WO2015030619A4 - System and method for testing components, circuits and complex systems using synchronized and pulsed fluxes consisting of laser accelerated particles - Google Patents

System and method for testing components, circuits and complex systems using synchronized and pulsed fluxes consisting of laser accelerated particles Download PDF

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Publication number
WO2015030619A4
WO2015030619A4 PCT/RO2014/000022 RO2014000022W WO2015030619A4 WO 2015030619 A4 WO2015030619 A4 WO 2015030619A4 RO 2014000022 W RO2014000022 W RO 2014000022W WO 2015030619 A4 WO2015030619 A4 WO 2015030619A4
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WO
WIPO (PCT)
Prior art keywords
laser
subsystem
fluxes
particle
fact
Prior art date
Application number
PCT/RO2014/000022
Other languages
French (fr)
Other versions
WO2015030619A1 (en
Inventor
Mihai Ganciu-Petcu
Marius-Ioan PISO
Ovidiu-Sorin STOICAN
Bogdan-Vasile MIHALCEA
Constantin DIPLAŞU
Octav MARGHITU
Andreea-Maria JULEA
Agavni SURMEIAN
Andreea-Liliana GROZA
Răzvan-Victor-Anton DABU
Ison MORJAN
Original Assignee
Institutul National De Cercetare - Dezvoltare Pentru Fizica Laserilor, Plasmei Si Radiaţiei
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Application filed by Institutul National De Cercetare - Dezvoltare Pentru Fizica Laserilor, Plasmei Si Radiaţiei filed Critical Institutul National De Cercetare - Dezvoltare Pentru Fizica Laserilor, Plasmei Si Radiaţiei
Publication of WO2015030619A1 publication Critical patent/WO2015030619A1/en
Publication of WO2015030619A4 publication Critical patent/WO2015030619A4/en

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Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H7/00Details of devices of the types covered by groups H05H9/00, H05H11/00, H05H13/00
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302Contactless testing
    • G01R31/305Contactless testing using electron beams
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01JCHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J19/00Chemical, physical or physico-chemical processes in general; Their relevant apparatus
    • B01J19/08Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01JCHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J19/00Chemical, physical or physico-chemical processes in general; Their relevant apparatus
    • B01J19/08Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor
    • B01J19/12Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor employing electromagnetic waves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302Contactless testing
    • G01R31/308Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H7/00Details of devices of the types covered by groups H05H9/00, H05H11/00, H05H13/00
    • H05H7/001Arrangements for beam delivery or irradiation
    • H05H2007/008Arrangements for beam delivery or irradiation for measuring beam parameters

Abstract

The patent application refers to a system and method to test components, circuits and complex equipment, used in order to determine the effect of an external particle flux and of radiation, with different energies, upon the characteristics and operating parameters and, if applicable, upon the program which controls the operation of components, circuits and complex equipment located on-board satellites, space ships or planes flying at high altitudes, that may be part of control systems for nuclear reactors or particle accelerators, intended for handling nuclear materials or waste, or used in areas exposed to nuclear accidents. We suggest a method to generate two or more pulsed fluxes of particles, that can eventually be associated with the emission of gamma or X ray radiation, characterized by specific space configurations, with an aim to use them to perform radiation hardening tests on components and complex systems (intended to operate in outer space or in very demanding environments such as nuclear plants or particle accelerators). According to the patent application, the system is made out of at least two separate laser- plasma particle accelerators (3, 4), placed in different locations with respect to the subsystem (1) under test, fixed on the holder system (2) which is able to rotate and translate, horizontally and vertically, so that the incident particle fluxes (5 and 6) can be applied under different optical angles and to different areas of the subsystem (1). Depending on their design, the laser-plasma accelerators (3 and 4) generate at least two pulsed fluxes of accelerated particles (5 and 6) that may contain identical or different types of particles, by applying incident laser pulses (9 and 10) delivered by two separate high power lasers (7 and 8). The laser beam (9) generated by the high power laser (7) is guided by a mirror (11) towards a parabolic mirror (13) that focuses the beam at the input of a laser-plasma accelerator (3). The laser beam (10) delivered by the high power laser (8), is guided by a mirror (12) towards a parabolic mirror (14), that focuses the beam at the input of another laser-plasma accelerator (4). According to the patent application, the method consists of a calibration procedure and the determination of the operating parameters of the subsystem (1) under test, i) in absence of particle fluxes (5 and 6), ii) in presence of particle fluxes (5 and 6), and iii) after applying the particle fluxes (5 and 6) to the subsystem (1).

Claims

AMENDED CLAIMS
received by the International Bureau on 07 April 2015 (07.04.2015)
Claims:
1. System (S) of test for components, circuits and complex equipment, and if applicable, for software which controls operation of these, characterized by the fact that the subsystem to be tested (1) is electromagnetically shielded and mounted on a holder system (2) which rotates either clockwise or counter-clockwise and translates vertically and horizontally, composed of at least two separate laser-plasma accelerators (3 and 4), that generate fluxes (5 and 6) of accelerated particles, either of identical type or of different types. Depending on the design of the laser-plasma accelerators (3 and 4), at the input of each of the two or more laser- plasma accelerators (3 and 4) incident laser pulses are applied, generated by some high power lasers (7 and 8), such as the surface of the subsystem (1) which is exposed to at least two particle fluxes (5 and 6) is increased with respect to the case when a single laser-plasma accelerator would be used, a laser beam (9) generated by the high power laser (7) is guided by a mirror (11) towards a parabolic mirror (13), that focuses the beam (9) at the input of the laser-plasma accelerator (3), and another laser beam (10) generated by the high power laser (8) is guided by a mirror (12) towards a parabolic mirror (14), that focuses the beam (10) at the input of the accelerator (4). The system also comprises the measuring instruments (27a, 27b, 27c, 27d, 27e), used in order to achieve system calibration by determining the intensity, energy, space distribution and nature of the particles of which the fluxes (5 and 6) are made of.
2. System according to claim 1 , characterized by the fact that at least two pulsed particle fluxes (5 and 6), consisting of identical or different species of electrically charged particles, are applied to the same area of the subsystem (1).
3. System according to claim 1, characterized by the fact that the output pulses for the two high power lasers (7 and 8) are triggered by a module (15) which generates the control signals (15a and 15b) that are either synchronized or lag in time.
6. System according to claim 1, characterized by the fact that the holder system (2) to which the subsystem (1) is attached, rotates either clockwise or counter-clockwise, to apply , the particle fluxes (5) and (6) under different optical angles or to different areas of the subsystem (1).
7. System according to claim 1, characterized by the fact that the holder system (2) to which the subsystem (1) is attached, translates horizontally and vertically, to expose different areas of the subsystem (1) to the particle fluxes (5) and (6).
8. System of test for components, circuits and complex equipment, characterized by the fact that the subsystem (1) is mounted on a holder system (2) that rotates, either clockwise or counter-clockwise, and translates horizontally and vertically. The system is composed at least two separate laser-plasma accelerators (3 and 4), where the incident pulse for each one of them is generated by a single power laser (16) and the output beam (17) of the laser (16) is splitted using a beam-splitter (18); one of the beams (19) is guided using the mirrors (20, 21 and 11) to the parabolic mirror (13) that focuses the beam at the input of the laser-plasma accelerator (3), the other remaining beam (22) crosses a compensating plate (23), before being guided by the mirrors (24, 25, 26 and 12) to the parabolic mirror (14), that focuses the beam to the input of the laser-plasma accelerator (4), therefore by shifting the ensemble composed of mirrors (24 and 25) the optical path of the incident laser pulses applied to the input of the laser-plasma accelerator (4) also changes, as a consequence, the laser-plasma accelerator (4) will implicitly generate the accelerated particle flux (6) with a specific time delay with respect to the laser-plasma accelerator (3) that generates the accelerated particle flux (5), and by the fact that the system also consists of the measuring instruments (27a, 27b, 27c, 27d, 27e), used in order to achieve calibration by determining the intensity, energy, space distribution and nature of the particles of which the fluxes (5 and 6) are made of.
9. System according to claim 8, characterized by the fact that the pulsed particle fluxes (5 and 6) are applied to the same area of the subsystem (1).
10. System according to claim 8, characterized by the fact that at least two pulsed particle fluxes (5 and 6) are applied to different areas of the subsystem (1).
11. Method of test for components, circuits and complex equipment, and if applicable, for software which controls operation of these, that uses the test subsystem described by claims 1 or 8, characterized by the fact that in order to determine the effects of an external particle flux and radiation with different energies upon the characteristics and operating parameters of the subsystem and, if applicable, upon the software which controls them, consisting of:
- system calibration procedure in order determine the intensity, energy, space distribution and nature of the particles which compose the fluxes (5 and 6), for a given intensity of the laser beams (9, 10, and 17), a given space configuration of these, and given characteristics of the accelerators (3 and 4). The system calibration procedure is achieved by means of the measuring instruments (27a, 27b, 27c, 27d, and 27e), at different locations in space, which are
21 situated within the volume occupied by the subsystem (1) under test and for a given rotation angle of the holder system (2).
- measurement the operating parameters of the subsystem (1), in absence of particle fluxes (5 and 6).
- removal of the measuring instruments (27a, 27b, 27c, 27d and 27e), followed by their replacement with the subsystem (1) .
- directing particle fluxes (5 and 6) to the subsystem (1), electromagnetically shielded, maintaining the same characteristics and space arrangement for the laser beams (9, 10 and 17) and for the accelerators (3 and 4), as stated before.
- measurement the operating parameters of the subsystem (1), while the particle fluxes (5 and 6) are applied, and their comparison with the values measured in absence of the particle fluxes (5 and 6).
- measurement the operating parameters of the subsystem (1) at the end of the tests, and their comparison with the values measured in absence of the particle fluxes (5 and 6).
13. Method according to claim 1 1, characterized by the fact that at least two accelerated particle fluxes (5 and 6) are directed simultaneously to the subsystem (1).
14. Method according to claim 1 1, characterized by the fact that at least two accelerated particle fluxes (5 and 6) are applied individually and separately to the subsystem (1) and the time delay between them is settled by operator.
23
PCT/RO2014/000022 2013-08-28 2014-08-26 System and method for testing components, circuits and complex systems using synchronized and pulsed fluxes consisting of laser accelerated particles WO2015030619A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
ROA201300643 2013-08-28
RO201300643A RO130134B1 (en) 2013-08-28 2013-08-28 System and process for testing the effect of pulsed and synchronized flows of laser-accelerated particles

Publications (2)

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WO2015030619A1 WO2015030619A1 (en) 2015-03-05
WO2015030619A4 true WO2015030619A4 (en) 2015-05-28

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Publication number Priority date Publication date Assignee Title
GB2544118B (en) 2015-11-09 2020-12-09 Res & Innovation Uk Inspection of nuclear waste
CN107782713A (en) * 2016-08-24 2018-03-09 中国科学院光电研究院 A kind of Laser induced plasma spectroscopy analytical equipment of achievable laser pulse width from femtosecond to psec consecutive variations
CN110083081B (en) * 2019-03-11 2020-08-04 北京时代民芯科技有限公司 Automatic single-particle irradiation test control system and method
CN112462226A (en) * 2019-09-06 2021-03-09 中华精测科技股份有限公司 Testing device for integrated circuit chip
CN113543451B (en) * 2020-04-13 2023-03-24 中国科学院上海光学精密机械研究所 Double-beam laser driving ion accelerating device
CN114779040B (en) * 2022-06-22 2022-09-06 成都理工大学 Laser simulation system for mixed radiation scene

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US7321604B2 (en) * 2004-01-07 2008-01-22 The Regents Of The University Of Michigan Ultra-short wavelength x-ray system
US8705692B2 (en) * 2009-05-12 2014-04-22 Nutech Ventures, Inc. Laser-based accelerator for interrogation of remote containers
DE102010010716A1 (en) * 2010-03-08 2012-02-16 Bernhard Hidding Method for testing the sensitivity of electronic components by particle and photon beams by means of laser-plasma interaction
CN102507512A (en) * 2011-11-07 2012-06-20 大连理工大学 On-line in situ detecting method for infrared-ultraviolet double pulse laser induced breakdown spectroscopy

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RO130134A2 (en) 2015-03-30
WO2015030619A1 (en) 2015-03-05

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