WO2015059203A1 - Optoelektronisches bauelement und verfahren zum herstellen eines optoelektronischen bauelements - Google Patents
Optoelektronisches bauelement und verfahren zum herstellen eines optoelektronischen bauelements Download PDFInfo
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- WO2015059203A1 WO2015059203A1 PCT/EP2014/072673 EP2014072673W WO2015059203A1 WO 2015059203 A1 WO2015059203 A1 WO 2015059203A1 EP 2014072673 W EP2014072673 W EP 2014072673W WO 2015059203 A1 WO2015059203 A1 WO 2015059203A1
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- YOZHUJDVYMRYDM-UHFFFAOYSA-N 4-(4-anilinophenyl)-3-naphthalen-1-yl-n-phenylaniline Chemical compound C=1C=C(C=2C(=CC(NC=3C=CC=CC=3)=CC=2)C=2C3=CC=CC=C3C=CC=2)C=CC=1NC1=CC=CC=C1 YOZHUJDVYMRYDM-UHFFFAOYSA-N 0.000 description 1
- ZNJRONVKWRHYBF-VOTSOKGWSA-N 4-(dicyanomethylene)-2-methyl-6-julolidyl-9-enyl-4h-pyran Chemical compound O1C(C)=CC(=C(C#N)C#N)C=C1\C=C\C1=CC(CCCN2CCC3)=C2C3=C1 ZNJRONVKWRHYBF-VOTSOKGWSA-N 0.000 description 1
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- 108010043121 Green Fluorescent Proteins Proteins 0.000 description 1
- 229910015711 MoOx Inorganic materials 0.000 description 1
- 229920002302 Nylon 6,6 Polymers 0.000 description 1
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 229910006404 SnO 2 Inorganic materials 0.000 description 1
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- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 229910052788 barium Inorganic materials 0.000 description 1
- 239000004305 biphenyl Substances 0.000 description 1
- 235000010290 biphenyl Nutrition 0.000 description 1
- CXKCTMHTOKXKQT-UHFFFAOYSA-N cadmium oxide Inorganic materials [Cd]=O CXKCTMHTOKXKQT-UHFFFAOYSA-N 0.000 description 1
- CFEAAQFZALKQPA-UHFFFAOYSA-N cadmium(2+);oxygen(2-) Chemical compound [O-2].[Cd+2] CFEAAQFZALKQPA-UHFFFAOYSA-N 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 239000010406 cathode material Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
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- AJNVQOSZGJRYEI-UHFFFAOYSA-N digallium;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Ga+3].[Ga+3] AJNVQOSZGJRYEI-UHFFFAOYSA-N 0.000 description 1
- HNPSIPDUKPIQMN-UHFFFAOYSA-N dioxosilane;oxo(oxoalumanyloxy)alumane Chemical class O=[Si]=O.O=[Al]O[Al]=O HNPSIPDUKPIQMN-UHFFFAOYSA-N 0.000 description 1
- DKHNGUNXLDCATP-UHFFFAOYSA-N dipyrazino[2,3-f:2',3'-h]quinoxaline-2,3,6,7,10,11-hexacarbonitrile Chemical compound C12=NC(C#N)=C(C#N)N=C2C2=NC(C#N)=C(C#N)N=C2C2=C1N=C(C#N)C(C#N)=N2 DKHNGUNXLDCATP-UHFFFAOYSA-N 0.000 description 1
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- FJAOBQORBYMRNO-UHFFFAOYSA-N f16cupc Chemical compound [Cu+2].[N-]1C(N=C2C3=C(F)C(F)=C(F)C(F)=C3C(N=C3C4=C(F)C(F)=C(F)C(F)=C4C(=N4)[N-]3)=N2)=C(C(F)=C(F)C(F)=C2F)C2=C1N=C1C2=C(F)C(F)=C(F)C(F)=C2C4=N1 FJAOBQORBYMRNO-UHFFFAOYSA-N 0.000 description 1
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- 229910001195 gallium oxide Inorganic materials 0.000 description 1
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- WIHZLLGSGQNAGK-UHFFFAOYSA-N hafnium(4+);oxygen(2-) Chemical compound [O-2].[O-2].[Hf+4] WIHZLLGSGQNAGK-UHFFFAOYSA-N 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- 229910003437 indium oxide Inorganic materials 0.000 description 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 1
- 238000007641 inkjet printing Methods 0.000 description 1
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- PQXKHYXIUOZZFA-UHFFFAOYSA-M lithium fluoride Inorganic materials [Li+].[F-] PQXKHYXIUOZZFA-UHFFFAOYSA-M 0.000 description 1
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- 229920000620 organic polymer Polymers 0.000 description 1
- 125000002524 organometallic group Chemical group 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 1
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 1
- 125000001037 p-tolyl group Chemical group [H]C1=C([H])C(=C([H])C([H])=C1*)C([H])([H])[H] 0.000 description 1
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- 229920000553 poly(phenylenevinylene) Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 239000011112 polyethylene naphthalate Substances 0.000 description 1
- 229920002098 polyfluorene Polymers 0.000 description 1
- 229920000098 polyolefin Polymers 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 229920000123 polythiophene Polymers 0.000 description 1
- 239000004800 polyvinyl chloride Substances 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- BPEVHDGLPIIAGH-UHFFFAOYSA-N ruthenium(3+) Chemical compound [Ru+3] BPEVHDGLPIIAGH-UHFFFAOYSA-N 0.000 description 1
- 238000006748 scratching Methods 0.000 description 1
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- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 239000010944 silver (metal) Substances 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/85—Arrangements for extracting light from the devices
- H10K50/856—Arrangements for extracting light from the devices comprising reflective means
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/80—Constructional details
- H10K30/81—Electrodes
- H10K30/82—Transparent electrodes, e.g. indium tin oxide [ITO] electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/805—Electrodes
- H10K50/81—Anodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/85—Arrangements for extracting light from the devices
- H10K50/858—Arrangements for extracting light from the devices comprising refractive means, e.g. lenses
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/60—Forming conductive regions or layers, e.g. electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K2102/00—Constructional details relating to the organic devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K2102/00—Constructional details relating to the organic devices covered by this subclass
- H10K2102/301—Details of OLEDs
- H10K2102/302—Details of OLEDs of OLED structures
- H10K2102/3023—Direction of light emission
- H10K2102/3035—Edge emission
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/805—Electrodes
- H10K50/82—Cathodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/805—Electrodes
- H10K50/82—Cathodes
- H10K50/824—Cathodes combined with auxiliary electrodes
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the invention relates to an optoelectronic component and to a method for producing an optoelectronic component
- Organic-based optoelectronic components for example organic solar cells or organic ones
- Light-emitting diodes find increasingly widespread application.
- OLEDs are increasingly used in general lighting, for example, as a surface light source.
- Such an optoelectronic component may have an anode and a cathode with an organic functional
- the organic functional layer structure may be one or more
- Emitter layers have, in the electromagnetic spectrum
- one or more charge carrier pair generation layer structures each comprising two or more charge generating layers (CGL) for charge carrier pair generation, and one or more electron block layers, also referred to as hole transport layers -HTL), and one or more hole blocker layers, also referred to as electron transport layer (ETL), to direct the flow of current.
- CGL charge generating layers
- ETL electron transport layer
- the cathode In the case of a bottom emitter OLED, that is to say an OLED emitting through the substrate or the carrier, the cathode has a double function. It is important for the electrical function of the OLED and serves as a mirror for light which is generated in the organic functional layer structure and should not leave the OLED on the cathode side. The efficiency of an OLED with internal decoupling is thereby Among other things, very strongly influenced by the reflectivity of the cathode. Silver has one of the highest known
- Reflectances for example, 94% at 550 nm, and is therefore used regularly as a cathode material.
- Silver cathode can show an angle and wavelength-dependent reflectivity of about 92% on average.
- Material of the cathode, for example, the silver can be any material of the cathode, for example, the silver.
- Optoelectronic device provided which has a particularly high efficiency.
- the optoelectronic component has a light-transmissive support, a transparent electrode over the support, and an organic functional layer structure having a first refractive index over the first electrode.
- a light-transmissive current distribution layer is formed over the organic functional layer structure.
- a translucent TIR (Total Internal Reflection) layer having a second refractive index smaller than the first refractive index is formed over the current distribution layer.
- a specular power supply layer is formed over the TIR layer. At least one power conducting element extends through the TIR layer and couples the power feeding layer to the power distribution layer
- Optoelectronic component has a carrier.
- a specular power supply layer is over the carrier
- a translucent TIR layer is formed over the power supply layer.
- a translucent TIR layer is formed over the power supply layer.
- Current distribution layer is formed over the TIR layer. At least one current conducting element extends through the TIR layer and electrically couples the current supplying layer to the current distributing layer.
- Refractive index is formed over the current distribution layer.
- a translucent electrode is formed over the organic functional layer structure.
- the translucent TIR layer has a second one
- Refractive index which is smaller than the first refractive index.
- TIR in German means total internal reflection and the “TIR layer” denotes a layer which is designed so that a particularly high proportion of total internal reflection occurs at the TIR layer during operation of the optoelectronic component.
- the electrode over the support and under the organic functional layer structure may also be referred to as the first electrode.
- the electrode over the organic functional layer structure may also be referred to as a second electrode.
- the TIR layer has a particularly low refractive index and can be referred to, for example, as a low-index layer.
- the refractive index jump from the organic functional layer structure towards the TIR layer provides a particularly high proportion of total internal reflection at the interface of the TIR layer. In particular, occurs at the
- the reflection at the TIR layer is quasi lossless.
- the reflection at the power supply layer may be the reflectivity of a conventional cathode. Therefore, it comes to a superposition of
- Reflection characteristics and overall increased reflection For example, the effective reflectivity of a conventional silver cathode can be exceeded.
- Electrode structure is defined by the current distribution layer, the current conducting elements and the current supply layer
- the power distribution layer can be any type of ensured.
- the current distribution layer may be made so thin that it has no or only one to the index jump
- the power distribution layer can
- the power supply layer is the main current carrying unit and the
- Power distribution layer takes over the local distribution of Electricity above or below the organic functional
- a layer or layer structure is translucent may mean, for example, that the corresponding layer or layer structure is transparent or translucent. That a layer or layer structure
- the corresponding layer or layer structure for the light generated by the OLED is transparent or in the case of an organic solar cell for the light supplied to the solar cell.
- the fact that the current supply layer is formed to be reflective may mean that the current supply layer is designed to be reflective at least at the interface towards the TIR layer.
- one, two or more further current-conducting elements can be arranged, which connect the current supply layer to the
- Current-conducting elements can pass through the TIR layer and / or completely or partially through the current distribution layer
- the Stromleitmaschine can
- the TIR layer for example, be formed island-shaped in the TIR layer.
- the TIR layer and the current distribution layer may have a well-defined interface with each other.
- the TIR layer and / or the current distribution layer can each be largely homogeneous. Alternatively, the TIR layer and the current distribution layer may gradually become
- the material of the TIR layer and the current distribution layer may be mixed with each other, wherein, toward the organic functional layer structure, the proportion of the material of the TIR layer decreases and the proportion of the material of the
- the second is
- the TIR layer comprises plastic.
- the TIR layer comprises plastic.
- the TIR layer comprises a foamed material.
- the material may be foamed, for example by means of air or nitrogen.
- the TIR layer comprises epoxide.
- the TIR layer comprises epoxy resin.
- the TIR layer has nanostructures.
- the nanostructures are, for example, nanodots, nanotubes or nanowires.
- the nanostructures have, for example, S1O 2 or carbon. Nanotubes have cavities that are particularly large
- Voids may be filled with air and / or nitrogen and then have a refractive index equal to or
- the TIR layer is formed by a cavity.
- the TIR layer may be an air layer, a gas layer, a gas cushion or an air cushion.
- the current conducting element is formed as a spacer between the current distribution layer and the Stromzu melt. This can help to make the TIR layer easy as a cavity.
- the electrode is formed as a spacer between the current distribution layer and the Stromzu melt. This can help to make the TIR layer easy as a cavity.
- the nanowires may be, for example, silver nanowires.
- the nanowires can be applied in a suspension over the carrier, for example. In the finished optoelectronic device then residues of the suspension may be present or the
- Suspension can be removed down to the nanowires.
- the power supply layer on silver. This can contribute to the fact that the corresponding electrode structure has a particularly high reflectivity.
- the power supply layer may be formed of silver.
- the power supply layer may be formed of silver.
- Stromzufish silk be formed according to a conventional silver cathode.
- the current conducting element is formed by electrically conductive adhesive.
- Adhesive may be, for example, adhesive and / or silver, for example, the adhesive may be electrically conductive silver adhesive.
- first of all the light-permeable carrier is provided, for example formed.
- the translucent electrode is formed over the carrier.
- the organic functional layer structure having the first refractive index is formed over the first electrode.
- the translucent current distribution layer is above the organic
- Refractive index is above the current distribution layer
- At least the one current conducting element is formed so as to pass through the TIR layer extends, wherein the Stromleitelement for electrical
- the specular power supply layer is used.
- the specular power supply layer is formed over the TIR layer.
- the translucent support is provided.
- Translucent electrode is formed over the carrier.
- the organic functional layer structure having the first refractive index becomes over the first electrode
- reflective power supply layer is over the cover
- the transparent TIR layer having a second refractive index smaller than the first refractive index is formed over the current supply layer.
- the at least one current-conducting element is formed so as to extend through the TIR layer, wherein the current-conducting element is formed so that it
- the carrier becomes
- a specular power supply layer is formed over the carrier.
- a transmissive TIR layer is formed over the specular power supply layer.
- At least one Stromleitelement is formed so that it extending through the TIR layer for electrically coupling the specular current supply layer to the light transmissive current distribution layer.
- transparent power distribution layer is formed over the TIR layer.
- Layer structure having the first refractive index is formed over the current distribution layer.
- the TIR layer has the second refractive index, which is smaller than the first refractive index.
- the carrier becomes
- the specular power supply layer is formed over the carrier.
- the transmissive TIR layer is formed over the current supply layer, and at least one current-conducting element is formed to extend through the TIR layer for electrically coupling the specular current-supplying layer to the substrate
- a translucent cover is provided.
- the translucent electrode is formed over the cover.
- An organic functional layer structure having a first refractive index is formed over the transparent electrode.
- the light-transmissive current distribution layer is formed over the organic functional layer structure or over the TIR layer.
- the functional layer structure is placed over the carrier so that the cover faces away from the TIR layer.
- the TIR layer has a second refractive index that is less than the first refractive index.
- the optoelectronic component can thus be constructed from two halves.
- the two halves can be glued together, for example, by means of the material of the TIR layer.
- the material of the TIR layer and the material of the current-conducting elements can be applied, for example, in a structured manner to the current supply layer, for example by means of a printing process.
- the cathode is no
- Foamed TIR layer The foaming can be done for example by means of air or nitrogen.
- the TIR layer is formed by a cavity.
- the TIR layer can be formed by forming the cavity.
- Figure 1 is a sectional view of a conventional
- FIG. 2 shows a layer structure of the conventional one
- FIG. 3 shows a layer structure of an exemplary embodiment of an optoelectronic component
- FIG. 4 is a detailed sectional view of
- FIG. 5 a simplified representation of the layer structure according to FIG. 4 with exemplary light paths
- FIG. 6 is a flowchart of an embodiment
- Figure 7 is a flowchart of an embodiment
- Figure 8 is a detailed sectional view of a
- FIG. 9 is a flow chart of an embodiment
- FIG. 10 is a flowchart of an embodiment
- An optoelectronic component may be an electromagnetic radiation emitting device or a
- An electromagnetic radiation absorbing component may be, for example, a solar cell.
- Electromagnetic radiation emitting device may be formed as a organic electromagnetic radiation emitting diode or as an organic electromagnetic radiation emitting transistor.
- the radiation may, for example, be light in the visible range, UV light and / or infrared light.
- the radiation may, for example, be light in the visible range, UV light and / or infrared light.
- a light emitting diode for example, as a light emitting diode (light emitting diode, LED) as an organic light emitting diode (organic light emitting diode, OLED), as light emitting Transistor or emitting as organic light
- the optoelectronic component can be part of an integrated circuit in various embodiments. Furthermore, a plurality of optoelectronic components can be provided,
- translucent or “translucent layer” can be understood to mean that a layer for light
- Optoelectronic component generated light for example, one or more wavelength ranges, for example, for light in a wavelength range of visible light (for example, at least in a portion of the
- Translucent layer in various exemplary embodiments is to be understood as meaning that essentially the entire amount of light coupled into a structure (for example a layer) is also coupled out of the structure, in which case a portion of the light can be scattered
- transparent or “transparent layer” it can be understood that a layer for light
- permeable for example, at least in one
- Subregion of the wavelength range from 380 nm to 780 nm), wherein a structure (for example a layer)
- a nanostructure is a structure that has at least an outer dimension that is less than 1000 nm.
- a nanotube or a nanowire may have a diameter of a few nanometers, but otherwise be made significantly larger, for example up to a few microns or even centimeters long.
- Fig.l shows a conventional optoelectronic device 1.
- the conventional optoelectronic component 1 has a carrier 12, for example a substrate.
- An optoelectronic layer structure is formed on the carrier 12.
- the optoelectronic layer structure has a first one
- Electrode layer 14 having a first contact portion 16, a second contact portion 18 and a first
- the second contact section 18 is connected to the first electrode 20 of the optoelectronic
- the first electrode 20 is electrically insulated from the first contact portion 16 by means of an electrical insulation barrier 21.
- an organic functional layer structure 22 of the optoelectronic layer structure is formed.
- the organic functional layer structure 22 may, for example, have one, two or more sub-layers, as explained in greater detail below with reference to FIG. About the organic functional
- Layer structure 22 is formed a conventional second electrode 23 of the optoelectronic layer structure, which is electrically coupled to the first contact portion 16.
- the first electrode 20 serves, for example, as the anode or cathode of the optoelectronic layer structure.
- Conventional second electrode 23 is used corresponding to the first electrode 20 as the cathode or anode of
- an encapsulation layer 24 of the optoelectronic layer structure is formed, which encapsulates the optoelectronic layer structure.
- Encapsulation layer 24 are above the first contact portion 16, a first recess of the encapsulation layer 24 and the second contact portion 18, a second recess of the
- Encapsulation layer 24 is formed. In the first recess of the encapsulation layer 24, a first contact region 32 is exposed and in the second recess of the Encapsulation layer 24, a second contact region 34 is exposed.
- the first contact region 32 serves for
- the adhesive layer 36 comprises, for example, an adhesive, for example an adhesive,
- a laminating adhesive for example, a laminating adhesive, a paint and / or a resin.
- a resin for example, a laminating adhesive, a paint and / or a resin.
- Cover body 38 is formed.
- the adhesive layer 36 serves to attach the cover body 38 to the
- the cover body 38 has
- the cover body 38 may be formed substantially of glass and a thin metal layer, such as a
- Metal foil and / or a graphite layer, such as a graphite laminate, have on the glass body.
- a graphite layer such as a graphite laminate
- Cover body 38 serves to protect the conventional
- cover body 38 may serve for distributing and / or dissipating heat, which in the conventional optoelectronic
- Component 1 is generated.
- the glass of the cover body 38 can serve as protection against external influences and the metal layer of the cover body 38 can be used for distributing and / or discharging during operation of the conventional
- the cover body 38, the adhesive layer 36 and / or the encapsulation layer may be referred to as a cover.
- the conventional optoelectronic component 1 can be any conventional optoelectronic component 1.
- Process step are exposed, for example by means of an ablation process, for example by means of
- Fig. 2 shows a detailed sectional view of a
- Component 1 according to FIG. 1.
- the conventional one is a mixture of
- Optoelectronic component 1 can be designed as a top emitter and / or bottom emitter. If the conventional optoelectronic component 1 is designed as a top emitter and bottom emitter, the conventional
- optoelectronic component 1 as an optically transparent component, for example a transparent organic compound
- the carrier 12 and the first electrode 20 are transparent or translucent. If that
- conventional optoelectronic component 1 is designed as a top emitter, so the cover, so the cover body 38, the second electrode 23 and the encapsulation layer 24 are transparent or translucent.
- the conventional optoelectronic component 1 has the carrier 12 and an active region above the carrier 12. Between the carrier 12 and the active region, a first, not shown, barrier layer, for example a first barrier thin layer, may be formed.
- Encapsulation layer 24 is formed.
- the encapsulation layer 24 may serve as a second barrier layer, for example as a second barrier layer Barrier thin film, be formed.
- the cover body 38 is arranged.
- the cover body 38 may, for example, by means of the adhesive layer 36 on the
- Encapsulation layer 24 may be arranged.
- the active region is an electrically and / or optically active region.
- the active region is, for example, the region of the conventional optoelectronic component 1 in which electric current flows for operating the conventional optoelectronic component 1 and / or in which electromagnetic radiation is generated by supplying electrical energy or electrical energy is generated by absorption of electromagnetic radiation.
- the organic functional layer structure 22 may include one, two or more functional layered structure units and one, two or more intermediate layers between them
- the carrier 12 may be translucent or transparent.
- the carrier 12 serves as a carrier element for electronic elements or layers, for example light-emitting elements.
- the carrier 12 may comprise or be formed, for example, glass, quartz, and / or a semiconductor material or any other suitable material.
- the carrier 12 may be a plastic film or a
- Laminate with one or more plastic films Laminate with one or more plastic films
- the plastic may have one or more polyolefins. Furthermore, the plastic may have one or more polyolefins. Furthermore, the plastic may have one or more polyolefins. Furthermore, the plastic may have one or more polyolefins. Furthermore, the plastic may have one or more polyolefins. Furthermore, the plastic may have one or more polyolefins. Furthermore, the plastic may have one or more polyolefins. Furthermore, the plastic may have one or more polyolefins. Furthermore, the
- the carrier 12 may comprise or be formed from a metal, for example copper, silver, gold, platinum, iron, for example a metal compound,
- the carrier 12 may be formed as a metal foil or metal-coated foil.
- the carrier 12 can be part of or form a mirror structure.
- the carrier 12 may have a mechanically rigid region and / or a mechanically flexible region or be formed in such a way.
- the first electrode 20 may be formed as an anode or as a cathode.
- the first electrode 20 may be translucent or transparent.
- the first electrode 20 comprises an electrically conductive material, for example metal and / or a conductive transparent oxide
- TCO transparent conductive oxide
- the first electrode 20 may comprise a layer stack of a combination of a layer of a metal on a layer of a TCO, or vice versa.
- An example is a silver layer deposited on an indium tin oxide (ITO) layer (Ag on ITO) or ITO-Ag-ITO multilayers.
- ITO indium tin oxide
- the metal for example, Ag, Pt, Au, Mg, Al, Ba, In, Ca, Sm or Li, as well as compounds, combinations or
- Transparent conductive oxides are transparent, conductive materials, for example metal oxides, such as, for example, zinc oxide, tin oxide, cadmium oxide, titanium oxide, indium oxide, or indium tin oxide (ITO).
- metal oxides such as, for example, zinc oxide, tin oxide, cadmium oxide, titanium oxide, indium oxide, or indium tin oxide (ITO).
- binary metal oxygen compounds such as ZnO, SnO 2 or In 2 O 3
- ternary metal oxygen compounds such as AlZnO, Zn 2 SnO 4, Cd SnO 3, Zn SnO 3, Mgln 204, GalnO 3, Zn 2 In 2 O 5 or In 4 Sn 3 O 12 or mixtures are also included
- the first electrode 20 may comprise, as an alternative or in addition to the materials mentioned: networks of metallic nanowires and particles, for example of Ag, networks of carbon nanotubes, graphene particles and layers and / or networks of semiconductive nanowires.
- the first electrode 20 may have or be formed from one of the following structures: a network of metallic nanowires, for example of Ag, which are combined with conductive polymers
- the first electrode 20 may comprise electrically conductive polymers or transition metal oxides.
- the first electrode 20 may, for example, have a layer thickness in a range of 10 nm to 500 nm,
- nm for example from 25 nm to 250 nm, for example from 50 nm to 100 nm.
- the first electrode 20 may be a first electrical
- the first electrical potential may be provided by a power source (not shown), such as a power source or a power source
- Electrode 20 are indirectly fed via the carrier 12.
- the first electrical potential may be, for example, the
- Ground potential or another predetermined reference potential is ground potential or another predetermined reference potential.
- the organic functional layer structure 22 may include a hole injection layer, a hole transport layer, a
- Emitter layer an electron transport layer and / or an electron injection layer.
- Refractive index in a range for example, from 1.7 to 1.8.
- the hole injection layer may be on or above the first
- Electrode 20 may be formed.
- the hole injection layer can one or more of the following materials: HAT-CN, Cu (I) pFBz, MoOx, WOx, VOx, ReOx, F4-TCNQ, NDP-2, NDP-9, Bi (III) pFBz, F16CuPc; NPB ( ⁇ , ⁇ '-bis (naphthalen-1-yl) -N, '-bis (phenyl) -benzidine); beta-NPB N, '-Bis (naphthalen-2-yl) -N,' -bis (phenyl) -benzidine); TPD (N, '- bis (3-methylphenyl) - N,' - bis (phenyl) benzidine); Spiro TPD (N, '- bis (3-methylphenyl) - N,' - bis (phenyl) benzidine); Spiro-NPB (N, 'bis (naphthalen-1-yl) -N,
- the hole injection layer may have a layer thickness in a range of about 10 nm to about 1000 nm, for example in a range of about 30 nm to about 300 nm, for example in a range of about 50 nm to about 200 nm.
- Hole transport layer may be formed.
- Hole transport layer may comprise or be formed from one or more of the following materials: NPB ( ⁇ , ⁇ '-bis (naphthalen-1-yl) -N, N'-bis (phenyl) benzidine); beta-NPB N, N'-bis (naphthalen-2-yl) -N, N'-bis (phenyl) -benzidine); TPD (',' - bis (3-methylphenyl) -N, '- bis (phenyl) benzidine); Spiro TPD (N, '- bis (3-methylphenyl) - N,' - bis (phenyl) benzidine); Spiro-NPB (N, 'bis (naphthalen-1-yl) -N,' -bis (phenyl) -spiro); DMFL-TPD ⁇ , ⁇ '-bis (3-methylphenyl) - ⁇ , ⁇ '-bis (phenyl) -9,9-dimethyl-fluorene); DM
- the hole transport layer may have a layer thickness in a range of about 5 nm to about 50 nm,
- nm for example in a range of about 10 nm to about 30 nm, for example about 20 nm.
- One or more emitter layers may be formed on or above the hole transport layer, for example with fluorescent and / or phosphorescent emitters.
- the emitter layer may be organic polymers, organic
- the emitter layer may comprise or be formed from one or more of the following materials: organic or organometallic
- the emitter materials may suitably be in one
- Embedded matrix material for example a technical ceramic or a polymer, for example an epoxy, or a silicone.
- the first emitter layer may have a layer thickness in a range of about 5 nm to about 50 nm
- nm for example in a range of about 10 nm to about 30 nm, for example about 20 nm.
- the emitter layer may have single-color or different-colored (for example blue and yellow or blue, green and red) emitting emitter materials.
- the emitter layer may have single-color or different-colored (for example blue and yellow or blue, green and red) emitting emitter materials.
- Emitter layer have multiple sub-layers that emit light of different colors. By mixing the different colors, the emission of light can result in a white color impression. Alternatively or additionally, it can be provided in the beam path of the primary emission generated by these layers
- the electron transport layer may include or be formed from one or more of the following materials: NET-18; 2, 2 ', 2 "- (1, 3, 5-benzyltriyl) tris (1-phenyl-1H-benzimidazoles); 2- (4-biphenylyl) -5- (4-tert-butylphenyl) -1, 3 , 4-oxadiazoles, 2, 9-dimethyl-4,7-diphenyl-l, 10-phenanthrolines (BCP), 8-hydroxyquinolinolato-lithium, 4- (naphthalen-1-yl) -3, 5-diphenyl-4H- l, 2, 4-triazoles; 1, 3-bis [2- (2,2'-bipyridine-6-yl) -1,3,4-oxadiazo-5-yl] benzene; 4,7-diphenyl-1 , 10-phenanthrolines (BPhen); 3- (4-biphenylyl) -4-phenyl-5
- the electron transport layer may have a layer thickness
- nm in a range of about 5 nm to about 50 nm, for example, in a range of about 10 nm to about 30 nm, for example about 20 nm.
- Electron injection layer may be formed.
- the Electron injection layer may include or may be formed of one or more of the following materials: NDN-26, MgAg, Cs 2 CO 3, Cs 3 PO 4, Na, Ca, K, Mg, Cs, Li, LiF; 2, 2 ', 2 "- (1,3,5-benzene triyl) tris (1-phenyl-1-H-benzimidazoles); 2- (4-biphenylyl) -5- (4-tert-butylphenyl) -1 , 3, 4-oxadiazoles, 2, 9-dimethyl-4,7-diphenyl-l, 10-phenanthrolines (BCP), 8-hydroxyquinolinolato-lithium, 4- (naphthalen-1-yl) -3, 5-diphenyl- 4H-1,2,4-triazoles; 1,3-bis [2- (2,2'-bipyridine-6-yl) -1,3,4-oxadiazo-5-yl] benzene; 4,
- the electron injection layer may have a layer thickness in a range of about 5 nm to about 200 nm, for example in a range of about 20 nm to about 50 nm, for example about 30 nm.
- organic functional layer structure 22 having two or more organic functional layer structure units
- corresponding intermediate layers may be interposed between the organic functional layer structure units
- Layered structure units may each individually separate according to an embodiment of the above organic functional layer structure 22 may be formed.
- the intermediate layer may be formed as an intermediate electrode.
- the intermediate electrode may be electrically connected to an external voltage source.
- the external voltage source can be at the intermediate electrode
- the intermediate electrode can also have no external electrical connection, for example by the intermediate electrode having a floating electrical potential.
- the organic functional layer structure unit may, for example, have a layer thickness of at most approximately 3 ⁇ m, for example a layer thickness of at most approximately 1 ⁇ m, for example a layer thickness of approximately approximately 300 nm.
- the conventional optoelectronic component 1 can optionally have further functional layers, for example arranged on or above the one or more
- Electron transport layer The other functional
- Layers can be, for example, internal or external coupling / decoupling structures that enhance the functionality and thus the efficiency of the conventional optoelectronic
- Component 10 can further improve.
- the conventional second electrode 23 may be formed according to any of the configurations of the first electrode 20, wherein the first electrode 20 and the conventional second electrode 23 may be the same or different.
- the conventional second electrode 23 may be formed as an anode or as a cathode.
- the conventional second electrode 23 may have a second electrical connection to which a second electrical potential can be applied.
- the second electrical potential may be provided by the same or a different energy source as the first electrical potential.
- the second electrical Potential may be different from the first electrical potential.
- the second electrical potential can be formed according to any of the configurations of the first electrode 20, wherein the first electrode 20 and the conventional second electrode 23 may be the same or different.
- the conventional second electrode 23 may be formed as an anode or as a cathode.
- the conventional second electrode 23 may have a second electrical connection to which a second electrical potential can be applied.
- the second electrical potential may be provided by the same or a different energy source as the first electrical potential.
- the second electrical Potential may be different from the first electrical potential
- Difference from the first electrical potential has a value in a range of about 1.5 V to about 20 V, for example, a value in a range of about 2.5 V to about 15 V, for example, a value in a range of about 3 V. to about 12 V.
- the encapsulation layer 24 may also be referred to as
- Thin-layer encapsulation may be referred to.
- Encapsulation layer 24 may be translucent or
- Then be formed transparent layer.
- Encapsulation layer 24 forms a barrier to chemical contaminants or atmospheric agents, especially to water (moisture) and oxygen.
- the encapsulation layer 24 is designed such that it can be damaged by substances which can damage the optoelectronic component, for example water,
- Oxygen or solvent not or at most can be penetrated at very low levels.
- Encapsulation layer 24 may be formed as a single layer, a layer stack, or a layered structure.
- the encapsulation layer 24 may include or be formed from: alumina, zinc oxide, zirconia,
- Indium tin oxide Indium tin oxide, indium zinc oxide, aluminum doped zinc oxide, poly (p-phenylene terephthalamide), nylon 66, and mixtures and alloys thereof.
- the encapsulation layer 24 may have a layer thickness of about 0.1 nm (one atomic layer) to about 1000 nm
- the encapsulation layer 24 may include a high refractive index material, such as one or more materials a high refractive index, for example with a
- the first barrier layer on the support 12 corresponding to a configuration of
- Encapsulation layer 24 may be formed.
- the encapsulation layer 24 may be formed, for example, by a suitable deposition method, e.g. by atomic layer deposition (ALD), e.g. a plasma-assisted ALD method.
- ALD atomic layer deposition
- plasma-assisted ALD atomic layer deposition
- PEALD Plasma Enhanced Atomic Layer Deposition
- CVD plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-assisted plasma-
- PECVD Plasma Enhanced Chemical Vapor Deposition
- a coupling or decoupling layer is any suitable deposition method.
- a coupling or decoupling layer is any suitable deposition method.
- the input / outcoupling layer may have a matrix and scattering centers distributed therein, wherein the average refractive index of the input / outcoupling layer is greater than the mean refractive index of the layer from which the electromagnetic radiation is provided. Furthermore, one or more can additionally
- the adhesive layer 36 may comprise, for example, adhesive and / or lacquer, by means of which the cover body 38 for example, arranged on the encapsulation layer 24, for example glued, is.
- the adhesive layer 36 may be transparent or translucent.
- Adhesive layer 36 may, for example, comprise particles which scatter electromagnetic radiation, for example light-scattering particles. As a result, the adhesive layer 36 can act as a scattering layer and lead to an improvement in the color angle distortion and the coupling-out efficiency. As light-scattering particles, dielectric
- Metal oxide for example, silicon oxide (SiO 2), zinc oxide (ZnO), zirconium oxide (ZrO 2), indium tin oxide (ITO) or indium zinc oxide (IZO), gallium oxide (Ga 2 Ox) aluminum oxide, or titanium oxide.
- Other particles may also be suitable provided they have a refractive index that is different from the effective refractive index of the matrix of the adhesive layer 36
- nanoparticles for example, air bubbles, acrylate, or glass bubbles.
- metallic nanoparticles metals such as gold, silver, iron nanoparticles, or the like may be provided as light-scattering particles.
- the adhesive layer 36 may have a layer thickness greater than 1 ym, for example, a layer thickness of several ym.
- the adhesive may be a lamination adhesive.
- the adhesive layer 36 may have a refractive index that is less than the refractive index of the cover body 38.
- the adhesive layer 36 may include, for example, a
- the adhesive layer 36 may also have a
- high refractive adhesive for example, has high refractive, non-diffusing particles and has a coating thickness-averaged refractive index
- functional layer structure 22 corresponds, for example in a range of about 1.6 to 2.5, for example from 1.7 to about 2.0.
- the active area On or above the active area may be a so-called
- Getter layer or getter structure i. a laterally structured getter layer (not shown) may be arranged.
- the getter layer can be translucent, transparent or opaque.
- the getter layer may include or be formed from a material that includes fabrics
- a getter layer may include or be formed from a zeolite derivative.
- the getter layer may have a layer thickness greater than 1 ym,
- a layer thickness of several ym for example, a layer thickness of several ym.
- the getter layer may comprise a lamination adhesive or in the
- the covering body 38 can be formed, for example, by a glass body, a metal foil or a sealed plastic film covering body.
- the cover body 38 can be formed, for example, by a glass body, a metal foil or a sealed plastic film covering body.
- the cover body 38 may, for example, a
- FIG. 3 shows a sectional view of a layer structure of an exemplary embodiment of an optoelectronic device
- the optoelectronic component 10 The optoelectronic component 10
- the layer structure of the optoelectronic component 10 can to a large extent be the one above
- the optoelectronic component 10 has instead of the
- the electrode structure 40 has a higher reflectivity than the conventional second electrode 23, whereby the coupling-out efficiency and thus the efficiency of the optoelectronic component 10 are increased compared to the conventional optoelectronic component 1.
- FIG. 4 shows a detailed view of the layer structure according to FIG. 3, in particular the organic functional layer structure 22 and the second electrode structure 40.
- the second electrode structure 40 has a
- the second electrode structure 40 further includes a TIR layer 44 overlying the TIR layer 44
- the second electrode structure 40 has a
- Stromleitieri 48 which electrically couple the Stromzuniz für für 46 with the current distribution layer 42.
- the current conducting elements 48 extend, for example, from the current supply layer 46 through the TIR layer 44 to the current distribution layer 42.
- the current conducting elements 48 can be flush with one of the TIR layers 44
- the current distribution layer 42 may be made particularly thin as compared with the TIR layer 44.
- the power distribution layer 42 may be made so thin be that their refractive index for the light generated in the organic functional layer structure 22 at the transition to the TIR layer 44 is not relevant or at least negligible.
- the TIR layer 44 may be made so thin be that their refractive index for the light generated in the organic functional layer structure 22 at the transition to the TIR layer 44 is not relevant or at least negligible.
- the Current distribution layer 42 have a thickness that is significantly smaller than the wavelength of the light generated.
- the current distribution layer 42 may be transparent or translucent, for example.
- the power distribution layer 42 may be, for example
- nanostructures may be, for example, nanowires or
- the nanostructures can be any shape.
- the nanostructures can be any shape.
- the nanowires may comprise, for example, silver nanowires.
- the current distribution layer 42 may include one or more conductive ALD or CVD layers, that is, layers formed by ALD (Atomic Layer Deposition) or CVD (Chemical Vapor Deposition).
- ALD Atomic Layer Deposition
- CVD Chemical Vapor Deposition
- Such layer may, for example, a TCO, as in
- the current distribution layer 42 may have a thickness in a range, for example, from 1 nm to 50 nm,
- Current distribution layer 42 may be an electrical
- the current distribution layer 42 serves to supply the current supplied to it from the current supply layer 46 via the current conducting elements 48 via the interface which connects it with the current distribution layer 42
- the power distribution layer 42 may
- the optoelectronic device 10 generated on it incident light absorbed.
- the TIR layer 44 is, for example, transparent and / or electrically insulating.
- the TIR layer 44 has a second refractive index which is smaller than the first refractive index of the organic functional layer structure 22.
- the first lies
- Refractive index is less than 1.7.
- the TIR layer 44 has a lower refractive index than the layer of the organic functional layer structure 22 which adjoins the current distribution layer 42.
- the second refractive index may be, for example, in a range of, for example, 1 to 1.48, 1 to 1.3, for example, 1 to 1.2, for example, 1 to 1.1.
- the TIR layer 44 may comprise, for example, a plastic, for example a synthetic resin, for example an epoxy, for example epoxy resin. Alternatively or additionally, the TIR layer 44 may be foamed.
- the material of the TIR layer 44 may be foamed with the aid of air or nitrogen, so that a large volume fraction of the TIR layer 44 consists of air or nitrogen-filled cavities. Such cavities have the refractive index 1 and contribute to the particularly low refractive index of the entire TIR layer 44 at.
- the material of the TIR layer 44 for example, epoxy, a polymer and / or acrylate
- the TIR layer 44 may include nanostructures, such as nanotubes
- the nanotubes may be silica or
- the nanotubes have a particularly high volume fraction of cavities formed, for example, within the nanotubes or between the nanotubes, for example between different nanotubes. These cavities can turn with air or Nitrogen, which contributes to the second refractive index of the TIR layer 44 being one or at least nearly one.
- the TIR layer 44 may include or be formed from a metal fluoride, for example, aluminum fluoride having a refractive index of 1.35, or a metal oxide.
- the metal fluoride or metal oxide TIR layer 44 can be formed, for example, in a sol-gel process.
- a nano-porous material may be formed which has pores whose size is, for example, less than 100 nm, for example less than 50 nm, for example less than 10 nm, for example an airgel.
- the TIR layer 44 may be formed such that structures of the TIR layer 44, such as pores or nanostructures, are smaller than the wavelength of the TIR layer 44
- the TIR layer 44 may be formed by a cavity.
- the TIR layer 44 may be an air or gas cushion and / or an air ⁇ or an air cushion, so an air or a gas layer.
- the second refractive index is 1, which is a high proportion of
- the current-conducting elements 48 are designed to be stable in such a way that they can serve as spacers between the current distribution layer 42 and the current supply layer 46.
- the TIR layer 44 serves a particularly large
- the particularly large refractive index jump causes a large proportion of the organic
- Total reflection depends on the size of the refractive index jump and decreases with increasing size of the refractive index jump. That means that with increasing size of the
- Refractive index jump of the critical angle of total reflection is smaller and an increasing portion of the light has an angle of incidence which is greater than the critical angle, and a correspondingly increasing proportion of the light generated at the interface is totally reflected.
- the Stromzu slaughterhouse slaughter 46 may with respect to their construction and / or material according to an embodiment of the
- Component 1 illustrated second electrode 23 may be formed.
- the Stromzutechnischmaschinench 46 may include or be formed from silver.
- the current-conducting elements 48 have an electrically conductive material.
- the current conducting elements 48 may be made of a hard material
- Then be formed for example of solder or copper.
- Current-conducting elements 48 are embedded in the TIR layer 44 and enclosed in FIG. 4 in the horizontal direction by the material of the TIR layer 44. Alternative to the two
- Stromleitierin 48 may be only one Stromleitelement 48 or it may be more than two, for example, three, four or more Stromleitmaschine 48 may be arranged.
- Fig. 5 shows a simplified representation of
- FIG. 5 also shows exemplary light paths of the
- Layer structure 22 is generated. For reasons of better representability, only light paths are shown which originate at a central point in the organic functional layer structure 22. In fact, however, in the operation of the optoelectronic component 10, the light in the organic functional layer structure 22 is generated within a large areal area, as a result of which a plurality of light paths which can not be represented graphically are formed.
- First light paths 50 represent the light that is generated in the organic functional layer structure 22 and toward the TIR layer 44 and the
- Stromzu classroom für Faculty für Faculty 46 is radiated.
- a first portion of the light passing along the first light paths 50 in particular the first portion of the light whose angle of incidence is smaller than the critical angle of total reflection at the interface of the TIR layer 44, enters the TIR layer 44 becomes this interface is refracted and continues along second light paths 52 toward the current delivery layer 46.
- the light passing through the TIR layer 44 along the second light paths 52 strikes the
- Stromzutechnischmaschinetechnischmaschinerium für Anlagen 46 is formed of silver, for example, 92% of the light along the second
- the light reflected at the power supply layer 46 can be
- functional layer structure 22 is generated and extends along the first light paths 50, meets in one
- Layer structure 22 are emitted through the first electrode 20, through the carrier 12 and out of the optoelectronic component 10 out.
- the total reflection 56 takes place almost without loss, so that approximately the entire second portion of the light is reflected back. Together with the reflection at the current supply layer 46, this results in a total reflectivity of the second electrode structure 40, which is significantly increased in comparison to the reflectivity of the conventional second electrode 23. For example, an average reflectivity of the second
- Electrode structure 40 can be achieved, for example, 96%. This can help improve the efficiency of the business
- optoelectronic component 10 is particularly high.
- FIG. 6 shows a flow chart of an exemplary embodiment of a method for producing an optoelectronic component, for example the optoelectronic component 10 explained above.
- a carrier is provided,
- the above-described carrier 12 may, for example, a forming of the carrier 12, for example from a
- step S2 optionally one or more barrier layers,
- Decoupling layers for example, scattering layers and / or other intermediate layers are formed on the carrier 12.
- an electrode for example, the first electrode 20 explained above, is formed over the carrier 12.
- the first electrode 20 can be any electrode, for example, the first electrode 20 explained above.
- step S6 becomes an organic functional
- the organic functional layer structure 22 may be deposited in layers or
- the above-described current distribution layer 42 is formed over the organic functional layer structure 22.
- Current distribution layer 42 may be formed, for example, by electrically conductive elements, such as the electrically conductive nanostructures, in a
- organic functional layer structure 22 is applied.
- the carrier liquid of the suspension can subsequently be partially or completely removed, for example by means of drying or evaporation.
- a drying or curing material which cures after application to the organic functional layer structure 22 may be used as the carrier liquid.
- a TIR layer is formed.
- the material of the TIR layer 44 may, for example, on the
- Power distribution layer 42 are foamed
- the TIR layer 44 may be formed by a
- Current-conducting elements 48 can be filled and / or introduced into the TIR layer 44.
- steps S10 and S12 are executed may vary depending on how
- Stromleitieri 48 are formed. Alternatively, for example, if step S12 is performed first, and then step S10 is performed, first forming the current-conducting elements 48 and subsequently forming the TIR layer 44, the current-conducting elements 48 may be implemented
- solder pads are formed on the current distribution layer 42 by applying an electrically conductive adhesive, such as a dot, to the current distribution layer 42, or by forming solid small electrically conductive elements.
- an electrically conductive adhesive such as a dot
- the TIR layer 44 may be formed around the current conducting elements 48.
- the current conducting elements 48 may first be formed as spacers, and subsequently the current supplying layer 46 may be applied to the current conducting elements 48 such that between the current supplying layer 46 and the current distribution layer 42 Cavity remains.
- the TIR layer 44 and the Stromleitium 48 are formed simultaneously.
- the TIR layer 44 and the
- Stromleitieri 48 are formed in one step, for example by means of a printing process.
- a current supply layer is formed over the TIR layer 44, for example, the
- the conventional second electrode 23 may be formed.
- the encapsulation layer 24, the adhesive layer 36 and / or the covering body 38 can be arranged and / or formed over the current supply layer 46, for example.
- FIG. 7 shows a flow diagram of an embodiment of an alternative method for producing a
- the steps S20 to S26 may, for example, analogously to the steps S2 to S8 of the above
- Process be processed.
- a current distribution layer is formed, for example, the above-described current distribution layer 42.
- the current distribution layer 42 may be formed, for example, according to step S8 over the organic functional layer structure 22.
- the step S26 may be formed after a step S34.
- the step S26 may be formed after a step S34.
- the cover may be provided.
- the cover the cover body 38, the adhesive layer 36 and / or the
- Encapsulation layer 44 have.
- the Stromzu semiconductor slaughter 46 over the cover, for example, formed directly on the cover.
- the Stromzu rapidly growing 46 can be deposited on the cover.
- the power supply layer 46 may be formed according to a configuration of the conventional second conventional electrode 23.
- the TIR layer 44 is overlaid over the
- Power supply layer 46 is formed.
- the formation of the TIR layer 44 in the step S32 may be substantially analogous to the formation of the TIR layer 44 over the
- Steps S10 and S12 take place.
- the steps S10 and S12 take place.
- step S26 may now be performed, and the current distribution layer 42 may be formed over the TIR layer 44.
- step S28 the cover with the
- Current-conducting elements 48 are arranged above the support 12 such that the current-conducting elements 48, the current supply layer 46 and the current distribution layer 42 are electrically coupled to one another.
- the cover is arranged so that the cover body 38 of the organic functional
- FIG. 8 shows a detailed view of a
- Optoelectronic component 10 The individual layers can be formed per se, for example, according to one of the above-described embodiment of the corresponding layers, but the layers can be arranged in a different sequence.
- the layer structure has a first alternative or in addition to the first electrode 20
- the first electrode structure 40 has the current distribution layer 42, wherein the
- the first electrode structure 60 further comprises the TIR layer 44, wherein the TIR layer 44 is formed under the current distribution layer 42, for example, directly below the current distribution layer 42. Furthermore, the first electrode structure 60 has the current supply layer 46, the current supply layer 46 under the TIR layer 44, for example directly under the TIR layer 44,
- the first electrode structure 60 has the current conducting elements 48 which electrically couple the current supply layer 46 to the current distribution layer 42.
- the current conducting elements 48 extend, for example, from the current supply layer 46 through the TIR layer 44 to the current distribution layer 42.
- the current conducting elements 48 can be flush with one of the TIR layers 44 Close the interface of the power distribution layer 42 or may be partially or completely through the
- the current distribution layer 42 extend therethrough.
- the current distribution layer 42 may be made particularly thin as compared with the TIR layer 44.
- the current distribution layer 42 may be made so thin that its refractive index for the light generated in the organic functional layer structure 22 is not relevant or at least negligible in the transition to the TIR layer 44.
- the current distribution layer 42 may be made so thin that its refractive index for the light generated in the organic functional layer structure 22 is not relevant or at least negligible in the transition to the TIR layer 44.
- Current distribution layer 42 have a thickness that is significantly smaller than the wavelength of the light generated.
- the current distribution layer 42 may be transparent or translucent, for example.
- the power distribution layer 42 may be, for example
- the nanostructures may be, for example, nanowires or
- the nanostructures can be any shape.
- the nanostructures can be any shape.
- the nanowires may comprise, for example, silver nanowires.
- the current distribution layer 42 may include one or more conductive ALD or CVD layers, that is, layers formed by ALD (Atomic Layer Deposition) or CVD (Chemical Vapor Deposition).
- ALD Atomic Layer Deposition
- CVD Chemical Vapor Deposition
- Such layer may, for example, a TCO, as in
- the current distribution layer 42 may have a thickness in a range, for example, from 1 nm to 50 nm,
- Current distribution layer 42 may be an electrical
- the current distribution layer 42 serves to supply the current supplied to it from the current supply layer 46 via the current conducting elements 48 via the interface which connects it with the current distribution layer 42
- the power distribution layer 42 may
- the TIR layer 44 is, for example, transparent and / or electrically insulating.
- the TIR layer 44 has a second refractive index which is smaller than the first refractive index of the organic functional layer structure 22.
- the first lies
- Refractive index is less than 1.7.
- the TIR layer 44 has a lower refractive index than the layer of the organic functional layer structure 22 which adjoins the current distribution layer 42.
- the second refractive index may be, for example, in a range, for example, from 1 to 1.48, for example from 1 to 1.3, for example from 1 to 1.2, for example from 1 to 1.1.
- the TIR layer 44 may comprise, for example, a plastic, for example a synthetic resin, for example an epoxy, for example epoxy resin. Alternatively or
- the TIR layer 44 may be foamed.
- the material of the TIR layer 44 may be foamed with the aid of air or nitrogen, so that a large volume fraction of the TIR layer 44 consists of air or nitrogen-filled cavities. Such cavities have the refractive index 1 and contribute to the particularly low refractive index of the entire TIR layer 44 at.
- the material of the TIR layer 44 for example, epoxy, a polymer and / or acrylate
- the TIR Layer 44 nanostructures for example nanotubes
- the nanotubes may be silica or
- the nanotubes have a particularly high volume fraction of cavities, for example, within the nanotubes or between the nanotubes, for example between different nanotubes,
- the TIR layer 44 may include or be formed from a metal fluoride, for example, aluminum fluoride having a refractive index of 1.35, or a metal oxide.
- the metal fluoride or metal oxide TIR layer 44 can be formed, for example, in a sol-gel process.
- a nano-porous material may be formed which has pores whose size is, for example, less than 100 nm, for example less than 50 nm, for example less than 10 nm, for example an airgel.
- the TIR layer 44 may be formed such that structures of the TIR layer 44, such as pores or nanostructures, are smaller than the wavelength of the TIR layer 44
- the TIR layer 44 may be formed by a cavity.
- the TIR layer 44 may be an air or gas cushion and / or an air ⁇ or an air cushion, so an air ⁇ or a gas layer.
- the second refractive index is 1, which is a high proportion of
- the current-conducting elements 48 are designed to be stable in such a way that they can serve as spacers between the current distribution layer 42 and the current supply layer 46.
- the TIR layer 44 serves a particularly large
- the particularly large refractive index jump causes a large proportion of the organic
- Total reflection depends on the size of the refractive index jump and decreases with increasing size of the refractive index jump. That means that with increasing size of the
- Refractive index jump of the critical angle of total reflection is smaller and an increasing portion of the light has an angle of incidence which is greater than the critical angle, and a correspondingly increasing proportion of the light generated at the interface is totally reflected.
- the Stromzu slaughterhouse slaughter 46 may with respect to their construction and / or material according to an embodiment of the
- Component 1 illustrated first electrode 20 may be formed.
- the Stromzugot slaughter 46 may include or be formed from silver.
- the current-conducting elements 48 have an electrically conductive material.
- the current conducting elements 48 may be made of a hard material
- the current conducting elements 48 are embedded in the TIR layer 44 and enclosed in Figure 4 in the horizontal direction by the material of the TIR layer 44. Alternative to the two
- Stromleitiumn 48 may be only one Stromleitelement 48 or it may be more than two, for example, three, four or more Stromleitmaschine 48 may be arranged.
- FIG 9 shows a flow chart of an exemplary embodiment of a method for producing an optoelectronic component, for example the optoelectronic component 10 explained above.
- a carrier is provided,
- the above-described carrier 12 may, for example, a forming of the carrier 12, for example from a
- step S2 optionally one or more
- Stray layers and / or other intermediate layers are formed on the carrier 12.
- the power supply layer 46 is formed over the carrier 12.
- the Stromzu slaughter 46 may, for example, according to an embodiment of
- step S44 current-conducting elements are formed, for example those explained above
- a TIR layer is formed.
- Power supply layer 46 is formed.
- the material of the TIR layer 44 may be deposited on or printed on the current delivery layer 46.
- the material of the TIR layer 44 is foamed prior to application or after application to the Stromzu réelle für
- the TIR layer 44 may be formed by providing a void, particularly a free volume, over the current delivery layer 46.
- steps S44 and S46 are executed may vary depending on how
- Stromleitieri 48 are formed. For example, if step S44 is performed first, then step S46, first forming the current conducting elements 48 and subsequently forming the TIR layer 44, the current conducting elements 48 may be formed, for example, by depositing soldering points on the current distribution layer 42 electrically conductive
- Adhesive for example, punctually, on the
- Current distribution layer 42 is applied, or by solid small electrically conductive elements, for example
- the TIR layer 44 may be formed around the current conducting elements 48.
- the current conducting elements 48 may first be formed as spacers, and subsequently the current supplying layer 46 may be applied to the current conducting elements 48 such that between the current supplying layer 46 and the current distribution layer 42 Cavity remains.
- step S46 is performed first, and then step S44 is performed by first forming the TIR layer 44 and subsequently forming the current conducting elements 48, holes may be formed in the TIR layer 42, for example, and the material of FIG
- Stromleitieri 48 can be filled or introduced into the TIR layer 44.
- steps S44 and S46 may be formed simultaneously and the TIR layer 44 and the
- Conductive elements 48 can be formed simultaneously and / or in one work step, for example by means of a printing process.
- a current distribution layer is formed.
- the above-described power distribution layer 42 is formed.
- Current distribution layer 42 may be formed, for example, by electrically conductive elements, such as the electrically conductive nanostructures, in a
- Suspension can subsequently be partially or completely removed, for example by means of drying or
- a drying or curing material which cures after application to the TIR layer 44 can be used as the carrier liquid.
- Layer structure 22 are formed, for example, the above-explained organic functional
- Layer structure 22 may, for example, over the
- Current distribution layer 42 may be formed, for example, directly on the current distribution layer 42.
- the organic functional layer structure 22 may be deposited in layers or printed in layers.
- a transparent electrode is formed.
- the second electrode 23 becomes translucent over the organic functional
- the second electrode 23 may, for example, be deposited over the carrier 12 or printed thereon.
- the encapsulation layer 24, the adhesive layer 36 and / or the cover body 38 can be arranged and / or formed over the second electrode 23, for example.
- FIG. 10 shows a flow chart of one embodiment of an alternative method of manufacturing a
- the steps S60 to S66 may, for example, be analogous to the steps S40 to S46 of the above
- Process be processed.
- the formation of the TIR layer 44 and the Stromleitance 48 for example, analogous to the formation of the
- Steps S44 and S46 take place.
- the steps S44 and S46 take place.
- a current distribution layer is formed.
- the above-described power distribution layer 42 is formed.
- Current distribution layer 42 may be formed according to step S48, for example, over TIR layer 44.
- step S68 may be formed after step S74.
- the process of forming current distribution layer 42 may be performed according to step S48, for example, over TIR layer 44.
- step S68 may be formed after step S74.
- the cover may be provided.
- the cover the cover body 38, the adhesive layer 36 and / or the
- Encapsulation layer 44 have.
- a light-transmissive electrode is formed.
- the above-described second electrode 23 is placed over the cover,
- the second electrode 23 may be deposited on the cover.
- the second electrode 23 may be deposited on the cover.
- the conventional second conventional electrode 23 may be formed.
- the formation of the organic functional layer structure 22 in the step S74 may be substantially analogous to the formation of the organic functional
- step S68 may now be performed and the current distribution layer 42 may be over the organic
- the optoelectronic component 10 can have a plurality of organic compounds
- the optoelectronic component 10 may deviate from the outer shape of the outer shape of the conventional optoelectronic component 1 shown in FIG.
- the cover body 38 may extend as far as an outer edge of the carrier 12 and the contact regions 32, 34 may be exposed in corresponding recesses of the cover body 38.
- the methods explained with reference to FIGS. 6, 7, 9, 10 may have fewer or more steps, for example for producing coupling-out layers, not shown, or the like.
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Abstract
Description
Claims
Priority Applications (2)
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KR1020167013430A KR20160075628A (ko) | 2013-10-24 | 2014-10-22 | 광전자 컴포넌트 및 광전자 컴포넌트를 생성하기 위한 방법 |
US15/030,901 US20160268550A1 (en) | 2013-10-24 | 2014-10-22 | Optoelectronic component and method for producing an optoelectronic component |
Applications Claiming Priority (2)
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DE201310111739 DE102013111739A1 (de) | 2013-10-24 | 2013-10-24 | Optoelektronisches Bauelement und Verfahren zum Herstellen eines optoelektronischen Bauelements |
DE102013111739.2 | 2013-10-24 |
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WO2015059203A1 true WO2015059203A1 (de) | 2015-04-30 |
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US (1) | US20160268550A1 (de) |
KR (1) | KR20160075628A (de) |
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WO (1) | WO2015059203A1 (de) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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DE102008054219A1 (de) * | 2008-10-31 | 2010-05-06 | Osram Opto Semiconductors Gmbh | Organisches strahlungsemittierendes Bauelement und Verfahren zur Herstellung eines organischen strahlungsemittierenden Bauelements |
DE102009047883A1 (de) * | 2009-09-30 | 2011-03-31 | Osram Opto Semiconductors Gmbh | Optoelektronisches organisches Bauelement und Verfahren zu dessen Herstellung |
US20120161115A1 (en) * | 2010-12-24 | 2012-06-28 | Semiconductor Energy Laboratory Co., Ltd. | Light-Emitting Device and Lighting Device |
Family Cites Families (10)
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EP1242849B1 (de) * | 1999-12-17 | 2007-02-21 | Osram Opto Semiconductors GmbH | Verbesserte kapselung organischer led-vorrichtungen |
US6580090B2 (en) * | 2001-06-22 | 2003-06-17 | International Business Machines Corporation | Organic light-emitting devices |
US6965197B2 (en) * | 2002-10-01 | 2005-11-15 | Eastman Kodak Company | Organic light-emitting device having enhanced light extraction efficiency |
WO2004089042A1 (ja) * | 2003-03-12 | 2004-10-14 | Mitsubishi Chemical Corporation | エレクトロルミネッセンス素子 |
US20080001538A1 (en) * | 2006-06-29 | 2008-01-03 | Cok Ronald S | Led device having improved light output |
DE102007000791A1 (de) * | 2007-09-28 | 2009-04-02 | Universität Köln | Verfahren zur Herstellung einer organischen Leuchtdiode oder einer organischen Solarzelle und hergestellte organische Leuchtdioden oder Solarzellen |
DE102009046755A1 (de) * | 2009-11-17 | 2011-05-26 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Organisches photoelektrisches Bauelement |
US20140061617A1 (en) * | 2011-04-05 | 2014-03-06 | University Of Florida Research Foundation, Inc. | Method and apparatus for integrating an infrared (hr) pholovoltaic cell on a thin photovoltaic cell |
DE102011079048A1 (de) * | 2011-07-13 | 2013-01-17 | Osram Opto Semiconductors Gmbh | Lichtemittierende bauelemente und verfahren zum herstellen eines lichtemittierenden bauelements |
JP2014078499A (ja) * | 2012-09-20 | 2014-05-01 | Toshiba Corp | 有機電界発光素子および発光装置 |
-
2013
- 2013-10-24 DE DE201310111739 patent/DE102013111739A1/de active Granted
-
2014
- 2014-10-22 US US15/030,901 patent/US20160268550A1/en not_active Abandoned
- 2014-10-22 WO PCT/EP2014/072673 patent/WO2015059203A1/de active Application Filing
- 2014-10-22 KR KR1020167013430A patent/KR20160075628A/ko not_active Application Discontinuation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102008054219A1 (de) * | 2008-10-31 | 2010-05-06 | Osram Opto Semiconductors Gmbh | Organisches strahlungsemittierendes Bauelement und Verfahren zur Herstellung eines organischen strahlungsemittierenden Bauelements |
DE102009047883A1 (de) * | 2009-09-30 | 2011-03-31 | Osram Opto Semiconductors Gmbh | Optoelektronisches organisches Bauelement und Verfahren zu dessen Herstellung |
US20120161115A1 (en) * | 2010-12-24 | 2012-06-28 | Semiconductor Energy Laboratory Co., Ltd. | Light-Emitting Device and Lighting Device |
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KR20160075628A (ko) | 2016-06-29 |
US20160268550A1 (en) | 2016-09-15 |
DE102013111739A1 (de) | 2015-04-30 |
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