WO2011014027A2 - Cleaning fluid composition and a cleaning method for a panel using the same - Google Patents

Cleaning fluid composition and a cleaning method for a panel using the same Download PDF

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Publication number
WO2011014027A2
WO2011014027A2 PCT/KR2010/005002 KR2010005002W WO2011014027A2 WO 2011014027 A2 WO2011014027 A2 WO 2011014027A2 KR 2010005002 W KR2010005002 W KR 2010005002W WO 2011014027 A2 WO2011014027 A2 WO 2011014027A2
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WIPO (PCT)
Prior art keywords
group
cleaning liquid
liquid composition
cleaning
panel display
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PCT/KR2010/005002
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French (fr)
Korean (ko)
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WO2011014027A3 (en
Inventor
홍형표
홍헌표
김태희
박면규
윤효중
김병묵
Original Assignee
동우 화인켐 주식회사
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Priority claimed from KR1020090069506A external-priority patent/KR20110011996A/en
Priority claimed from KR1020090069505A external-priority patent/KR20110011995A/en
Priority claimed from KR1020090073683A external-priority patent/KR20110016136A/en
Application filed by 동우 화인켐 주식회사 filed Critical 동우 화인켐 주식회사
Priority to CN201080038438.9A priority Critical patent/CN102639686B/en
Priority to JP2012522766A priority patent/JP5890306B2/en
Publication of WO2011014027A2 publication Critical patent/WO2011014027A2/en
Publication of WO2011014027A3 publication Critical patent/WO2011014027A3/en

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    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D3/00Other compounding ingredients of detergent compositions covered in group C11D1/00
    • C11D3/16Organic compounds
    • C11D3/26Organic compounds containing nitrogen
    • C11D3/28Heterocyclic compounds containing nitrogen in the ring
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/32Organic compounds containing nitrogen
    • C11D7/3281Heterocyclic compounds

Definitions

  • the present invention relates to a cleaning liquid composition and a cleaning method using the same.
  • the present invention relates to Korean Patent Application Nos. 10-2009-0069505 and 10-2009-0069506 filed to the Korean Patent Office on July 29, 2009, and Korean Patent Application No. Claims the benefit of the filing date of 10-2009-0073683, the entire contents of which are incorporated herein.
  • a flat panel display device (hereinafter referred to as "FPD") represented by a liquid crystal display device, like a semiconductor device, is manufactured through a process such as film formation, exposure and etching.
  • FPD flat panel display device
  • very small particles having a size of 1 ⁇ m or less of various organic materials or inorganic materials may be attached to the surface of the substrate.
  • pinholes or pits of the film, disconnection or bridges of the wires are generated, and the production yield of the product is lowered.
  • Japanese Laid-Open Patent Publication No. 2005-154558 proposes a cleaning liquid containing H 3 PO 4 , HF, ammonia, and / or an amine.
  • the cleaning liquid of this patent cannot be used for cleaning FPD substrates because it contains a glass substrate, which is the most representative FPD substrate, and HF, which intensively etches Al, the most representative wiring material.
  • Japanese Patent Application Laid-Open No. 2000-232063 proposes to use phosphoric acid and ammonium phosphate as corrosion inhibitors.
  • this patent is for removing resist residues and the pH of the composition is in the acidic range.
  • Korean Patent Publication No. 10-0574607 proposes a cleaning solution containing deionized water, an organic compound and an ammonium compound in an acidic pH environment.
  • the cleaning solution of this patent is an acidic solution, the removal ability of very small particles having a size of 1 ⁇ m or less, such as organic or inorganic substances, which is a basic characteristic of the initial stage of cleaning, is not excellent.
  • Korean Patent Publication No. 10-0574607 proposes a cleaning solution containing deionized water, an organic compound and an ammonium compound in an acidic pH environment.
  • the cleaning solution of this patent is an acidic solution, the removal ability of very small particles having a size of 1 ⁇ m or less, such as organic or inorganic substances, which is a basic characteristic of the initial stage of cleaning, is not excellent.
  • 10-0599849 discloses an organic acid such as urea and / or an alkaline component such as urea urea, quaternary ammonium hydroxide, ammonia, citric acid (CITRIC ACID), malic acid (MALIC ACID), and tartaric acid (TARTARIC ACID). And / or a salt thereof, and a washing liquid containing residual deionized distilled water.
  • the cleaning solution of this patent may cause the problem of precipitation of urea or ethylene urea with prolonged use.
  • An object of the present invention is to provide a cleaning liquid composition suitable for removing particles such as organic or inorganic substances present on a substrate used in a flat panel display.
  • the present invention relates to a total weight of the composition, (a) 0.05 to 5% by weight of an amine compound represented by any one of the following Formulas 1 to 5; (b) 0.01 to 10% by weight of an additive including one or two or more selected from the group consisting of an azole compound, an alkanol amine salt, and a reducing agent; And (c) provides a cleaning liquid composition for a flat panel display comprising a residual amount of water.
  • R 1 , R 4 , and R 5 are each independently a C 1 to C 10 linear or branched alkylene group
  • R 2 , R 3 , and R 6 are each independently hydrogen, a C 1 to C 10 straight or branched alkyl group,
  • R 7, R 8, R 10 are each independently hydrogen, C 1 ⁇ C 10 straight-chain or branched-chain alkyl group, C 6 ⁇ C 10 aryl group, C 1 ⁇ a C 10 linear or branched alkyl group, C 1 and - a C 10 straight or branched chain hydroxyalkyl group, C 1 ⁇ C 10 straight or branched chain of an alkyl benzene group or an amino group,
  • R 9 and R 11 are hydrogen, a C 1 to C 10 straight or branched alkyl group, C 6 to C 10 aryl group, C 1 to C 10 straight or branched chain alkylamino group or amino group,
  • R 12 is a C 1 to C 4 straight or branched hydroxyalkyl group, or C 1 to C 4 straight or branched thiolalkyl group,
  • R 13 and R 14 are each independently a C 1 to C 5 straight or branched chain alkyl group, C 1 to C 4 straight or branched chain hydroxyalkyl group, C 6 to C 10 aryl group or C 1 to C 4 An alkoxyalkyl group, R 13 and R 14 may combine to form a heterocycle,
  • n 1 and n 3 are each independently an integer of 0 or 1
  • n 2 and n 4 are each independently an integer of 0 to 4,
  • n 5 is an integer of 1 or 2
  • n 6 is an integer from 1 to 4,
  • n 7 is an integer of 0 to 4,
  • X 1 is S, O or N
  • X 3 is CH or N
  • Y is a hydroxyl group or an amino group.
  • the present invention provides a method for cleaning a flat panel display using the cleaning liquid composition.
  • the cleaning liquid composition of the present invention is excellent in the ability to remove particles such as organic or inorganic substances present on the surface of the substrate used in the flat panel display device.
  • the cleaning liquid composition of the present invention is excellent in the anti-corrosion effect on the wiring including copper and the wiring including aluminum located on the substrate.
  • the cleaning liquid composition of the present invention contains a large amount of water is easy to handle and environmentally friendly.
  • 1 is a photograph showing a glass substrate contaminated with organic sign pen marks among organic contaminants.
  • FIG. 2 is a photograph showing a result of removing the organic sign pen marks shown in FIG. 1 by using the cleaning solution composition of Example 16.
  • FIG. 2 is a photograph showing a result of removing the organic sign pen marks shown in FIG. 1 by using the cleaning solution composition of Example 16.
  • FIG. 3 is a photograph showing a glass substrate contaminated with human fingerprints among organic contaminants.
  • Figure 4 is a photograph showing the result of removing the fingerprint component of the person shown in Figure 3 using the cleaning liquid composition according to Example 16.
  • FIG. 5 is a photograph showing a glass substrate contaminated with an organic sign pen mark among organic contaminants.
  • FIG. 6 is a photograph showing a result of removing the organic sign pen marks shown in FIG. 5 using the cleaning liquid composition of Example 32.
  • FIG. 6 is a photograph showing a result of removing the organic sign pen marks shown in FIG. 5 using the cleaning liquid composition of Example 32.
  • FIG. 7 is a photograph showing a glass substrate contaminated with human fingerprints among organic contaminants.
  • Example 8 is a photograph showing the result of removing the fingerprint component of the person shown in FIG. 6 by using the cleaning liquid composition according to Example 32.
  • FIG. 9 is a photograph showing a glass substrate contaminated with organic sign pen marks among organic contaminants.
  • FIG. 10 is a photograph showing the result of removing the organic sign pen marks shown in FIG. 9 using the cleaning solution composition of Example 51.
  • FIG. 10 is a photograph showing the result of removing the organic sign pen marks shown in FIG. 9 using the cleaning solution composition of Example 51.
  • FIG. 11 is a photograph showing a glass substrate contaminated with a human fingerprint of organic contaminants.
  • FIG. 12 is a photograph showing the result of removing the fingerprint component of the person shown in FIG. 11 using the cleaning liquid composition according to Example 51.
  • FIG. 12 is a photograph showing the result of removing the fingerprint component of the person shown in FIG. 11 using the cleaning liquid composition according to Example 51.
  • the cleaning liquid composition for a flat panel display device of this invention contains (a) an amine compound, (b) additive, and (c) water.
  • the (a) amine compound included in the cleaning liquid composition for a flat panel display of the present invention is represented by any one of the following Chemical Formulas 1 to 5.
  • R 1 , R 4 , and R 5 are each independently a C 1 to C 10 linear or branched alkylene group
  • R 2 , R 3 , and R 6 are each independently hydrogen, a C 1 to C 10 straight or branched alkyl group,
  • R 7, R 8, R 10 are each independently hydrogen, C 1 ⁇ C 10 straight-chain or branched-chain alkyl group, C 6 ⁇ C 10 aryl group, C 1 ⁇ a C 10 linear or branched alkyl group, C 1 and - a C 10 straight or branched chain hydroxyalkyl group, C 1 ⁇ C 10 straight or branched chain of an alkyl benzene group or an amino group,
  • R 9 and R 11 are hydrogen, a C 1 to C 10 straight or branched alkyl group, C 6 to C 10 aryl group, C 1 to C 10 straight or branched chain alkylamino group or amino group,
  • R 12 is a C 1 to C 4 straight or branched hydroxyalkyl group, or C 1 to C 4 straight or branched thiolalkyl group,
  • R 13 and R 14 are each independently a C 1 to C 5 straight or branched chain alkyl group, C 1 to C 4 straight or branched chain hydroxyalkyl group, C 6 to C 10 aryl group or C 1 to C 4 An alkoxyalkyl group, R 13 and R 14 may combine to form a heterocycle,
  • n 1 and n 3 are each independently an integer of 0 or 1
  • n 2 and n 4 are each independently an integer of 0 to 4,
  • n 5 is an integer of 1 or 2
  • n 6 is an integer from 1 to 4,
  • n 7 is an integer of 0 to 4,
  • X 1 is S, O or N
  • X 3 is CH or N
  • Y is a hydroxyl group or an amino group.
  • the (a) amine compound is preferably contained in 0.05 to 5% by weight, 0.1 to 3% by weight based on the total weight of the composition. If it is included in less than the above-described range, it is not possible to implement a sufficient cleaning effect. When included in excess of the above-mentioned range, the activity in the cleaning liquid is lowered to reduce the particle removal effect or to increase corrosion to the wiring including copper or the wiring including aluminum.
  • the amine compound represented by Formula 1 is N- (2-hydroxyethyl) piperazine, N- (2-hydroxypropyl) piperazine, N- (2-hydroxybutyl) piperazine, 1- (2- Hydroxyethyl) -4-methylpiperazine, 1- (2-hydroxypropyl) -4-methylpiperazine, 1- (2-hydroxybutyl) -4-methylpiperazine, 1- (2-hydroxy Ethyl) -4-ethylpiperazine, 1- (2-hydroxyethyl) -4-propylpiperazine, 1- (2-hydroxyethyl) -4-butylpiperazine, 1- (2-hydroxypropyl) -4-methylpiperazine, 1- (2-hydroxypropyl) -4-ethylpiperazine, 1- (2-hydroxypropyl) -4-propylpiperazine, 1- (2-hydroxypropyl) -4 -Butyl piperazine, 1- (2-hydroxybutyl) -4-methylpiperazine, 1- (2-hydroxybutyl)
  • the compound represented by Chemical Formula 2 is preferably selected from the group consisting of 1,4-piperazinediethanol (1,4-Piperazinediethanol) and 1,4-piperazinedimethanol (1,4-Piperazinedimethanol).
  • Compound represented by the formula (3) is N- (2-hydroxyethyl) -ethylene urea, N- (3-hydroxypropyl) -2-pyrrolidone, hydroxymethylpyrrolidone and 1- (2-hydroxy It is preferably selected from the group consisting of oxyethyl) -2-pyrrolidone.
  • the compound represented by the formula (4) is in the group consisting of N- (2-hydroxyethyl) piperidine, N- (2-hydroxypropyl) piperidine and N- (2-hydroxybutyl) piperidine It is preferred to be selected.
  • Compound represented by the formula (5) is amino ethoxy ethanol, amino propoxy ethanol, amino butoxy ethanol, dimethyl amino ethoxy thiol, diethyl amino ethoxy thiol, dipropyl amino ethoxy thiol, dibutyl amino ethoxy thiol, Dimethylaminoethoxyethanol, diethylaminoethoxyethanol, dipropylaminoethoxyethanol, dibutylaminoethoxyethanol, dimethylaminoethoxyethanethiol, diethylaminoethoxypropanethiol, dipropylaminoethoxybutanethiol, Dibutylaminoethoxyethanol, N- (methoxymethyl) morpholine, N- (ethoxymethyl) morpholine, N- (2-methoxyethanol) morpholine, N- (2-ethoxyethanol) morpholine And N- (2-butoxyethanol) morpholine.
  • the additive (b) contained in the cleaning liquid composition for a flat panel display device of the present invention includes one or two or more selected from the group consisting of an azole compound, an alkanol amine salt, and a reducing agent.
  • the additive (b) minimizes corrosion of the wiring including copper and the wiring including aluminum.
  • the additive is included in an amount of 0.01 to 10% by weight, and 0.1 to 3% by weight based on the total weight of the composition. When the above range is satisfied, damage to metal films such as aluminum, copper, or an aluminum alloy, a copper alloy is minimized and economical.
  • the said azole type compound contains a triazole ring.
  • a non-covalent electron pair of nitrogen atoms present in the triazole ring electronically bonds with copper to inhibit metal corrosion.
  • the azole compound is tolytriazole, 1,2,3-benzotriazole, 1,2,3-triazole, 1,2,4-triazole, 3-amino-1,2,4-triazole , 4-amino-4H-1,2,4-triazole, 1-hydroxybenzotriazole, 1-methylbenzotriazole, 2-methylbenzotriazole, 5-methylbenzotriazole, benzotriazole-5 -Carboxylic acid, nitrobenzotriazole and 2- (2H-benzotriazol-2-yl) -4,6-di-tet-butylphenol, and 2,2 '-[[[ethyl-1 hydrogen-benzotria It is preferable that it is 1 type (s) or 2 or more types chosen from the group which consists of sol-1-yl] methyl
  • the alkanol amine salt has a pH buffering effect that prevents corrosion of the metal and overetching of the oxide film during the cleaning process of the substrate having the metal pattern and the oxide film and suppresses the pH change of the cleaning solution.
  • the temperature of the salt formation reaction is preferably maintained at 90 ° C or less.
  • the alkanol amine salt is preferably selected from alkanolamines wherein the alkyl moiety is usually lower alkyl, ie C1 to C5 alkyl. It is also preferable to use other lower alkanol amine salts, such as dimethyl methanolamine salt, since other substituents may be present in the amine group if one or more hydroxy groups remain. Specific examples of the alkanol amine salts include monoethanolamine salts, diethanolamine salts, triethanolamine salts, monoisopropanolamine salts, diisopropanolamine salts and triisopropanolamine salts. As the alkanol amine salt, a commercially available product may be used.
  • Examples of commercially available products include AB RUST CM (product of LABEMA Co.), AB RUST A4 (product of LABEMA Co.), EMADOX-NA (product of LABEMA Co.), EMADOX-NB (product of LABEMA Co.), EMADOX-NCAL ( LABEMA Co. product), EMADOX-102 (made by LABEMA Co.), EMADOX-103 (made by LABEMA Co.), EMADOX-D520 (made by LABEMA Co.), and AB Rust at (made by LABEMA Co.), and the like. .
  • the reducing agent serves to prevent corrosion of the metal wiring by inhibiting the formation of an oxide film, which may be referred to as the progress of corrosion of the metal wiring.
  • the reducing agent is preferably one or two or more selected from the group consisting of elisorbic acid, vitamin C and alpha tocopherol.
  • Water contained in the cleaning liquid composition for flat panel display devices of this invention is preferably deionized water, and more preferably deionized distilled water. When the water (c) is included, it is possible to provide an economical and environmentally friendly cleaning liquid composition. The water (c) is contained in the remaining amount so that the content of the cleaning liquid composition of the present invention is 100% by weight.
  • the cleaning liquid composition for a flat panel display device of the present invention preferably further includes a polycarboxylic acid copolymer, a proton alkylene glycol monoalkyl ether compound, and a surfactant.
  • the polycarboxylic acid copolymer may form a protective layer on the surface of the metal to inhibit excessive reaction with alkali ions, thereby preventing corrosion of the metal, and serves as a pH adjusting agent.
  • the polycarboxylic acid copolymer preferably includes a structural unit represented by the following formula (6).
  • R 15 to R 17 are each independently hydrogen, a C 1 to C 3 straight or branched alkyl group, or (CH 2 ) m 2 COOM 2 ,
  • M 1 and M 2 are each independently hydrogen, an alkali metal, an alkaline earth metal, an ammonium group, a C 1 to C 10 alkylammonium group or a C 1 to C 10 substituted alkylammonium group,
  • n 1 and m 2 are each independently an integer of 0 to 2.
  • the polycarboxylic acid copolymer preferably includes a monomer having a structural unit represented by Chemical Formula 6.
  • Monomers having a structural unit represented by the formula (6) are acrylic acid, methyl (meth) acrylic acid, ethyl (meth) acrylic acid, trimethyl acrylic acid, maleic acid, fumaric acid, itaconic acid, crotonic acid, citraconic acid, vinyl acetic acid, 4-phene It is preferably selected from the group consisting of tenic acid and salts thereof. Among them, acrylic acid, methyl (meth) acrylic acid and maleic acid are more preferable from the viewpoint of polishing the metal at high speed.
  • the polycarboxylic acid copolymer may use one kind or two or more kinds of other monomers copolymerizable with the monomer having the structural unit represented by the formula (6).
  • specific examples thereof include polyacrylic acid polymer (PAA), polymethyl (meth) acrylic acid copolymer (PMAA), polyacrylic acid maleic acid copolymer (PAMA), polymethyl acrylate (meth) acrylic acid copolymer (PAMAA), polymale Acid copolymer (PMA), polymethyl (meth) acrylic acid maleic acid copolymer (PMAMA), these salts, etc. are mentioned.
  • the polycarboxylic acid copolymer is preferably included in an amount of 0.01% to 10% by weight, more preferably 0.05% to 5% by weight, and 0.1% to 1% by weight, based on the total weight of the composition. Most preferably.
  • the protic alkylene glycol monoalkyl ether compound serves as a solvent for dissolving organic contaminants.
  • the proton alkylene glycol monoalkyl ether compound lowers the surface tension of the cleaning solution to increase the wettability on the glass substrate, thereby improving the cleaning power.
  • the protic alkylene glycol monoalkyl ether compound is ethylene glycol monobutyl ether (BG), diethylene glycol monomethyl ether (MDG), diethylene glycol monoethyl ether (carbitol), diethylene glycol monobutyl ether (BDG), Dipropylene glycol monomethyl ether (DPM), dipropylene glycol monoethyl ether (MFDG), triethylene glycol monobutyl ether (BTG), triethylene glycol monoethyl ether (MTG) and propylene glycol monomethyl ether (MFG) It is preferably selected from the group.
  • the protic alkylene glycol monoalkyl ether compound is preferably contained in 0.05 to 20% by weight, more preferably in 0.5 to 10% by weight based on the total weight of the composition.
  • the protic alkylene glycol monoalkyl ether compound is preferably contained in 0.05 to 20% by weight, more preferably in 0.5 to 10% by weight based on the total weight of the composition.
  • the surfactant increases the wettability of the substrate so that uniform cleaning is performed, and has an effect of preventing corrosion of the metal and over-etching of the oxide film during the cleaning process of the substrate including the metal pattern and the oxide film.
  • the said surfactant is 1 type (s) or 2 or more types chosen from the group which consists of a negative surfactant, an amphoteric surfactant, and a nonionic surfactant.
  • nonionic surfactant which is excellent in wettability and has less bubble generation.
  • the nonionic surfactants are polyoxyethylene / polyoxypropylene glycol type, polyoxyethylene alkyl ether type, polyoxyethylene alkylphenyl ether type, polyoxyethylene / polyoxypropylene alkyl ether type, polyoxyethylene / polyoxybutylene Alkyl ether type, polyoxyethylene alkyl amino ether type, polyoxyethylene alkylamide ether type, polyethylene glycol fatty acid ester type, sorbitan fatty acid ester type, fatty acid ester type, glycerin fatty acid ester type, polyglycerol fatty acid ester type, glycerin ester type It is preferable that it is 1 type (s) or 2 or more types chosen from the group which consists of alkyramide type
  • polyoxyethylene / polyoxybutylene which has an oxyethylene group (EO group) as a hydrophilic group in the structure of surfactant molecule, and has an oxypropylene group (PO group) and or an oxy butylene group (BO group) as a hydrophobic group. It is preferable that it is an alkyl ether type copolymer.
  • the EO group is represented by -CH 2 -CH 2 -O-
  • the oxypropylene group is -CH (CH 3 ) -CH 2 -O- or -CH 2 -CH (CH 3 ) -O-
  • the oxybutylene group -CH 2 -CH 2 -CH 2 -CH 2 -O-, -CH (CH 3 ) -CH 2 -CH 2 -O-, -CH 2 -CH (CH 3 ) -CH 2 -O-, or It is represented by CH 2 -CH 2 -CH (CH 3 ) 2 -O-.
  • the copolymerization portion of the EO group, the PO group, and the PO group may be a block copolymer, a random copolymer, or a random polypolymer having block properties.
  • the copolymer molecule may be a copolymer of an EO group or a PO group, a copolymer of an EO group or a PO group, or a copolymer of the EO group or a PO group or a BA group.
  • Y is in the range of 0.05 to 0.7.
  • the terminal of the said nonionic surfactant may be 1 type, or 2 or more types chosen from the group which consists only of a hydrogen, a hydroxyl group, an alkyl group, and an alkenyl group.
  • the structure which added ethylene diamine and glycerol may be sufficient.
  • nonionic surfactants include polyoxyethylene / polyoxypropylene condensates, polyoxyethylene / polyoxybutylene condensates, polyoxyethylene / polyoxypropylene dicanylether condensates, polyoxyethylene / polyoxypropylene Decanyl ether condensates, polyoxyethylene / polyoxypropylene undecanyl ether condensates, polyoxyethylene / polyoxypropylene dodecanyl ether condensates, polyoxyethylene / polyoxypropylene tetradecanyl ether condensates, polyoxyethylene / Polyoxybutylene decanyl ether condensate, polyoxyethylene / polyoxybutylene undecanyl ether condensate, polyoxyethylene / polyoxybutylene dodecanyl ether condensate, polyoxyethylene / polyoxybutylene tetradecanyl ether Condensate, polyoxyethylene / polyoxypropylene 2-ethylhexyl
  • the surfactant is preferably included in 0.001 to 1.0% by weight, more preferably 0.01 to 0.5% by weight based on the total weight of the composition. If it is included in the above-described range, the cleaning uniformity increase effect of the glass substrate is insignificant. If it is included in the above-mentioned range, the cleaning uniformity is constant but converges within a certain range without increasing more.
  • the cleaning method using the cleaning liquid composition for a flat panel display device of the present invention may be performed by a method commonly known in the art.
  • the cleaning method is preferably performed by one or two or more selected from the group consisting of a spray method, a spin method, a dipping method, and a dipping method using ultrasonic waves.
  • the temperature at which the cleaning method of the present invention can exhibit the most excellent cleaning effect is 20 to 80 ° C, preferably 20 to 50 ° C.
  • the cleaning method of the present invention is preferably carried out for 30 seconds to 10 minutes.
  • Washing liquid compositions were prepared by mixing and stirring with the ingredients and compositions shown in Table 1.
  • PAA polyacrylic acid polymer
  • a glass substrate having a copper thickness of 2500 was dipped into the cleaning liquid compositions of Examples 1 to 12 and Comparative Examples 1 to 3 for 30 minutes.
  • the temperature of the cleaning liquid is 40 °C and the thickness of the copper film is measured before and after dipping, the dissolution rate of the copper film is calculated by calculating from the change in the thickness of the copper film. The results are shown in Table 2.
  • the human body is stained with a fingerprint or an organic signature pen on a glass substrate formed of 5 cm x 5 cm, and the contaminated substrate is carried out at 40 ° C. for 2 minutes using a spray glass substrate cleaning device. It wash
  • FIGS. 1 to 4 are shown in FIGS. 1 to 4.
  • 1 is a photograph showing a glass substrate contaminated with an organic sign pen mark among organic contaminants.
  • FIG. 2 is a photograph showing a result of removing the organic sign pen marks shown in FIG. 1 using the cleaning liquid composition according to Example 16 of the present invention.
  • 3 is a photograph showing a glass substrate contaminated with human fingerprints among organic contaminants.
  • Figure 4 is a photograph showing the result of removing the fingerprint component of the person shown in Figure 3 using the cleaning liquid composition according to Example 16 of the present invention.
  • the glass substrate is left in the air for 24 hours to contaminate various organic substances, inorganic substances, particles, etc. in the air, and then, using the spray-type glass substrate cleaning apparatus, the sample is carried out at 40 ° C. for 2 minutes.
  • Examples 4, 8 and 12 To the cleaning liquid composition of Example 19 to 30 seconds after washing in ultrapure water and then dried with nitrogen. 0.5 ⁇ l of ultrapure water was dropped on the glass substrate to measure the contact angle after washing. The results are shown in Table 2.
  • the glass substrates having the cleaning liquid compositions of Examples 4, 8, 12, 13, 16 and 18 were contaminated with an organic particle solution were washed. That is, the glass substrate was contaminated with an organic particle solution having an average particle size of 0.8 ⁇ m, spin-dried at 3000 rpm for 1 minute, and then washed with each cleaning solution at 40 ° C. for 2 minutes using a spray-type glass substrate cleaner. . After washing for 30 seconds in ultrapure water and dried with nitrogen. The number of particles before and after cleaning was measured by a particle size measuring instrument (Topcon WM-1500) of 0.1 ⁇ m or more, and is shown in Table 2.
  • Topiccon WM-1500 Topical WM-1500
  • the cleaning liquid compositions of Examples 1 to 12 had an anticorrosion effect on copper.
  • Comparative Examples 1 to 3 in which an alkaline compound other than the cyclic amine compound was contained, corrosion phenomenon of copper was observed.
  • Washing liquid compositions were prepared by mixing and stirring with the ingredients and compositions shown in Table 3.
  • PAA polyacrylic acid polymer
  • a glass substrate having a copper thickness of 2500 was dipped into the cleaning liquid compositions of Examples 20 to 31 and Comparative Examples 1 to 3 for 30 minutes.
  • the temperature of the cleaning liquid is 40 °C and the thickness of the copper film is measured before and after dipping, and the dissolution rate of the copper film is calculated by calculating from the change in the thickness of the copper film.
  • Table 4 The results are shown in Table 4.
  • the human body is stained with a fingerprint or an organic signature pen on a glass substrate formed of 5 cm x 5 cm, and the contaminated substrate is carried out at 40 ° C. for 2 minutes using a spray glass substrate cleaning device. It wash
  • FIGS. 5 to 8 are photographs showing a glass substrate contaminated with an organic sign pen mark among organic contaminants.
  • FIG. 6 is a photograph showing a result of removing the organic sign pen marks shown in FIG. 5 using the cleaning liquid composition according to Example 32 of the present invention.
  • FIG. 7 is a photograph showing a glass substrate contaminated with human fingerprints among organic contaminants. 8 is a photograph showing the result of removing the fingerprint component of the person shown in FIG. 7 by using the cleaning liquid composition according to Example 32 of the present invention.
  • the glass substrate is left in the air for 24 hours to contaminate various organic substances, inorganic substances, particles, etc. in the air, and then, at 23 ° C. for 2 minutes using a spray-type glass substrate cleaning device, Examples 23, 27 and 31 are used.
  • After washing with the cleaning liquid composition of Example 38 After washing 30 seconds in ultrapure water and then dried with nitrogen. 0.5 ⁇ l of ultrapure water was dropped on the glass substrate, and the contact angle after washing was measured. The results are shown in Table 4.
  • Example 23 The glass substrates of Example 23, Example 27, Example 31, Example 32, Example 35, and Example 37 were cleaned and contaminated with the organic particle solution. That is, the glass substrate was contaminated with an organic particle solution having an average particle size of 0.8 ⁇ m, spin-dried at 3000 rpm for 1 minute, and then washed with each cleaning solution at 40 ° C. for 2 minutes using a spray-type glass substrate cleaner. . After washing for 30 seconds in ultrapure water and dried with nitrogen. Particle number before and after cleaning was measured by the particle count (Topcon WM-1500) particle size of 0.1 ⁇ m or more, are shown in Table 4.
  • the cleaning liquid compositions of Examples 20 to 31 had an anticorrosion effect on copper.
  • all of the cleaning liquid compositions of Examples 27, 31, 32, and 35 to 38 showed the ability to remove organic contaminants, and the contact angles were 20 ° to 40 ° to remove organic contaminants. Demonstrated ability.
  • the cleaning liquid compositions of Examples 23, 27, 31, 32, 35, and 37 were washed on the glass substrate contaminated with the organic particle solution, the cleaning liquid composition was close to 77-86%. Particle removal was shown.
  • PAA polyacrylic acid polymer
  • a glass substrate having a copper thickness of 2500 was dipped into the cleaning liquid compositions of Examples 38 to 50 and Comparative Examples 1 to 3 for 30 minutes.
  • the temperature of the cleaning liquid is 40 °C and the thickness of the copper film is measured before and after dipping, and the dissolution rate of the copper film is calculated by calculating from the change in the thickness of the copper film.
  • Table 6 The results are shown in Table 6.
  • the human body is stained with fingerprint marks or organic component pens on a glass substrate formed 5 cm x 5 cm, and the contaminated substrate is carried out at 40 ° C. for 2 minutes using a spray glass substrate cleaning device. It wash
  • FIG. 9 is a photograph showing a glass substrate contaminated with an organic sign pen mark among organic contaminants.
  • 10 is a photograph showing a result of removing an organic sign pen mark from organic contaminants using the cleaning liquid composition according to Example 51 of the present invention.
  • 11 is a photograph showing a glass substrate contaminated with a human fingerprint of organic contaminants.
  • 12 is a photograph showing a result of removing a fingerprint component of a human from organic contaminants using the cleaning liquid composition according to Example 51 of the present invention.
  • the glass substrate was left in the air for 24 hours to contaminate various organic substances, inorganic substances, particles, and the like in the atmosphere, and then, at 42 ° C. for 2 minutes using a spray-type glass substrate cleaning device, Examples 42, 46 and 47 were used.
  • Example 49, and Example 51 to Example 60 was washed with the cleaning liquid composition. After washing, it was washed with ultrapure water for 30 seconds and then dried with nitrogen. 0.5 ⁇ l of ultrapure water was dropped on the glass substrate to measure the contact angle after washing. The results are shown in Table 6.
  • the glass substrates having the cleaning liquid compositions of Examples 42, 46, 55, 57 and 59 were contaminated with the organic particle solution. That is, the glass substrate was contaminated with an organic particle solution having an average particle size of 0.8 ⁇ m, spin dried at 3000 rpm for 1 minute, and then washed with each cleaning solution at 40 ° C. for 2 minutes using a spray-type glass substrate cleaner. . After washing for 30 seconds in ultrapure water and dried with nitrogen. Particle number before and after cleaning was measured by a particle size measuring instrument (Topcon WM-1500) 0.1 ⁇ m or more particles are shown in Table 6.
  • the cleaning liquid compositions of Examples 39 to 50 had an anticorrosion effect on copper.
  • all of the cleaning liquid compositions of Examples 42, 46, 47, 49, and 51 to 60 showed removal ability of organic contaminants, and the contact angles were 20 ° to 40 °. The ability to remove organic contaminants was shown. Further, when cleaning the glass substrate contaminated with the organic particle solution with the cleaning liquid compositions of Examples 42, 46, 55, 57, and 59, the particle removal ability was 80% or more.

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Abstract

The present invention relates to a cleaning fluid composition for flat-panel display devices, comprising: (a) between 0.05 and 5 wt.% of an amine compound; (b) from 0.01 to 10 wt.% of an additive comprising one or two or more components selected from the group consisting of azole-based compounds, alkanol amine salts and reducing agents; and (c) a balance of water.

Description

세정액 조성물 및 이를 이용한 패널의 세정방법Cleaning liquid composition and cleaning method of panel using same
본 발명은 세정액 조성물 및 이를 이용한 세정방법에 관한 것이다. 본 발명은 2009년 07월 29일에 한국특허청에 제출된 한국특허출원 제10-2009-0069505호, 제10-2009-0069506호와 2009년 08월 11일에 한국특허청에 제출된 한국특허출원 제10-2009-0073683호의 출원일의 이익을 주장하며, 그 내용 전부는 본 명세서에 포함된다.The present invention relates to a cleaning liquid composition and a cleaning method using the same. The present invention relates to Korean Patent Application Nos. 10-2009-0069505 and 10-2009-0069506 filed to the Korean Patent Office on July 29, 2009, and Korean Patent Application No. Claims the benefit of the filing date of 10-2009-0073683, the entire contents of which are incorporated herein.
액정표시장치로 대표되는 평판표시장치(이하 ‘FPD’라 함)는, 반도체 장치와 같이, 성막, 노광, 에칭 등의 공정을 거쳐 제품이 제조된다. 하지만, 이러한 공정을 수행하면, 기판 표면에 각종의 유기물이나 무기물 등의 1㎛ 이하의 크기를 갖는 매우 작은 파티클(Particle)이 부착될 수 있다. 이러한 파티클이 부착한 채로, 다음의 공정을 수행하였을 경우, 막의 핀홀이나 피트, 배선의 단선이나 브릿지(Bridge)가 발생하여, 제품의 제조 수율이 저하된다.A flat panel display device (hereinafter referred to as "FPD") represented by a liquid crystal display device, like a semiconductor device, is manufactured through a process such as film formation, exposure and etching. However, when such a process is performed, very small particles having a size of 1 μm or less of various organic materials or inorganic materials may be attached to the surface of the substrate. When the following steps are carried out with these particles attached, pinholes or pits of the film, disconnection or bridges of the wires are generated, and the production yield of the product is lowered.
따라서 파티클을 제거하기 위한 세정이 각 공정 사이에 수행되고 있다. 세정을 위한 세정액에 대해서도 많은 제안이 나와 있다. 예를 들면, 일본공개특허 2005-154558호 공보에는, H3PO4, HF, 암모니아, 및/또는 아민을 함유하는 세정액이 제안되고 있다. 그러나, 이 특허의 세정액은 반도체 디바이스용이고, 가장 대표적인 FPD 기판인 유리기판과 가장 대표적인 배선재료인 Al을 격렬하게 식각(Etching)하는 HF를 포함하고 있기 때문에, FPD용 기판의 세정에는 사용할 수 없다. 또한, 일본공개특허 2000-232063호 공보에는 인산과 인산 암모늄을 부식방지제로 이용하는 것이 제안되었다. 그러나, 이 특허는 레지스트 잔사 제거용이고, 조성물의 pH도 산성범위이다. 따라서, 세정 초기의 단계의 기본적 특성인 유기물이나 무기물 등의 1㎛ 이하의 크기를 갖는 매우 작은 파티클(Particle)에 대한 제거성과 알루미늄 배선에 대한 부식 방지성을 동시에 만족시키기 어렵다. 또한, 대한민국등록특허 10-0574607호 공보에는 산성의 pH 환경 하에 탈이온수, 유기화합물 및 암모늄화합물을 포함하는 세정액을 제안하였다. 그러나 이 특허의 세정액은 산성 범위의 용액이므로 세정 초기의 단계의 기본적 특성인 유기물이나 무기물 등의 1㎛ 이하의 크기를 갖는 매우 작은 파티클(Particle)에 대한 제거능력이 우수하지 못하다. 또한, 대한민국 등록특허 10-0599849호 공보에서 요소 및/또는 에틸렌요소, 제 4급 암모늄수산화물, 암모니아 등의 알칼리 성분, 시트르산(CITRIC ACID), 말산(MALIC ACID), 타르타르산(TARTARIC ACID) 등의 유기산 및/또는 그 염, 그리고 잔량이 탈이온 증류수를 포함하는 세정액을 제안하였다. 그러나, 이 특허의 세정액은 장시간 사용 시 요소 또는 에틸렌 요소의 석출 문제가 발생할 수 있다. Thus, cleaning to remove particles is performed between each process. Many proposals have also been made for cleaning liquids for cleaning. For example, Japanese Laid-Open Patent Publication No. 2005-154558 proposes a cleaning liquid containing H 3 PO 4 , HF, ammonia, and / or an amine. However, the cleaning liquid of this patent cannot be used for cleaning FPD substrates because it contains a glass substrate, which is the most representative FPD substrate, and HF, which intensively etches Al, the most representative wiring material. . In addition, Japanese Patent Application Laid-Open No. 2000-232063 proposes to use phosphoric acid and ammonium phosphate as corrosion inhibitors. However, this patent is for removing resist residues and the pH of the composition is in the acidic range. Therefore, it is difficult to satisfy both the removal of very small particles having a size of 1 μm or less, which is a basic characteristic of the initial stage of cleaning, and the corrosion protection of aluminum wiring. In addition, Korean Patent Publication No. 10-0574607 proposes a cleaning solution containing deionized water, an organic compound and an ammonium compound in an acidic pH environment. However, since the cleaning solution of this patent is an acidic solution, the removal ability of very small particles having a size of 1 μm or less, such as organic or inorganic substances, which is a basic characteristic of the initial stage of cleaning, is not excellent. In addition, Korean Patent Publication No. 10-0599849 discloses an organic acid such as urea and / or an alkaline component such as urea urea, quaternary ammonium hydroxide, ammonia, citric acid (CITRIC ACID), malic acid (MALIC ACID), and tartaric acid (TARTARIC ACID). And / or a salt thereof, and a washing liquid containing residual deionized distilled water. However, the cleaning solution of this patent may cause the problem of precipitation of urea or ethylene urea with prolonged use.
본 발명의 목적은 평판표시장치에 이용되는 기판 상에 존재하는 유기물 또는 무기물 등의 파티클을 제거하기 적합한 세정액 조성물을 제공하는 것이다.An object of the present invention is to provide a cleaning liquid composition suitable for removing particles such as organic or inorganic substances present on a substrate used in a flat panel display.
또한, 본 발명의 목적은 평판표시장치에 이용되는 구리를 포함하는 배선, 알루미늄을 포함하는 배선을 부식시키지 않는 세정액 조성물을 제공하는 것이다.It is also an object of the present invention to provide a cleaning liquid composition which does not corrode wiring including copper and wiring including aluminum used in a flat panel display.
본 발명은 조성물 총 중량에 대하여, (a) 하기 화학식 1 내지 5 중에서 어느 하나로 표시되는 아민 화합물 0.05~5중량%; (b) 아졸계 화합물, 알칸올 아민염 및 환원제로 이루어진 군에서 선택되는 1종 또는 2종 이상을 포함하는 첨가제 0.01 내지 10중량%; 및 (c) 물 잔량을 포함하는 것을 특징으로 하는 평판표시장치용 세정액 조성물을 제공한다.The present invention relates to a total weight of the composition, (a) 0.05 to 5% by weight of an amine compound represented by any one of the following Formulas 1 to 5; (b) 0.01 to 10% by weight of an additive including one or two or more selected from the group consisting of an azole compound, an alkanol amine salt, and a reducing agent; And (c) provides a cleaning liquid composition for a flat panel display comprising a residual amount of water.
<화학식 1><Formula 1>
Figure PCTKR2010005002-appb-I000001
Figure PCTKR2010005002-appb-I000001
<화학식 2><Formula 2>
Figure PCTKR2010005002-appb-I000002
Figure PCTKR2010005002-appb-I000002
<화학식 3><Formula 3>
Figure PCTKR2010005002-appb-I000003
Figure PCTKR2010005002-appb-I000003
<화학식 4><Formula 4>
Figure PCTKR2010005002-appb-I000004
Figure PCTKR2010005002-appb-I000004
<화학식 5><Formula 5>
Figure PCTKR2010005002-appb-I000005
Figure PCTKR2010005002-appb-I000005
상기 화학식 1 내지 5에 있어서,In Chemical Formulas 1 to 5,
R1, R4, R5는 각각 독립적으로 C1~C10의 직쇄 또는 분지쇄 알킬렌기이고,R 1 , R 4 , and R 5 are each independently a C 1 to C 10 linear or branched alkylene group,
R2, R3, R6는 각각 독립적으로 수소, C1~C10의 직쇄 또는 분지쇄 알킬기이고, R 2 , R 3 , and R 6 are each independently hydrogen, a C 1 to C 10 straight or branched alkyl group,
R7, R8, R10은 각각 독립적으로 수소, C1~C10의 직쇄 또는 분지쇄 알킬기, C6~C10의 아릴기, C1~C10의 직쇄 또는 분지쇄 알킬아미노기, C1~C10의 직쇄 또는 분지쇄 히드록시알킬기, C1~C10의 직쇄 또는 분지쇄 알킬벤젠기 또는 아미노기이고,R 7, R 8, R 10 are each independently hydrogen, C 1 ~ C 10 straight-chain or branched-chain alkyl group, C 6 ~ C 10 aryl group, C 1 ~ a C 10 linear or branched alkyl group, C 1 and - a C 10 straight or branched chain hydroxyalkyl group, C 1 ~ C 10 straight or branched chain of an alkyl benzene group or an amino group,
R9 및 R11은 수소, C1~C10의 직쇄 또는 분지쇄 알킬기, C6~C10의 아릴기, C1~C10의 직쇄 또는 분지쇄 알킬아미노기 또는 아미노기이고, R 9 and R 11 are hydrogen, a C 1 to C 10 straight or branched alkyl group, C 6 to C 10 aryl group, C 1 to C 10 straight or branched chain alkylamino group or amino group,
R12은 C1~C4의 직쇄 또는 분지쇄 히드록시알킬기, 또는 C1~C4의 직쇄 또는 분지쇄 티올알킬기이고, R 12 is a C 1 to C 4 straight or branched hydroxyalkyl group, or C 1 to C 4 straight or branched thiolalkyl group,
R13 및 R14는 각각 독립적으로 C1~C5의 직쇄 또는 분지쇄 알킬기, C1~C4의 직쇄 또는 분지쇄 히드록시알킬기, C6~C10의 아릴기 또는 C1~C4의 알콕시알킬기이고, R13 및 R14는 결합하여 헤테로고리를 형성할 수 있고,R 13 and R 14 are each independently a C 1 to C 5 straight or branched chain alkyl group, C 1 to C 4 straight or branched chain hydroxyalkyl group, C 6 to C 10 aryl group or C 1 to C 4 An alkoxyalkyl group, R 13 and R 14 may combine to form a heterocycle,
n1 및 n3은 각각 독립적으로 0 또는 1의 정수이고,n 1 and n 3 are each independently an integer of 0 or 1,
n2 및 n4는 각각 독립적으로 0 내지 4의 정수이고,n 2 and n 4 are each independently an integer of 0 to 4,
n5은 1 또는 2의 정수이고,n 5 is an integer of 1 or 2,
n6는 1 내지 4의 정수이고,n 6 is an integer from 1 to 4,
n7은 O 내지 4의 정수이고,n 7 is an integer of 0 to 4,
X1는 S, O 또는 N이고,X 1 is S, O or N,
X2은 N이고,X 2 is N,
X3는 CH 또는 N이고,X 3 is CH or N,
Y는 히드록시기 또는 아미노기이다.Y is a hydroxyl group or an amino group.
본 발명은 상기 세정액 조성물을 이용한 평판표시장치의 세정방법을 제공한다.The present invention provides a method for cleaning a flat panel display using the cleaning liquid composition.
본 발명의 세정액 조성물은 평판표시장치에 이용되는 기판의 표면에 존재하는 유기물 또는 무기물 등의 파티클에 대한 제거력이 우수하다. 또한, 본 발명의 세정액 조성물은 기판 상에 위치한 구리를 포함하는 배선과 알루미늄을 포함하는 배선에 대한 부식방지 효과가 우수하다. 또한, 본 발명의 세정액 조성물은 다량의 물을 포함하고 있어 취급이 용이하며 친환경적이다.The cleaning liquid composition of the present invention is excellent in the ability to remove particles such as organic or inorganic substances present on the surface of the substrate used in the flat panel display device. In addition, the cleaning liquid composition of the present invention is excellent in the anti-corrosion effect on the wiring including copper and the wiring including aluminum located on the substrate. In addition, the cleaning liquid composition of the present invention contains a large amount of water is easy to handle and environmentally friendly.
도 1은 유기 오염물 중 유기 사인펜 자국으로 오염된 유리기판을 나타낸 사진이다.1 is a photograph showing a glass substrate contaminated with organic sign pen marks among organic contaminants.
도 2는 실시예16에 따른 세정액 조성물을 이용하여 도 1에 도시된 유기 사인펜 자국이 제거되는 결과를 나타내는 사진이다. FIG. 2 is a photograph showing a result of removing the organic sign pen marks shown in FIG. 1 by using the cleaning solution composition of Example 16. FIG.
도 3은 유기 오염물 중 사람의 지문으로 오염된 유리기판을 나타낸 사진이다.3 is a photograph showing a glass substrate contaminated with human fingerprints among organic contaminants.
도 4는 실시예16에 따른 세정액 조성물을 이용하여 도 3에 도시된 사람의 지문성분이 제거되는 결과를 나타내는 사진이다.Figure 4 is a photograph showing the result of removing the fingerprint component of the person shown in Figure 3 using the cleaning liquid composition according to Example 16.
도 5는 유기 오염물 중 유기 사인펜 자국으로 오염된 유리기판을 나타낸 사진이다.5 is a photograph showing a glass substrate contaminated with an organic sign pen mark among organic contaminants.
도 6은 실시예32에 따른 세정액 조성물을 이용하여 도 5에 도시된 유기 사인펜 자국이 제거되는 결과를 나타내는 사진이다. FIG. 6 is a photograph showing a result of removing the organic sign pen marks shown in FIG. 5 using the cleaning liquid composition of Example 32. FIG.
도 7은 유기 오염물 중 사람의 지문으로 오염된 유리기판을 나타낸 사진이다.7 is a photograph showing a glass substrate contaminated with human fingerprints among organic contaminants.
도 8은 실시예32에 따른 세정액 조성물을 이용하여 도 6에 도시된 사람의 지문성분이 제거되는 결과를 나타내는 사진이다.8 is a photograph showing the result of removing the fingerprint component of the person shown in FIG. 6 by using the cleaning liquid composition according to Example 32.
도 9는 유기 오염물 중 유기 사인펜 자국으로 오염된 유리기판을 나타낸 사진이다. 9 is a photograph showing a glass substrate contaminated with organic sign pen marks among organic contaminants.
도 10은 실시예51에 따른 세정액 조성물을 이용하여 도 9에 도시된 유기 사인펜 자국이 제거되는 결과를 나타내는 사진이다. FIG. 10 is a photograph showing the result of removing the organic sign pen marks shown in FIG. 9 using the cleaning solution composition of Example 51. FIG.
도 11은 유기 오염물 중 사람의 지문으로 오염된 유리기판을 나타낸 사진이다. 11 is a photograph showing a glass substrate contaminated with a human fingerprint of organic contaminants.
도 12는 실시예51에 따른 세정액 조성물을 이용하여 도 11에 도시된 사람의 지문성분이 제거되는 결과를 나타내는 사진이다.12 is a photograph showing the result of removing the fingerprint component of the person shown in FIG. 11 using the cleaning liquid composition according to Example 51. FIG.
이하 본 발명을 구체적으로 설명한다.Hereinafter, the present invention will be described in detail.
본 발명의 평판표시장치용 세정액 조성물은 (a) 아민 화합물, (b) 첨가제 및 (c) 물을 포함한다.The cleaning liquid composition for a flat panel display device of this invention contains (a) an amine compound, (b) additive, and (c) water.
본 발명의 평판표시장치용 세정액 조성물에 포함되는 (a) 아민 화합물은 하기 화학식 1 내지 5 중에서 어느 하나로 표시된다.The (a) amine compound included in the cleaning liquid composition for a flat panel display of the present invention is represented by any one of the following Chemical Formulas 1 to 5.
<화학식 1><Formula 1>
Figure PCTKR2010005002-appb-I000006
Figure PCTKR2010005002-appb-I000006
<화학식 2><Formula 2>
Figure PCTKR2010005002-appb-I000007
Figure PCTKR2010005002-appb-I000007
<화학식 3><Formula 3>
Figure PCTKR2010005002-appb-I000008
Figure PCTKR2010005002-appb-I000008
<화학식 4><Formula 4>
Figure PCTKR2010005002-appb-I000009
Figure PCTKR2010005002-appb-I000009
<화학식 5><Formula 5>
Figure PCTKR2010005002-appb-I000010
Figure PCTKR2010005002-appb-I000010
상기 화학식 1 내지 5에 있어서,In Chemical Formulas 1 to 5,
R1, R4, R5는 각각 독립적으로 C1~C10의 직쇄 또는 분지쇄 알킬렌기이고,R 1 , R 4 , and R 5 are each independently a C 1 to C 10 linear or branched alkylene group,
R2, R3, R6는 각각 독립적으로 수소, C1~C10의 직쇄 또는 분지쇄 알킬기이고, R 2 , R 3 , and R 6 are each independently hydrogen, a C 1 to C 10 straight or branched alkyl group,
R7, R8, R10은 각각 독립적으로 수소, C1~C10의 직쇄 또는 분지쇄 알킬기, C6~C10의 아릴기, C1~C10의 직쇄 또는 분지쇄 알킬아미노기, C1~C10의 직쇄 또는 분지쇄 히드록시알킬기, C1~C10의 직쇄 또는 분지쇄 알킬벤젠기 또는 아미노기이고,R 7, R 8, R 10 are each independently hydrogen, C 1 ~ C 10 straight-chain or branched-chain alkyl group, C 6 ~ C 10 aryl group, C 1 ~ a C 10 linear or branched alkyl group, C 1 and - a C 10 straight or branched chain hydroxyalkyl group, C 1 ~ C 10 straight or branched chain of an alkyl benzene group or an amino group,
R9 및 R11은 수소, C1~C10의 직쇄 또는 분지쇄 알킬기, C6~C10의 아릴기, C1~C10의 직쇄 또는 분지쇄 알킬아미노기 또는 아미노기이고, R 9 and R 11 are hydrogen, a C 1 to C 10 straight or branched alkyl group, C 6 to C 10 aryl group, C 1 to C 10 straight or branched chain alkylamino group or amino group,
R12은 C1~C4의 직쇄 또는 분지쇄 히드록시알킬기, 또는 C1~C4의 직쇄 또는 분지쇄 티올알킬기이고, R 12 is a C 1 to C 4 straight or branched hydroxyalkyl group, or C 1 to C 4 straight or branched thiolalkyl group,
R13 및 R14는 각각 독립적으로 C1~C5의 직쇄 또는 분지쇄 알킬기, C1~C4의 직쇄 또는 분지쇄 히드록시알킬기, C6~C10의 아릴기 또는 C1~C4의 알콕시알킬기이고, R13 및 R14는 결합하여 헤테로고리를 형성할 수 있고,R 13 and R 14 are each independently a C 1 to C 5 straight or branched chain alkyl group, C 1 to C 4 straight or branched chain hydroxyalkyl group, C 6 to C 10 aryl group or C 1 to C 4 An alkoxyalkyl group, R 13 and R 14 may combine to form a heterocycle,
n1 및 n3은 각각 독립적으로 0 또는 1의 정수이고,n 1 and n 3 are each independently an integer of 0 or 1,
n2 및 n4는 각각 독립적으로 0 내지 4의 정수이고,n 2 and n 4 are each independently an integer of 0 to 4,
n5은 1 또는 2의 정수이고,n 5 is an integer of 1 or 2,
n6는 1 내지 4의 정수이고,n 6 is an integer from 1 to 4,
n7은 O 내지 4의 정수이고,n 7 is an integer of 0 to 4,
X1는 S, O 또는 N이고,X 1 is S, O or N,
X2은 N이고,X 2 is N,
X3는 CH 또는 N이고,X 3 is CH or N,
Y는 히드록시기 또는 아미노기이다.Y is a hydroxyl group or an amino group.
상기 (a) 아민 화합물은 조성물 총 중량에 대하여, 0.05 내지 5 중량% 포함되고, 0.1 내지 3중량%로 포함되는 것이 바람직하다. 상술한 범위 미만으로 포함되면, 충분한 세정효과를 구현할 수 없다. 상술한 범위를 초과하여 포함되면, 세정액 내의 활동도를 저하시켜 파티클 제거 효과를 감소시키거나 구리를 포함하는 배선 또는 알루미늄을 포함하는 배선에 대한 부식이 증가한다.The (a) amine compound is preferably contained in 0.05 to 5% by weight, 0.1 to 3% by weight based on the total weight of the composition. If it is included in less than the above-described range, it is not possible to implement a sufficient cleaning effect. When included in excess of the above-mentioned range, the activity in the cleaning liquid is lowered to reduce the particle removal effect or to increase corrosion to the wiring including copper or the wiring including aluminum.
상기 화학식 1로 표시되는 아민 화합물은 N-(2-히드록시에틸)피페라진, N-(2-히드록시프로필)피페라진, N-(2-히드록시부틸)피페라진, 1-(2-히드록시에틸)-4-메틸피페라진, 1-(2-히드록시프로필)-4-메틸피페라진, 1-(2-히드록시부틸)-4-메틸피페라진, 1-(2-히드록시에틸)-4-에틸피페라진, 1-(2-히드록시에틸)-4-프로필피페라진, 1-(2-히드록시에틸)-4-부틸피페라진, 1-(2-히드록시프로필)-4-메틸피페라진, 1-(2-히드록시프로필)-4-에틸피페라진, 1-(2-히드록시프로필)-4-프로필피페라진, 1-(2-히드록시프로필)-4-부틸피페라진, 1-(2-히드록시부틸)-4-메틸피페라진, 1-(2-히드록시부틸)-4-에틸피페라진, 1-(2-히드록시부틸)-4-프로필피페라진, 1-(2-히드록시부틸)-4-부틸피페라진, N-(2-히드록시에틸)모폴린, N-(2-히드록시프로필)모폴린, N-아미노프로필모폴린, 히드록시에틸피페라진, 히드록시프로필피페라진 및 1-(N-메틸피페라진)에탄올으로 이루어진 군에서 선택되는 것이 바람직하다.The amine compound represented by Formula 1 is N- (2-hydroxyethyl) piperazine, N- (2-hydroxypropyl) piperazine, N- (2-hydroxybutyl) piperazine, 1- (2- Hydroxyethyl) -4-methylpiperazine, 1- (2-hydroxypropyl) -4-methylpiperazine, 1- (2-hydroxybutyl) -4-methylpiperazine, 1- (2-hydroxy Ethyl) -4-ethylpiperazine, 1- (2-hydroxyethyl) -4-propylpiperazine, 1- (2-hydroxyethyl) -4-butylpiperazine, 1- (2-hydroxypropyl) -4-methylpiperazine, 1- (2-hydroxypropyl) -4-ethylpiperazine, 1- (2-hydroxypropyl) -4-propylpiperazine, 1- (2-hydroxypropyl) -4 -Butyl piperazine, 1- (2-hydroxybutyl) -4-methylpiperazine, 1- (2-hydroxybutyl) -4-ethylpiperazine, 1- (2-hydroxybutyl) -4-propyl Piperazine, 1- (2-hydroxybutyl) -4-butylpiperazine, N- (2-hydroxyethyl) morpholine, N- (2-hydroxypropyl) morpholine, N-aminopropylmorpholine, Hydroxyethylpiperazine, hydroxy Be selected from the group consisting of propyl-piperazin-1- (N- methylpiperazine) ethanol is preferred.
상기 화학식 2로 표시되는 화합물은 1,4-피페라진디에탄올(1,4-Piperazinediethanol)과 1,4-피페라진디메탄올(1,4-Piperazinedimethanol)으로 이루어진 군에서 선택되는 것이 바람직하다.The compound represented by Chemical Formula 2 is preferably selected from the group consisting of 1,4-piperazinediethanol (1,4-Piperazinediethanol) and 1,4-piperazinedimethanol (1,4-Piperazinedimethanol).
상기 화학식 3으로 표시되는 화합물은 N-(2-히드록시에틸)-에틸렌우레아, N-(3-히드록시프로필)-2-피롤리돈, 히드록시메틸피롤리돈 및 1-(2-히드록시에틸)-2-피롤리돈으로 이루어진 군에서 선택되는 것이 바람직하다.Compound represented by the formula (3) is N- (2-hydroxyethyl) -ethylene urea, N- (3-hydroxypropyl) -2-pyrrolidone, hydroxymethylpyrrolidone and 1- (2-hydroxy It is preferably selected from the group consisting of oxyethyl) -2-pyrrolidone.
상기 화학식 4로 표시되는 화합물은 N-(2-히드록시에틸)피페리딘, N-(2-히드록시프로필)피페리딘 및 N-(2-히드록시부틸)피페리딘으로 이루어진 군에서 선택되는 것이 바람직하다.The compound represented by the formula (4) is in the group consisting of N- (2-hydroxyethyl) piperidine, N- (2-hydroxypropyl) piperidine and N- (2-hydroxybutyl) piperidine It is preferred to be selected.
상기 화학식 5로 표시되는 화합물은 아미노에톡시에탄올, 아미노프로폭시에탄올, 아미노부톡시에탄올, 디메틸아미노에톡시티올, 디에틸아미노에톡시티올, 디프로필아미노에톡시티올, 디부틸아미노에톡시티올, 디메틸아미노에톡시에탄올, 디에틸아미노에톡시에탄올, 디프로필아미노에톡시에탄올, 디부틸아미노에톡시에탄올, 디메틸아미노에톡시에탄티올, 디에틸아미노에톡시프로판티올, 디프로필아미노에톡시부탄티올, 디부틸아미노에톡시에탄올, N-(메톡시메틸)모폴린, N-(에톡시메틸)모폴린, N-(2-메톡시에탄올)모폴린, N-(2-에톡시에탄올)모폴린 및 N-(2-부톡시에탄올)모폴린으로 이루어진 군으로부터 선택되는 것이 바람직하다.Compound represented by the formula (5) is amino ethoxy ethanol, amino propoxy ethanol, amino butoxy ethanol, dimethyl amino ethoxy thiol, diethyl amino ethoxy thiol, dipropyl amino ethoxy thiol, dibutyl amino ethoxy thiol, Dimethylaminoethoxyethanol, diethylaminoethoxyethanol, dipropylaminoethoxyethanol, dibutylaminoethoxyethanol, dimethylaminoethoxyethanethiol, diethylaminoethoxypropanethiol, dipropylaminoethoxybutanethiol, Dibutylaminoethoxyethanol, N- (methoxymethyl) morpholine, N- (ethoxymethyl) morpholine, N- (2-methoxyethanol) morpholine, N- (2-ethoxyethanol) morpholine And N- (2-butoxyethanol) morpholine.
본 발명의 평판표시장치용 세정액 조성물에 포함되는 (b) 첨가제는 아졸계 화합물, 알칸올 아민염 및 환원제로 이루어진 군에서 선택되는 1종 또는 2종 이상을 포함한다. The additive (b) contained in the cleaning liquid composition for a flat panel display device of the present invention includes one or two or more selected from the group consisting of an azole compound, an alkanol amine salt, and a reducing agent.
상기 (b) 첨가제는 구리를 포함하는 배선과 알루미늄을 포함하는 배선의 부식을 최소화한다.The additive (b) minimizes corrosion of the wiring including copper and the wiring including aluminum.
상기 첨가제는 조성물 총 중량에 대하여, 0.01 내지 10중량%로 포함되고, 0.1 내지 3 중량%로 포함되는 것이 바람직하다. 상술한 범위를 만족하면, 알루미늄, 구리, 또는 알루미늄 합금, 구리 합금 등의 금속막의 손상을 최소화하고, 경제적이다.The additive is included in an amount of 0.01 to 10% by weight, and 0.1 to 3% by weight based on the total weight of the composition. When the above range is satisfied, damage to metal films such as aluminum, copper, or an aluminum alloy, a copper alloy is minimized and economical.
상기 아졸계 화합물은 트리아졸 고리를 포함하는 것이 바람직하다. 상기 트리아졸 고리에 존재하는 질소 원자의 비공유전자쌍이 구리와 전자적으로 결합하여 금속 부식을 억제한다. 상기 아졸계 화합물은 톨리트리아졸, 1,2,3-벤조트리아졸, 1,2,3-트리아졸, 1,2,4-트리아졸, 3-아미노-1,2,4-트리아졸, 4-아미노-4H-1,2,4-트리아졸, 1-히드록시벤조트리아졸, 1-메틸벤조트리아졸, 2-메틸벤조트리아졸, 5-메틸벤조트리아졸, 벤조트리아졸-5-카르본산, 니트로벤조트리아졸 및 2-(2H-벤조트리아졸-2-일)-4,6-디-t-부틸페놀, 및 2,2’-[[[에틸-1수소-벤조트리아졸-1-일]메틸]이미노]비스에탄올로 이루어진 군에서 선택되는 1종 또는 2종 이상인 것이 바람직하다.It is preferable that the said azole type compound contains a triazole ring. A non-covalent electron pair of nitrogen atoms present in the triazole ring electronically bonds with copper to inhibit metal corrosion. The azole compound is tolytriazole, 1,2,3-benzotriazole, 1,2,3-triazole, 1,2,4-triazole, 3-amino-1,2,4-triazole , 4-amino-4H-1,2,4-triazole, 1-hydroxybenzotriazole, 1-methylbenzotriazole, 2-methylbenzotriazole, 5-methylbenzotriazole, benzotriazole-5 -Carboxylic acid, nitrobenzotriazole and 2- (2H-benzotriazol-2-yl) -4,6-di-tet-butylphenol, and 2,2 '-[[[ethyl-1 hydrogen-benzotria It is preferable that it is 1 type (s) or 2 or more types chosen from the group which consists of sol-1-yl] methyl] imino] bisethanol.
상기 알칸올 아민염은 금속 패턴 및 산화막이 존재하는 기판의 세정 공정시 금속의 부식 및 산화막의 과식각을 방지하며 세정액의 pH변화를 억제하는 pH완충 효과를 갖는다. 상기 알칸올 아민염의 제조시 염 생성 반응의 온도는 90℃ 이하에서 유지되는 것이 바람직하다. The alkanol amine salt has a pH buffering effect that prevents corrosion of the metal and overetching of the oxide film during the cleaning process of the substrate having the metal pattern and the oxide film and suppresses the pH change of the cleaning solution. In the preparation of the alkanol amine salt, the temperature of the salt formation reaction is preferably maintained at 90 ° C or less.
상기 알칸올 아민염은 알킬 부분이 통상 저급 알킬 즉, C1 내지 C5 알킬인 알칸올아민으로부터 선택되는 것이 바람직하다. 또한, 1개 이상의 히드록시기가 남아있다면 다른 치환체가 아민기 중에 존재할 수 있으므로, 디메틸 메탄올아민염과 같은 다른 저급 알칸올 아민염을 사용하는 것도 바람직하다. 상기 알칸올 아민염의 구체적인 예로는 모노에탄올아민염, 디에탄올아민염, 트리에탄올아민염, 모노이소프로판올아민염, 디이소프로판올아민염 및 트리이소프로판올아민염 등을 들 수 있다. 상기 알칸올 아민염으로서, 시판된 제품을 사용해도 무방하다. 시판된 제품의 예로는 AB RUST CM(LABEMA Co. 제품), AB RUST A4(LABEMA Co. 제품), EMADOX-NA(LABEMA Co. 제품), EMADOX-NB(LABEMA Co. 제품), EMADOX-NCAL(LABEMA Co. 제품), EMADOX-102(LABEMA Co. 제품), EMADOX-103(LABEMA Co. 제품), EMADOX-D520(LABEMA Co. 제품) 및 AB Rust at(LABEMA Co. 제품) 등을 들 수 있다.The alkanol amine salt is preferably selected from alkanolamines wherein the alkyl moiety is usually lower alkyl, ie C1 to C5 alkyl. It is also preferable to use other lower alkanol amine salts, such as dimethyl methanolamine salt, since other substituents may be present in the amine group if one or more hydroxy groups remain. Specific examples of the alkanol amine salts include monoethanolamine salts, diethanolamine salts, triethanolamine salts, monoisopropanolamine salts, diisopropanolamine salts and triisopropanolamine salts. As the alkanol amine salt, a commercially available product may be used. Examples of commercially available products include AB RUST CM (product of LABEMA Co.), AB RUST A4 (product of LABEMA Co.), EMADOX-NA (product of LABEMA Co.), EMADOX-NB (product of LABEMA Co.), EMADOX-NCAL ( LABEMA Co. product), EMADOX-102 (made by LABEMA Co.), EMADOX-103 (made by LABEMA Co.), EMADOX-D520 (made by LABEMA Co.), and AB Rust at (made by LABEMA Co.), and the like. .
상기 환원제는 금속 배선의 부식 진행 단계라 할 수 있는 산화막 형성을 억제함으로써 금속 배선의 부식을 방지하는 역할을 한다. 상기 환원제는 엘리소르빈산, 비타민 C 및 알파 토코페롤으로 이루어진 군에서 선택되는 1종 또는 2종 이상인 것이 바람직하다. The reducing agent serves to prevent corrosion of the metal wiring by inhibiting the formation of an oxide film, which may be referred to as the progress of corrosion of the metal wiring. The reducing agent is preferably one or two or more selected from the group consisting of elisorbic acid, vitamin C and alpha tocopherol.
본 발명의 평판표시장치용 세정액 조성물에 포함되는 (c) 물은 탈이온수인 것이 바람직하고, 탈이온 증류수인 것이 보다 바람직하다. 상기 (c) 물이 포함되면, 경제적이고 환경친화적인 세정액 조성물을 제공할 수 있다. 상기 (c) 물은 본 발명의 세정액 조성물의 함량이 100중량%가 되도록 잔량 포함된다.(C) Water contained in the cleaning liquid composition for flat panel display devices of this invention is preferably deionized water, and more preferably deionized distilled water. When the water (c) is included, it is possible to provide an economical and environmentally friendly cleaning liquid composition. The water (c) is contained in the remaining amount so that the content of the cleaning liquid composition of the present invention is 100% by weight.
본 발명의 평판표시장치용 세정액 조성물은 폴리카르복실산 공중합체, 양자성 알킬렌글리콜 모노알킬에테르 화합물 및 계면활성제로 이루어진 군에서 선택되는 것을 더 포함하는 것이 바람직하다.The cleaning liquid composition for a flat panel display device of the present invention preferably further includes a polycarboxylic acid copolymer, a proton alkylene glycol monoalkyl ether compound, and a surfactant.
상기 폴리카르복실산 공중합체는 금속의 표면에 보호막층을 형성하여 알칼리 이온과의 과도한 반응을 억제하여 금속의 부식방지을 방지할 수 있고, pH조절제 역할을 한다. 상기 폴리카르복실산 공중합체는 하기 화학식 6으로 표시되는 구조단위를 포함하는 것이 바람직하다.The polycarboxylic acid copolymer may form a protective layer on the surface of the metal to inhibit excessive reaction with alkali ions, thereby preventing corrosion of the metal, and serves as a pH adjusting agent. The polycarboxylic acid copolymer preferably includes a structural unit represented by the following formula (6).
<화학식 6><Formula 6>
Figure PCTKR2010005002-appb-I000011
Figure PCTKR2010005002-appb-I000011
상기 화학식 6에서,In Chemical Formula 6,
R15 내지 R17 는 각각 독립적으로, 수소, C1~C3의 직쇄 또는 분지쇄 알킬기, 또는 (CH2)m2COOM2이고, R 15 to R 17 are each independently hydrogen, a C 1 to C 3 straight or branched alkyl group, or (CH 2 ) m 2 COOM 2 ,
M1 및 M2는 각각 독립적으로 수소, 알칼리 금속, 알칼리 토금속, 암모늄기, C1~C10의 알킬암모늄기 또는 C1~C10의 치환알킬암모늄기이고,M 1 and M 2 are each independently hydrogen, an alkali metal, an alkaline earth metal, an ammonium group, a C 1 to C 10 alkylammonium group or a C 1 to C 10 substituted alkylammonium group,
m1 및 m2 는 각각 독립적으로 0 내지 2의 정수이다.m 1 and m 2 are each independently an integer of 0 to 2.
상기 폴리카르복실산 공중합체는 상기 화학식 6으로 표시되는 구조단위를 갖는 단량체를 포함하는 것이 바람직하다. 상기 화학식 6으로 표시되는 구조단위를 갖는 단량체는 아크릴산, 메틸(메타)아크릴산, 에틸(메타)아크릴산, 트리메틸아크릴산, 말레산, 푸마르산, 이타콘산, 크로톤산, 시트라콘산, 비닐초산, 4-펜텐산 및 이들의 염으로 이루어진 군에서 선택되는 것이 바람직하다. 이 중에서 금속을 고속으로 연마한다는 관점에서 아크릴산, 메틸(메타)아크릴산 및 말레산이 보다 바람직하다. The polycarboxylic acid copolymer preferably includes a monomer having a structural unit represented by Chemical Formula 6. Monomers having a structural unit represented by the formula (6) are acrylic acid, methyl (meth) acrylic acid, ethyl (meth) acrylic acid, trimethyl acrylic acid, maleic acid, fumaric acid, itaconic acid, crotonic acid, citraconic acid, vinyl acetic acid, 4-phene It is preferably selected from the group consisting of tenic acid and salts thereof. Among them, acrylic acid, methyl (meth) acrylic acid and maleic acid are more preferable from the viewpoint of polishing the metal at high speed.
또한, 상기 폴리카르복실산계 공중합체는 상기 화학식 6으로 표시되는 구조단위를 가지는 단량체와 공중합 가능한 다른 단량체를 1종 또는 2종 이상 사용하여도 된다. 이들의 구체적인 예로는, 폴리아크릴산 중합체(PAA), 폴리메틸(메타)아크릴산 공중합체(PMAA), 폴리아크릴산말레산 공중합체(PAMA), 폴리아크릴산메틸(메타)아크릴산 공중합체(PAMAA), 폴리말레산 공중합체(PMA), 폴리메틸(메타)아크릴산말레산 공중합체(PMAMA) 및 이들의 염 등을 들 수 있다. In addition, the polycarboxylic acid copolymer may use one kind or two or more kinds of other monomers copolymerizable with the monomer having the structural unit represented by the formula (6). Specific examples thereof include polyacrylic acid polymer (PAA), polymethyl (meth) acrylic acid copolymer (PMAA), polyacrylic acid maleic acid copolymer (PAMA), polymethyl acrylate (meth) acrylic acid copolymer (PAMAA), polymale Acid copolymer (PMA), polymethyl (meth) acrylic acid maleic acid copolymer (PMAMA), these salts, etc. are mentioned.
상기 폴리카르복시산 공중합체는 조성물 총 중량에 대하여, 0.01중량% 내지 10중량%로 포함되는 것이 바람직하며, 0.05중량% 내지 5중량%으로 포함되는 것이 보다 바람직하며, 0.1중량% 내지 1중량%으로 포함되는 것이 가장 바람직하다.The polycarboxylic acid copolymer is preferably included in an amount of 0.01% to 10% by weight, more preferably 0.05% to 5% by weight, and 0.1% to 1% by weight, based on the total weight of the composition. Most preferably.
상기 양자성 알킬렌글리콜 모노알킬에테르 화합물은 유기 오염물을 용해시키는 용매 역할을 한다. 또한 상기 양자성 알킬렌글리콜 모노알킬에테르 화합물은 용매로서의 기능 외에도 세정액의 표면장력을 저하시켜 유리기판에 대한 습윤성을 증가시키므로 세정력을 향상시켜 준다. The protic alkylene glycol monoalkyl ether compound serves as a solvent for dissolving organic contaminants. In addition to the function as a solvent, the proton alkylene glycol monoalkyl ether compound lowers the surface tension of the cleaning solution to increase the wettability on the glass substrate, thereby improving the cleaning power.
상기 양자성 알킬렌글리콜 모노알킬에테르 화합물은 에틸렌글리콜모노부틸에테르(BG), 디에틸렌글리콜 모노메틸에테르(MDG), 디에틸렌글리콜 모노에틸에테르(carbitol), 디에틸렌글리콜 모노부틸에테르(BDG), 디프로필렌글리콜 모노메틸에테르(DPM), 디프로필렌글리콜 모노에틸에테르(MFDG), 트리에틸렌글리콜 모노부틸에테르(BTG), 트리에틸렌글리콜 모노에틸에테르(MTG) 및 프로필렌글리콜 모노메틸에테르(MFG)로 이루어진 군으로부터 선택되는 것이 바람직하다.The protic alkylene glycol monoalkyl ether compound is ethylene glycol monobutyl ether (BG), diethylene glycol monomethyl ether (MDG), diethylene glycol monoethyl ether (carbitol), diethylene glycol monobutyl ether (BDG), Dipropylene glycol monomethyl ether (DPM), dipropylene glycol monoethyl ether (MFDG), triethylene glycol monobutyl ether (BTG), triethylene glycol monoethyl ether (MTG) and propylene glycol monomethyl ether (MFG) It is preferably selected from the group.
상기 양자성 알킬렌글리콜 모노알킬에테르 화합물은 조성물 총 중량에 대하여 0.05 내지 20중량%로 포함되는 것이 바람직하고, 0.5 내지 10중량%로 포함되는 것이 보다 바람직하다. 상술한 범위 미만으로 포함되면 양자성 알킬렌글리콜 모노알킬에테르 화합물의 추가에 기인한 세정액 조성물의 유기 오염물에 대한 용해력 증가를 기대할 수 없다. 상술한 범위를 초과하여 포함되면 습윤성 증가에 대한 더 이상의 효과를 기대할 수 없다.The protic alkylene glycol monoalkyl ether compound is preferably contained in 0.05 to 20% by weight, more preferably in 0.5 to 10% by weight based on the total weight of the composition. When included below the above range, it is not possible to expect an increase in the solubility of the cleaning liquid composition to organic contaminants due to the addition of the protic alkylene glycol monoalkyl ether compound. If included beyond the above range, no further effect on the increase in wettability can be expected.
상기 계면활성제는 기판에 대한 습윤성을 증가시켜 균일한 세정이 이루어지도록 하며 금속 패턴 및 산화막이 존재하는 기판의 세정 공정시 금속의 부식 및 산화막의 과식각을 방지하는 효과를 갖는다. 상기 계면활성제는 음성 계면활성제, 양성 계면활성제 및 비이온성의 계면활성제으로 이루어진 군에서 선택되는 1종 또는 2종 이상인 것이 바람직하다. 특히 이들 가운데 습윤성이 우수하고 기포 발생이 보다 적은 비이온성 계면활성제를 이용하는 것이 바람직하다.The surfactant increases the wettability of the substrate so that uniform cleaning is performed, and has an effect of preventing corrosion of the metal and over-etching of the oxide film during the cleaning process of the substrate including the metal pattern and the oxide film. It is preferable that the said surfactant is 1 type (s) or 2 or more types chosen from the group which consists of a negative surfactant, an amphoteric surfactant, and a nonionic surfactant. Among these, it is preferable to use nonionic surfactant which is excellent in wettability and has less bubble generation.
상기 비이온성 계면활성제는 폴리옥시에틸렌/폴리옥시프로필렌 글리콜형, 폴리옥시에틸렌알킬에테르형, 폴리옥시에틸렌 알킬페닐에테르형, 폴리옥시에틸렌/폴리옥시프로필렌알킬에테르형, 폴리옥시에틸렌/폴리옥시부틸렌알킬에테르형, 폴리옥시에틸렌알킬아미노에테르형, 폴리옥시에틸렌알킬아미드에테르형, 폴리에틸렌글리콜지방산에스테르형, 솔비탄지방산 에스테르형, 지방산 에스테르형, 글리세린 지방산 에스테르형, 폴리글리세롤 지방산 에스테르형, 글리세린에스테르형, 알키롤아미드형, 지방산 아미드형 및 옥시에틸렌 첨가 지방산 아미드형으로 이루어진 군에서 선택되는 1종 또는 2종 이상인 것이 바람직하다. 이 중에서도, 계면활성제 분자의 구조 중에 친수기로서 옥시 에틸렌기(EO기)를 갖고, 소수기로서는 옥시프로필렌기(PO기) 및 또는 옥시 부틸렌기(BO기)을 가지는, 폴리옥시에틸렌/폴리옥시부틸렌알킬에테르형 공중합체인 것이 바람직하다. 여기서, EO기는 -CH2-CH2-O-로 표시되고, 옥시 프로필렌기는 -CH(CH3)-CH2-O- 또는 -CH2-CH(CH3)-O-, 옥시 부틸렌기는 -CH2-CH2-CH2-CH2-O-, -CH(CH3)-CH2-CH2-O-, -CH2-CH(CH3)-CH2-O-, 또는 -CH2-CH2-CH(CH3)2-O-로 표시된다. EO기와 PO기, BO기의 공중합 부분은, 블록 공중합체이어도, 랜덤한 공중합체이어도, 블록(block)성을 띤 랜덤(random) 다중합체이어도 좋다. 또한 그 공중합 분자는, EO기와 PO기에 의한 공중합체, EO기와 BO기에 의한 공중합체, 혹은 EO기와 PO기, BO기에 의한 공중합체이어도 좋다. 친수기의 EO기와, 소수기의 PO기 또는 BO기의, 계면활성제 분자 중에서의 존재 비율로서는, EO기의 총 몰수를 X, PO기 또는 BO기의 총 몰수를 Y라고 했을 경우, X/(X+Y)이 0.05 내지 0.7의 범위인 것이 바람직하다.The nonionic surfactants are polyoxyethylene / polyoxypropylene glycol type, polyoxyethylene alkyl ether type, polyoxyethylene alkylphenyl ether type, polyoxyethylene / polyoxypropylene alkyl ether type, polyoxyethylene / polyoxybutylene Alkyl ether type, polyoxyethylene alkyl amino ether type, polyoxyethylene alkylamide ether type, polyethylene glycol fatty acid ester type, sorbitan fatty acid ester type, fatty acid ester type, glycerin fatty acid ester type, polyglycerol fatty acid ester type, glycerin ester type It is preferable that it is 1 type (s) or 2 or more types chosen from the group which consists of alkyramide type | mold, fatty acid amide type, and oxyethylene addition fatty acid amide type. Among these, polyoxyethylene / polyoxybutylene which has an oxyethylene group (EO group) as a hydrophilic group in the structure of surfactant molecule, and has an oxypropylene group (PO group) and or an oxy butylene group (BO group) as a hydrophobic group. It is preferable that it is an alkyl ether type copolymer. Here, the EO group is represented by -CH 2 -CH 2 -O-, the oxypropylene group is -CH (CH 3 ) -CH 2 -O- or -CH 2 -CH (CH 3 ) -O-, and the oxybutylene group -CH 2 -CH 2 -CH 2 -CH 2 -O-, -CH (CH 3 ) -CH 2 -CH 2 -O-, -CH 2 -CH (CH 3 ) -CH 2 -O-, or It is represented by CH 2 -CH 2 -CH (CH 3 ) 2 -O-. The copolymerization portion of the EO group, the PO group, and the PO group may be a block copolymer, a random copolymer, or a random polypolymer having block properties. In addition, the copolymer molecule may be a copolymer of an EO group or a PO group, a copolymer of an EO group or a PO group, or a copolymer of the EO group or a PO group or a BA group. As the ratio of the number of moles of the EO group to X, the number of moles of the PO group or the BOH group as Y, X / (X + It is preferable that Y) is in the range of 0.05 to 0.7.
또한, 상기 비이온성 계면활성제의 말단은, 단지 수소, 수산기, 알킬기 및 알케닐기로 이루어진 군에서 선택되는 1종 또는 2종 이상이어도 무방하다. 또한, 에틸렌 디아민이나 글리세린을 부가시킨 구조이어도 무방하다. 이러한 비이온성 계면활성제의 예로는, 폴리옥시에틸렌/폴리옥시프로필렌 축합물, 폴리옥시에틸렌/폴리옥시부틸렌 축합물, 폴리옥시에틸렌/폴리옥시프로필렌 디카닐에테르축합물, 폴리옥시에틸렌/폴리옥시프로필렌 데카닐에테르축합물, 폴리옥시에틸렌/폴리옥시프로필렌 운데카닐에테르축합물, 폴리옥시에틸렌/폴리옥시프로필렌 도데카닐에테르축합물, 폴리옥시에틸렌/폴리옥시프로필렌 테트라데카닐에테르축합물, 폴리옥시에틸렌/폴리옥시부틸렌 데카닐에테르축합물, 폴리옥시에틸렌/폴리옥시부틸렌 운데카닐에테르축합물, 폴리옥시에틸렌/폴리옥시부틸렌 도데카닐에테르축합물, 폴리옥시에틸렌/폴리옥시부틸렌 테트라데카닐에테르축합물, 폴리옥시에틸렌/폴리옥시프로필렌2-에틸헥실에테르, 폴리옥시에틸렌/폴리옥시프로필렌 라우릴에테르, 폴리옥시에틸렌/폴리옥시프로필렌 스테아릴에테르, 글리세린부가형 폴리옥시에틸렌/폴리옥시프로필렌 축합물, 글리세린부가형 폴리옥시에틸렌/폴리옥시부틸렌 축합물 에틸렌디아민부가형 폴리옥시에틸렌/폴리옥시프로필렌 축합물, 에틸렌디아민부가형 폴리옥시에틸렌/폴리옥시부틸렌 축합물 폴리옥시에틸렌/폴리옥시부틸렌2-에틸헥실에테르, 폴리옥시에틸렌/폴리옥시부틸렌 라우릴에테르, 폴리옥시에틸렌/폴리옥시부틸렌 스테아릴에테르 등을 들 수 있다.In addition, the terminal of the said nonionic surfactant may be 1 type, or 2 or more types chosen from the group which consists only of a hydrogen, a hydroxyl group, an alkyl group, and an alkenyl group. Moreover, the structure which added ethylene diamine and glycerol may be sufficient. Examples of such nonionic surfactants include polyoxyethylene / polyoxypropylene condensates, polyoxyethylene / polyoxybutylene condensates, polyoxyethylene / polyoxypropylene dicanylether condensates, polyoxyethylene / polyoxypropylene Decanyl ether condensates, polyoxyethylene / polyoxypropylene undecanyl ether condensates, polyoxyethylene / polyoxypropylene dodecanyl ether condensates, polyoxyethylene / polyoxypropylene tetradecanyl ether condensates, polyoxyethylene / Polyoxybutylene decanyl ether condensate, polyoxyethylene / polyoxybutylene undecanyl ether condensate, polyoxyethylene / polyoxybutylene dodecanyl ether condensate, polyoxyethylene / polyoxybutylene tetradecanyl ether Condensate, polyoxyethylene / polyoxypropylene 2-ethylhexyl ether, polyoxyethylene / polyoxypropylene lauryl Le, polyoxyethylene / polyoxypropylene stearyl ether, glycerin addition polyoxyethylene / polyoxypropylene condensate, glycerin addition polyoxyethylene / polyoxybutylene condensate ethylenediamine addition polyoxyethylene / polyoxypropylene condensate, Ethylenediamine addition type polyoxyethylene / polyoxybutylene condensate polyoxyethylene / polyoxybutylene 2-ethylhexyl ether, polyoxyethylene / polyoxybutylene lauryl ether, polyoxyethylene / polyoxybutylene stearyl ether Etc. can be mentioned.
바람직하게는 폴리옥시에틸렌/폴리옥시프로필렌 축합물, 폴리옥시에틸렌 폴리옥시부틸렌 축합물, 글리세린부가형 폴리옥시에틸렌 폴리옥시프로필렌 축합물 및 에틸렌디아민부가형 폴리옥시에틸렌 폴리옥시프로필렌 축합물이고, 보다 바람직하게는 폴리옥시에틸렌 폴리옥시프로필렌 축합물 또는 에틸렌디아민부가형 폴리옥시에틸렌 폴리옥시프로필렌 축합물이다. Preferred are polyoxyethylene / polyoxypropylene condensates, polyoxyethylene polyoxybutylene condensates, glycerin added polyoxyethylene polyoxypropylene condensates and ethylenediamine added polyoxyethylene polyoxypropylene condensates, more preferably Is a polyoxyethylene polyoxypropylene condensate or an ethylenediamine addition polyoxyethylene polyoxypropylene condensate.
상기 계면활성제는 조성물 총 중량에 대하여, 0.001 내지 1.0중량%로 포함되는 것이 바람직하고, 0.01 내지 0.5중량%로 포함되는 것이 보다 바람직하다. 상술한 범위 미만으로 포함되면 유리기판의 세정 균일도 증가 효과가 미미하며, 상술한 범위를 초과하여 포함되면 세정 균일도는 일정하나 그 이상 증가하지 않고 일정 범위 내에서 수렴한다.The surfactant is preferably included in 0.001 to 1.0% by weight, more preferably 0.01 to 0.5% by weight based on the total weight of the composition. If it is included in the above-described range, the cleaning uniformity increase effect of the glass substrate is insignificant. If it is included in the above-mentioned range, the cleaning uniformity is constant but converges within a certain range without increasing more.
본 발명의 평판표시장치용 세정액 조성물을 이용한 세정방법은 당 업계에 통상적으로 알려진 방법에 의하여 수행할 수 있다. 상기 세정방법은 스프레이(spray) 방식, 스핀(spin) 방식, 딥핑(dipping) 방식 및 초음파를 이용한 딥핑방식으로 이루어진 군에서 선택되는 1종 또는 2종 이상으로 수행되는 것이 바람직하다. 본 발명의 세정방법이 가장 우수한 세정 효과를 나타낼 수 있는 온도는 20내지 80℃이며, 바람직하게는 20내지 50℃이다. 또한 본 발명의 세정방법은 30초 내지 10분 동안 수행되는 것이 바람직하다.The cleaning method using the cleaning liquid composition for a flat panel display device of the present invention may be performed by a method commonly known in the art. The cleaning method is preferably performed by one or two or more selected from the group consisting of a spray method, a spin method, a dipping method, and a dipping method using ultrasonic waves. The temperature at which the cleaning method of the present invention can exhibit the most excellent cleaning effect is 20 to 80 ° C, preferably 20 to 50 ° C. In addition, the cleaning method of the present invention is preferably carried out for 30 seconds to 10 minutes.
이하에서 본 발명을 실시예를 통하여 더욱 구체적으로 설명한다. 그러나, 하기의 실시예에 의하여 본 발명의 범위가 제한되는 것은 아니다.Hereinafter, the present invention will be described in more detail with reference to Examples. However, the scope of the present invention is not limited by the following examples.
실시예1 내지 실시예19 및 비교예1 내지 비교예3: 세정액 조성물의 제조Examples 1 to 19 and Comparative Examples 1 to 3: Preparation of Cleaning Liquid Composition
표 1에 기재된 구성성분 및 조성으로 혼합하고 교반하여 세정액 조성물을 제조하였다.Washing liquid compositions were prepared by mixing and stirring with the ingredients and compositions shown in Table 1.
표 1
고리형 아민 화합물 첨가제 * GE 폴리카르복시산공중합쳬 계면활성제
종류 중량% 종류 중량% 종류 중량% 종류 중량% 종류 중량%
실시예1 NHEP1 0.2 *1) 0.05 - - - - - - 잔량
실시예2 NHEP1 0.2 *2) 0.2 - - - - - - 잔량
실시예3 NHEP1 0.2 *3) 0.2 - - - - - - 잔량
실시예4 NHEP1 1.0 *1) 0.1 - - - - - - 잔량
실시예5 HEMP 0.2 *1) 0.05 - - - - - - 잔량
실시예6 HEMP 0.2 *2) 0.2 - - - - - - 잔량
실시예7 HEMP 0.2 *3) 0.2 - - - - - - 잔량
실시예8 HEMP 1.0 *1) 0.1 - - - - - - 잔량
실시예9 NHEM 0.2 *1) 0.05 - - - - - - 잔량
실시예10 NHEM 0.2 *2) 0.2 - - - - - - 잔량
실시예11 NHEM 0.2 *3) 0.2 - - - - - - 잔량
실시예12 NHEM 1.0 *1) 0.1 - - - - - - 잔량
실시예13 NHEP 1.0 *1) 0.1 *4) 0.5 - - - - 잔량
실시예14 NHEP 1.0 *1) 0.1 *5) 0.5 - - - - 잔량
실시예15 NHEP 1.0 *1) 0.1 *6) 0.5 - - - - 잔량
실시예16 NHEP 1.0 *1) 0.1 - - *7) 0.2 - - 잔량
실시예17 NHEP 1.0 *1) 0.1 - - *8) 0.2 - - 잔량
실시예18 NHEP 1.0 *1) 0.1 - - - - *9) 0.02 잔량
실시예19 NHEP 1.0 *1) 0.1 - - - - *10) 0.02 잔량
비교예1 TMAH 1.0 *2) 0.3 - - - - - - 잔량
비교예2 NH4OH 1.0 - - - - - - - - 잔량
비교예3 MEA 1.0 - - - - - - - - 잔량
Table 1
Cyclic amine compounds additive * GE Polycarboxylic Acid Copolymerization 쳬 Surfactants water
Kinds weight% Kinds weight% Kinds weight% Kinds weight% Kinds weight%
Example 1 NHEP1 0.2 *One) 0.05 - - - - - - Remaining amount
Example 2 NHEP1 0.2 *2) 0.2 - - - - - - Remaining amount
Example 3 NHEP1 0.2 * 3) 0.2 - - - - - - Remaining amount
Example 4 NHEP1 1.0 *One) 0.1 - - - - - - Remaining amount
Example 5 HEMP 0.2 *One) 0.05 - - - - - - Remaining amount
Example 6 HEMP 0.2 *2) 0.2 - - - - - - Remaining amount
Example 7 HEMP 0.2 * 3) 0.2 - - - - - - Remaining amount
Example 8 HEMP 1.0 *One) 0.1 - - - - - - Remaining amount
Example 9 NHEM 0.2 *One) 0.05 - - - - - - Remaining amount
Example 10 NHEM 0.2 *2) 0.2 - - - - - - Remaining amount
Example 11 NHEM 0.2 * 3) 0.2 - - - - - - Remaining amount
Example 12 NHEM 1.0 *One) 0.1 - - - - - - Remaining amount
Example 13 NHEP 1.0 *One) 0.1 *4) 0.5 - - - - Remaining amount
Example 14 NHEP 1.0 *One) 0.1 * 5) 0.5 - - - - Remaining amount
Example 15 NHEP 1.0 *One) 0.1 * 6) 0.5 - - - - Remaining amount
Example 16 NHEP 1.0 *One) 0.1 - - * 7) 0.2 - - Remaining amount
Example 17 NHEP 1.0 *One) 0.1 - - *8) 0.2 - - Remaining amount
Example 18 NHEP 1.0 *One) 0.1 - - - - * 9) 0.02 Remaining amount
Example 19 NHEP 1.0 *One) 0.1 - - - - * 10) 0.02 Remaining amount
Comparative Example 1 TMAH 1.0 *2) 0.3 - - - - - - Remaining amount
Comparative Example 2 NH 4 OH 1.0 - - - - - - - - Remaining amount
Comparative Example 3 MEA 1.0 - - - - - - - - Remaining amount
주) NHEP1: N-(2-히드록시에틸)피페라진 NHEP 1: N- (2-hydroxyethyl) piperazine
HEMP: 1-(2-히드록시에틸)-4-메틸피페라진 HEMP: 1- (2-hydroxyethyl) -4-methylpiperazine
NHEM: N-(2-히드록시에틸)모폴린NHEM: N- (2-hydroxyethyl) morpholine
TMAH: 테트라메틸암모늄 히드록시드TMAH: Tetramethylammonium Hydroxide
NH4OH: 암모늄 히드록시드NH 4 OH: ammonium hydroxide
MEA: 모노 에탄올 아민MEA: Monoethanol Amine
*1): 2,2’-[[[에틸-1수소-벤조트리아졸-1-일]메틸]이미노]비스에탄올* 1): 2,2 '-[[[ethyl-1 hydrogen-benzotriazol-1-yl] methyl] imino] bisethanol
*2): EMADOX-NA(상품명, 제조사: LABEMA Co.)* 2): EMADOX-NA (trade name: LABEMA Co.)
*3): 아스코르빅산* 3): Ascorbic acid
*GE: 양자성 알킬렌글리콜 모노알킬에테르* GE: protic alkylene glycol monoalkyl ether
*4): 디에틸렌글리콜 모노메틸에테르* 4) diethylene glycol monomethyl ether
*5): 디에틸렌글리콜 모노부틸에테르* 5) diethylene glycol monobutyl ether
*6): 트리에틸렌글리콜 모노에틸에테르* 6): triethylene glycol monoethyl ether
*7): 폴리아크릴산중합체(PAA)* 7): polyacrylic acid polymer (PAA)
*8): 폴리메틸아크릴산공중합체(PMAA)* 8): polymethylacrylic acid copolymer (PMAA)
*9): 폴리옥시에틸렌/폴리옥시프로필렌 글리콜* 9): polyoxyethylene / polyoxypropylene glycol
*10): 에틸렌디아민부가형 폴리옥시에틸렌/폴리옥시프로필렌 축합물* 10): Ethylenediamine-Added Polyoxyethylene / Polyoxypropylene Condensate
시험예1: 세정액 조성물의 특성 평가Test Example 1 Evaluation of Characteristics of Cleaning Liquid Composition
1) 구리 에칭 속도 평가1) copper etch rate evaluation
먼저 구리가 2500 두께로 형성된 유리기판을 실시예1 내지 실시예12 및 비교예1 내지 비교예3의 세정액 조성물에 30분간 디핑시킨다. 이때 세정액의 온도는 40℃이며 구리 막의 두께를 디핑 이전 및 이후에 측정하고, 구리막의 용해속도를 구리막의 두께 변화로부터 계산하여 측정한다. 그 결과를 표 2에 기재하였다.First, a glass substrate having a copper thickness of 2500 was dipped into the cleaning liquid compositions of Examples 1 to 12 and Comparative Examples 1 to 3 for 30 minutes. At this time, the temperature of the cleaning liquid is 40 ℃ and the thickness of the copper film is measured before and after dipping, the dissolution rate of the copper film is calculated by calculating from the change in the thickness of the copper film. The results are shown in Table 2.
2) 유기 오염물 제거력 평가-12) Evaluation of Organic Pollutant Removal Capacity-1
유기 오염물의 제거력 평가를 위해 5㎝ x 5㎝ 크기로 형성된 유리기판 위에 사람의 지문 자국 또는 유기성분 사인펜으로 오염시키고, 오염된 기판을 스프레이식 유리 기판 세정장치를 이용하여 2분 동안 40℃에서 실시예4, 실시예8, 실시예12 내지 실시예19의 세정액 조성물로 세정하였다. 세정 후 초순수에 30초 세척한 후 질소로 건조하였다. In order to evaluate the removal power of organic contaminants, the human body is stained with a fingerprint or an organic signature pen on a glass substrate formed of 5 cm x 5 cm, and the contaminated substrate is carried out at 40 ° C. for 2 minutes using a spray glass substrate cleaning device. It wash | cleaned with the cleaning liquid composition of Example 4, Example 8, and Example 12-19. After washing for 30 seconds in ultrapure water and dried with nitrogen.
이때 하기 표 2에서 유기 오염물의 제거 유무는 제거가 되었을 때, ○, 제거가 되지 않았을 때 x로 표시하였다. 또한 실시예16에 의한 유기 오염물 제거 결과를 도 1 내지 도 4에 나타내었다. 여기서, 도 1은 유기 오염물 중 유기 사인펜 자국으로 오염된 유리기판을 나타낸 사진이다. 도 2는 본 발명의 실시예16에 따른 세정액 조성물을 이용하여 도 1에 도시된 유기 사인펜 자국이 제거되는 결과를 나타내는 사진이다. 도 3은 유기 오염물 중 사람의 지문으로 오염된 유리기판을 나타낸 사진이다. 도 4는 본 발명의 실시예16에 따른 세정액 조성물을 이용하여 도 3에 도시된 사람의 지문성분이 제거되는 결과를 나타내는 사진이다.At this time, the presence or absence of the organic contaminants in Table 2, when removed, was indicated by x, when not removed. In addition, the organic contaminant removal results according to Example 16 are shown in FIGS. 1 to 4. 1 is a photograph showing a glass substrate contaminated with an organic sign pen mark among organic contaminants. FIG. 2 is a photograph showing a result of removing the organic sign pen marks shown in FIG. 1 using the cleaning liquid composition according to Example 16 of the present invention. 3 is a photograph showing a glass substrate contaminated with human fingerprints among organic contaminants. Figure 4 is a photograph showing the result of removing the fingerprint component of the person shown in Figure 3 using the cleaning liquid composition according to Example 16 of the present invention.
3) 유기 오염물 제거력 평가-23) Evaluation of Organic Pollutant Removal Capacity-2
또한, 유리기판을 대기중에 24시간 방치하여 대기중의 각종 유기물, 무기물, 파티클 등에 오염시킨 후 스프레이식 유리 기판 세정장치를 이용하여 2분동안 40℃에서 실시예4, 실시예8, 실시예12 내지 실시예19의 세정액 조성물으로 세정하였다 세정 후 초순수에 30초 세척한 후 질소로 건조하였다. 상기 유리기판 위에 0.5㎕의 초순수 방울을 떨어뜨려 세정후의 접촉각을 측정하였다. 그 결과를 표 2에 나타내었다.In addition, the glass substrate is left in the air for 24 hours to contaminate various organic substances, inorganic substances, particles, etc. in the air, and then, using the spray-type glass substrate cleaning apparatus, the sample is carried out at 40 ° C. for 2 minutes. Examples 4, 8 and 12 To the cleaning liquid composition of Example 19 to 30 seconds after washing in ultrapure water and then dried with nitrogen. 0.5 μl of ultrapure water was dropped on the glass substrate to measure the contact angle after washing. The results are shown in Table 2.
4) 유기 오염물 제거력 평가-34) Evaluation of organic pollutant removal-3
실시예4, 실시예8, 실시예12, 실시예13, 실시예16 및 실시예18의 세정액 조성물을 가지고, 유기 파티클 솔루션으로 오염시킨 유리기판에 대한 세정을 실시하였다. 즉, 유리기판을 평균 입자 크기가 0.8㎛인 유기 파티클 솔루션으로 오염시키고 1분간 3000rpm으로 스핀(spin) 드라이한 후 스프레이식 유리 기판 세정장치를 이용하여 2분 동안 40℃에서 각각의 세정액으로 세정하였다. 세정 후 초순수에 30초 세척한 후 질소로 건조하였다. 세정 전후의 파티클 수는 표면입자측정기(Topcon WM-1500)로 0.1㎛ 이상의 파티클 수를 측정하였고, 표 2에 나타내었다.The glass substrates having the cleaning liquid compositions of Examples 4, 8, 12, 13, 16 and 18 were contaminated with an organic particle solution were washed. That is, the glass substrate was contaminated with an organic particle solution having an average particle size of 0.8 μm, spin-dried at 3000 rpm for 1 minute, and then washed with each cleaning solution at 40 ° C. for 2 minutes using a spray-type glass substrate cleaner. . After washing for 30 seconds in ultrapure water and dried with nitrogen. The number of particles before and after cleaning was measured by a particle size measuring instrument (Topcon WM-1500) of 0.1 μm or more, and is shown in Table 2.
표 2
Cu 에칭속도(Å/분) 유기지문 유기사인펜 접촉각 세정전 파티클수 세정후 파티클수 제거율(%)
실시예1 1.0 - - - - - -
실시예2 1.6 - - - - - -
실시예3 1.3 - - - - - -
실시예4 0.8 35 2851 484 83
실시예5 0.7 - - - - - -
실시예6 1.4 - - - - - -
실시예7 0.9 - - - - - -
실시예8 0.6 39 2936 675 77
실시예9 0.6 - - - - - -
실시예10 1.2 - - - - - -
실시예11 0.8 - - - - - -
실시예12 0.5 38 2987 627 79
실시예13 - 32 2913 407 86
실시예14 - 34 - - -
실시예15 - 34 - - -
실시예16 - 38 3012 542 82
실시예17 - 38 - - -
실시예18 - 33 3187 478 85
실시예19 - 32 - - -
비교예1 62 - - - - - -
비교예2 70 - - - - - -
비교예3 66 - - - - - -
TABLE 2
Cu etching rate (ms / min) Organic fingerprint Organic sign pen Contact angle Number of particles before cleaning Number of particles after cleaning % Removal
Example 1 1.0 - - - - - -
Example 2 1.6 - - - - - -
Example 3 1.3 - - - - - -
Example 4 0.8 35 2851 484 83
Example 5 0.7 - - - - - -
Example 6 1.4 - - - - - -
Example 7 0.9 - - - - - -
Example 8 0.6 39 2936 675 77
Example 9 0.6 - - - - - -
Example 10 1.2 - - - - - -
Example 11 0.8 - - - - - -
Example 12 0.5 38 2987 627 79
Example 13 - 32 2913 407 86
Example 14 - 34 - - -
Example 15 - 34 - - -
Example 16 - 38 3012 542 82
Example 17 - 38 - - -
Example 18 - 33 3187 478 85
Example 19 - 32 - - -
Comparative Example 1 62 - - - - - -
Comparative Example 2 70 - - - - - -
Comparative Example 3 66 - - - - - -
표 2를 참조하면, 실시예1 내지 12의 세정액 조성물은 구리에 대한 부식방지 효과가 있었다. 그러나 고리형 아민 화합물이 아닌 알카리성 화합물이 포함되어 있는 비교예1 내지 3의 경우에는, 구리의 부식 현상이 관찰되었다.Referring to Table 2, the cleaning liquid compositions of Examples 1 to 12 had an anticorrosion effect on copper. However, in the case of Comparative Examples 1 to 3 in which an alkaline compound other than the cyclic amine compound was contained, corrosion phenomenon of copper was observed.
또한, 실시예4, 실시예8, 실시예 12, 실시예13, 실시예16 내지 실시예19의 세정액 조성물은 모두 유기 오염물의 제거력이 있음을 보였으며, 접촉각이 20°내지 40°를 갖게 되어 유기 오염물의 제거능력을 나타내었다.In addition, all of the cleaning liquid compositions of Examples 4, 8, 12, 13, and 16-19 were shown to have the ability to remove organic contaminants, and the contact angles were 20 ° to 40 °. The ability to remove organic contaminants was shown.
실시예4, 실시예8, 실시예12, 실시예13, 실시예16 및 실시예18의 세정액 조성물로 유기 파티클 솔루션으로 오염시킨 유리기판에 대한 세정을 실시하였을 때 77 내지 86%에 가까운 파티클 제거력을 나타내었다.Particle removal force of 77-86% when cleaning the glass substrate contaminated with the organic particle solution with the cleaning liquid compositions of Examples 4, 8, 12, 13, 16 and 18 Indicated.
실시예20 내지 실시예38: 세정액 조성물의 제조Examples 20-38 Preparation of Cleaning Liquid Compositions
표 3에 기재된 구성성분 및 조성으로 혼합하고 교반하여 세정액 조성물을 제조하였다.Washing liquid compositions were prepared by mixing and stirring with the ingredients and compositions shown in Table 3.
표 3
고리형 아민 화합물 첨가제 * GE 폴리카르복시산공중합쳬 계면활성제
종류 중량% 종류 중량% 종류 중량% 종류 중량% 종류 중량%
실시예20 NHEP2 0.2 *1) 0.05 - - - - - - 잔량
실시예21 NHEP2 0.2 *2) 0.2 - - - - - - 잔량
실시예22 NHEP2 0.2 *3) 0.2 - - - - - - 잔량
실시예23 NHEP2 1.0 *1) 0.1 - - - - - - 잔량
실시예24 NHPP2 0.2 *1) 0.05 - - - - - - 잔량
실시예25 NHPP2 0.2 *2) 0.2 - - - - - - 잔량
실시예26 NHPP2 0.2 *3) 0.2 - - - - - - 잔량
실시예27 NHPP2 1.0 *1) 0.1 - - - - - - 잔량
실시예28 HEP 0.2 *1) 0.05 - - - - - - 잔량
실시예29 HEP 0.2 *2) 0.2 - - - - - - 잔량
실시예30 HEP 0.2 *3) 0.2 - - - - - - 잔량
실시예31 HEP 1.0 *1) 0.1 - - - - - - 잔량
실시예32 NHEP 1.0 *1) 0.1 *4) 0.5 - - - - 잔량
실시예33 NHEP 1.0 *1) 0.1 *5) 0.5 - - - - 잔량
실시예34 NHEP 1.0 *1) 0.1 *6) 0.5 - - - - 잔량
실시예35 NHEP 1.0 *1) 0.1 - - *7) 0.2 - - 잔량
실시예36 NHEP 1.0 *1) 0.1 - - *8) 0.2 - - 잔량
실시예37 NHEP 1.0 *1) 0.1 - - - - *9) 0.02 잔량
실시예38 NHEP 1.0 *1) 0.1 - - - - *10) 0.02 잔량
TABLE 3
Cyclic amine compounds additive * GE Polycarboxylic Acid Copolymerization 쳬 Surfactants water
Kinds weight% Kinds weight% Kinds weight% Kinds weight% Kinds weight%
Example 20 NHEP2 0.2 *One) 0.05 - - - - - - Remaining amount
Example 21 NHEP2 0.2 *2) 0.2 - - - - - - Remaining amount
Example 22 NHEP2 0.2 * 3) 0.2 - - - - - - Remaining amount
Example 23 NHEP2 1.0 *One) 0.1 - - - - - - Remaining amount
Example 24 NHPP2 0.2 *One) 0.05 - - - - - - Remaining amount
Example 25 NHPP2 0.2 *2) 0.2 - - - - - - Remaining amount
Example 26 NHPP2 0.2 * 3) 0.2 - - - - - - Remaining amount
Example 27 NHPP2 1.0 *One) 0.1 - - - - - - Remaining amount
Example 28 HEP 0.2 *One) 0.05 - - - - - - Remaining amount
Example 29 HEP 0.2 *2) 0.2 - - - - - - Remaining amount
Example 30 HEP 0.2 * 3) 0.2 - - - - - - Remaining amount
Example 31 HEP 1.0 *One) 0.1 - - - - - - Remaining amount
Example 32 NHEP 1.0 *One) 0.1 *4) 0.5 - - - - Remaining amount
Example 33 NHEP 1.0 *One) 0.1 * 5) 0.5 - - - - Remaining amount
Example 34 NHEP 1.0 *One) 0.1 * 6) 0.5 - - - - Remaining amount
Example 35 NHEP 1.0 *One) 0.1 - - * 7) 0.2 - - Remaining amount
Example 36 NHEP 1.0 *One) 0.1 - - *8) 0.2 - - Remaining amount
Example 37 NHEP 1.0 *One) 0.1 - - - - * 9) 0.02 Remaining amount
Example 38 NHEP 1.0 *One) 0.1 - - - - * 10) 0.02 Remaining amount
주) NHEP2: N-(2-히드록시에틸)피페리딘NHEP2: N- (2-hydroxyethyl) piperidine
NHPP: N-(2-히드록시프로필)피페리딘 NHPP: N- (2-hydroxypropyl) piperidine
HEP: 1-(2-히드록시에틸)-2-피롤리돈HEP: 1- (2-hydroxyethyl) -2-pyrrolidone
*1): 2,2’-[[[에틸-1수소-벤조트리아졸-1-일]메틸]이미노]비스에탄올* 1): 2,2 '-[[[ethyl-1 hydrogen-benzotriazol-1-yl] methyl] imino] bisethanol
*2): EMADOX-NA(상품명, 제조사: LABEMA Co.)* 2): EMADOX-NA (trade name: LABEMA Co.)
*3): 아스코르빅산* 3): Ascorbic acid
*GE: 양자성 알킬렌글리콜 모노알킬에테르* GE: protic alkylene glycol monoalkyl ether
*4): 디에틸렌글리콜 모노메틸에테르* 4) diethylene glycol monomethyl ether
*5): 디에틸렌글리콜 모노부틸에테르* 5) diethylene glycol monobutyl ether
*6): 트리에틸렌글리콜 모노에틸에테르* 6): triethylene glycol monoethyl ether
*7): 폴리아크릴산중합체(PAA)* 7): polyacrylic acid polymer (PAA)
*8): 폴리메틸아크릴산공중합체(PMAA)* 8): polymethylacrylic acid copolymer (PMAA)
*9): 폴리옥시에틸렌/폴리옥시프로필렌 글리콜* 9): polyoxyethylene / polyoxypropylene glycol
*10): 폴리옥시에틸렌/폴리옥시프로필렌 에틸렌디아민 축합물* 10): polyoxyethylene / polyoxypropylene ethylenediamine condensate
시험예2: 세정액 조성물의 특성 평가Test Example 2: Evaluation of Characteristics of Cleaning Liquid Composition
1) 구리 에칭 속도 평가1) copper etch rate evaluation
먼저 구리가 2500 두께로 형성된 유리기판을 실시예20 내지 실시예31 및 비교예1 내지 비교예3의 세정액 조성물에 30분간 디핑시킨다. 이때 세정액의 온도는 40℃이며 구리 막의 두께를 디핑 이전 및 이후에 측정하고, 구리막의 용해속도를 구리막의 두께 변화로부터 계산하여 측정한다. 그 결과를 표 4에 기재하였다.First, a glass substrate having a copper thickness of 2500 was dipped into the cleaning liquid compositions of Examples 20 to 31 and Comparative Examples 1 to 3 for 30 minutes. At this time, the temperature of the cleaning liquid is 40 ℃ and the thickness of the copper film is measured before and after dipping, and the dissolution rate of the copper film is calculated by calculating from the change in the thickness of the copper film. The results are shown in Table 4.
2) 유기 오염물 제거력 평가-12) Evaluation of Organic Pollutant Removal Capacity-1
유기 오염물의 제거력 평가를 위해 5㎝ x 5㎝ 크기로 형성된 유리기판 위에 사람의 지문 자국 또는 유기성분 사인펜으로 오염시키고, 오염된 기판을 스프레이식 유리 기판 세정장치를 이용하여 2분 동안 40℃에서 실시예23, 실시예27, 실시예31 내지 실시예38의 세정액 조성물로 세정하였다. 세정 후 초순수에 30초 세척한 후 질소로 건조하였다. In order to evaluate the removal power of organic contaminants, the human body is stained with a fingerprint or an organic signature pen on a glass substrate formed of 5 cm x 5 cm, and the contaminated substrate is carried out at 40 ° C. for 2 minutes using a spray glass substrate cleaning device. It wash | cleaned with the cleaning liquid composition of Example 23, Example 27, and Example 31-38. After washing for 30 seconds in ultrapure water and dried with nitrogen.
이때 하기 표 4에서 유기 오염물의 제거 유무는 제거가 되었을 때, ○, 제거가 되지 않았을 때 x로 표시하였다. 또한, 실시예35에 의한 유기 오염물 제거 결과를 도 5 내지 도 8에 나타내었다. 여기서, 도 5는 유기 오염물 중 유기 사인펜 자국으로 오염된 유리기판을 나타낸 사진이다. 도 6은 본 발명의 실시예32에 따른 세정액 조성물을 이용하여 도 5에 도시된 유기 사인펜 자국이 제거되는 결과를 나타내는 사진이다. 도 7은 유기 오염물 중 사람의 지문으로 오염된 유리기판을 나타낸 사진이다. 도 8는 본 발명의 실시예32에 따른 세정액 조성물을 이용하여 도 7에 도시된 사람의 지문성분이 제거되는 결과를 나타내는 사진이다.At this time, the presence or absence of the organic contaminants in Table 4, when removed, was indicated by x, when not removed. In addition, the results of removing organic contaminants according to Example 35 are shown in FIGS. 5 to 8. 5 is a photograph showing a glass substrate contaminated with an organic sign pen mark among organic contaminants. FIG. 6 is a photograph showing a result of removing the organic sign pen marks shown in FIG. 5 using the cleaning liquid composition according to Example 32 of the present invention. FIG. 7 is a photograph showing a glass substrate contaminated with human fingerprints among organic contaminants. 8 is a photograph showing the result of removing the fingerprint component of the person shown in FIG. 7 by using the cleaning liquid composition according to Example 32 of the present invention.
3) 유기 오염물 제거력 평가-23) Evaluation of Organic Pollutant Removal Capacity-2
또한, 유리기판을 대기중에 24시간 방치하여 대기중의 각종 유기물, 무기물, 파티클 등에 오염시킨 후 스프레이식 유리 기판 세정장치를 이용하여 2분 동안 40℃에서 실시예23, 실시예27, 실시예31 내지 실시예38의 세정액 조성물으로 세정하였다 세정 후 초순수에 30초 세척한 후 질소로 건조하였다. 상기 유리기판 위에 0.5㎕의 초순수 방울을 떨어뜨려 세정후의 접촉각을 측정하였다. 그 결과를 표 4에 나타내었다.In addition, the glass substrate is left in the air for 24 hours to contaminate various organic substances, inorganic substances, particles, etc. in the air, and then, at 23 ° C. for 2 minutes using a spray-type glass substrate cleaning device, Examples 23, 27 and 31 are used. After washing with the cleaning liquid composition of Example 38 After washing 30 seconds in ultrapure water and then dried with nitrogen. 0.5 μl of ultrapure water was dropped on the glass substrate, and the contact angle after washing was measured. The results are shown in Table 4.
4) 유기 오염물 제거력 평가-34) Evaluation of organic pollutant removal-3
실시예23, 실시예27, 실시예31, 실시예32, 실시예35 및 실시예37의 세정액 조성물을 가지고, 유기 파티클 솔루션으로 오염시킨 유리기판에 대한 세정을 실시하였다. 즉, 유리기판을 평균 입자 크기가 0.8㎛인 유기 파티클 솔루션으로 오염시키고 1분간 3000rpm으로 스핀(spin) 드라이한 후 스프레이식 유리 기판 세정장치를 이용하여 2분 동안 40℃에서 각각의 세정액으로 세정하였다. 세정 후 초순수에 30초 세척한 후 질소로 건조하였다. 세정 전후의 파티클 수는 표면입자측정기(Topcon WM-1500)로 0.1㎛ 이상의 파티클 수를 측정하였고, 표 4에 나타내었다.The glass substrates of Example 23, Example 27, Example 31, Example 32, Example 35, and Example 37 were cleaned and contaminated with the organic particle solution. That is, the glass substrate was contaminated with an organic particle solution having an average particle size of 0.8 μm, spin-dried at 3000 rpm for 1 minute, and then washed with each cleaning solution at 40 ° C. for 2 minutes using a spray-type glass substrate cleaner. . After washing for 30 seconds in ultrapure water and dried with nitrogen. Particle number before and after cleaning was measured by the particle count (Topcon WM-1500) particle size of 0.1㎛ or more, are shown in Table 4.
표 4
Cu 에칭속도(Å/분) 유기지문 유기사인펜 접촉각 세정전 파티클수 세정후 파티클수 제거율(%)
실시예20 1.0 - - - - - -
실시예21 1.6 - - - - - -
실시예22 1.3 - - - - - -
실시예23 0.8 38 2851 627 80
실시예24 0.7 - - - - - -
실시예25 1.4 - - - - - -
실시예26 0.9 - - - - - -
실시예27 0.6 37 2936 675 80
실시예28 0.6 - - - - - -
실시예29 1.2 - - - - - -
실시예30 0.8 - - - - - -
실시예31 0.5 36 2987 627 81
실시예32 - 35 2913 582 82
실시예33 - 36 - - -
실시예34 - 36 - - -
실시예35 - 39 3056 611 80
실시예36 - 39 -
실시예37 - 35 3201 544 83
실시예38 - 36 -
Table 4
Cu etching rate (ms / min) Organic fingerprint Organic sign pen Contact angle Number of particles before cleaning Number of particles after cleaning % Removal
Example 20 1.0 - - - - - -
Example 21 1.6 - - - - - -
Example 22 1.3 - - - - - -
Example 23 0.8 38 2851 627 80
Example 24 0.7 - - - - - -
Example 25 1.4 - - - - - -
Example 26 0.9 - - - - - -
Example 27 0.6 37 2936 675 80
Example 28 0.6 - - - - - -
Example 29 1.2 - - - - - -
Example 30 0.8 - - - - - -
Example 31 0.5 36 2987 627 81
Example 32 - 35 2913 582 82
Example 33 - 36 - - -
Example 34 - 36 - - -
Example 35 - 39 3056 611 80
Example 36 - 39 -
Example 37 - 35 3201 544 83
Example 38 - 36 -
표 4를 참조하면, 실시예20 내지 31의 세정액 조성물은 구리에 대한 부식방지 효과가 있었다. 또한, 실시예27, 실시예31, 실시예32, 실시예35 내지 실시예38의 세정액 조성물은 모두 유기 오염물의 제거력이 있음을 보였으며, 접촉각이 20°내지 40°를 갖게 되어 유기 오염물의 제거능력을 나타내었다. 또한, 실시예23, 실시예27, 실시예31, 실시예32, 실시예35 및 실시예37의 세정액 조성물로 유기 파티클 솔루션으로 오염시킨 유리기판에 대한 세정을 실시하였을 때 77 내지 86%에 가까운 파티클 제거력을 나타내었다.Referring to Table 4, the cleaning liquid compositions of Examples 20 to 31 had an anticorrosion effect on copper. In addition, all of the cleaning liquid compositions of Examples 27, 31, 32, and 35 to 38 showed the ability to remove organic contaminants, and the contact angles were 20 ° to 40 ° to remove organic contaminants. Demonstrated ability. In addition, when the cleaning liquid compositions of Examples 23, 27, 31, 32, 35, and 37 were washed on the glass substrate contaminated with the organic particle solution, the cleaning liquid composition was close to 77-86%. Particle removal was shown.
실시예39 내지 실시예60 및 비교예1 내지 비교예3: 세정액 조성물의 제조Examples 39 to 60 and Comparative Examples 1 to 3 Preparation of Cleaning Liquid Composition
표 5에 기재된 구성성분을 표 5에 기재된 조성으로 물 잔량과 함께 혼합하고 교반하여 세정액 조성물을 제조하였다. The constituents described in Table 5 were mixed with the remaining water in the composition described in Table 5 and stirred to prepare a cleaning liquid composition.
표 5
옥시아민 화합물 사슬형 알칸올 아민 첨가제 * GE 폴리카르복시산공중합쳬 계면활성제
종류 중량% 종류 중량% 종류 중량% 종류 중량% 종류 중량% 종류 중량%
실시예39 AEE 0.2 - - *1) 0.05 - - - - - -
실시예40 AEE 0.2 - - *2) 0.2 - - - - - -
실시예41 AEE 0.2 - - *3) 0.2 - - - - - -
실시예42 AEE 1.0 - - *1) 0.1 - - - - - -
실시예43 DAEE 0.2 - - *1) 0.05 - - - - - -
실시예44 DAEE 0.2 - - *2) 0.2 - - - - - -
실시예45 DAEE 0.2 - - *3) 0.2 - - - - - -
실시예46 DAEE 1.0 - - *1) 0.1 - - - - - -
실시예47 AEE 0.9 MEA 0.1 *1) 0.1 - - - - - -
실시예48 AEE 0.9 MIPA 0.1 *2) 0.1 - - - - - -
실시예49 DAEE 0.9 MEA 0.1 *3) 0.1 - - - - - -
실시예50 DAEE 0.9 MIPA 0.1 *1) 0.1 - - - - - -
실시예51 AEE 1.0 - - *1) 0.1 *4) 0.5 - - - -
실시예52 AEE 1.0 - - *1) 0.1 *5) 0.5 - - - -
실시예53 AEE 1.0 - - *1) 0.1 *6) 0.5 - - - -
실시예54 DAEE 1.0 - - *1) 0.1 *4) 0.5 - - - -
실시예55 AEE 0.9 MEA 0.1 *1) 0.1 *4) 0.5 - - - -
실시예56 DAEE 0.9 MEA 0.1 *1) 0.1 *4) 0.5 - - - -
실시예57 AEE 0.9 MEA 0.1 *1) 0.1 - - *7) 0.2 - -
실시예58 DAEE 0.9 MEA 0.1 *1) 0.1 - - *8) 0.2 - -
실시예59 AEE 1.0 - - *1) 0.1 - - - - *9) 0.02
실시예60 AEE 1.0 - - *1) 0.1 - - - - *10) 0.1
Table 5
Oxyamine Compound Chain alkanol amines additive * GE Polycarboxylic Acid Copolymerization 쳬 Surfactants
Kinds weight% Kinds weight% Kinds weight% Kinds weight% Kinds weight% Kinds weight%
Example 39 AEE 0.2 - - *One) 0.05 - - - - - -
Example 40 AEE 0.2 - - *2) 0.2 - - - - - -
Example 41 AEE 0.2 - - * 3) 0.2 - - - - - -
Example 42 AEE 1.0 - - *One) 0.1 - - - - - -
Example 43 DAEE 0.2 - - *One) 0.05 - - - - - -
Example 44 DAEE 0.2 - - *2) 0.2 - - - - - -
Example 45 DAEE 0.2 - - * 3) 0.2 - - - - - -
Example 46 DAEE 1.0 - - *One) 0.1 - - - - - -
Example 47 AEE 0.9 MEA 0.1 *One) 0.1 - - - - - -
Example 48 AEE 0.9 MIPA 0.1 *2) 0.1 - - - - - -
Example 49 DAEE 0.9 MEA 0.1 * 3) 0.1 - - - - - -
Example 50 DAEE 0.9 MIPA 0.1 *One) 0.1 - - - - - -
Example 51 AEE 1.0 - - *One) 0.1 *4) 0.5 - - - -
Example 52 AEE 1.0 - - *One) 0.1 * 5) 0.5 - - - -
Example 53 AEE 1.0 - - *One) 0.1 * 6) 0.5 - - - -
Example 54 DAEE 1.0 - - *One) 0.1 *4) 0.5 - - - -
Example 55 AEE 0.9 MEA 0.1 *One) 0.1 *4) 0.5 - - - -
Example 56 DAEE 0.9 MEA 0.1 *One) 0.1 *4) 0.5 - - - -
Example 57 AEE 0.9 MEA 0.1 *One) 0.1 - - * 7) 0.2 - -
Example 58 DAEE 0.9 MEA 0.1 *One) 0.1 - - *8) 0.2 - -
Example 59 AEE 1.0 - - *One) 0.1 - - - - * 9) 0.02
Example 60 AEE 1.0 - - *One) 0.1 - - - - * 10) 0.1
주) AEE: 아미노에톡시에탄올AEE: aminoethoxyethanol
DAEE: 디메틸아미노에톡시에탄올DAEE: Dimethylaminoethoxyethanol
MEA: 모노에탄올아민MEA: monoethanolamine
MIPA: 모노이소프로판올아민MIPA: monoisopropanolamine
TMAH: 테트라메틸암모늄 히드록시드TMAH: Tetramethylammonium Hydroxide
NH4OH: 암모늄 히드록시드NH 4 OH: ammonium hydroxide
*1): 2,2’-[[[에틸-1수소-벤조트리아졸-1-일]메틸]이미노]비스에탄올* 1): 2,2 '-[[[ethyl-1 hydrogen-benzotriazol-1-yl] methyl] imino] bisethanol
*2): EMADOX-NA* 2): EMADOX-NA
*3): 아스코르빅산* 3): Ascorbic acid
*GE: 양자성 알킬렌글리콜 모노알킬에테르* GE: protic alkylene glycol monoalkyl ether
*4): 디에틸렌글리콜 모노메틸에테르* 4) diethylene glycol monomethyl ether
*5): 디에틸렌글리콜 모노부틸에테르* 5) diethylene glycol monobutyl ether
*6): 트리에틸렌글리콜 모노에틸에테르* 6): triethylene glycol monoethyl ether
*7): 폴리아크릴산중합체(PAA)* 7): polyacrylic acid polymer (PAA)
*8): 폴리메틸(메타)아크릴산공중합체(PMAA)* 8): polymethyl (meth) acrylic acid copolymer (PMAA)
*9): 폴리옥시에틸렌/폴리옥시프로필렌 글리콜* 9): polyoxyethylene / polyoxypropylene glycol
*10): 폴리옥시에틸렌/폴리옥시프로필렌 에틸렌디아민 축합물* 10): polyoxyethylene / polyoxypropylene ethylenediamine condensate
시험예3: 세정액 조성물의 특성 평가Test Example 3 Evaluation of Characteristics of Cleaning Liquid Composition
1) 구리 에칭 속도 평가1) copper etch rate evaluation
먼저 구리가 2500 두께로 형성된 유리기판을 실시예38 내지 실시예50 및 비교예1 내지 비교예3의 세정액 조성물에 30분간 디핑시킨다. 이때 세정액의 온도는 40℃이며 구리 막의 두께를 디핑 이전 및 이후에 측정하고, 구리막의 용해속도를 구리막의 두께 변화로부터 계산하여 측정한다. 그 결과를 표 6에 기재하였다.First, a glass substrate having a copper thickness of 2500 was dipped into the cleaning liquid compositions of Examples 38 to 50 and Comparative Examples 1 to 3 for 30 minutes. At this time, the temperature of the cleaning liquid is 40 ℃ and the thickness of the copper film is measured before and after dipping, and the dissolution rate of the copper film is calculated by calculating from the change in the thickness of the copper film. The results are shown in Table 6.
2) 유기 오염물 제거력 평가-12) Evaluation of Organic Pollutant Removal Capacity-1
유기 오염물의 제거력 평가를 위해 5㎝ x 5㎝ 크기로 형성된 유리기판 위에 사람의 지문 자국 또는 유기성분 사인펜으로 오염시키고, 오염된 기판을 스프레이식 유리 기판 세정장치를 이용하여 2분 동안 40℃에서 실시예42, 실시예46, 실시예47, 실시예 49, 실시예51 내지 실시예60의 세정액 조성물로 세정하였다. 세정 후 초순수에 30초 세척한 후 질소로 건조하였다. In order to evaluate the removal power of organic contaminants, the human body is stained with fingerprint marks or organic component pens on a glass substrate formed 5 cm x 5 cm, and the contaminated substrate is carried out at 40 ° C. for 2 minutes using a spray glass substrate cleaning device. It wash | cleaned with the cleaning liquid composition of Example 42, Example 46, Example 47, Example 49, and Examples 51-60. After washing for 30 seconds in ultrapure water and dried with nitrogen.
이때 하기 표 6에서 유기 오염물의 제거 유무는 제거가 되었을 때, ○, 제거가 되지 않았을 때 x로 표시하였다. 또한 실시예51에 의한 유기 오염물 제거 결과를 도 9 내지 도 12에 나타내었다. 여기서, 도 9는 유기 오염물 중 유기 사인펜 자국으로 오염된 유리기판을 나타낸 사진이다. 도 10은 본 발명의 실시예51에 따른 세정액 조성물을 이용하여 유기 오염물 중 유기 사인펜 자국이 제거되는 결과를 나타내는 사진이다. 도 11은 유기 오염물 중 사람의 지문으로 오염된 유리기판을 나타낸 사진이다. 도 12는 본 발명의 실시예51에 따른 세정액 조성물을 이용하여 유기 오염물 중 사람의 지문성분이 제거되는 결과를 나타내는 사진이다.At this time, the presence or absence of the organic contaminants in Table 6, when removed, was indicated by x, when not removed. In addition, the results of removing organic contaminants according to Example 51 are shown in FIGS. 9 to 12. Here, FIG. 9 is a photograph showing a glass substrate contaminated with an organic sign pen mark among organic contaminants. 10 is a photograph showing a result of removing an organic sign pen mark from organic contaminants using the cleaning liquid composition according to Example 51 of the present invention. 11 is a photograph showing a glass substrate contaminated with a human fingerprint of organic contaminants. 12 is a photograph showing a result of removing a fingerprint component of a human from organic contaminants using the cleaning liquid composition according to Example 51 of the present invention.
3) 유기 오염물 제거력 평가-23) Evaluation of Organic Pollutant Removal Capacity-2
또한, 유리기판을 대기중에 24시간 방치하여 대기중의 각종 유기물, 무기물, 파티클 등에 오염시킨 후 스프레이식 유리 기판 세정장치를 이용하여 2분 동안 40℃에서 실시예42, 실시예46, 실시예47, 실시예 49, 실시예51 내지 실시예60의 세정액 조성물으로 세정하였다 세정 후 초순수에 30초 세척한 후 질소로 건조하였다. 상기 유리기판 위에 0.5㎕의 초순수 방울을 떨어뜨려 세정후의 접촉각을 측정하였다. 그 결과를 표 6에 나타내었다.In addition, the glass substrate was left in the air for 24 hours to contaminate various organic substances, inorganic substances, particles, and the like in the atmosphere, and then, at 42 ° C. for 2 minutes using a spray-type glass substrate cleaning device, Examples 42, 46 and 47 were used. , Example 49, and Example 51 to Example 60 was washed with the cleaning liquid composition. After washing, it was washed with ultrapure water for 30 seconds and then dried with nitrogen. 0.5 μl of ultrapure water was dropped on the glass substrate to measure the contact angle after washing. The results are shown in Table 6.
4) 유기 오염물 제거력 평가-34) Evaluation of organic pollutant removal-3
실시예42, 실시예46, 실시예55, 실시예57 및 실시예 59의 세정액 조성물을 가지고, 유기 파티클 솔루션으로 오염시킨 유리기판에 대한 세정을 실시하였다. 즉, 유리기판을 평균 입자 크기가 0.8㎛인 유기 파티클 솔루션으로 오염시키고 1분간 3000rpm으로 스핀(spin) 드라이한 후 스프레이식 유리 기판 세정장치를 이용하여 2분동안 40℃에서 각각의 세정액으로 세정하였다. 세정 후 초순수에 30초 세척한 후 질소로 건조하였다. 세정 전후의 파티클 수는 표면입자측정기(Topcon WM-1500)로 0.1㎛ 이상의 파티클 수를 측정하였고, 표 6에 나타내었다.The glass substrates having the cleaning liquid compositions of Examples 42, 46, 55, 57 and 59 were contaminated with the organic particle solution. That is, the glass substrate was contaminated with an organic particle solution having an average particle size of 0.8 μm, spin dried at 3000 rpm for 1 minute, and then washed with each cleaning solution at 40 ° C. for 2 minutes using a spray-type glass substrate cleaner. . After washing for 30 seconds in ultrapure water and dried with nitrogen. Particle number before and after cleaning was measured by a particle size measuring instrument (Topcon WM-1500) 0.1㎛ or more particles are shown in Table 6.
표 6
Cu 에칭속도(Å/분) 유기지문 유기사인펜 접촉각 세정전 파티클수 세정후 파티클수 제거율(%)
실시예39 1.0 - - - - - -
실시예40 1.5 - - - - - -
실시예41 1.3 - - - - - -
실시예42 0.8 34 2925 439 85
실시예43 0.6 - - - - - -
실시예44 1.2 - - - - - -
실시예45 0.9 - - - - - -
실시예46 0.7 38 2965 563 81
실시예47 1.5 30 - - -
실시예48 1.5 - - - - - -
실시예49 1.3 31 - - -
실시예50 1.2 - - - - - -
실시예51 - 32 - - -
실시예52 - 34 - - -
실시예53 - 35 - - -
실시예54 - 36 - - -
실시예55 - 27 3012 331 89
실시예56 - 28 - - -
실시예57 - 29 2913 350 88
실시예58 - 30 - - -
실시예59 - 32 3019 497 84
실시예60 - 33 - - -
Table 6
Cu etching rate (ms / min) Organic fingerprint Organic sign pen Contact angle Number of particles before cleaning Number of particles after cleaning % Removal
Example 39 1.0 - - - - - -
Example 40 1.5 - - - - - -
Example 41 1.3 - - - - - -
Example 42 0.8 34 2925 439 85
Example 43 0.6 - - - - - -
Example 44 1.2 - - - - - -
Example 45 0.9 - - - - - -
Example 46 0.7 38 2965 563 81
Example 47 1.5 30 - - -
Example 48 1.5 - - - - - -
Example 49 1.3 31 - - -
Example 50 1.2 - - - - - -
Example 51 - 32 - - -
Example 52 - 34 - - -
Example 53 - 35 - - -
Example 54 - 36 - - -
Example 55 - 27 3012 331 89
Example 56 - 28 - - -
Example 57 - 29 2913 350 88
Example 58 - 30 - - -
Example 59 - 32 3019 497 84
Example 60 - 33 - - -
표 6을 참조하면, 실시예39 내지 50의 세정액 조성물은 구리에 대한 부식방지 효과가 있었다. 또한, 실시예42, 실시예46, 실시예47, 실시예 49, 실시예51 내지 실시예60의 세정액 조성물은 모두 유기 오염물의 제거력이 있음을 보였으며, 접촉각이 20°내지 40°를 갖게 되어 유기 오염물의 제거능력을 나타내었다. 또한, 실시예42, 실시예46, 실시예55, 실시예57 및 실시예59의 세정액 조성물로 유기 파티클 솔루션으로 오염시킨 유리기판에 대한 세정을 실시하였을 때, 80% 이상의 파티클 제거력을 나타내었다.Referring to Table 6, the cleaning liquid compositions of Examples 39 to 50 had an anticorrosion effect on copper. In addition, all of the cleaning liquid compositions of Examples 42, 46, 47, 49, and 51 to 60 showed removal ability of organic contaminants, and the contact angles were 20 ° to 40 °. The ability to remove organic contaminants was shown. Further, when cleaning the glass substrate contaminated with the organic particle solution with the cleaning liquid compositions of Examples 42, 46, 55, 57, and 59, the particle removal ability was 80% or more.

Claims (18)

  1. 조성물 총 중량에 대하여,Regarding the total weight of the composition,
    (a) 하기 화학식 1 내지 5 중에서 어느 하나로 표시되는 아민 화합물 0.05~5중량%;(a) 0.05 to 5% by weight of an amine compound represented by any one of the following Formulas 1 to 5;
    (b) 아졸계 화합물, 알칸올 아민염 및 환원제로 이루어진 군에서 선택되는 1종 또는 2종 이상을 포함하는 첨가제 0.01 내지 10중량%; 및(b) 0.01 to 10% by weight of an additive including one or two or more selected from the group consisting of an azole compound, an alkanol amine salt, and a reducing agent; And
    (c) 물 잔량을 포함하는 것을 특징으로 하는 평판표시장치용 세정액 조성물:(c) a cleaning liquid composition for a flat panel display comprising a remaining amount of water:
    <화학식 1><Formula 1>
    Figure PCTKR2010005002-appb-I000012
    Figure PCTKR2010005002-appb-I000012
    <화학식 2><Formula 2>
    Figure PCTKR2010005002-appb-I000013
    Figure PCTKR2010005002-appb-I000013
    <화학식 3><Formula 3>
    Figure PCTKR2010005002-appb-I000014
    Figure PCTKR2010005002-appb-I000014
    <화학식 4><Formula 4>
    Figure PCTKR2010005002-appb-I000015
    Figure PCTKR2010005002-appb-I000015
    <화학식 5><Formula 5>
    Figure PCTKR2010005002-appb-I000016
    Figure PCTKR2010005002-appb-I000016
    상기 화학식 1 내지 5에 있어서,In Chemical Formulas 1 to 5,
    R1, R4, R5는 각각 독립적으로 C1~C10의 직쇄 또는 분지쇄 알킬렌기이고,R 1 , R 4 , and R 5 are each independently a C 1 to C 10 linear or branched alkylene group,
    R2, R3, R6는 각각 독립적으로 수소, C1~C10의 직쇄 또는 분지쇄 알킬기이고, R 2 , R 3 , and R 6 are each independently hydrogen, a C 1 to C 10 straight or branched alkyl group,
    R7, R8, R10은 각각 독립적으로 수소, C1~C10의 직쇄 또는 분지쇄 알킬기, C6~C10의 아릴기, C1~C10의 직쇄 또는 분지쇄 알킬아미노기, C1~C10의 직쇄 또는 분지쇄 히드록시알킬기, C1~C10의 직쇄 또는 분지쇄 알킬벤젠기 또는 아미노기이고,R 7, R 8, R 10 are each independently hydrogen, C 1 ~ C 10 straight-chain or branched-chain alkyl group, C 6 ~ C 10 aryl group, C 1 ~ a C 10 linear or branched alkyl group, C 1 and - a C 10 straight or branched chain hydroxyalkyl group, C 1 ~ C 10 straight or branched chain of an alkyl benzene group or an amino group,
    R9 및 R11은 수소, C1~C10의 직쇄 또는 분지쇄 알킬기, C6~C10의 아릴기, C1~C10의 직쇄 또는 분지쇄 알킬아미노기 또는 아미노기이고, R 9 and R 11 are hydrogen, a C 1 to C 10 straight or branched alkyl group, C 6 to C 10 aryl group, C 1 to C 10 straight or branched chain alkylamino group or amino group,
    R12은 C1~C4의 직쇄 또는 분지쇄 히드록시알킬기, 또는 C1~C4의 직쇄 또는 분지쇄 티올알킬기이고, R 12 is a C 1 to C 4 straight or branched hydroxyalkyl group, or C 1 to C 4 straight or branched thiolalkyl group,
    R13 및 R14는 각각 독립적으로 C1~C5의 직쇄 또는 분지쇄 알킬기, C1~C4의 직쇄 또는 분지쇄 히드록시알킬기, C6~C10의 아릴기 또는 C1~C4의 알콕시알킬기이고, R13 및 R14는 결합하여 헤테로고리를 형성할 수 있고,R 13 and R 14 are each independently a C 1 to C 5 straight or branched chain alkyl group, C 1 to C 4 straight or branched chain hydroxyalkyl group, C 6 to C 10 aryl group or C 1 to C 4 An alkoxyalkyl group, R 13 and R 14 may combine to form a heterocycle,
    n1 및 n3은 각각 독립적으로 0 또는 1의 정수이고,n 1 and n 3 are each independently an integer of 0 or 1,
    n2 및 n4는 각각 독립적으로 0 내지 4의 정수이고,n 2 and n 4 are each independently an integer of 0 to 4,
    n5은 1 또는 2의 정수이고,n 5 is an integer of 1 or 2,
    n6는 1 내지 4의 정수이고,n 6 is an integer from 1 to 4,
    n7은 O 내지 4의 정수이고,n 7 is an integer of 0 to 4,
    X1는 S, O 또는 N이고,X 1 is S, O or N,
    X2은 N이고,X 2 is N,
    X3는 CH 또는 N이고,X 3 is CH or N,
    Y는 히드록시기 또는 아미노기이다.Y is a hydroxyl group or an amino group.
  2. 청구항 1에 있어서, The method according to claim 1,
    상기 화학식 1로 표시되는 아민 화합물은 N-(2-히드록시에틸)피페라진, N-(2-히드록시프로필)피페라진, N-(2-히드록시부틸)피페라진, 1-(2-히드록시에틸)-4-메틸피페라진, 1-(2-히드록시프로필)-4-메틸피페라진, 1-(2-히드록시부틸)-4-메틸피페라진, 1-(2-히드록시에틸)-4-에틸피페라진, 1-(2-히드록시에틸)-4-프로필피페라진, 1-(2-히드록시에틸)-4-부틸피페라진, 1-(2-히드록시프로필)-4-메틸피페라진, 1-(2-히드록시프로필)-4-에틸피페라진, 1-(2-히드록시프로필)-4-프로필피페라진, 1-(2-히드록시프로필)-4-부틸피페라진, 1-(2-히드록시부틸)-4-메틸피페라진, 1-(2-히드록시부틸)-4-에틸피페라진, 1-(2-히드록시부틸)-4-프로필피페라진, 1-(2-히드록시부틸)-4-부틸피페라진, N-(2-히드록시에틸)모폴린, N-(2-히드록시프로필)모폴린, N-아미노프로필모폴린, 히드록시에틸피페라진, 히드록시프로필피페라진 및 1-(N-메틸피페라진)에탄올으로 이루어진 군에서 선택되는 것을 특징으로 하는 평판표시장치용 세정액 조성물.The amine compound represented by Formula 1 is N- (2-hydroxyethyl) piperazine, N- (2-hydroxypropyl) piperazine, N- (2-hydroxybutyl) piperazine, 1- (2- Hydroxyethyl) -4-methylpiperazine, 1- (2-hydroxypropyl) -4-methylpiperazine, 1- (2-hydroxybutyl) -4-methylpiperazine, 1- (2-hydroxy Ethyl) -4-ethylpiperazine, 1- (2-hydroxyethyl) -4-propylpiperazine, 1- (2-hydroxyethyl) -4-butylpiperazine, 1- (2-hydroxypropyl) -4-methylpiperazine, 1- (2-hydroxypropyl) -4-ethylpiperazine, 1- (2-hydroxypropyl) -4-propylpiperazine, 1- (2-hydroxypropyl) -4 -Butyl piperazine, 1- (2-hydroxybutyl) -4-methylpiperazine, 1- (2-hydroxybutyl) -4-ethylpiperazine, 1- (2-hydroxybutyl) -4-propyl Piperazine, 1- (2-hydroxybutyl) -4-butylpiperazine, N- (2-hydroxyethyl) morpholine, N- (2-hydroxypropyl) morpholine, N-aminopropylmorpholine, Hydroxyethylpiperazine, hydroxy Propyl piperazine and 1- (N- methyl piperazine), a cleaning liquid composition for a flat panel display device is selected from the group consisting of ethanol.
  3. 청구항 1에 있어서, The method according to claim 1,
    상기 화학식 2로 표시되는 화합물은 1,4-피페라진디에탄올(1,4-Piperazinediethanol)과 1,4-피페라진디메탄올(1,4-Piperazinedimethanol)으로 이루어진 군에서 선택되는 것을 특징으로 하는 평판표시장치용 세정액 조성물.The compound represented by the formula (2) is 1,4-piperazinediethanol (1,4-Piperazinediethanol) and 1,4-piperazinedimethanol (1,4-Piperazinedimethanol) characterized in that the plate is selected from the group consisting of Cleaning liquid composition for a display device.
  4. 청구항 1에 있어서, The method according to claim 1,
    상기 화학식 3으로 표시되는 화합물은 N-(2-히드록시에틸)-에틸렌우레아, N-(3-히드록시프로필)-2-피롤리돈, 히드록시메틸피롤리돈 및 1-(2-히드록시에틸)-2-피롤리돈으로 이루어진 군에서 선택되는 것을 특징으로 하는 평판표시장치용 세정액 조성물.Compound represented by the formula (3) is N- (2-hydroxyethyl) -ethylene urea, N- (3-hydroxypropyl) -2-pyrrolidone, hydroxymethylpyrrolidone and 1- (2-hydroxy Roxyethyl) -2-pyrrolidone cleaning liquid composition for a flat panel display characterized in that it is selected from the group consisting of.
  5. 청구항 1에 있어서, The method according to claim 1,
    상기 화학식 4로 표시되는 화합물은 N-(2-히드록시에틸)피페리딘, N-(2-히드록시프로필)피페리딘 및 N-(2-히드록시부틸)피페리딘으로 이루어진 군에서 선택되는 것을 특징으로 하는 평판표시장치용 세정액 조성물.The compound represented by the formula (4) is in the group consisting of N- (2-hydroxyethyl) piperidine, N- (2-hydroxypropyl) piperidine and N- (2-hydroxybutyl) piperidine The cleaning liquid composition for a flat panel display characterized by the above-mentioned.
  6. 청구항 1에 있어서, The method according to claim 1,
    상기 화학식 5로 표시되는 화합물은 아미노에톡시에탄올, 아미노프로폭시에탄올, 아미노부톡시에탄올, 디메틸아미노에톡시티올, 디에틸아미노에톡시티올, 디프로필아미노에톡시티올, 디부틸아미노에톡시티올, 디메틸아미노에톡시에탄올, 디에틸아미노에톡시에탄올, 디프로필아미노에톡시에탄올, 디부틸아미노에톡시에탄올, 디메틸아미노에톡시에탄티올, 디에틸아미노에톡시프로판티올, 디프로필아미노에톡시부탄티올, 디부틸아미노에톡시에탄올, N-(메톡시메틸)모폴린, N-(에톡시메틸)모폴린, N-(2-메톡시에탄올)모폴린, N-(2-에톡시에탄올)모폴린 및 N-(2-부톡시에탄올)모폴린으로 이루어진 군으로부터 선택되는 것을 특징으로 하는 평판표시장치용 세정액 조성물.Compound represented by the formula (5) is amino ethoxy ethanol, amino propoxy ethanol, amino butoxy ethanol, dimethyl amino ethoxy thiol, diethyl amino ethoxy thiol, dipropyl amino ethoxy thiol, dibutyl amino ethoxy thiol, Dimethylaminoethoxyethanol, diethylaminoethoxyethanol, dipropylaminoethoxyethanol, dibutylaminoethoxyethanol, dimethylaminoethoxyethanethiol, diethylaminoethoxypropanethiol, dipropylaminoethoxybutanethiol, Dibutylaminoethoxyethanol, N- (methoxymethyl) morpholine, N- (ethoxymethyl) morpholine, N- (2-methoxyethanol) morpholine, N- (2-ethoxyethanol) morpholine And N- (2-butoxyethanol) morpholine.
  7. 청구항 1에 있어서, The method according to claim 1,
    상기 아졸계 화합물은 톨리트리아졸, 1,2,3-벤조트리아졸, 1,2,3-트리아졸, 1,2,4-트리아졸, 3-아미노-1,2,4-트리아졸, 4-아미노-4H-1,2,4-트리아졸, 1-히드록시벤조트리아졸, 1-메틸벤조트리아졸, 2-메틸벤조트리아졸, 5-메틸벤조트리아졸, 벤조트리아졸-5-카르본산, 니트로벤조트리아졸, 2- (2H-벤조트리아졸-2-일)-4,6-디-t-부틸페놀 및 2,2’-[[[에틸-1수소-벤조트리아졸-1-일]메틸]이미노]비스에탄올으로 이루어진 군에서 선택되는 것을 특징으로 하는 평판표시장치용 세정액 조성물.The azole compound is tolytriazole, 1,2,3-benzotriazole, 1,2,3-triazole, 1,2,4-triazole, 3-amino-1,2,4-triazole , 4-amino-4H-1,2,4-triazole, 1-hydroxybenzotriazole, 1-methylbenzotriazole, 2-methylbenzotriazole, 5-methylbenzotriazole, benzotriazole-5 -Carboxylic acid, nitrobenzotriazole, 2- (2H-benzotriazol-2-yl) -4,6-di-tet-butylphenol and 2,2 '-[[[ethyl-1 hydrogen-benzotriazole -1-yl] methyl] imino] bisethanol. A cleaning liquid composition for a flat panel display device.
  8. 청구항 1에 있어서, The method according to claim 1,
    상기 알칸올 아민염은 모노에탄올 아민염, 디에탄올 아민염, 트리에탄올 아민염, 모노이소프로판올 아민염, 디이소프로판올 아민염 및 트리이소프로판올 아민염으로 이루어진 군에서 선택되는 평판표시장치용 세정액 조성물.The alkanol amine salt is a monoethanol amine salt, diethanol amine salt, triethanol amine salt, monoisopropanol amine salt, diisopropanol amine salt and triisopropanol amine salt selected from the group consisting of a cleaning liquid composition for a flat panel display device.
  9. 청구항 1에 있어서, The method according to claim 1,
    상기 환원제는 엘리소르빈산, 비타민 C 및 알파 토코페롤로 이루어진 군에서 선택되는 1종 또는 2종 이상인 것을 특징으로 하는 평판표시장치용 세정액 조성물.The reducing agent is a cleaning liquid composition for a flat panel display device, characterized in that one or two or more selected from the group consisting of elisorbic acid, vitamin C and alpha tocopherol.
  10. 청구항 1에 있어서,The method according to claim 1,
    사슬형 알칸올 아민, 폴리카르복실산 공중합체, 양자성 알킬렌글리콜 모노알킬에테르 화합물 및 계면활성제로 이루어진 군에서 선택되는 것을 더 포함하는 것을 특징으로 하는 평판표시장치용 세정액 조성물.A cleaning liquid composition for a flat panel display device, further comprising one selected from the group consisting of a chain alkanol amine, a polycarboxylic acid copolymer, a protic alkylene glycol monoalkyl ether compound, and a surfactant.
  11. 청구항 10에 있어서,The method according to claim 10,
    상기 사슬형 알칸올 아민은 모노에탄올아민, 모노프로판올아민, 모노이소프로판올아민, 부탄올아민, 2-프로폭시에틸아민, N-부틸에탄올아민, N-메틸에탄올아민 및 N-에틸에탄올아민으로 이루어진 군에서 선택되는 것을 특징으로 하는 평판표시장치용 세정액 조성물.The chain alkanol amine is monoethanolamine, monopropanolamine, monoisopropanolamine, butanolamine, 2-propoxyethylamine, N-butylethanolamine, N-methylethanolamine and N-ethylethanolamine The cleaning liquid composition for a flat panel display characterized by the above-mentioned.
  12. 청구항 10에 있어서,The method according to claim 10,
    상기 폴리카르복실산 공중합체로는 하기 화학식 6으로 표시되는 구조단위를 포함하는 것을 특징으로 하는 평판표시장치용 세정액 조성물.The polycarboxylic acid copolymer as a cleaning liquid composition for a flat panel display device comprising a structural unit represented by the following formula (6).
    <화학식 6><Formula 6>
    Figure PCTKR2010005002-appb-I000017
    Figure PCTKR2010005002-appb-I000017
    상기 화학식 6에서,In Chemical Formula 6,
    R15 내지 R17 는 각각 독립적으로, 수소, C1~C3의 직쇄 또는 분지쇄 알킬기, 또는 (CH2)m2COOM2이고, R 15 to R 17 are each independently hydrogen, a C 1 to C 3 straight or branched alkyl group, or (CH 2 ) m 2 COOM 2 ,
    M1 및 M2는 각각 독립적으로 수소, 알칼리 금속, 알칼리 토금속, 암모늄기, C1~C10의 알킬암모늄기 또는 C1~C10의 치환알킬암모늄기이고,M 1 and M 2 are each independently hydrogen, an alkali metal, an alkaline earth metal, an ammonium group, a C 1 to C 10 alkylammonium group or a C 1 to C 10 substituted alkylammonium group,
    m1 및 m2 는 각각 독립적으로 0 내지 2의 정수이다.m 1 and m 2 are each independently an integer of 0 to 2.
  13. 청구항 10에 있어서,The method according to claim 10,
    상기 양자성 알킬렌글리콜 모노알킬에테르 화합물은 에틸렌글리콜모노부틸에테르(BG), 디에틸렌글리콜 모노메틸에테르(MDG), 디에틸렌글리콜 모노에틸에테르(carbitol), 디에틸렌글리콜 모노부틸에테르(BDG), 디프로필렌글리콜 모노메틸에테르(DPM), 디프로필렌글리콜 모노에틸에테르(MFDG), 트리에틸렌글리콜 모노부틸에테르(BTG), 트리에틸렌글리콜 모노에틸에테르(MTG) 및 프로필렌글리콜 모노메틸에테르(MFG)로 이루어진 군으로부터 선택되는 것을 특징으로 하는 평판표시장치용 세정액 조성물.The protic alkylene glycol monoalkyl ether compound is ethylene glycol monobutyl ether (BG), diethylene glycol monomethyl ether (MDG), diethylene glycol monoethyl ether (carbitol), diethylene glycol monobutyl ether (BDG), Dipropylene glycol monomethyl ether (DPM), dipropylene glycol monoethyl ether (MFDG), triethylene glycol monobutyl ether (BTG), triethylene glycol monoethyl ether (MTG) and propylene glycol monomethyl ether (MFG) The cleaning liquid composition for a flat panel display device selected from the group.
  14. 청구항 1에 있어서,The method according to claim 1,
    상기 평판표시장치용 세정액 조성물의 pH는 7내지 13인 것을 특징으로 하는 평판표시장치용 세정액 조성물.PH of the cleaning liquid composition for a flat panel display device is 7 to 13, the cleaning liquid composition for a flat panel display device.
  15. 청구항 1의 세정액 조성물을 이용한 평판표시장치의 세정방법.A method for cleaning a flat panel display using the cleaning liquid composition of claim 1.
  16. 청구항 15에 있어서, The method according to claim 15,
    상기 세정방법은 스프레이(Spray)방식, 스핀(Spin)방식, 딥핑(Dipping)방식, 및 초음파를 이용한 딥핑방식으로 이루어진 군에서 선택되는 1종 또는 2종 이상으로 수행하는 것을 특징으로 하는 평판표시장치의 세정방법.The cleaning method may be performed using one or two or more selected from the group consisting of a spray method, a spin method, a dipping method, and a dipping method using ultrasonic waves. Washing method.
  17. 청구항 15에 있어서,The method according to claim 15,
    상기 세정방법은 20 내지 80℃의 온도에서 세정하는 것을 특징으로 하는 평판표시장치의 세정방법.The cleaning method is a cleaning method of a flat panel display device, characterized in that for cleaning at a temperature of 20 to 80 ℃.
  18. 청구항 15에 있어서,The method according to claim 15,
    상기 세정방법은 30초 내지 10분 동안 세정하는 것을 특징으로 하는 평판표시장치의 세정방법.The cleaning method may include cleaning for 30 seconds to 10 minutes.
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI491729B (en) * 2011-08-31 2015-07-11 Dongwoo Fine Chem Co Ltd Cleaning composition
EP3575289A4 (en) * 2017-01-26 2020-07-29 Tosoh Corporation Alkanolamine, friction-reducing agent, and lubricating oil composition

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9719052B2 (en) * 2014-03-27 2017-08-01 The Procter & Gamble Company Cleaning compositions containing a polyetheramine
WO2017169981A1 (en) * 2016-03-30 2017-10-05 日産化学工業株式会社 Aqueous solution for coating resist pattern and pattern formation method using same

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000232063A (en) * 1998-12-09 2000-08-22 Kishimoto Sangyo Co Ltd Resist residual removal agent
JP2005154558A (en) * 2003-11-25 2005-06-16 Kishimoto Sangyo Co Ltd Detergent
KR100599849B1 (en) * 2003-01-07 2006-07-13 토소가부시키가이샤 Cleaning material and method for cleaning using it

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4304909B2 (en) * 2002-04-03 2009-07-29 東ソー株式会社 Cleaning agent and cleaning method using the same
US6951710B2 (en) * 2003-05-23 2005-10-04 Air Products And Chemicals, Inc. Compositions suitable for removing photoresist, photoresist byproducts and etching residue, and use thereof
JP2005336342A (en) * 2004-05-27 2005-12-08 Tosoh Corp Cleaning composition
US7888302B2 (en) * 2005-02-03 2011-02-15 Air Products And Chemicals, Inc. Aqueous based residue removers comprising fluoride
KR101251594B1 (en) * 2006-03-23 2013-04-08 주식회사 동진쎄미켐 Chemical rinse composition for removing resist stripper
JP4692497B2 (en) * 2007-02-28 2011-06-01 ナガセケムテックス株式会社 Photoresist stripper composition
JP4716225B2 (en) * 2007-05-15 2011-07-06 ナガセケムテックス株式会社 Photoresist stripper composition
JP2009021377A (en) * 2007-07-11 2009-01-29 Yushiro Chem Ind Co Ltd Cleaner composition for electronic material and cleaning method of electronic material
TW200925800A (en) * 2007-12-06 2009-06-16 Mallinckrodt Baker Inc Fluoride-free photoresist stripper or residue removing cleaning compositions containing conjugate oligomeric or polymeric material of alpha-hydroxycarbonyl compound/amine or ammonia reaction
WO2009078123A1 (en) * 2007-12-17 2009-06-25 Sanyo Chemical Industries, Ltd. Cleaning agent and cleaning method for electronic material

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000232063A (en) * 1998-12-09 2000-08-22 Kishimoto Sangyo Co Ltd Resist residual removal agent
KR100599849B1 (en) * 2003-01-07 2006-07-13 토소가부시키가이샤 Cleaning material and method for cleaning using it
JP2005154558A (en) * 2003-11-25 2005-06-16 Kishimoto Sangyo Co Ltd Detergent

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI491729B (en) * 2011-08-31 2015-07-11 Dongwoo Fine Chem Co Ltd Cleaning composition
EP3575289A4 (en) * 2017-01-26 2020-07-29 Tosoh Corporation Alkanolamine, friction-reducing agent, and lubricating oil composition
US10927084B2 (en) 2017-01-26 2021-02-23 Tosoh Corporation Alkanolamine, friction-reducing agent, and lubricating oil composition

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