WO2015046746A1 - 도가니 및 이를 포함하는 잉곳성장장치 - Google Patents
도가니 및 이를 포함하는 잉곳성장장치 Download PDFInfo
- Publication number
- WO2015046746A1 WO2015046746A1 PCT/KR2014/007282 KR2014007282W WO2015046746A1 WO 2015046746 A1 WO2015046746 A1 WO 2015046746A1 KR 2014007282 W KR2014007282 W KR 2014007282W WO 2015046746 A1 WO2015046746 A1 WO 2015046746A1
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- WIPO (PCT)
- Prior art keywords
- crucible
- graphite crucible
- inert gas
- graphite
- inner body
- Prior art date
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Classifications
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
- C30B15/22—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/10—Crucibles or containers for supporting the melt
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/14—Heating of the melt or the crystallised materials
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
Definitions
- the present invention relates to a crucible and an ingot growth apparatus including the same, and more particularly, to a crucible and an ingot growth apparatus capable of further improving the thermal insulation of the crucible.
- polysilicon is charged into a quartz crucible, heated and melted by a graphite heating element, and then the seed crystals are brought into contact with the silicon melt formed as a result of melting, and crystallization occurs at the interface to gradually raise the seed crystals while rotating them. Thereby growing a silicon single crystal ingot having a desired diameter.
- the present invention is to solve the above problems, it is to propose an ingot growth apparatus to prevent the phenomenon that deterioration is concentrated on a specific portion of the crucible by insulating the inside of the graphite crucible when heating the polysilicon.
- a quartz crucible in which the silicon melt is accommodated;
- Graphite crucible in which the quartz crucible is accommodated;
- a crucible pedestal for supporting a lower portion of the graphite crucible;
- a heater unit for providing heat to the graphite crucible side, wherein the graphite crucible is formed of an inner body contacting the quartz crucible, and an outer body disposed at a predetermined distance from the inner body, and An inert gas layer in which an inert gas is injected is formed between the outer bodies.
- 1 is a view showing the ingot growth apparatus of this embodiment.
- FIG. 2 shows a cross section of the crucible and components around the crucible of this embodiment.
- FIG 4 is a view showing a heater applying heat to the crucible without the inert gas layer of the present embodiment.
- FIG. 5 is a diagram illustrating a heater applying heat to a crucible having an inert gas layer according to the present embodiment.
- 1 is a view showing the ingot growth apparatus of this embodiment.
- the ingot growth apparatus includes a quartz crucible 200 containing a silicon melt, a graphite crucible 100 supporting the silicon melt, a heater 300 for applying heat, and heat to the outside. It includes a side insulation 600 and the upper insulation 700 to block.
- the apparatus further includes a pedestal 400 for supporting the graphite crucible 100 and a crucible rotating part 410 extending from the pedestal 400 to rotate the crucible, and the crucible rotating part 410 is also vertically movable. Therefore, the graphite crucible 100 may be rotated and lifted by the crucible rotating part 410.
- the ingot growth apparatus includes an empty space and a gas injection hole inside the graphite crucible 100, and is connected to the gas injection hole to transmit an inert gas to an internal space of the graphite crucible 100;
- the gas supply pipe 510 further includes a gas supply means 500 for supplying an inert gas to the gas supply pipe 510.
- the graphite crucible 100 refers to a crucible made of graphite, but is also considered to include a crucible made of a carbon composite material.
- a seed crystal rotating shaft 800 is attached to the lower end of the seed crystal made of a single crystal, the seed crystal rotating shaft 800 is rotated in a different direction than the crucible rotating part 410
- the seed crystal rotation shaft 800 may also be lifted and lifted like the crucible rotation unit 410.
- the heater unit 300 that generates heat toward the graphite crucible 100 serves to supply heat during the process of melting polysilicon, which is a raw material of the ingot, to form a silicon melt, and the side heat insulating part 600 is ingot grown. It is configured on the outside of the heater 300 for heat insulation in the device, the upper heat insulating portion 700 is located above the silicon melt, and the ingot is raised of the seed crystal rotating shaft 800 inside the upper heat insulating portion 700. Is impressed.
- the heater unit 300 heats the graphite crucible 100, a deviation occurs in heat transfer according to a portion of the graphite crucible 100, and the specificity of the graphite crucible 100 is caused by the heat transfer deviation. Degradation may be concentrated at the site.
- Inert gas layer is further formed to more effectively insulate the crucible 100.
- an inert gas layer 110 is provided in the internal space of the graphite crucible 100, and the inert gas layer 110 is disposed inside the graphite crucible 100.
- the inert gas layer 110 By insulating and distributing heat uniformly on the inner wall of the crucible, it is possible to prevent damage due to deterioration concentration on a specific portion of the graphite crucible 100.
- the inert gas layer 110 excessive heat loss to the outside of the crucible can be prevented.
- FIG. 2 To describe the components of the present invention in more detail, reference is made to FIG. 2.
- FIG 2 is a view showing the components around the graphite crucible 100 and the graphite crucible 100 of the present embodiment.
- the quartz crucible 200 in which the silicon melt is accommodated may be disposed in the graphite crucible 100 to form a double crucible.
- silicon oxide gas SiOx
- SiC silicon carbide
- This phenomenon occurs intensively at a specific part where the temperature of the graphite crucible 100 is high, and the silicon carbide causes damage to the graphite crucible 100.
- quartz crucible 200 In the case where the quartz crucible 200 is positioned in the damaged graphite crucible 100, silicon carbide is more concentrated in the damaged specific portion of the graphite crucible 100, and thus the quartz in contact with the specific portion is finally formed. Deformation of the shape of the crucible 200 may occur, so that the lifetime of the graphite crucible 100 may be shortened.
- the graphite crucible 100 is provided with a space for accommodating an inert gas according to the present embodiment.
- a space in which an inert gas is filled in the graphite crucible 100 may be variously formed.
- At least one or more empty spaces may be formed in the graphite crucible 100, or the graphite crucible 100 includes an inner body 101 and an outer body 102 spaced by a predetermined interval.
- a space can be formed between the bodies.
- the graphite crucible 100 is formed of an inner body 101 in contact with the quartz crucible 200 and an outer body 102 disposed at a predetermined distance from the inner body 101, the inner body 101 is provided.
- at least one support 120 may be formed between the outer body 102.
- At least one support part 120 is formed to a predetermined thickness, and an inert gas may be filled in the space inside the graphite crucible 100.
- an inert gas may be filled in the space inside the graphite crucible 100.
- a space in which an inert gas may be accommodated is provided between the inner body 101 and the outer body 102 positioned on the side surface of the graphite crucible 100, and the inert gas is an inner body of the graphite crucible 100.
- 101 is provided to enclose.
- the height at which the inner body 101 and the outer body 102 are separated by the support part 120 may be formed to be within 50% of the total thickness of the graphite crucible 100.
- the height of the space filled with the inert gas may be in the range of 10 ⁇ 14mm.
- the graphite crucible 100 is made of a carbon composite material and can be formed in a thinner thickness, for example, when the entire thickness can be formed in the range of 8 to 10 mm, the inner body and the outer body are spaced apart. Length can range from 3 to 4 mm.
- the inner body 101 and the outer body 102 of the graphite crucible 100 may be formed to be connected to each other from the upper side, thereby preventing the inert gas from flowing out of the graphite crucible.
- the bonds of the carbons forming the graphite is made of van der Waals bonds having a weak bonding force, the particles are easily generated by a high temperature reaction, the inert gas can be discharged through the outer body There is a risk of silicon contamination inside the graphite crucible.
- the surface of the graphite crucible 100 accommodating the quartz crucible 200 or the inner surface of the outer and inner bodies forming the inner space of the graphite crucible 100 is coated with glassy carbon.
- the strength of the graphite crucible 100 can be increased to prevent the outflow of inert gas.
- thermosetting resin layer is formed on the surface of the graphite crucible 100, followed by drying and heat treatment to carbonize the thermosetting resin with the glassy carbon to form the glassy carbon with the graphite crucible 100. It may be coated on the surface of the outer inner body.
- thermosetting resin used a phenol resin, a furan resin, or a mixture thereof may be used.
- the inert gas constituting the inert gas layer 110 has a very low thermal conductivity, it is possible to block the heat exchange between the inner body 101 and the outer body 102.
- the inert gas layer 110 may not easily escape the heat flowing into the graphite crucible 100 out of the crucible, so that the temperature of the crucible may be maintained even if the heater power value of the heater 300 is lowered. Due to the thermal insulation of the inert gas layer 110, it is possible to prevent deterioration of concentration at a specific portion of the inner wall of the graphite crucible 100.
- the inert gas layer 110 may uniformly distribute heat on the inner wall of the graphite crucible 100, thereby preventing deterioration of concentrated phenomenon and further preventing damage to the graphite crucible 100.
- argon gas (Ar gas) having a low thermal conductivity may be used.
- an inlet for injecting gas into the inert gas receiving space or the inner space below the graphite crucible 100 is provided, connected to the inlet is inert
- a gas supply pipe 510 for supplying and removing gas may be further disposed.
- the graphite crucible 100 may maintain the internal pressure of the graphite crucible 100 uniformly by adjusting the amount of inert gas in the internal space.
- a gas supply pipe 510 for delivering an inert gas is connected to a gas injection hole below the graphite crucible 100.
- the gas supply pipe 510 passes through the inside of the pedestal 400 for supporting the graphite crucible 100 and extends along the rotation axis of the rotating part 410 inside the crucible rotating part 410, thereby providing a gas supply means 500. ).
- the gas supply means 500 may be provided outside the chamber so that inert gas is supplied into the graphite crucible 100 only while the heater part 300 is operated.
- the gas supply means 500 may also suck the inert gas inside the graphite crucible 100 to remove the inert gas.
- the gas supply means 500 serves to maintain an internal pressure of the graphite crucible 100 by making an inert gas layer inside the graphite crucible 100 and maintaining an amount of inert gas.
- At least one hole H may be formed in the graphite crucible 100 to discharge the injected inert gas.
- the hole H of the graphite crucible 100 may be formed on the graphite crucible 100.
- the hole H may be formed on the upper surface of the graphite crucible 100.
- At least two holes may be disposed on the upper surface of the graphite crucible 100 at equal intervals.
- the inert gas injected from the gas supply means 500 may be discharged through the hole H to prevent foreign substances from adsorbing into the gap between the graphite crucible 100 and the quartz crucible 200.
- the inert gas layer 110 is provided inside the graphite crucible 100. Effects of the inert gas layer 110 will be described with reference to FIGS. 4 and 5.
- 4 and 5 are diagrams for explaining the difference of the heat distribution when the heater 300 applies the graphite crucible 100 heat, depending on the presence or absence of the inert gas layer 110.
- the process of transferring heat from the heater 300 to the graphite crucible 100 by dividing the graphite crucible 100 into an upper portion 130, an intermediate portion 140, and a lower portion 150.
- the heater unit 300 heats the graphite crucible 100
- heat is transferred to the side surface of the graphite crucible 100.
- the middle portion 140 of the graphite crucible 100 is provided in a shape having a bend to connect the side surface and the bottom surface of the graphite crucible 100, by the shape of the graphite crucible 100, the middle portion Since the area where the 140 receives heat increases, heat transfer is concentrated in the intermediate part 140.
- the heater 300 is powered up to maintain the temperature of the upper portion 130 and the lower portion 150.
- heat transfer is concentrated due to the curved shape of the graphite crucible 100 in the middle part 140, and deterioration is concentrated compared to the peripheral part because the middle part 140 also has little heat loss to the outside.
- a portion of the quartz crucible 200 in contact with the intermediate portion 140 is placed in a higher temperature environment than the peripheral portion, and the silicon oxide gas is generated in a portion of the quartz crucible 200 due to the high temperature environment. This will be further promoted, the reaction of the silicon oxide gas and the carbon of the graphite crucible 100 to produce silicon carbide is also promoted.
- Such silicon carbide easily falls from the graphite crucible 100 when the graphite crucible 100 is cleaned, and damage occurs as much as the amount of the silicon carbide falls, causing deformation of the graphite crucible 100 and shortening its lifespan. .
- the intermediate portion 140 is formed as a bent portion, the silicon carbide reaction penetrates to the inside of the bent portion, the bending when the quartz crucible 200 infiltrate the graphite crucible 100 This part is easily broken, and the broken portion or the shape of the deformed portion is more active heat and gas movement, the damage of the graphite crucible 100 is further promoted. Therefore, the degree of damage of the intermediate portion 140 is a portion that determines the life of the graphite crucible 100.
- an inert gas layer 110 is provided inside the graphite crucible 100 to prevent damage to the intermediate portion 140.
- the inert gas layer 110 has a very low thermal conductivity, heat flowing into the graphite crucible 100 becomes difficult to be discharged to the outside.
- the upper portion 130 and the lower portion 150 of the graphite crucible 100 exposed to the outside emits a lot of heat by the graphite crucible 100 having a high thermal conductivity, but an inert gas layer having a low thermal conductivity in this portion.
- the 110 is formed to prevent the release of heat.
- the graphite crucible 100 may be sufficiently heated to a value lower than the heater power required for heating the existing graphite crucible 100.
- the inert gas layer 110 while reducing the heat exiting the upper portion 130 and the lower portion 150 of the graphite crucible 100 reduces the phenomenon that deterioration is concentrated only in the middle portion 140, By reducing the amount of heat received by the outer wall of the intermediate portion 140 is transferred to the inner portion it can prevent the shape in which deterioration is concentrated in the intermediate portion 140.
- the graphite crucible 100 has a uniform heat distribution over the entire area, it is possible to prevent the phenomenon that deterioration is concentrated on a specific portion, the graphite crucible due to the deterioration concentration Damage to the 100 is prevented.
- the ingot growth apparatus as described above, it is possible to reduce the heater power by insulating the inside of the graphite crucible 100, to prevent the phenomenon that deterioration is concentrated on a specific portion of the graphite crucible 100 of the graphite crucible 100 It can increase the lifespan, thereby reducing the production cost of the ingot.
- the present invention relates to an ingot growth apparatus for growing an ingot as a material on a wafer and a crucible used therein, there is industrial applicability.
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Abstract
Description
Claims (16)
- 실리콘 융액이 수용되는 석영 도가니;상기 석영 도가니가 수용되는 흑연 도가니;상기 흑연 도가니의 하부를 지지하는 도가니 받침대; 및상기 흑연 도가니 측으로 열을 제공하기 위한 히터부;를 포함하고,상기 흑연 도가니는 상기 석영 도가니와 접하는 내측 바디와, 상기 내측 바디로부터 소정 간격을 두고 배치되는 외측 바디을 포함하도록 구성되어, 상기 내측 바디와 외측 바디 사이에는 공간이 형성되는 잉곳성장장치.
- 제 1 항에 있어서,상기 흑연 도가니에는 공간은 불활성 가스로 채워진 잉곳성장장치.
- 제 2 항에 있어서,상기 흑연 도가니 내부로 상기 불활성 가스를 공급하기 위한 가스 공급수단을 더 포함하는 잉곳성장장치.
- 제 3 항에 있어서,상기 가스 공급수단을 통하여 공급되는 불활성 가스는 상기 도가니 받침대를 통과하여 상기 흑연 도가니 하측부를 통하여 제공되는 잉곳성장장치.
- 제 3 항에 있어서,상기 가스 공급수단은 상기 히터부가 동작되는 때에 상기 불활성 가스를 상기 흑연 도가니 내부로 공급하는 잉곳성장장치.
- 제 2 항에 있어서,상기 불활성 가스는 아르곤 가스인 잉곳성장장치.
- 제 1 항에 있어서,상기 흑연 도가니의 내측 바디와 외측 바디 사이는 소정 두께의 적어도 하나 이상의 지지부에 의하여 이격된 간격이 유지되는 잉곳성장장치.
- 제 1 항에 있어서,상기 불활성 가스층은 상기 흑연 도가니 두께의 50%미만의 높이를 갖도록 형성되는 잉곳성장장치.
- 제 1 항에 있어서,상기 흑연 도가니의 적어도 일부 표면에는 유리질 탄소가 코팅되는 잉곳성장장치.
- 제 1 항에 있어서,상기 불활성 가스층과 맞닿는 상기 외측 바디와 내측 바디의 적어도 일부 면에는 유리질 탄소가 코팅되는 잉곳성장장치.
- 제 1 항에 있어서,상기 흑연 도가니의 상면에는 홀이 형성된 잉곳성장장치.
- 잉곳성장을 성장하기 위한 잉곳성장장치의 내부에 배치되고, 석영 도가니를 수용하는 흑연 도가니로서,상기 석영 도가니와 접하는 내측 바디;상기 내측 바디로부터 소정 간격을 두고 배치되는 외측 바디; 및상기 외측 바디와 내측 바디를 연결하는 상부 연결부; 를 포함하고,상기 내측 바디와 외측 바디 사이에는 적어도 하나 이상의 공간이 형성된 흑연 도가니.
- 제 12 항에 있어서,상기 흑연 도가니의 공간은 불활성 가스로 채워진 흑연 도가니.
- 제 13 항에 있어서,상기 흑연 도가니의 공간으로 불활성 가스를 주입하기 위한 가스 공급수단을 포함하는 흑연 도가니.
- 제 14 항에 있어서,상기 흑연 도가니의 상면에는 불활성 가스를 배출하기 위한 적어도 하나 이상의 홀이 배치된 흑연 도가니.
- 제 12 항에 있어서,상기 흑연 도가니의 내측 바디와 외측 바디 사이는 소정 두께의 적어도 하나 이상의 지지부에 의하여 이격된 간격이 유지되는 잉곳성장장치.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016536018A JP6236158B2 (ja) | 2013-09-25 | 2014-08-06 | インゴット成長装置 |
US14/914,601 US20160208406A1 (en) | 2013-09-25 | 2014-08-06 | Crucible and ingot growing device comprising same |
EP14849869.4A EP3051008B1 (en) | 2013-09-25 | 2014-08-06 | Crucible and ingot growing device comprising same |
CN201480041859.5A CN105408529A (zh) | 2013-09-25 | 2014-08-06 | 坩埚及包含坩埚的铸锭生长装置 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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KR1020130113770A KR101516486B1 (ko) | 2013-09-25 | 2013-09-25 | 잉곳성장장치 |
KR10-2013-0113770 | 2013-09-25 |
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WO2015046746A1 true WO2015046746A1 (ko) | 2015-04-02 |
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US (1) | US20160208406A1 (ko) |
EP (1) | EP3051008B1 (ko) |
JP (1) | JP6236158B2 (ko) |
KR (1) | KR101516486B1 (ko) |
CN (1) | CN105408529A (ko) |
WO (1) | WO2015046746A1 (ko) |
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KR102301821B1 (ko) * | 2018-12-20 | 2021-09-14 | 한국세라믹기술원 | 단결정 용액성장 장치 및 단결정 용액성장 방법 |
CN113522393B (zh) * | 2021-07-01 | 2022-07-15 | 北京科技大学 | 一种嵌套式平衡坩埚及控制方法 |
CN113547092B (zh) * | 2021-07-22 | 2023-09-15 | 东莞市凤岗冠铸铜业有限公司 | 一种多元铜合金上引炉及引铸方法 |
KR102643160B1 (ko) | 2022-06-08 | 2024-03-04 | 주식회사 한스코리아 | 실리콘 단결정 잉곳 생산장치 |
US12065990B1 (en) * | 2023-09-21 | 2024-08-20 | Raytheon Company | Heavy inert gas insulated blast tube |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20030055900A (ko) * | 2001-12-27 | 2003-07-04 | 주식회사 실트론 | 단결정 잉곳의 제조장치 |
KR100411571B1 (ko) * | 2000-11-27 | 2003-12-18 | 주식회사 실트론 | 단결정 잉곳의 제조장치 |
KR20040049357A (ko) * | 2002-12-03 | 2004-06-12 | 주식회사 실트론 | 실리콘 단결정 성장 장치 |
JP2004256323A (ja) * | 2003-02-24 | 2004-09-16 | Komatsu Electronic Metals Co Ltd | 単結晶引上げ装置および単結晶製造方法 |
JP2007261868A (ja) * | 2006-03-28 | 2007-10-11 | Covalent Materials Corp | 単結晶育成装置および単結晶育成方法 |
JP2009298652A (ja) * | 2008-06-13 | 2009-12-24 | Sumco Corp | 黒鉛ルツボ及び該黒鉛ルツボを用いた石英ルツボの変形防止方法 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6021900A (ja) * | 1983-07-19 | 1985-02-04 | Agency Of Ind Science & Technol | 化合物半導体単結晶製造装置 |
JPS6428294A (en) * | 1987-07-23 | 1989-01-30 | Ibiden Co Ltd | Graphic crucible for pulling up silicon single crystal |
JPH0266680U (ko) * | 1988-11-10 | 1990-05-21 | ||
KR930004506A (ko) * | 1991-08-29 | 1993-03-22 | 티모티 엔. 비숍 | 실리콘 결정을 성장시키는데 사용되는 유리질 탄소 피복 흑연성분 |
CN1084398C (zh) * | 1999-12-16 | 2002-05-08 | 上海中科嘉浦光电子材料有限公司 | 生长高温氧化物晶体的装置 |
CN1272475C (zh) * | 2000-02-24 | 2006-08-30 | 东芝株式会社 | 氧化物单晶的制造装置及制造方法 |
CN2506959Y (zh) * | 2001-09-18 | 2002-08-21 | 西南交通大学 | 一种坩埚 |
JP3970580B2 (ja) * | 2001-11-07 | 2007-09-05 | 株式会社Sumco | シリコン単結晶の引上げ装置及びその引上げ方法 |
CN201634792U (zh) * | 2009-10-23 | 2010-11-17 | 上海杰姆斯电子材料有限公司 | 一种直拉单晶炉 |
CN201634795U (zh) * | 2010-03-29 | 2010-11-17 | 上海杰姆斯电子材料有限公司 | 直拉单晶炉石墨坩埚 |
US20130305984A1 (en) * | 2011-02-02 | 2013-11-21 | Toyo Tanso Co., Ltd. | Graphite crucible for single crystal pulling apparatus and method of manufacturing same |
CN102995104B (zh) * | 2012-12-04 | 2016-01-20 | 江苏协鑫硅材料科技发展有限公司 | 一种铸造多晶硅或准单晶硅的方法及装置 |
-
2013
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-
2014
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- 2014-08-06 US US14/914,601 patent/US20160208406A1/en not_active Abandoned
- 2014-08-06 CN CN201480041859.5A patent/CN105408529A/zh active Pending
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Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100411571B1 (ko) * | 2000-11-27 | 2003-12-18 | 주식회사 실트론 | 단결정 잉곳의 제조장치 |
KR20030055900A (ko) * | 2001-12-27 | 2003-07-04 | 주식회사 실트론 | 단결정 잉곳의 제조장치 |
KR20040049357A (ko) * | 2002-12-03 | 2004-06-12 | 주식회사 실트론 | 실리콘 단결정 성장 장치 |
JP2004256323A (ja) * | 2003-02-24 | 2004-09-16 | Komatsu Electronic Metals Co Ltd | 単結晶引上げ装置および単結晶製造方法 |
JP2007261868A (ja) * | 2006-03-28 | 2007-10-11 | Covalent Materials Corp | 単結晶育成装置および単結晶育成方法 |
JP2009298652A (ja) * | 2008-06-13 | 2009-12-24 | Sumco Corp | 黒鉛ルツボ及び該黒鉛ルツボを用いた石英ルツボの変形防止方法 |
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EP3051008A1 (en) | 2016-08-03 |
EP3051008B1 (en) | 2019-10-23 |
JP2016528157A (ja) | 2016-09-15 |
US20160208406A1 (en) | 2016-07-21 |
KR20150033909A (ko) | 2015-04-02 |
EP3051008A4 (en) | 2017-05-31 |
KR101516486B1 (ko) | 2015-05-04 |
JP6236158B2 (ja) | 2017-11-22 |
CN105408529A (zh) | 2016-03-16 |
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