WO2012118322A3 - 격자패턴투영장치 - Google Patents

격자패턴투영장치 Download PDF

Info

Publication number
WO2012118322A3
WO2012118322A3 PCT/KR2012/001495 KR2012001495W WO2012118322A3 WO 2012118322 A3 WO2012118322 A3 WO 2012118322A3 KR 2012001495 W KR2012001495 W KR 2012001495W WO 2012118322 A3 WO2012118322 A3 WO 2012118322A3
Authority
WO
WIPO (PCT)
Prior art keywords
grid pattern
projecting
image
dimensional measurement
present
Prior art date
Application number
PCT/KR2012/001495
Other languages
English (en)
French (fr)
Other versions
WO2012118322A2 (ko
Inventor
이경자
최수연
최수형
Original Assignee
Lee Keyoung Ja
Choi Su Yeoun
Choi Su Heyng
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lee Keyoung Ja, Choi Su Yeoun, Choi Su Heyng filed Critical Lee Keyoung Ja
Priority to US14/002,119 priority Critical patent/US20130335531A1/en
Publication of WO2012118322A2 publication Critical patent/WO2012118322A2/ko
Publication of WO2012118322A3 publication Critical patent/WO2012118322A3/ko
Priority to US15/712,759 priority patent/US20180075610A1/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/507—Depth or shape recovery from shading
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T15/00—3D [Three Dimensional] image rendering
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Graphics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

본 발명은 격자패턴투영장치에 관한 것으로서, 더욱 상세하게는 검사물체에 3차원 측정 시 투영되는 격자패턴투영장치에 관한 것이다. 검사물체로 격자패턴형태의 광을 방출하기 위하여 격자패턴정보를 입력받아 격자패턴신호를 발생시키고, 격자패턴신호를 제어하는 격자패턴신호발생부와 격자패턴신호를 이용하여 광원 및 레이저스캐너용 마이크로미러를 제어하여 격자패턴을 방출하는 격자패턴방출부로 구성되는 격자패턴투영수단을 이용하여 격자패턴 영상을 입력받는 카메라와, 3차원 영상을 추출하는 정보처리수단 및 출력 수단을 포함하는 것을 특징으로 한다. 상기와 같은 발명에 따르면, 모바일기기 및 3차원 측정용 기기에 내장형 또는 외장형으로 소형화할 수 있으며 기존의 격자패턴투영장치의 초점 조절의 문제점 및 고속카메라에 격자패턴 영상을 실시간으로 투영하여 3차원 측정을 할 수 있다.
PCT/KR2012/001495 2011-02-28 2012-02-28 격자패턴투영장치 WO2012118322A2 (ko)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US14/002,119 US20130335531A1 (en) 2011-02-28 2012-02-28 Apparatus for projecting grid pattern
US15/712,759 US20180075610A1 (en) 2011-02-28 2017-09-22 Apparatus for projecting a grid pattern

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020110017876A KR101289595B1 (ko) 2011-02-28 2011-02-28 격자패턴투영장치
KR10-2011-0017876 2011-02-28

Related Child Applications (2)

Application Number Title Priority Date Filing Date
US14/002,119 A-371-Of-International US20130335531A1 (en) 2011-02-28 2012-02-28 Apparatus for projecting grid pattern
US15/712,759 Continuation US20180075610A1 (en) 2011-02-28 2017-09-22 Apparatus for projecting a grid pattern

Publications (2)

Publication Number Publication Date
WO2012118322A2 WO2012118322A2 (ko) 2012-09-07
WO2012118322A3 true WO2012118322A3 (ko) 2012-12-20

Family

ID=46758373

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2012/001495 WO2012118322A2 (ko) 2011-02-28 2012-02-28 격자패턴투영장치

Country Status (3)

Country Link
US (2) US20130335531A1 (ko)
KR (1) KR101289595B1 (ko)
WO (1) WO2012118322A2 (ko)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2010363965B2 (en) 2010-11-16 2014-10-23 Micro Motion, Inc. Multiple temperature sensor system
EP2831538B1 (en) * 2012-03-26 2017-05-03 Mantisvision Ltd. Three dimensional camera and projector for same
KR101314101B1 (ko) * 2012-09-24 2013-10-04 위프코 주식회사 3차원 계측 시스템 및 그 방법
DE102013200657B4 (de) * 2013-01-17 2015-11-26 Sypro Optics Gmbh Vorrichtung zur Erzeugung eines optischen Punktmusters
US20140307055A1 (en) 2013-04-15 2014-10-16 Microsoft Corporation Intensity-modulated light pattern for active stereo
US9234742B2 (en) * 2013-05-01 2016-01-12 Faro Technologies, Inc. Method and apparatus for using gestures to control a laser tracker
US9835642B2 (en) 2013-11-08 2017-12-05 The Johns Hopkins University High speed image processing device
KR20150107522A (ko) * 2014-03-14 2015-09-23 유태정 조명장치, 조명장치를 이용한 정보제공시스템 및 그 방법
JP6420572B2 (ja) * 2014-06-13 2018-11-07 キヤノン株式会社 計測装置およびその方法
US9826203B2 (en) * 2014-09-08 2017-11-21 Intel Corporation Method and system for controlling a laser-based lighting system
CN104296681B (zh) * 2014-10-16 2016-12-07 浙江大学 基于激光点阵标识的三维地形传感方法
KR101628158B1 (ko) * 2014-12-05 2016-06-09 주식회사 미르기술 3차원 형상 측정 장치
DE102015012296A1 (de) * 2015-09-23 2017-03-23 GL Messtechnik GmbH Smart Scan, Handhaltbare Vorrichtung zur mobilen Profilmessung von Oberflächen.
CN106052592A (zh) * 2016-06-28 2016-10-26 西安励德微系统科技有限公司 一种扫描式结构光投影系统及其控制方法
JP6812149B2 (ja) * 2016-06-30 2021-01-13 オリンパス株式会社 走査型顕微鏡、及び、走査型顕微鏡の制御方法
KR101824888B1 (ko) * 2016-10-04 2018-02-02 이경자 3차원 형상 측정 장치 및 그의 측정 방법
JP6934645B2 (ja) * 2017-01-25 2021-09-15 国立研究開発法人産業技術総合研究所 画像処理方法
WO2018161260A1 (en) * 2017-03-07 2018-09-13 Goertek Inc. Laser projection device and laser projection system
CN107941147B (zh) * 2017-11-17 2020-04-07 北京振兴计量测试研究所 大型系统三维坐标非接触在线测量方法
CN109489583B (zh) * 2018-11-19 2021-09-17 先临三维科技股份有限公司 投影装置、采集装置及具有其的三维扫描系统
CN109725428B (zh) * 2019-02-26 2021-09-07 浙江理工大学 一种光场显示方法与光场显示引擎
KR102161452B1 (ko) * 2019-07-24 2020-10-05 (주)칼리온 스캐너 움직임에 따른 모션 유효성 검출 장치 및 그 방법
US20220092805A1 (en) * 2020-09-23 2022-03-24 Smith & Nephew, Inc. Optical caliper for 3-d endoscopic imaging and measurement
CN114322751B (zh) * 2020-09-30 2024-01-23 广东博智林机器人有限公司 目标测量方法、装置、计算机设备和存储介质
KR102428841B1 (ko) * 2020-12-09 2022-08-04 두산산업차량 주식회사 구조광을 이용한 연마 로봇 시스템 및 그 제어방법

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0914914A (ja) * 1994-06-06 1997-01-17 Kishimoto Sangyo Kk レーザスペックルパターンによる移動量の測定装置におけるレーザ光の照射方法ならびにその装置
JP2008032609A (ja) * 2006-07-31 2008-02-14 Aisin Seiki Co Ltd 三次元形状測定装置及び三次元形状測定方法
KR20090092352A (ko) * 2008-02-27 2009-09-01 정병주 광 빔의 추적과 영상분석에 의한 반사체의 위치좌표입력장치

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6366689B1 (en) * 1999-10-14 2002-04-02 Asti, Inc. 3D profile analysis for surface contour inspection
JP3519698B2 (ja) * 2001-04-20 2004-04-19 照明 與語 ３次元形状測定方法
EP1777485A4 (en) * 2004-08-03 2012-09-19 Techno Dream 21 Co Ltd METHOD AND DEVICE FOR MEASURING THREE-DIMENSIONAL FORMS
WO2006134793A1 (ja) * 2005-06-14 2006-12-21 Brother Kogyo Kabushiki Kaisha 投影装置
US20070091174A1 (en) * 2005-09-30 2007-04-26 Topcon Corporation Projection device for three-dimensional measurement, and three-dimensional measurement system
JP2007271530A (ja) * 2006-03-31 2007-10-18 Brother Ind Ltd ３次元形状検出装置及び３次元形状検出方法
US8456521B2 (en) * 2009-12-14 2013-06-04 Berliner Glas Kgaa Herbert Kubatz Gmbh & Co. Triangulation camera device and triangulation imaging method
US20120218464A1 (en) * 2010-12-28 2012-08-30 Sagi Ben-Moshe Method and system for structured light 3D camera
US20120200829A1 (en) * 2011-02-09 2012-08-09 Alexander Bronstein Imaging and projecting devices and methods

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0914914A (ja) * 1994-06-06 1997-01-17 Kishimoto Sangyo Kk レーザスペックルパターンによる移動量の測定装置におけるレーザ光の照射方法ならびにその装置
JP2008032609A (ja) * 2006-07-31 2008-02-14 Aisin Seiki Co Ltd 三次元形状測定装置及び三次元形状測定方法
KR20090092352A (ko) * 2008-02-27 2009-09-01 정병주 광 빔의 추적과 영상분석에 의한 반사체의 위치좌표입력장치

Also Published As

Publication number Publication date
KR20120098131A (ko) 2012-09-05
US20180075610A1 (en) 2018-03-15
KR101289595B1 (ko) 2013-07-24
US20130335531A1 (en) 2013-12-19
WO2012118322A2 (ko) 2012-09-07

Similar Documents

Publication Publication Date Title
WO2012118322A3 (ko) 격자패턴투영장치
PH12020551338A1 (en) Apparatus, method and computer program product for defect detection in work pieces
IL230700B (en) Detection of defects in the chip
EP4231637A3 (en) Light projector using an acousto-optical control device
SG11201808036XA (en) Image processing apparatus, imaging apparatus, and control methods thereof
EP2216679A4 (en) LIGHT SOURCE FOR A PROJECTION SYSTEM AND PROJECTION DISPLAY DEVICE
EP2672290A3 (en) Apparatus depth image generating method and apparatus and depth image processing method and apparatus
TW200951398A (en) Apparatus for measurement of surface profile
EP2523043A3 (en) Substrate inspection apparatus and mask inspection apparatus
WO2016062785A3 (en) Smart photonic imaging method and apparatus
BR112014028135A2 (pt) aparelho de caracterização de profundidade portátil para caracterizar uma profundidade de uma superfície de um objeto alvo; método de caracterizar uma profundidade de uma superfície de um objeto alvo utilizando um aparelho portátil; e meio de armazenamento legível por computador
MX2017004962A (es) Sistema y metodo detector de fugas de aceite.
EP2590414A3 (en) Image projection apparatus
EP2493199A3 (en) Laser projector and method of processing signal thereof
EP2575078A3 (en) Front vehicle detecting method and front vehicle detecting apparatus
EP2702932A3 (en) Image capturing apparatus, image capturing method, and storage medium
EP2571274A3 (en) Projector
EP2566164A3 (en) Projection apparatus and projection control method
GB2506068A (en) Apparatus and method
GB2489582A8 (en) Image capturing device and image capturing method
EP2787734A3 (en) Apparatus and method for forming light field image
EP2775721A3 (en) Projector
WO2015138994A3 (en) Registration using a microscope insert
EP2667619A3 (en) Image projection module, mobile device including image projection module and method for operating the same
TW201612863A (en) Aircraft landing-guiding system and method

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 12752545

Country of ref document: EP

Kind code of ref document: A2

NENP Non-entry into the national phase

Ref country code: DE

WWE Wipo information: entry into national phase

Ref document number: 14002119

Country of ref document: US

122 Ep: pct application non-entry in european phase

Ref document number: 12752545

Country of ref document: EP

Kind code of ref document: A2