WO2015113153A1 - Scanner system and method for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test - Google Patents
Scanner system and method for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test Download PDFInfo
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- WO2015113153A1 WO2015113153A1 PCT/CA2015/050060 CA2015050060W WO2015113153A1 WO 2015113153 A1 WO2015113153 A1 WO 2015113153A1 CA 2015050060 W CA2015050060 W CA 2015050060W WO 2015113153 A1 WO2015113153 A1 WO 2015113153A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0892—Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0878—Sensors; antennas; probes; detectors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/07—Non contact-making probes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
Definitions
- the present invention relates to testing of electromagnetic compatibility and diagnosis of electromagnetic interference of electronic devices, and is particularly concerned with high-resolution spatial scanning of electromagnetic field levels generated by an electronic device under test.
- the EMC/EMI problem in the performance of electronic devices refers to the lack of electromagnetic compatibility (EMC) of device components due to electromagnetic interference (EMI) between them.
- EMC electromagnetic compatibility
- EMI electromagnetic interference
- the EMC/EMI problem involves one device component (a source) generating an electromagnetic field that propagates through a coupling path to another device component (the receiver). The electromagnetic field induces the receiver to radiate an electromagnetic field that is different from what is desired of the receiver.
- a designer or manufacturer of an electronic device may use a scanner to detect the electromagnetic field levels radiated by the electronic device.
- a spectral scan may be performed to determine electromagnetic field levels at a variety of desired frequencies.
- a spatial scan may be performed to map electromagnetic field levels at a designated frequency at different sampling locations relative to the electronic device. In this manner, a spatial scan can assist in identifying the components of the device that are responsible for an EMC/EMI problem.
- the distance between sampling locations of the spatial scan may be small relative to the size and spacing of the device components. For example, a resolution of less than a millimeter may be required to discriminate between the electromagnetic fields radiated by the miniaturized components packaged on a printed circuit board used in a compact cellular phone under test.
- decreased spacing between sampling locations increases the number of sampling locations for a given scan area and the time required to complete the spatial scan. For prior art scanners having a single probe, the probe must be moved to each and every sampling location, which can make it prohibitively time-consuming to perform a spatial scan having hundreds or thousands of sampling locations.
- the invention provides a scanner system and a method for performing a high- resolution spatial scan of an electromagnetic field radiated by an electronic device.
- the present invention comprises a scanner system operable for high- resolution spatial scanning of an electromagnetic field radiated by an electronic device under test (DUT).
- the scanner system comprises: a probe array comprising a plurality of switched probes, wherein adjacent probes are spaced apart at a separation distance; an analyzer connected to the probe array for determining the electromagnetic field level at each probe location based on a signal induced in each probe by the radiated electromagnetic field; an actuator for changing the relative position of the probe array to the DUT, from a first array position to a second array position; and a computer comprising a processor and a memory,
- the processor is operatively connected to the analyzer and the actuator, and the memory component stores a set of instructions executable by the processor to implement a method comprising the steps of:
- the scanner system further comprises a planar scan surface for placement of the DUT thereon,
- the scan surface may form the top surface of a case containing the probe array and the actuator,
- the probe array is formed as part of a printed circuit board. [0010] In one embodiment, the probes are arranged in a substantially planar array of rows and columns.
- the probes comprise a first probe and a second probe having a different polarization than the first probe.
- the position of the second probe relative to the DUT when the probe array in the second array position may be substantially the same as the position of the first probe relative to the DUT when the probe array is in the first array position.
- the distance between the first array position and the second array position is less than or substantially equal to the separation distance of the adjacent probes.
- the analyzer is a spectrum analyzer.
- the actuator moves the probe array while the DUT remains stationary. In another embodiment, the actuator moves the DUT while the probe array remains stationary.
- the actuator comprises: an elongate first track; a first sliding member movable along the first track and attached to the probe array; and a first motor in driving engagement with the first sliding member for moving the first sliding member along the first track.
- the actuator may further comprise: an elongate second track disposed at an angle to the first track; a second sliding member movable along the second track and attached to the elongate first track; and a second motor in driving engagement with the second sliding member for moving the second sliding member along the second track.
- the scanner system further comprises a signal conditioner operatively connected to the probe array and the analyzer for amplifying or attenuating the signal induced in each probe before being transmitted by the analyzer.
- the present invention comprises a method for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test (DUT).
- the method comprises the steps of:
- the DUT rests on a scan surface while the probe array is moved from the first array position to the second array position.
- the probes comprise a first probe and a second probe having a different polarization than the first probe.
- the position of the second probe relative to the DUT when the probe array in the second array position may be substantially the same as the position of the first probe relative to the DUT when the probe array is in the first array position.
- the distance between the first array position and the second array position is less than the separation distance of the adjacent probes, preferably less than or equal to one half the separation distance of adjacent probes, and more preferably less than or equal to 1.5 mm, or less than or equal to l/5 th the separation distance of adjacent probes.
- the step of measuring the electromagnetic field level in either one or both of the first array position and the second array position is performed over a range of frequencies.
- the effective resolution of the scanner system can be made less than the separation distance between the probes.
- the amount of increased resolution may be adjustable between zero and the limit of the positional accuracy of the actuator.
- the computer can substantially automate the scanning process and may interleave the datasets resulting from the scans at different positions of the probe array, and cause a display device to show the spatial distribution of electromagnetic field levels at different positions of the DUT.
- Figure 1 shows a perspective view of the exterior of one embodiment of scanner system of the present invention, with a DUT placed on the scan surface.
- Figure 2 shows an exploded perspective view of the exterior of the scanner system shown in Figure 1 , with the top part of the case removed.
- Figure 3 shows a top perspective view of the interior the scanner system shown in Figure 1 , with the top part of the case and the scan surface removed.
- Figure 4 shows a top perspective view of the interior of the scanner system shown in Figure 1 , with the top part of the case, the scan surface, the analyzer, signal conditioner and computer removed.
- Figure 5 shows a bottom perspective view of the interior of the scanner system shown in Figure 1 , with the bottom part of the case, the analyzer, signal conditioner and computer removed.
- Figure 6 shows a schematic diagram of the switched probe array and signal conditioner of one embodiment of the scanner system of the present invention.
- Figure 7 shows a portion of a probe array having square half-loop probes, in one embodiment of a scanner system of the present invention.
- Figures 8A - 8D are schematic depictions of a pattern of sampling locations for a spatial scan performed by one embodiment of the scanner system of the present invention.
- Figure 9 is a schematic depiction of the display of electromagnetic field level data corresponding to the pattern of sampling locations shown in Figure 8D.
- Figure 10 is a flow chart showing the steps of one embodiment of the method of the present invention.
- the present invention comprises a scanner system and method for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device-under-test.
- all terms not defined herein have their common art- recognized meanings.
- the following description is of a specific embodiment or a particular use of the invention, it is intended to be illustrative only, and not limiting of the claimed invention.
- the following description is intended to cover all alternatives, modifications and equivalents that are included in the spirit and scope of the invention, as defined in the appended claims.
- an “electronic device” means any device having one or more components that is capable of radiating an electromagnetic field, irrespective of power or range, and irrespective of whether such electromagnetic field is generated or induced.
- Electronic devices include, but are not limited to, printed circuit boards.
- a “device-under-test” or “DUT” means an electronic device that produces a radiated electromagnetic field to be scanned by the scanner system of the present invention.
- the scanner system of the present invention has a probe array with a plurality of spaced-apart switched probes for sensing the electromagnetic field radiated by an electronic device under test (DUT).
- An actuator or a combination of actuators, moves the probe array relative to the DUT to successive positions, which preferably are separated by distances less than or equal to the separation distance between the probes.
- the effective resolution of the scanner system may be made less than the separation distance between the probes.
- the increased resolution factor may adjustable between zero and the limit of the positional accuracy of the actuator.
- an analyzer such as a spectral analyzer, receives signals induced in the probes by the radiated electromagnetic field to determine the electromagnetic field levels.
- the scanning process can be substantially automated through the use of a computer which comprises components which controls the actuators and the analyzer, and stores data sets reflecting the position of each probe and the electromagnetic field level at each probe, at each successive position of the probe array.
- the computer may comprise components which interleave the datasets and cause a display device to display the interleaved results to show the spatial distribution of electromagnetic field levels at different positions relative to the DUT.
- the scanner system (10) comprises a case (12), a DUT holding device in the form of a scan surface (18), a probe array (20) having a plurality of switched probes, an actuator (30), a signal conditioner (40), an analyzer (50), and a computer (60).
- the actuator (30), signal conditioner (40), analyzer (50) and computer (60) are operatively connected to perform functions as described below.
- the signal conditioner (40), analyzer (50), and computer (60) are contained within the case (12).
- each of the signal conditioner (40), analyzer (50), and computer (60) may comprise components contained outside of the case (12), or components partially within the case (12) and partially outside the case (12).
- the case (12) contains the probe array (20) and the actuator (30), and may also contain the signal conditioner (40), analyzer (50) and computer (60).
- the case (12) is a box-like container, formed from a bottom part (14) and a top part (16) that may be connected together with screws or dowels that insert into aligned slots or receptacles (15) formed in the bottom part (14) and top part (16).
- the bottom and side walls of the case (12) are made of electrically non-conductive anodized aluminum.
- the top part (16) of the case (12) defines an opening (17) to reveal the scan surface (18).
- the case (12) also defines one or more ports (19) for connecting the computer (60) or other internalized components of the scanner system (10) to an external power source, externalized components of the scanner system (10), or external output devices such as another computer or a display device.
- the DUT holding device may comprise any suitable device for retaining the DUT in a stationary position relative to the probe array (20).
- the DUT holding device comprises a scan surface (18) which provides a surface onto which the DUT can be placed.
- the scan surface (18) is made of a thin, flat membrane of glass, which interferes minimally with the propagation of electromagnetic radiation.
- the glass membrane is supported on rollers (21) that can be vertically adjusted relative to the bottom part (14) of the case (12) to horizontally level the scan surface (18).
- the scan surface (18) is revealed by the top opening (17) through a glass lid of the case (12).
- the DUT holding device may comprise a stand, mount or a clamp type device.
- the probe array (20) includes a plurality of switched probes, each of which is operable to sense the electromagnetic field radiated by the DUT at different regions of the DUT.
- the probes are spaced apart at a separation distance so that each probe is adjacent to a spatially distinct position of the scan surface (18), and thus occupies a distinct position relative to the DUT when placed on the scan surface (18).
- the probes (22) of the probe array (20) are arranged in a rectangular array of equally spaced rows and columns.
- the probes (22) form a substantially planar rectangular array surface that is positioned within the case (12), beneath and substantially parallel to the scan surface (18).
- the probes may be arranged in another array configuration such as a circular arrangement.
- the probe array (20) is manufactured as part of a printed circuit board (PCB).
- the PCB has 1218 probes arranged in 29 rows and 45 columns, at a separation distance of 7.5 mm center to center, over a rectangular scan area of approximately 21.8 cm by 31.6 cm.
- these probes (22) of the PCB are connected in a tree-like structure of solid-state switches (24) that allow for rapid electronic switching on and off of the probes (22), and leads to the signal conditioner (40) that produces a single RF output (42).
- each probe (22) is a 2 mm x 2 mm square loop H-field probe.
- the size of these probes means that a great many of them can be placed is a small space creating a high density array.
- the size of these probes also means that they are not efficient radiators, so that the DUT should be placed in close proximity (typically less than 2.5 cm) to the probe array (20).
- each probe (22) is formed by a square half- loop on a printed circuit board forming the probe array (20).
- the orientation of the square half-loop of these probes (22) causes an insensitivity to magnetic fields in certain directions or polarizations, thereby creating a "blind spot" of the probe (22), which can affect scan results.
- the orientation of probes (22) in adjacent rows or columns of the probe array (20) may be different, for example, they may be shifted by 90 degrees relative to each other.
- a technique for reducing the blind spot effect using such a probe array is further described below.
- the actuator (30) may be any suitable electrically powered mechanism for either moving the probe array (20) relative to the DUT, or the DUT relative to the probe array, or both the probe array (20) and the DUT relative to each other, between a first array position and a second array position.
- the actuator (30) moves the probe array (20) while the DUT remains stationary on the scan surface (18).
- the actuator (30) comprises a cross-slide mechanism comprising first and second electrically- powered motors (31, 32), elongate first and second linear tracks (33, 34), and first and second sliding members (35, 36).
- the first track (33) is secured to the interior of the bottom part (14) of the case (12),
- the first motor (31) is in driving engagement with the first sliding member (35) to slide it along the elongate direction of the first track (33).
- the second track (34) is secured to the first sliding member (35) and, as such, slides with the first sliding member (35) along the first track (33).
- the second motor (32) is in driving engagement with the second sliding member (36) to slide it along the elongate direction of the second track (34),
- the probe array (20) is attached to the second sliding member (36), and as such slides with the second sliding member (36) along the second track (34).
- the first and second tracks (33, 34) are disposed substantially perpendicularly to each other to allow the probe array (20) to be moved independently in substantially perpendicular directions in a substantially horizontal plane so that the probe array (20) can be selectively positioned at any desired position relative to the DUT placed on the scan surface (18).
- the actuator (30) may move the DUT holding device, while the probe array (20) remains stationary.
- the actuator (30) may move both the probe array (20) and the DUT,
- the first array position and the second array position correspond to spatially distinct positions of the probe array (20) relative to the scan surface (18), such that each probe (22) of the probe array (20) projects onto a different point on the scan surface (18) when the probe array (20) is in the first array position, in comparison with when the probe array (20) is in the second array position.
- the distance between the first array position and the second array position may be selected for any desired spatial resolution.
- the first array position and the second array position are separated by a distance less than the separation distance of the probes in the probe array (20).
- the first and second array positions are separated by a distance substantially equal to the separation distance between adjacent rows or columns of probes in the probe array (20).
- the electromagnetic field at a particular spatial location of the scan surface (18) can be measured by a probe of one polarization when the probe array (20) is in the first array position, and by the adjacent probe of a different polarization when the probe array (20) is in the second array position.
- the signal conditioner (40) receives the signal induced in the probes of the probe array (20) by the electromagnetic field radiated by the DUT, prior to being transmitted to the analyzer (50),
- the signal conditioner (40) may comprise one or more amplifiers for amplifying the signal, one or more attenuators for attenuating the signal, or a combination of amplifiers and attenuators, to ensure that the signal is within the amplitude range of the analyzer (50).
- the analyzer (50) measures the electromagnetic field level radiated by the DUT at each probe location based on a signal induced in each probe (22) by the radiated electromagnetic field.
- the analyzer (50) may be a spectrum analyzer that measures the electromagnetic field levels over a range of frequencies.
- the technology of analyzers is well known to those skilled in the art and is not part of the present invention.
- Non-limiting examples of analyzers that are suitable for use with the present invention include spectrum analyzers manufactured by Agilent Technologies Canada Inc.TM (now Keysight TechnologiesTM) (Mississauga, Ontario, Canada) under the model series names PSA, PXA, MXA, CXA, EXA, N9912A, and 9918 A.
- the computer (60) includes a processor and a memory component.
- the processor is operatively connected to the actuator (30), the signal conditioner (40), and the analyzer (50).
- the memory component stores a set of instructions executable by the processor to implement a method of the present invention during the use of the scanner system (10).
- the stored instructions may be programmable by the user of the scanner system (10).
- the computer (60) has an actuator module to determine the position of the probe array (20) and to control the movement of the probe array (20) by the actuator (30).
- the actuator module controls the supply of power to the motors (31, 32), so as to move the first and second sliding members (35, 36) in small (e.g., 0.1 mm) increments along the first and second tracks (33, 34), respectively.
- the actuator module of the computer (60) may allow the user to set the spatial resolution of the scan at a desired value, or select a preset spatial resolution value such as 0.50 mm, 0.75 mm, 1.50 mm, 2.50 mm, 3.75 mm, or 7.50 mm.
- the computer (60) also has an analyzer-probe module to control the probe array (20) and the analyzer (50) to determine the level of the electromagnetic field at each probe (22) of the probe array (20).
- the analyzer-probe module electronically switches individual probes of the probe array (20) on and off in a sequential manner to determine the electromagnetic field detected by each of the probes (22).
- the analyzer-probe module of the computer (60) corrects for any losses in RF paths by de-embedding the RF path losses from the switched probe array (20) (e.g., due to the discontinuity introduced by the probe array) and transforming the conducted levels of signals from the probe array (20) in the RF paths to radiated levels of electromagnetic fields detected by the probe array (20).
- the computer (60) may be configured to process the signal data in accordance with the methods described in U.S. Patent No. 7,672,640, the entire contents of which are incorporated by reference herein, where permitted.
- the computer (60) also has a display module that controls a display device (e.g., a computer monitor) to output data from the probe-analyzer module in a human readable form.
- a display device e.g., a computer monitor
- the scanner system (10) of the present invention to perform a spatial scan of an electromagnetic field radiated by a DUT is now described through a simplified example, with reference to Figures 8A to 8D, 9 and 10.
- the positive and negative “column directions” refer to the upwards and downwards directions, respectively, while the positive and negative “row directions” refer to the rightwards and leftwards directions, respectively.
- the probe array (20) has four probes (22) in total, arranged in a planar rectangular array of 2 rows and 2 columns that are spaced apart at 7.5 mm, center to center. It will be understood that, in practice, the probe array (20) may have a much larger number of probes covering a larger scan area.
- the four dots indicate the starting positions of the four probes (22), each centered within its own cell measuring 7.5 mm x 7.5 mm,
- the user places the DUT on the scan surface (18) and powers the DUT to radiate the electromagnetic field (step 200). Once the DUT is placed on the scan surface (18), the position of the DUT remains unchanged until the spatial scan is complete. In this manner, any subsequent movement of the probe array (20) relative to the scan surface (18) will result in predictable relative movement between the probes and the DUT from a first array position to a second array position.
- the user programs the computer (60) with the desired scan resolution level, which refers to the spacing between sampling points in the spatial scan (step 210).
- the desired scan resolution level refers to the spacing between sampling points in the spatial scan.
- the user selects a scan resolution of 1.5 mm in the row direction and 1.5 mm in the column direction.
- the scan resolution need not be the same in the row and column directions.
- the user commands the computer (60) to begin the scanning process (step 220).
- the scan resolution factor in one dimension is equal to 'd/n' where 'd' is the probe separation distance, and ' ⁇ ' is the scan resolution level.
- the scan resolution factor is 7.5/1.5 in each of the row and column dimensions, and (7.5/1.5) 2 for the grid.
- the actuator module of the computer determines the pattern of sampling locations based on the selected scan resolution level (step 230).
- the first sampling location designated as position 1 1 in Figure 8B, is positioned 0.75 mm in the positive column direction and 0.75 mm in the positive row direction from the lower-left corner of the cell. This pattern of sampling locations provides an even distribution of sampling points and prevents the probes from overlapping into cells of adjacent probes.
- the actuator module of the computer (60) then controls the actuator (30) to move the probe array (20) into the first array position, as shown in Figure 8B (step 240).
- the four dots indicate the sampling locations of the four probes relative to the scan surface (18) when the probe array (20) is in the first array position.
- the computer (60) determines the position of the probes and controls the analyzer (50) to determine the electromagnetic field level at each one of the probes, based on the signal induced in that probe by the radiated electromagnetic field (step 250).
- the computer (60) stores the position of each probe and the associated determined electromagnetic field level at each probe in a first data set (step 260).
- the computer (60) repeats this process for the second through fifth array positions by moving the probe array (20) in the positive column direction as shown in Figure 8C.
- the computer (60) repeats this process for the sixth through twenty-fifth array positions by moving the probe array (20) in 1.5 mm increments in the positive row direction and in the column directions, as necessary.
- the probe array (20) is moved in both the positive and negative column directions to trace a seipentine route and thus minimize the necessary amount of movement of the probe array (20).
- the analyzer-probe module of the computer (60) For each position of the probe array (20), the analyzer-probe module of the computer (60) electronically switches on and off each of the probes in a sequential manner to determine the electromagnetic field levels at each of the probes in the probe array (20). If desired, the analyzer-probe module of the computer (60) may also de-embed the RF path losses and transform conducted signal levels to radiated levels. After the twenty-five spatial scans have been performed, the computer (60) processes the resulting twenty five data sets, by interleaving the data to make a single spatial scan having 100 sample points, i.e. 4 x (5 x 5) (step 270).
- the display module of the computer (60) may then cause an output device such as a computer monitor to graphically show the scan data.
- an output device such as a computer monitor
- the electromagnetic field levels may be displayed spatially in an array corresponding to the array of scan locations. Different ranges of electromagnetic field levels may be represented by different colors to produce a map of electromagnetic field levels for the DUT.
- the combined effect of the spatial separation of probes in the probe array (20) and the sub-spacing movement of the probe array (20) allows the scanner system (10) to reduce the scanning time by a factor of the number of probes in the probe array. Decreasing the sub-spacing movement of the probe array (20) increases the spatial resolution of the scanner system (10), but also the necessary run-time to perform a scan.
- the computer (60) may be configured to execute an algorithm to spatially interpret signal parameters between probe measurement locations. As the system moves to higher resolution scanning, these algorithms are less critical as the estimated results can be replaced by actual measurement data.
- the scanner system (100) may reduce the blind spot effect caused by any polarization of the probes, provided that the probe array (20) contains probes of differing orientations.
- the probes may be square half-loop probes with the probes originally in column "A” being shifted 90 degrees in polarity from the probes originally in column "B".
- the actuator (30) moves the probe array (20) by the separation distance of 7.5 mm in the positive row direction (step 290), so that the probes originally in column "A" are situated in column "B". Thereafter, the spatial scanning process as described above is repeated to create a "shifted" dataset for the scan locations in column "B" (step 300).
- This shifted dataset can be compared with the dataset generated prior to the shift (i.e., the "unshifted” dataset) to determine the maximum “peak hold” electromagnetic field levels at each sampling location (step 310). Since each sampling location will now have a measurement from a probe in each of the two possible planar polarizations, the peak hold from these two measurements will approximately equal to the true maximum possible signal.
- the "unshifted" and “shifted” data sets can be split with matching polarizations to create a polarized view of the electromagnetic fields (step 310),
- the algorithm is not looking for the peak signal but rather grouping all measurements together which have the same polarization, Because of the shift of one column, there will be a measurement in each of the two possible planar polarizations at each of the spatially distinct locations in the initial array position except for column "A". This first column "A" can also be measured in a different polarization if the probe array (20) is shifted to the left by the distance of one column separation from the initial location of the probe array (20).
- the display module of the computer causes a display device to display the interleaved data in a series of grid points corresponding to the different sampling locations, with color-coded regions indicating the intensity of the electromagnetic field for different frequencies, at the sampling points (step 320).
- the scan data may be processed to create a spectral-spatial span in accordance with known methods, such as the methods described in U.S. Patent no. 6,268,738, the entire contents of which are incorporated herein by reference (where permitted).
- the scanner system (10) can be used to achieve an effective resolution that is smaller than the probe separation distance. In the example described above, the scanner system (10) has an effective resolution of 1.5 mm even though the probe separation distance is 7.5 mm. Second, the effective resolution of the scanner system (10) can be varied by controlling the movement of the actuator (30). Third, the scanner system (10) may require fewer movements of the probe array (20) than there are sampling locations. In the example described above, only twenty-five moves of the probe array (20) are needed to produce a spatial scan having one hundred sampling locations. Fourth, it is unnecessary to move the probe array (20) more than the separation distance between the probes.
- the probe array (20) needs to be moved less than 7.5 mm in the column and row directions because movement beyond this range would result in redundant sampling locations. This may allow the internal actuator (30) to be kept relatively compact and may make it easier to control fine movements of the probe array (20).
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US15/111,229 US9880210B2 (en) | 2014-01-30 | 2015-01-29 | Scanner system and method for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test |
JP2016567108A JP2017508985A (en) | 2014-01-30 | 2015-01-29 | Scanner system and method for high resolution spatial scanning of electromagnetic fields emitted from an electronic device under test |
CA2936706A CA2936706A1 (en) | 2014-01-30 | 2015-01-29 | Scanner system and method for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test |
CN201580006387.4A CN105940309A (en) | 2014-01-30 | 2015-01-29 | Scanner system and method for high-resolution spatial scanning of electromagnetic field radiated by electronic device under test |
EP15743067.9A EP3100060A4 (en) | 2014-01-30 | 2015-01-29 | Scanner system and method for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test |
KR1020167023071A KR20160114636A (en) | 2014-01-30 | 2015-01-29 | Scanner system and method for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test |
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US201461933423P | 2014-01-30 | 2014-01-30 | |
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PCT/CA2015/050060 WO2015113153A1 (en) | 2014-01-30 | 2015-01-29 | Scanner system and method for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test |
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EP (1) | EP3100060A4 (en) |
JP (1) | JP2017508985A (en) |
KR (1) | KR20160114636A (en) |
CN (1) | CN105940309A (en) |
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US20230204647A1 (en) * | 2021-12-27 | 2023-06-29 | International Business Machines Corporation | Dual-sideband microwave interferometer |
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US10085162B2 (en) * | 2016-07-22 | 2018-09-25 | Ets-Lindgren, Inc. | System and method for over-the-air testing of milli-meter wave and other beamforming technologies |
US11671144B2 (en) | 2019-03-28 | 2023-06-06 | Intel Corporation | Near-field test apparatus for far-field antenna properties |
TWI806647B (en) * | 2022-06-08 | 2023-06-21 | 英業達股份有限公司 | Automatic test system and method for radio frequency and electromagnetic interference |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6268738B1 (en) | 1995-11-07 | 2001-07-31 | Emscan Corporation | Method and apparatus for high-speed scanning of electromagnetic emission levels |
WO2007112546A1 (en) * | 2006-04-05 | 2007-10-11 | Emscan Corporation | Multichannel absorberless near field measurement system |
US7672640B2 (en) | 2006-04-05 | 2010-03-02 | Emscan Corporation | Multichannel absorberless near field measurement system |
CN102162828A (en) * | 2010-12-28 | 2011-08-24 | 哈尔滨工业大学 | Device and method for qualitatively detecting PCB (printed circuit board) board electromagnetic interference radiation performance |
CN202013428U (en) * | 2010-12-24 | 2011-10-19 | 北京遥感设备研究所 | Active millimeter wave near-field scanning imaging security inspection device |
CN102565546A (en) * | 2010-12-17 | 2012-07-11 | 上海无线电设备研究所 | Electromagnetic radiation scanning and positioning method |
CN101750546B (en) * | 2009-12-28 | 2012-10-24 | 北京航空航天大学 | Self-adaptive scanning device with electromagnetic compatibility for near-field test |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2702254B2 (en) * | 1990-02-09 | 1998-01-21 | 日本電信電話株式会社 | Disturbance electromagnetic wave distribution measuring method and apparatus |
US5300879A (en) | 1990-06-18 | 1994-04-05 | Nec Corporation | Bidimensional electromagnetic emission level monitoring equipment |
JPH10104294A (en) * | 1996-09-30 | 1998-04-24 | Kyodo Kumiai Jiyointo Lab Sendai | Electromagnetic noise measuring device |
JP3163016B2 (en) * | 1996-10-14 | 2001-05-08 | 協同組合ジョイント・ラボ・仙台 | Electromagnetic noise measuring device |
JPH10260211A (en) * | 1997-03-19 | 1998-09-29 | Fujitsu Ltd | Device for measuring distribution of radiation radio wave noise |
JPH1144719A (en) * | 1997-05-30 | 1999-02-16 | Fuji Xerox Co Ltd | Electromagnetic wave measuring device |
JP4481578B2 (en) * | 2003-02-28 | 2010-06-16 | パナソニック株式会社 | Electromagnetic wave measuring apparatus and method |
WO2005085938A1 (en) * | 2004-03-05 | 2005-09-15 | Toshiba Matsushita Display Technology Co., Ltd. | Board inspecting method, array board inspecting method and array board inspecting equipment |
US8502546B2 (en) | 2006-04-05 | 2013-08-06 | Emscan Corporation | Multichannel absorberless near field measurement system |
CN101652667B (en) * | 2007-10-10 | 2013-09-04 | Emscan公司 | Multichannel absorberless near field measurement system |
EP2053764B1 (en) | 2007-10-25 | 2014-08-13 | Rohde & Schwarz GmbH & Co. KG | Method and device for transmitter calibration |
US7746266B2 (en) * | 2008-03-20 | 2010-06-29 | The Curators Of The University Of Missouri | Microwave and millimeter wave imaging system |
US8472881B2 (en) | 2009-03-31 | 2013-06-25 | Karl Frederick Scheucher | Communication system apparatus and method |
CN102056069B (en) * | 2009-10-30 | 2013-12-11 | 清华大学 | Hearing aid compatibility test method |
JP5921169B2 (en) * | 2010-12-13 | 2016-05-24 | 三菱電機株式会社 | Electromagnetic noise distribution detector |
TWI593252B (en) | 2011-12-06 | 2017-07-21 | 艾斯肯公司 | Test station for wireless devices and methods for calibration thereof |
CN104375142B (en) * | 2013-08-15 | 2019-12-13 | 同方威视技术股份有限公司 | Millimeter wave holographic imaging device for human body safety inspection |
-
2015
- 2015-01-29 WO PCT/CA2015/050060 patent/WO2015113153A1/en active Application Filing
- 2015-01-29 KR KR1020167023071A patent/KR20160114636A/en not_active Application Discontinuation
- 2015-01-29 EP EP15743067.9A patent/EP3100060A4/en not_active Withdrawn
- 2015-01-29 CA CA2936706A patent/CA2936706A1/en not_active Abandoned
- 2015-01-29 JP JP2016567108A patent/JP2017508985A/en active Pending
- 2015-01-29 TW TW104103076A patent/TW201534934A/en unknown
- 2015-01-29 CN CN201580006387.4A patent/CN105940309A/en active Pending
- 2015-01-29 US US15/111,229 patent/US9880210B2/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6268738B1 (en) | 1995-11-07 | 2001-07-31 | Emscan Corporation | Method and apparatus for high-speed scanning of electromagnetic emission levels |
WO2007112546A1 (en) * | 2006-04-05 | 2007-10-11 | Emscan Corporation | Multichannel absorberless near field measurement system |
US7672640B2 (en) | 2006-04-05 | 2010-03-02 | Emscan Corporation | Multichannel absorberless near field measurement system |
CN101750546B (en) * | 2009-12-28 | 2012-10-24 | 北京航空航天大学 | Self-adaptive scanning device with electromagnetic compatibility for near-field test |
CN102565546A (en) * | 2010-12-17 | 2012-07-11 | 上海无线电设备研究所 | Electromagnetic radiation scanning and positioning method |
CN202013428U (en) * | 2010-12-24 | 2011-10-19 | 北京遥感设备研究所 | Active millimeter wave near-field scanning imaging security inspection device |
CN102162828A (en) * | 2010-12-28 | 2011-08-24 | 哈尔滨工业大学 | Device and method for qualitatively detecting PCB (printed circuit board) board electromagnetic interference radiation performance |
Non-Patent Citations (1)
Title |
---|
See also references of EP3100060A4 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20230204647A1 (en) * | 2021-12-27 | 2023-06-29 | International Business Machines Corporation | Dual-sideband microwave interferometer |
US11946964B2 (en) * | 2021-12-27 | 2024-04-02 | International Business Machines Corporation | Dual-sideband microwave interferometer |
Also Published As
Publication number | Publication date |
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EP3100060A1 (en) | 2016-12-07 |
EP3100060A4 (en) | 2017-09-13 |
JP2017508985A (en) | 2017-03-30 |
CA2936706A1 (en) | 2015-08-06 |
US9880210B2 (en) | 2018-01-30 |
TW201534934A (en) | 2015-09-16 |
US20160334450A1 (en) | 2016-11-17 |
CN105940309A (en) | 2016-09-14 |
KR20160114636A (en) | 2016-10-05 |
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