CN114543599A - Laser target simulation measuring device and measuring method - Google Patents
Laser target simulation measuring device and measuring method Download PDFInfo
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- CN114543599A CN114543599A CN202011327193.3A CN202011327193A CN114543599A CN 114543599 A CN114543599 A CN 114543599A CN 202011327193 A CN202011327193 A CN 202011327193A CN 114543599 A CN114543599 A CN 114543599A
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F42—AMMUNITION; BLASTING
- F42B—EXPLOSIVE CHARGES, e.g. FOR BLASTING, FIREWORKS, AMMUNITION
- F42B15/00—Self-propelled projectiles or missiles, e.g. rockets; Guided missiles
- F42B15/01—Arrangements thereon for guidance or control
Abstract
The device comprises a laser echo simulation source, a laser measurement detector and a control system; the laser echo simulation source is used for transmitting laser pulses with preset power under the control of the control system; the laser measurement detector comprises a laser processing assembly and a laser parameter measurement assembly; the laser processing assembly is used for receiving the laser pulse emitted by the laser echo simulation source and converging the laser pulse to form a converged light source; the laser parameter measuring component is used for receiving the convergent light source, carrying out photoelectric signal conversion to obtain an electric signal waveform and sending the electric signal waveform to the control system; the control system is used for receiving the electric signal waveform sent by the laser parameter measuring component and obtaining the laser pulse parameter based on a magnitude tracing method.
Description
Technical Field
The invention relates to the field of laser light wave guidance system simulation, in particular to a laser target simulation measuring device and a measuring method.
Background
At present, due to the urgent need of accurate guided weapons, laser guided weapons become a research hotspot of all countries, so far, the laser guided weapons are applied to the core hardware of a laser target simulation device in both the laser seeker research field and the laser guided semi-physical simulation research field.
However, most of the conventional laser target simulation devices at the present stage cannot realize the quantitative measurement of the photoelectric response parameters, especially the energy detection threshold, of the laser seeker, and the conventional laser target simulation devices are required to realize the measurement of the tracking performance of the laser seeker, and a two-dimensional turntable mode is adopted, so that the measurement system is complex and large, and the quantitative measurement of the laser echo is not suitable for the requirements of quick and portable tests.
Therefore, how to rapidly and conveniently realize quantitative measurement of the laser target simulation device becomes a technical problem to be solved urgently at present.
Disclosure of Invention
In view of the above problems of the prior art, an object of the present invention is to provide a laser target simulation measuring apparatus and a measuring method, which can measure parameters of laser pulses quantitatively.
In order to solve the technical problems, the specific technical scheme of the invention is as follows:
in one aspect, the invention provides a laser target simulation measuring device, which comprises a laser echo simulation source, a laser measuring detector and a control system;
the laser echo simulation source comprises a laser emission component;
the laser emission component is used for emitting laser pulses with preset power under the control of the control system;
the laser measurement detector comprises a laser processing assembly and a laser parameter measurement assembly;
the laser processing assembly is used for receiving the laser pulse emitted by the laser echo simulation source and carrying out convergence processing on the laser pulse to form a convergence light source;
the laser parameter measuring component is used for receiving the convergent light source, carrying out photoelectric signal conversion to obtain an electric signal waveform and sending the electric signal waveform to the control system;
the control system is used for receiving the electric signal waveform sent by the laser parameter measuring component and obtaining the laser pulse parameters based on a magnitude tracing method.
On the other hand, on the basis of the laser target simulation measuring device provided by the invention, the invention also provides a laser target simulation measuring method, which comprises the following steps:
controlling a laser echo simulation source to emit laser pulses with preset power;
receiving laser pulses emitted by the laser echo simulation source by using a laser measurement detector, and carrying out convergence and photoelectric conversion processing on the laser pulses to obtain an electric signal waveform;
and analyzing the waveform of the electric signal by using a magnitude tracing method to determine the parameters of the laser pulse.
By adopting the technical scheme, the laser target simulation measuring device has the following beneficial effects: according to the invention, the laser measuring detector is arranged to receive the laser pulse emitted by the laser echo simulation source, and the laser is converged and subjected to photoelectric conversion to obtain the electric signal waveform of the laser pulse, so that the receiving and the conversion of the laser pulse emitted by the laser echo simulation source can be realized, the control system is used for carrying out magnitude traceability analysis on the electric signal waveform converted by the laser measuring detector, and the quantitative measurement of the laser pulse parameter can be realized. The invention has simple structure and can quickly and conveniently obtain laser pulse parameters.
Drawings
In order to more clearly illustrate the technical solution of the present invention, the drawings used in the description of the embodiment or the prior art will be briefly described below. It is obvious that the drawings in the following description are only some embodiments of the invention, and that for a person skilled in the art, other drawings can be derived from them without inventive effort.
FIG. 1 is a schematic diagram of a laser target simulation measuring device according to the present invention;
FIG. 2 is a schematic diagram of a laser echo simulation source in some embodiments of the present disclosure;
FIG. 3 is a schematic diagram of a laser target simulation measurement apparatus in some embodiments of the present disclosure;
FIG. 4 is a schematic diagram of a laser target simulation measurement apparatus in some embodiments of the present disclosure;
FIG. 5 is a diagram of steps in a method for simulated measurement of a laser target in some embodiments of the present description.
Reference numbers in the figures:
1: a laser echo simulation source;
2: a laser measurement detector;
3: a control system;
4: a power supply;
5: a support structure;
11: a laser emitting assembly;
12: a laser modulation assembly;
13: a laser emitting assembly;
21: a laser processing assembly;
22: a laser parameter measurement component;
111: a drive module;
112: a laser tube;
121: a modulation signal generator;
122: an electro-optic modulator;
123: an adjustable attenuator;
124: a laser spot homogenizing assembly;
131: a collimation module;
132: an optical wedge assembly;
133: a small aperture diaphragm;
211: a filtering diaphragm assembly;
212: a convergence module;
221: an avalanche detector;
222: and a signal conditioning and measuring module.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention.
It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the invention described herein are capable of operation in sequences other than those illustrated or described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, apparatus, article, or device that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or device.
In order to realize quantitative measurement of a laser target simulation device, embodiments of the present specification provide a laser target simulation measurement device, which can emit a simulation laser with preset parameters as required, and accurately measure real parameters of the simulation laser, thereby realizing quantitative measurement of simulation laser parameters.
The structural composition of the laser target simulation measuring device provided by the embodiment of the specification is an expression form of the inventive concept of the specification, and too much or too little structural composition capable of realizing accurate measurement of simulated laser is within the scope of the technical scheme claimed by the specification.
In the embodiment, as shown in fig. 1, the structure of the laser target simulation measuring device is schematically illustrated, wherein the device includes a laser echo simulation source 1, a laser measurement detector 2 and a control system 3; the laser echo simulation source 1 is used for emitting laser pulses with preset power under the control of the control system 3, and the laser pulses can be used in the fields of life, science and technology, military and the like, for example, the laser pulses are used for positioning and tracking of laser radars and are used for simulating targets by national defense missile laser guide heads.
The laser measuring detector 2 comprises a laser processing component 21 and a laser parameter measuring component 22; the laser processing component 21 is configured to receive a laser pulse emitted by the laser echo simulation source 1, and perform convergence processing on the laser pulse to form a convergence light source; the laser parameter measuring component 22 is configured to receive the converged light source, perform photoelectric signal conversion to obtain an electrical signal waveform, and send the electrical signal waveform to the control system 3; the laser beam with concentrated energy and dense light beam can be obtained by converging the laser pulse light beam, the phenomenon that the energy absorption is insufficient due to the dispersion of the light beam is avoided during photoelectric conversion, the efficiency of photoelectric conversion is guaranteed, the accuracy of parameter measurement is improved, the laser pulse can be directly converted into an electric signal waveform form through the photoelectric conversion, the real parameters of the laser pulse can be further obtained through the analysis of the electric signal waveform, and the laser parameters can be rapidly and conveniently obtained.
The control system 3 is configured to receive the electrical signal waveform sent by the laser parameter measurement component 22, and obtain the parameter of the laser pulse based on a magnitude tracing method.
In this embodiment, the control system 3 may control the laser echo simulation source 1 and the laser measurement detector 2 to operate, where the control system 3 may be disposed independently of the laser echo simulation source 1 and the laser measurement detector 2, and in some other embodiments, the control system 3 may be disposed inside the laser echo simulation source 1 or inside the laser measurement detector 2, and a specific position is set according to an actual situation, which is not limited in this specification.
Control system 3 can be for the controller of device realizes the interaction with outside host computer through the serial ports, and the staff sends corresponding control command to the controller through the host computer, the controller is through right control command's analytic analysis or direct appropriate corresponding instruction information to ensure measuring device's normal work.
The parameters of the laser pulse can be obtained by a magnitude tracing method preset by the control system 3, or the parameters of the laser pulse can be obtained by an external upper computer obtaining the waveform of the electric signal received by the control system 3 and obtaining the corresponding parameters of the laser pulse by the magnitude tracing, and under the condition, the control system can be an internal structure of the upper computer.
It should be noted that the waveform parameter corresponding to the waveform of the electrical signal is not a parameter of a real laser pulse, but only represents parameter information such as the shape of the electrical signal, and the control system 3 receives the waveform parameter of the electrical signal and also needs to perform quantity tracing to obtain a real laser pulse parameter.
In an embodiment of the present specification, the process of obtaining the parameters of the laser pulse based on a magnitude tracing method includes: and acquiring the electrical signal waveforms of the standard laser under different parameters, and taking the laser parameters corresponding to the standard laser electrical signal waveforms matched with the received electrical signal waveforms as the parameters of the laser pulses. Specifically, the control system 3 may store an electrical signal parameter corresponding to a standard laser pulse in advance, and obtain a true laser pulse parameter through numerical value comparison verification, in some other embodiments, the control system 3 may obtain the electrical signal waveform (or the electrical signal waveform parameter) and send a corresponding verification platform, and perform test verification through the electrical signal waveform corresponding to the standard continuous laser, specifically include comparing the electrical signal waveform of the laser pulse in this specification with the electrical signal waveform corresponding to the standard continuous laser until obtaining an electrical signal waveform corresponding to the standard laser that matches the electrical signal waveform of the laser pulse in this specification, where the parameter of the standard laser corresponding to the electrical signal waveform is the parameter of the laser pulse to be measured in this specification, and the specific obtaining mode is set according to an actual situation.
In the embodiment of the present specification, the laser measurement detector 2 obtains the electrical signal waveform of the corresponding laser pulse by setting the laser processing component 21 and the laser parameter measurement component 22, and finally determines the real parameter of the laser pulse based on a magnitude tracing method, so that the working performance of the laser echo simulation source 1 can be further modified.
Further, the laser processing assembly 21 may include a convergence module 212, the laser parameter measurement assembly 22 includes an avalanche detector 221; the converging module 212 can converge the laser light passing through the filtering diaphragm assembly 211 to obtain a light beam with concentrated energy; the avalanche detector 221 can receive the laser processed by the convergence module 212, and perform photoelectric signal conversion on the received laser to obtain a converted electrical signal waveform, the energy of the converged laser beam is sufficient, the laser signal is relatively concentrated, the laser optical signal can be accurately obtained by the avalanche detector 221, and the converted electrical signal waveform is closer to a real value.
In order to improve the accuracy of laser parameter measurement, the laser processing component 21 may include a filtering diaphragm component 211, the laser parameter measurement component 22 may further include a signal conditioning and measuring module 222, the filtering diaphragm component 211 may perform filtering processing and adjusting of a light transmission aperture on a laser pulse emitted by the laser echo simulation source 1, the filtering processing may remove an influence of interference light, the adjusting of the light transmission aperture may ensure that light with a preset aperture passes through, and a content of a laser beam converging the laser may be accurately obtained, so that a parameter of each laser beam may be conveniently obtained during subsequent optical parameter calculation; the signal conditioning and measuring module 222 is configured to perform waveform amplification processing and digital-to-analog conversion on an electrical signal waveform to obtain parameters of the electrical signal waveform, and send the parameters of the electrical signal waveform to the control system 3, when the energy of a single laser beam is weak, the electrical signal waveform obtained through photoelectric conversion is not obvious, and the precision of the measured parameters of the laser pulse is poor, so that an electrical signal waveform with high precision can be obtained through amplification processing of the electrical signal waveform, specific parameters of the electrical signal waveform, such as a peak, a trough, a period, a frequency and the like, can be obtained through digital-to-analog conversion, and can be used as a direct recurrence object when magnitude tracing is performed, thereby improving the efficiency of tracing.
Illustratively, the filtering diaphragm assembly 211 may include a filtering element and a diaphragm element, where the filtering element may implement screening of laser with a preset wavelength, specifically, allow the laser with the preset wavelength, for example, the laser with the wavelength of 1064nm to pass through, and reflect the laser with the other wavelengths, so as to ensure that the laser pulse is the laser emitted by the laser echo simulation source 1, reduce interference of ambient light, and improve reliability of detection, the diaphragm element may modulate the beam diameter with the same optical aperture in a quantified manner, so that a suitable beam diameter may be selected according to different detectors, thereby improving accuracy of detection, the filtering element may be an optical filter or other components that may implement a filtering function, and the diaphragm element may be a small aperture diaphragm.
In this embodiment, the converging module 212 may be a light collecting lens, and performs converging processing on the spatial laser light to obtain accurate laser energy and other parameter information, so as to avoid a large deviation of detection data due to too low energy of a single laser beam.
Different detectors can be selected according to different laser types and detection standards, in the embodiment of the specification, laser pulses are used for representing laser echoes of a laser seeker, an avalanche detector can be selected, an avalanche diode gain control technology is adopted, space optical signals are converted into electric signals through photoelectricity, energy measurement of 1064nm laser ultra-weak single-pulse light can be achieved through static calibration, the measurement error is within 20%, the measurement pulse width can cover 10 ns-100 ns, the repetition frequency can cover 20 Hz-5 kHz, and the aperture of a measurement light beam covers 200mm, so that the accuracy and the reliability of laser pulse detection can be improved.
As shown in fig. 4, in a specific embodiment of a laser target simulation measuring device, the device may generate a simulation echo of a laser seeker so as to adjust a running track of the laser seeker, where the laser seeker is mainly used in the field of national defense such as precision guided weapons, and the laser seeker receives a laser pulse with preset parameters, and adjusts the running track of the laser seeker according to an emission angle of the laser pulse, so as to track the laser, and thus the prepared parameter for obtaining the laser pulse is very important.
Because the laser energy suitable for the laser seeker is low, or under other scenes with low laser energy, in order to further improve the accuracy of the test, the electric signal obtained by the avalanche detector 221 can be processed through the signal conditioning and measuring module 222, specifically, the electric signal can be filtered, amplified and subjected to digital-to-analog conversion, the interference of other electric signals can be removed through the filtering processing, the initial electric signal waveform can be amplified through the amplifying processing, so that more accurate waveform parameters can be obtained, the waveform can be converted into a parameter form through the digital-to-analog conversion principle, and the recording and the comparison are convenient.
In actual work, space light is focused and converged through a light collecting lens, energy is concentrated in a small circular area on the photosensitive surface of an avalanche detector, the avalanche detector can realize photoelectric signal conversion, the full waveform of an optical signal is converted into the waveform of an electric signal and recorded, the laser parameter corresponding to the electric signal is the parameter value to be measured, in order to obtain the specific parameter corresponding to the electric signal, the waveform of the electric signal can be filtered and amplified, the waveform of the electric signal of a real amplification version is obtained, and therefore digital-to-analog conversion can be conveniently and rapidly carried out on the waveform of the electric signal, and the corresponding electric signal parameter can be obtained.
In a further embodiment, a control instruction is sent to the laser echo simulation source 1 through a control system 3, where the control instruction may include a laser emission signal and laser parameter information; the parameter information may include pulse width, repetition frequency, single pulse energy, emission direction, and the like; optionally, the laser echo simulation source 1 may be provided with a laser emission component 11, the laser emission component 11 emits laser according to the laser emission instruction and according to parameter information carried in the instruction, the laser emission component 11 may emit laser pulses, in some other embodiments, the laser emission component 11 may emit laser pulse signals, and the laser pulse signals are emitted in a laser pulse form after being subjected to signal processing. The laser measurement detector 2 performs photoelectric signal conversion on the received laser pulse to obtain an electric signal waveform of the laser pulse to be measured, and finally the control system 3 obtains real simulated laser parameters through magnitude traceability.
In a further embodiment, as shown in fig. 3, the apparatus may further include a power supply 4, where the power supply 4 provides stable electric energy for the laser echo analog source 1, the laser measurement detector 2, and the control system 3, and optionally, the power supply 4 may be a high-temperature power supply, and the high-stability power supply realizes stable dc output conversion from 220V power supply to different voltage outputs.
In a further embodiment, the device may further comprise a support structure 5, which provides a stable working physical environment for the whole device. Alternatively, the support structure 5 may include a first support structure and a second support structure, the first support structure is disposed inside the laser echo simulation source 1 and is used for fixing and supporting the spatial relative position of other components of the simulation source, and the second support structure is disposed inside the laser measurement probe 2 and is used for providing the spatial relative position fixing and supporting for the probe functional component.
For example, the laser emitted in the embodiments of the present disclosure may be a laser for a semi-active laser seeker test, where the laser seeker is capable of receiving a laser echo and a direction thereof, so as to track the laser echo, and in actual work, the laser seeker receives a laser echo with low energy, so that a laser pulse with low energy needs to be emitted during laser simulation.
When the control system 3 controls the laser emitting assembly 11 to generate and emit a laser pulse signal, the laser emitting assembly 11 may further include a driving module 111 and a laser tube 112. The driving module 111 is configured to receive a control instruction of the control system 3, and send an electrical excitation signal to the laser tube 112 according to the control instruction; the laser tube 112 is configured to emit a laser pulse signal with a preset wavelength according to the electrical excitation signal sent by the driving module 111.
Optionally, the driving module 111 may be a laser tube temperature control driving circuit board, the laser tube 112 may be a pigtail output semiconductor laser tube, and the laser tube temperature control driving circuit board may receive a control instruction of the control system 3, so as to provide an electrical excitation signal to the pigtail output semiconductor laser tube, and simultaneously adjust the ambient temperature of the laser tube in real time, so as to ensure that the laser tube is within a suitable working temperature range, the pigtail output semiconductor laser tube is a light source device whose typical light emitting working wavelength is around 1064nm and covers 1064nm, and the laser tube is a single-mode fiber pigtail output semiconductor laser tube, and the pigtail output semiconductor laser tube may emit laser adapted to the receiving wavelength of the laser seeker.
It should be noted that the pigtail output semiconductor laser tube is a fiber laser, and optical transmission is realized through an optical fiber.
In order to better explain the operation of the laser echo simulation source and the further processing of the light in the optical fiber, as shown in fig. 2, the structure of the laser echo simulation source is schematically illustrated; the laser echo simulation source 1 may further include a laser modulation assembly 12 and a laser exit assembly 13.
Wherein the laser modulation component 12 can perform signal processing on the laser pulse to obtain a laser pulse with stable output; the laser emitting component 13 can adjust the emitting direction of the laser pulse modulated by the laser modulating component 12, and emit the emitted laser to the laser measuring probe 2.
The preset laser pulse can be obtained by processing the laser pulse signal generated and emitted by the laser tube 112 and adjusting the emission angle, and can be set according to the actual laser pulse requirement.
In a further embodiment, to better illustrate the process of processing the laser pulse signal, the laser modulation assembly 12 may include a modulation signal generator 121 and an electro-optical modulator 122, wherein the modulation signal generator 121 is configured to activate the electro-optical modulator 122, so that the electro-optical modulator 122 performs pulse modulation and signal coding on the laser pulse signal.
Illustratively, the modulation signal generator 121 may receive a control command of the control system 3, where the control command may include a modulation parameter and a coding parameter for the laser pulse signal, and the modulation signal generator 121 receives and interprets the control command and activates the electro-optical modulator 122 to operate.
In some other embodiments, the modulation signal generator 121 may further include an external trigger operating mode in addition to the internal trigger operating mode described above, specifically, the modulation signal generator 121 may further receive a control instruction of an external signal source, perform excitation, and control the electro-optical modulator 122 to operate, where a specific control process of the modulation signal generator is consistent with a control process of the control system 3, and details are not repeated here.
In a further embodiment, in order to achieve the output of the laser pulse according to preset parameters, such as the adjustment of the output energy of the laser pulse and the spread angle of the laser beam, the laser modulation assembly 12 further includes an adjustable attenuator 123 and a laser spot homogenization assembly 124; the adjustable attenuator 123 is used for adjusting the amplitude of the laser pulse signal to realize the quantitative attenuation of the laser energy; the laser spot homogenizing assembly 124 is used for homogenizing the laser light adjusted by the adjustable attenuator 123, and can adjust the laser beam to emit according to a certain scattering angle, so that the arrangement rule of the laser beam on the cross section of the laser beam is consistent, and the quantity of the laser beam is convenient to obtain.
Optionally, the adjustable attenuator 123 may be a light adjustable attenuator, and may adjust light energy in light, the laser spot homogenization assembly 124 may include a laser spot homogenization integrating sphere, and is connected to the transmission laser fiber through a fiber flange on an outer surface of the spherical shell, the laser spot homogenization integrating sphere homogenizes laser input by the fiber, and finally outputs the homogenized laser through an outlet of the integrating sphere, and laser pulse energy and laser distribution after quantitative attenuation and homogenization processing may meet preset requirements, so as to improve efficiency and accuracy of laser pulse emission.
In a further embodiment, the laser exit assembly 13 includes a collimating module 131 and an optical wedge assembly 132; the laser incidence end of the collimation module 131 is provided with a small-hole diaphragm 133, the small-hole diaphragm 133 is used for adjusting the diameter of the light beam passing through the homogenized laser, the collimation module 131 is used for collimating and modulating the laser beam passing through the small-hole diaphragm 133, and on the basis of the homogenization treatment, the laser beam is collimated so that the distribution density of the laser beam on the cross section of the laser beam is consistent; the optical wedge assembly 132 is used to change the emitting direction of the laser beam.
In actual work, the laser homogenized by the laser spot homogenizing assembly 124 is emitted uniformly to the space, in order to ensure that the finally emitted laser pulse meets the actual requirement, the laser pulse light needs to be collimated, specifically, a collimating lens may be provided, and an aperture diaphragm 133 is provided as a light limiting diaphragm at the focal plane position of the collimating lens, so that the aperture of the light passing through the aperture diaphragm may be reduced, and further, the light passing through the aperture diaphragm 133 is emitted in the collimated direction to the space, so that the outgoing divergence angle of the laser pulse may be obtained, so that a collimated, uniform and small-aperture laser beam may be obtained, and then the outgoing direction of the outgoing light may be adjusted by the optical wedge assembly 132, so that the target simulated echo may be received by the laser guide head, in the embodiment of the present specification, the optical wedge assembly 132 may be a dual-optical wedge assembly, the emergent direction of the space laser beam can be accurately changed.
Through the structural description of the laser echo simulation source 1, the emission of laser pulses aiming at different environments and different requirements can be realized, for example, for the test laser of a laser seeker, the laser echo simulation source 1 can emit laser with the laser wavelength of 1064nm, the light emitting repetition frequency can be adjusted at will between 20Hz and 5kHz, the pulse width can be adjusted at will between 10ns and 100ns, the single pulse energy for simulating laser pulse radiation can be adjusted at will between 50fJ and 100pJ, the light emitting caliber can be adjusted at will between 100mm and 200mm, and the adjustment is specifically carried out according to the test environment and the test requirements.
Specifically, a mechanical support structure of the laser echo simulation source provides a stable working physical environment for the whole laser echo simulation source, a high-stability power supply realizes stable direct current output conversion from 220V power supply to different voltage outputs, a pigtail output semiconductor laser tube typically has a light emitting working wavelength near 1064nm and covers the 1064nm wavelength, the semiconductor laser tube outputs through a single-mode fiber pigtail, the semiconductor laser tube supplies power through a laser tube and drives a circuit board to generate an optical signal through electric signal excitation, a laser external modulation component performs pulse modulation and signal coding on continuous light output by the laser tube, supports an internal trigger working mode and an external trigger working mode, and an optical fiber adjustable attenuator performs quantitative attenuation on laser energy to realize light output energy adjustment; the laser spot homogenization integrating sphere is connected with a transmission laser optical fiber through an optical fiber flange on the outer surface of the spherical shell, the input laser is homogenized and finally output through an integrating sphere outlet, and the pinhole diaphragm is positioned at the focal plane position of the laser collimating lens and is illuminated by the laser at the integrating sphere outlet; the laser collimating lens is mainly used for collimating laser emitted after the small-opening diaphragm into space light which is received by a laser seeker, the double-optical-wedge component can accurately change the emitting direction of the space light, the comprehensive control system mainly controls the whole device, in addition, the laser measuring detector can be a laser calibration detector, specifically, in a calibration probe form, and the hardware of the laser calibration lens comprises: the device comprises a receiver mechanical supporting structure, a light collecting lens, a light filtering diaphragm assembly, an avalanche detector and a signal conditioning and measuring circuit board, wherein the mechanical supporting structure provides a stable working physical structure environment for the whole calibration probe, the light filtering diaphragm assembly realizes transmission of narrow-band laser with 1064nm wavelength, reflection of the rest of the wavelength light, the diaphragm can be used for quantitatively adjusting and limiting the diameter of a light beam with a light-passing aperture, the light collecting lens focuses and collects space light, and the avalanche detector can realize photoelectric signal conversion. And finally, feeding back the signals to a comprehensive control system to realize quantitative measurement of laser photoelectric parameters.
On the basis of the laser target simulation measuring device provided above, an embodiment of the present specification further provides a laser target simulation measuring method, fig. 5 is a schematic step diagram of a laser target simulation measuring method provided by an embodiment of the present invention, and the present specification provides method operation steps as described in the embodiment or the flowchart, but more or less operation steps may be included based on conventional or non-inventive labor. The order of steps recited in the embodiments is merely one manner of performing the steps in a multitude of orders and does not represent the only order of execution. When an actual system or apparatus product executes, it can execute sequentially or in parallel according to the method shown in the embodiment or the figures. Specifically, as shown in fig. 5, the method may include:
s101: controlling a laser echo simulation source to emit laser pulses with preset power;
the control system sends a control instruction to the laser emission component through an instruction of the upper computer, the control instruction comprises a starting instruction and a laser parameter instruction, and the laser parameter can represent laser wavelength, pulse width, repetition frequency, single pulse energy, emission direction and the like.
In practical operation, after step S101, the method may further include a step of modulating and adjusting the laser, specifically:
the laser modulation component receives a laser pulse signal emitted by the laser emission component and processes the signal, so as to obtain a laser pulse with stable output;
and the laser emitting component adjusts the emitting direction of the laser pulse modulated by the laser modulation component and emits the emitted laser to the laser measuring detector.
Illustratively, a tail fiber is controlled by a comprehensive control system to output a semiconductor laser tube to emit continuous laser signals, laser pulses required by composite measurement are formed through an electro-optical modulator, then light is homogenized through a laser spot homogenizing integrating sphere, light rays illuminate an aperture diaphragm, the laser pulses transmitted from the aperture diaphragm are collimated by an optical lens, finally pointing adjustment of an emergent beam optical axis is realized through a double optical wedge, and finally the laser pulses are received by a laser seeker, so that simulation of an input light excitation signal of the laser seeker is realized, and laser pulses with preset parameters can be obtained through modulation and emergent angle adjustment of emergent laser, so that different requirements on the laser pulses can be met.
S103: laser measuring detectors are used for receiving laser pulses emitted by the laser echo simulation sources, and the laser pulses are converged and subjected to photoelectric conversion processing to obtain electric signal waveforms;
the photoelectric conversion of the laser signal is conveniently realized through the convergence processing of the laser, so that the real parameters of the laser pulse are obtained.
In actual operation, step S103 is preceded by a step of processing to receive laser pulses, specifically,
and the filtering diaphragm assembly receives laser pulses emitted by the laser echo simulation source and filters and adjusts the light transmission aperture of the laser pulses.
The laser measuring device can be understood as filtering laser pulses through the light filtering piece, then the light passing diaphragm piece adjusts the light passing aperture of laser passing through the light filtering piece, the influence of external light on a measuring result can be reduced, light limiting processing of the diaphragm piece can be further carried out, parameters of laser with a preset aperture are obtained, and therefore measuring accuracy is improved.
Performing photoelectric signal conversion on the convergent light source, and sending the converted electric signal waveform to the control system; it can be understood that, when the avalanche detector receives the laser energy converged by the convergence module, so as to perform photoelectric conversion on the laser energy, that is, convert the laser energy into an electrical signal from an optical signal, and for a case that the electrical signal is not obvious due to too low laser energy, so as to affect the measurement accuracy, after step S103, the method may further include:
and filtering, amplifying and carrying out digital-to-analog conversion on the converted electric signal.
The interference of other electric signals can be removed through filtering processing, the initial electric signal waveform can be amplified through amplification processing, so that more accurate waveform parameters are obtained, and the waveform can be converted into a parameter form through the digital-to-analog conversion principle in digital-to-analog conversion, so that the recording and the comparison are convenient.
S105: and analyzing the waveform of the electric signal by using a magnitude tracing method to determine the parameters of the laser pulse.
As can be seen from the above discussion, the electrical signal parameters received by the control system are not the parameters of the real laser pulse, and the magnitude tracing needs to be performed to obtain the parameters of the real laser pulse. Specifically, the control system may store an electrical signal parameter corresponding to a standard laser pulse in advance, obtain a real laser pulse parameter through numerical value comparison verification, and in some other embodiments, may also obtain the electrical signal parameter and send a corresponding verification platform, perform test verification through an electrical signal waveform corresponding to a standard laser until the electrical signal parameter of the laser pulse in this specification is obtained, where a specific obtaining manner is set according to an actual situation.
According to the laser target simulation measurement method, the received laser signals are processed and converged, the converged laser pulses are subjected to photoelectric conversion through the avalanche detector to obtain electric signal waveforms, the electric signal waveforms are subjected to waveform processing, and finally real parameter information of the laser pulses is obtained through magnitude tracing through the control system, so that the laser pulse signals can be rapidly and conveniently measured.
In some other embodiments, the control system may further implement a function of calibrating the laser echo simulation source, and on the basis of obtaining the real parameters of the laser pulse, the control system may obtain a calibration value of the laser emitted by the laser echo simulation source by combining with preset parameters of the laser pulse, and may perform corresponding calibration each time the laser echo simulation source operates.
In some other embodiments, verification of the tracking performance of the laser seeker can be further achieved through the laser pulse with a certain angle emitted by the laser echo simulation source in the description, specifically, the laser seeker receives the laser pulse with the angle changed by the double-optical-wedge assembly, laser tracking is achieved by the laser seeker according to the emission angle of the laser pulse, an actual tracking angle of the laser seeker is obtained by the internal detection module of the laser seeker in real time, accordingly, the actual tracking angle of the laser seeker can be obtained by the control system, a tracking deviation angle of the laser seeker is obtained by combining a preset laser emission angle of the double-optical-wedge assembly, and the tracking performance of the laser seeker is judged according to the tracking deviation angle.
Optionally, the tracking angle of the laser seeker can be adjusted according to the tracking deviation angle, specifically, when the tracking deviation angle is α, that is, α is an actual tracking angle — a preset laser emission angle, and when the laser seeker obtains an emission angle of a laser echo, the term α is an angle that the laser seeker needs to track, so that by judging and calibrating the tracking performance of the laser seeker, the accuracy of laser tracking of the laser seeker can be improved, and further the guidance precision of precision guided weapons such as missiles and the like is improved.
The laser target simulation measuring device and the measuring method provided by the invention can achieve the following beneficial effects:
1) the laser target simulation measurement device and the measurement method provided by the embodiment of the specification can emit laser pulses with specific parameters and emission angles according to actual needs, and improve the application range of a laser echo simulation source.
2) The laser target simulation measurement device and the measurement method provided by the embodiments of the present specification can obtain real laser parameters by filtering and converging laser pulses, avoid interference of ambient light, converge energy, and further improve accuracy of laser parameter acquisition.
3) The laser target simulation measurement device and the laser target simulation measurement method provided by the embodiments of the present specification can realize measurement of ultra-weak laser pulse energy by arranging the avalanche detector, thereby improving accuracy and reliability of laser pulse measurement.
While the invention has been described with reference to specific embodiments, it will be appreciated by those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the invention can be embodied in other specific forms without departing from the spirit or essential attributes thereof. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.
Claims (10)
1. The laser target simulation measuring device is characterized by comprising a laser echo simulation source (1), a laser measuring detector (2) and a control system (3);
the laser echo simulation source (1) is used for emitting laser pulses with preset power under the control of the control system (3);
the laser measurement detector (2) comprises a laser processing component (21) and a laser parameter measurement component (22);
the laser processing assembly (21) is used for receiving laser pulses emitted by the laser echo simulation source (1) and converging the laser pulses to form a converging light source;
the laser parameter measuring component (22) is used for receiving the convergent light source, carrying out photoelectric signal conversion to obtain an electric signal waveform, and sending the electric signal waveform to the control system (3);
the control system (3) is used for receiving the electric signal waveform sent by the laser parameter measuring component (22) and obtaining the laser pulse parameters based on a magnitude tracing method.
2. The laser target simulation measuring device of claim 1, wherein the laser processing assembly (21) comprises a filter diaphragm assembly (211) and a convergence module (212);
the filtering diaphragm assembly (211) is used for filtering laser pulses emitted by the laser echo simulation source (1) and adjusting the light transmission aperture;
the converging module (212) is used for converging the laser pulse to obtain an energy-concentrated beam.
3. The laser target simulation measuring device of claim 1, wherein the laser parameter measuring assembly (22) comprises an avalanche detector (221) and a signal conditioning and measuring module (222);
the avalanche detector (221) is used for receiving the laser processed by the convergence module (212) and performing photoelectric signal conversion on the received laser to obtain a converted electric signal waveform;
the signal conditioning and measuring module (222) is used for carrying out waveform amplification processing and digital-to-analog conversion operation on the waveform of the electric signal to obtain parameters of the waveform of the electric signal and sending the parameters of the waveform of the electric signal to the control system (3).
4. The laser target simulation measuring device of claim 2, wherein the process of obtaining the parameters of the laser pulse based on the magnitude tracing method comprises:
and acquiring electrical signal waveforms of the standard laser under different parameters, matching the electrical signal waveforms of the standard laser under different parameters with the electrical signal waveforms sent from the laser parameter measuring component (22), and taking laser parameters corresponding to the matched electrical signal waveforms of the standard laser as parameters of the laser pulse.
5. The laser target simulation measuring device according to claim 1, wherein the control system (3) is further configured to compare the obtained parameters of the laser pulse with preset parameters of the laser pulse to obtain a parameter calibration value of the laser pulse emitted by the laser echo simulation source (1).
6. The laser target simulation measuring device of claim 1,
the laser echo simulation source (1) comprises a laser emitting component (11), a laser modulating component (12) and a laser emitting component (13);
the laser emission component (11) is used for emitting laser pulses with preset power under the control of the control system;
the laser modulation component (12) is used for carrying out signal processing on the laser pulse to obtain a laser pulse with stable output;
the laser emitting component (13) is used for adjusting the emitting direction of the laser pulse modulated by the laser modulating component (12) and emitting the emitted laser to the laser measuring detector (2).
7. The laser target simulation measuring device of claim 6, wherein the laser modulation assembly (12) comprises a modulation signal generator (121) and an electro-optical modulator (122);
the modulation signal generator (121) is used for exciting the electro-optical modulator (122) so that the electro-optical modulator (122) performs pulse modulation and signal coding on a laser pulse signal.
8. The laser target simulation measuring device of claim 6, wherein the laser modulation assembly (12) further comprises an adjustable attenuator (123) and a laser spot homogenization assembly (124);
the adjustable attenuator (123) is used for adjusting the amplitude of the laser pulse signal so as to realize the quantitative attenuation of the laser energy;
the laser spot homogenizing assembly (124) is used for homogenizing the laser light adjusted by the adjustable attenuator (123).
9. The laser target simulation measuring device of claim 6, wherein the laser exit assembly (13) comprises a collimating module (131) and an optical wedge assembly (132);
an aperture diaphragm (133) is arranged at the laser incidence end of the collimation module (131), the aperture diaphragm (133) is used for adjusting the diameter of the light beam of the homogenized laser, and the collimation module (131) is used for collimating and modulating the laser beam passing through the aperture diaphragm (133);
the optical wedge assembly (132) is used for changing the emitting direction of the laser beam.
10. A laser target simulation measuring method, which is applied to the laser target simulation measuring apparatus according to any one of claims 1 to 9, comprising:
controlling a laser echo simulation source to emit laser pulses with preset power;
receiving laser pulses emitted by the laser echo simulation source by using a laser measurement detector, and carrying out convergence and photoelectric conversion processing on the laser pulses to obtain an electric signal waveform;
and analyzing the waveform of the electric signal by using a magnitude tracing method to determine the parameters of the laser pulse.
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