WO2014104172A8 - 高分子鎖の動態解析方法、高分子の製造方法、高分子、合成高分子の製造方法及び合成高分子 - Google Patents

高分子鎖の動態解析方法、高分子の製造方法、高分子、合成高分子の製造方法及び合成高分子 Download PDF

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Publication number
WO2014104172A8
WO2014104172A8 PCT/JP2013/084818 JP2013084818W WO2014104172A8 WO 2014104172 A8 WO2014104172 A8 WO 2014104172A8 JP 2013084818 W JP2013084818 W JP 2013084818W WO 2014104172 A8 WO2014104172 A8 WO 2014104172A8
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WO
WIPO (PCT)
Prior art keywords
polymer
manufacturing
synthetic
dynamic analysis
dynamic
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PCT/JP2013/084818
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English (en)
French (fr)
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WO2014104172A1 (ja
Inventor
篠原　健一
Original Assignee
国立大学法人北陸先端科学技術大学院大学
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Application filed by 国立大学法人北陸先端科学技術大学院大学 filed Critical 国立大学法人北陸先端科学技術大学院大学
Priority to JP2014554534A priority Critical patent/JP6061277B2/ja
Publication of WO2014104172A1 publication Critical patent/WO2014104172A1/ja
Publication of WO2014104172A8 publication Critical patent/WO2014104172A8/ja

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G01Q60/42—Functionalisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/04—Display or data processing devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/08—Means for establishing or regulating a desired environmental condition within a sample chamber
    • G01Q30/12—Fluid environment
    • G01Q30/14—Liquid environment

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

　高分子材料の構造物性相関等を明確化するために、高速原子間力顕微鏡又は原子間力顕微鏡を用いて高分子鎖一本の動態を解析する方法を提供する。また、この動態解析方法を用いた高分子の製造方法、当該製造方法によって製造した高分子、この動態解析方法を用いた合成高分子の製造方法及び当該製造方法によって製造した合成高分子を提供する。　本発明の高分子鎖一本の動態解析方法は、高分子鎖一本の動態画像を取得するステップと、前記動態画像を構成する各静止画像のうち任意の１画像を選択するステップと、選択した静止画像を用いて高分子鎖一本の複数部位に番号付けを行うステップと、前記番号付けを行った部位の変位計測を前記各静止画像に対して行うステップと、前記番号付けを行った部位の変位計測値に基づいて、当該部位の移動量、移動速度、移動加速度、３点間角度及び拡散係数のうち少なくとも一つを算出するステップを備える。
PCT/JP2013/084818 2012-12-27 2013-12-26 高分子鎖の動態解析方法、高分子の製造方法、高分子、合成高分子の製造方法及び合成高分子 WO2014104172A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2014554534A JP6061277B2 (ja) 2012-12-27 2013-12-26 高分子鎖の動態解析方法、高分子の製造方法、高分子、合成高分子の製造方法及び合成高分子

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2012-283897 2012-12-27
JP2012283897 2012-12-27
JP2013-086164 2013-04-17
JP2013086164 2013-04-17

Publications (2)

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WO2014104172A1 WO2014104172A1 (ja) 2014-07-03
WO2014104172A8 true WO2014104172A8 (ja) 2014-10-16

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PCT/JP2013/084818 WO2014104172A1 (ja) 2012-12-27 2013-12-26 高分子鎖の動態解析方法、高分子の製造方法、高分子、合成高分子の製造方法及び合成高分子

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JP (1) JP6061277B2 (ja)
WO (1) WO2014104172A1 (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6811477B2 (ja) * 2016-04-19 2021-01-13 国立大学法人北陸先端科学技術大学院大学 変性ｓｂｒポリマー鎖一本の動態解析方法及びこの動態解析方法を用いた変性ｓｂｒポリマーの製造方法
CN110728078B (zh) * 2019-11-14 2022-11-25 吉林大学 一种基于胶粘剂化学特性的粘接结构在全服役温度区间下的力学性能的预测方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11219445A (ja) * 1998-02-03 1999-08-10 Matsushita Electric Ind Co Ltd 画像表示装置、画像表示方法、および画像表示プログラム記録媒体
JP2006349533A (ja) * 2005-06-16 2006-12-28 Olympus Corp 画像処理装置および画像処理プログラム
JP2008003673A (ja) * 2006-06-20 2008-01-10 Oki Electric Ind Co Ltd アニメーション作成システムおよび方法
JP5907484B2 (ja) * 2010-07-08 2016-04-26 国立大学法人北陸先端科学技術大学院大学 高速走査型プローブ顕微鏡を用いる合成高分子の観測方法

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WO2014104172A1 (ja) 2014-07-03
JPWO2014104172A1 (ja) 2017-01-12
JP6061277B2 (ja) 2017-01-18

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