WO2014205904A1 - Array substrate and manufacturing method therefor, and display device - Google Patents

Array substrate and manufacturing method therefor, and display device Download PDF

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Publication number
WO2014205904A1
WO2014205904A1 PCT/CN2013/081718 CN2013081718W WO2014205904A1 WO 2014205904 A1 WO2014205904 A1 WO 2014205904A1 CN 2013081718 W CN2013081718 W CN 2013081718W WO 2014205904 A1 WO2014205904 A1 WO 2014205904A1
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WIPO (PCT)
Prior art keywords
insulating layer
array substrate
electrode
substrate
dielectric constant
Prior art date
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PCT/CN2013/081718
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French (fr)
Chinese (zh)
Inventor
袁剑峰
冯玉春
林承武
Original Assignee
京东方科技集团股份有限公司
北京京东方显示技术有限公司
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Publication of WO2014205904A1 publication Critical patent/WO2014205904A1/en

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    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells
    • G02F1/136213Storage capacitors associated with the pixel electrode
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/133345Insulating layers
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1343Electrodes
    • G02F1/134309Electrodes characterised by their geometrical arrangement
    • G02F1/134363Electrodes characterised by their geometrical arrangement for applying an electric field parallel to the substrate, i.e. in-plane switching [IPS]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • H01L27/1214Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
    • H01L27/1248Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition or shape of the interlayer dielectric specially adapted to the circuit arrangement
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1343Electrodes
    • G02F1/134309Electrodes characterised by their geometrical arrangement
    • G02F1/134372Electrodes characterised by their geometrical arrangement for fringe field switching [FFS] where the common electrode is not patterned

Definitions

  • the present invention relates to the field of display, and in particular to an array substrate, a method of manufacturing the same, and a display device. Background technique
  • Liquid crystal molecules of conventional liquid crystal displays generally switch between vertical-parallel states, and there are problems of angular anisotropy and narrow viewing angle.
  • LCDs liquid crystal displays
  • IPS In-Plane Switching
  • FFS Fringe Field Switching
  • the common feature of the IPS technology and the FFS technology is that the pixel electrode and the common electrode are disposed on the array substrate. Therefore, an insulating layer (usually a resin layer, or a passivation layer) or an insulating layer is required between the pixel electrode and the common electrode.
  • an insulating layer usually a resin layer, or a passivation layer
  • an insulating layer is required between the pixel electrode and the common electrode.
  • the insulating layer is initially made of a silicon nitride insulating film, and the silicon nitride has a large dielectric constant (7 to 8), and a large pixel storage capacitor can be obtained, which contributes to driving reduction.
  • the silicon nitride insulating film is difficult to fabricate, and the surface flatness of the array substrate cannot be ensured (flatness is advantageous for reducing the incidence of defects such as polyimide (PI) coating and rubbing alignment), and Due to the large dielectric constant of silicon nitride, there is often a large parasitic capacitance at the data lines, gate lines, and the like. Therefore, the insulating layer between the existing pixel electrode and the common electrode is generally an organic insulating film such as a resin layer.
  • the dielectric constant (3 to 4) of the resin is smaller than that of silicon nitride, and the fabrication is simple. The introduction of the array substrate can charge the LCD.
  • the invention provides an array substrate, a manufacturing method thereof and a display device, which can reduce the parasitic capacitance at the signal line trace and solve the driving problem caused by the organic insulating film disposed between the pixel electrode and the common electrode in the prior art.
  • the problem of high voltage is a problem of high voltage.
  • An array substrate comprising a substrate and a pixel electrode, a common electrode, a thin film transistor and a signal line disposed on the substrate, the signal line comprising a gate line, a data line and a common electrode line, the array substrate further comprising:
  • An insulating layer disposed between the pixel electrode and the common electrode, the insulating layer including a first portion corresponding to the display region and a second portion corresponding to the non-display region, the non-display region including the thin film transistor and The area corresponding to the signal line trace,
  • the dielectric constant of the first portion is greater than a first threshold
  • the dielectric constant of the second portion is less than a second threshold
  • the first threshold is greater than the second threshold
  • the material of the insulating layer has the following characteristics: After ultraviolet light irradiation, the dielectric constant becomes large.
  • the first portion of the insulating layer is subjected to ultraviolet light irradiation during the manufacturing process, and the second portion of the insulating layer is not subjected to ultraviolet light irradiation during the manufacturing process.
  • the insulating layer is an organic insulating film.
  • the array substrate further includes a passivation layer
  • the present invention further provides a display device in which the passivation layer is disposed closer to the surface of the array substrate than the insulating layer, comprising: the array substrate described above.
  • the present invention further provides a method for fabricating an array substrate, comprising the steps of: forming an insulating layer on a substrate on which a first electrode is formed, wherein the insulating layer is made of a material having a higher dielectric constant after being irradiated with ultraviolet light; production;
  • the array substrate is subjected to ultraviolet light from a side of the non-face to face of the array substrate.
  • the first electrode is a pixel electrode
  • the second electrode is a common electrode
  • the first electrode is a common electrode
  • the second electrode is a pixel electrode.
  • the method further includes the step of: forming a passivation layer on the substrate on which the insulating layer is formed.
  • the array substrate provided by the present invention, the manufacturing method thereof and the display device are provided with an insulating layer between the pixel electrode and the common electrode.
  • the dielectric constant of the first portion corresponding to the display region on the insulating layer is greater than the first critical value.
  • the purpose of increasing the pixel storage capacitance and lowering the driving voltage can be achieved;
  • the dielectric constant of the second portion corresponding to the non-display area on the insulating layer is less than the second critical value (the first critical value is greater than The second critical value) can reduce the parasitic capacitance existing in the non-display area (the area corresponding to the thin film transistor and the signal line trace), ensure the charging rate, and ensure the display effect.
  • FIG. 1 is a schematic plan view showing a planar structure of an array substrate according to Embodiment 1 of the present invention
  • FIG. 2 is a cross-sectional structural view of the array substrate of FIG. 1 taken along line A-A';
  • FIG. 3 is a schematic view of an array substrate fabricated by irradiating a substrate with ultraviolet light according to Embodiment 1 of the present invention
  • FIG. 4 is a schematic structural diagram of an optional array substrate according to Embodiment 1 of the present invention
  • FIG. 5(a) is a schematic diagram showing the position of a passivation layer in an array substrate according to an embodiment of the present invention
  • Embodiment 1 is a schematic diagram of a position of a passivation layer in an array substrate
  • FIG. 6 is a flow chart 1 of a method for manufacturing an array substrate according to Embodiment 2 of the present invention
  • FIG. 7 is a second flowchart of a method for manufacturing an array substrate according to Embodiment 2 of the present invention.
  • FIG. 8 is a schematic view showing a manufacturing process corresponding to the method of manufacturing the array substrate shown in FIG. 7.
  • FIG. 8 is a schematic view showing a manufacturing process corresponding to the method of manufacturing the array substrate shown in FIG. 7.
  • the array substrate includes a substrate 11 and a thin film transistor 13 , a pixel electrode 14 , a common electrode 16 , a signal line 12 , and a signal line disposed on the substrate 11 .
  • 12 includes a gate line, a data line, and a common electrode line.
  • the array substrate further includes: an insulating layer 15 disposed between the pixel electrode 14 and the common electrode 16.
  • the insulating layer 15 includes: a first portion 151 corresponding to the display area, and A second portion 152 corresponding to the display area, the second portion 152 includes a region corresponding to the trace of the thin film transistor 13 and the signal line 12; the dielectric constant of the first portion 151 is greater than the first critical value ⁇ ⁇ , and the dielectric constant of the second portion 152 Less than the second critical value ⁇ 2, the first critical value ⁇ is greater than the second critical value ⁇ 2.
  • the pixel electrode 14 and the common electrode 16 in this embodiment are both disposed on the substrate 11.
  • the array substrate and the color filter substrate are filled with liquid crystal after the box, and the liquid crystal molecules are located above the common electrode 16 in FIG. 2, and the display signal is loaded through the thin film transistor 13.
  • the driving electric field formed between the pixel electrode 14, the pixel electrode 14 and the common electrode 16 drives the liquid crystal molecules to be deflected, thereby displaying an image.
  • an insulating layer 15 is disposed between the pixel electrode 14 and the common electrode 16, the first portion 151 of the insulating layer 15 corresponds to the display region, and the second portion 152 corresponds to the non-display region.
  • the display area that is, the area through which the backlight is permeable on the array substrate (also referred to as a light-transmitting area) and the color film color resist 22 (refer to FIG.
  • the non-display area that is, the area corresponding to the trace of the thin film transistor 13 and the signal line 12, the backlight cannot be emitted due to the occlusion of the metal layer or the metal trace, and the non-display area and the black matrix after the pair of boxes 23 (the general position on the color filter substrate 20) corresponds to the position.
  • the pixel storage capacitance Cst increases as the dielectric constant ⁇ of the first portion 151 increases.
  • the portion 152 corresponds to the non-display area (the thin film transistor 13 and the signal line 12 routing area).
  • the technical solution provided in this embodiment ensures insulation.
  • the dielectric constant of the second portion 152 is kept at a lower level (less than the second critical value ⁇ 2) to reduce the parasitic capacitance;
  • the dielectric constant of the first portion 151 is increased as much as possible (greater than the first The threshold value ⁇ 1 ) increases the pixel storage capacitor Cst to lower the driving voltage Vop to ensure the display effect.
  • the dielectric constant of the first portion 151 is greater than the first critical value ⁇ 1.
  • the first portion 151 is made of a material having a large dielectric constant as much as possible under the premise of satisfying other conditions such as insulation and preparation processes.
  • the value of the first critical value ⁇ ⁇ satisfies ⁇ 1 ⁇ 4.5; the dielectric constant of the second portion 152 is smaller than the second critical value ⁇ 2, and the first critical value ⁇ ⁇ is greater than the second critical value ⁇ 2 , and the second portion 152
  • a material having a small dielectric constant is selected as much as possible.
  • the value of the second critical value ⁇ 2 satisfies ⁇ 2 ⁇ 3.
  • the insulating layer 15 in this embodiment may be a single layer or a composite layer.
  • silicon nitride has a dielectric constant of 7 to 8
  • a resin has a dielectric constant of 3 to 4.
  • patterned nitride is formed using silicon nitride.
  • the silicon layer 153, the silicon nitride layer 153 is only distributed in the display region; then the resin is coated to form the resin layer 154 to ensure the flatness of the surface of the array substrate.
  • the silicon nitride layer 153 and the resin layer 154 together constitute the insulating layer 15 in this embodiment.
  • the first portion 151 of the insulating layer 15 includes a silicon nitride layer 153 and a resin layer 154.
  • the dielectric constant of the first portion 151 is understood to be nitriding.
  • the silicon layer 153 and the resin layer 154 have an equivalent dielectric constant, and the resin layer 154 of the first portion 151 is generally thin, so that the equivalent dielectric constant of the first portion 151 is close to 7 to 8; the second portion 152 of the insulating layer 15 is only The resin layer 154 is included, and therefore, the dielectric constant of the second portion 152 is the dielectric constant of the resin layer 154.
  • the insulating layer 15 can be formed in steps, and the first portion 151 and the second portion 152 which finally form the insulating layer 15 can be formed through a preparation step as in the prior art.
  • the following embodiments are a preferred embodiment of the present embodiment, and the specific embodiments described herein are merely illustrative of the embodiments and are not intended to be limiting.
  • the material of the insulating layer 15 has the following characteristics: Point: The dielectric constant becomes larger after irradiation with ultraviolet light. And for better display, insulation
  • the dielectric constant of the selected material is generally not less than the dielectric constant of the prior art insulating layer material such as the resin layer.
  • the insulating layer 15 is prepared by using the material having a large dielectric constant after ultraviolet light irradiation, and of course, the insulating requirements and the process preparation requirements are also required, and then the array substrate 10 is prepared according to a conventional procedure.
  • the array substrate 10 is irradiated with ultraviolet light 30 from the side of the non-opposing surface of the array substrate 10.
  • the side of the non-opposing surface described herein refers to the side of the array substrate 10 that is close to the backlight.
  • the display area (light-transmitting area) is permeable to light, and the first portion 151 corresponding to the display area is subjected to ultraviolet light 30 irradiation during the manufacturing process, and the ultraviolet light 30 is irradiated to make the dielectric constant of the first portion 151 large; the non-display area and the film
  • the transistor 13 and the signal line 12 are correspondingly routed. Due to the occlusion of the metal layer or the metal trace, the second portion 152 corresponding to the non-display area is not subjected to the ultraviolet light 30 during the manufacturing process, and the dielectric constant remains unchanged.
  • the structure of the array substrate provided in this embodiment is substantially the same as that of the prior art, except that the insulating layer selects a material whose dielectric constant is sensitive to ultraviolet light irradiation, and after the preparation process of the array substrate is completed, the ultraviolet light irradiation step is added to make the insulating layer 15
  • the first portion 151 (corresponding to the electrode region) undergoes a physical or chemical change, thereby increasing the dielectric constant of the first portion 151, thereby increasing the pixel storage capacitance Cst and lowering the driving voltage Vop.
  • the insulating layer is an organic insulating film.
  • the organic insulating film is simple to manufacture (usually coated with a film), and the surface flatness of the array substrate can be ensured, which is advantageous for reducing the incidence of defects such as PI coating and rubbing orientation.
  • the array substrate further includes: a passivation layer 17; the passivation layer 17 is disposed closer to the array substrate than the insulating layer 15 One side of the face.
  • the array substrate is opposite to the surface of the array substrate on the array substrate near the color filter substrate. Since the passivation layer 17 is disposed on the side closer to the face of the array substrate, the introduction of the passivation layer 17 does not affect the intensity of the ultraviolet light to the insulating layer 15.
  • the passivation layer 17 may be disposed above the insulating layer 15 below the common electrode 16; or as shown in FIG. 5(b), the passivation layer 17 may be used. It is disposed above the common electrode 16. It is to be noted that, in the drawings of the present embodiment, only the case where the pixel electrode 14 is closer to the substrate 11 than the common electrode 16 is shown, but the present invention can be applied even if the positions of the pixel electrode and the common electrode are interchanged.
  • the array substrate provided by the invention can reduce the parasitic capacitance at the signal line trace and solve the problem of high driving voltage caused by the organic insulating film disposed between the pixel electrode and the common electrode in the prior art.
  • the present invention also provides a display device comprising any of the above array substrates.
  • the display device has a small driving voltage, saves energy and saves power, and at the same time, reduces the influence of parasitic capacitance on the display effect, thereby obtaining higher display quality.
  • the display device may be any product or component having a display function such as a liquid crystal panel, an electronic paper, an OLED panel, a mobile phone, a tablet computer, a television, a display, a notebook computer, a digital photo frame, a navigator, and the like.
  • Embodiment 2 Embodiment 2
  • the present invention also provides a method of fabricating an array substrate. As shown in FIG. 6, the method includes the following steps:
  • the insulating layer being made of a material having a large dielectric constant after being irradiated with ultraviolet light;
  • the second electrode is a common electrode; and when the first electrode is a common electrode, the second electrode is a pixel electrode.
  • the manufacturing method of the array substrate provided by the present invention is substantially the same as that of the prior art, except that the insulating layer selects a material whose dielectric constant is sensitive to ultraviolet light irradiation, and after the preparation process of the array substrate is completed, the ultraviolet light irradiation step is added to make the insulation.
  • the first portion of the layer (corresponding to the electrode region) undergoes a physical or chemical change to increase the dielectric constant of the first portion, thereby increasing the pixel storage capacitance Cst and lowering the driving voltage Vop.
  • the insulating layer is an organic insulating film.
  • Fig. 7 is a flow chart showing the manufacturing method of the array substrate shown in the cross-sectional view taken along line A-A' in Fig. 1, that is, an Array process flow.
  • a schematic diagram of the manufacturing process corresponding to the Array process flow is depicted in Figure 8, which is substantially similar to the conventional array (Array) process, namely: Glass ⁇ Gate ⁇ SDT ⁇ 1 st Organic ⁇ Pixel ITO ⁇ 2nd Organic ⁇ Common ITO, except that 2nd Organic is an insulating layer interposed between the pixel electrode and the common electrode as described in the embodiment, and an organic insulating film whose dielectric constant ⁇ is controlled by ultraviolet (UV) light is used.
  • Array conventional array
  • the array substrate manufacturing method shown in FIG. 7 includes the following steps:
  • 201 forming a gate metal layer (Gate) on the substrate (Glass), forming a gate and a gate line of the thin film transistor by a patterning process;
  • 202 forming a gate insulating layer, a semiconductor layer, and a source/drain metal layer, and forming a thin film transistor 13 and a data line by a patterning process;
  • 204 forming a transparent conductive layer on the substrate formed with the interlayer insulating layer, forming a pixel electrode 14 by a patterning process;
  • the insulating film 15 is preferably an organic insulating film whose dielectric constant ⁇ can be controlled by ultraviolet (UV) light;
  • 206 forming a transparent conductive layer on the substrate on which the insulating layer 15 is formed, forming a common electrode 16 by a patterning process;
  • the embodiment provides a method for fabricating an array substrate by irradiating a substrate with UV light.
  • the dielectric constant ⁇ of the organic insulating film in the light-transmitting region is changed by UV light irradiation to achieve the purpose of increasing the pixel storage capacitor Cst.
  • the driving voltage Vop of the LCD to which the organic insulating film technology is applied is lowered.
  • the FFS mode array substrate is taken as an example, but the application of the present invention is not limited thereto.
  • the technical solution of the present invention is applicable to an application scenario in which an insulating layer needs to be disposed between all the pixel electrodes and the common electrode.

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Mathematical Physics (AREA)
  • Power Engineering (AREA)
  • Optics & Photonics (AREA)
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  • Condensed Matter Physics & Semiconductors (AREA)
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Abstract

An array substrate, comprising a substrate (11), and a pixel electrode (14), a common electrode (16), a thin-film transistor (13) and a signal line (12) which are arranged on the substrate (11). The signal line (12) comprises a gate line, a data line and a common electrode line. The array substrate further comprises: an insulation layer (15) arranged between the pixel electrode (14) and the common electrode (16). The insulation layer (15) comprises: a first part (151) corresponding to a display area, and a second part (152) corresponding to a non-display area. The non-display area comprises: an area corresponding to the thin-film transistor (13) and the cabling of the signal line (12). The dielectric constant of the first part (151) is greater than a first critical value (ε1), the dielectric constant of the second part (152) is smaller than a second critical value (ε2), and the first critical value (ε1) is greater than the second critical value (ε2). The array substrate can not only reduce the stray capacitance at the cabling of the signal line, but can also solve the problem in the prior art that the drive voltage is higher due to the fact that an organic insulation film is arranged between the pixel electrode and the common electrode. Also provided are a manufacturing method for an array substrate and a display device.

Description

阵列基板及其制造方法和显示装置 技术领域  Array substrate, manufacturing method thereof and display device
本发明涉及显示领域,尤其涉及一种阵列基板及其制造方法和显示装置。 背景技术  The present invention relates to the field of display, and in particular to an array substrate, a method of manufacturing the same, and a display device. Background technique
传统液晶显示器( Liquid Crystal Display, LCD)的液晶分子一般都在垂 直 -平行状态间切换, 存在视角各向异性和可视角度窄的问题, 目前针对这一 问题已经提出了很多种解决方法,如平面转换(In-Plane Switching,简称 IPS) 技术和边缘场开关 (Fringe Field Switching, 简称: FFS) 技术。  Liquid crystal molecules of conventional liquid crystal displays (LCDs) generally switch between vertical-parallel states, and there are problems of angular anisotropy and narrow viewing angle. At present, many solutions have been proposed for this problem, such as In-Plane Switching (IPS) technology and Fringe Field Switching (FFS) technology.
IPS技术和 FFS技术, 其共同特点是像素电极和公共电极都设置在阵列 基板上, 因此, 像素电极和公共电极之间需设置一层绝缘层(通常为树脂层, 或者钝化层, 或者包括树脂层和钝化层的双层膜结构), 该绝缘层最初采用氮 化硅绝缘膜, 氮化硅介电常数大(7〜8 ), 可获得大的像素存储电容, 有助于 降低驱动电压, 但氮化硅绝缘膜存在制作困难, 无法保证阵列基板表面平坦 度 (平坦度有利于减少聚酰亚胺 (polyimide, PI)涂覆和摩擦取向等工艺的不 良发生率) 等问题, 而且因氮化硅介电常数大, 在数据线、 栅线等走线处常 常存在较大寄生电容。 因此, 现有像素电极和公共电极之间的绝缘层一般采 用有机绝缘膜如树脂层, 树脂的介电常数 (3〜4) 比氮化硅小, 而且制作简 单, 引入阵列基板可使得 LCD充电时间减少 (走线处寄生电容减小), 保证 充电率, 提高 LCD开口率和保证阵列基板表面平坦度, 但也因树脂的介电常 数较小, 像素存储电容相对较小, 存在驱动电压偏高的问题。 发明内容  The common feature of the IPS technology and the FFS technology is that the pixel electrode and the common electrode are disposed on the array substrate. Therefore, an insulating layer (usually a resin layer, or a passivation layer) or an insulating layer is required between the pixel electrode and the common electrode. a two-layer film structure of a resin layer and a passivation layer), the insulating layer is initially made of a silicon nitride insulating film, and the silicon nitride has a large dielectric constant (7 to 8), and a large pixel storage capacitor can be obtained, which contributes to driving reduction. Voltage, but the silicon nitride insulating film is difficult to fabricate, and the surface flatness of the array substrate cannot be ensured (flatness is advantageous for reducing the incidence of defects such as polyimide (PI) coating and rubbing alignment), and Due to the large dielectric constant of silicon nitride, there is often a large parasitic capacitance at the data lines, gate lines, and the like. Therefore, the insulating layer between the existing pixel electrode and the common electrode is generally an organic insulating film such as a resin layer. The dielectric constant (3 to 4) of the resin is smaller than that of silicon nitride, and the fabrication is simple. The introduction of the array substrate can charge the LCD. Reduced time (reduced parasitic capacitance at the trace), guaranteed charging rate, increased LCD aperture ratio and surface flatness of the array substrate, but also due to the small dielectric constant of the resin, the pixel storage capacitor is relatively small, and there is a driving voltage bias. High problem. Summary of the invention
本发明提供一种阵列基板及其制造方法和显示装置, 既能降低信号线走 线处的寄生电容, 又能解决现有技术中因像素电极和公共电极之间设置的有 机绝缘膜导致的驱动电压偏高的问题。  The invention provides an array substrate, a manufacturing method thereof and a display device, which can reduce the parasitic capacitance at the signal line trace and solve the driving problem caused by the organic insulating film disposed between the pixel electrode and the common electrode in the prior art. The problem of high voltage.
为达到上述目的, 本发明提供如下技术方案: 一种阵列基板, 其包括基板以及设置在基板上的像素电极、 公共电极、 薄膜晶体管和信号线, 所述信号线包括栅线、 数据线和公共电极线, 所述阵 列基板还包括: In order to achieve the above object, the present invention provides the following technical solutions: An array substrate comprising a substrate and a pixel electrode, a common electrode, a thin film transistor and a signal line disposed on the substrate, the signal line comprising a gate line, a data line and a common electrode line, the array substrate further comprising:
设置于所述像素电极和所述公共电极之间的绝缘层, 所述绝缘层包括与 显示区域对应的第一部分、 与非显示区域对应的第二部分, 所述非显示区域 包括与薄膜晶体管及信号线走线对应的区域,  An insulating layer disposed between the pixel electrode and the common electrode, the insulating layer including a first portion corresponding to the display region and a second portion corresponding to the non-display region, the non-display region including the thin film transistor and The area corresponding to the signal line trace,
所述第一部分的介电常数大于第一临界值, 所述第二部分的介电常数小 于第二临界值, 所述第一临界值大于所述第二临界值。  The dielectric constant of the first portion is greater than a first threshold, the dielectric constant of the second portion is less than a second threshold, and the first threshold is greater than the second threshold.
优选地, 所述绝缘层的材质具有如下特点: 经过紫外光照射后, 介电常 数变大。  Preferably, the material of the insulating layer has the following characteristics: After ultraviolet light irradiation, the dielectric constant becomes large.
具体地, 所述绝缘层的第一部分在制造过程中经历过紫外光照射, 所述 绝缘层的第二部分在制造过程中没有经历过紫外光照射。  Specifically, the first portion of the insulating layer is subjected to ultraviolet light irradiation during the manufacturing process, and the second portion of the insulating layer is not subjected to ultraviolet light irradiation during the manufacturing process.
可选地, 所述绝缘层为有机绝缘膜。  Optionally, the insulating layer is an organic insulating film.
进一步地, 所述的阵列基板还包括钝化层;  Further, the array substrate further includes a passivation layer;
与所述绝缘层相比, 所述钝化层设置在更靠近所述阵列基板对盒面的一 本发明还提供一种显示装置, 包括: 以上所述的阵列基板。  The present invention further provides a display device in which the passivation layer is disposed closer to the surface of the array substrate than the insulating layer, comprising: the array substrate described above.
对应地, 本发明还提供一种阵列基板的制造方法, 包括以下步骤: 在形成有第一电极的基板上形成绝缘层, 所述绝缘层由经过紫外光照射 后介电常数会变大的材质制成;  Correspondingly, the present invention further provides a method for fabricating an array substrate, comprising the steps of: forming an insulating layer on a substrate on which a first electrode is formed, wherein the insulating layer is made of a material having a higher dielectric constant after being irradiated with ultraviolet light; production;
在形成有所述第一电极和所述绝缘层的基板上形成第二电极;  Forming a second electrode on the substrate on which the first electrode and the insulating layer are formed;
从阵列基板的非对盒面的一侧对所述阵列基板进行紫外光照。  The array substrate is subjected to ultraviolet light from a side of the non-face to face of the array substrate.
可选地, 所述第一电极为像素电极, 所述第二电极为公共电极。  Optionally, the first electrode is a pixel electrode, and the second electrode is a common electrode.
或者, 所述第一电极为公共电极, 所述第二电极为像素电极。 或者,在形成有所述第一电极和所述绝缘层的基板上形成第二电极之后, 还包括以下步骤: 在形成有所述绝缘层的基板上形成钝化层。 Alternatively, the first electrode is a common electrode, and the second electrode is a pixel electrode. Alternatively, after the second electrode is formed on the substrate on which the first electrode and the insulating layer are formed, the method further includes the step of: forming a passivation layer on the substrate on which the insulating layer is formed.
本发明提供的阵列基板及其制造方法和显示装置, 在像素电极和公共电 极之间设置绝缘层, 一方面, 所述绝缘层上与显示区域对应的第一部分的介 电常数大于第一临界值, 可达到增大像素存储电容, 降低驱动电压的目的; 另一方面, 所述绝缘层上与非显示区域对应的第二部分介电常数小于第二临 界值(所述第一临界值大于所述第二临界值), 可达到降低非显示区域(与薄 膜晶体管和信号线走线对应的区域) 存在的寄生电容, 保证充电率, 保证显 示效果。 附图说明  The array substrate provided by the present invention, the manufacturing method thereof and the display device are provided with an insulating layer between the pixel electrode and the common electrode. On the one hand, the dielectric constant of the first portion corresponding to the display region on the insulating layer is greater than the first critical value. The purpose of increasing the pixel storage capacitance and lowering the driving voltage can be achieved; on the other hand, the dielectric constant of the second portion corresponding to the non-display area on the insulating layer is less than the second critical value (the first critical value is greater than The second critical value) can reduce the parasitic capacitance existing in the non-display area (the area corresponding to the thin film transistor and the signal line trace), ensure the charging rate, and ensure the display effect. DRAWINGS
图 1为本发明实施例一提供的阵列基板的平面结构示意图;  1 is a schematic plan view showing a planar structure of an array substrate according to Embodiment 1 of the present invention;
图 2为图 1所示阵列基板沿 A-A'线的剖面结构示意图;  2 is a cross-sectional structural view of the array substrate of FIG. 1 taken along line A-A';
图 3 为本发明实施例一中采用紫外光照射基板制作的阵列基板的示意 图;  3 is a schematic view of an array substrate fabricated by irradiating a substrate with ultraviolet light according to Embodiment 1 of the present invention;
图 4为本发明实施例一提供的一种可选的阵列基板的结构示意图; 图 5 (a) 为本发明实施例一阵列基板中钝化层的位置示意图一; 图 5 (b) 为本发明实施例一阵列基板中钝化层的位置示意图二; 图 6为本发明实施例二提供的阵列基板的制造方法流程图一;  4 is a schematic structural diagram of an optional array substrate according to Embodiment 1 of the present invention; FIG. 5(a) is a schematic diagram showing the position of a passivation layer in an array substrate according to an embodiment of the present invention; Embodiment 1 is a schematic diagram of a position of a passivation layer in an array substrate; FIG. 6 is a flow chart 1 of a method for manufacturing an array substrate according to Embodiment 2 of the present invention;
图 7为本发明实施例二提供的阵列基板的制造方法流程图二;  7 is a second flowchart of a method for manufacturing an array substrate according to Embodiment 2 of the present invention;
图 8为图 7所示阵列基板制造方法对应的制造过程示意图。  FIG. 8 is a schematic view showing a manufacturing process corresponding to the method of manufacturing the array substrate shown in FIG. 7. FIG.
附图标记  Reference numeral
10-阵列基板, 11-基板, 12-信号线, 13-薄膜晶体管, 14-像素电极, 15-绝缘层, 151-绝缘层的第一部分, 152-绝缘层的第二部分,  10-array substrate, 11-substrate, 12-signal line, 13-thin film transistor, 14-pixel electrode, 15-insulation layer, 151-first part of insulating layer, 152-second part of insulating layer,
153-氮化硅层, 154-树脂层, 16-公共电极, 17-钝化层,  153-silicon nitride layer, 154-resin layer, 16-common electrode, 17-passivation layer,
20-彩膜基板, 22-彩膜色阻, 23-黑矩阵, 30-紫外光。 具体实鮮式 下面结合附图对本发明实施例进行详细描述。 此处所描述的具体实施方 式仅仅用以解释本发明, 并不用于限定本发明。 20-color film substrate, 22-color film color resistance, 23-black matrix, 30-ultraviolet light. Specific real The embodiments of the present invention are described in detail below with reference to the accompanying drawings. The specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
实施例一  Embodiment 1
本发明实施例提供一种阵列基板, 如图 1和图 2所示, 该阵列基板包括 基板 11以及设置在基板 11上的薄膜晶体管 13、 像素电极 14、 公共电极 16、 信号线 12, 信号线 12包括栅线、 数据线和公共电极线, 该阵列基板还包括: 设置于像素电极 14和公共电极 16之间的绝缘层 15, 绝缘层 15包括: 与显 示区域对应的第一部分 151、 与非显示区域对应的第二部分 152, 第二部分 152包括与薄膜晶体管 13及信号线 12走线对应的区域; 第一部分 151的介 电常数大于第一临界值 εΐ , 第二部分 152的介电常数小于第二临界值 ε2, 所 述第一临界值 εΐ大于所述第二临界值 ε2。  An embodiment of the present invention provides an array substrate. As shown in FIG. 1 and FIG. 2 , the array substrate includes a substrate 11 and a thin film transistor 13 , a pixel electrode 14 , a common electrode 16 , a signal line 12 , and a signal line disposed on the substrate 11 . 12 includes a gate line, a data line, and a common electrode line. The array substrate further includes: an insulating layer 15 disposed between the pixel electrode 14 and the common electrode 16. The insulating layer 15 includes: a first portion 151 corresponding to the display area, and A second portion 152 corresponding to the display area, the second portion 152 includes a region corresponding to the trace of the thin film transistor 13 and the signal line 12; the dielectric constant of the first portion 151 is greater than the first critical value ε ΐ , and the dielectric constant of the second portion 152 Less than the second critical value ε2, the first critical value εΐ is greater than the second critical value ε2.
本实施例中的像素电极 14和公共电极 16均设置在基板 11上, 阵列基板 和彩膜基板对盒后灌注液晶, 液晶分子位于图 2中公共电极 16的上方, 显示 信号通过薄膜晶体管 13加载到像素电极 14, 像素电极 14和公共电极 16间 形成的驱动电场驱动液晶分子偏转, 从而显示出图像。  The pixel electrode 14 and the common electrode 16 in this embodiment are both disposed on the substrate 11. The array substrate and the color filter substrate are filled with liquid crystal after the box, and the liquid crystal molecules are located above the common electrode 16 in FIG. 2, and the display signal is loaded through the thin film transistor 13. The driving electric field formed between the pixel electrode 14, the pixel electrode 14 and the common electrode 16 drives the liquid crystal molecules to be deflected, thereby displaying an image.
本实施例中, 在像素电极 14和公共电极 16之间设置有绝缘层 15, 绝缘 层 15的第一部分 151与显示区域对应, 第二部分 152与非显示区域对应。参 照图 3所示, 所述显示区域, 即阵列基板上背光可透出的区域 (也称为透光 区域) 与彩膜色阻 22(参照图 3所示, 一般位于彩膜基板 20上)的位置对应; 所述非显示区域, 即与薄膜晶体管 13及信号线 12走线对应的区域, 因金属 层或金属走线的遮挡, 背光无法射出, 对盒后, 该非显示区域与黑矩阵 23(— 般位于彩膜基板 20上)的位置对应。  In the present embodiment, an insulating layer 15 is disposed between the pixel electrode 14 and the common electrode 16, the first portion 151 of the insulating layer 15 corresponds to the display region, and the second portion 152 corresponds to the non-display region. Referring to FIG. 3, the display area, that is, the area through which the backlight is permeable on the array substrate (also referred to as a light-transmitting area) and the color film color resist 22 (refer to FIG. 3, generally located on the color filter substrate 20) Corresponding to the position; the non-display area, that is, the area corresponding to the trace of the thin film transistor 13 and the signal line 12, the backlight cannot be emitted due to the occlusion of the metal layer or the metal trace, and the non-display area and the black matrix after the pair of boxes 23 (the general position on the color filter substrate 20) corresponds to the position.
第一部分 151与显示区域对应, 由于显示区域基本与像素电极 16对应, 因此可由电容公式 Cst=sSA^kd (k, π为常数)得出: 在电极(像素电极和公 共电极的统称) 的正对面积 S, 电极的间距 d不变的情况下, 像素存储电容 Cst随第一部分 151的介电常数 ε的增大而增大。 进一步, 由公式 Q=UC=IAt 可知, 驱动电压 Vop(Vop=IAt/Cst)随像素存储电容 Cst的增大而减小。 而第二 部分 152与非显示区域 (薄膜晶体管 13及信号线 12走线区域) 对应, 为避 免非显示区域产生寄生电容对液晶驱动产生影响, 进而影响显示效果, 本实 施例提供的技术方案在保证绝缘的前提下, 一方面保持第二部分 152的介电 常数处于较低水平(小于第二临界值 ε2), 以降低寄生电容; 另一方面, 尽量 增大第一部分 151的介电常数(大于第一临界值 ε1 ),从而增大像素存储电容 Cst, 以降低驱动电压 Vop, 保证显示效果。 The first portion 151 corresponds to the display area, and since the display area substantially corresponds to the pixel electrode 16, it can be obtained by the capacitance formula Cst=sSA^kd (k, π is a constant): Positive at the electrode (collectively referred to as the pixel electrode and the common electrode) In the case where the area d and the pitch d of the electrodes do not change, the pixel storage capacitance Cst increases as the dielectric constant ε of the first portion 151 increases. Further, from the formula Q=UC=IAt, the driving voltage Vop (Vop=IAt/Cst) decreases as the pixel storage capacitor Cst increases. And second The portion 152 corresponds to the non-display area (the thin film transistor 13 and the signal line 12 routing area). In order to prevent the parasitic capacitance in the non-display area from affecting the liquid crystal driving, thereby affecting the display effect, the technical solution provided in this embodiment ensures insulation. On the other hand, on the one hand, the dielectric constant of the second portion 152 is kept at a lower level (less than the second critical value ε2) to reduce the parasitic capacitance; on the other hand, the dielectric constant of the first portion 151 is increased as much as possible (greater than the first The threshold value ε1 ) increases the pixel storage capacitor Cst to lower the driving voltage Vop to ensure the display effect.
本实施例中第一部分 151的介电常数大于第一临界值 ε1, 具体实施时, 在满足绝缘性、 制备工艺等其它条件的前提下, 第一部分 151尽量选择介电 常数大的材质制成, 一般而言, 第一临界值 εΐ的取值满足 ε1≥4.5; 第二部分 152的介电常数小于第二临界值 ε2, 且第一临界值 εΐ大于第二临界值 ε2, 而 第二部分 152在满足绝缘性、 制备工艺等其它条件的前提下, 尽量选择介电 常数小的材质制成, 一般而言, 第二临界值 ε2的取值满足 ε2≤3。  In the embodiment, the dielectric constant of the first portion 151 is greater than the first critical value ε1. In the specific implementation, the first portion 151 is made of a material having a large dielectric constant as much as possible under the premise of satisfying other conditions such as insulation and preparation processes. In general, the value of the first critical value ε 满足 satisfies ε1 ≥ 4.5; the dielectric constant of the second portion 152 is smaller than the second critical value ε2, and the first critical value ε ΐ is greater than the second critical value ε 2 , and the second portion 152 Under the premise of satisfying other conditions such as insulation and preparation process, a material having a small dielectric constant is selected as much as possible. Generally, the value of the second critical value ε2 satisfies ε2 ≤ 3.
需要注意的是, 本实施例中的绝缘层 15可以是单层, 还可以是复合层。 例如氮化硅的介电常数为 7〜8, 树脂的介电常数为 3〜4, 在一种可选的实施 方式中, 如图 4所示, 采用氮化硅制成图案化的氮化硅层 153, 氮化硅层 153 仅分布在显示区域; 然后涂覆树脂, 形成树脂层 154, 用以保证阵列基板表 面的平坦度。 氮化硅层 153和树脂层 154共同构成本实施例中的绝缘层 15, 绝缘层 15的第一部分 151包括氮化硅层 153和树脂层 154, 第一部分 151的 介电常数理解为与氮化硅层 153和树脂层 154等效的介电常数,第一部分 151 的树脂层 154—般比较薄, 因此第一部分 151的等效介电常数接近 7〜8; 绝 缘层 15的第二部分 152仅包括树脂层 154, 因此, 第二部分 152的介电常数 即为树脂层 154的介电常数。  It should be noted that the insulating layer 15 in this embodiment may be a single layer or a composite layer. For example, silicon nitride has a dielectric constant of 7 to 8, and a resin has a dielectric constant of 3 to 4. In an alternative embodiment, as shown in FIG. 4, patterned nitride is formed using silicon nitride. The silicon layer 153, the silicon nitride layer 153 is only distributed in the display region; then the resin is coated to form the resin layer 154 to ensure the flatness of the surface of the array substrate. The silicon nitride layer 153 and the resin layer 154 together constitute the insulating layer 15 in this embodiment. The first portion 151 of the insulating layer 15 includes a silicon nitride layer 153 and a resin layer 154. The dielectric constant of the first portion 151 is understood to be nitriding. The silicon layer 153 and the resin layer 154 have an equivalent dielectric constant, and the resin layer 154 of the first portion 151 is generally thin, so that the equivalent dielectric constant of the first portion 151 is close to 7 to 8; the second portion 152 of the insulating layer 15 is only The resin layer 154 is included, and therefore, the dielectric constant of the second portion 152 is the dielectric constant of the resin layer 154.
因此, 在制备绝缘层 15时, 可以分步骤形成绝缘层 15, 最终形成绝缘 层 15的第一部分 151和第二部分 152, 也可与现有技术一样, 经过一个制备 步骤形成。 下面的实施方式为本实施例的一种优选的具体实施方式, 此处所 描述的具体实施方式仅仅用以解释本实施例, 并不用于限定。  Therefore, in the preparation of the insulating layer 15, the insulating layer 15 can be formed in steps, and the first portion 151 and the second portion 152 which finally form the insulating layer 15 can be formed through a preparation step as in the prior art. The following embodiments are a preferred embodiment of the present embodiment, and the specific embodiments described herein are merely illustrative of the embodiments and are not intended to be limiting.
在本实施例的所述的优选的实施方式中, 绝缘层 15 的材质具有如下特 点: 经过紫外光照射后介电常数变大。 而且为达到更好的显示效果, 绝缘层In the preferred embodiment of the embodiment, the material of the insulating layer 15 has the following characteristics: Point: The dielectric constant becomes larger after irradiation with ultraviolet light. And for better display, insulation
15所选用的材质的介电常数一般不小于现有技术的绝缘层材质如树脂层的介 电常数。 The dielectric constant of the selected material is generally not less than the dielectric constant of the prior art insulating layer material such as the resin layer.
具体地, 如图 3所示, 选用这种经过紫外光照射后介电常数变大的材质 制备绝缘层 15, 当然还需满足绝缘性要求以及工艺制备要求, 然后, 按常规 流程制备阵列基板 10, 在阵列基板 10对盒之前, 从阵列基板 10的非对盒面 的一侧对阵列基板 10进行紫外光 30照射。 此处所述的非对盒面的一侧, 指 阵列基板 10靠近背光源的一侧。 显示区域(透光区域)可透光, 与显示区域 对应的第一部分 151在制造过程中经历过紫外光 30照射, 紫外光 30照射使 得第一部分 151 的介电常数变大; 非显示区域与薄膜晶体管 13及信号线 12 走线对应, 因金属层或金属走线的遮挡, 与非显示区域对应的第二部分 152 在制造过程中没有经历过紫外光 30照射, 介电常数保持不变。  Specifically, as shown in FIG. 3, the insulating layer 15 is prepared by using the material having a large dielectric constant after ultraviolet light irradiation, and of course, the insulating requirements and the process preparation requirements are also required, and then the array substrate 10 is prepared according to a conventional procedure. Before the array substrate 10 is placed on the cassette, the array substrate 10 is irradiated with ultraviolet light 30 from the side of the non-opposing surface of the array substrate 10. The side of the non-opposing surface described herein refers to the side of the array substrate 10 that is close to the backlight. The display area (light-transmitting area) is permeable to light, and the first portion 151 corresponding to the display area is subjected to ultraviolet light 30 irradiation during the manufacturing process, and the ultraviolet light 30 is irradiated to make the dielectric constant of the first portion 151 large; the non-display area and the film The transistor 13 and the signal line 12 are correspondingly routed. Due to the occlusion of the metal layer or the metal trace, the second portion 152 corresponding to the non-display area is not subjected to the ultraviolet light 30 during the manufacturing process, and the dielectric constant remains unchanged.
本实施例提供的阵列基板, 结构与现有技术大致相同, 只是绝缘层选择 介电常数对紫外光照射敏感的材质, 且在阵列基板制备流程完成后, 增加紫 外光照射步骤, 使得绝缘层 15的第一部分 151 (与电极区域对应) 发生物理 或化学变化, 从而使第一部分 151 的介电常数增加, 从而增大像素存储电容 Cst, 降低驱动电压 Vop。  The structure of the array substrate provided in this embodiment is substantially the same as that of the prior art, except that the insulating layer selects a material whose dielectric constant is sensitive to ultraviolet light irradiation, and after the preparation process of the array substrate is completed, the ultraviolet light irradiation step is added to make the insulating layer 15 The first portion 151 (corresponding to the electrode region) undergoes a physical or chemical change, thereby increasing the dielectric constant of the first portion 151, thereby increasing the pixel storage capacitance Cst and lowering the driving voltage Vop.
其中, 优选地, 所述绝缘层为有机绝缘膜。 有机绝缘膜制作简单 (一般 采用涂覆成膜), 并且可保证阵列基板表面平坦度, 有利于减少 PI涂覆和摩 擦取向等工艺的不良发生率等问题。  Preferably, the insulating layer is an organic insulating film. The organic insulating film is simple to manufacture (usually coated with a film), and the surface flatness of the array substrate can be ensured, which is advantageous for reducing the incidence of defects such as PI coating and rubbing orientation.
进一步地, 如图 5 (a) 和图 5 (b )所示, 所述的阵列基板还包括: 钝化 层 17; 与绝缘层 15相比, 钝化层 17设置在更靠近阵列基板对盒面的一侧。 其中, 阵列基板对盒面指对盒后阵列基板上靠近彩膜基板的面。 由于钝化层 17设置在更靠近阵列基板对盒面的一侧, 因此, 钝化层 17的引入不会影响 紫外光对绝缘层 15的照射强度。 具体而言, 既可以如图 5 (a)所示, 将钝化 层 17设置在绝缘层 15的上方, 公共电极 16的下方; 也可以如图 5 (b ) 所 示, 将钝化层 17设置在公共电极 16的上方。 需要注意的是, 在本实施例的附图中仅表示了像素电极 14 比公共电极 16更靠近基板 11 的情况, 但是, 即使将像素电极和公共电极的位置互换, 也可以应用本发明。 Further, as shown in FIG. 5(a) and FIG. 5(b), the array substrate further includes: a passivation layer 17; the passivation layer 17 is disposed closer to the array substrate than the insulating layer 15 One side of the face. The array substrate is opposite to the surface of the array substrate on the array substrate near the color filter substrate. Since the passivation layer 17 is disposed on the side closer to the face of the array substrate, the introduction of the passivation layer 17 does not affect the intensity of the ultraviolet light to the insulating layer 15. Specifically, as shown in FIG. 5(a), the passivation layer 17 may be disposed above the insulating layer 15 below the common electrode 16; or as shown in FIG. 5(b), the passivation layer 17 may be used. It is disposed above the common electrode 16. It is to be noted that, in the drawings of the present embodiment, only the case where the pixel electrode 14 is closer to the substrate 11 than the common electrode 16 is shown, but the present invention can be applied even if the positions of the pixel electrode and the common electrode are interchanged.
本发明提供的阵列基板, 既能降低信号线走线处的寄生电容, 又能解决 现有技术中因像素电极和公共电极之间设置有机绝缘膜导致的驱动电压偏高 的问题。 本发明还提供一种显示装置, 其包括上述任意一种阵列基板。 所述显示 装置驱动电压小, 节能省电, 同时还由于降低了寄生电容对显示效果的影响, 从而可获得更高的显示品质。所述显示装置可以为:液晶面板、电子纸、OLED 面板、 手机、 平板电脑、 电视机、 显示器、 笔记本电脑、 数码相框、 导航仪 等任何具有显示功能的产品或部件。 实施例二  The array substrate provided by the invention can reduce the parasitic capacitance at the signal line trace and solve the problem of high driving voltage caused by the organic insulating film disposed between the pixel electrode and the common electrode in the prior art. The present invention also provides a display device comprising any of the above array substrates. The display device has a small driving voltage, saves energy and saves power, and at the same time, reduces the influence of parasitic capacitance on the display effect, thereby obtaining higher display quality. The display device may be any product or component having a display function such as a liquid crystal panel, an electronic paper, an OLED panel, a mobile phone, a tablet computer, a television, a display, a notebook computer, a digital photo frame, a navigator, and the like. Embodiment 2
本发明还提供一种阵列基板的制造方法, 如图 6所示, 该方法包括以下 步骤:  The present invention also provides a method of fabricating an array substrate. As shown in FIG. 6, the method includes the following steps:
101: 在形成有第一电极的基板上形成绝缘层, 所述绝缘层由经过紫外光 照射后介电常数会变大的材质制成;  101: forming an insulating layer on a substrate on which the first electrode is formed, the insulating layer being made of a material having a large dielectric constant after being irradiated with ultraviolet light;
102: 在形成有所述第一电极和所述绝缘层的基板上形成第二电极, 完成 阵列基板的常规制造流程;  102: forming a second electrode on the substrate on which the first electrode and the insulating layer are formed, completing a conventional manufacturing process of the array substrate;
103: 从阵列基板的非对盒面的一侧对所述阵列基板进行紫外光照。  103: UV-illuminating the array substrate from a side of the non-face to face of the array substrate.
其中, 可选地, 在所述第一电极为像素电极时, 所述第二电极为公共电 极; 在所述第一电极为公共电极时, 所述第二电极为像素电极。  Optionally, when the first electrode is a pixel electrode, the second electrode is a common electrode; and when the first electrode is a common electrode, the second electrode is a pixel electrode.
本发明提供的阵列基板制造方法, 制备流程与现有技术大致相同, 只是 绝缘层选择介电常数对紫外光照射敏感的材质, 且在阵列基板制备流程完成 后, 增加紫外光照射步骤, 使得绝缘层的第一部分 (与电极区域对应) 发生 物理或化学变化, 使第一部分的介电常数增加, 从而增大像素存储电容 Cst, 降低驱动电压 Vop。 优选地, 所述绝缘层为有机绝缘膜。 The manufacturing method of the array substrate provided by the present invention is substantially the same as that of the prior art, except that the insulating layer selects a material whose dielectric constant is sensitive to ultraviolet light irradiation, and after the preparation process of the array substrate is completed, the ultraviolet light irradiation step is added to make the insulation. The first portion of the layer (corresponding to the electrode region) undergoes a physical or chemical change to increase the dielectric constant of the first portion, thereby increasing the pixel storage capacitance Cst and lowering the driving voltage Vop. Preferably, the insulating layer is an organic insulating film.
进一步地, 在形成有所述第一电极和所述绝缘层的基板上形成第二电极 之前,或者在形成有所述第一电极和所述绝缘层的基板上形成第二电极之后, 还包括: 在形成有所述绝缘层的基板上形成钝化层的步骤。  Further, after the second electrode is formed on the substrate on which the first electrode and the insulating layer are formed, or after the second electrode is formed on the substrate on which the first electrode and the insulating layer are formed, : a step of forming a passivation layer on a substrate on which the insulating layer is formed.
为了使本领域技术人员更好的理解本发明提供的阵列基板制造方法, 如 图 7和图 8所示, 下面通过具体的实施例对本发明提供的阵列基板制造方法 进行简要说明。  In order to enable those skilled in the art to better understand the method of fabricating the array substrate provided by the present invention, as shown in FIGS. 7 and 8, the method for fabricating the array substrate provided by the present invention will be briefly described below by way of specific embodiments.
图 7为图 1中沿 A-A'剖线的截面图所示的阵列基板的制造方法流程, 即 阵列 (Array)工艺流程。 图 8中描绘了与该阵列 (Array) 工艺流程对应的制造 过程示意图, 其与常规阵列 (Array ) 工艺流程大致类似, 即: Glass→Gate→SDT→ 1 st Organic→Pixel ITO→2nd Organic→Common ITO,只 不过其中的 2nd Organic为本实施例中所述的夹设在像素电极和公共电极之间 的绝缘层, 采用介电常数 ε受紫外 (UV) 光调控的有机绝缘膜。  Fig. 7 is a flow chart showing the manufacturing method of the array substrate shown in the cross-sectional view taken along line A-A' in Fig. 1, that is, an Array process flow. A schematic diagram of the manufacturing process corresponding to the Array process flow is depicted in Figure 8, which is substantially similar to the conventional array (Array) process, namely: Glass→Gate→SDT→ 1 st Organic→Pixel ITO→2nd Organic→Common ITO, except that 2nd Organic is an insulating layer interposed between the pixel electrode and the common electrode as described in the embodiment, and an organic insulating film whose dielectric constant ε is controlled by ultraviolet (UV) light is used.
图 7所示的阵列基板制造方法包括以下步骤:  The array substrate manufacturing method shown in FIG. 7 includes the following steps:
201: 在基板 (Glass) 上形成栅金属层 (Gate) , 采用构图工艺形成薄膜 晶体管的栅极及栅线;  201: forming a gate metal layer (Gate) on the substrate (Glass), forming a gate and a gate line of the thin film transistor by a patterning process;
202: 形成栅绝缘层、 半导体层和源漏金属层, 采用构图工艺形成薄膜晶 体管 13和数据线;  202: forming a gate insulating layer, a semiconductor layer, and a source/drain metal layer, and forming a thin film transistor 13 and a data line by a patterning process;
203: 在形成有薄膜晶体管和数据线的基板上形成层间绝缘层及漏极过 孔;  203: forming an interlayer insulating layer and a drain via on the substrate on which the thin film transistor and the data line are formed;
204: 在形成有层间绝缘层的基板上形成透明导电层, 采用构图工艺形成 像素电极 14;  204: forming a transparent conductive layer on the substrate formed with the interlayer insulating layer, forming a pixel electrode 14 by a patterning process;
205: 在形成有像素 14的基板上形成绝缘层 15, 绝缘膜 15优选为介电 常数 ε可通过紫外 (UV) 光调控的有机绝缘膜;  205: forming an insulating layer on the substrate on which the pixel 14 is formed. The insulating film 15 is preferably an organic insulating film whose dielectric constant ε can be controlled by ultraviolet (UV) light;
206: 在形成有绝缘层 15的基板上形成透明导电层, 采用构图工艺形成 公共电极 16;  206: forming a transparent conductive layer on the substrate on which the insulating layer 15 is formed, forming a common electrode 16 by a patterning process;
207: 从阵列基板的非对盒面的一侧对形成的阵列基板进行紫外光 30照 射, 紫外光照使得透光区域对应的有机绝缘膜介电常数 ε增大。 207: performing ultraviolet light irradiation on the array substrate formed from one side of the non-aligned surface of the array substrate The ultraviolet light causes the dielectric constant ε of the organic insulating film corresponding to the light-transmitting region to increase.
本实施例提供一种采用 UV光照射基板来制作阵列基板的方案, 本方案 中通过 UV光照射改变可透光区域有机绝缘膜的介电常数 ε,来达到增大像素 存储电容 Cst的目的,从而降低应用有机绝缘膜技术的 LCD的驱动电压 Vop。 本发明实施例虽然以 FFS模式阵列基板为例, 但本发明的应用并不限于 此, 本发明技术方案适用于所有像素电极和公共电极之间需要设置绝缘层的 应用场景。  The embodiment provides a method for fabricating an array substrate by irradiating a substrate with UV light. In this embodiment, the dielectric constant ε of the organic insulating film in the light-transmitting region is changed by UV light irradiation to achieve the purpose of increasing the pixel storage capacitor Cst. Thereby, the driving voltage Vop of the LCD to which the organic insulating film technology is applied is lowered. In the embodiment of the present invention, the FFS mode array substrate is taken as an example, but the application of the present invention is not limited thereto. The technical solution of the present invention is applicable to an application scenario in which an insulating layer needs to be disposed between all the pixel electrodes and the common electrode.
需要注意的是, 本发明实施例所述的技术特征, 在不冲突的情况下, 可 任意相互组合使用。  It should be noted that the technical features described in the embodiments of the present invention can be used in combination with each other without conflict.
以上所述, 仅为本发明的具体实施方式, 但本发明的保护范围并不局限 于此, 任何熟悉本技术领域的技术人员在本发明揭露的技术范围内, 可轻易 想到变化或替换, 都应涵盖在本发明的保护范围之内。 因此, 本发明的保护 范围应以权利要求的保护范围为准。  The above is only the specific embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily think of changes or substitutions within the technical scope of the present invention. It should be covered by the scope of the present invention. Therefore, the scope of the invention should be determined by the scope of the appended claims.

Claims

权利要求书 Claim
1. 一种阵列基板, 包括基板以及设置在基板上的像素电极、 公共电极、 薄膜晶体管和信号线, 所述信号线包括栅线、 数据线和公共电极线, 其特征 在于, 还包括: An array substrate comprising a substrate, a pixel electrode, a common electrode, a thin film transistor, and a signal line disposed on the substrate, wherein the signal line includes a gate line, a data line, and a common electrode line, and further includes:
设置于所述像素电极和所述公共电极之间的绝缘层, 所述绝缘层包括与 显示区域对应的第一部分、 与非显示区域对应的第二部分, 所述非显示区域 包括与薄膜晶体管及信号线走线对应的区域;  An insulating layer disposed between the pixel electrode and the common electrode, the insulating layer including a first portion corresponding to the display region and a second portion corresponding to the non-display region, the non-display region including the thin film transistor and The area corresponding to the signal line trace;
所述第一部分的介电常数大于第一临界值, 所述第二部分的介电常数小 于第二临界值, 所述第一临界值大于所述第二临界值。  The dielectric constant of the first portion is greater than a first threshold, the dielectric constant of the second portion is less than a second threshold, and the first threshold is greater than the second threshold.
2. 根据权利要求 1所述的阵列基板, 其特征在于,  2. The array substrate according to claim 1, wherein
所述绝缘层的材质在经过紫外光照射后介电常数变大。  The material of the insulating layer becomes large in dielectric constant after being irradiated with ultraviolet light.
3. 根据权利要求 2所述的阵列基板, 其特征在于,  3. The array substrate according to claim 2, wherein
所述绝缘层的第一部分在制造过程中经历过紫外光照射, 所述绝缘层的 第二部分在制造过程中没有经历过紫外光照射。  The first portion of the insulating layer is subjected to ultraviolet light illumination during the manufacturing process, and the second portion of the insulating layer is not exposed to ultraviolet light during the manufacturing process.
4. 根据权利要求 1-3任一项所述的阵列基板, 其特征在于,  The array substrate according to any one of claims 1 to 3, wherein
所述绝缘层为有机绝缘膜。  The insulating layer is an organic insulating film.
5. 根据权利要求 1-4任一项所述的阵列基板, 其特征在于,  The array substrate according to any one of claims 1 to 4, wherein
还包括钝化层,  Also includes a passivation layer,
与所述绝缘层相比, 所述钝化层设置在更靠近所述阵列基板对盒面的一  The passivation layer is disposed closer to the surface of the array substrate than the insulating layer
6. 一种显示装置, 其特征在于, 6. A display device, characterized in that
包括: 权利要求 1-5任一项所述的阵列基板。  The array substrate according to any one of claims 1 to 5, comprising:
7. 一种阵列基板的制造方法, 其特征在于, 包括以下步骤:  A method of manufacturing an array substrate, comprising the steps of:
在形成有第一电极的基板上形成绝缘层, 所述绝缘层由经过紫外光照射 后介电常数会变大的材质制成;  Forming an insulating layer on the substrate on which the first electrode is formed, the insulating layer being made of a material having a large dielectric constant after being irradiated with ultraviolet light;
在形成有所述第一电极和所述绝缘层的基板上形成第二电极; 从阵列基板的非对盒面的一侧对所述阵列基板进行紫外光照。 Forming a second electrode on the substrate on which the first electrode and the insulating layer are formed; The array substrate is subjected to ultraviolet light from a side of the non-face to face of the array substrate.
8. 根据权利要求 7所述的制造方法, 其特征在于,  8. The manufacturing method according to claim 7, wherein
所述第一电极为像素电极, 所述第二电极为公共电极。  The first electrode is a pixel electrode, and the second electrode is a common electrode.
9. 根据权利要求 7所述的制造方法, 其特征在于,  9. The manufacturing method according to claim 7, wherein
所述第一电极为公共电极, 所述第二电极为像素电极。  The first electrode is a common electrode, and the second electrode is a pixel electrode.
10. 根据权利要求 7-9任一项所述的制造方法, 其特征在于,  The manufacturing method according to any one of claims 7 to 9, characterized in that
所述绝缘层为有机绝缘膜。  The insulating layer is an organic insulating film.
11. 根据权利要求 7所述的制造方法, 其特征在于,  11. The manufacturing method according to claim 7, wherein
在形成有所述第一电极和所述绝缘层的基板上形成第二电极之前, 还包 括以下步骤:  Before forming the second electrode on the substrate on which the first electrode and the insulating layer are formed, the method further includes the following steps:
在形成有所述绝缘层的基板上形成钝化层。  A passivation layer is formed on the substrate on which the insulating layer is formed.
12. 根据权利要求 7所述的制造方法, 其特征在于,  12. The manufacturing method according to claim 7, wherein
在形成有所述第一电极和所述绝缘层的基板上形成第二电极之后, 还包 括以下步骤: 在形成有所述绝缘层的基板上形成钝化层。  After the second electrode is formed on the substrate on which the first electrode and the insulating layer are formed, the method further includes the step of: forming a passivation layer on the substrate on which the insulating layer is formed.
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