WO2012064116A2 - Test tray for testing light-emitting diodes - Google Patents

Test tray for testing light-emitting diodes Download PDF

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Publication number
WO2012064116A2
WO2012064116A2 PCT/KR2011/008542 KR2011008542W WO2012064116A2 WO 2012064116 A2 WO2012064116 A2 WO 2012064116A2 KR 2011008542 W KR2011008542 W KR 2011008542W WO 2012064116 A2 WO2012064116 A2 WO 2012064116A2
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WO
WIPO (PCT)
Prior art keywords
led
leds
test
test tray
tray
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PCT/KR2011/008542
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French (fr)
Korean (ko)
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WO2012064116A3 (en
Inventor
이기현
심규열
홍성민
방지원
임정호
송준성
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강우테크 주식회사
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Publication of WO2012064116A2 publication Critical patent/WO2012064116A2/en
Publication of WO2012064116A3 publication Critical patent/WO2012064116A3/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
    • G01J2001/4252Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources for testing LED's
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2632Circuits therefor for testing diodes
    • G01R31/2635Testing light-emitting diodes, laser diodes or photodiodes

Definitions

  • the present invention is equipped with a plurality of LEDs in the final process to automatically test the performance of the LED produced in the manufacturing process (hereinafter referred to as "LED") at the same time the test tray for the LED test to perform the test while moving between processes (test tray).
  • LED produced in the manufacturing process
  • the flat panel displays include a liquid crystal display device (LCD), a field emission display device (FED), an electro-luminescence display device (ELD), and a PDP. (Plasma Display Panels).
  • LCD liquid crystal display device
  • FED field emission display device
  • ELD electro-luminescence display device
  • PDP Plasma Display Panels
  • liquid crystal display devices have a large contrast ratio, are suitable for gray scale display or moving image display, and have low power consumption. Therefore, the area of the liquid crystal display device is gradually expanding to notebook PCs, desktop monitors, and liquid crystal TVs.
  • liquid crystal display itself is non-luminous, it requires a separate external light source for irradiating light.
  • a back light which is a separate dimming device for emitting and guiding light on the back of the LCD panel, is necessarily required.
  • the backlight is divided into an edge type and a direct type according to a method of projecting light.
  • the edge type backlight is provided with a tubular light emitting lamp (hot cathode or cold cathode) on the side of the liquid crystal panel, and uses a transparent light guide plate to project the light from the light emitting lamp to be uniformly distributed over the entire liquid crystal panel screen.
  • the direct type backlight is a method in which light from a light emitting lamp selectively mounted on a lower portion of the liquid crystal panel is diffused by a convincing sheet provided between the light emitting lamp and the liquid crystal panel and distributed throughout the liquid crystal panel screen.
  • the edge type backlight uses a hot cathode fluorescent lamp or a cold cathode fluorescent lamp, so that the thickness of the backlight is not only high, but the lifetime of the fluorescent lamp is short and power consumption is large. Edge type backlights are drawing attention.
  • the LED array used as a light source of the edge type backlight for a liquid crystal display device is a plurality of light emitting diodes arranged in a row on a flexible printed circuit board (FPCB), and the plurality of light emitting diodes emit light from the plurality of light emitting diodes. Light is fastened to the backlight unit to be incident on one side of the light guide plate.
  • FPCB flexible printed circuit board
  • the backlight LED array of the liquid crystal display device may improve the image quality of the liquid crystal display device only when light of a constant brightness is emitted from the lens L of each LED 1, which is a light emitting diode. Therefore, in order to apply the LED array to the backlight of the liquid crystal display, it is necessary to inspect the optical characteristics through the lens L as well as the electrical characteristics of the produced LED 1. .
  • FIG 2 is a longitudinal cross-sectional view for explaining a conventional LED test method
  • Figure 3 is a plan view of Figure 2
  • Figures 4a to 4e is a process diagram for explaining the operating state according to the test of the LED
  • the finished LED (1) is
  • the LED feeder 10 is provided on one side of a bowl feeder (not shown) packed in a bulk type, and the LEDs are sequentially transferred when the finished LEDs are randomly contained in the bowl feeder. It moves to the tester side (not shown) via the apparatus 10 and sorts the good and defective items.
  • the LED conveying apparatus 10 which transfers the LED which escaped from the bowl feeder to the tester side in this way is the linear feeder 8 which has the supply path 9 which supplies LED1a, 1b, 1c on a straight line,
  • the turntable 2 provided on the outer circumference of the LED housing recess 2a, which is installed at one side of the linear feeder 8 and accommodates the LEDs 1a, 1b and 1c supplied from the linear feeder 8, is provided on the outer periphery. Consists of.
  • the straight feeder 8 and the turntable 2 are respectively arranged on the base 11, and the recesses 2a of the straight feeder 8 and the turntable 2 are covered by the cover 12. As shown in FIG.
  • the base 11 positioned below the supply passage 9 formed in the straight feeder 8 has a stopper 3 for controlling the transfer of the LED 1a positioned at the top of the LEDs positioned in the supply passage 9.
  • the separator pin (5) for pushing and stopping the LED (1b) located in the second position to the cover (12) located at the upper part of the supply path (9) is installed so as to move up and down.
  • the push pin 7 for pressing the third position LED 1c in the supply path 9 toward the front (second LED 1b side) and stopping the light is stopped. It is installed so that you can move back and forth in the photo state.
  • a light transmitting portion 6a and a light receiving portion 6b are provided to control the operation of the pin 7.
  • the light transmitting portion 6a is provided on the base 11 side, and the light receiving portion 6b is a cover 12. It is installed on the side.
  • the finished LED (1) is put into the bowl Peter as a bulk type (bulk type) and the bowl feeder is operated, the LEDs randomly contained in the bowl feeder are aligned in a constant direction to supply the LED conveying apparatus 10. Transferred to the furnace (9).
  • the stopper 3 is moved from the base 11 to the supply path 9 side by the drive control device 15.
  • the protruding LED 1a positioned at the top end is caught by the stopper 3, and the transfer is stopped. At this time, even if the vacuum is continuously applied to the suction port 4, the LED 1a at the top end is stopped. ) Is not supplied to the turntable 2 side.
  • the separator pin 5 and the push pin 7 are located at the top dead center, and the LED 1a positioned at the top is shown in FIG. 4A.
  • FIG. 3 when the light receiving part 6a and the light receiving part 6b detect the same and the separator pin 5 is lowered by the drive control device 15 to hold the LED 1b positioned secondly. Done.
  • the drive control device 15 determines that the LED 1a at the uppermost end is accommodated in the recess 2a and rotates the turntable 2 by one pitch.
  • the stopper 3 is protruded again by the drive control device 15 to the supply path 9 as shown in FIG. 4C, and then the drive control device 15 as shown in FIG. 4D.
  • the separator pin 5 is pulled into the cover 12 side to release the latch of the LED 1b located at the second position. In this case, the LED 1b floats due to the vacuum pressure, causing the separator pin 5 to rise. Since it is attached to the bottom of the), it can not be separated from the separator pin (5).
  • the turntable 2 rotates and moves toward the test unit (not shown).
  • the optical characteristics of the lens are tested to determine whether they are good or bad.
  • test method of the LED using such a conventional device has a number of problems as follows.
  • the LED with the lens is randomly placed in the bowl feeder to be moved to the supply path by vibration, so that the lens is hit by another LED or is scratched, causing scratches on the lens. Has a defect.
  • the LEDs transferred through the supply path are pressed to the separator pins and the push pins to control or separate the transfers, thereby causing a risk of damaging the lens positioned above the LEDs.
  • the LED is transferred by the vacuum pressure acting through the suction port, so that the LED hits the recess or the stopper during the transfer of the LED, causing damage to the LED, thereby deteriorating the electrical characteristics.
  • the optical characteristics of the LED is to emit light in the state that the lens is exposed to the outside, the light emitted is not focused and diffused to the outside, the quality of the optical test is deteriorated.
  • the present invention has been made in order to solve such a conventional problem, by placing a plurality of (about 60 to 240) LEDs produced in the main body of the test tray through the through-hole formed through the lens insertion space
  • the objective is to ensure accurate optical testing while protecting the lens in the process of transferring it to the lower part and transferring it between processes.
  • test tray for the LED test formed with a plurality of insertion spaces containing the LED on the upper surface of the body, by forming a through hole through the bottom of the respective insertion spaces A test tray for LED testing is provided, wherein the LED is tested in a state in which the lens of the LED contained in the insertion space is exposed downward through the through hole.
  • the present invention has several advantages over the conventional method as follows.
  • FIG. 1 is a perspective view showing the structure of a typical LED
  • Figure 2 is a longitudinal cross-sectional view for explaining a conventional LED test method
  • FIG. 3 is a plan view of FIG.
  • 4a to 4e is a process chart for explaining the operating state according to the test of the LED
  • FIG. 5 is a perspective view showing the structure of a test tray of the present invention.
  • FIG. 6 is a bottom perspective view of FIG.
  • Figure 7 is a longitudinal cross-sectional view of the LED is contained in the test tray of the present invention.
  • FIG. 8 is a perspective view showing a customer tray for loading or unloading an LED to be tested in a test tray of the present invention.
  • Figure 5 is a perspective view showing the structure of the test tray of the present invention
  • Figure 6 is a bottom perspective view of Figure 5
  • Figure 7 is a longitudinal cross-sectional view of the LED contained in the test tray of the present invention
  • the present invention is a test tray 16
  • the lens L of the LED 1 is exposed to the lower portion through the through hole 19 so that the test of the LED 1 is performed.
  • the through hole 19 formed to pass through the insertion space 18 formed in the main body 17 is the lens L formed in the LED 1 when the lens L is inserted into the insertion space 18 so as to face downward. ) May be exposed downward through the through hole 19, but it is more preferable to form a vertically lowered inclined surface 19a and a vertical surface 19b perpendicular to the inclined surface.
  • the through hole 19 may be applied only to the upper and lower sloped slopes 19a as necessary.
  • the test portion of the tester by directly containing the LED (1) so that the lens (L) is exposed to the lower portion through the through hole 19 to the insertion space 18 formed in the main body 17 of the test tray (16)
  • the LED 1 is placed in the insertion space 22 of the custom tray 21 shown in FIG. Since the LED is contained facing upwards, it is advantageous to realize the automation of the tester by moving the LED 1 contained in the customer tray 21 to the test tray 16 and then loading it into the test section.
  • the alignment means 20 is provided outside the insertion space 18 formed on the upper surface of the main body 17 constituting the test tray.
  • the aligning means 20 is formed as an integral insertion groove along the edge of the main body 17. However, if necessary, the alignment means 20 is inserted independently of the edge of the main body 17. At least two grooves (not shown) may be formed and applied.
  • the alignment means 20 is formed as an inserting projection, as opposed to an embodiment of the present invention, it is a matter of course that an insertion groove is formed along the edge of the customer tray 21 shown in FIG. 8.
  • the alignment means 20 is shown as an insertion groove in the test tray 16 of FIG. 5 as an embodiment of the present invention, and the customer tray 21 shown in FIG. 8 is shown as an insertion protrusion 23.
  • the worker manually works in the process of loading the customer tray 21 containing the plurality of LEDs 1 in the insertion space 18 to the loading unit (not shown) so that the lens L faces upward.
  • the customer tray 21 containing the LED 1 may be loaded into the loading unit one by one, but a plurality of customer trays 21 including the LED 1 in the loading unit may be stacked to realize automation of expensive equipment. More preferably, the customer trays are separated and supplied one by one.
  • the loading is performed.
  • the transfer transfer is holding the test tray 16 so that the through hole 19 formed in the test tray 16 faces upward, and then covers the test tray 16 on the customer tray 21 and then the customer tray 21.
  • the test tray 16 are simultaneously held and inverted by 180 °, so that the LED 1 contained in the insertion space 22 of the customer tray 21 is moved to the insertion space 18 of the test tray 16. Since the lens L faces downward, the lens L is exposed downward through the through hole 19 formed through the insertion space 18 as shown in FIG. 8.
  • the customer tray 21 and the test tray 16 coincide with each other in the right position by the alignment means 20 formed on the upper surface of the main body 17 of the test tray 16.
  • the loading transfer moves the two trays 16 and 21 to the test unit (not shown).
  • the test unit tests the electrical and optical characteristics of the LED 1 contained in the insertion space 18 of the test tray 16.

Abstract

The present invention relates to a test tray for testing light-emitting diodes (hereinafter, referred to as "LEDs"), which enables a plurality of LEDs to be mounted simultaneously in the test tray and tested while moving between processes in a final process that automatically tests the performance of LEDs produced in a manufacturing process. A plurality of produced LEDs (approximately 60 to 240 LEDs) are placed into a main body of the test tray such that the lenses of the LEDs are exposed downwardly via respective through-holes communicating with respective insertion spaces, and an optical test is accurately performed while safely protecting the lenses when transferring the LEDs between processes. To this end, a plurality of insertion spaces (18) for accommodating LEDs (1) are formed in the upper surface of a main body (17) of a test tray (16) for testing LEDs (1), and through-holes (19) communicating with the bottom of the main body (17) are formed in the bottoms of the respective insertion spaces (18) such that a test on LEDs (1) can be performed with the lenses (L) of the LEDs (1) accommodated in the respective insertion spaces (18) being exposed downwardly via the through-holes (19).

Description

엘이디 테스트용 테스트 트레이Test tray for LED test
본 발명은 제조공정에서 생산된 엘이디(이하 "LED"라함)의 성능을 자동으로 테스트하는 파이널 공정에서 복수 개의 LED를 동시에 탑재하여 공정간에 이동하면서 테스트를 실시할 수 있도록 하는 엘이디 테스트용 테스트 트레이(test tray)에 관한 것이다.The present invention is equipped with a plurality of LEDs in the final process to automatically test the performance of the LED produced in the manufacturing process (hereinafter referred to as "LED") at the same time the test tray for the LED test to perform the test while moving between processes ( test tray).
최근 들어, 평판표시장치에 대한 연구가 활발히 진행되고 있는데, 상기 평판표시장치는 액정표시장치(LCD; Liquid Crystal Display Device), FED(Field Emission Display Device), ELD(Electro-luminescence Display Device), PDP(Plasma Display Panels) 등으로 대별된다.Recently, researches on flat panel displays have been actively conducted. The flat panel displays include a liquid crystal display device (LCD), a field emission display device (FED), an electro-luminescence display device (ELD), and a PDP. (Plasma Display Panels).
이 중, 액정표시장치는 콘트라스트 비(contrast ratio)가 크고, 계조 표시나 동화상 표시에 적합하며 전력소비가 적다는 특징 때문에 노트북 PC, 데스크탑 모니터 및 액정TV로 그 영역이 점차 확대되고 있는 추세이다.Among these, liquid crystal display devices have a large contrast ratio, are suitable for gray scale display or moving image display, and have low power consumption. Therefore, the area of the liquid crystal display device is gradually expanding to notebook PCs, desktop monitors, and liquid crystal TVs.
그러나, 상기 액정표시장치는 그 자체가 비발광성이므로 반드시 빛을 조사하기 위한 별도의 외부광원을 필요로 한다.However, since the liquid crystal display itself is non-luminous, it requires a separate external light source for irradiating light.
특히, 투과형 액정표시장치의 경우 LCD 패널의 배면에 광을 발산하고 안내하는 별도의 조광장치인 백라이트(back light)가 반드시 필요하다.In particular, in the case of a transmissive liquid crystal display, a back light, which is a separate dimming device for emitting and guiding light on the back of the LCD panel, is necessarily required.
상기 백라이트는 광을 투사시키는 방식에 따라, 에지형 방식과 직하형 방식으로 구분된다.The backlight is divided into an edge type and a direct type according to a method of projecting light.
이 중, 에지형 백라이트는 액정패널의 측면에 관 형상의 발광 램프(열음극 또는 냉음극)를 설치하고, 투명한 도광판을 이용하여 상기 발광 램프로부터의 광을 액정패널 화면 전체에 균일하게 분포되도록 투사시키는 방식이고, 직하형 백라이트는 액정패널 하부에 선택적으로 장착된 발광 램프에서 나오는 광이 발광 램프와 액정패널 사이에 설치된 확신시트에 의해 확산되어 액정패널 화면 전체에 분포되도록 하는 방식이다.Among these, the edge type backlight is provided with a tubular light emitting lamp (hot cathode or cold cathode) on the side of the liquid crystal panel, and uses a transparent light guide plate to project the light from the light emitting lamp to be uniformly distributed over the entire liquid crystal panel screen. The direct type backlight is a method in which light from a light emitting lamp selectively mounted on a lower portion of the liquid crystal panel is diffused by a convincing sheet provided between the light emitting lamp and the liquid crystal panel and distributed throughout the liquid crystal panel screen.
그러나, 상기 에지형 백라이트에서는 열음극 형광 램프 또는 냉음극 형광 램프를 사용하므로 인하여 백라이트의 두께가 두꺼울 뿐만 아니라 형광 램프의 수명이 짧으면서도 소비 전력이 큰 단점이 있어 최근에는 발광 다이오드(LED) 어레이를 이용한 에지형 백라이트가 주목받고 있다. However, the edge type backlight uses a hot cathode fluorescent lamp or a cold cathode fluorescent lamp, so that the thickness of the backlight is not only high, but the lifetime of the fluorescent lamp is short and power consumption is large. Edge type backlights are drawing attention.
특히, 노트북용 백라이트 유닛의 경우 저전력, 고수명, 소형화 등의 장점으로 인해 액정표시장치의 백라이트 광원으로 LED의 수요가 확대되고 있는 추세이다.In particular, in the case of a notebook backlight unit, the demand for LEDs is increasing as a backlight light source of a liquid crystal display device due to advantages such as low power, high lifespan, and miniaturization.
이와 같은 액정표시장치용 에지형 백라이트의 광원으로 사용되는 LED 어레이는 유연한 회로 기판(FPCB : flexible printed circuit board)에 일 열로 복수개의 발광 다이어드를 배열한 것으로써, 상기 복수개의 발광 다이오드에서 발광된 광이 상기 도광판의 일 측면으로 입사되도록 백라이트 유닛에 체결되어 사용된다.The LED array used as a light source of the edge type backlight for a liquid crystal display device is a plurality of light emitting diodes arranged in a row on a flexible printed circuit board (FPCB), and the plurality of light emitting diodes emit light from the plurality of light emitting diodes. Light is fastened to the backlight unit to be incident on one side of the light guide plate.
이와 같은 액정표시장치의 백라이트용 LED 어레이는 도 1에 나타낸 바와 같이 각 발광 다이오드인 LED(1)의 렌즈(L)에서 일정한 방향으로 일정한 밝기의 광을 발광하여야만 액정표시장치의 화질을 향상시킬 수 있기 때문에 상기 액정표시장치의 백라이트에 상기 LED 어레이를 적용하기 위해서는 생산된 LED(1)의 전기(electric)적인 특성은 물론이고 렌즈(L)를 통한 광학(optical)적인 특성을 검사할 필요가 있다.As shown in FIG. 1, the backlight LED array of the liquid crystal display device may improve the image quality of the liquid crystal display device only when light of a constant brightness is emitted from the lens L of each LED 1, which is a light emitting diode. Therefore, in order to apply the LED array to the backlight of the liquid crystal display, it is necessary to inspect the optical characteristics through the lens L as well as the electrical characteristics of the produced LED 1. .
도 2는 종래의 LED 테스트방법을 설명하기 위한 종단면도이고 도 3은 도 2의 평면도이며 도 4a 내지 도 4e는 LED의 테스트에 따른 작동상태를 설명하기 위한 공정도로써, 생산 완료된 LED(1)가 벌크타입(bulk type)으로 담겨진 보울 피더(bowl feeder)(도시는 생략함)의 일 측에 LED 반송장치(10)를 구비하여 보울 피더에 생산 완료된 LED를 무작위로 담아 놓으면 LED가 순차적으로 LED 반송장치(10)를 통해 테스터(도시는 생략함) 측으로 이동하여 양품과 불량품으로 선별된다.Figure 2 is a longitudinal cross-sectional view for explaining a conventional LED test method, Figure 3 is a plan view of Figure 2 and Figures 4a to 4e is a process diagram for explaining the operating state according to the test of the LED, the finished LED (1) is The LED feeder 10 is provided on one side of a bowl feeder (not shown) packed in a bulk type, and the LEDs are sequentially transferred when the finished LEDs are randomly contained in the bowl feeder. It moves to the tester side (not shown) via the apparatus 10 and sorts the good and defective items.
이와 같이 보울 피더에서 빠져나온 LED를 테스터 측으로 이송시키는 LED 반송 장치(10)는 LED(1a)(1b)(1c)를 직선 상으로 공급하는 공급로(9)를 갖는 직선 피더(8)와, 상기 직선 피더(8)의 일 측에 설치되어 직선 피더(8)로부터 공급되는 LED(1a)(1b)(1c)를 수납하는 LED 수납용 오목부(2a)가 외주에 설치된 턴테이블(2)로 구성되어 있다.The LED conveying apparatus 10 which transfers the LED which escaped from the bowl feeder to the tester side in this way is the linear feeder 8 which has the supply path 9 which supplies LED1a, 1b, 1c on a straight line, The turntable 2 provided on the outer circumference of the LED housing recess 2a, which is installed at one side of the linear feeder 8 and accommodates the LEDs 1a, 1b and 1c supplied from the linear feeder 8, is provided on the outer periphery. Consists of.
상기 직선 피더(8)와 턴테이블(2)은 각각 베이스(11) 상에 배치되어 있는데, 직선 피더(8) 및 턴테이블(2)의 오목부(2a)는 커버(12)에 의해서 덮여져 있다.The straight feeder 8 and the turntable 2 are respectively arranged on the base 11, and the recesses 2a of the straight feeder 8 and the turntable 2 are covered by the cover 12. As shown in FIG.
또, 턴테이블(2)의 하부에 위치하는 베이스(11)에는 직선 피더(8)로부터 공급되는 LED(1a)(1b)(1c)를 턴테이블(2)의 오목부(2a) 내로 흡인하는 흡인구(4)가 설치되어 있는데, 상기 흡인구(4)는 도시하지 않는 진공장치에 의해서 항상 진공상태를 유지하고 있다.In addition, a suction port for sucking LEDs 1a, 1b and 1c supplied from the straight feeder 8 into the recess 2a of the turntable 2 to the base 11 positioned below the turntable 2. (4) is provided, and the suction port 4 is always kept in a vacuum state by a vacuum apparatus (not shown).
그리고 직선 피더(8)에 형성된 공급로(9)의 하부에 위치하는 베이스(11)에는 공급로(9) 내에 위치하는 LED 중 최선단에 위치하는 LED(1a)의 이송을 제어하는 스토퍼(3)가 승, 하강 가능하게 설치되어 있고 공급로(9)의 상부에 위치하는 커버(12)에는 2번째 위치하는 LED(1b)를 밀어 붙여서 정지시키는 세퍼레이터 핀(5)이 승, 하강 가능하게 설치되어 있으며 상기 세퍼레이터 핀(5)의 인근에는 공급로(9) 내의 3번째 위치하는 LED(1c)를 전방(2번째의 LED(1b)측)을 향해서 압압하여 정지시키는 푸시 핀(7)이 경사진 상태로 진퇴 가능하게 설치되어 있다.In addition, the base 11 positioned below the supply passage 9 formed in the straight feeder 8 has a stopper 3 for controlling the transfer of the LED 1a positioned at the top of the LEDs positioned in the supply passage 9. ) Is installed so as to move up and down, and the separator pin (5) for pushing and stopping the LED (1b) located in the second position to the cover (12) located at the upper part of the supply path (9) is installed so as to move up and down. In the vicinity of the separator pin 5, the push pin 7 for pressing the third position LED 1c in the supply path 9 toward the front (second LED 1b side) and stopping the light is stopped. It is installed so that you can move back and forth in the photo state.
한편, 공급로(9)와 턴테이블(2)의 사이에는 LED(1a)(1b)(1c)의 통과를 검지하여 구동제어장치(15)에 의해 스토퍼(3), 세퍼레이터 핀(5), 푸시 핀(7)의 동작을 제어할 수 있도록 투광부(6a) 및 수광부(6b)가 설치되어 있는데, 상기 투광부(6a)는 베이스(11)측에 설치되어 있고 수광부(6b)는 커버(12)측에 설치되어 있다.On the other hand, between the supply path 9 and the turntable 2, the passage of the LEDs 1a, 1b and 1c is detected and the drive control device 15 stops the stopper 3, the separator pin 5 and the push. A light transmitting portion 6a and a light receiving portion 6b are provided to control the operation of the pin 7. The light transmitting portion 6a is provided on the base 11 side, and the light receiving portion 6b is a cover 12. It is installed on the side.
따라서 전술한 바와 같이 생산 완료된 LED(1)를 보울 피터에 벌크타입(bulk type)으로 담은 다음 보울 피더를 동작시키면 보울 피더에 무작위로 담겨진 LED가 일정한 방향으로 정렬되어 LED 반송장치(10)의 공급로(9)로 이송된다.Therefore, as described above, when the finished LED (1) is put into the bowl Peter as a bulk type (bulk type) and the bowl feeder is operated, the LEDs randomly contained in the bowl feeder are aligned in a constant direction to supply the LED conveying apparatus 10. Transferred to the furnace (9).
이와 같이 테스트할 LED(1a)(1b)(1c)가 차례로 공급로(9)를 통해 이송되면 스토퍼(3)가 구동제어장치(15)에 의하여 베이스(11)로부터 공급로(9)측에 돌출되어 있어 최선단에 위치하는 LED(1a)가 스토퍼(3)에 걸려 이송이 중단되는데, 이 때 상기 흡인구(4)에 지속적으로 진공이 작용되더라도 최선단의 LED(1a)는 스토퍼(3)에 의해서 정지되어 있어 턴테이블(2)측에 공급되지 않는다.When the LEDs 1a, 1b, and 1c to be tested are transferred through the supply path 9 in turn, the stopper 3 is moved from the base 11 to the supply path 9 side by the drive control device 15. The protruding LED 1a positioned at the top end is caught by the stopper 3, and the transfer is stopped. At this time, even if the vacuum is continuously applied to the suction port 4, the LED 1a at the top end is stopped. ) Is not supplied to the turntable 2 side.
상기한 바와 같이 테스트할 LED가 공급로(9)를 통해 공급되는 과정에서는 세퍼레이터 핀(5) 및 푸시 핀(7)은 상사점에 위치되어 있다가 최선단에 위치하는 LED(1a)가 도 4a와 같이 스토퍼(3)에 걸림과 동시에 투광부(6a) 및 수광부(6b)가 이를 감지하면 구동제어장치(15)에 의해서 세퍼레이터 핀(5)이 하강하여 2번째 위치하는 LED(1b)를 홀딩하게 된다.As described above, in the process of supplying the LED to be tested through the supply path 9, the separator pin 5 and the push pin 7 are located at the top dead center, and the LED 1a positioned at the top is shown in FIG. 4A. As shown in FIG. 3, when the light receiving part 6a and the light receiving part 6b detect the same and the separator pin 5 is lowered by the drive control device 15 to hold the LED 1b positioned secondly. Done.
그 후, 도 4b에 나타낸 것과 같이 스토퍼(3)가 구동제어장치(15)에 의해서 베이스(11)측에 인입되게 하강하면 최선단에 위치되어 있던 LED(1a)가 흡인구(4)의 흡인력에 의해서 턴테이블(2)측에 흡인되어 오목부(2a)의 내부로 수납된다. Then, as shown in FIG. 4B, when the stopper 3 descends to the base 11 side by the drive control device 15, the LED 1a, which is located at the uppermost end, is attracted by the suction port 4 Is sucked by the turntable 2 side, and is accommodated in the recessed part 2a.
이와 같이 최선단의 LED(1a)가 턴테이블(2)의 오목부(2a)로 수납되면 투광부(6a)에서 발광된 빛을 수광부(6b)과 수광하여 이를 구동제어장치(15)에 보내게 되므로 구동제어장치(15)는 최선단의 LED(1a)가 오목부(2a)의 내부로 수납되었다고 판단하여 턴테이블(2)을 1피치(pitch) 회전시킨다.When the LED 1a at the uppermost end is received in the recess 2a of the turntable 2, the light emitted from the light transmitting part 6a is received by the light receiving part 6b and sent to the drive control device 15. Therefore, the drive control device 15 determines that the LED 1a at the uppermost end is accommodated in the recess 2a and rotates the turntable 2 by one pitch.
이와 같이 턴테이블(2)이 1피치 회전하고 나면 도 4c와 같이 구동제어장치(15)에 의해서 스토퍼(3)가 공급로(9)측에 재차 돌출된 다음 도 4d와 같이 구동제어장치(15)에 의해서 세퍼레이터 핀(5)이 커버(12)측으로 인입되므로 2번째 위치하는 LED(1b)의 걸림을 해제하게 되는데, 이 때에는 LED(1b)가 진공압에 의해 부상(浮上)하여 세퍼레이터 핀(5)의 저면에 부착되므로 세퍼레이터 핀(5)으로부터 떨어져나갈 수 없게 된다.After the turntable 2 rotates one pitch as described above, the stopper 3 is protruded again by the drive control device 15 to the supply path 9 as shown in FIG. 4C, and then the drive control device 15 as shown in FIG. 4D. The separator pin 5 is pulled into the cover 12 side to release the latch of the LED 1b located at the second position. In this case, the LED 1b floats due to the vacuum pressure, causing the separator pin 5 to rise. Since it is attached to the bottom of the), it can not be separated from the separator pin (5).
이러한 상태에서 도 4e에 나타낸 바와 같이 구동제어장치(15)에 의해서 푸시 핀(7)이 3번째 위치하는 LED(1c)를 2번째 위치하는 LED(1b)측에 밀어주면 3번째 위치하는 LED(1c)가 2번째 위치하는 LED(1b)를 턴테이블(2)측에 밀어 주게 되므로 2번째 위치하는 LED(1b)가 세퍼레이터 핀(5)으로부터 분리됨과 동시에 흡인구(4)로부터의 흡인력에 의해서 턴테이블(2)측에 보내져 스토퍼(3)에 걸리게 되고, 이에 따라 전술한 바와 같은 동작에 의해 턴테이블(2)의 오목부(2a)에 LED를 지속적으로 수납할 수 있게 된다.In this state, as shown in FIG. 4E, when the push pin 7 pushes the LED 1c on the third position to the LED 1b side on the second position by the drive control device 15, the LED located on the third position ( Since 1c is pushed to the turntable 2 side by the LED 1b which is 2nd-positioned, the 2nd-positioned LED 1b is isolate | separated from the separator pin 5 and at the same time by the suction force from the suction port 4 It is sent to the side (2) and caught by the stopper 3, whereby the LED can be continuously stored in the recess 2a of the turntable 2 by the above-described operation.
이와 같이 테스트할 LED(1)가 순차적으로 턴테이블(2)의 오목부(2a)에 수납된 상태에서 턴테이블(2)이 회전하여 테스트부(도시는 생략함) 측으로 이동함에 따라 테스트부에서 LED의 전기적인 특성은 물론이고 렌즈의 광학적인 특성을 테스트하여 양품 또는 불량품으로 선별하게 된다.As the LED 1 to be tested is sequentially stored in the recess 2a of the turntable 2, the turntable 2 rotates and moves toward the test unit (not shown). In addition to the electrical characteristics, the optical characteristics of the lens are tested to determine whether they are good or bad.
그러나 이러한 종래의 장치를 이용한 LED의 테스트방법은 다음과 같은 여러 가지 문제점을 갖는다.However, the test method of the LED using such a conventional device has a number of problems as follows.
첫째, 렌즈를 구비하는 LED를 보울 피더에 무작위로 넣어 진동에 의해 공급로 측으로 이송시키도록 되어 있어 렌즈가 다른 LED에 부딪히거나 찍혀 렌즈에 스크래치(scratch)가 발생되므로 LED의 품질을 떨어뜨리는 치명적인 결함을 갖는다.First, the LED with the lens is randomly placed in the bowl feeder to be moved to the supply path by vibration, so that the lens is hit by another LED or is scratched, causing scratches on the lens. Has a defect.
둘째, 공급로를 통해 이송된 LED를 세퍼레이터 핀 및 푸시 핀으로 눌러 이송을 제어하거나, 분리하도록 되어 있어 이러한 과정에서 LED의 상부에 위치하는 렌즈에 손상을 입힐 우려가 발생된다.Second, the LEDs transferred through the supply path are pressed to the separator pins and the push pins to control or separate the transfers, thereby causing a risk of damaging the lens positioned above the LEDs.
셋째, 흡인구를 통해 작용하는 진공압에 의해 LED를 이송시키도록 되어 있어 LED의 이송간에 LED가 오목부 또는 스토퍼에 부딪혀 LED에 데미지(demage)를 입히게 되므로 전기적인 특성이 떨어지게 된다.Third, the LED is transferred by the vacuum pressure acting through the suction port, so that the LED hits the recess or the stopper during the transfer of the LED, causing damage to the LED, thereby deteriorating the electrical characteristics.
넷째, LED의 광학적인 특성을 테스트하는 과정에서 렌즈가 외부로 노출된 상태에서 빛을 발광하도록 되어 있어 발광된 빛이 집광되지 않고 외부로 확산되므로 광학테스트의 품질이 떨어지게 된다.Fourth, in the process of testing the optical characteristics of the LED is to emit light in the state that the lens is exposed to the outside, the light emitted is not focused and diffused to the outside, the quality of the optical test is deteriorated.
본 발명은 이와 같은 종래의 문제점을 해결하기 위해 안출한 것으로써, 생산 완료된 복수 개(대략 60 ∼ 240개정도)의 LED를 테스트 트레이의 본체에 담으면 렌즈가 삽입공간과 통하여지게 형성된 통공을 통해 하부로 노출되도록 하여 공정간에 이송시키는 과정에서 렌즈를 안전하게 보호하면서 광학적인 테스트를 정확하게 실시할 수 있도록 하는데 그 목적이 있다.The present invention has been made in order to solve such a conventional problem, by placing a plurality of (about 60 to 240) LEDs produced in the main body of the test tray through the through-hole formed through the lens insertion space The objective is to ensure accurate optical testing while protecting the lens in the process of transferring it to the lower part and transferring it between processes.
상기 목적을 달성하기 위한 본 발명의 형태에 따르면, 본체의 상면에 LED가 담겨지는 복수 개의 삽입공간이 형성된 엘이디 테스트용 테스트 트레이에 있어서, 상기 각 삽입공간의 저면에 하부와 통하여지는 통공을 형성하여 상기 삽입공간에 담겨진 LED의 렌즈가 통공을 통해 하부로 노출되도록 한 상태에서 LED의 테스트가 이루어지도록 하는 것을 특징으로 하는 엘이디 테스트용 테스트 트레이가 제공된다.According to an aspect of the present invention for achieving the above object, in the test tray for the LED test formed with a plurality of insertion spaces containing the LED on the upper surface of the body, by forming a through hole through the bottom of the respective insertion spaces A test tray for LED testing is provided, wherein the LED is tested in a state in which the lens of the LED contained in the insertion space is exposed downward through the through hole.
본 발명은 종래의 방법에 비하여 다음과 같은 여러 가지 장점을 갖는다.The present invention has several advantages over the conventional method as follows.
첫째, 여러 개의 LED를 테스트 트레이에 담아 테스트부에서 테스트를 실시하므로 LED의 렌즈에 스크래치(scratch)가 발생되는 현상을 근본적으로 해소할 수 있게 된다.First, since several LEDs are put in a test tray and tested by the test unit, it is possible to fundamentally solve a phenomenon in which scratches are generated on the lenses of the LEDs.
둘째, LED가 테스트 트레이에 안전하게 담겨진 상태로 공정간에 이송되므로 LED의 이송에 따른 렌즈의 손상은 물론이고 데미지를 방지하게 된다.Second, since the LED is safely transferred to the test tray between processes, damage to the lens as well as damage due to the LED transfer is prevented.
셋째, LED의 광학적인 특성을 테스트하는 과정에서 삽입공간과 통하여지도록 형성된 통공을 통해 집광되어 외부로 확산되지 않으므로 광학테스트의 품질을 높일 수 있게 된다.Third, in the process of testing the optical characteristics of the LED is condensed through the hole formed to be through the insertion space and is not diffused to the outside can improve the quality of the optical test.
도 1은 일반적인 LED의 구조를 나타낸 사시도1 is a perspective view showing the structure of a typical LED
도 2는 종래의 LED 테스트방법을 설명하기 위한 종단면도Figure 2 is a longitudinal cross-sectional view for explaining a conventional LED test method
도 3은 도 2의 평면도3 is a plan view of FIG.
도 4a 내지 도 4e는 LED의 테스트에 따른 작동상태를 설명하기 위한 공정도4a to 4e is a process chart for explaining the operating state according to the test of the LED
도 5는 본 발명의 테스트 트레이의 구조를 나타낸 사시도5 is a perspective view showing the structure of a test tray of the present invention;
도 6은 도 5의 저면 사시도 6 is a bottom perspective view of FIG.
도 7은 본 발명의 테스트 트레이에 LED가 담겨진 상태의 종단면도Figure 7 is a longitudinal cross-sectional view of the LED is contained in the test tray of the present invention
도 8은 본 발명의 테스트 트레이에 테스트할 LED를 로딩하거나, 언로딩하기 위한 고객 트레이를 나타낸 사시도8 is a perspective view showing a customer tray for loading or unloading an LED to be tested in a test tray of the present invention.
이하, 본 발명을 일 실시예로 도시한 도 5 내지 도 8을 참고하여 더욱 상세히 설명하면 다음과 같다.Hereinafter, the present invention will be described in more detail with reference to FIGS. 5 to 8 as an embodiment.
도 5는 본 발명의 테스트 트레이의 구조를 나타낸 사시도이고 도 6은 도 5의 저면 사시도이며 도 7은 본 발명의 테스트 트레이에 LED가 담겨진 상태의 종단면도로써, 본 발명은 테스트 트레이(16)를 구성하는 본체(17)의 상면에 LED(1)가 담겨지는 복수 개의 삽입공간(18)이 되어 있고 상기 각 삽입공간(18)의 저면에는 하부와 통하여지는 통공(19)이 형성되어 있어 상기 삽입공간(18)에 LED(1)를 담으면 LED(1)의 렌즈(L)가 통공(19)을 통해 하부로 노출되도록 한 상태에서 LED(1)의 테스트가 이루어지도록 하는데 그 특징이 있다.Figure 5 is a perspective view showing the structure of the test tray of the present invention, Figure 6 is a bottom perspective view of Figure 5 and Figure 7 is a longitudinal cross-sectional view of the LED contained in the test tray of the present invention, the present invention is a test tray 16 There is a plurality of insertion spaces 18 into which the LEDs 1 are contained on the upper surface of the main body 17, and a through hole 19 through the lower portion is formed on the bottom of each of the insertion spaces 18. When the LED 1 is contained in the space 18, the lens L of the LED 1 is exposed to the lower portion through the through hole 19 so that the test of the LED 1 is performed.
상기 본체(17)에 형성된 삽입공간(18)과 통하여지도록 형성되는 통공(19)은 삽입공간(18)으로 렌즈(L)가 하부를 향하도록 담았을 때 상기 LED(1)에 형성된 렌즈(L)가 통공(19)을 통해 하부로 노출되도록 하면 족하나, 상협하광된 경사면(19a) 및 상기 경사면으로부터 수직하는 수직면(19b)으로 형성하는 것이 보다 바람직하다.The through hole 19 formed to pass through the insertion space 18 formed in the main body 17 is the lens L formed in the LED 1 when the lens L is inserted into the insertion space 18 so as to face downward. ) May be exposed downward through the through hole 19, but it is more preferable to form a vertically lowered inclined surface 19a and a vertical surface 19b perpendicular to the inclined surface.
이는, LED(1)의 광학적인 테스트하는 과정에서 렌즈(L)로부터 빛을 발광하면 발광된 빛이 상협하광된 경사면(19a)으로 확산되었다가 수직면(19b)으로 인해 집광되도록 하여 LED의 광학테스트의 품질을 향상시킬 수 있도록 하기 위한 것이다.This means that when the light is emitted from the lens L during the optical test process of the LED 1, the emitted light is diffused to the vertically lowered inclined surface 19a and condensed by the vertical surface 19b. It is to help improve the quality of the.
그러나, 필요에 따라 통공(19)을 상형하광된 경사면(19a)만으로 적용할 수 있음은 이해 가능한 것이다.However, it is understood that the through hole 19 may be applied only to the upper and lower sloped slopes 19a as necessary.
한편, 상기 테스트 트레이(16)의 본체(17)에 형성된 삽입공간(18)으로 렌즈(L)가 통공(19)을 통해 하부로 노출되도록 LED(1)를 직접 담아 테스터의 테스트부(도시는 생략함)로 로딩(loading)하여도 되지만, LED(1)의 생산공정에서는 LED(1)가 도 8에 도시한 고객 트레이(custom tray)(21)의 삽입공간(22)에 렌즈(L)가 상부를 향하도록 담겨져 있기 때문에 고객 트레이(21)에 담겨진 LED(1)를 테스트 트레이(16)로 옮긴 다음 테스트부로 로딩하는 것이 테스터의 자동화 실현에 유리하다.On the other hand, the test portion of the tester by directly containing the LED (1) so that the lens (L) is exposed to the lower portion through the through hole 19 to the insertion space 18 formed in the main body 17 of the test tray (16) In the production process of the LED 1, the LED 1 is placed in the insertion space 22 of the custom tray 21 shown in FIG. Since the LED is contained facing upwards, it is advantageous to realize the automation of the tester by moving the LED 1 contained in the customer tray 21 to the test tray 16 and then loading it into the test section.
따라서 고객 트레이(21)의 삽입공간(22)에 담겨진 LED(1)를 테스트 트레이(16)의 삽입공간(18)으로 옮기기 위해서는 고객 트레이(21)의 상면에 테스트 트레이(16)를 뒤집어 덮은 다음 고객 트레이(21) 및 테스트 트레이(16)를 동시에 180ㅀ반전시켜 고객 트레이(21)의 삽입공간(22)에 있던 LED(1)가 테스트 트레이(16)의 삽입공간(18)에 담기도록 하여야 된다.Therefore, in order to move the LED 1 contained in the insertion space 22 of the customer tray 21 to the insertion space 18 of the test tray 16, cover the test tray 16 on the upper surface of the customer tray 21 upside down. The customer tray 21 and the test tray 16 are simultaneously inverted by 180 도록 so that the LED 1 in the insertion space 22 of the customer tray 21 is contained in the insertion space 18 of the test tray 16. do.
이와 같이 고객 트레이(21)에 담겨진 LED(1)를 테스트 트레이(16)로 안전하고도 정확하게 옮기거나, 테스트 트레이(16)에 담겨져 테스트가 완료된 LED(1)를 고객 트레이(21)에 옮기기 위해서는 테스트 트레이를 구성하는 본체(17)의 상면에 형성되는 삽입공간(18)의 외측으로 얼라인수단(align means)(20)을 구비하는 것이 보다 바람직하다.In this way, to safely and accurately transfer the LED (1) contained in the customer tray 21 to the test tray 16, or to move the LED (1), which is contained in the test tray 16, the test is completed to the customer tray 21 More preferably, the alignment means 20 is provided outside the insertion space 18 formed on the upper surface of the main body 17 constituting the test tray.
상기 얼라인수단(20)을 본 발명의 일 실시예에서는 도 5에 나타낸 바와 같이 본체(17)의 가장자리를 따라 일체형의 삽입홈으로 형성하였으나, 필요에 따라서는 본체(17)의 가장자리에 독립된 삽입홈(도시는 생략함)을 최소한 2개소 이상 형성하여 적용할 수도 있다.In one embodiment of the present invention, the aligning means 20 is formed as an integral insertion groove along the edge of the main body 17. However, if necessary, the alignment means 20 is inserted independently of the edge of the main body 17. At least two grooves (not shown) may be formed and applied.
그러나 상기 얼라인수단(20)을 본 발명의 일 실시예와는 반대로 삽입돌기로 형성할 경우에는 도 8에 나타낸 고객 트레이(21)의 가장자리를 따라 삽입홈을 형성함은 당연한 사실이다.However, when the alignment means 20 is formed as an inserting projection, as opposed to an embodiment of the present invention, it is a matter of course that an insertion groove is formed along the edge of the customer tray 21 shown in FIG. 8.
본 발명의 일 실시예로 나타낸 도 5의 테스트 트레이(16)에 얼라인수단(20)이 삽입홈으로 도시되어 있어 도 8에 나타낸 고객 트레이(21)에는 삽입돌기(23)로 나타내었다.The alignment means 20 is shown as an insertion groove in the test tray 16 of FIG. 5 as an embodiment of the present invention, and the customer tray 21 shown in FIG. 8 is shown as an insertion protrusion 23.
이와 같이 구성된 본 발명의 테스트 트레이(16)를 이용하여 테스트하는 과정에 대하여 보다 구체적으로 설명하면 다음과 같다.Referring to the process of testing using the test tray 16 of the present invention configured as described above in more detail as follows.
먼저, 렌즈(L)가 상부를 향하도록 복수 개의 LED(1)가 삽입공간(18)에 담긴 고객 트레이(21)를 로딩부(도시는 생략함)에 로딩(loading)시키는 과정에서 작업자가 수작업으로 LED(1)가 담긴 고객 트레이(21)를 1개씩 로딩부에 로딩하여도 되지만, 고가 장비의 자동화가 실현될 수 있도록 로딩부에 LED(1)가 담긴 고객 트레이(21)를 복수 개 적층하여 고객 트레이를 순차적으로 1개씩 분리하여 공급하는 것이 보다 바람직하다.First, the worker manually works in the process of loading the customer tray 21 containing the plurality of LEDs 1 in the insertion space 18 to the loading unit (not shown) so that the lens L faces upward. The customer tray 21 containing the LED 1 may be loaded into the loading unit one by one, but a plurality of customer trays 21 including the LED 1 in the loading unit may be stacked to realize automation of expensive equipment. More preferably, the customer trays are separated and supplied one by one.
상기 로딩부에 적층되어 있던 고객 트레이(21) 중 최상부 또는 최하부에 위치하는 고객 트레이(21)를 자동으로 1개씩 분리하여 공지의 이송수단(도시는 생략함)을 이용하여 로딩 포지션으로 이송시키면 로딩 트랜스퍼(loading transfer)가 테스트 트레이(16)에 형성된 통공(19)이 상부를 향하도록 테스트 트레이(16)를 홀딩하고 있다가 테스트 트레이(16)를 고객 트레이(21)에 덮은 다음 고객 트레이(21) 및 테스트 트레이(16)를 동시에 홀딩하여 180ㅀ반전시킴으로써, 고객 트레이(21)의 삽입공간(22)에 담겨져 있던 LED(1)가 테스트 트레이(16)의 삽입공간(18)으로 옮겨짐과 동시에 렌즈(L)가 하부를 향하므로 도 8과 같이 삽입공간(18)과 통하여지게 형성된 통공(19)을 통해 하부로 노출된다.If the customer tray 21 located at the top or bottom of the customer tray 21 stacked on the loading unit is automatically separated one by one and transferred to a loading position using a known transfer means (not shown), the loading is performed. The transfer transfer is holding the test tray 16 so that the through hole 19 formed in the test tray 16 faces upward, and then covers the test tray 16 on the customer tray 21 and then the customer tray 21. ) And the test tray 16 are simultaneously held and inverted by 180 °, so that the LED 1 contained in the insertion space 22 of the customer tray 21 is moved to the insertion space 18 of the test tray 16. Since the lens L faces downward, the lens L is exposed downward through the through hole 19 formed through the insertion space 18 as shown in FIG. 8.
이 때, 상기 고객 트레이(21) 및 테스트 트레이(16)는 테스트 트레이(16)의 본체(17) 상면에 형성된 얼라인수단(20)에 의해 정 위치에서 상호 일치된다.At this time, the customer tray 21 and the test tray 16 coincide with each other in the right position by the alignment means 20 formed on the upper surface of the main body 17 of the test tray 16.
이와 같은 동작으로 고객 트레이(21)에 담겨져 있던 LED(1)를 테스트 트레이(16)로 옮기고 나면 로딩 트랜스퍼가 2개의 트레이(16)(21)를 테스트부(도시는 생략함) 측으로 이동한 다음 상부에 위치된 고객 트레이(21)만을 제거함으로써, 테스트부에서 테스트 트레이(16)의 삽입공간(18)에 담겨져 있던 LED(1)의 전기적인 특성 및 광학적인 특성을 테스트하게 된다.After moving the LED 1 contained in the customer tray 21 to the test tray 16 in this manner, the loading transfer moves the two trays 16 and 21 to the test unit (not shown). By removing only the customer tray 21 located in the upper portion, the test unit tests the electrical and optical characteristics of the LED 1 contained in the insertion space 18 of the test tray 16.
상기한 바와 같이 LED(1)의 테스트를 하는 과정에서 테스트 트레이(16)의 상부로 노출되는 LED(1)의 단자(도시는 생략함)를 이용하여 전기적인 특성을 테스트하는 동안 통공(19)을 통해 하부를 향하고 있는 렌즈(L)에서는 전원의 인가에 따라 빛을 발광하게 된다.As described above, through the test of the electrical characteristics by using the terminal (not shown) of the terminal of the LED 1 exposed to the upper portion of the test tray 16 in the process of testing the LED (1) 19 Through the lens (L) facing downward through the light will be emitted according to the application of power.
상기 렌즈(L)에서 발광된 빛은 통공(19)의 경사면(19a)을 따라 확산되다가 수직면(19b)에서 집광되므로 보다 렌즈(L)의 정확한 광학적인 테스트가 이루어지게 된다.Since the light emitted from the lens L diffuses along the inclined surface 19a of the through hole 19 and is focused on the vertical surface 19b, more accurate optical test of the lens L is performed.
한편, 설정된 시간동안 테스트 트레이(16)의 삽입공간(18)에 담겨져 있던 LED(1)의 테스트가 이루어지고 나면 테스트부로부터 테스트 트레이(16)를 언로딩하여 테스트 트레이(16)의 삽입공간(18)에 담겨져 있던 LED(1)를 고객 트레이(21)의 삽입공간(22)으로 옮기게 되는데, 이러한 과정은 전술한 바와는 반대로 이루어지게 되므로 이에 대한 구체적인 설명은 생략하기로 한다.On the other hand, after the test of the LED (1) contained in the insertion space 18 of the test tray 16 for a predetermined time is made, by unloading the test tray 16 from the test unit inserting space of the test tray 16 ( The LED 1 contained in 18) is moved to the insertion space 22 of the customer tray 21. Since this process is performed in the opposite manner as described above, a detailed description thereof will be omitted.
본 발명의 기술사상은 상기한 바람직한 실시예에 따라 구체적으로 기술되었으나, 전술한 실시예들은 그 설명을 위한 것이며, 그 제한을 위한 것이 아님을 주의하여야 한다.Although the technical spirit of the present invention has been described in detail according to the above-described preferred embodiment, it should be noted that the above-described embodiments are for the purpose of description and not of limitation.
또한, 본 발명의 기술분야에서 통상의 전문가라면 본 발명의 기술사상의 범위 내에서 다양하게 변화하여 실시할 수 있음은 이해 가능한 것이다.In addition, it will be understood by those skilled in the art that various changes can be made within the scope of the technical idea of the present invention.

Claims (5)

  1. 테스트 트레이(16)를 구성하는 본체(17)의 상면에 LED(1)가 담겨지는 복수 개의 삽입공간(18)이 형성된 엘이디 테스트용 트레이에 있어서, 상기 각 삽입공간(18)에 통공(19)을 형성하여 상기 삽입공간(18)에 담겨진 LED(1)의 렌즈(L)가 통공(19)을 통해 노출되도록 한 상태에서 LED(1)의 테스트가 이루어지도록 하는 것을 특징으로 하는 엘이디 테스트용 트레이.In the LED test tray having a plurality of insertion spaces 18 in which the LEDs 1 are contained on the upper surface of the main body 17 constituting the test tray 16, the through hole 19 in each of the insertion spaces 18 LED test tray, characterized in that the test of the LED (1) is made in a state in which the lens (L) of the LED (1) contained in the insertion space 18 is exposed through the through hole (19) .
  2. 청구항 1에 있어서,The method according to claim 1,
    상기 통공(19)은 상협하광된 경사면(19a) 및 상기 경사면으로부터 수직하는 수직면(19b)으로 형성된 것을 특징으로 하는 엘이디 테스트용 트레이.The through hole (19) is characterized in that the upper and lowered inclined surface (19a) and the vertical test (19b) perpendicular to the inclined surface characterized in that the LED test tray.
  3. 청구항 1에 있어서,The method according to claim 1,
    상기 본체(17)의 상면에 형성되는 삽입공간(18)의 외측으로 얼라인수단(20)이 구비된 것을 특징으로 하는 엘이디 테스트용 트레이.Led test tray, characterized in that the alignment means 20 is provided on the outside of the insertion space (18) formed on the upper surface of the main body (17).
  4. 청구항 3에 있어서,The method according to claim 3,
    상기 얼라인수단(20)이 본체(17)의 가장자리를 따라 일체로 형성된 것을 특징으로 하는 엘이디 테스트용 트레이.LED alignment tray characterized in that the alignment means 20 is formed integrally along the edge of the main body (17).
  5. 청구항 3 또는 청구항 4에 있어서,The method according to claim 3 or 4,
    상기 얼라인수단(20)이 삽입돌기 또는 삽입홈인 것을 특징으로 하는 엘이디 테스트용 트레이.LED test tray, characterized in that the alignment means 20 is an insertion protrusion or insertion groove.
PCT/KR2011/008542 2010-11-10 2011-11-10 Test tray for testing light-emitting diodes WO2012064116A2 (en)

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