CN208172226U - A kind of light scattering measurement circuit based on magnetic resonance imaging - Google Patents
A kind of light scattering measurement circuit based on magnetic resonance imaging Download PDFInfo
- Publication number
- CN208172226U CN208172226U CN201820523165.0U CN201820523165U CN208172226U CN 208172226 U CN208172226 U CN 208172226U CN 201820523165 U CN201820523165 U CN 201820523165U CN 208172226 U CN208172226 U CN 208172226U
- Authority
- CN
- China
- Prior art keywords
- light scattering
- scattering measurement
- light
- electrically connected
- measurement circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Abstract
The utility model provides a kind of light scattering measurement circuit based on magnetic resonance imaging, controls the light scattering measurement device based on magnetic resonance imaging and carries out light scattering measurement, the light scattering measurement circuit includes：Light source generator, the light source generator are electrically connected the light scattering measurement device；Optical detector, the optical detector are electrically connected the light scattering measurement device；Time domain follower, the time domain follower are electrically connected the light scattering measurement device；Temporal modulation device, the temporal modulation device are electrically connected the time domain follower and are electrically connected one of the light source generator and the optical detector, and the time domain follower is electrically connected the other of the light source generator and the optical detector；Processor, the processor are electrically connected the optical detector, the light scattering measurement device and the time domain follower.Light scattering measurement circuit control simultaneously cooperates light scattering measurement device to realize the measurement scattered to light, obtains continuous light scatter intensity signal distribution plots.
Description
Technical field
The utility model relates to optical technical field, in particular to a kind of light scattering measurement electricity based on magnetic resonance imaging
Road.
Background technique
Light scattering refers to that a part of light deviates the phenomenon that former direction is propagated when light passes through inhomogeneous medium, deviates former direction
Light is known as scattering light.As the absorption of light, the scattering of light can also be existed by the remitted its fury of the light of substance, the scattering phenomenon of light
By special use in each field.Light scatter profile is obtained to have great importance to research substance characteristics.
It generallys use light scattering measurement instrument and obtains light scatter profile, light scattering measurement instrument includes detection in the prior art
Device, light supply apparatus, specimen holder and rotating device, after sample is placed on specimen holder, light source is directly incident on the table of sample
Face, detector receive the reflected light beam signal after sample surfaces scattering process, to obtain light scatter intensity under this state
Signal value using one of specific rotating device adjustment detector, light supply apparatus, specimen holder, the two or three, and then obtains
Take the light scatter intensity signal value of different incidence angles, different reflection angles and sample different surfaces.By the above method, pass through
The light scatter profile that a large amount of discrete light scattering signal values generate is obtained, although the rotation by a large amount of numbers operates, so that
The light scattering diagram spectrum approximate continuous of generation, but actually still composed for discrete light scattering diagram, it can not accurately obtain sample surfaces
The signal value of any position light scattering, the limitation used is poor, also, by rotation operation, time-consuming in measurement process, surveys
Amount efficiency is low, and especially for performance unstable measurement object or measuring condition, measured deviation is larger, or even can not achieve
The measurement of effect.
To those skilled in the art, how magnetic resonance imaging to be utilized to obtain continuous light scatter intensity distribution map,
Effective signal value is obtained one of to be a problem to be solved.
Utility model content
The purpose of the utility model is to provide a kind of light scattering measurement circuits, for controlling and cooperating light scattering measurement device
It realizes the measurement scattered to light, obtains continuous light scatter intensity signal distribution plots.
A kind of light scattering measurement circuit based on magnetic resonance imaging provided by the utility model, the light scattering measurement circuit
For connecting the light scattering measurement device for generating magnetic resonance light scatter profile, the light scattering measurement circuit includes：
Light source generator, the light source generator are electrically connected the light scattering measurement device；
Optical detector, the optical detector are electrically connected the light scattering measurement device；
Time domain follower, the time domain follower are electrically connected the light scattering measurement device；
Temporal modulation device, the temporal modulation device are electrically connected the time domain follower and are electrically connected the light source generator
One of with the optical detector, the time domain follower is electrically connected another in the light source generator and the optical detector
One；
Processor, the processor be electrically connected the optical detector, the light scattering measurement device and the time domain with
With device.
Optionally, the light scattering measurement circuit further includes：
First door operating mechanisms, first door operating mechanisms are connected electrically in the light source generator and the light scattering measurement fills
Between setting；
Second door operating mechanisms, second door operating mechanisms are connected electrically in the optical detector and the light scattering measurement device
Between.
Optionally, first door operating mechanisms and second door operating mechanisms respectively with the time domain follower and it is described when
The corresponding electrical connection of domain modulator.
Optionally, first door operating mechanisms and second door operating mechanisms pass through optical fiber and the light scattering measurement fills
Set connection.
Optionally, the light scattering measurement circuit further includes spectrometer, and the spectrometer is connected electrically in the processor and described
Between light scattering measurement device.
Optionally, the spectrometer is connect by optical fiber with the light scattering measurement device.
Optionally, the light scattering measurement circuit further includes Waveform generator, and the Waveform generator is connected electrically in described
Between spectrometer and the light scattering measurement device.
Optionally, the light scattering measurement circuit further includes main controller, and the main controller is electrically connected the processor.
Optionally, the processor is programmable gate array.
It can be seen from the above, the utility model provides a kind of light scattering measurement circuit, controls and cooperate light scattering measurement device
It realizes the measurement scattered to light, obtains continuous light scatter intensity signal distribution plots.
Detailed description of the invention
Fig. 1 is that the light scattering measurement circuit and light in the first specific embodiment of the utility model based on magnetic resonance imaging scatter
The structural schematic diagram of measuring device；
Fig. 2 is that the light scattering measurement circuit and light in the second specific embodiment of the utility model based on magnetic resonance imaging scatter
The structural schematic diagram of measuring device；
Fig. 3 is that the light scattering measurement circuit and light in the utility model third specific embodiment based on magnetic resonance imaging scatter
The structural schematic diagram of measuring device；
Fig. 4 is that the light scattering measurement circuit and light in the 4th specific embodiment of the utility model based on magnetic resonance imaging scatter
The structural schematic diagram of measuring device.
Wherein, appended drawing reference is：
10 light scattering measurement devices；
11 cylindrical skeletons；
12 radio-frequency coils；
13 gradient coils；
14 cylindrical magnets；
16X gradient power amplifier；
17Y gradient power amplifier；
18Z gradient power amplifier；
19 RF power amplifications；
20 light scattering measurement circuits；
21 light source generators；
22 optical detectors；
23 time domain followers；
24 temporal modulation devices；
25 processors；
26 first door operating mechanisms；
27 second door operating mechanisms；
28 spectrometers；
29 Waveform generators；
30 main controllers.
Specific embodiment
In order to which the technical features, objects and effects for the technical solution protected to the requires of the utility model have more clear reason
Solution now compares Detailed description of the invention specific embodiment of the present utility model, and identical label indicates identical part in the various figures.
In order to make simplified form, only schematically shown in each figure and the utility model relevant portion, and not generation
Practical structures of the table as product.In addition, there is identical structure or function in some figures so that simplified form is easy to understand
Component has only symbolically shown one of those, or has only indicated one of those.
A kind of light scattering measurement circuit 20 based on magnetic resonance imaging provided by the utility model is total based on magnetic for controlling
The light scattering measurement device 10 of vibration imaging carries out light scattering measurement.
For the structure and working principle of clear statement light scattering measurement circuit 20 provided by the utility model, specific real
It applies to connect it with light scattering measurement device 10 in example and be illustrated.
As depicted in figs. 1 and 2, light scattering measurement device 10 include cylindrical skeleton 11, radio-frequency coil 12, gradient coil 13,
Cylindrical magnet 14 and a plurality of optical fiber.
The inner surface of the peripheral wall of cylindrical skeleton 11 surrounds to form sample placed cavity, and sample placed cavity is for placing sample to be measured
Product, sample to be measured can be supported in sample placed cavity by bracket, in order to promoted measurement sample surfaces to light dissipate
The center of sample is placed roughly at the center of cylindrical skeleton 11, also, makes in sample by the accuracy for penetrating the distribution of intensity
Line is overlapped with the central axes of cylindrical skeleton 11.
As shown in Figure 1, radio-frequency coil 12 is wound in the outer surface of the peripheral wall of cylindrical skeleton 11, protrusion is shown, gradient
Coil 13 is wound in 12 outer layer of radio-frequency coil, and cylindrical magnet 14 is looped around the outer layer of gradient coil 13, cylindrical magnet 14 and gradient
There is space between coil 13.In this way, three can form magnetic field, so that the sample that sample is placed on cylindrical skeleton 11 is placed
After chamber in magnetic field.Under the influence of a magnetic field, the magnetic resonance light scatter profile of available sample surfaces.
A plurality of optical fiber penetrates the peripheral wall of cylindrical skeleton 11 on multiple radial angles of cylindrical skeleton 11 respectively, also, more
The end of optical fiber exposure in sample placed cavity, to allow light beam feed-in sample placed cavity and the sample from a plurality of optical fiber
Scattering light in product placed cavity is fed out from a plurality of optical fiber.That is, a part is for will entering from light source in a plurality of optical fiber
Light is penetrated by being exposed in the end feed-in sample placed cavity of sample placed cavity, and exposes to the surface of sample to be tested；It is a plurality of
Another part in optical fiber is used to be put by the light beam that the surface reflection of sample to be tested goes out by being exposed to sample in sample placed cavity
The end for setting chamber is fed out.
The light scattering measurement device 10 based on magnetic resonance imaging using the above structure scatters the light on the surface of sample strong
It, can be the case where not rotating sample, light source after a plurality of optical fiber penetrates the peripheral wall of cylindrical skeleton 11 when the distribution of degree measures
Under, so that the incident beam of multiple angles is radiated at sample surfaces respectively, to obtain sample surfaces to from multiple and different incidences
The distribution of the beam divergence intensity of angle.Also, it is used to feed out a plurality of optical fiber of the reflected beams while can get multiple angles
The reflected beams can obtain simultaneously as a result, in scattering strength of the light velocity measurement sample surfaces to same incident angle to light beam
Multiple reflection angles the reflected beams, reduce change and receive reflective beam arrangement and do not stop conversion angle to obtain reflection different anti-
The workload of irradiating light beam, improves measurement efficiency.
Light scattering measurement device 10 has X-gradient power amplifier 16, Y-gradient power amplifier 17 and Z-Gradient power amplifier 18, and three is electrically connected
Gradient coil 13.Also there is RF power amplification 19, which is electrically connected radio-frequency coil 12.
Cylindrical skeleton is penetrated in a plurality of optical fiber of multiple confessions that opens up of the peripheral wall of the cylindrical skeleton 11 of light scattering measurement device 10
11 through-hole.Wherein, multiple through-holes include one group of light source incidence hole and one group of scattering gone out for scattering light emission for light source entrance
Light feeds out mouth.
Based on above-mentioned light scattering measurement device 10, the utility model provides a kind of light scattering measurement circuit 20, the light
Scatterometry circuit 20 is used to connect the light scattering measurement device 10 for generating magnetic resonance light scatter profile.
In Fig. 1 to Fig. 4, what arrow indicated is the direction of transfer of signal, and four-headed arrow indicates signal bus herein
Different signals can be mutually transmitted therebetween.
The light scattering measurement circuit 20 includes light source generator 21, optical detector 22, time domain follower 23, temporal modulation device
24 and processor 25.Wherein, light source generator 21, optical detector 22 and time domain follower 23 are electrically connected light scattering measurement device
10, and temporal modulation device 24 is electrically connected time domain follower 23 and one of is electrically connected light source generator 21 and detector, and when
Domain follower 23 is electrically connected the other of light source generator 21 and optical detector 22.
As depicted in figs. 1 and 2, in the first specific embodiment and the second specific embodiment provided by the utility model, time domain
Follower 23 is electrically connected light source generator 21, then is electrically connected optical detector 22 by temporal modulation device 24.First specific embodiment
Unlike the second specific embodiment, spectrometer 28 is transmitted working signal by Waveform generator 29 in the first specific embodiment
To the X-gradient power amplifier 16 of magnetic resonance device, Y-gradient power amplifier 17, Z-Gradient power amplifier 18 and RF power amplification 19, and it is total by signal
Line receives the picture signal from RF power amplification 19；Spectrometer 28 sends working signal to magnetic resonance by optical fiber in second embodiment
X-gradient power amplifier 16, Y-gradient power amplifier 17, Z-Gradient power amplifier 18 and the RF power amplification 19 of device, and receive to come from by optical fiber and penetrate
The picture signal of frequency power amplifier 19.
As shown in Figure 3 and Figure 4, third specific embodiment and the 4th specific embodiment provided by the utility model and above-mentioned
Unlike first specific embodiment and the second specific embodiment, time domain follower 23 is electrically connected optical detector 22, then when passing through
Domain modulator 24 is electrically connected light source generator.And unlike third specific embodiment and the 4th specific embodiment, third is specific
Working signal is passed to X-gradient power amplifier 16, the Y-gradient function of magnetic resonance device by Waveform generator 29 by spectrometer 28 in embodiment
17, Z-Gradient power amplifier 18 and RF power amplification 19 are put, and the picture signal from RF power amplification 19 is received by signal bus；The
Spectrometer 28 sends working signal to X-gradient power amplifier 16, Y-gradient power amplifier 17, the Z ladder of magnetic resonance device by optical fiber in four embodiments
Power amplifier 18 and RF power amplification 19 are spent, and the picture signal from RF power amplification 19 is received by optical fiber.
The technical solution in above-mentioned specific embodiment provided by the utility model is described in detail below.
In a particular embodiment, light source generator 21 passes through optical fiber for light source by the tubular bone on light scattering measurement device 10
On sample in the light source incidence hole feed-in cylindrical skeleton 11 of frame 11, so that light source will be provided for light scattering measurement, and after scattering
Light beam mouth is fed out by optical fiber feed-in optical detector 22 by the light scattering light of the cylindrical skeleton 11 on light scattering measurement device 10
In.As depicted in figs. 1 and 2, and time domain follower 23 is connected to the magnetic resonance light of light scattering measurement device 10 by signal bus
The output end of scatter profile, also, time domain follower 23 is also electrically connected light source generator 21, and by being suitable for temporal modulation device
24 and signal bus be electrically connected optical detector 22, and processor 25 by signal bus connect optical detector 22, light scattering survey
Measure device 10 and time domain follower 23.
By above-mentioned setting, processor 25 generates the control signal of light incidence, and transmits time domain by signal bus and follow
Device 23, time domain follower 23 controls light source generator 21 and generates incident beam, and is incident to sample surfaces by optical fiber；It is generating
After the certain time-delay that the control signal of light incidence starts, processor 25 generates the control signal of magnetic resonance work, total by signal
Line passes to X-gradient power amplifier 16, Y-gradient power amplifier 17, Z-Gradient power amplifier 18 and the radio frequency gradient function of light scattering measurement device 10
It puts, to carry out the work of magnetic resonance while light incidence, 4 π solid angles is carried out to light scattering signal by RF power amplification 19
The picture catching in space, to obtain magnetic resonance light scatter profile；Meanwhile one started in the control signal for generating light incidence
After fixed delay, under the control of temporal modulation device 24, so that optical detector 22 generates incident beam in light source generator 21
Certain time-delay after by optical fiber receive scattering light, and then generate light scatter intensity signal value.
The magnetic resonance light scatter profile of above-mentioned generation passes to processor 25 by signal bus, and light scatter intensity is believed
Number value passes to processor 25 by signal bus, is dissipated magnetic resonance light scatter profile and light by algorithm in processor 25
Strength signal value is penetrated to be registrated.
Processor 25 is programmable gate array (PFGA Field-Programmable Gate in a particular embodiment
Array), image algorithm processing is carried out by programmable gate array, to obtain continuous light scatter intensity signal distribution plots.
Light scattering measurement circuit 20 further includes the first door operating mechanisms 26 and the second door operating mechanisms 27, wherein the first gate machine
Structure 26 is connected electrically between light source generator 21 and light scattering measurement device 10.Specifically, shown in Figure 1, the first gate machine
Structure 26 is electrically connected light source generator 21, and incident by the one group of light source entered for light source that optical fiber is connected to cylindrical skeleton 11
Hole only schematically indicates it in figure and is connected in one group of light source entrance aperture so that light source is fed into sample surfaces
On one through-hole, the position in the light source incidence hole that selection connects as needed in practice and quantity.The connection of second door operating mechanisms 27
Between optical detector 22 and light scattering measurement device 10, which is electrically connected optical detector 22, and passes through light
The one group of scattering light gone out for scattering light emission that fibre is connected to cylindrical skeleton 11 is fed out on mouth, to feeding out scattering light to optical detection
Device 22, only schematically indicates it in the figure and is connected to one group of scattering light and feed out on a through-hole of mouth, in practice basis
The scattering light for selecting connection is needed to feed out position and the quantity of mouth.
It should be noted that " first, second " used herein distinguishes the door operating mechanisms of different location, not
Primary and secondary, significance level and order etc. are represented, herein just for the sake of the door operating mechanisms of mark different location, originally with clear statement
The technical solution of application.
As depicted in figs. 1 and 2, in the first specific embodiment and the second specific embodiment, time domain follower 23 passes through the
One door operating mechanisms 26 are electrically connected light source generator 21, and temporal modulation device 24 is electrically connected time domain follower 23 and the second door operating mechanisms
27.Ginseng as shown in figure 3 and figure 4, in third specific embodiment and the 4th specific embodiment, can be also electrically connected by time domain follower 23
Connect the second door operating mechanisms 27, again by the second door operating mechanisms 27 electrical connection optical detector 22, and when the electrical connection of temporal modulation device 24
After domain follower 23, it is electrically connected the first door operating mechanisms 26.The effect of same achievable above-mentioned technical proposal.
In a particular embodiment, which further includes spectrometer 28, wherein the spectrometer 28 is connected electrically in place
It manages between device 25 and light scattering measurement device 10.
As shown in Figure 3 and Figure 4, which is directly connect with light scattering measurement device 10 by optical fiber, specifically, spectrometer
28 connect X-gradient power amplifier 16, Y-gradient power amplifier 17, Z-Gradient power amplifier 18 and the radio frequency function of light scattering measurement device 10 by optical fiber
19 are put, on the one hand magnetic resonance signal is sent to light scattering measurement device 10, on the other hand from the output end of image of RF power amplification 19
Receive picture signal.
In a particular embodiment, which further includes Waveform generator 29, and Waveform generator 29 is electrically connected
It connects between spectrometer 28 and light scattering measurement device 10.As depicted in figs. 1 and 2, spectrometer 28 is electrically connected by Waveform generator 29
X-gradient power amplifier 16, Y-gradient power amplifier 17, Z-Gradient power amplifier 18 and the RF power amplification 19 of light scattering measurement device 10 are connect, it is equivalent
Spectrometer 28 is connected by optical fiber, also, in this embodiment, spectrometer 28 is defeated by the image that signal bus connects RF power amplification 19
Outlet, for receiving picture signal.
Spectrometer 28 obtains magnetic resonance light scatter profile by picture signal, and then is exported again by signal bus to processing
Device 25.
In a particular embodiment, which further includes main controller 30, and main controller 30 is electrically connected processor
25.Whole control is carried out to light scattering measurement device 10 and light scattering measurement circuit 20 by main controller 30.
Based on above-mentioned each embodiment, light scattering measurement circuit 20 provided by the utility model is controlled and is surveyed with light combination scattering
Amount device 10 realizes the measurement scattered to light, obtains continuous light scatter intensity signal distribution plots.
The above is only the preferred embodiment of the utility model only, is not intended to limit the utility model, all at this
Within the spirit and principle of utility model, any modification, equivalent substitution, improvement and etc. done should be included in the utility model
Within the scope of protection.
Claims (9)
1. a kind of light scattering measurement circuit based on magnetic resonance imaging, which is characterized in that the light scattering measurement circuit (20) is used
The light scattering measurement device (10) of magnetic resonance light scatter profile is generated in connection, the light scattering measurement circuit (20) includes：
Light source generator (21), the light source generator (21) are electrically connected the light scattering measurement device (10)；
Optical detector (22), the optical detector (22) are electrically connected the light scattering measurement device (10)；
Time domain follower (23), the time domain follower (23) are electrically connected the light scattering measurement device (10)；
Temporal modulation device (24), the temporal modulation device (24) are electrically connected the time domain follower (23) and are electrically connected the light
One of source generator (21) and the optical detector (22), the time domain follower (23) are electrically connected the light source generator
(21) and the other of the optical detector (22)；
Processor (25), the processor (25) be electrically connected the optical detector (22), the light scattering measurement device (10) with
And the time domain follower (23).
2. light scattering measurement circuit according to claim 1, which is characterized in that the light scattering measurement circuit (20) is also wrapped
It includes：
First door operating mechanisms (26), first door operating mechanisms (26) are connected electrically in the light source generator (21) and the light dissipates
It penetrates between measuring device (10)；
Second door operating mechanisms (27), second door operating mechanisms (27) are connected electrically in the optical detector (22) and the light scatters
Between measuring device (10).
3. light scattering measurement circuit according to claim 2, which is characterized in that first door operating mechanisms (26) and described
Second door operating mechanisms (27) electrical connection corresponding with the time domain follower (23) and temporal modulation device (24) respectively.
4. light scattering measurement circuit according to claim 2, which is characterized in that first door operating mechanisms (26) and described
Second door operating mechanisms (27) are connect by optical fiber with the light scattering measurement device (10).
5. light scattering measurement circuit according to claim 1, which is characterized in that the light scattering measurement circuit (20) is also wrapped
It includes spectrometer (28), the spectrometer (28) is connected electrically between the processor (25) and the light scattering measurement device (10).
6. light scattering measurement circuit according to claim 5, which is characterized in that the spectrometer (28) by optical fiber with it is described
Light scattering measurement device (10) connection.
7. light scattering measurement circuit according to claim 5, which is characterized in that the light scattering measurement circuit (20) is also wrapped
It includes Waveform generator (29), the Waveform generator (29) is connected electrically in the spectrometer (28) and the light scattering measurement device
(10) between.
8. light scattering measurement circuit according to claim 1, which is characterized in that the light scattering measurement circuit (20) is also wrapped
It includes main controller (30), the main controller (30) is electrically connected the processor (25).
9. light scattering measurement circuit according to claim 1, which is characterized in that the processor (25) is programmable gate array
Column.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820523165.0U CN208172226U (en) | 2018-04-13 | 2018-04-13 | A kind of light scattering measurement circuit based on magnetic resonance imaging |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820523165.0U CN208172226U (en) | 2018-04-13 | 2018-04-13 | A kind of light scattering measurement circuit based on magnetic resonance imaging |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208172226U true CN208172226U (en) | 2018-11-30 |
Family
ID=64369063
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820523165.0U Expired - Fee Related CN208172226U (en) | 2018-04-13 | 2018-04-13 | A kind of light scattering measurement circuit based on magnetic resonance imaging |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208172226U (en) |
-
2018
- 2018-04-13 CN CN201820523165.0U patent/CN208172226U/en not_active Expired - Fee Related
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Durst et al. | Density fluctuation measurements via beam emission spectroscopy | |
| US6076010A (en) | Imaging spatially varying dynamic media with diffusing correlation waves | |
| Brogioli et al. | Heterodyne near-field scattering | |
| NZ507260A (en) | Arrangement and method to apply diffusing wave spectroscopy to measure the properties of multi-phase systems, as well as the changes therein | |
| EP0167272A2 (en) | Particle size measuring apparatus | |
| CN108287126B (en) | Nanoparticle size measurement system | |
| CN115825033A (en) | Microwave reflection detection device and method based on diamond NV color center | |
| CN111426401B (en) | Testing device and method for counting sensitivity consistency of photon counter | |
| CN106538069B (en) | Imaging is fed back using the ultra low-volume that laser Compton x-ray source and laser Compton gamma-ray source carry out | |
| CN208172226U (en) | A kind of light scattering measurement circuit based on magnetic resonance imaging | |
| KR102530265B1 (en) | Carrier lifetime measurement method and carrier lifetime measurement device | |
| RO130134B1 (en) | System and process for testing the effect of pulsed and synchronized flows of laser-accelerated particles | |
| EP0074588A1 (en) | Imaging apparatus using nuclear magnetic resonance | |
| CN105301025A (en) | Multi-band crystal spectrometer and adjusting method thereof | |
| CN208076700U (en) | A kind of light scattering measurement device based on magnetic resonance imaging | |
| CN106342212B (en) | High reflection mirror laser back scattering measurement mechanism | |
| CN107219182B (en) | The particle beams excites vacuum ultraviolet-visible light wave range magneto-optic spectrum test method and system | |
| NL2016405A (en) | Measurement apparatus and method. | |
| Mazzoni et al. | JACoW: Progress on Transverse Beam Profile Measurement Using the Heterodyne Near Field Speckles Method at ALBA | |
| KR102532521B1 (en) | Concentration measurement method and concentration measurement device | |
| JP6875265B2 (en) | Neutron beam detector | |
| CN108535673A (en) | A kind of light scattering measurement device based on magnetic resonance imaging | |
| CN108204890A (en) | The test method and its detection device of lighting system light field uniformity | |
| Okabe et al. | A preliminary study of the vibration wire monitor for beam halo diagnostic in J-PARC L3BT | |
| EP4184184A1 (en) | Measurement system and method for analyzing rf signals |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20181130 Termination date: 20190413 |