WO2013089155A1 - X線ct装置および散乱x線補正方法 - Google Patents
X線ct装置および散乱x線補正方法 Download PDFInfo
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
- A61B6/52—Devices using data or image processing specially adapted for radiation diagnosis
- A61B6/5258—Devices using data or image processing specially adapted for radiation diagnosis involving detection or reduction of artifacts or noise
- A61B6/5282—Devices using data or image processing specially adapted for radiation diagnosis involving detection or reduction of artifacts or noise due to scatter
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
- A61B6/02—Devices for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
- A61B6/03—Computerised tomographs
- A61B6/032—Transmission computed tomography [CT]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T11/00—2D [Two Dimensional] image generation
- G06T11/003—Reconstruction from projections, e.g. tomography
- G06T11/005—Specific pre-processing for tomographic reconstruction, e.g. calibration, source positioning, rebinning, scatter correction, retrospective gating
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
- A61B6/42—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment with arrangements for detecting radiation specially adapted for radiation diagnosis
- A61B6/4291—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment with arrangements for detecting radiation specially adapted for radiation diagnosis the detector being combined with a grid or grating
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
- A61B6/52—Devices using data or image processing specially adapted for radiation diagnosis
- A61B6/5205—Devices using data or image processing specially adapted for radiation diagnosis involving processing of raw data to produce diagnostic data
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
- A61B6/58—Testing, adjusting or calibrating apparatus or devices for radiation diagnosis
- A61B6/582—Calibration
- A61B6/583—Calibration using calibration phantoms
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2211/00—Image generation
- G06T2211/40—Computed tomography
- G06T2211/416—Exact reconstruction
Definitions
- the present invention relates to an X-ray CT apparatus and a scattered X-ray correction method for data photographed by an X-ray CT apparatus or the like.
- the X-ray CT (Computed Tomography) apparatus is an apparatus for reconstructing the difference in the X-ray attenuation rate (X-ray absorption coefficient) inside the subject as an image using a data processing system.
- the X-ray CT apparatus includes an X-ray source that irradiates an object with X-rays and an X-ray detector that detects X-rays transmitted through the object.
- the X-ray source and the X-ray detector are arranged so as to face each other with the subject interposed therebetween.
- the X-ray source and the X-ray detector rotate around the subject while maintaining the relationship of being placed oppositely across the subject. Take line transmission image data.
- an X-ray tube that generates X-rays by irradiating an electron accelerated at a high voltage to an anode is usually used.
- the X-ray detector has a structure in which X-ray detection elements are arranged two-dimensionally so as to image a wide area at a high speed at a time.
- Projection data obtained by imaging with an X-ray CT apparatus includes incident intensity of X-rays scattered by a subject (scattered X-rays) in addition to the intensity of X-rays (direct X-rays) transmitted through the subject without scattering. Information is also included.
- a scattered radiation prevention grid for removing scattered X-rays generated in the subject is disposed on the X-ray source side of the X-ray detector.
- scattered X-ray correction by software is also performed (see, for example, Patent Documents 1 to 3 below).
- X-ray CT apparatuses are capable of imaging a wide range of subjects with one imaging as the number of X-ray detectors increases.
- the number of X-ray detectors increases the width of the X-ray irradiation on the subject, and the scattered X-ray dose increases accordingly, resulting in a false image (artifact) on the reconstructed image.
- the ratio of the detection signal derived from scattered X-rays to the detection signal derived from direct X-rays increases relatively, and the X-rays of the subject The absorption coefficient may be underestimated.
- FIG. 7 is an explanatory diagram schematically showing artifacts generated in the reconstructed image.
- FIG. 7A shows a human body simulated structure (hereinafter referred to as a phantom) in which two high absorber rods H are present inside the low absorber L.
- FIG. 7A When this phantom is photographed, a dark band artifact D with a CT value measured smaller than the actual value is observed between the two superabsorbent rods H, as in the reconstructed image shown in FIG. .
- the magnitude of the CT value is illustrated by hatching interval (density), and the smaller the CT value, the shorter (dense) the hatching interval is.
- the present invention provides an X-ray CT apparatus and a scattered X-ray correction method that can prevent deterioration in image quality due to scattered X-rays by estimating and correcting the scattered X-ray dose with high accuracy. Let it be an issue.
- the present invention provides an X-ray detection in which an X-ray source that generates X-rays from an X-ray focal point and an X-ray detection element for detecting the X-rays are two-dimensionally arranged.
- An imaging unit that rotates around the subject while maintaining a relationship of being opposed to each other across the subject, and photographing the X-ray transmission image data of the subject from a plurality of projection directions, and photographing by the photographing unit
- An internal distribution estimation unit for estimating an X-ray absorption coefficient distribution inside the subject based on the X-ray transmission image data, and a simulated subject having the X-ray absorption coefficient distribution estimated by the internal distribution estimation unit.
- a Monte Carlo simulation that simulates the physical interaction of the X-rays is performed, and a point spread function estimation unit that estimates a point spread function of scattering derived from the subject and a point spread function estimation unit.
- a correction unit that corrects the X-ray transmission image data by deconvolution and integrating the estimated point spread function and the X-ray transmission image data, and the X-ray transmission image data corrected by the correction unit.
- an imaging unit configured to form an X-ray absorption coefficient distribution image of the subject.
- an X-ray source that generates X-rays from an X-ray focal point and an X-ray detector in which X-ray detection elements for detecting the X-rays are two-dimensionally arranged sandwich a subject.
- the X-ray transmission image data imaged by the imaging unit that rotates around the subject while capturing the X-ray transmission image data of the subject from a plurality of projection directions, while maintaining the relationship of being opposed to each other
- an X-ray distribution estimator Based on the distribution estimated by the X-ray distribution estimator, an X-ray distribution estimator that performs a Monte Carlo simulation that simulates an interaction, and estimates the distribution of scattered X-rays derived from the subject.
- An X-ray absorption coefficient distribution image of the subject using a correction unit that removes the scattered X-ray component from the transmission image data and the X-ray transmission image data from which the scattered X-ray component has been removed by the correction unit An X-ray CT apparatus.
- an X-ray CT apparatus and a scattered X-ray correction method that can prevent deterioration in image quality due to scattered X-rays by estimating and correcting the scattered X-ray dose with high accuracy. it can.
- FIG. 1 is an explanatory diagram showing a configuration of an X-ray CT apparatus 100 according to the first embodiment.
- the X-axis direction in FIG. 1 is the channel direction
- the Y-axis direction is the X-ray focal direction
- the Z-axis direction is the slice direction.
- the X-ray CT apparatus 100 is illustrated as viewed from the body axis direction (slice direction: Z-axis direction) of the subject 3.
- An opening 2 through which the subject 3 can enter is provided at the center of the gantry (not shown) of the X-ray CT apparatus 100.
- the scanner device of the X-ray CT apparatus 100 includes an X-ray tube 1 that is an X-ray source and an X-ray detector 4, and the gantry can be rotated about the center of the opening 2 as a rotation center axis. It is supported by. With such a configuration, the subject 3 in the opening 2 can be rotated and photographed.
- the X-ray tube 1 as an X-ray source generates X-rays from an X-ray focal point 9 having a finite size in the X-ray tube 1.
- An X-ray detector 4 is disposed at a position facing the X-ray tube 1 across the subject 3.
- the X-ray detector 4 is divided into a plurality of detector modules 8, and each detector module 8 is arranged in an arc shape or a flat panel shape around the X-ray focal point 9.
- FIG. 2 is an explanatory diagram showing the structure of the detector module 8.
- the X-ray detection elements 6 are two-dimensionally arranged with respect to the channel direction (scanner rotation direction) and the slice direction (body axis direction) via the separator 7. This is for obtaining a wide range of X-ray transmission image data (projection data) of the subject 3 by one X-ray irradiation.
- the X-ray detection element 6 is composed of, for example, a combination of a scintillator and a photodiode, or a semiconductor that converts radiation into an electrical signal, and measures the X-ray incident intensity to the X-ray detection element 6. is there.
- a scattered radiation prevention grid 5 is disposed on the X-ray tube 1 side of the detector module 8 in order to remove scattered X-rays generated in the subject 3 and the like.
- the imaging control of the X-ray CT apparatus 100 is performed by the control device 103 through the recording device 101 and the arithmetic device 102 based on the scanning conditions set by the user through the input device 104.
- a large number of projection data obtained by rotational imaging is recorded in the recording device 101, and an image processing calculation is executed by the calculation device 102.
- the projection data after the image processing calculation is displayed on the output device 105 as information such as a tomographic image of the subject 3.
- the projection data (X-ray transmission image data) photographed by the X-ray CT apparatus 100 includes scattered X-rays resulting from the subject 3. For this reason, the X-ray CT apparatus 100 performs a point spread function (PSF) that takes into account the distribution of scattered X-rays caused by the subject 3 that changes with each imaging, in addition to image correction processing in general image processing. An image is formed after estimation and correction.
- PSF point spread function
- FIG. 3 is an explanatory diagram showing an outline of image forming processing by the X-ray CT apparatus.
- the X-ray CT apparatus 100 performs a correction / reconstruction process (F2) on the projection data (Raw Data) obtained by imaging (F1), and generates a reconstructed image (Image).
- the correction / reconstruction process in F2 is a general image correction process such as sensitivity correction.
- the computing device 102 of the X-ray CT apparatus 100 virtually subjects the subject on the computing device 102 (see FIG. 1) based on the reconstructed image (Image) generated by the correction / reconstruction processing (F2). 3 is simulated (F3). Then, a Monte Carlo simulation capable of calculating a detailed physical interaction of X-rays is performed on the virtual subject 3A simulated in F3 (F4). This makes it possible to accurately estimate a point spread function (PSF) reflecting the structure of the subject 3 that changes with each shooting. Note that there is a possibility that a false image due to scattered X-rays exists in the reconstructed image (Image) before correction of scattered X-rays. However, if the influence of the false image is not excessively serious, it is possible to read the internal structure information of the subject 3 from the reconstructed image.
- PSF point spread function
- the arithmetic unit 102 corrects the projection data (Raw Data) obtained by photographing (F1) based on the point spread function (PSF) estimated in F4 (F5). Specifically, the scattered X-ray component is removed from the projection data. Then, the arithmetic unit 102 corrects and reconstructs the projection data after the scattered X-ray component removal (F6). Thereby, in the arithmetic unit 102, a high-quality reconstructed image (New Image) in which the influence of scattered X-rays is further reduced as compared with the reconstructed image (Image) generated by the correction / reconstruction processing (F2). can get.
- the correction / reconstruction process in F6 is a general image correction process such as sensitivity correction as in F2.
- imaging (F1), correction / reconstruction processing (F2), and correction / reconstruction processing (F6) are imaging and image correction processing of a general X-ray CT apparatus 100, and will not be described.
- the arithmetic unit 102 of the X-ray CT apparatus 100 virtually simulates the subject 3 on the computer based on the reconstructed image (Image) and generates a virtual subject 3A.
- the reconstructed image (Image) represents the difference in the X-ray absorption coefficient inside the subject 3 as a CT value.
- CT values are standardized so that water is 0 HU and air is -1000 HU.
- what is required in the Monte Carlo simulation is the elemental composition and density of the substance, but the composition and density cannot be determined from the CT value alone.
- a constituent material is defined as a predefined material or a mixture thereof for each pixel of the reconstructed image.
- FIG. 4 is an explanatory diagram showing an example of a method for determining a substance that simulates the subject 3.
- air, water, and Teflon registered trademark, hereinafter the same
- these mixtures are configured as follows.
- the horizontal axis represents the CT value of the pixel
- the vertical axis represents the mixing ratio of the representative substance.
- the ratio is a volume ratio.
- a and B are expressed as in the following (formula 1) and (formula 2).
- A ⁇ CT value [HU] / 1000 ⁇ 100 (Formula 1)
- B CT value [HU] / 1000 ⁇ 100 (Expression 2)
- composition of the subject 3 can be predicted to some extent, a substance that is present in a large amount in the subject 3 is selected as a representative substance, and a substance that is hardly present in the subject 3 is not selected as a representative substance, thereby improving the precision and accuracy. It is possible. However, in order to be able to interpolate an arbitrary CT value, it is desirable to widen the CT value range of the representative substance.
- a region where the CT value is in a certain range may be replaced with a single substance.
- the following settings are conceivable. Air (when CT value ⁇ -500HU) Water (when -500HU ⁇ CT value ⁇ 500HU) Teflon (500HU ⁇ CT value)
- the reconstructed image (Image) is expressed as a matrix of, for example, 512 ⁇ 512 pixels.
- the object 3 is represented by 512 ⁇ 512 voxels per slice on the arithmetic unit 102, and the constituent substance information determined by the above method is added to each voxel. That is, the virtual subject 3A is configured as a set of rectangular parallelepiped regions including surrounding air.
- the area captured by the X-ray CT apparatus 100 is limited to a part of the subject 3 except when scanning the entire subject 3.
- information about the subject 3 outside the reconstruction area cannot be obtained, but scattered X-rays may interact outside the reconstruction area and recurse into the reconstruction area. Therefore, it is necessary to simulate the structure of the subject 3 outside the reconstruction area.
- a method can be used in which the structure indicated by the surrounding pixels of the reconstruction area is uniformly present outside the field of view.
- the computing device 102 of the X-ray CT apparatus 100 obtains projection data when an X-ray projection similar to that for actual imaging is performed on the subject 3 reproduced on the computing device 102 by Monte Carlo simulation.
- the device structure such as the X-ray source (X-ray tube 1 and X-ray focal point 9) and the X-ray detector 4 are also placed on the arithmetic device 102 according to the actual structure. Simulate it.
- the X-ray CT apparatus 100 irradiates a simulated subject 3 with a pencil-like X-ray beam by Monte Carlo simulation, and generates an X-ray intensity distribution (point spread function p) on the surface of the X-ray detector 4 with respect to the X-ray incident direction.
- the measured projection data g (ch, sl), ideal projection data t (ch, sl) without scattered X-rays, and point spread function p (ch, sl) are used, and these Fourier transforms are respectively G (CH, SL). , T (CH, SL), and P (CH, SL), it is known that the following relationships (Equation 3) and (Equation 4) hold.
- CH and SL represent frequency components in the ch direction and sl direction, respectively.
- the point spread function changes relatively slowly, and several representative projection angles / detection element 6 positions (ch ′, sl ′, ⁇ ′) are used for speeding up the calculation. Only find the point spread function.
- the X-ray detector 4 is divided into ten in the channel direction, and a point spread function is calculated for the detection element 6 position (ch ′, sl ′) in the center of each region. From the obtained point spread function and (Equation 5), ideal projection data t in each region is obtained (F5).
- the point spread function of the intermediate projection angle / position can be estimated by interpolation from the point spread function p of the representative projection angle / position.
- the point spread function p is obtained by, for example, fitting with C ⁇ EXP ( ⁇ D ⁇
- EXP represents an exponential function.
- smoothing processing may be performed on the distribution of the point spread function or the distribution of the fitting parameters in order to remove high-frequency components due to insufficient statistics in the Monte Carlo simulation.
- the smoothing process is performed, for example, by taking a moving average of data in the channel direction, slice direction, and projection angle direction.
- the X-ray CT apparatus 100 obtains ideal projection t data in all projection angle directions, and performs image formation again. Thereby, a high-quality image without the influence of scattered X-rays can be obtained.
- the X-ray CT apparatus 100 estimates the point spread function of the scattering derived from the subject 3 based on the reconstructed image of the subject 3, the structure corresponding to the subject 3 is used. Can be reproduced. Thereby, the X-ray CT apparatus 100 can estimate the point spread function with high accuracy, and can reduce deterioration in image quality caused by scattered X-rays. Further, according to the X-ray CT apparatus 100 according to the first embodiment, since the Monte Carlo simulation that can strictly simulate the physical interaction is used, the point spread function can be estimated with higher accuracy.
- the X-ray CT apparatus 100 limits the projection angle only to the representative angle direction, performs the simulation only to the position representing the X-ray detection element 6, and obtains the point spread function, By calculating point spread functions at other projection angles and other X-ray detection element 6 positions by interpolation, the calculation time required for correcting scattered X-rays can be greatly reduced. Furthermore, since the X-ray CT apparatus 100 according to the first embodiment smoothes the distribution of the point spread function or the fitting parameter distribution obtained by the calculation, it can remove high-frequency noise caused by statistical fluctuations. Thus, the calculation time can be shortened and overcorrection and erroneous correction can be suppressed. That is, according to the X-ray CT apparatus 100 according to the second embodiment, a high-quality CT image that is not affected by scattered X-rays can be obtained within a realistic calculation time.
- the scattered X-ray correction is performed by estimating the point spread function at the representative point.
- the scattered X-ray correction is performed by estimating the scattered X-ray distribution by Monte Carlo simulation.
- the configuration of the X-ray CT apparatus 100 (see FIGS. 1 and 2) is the same as that of the first embodiment, and a detailed description thereof will be omitted.
- the projection data (X-ray transmission image data) photographed by the X-ray CT apparatus 100 includes scattered X-rays resulting from the subject 3. For this reason, the X-ray CT apparatus 100 estimates the distribution of scattered X-rays caused by the subject 3 that changes at each imaging as well as image correction processing in general image processing, and forms an image after correcting the distribution.
- FIG. 5 is an explanatory diagram showing an outline of image forming processing by the X-ray CT apparatus according to the second embodiment.
- the imaging (F1), the correction / reconstruction process (F2), and the simulation of the virtual subject 3 (F3) are the same as the image forming process by the X-ray CT apparatus 100 according to the first embodiment, and the description is omitted. .
- Monte Carlo simulation capable of calculating detailed physical interaction of X-rays is performed on the virtual subject 3A simulated in F3 (F7).
- F7 F3
- the influence of the false image is not excessively serious, it is possible to read the internal structure information of the subject 3 from the reconstructed image.
- the computing device 102 corrects the projection data (Raw Data) obtained by imaging (F1) based on the scattered X-ray distribution estimated in F7 (F8). Specifically, the scattered X-ray component is removed from the projection data. Then, the arithmetic unit 102 again corrects and reconstructs the projection data after the scattered X-ray component removal (F9). Thereby, in the arithmetic unit 102, a high-quality reconstructed image (New Image) in which the influence of scattered X-rays is further reduced as compared with the reconstructed image (Image) generated by the correction / reconstruction processing (F2). can get.
- the correction / reconstruction processing in F9 is a general image correction processing such as sensitivity correction as in F2.
- imaging (F1), correction / reconstruction processing (F2), and correction / reconstruction processing (F9) are imaging and image correction processing of a general X-ray CT apparatus 100, and will not be described.
- the simulation (F3) of the subject 3 is the same as that in the first embodiment, and a description thereof will be omitted.
- the computing device 102 of the X-ray CT apparatus 100 obtains projection data when an X-ray projection similar to that for actual imaging is performed on the subject 3 reproduced on the computing device 102 by Monte Carlo simulation.
- the device structure such as the X-ray source (X-ray tube 1 and X-ray focal point 9) and the X-ray detector 4 are also placed on the arithmetic device 102 according to the actual structure. Simulate it.
- X-rays are emitted from the X-ray focal point 9 as a large number of photons.
- X-ray energy is distributed to each photon based on an energy spectrum measured in advance under each scanning condition.
- the interaction received by each photon is described by probability, and the presence or absence of the interaction is determined using a pseudo-random number.
- Typical physical processes involving X-rays include, for example, Compton scattering, Rayleigh scattering, the photoelectric effect, and characteristic X-ray emission processes.
- the X-ray source (X-ray tube 1 and X-ray focal point 9) and the X-ray detector 4 rotate around the subject 3 from a plurality of angular directions in the virtual space, as in actual imaging. Take a picture and obtain projection data by calculation.
- the Monte Carlo simulation since it is possible to know whether or not there is an interaction between the X-ray and the subject 3, the incident intensity of the direct X-ray and the incident intensity of the scattered X-ray to the X-ray detector 4 are separately set Can be requested.
- the Monte Carlo simulation on the virtual subject 3A, it is possible to accurately estimate the scattered X-ray distribution (Scat. Dist.) In consideration of the subject 3.
- the representative angle direction may be selected at random or equiangular intervals, but may be selected as follows, for example, in order to reproduce the scattered X-ray distribution with high accuracy within a limited calculation time.
- FIG. 6 is a flowchart illustrating an example of a procedure of Monte Carlo simulation.
- the computing device 102 performs the above-described Monte Carlo simulation for a predetermined initial projection angle (for example, 0 degrees, 90 degrees, 180 degrees, and 270 degrees), and calculates the scattered X-ray distribution.
- a predetermined initial projection angle for example, 0 degrees, 90 degrees, 180 degrees, and 270 degrees
- step S ⁇ b> 2 the arithmetic unit 102 calculates the magnitude of the change in the scattered X-ray dose according to the following (Equation 7).
- data scat (ch, sl, ⁇ ) represents the scattered X-ray distribution obtained per detector rotation, and the position (ch) of the channel direction X-ray detection element 6 and the X in the slice direction It is expressed as a function of the position (sl) of the line detection element 6 and the projection angle ( ⁇ ).
- ch, sl, and ⁇ are discrete variables.
- step S ⁇ b> 3 the computing device 102 obtains a section in which the magnitude of the change in the scattered X-ray dose is maximized.
- step S4 the arithmetic unit 102 sets the projection angle in the section obtained in step S3, performs the above-described Monte Carlo simulation, and calculates the scattered X-ray distribution. For example, when the change in (Equation 7) shows the maximum value between the projection angles ⁇ 1 and ⁇ 2 (S3), the arithmetic unit 102 takes, for example, ( ⁇ 1 + ⁇ 2) / 2 as the next projection angle, and again A Monte Carlo simulation is performed to calculate the scattered X-ray distribution (S4).
- step S5 the arithmetic unit 102 returns to step S2 until the required statistical accuracy is satisfied or the allowable calculation time is exceeded (S5, No), and the subsequent processing is repeated.
- the process proceeds to step S6.
- the time required for the Monte Carlo simulation varies depending on the required accuracy.
- the user can arbitrarily set an X-ray statistic or a calculation time used for the Monte Carlo simulation through the input device 104. Further, the user can interrupt the Monte Carlo simulation at an arbitrary timing.
- the X-ray CT apparatus 100 performs scattered X-ray correction using data that has been calculated by the time of the interruption.
- step S6 the arithmetic unit 102 performs an interpolation process and a smoothing process on the scattered X-ray distribution obtained in steps S1 and S4, and ends the process according to this flowchart.
- the interpolation processing in step S6 is performed to interpolate intermediate angle data because the scattered X-ray distribution obtained by the above processing has a smaller number of data than actually measured in the projection angle direction.
- data interpolation methods for example, a spline interpolation method, a Lagrange interpolation method, and the like are known.
- the smoothing process in step S6 is performed in order to remove a high-frequency component caused by a shortage of statistics in the Monte Carlo simulation.
- the smoothing process is performed, for example, by taking a moving average of data in the channel direction, slice direction, and projection angle direction.
- the arithmetic unit 102 performs the scattered X-ray correction by the calculation shown in the following (Formula 8).
- DATA is projection data obtained by imaging
- DATA ref is reference data of projection obtained by imaging (for example, average data of the output of the X-ray detection element 6 located at the end)
- data scat is reference data obtained scattered X-ray distribution data calculation
- the display of the variables have been omitted .
- ⁇ is a constant representing the correction intensity. Note that the measurement data is corrected so that the output (offset value) when X-rays are not irradiated is zero.
- the arithmetic unit 102 also performs scattered X-ray correction of air data (output value when the subject 3 is air) by the calculation shown in the following (formula 9).
- AIR is projection data when the subject 3 is photographed as air.
- the meaning of each subscript is the same as in the above (Formula 8).
- the arithmetic unit 102 uses the values calculated in the above (Expression 8) and (Expression 9), the arithmetic unit 102 performs sensitivity correction (referred to as air correction) of the X-ray detection element 6 by the following (Expression 10).
- Air correction sensitivity correction
- NewData / NewAir Form 10
- the computing device 102 performs image reconstruction again based on the data after the scattered X-ray correction and air correction shown in the above (Equation 10). Thereby, the X-ray CT apparatus 100 can provide a user with a high-quality image that is not affected by scattered X-rays.
- the scattered X-ray distribution (Scat. Dist.) Is estimated based on the reconstructed image (Image) of the subject 3.
- the change of the structure can be reproduced.
- the X-ray CT apparatus 100 can estimate the scattered X-ray distribution with high accuracy, and can reduce deterioration in image quality caused by the scattered X-rays.
- the Monte Carlo simulation that can strictly simulate the physical interaction is used, the scattered X-ray distribution can be estimated with higher accuracy.
- the X-ray CT apparatus 100 obtains a scattered X-ray distribution by performing a simulation by limiting the projection angle only to the representative angle direction, and interpolates the scattered X-ray distribution in other angular directions. Therefore, the calculation time required for estimating the scattered X-ray distribution can be greatly shortened. Furthermore, since the X-ray CT apparatus 100 according to the second embodiment smoothes the scattered X-ray distribution obtained by calculation, high-frequency noise due to statistical fluctuations can be removed, and calculation time can be reduced. It is possible to suppress overcorrection and erroneous correction. That is, according to the X-ray CT apparatus 100 according to the second embodiment, a high-quality CT image that is not affected by scattered X-rays can be obtained within a realistic calculation time.
- the X-ray CT apparatus 100 employs elliptical columnar water as a phantom, for example.
- the variables are only the major axis a and the minor axis b.
- the X-ray CT apparatus 100 obtains the dependence of the scattered X-ray distribution or the point spread function on the major axis a for a plurality of elliptical cylinders having various flatness ratios f. Then, the X-ray CT apparatus 100 obtains the scattered X-ray distribution and the point spread function distribution for the arbitrary variables a and f by interpolation and function fitting, and creates a database.
- the X-ray CT apparatus 100 approximates the imaging region shape of the object 3 to an ellipse based on the reconstructed image obtained by imaging, and sets the major axis a and the flatness ratio f. taking measurement.
- the X-ray CT apparatus 100 selects a scattered X-ray distribution or a distribution of a point spread function that approximates the measured major axis a and flatness f from the above-described database, and by the method described in the first embodiment or 2,
- the scattered X-ray correction is performed on the measurement data.
- the X-ray CT apparatus 100 performs image reconstruction using the measurement data after the scattered X-ray correction. Thereby, a high-quality image without the influence of scattered X-rays can be obtained.
- the X-ray CT apparatus 100 according to the third embodiment has the following effects in addition to the same effects as those of the X-ray CT apparatus 100 according to the first embodiment or the second embodiment. can get. That is, according to the X-ray CT apparatus 100 according to the third embodiment, since the Monte Carlo simulation that requires a long time for the calculation is executed in advance before photographing the subject 3, the time required for correcting the scattered X-ray is greatly reduced. can do.
- X-ray tube (X-ray source) 2 Opening 3 Subject 3A Virtual subject (simulated subject, X-ray absorption coefficient distribution) 4 X-ray detector 5 Scattered ray prevention grid 6 Separator 7 X-ray detection element 8 Detector module 9 X-ray focus 100 X-ray CT apparatus 101 Recording apparatus 102 Arithmetic apparatus 103 Control apparatus 104 Input apparatus 105 Output apparatus F1 Imaging (imaging part) ) F2 Correction / reconstruction processing F3 Simulation of the subject F4 Monte Carlo simulation for virtual subjects (point spread function estimation unit) F5 Projection data correction (correction unit) F6 correction / reconstruction processing (imaging part) F7 Monte Carlo simulation for virtual subjects (X-ray distribution estimation unit) F8 Projection data correction (correction unit) F9 Correction / reconstruction processing (imaging part)
Abstract
Description
<X線CT装置100の構成>
図1は、第1実施形態に係るX線CT装置100の構成を示す説明図である。以下の説明において、図1中のX軸方向をチャネル方向、Y軸方向をX線焦点方向、Z軸方向をスライス方向とする。図1では、X線CT装置100を、被写体3の体軸方向(スライス方向:Z軸方向)から見たものとして図示している。
つづいて、X線CT装置100による画像形成処理について説明する。X線CT装置100によって撮影された投影データ(X線透過像データ)には、被写体3に起因する散乱X線が含まれている。このため、X線CT装置100は、一般的な画像処理における画像補正処理の他、撮影ごとに変わる被写体3に起因する散乱X線の分布を考慮した点拡がり関数(PSF:Point Spread Function)を推定し、補正した上で画像を形成する。
X線CT装置100は、撮影(F1)によって得られた投影データ(Raw Data)に対して、補正・再構成処理(F2)をおこない、再構成画像(Image)を生成する。なお、F2における補正・再構成処理とは、例えば、感度補正などの一般的な画像補正処理である。
つづいて、図3に示した画像形成処理の各工程の詳細について説明する。
なお、撮影(F1)、補正・再構成処理(F2)および補正・再構成処理(F6)は、一般的なX線CT装置100の撮影および画像補正処理であり、説明を省略する。
図3のF3において、X線CT装置100の演算装置102は、再構成画像(Image)を基に、計算機上で仮想的に被写体3を模擬し仮想被写体3Aを生成する。ここで、再構成画像(Image)は、被写体3内部のX線吸収係数の違いをCT値として表現したものである。CT値は、水が0HU、空気が-1000HUになるように規格化されている。一方、モンテカルロシミュレーションで必要になるのは、物質の元素組成と密度であるが、CT値だけからは組成と密度は決定できない。
空気:水:テフロン=A%:(100-A)%:0%(-1000HU<CT値≦0HUの場合)
空気:水:テフロン=0%:(100-B)%:B%(0HU<CT値≦1000HUの場合)
空気:水:テフロン=0%:0%:100%(1000HU<CT値の場合)
ここで、比率は体積比である。またAおよびBは、下記(式1),(式2)のように示される。
A = -CT値[HU]/1000×100 ・・・(式1)
B = CT値[HU]/1000×100 ・・・(式2)
空気(CT値≦-500HUの場合)
水(-500HU<CT値≦500HUの場合)
テフロン(500HU<CT値の場合)
つづいて、演算装置102上に模擬した仮想被写体3Aに対するモンテカルロシミュレーション(図3のF4)について説明する。X線CT装置100の演算装置102は、モンテカルロシミュレーションによって、演算装置102上に再現した被写体3に対して実際の撮影と同様のX線投影をおこなった場合の投影データを求める。このとき、被写体3以外の条件、例えば、X線源(X線管球1、X線焦点9)やX線検出器4などの装置構造についても、実際の構造に準じて演算装置102上に模擬しておく。
G=T・P ・・・(式4)
ここで、*は畳み込み積分、・は積を表す。なお変数表示は省略した。
t=F[G/P]=g*F[1/P] ・・・(式5)
この方法を逆畳み込み積分法と呼ぶ。
p(ch,sl,ch',sl',θ') ・・・(式6)
第1実施形態では、代表点における点拡がり関数を推定することによって、散乱X線補正をおこなった。第2実施形態では、モンテカルロシミュレーションにより散乱X線の分布を推定して、散乱X線補正をおこなった。なお、第2実施形態において、X線CT装置100の構成(図1、図2参照)については、第1実施形態と同様であるので詳細な説明を省略する。
第2実施形態に係るX線CT装置100による画像形成処理について説明する。X線CT装置100によって撮影された投影データ(X線透過像データ)には、被写体3に起因する散乱X線が含まれている。このため、X線CT装置100は、一般的な画像処理における画像補正処理の他、撮影ごとに変わる被写体3に起因する散乱X線の分布を推定し、補正した上で画像を形成する。
撮影(F1)、補正・再構成処理(F2)および仮想的な被写体3の模擬(F3)は、第1実施形態に係るX線CT装置100による画像形成処理と同様であり、説明を省略する。
つづいて、図5に示した画像形成処理の各工程の詳細について説明する。
なお、撮影(F1)、補正・再構成処理(F2)および補正・再構成処理(F9)は、一般的なX線CT装置100の撮影および画像補正処理であり、説明を省略する。また、被写体3の模擬(F3)は第1実施形態と同様であり、説明を省略する。
つづいて、演算装置102上に模擬した仮想被写体3Aに対するモンテカルロシミュレーション(図5のF7)について説明する。X線CT装置100の演算装置102は、モンテカルロシミュレーションによって、演算装置102上に再現した被写体3に対して実際の撮影と同様のX線投影をおこなった場合の投影データを求める。このとき、被写体3以外の条件、例えば、X線源(X線管球1、X線焦点9)やX線検出器4などの装置構造についても、実際の構造に準じて演算装置102上に模擬しておく。
このように、仮想被写体3Aに対してモンテカルロシミュレーションを実行することにより、被写体3を考慮した散乱X線分布(Scat.Dist.)を精度良く推定することが可能となる。
ステップS1において、演算装置102は、あらかじめ決められた初期投影角度(例えば0度、90度、180度、270度)について、上述したモンテカルロシミュレーションをおこない、散乱X線分布を計算する。
下記(式7)において、datascat(ch,sl,θ)は、検出器1回転あたりに得られる散乱X線分布を表し、チャネル方向X線検出素子6の位置(ch)、スライス方向のX線検出素子6の位置(sl)、投影角度(θ)の関数として表わされる。ただし、ch、sl、θは離散的変数である。
ステップS4において、演算装置102は、ステップS3で求めた区間中に投影角度を設定し、上述したモンテカルロシミュレーションをおこない、散乱X線分布を計算する。
例えば、投影角度θ1からθ2の間で上記(式7)の変化が最大値を示した場合(S3)、演算装置102は、つぎの投影角度として、例えば、(θ1+θ2)/2をとり、再度モンテカルロシミュレーションをおこなって散乱X線分布を計算する(S4)。
つぎに、F7において推定した散乱X線分布を基に、撮影(F1)によって得られた投影データ(Raw Data)を補正する散乱X線補正(図5のF8)の詳細について説明する。X線CT装置100の演算装置102は、シミュレーションによって得られた散乱X線分布を用いて、撮影で得られた投影データから散乱X線の寄与を差し引く。
NewData/NewAir・・・(式10)
第1実施形態および第2実施形態では、被写体3に対する計測(撮像:F1)をおこなう度に、仮想被写体3A(X線吸収係数分布)に対するモンテカルロシミュレーションをおこない(F4)、散乱X線分布や点拡がり関数を求めた。第3実施形態では、事前のシミュレーションによって、被写体3を模擬したファントム(模擬被写体)を定義し、第1実施形態または第2実施形態で示した方法により、散乱X線分布または点拡がり関数の分布を詳細に求めておく。これにより、散乱X線補正に要する時間を大幅に短縮することができる。なお、第3実施形態において、X線CT装置100の構成(図1、図2参照)および画像形成処理の流れ(図3,図5参照)については、第1実施形態または第2実施形態と同様であるので詳細な説明を省略する。
2 開口部
3 被写体
3A 仮想被写体(模擬被写体、X線吸収係数分布)
4 X線検出器
5 散乱線防止グリッド
6 セパレータ
7 X線検出素子
8 検出器モジュール
9 X線焦点
100 X線CT装置
101 記録装置
102 演算装置
103 制御装置
104 入力装置
105 出力装置
F1 撮影(撮影部)
F2 補正・再構成処理
F3 被写体の模擬(内部分布推定部)
F4 仮想被写体に対するモンテカルロシミュレーション(点拡がり関数推定部)
F5 投影データ補正(補正部)
F6 補正・再構成処理(画像化部)
F7 仮想被写体に対するモンテカルロシミュレーション(X線分布推定部)
F8 投影データ補正(補正部)
F9 補正・再構成処理(画像化部)
Claims (11)
- X線焦点からX線を発生するX線源と、前記X線を検出するためのX線検出素子が2次元配列されているX線検出器とが、被写体をはさんで対向配置された関係を保ちながら前記被写体の周りを回転し、複数の投影方向から前記被写体のX線透過像データを撮影する撮影部と、
前記撮影部によって撮影された前記X線透過像データに基づいて、前記被写体内部のX線吸収係数分布を推定する内部分布推定部と、
前記内部分布推定部によって推定された前記X線吸収係数分布を有する模擬被写体に対して、前記X線の物理相互作用を模擬するモンテカルロシミュレーションを実施して、前記被写体に由来する散乱の点拡がり関数を推定する点拡がり関数推定部と、
前記点拡がり関数推定部によって推定された前記点拡がり関数と、前記X線透過像データとを逆畳み込み積分して、前記X線透過像データを補正する補正部と、
前記補正部によって補正された前記X線透過像データを用いて、前記被写体のX線吸収係数分布画像を形成する画像化部と、を備える
ことを特徴とするX線CT装置。 - 前記点拡がり関数推定部は、
前記複数の投影方向よりも少ない数の投影方向である代表投影方向について前記モンテカルロシミュレーションを実施して、当該モンテカルロシミュレーションによって得られた前記代表投影方向間の前記点拡がり関数を補間することによって、前記複数の投影方向すべての前記点拡がり関数を推定する
こと特徴とする請求項1に記載のX線CT装置。 - 前記点拡がり関数推定部は、
前記2次元配列された前記X線検出素子のうち、所定数の素子の位置である代表素子位置において前記モンテカルロシミュレーションを実施して、当該モンテカルロシミュレーションによって得られた前記代表素子位置間の前記点拡がり関数を補間することによって、前記2次元配列された前記X線検出素子のすべての位置における前記点拡がり関数を推定する
ことを特徴とする請求項1に記載のX線CT装置。 - X線焦点からX線を発生するX線源と、前記X線を検出するためのX線検出素子が2次元配列されているX線検出器とが、被写体をはさんで対向配置された関係を保ちながら前記被写体の周りを回転し、複数の投影方向から前記被写体のX線透過像データを撮影する撮影部と、
前記撮影部によって撮影された前記X線透過像データに基づいて、前記被写体内部のX線吸収係数分布を推定する内部分布推定部と、
前記内部分布推定部によって推定された前記X線吸収係数分布を有する模擬被写体に対して、前記X線の物理相互作用を模擬するモンテカルロシミュレーションを実施して、前記被写体に由来する散乱X線の分布を推定するX線分布推定部と、
前記X線分布推定部によって推定された前記分布に基づいて、前記X線透過像データから前記散乱X線の成分を除去する補正部と、
前記補正部によって前記散乱X線の成分が除去された前記X線透過像データを用いて、前記被写体のX線吸収係数分布画像を形成する画像化部と、を備える
ことを特徴とするX線CT装置。 - 前記X線分布推定部は、
前記複数の投影方向より少ない数の投影方向である代表投影方向について前記モンテカルロシミュレーションを実施して、当該モンテカルロシミュレーションによって得られた前記代表投影方向間の前記分布を補間することによって、前記複数の投影方向すべての前記分布を推定する
こと特徴とする請求項4に記載のX線CT装置。 - 前記X線分布推定部は、
前記代表投影方向の前記分布から前記散乱X線量の変化率が最大となる前記投影方向を推定し、前記変化率が最大となる前記投影方向の前記散乱X線の分布を前記モンテカルロシミュレーションによって求める手続きをくり返して、前記代表投影方向を逐次選択することを特徴とする請求項5に記載のX線CT装置。 - 前記内部分布推定部は、
CT値が既知な複数の物質の混合物として前記被写体を模擬することによって前記X線吸収係数分布を推定する
ことを特徴とする、請求項1に記載のX線CT装置。 - 前記モンテカルロシミュレーションにおけるX線統計量の設定と、前記モンテカルロシミュレーションを実行する計算時間の設定と、前記モンテカルロシミュレーションの任意のタイミングでの中断と、のうち、少なくともいずれか1つを可能とするユーザインターフェースをさらに備える
ことを特徴とする、請求項1に記載のX線CT装置。 - 前記内部分布推定部は、
前記撮影部によって撮影された前記X線透過像データに基づいて、前記被写体内部のX線吸収係数分布を推定することに換えて、
前記被写体を模擬する模擬被写体内部のX線吸収係数分布を前記被写体内部のX線吸収係数分布として推定する
ことを特徴とする、請求項1に記載のX線CT装置。 - X線焦点位置からX線を発生するX線源と、前記X線を検出するためのX線検出素子が2次元配列されているX線検出器とが、被写体をはさんで対向配置された関係を保ちながら前記被写体の周りを回転し、複数の投影方向から前記被写体のX線透過像データを撮影する撮影工程と、
前記撮影工程で撮影された前記X線透過像データに基づいて、前記被写体内部のX線吸収係数分布を推定する内部分布推定工程と、
前記内部分布推定工程で推定された前記X線吸収係数分布を有する模擬被写体に対して、前記X線の物理相互作用を模擬するモンテカルロシミュレーションを実施して、前記被写体に由来する散乱の点拡がり関数を推定する点拡がり関数推定工程と、
前記点拡がり関数推定工程で推定された前記点拡がり関数と、前記X線透過像データとを逆畳み込み積分して、前記X線透過像データを補正する補正工程と、
前記補正工程で補正された前記X線透過像データを用いて、前記被写体のX線吸収係数分布画像を形成する画像化工程と、
を含んだことを特徴とする散乱X線補正方法。 - X線焦点位置からX線を発生するX線源と、前記X線を検出するためのX線検出素子が2次元配列されているX線検出器とが、被写体をはさんで対向配置された関係を保ちながら前記被写体の周りを回転し、複数の投影方向から前記被写体のX線透過像データを撮影する撮影工程と、
前記撮影工程で撮影された前記X線透過像データに基づいて、前記被写体内部のX線吸収係数分布を推定する内部分布推定工程と、
前記内部分布推定工程で推定された前記X線吸収係数分布を有する模擬被写体に対して、前記X線の物理相互作用を模擬するモンテカルロシミュレーションを実施して、前記被写体に由来する散乱X線の分布を推定するX線分布推定工程と、
前記X線分布推定工程で推定された前記分布に基づいて、前記X線透過像データから前記散乱X線の成分を除去する補正工程と、
前記補正工程で前記散乱X線の成分が除去された前記X線透過像データを用いて、前記被写体のX線吸収係数分布画像を形成する画像化工程と、
を含んだことを特徴とする散乱X線補正方法。
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Cited By (5)
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Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
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Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005058760A (ja) * | 2003-07-31 | 2005-03-10 | Toshiba Corp | 画像データ処理装置及び画像データ処理方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3069411B2 (ja) | 1991-09-04 | 2000-07-24 | 科学技術振興事業団 | 導波路型非対称方向性光結合器 |
BE1007766A3 (nl) | 1993-11-10 | 1995-10-17 | Philips Electronics Nv | Werkwijze en inrichting voor computer tomografie. |
JP4218908B2 (ja) | 1998-04-24 | 2009-02-04 | 株式会社東芝 | X線ct装置 |
US7330594B2 (en) | 2003-07-31 | 2008-02-12 | Kabushiki Kaisha Toshiba | Image enhancement or correction software, method, apparatus and system for substantially minimizing blur in the scanned image |
JP5052281B2 (ja) | 2007-10-02 | 2012-10-17 | 株式会社東芝 | X線ctにおける散乱線強度分布の推定方法およびx線ct装置 |
JP5093195B2 (ja) | 2009-07-06 | 2012-12-05 | カシオ計算機株式会社 | 液晶表示パネル |
CN101987021B (zh) | 2010-12-06 | 2012-10-17 | 中国科学院深圳先进技术研究院 | Ct系统的散射校正方法及ct系统 |
US8433154B2 (en) * | 2010-12-13 | 2013-04-30 | Carestream Health, Inc. | Enhanced contrast for scatter compensation in X-ray imaging |
-
2012
- 2012-12-12 CN CN201280060843.XA patent/CN103987320B/zh active Active
- 2012-12-12 WO PCT/JP2012/082251 patent/WO2013089155A1/ja active Application Filing
- 2012-12-12 JP JP2013549295A patent/JP5815048B2/ja active Active
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Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005058760A (ja) * | 2003-07-31 | 2005-03-10 | Toshiba Corp | 画像データ処理装置及び画像データ処理方法 |
Non-Patent Citations (3)
Title |
---|
GENEVIEVE JARRY: "Characterization of scattered radiation in kV CBCT images using Monte Carlo simulations", MEDICAL PHYSICS, vol. 33, no. ISSUE, 2006, pages 4320 - 4329, XP012091941, DOI: doi:10.1118/1.2358324 * |
J. A. SEIBERT: "X-ray scatter removal by deconvolution", MEDICAL PHYSICS, vol. 15, no. ISSUE, 1988, pages 567 - 575, XP002340970, DOI: doi:10.1118/1.596208 * |
TAKASHI SATO: "X-sen Kyushu Katei ni Okeru Ryoshi Yuragi no Denpa (Gazo Kogaku Noise Tokusei)", JAPANESE JOURNAL OF RADIOLOGICAL TECHNOLOGY, vol. 50, no. 8, 1 August 1994 (1994-08-01), pages 1022 * |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2016028673A (ja) * | 2014-07-14 | 2016-03-03 | 朝日レントゲン工業株式会社 | 画像処理装置、画像処理方法、及びx線撮影装置 |
JP2020534929A (ja) * | 2017-09-28 | 2020-12-03 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | 深層学習ベースの散乱補正 |
JP2019111346A (ja) * | 2017-12-22 | 2019-07-11 | キヤノンメディカルシステムズ株式会社 | 医用処理装置及び放射線診断装置 |
WO2020184361A1 (ja) * | 2019-03-13 | 2020-09-17 | 日本電産リード株式会社 | 検出値補正システム、係数算出方法、及び検出値補正方法 |
JP2021023761A (ja) * | 2019-08-01 | 2021-02-22 | 恵一 中川 | X線コーンビームct画像再構成方法 |
JP7022268B2 (ja) | 2019-08-01 | 2022-02-18 | 恵一 中川 | X線コーンビームct画像再構成方法 |
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