WO2012087075A2 - 레이저간섭 노광을 이용한 대면적 미세패턴 제작 방법, 상기 방법을 이용하여 제작된 미세패턴의 비평면적 전사 방법 및 이를 이용하여 미세 패턴을 전사한 물품 - Google Patents
레이저간섭 노광을 이용한 대면적 미세패턴 제작 방법, 상기 방법을 이용하여 제작된 미세패턴의 비평면적 전사 방법 및 이를 이용하여 미세 패턴을 전사한 물품 Download PDFInfo
- Publication number
- WO2012087075A2 WO2012087075A2 PCT/KR2011/010063 KR2011010063W WO2012087075A2 WO 2012087075 A2 WO2012087075 A2 WO 2012087075A2 KR 2011010063 W KR2011010063 W KR 2011010063W WO 2012087075 A2 WO2012087075 A2 WO 2012087075A2
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- WIPO (PCT)
- Prior art keywords
- fine pattern
- pattern
- article
- forming layer
- pattern forming
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/34—Imagewise removal by selective transfer, e.g. peeling away
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
- G03F7/0757—Macromolecular compounds containing Si-O, Si-C or Si-N bonds
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/34—Imagewise removal by selective transfer, e.g. peeling away
- G03F7/346—Imagewise removal by selective transfer, e.g. peeling away using photosensitive materials other than non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/139—Manufacture or treatment of devices covered by this subclass using temporary substrates
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/40—Optical elements or arrangements
- H10F77/42—Optical elements or arrangements directly associated or integrated with photovoltaic cells, e.g. light-reflecting means or light-concentrating means
- H10F77/484—Refractive light-concentrating means, e.g. lenses
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/40—Optical elements or arrangements
- H10F77/42—Optical elements or arrangements directly associated or integrated with photovoltaic cells, e.g. light-reflecting means or light-concentrating means
- H10F77/488—Reflecting light-concentrating means, e.g. parabolic mirrors or concentrators using total internal reflection
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/52—PV systems with concentrators
Definitions
- the present invention relates to a method for manufacturing a large-area micropattern using laser interference exposure, to a non-planar area transfer method of a micropattern produced using the method, and to an article in which the micropattern is transferred using the same.
- the fine pattern is formed in a large area on the coated pattern forming layer, and the pattern forming layer on which the fine pattern has been transferred is separated and adhered to the object to be applied to thereby apply the fine pattern non-planarly.
- the present invention relates to a method of transferring and an article to which a fine pattern is transferred using the same.
- Micropattern processing technology to form fine patterns is the foundation technology of various industrial fields and can have ripple effect in various fields such as electronic devices, optical devices, micro-electromechanical systems (MEMS), and recently bio devices. That is the core technology. Particularly, since the 1990s, researches paying attention to phenomena that are different from those of macrostructures have appeared in nanostructures. It is concentrated. In addition, as various mixed-application technologies have been developed based on nanotechnology in traditional studies such as electrical, electronics, chemistry, materials, and biotechnology, the application of micropattern processing technology, which is mainly used in the electronics industry, has been increasingly applied to various nano and optical devices. In addition, the applicability of bio devices such as biochips is being expanded day by day.
- a photographic dry plate (mask, reticle) is exposed to irradiation light to expose the original pattern recorded on the photographic dry plate to a substrate surface coated with a photosensitive agent.
- the exposure method includes a batch exposure method and a projection exposure method.
- a pattern on a mask exposed to parallel light is directly transferred as a 'shadow play' to an exposure substrate disposed directly below the mask.
- This method has a shallow depth of focus and a large variation in pattern width due to the gap between the mask and the substrate. And because it is 1: 1 transfer, it cannot cope with the process stretching of the substrate. Therefore, there is a limit to the adhesion performance.
- the pattern on the mask is imaged and transferred onto the exposure substrate with the projection lens interposed therebetween.
- This method has a deep depth of focus because it is a projection exposure via a lens. And for the expansion and contraction of the substrate, it is easy to cope with the 'adhesion' by changing the magnification of the lens. As the pattern becomes finer in the future, it is expected to move from the batch exposure method to the projection exposure method due to the performance limitations mentioned above.
- the present inventors coat the sacrificial layer and the pattern forming layer on the substrate having a planar structure, and then form a fine pattern on the coated pattern forming layer in large areas, and separate the pattern forming layer on which the fine pattern is transferred to adhere to the applied object.
- the present invention was completed by confirming that the fine pattern can be transferred non-planarly.
- An object of the present invention is to coat a sacrificial layer and a pattern forming layer on top of the substrate having a planar structure and then to form a large pattern on the coated pattern forming layer in a large area and to separate the pattern forming layer to which the fine pattern is transferred to the article to be applied. It is providing a method of transferring a fine pattern non-planarly by adhering.
- Another object of the present invention is to provide an article obtained by transferring a fine pattern using the above method.
- the present invention provides a non-planar area transfer method of a fine pattern comprising the following steps.
- FIG. 1 is a flowchart schematically showing a non-planar transfer method of a fine pattern of the present invention.
- Step 1 is a step of coating a sacrificial layer on a substrate having a planar structure, and first coating a sacrificial layer to be removed to separate the multilayer thin film having a fine pattern from the substrate.
- the "substrate” of the present invention is not limited as long as it is a material capable of forming a fine pattern, and by having a planar structure, it is possible to more easily implement the formation of the fine pattern.
- the substrate material include, but are not limited to, silicon, glass, and the like.
- the substrate material may be a flexible substrate, and in a preferred embodiment of the present invention, a fine pattern is formed on a ma-N Negative PR (Microresist, Germany) substrate using a laser interference exposure method.
- a material capable of exfoliation such as silicon oxide may be used as the sacrificial layer, but is not limited thereto.
- the sacrificial layer coating method may be used without limitation methods commonly used in the art, preferably may be performed by a liquid thin film deposition method, gas thin film deposition method, chemical thin film deposition method, and the like, It is not limited.
- the sacrificial layer may have a thickness of several tens of nanometers to several hundred micrometers. If thicker than the upper limit or thinner than the lower limit, there is a disadvantage in that the peeling is difficult.
- Step 2 is a step of coating the pattern forming layer on the coated sacrificial layer, the step of coating a layer on which the fine pattern can be formed on the sacrificial layer.
- a material capable of exfoliation such as polyhedral oligomeric silsesquioxane (POSS), a composite of SiO 2 and urethane, or a combination thereof may be used as the pattern forming layer material, but is not limited thereto.
- the coating method of the pattern forming layer can be used without limitation methods commonly used in the art, preferably may be carried out by a liquid thin film deposition method, gas thin film deposition method, chemical thin film deposition method, It is not limited to this.
- the thickness of the pattern forming layer may be several hundred nanometers to several hundred micrometers. If it is thicker than the upper limit, there is a disadvantage of peeling and cracking, and if it is thinner than the lower limit, there is a disadvantage of difficulty of peeling and cracking.
- Step 3 is a step of forming a fine pattern on the coated pattern forming layer using a fine pattern forming method commonly used in the art to apply a fine pattern on top of the pattern forming layer coated on the substrate having a flat structure It is a step of forming the area. That is, the present invention has the feature that a fine pattern can be formed on a large area scale.
- Laser interference exposure proceeds with an exposure process by using an interference pattern in which contrast is periodically repeated when a plurality of coherent laser lights incident from different directions meet.
- Applying a photoresist on the substrate to be processed and allowing the two diffused laser beams to enter the substrate surface at different angles results in a periodic contrast pattern on the substrate, and a bright pattern portion is photosensitive to develop the photoresist.
- a pattern is formed.
- the pattern to be formed is directly related to the wavelength of the laser light to which the period of light and darkness is incident, and the period may be represented by Equation 1 below.
- Equation 1 ⁇ is a wavelength of incident light and ⁇ is an angle between two incident lights.
- a laser interference exposure method is exemplified as a fine pattern forming method, but is not limited thereto, and other fine pattern forming methods commonly used in the art may be used.
- a conventional laser interference exposure apparatus when forming a fine pattern using the laser interference exposure method, a conventional laser interference exposure apparatus can be used.
- the light output before the laser beam diffusion may be exposed using several tens to several hundred mW, preferably 10 to 900 mW, depending on the selection of the photosensitive material and the laser type. In the embodiment of the present invention, it was exposed to 100 mW.
- step 4 the sacrificial layer is etched to separate the pattern forming layer from the substrate.
- the step of separating the pattern forming layer on which the fine pattern is transferred from the substrate is performed by etching the coated sacrificial layer.
- the separation method may use a flexible and flexible stamp such as PDMS (polydimethylsiloxane), photosensitive material, SU-8, but is not limited thereto.
- a flexible and flexible stamp such as PDMS (polydimethylsiloxane), photosensitive material, SU-8, but is not limited thereto.
- the etching method may use a dry etching or a liquid etching method.
- step 5 the separated pattern forming layer is adhered to the article to be applied, and the pattern forming layer separated from the substrate is adhered to the desired article to be applied while the fine pattern is transferred.
- the article to be applied includes, but not limited to, a flexible display device, a flexible device, a flexible electronic device, a solar cell, a building glass, or an automobile glass.
- the sacrificial layer and the pattern forming layer are coated on the substrate having the planar structure as described above, and then the fine pattern is formed on the coated pattern forming layer in a large area through a laser interference exposure method.
- the present invention also provides an article obtained by transferring a fine pattern using the non-planar transfer method of the fine pattern.
- the article includes a flexible display device, a flexible device, a flexible electronic device, a solar cell, a building glass or an automobile glass, but is not limited thereto.
- the fine pattern may be utilized as a structure that increases the light efficiency, such as light prism, light focused light, light scattering prevention.
- the present invention by coating a sacrificial layer and a pattern forming layer on a substrate having a planar structure and then forming a fine pattern on the coated pattern forming layer in a large area and by separating the pattern forming layer to which the fine pattern is transferred to adhere to the application object It is possible to effectively transfer fine patterns to various articles, in particular articles of non-planar structure.
- FIG. 1 is a flowchart schematically showing a non-planar transfer method of a fine pattern of the present invention.
- Figure 2 simply shows a fine pattern manufacturing process using a laser interference exposure method.
- 3 is an SEM image observing the surface shape of the manufactured fine pattern.
- Figure 4 is a photograph showing the appearance of the fine pattern produced.
- Figure 5 simply shows the movement of the fine pattern through the process of separation after the multilayer thin film coating.
- a silicon oxide was spin-coated as a sacrificial layer on a glass substrate, and then a POSS thin film material, which is an inorganic material, was spin-coated as a pattern forming layer.
- a 230 nm pitch fine pattern was fabricated on a ma-N Negative PR (Microresist, Germany) coated on a silicon substrate under an exposure condition of 100 mW by using a laser interference exposure method on the pattern forming layer.
- the angle between the two incident light is about 35 degrees, it was possible to form a pattern having a period of about 450nm using laser interference exposure.
- micropattern fabrication process using the laser interference exposure method is briefly illustrated in FIG. 2, and the SEM image of the surface pattern of the fabricated micropattern is illustrated in FIG. 3.
- FIG. 2 sunlight is transmitted through a substrate, and the transmitted light is transmitted to a prism sheet having a periodic fine pattern, and the beam transmitted to the periodic fine pattern is separated by wavelength by the fine pattern, and light of a specific wavelength region is Total reflection. The totally reflected light does not disappear and increases the light efficiency.
- the present invention is expected to be applicable to various articles for increasing the light efficiency.
- Figure 4 shows a photograph showing the appearance of the fine pattern produced.
- FIG. 5 briefly illustrates a process of moving a fine pattern through a process of separating the pattern forming layer.
- the pattern forming layer having the fine pattern moved from the substrate was separated to obtain a pattern forming layer having the fine pattern moved.
- the pattern forming layer obtained by moving the fine pattern obtained in Example 2 was adhered to the desired article to prepare an article on which the fine pattern was transferred.
- Example 2 by fabricating the pattern-forming layer obtained in Example 2 to the flexible substrate material by applying a mechanical adhesive and heat using a PDMS (polydimethylsiloxane) flexible material as a stamp to produce an article in which the fine pattern is transferred It was.
- PDMS polydimethylsiloxane
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Photovoltaic Devices (AREA)
- Surface Treatment Of Glass (AREA)
- Manufacturing Of Printed Wiring (AREA)
Abstract
Description
Claims (11)
- 평면 구조의 기판 상부에 희생층을 코팅시키는 단계;상기 코팅된 희생층 상부에 패턴형성층을 코팅시키는 단계;상기 코팅된 패턴형성층 상부에 미세 패턴을 형성시키는 단계;상기 희생층을 식각하여 기판으로부터 패턴형성층을 분리시키는 단계; 및상기 분리된 패턴형성층을 적용 대상 물품에 접착시키는 단계를 포함하는 미세 패턴의 비평면적 전사 방법.
- 제1항에 있어서, 상기 기판 재료는 실리콘 또는 유리인 미세 패턴의 비평면적 전사 방법.
- 제1항에 있어서, 상기 미세 패턴 형성 방법은 레이저 간섭 노광 방법인 미세 패턴의 비평면적 전사 방법.
- 제1항에 있어서, 상기 희생층의 코팅은 실리콘산화물을 사용하는 것인 미세 패턴의 비평면적 전사 방법.
- 제1항에 있어서, 상기 희생층의 코팅방법은 액상박막증착방법, 기체박막증착방법 또는 화학박막증착방법인 미세 패턴의 비평면적 전사 방법.
- 제1항에 있어서, 상기 패턴형성층 물질은 POSS(polyhedral oligomeric silsesquioxane), SiO2와 우레탄의 복합체, 또는 이의 조합인 미세 패턴의 비평면적 전사 방법.
- 제1항에 있어서, 상기 패턴형성층의 코팅 방법은 액상박막증착방법, 기체박막증착방법 또는 화학박막증착방법인 미세 패턴의 비평면적 전사 방법.
- 제1항에 있어서, 상기 미세 패턴을 레이저 간섭 노광 방법을 이용하여 형성시키는 경우 10 내지 900 mW를 사용하여 노광시키는 미세 패턴의 비평면적 전사 방법.
- 제1항에 있어서, 상기 적용 대상 물품은 유연표시소자, 플렉서블 디바이스, 유연 전자소자, 태양전지, 건물 유리 또는 자동차 유리인 미세 패턴의 비평면적 전사 방법.
- 제1항 내지 제9항 중 어느 한 항에 기재된 미세 패턴의 비평면적 전사 방법을 이용하여 미세 패턴을 전사한 물품.
- 제10항에 있어서, 상기 물품은 유연표시소자, 플렉서블 디바이스, 유연 전자소자, 태양전지, 건물 유리 또는 자동차 유리인 물품.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE112011104571T DE112011104571T5 (de) | 2010-12-24 | 2011-12-23 | Verfahren zum Ausbilden eines feinen Musters in einem großen Bereich unter Verwendung von Laser-Interferenz-Lithographie, Verfahren zum nicht-planaren Transfer des feinen Musters, ausgebildet durch das Verfahren und Artikel, an welchen das feine Muster durch das Transferverfahren transferiert ist |
| JP2013546037A JP2014507790A (ja) | 2010-12-24 | 2011-12-23 | レーザ干渉リソグラフィを用いた大面積微細パターンの製作方法、前記方法を用いて製作された微細パターンの非平面的転写方法、及びそれを用いて微細パターンを転写した物品 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2010-0134870 | 2010-12-24 | ||
| KR1020100134870A KR101385070B1 (ko) | 2010-12-24 | 2010-12-24 | 레이저간섭 노광을 이용한 대면적 미세패턴 제작 방법, 상기 방법을 이용하여 제작된 미세패턴의 비평면적 전사 방법 및 이를 이용하여 미세 패턴을 전사한 물품 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2012087075A2 true WO2012087075A2 (ko) | 2012-06-28 |
| WO2012087075A3 WO2012087075A3 (ko) | 2012-10-18 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/KR2011/010063 Ceased WO2012087075A2 (ko) | 2010-12-24 | 2011-12-23 | 레이저간섭 노광을 이용한 대면적 미세패턴 제작 방법, 상기 방법을 이용하여 제작된 미세패턴의 비평면적 전사 방법 및 이를 이용하여 미세 패턴을 전사한 물품 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP2014507790A (ko) |
| KR (1) | KR101385070B1 (ko) |
| DE (1) | DE112011104571T5 (ko) |
| WO (1) | WO2012087075A2 (ko) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20140191185A1 (en) * | 2013-01-09 | 2014-07-10 | Korea University Industrial & Academic Collaboration Foundation | Apparatus and method for fabricating nano resonator using laser interference lithography |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102203701B1 (ko) * | 2014-04-23 | 2021-01-18 | 한국생산기술연구원 | 나노입자 노출을 이용한 마이크로-나노 복합 패턴의 제조 방법 및 이를 이용한 도광판의 제조 방법 |
| KR101689153B1 (ko) * | 2015-01-28 | 2016-12-23 | 한국산업기술대학교 산학협력단 | 집속이온빔 적용 재전사가 가능한 나노 패턴 쉐도우 마스크 제조 방법 및 나노 패턴 쉐도우 마스크를 재사용하는 패턴 전사 방법 |
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| JP3360919B2 (ja) * | 1993-06-11 | 2003-01-07 | 三菱電機株式会社 | 薄膜太陽電池の製造方法,及び薄膜太陽電池 |
| KR20050075581A (ko) * | 2004-01-16 | 2005-07-21 | 엘지전자 주식회사 | 나노 임프린트용 쿼츠 스템프 제작 방법 |
| KR100631014B1 (ko) * | 2004-03-17 | 2006-10-04 | 엘지.필립스 엘시디 주식회사 | 인쇄롤 제조방법 및 이를 이용한 패턴형성방법 |
| JP4389791B2 (ja) * | 2004-08-25 | 2009-12-24 | セイコーエプソン株式会社 | 微細構造体の製造方法および露光装置 |
| JP4692136B2 (ja) * | 2005-08-08 | 2011-06-01 | 東レ株式会社 | 感光性ペースト組成物およびそれを用いたフィールドエミッションディスプレイ部材 |
| JP5177976B2 (ja) * | 2005-08-31 | 2013-04-10 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| JP2007318046A (ja) * | 2006-05-29 | 2007-12-06 | Kochi Univ Of Technology | 転写方法 |
| KR101181602B1 (ko) * | 2009-05-13 | 2012-09-10 | 한양대학교 산학협력단 | 표면 굴곡을 가지는 기판에 패턴을 형성하는 방법 |
-
2010
- 2010-12-24 KR KR1020100134870A patent/KR101385070B1/ko active Active
-
2011
- 2011-12-23 DE DE112011104571T patent/DE112011104571T5/de not_active Ceased
- 2011-12-23 JP JP2013546037A patent/JP2014507790A/ja active Pending
- 2011-12-23 WO PCT/KR2011/010063 patent/WO2012087075A2/ko not_active Ceased
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20140191185A1 (en) * | 2013-01-09 | 2014-07-10 | Korea University Industrial & Academic Collaboration Foundation | Apparatus and method for fabricating nano resonator using laser interference lithography |
| KR20140091146A (ko) * | 2013-01-09 | 2014-07-21 | 삼성전자주식회사 | 레이저 간섭 리소그래피를 이용한 나노 공진기 제작 장치 및 방법 |
| US9617146B2 (en) * | 2013-01-09 | 2017-04-11 | Samsung Electronics Co., Ltd. | Apparatus and method for fabricating nano resonator using laser interference lithography |
| KR101959334B1 (ko) * | 2013-01-09 | 2019-03-19 | 삼성전자주식회사 | 레이저 간섭 리소그래피를 이용한 나노 공진기 제작 장치 및 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2012087075A3 (ko) | 2012-10-18 |
| JP2014507790A (ja) | 2014-03-27 |
| DE112011104571T5 (de) | 2013-09-26 |
| KR101385070B1 (ko) | 2014-04-15 |
| KR20120072934A (ko) | 2012-07-04 |
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