WO2013171071A1 - Illumination optical unit for euv projection lithography - Google Patents

Illumination optical unit for euv projection lithography Download PDF

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Publication number
WO2013171071A1
WO2013171071A1 PCT/EP2013/059016 EP2013059016W WO2013171071A1 WO 2013171071 A1 WO2013171071 A1 WO 2013171071A1 EP 2013059016 W EP2013059016 W EP 2013059016W WO 2013171071 A1 WO2013171071 A1 WO 2013171071A1
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WIPO (PCT)
Prior art keywords
mirror
individual
illumination
facet
groups
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Ceased
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PCT/EP2013/059016
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English (en)
French (fr)
Inventor
Michael Patra
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Carl Zeiss SMT GmbH
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Carl Zeiss SMT GmbH
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Application filed by Carl Zeiss SMT GmbH filed Critical Carl Zeiss SMT GmbH
Priority to JP2015511982A priority Critical patent/JP6332758B2/ja
Publication of WO2013171071A1 publication Critical patent/WO2013171071A1/en
Priority to US14/517,139 priority patent/US10126658B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/70091Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
    • G03F7/70116Off-axis setting using a programmable means, e.g. liquid crystal display [LCD], digital micromirror device [DMD] or pupil facets
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/0816Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
    • G02B26/0833Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/08Mirrors
    • G02B5/0891Ultraviolet [UV] mirrors
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/70075Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/70083Non-homogeneous intensity distribution in the mask plane
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/702Reflective illumination, i.e. reflective optical elements other than folding mirrors, e.g. extreme ultraviolet [EUV] illumination systems

Definitions

  • German patent application DE 10 2012 208 064.3 are incorporated by reference.
  • the invention relates to an illumination optical unit for EUV projection lithography, for guiding illumination light to an object field in which a lithography mask can be arranged. Additionally, the invention relates to an illumination system with such an illumination optical unit and a projection optical unit for imaging the object field in an image field. Furthermore, the invention relates to a projection exposure apparatus with such an illumination system, a method for producing a microstructured or nano structured component, in particular a semiconductor chip, with the aid of such a projection exposure apparatus and a microstructured or nanostructured com- ponent produced thus.
  • An illumination optical unit of the type mentioned at the outset is known from US 201 1/0001947 Al . It is an object of the present invention to develop an illumination optical unit of the type mentioned at the outset in such a way that the flexibility is increased when setting different illumination geometries or illumination settings. According to the invention, this object is achieved by an illumination optical unit for EUV projection lithography, for guiding illumination light to an object field in which a lithography mask can be arranged,
  • first facet mirror which comprises a multiplicity of individual mirrors which can be switched between at least two tilt positions, which individual mirrors provide individual mirror illumination channels for guiding illumination light partial beams to the object field
  • second facet mirror which is arranged downstream of the first facet mirror in the beam path of the illumination light and has a plural- ity of facets, which respectively contribute to imaging a group of the individual mirrors of the first facet mirror into the object field via a group mirror illumination channel, wherein the images of the individual mirror groups are superposed on one another in the object field, wherein at least some of the individual mirrors belong to at least two different groups of the individual mirror groups, which, depending on the respective tilt position of the individual mirrors, can respectively be associated with at least one dedicated second facet via at least one dedicated group mirror illumination channel.
  • the invention is freed from the prescription of a fixed assignment of all individual mirrors of the first facet mirror to specific individual mirror groups, where each individual mirror is only associated with precisely one individual mirror group.
  • tilting the individual mirrors can bring about not only a change between second facets associated via the individual mirror illumination channels, but there can also be a change in the group assignment of the individual mirrors to respectively one individual mirror group which is associated with at least one second facet via at least one group illumination channel.
  • One and the same individual mirror group can, depending on the tilt position of the individual mirrors, be associated with different second facets via respectively one group illumination channel.
  • illumination angular distributions which, in principle, can be obtained by imaging the individual mir- ror groups into the illumination field via the facets of the second facet mirror, and thus illumination geometries or illumination settings achievable.
  • a given number of required illumination angular distributions can be obtained using a first facet mirror with a smaller number of individual mirrors.
  • the facets of the second facet mirror can, individually or inter- acting with subsequent components of the illumination optical unit, contribute to imaging the respective individual mirror group of the first facet mirror into the illumination field.
  • a group mirror illumination channel is the totality of all individual mirror illumination channels of an individual mirror group, which complement one another to illuminate the whole illu- mination field as a result of imaging via the associated facet of the second facet mirror.
  • An individual mirror group can be considered to be an original image of an illumination field, in which the object field is arranged or which coincides with the object field. These original images respectively have substantially the same aspect ratio.
  • the individual mirror groups also respectively have substantially the same aspect ratio. Differences in the aspect ratio, which occur as a result of detailed changes when imaging the respective individual mirror group in the object field as a result of a change in the beam geometry depending on the tilt position of the individual mirrors, remain unconsidered herein.
  • the illumination of the illumination field then constitutes a superposition of the original images in the illumination field, wherein the original images in any case coincide in the object field.
  • Different individual mirror groups are individual mirror groups which are not composed of the same individual mirrors. Thus, in the case of different individual mirror groups, there is always at least one individual mirror which does not simultaneously belong to both individual mirror groups.
  • one and the same individual mirror group can, depending on the tilt position, be associated with different second facets.
  • the assignment of the individual mirrors to form the respective individual mirror group and the assignment of the respective individual mirror groups to the respective second facet is brought about by prescribing the corresponding position or switch position of the individual mirrors belonging to the respectively formed individual mirror group.
  • an overlap in which two individual mirror groups, which are respectively associated with a dedicated second facet via a dedicated group mirror illu- mination channel, overlap one another in such a way that between 20% and 80% of all of the individual mirrors of the two individual mirror groups simultaneously belong to both the individual mirror groups, was found to be suitable for practical applications.
  • the overlap region can comprise whole rows or columns of individual mirrors.
  • an object holder for holding an object in the object field, said object holder being displaceable along a displacement direction by means of an object displacement drive,
  • a projection exposure apparatus in which at least two of the individual mirror groups overlap one another along the displacement direction, use can be made of individual mirrors which are substantially designed to be tiltable about one axis. In principle, it is also possible that at least two of the individual mirror groups overlap in a dimension transverse to the displacement direction. A simultaneous overlap of at least two of the individual mirror groups both along and across the displacement direction is also possible.
  • Figure 1 schematically shows a meridional section through a projection exposure apparatus for EUV projection lithography
  • Figure 2 schematically shows a top view of a section of a field facet mirror which is made up of individual mirrors and designed for use in the projection exposure apparatus according to Figure 1
  • Figure 3 shows a view of a section of an individual mirror row of the facet mirror according to Figure 2 from the viewing direction III in Figure 2;
  • Figures 4 to 6 very schematically show, in three different configurations, different forms of a row reflection surface formed from the individual mirrors of the individual mirror row illustrated in Figure 3; shows a top view of a section of an embodiment of a field facet mirror, made up of individual mirrors, with an exemplary grouping of the individual mirrors in an arrangement of individual mirror groups;
  • Figures 8 and 9 show examples of various groupings of the individual mirrors of the facet mirror according to Figure 2 in individual mirror groups with such a grouping assignment that some of the individual mirrors belong to at least two different individ- ual mirror groups, which are respectively associated with a dedicated second facet of a second facet mirror, likewise illustrated in Figures 8 and 9 in top view, respectively on the left-hand side, via a dedicated group mirror illumination channel;
  • Figure 10 very schematically shows a top view of a section of a further embodiment of a field facet mirror, made up of individual mirrors, with such a grouping assignment of the individual mirrors that some of the individual mirrors belong to at least two different individual mirror groups, which are respectively associated with a dedicated second facet of a second facet mirror, likewise illustrated in Figure 10 in top view, on the right-hand side, via a dedicated group mirror illumination channel.
  • Figure 1 schematically shows a projection exposure apparatus 1 for microlithography.
  • the projection exposure apparatus 1 includes a radiation source 2.
  • An illumination system 3 of the projection exposure apparatus 1 has an illumination optical unit 4 for exposing an il- lumination field, which coincides with an object field 5, in an object plane 6.
  • the illumination field can also be larger than the object field 5.
  • What is exposed here is an object in the form of a reticle 7, which is arranged in the object field 5 and held by an object or reticle holder 8.
  • the object holder 8 can be displaced along a displacement direction by means of an object dis- placement drive 9.
  • a projection optical unit 10 serves for imaging the object field 5 in an image field 1 1 in an image plane 12.
  • a structure on the reticle 7 is imaged on a light-sensitive layer of a wafer 13 arranged in the region of the image field 1 1 in the image plane 12.
  • the wafer 13 is held by a wafer holder 14 (likewise not illustrated).
  • the wafer holder 14 can likewise be displaced, synchronized with the object holder 8, along the displacement direction by means of a wafer displacement drive 15.
  • the radiation source 2 is an EUV radiation source with an emitted used radiation in the range between 5 nm and 30 nm.
  • this can be a plasma source, for example a GDPP source (gas discharge-produced plasma) or an LPP source (laser-produced plasma).
  • a radiation source which is based on a synchrotron or on a free electron laser (FEL) can also be used as radiation source 2.
  • FEL free electron laser
  • the field facet mir- ror 19 is a first facet mirror of the illumination optical unit 4.
  • the field facet mirror 19 has a multiplicity of individual mirrors, which are not illustrated in Figure 1.
  • the field facet mirror 19 is arranged in a plane of the illumination optical unit 4, which is optically conjugate to the object plane 6.
  • the EUV radiation 16 is also referred to as illumination light or imaging light.
  • the EUV radiation 16 is reflected by a pupil facet mirror 20.
  • the pupil facet mirror 20 is a second facet mirror of the illumination optical unit 4.
  • the pupil facet mirror 20 is arranged in a pupil plane of the illumination optical unit 4, which is optically conjugate to the intermediate focus plane 18 and to a pupil plane of the projection optical unit 10, or coincides with this pupil plane.
  • the pupil facet mirror 20 has a plurality of pupil facets, which are not illustrated in Figure 1.
  • a Cartesian xyz- coordinate system is plotted in Figure 1 as a global coordinate system for the description of the positional relations of components of the projection exposure apparatus 1 between the object plane 6 and the image plane 12.
  • the x-axis extends perpendicular to the plane of the drawing and into the latter.
  • the y-axis extends toward the right in Figure 1 and parallel to the displacement direction of the object holder 8 and of the wafer holder 14.
  • the z-axis extends downward, i.e. perpendicular to the object plane 6 and to the image plane 12.
  • Figure 2 shows details of the design of the field facet mirror 19 in a very schematic illustration.
  • An overall reflection surface 25 of the field facet mirror 19 is subdivided into rows and columns to form a grid of individual mirrors 26.
  • the individual reflection surfaces of the individual individual mirrors 26 are planar and have no curvature.
  • An individual mirror row 27 has a plurality of individual mirrors 26 lying directly next to one another. Several ten to several hundred individual mirrors 26 can be provided on one individual mirror row 27.
  • the individual mirrors 26 are square. Other shapes of individual mirrors, which allow occupancy of the reflection surface 20 with as few gaps as possible, can also be used. Such alternative individual mirror shapes are known from the mathematical theory of tessellation. In this context, reference is made to the references specified in WO 2009/100 856 Al .
  • an individual mirror column 28 likewise has a plurality of individual mirrors 26. By way of example, several ten to several hundred individual mirrors 26 are provided per individual mirror column 28.
  • a Cartesian xyz- coordinate system is plotted in Figure 2 as a local coordinate system of the field facet mirror 19.
  • the reflection surface 25 of the field facet mirror 19 has an extent of xo. In the y-direction, the reflection surface 25 of the field facet mirror 19 has an extent of yo.
  • the individual mirrors 26 have x/y extents in the region of, for example, 500 ⁇ x 500 ⁇ to, for example, 2 mm x 2 mm.
  • the individual mirrors 26 can be shaped in such a way that they have a focusing effect for the illumination light 16. Such a focusing effect of the individual mirrors 26 is particularly advantageous if use is made of a divergent illumination of the field facet mirror 19 by the illumination light 16.
  • the overall field facet mirror 19 has an x 0 /yo extent which, depending on the embodiment, for example is 300 mm x 300 mm or 600 mm x 600 mm.
  • the individual mirror groups 24a (see Figure 7) have typical x/y extents of 25 mm x 4 mm or of 104 mm x 8 mm. Depending on the ratio between the size of the respective individual mirror groups 24a and the size of the individual mirrors 26, which make up these individual mirror groups 24a, each of the individual mirror groups 24a has an appropriate number of individual mirrors 26.
  • each of the individual mirrors 26 is respectively connected to an actua- tor 29, as indicated in a dashed fashion in Figure 2 on the basis of two individual mirrors 26 arranged in a bottom left-hand corner of the reflection surface 25 and illustrated in more detail in Figure 3 on the basis of a section of an individual mirror row 27.
  • the actuators 29 are arranged on the side of each of the individual mirrors 26 which faces away from a reflect- ing side of the individual mirrors 26.
  • the actuators 29 can be configured as piezo-actuators. Embodiments of such actuators are known from the design of micro-mirror arrays.
  • the actuators 29 of an individual mirror row 27 are respectively connected to a row signal bus 31 via signal lines 30.
  • One individual mirror row 27 is associated with respectively one of the row signal buses 31.
  • the row signal buses 31 of the individual mirror rows 27 are in turn connected to a main signal bus 32.
  • the latter has a signal connection to a control device 33 of the field facet mirror 19.
  • the control device 33 is in particular configured for common line -by-line, i.e. row-by-row or column-by-column, actuation of the individual mirrors 26.
  • An individual actuation of the individual mirrors 26 is also possible within the individual mirror rows 27 and the individual mirror columns 28.
  • Each of the individual mirrors 26 can, individually and independently, be tilted about two tilt axes which are perpendicular to one another, wherein a first one of these tilt axes extends parallel to the x-axis and the second one of these two tilt axes extends parallel to the y-axis.
  • the two tilt axes lie in the individual reflection surfaces of the respective individual mirrors 26.
  • the actuators 29 also render it possible to displace the individual mirrors 26 individually in the z-direction.
  • the individual mirrors 26 can be displaced in an actuatable manner separately from one an- other along a normal to the reflection surface 25.
  • This is illustrated in an exemplary and very schematic fashion on the basis of Figures 4 to 6.
  • a basic curvature of such a mirror surface topography with large sagittal height is eliminated by such a subdivision into sections in the style of Fresnel zones.
  • Figure 4 shows individual reflection surfaces of the individual mirrors 26 of a section of an individual mirror row 27, wherein all individual mirrors 26 of this individual mirror row 27 are set to the same absolute z-position by the control device 33 and the actuators 29. This results in a planar row reflection surface of the individual mirror row 27. If all individual mirrors 26 of the field facet mirror 19 are aligned in accordance with Figure 4, the whole reflection surface 25 of the field facet mirror 19 is planar.
  • Figure 5 shows an actuation of the individual mirrors 26 of the individual mirror row 27, in which the central individual mirror 26 m is set offset in the negative z-direction with respect to neighboring individual mirrors 26 rl , 26 r2 , 26 r3 .
  • the result of this is a stepped arrangement, which leads to a corresponding phase offset of the EUV radiation 16 incident on the individual mirror row 27 according to Figure 5.
  • the EUV radiation 16 reflected by the two central individual mirrors 26 m experiences the greatest phase retardation here.
  • the edge-side individual mirrors 26 r3 generate the least phase retardation.
  • the intermediate individual mirrors 26 rl , 26 r2 generate, correspondingly step-wise, increasingly less phase retardation proceeding from the phase retardation by the central individual mirrors 26 m .
  • Figure 6 shows an actuation of the individual mirrors 26 of the illustrated section of the individual mirror row 27 in such a way that this results overall in a convexly shaped individual mirror row 27 as a result of, firstly, the offset of the individual mirrors 26 with respect to one another in the z- direction and, secondly, the orientation of the individual mirrors 26 with respect to one another.
  • This can be used to generate an imaging effect of individual mirror groups of the field facet mirror 19.
  • an e.g. concave arrangement of groups of the individual mirrors 26 is also possible of course.
  • the individual mirror groups 24a are respectively associated with at least one dedicated pupil facet of the pupil facet mirror 20 for imaging the individual mirror group 24a into the object field 5 via at least one dedicated group mirror illumination channel for the illumination light 16. This assignment is brought about by predetermining the respective tilt position or switch position of the individual mirrors belonging to the individual mirror group 24a.
  • the group mirror illumination channel is the totality of all individual mirror illumination channels of the respective individual mirror group 24a, which complement one another as a result of the imaging via the pupil facet to illuminate the whole illumination or object field 5.
  • Each of the individual mirror groups 24a can therefore be considered to be an original image of the illumination field 5.
  • the overall illumination of the illumination or object field 5 then constitutes the superposition of these original images. Therefore, the function of a facet of a field facet mirror is assumed in each case by one of the individual mirror groups 24a, as is disclosed for example in US 6,438,199 Bl or in US 6,658,084 B2.
  • Figure 7 exemplifies such a grouping.
  • Components corresponding to those which have already been explained above with reference to Figures 2 to 6 are denoted by the same reference signs and will not be discussed again in detail.
  • each of the individual mirror groups 24a consists of a 24 3 array of individual mirrors 26, i.e. has three individual mirror rows with respectively twenty-four individual mirrors 26.
  • each of the individual mirror groups 24a has an aspect ratio of 8 to 1. This aspect ratio corresponds to the aspect ratio of the object field 5 to be illuminated.
  • each of the individual mirror groups 24a the individual mirrors 26 are aligned with respect to one another in such a way that the shape of each of the individual mirror groups 24a corresponds to the shape of an individual field facet of a conventional field facet mirror.
  • Figures 8 and 9 show examples of groupings of the individual mirrors 26 of the field facet mirror 19 to form individual mirror groups 24a.
  • the individual mirror rows 27 are provided with an index, numbered continuously from top to bottom.
  • the uppermost individual mirror line is denoted by 27 1
  • the lowest individual mirror line is denoted by 27 8 .
  • respectively two individual mirror rows lying one above the other, namely the individual mirror rows 27 2 /3, 27 4/5 and 27 6/7 are combined to form three individual mirror groups 24a l s 24a 2 and 24a 3 .
  • the assignment of these individual mirror groups 24ai to 24a 3 with three pupil facets 34 34 2 and 34 3 via group mirror illumination channels 351 , 35 2 and 35 3 is also illustrated schematically in Figure 8.
  • the illumination light is guided, via the pupil facets 34 ! to 34 3 , via the individual mirror illumination channels of the individual mirrors 26 belonging to these individual mirror groups 24ai to 24a 3 , to the illumination field 5, wherein the respective individual mirror group 24ai to 24a 3 is imaged in the object or illumination field 5.
  • the individual mirrors 26 of the individual mirror groups 24ai to 24a 3 are tilted by means of the control device 33 in such a way that the illumination light 16 is guided to the respective pupil facets 34 ! to 34 3 .
  • Figure 9 shows a different assignment of the individual mirrors 26 of the field facet mirror 19 to form individual mirror groups.
  • the individual mirror rows 27 1/2 are associated with the individual mirror group 24a 4
  • the individual mirror rows 27 3/4 are associated with the individual mirror group 24a 5
  • the individual mirror rows 27 5/6 are associated with the individual mirror group 24a 6
  • the individual mirror rows 27 7/8 are associated with the individual mirror group 24a 7 .
  • the individual mirror groups 24a 4 to 24a 7 are associated with further pupil facets 34 4 to 34 7 , which are different from the pupil facets 34 t to 34 3 from the assignment according to Figure 8, via group mirror illumination channels 35 4 to 35 7 .
  • the individual mirror groups 24a 4 to 24a 7 are once again imaged in the object or illumination field 5 via the group mirror illumination channels 35 4 to 35 7 and the pupil facets 34 4 to 34 7 .
  • the pupil facets 34 ! to 34 3 remain unilluminated.
  • the pupil facets 34 4 to 34 7 remain unilluminated.
  • the two different assignments of the individual mirror groups 24a to the pupil facets 34 result in correspondingly different illumination angular distributions in the illumination of the object or illumination field 5. These different illumination angular distributions are also referred to as illumination settings.
  • the individual mirrors 26 of the individual mirror rows 27 2 to 27 7 belong to two different individual mirror groups 24a in the assignment examples of Figures 8 and 9.
  • the individual mirror row 27 2 belongs firstly to the individual mirror group 24ai and secondly to the individual mirror group 24a 4 .
  • These different individual mirror groups, i.e., for example, the individual mirror groups 24a l 5 24a 4 are respectively associated with a dedicated second facet, i.e. the pupil facets 34 !
  • These individual mirrors of the individual mirror rows 27 2 to 27 7 respectively belong to precisely two individual mirror groups 24a as already explained above. It is self-evident that illumination geometries are also possible, in which certain individual mirrors 26 belong to a larger number of individual mirror groups 24a.
  • an individual mirror group 24a is made up of three individual mirror rows 27, it is possible, analogously to what was already explained above in conjunction with Figures 8 and 9, to predetermine grouping assignments, in which one of these three individual mirror rows constitutes an upper individual mirror row of a first individual mirror group in a first grouping, a central row of a second individual mirror group in a second grouping and a lower row of a third individual mirror group in a third grouping.
  • none of the individual mirrors 26 belongs to more than two individual mirror groups 24a.
  • the individual mirror groups 24a i.e., for example, the individual mirror groups 24ai of the grouping assignment according to Figure 8 and the individual mirror group 24a 4 of the grouping assignment according to Figure 9, overlap in such a way that 50% of all of the individual mirrors 26 of these individual mirror groups 24a l s 24a 4 , namely the individual mirrors 26 of the individual mirror row 27 2 , simultaneously belong to both individual mirror groups 24ai, 24a 4 .
  • the field facet mirror 36 is subdivided into a grid of individual mirrors 26. However, in the field facet mirror 36, the rows and columns of this grid respectively extend at an angle of 45° to the object displacement direction y.
  • a further difference between the field facet mirror 36 according to Figure 10 and the field facet mirror 19 is that the individual mirror groups 24a are not enclosed in a rectangular but in an arcuate fashion. These arcuate individual mirror groups 24a are corre- spondingly imaged into an arcuate object or illumination field via respectively associated pupil facets 34 and, optionally, a downstream transmission optical unit, as is known, in principle, from the prior art.
  • the arcuate edge of the individual mirror groups 24a is respectively illus- trated in Figure 10 with a full line. Those individual mirrors 26 of which more than 50% respectively lie within this edge belong to the respective individual mirror group 24a.
  • Two different grouping assignments of individual mirror groups 24a to pu- pil facets 34 are illustrated in Figure 10.
  • the individual mirrors 26 of two individual mirror groups 24a l s 24a 2 which lie above one another and adjoin one another, are associated with two pupil facets 34 ! , 34 2 via group mirror illumination channels 351 , 35 2 .
  • a third individual mirror group 24a 3 which in half overlaps these two first individual mirror groups 24a l 5 24a 2 , is associated with a third pupil facet 34 3 via a third group mirror illumination channel 35 3 .
  • one of the individual mirrors 26o is highlighted in an exemplary fashion, said individual mirror belonging to the two different individual mirror groups 24a 2 and 24a 3 .
  • This individual mirror 26 0 belongs to precisely two individual mirror groups, namely to individual mirror groups 24a 2 and 24a 3 .
  • Illumination light partial beams of the illumination light 16 are guided from the respective individual mirror 26 via the individual mirror illumination channels 35a, via the respective pupil facet 34 to the illumination or object field 5.
  • the two individual mirror groups 24ai and 24a 3 for example also overlap one another in such a way that approximately 50% of all of the individual mirrors 26 of the two indi- vidual mirror groups 24a l s 24a 3 simultaneously belong to both individual mirror groups 24a l s 24a 3 .
  • the individual mirrors 26 can be grouped to form individual mirror groups 24a in many different ways, such that the pupil facet mirror 20 can have a much larger number of pupil facets 34 on which illumination light 16 can impinge via the associated group mirror illumination channels 35 by means of the alternative assignments of the individual mirrors 26 to form individual mirror groups 24a.
  • the selection of different illumination settings is markedly increased hereby.
  • at least part of the reticle in the object field 5 is imaged onto a region of a light-sensitive layer onto the wafer 13 in the image field 1 1 for the lithographic production of a microstructured or nanostructured component, in particular of a semiconductor component, for example a microchip.
  • the reticle 7 and the wafer 13 are displaced in the y-direction in a temporally synchronized fashion, either continuously in the scanner operation or in a step-by-step fashion in the stepper operation.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Lenses (AREA)
  • Optical Elements Other Than Lenses (AREA)
  • Microscoopes, Condenser (AREA)
PCT/EP2013/059016 2012-05-15 2013-04-30 Illumination optical unit for euv projection lithography Ceased WO2013171071A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2015511982A JP6332758B2 (ja) 2012-05-15 2013-04-30 Euv投影リソグラフィのための照明光学ユニット
US14/517,139 US10126658B2 (en) 2012-05-15 2014-10-17 Illumination optical unit for EUV projection lithography

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DE102014217611A1 (de) * 2014-09-03 2016-03-03 Carl Zeiss Smt Gmbh Beleuchtungsoptik für die Projektionslithografie
WO2016078819A1 (en) * 2014-11-18 2016-05-26 Carl Zeiss Smt Gmbh Illumination optical unit for euv projection lithography
DE102017217266A1 (de) * 2017-09-28 2019-03-28 Carl Zeiss Smt Gmbh Verfahren zur Bestimmung von Eigenschaften einer EUV-Quelle
DE102021202768A1 (de) * 2021-03-22 2022-09-22 Carl Zeiss Smt Gmbh Facettensystem und lithographieanlage

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US20150036115A1 (en) 2015-02-05
DE102012208064A1 (de) 2013-11-21

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