WO2014066872A3 - Adaptateurs pour dispositif d'analyse directe d'échantillons et leurs procédés d'utilisation - Google Patents

Adaptateurs pour dispositif d'analyse directe d'échantillons et leurs procédés d'utilisation Download PDF

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Publication number
WO2014066872A3
WO2014066872A3 PCT/US2013/066993 US2013066993W WO2014066872A3 WO 2014066872 A3 WO2014066872 A3 WO 2014066872A3 US 2013066993 W US2013066993 W US 2013066993W WO 2014066872 A3 WO2014066872 A3 WO 2014066872A3
Authority
WO
WIPO (PCT)
Prior art keywords
analysis device
sample analysis
direct sample
methods
device adapters
Prior art date
Application number
PCT/US2013/066993
Other languages
English (en)
Other versions
WO2014066872A2 (fr
Inventor
Paul L. St. Cyr
Michael L. DELVECCHIO
Craig M. Whitehouse
Original Assignee
Perkinelmer Health Sciences, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US13/662,500 external-priority patent/US9412572B2/en
Priority claimed from US13/662,801 external-priority patent/US9733156B2/en
Priority claimed from US13/662,745 external-priority patent/US9117641B2/en
Application filed by Perkinelmer Health Sciences, Inc. filed Critical Perkinelmer Health Sciences, Inc.
Priority to EP13849385.3A priority Critical patent/EP2912677B1/fr
Priority to CA2889372A priority patent/CA2889372C/fr
Priority to CN201390001015.9U priority patent/CN205582883U/zh
Publication of WO2014066872A2 publication Critical patent/WO2014066872A2/fr
Publication of WO2014066872A3 publication Critical patent/WO2014066872A3/fr

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0404—Capillaries used for transferring samples or ions
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
    • F04C—ROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; ROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT PUMPS
    • F04C2270/00—Control; Monitoring or safety arrangements
    • F04C2270/04—Force
    • F04C2270/041—Controlled or regulated

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

Certains modes de réalisation de l'invention concernent des adaptateurs destinés à être utilisés pour accoupler un dispositif d'analyse directe d'échantillons avec un instrument d'analyse tel qu'un spectromètre de masse par exemple. Dans certains exemples, l'adaptateur peut comprendre un système d'accouplement interne séparé d'un système d'accouplement externe par l'intermédiaire d'un isolant.
PCT/US2013/066993 2012-10-28 2013-10-27 Adaptateurs pour dispositif d'analyse directe d'échantillons et leurs procédés d'utilisation WO2014066872A2 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP13849385.3A EP2912677B1 (fr) 2012-10-28 2013-10-27 Adaptateurs pour dispositif d'analyse directe d'échantillons
CA2889372A CA2889372C (fr) 2012-10-28 2013-10-27 Adaptateurs pour dispositif d'analyse directe d'echantillons et leurs procedes d'utilisation
CN201390001015.9U CN205582883U (zh) 2012-10-28 2013-10-27 用于安装直接样品分析装置的适配器及用于进行直接样品分析的包含所述适配器的系统

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US13/662,500 2012-10-28
US13/662,500 US9412572B2 (en) 2012-10-28 2012-10-28 Sample holders and methods of using them
US13/662,801 US9733156B2 (en) 2012-10-29 2012-10-29 Sample platforms and methods of using them
US13/662,745 2012-10-29
US13/662,801 2012-10-29
US13/662,745 US9117641B2 (en) 2012-10-29 2012-10-29 Direct sample analysis device adapters and methods of using them

Publications (2)

Publication Number Publication Date
WO2014066872A2 WO2014066872A2 (fr) 2014-05-01
WO2014066872A3 true WO2014066872A3 (fr) 2014-06-19

Family

ID=50545376

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2013/066993 WO2014066872A2 (fr) 2012-10-28 2013-10-27 Adaptateurs pour dispositif d'analyse directe d'échantillons et leurs procédés d'utilisation

Country Status (4)

Country Link
EP (1) EP2912677B1 (fr)
CN (1) CN205582883U (fr)
CA (1) CA2889372C (fr)
WO (1) WO2014066872A2 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9590583B2 (en) 2015-06-29 2017-03-07 Agilent Technologies, Inc. Alternating current (AC) coupler for wideband AC signals and related methods
CN106769280B (zh) * 2016-11-24 2019-10-29 中国石油大学(华东) 一种简易海洋沉积物古地磁研究分样装置

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5157260A (en) * 1991-05-17 1992-10-20 Finnian Corporation Method and apparatus for focusing ions in viscous flow jet expansion region of an electrospray apparatus
US5965883A (en) * 1997-08-25 1999-10-12 California Institute Of Technology Capillary for electrospray ion source
US20030070913A1 (en) * 2001-08-08 2003-04-17 Sionex Corporation Capacitive discharge plasma ion source
US20040056192A1 (en) * 2002-09-19 2004-03-25 Jean-Luc Truche Ap-maldi target illumination device and method for using an ap-maldi target illumination device
US20050133714A1 (en) * 2003-12-19 2005-06-23 Vestal Marvin L. MALDI plate construction with grid
US20060054805A1 (en) * 2004-09-13 2006-03-16 Flanagan Michael J Multi-inlet sampling device for mass spectrometer ion source
US20060207115A1 (en) * 2005-03-17 2006-09-21 Jean-Luc Truche Laser alignment for ion source
US20080067367A1 (en) * 2006-09-20 2008-03-20 Bruker Daltonics, Inc. Means and method for field asymmetric ion mobility spectrometry combined with mass spectrometry
US20090014640A1 (en) * 2005-06-09 2009-01-15 Centre National De La Recherche Nebulizer with Nanometric Flow Rate of a Liquid Effluent and Nebulizing Installation Comprising Same
US20120145890A1 (en) * 2009-11-13 2012-06-14 University Of Glasgow Methods And Systems For Mass Spectrometry

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6248999B1 (en) * 1998-09-24 2001-06-19 Finnigan Corporation Assembly for coupling an ion source to a mass analyzer
US6794644B2 (en) 2000-02-18 2004-09-21 Melvin A. Park Method and apparatus for automating an atmospheric pressure ionization (API) source for mass spectrometry
US6657191B2 (en) 2001-03-02 2003-12-02 Bruker Daltonics Inc. Means and method for multiplexing sprays in an electrospray ionization source
JP4356491B2 (ja) * 2004-03-26 2009-11-04 株式会社島津製作所 ガスクロマトグラフ質量分析装置
WO2009023361A2 (fr) * 2007-06-01 2009-02-19 Purdue Research Foundation Interface de pression atmosphérique discontinue
KR20110071320A (ko) * 2009-12-21 2011-06-29 한국기초과학지원연구원 이온 주입기, 이를 포함하는 질량 분석기 및 이를 이용한 이온 집속 방법

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5157260A (en) * 1991-05-17 1992-10-20 Finnian Corporation Method and apparatus for focusing ions in viscous flow jet expansion region of an electrospray apparatus
US5965883A (en) * 1997-08-25 1999-10-12 California Institute Of Technology Capillary for electrospray ion source
US20030070913A1 (en) * 2001-08-08 2003-04-17 Sionex Corporation Capacitive discharge plasma ion source
US20040056192A1 (en) * 2002-09-19 2004-03-25 Jean-Luc Truche Ap-maldi target illumination device and method for using an ap-maldi target illumination device
US20050133714A1 (en) * 2003-12-19 2005-06-23 Vestal Marvin L. MALDI plate construction with grid
US20060054805A1 (en) * 2004-09-13 2006-03-16 Flanagan Michael J Multi-inlet sampling device for mass spectrometer ion source
US20060207115A1 (en) * 2005-03-17 2006-09-21 Jean-Luc Truche Laser alignment for ion source
US20090014640A1 (en) * 2005-06-09 2009-01-15 Centre National De La Recherche Nebulizer with Nanometric Flow Rate of a Liquid Effluent and Nebulizing Installation Comprising Same
US20080067367A1 (en) * 2006-09-20 2008-03-20 Bruker Daltonics, Inc. Means and method for field asymmetric ion mobility spectrometry combined with mass spectrometry
US20120145890A1 (en) * 2009-11-13 2012-06-14 University Of Glasgow Methods And Systems For Mass Spectrometry

Also Published As

Publication number Publication date
WO2014066872A2 (fr) 2014-05-01
EP2912677B1 (fr) 2021-04-07
CA2889372A1 (fr) 2014-05-01
CA2889372C (fr) 2022-12-06
EP2912677A4 (fr) 2016-08-10
EP2912677A2 (fr) 2015-09-02
CN205582883U (zh) 2016-09-14

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