WO2015091393A1 - Konversionselement, bauelement und verfahren zur herstellung eines bauelements - Google Patents
Konversionselement, bauelement und verfahren zur herstellung eines bauelements Download PDFInfo
- Publication number
- WO2015091393A1 WO2015091393A1 PCT/EP2014/077824 EP2014077824W WO2015091393A1 WO 2015091393 A1 WO2015091393 A1 WO 2015091393A1 EP 2014077824 W EP2014077824 W EP 2014077824W WO 2015091393 A1 WO2015091393 A1 WO 2015091393A1
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- WIPO (PCT)
- Prior art keywords
- mol
- conversion element
- glass composition
- phosphor
- semiconductor chip
- Prior art date
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- 238000006243 chemical reaction Methods 0.000 title claims abstract description 146
- 238000000034 method Methods 0.000 title claims abstract description 32
- 230000008569 process Effects 0.000 title abstract description 17
- 239000011521 glass Substances 0.000 claims abstract description 126
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims abstract description 111
- 239000000203 mixture Substances 0.000 claims abstract description 110
- 239000011159 matrix material Substances 0.000 claims abstract description 108
- 229910052714 tellurium Inorganic materials 0.000 claims abstract description 25
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 claims abstract description 25
- 230000005670 electromagnetic radiation Effects 0.000 claims abstract description 13
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 10
- 229910052746 lanthanum Inorganic materials 0.000 claims abstract description 9
- 229910052727 yttrium Inorganic materials 0.000 claims abstract description 9
- 229910052788 barium Inorganic materials 0.000 claims abstract description 7
- 229910052791 calcium Inorganic materials 0.000 claims abstract description 7
- 229910052733 gallium Inorganic materials 0.000 claims abstract description 7
- 229910052738 indium Inorganic materials 0.000 claims abstract description 7
- 229910052749 magnesium Inorganic materials 0.000 claims abstract description 7
- 229910052725 zinc Inorganic materials 0.000 claims abstract description 7
- 229910052748 manganese Inorganic materials 0.000 claims abstract description 6
- 229910052712 strontium Inorganic materials 0.000 claims abstract description 6
- 229910052744 lithium Inorganic materials 0.000 claims abstract description 5
- 229910052700 potassium Inorganic materials 0.000 claims abstract description 5
- 229910052708 sodium Inorganic materials 0.000 claims abstract description 5
- 229910052719 titanium Inorganic materials 0.000 claims abstract description 4
- 229910052726 zirconium Inorganic materials 0.000 claims abstract description 4
- 239000004065 semiconductor Substances 0.000 claims description 83
- 230000005855 radiation Effects 0.000 claims description 81
- 239000000758 substrate Substances 0.000 claims description 33
- 239000000919 ceramic Substances 0.000 claims description 16
- 239000000843 powder Substances 0.000 claims description 13
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 claims description 12
- 230000009477 glass transition Effects 0.000 claims description 12
- 230000003595 spectral effect Effects 0.000 claims description 10
- 238000004519 manufacturing process Methods 0.000 claims description 8
- 239000000126 substance Substances 0.000 claims description 8
- 238000010438 heat treatment Methods 0.000 claims description 6
- YBMRDBCBODYGJE-UHFFFAOYSA-N germanium oxide Inorganic materials O=[Ge]=O YBMRDBCBODYGJE-UHFFFAOYSA-N 0.000 claims description 5
- PVADDRMAFCOOPC-UHFFFAOYSA-N oxogermanium Chemical compound [Ge]=O PVADDRMAFCOOPC-UHFFFAOYSA-N 0.000 claims description 5
- 229910019142 PO4 Inorganic materials 0.000 claims description 4
- 229910052797 bismuth Inorganic materials 0.000 claims description 4
- 150000004820 halides Chemical class 0.000 claims description 4
- 235000021317 phosphate Nutrition 0.000 claims description 4
- 150000003013 phosphoric acid derivatives Chemical class 0.000 claims description 4
- IVIIAEVMQHEPAY-UHFFFAOYSA-N tridodecyl phosphite Chemical compound CCCCCCCCCCCCOP(OCCCCCCCCCCCC)OCCCCCCCCCCCC IVIIAEVMQHEPAY-UHFFFAOYSA-N 0.000 claims description 3
- 229910052735 hafnium Inorganic materials 0.000 abstract description 3
- 239000010410 layer Substances 0.000 description 58
- 239000002245 particle Substances 0.000 description 16
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 12
- 239000000463 material Substances 0.000 description 12
- 230000005540 biological transmission Effects 0.000 description 11
- 238000002425 crystallisation Methods 0.000 description 11
- 230000008025 crystallization Effects 0.000 description 11
- 150000001875 compounds Chemical class 0.000 description 9
- 239000002223 garnet Substances 0.000 description 8
- 230000003287 optical effect Effects 0.000 description 7
- 229920001296 polysiloxane Polymers 0.000 description 7
- 238000005245 sintering Methods 0.000 description 7
- 238000000576 coating method Methods 0.000 description 6
- 230000000052 comparative effect Effects 0.000 description 6
- 238000004382 potting Methods 0.000 description 6
- 238000001228 spectrum Methods 0.000 description 6
- 238000000411 transmission spectrum Methods 0.000 description 6
- 239000011787 zinc oxide Substances 0.000 description 6
- 238000002441 X-ray diffraction Methods 0.000 description 5
- 239000011575 calcium Substances 0.000 description 5
- MRELNEQAGSRDBK-UHFFFAOYSA-N lanthanum(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[La+3].[La+3] MRELNEQAGSRDBK-UHFFFAOYSA-N 0.000 description 5
- 239000011777 magnesium Substances 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 239000010955 niobium Substances 0.000 description 5
- 230000005693 optoelectronics Effects 0.000 description 5
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 5
- 239000011734 sodium Substances 0.000 description 5
- KKCBUQHMOMHUOY-UHFFFAOYSA-N sodium oxide Chemical compound [O-2].[Na+].[Na+] KKCBUQHMOMHUOY-UHFFFAOYSA-N 0.000 description 5
- 239000011701 zinc Substances 0.000 description 5
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 238000000149 argon plasma sintering Methods 0.000 description 4
- 239000002585 base Substances 0.000 description 4
- 230000008901 benefit Effects 0.000 description 4
- 239000011572 manganese Substances 0.000 description 4
- 150000002739 metals Chemical class 0.000 description 4
- 229910000484 niobium oxide Inorganic materials 0.000 description 4
- URLJKFSTXLNXLG-UHFFFAOYSA-N niobium(5+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Nb+5].[Nb+5] URLJKFSTXLNXLG-UHFFFAOYSA-N 0.000 description 4
- 238000007493 shaping process Methods 0.000 description 4
- 239000007787 solid Substances 0.000 description 4
- 229910001936 tantalum oxide Inorganic materials 0.000 description 4
- DLYUQMMRRRQYAE-UHFFFAOYSA-N tetraphosphorus decaoxide Chemical compound O1P(O2)(=O)OP3(=O)OP1(=O)OP2(=O)O3 DLYUQMMRRRQYAE-UHFFFAOYSA-N 0.000 description 4
- MCMNRKCIXSYSNV-UHFFFAOYSA-N ZrO2 Inorganic materials O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 3
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 3
- 229910052785 arsenic Inorganic materials 0.000 description 3
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 3
- 229910052799 carbon Inorganic materials 0.000 description 3
- 230000007797 corrosion Effects 0.000 description 3
- 238000005260 corrosion Methods 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000007571 dilatometry Methods 0.000 description 3
- 239000006185 dispersion Substances 0.000 description 3
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 3
- 238000002844 melting Methods 0.000 description 3
- 238000002161 passivation Methods 0.000 description 3
- 229910052698 phosphorus Inorganic materials 0.000 description 3
- 239000011241 protective layer Substances 0.000 description 3
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 3
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 2
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 229910052770 Uranium Inorganic materials 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 229910000272 alkali metal oxide Inorganic materials 0.000 description 2
- 150000004645 aluminates Chemical class 0.000 description 2
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 2
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 description 2
- QVQLCTNNEUAWMS-UHFFFAOYSA-N barium oxide Chemical compound [Ba]=O QVQLCTNNEUAWMS-UHFFFAOYSA-N 0.000 description 2
- 239000011324 bead Substances 0.000 description 2
- 229910000416 bismuth oxide Inorganic materials 0.000 description 2
- 229910052793 cadmium Inorganic materials 0.000 description 2
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 2
- 150000004649 carbonic acid derivatives Chemical class 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 239000003086 colorant Substances 0.000 description 2
- 238000004040 coloring Methods 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 238000006731 degradation reaction Methods 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- TYIXMATWDRGMPF-UHFFFAOYSA-N dibismuth;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Bi+3].[Bi+3] TYIXMATWDRGMPF-UHFFFAOYSA-N 0.000 description 2
- 238000000113 differential scanning calorimetry Methods 0.000 description 2
- 238000004455 differential thermal analysis Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 238000000605 extraction Methods 0.000 description 2
- 239000000945 filler Substances 0.000 description 2
- 238000000227 grinding Methods 0.000 description 2
- CJNBYAVZURUTKZ-UHFFFAOYSA-N hafnium(iv) oxide Chemical compound O=[Hf]=O CJNBYAVZURUTKZ-UHFFFAOYSA-N 0.000 description 2
- 150000004679 hydroxides Chemical class 0.000 description 2
- AMWRITDGCCNYAT-UHFFFAOYSA-L hydroxy(oxo)manganese;manganese Chemical compound [Mn].O[Mn]=O.O[Mn]=O AMWRITDGCCNYAT-UHFFFAOYSA-L 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- FUJCRWPEOMXPAD-UHFFFAOYSA-N lithium oxide Chemical compound [Li+].[Li+].[O-2] FUJCRWPEOMXPAD-UHFFFAOYSA-N 0.000 description 2
- 229910001947 lithium oxide Inorganic materials 0.000 description 2
- 238000003754 machining Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 239000006060 molten glass Substances 0.000 description 2
- 229910052605 nesosilicate Inorganic materials 0.000 description 2
- 229910052758 niobium Inorganic materials 0.000 description 2
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 2
- 150000002823 nitrates Chemical class 0.000 description 2
- 150000004762 orthosilicates Chemical class 0.000 description 2
- 239000011574 phosphorus Substances 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 238000007639 printing Methods 0.000 description 2
- 238000007650 screen-printing Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 229910001948 sodium oxide Inorganic materials 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- 239000007858 starting material Substances 0.000 description 2
- 238000010345 tape casting Methods 0.000 description 2
- 150000003568 thioethers Chemical class 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 239000004408 titanium dioxide Substances 0.000 description 2
- 230000009466 transformation Effects 0.000 description 2
- DNYWZCXLKNTFFI-UHFFFAOYSA-N uranium Chemical compound [U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U] DNYWZCXLKNTFFI-UHFFFAOYSA-N 0.000 description 2
- RUDFQVOCFDJEEF-UHFFFAOYSA-N yttrium(III) oxide Inorganic materials [O-2].[O-2].[O-2].[Y+3].[Y+3] RUDFQVOCFDJEEF-UHFFFAOYSA-N 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 description 1
- -1 Nitride compound Chemical class 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 238000003723 Smelting Methods 0.000 description 1
- 239000004904 UV filter Substances 0.000 description 1
- DPWBZNOQZSTFQV-UHFFFAOYSA-N [O-2].[O-2].[Ta+4] Chemical compound [O-2].[O-2].[Ta+4] DPWBZNOQZSTFQV-UHFFFAOYSA-N 0.000 description 1
- UZNFCWIUIIGZTF-UHFFFAOYSA-N [O-2].[Ta+].[Ta+] Chemical compound [O-2].[Ta+].[Ta+] UZNFCWIUIIGZTF-UHFFFAOYSA-N 0.000 description 1
- 229910052767 actinium Inorganic materials 0.000 description 1
- QQINRWTZWGJFDB-UHFFFAOYSA-N actinium atom Chemical compound [Ac] QQINRWTZWGJFDB-UHFFFAOYSA-N 0.000 description 1
- 229910000287 alkaline earth metal oxide Inorganic materials 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- WMWLMWRWZQELOS-UHFFFAOYSA-N bismuth(III) oxide Inorganic materials O=[Bi]O[Bi]=O WMWLMWRWZQELOS-UHFFFAOYSA-N 0.000 description 1
- 238000007707 calorimetry Methods 0.000 description 1
- 229910052729 chemical element Inorganic materials 0.000 description 1
- 229940125782 compound 2 Drugs 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000000280 densification Methods 0.000 description 1
- 230000001627 detrimental effect Effects 0.000 description 1
- FZFYOUJTOSBFPQ-UHFFFAOYSA-M dipotassium;hydroxide Chemical compound [OH-].[K+].[K+] FZFYOUJTOSBFPQ-UHFFFAOYSA-M 0.000 description 1
- 238000002845 discoloration Methods 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 239000005357 flat glass Substances 0.000 description 1
- 238000005194 fractionation Methods 0.000 description 1
- 239000000156 glass melt Substances 0.000 description 1
- 239000002241 glass-ceramic Substances 0.000 description 1
- 238000000265 homogenisation Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 229910052747 lanthanoid Inorganic materials 0.000 description 1
- 150000002602 lanthanoids Chemical class 0.000 description 1
- 239000005355 lead glass Substances 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- QHMGFQBUOCYLDT-RNFRBKRXSA-N n-(diaminomethylidene)-2-[(2r,5r)-2,5-dimethyl-2,5-dihydropyrrol-1-yl]acetamide Chemical compound C[C@@H]1C=C[C@@H](C)N1CC(=O)N=C(N)N QHMGFQBUOCYLDT-RNFRBKRXSA-N 0.000 description 1
- ZKATWMILCYLAPD-UHFFFAOYSA-N niobium pentoxide Inorganic materials O=[Nb](=O)O[Nb](=O)=O ZKATWMILCYLAPD-UHFFFAOYSA-N 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 description 1
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- CHWRSCGUEQEHOH-UHFFFAOYSA-N potassium oxide Chemical compound [O-2].[K+].[K+] CHWRSCGUEQEHOH-UHFFFAOYSA-N 0.000 description 1
- 229910001950 potassium oxide Inorganic materials 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 229910001404 rare earth metal oxide Inorganic materials 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 238000007788 roughening Methods 0.000 description 1
- 229910052706 scandium Inorganic materials 0.000 description 1
- SIXSYDAISGFNSX-UHFFFAOYSA-N scandium atom Chemical compound [Sc] SIXSYDAISGFNSX-UHFFFAOYSA-N 0.000 description 1
- 238000005204 segregation Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 150000004760 silicates Chemical class 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 1
- PBCFLUZVCVVTBY-UHFFFAOYSA-N tantalum pentoxide Inorganic materials O=[Ta](=O)O[Ta](=O)=O PBCFLUZVCVVTBY-UHFFFAOYSA-N 0.000 description 1
- IIXQANVWKBCLEB-UHFFFAOYSA-N tellurium trioxide Chemical compound O=[Te](=O)=O IIXQANVWKBCLEB-UHFFFAOYSA-N 0.000 description 1
- 230000000930 thermomechanical effect Effects 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/02—Use of particular materials as binders, particle coatings or suspension media therefor
- C09K11/025—Use of particular materials as binders, particle coatings or suspension media therefor non-luminescent particle coatings or suspension media
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C14/00—Glass compositions containing a non-glass component, e.g. compositions containing fibres, filaments, whiskers, platelets, or the like, dispersed in a glass matrix
- C03C14/006—Glass compositions containing a non-glass component, e.g. compositions containing fibres, filaments, whiskers, platelets, or the like, dispersed in a glass matrix the non-glass component being in the form of microcrystallites, e.g. of optically or electrically active material
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C3/00—Glass compositions
- C03C3/12—Silica-free oxide glass compositions
- C03C3/122—Silica-free oxide glass compositions containing oxides of As, Sb, Bi, Mo, W, V, Te as glass formers
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C3/00—Glass compositions
- C03C3/12—Silica-free oxide glass compositions
- C03C3/125—Silica-free oxide glass compositions containing aluminium as glass former
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C4/00—Compositions for glass with special properties
- C03C4/12—Compositions for glass with special properties for luminescent glass; for fluorescent glass
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/02—Use of particular materials as binders, particle coatings or suspension media therefor
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/50—Wavelength conversion elements
- H01L33/501—Wavelength conversion elements characterised by the materials, e.g. binder
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/50—Wavelength conversion elements
- H01L33/501—Wavelength conversion elements characterised by the materials, e.g. binder
- H01L33/502—Wavelength conversion materials
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C2204/00—Glasses, glazes or enamels with special properties
- C03C2204/02—Antibacterial glass, glaze or enamel
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C2214/00—Nature of the non-vitreous component
- C03C2214/16—Microcrystallites, e.g. of optically or electrically active material
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C2214/00—Nature of the non-vitreous component
- C03C2214/30—Methods of making the composites
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2933/00—Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
- H01L2933/0008—Processes
- H01L2933/0033—Processes relating to semiconductor body packages
- H01L2933/0041—Processes relating to semiconductor body packages relating to wavelength conversion elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/50—Wavelength conversion elements
- H01L33/501—Wavelength conversion elements characterised by the materials, e.g. binder
- H01L33/502—Wavelength conversion materials
- H01L33/504—Elements with two or more wavelength conversion materials
Definitions
- a conversion element is specified.
- a device and a method for producing such a device are specified.
- a conventional conversion element usually has silicon as the matrix material, in which the phosphor
- Conversion element have a refractive index, which is adapted to the refractive index of a phosphor embedded in the conversion element.
- Matrix material embedded phosphor can be any suitable material.
- Glass composition has a glass transition temperature of less than 320 ° C and a dilatometric
- Tellurium oxide matrix material having a content of at least 65 mole% and at most 90 mole% inclusive, RO between 0.1 mole% and 15 mole% inclusive, and R 2 2Ü3, in the range of 1 mole inclusive -% and including 3 mol%.
- Consists of may mean here that no other components are included in the composition. Alternatively, “consists of” mean that other components only in small
- a glass composition can be produced as a matrix material.
- the proportion of the weight of the components corresponds to the proportion of the components in the glass composition with a maximum deviation of 5 ⁇ 6.
- this consists
- Matrix material in particular the glass composition of:
- composition of the matrix material does not necessarily have to be added as starting materials, but the glass components can also be used hydroxides, carbonates, nitrates, etc., if they exist, and therefore present in the mixture. According to at least one embodiment is in the
- Matrix material embedded at least one phosphor or combinations of multiple phosphor may, for example, in powder form in
- TeC> 2 is used as tellurium oxide. TeC> 2 has a share of at least
- R 1 -O 2 is zinc oxide and / or barium oxide.
- the glass composition as matrix material has alkali oxide ( ⁇ 1 2 ⁇ ).
- the proportion is at least 4 mol%, 6 mol%, 8 mol%, 10 mol% or 12 mol% and / or at most 14 mol%, 16 mol%, 18 mol%, 20 mol -%, 22 mol% or 24 mol%.
- the content of M ⁇ O is 10 mol% to 12 mol% (including limits).
- Potassium oxide (K 2 0) and combinations of the three mentioned oxides for the preparation of the glass composition or in the glass composition can be used.
- the alkali oxides have the main task of reducing the viscosity of the matrix material, which in turn is advantageous to temperature-sensitive materials at low
- trivalent metals such as aluminum, gallium, indium,
- R 2 203 Combinations thereof (R 2 203).
- oxides of aluminum, lanthanum, bismuth, yttrium and / or rare earths are preferred.
- Rare earths here refers to the chemical elements of the 3rd subgroup of the periodic table (with the exception of the actinium) and the lanthanides.
- the proportion of R 2 2Ü 3 is at least 1.2 mol%, 1.4 mol%, 1.5 mol% or 1.75 mol% and / or at most 1.9 mol%, 2 mol%, 2.4 mol% or 2.6 mol%, for example, 1.7 mol%.
- the proportion of R 2 2Ü3 should not exceed 3 mol% in the
- Conversion element can be provided, which in a broad spectral range of 380 nm to 800 nm none
- the glass composition Alternatively or additionally, the glass composition
- TaC> 2 tantalum (V) oxide
- Ta20s tantalum (V) oxide
- Matrix material in particular the glass composition reduce the tendency to crystallize, without simultaneously increasing the glass transition and softening temperature significantly.
- alumina, lanthanum oxide, bismuth oxide, yttria and / or rare earths are examples of the glass composition.
- TMA thermomechanical analysis
- DSC differential scanning calorimetry
- DTA differential thermal analysis
- Softening temperature (T e ) is the temperature at which the glass or the glass composition begins to deform markedly and is therefore under the influence of
- the softening temperature is an essential parameter when embedding materials, such as a phosphor, in glass. In these
- DSC Differential calorimetry
- TMA dilatometry
- the crystallization of the glass composition or a lack of crystallization of the glass composition can be determined by X-ray diffraction (XRD).
- the glass composition for example, has a content of at most 10 ppm by weight of the compounds mentioned in the glass composition.
- the dilatometric softening temperature of the matrix material has a value of less than 400 ° C., in particular less than 350 ° C. or less than 325 ° C.
- the matrix material is radiation-permeable and / or and free from scattering. This means in particular that 90%, minus the
- the matrix material in particular the glass composition, has the property of having high transmission and low absorption. In particular, that absorbs
- Matrix material ⁇ 10%, preferably ⁇ 5%, particularly preferably ⁇ 1% of the incident electromagnetic radiation from a wavelength range of 380 nm to 800 nm
- Fresnel losses can vary by refractive index at 8-11 ⁇ 6 per
- the matrix material is colorless. As colorless is here and below referred to that the matrix material, in particular the glass composition no electromagnetic radiation, ie at most 5% of the incident electromagnetic radiation from a
- this includes
- the matrix material can additionally serve as a UV filter.
- the matrix material in particular the glass composition, is ultra-low-melting.
- ultra-low melting point material is considered in the context of the present application, a material which softens at a temperature of at most 350 ° C. This makes it possible with advantage that the matrix material can be connected directly to the semiconductor chip at low temperatures of at most 350 ° C, at such temperatures, the semiconductor chip undergoes no damage.
- a substance is referred to as "phosphor", which at least partially absorbs electromagnetic primary radiation and as electromagnetic secondary radiation in an at least partially from the electromagnetic primary radiation emitted different wavelength range.
- monochrome wavelength range can have.
- the spectrum of the electromagnetic primary radiation and / or the spectrum of the electromagnetic secondary radiation can also be broadband, that is to say that the
- Wavelength range wherein the mixed-color wavelength range can each have a continuous spectrum or a plurality of discrete spectral components at different wavelengths.
- the phosphor used may be a garnet phosphor, for example a yellow garnet phosphor. Alternatively or additionally, a nitridic phosphor,
- the matrix material has a higher thermal conductivity than conventionally used silicone, whereby the
- the phosphor can be embedded in the matrix material and shaped as a potting compound, layer or film.
- the potting can, for example
- the matrix material may additionally comprise a filler, such as a
- Metal oxide such as titanium dioxide, silicon dioxide,
- the filler may e.g. serve for targeted light scattering and inhomogeneous or homogeneous in the
- the component comprises the conversion element.
- the same definitions and explanations apply to the method or to the component, as stated above for the conversion element, and vice versa.
- the component comprises a semiconductor chip.
- the semiconductor chip is set up to generate electromagnetic primary radiation at least from the blue spectral range.
- the conversion element can be arranged directly on the semiconductor chip. Between semiconductor chip and conversion element thus no distance is provided.
- the conversion element is mounted on the radiation exit surface of the semiconductor chip. The conversion element is thus directly on the
- the semiconductor chip comprises according to at least one
- Embodiment a semiconductor layer sequence.
- the semiconductor material is preferably a Nitride compound semiconductor material such as Al n In] __ n _ m Ga m N or to a phosphide compound semiconductor material such as
- the semiconductor chip may be an active layer having at least one pn junction and / or one or more
- Quantum well structures include. In operation of the
- a wavelength of the electromagnetic primary radiation is preferably in the ultraviolet and / or visible spectral range
- wavelengths between 420 nm and 680 nm inclusive for example between 440 nm and 480 nm inclusive.
- the component comprises a semiconductor chip.
- the semiconductor chip is set up to generate electromagnetic primary radiation at least from the blue spectral range.
- the conversion element may be arranged spatially spaced from the semiconductor chip.
- Radiation exit surface formed a gap.
- Conversion element and semiconductor chip of greater than or equal to 200 ym, preferably greater than or equal to 750 ym, more preferably greater than or equal to 900 ym (so-called "Remote Phosphor Conversion").
- the component comprises a semiconductor chip which is used to generate
- electromagnetic primary radiation is set up at least from the blue spectral range.
- the electromagnetic primary radiation is set up at least from the blue spectral range.
- Component comprise a substrate.
- the conversion element may connect an additional layer to the semiconductor chip or the substrate, wherein the additional layer is a
- the method for producing a component comprises the method steps a) providing at least one semiconductor chip having or having a radiation exit surface
- the matrix material is ground after the melt and sieved to a specific particle size fraction. Subsequently, the phosphor, which is present for example as a powder, can be embedded in the matrix material.
- the phosphor which is present for example as a powder
- Radiation exit surface can be generated.
- the connection can be increased by a weight application or thereby also take place at a lower temperature.
- oxides of R 2 2 Ü3 such as aluminum, the crystallization of the matrix material during the production of positive, so that the conversion element in step c) does not crystallize.
- Process step b) applied the conversion element as a powder or as a preformed body on the radiation exit surface.
- Prefabricated body means in this
- Body can be made by first melting the glass from the batch.
- the phosphor preferably a temperaturuntube.
- the solid may also be a raw or preform from which the prefabricated Body with the appropriate dimensions can be obtained, for example, by sawing, grinding, polishing, etching or laser machining.
- the prefabricated Body with the appropriate dimensions can be obtained, for example, by sawing, grinding, polishing, etching or laser machining.
- Glass powder are produced a compact, which is then sintered at elevated temperature or "melted", whereby the phosphor is enclosed by the glass and then present as a prefabricated conversion element.
- the prefabricated body can initially without
- the resulting melt can be poured or formed and then cooled to form a solid.
- the solid may also be a green or preform from which the prefabricated body of the appropriate dimensions may subsequently be obtained, for example by sawing, grinding, polishing, etching or laser machining. Then the
- prefabricated bodies are applied to the radiation exit surface or on a substrate and coated with the phosphor.
- the coating can take place, for example, by printing, screen printing, spraying, knife coating, dispensing or spincoating. Subsequently, the device at a temperature of ⁇ 350 ° C for
- Conversion element, z. Example a ceramic conversion element of the same or different color or a conversion element embedded in glass phosphor or a lens
- Conversion element or the lens with the conversion element can be connected via the matrix material.
- Color information in relation to the conversion element designates here and below the respective spectral range of the electromagnetic radiation, for example the
- the phosphor is introduced into the glass composition prior to sintering.
- a mixture of phosphor and powder of the glass composition is sintered, in particular pressed, in order to minimize air pockets.
- temperatures near the softening point of the glass composition may be found under reduced pressure and / or
- a liquid melt of the glass composition is prepared with phosphor suspended therein, wherein then the liquid Melt is sprayed or dropped so that the conversion element is applied to the radiation exit surface of the semiconductor chip or the substrate.
- a layer of defined layer thickness of phosphor and optionally further elements may be applied to a layer of the glass composition, followed by sintering at a temperature close to the softening point of the glass composition. This can cause the phosphor to sink into the
- Gas composition is deposited in the interstices between the phosphor particles.
- Weight is softened and flows into the spaces between the phosphor particles (sinking of the
- Radiation exit surface of the semiconductor connects.
- Substrate eg thin flat glass, transparent ceramic or glass ceramic
- a glassy layer of the glass composition generated.
- a phosphor layer is applied, which then sinks under temperature increase in the glassy layer. This can additionally with a
- Weighting carried out in order to bring more phosphor into the matrix material and / or thereby let this phosphor sink in at a lower temperature and / or to shorten the process time.
- glass powder and phosphor powder can be mixed and then applied as a layer on the substrate.
- scattering particles can be added which homogenize the emission characteristic and / or increase the light extraction.
- Conversion element as a prefabricated body a separate platelets.
- the tile will be on the
- the matrix material is produced as a thin layer directly on the semiconductor chip or as a separate platelet at higher temperatures of over 350 ° C.
- the matrix material can be applied as a thin layer directly on a substrate, a further conversion element or a lens.
- the glass preferably has a viscosity n with 10 7 ' 6 dPas * s ⁇ > 10 " 2 dPas * s, in particular of 10 4 dPas * s ⁇ > 10 " 2 dPas * s, ideally of 10 2 dPas * s ⁇ > 10 "2 dPas * s
- phosphor for example YAG: Ce
- the phosphor particles sink, for example within 1, 5, 10 or 30 minutes, at a temperature of less than or equal to 350 ° C in the glass layer.
- Glass composition is then heated so far that the glass softens only slightly and the phosphor sinks into the glass layer and is enclosed by it. This can also be done by applying weight to bring more phosphor into the matrix material or glass and / or the
- Radiation exit surface and the side surfaces are coated with the same phosphor as well as with other types of phosphor. Alternatively, both can
- Radiation exit surfaces are coated with phosphor, wherein the same and different phosphors can be used on the two surfaces. In the latter (separation of the phosphors) so the
- the phosphor-containing radiation exit surface is preferably close to the chip.
- Replace scattered particles to the primary radiation reflect as usual for a color wheel for laser applications. It is also possible to apply different phosphors separately or mixed together. In the case of a color wheel for laser applications, these are usually present separately from one another on a substrate. In a particular embodiment, a reflective and converting layer can also be present on top of one another on a substrate, so that both unconverted primary radiation and secondary radiation are reflected by it. For remote applications, the reflective layer is
- the reflectivity of the reflective layer in this case is> 80%, preferably> 90%, in particular ⁇ 95% of
- FIG. 2 shows a transmission spectrum of a
- FIG. 3 shows an X-ray diffraction diagram of a
- FIG. 4 shows a transmission spectrum of a
- FIG. 5 shows a transmission spectrum of a
- Figure 6 is a comparison of X-ray diffraction patterns of three embodiments.
- curve 2 shows the transmission of the matrix material after the weathering test. The transmission changes due to influence of temperature, more relative
- Glass composition 2a can be removed and the
- Conversion element 2 advantageously covers at least 80% of the radiation exit area 11 of the semiconductor chip 1.
- a vitreous, ceramic or metallic substrate can be used, on which the conversion element 2 is applied and, e.g. for transmissive or reflective
- the embedding of the phosphor 2b in the glass composition 2a is preferably carried out by means of a softening, sinking, sinking, smelting and / or sintering process.
- FIG. 8 shows a schematic side view of a
- Conversion element 2 has a convex lens shape.
- Conversion element 2 is thus already formed as an integrated lens, wherein the lens may arise, for example, by a targeted shaping or by the surface tension of the glass during the heating of the conversion element 2.
- the primary radiation emitted by the semiconductor chip 1 can be guided in a targeted manner.
- the emission angle of the primary radiation emitted by the semiconductor chip 1 can thus be targeted
- the conversion element 2 influences, among other things, the emission characteristic and the directionality as well as the color locus of the
- the additional element 2c is homogeneously distributed in the glass composition 2a.
- the additional element 2c increases the refractive index of the glass composition 2a.
- An index-increasing additional element 2c is, for example, 1 ⁇ 203.
- the exemplary embodiment of FIG. 8 corresponds to the exemplary embodiment of FIG. 7. This additional element 2c can additionally or alternatively influence the light scattering in a targeted manner and thus for better coupling out and
- the additional element 2c may be for example a scattering particles T1O 2, Al 2 O 3, S1O. 2
- the additional element 2c may be for example a scattering particles T1O 2, Al 2 O 3, S1O. 2
- Scattering particles may be inhomogeneously distributed in the glass composition 2a or formed as a separate layer.
- the separate layer can be above or below the
- FIG. 9 shows a schematic side view of a
- the component 10 has two conversion layers, preferably with different ones
- the semiconductor chip 1 is advantageously completely of the
- the conversion element 2 comprises a phosphor 2b, the glass composition 2a and an additional element 2c.
- the components embedded in the glass composition 2a such as phosphor 2b and
- FIG. 11 shows a schematic side view of a component 10 according to one embodiment.
- the semiconductor chip 1 is arranged on a carrier 5. Subsequently, a conversion layer 2 is arranged. The conversion layer 2 is followed by an additional layer 3.
- the additional layer 3 may in turn comprise a phosphor.
- the additional layer 3 is in particular made of a ceramic, preferably an oxidic garnet ceramic (YAG: Ce, LuAG: Ce, etc.).
- the device 10 may be provided by providing a
- the conversion element 2 can be applied as a prefabricated body, for example as platelets, or as a powder.
- the prefabricated body comprises in particular at least one phosphor 2a, which is itself
- the color location of the prefabricated additional layer 3 is selectively changed by the conversion layer 2, preferably a red-emitting phosphor is introduced.
- Conversion element 2 and / or the additional layer 3 as platelets can take place in a so-called pick-and-place process on the radiation exit surface 11 of the semiconductor layer sequence 1.
- a metallic, glassy or ceramic substrate may also be used.
- the substrate is for e.g.
- the substrate may also have functional oxide coatings which act, for example, as a passivation, as a protective layer or as an optical element.
- the invention is not limited by the description based on the embodiments of these, but includes each feature and any combination of features, which in particular any combination of features in the
- German Patent Application DE 10 2013 226 630.8 is claimed, the disclosure of which is expressly incorporated by reference.
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- General Chemical & Material Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Ceramic Engineering (AREA)
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- Crystallography & Structural Chemistry (AREA)
- Manufacturing & Machinery (AREA)
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Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE112014005897.1T DE112014005897B4 (de) | 2013-12-19 | 2014-12-15 | Konversionselement, Bauelement und Verfahren zur Herstellung eines Bauelements |
US15/102,892 US9688910B2 (en) | 2013-12-19 | 2014-12-15 | Conversion element, component and process for producing a component |
JP2016541428A JP6347393B2 (ja) | 2013-12-19 | 2014-12-15 | 変換素子、コンポーネントおよびコンポーネントを製造するための方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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DE102013226630.8A DE102013226630A1 (de) | 2013-12-19 | 2013-12-19 | Konversionselement, Bauelement und Verfahren zur Herstellung eines Bauelements |
DE102013226630.8 | 2013-12-19 |
Publications (1)
Publication Number | Publication Date |
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WO2015091393A1 true WO2015091393A1 (de) | 2015-06-25 |
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Family Applications (1)
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PCT/EP2014/077824 WO2015091393A1 (de) | 2013-12-19 | 2014-12-15 | Konversionselement, bauelement und verfahren zur herstellung eines bauelements |
Country Status (4)
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US (1) | US9688910B2 (de) |
JP (1) | JP6347393B2 (de) |
DE (2) | DE102013226630A1 (de) |
WO (1) | WO2015091393A1 (de) |
Cited By (4)
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WO2017214464A1 (en) | 2016-06-09 | 2017-12-14 | Osram Sylvania Inc. | Target assembly with glass-bonded wavelength converter |
WO2018025670A1 (ja) * | 2016-08-05 | 2018-02-08 | 日本電気硝子株式会社 | 波長変換部材及びその製造方法 |
US11259471B2 (en) | 2016-05-24 | 2022-03-01 | Osram Gmbh | Cover member for a greenhouse, greenhouse, and use of a layer for a cover member |
US11294195B2 (en) | 2018-11-05 | 2022-04-05 | Osram Opto Semiconductors Gmbh | Aperiodic nano-optical array for angular shaping of incoherent emissions |
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DE102013226636A1 (de) * | 2013-12-19 | 2015-06-25 | Friedrich-Schiller-Universität Jena | Glaszusammensetzung, Bauelement und Verfahren zur Herstellung eines Bauelements |
DE102016106841B3 (de) | 2015-12-18 | 2017-03-23 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Konverter zur Erzeugung eines Sekundärlichts aus einem Primärlicht, Leuchtmittel, die solche Konverter enthalten, sowie Verfahren zur Herstellung der Konverter und Leuchtmittel |
JP2018128617A (ja) * | 2017-02-10 | 2018-08-16 | 信越化学工業株式会社 | 波長変換部材及びled発光装置 |
DE102017104134A1 (de) * | 2017-02-28 | 2018-08-30 | Osram Gmbh | Optoelektronisches Bauelement und Verfahren zur Herstellung eines optoelektronischen Bauelements |
WO2019107100A1 (ja) * | 2017-11-30 | 2019-06-06 | マクセル株式会社 | 蛍光体部材及び光源装置 |
WO2023072867A1 (en) * | 2021-10-29 | 2023-05-04 | Ams-Osram International Gmbh | Optoelectronic semiconductor chip, optoelectronic component and method for producing an optoelectronic semiconductor chip |
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WO2017214464A1 (en) | 2016-06-09 | 2017-12-14 | Osram Sylvania Inc. | Target assembly with glass-bonded wavelength converter |
WO2018025670A1 (ja) * | 2016-08-05 | 2018-02-08 | 日本電気硝子株式会社 | 波長変換部材及びその製造方法 |
JP2018022095A (ja) * | 2016-08-05 | 2018-02-08 | 日本電気硝子株式会社 | 波長変換部材及びその製造方法 |
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Also Published As
Publication number | Publication date |
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JP2017504061A (ja) | 2017-02-02 |
US20160304776A1 (en) | 2016-10-20 |
US9688910B2 (en) | 2017-06-27 |
JP6347393B2 (ja) | 2018-06-27 |
DE112014005897A5 (de) | 2016-09-15 |
DE102013226630A1 (de) | 2015-06-25 |
DE112014005897B4 (de) | 2019-07-11 |
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