can be employed in a high-contrast liquid crystal display even if such internal defects affecting quality are present.
また、内部欠陥10は、ガラス基板1中に、複数存在してもよい。凸部7は、ガラス基板の主表面に複数あってもよい。 In other embodiments, the
A plurality of
次に、ガラス基板の製造方法について説明する。
図3に、ガラス基板の製造方法のフローの一例を説明する図を示す。
本発明のガラス基板の製造方法は、ガラス基板製造工程と、検査工程(ステップS100)と、を備える。 (Glass substrate manufacturing method)
Next, the manufacturing method of a glass substrate is demonstrated.
In FIG. 3, the figure explaining an example of the flow of the manufacturing method of a glass substrate is shown.
The manufacturing method of the glass substrate of this invention is equipped with a glass substrate manufacturing process and an inspection process (step S100).
熔解工程(ST1)は熔解炉で行われる。熔解炉では、ガラス原料を、熔解炉に蓄えられた熔融ガラスの液面に投入し、加熱することにより熔融ガラスを作る。さらに、熔解炉の内側側壁の1つの底部に設けられた流出口から下流工程に向けて熔融ガラスを流す。
なお、ガラス原料には清澄剤が添加される。環境負荷低減の点から、清澄剤として酸化錫を用いることが好ましい。 The glass substrate manufacturing process includes a melting process (ST1), a clarification process (ST2), a homogenization process (ST3), a supply process (ST4), a molding process (ST5), a slow cooling process (ST6), Cutting step (ST7). In addition to this, there are a grinding process, a polishing process, a cleaning process, and the like.
The melting step (ST1) is performed in a melting furnace. In a melting furnace, a glass raw material is put into a liquid surface of molten glass stored in a melting furnace and heated to make molten glass. Furthermore, molten glass is flowed toward the downstream process from the outlet provided in one bottom part of the inner side wall of the melting furnace.
A clarifier is added to the glass raw material. From the viewpoint of reducing environmental burden, it is preferable to use tin oxide as a fining agent.
成形工程(ST5)では、熔融ガラスをシートガラスに成形し、シートガラスの流れを作る。成形は、オーバーフローダウンドロー法が用いられる。
徐冷工程(ST6)では、成形されて流れるシートガラスが所望の厚さになり、内部歪が生じないように、さらに、反りが生じないように冷却される。 In the molding apparatus, a molding step (ST5) and a slow cooling step (ST6) are performed.
In the forming step (ST5), the molten glass is formed into a sheet glass to make a flow of the sheet glass. For forming, an overflow downdraw method is used.
In the slow cooling step (ST6), the sheet glass that has been formed and flowed is cooled to a desired thickness, so that internal distortion does not occur and warpage does not occur.
SiO2 55~75モル%、
Al2O3 5~20モル%、
B2O3 0~15モル%、
RO:5~20モル%(RはMg、Ca、Sr及びBaのうち、ガラス基板に含まれる全元素)、
R’ 2O:0~0.8モル%(R’はLi、K、及びNaのうち、ガラス基板に含まれる全元素)。
上記ガラスは、高温粘性が高いガラスの一例である。このようなガラスにおいて、清澄管102において適正な熔融ガラスの粘度で脱泡を行うために熔融ガラスを高温に加熱する。清澄剤として酸化錫を含み、粘度が102.5ポアズ(1ポアズ=0.1Pa・秒)であるときの熔融ガラスの温度は、例えば1500~1700℃であり、清澄管102の内部における溶融ガラス温度は1600℃以上となるよう加熱される。このため、清澄管102の内壁から揮発物は多量に揮発し、揮発物の凝集(析出)が生じるおそれがある。
なお、清澄管102の内部の気相空間に窒素などの不活性ガスを供給することで、清澄管102の内部の気相空間の酸素濃度(気相空間内の酸素分圧)を、少なくとも大気での酸素濃度未満に下げて揮発量を低減すること、また、清澄管102の内部壁面(気相空間にさらされた壁面)における温度差を低減すること(例えば、気相空間が連通した清澄管102内において、温度差を150℃以下にする)で、揮発した白金の析出を抑制することが行われているが、長期にわたる操業中には、操業条件が崩れてしまい、白金の揮発・凝集(析出)による内部異物を発生させてしまう場合がある。この場合、上述した内部欠陥10及び凸部7をガラス基板が有することは避けられない。 As a glass substrate produced with the
SiO 2 55-75 mol%,
Al 2 O 3 5-20 mol%,
B 2 O 3 0-15 mol%,
RO: 5 to 20 mol% (R is all elements contained in the glass substrate among Mg, Ca, Sr and Ba),
R ′ 2 O: 0 to 0.8 mol% (R ′ is all elements contained in the glass substrate among Li, K, and Na).
The glass is an example of a glass having a high temperature viscosity. In such a glass, the molten glass is heated to a high temperature in order to perform defoaming with an appropriate viscosity of the molten glass in the fining
By supplying an inert gas such as nitrogen to the gas phase space inside the
不良品であるか否かの判別は、具体的には、透光性を有さず、長辺長さが50μmを超え、好ましくは50μmを超え80μm未満であり、短辺長さが5μm未満、好ましくは1μm未満である内部欠陥を有し、かつ、ガラス板が延在する方向における内部欠陥の位置と対応するガラス板の主表面の位置に主表面からの高さが0.15μm以上の凸部を有するガラス板を不良と判別することにより行われる。ガラス板に内部欠陥が存在することは、自動検査装置、又は検査員によって判断される。透光性を有しない内部欠陥が存在すると判断られたガラス板は、例えば、レーザ顕微鏡を用いて、内部欠陥の長辺長さおよび短辺長さ、凸部の高さおよび深さが測定される。
ガラス基板の製造方法は、以上の工程の他、梱包工程を有し、梱包工程で積層された複数のガラス基板は、納入先の業者に搬送される。 Returning to the description of the method for manufacturing the glass substrate, in the inspection step (ST8), the presence or absence of defects such as bubbles is inspected, and then a glass plate that has passed the inspection is packed as a final product. In addition, in the inspection step (ST8), in addition to the presence or absence of defects, the internal defects that do not have translucency and the size of the projections formed on the main surface of the glass plate are inspected to determine whether or not the glass plate is defective. Is determined.
Specifically, the determination as to whether or not the product is defective is not translucent, and the long side length exceeds 50 μm, preferably exceeds 50 μm and is less than 80 μm, and the short side length is less than 5 μm. The height from the main surface is preferably 0.15 μm or more at the position of the main surface of the glass plate corresponding to the position of the internal defect in the direction in which the glass plate extends, preferably having an internal defect of less than 1 μm. This is done by discriminating a glass plate having a convex portion as defective. The presence of internal defects in the glass plate is determined by an automatic inspection device or an inspector. For a glass plate that is determined to have an internal defect that does not have translucency, the long side length and short side length of the internal defect and the height and depth of the convex portion are measured using, for example, a laser microscope. The
The glass substrate manufacturing method includes a packaging process in addition to the above processes, and the plurality of glass substrates stacked in the packaging process are transported to a supplier.
透光性を有しない内部欠陥として線状白金を有するガラス基板のサンプルを、オーバーフローダウンドロー法により製造されたガラス基板から選別し、実施例1として、線状白金異物サイズが、長辺長さ52~200μmであり、短辺長さ1~4μm、かつ線状白金に起因する凸部高さが0.03~0.14μmの主表面状態を有するガラス基板を複数枚取得した。そして、図2に示す構造と同様のIPS方式の液晶ディスプレイを複数作製した。ガラス基板のサンプルは、カラーフィルタ側の基板として、凸部を液晶層20側に向けて配した。なお、TFT側には、別途作成した、内部欠陥および凸部を有しないガラス基板を配した(実施例1)。
さらに、実施例1と同様に、透光性を有しない内部欠陥として線状白金を有するガラス基板のサンプルを、オーバーフローダウンドロー法により製造されたガラス基板から選別し、実施例2として、線状白金異物サイズが、長辺長さ52~78μmであり、短辺長さ0.1μm~0.98μm未満、かつ線状白金に起因する凸部高さが0.03~0.14μmの主表面状態を有するガラス基板を複数枚取得した。さらに、実施例1と同様に、IPS方式の液晶ディスプレイを複数作製した。ガラス基板のサンプルは、カラーフィルタ側の基板として、凸部を液晶層20側に向けて配した。なお、TFT側には、別途作成した、内部欠陥および凸部を有しないガラス基板を配した(実施例2)。
また、実施例1,2のガラス基板のサンプルに代えて、凸部の高さが0.15μm、0.25μmであるガラス基板のサンプル、内部欠陥の短辺長さが5μm、10μmであるガラス基板のサンプルを用いて、それぞれ、液晶ディスプレイを作成した(比較例1~4)。
さらに、凸部の高さが0.15μm~0.2μmであり、内部欠陥の短辺長さが0.1~1μmであり、長辺長さが52~78μmであるガラス基板のサンプルを用いて、液晶ディスプレイを作製した(比較例5)。
なお、いずれのガラス基板においても、線状白金は主表面から50μm未満の深さに存在した。線状白金の位置がもう一方の表面側に存在する場合、パネル形成後のガラス基板のスリミング時に表面に現れる問題がある。このため、オーバーフローダウンドロー法により製造されたガラス基板において、線状白金が存在する場合には、裏面側に存在しないことが好ましい。
なお、上記液晶ディスプレイは、正面コントラストが3000:1のコントラスト比となるよう設計をした。 (Experimental example)
A sample of a glass substrate having linear platinum as an internal defect having no translucency is selected from a glass substrate manufactured by an overflow down draw method. As Example 1, the size of the linear platinum foreign matter has a long side length. A plurality of glass substrates having a main surface state of 52 to 200 μm, a short side length of 1 to 4 μm, and a convex part height due to linear platinum of 0.03 to 0.14 μm were obtained. A plurality of IPS liquid crystal displays having the same structure as that shown in FIG. The sample of the glass substrate was arranged with the convex portion facing the
Further, as in Example 1, a sample of a glass substrate having linear platinum as an internal defect that does not have translucency is selected from a glass substrate manufactured by an overflow down draw method. The main surface of the platinum foreign matter has a long side length of 52 to 78 μm, a short side length of 0.1 μm to less than 0.98 μm, and a convex height due to linear platinum of 0.03 to 0.14 μm. A plurality of glass substrates having a state were obtained. Further, in the same manner as in Example 1, a plurality of IPS liquid crystal displays were manufactured. The sample of the glass substrate was arranged with the convex portion facing the
Moreover, it replaced with the sample of the glass substrate of Example 1, 2, the sample of the glass substrate whose convex part height is 0.15 micrometer and 0.25 micrometer, and the glass whose short side length of an internal defect is 5 micrometers and 10 micrometers. A liquid crystal display was prepared using each sample of the substrate (Comparative Examples 1 to 4).
Further, a glass substrate sample in which the height of the convex portion is 0.15 μm to 0.2 μm, the short side length of the internal defect is 0.1 to 1 μm, and the long side length is 52 to 78 μm is used. Thus, a liquid crystal display was produced (Comparative Example 5).
In any glass substrate, linear platinum was present at a depth of less than 50 μm from the main surface. When the position of the linear platinum exists on the other surface side, there is a problem that it appears on the surface during slimming of the glass substrate after the panel is formed. For this reason, in the glass substrate manufactured by the overflow down draw method, when linear platinum exists, it is preferable not to exist in the back surface side.
The liquid crystal display was designed so that the front contrast was a contrast ratio of 3000: 1.
ガラス基板のサンプルの凸部は、自動検査機に蓄積された欠陥データに基づいて、サンプルの主表面における水平方向位置が特定される。また、内部欠陥の長辺長さL2および短辺長さL1、および凸部の高さhおよび深さDは、レーザ顕微鏡を用いて2400倍の倍率にて測定した。測定結果を、表1に示す。 (Measurement of internal defects and protrusions)
As for the convex part of the sample of the glass substrate, the horizontal position on the main surface of the sample is specified based on the defect data accumulated in the automatic inspection machine. Further, the long side length L2 and short side length L1 of the internal defect and the height h and depth D of the convex part were measured at a magnification of 2400 times using a laser microscope. The measurement results are shown in Table 1.
暗室内で、輝度計BM-5A(トプコン社製)を用いて、液晶ディスプレイの黒表示状態および白表示状態での正面輝度を測定し、正面コントラストを算出して確認を行った。 (Front contrast)
In a dark room, a luminance meter BM-5A (manufactured by Topcon Corporation) was used to measure the front luminance in the black display state and the white display state of the liquid crystal display, and the front contrast was calculated for confirmation.
作成した液晶ディスプレイに電圧をかけて液晶を駆動し、液晶ディスプレイの正面および斜め方向から、液晶ディスプレイから所定距離だけ離れた位置で目視により、白表示から黒表示、および黒表示から白表示にかけて表示ムラが全く確認されなかったものをA(使用可能)、表示ムラが確認されたものをB(不良品)、と評価した。表示ムラは、限度サンプルとの対比により判定を行う。結果を、表1に示す。 (Display unevenness of display)
Drive the liquid crystal by applying voltage to the created liquid crystal display, and display from white display to black display and from black display to white display by visual observation at a predetermined distance from the liquid crystal display from the front and oblique directions of the liquid crystal display The case where no unevenness was confirmed was evaluated as A (usable), and the case where display unevenness was confirmed was evaluated as B (defective product). Display unevenness is determined by comparison with a limit sample. The results are shown in Table 1.
3 ガラス基板の主表面
7 凸部
10 内部欠陥
h 凸部の高さ
D 内部欠損のガラス基板の主表面からの深さ領域
L1 内部欠陥の短辺長さ
L2 内部欠陥の長辺長さ 1 Glass substrate (flat display glass substrate)
3
Claims (9)
- ガラス基板であって、
透光性を有さず、長辺長さが50μmを超え、短辺長さが5μm未満である内部欠陥と、
前記内部欠陥の位置に対応する前記ガラス基板の主表面上の位置に形成され、前記主表面からの高さが0.15μm未満である凸部と、を有するガラス基板を、フラットパネルディスプレイガラス基板として用いることを特徴とするフラットパネルディスプレイ用ガラス基板。 A glass substrate,
An internal defect having no translucency, a long side length of more than 50 μm, and a short side length of less than 5 μm;
A glass substrate having a convex portion formed at a position on the main surface of the glass substrate corresponding to the position of the internal defect and having a height of less than 0.15 μm from the main surface, a flat panel display glass substrate A glass substrate for a flat panel display, characterized by being used as: - 前記内部欠陥の長辺長さが200μm以下であり、短辺長さが1μm以上であり、
前記凸部の前記主表面からの高さが0.10μm未満であり、
前記内部欠陥が、前記主表面から50μm未満の深さ領域に存在する、請求項1に記載のフラットパネルディスプレイ用ガラス基板。 The internal defect has a long side length of 200 μm or less, a short side length of 1 μm or more,
The height of the convex part from the main surface is less than 0.10 μm;
The glass substrate for a flat panel display according to claim 1, wherein the internal defect exists in a depth region of less than 50 μm from the main surface. - 前記内部欠陥の長辺長さが50μmを超え80μm未満であり、短辺長さが1μm未満である、請求項1に記載のフラットパネルディスプレイ用ガラス基板。 The glass substrate for a flat panel display according to claim 1, wherein the internal defect has a long side length of more than 50 µm and less than 80 µm and a short side length of less than 1 µm.
- 前記内部欠陥が、線状白金である、請求項1~3のいずれか1項に記載のフラットパネルディスプレイ用ガラス基板。 The glass substrate for a flat panel display according to any one of claims 1 to 3, wherein the internal defect is linear platinum.
- 請求項1~4のいずれか1項に記載された前記フラットパネルディスプレイ用ガラス基板を用いた液晶ディスプレイであって、
前記ガラス基板の一方の主表面にカラーフィルタ又はTFTデバイスが形成され、前記主表面側に液晶層が設けられていることを特徴とする液晶ディスプレイ。 A liquid crystal display using the flat panel display glass substrate according to any one of claims 1 to 4,
A liquid crystal display, wherein a color filter or a TFT device is formed on one main surface of the glass substrate, and a liquid crystal layer is provided on the main surface side. - 2000:1以上のコントラスト比を有する、請求項5に記載の液晶ディスプレイ。 The liquid crystal display according to claim 5, which has a contrast ratio of 2000: 1 or more.
- ガラス基板を製造するガラス基板製造工程と、前記ガラス基板製造工程で製造されたガラス基板を検査するガラス基板検査工程と、を備え、
前記ガラス基板検査工程では、透光性を有さず、長辺長さが50μmを超え、短辺長さが5μm未満である内部欠陥を有し、かつ、前記内部欠陥の位置に対応する前記ガラス基板の主表面上の位置に形成され、前記主表面からの高さが0.15μm以上である凸部を有するガラス基板、を不良と判別することを特徴とするフラットパネルディスプレイ用ガラス基板の製造方法。 A glass substrate manufacturing process for manufacturing a glass substrate, and a glass substrate inspection process for inspecting the glass substrate manufactured in the glass substrate manufacturing process.
In the glass substrate inspection step, the glass substrate inspection step does not have translucency, has an internal defect having a long side length of more than 50 μm and a short side length of less than 5 μm, and corresponds to the position of the internal defect. A glass substrate for a flat panel display, characterized in that a glass substrate having a convex portion formed at a position on the main surface of the glass substrate and having a height of 0.15 μm or more from the main surface is determined as defective. Production method. - 前記内部欠陥は、50μmを超え80μm未満の長辺長さを有し、1μm未満の短辺長さを有する、請求項7に記載のフラットパネルディスプレイ用ガラス基板の製造方法。 The method for producing a glass substrate for a flat panel display according to claim 7, wherein the internal defect has a long side length of more than 50 µm and less than 80 µm and a short side length of less than 1 µm.
- 前記内部欠陥が、線状白金である、請求項7または8に記載のフラットパネルディスプレイ用ガラス基板の製造方法。
The manufacturing method of the glass substrate for flat panel displays of Claim 7 or 8 whose said internal defect is linear platinum.
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