WO2011013766A1 - Method for removal of hard coating film in superhard material, and method for production of superhard material - Google Patents

Method for removal of hard coating film in superhard material, and method for production of superhard material Download PDF

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WO2011013766A1
WO2011013766A1 PCT/JP2010/062835 JP2010062835W WO2011013766A1 WO 2011013766 A1 WO2011013766 A1 WO 2011013766A1 JP 2010062835 W JP2010062835 W JP 2010062835W WO 2011013766 A1 WO2011013766 A1 WO 2011013766A1
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group
hard film
film according
cemented carbide
hard
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PCT/JP2010/062835
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French (fr)
Japanese (ja)
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誠 石川
大助 西尾
毅 沢井
仁 八代
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株式会社新菱
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23GCLEANING OR DE-GREASING OF METALLIC MATERIAL BY CHEMICAL METHODS OTHER THAN ELECTROLYSIS
    • C23G1/00Cleaning or pickling metallic material with solutions or molten salts
    • C23G1/14Cleaning or pickling metallic material with solutions or molten salts with alkaline solutions
    • C23G1/16Cleaning or pickling metallic material with solutions or molten salts with alkaline solutions using inhibitors
    • C23G1/18Organic inhibitors
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C24/00Coating starting from inorganic powder
    • C23C24/08Coating starting from inorganic powder by application of heat or pressure and heat
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C30/00Coating with metallic material characterised only by the composition of the metallic material, i.e. not characterised by the coating process
    • C23C30/005Coating with metallic material characterised only by the composition of the metallic material, i.e. not characterised by the coating process on hard metal substrates

Definitions

  • the present invention relates to a method of removing a hard coating on a cemented carbide material and a method of manufacturing a cemented carbide material. More specifically, in the case of cemented carbide materials such as cemented carbide tools or molds having a hard coating formed on the surface, the nonstandard products at the time of production of these or hard products of use deterioration using these for cutting etc.
  • the present invention relates to a chemical solution for removing a film, a method for removing a hard film using the chemical solution, and a method for producing a hard material for forming a hard film again on a hard material from which the hard film has been removed.
  • Cemented carbide is a cemented carbide tool in which a hard coating such as nitride is formed on the surface of a cemented carbide base material using CVD (chemical vapor deposition) or PVD (physical vapor deposition). Class or mold class. Since cemented carbides are excellent in properties such as hardness, toughness, and wear resistance, they are used in fields such as various cuttings and molds where these properties are required.
  • CVD chemical vapor deposition
  • PVD physical vapor deposition
  • the cemented carbide base material is obtained by sintering cemented carbide particles such as WC (tungsten carbide) with a binder metal such as Fe, Co, Ni, and Cu at around 1500 ° C., and has a very high hardness and It has toughness. Since the base material of cemented carbide changes the characteristics such as hardness and toughness by changing the particle size of cemented carbide particles and the amount of binder metal, it is necessary to use metalworking tools, dies, etc. A suitable one is used. Generally, the smaller the particle size of cemented carbide particles or the smaller the amount of binder metal, the higher the hardness of the cemented carbide base material tends to be.
  • a hard coating is a coating made of a hard material formed on the surface of a base material using a CVD method or a PVD method for the purpose of further improving the wear resistance and corrosion resistance of the base material, and a carbide tool It contributes to the improvement of the life of the mold or mold.
  • the compounds used for the hard coating include nitrides such as TiN, CrN, VN, TiAlN, AlCrN, TiAlCrN, TiSiN, carbides such as TiC, CrC, VC, etc. and carbonitrides such as TiCN. Is coated in a single layer or multiple layers.
  • carbide materials are “non-standard products” that have coating defects in the coating process of hard coatings at the time of their manufacture, and “defective products” that cause partial peeling and wear resistance defects etc. in a short time when using them. Furthermore, the hard coating wears out in normal long-term use, and the "life-deteriorated product” which has reached the life is generated. Such “non-standard products”, “defective products” and “life-deteriorated products” are mostly crushed from the viewpoint of resource protection, recovered as rare metal tungsten as WC powder and recycled and used. is there.
  • the current recycling methods involve many processes such as crushing, classification, re-sintering, shape processing and recovery, and there is a problem that recycling costs increase.
  • a reuse method of recoating a hard coating by removing a defective, defective or life-degraded hard coating from a cemented carbide base material is also advantageous in terms of efficiency and cost. Therefore, attempts have been made to remove hard coatings using various removal chemicals.
  • a method of removing a hard film using a chemical solution in the prior art a method using an acid-based chemical solution and a method using an alkaline chemical solution containing hydrogen peroxide are known.
  • Patent Document 1 discloses that the stainless steel on which the coating is formed is added to 70 ° C. or more by a method of removing the TiN coating coated on the surface of stainless steel.
  • Patent Document 2 contains 1 to 60% by weight of hydrogen peroxide and 0.05 to 5% by weight of a surfactant, and There is disclosed a method of immersing a member to be subjected to film removal in an alkaline aqueous solution having a pH of 7.5 to 12.
  • cemented carbide materials such as cemented carbide tools or molds
  • cemented carbide base material it is an object of the present invention to provide a method of removing a hard film in a cemented carbide material, which makes it possible to
  • the present invention relates to the following inventions.
  • ⁇ 1> A group in which cemented carbide particles containing a carbide of at least one element selected from the group consisting of a group 4 element, a group 5 element and a group 6 element consist of Fe, Co, Cu and Ni
  • the surface of a cemented carbide base material sintered with a binder metal consisting of at least one element selected from the group consisting of at least one element selected from these elements or an alloy containing these elements is a group 4 element, a group 5 element, a group 6 element, a group Coated with a hard film containing a nitride, carbide, carbonitride, oxide or boride of at least one element selected from the group consisting of Group 13 elements and Group 14 elements (with the exception of carbon)
  • a method of removing the hard coating on the resulting cemented carbide material A method of removing a hard film on a cemented carbide, comprising bringing the cemented carbide into contact with an alkaline chemical solution at
  • the corrosion inhibitor is at least one selected from the group consisting of Group 4 elements, Group 5 elements, Group 6 elements, Fe, Co, Cu and Ni constituting the cemented carbide base material.
  • the removal method of the hard film the said ⁇ 3> description whose ⁇ 4> above-mentioned corrosion inhibitor is a cobalt compound.
  • ⁇ 5> The method for removing a hard film according to ⁇ 4>, wherein the corrosion inhibitor is cobalt tungstate, cobalt hydroxide or cobalt oxide, or cobalt metal.
  • the removal method of the hard film as described in said ⁇ 2> whose ⁇ 6> above-mentioned corrosion inhibitor is a reducing agent.
  • the removal method of the hard film the said ⁇ 6> description whose ⁇ 7> above-mentioned reducing agent is a compound shown by following General formula (1).
  • R 1 is any of a carboxyl group, an alkyl group having 1 to 6 carbon atoms, an acyl group and an alkoxycarbonyl group
  • R 2 is any of an alkyl group having 1 to 6 carbon atoms, an alkoxy group and a hydroxyl group
  • R 1 and R 2 may form a ring structure
  • X 1 and X 2 each independently represent a hydrogen atom or an alkali metal.
  • R 3 is a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, an alkenyl group, an alkynyl group, an acyl group, an alkoxycarbonyl group, n is 0 or 1 and X 3 and X 4 are each independently hydrogen Is either an atom or an alkali metal.
  • the reducing agent is at least one selected from ascorbic acid, sodium ascorbate, erythorbic acid and sodium erythorbate.
  • ⁇ 11> The method for removing a hard film according to ⁇ 6>, wherein the reducing agent is a compound represented by the following general formula (3-a) or (3-b) and / or a salt thereof.
  • the reducing agent is a compound represented by the following general formula (3-a) or (3-b) and / or a salt thereof.
  • R 4 is a carboxyl group, an aldehyde group, an alkoxy group, an alkoxycarbonyl group, or an acyl group
  • R 5 is a hydrogen atom or a hydroxyl group.
  • reducing agent is at least one selected from gallic acid, m-galoyl gallic acid, catechol and hydroquinone.
  • reducing agent is a monosaccharide, a disaccharide, a trisaccharide, a tetrasaccharide, an oligosaccharide, or a polysaccharide.
  • the reducing agent is dihydroxyacetone, erythrulose, erythrose, xylulose, ribose, arabinose, xylose, deoxyribose, psicose, glucose, fructose, sorbose, tagatose, mannose, idose, talose, fucose, rhamnose, maltose, lactose, At least selected from sucrose, trehalose, tulanose, cellobiose, raffinose, maltotriose, acarbose, stachyose, galactose, ribose, fructooligosaccharide, galactooligosaccharide, mannanoligosaccharide, glycogen, starch, cellulose, dextrin, glucan, levan and inulin
  • the removal method of the hard film of the said ⁇ 13> description which is 1 type.
  • ⁇ 15> The method for removing a hard film according to ⁇ 6>, wherein the reducing agent is a phosphorus-containing reducing agent or a sulfur-containing reducing agent.
  • the reducing agent is disodium hydrogen phosphite or sodium thiosulfate.
  • the corrosion inhibitor is at least one compound selected from the group consisting of an azole compound or a salt thereof, a thiourea compound and an acetylenic compound.
  • ⁇ 18> The method for removing a hard film according to ⁇ 17>, wherein the azole compound is benzotriazole.
  • ⁇ 19> The method for removing a hard film according to ⁇ 17>, wherein the thiourea compound is thiourea.
  • ⁇ 20> The hard coating according to ⁇ 17>, wherein the acetylene compound is at least one selected from 2-propyn-1-ol, 1-hex-3-ol, and 3-butyn-1-ol. How to remove ⁇ 21>
  • ⁇ 22> The method for removing a hard film according to any one of ⁇ 1> to ⁇ 21>, wherein the binder metal contains Co.
  • the hard film comprises a nitride, carbide or carbonitride of at least one element selected from the group consisting of Ti, V, Cr, Si and Al.
  • ⁇ 24> Any one of the above ⁇ 1> to ⁇ 23>, wherein the hard coating contains at least one compound selected from the group consisting of TiN, TiAlN, TiSiN, TiAlCrN, CrN, TiCrN, VN, TiC and TiCN. Hard coating removal method described in.
  • alkaline chemical is, 1 ⁇ 20 mol / L - according to any one of ⁇ 1> to ⁇ 25> containing an alkali metal hydroxide and / or alkaline earth metal hydroxide (OH equivalent) Hard coating removal method.
  • alkaline chemical solution contains 1 to 20 mol / L (OH - converted) sodium hydroxide and / or potassium hydroxide.
  • ⁇ 28> The above-mentioned ⁇ 1> for removing the hard film from the cemented carbide in an airtight processing container in which the gas phase part is replaced with an inert gas and / or a reducing gas and / or a vapor generated from an alkaline chemical solution.
  • ⁇ 27> The method for removing a hard film according to any one of ⁇ 27>.
  • ⁇ 29> A method for producing a cemented carbide-coated material coated with a hard coating, wherein the hard coating is removed by the method for removing a hard coating according to any one of ⁇ 1> to ⁇ 28>, and the hard coating is formed again.
  • the present invention selectively removes the hard coating on the surface of the cemented carbide while minimizing the surface deterioration of the cemented carbide in the cemented carbide material such as cemented carbide tools or dies. Because of this, efficient and inexpensive reuse of cemented carbide can be realized.
  • Example 1 It is a surface SEM image of Example 1 (darkness at the center right is burnt by electron beam and not damage by film removal treatment). It is a surface SEM image of Example 2 (darkness on the center right is burnt by electron beam and not damage by film removal treatment). 7 is a surface SEM image of Example 3. It is a surface SEM image of Example 4 (darkness in the center right is burnt by electron beam and not damage by film removal treatment). 7 is a surface SEM image of Example 5.
  • 7 is a surface SEM image of Comparative Example 1; 7 is a surface SEM image of Comparative Example 2; 7 is a surface SEM image of Comparative Example 3; 7 is a surface SEM image of Example 6. 7 is a surface SEM image of Example 7.
  • 21 is a surface SEM image of Example 8.
  • 21 is a surface SEM image of Example 9.
  • 21 is a surface SEM image of Example 10.
  • 7 is a surface SEM image of Comparative Example 4; 7 is a surface SEM image of Comparative Example 5;
  • 21 is a surface SEM image of Example 11.
  • 21 is a surface SEM image of Example 12.
  • 21 is a surface SEM image of Example 13.
  • 21 is a surface SEM image of Example 14.
  • 21 is a surface SEM image of Example 15. It is a surface SEM image of Example 16. (The darkening at the center right is burnt by electron beam, not damage by film removal treatment).
  • 21 is a surface SEM image of Example 17.
  • 21 is a surface SEM image of Example 18.
  • 21 is a surface SEM image of Example 19.
  • FIG. 7 It is a cross-sectional analysis result (the left figure is a SEM image and the right figure is a cobalt mapping image by EDX) of Example 7.
  • FIG. 11 It is a cross-sectional analysis result (the left figure is a SEM image and the right figure is a cobalt mapping image by EDX) of Example 11.
  • cemented carbide particles containing carbide of at least one element selected from the group consisting of Group 4 elements, Group 5 elements and Group 6 elements consist of Fe, Co, Cu and Ni.
  • a surface of a cemented carbide base material sintered with a binder metal consisting of at least one element selected from the group or an alloy containing these elements is a group 4 element, a group 5 element, a group 6 element,
  • a method for removing a hard film on a coated hard material comprising the step of bringing the hard material into contact with an alkaline chemical solution at a temperature of 100 to 250 ° C. It is referred to as “method”.
  • the group 4 element, the group 5 element and the group 6 element respectively mean elements belonging to the group 4 group 5 group 6 of the long period periodic table.
  • the feature of the method of the present invention is that the cemented carbide is brought into contact with an alkaline chemical solution (hereinafter sometimes referred to as "the chemical solution of the present invention") at a temperature of 100 to 250 ° C, preferably 170 to 220 ° C. It is.
  • the chemical solution of the present invention By using the chemical solution of the present invention and treating it in the above temperature range, it is possible to minimize the surface deterioration of the cemented carbide base material and at the same time to selectively remove the hard film. If the temperature of contact is too low, removal of the hard coating will be insufficient, and if the temperature of contact is too high, special facilities such as heating equipment and processing containers are often required, resulting in high processing costs. The problem arises.
  • a cemented carbide is a cemented carbide tool or die having a hard coating formed on the surface of a cemented carbide base material formed by sintering cemented carbide particles using a binder metal.
  • the cemented carbide particles serving as a base material of cemented carbide are composed of a Group 4 element such as Ti, V, Cr, Zr, Nb, Mo, Hf, Ta, W, etc., a Group 5 element and a Group 6 element.
  • Carbides of at least one element selected from the group can be mentioned, and these carbides can be used alone or in combination of two or more.
  • carbides of at least one element selected from the group consisting of W, Ti, Nb, Ta, V, and Cr are preferable, and WC is particularly preferable in that it has high strength.
  • other elements may be added to improve performance.
  • the additive element examples include Ti, Ta, Nb, and the like for improving heat resistance.
  • the chemical formula represents a constituent element, and the stoichiometric ratio of the chemical formula is not particularly limited.
  • the particle size of the cemented carbide particles is not particularly limited, but is usually about 0.1 to 20 ⁇ m.
  • the binder metal is at least one element selected from the group consisting of Fe, Co, Cu and Ni, or an alloy containing these elements, which binds cemented carbide particles. Among these, it is particularly preferable to contain Co. Further, from the viewpoint of increasing the toughness of the superhard material, Co alone or an alloy containing Co as a main component is suitably used as a binder metal because it is excellent in toughness. In the present invention, “an alloy containing Co as a main component” means an alloy containing 80 mol% or more of Co. In addition, in order to change properties such as hardness and toughness of the cemented carbide material, elements other than the above metal elements may be contained in the binder metal.
  • the hard coating is formed on the surface of the cemented carbide base material using the CVD method or the PVD method.
  • the material of the hard film is at least one element selected from the group consisting of Group 4 elements, Group 5 elements, Group 6 elements, Group 13 elements and Group 14 elements (with the exception of carbon).
  • nitrides such as TiN, CrN, VN, TiAlN, AlCrN, TiAlCrN, TiSiN, carbides such as TiC, CrC, VC, BC, carbonitrides such as TiCN, oxides such as TiO, AlO, ZrO, etc.
  • borides such as CrB.
  • the hard coating is formed by covering a thin film containing these compounds in a single layer or multiple layers.
  • the hard coating contains at least one selected from the group consisting of nitride, carbide or carbonitride of at least one element selected from the group consisting of Ti, V, Cr, Si and Al.
  • at least one compound selected from the group consisting of TiN, TiAlN, TiSiN, TiAlCrN, CrN, TiCrN, VN, TiC and TiCN is preferable.
  • the hard coating contains these compounds, it can be easily removed by the chemical solution of the present invention.
  • the chemical formulas indicate constituent elements, and the stoichiometric ratio of the chemical formulas is not particularly limited.
  • the drug solution of the present invention is an alkaline aqueous solution having a pH of 7 or more.
  • adjustment of pH may be performed by any method such as dissolution of ammonia, addition of hydroxide, etc., but alkali hydroxide, ie, alkali metal hydroxide such as Li, Na, K, Rb, etc. It is preferable to carry out by containing single or multiple types of alkaline earth metal hydroxides such as Be, Mg, Ca, Sr, and Ba.
  • sodium hydroxide and potassium hydroxide are preferably used because of their solubility in water and relatively low cost.
  • the hard coating can be efficiently removed by using an aqueous solution containing these hydroxides in a concentration range of preferably 1 to 20 mol / L (OH - equivalent), particularly preferably 5 to 15 mol / L.
  • a water-soluble organic solvent such as alcohol may be contained as a solvent as long as the effects of the present invention are not impaired.
  • the chemical solution of the present invention preferably contains a corrosion inhibitor for the purpose of further suppressing partial corrosion of the surface layer of the cemented carbide base material.
  • the corrosion inhibitor adsorbed on the surface of the cemented carbide base material, or the reaction between the binder metal of the cemented carbide base material and the corrosion inhibitor
  • the surface compound thus formed suppresses corrosion such as oxidation of cemented carbide particles such as WC of cemented carbide and binder metals such as Co by alkali chemicals, or reduces the corrosion rate to cause corrosion and deterioration of cemented carbide. Can be suppressed.
  • Corrosion inhibitor (a) A corrosion inhibitor that suppresses corrosion by previously containing chemical species generated by dissolution of cemented carbide base metal in an alkaline chemical solution
  • Corrosion inhibitor (b) A corrosion inhibitor capable of reducing an oxidizing agent such as dissolved oxygen in an alkaline chemical solution and suppressing corrosion by preventing oxidation of a cemented carbide base material
  • Corrosion inhibitor (c) A corrosion inhibitor that forms a protective film on the surface of the base metal and suppresses corrosion Can be mentioned.
  • These corrosion inhibitors may be used by simultaneously containing a plurality of types in an alkaline chemical solution, and the chemical solution of the present invention may contain a plurality of appropriate corrosion inhibitors to suppress corrosion of the cemented carbide base material. In some cases, the effect can be improved.
  • the corrosion inhibitors (a), (b) and (c) will be described in detail below.
  • the corrosion inhibitor (a) contains in advance in the chemical solution chemical species generated by dissolution of a base metal (a cemented carbide particle and a metal element in a binder metal) constituting a cemented carbide base material by being added to the chemical solution. By doing this, it is intended to suppress corrosion and elution.
  • the corrosion inhibitor (a) is at least one element selected from the group consisting of Group 4 elements, Group 5 elements, Group 6 elements, Fe, Co, Cu and Ni, which constitute the above-mentioned cemented carbide base material. Or a compound containing the element, and is appropriately selected depending on the base metal and / or the binder metal in the cemented carbide base material to be used.
  • a corrosion inhibitor (a) may be made to contain multiple types simultaneously in the chemical
  • the chemical solution of the present invention is a group consisting of Fe, Co, Cu and Ni constituting the binder metal as a corrosion inhibitor (a) It is preferable to contain a single metal containing at least one selected element or a compound containing the element.
  • the chemical solution of the present invention preferably contains a cobalt compound as a corrosion inhibitor (a).
  • cobalt compounds cobalt tungstate, cobalt hydroxide, cobalt oxide and the like can be mentioned.
  • cobalt tungstate and cobalt hydroxide are preferable, and cobalt tungstate is particularly preferable.
  • cobalt metal, tungsten metal, cobalt oxide, tungsten oxide as a corrosion inhibitor (a) Cobalt hydroxide, cobalt tungstate, sodium tungstate, sodium cobaltate, cobalt phosphate and the like can be mentioned.
  • cobalt tungstate, cobalt hydroxide, cobalt oxide and cobalt metal are preferable, and cobalt tungstate is particularly preferable.
  • the corrosion inhibitor (b) is a reducing agent, and the corrosion of the cemented carbide can be suppressed by reducing the oxidizing agent such as dissolved oxygen in the alkaline liquid chemical solution to prevent the oxidation of the cemented carbide base material.
  • a corrosion inhibitor (b) As a suitable example of a corrosion inhibitor (b), the compound shown by General formula (1) is mentioned, for example, A dihydroxy maleic acid is mentioned as a suitable specific example.
  • the compound represented by the general formula (1) is considered to reduce the oxidizing agent in the alkaline chemical solution by supplying reducing hydrogen and to suppress the corrosion of the cemented carbide base material.
  • R 1 is any of a carboxyl group, an alkyl group having 1 to 6 carbon atoms, an acyl group and an alkoxycarbonyl group
  • R 2 is any of an alkyl group having 1 to 6 carbon atoms, an alkoxy group and a hydroxyl group
  • R 1 and R 2 may form a ring structure
  • X 1 and X 2 each independently represent a hydrogen atom or an alkali metal.
  • the compound represented by the R 1 and R 2 of the compound represented by the general formula (1) is an example of a case of forming a ring structure formula (2), preferred example of the corrosion inhibitor (b) It is.
  • R 3 is a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, an alkenyl group, an alkynyl group, an acyl group, an alkoxycarbonyl group, n is 0 or 1 and X 3 and X 4 are each independently hydrogen Is either an atom or an alkali metal.
  • Examples of the compound represented by the general formula (2) include ascorbic acid, sodium ascorbate, erythorbic acid and sodium erythorbate, and it is preferable that the drug solution of the present invention contain at least one of these compounds.
  • corrosion inhibitor (b) examples include compounds represented by the general formulas (3-a) and (3-b).
  • R 4 is a carboxyl group, an aldehyde group, an alkoxy group, an alkoxycarbonyl group, or an acyl group
  • R 5 is a hydrogen atom or a hydroxyl group.
  • a compound having at least one set of a hydroxyl group (OH) in an ortho or para positional relationship has a reduction hydrogen after delivery. Is preferable because it forms a six-membered ring of a stable conjugated structure and has a high reducing power.
  • examples of the above-mentioned compounds include gallic acid, m-galoyl gallic acid, catechol and hydroquinone, and it is preferable to make the drug solution of the present invention contain at least one of these compounds.
  • gallic acid is particularly preferred.
  • the corrosion inhibitor (b) include monosaccharides, disaccharides, trisaccharides, tetrasaccharides, oligosaccharides or polysaccharides.
  • the saccharides exhibiting reducibility show reducibility by the appearance of an aldehyde group which is a reducible functional group when the cyclic structure is solved to form a chain structure.
  • some sugars exhibit reducibility by the structural change of the ketone group that appears when the chain structure is obtained, to form an aldehyde group.
  • disaccharides, trisaccharides, tetrasaccharides, oligosaccharides or polysaccharides that do not have reducibility also exhibit reducibility due to the progress of hydrolysis in the drug solution to produce saccharides having reducibility.
  • An example of these is sucrose.
  • a phosphorus containing reducing agent or a sulfur containing reducing agent is mentioned as another suitable example of a corrosion inhibitor (b).
  • the phosphorus-containing reducing agent or the sulfur-containing reducing agent can reduce an oxidizing agent such as dissolved oxygen in the alkaline liquid chemical solution, and can prevent corrosion by preventing the oxidation of the cemented carbide base material.
  • Examples of the phosphorus-containing reducing agent or the sulfur-containing reducing agent include sodium hypophosphite, potassium phosphite, sodium thiosulfate, sodium sulfite and the like. Among these, sodium thiosulfate is preferable.
  • the corrosion inhibitor (c) is a type of corrosion inhibitor that binds to a base metal and forms a protective film on the surface to suppress corrosion, and includes an azole compound or a salt thereof, a thiourea compound and an acetylene compound.
  • An azole compound or a salt thereof which is an example of a corrosion inhibitor (c), forms a stable film on the surface of a cemented carbide base material by the coordination of the lone electron pair of nitrogen contained in the azole structure to a metal, and oxidation It is considered that the corrosion is suppressed by preventing the intrusion of the agent and the like.
  • azole compound or a salt thereof examples include 1H-tetrazole, 5-amino-1H-tetrazole, 5-methyl-1H-tetrazole, 1-methyl-5-ethyl-tetrazole, 1-methyl-5-mercapto-tetrazole , 5- (2-aminophenyl) -1H-tetrazole, 1-cyclohexyl-5-mercapto-tetrazole, 1-phenyl-5-mercapto-tetrazole, 1-carboxymethyl-5-mercapto-tetrazole and alkali salts thereof
  • Benzotriazole, methylbenzotriazole, dimethylbenzotriazole, hydroxybenzotriazole and the like can be mentioned, among which benzotriazole is preferred.
  • the thiourea compound which is an example of a corrosion inhibitor (c) is a general term for a compound having a structure represented by the general formula (4) in the molecule, and a polar group containing nitrogen or sulfur constitutes a cemented carbide base material It is believed that it can be chelate-adsorbed to metal elements to prevent the entry of oxidants etc. and to inhibit corrosion.
  • Specific examples of the thiourea compound include thiourea, methylthiourea, dimethylthiourea and ethylenethiourea. Among these, thiourea is preferable.
  • An acetylene compound which is an example of a corrosion inhibitor (c) is a generic term for organic compounds containing a C ⁇ C triple bond in the molecule, and provides ⁇ electrons of the triple bond to the empty orbital of the base metal element. It is believed that a bond can be formed between the base metal and the base metal, thereby preventing the entry of an oxidant and exhibiting a corrosion suppressing effect.
  • 2-propyn-1-ol, 1-hexyn-3-ol, 3-butyn-1-ol and the like can be mentioned, and 2-propyn-1-ol is preferred.
  • the corrosion inhibitor may be used by simultaneously containing a plurality of types in an alkaline chemical solution.
  • the concentration in the alkali chemical solution in the case where only one type of each of the corrosion inhibitors (a), (b) and (c) is added is usually 0. 5 in the case of the corrosion inhibitor (a). It is in the range of 001 to 10 mol / L, preferably 0.01 to 1 mol / L, and in the case of the corrosion inhibitor (b), usually 0.001 to 10 mol / L, preferably 0.01 to 1 mol / L.
  • the corrosion inhibitor (c) it is usually in the range of 0.001 to 10 mol / L, preferably 0.05 to 2 mol / L.
  • the amount is not limited to this range, and when the amount of the corrosion inhibitor is too large, it may be difficult to remove the hard coating. On the other hand, when the amount is too small, the corrosion inhibiting effect of the carbide base material may be reduced. It is necessary to set the type and concentration of the alkali chemical solution or the processing temperature under optimum conditions in consideration of the removal rate of the hard film and the corrosion inhibition effect of the cemented carbide base material.
  • a cemented carbide particle is WC
  • a binder metal is an alloy containing Co as a main component
  • a hard film contains at least one compound selected from the group consisting of TiAlN, TiSiN and TiAlCrN.
  • tungstic acid as a corrosion inhibitor for a 10 mol / L sodium hydroxide aqueous solution at a temperature of 170 to 220 ° C.
  • concentration range 0.01 to 1 mol / L
  • concentration range 0.01 to 1 mol / L
  • concentration range 0.01 to 1 mol / L
  • concentration range 0.01 to 1 mol / L
  • concentration ranges of each of the case of use is 0.05 ⁇ 2mol / L.
  • the preferred concentration range of each corrosion inhibitor tends to decrease as compared with the case where only a single corrosion inhibitor is contained by a synergetic effect. For this reason, it is necessary to set optimum conditions according to the type of caustic agent to be combined.
  • Preferred concentrations in the case of combination with other corrosion inhibitors are 0.0001 to 0.1 mol / L in the case of corrosion inhibitors (a) and 0.0001 to 0. 0 in the case of corrosion inhibitors (b). 5 mol / L, and in the case of the corrosion inhibitor (c), 0.0005 to 1 mol / L.
  • a cemented carbide particle is WC
  • a binder metal is an alloy containing Co as a main component
  • a hard film contains at least one compound selected from the group consisting of TiAlN, TiSiN and TiAlCrN. Hydroxide, as a corrosion inhibitor, for a 10 mol / L sodium hydroxide aqueous solution at a temperature of 170 to 220 ° C.
  • the preferred concentration range of each is 0.0001 to 0.1 mol / L of cobalt hydroxide and 0.0001 to 0.5 mol / L of ascorbic acid, each of The preferred concentration range is reduced compared to when used alone.
  • medical solution of this invention may contain the other addition component in the range which does not impair the objective of this invention other than a corrosion inhibitor.
  • a pH buffer, a stabilizer, a surfactant, a radical scavenger and the like can be added as appropriate.
  • alkali hydroxide is suitably used for pH adjustment in the chemical solution of the present invention.
  • the preparation of an aqueous alkali hydroxide solution of a predetermined concentration can be carried out according to the following procedure. First, a predetermined amount of water is placed in a corrosion resistant container, and a predetermined amount of the selected alkali hydroxide compound is gradually added thereto at room temperature with stirring to dissolve or disperse. In addition, it is preferable to add while cooling, when generation
  • the corrosion inhibitor-containing alkali hydroxide aqueous solution may be prepared by gradually adding and dissolving or dispersing it while stirring in an alkaline aqueous solution.
  • the addition of the corrosion inhibitor may be performed simultaneously with or subsequent to the addition of the alkali hydroxide compound.
  • the contact between the cemented carbide and the alkali chemical may be carried out by immersing the cemented carbide in the alkali chemical, dropping the alkali chemical on the cemented carbide, etc. Usually, it is performed by the method of immersing a superhard material in an alkali chemical
  • medical solution Specifically, first, a predetermined amount of an alkali chemical solution capable of completely immersing a cemented carbide material to be removed is placed in a pressure vessel having corrosion resistance to the alkali chemical solution, and then the cemented carbide material is removed at room temperature. Immerse in alkaline chemical solution, close the lid of the pressure container and seal it.
  • an inert gas such as nitrogen or argon gas
  • a reducing gas such as hydrogen sulfide or a vapor generated from an alkaline chemical solution for the purpose of removing the oxidizing gas.
  • a pressure-resistant container in which the above-mentioned cemented carbide material is immersed is set in a heating device such as a ventilation oven, an oil bath, or a heater with a steam jacket, and the heating device is heated to a predetermined temperature. Film removal processing is performed by holding for a while.
  • the heating device is not limited to the one described above as long as it can heat at the predetermined temperature of the present invention.
  • the treatment time is appropriately determined in consideration of the film type (constituting element) of the hard film, the film thickness, the treatment temperature, etc., but usually 1 hour to 100 hours (preferably 5 to 72 hours). Time). If the time is too short, film removal may not be sufficient, and film removal is sufficiently performed in 100 hours, so it is often unnecessary to spend more time.
  • the moisture is removed by drying using a conventional drier to obtain a cemented carbide material from which the hard coating has been removed.
  • the drying and drying conditions are not particularly limited as long as the drying at this time can remove and remove the water.
  • the hard coating of the defective product at the time of manufacture and the end of life product due to use deterioration is selectively removed It is possible to recycle by coating the hard coating again.
  • reagent -Sodium hydroxide (Wako Pure Chemical Industries, Ltd.) ⁇ Benzotriazole (Kanto Chemical Co., Ltd.) -Cobalt tungstate (Mitsuwa Chemical Co., Ltd.
  • Hard film forming device Arc ion plating system (made by Kobe Steel, model number: AIP70TK) (Coating conditions)
  • the table was rotated and treated under conditions, a work temperature of 420 ° C., and a coating time of 60 minutes.
  • Example 1 In a 100 mL volumetric flask, 40 g of sodium hydroxide was weighed, to which pure water was gradually added and dissolved, and the solution was cooled to room temperature and then adjusted to 100 mL to prepare an alkaline chemical solution.
  • a cemented carbide base material comprising an alloy in which the cemented carbide particles are WC and the binder metal is mainly Co (hereinafter referred to as “WC / Co based super”
  • An end mill ( ⁇ 6 mm, length 50 mm, blade length 20 mm) in which two layers of TiAlN and TiAlCrN are coated on the surface of a hard base material) as a compound constituting a hard film
  • the pressure container was sealed by immersing in a chemical solution.
  • the film thickness of the hard film is about 4 ⁇ m.
  • the pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 200 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven became 60 ° C or less, the end mill was taken out from the pressure container, sufficiently washed with pure water, and then water was removed by air blow to obtain a film removal treatment end mill .
  • the surface SEM image (1000 times) of the end mill (base material) after processing is shown in FIG.
  • the film removal conditions and the evaluation results are shown in Table 2. In addition, in the surface SEM image of the end mill (base material) after the treatment, there was no noticeable change in appearance with the surface SEM image (not shown) of the end mill (base material) before the treatment.
  • Example 2 40 g of sodium hydroxide and 1.2 g of benzotriazole were weighed in a 100 mL volumetric flask, pure water was gradually added to this, dissolved, cooled to room temperature, and then made constant to 100 mL to prepare an alkaline chemical solution. 60 mL of this preparation solution is taken while stirring, and charged into the above-mentioned pressure-resistant container, and subsequently a drill ( ⁇ 6 mm) in which TiSiN and TiAlCrN are alternately multi-layeredly coated as a hard coating on the surface of WC / Co cemented carbide base material. , 82 mm in length and 42 mm in blade length) were immersed in the above alkaline chemical solution to seal the pressure resistant container.
  • the film thickness of the hard film is about 4 ⁇ m.
  • the pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven became 60 ° C or lower, the drill was taken out from the pressure container, sufficiently washed with pure water, and then water was removed by air blow to obtain a film removal treatment drill .
  • the surface SEM image (1000 times) of the drill (base material) after processing is shown in FIG.
  • the film removal conditions and the evaluation results are shown in Table 2. In addition, in the surface SEM image of the drill (base material) after the treatment, there was no noticeable change in appearance with the surface SEM image (not shown) of the drill (base material) before the treatment.
  • Example 3 Measure 40 g of sodium hydroxide and 3.4 g of cobalt tungstate in a 100-mL volumetric flask, slowly add pure water to this and dissolve it (cobalt tungstate becomes a slurry because undissolved matter remains), and room temperature After cooling down to a constant volume of 100 mL, an alkaline solution was prepared.
  • the drill was taken out from the pressure container, sufficiently washed with pure water, and then water was removed by air blow to obtain a film removal treatment drill .
  • the surface SEM image (1000 times) of the drill (base material) after processing is shown in FIG.
  • the film removal conditions and the evaluation results are shown in Table 2.
  • Example 4 In a 100-mL volumetric flask, 56 g of potassium hydroxide and 1.2 g of benzotriazole were weighed, and pure water was gradually added thereto, dissolved, cooled to room temperature, and adjusted to 100 mL to prepare an alkaline chemical solution. 60 mL of this preparation solution is taken while stirring, and charged into the above-mentioned pressure-resistant container, and subsequently, a chip (thickness 4.8 mm, side) coated with TiAlN as a hard coating on the surface of WC / Co cemented carbide base material The pressure container was sealed by immersing the 16.5 mm long triangle) in the alkaline chemical solution. The film thickness of the hard film is about 4 ⁇ m.
  • the pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven became 60 ° C or lower, the chip was taken out from the pressure container, sufficiently rinsed with pure water, and then water was removed by air blow to obtain a film-removed chip .
  • the surface SEM image (1000 ⁇ ) of the chip after treatment is shown in FIG.
  • the film removal conditions and the evaluation results are shown in Table 2. In the surface SEM image of the processed chip, there was no noticeable change in appearance with the surface SEM image (not shown) of the chip before processing.
  • Example 5 40 g of sodium hydroxide and 1.2 g of benzotriazole were weighed in a 100 mL volumetric flask, pure water was gradually added to this, dissolved, cooled to room temperature, and then made constant to 100 mL to prepare an alkaline chemical solution. 60 mL of this preparation solution is taken while stirring, and charged into the above-mentioned pressure-resistant container, and subsequently a drill ( ⁇ 6 mm) in which TiSiN and TiAlCrN are alternately multi-layeredly coated as a hard coating on the surface of WC / Co cemented carbide base material. , 82 mm in length and 42 mm in blade length) were immersed in the above alkaline chemical solution to seal the pressure resistant container.
  • the film thickness of the hard film is about 4 ⁇ m.
  • the pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 200 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven became 60 ° C or lower, the drill was taken out from the pressure container, sufficiently washed with pure water, and then water was removed by air blow to obtain a film removal treatment drill .
  • the surface SEM image (1000 times) of the drill (base material) after processing is shown in FIG.
  • the film removal conditions and the evaluation results are shown in Table 2. In addition, in the surface SEM image of the drill (base material) after the treatment, there was no noticeable change in appearance with the surface SEM image (not shown) of the drill (base material) before the treatment.
  • Example 6 In a 100 mL volumetric flask, 40 g of sodium hydroxide was weighed, to which pure water was gradually added and dissolved, and the solution was cooled to room temperature and then adjusted to 100 mL to prepare an alkaline chemical solution. 60 mL of this preparation liquid is charged in the above-mentioned pressure-resistant container, and subsequently, a throwaway tip (12 mm on a side, 3 mm in thickness, a quadrangle of cobalt content 2.5 weight) where the carbide base material is a WC / Co cemented carbide base material.
  • a cemented carbide tool having a hard coating (film thickness 4 ⁇ m) mainly composed of TiAlN formed on a surface of the%) using a PVD apparatus was immersed in the alkali chemical solution to seal the pressure resistant container.
  • the pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip.
  • the surface SEM image (1000 times) of the throw-away tip after treatment is shown in FIG. 9 and the physical properties of the film-deposition treated throw-away tip are shown in Table 2.
  • Table 2 The surface SEM image of the throwaway tip (base material) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG. 35) of the throwaway tip (base material) before hard coating.
  • ion bombard cleaning using argon gas was performed for 75 minutes to clean the surface of the indexable tip.
  • Example 7 Measure 40 g of sodium hydroxide and 3.4 g of cobalt tungstate in a 100-mL volumetric flask, slowly add pure water to this and dissolve it (cobalt tungstate becomes a slurry because undissolved matter remains), and room temperature After cooling down to a constant volume of 100 mL, an alkaline solution was prepared.
  • the same cemented carbide tool as in Example 6 in which 60 mL of this preparation liquid was charged in the above-described pressure resistant container and then a hard coating mainly composed of TiAlN was formed on the throwaway tip was immersed in the alkali chemical solution to Was sealed.
  • the pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip.
  • the surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. 10, and the physical properties of the film-deposition treated throw-away tip are shown in Table 3.
  • the pressure in the chamber is 4 Pa
  • the work temperature is 420 ° C.
  • the film forming speed is 2 to 4 ⁇ m / hr
  • the bias voltage is 30 V
  • a hard coating was formed on the surface of the film removal indexable tip under the conditions.
  • the film adhesion strength between a hard coating formed and regenerated indexable insert and a new indexable insert which has not been subjected to a film removal treatment is as good as 65.1 newton compared to 60.5 new.
  • the film removal conditions and the film adhesion strength evaluation results are shown in Table 4.
  • Example 8 40 g of sodium hydroxide and 1.2 g of benzotriazole were weighed in a 100 mL volumetric flask, pure water was gradually added to this, dissolved, cooled to room temperature, and then made constant to 100 mL to prepare an alkaline chemical solution.
  • the same cemented carbide tool as in Example 6 in which 60 mL of this preparation liquid was charged in the above-described pressure resistant container and then a hard coating mainly composed of TiAlN was formed on the throwaway tip was immersed in the alkali chemical solution to Was sealed.
  • the pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours.
  • the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip.
  • the surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. 11, and the physical properties of the film-deposition treated throw-away tip are shown in Table 2. In the surface SEM image of the throwaway tip (base material) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG. 35) of the throwaway tip (base material) before hard coating.
  • Example 9 In a 100 mL volumetric flask, 40 g of sodium hydroxide and 3.5 g of ascorbic acid were weighed, pure water was gradually added to this, dissolved, cooled to room temperature, and then made constant to 100 mL to prepare an alkaline chemical solution.
  • the same cemented carbide tool as in Example 6 in which 60 mL of this preparation liquid was charged in the above-described pressure resistant container and then a hard coating mainly composed of TiAlN was formed on the throwaway tip was immersed in the alkali chemical solution to Was sealed.
  • the pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 12 hours.
  • the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip.
  • the surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. 12, and the physical properties of the film-deposition treated throw-away tip are shown in Table 3. In the surface SEM image of the throwaway tip (base material) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG.
  • Example 10 Measure 40 g of sodium hydroxide and 3.5 g of cobalt hydroxide in a 100-mL volumetric flask, slowly add pure water to this and dissolve it (cobalt hydroxide becomes a slurry because undissolved matter remains), and room temperature After cooling down to a constant volume of 100 mL, an alkaline solution was prepared.
  • the same cemented carbide tool as in Example 6 in which 60 mL of this preparation liquid was charged in the above-described pressure resistant container and then a hard coating mainly composed of TiAlN was formed on the throwaway tip was immersed in the alkali chemical solution to Was sealed.
  • the pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip.
  • the surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. 13 and the physical properties of the film-deposition treated throw-away tip are shown in Table 3.
  • Example 11 Weigh 40 g of sodium hydroxide and 3.5 g of 2-propyn-1-ol in a 100 mL volumetric flask, slowly add pure water to this, dissolve it, cool to room temperature, and then make up to 100 mL and make an alkaline solution Was prepared. 60 mL of this preparation solution is taken while stirring, and charged into the above-mentioned pressure-resistant container, and subsequently a drill ( ⁇ 6 mm) in which TiSiN and TiAlCrN are alternately multi-layeredly coated as a hard coating on the surface of WC / Co cemented carbide base material.
  • the length 82 mm, blade length 42 mm, cobalt content 6.5 wt%) was immersed in the above alkaline chemical solution to seal the pressure resistant container.
  • the film thickness of the hard film is about 4 ⁇ m.
  • the pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 200 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven became 60 ° C or lower, the drill was taken out from the pressure container, sufficiently washed with pure water, and then water was removed by air blow to obtain a film removal treatment drill .
  • the surface SEM image (1000 times) of the drill (base material) after processing is shown in FIG.
  • the film removal conditions and the evaluation results are shown in Table 3.
  • the surface SEM image of the drill (base material) after treatment there is no noticeable change in appearance with the surface SEM image (not shown) of the drill (base material) before treatment, and the surface cobalt concentration by the SEM-EDX method was measured to be 6.2% by weight.
  • the cross-sectional analysis result of the drill after this process is shown in FIG. As a result of cobalt mapping analysis in the surface depth direction by the SEM-EDX method, cobalt desorption was not found.
  • Example 12 40 g of sodium hydroxide and 3.5 g of gallic acid were weighed in a 100 mL volumetric flask, pure water was gradually added to this, dissolved, cooled to room temperature, and then made constant to 100 mL to prepare an alkaline chemical solution.
  • the same cemented carbide tool as in Example 6 in which 60 mL of this preparation liquid was charged in the above-described pressure resistant container and then a hard coating mainly composed of TiAlN was formed on the throwaway tip was immersed in the alkali chemical solution to Was sealed.
  • the pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours.
  • the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip.
  • the surface SEM image (1000 times) of the throw-away tip after treatment is shown in FIG. 17 and the physical properties of the film-deposition treated throw-away tip are shown in Table 2. In the surface SEM image of the throwaway tip (base material) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG. 35) of the throwaway tip (base material) before hard coating.
  • Example 13 40 g of sodium hydroxide and 3.5 g of disodium hydrogen phosphite are weighed into a 100 mL volumetric flask, pure water is gradually added to this, dissolved, cooled to room temperature, and made constant to 100 mL to prepare an alkaline chemical solution did.
  • the same cemented carbide tool as in Example 6 in which 60 mL of this preparation liquid was charged in the above-described pressure resistant container and then a hard coating mainly composed of TiAlN was formed on the throwaway tip was immersed in the alkali chemical solution to Was sealed.
  • the pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours.
  • the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip.
  • the surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. 18 and the physical properties of the film-deposition treated throw-away tip are shown in Table 2. In the surface SEM image of the throwaway tip (base material) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG. 35) of the throwaway tip (base material) before hard coating.
  • Example 14 In a 100-mL volumetric flask, 40 g of sodium hydroxide and 3.5 g of sodium thiosulfate were weighed, pure water was gradually added to this, dissolved, cooled to room temperature, and then made constant to 100 mL to prepare an alkaline chemical solution.
  • the same cemented carbide tool as in Example 6 in which 60 mL of this preparation liquid was charged in the above-described pressure resistant container and then a hard coating mainly composed of TiAlN was formed on the throwaway tip was immersed in the alkali chemical solution to Was sealed.
  • the pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours.
  • the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip.
  • the surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. 19 and the physical properties of the film-deposition treated throw-away tip are shown in Table 2. In the surface SEM image of the throwaway tip (base material) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG. 35) of the throwaway tip (base material) before hard coating.
  • Example 15 Weigh 40 g of sodium hydroxide and 3.5 g of cobalt hydroxide in a 100-mL volumetric flask and slowly add pure water to this to dissolve it (cobalt hydroxide becomes a slurry because undissolved matter remains) to room temperature After cooling, the volume was adjusted to 100 mL to prepare an alkaline chemical solution. 60 mL of this preparation liquid was charged in the above-mentioned pressure-resistant container, and then one surface was mirror-polished. A throwaway tip (12 mm on a side, 3 mm in thickness, cobalt) whose cemented carbide substrate is a WC / Co cemented carbide substrate.
  • a cemented carbide tool in which a hard coating (film thickness 4 ⁇ m) mainly composed of TiAlN was formed on the surface with a content of 2.5% by weight using a PVD apparatus was immersed in the alkaline chemical solution to seal the pressure resistant container.
  • a hard coating film thickness 4 ⁇ m
  • PVD apparatus By mirror-polishing, it can be expected that variations in measured values in the evaluation of film adhesion strength after film removal and recoating described later will be reduced.
  • the pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling.
  • FIG. 1 the cross-sectional analysis result of the throw away tip after this process is shown in FIG.
  • ion bombard cleaning using argon gas was performed for 75 minutes to clean the surface of the indexable tip.
  • the pressure in the chamber is 4 Pa
  • the work temperature is 420 ° C.
  • the film forming speed is 2 to 4 ⁇ m / hr
  • the bias voltage is 30 V
  • a hard coating was formed on the surface of the film removal indexable tip under the conditions.
  • the film adhesion strength of a new indexable insert which has a hard coating formed and regenerated and a new indexable insert which has not been subjected to a film removal treatment is compared with that of the coating: Met.
  • the variation in the film adhesion strength measurement value has a range of about ⁇ 15 N from the average value, it can be said that the film adhesion strength of the recycled product is comparable to that of a new product.
  • the film removal conditions and the film adhesion strength evaluation results are shown in Table 5.
  • Example 16 Measure 40 g of sodium hydroxide, 0.18 g of ascorbic acid and 0.17 g of cobalt tungstate in a 100-mL volumetric flask, slowly add pure water to this and dissolve it (cobalt tungstate remains small as it remains undissolved. The reaction mixture was cooled to room temperature and then adjusted to 100 mL to prepare an alkaline solution. 60 mL of this preparation liquid was charged in the above-mentioned pressure-resistant container, and then one surface was mirror-polished. A throwaway tip (12 mm on a side, 3 mm in thickness, cobalt) whose cemented carbide substrate is a WC / Co cemented carbide substrate.
  • a cemented carbide tool in which a hard coating (film thickness 4 ⁇ m) mainly composed of TiAlN was formed on the surface with a content of 2.5% by weight using a PVD apparatus was immersed in the alkaline chemical solution to seal the pressure resistant container.
  • a hard coating film thickness 4 ⁇ m
  • PVD apparatus By mirror-polishing, it can be expected that variations in measured values in the evaluation of film adhesion strength after film removal and recoating described later will be reduced.
  • the pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling.
  • FIG. 1 the cross-sectional analysis result of the throw away tip after this process is shown in FIG.
  • ion bombard cleaning using argon gas was performed for 75 minutes to clean the surface of the indexable tip.
  • the pressure in the chamber is 4 Pa
  • the work temperature is 420 ° C.
  • the film forming speed is 2 to 4 ⁇ m / hr
  • the bias voltage is 30 V
  • a hard coating was formed on the surface of the film removal indexable tip under the conditions.
  • the film adhesion strength of a new indexable insert which has a hard coating formed and regenerated and a new indexable insert which has not been subjected to a film removal treatment is compared with that of the coating: Met.
  • the variation in the film adhesion strength measurement value has a range of about ⁇ 15 N from the average value, it can be said that the film adhesion strength of the recycled product is comparable to that of a new product.
  • the film removal conditions and the film adhesion strength evaluation results are shown in Table 5.
  • Example 17 40 g of sodium hydroxide and 7.2 g of maltose were weighed in a 100-mL volumetric flask, pure water was gradually added to this, dissolved, cooled to room temperature, and then made constant to 100 mL to prepare an alkaline chemical solution.
  • the same cemented carbide tool as in Example 6 in which 60 mL of the preparation liquid was charged into the above-mentioned pressure-resistant container in a glove box whose inside was replaced with nitrogen gas, and then a hard coating consisting mainly of TiAlN was formed on the throwaway tip. Was immersed in the alkali chemical solution.
  • the container was sealed in a form in which the gas phase portion of the pressure container was replaced with nitrogen gas.
  • the pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip.
  • the surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. In the surface SEM image of the throwaway tip (base material) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG. 35) of the throwaway tip (base material) before hard coating.
  • Example 18 40 g of sodium hydroxide, 0.34 g of sucrose, and 0.05 g of cobalt hydroxide are weighed into a 100-mL volumetric flask, pure water is gradually added to this, dissolved, cooled to room temperature, and the volume is adjusted to 100 mL and alkali A drug solution was prepared (cobalt hydroxide produces a small amount of precipitate because undissolved matter remains).
  • the same cemented carbide tool as in Example 6 in which 60 mL of the preparation liquid was charged into the above-mentioned pressure-resistant container in a glove box whose inside was replaced with nitrogen gas, and then a hard coating consisting mainly of TiAlN was formed on the throwaway tip. was immersed in the alkali chemical solution.
  • the container was sealed in a form in which the gas phase portion of the pressure container was replaced with nitrogen gas.
  • the pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip. The surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG.
  • Example 19 40 g of sodium hydroxide, 0.18 g of glucose, and 0.05 g of cobalt hydroxide are weighed into a 100-mL volumetric flask, pure water is gradually added to this, dissolved, cooled to room temperature, and the volume is adjusted to 100 mL and alkali A drug solution was prepared (cobalt hydroxide produces a small amount of precipitate because undissolved matter remains).
  • the same cemented carbide tool as in Example 6 in which 60 mL of the preparation liquid was charged into the above-mentioned pressure-resistant container in a glove box whose inside was replaced with nitrogen gas, and then a hard coating consisting mainly of TiAlN was formed on the throwaway tip. was immersed in the alkali chemical solution.
  • the container was sealed in a form in which the gas phase portion of the pressure container was replaced with nitrogen gas.
  • the pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip. The surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG.
  • Comparative Example 1 In a 300 mL poly beaker, 106 g of pure water and 86 g of 35% hydrogen peroxide water were weighed and subsequently, 8 g of 25% aqueous ammonia at room temperature was gradually added while stirring to prepare a film removing solution. Then, immerse an end mill ( ⁇ 6 mm, length 50 mm, edge length 20 mm) coated with TiAlN and TiAlCrN as a hard coating on the surface of WC / Co cemented carbide base material in this chemical solution, 15 The film was removed at 9 ° C. to 25 ° C. for 9 hours. The film thickness of the hard film is about 4 ⁇ m.
  • the end mill was taken out of the beaker, thoroughly washed with pure water, and then water was removed by air blow to obtain a film removal end mill.
  • the surface SEM image (1000 times) of the end mill (base material) after the treatment is shown in FIG.
  • the film removal conditions and the evaluation results are shown in Table 2.
  • the metallic gloss of the surface was apparently lost and turned to gray.
  • Comparative example 2 74 mL of 67.5% nitric acid was placed in a 200 mL glass measuring flask, and the volume was adjusted with pure water to adjust the decoating chemical solution. This solution is charged into a 300 mL glass beaker, and then an end mill ( ⁇ 6 mm, length 50 mm, blade) is coated with two layers of TiAlN and TiAlCrN as a hard coating on the surface of WC / Co cemented carbide base material with this chemical solution. The part length was 20 mm, and after raising the temperature to 80 ° C. in a water bath, the film was held for 48 hours for film removal treatment. The film thickness of the hard film is about 4 ⁇ m.
  • the end mill was taken out of the beaker, thoroughly washed with pure water, and then water was removed by air blow to obtain a film removal end mill.
  • a surface SEM image (1000 ⁇ ) of the end mill after treatment is shown in FIG.
  • the film removal conditions and the evaluation results are shown in Table 2.
  • the surface SEM image of the end mill (base material) after the treatment had a rough surface (corrosion) compared to the surface SEM image (not shown) of the end mill (base material) before the treatment.
  • Comparative example 3 40 g of sodium hydroxide and 1.2 g of benzotriazole were weighed in a 100 mL volumetric flask, pure water was gradually added to this, dissolved, cooled to room temperature, and then made constant to 100 mL to prepare an alkaline chemical solution. 60 mL of this preparation solution is taken while stirring, and charged into the above-mentioned pressure-resistant container, and subsequently a drill ( ⁇ 6 mm) in which TiSiN and TiAlCrN are alternately multi-layeredly coated as a hard coating on the surface of WC / Co cemented carbide base material. , 82 mm in length and 42 mm in blade length) were immersed in the above alkaline chemical solution to seal the pressure resistant container.
  • the film thickness of the hard film is about 4 ⁇ m.
  • the pressure-resistant container was placed in the above-mentioned heating oven, heated to 95 ° C., and subjected to film removal treatment at this temperature for 48 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven became 60 ° C or lower, the drill was taken out from the pressure container, sufficiently washed with pure water, and then water was removed by air blow to obtain a film removal treatment drill .
  • the surface SEM image (1000 times) of the drill (base material) after the treatment is shown in FIG.
  • the film removal conditions and the evaluation results are shown in Table 2.
  • the surface SEM image of the drill (base material) after the treatment had a rough surface (corrosion) compared to the surface SEM image (not shown) of the drill (base material) before the treatment.
  • Comparative example 4 In a 300 mL poly beaker, 106 g of pure water and 86 g of 35% hydrogen peroxide water were weighed and subsequently, 8 g of 25% aqueous ammonia at room temperature was gradually added while stirring to prepare a film removing solution. Subsequently, the same cemented carbide tool as in Example 6 in which a hard coating mainly composed of TiAlN was formed on the indexable tip was immersed in the film removing chemical solution to seal the pressure resistant container, and 39 at 15 ° C to 25 ° C. The film was removed for a while.
  • the throwaway tip was taken out of the beaker, sufficiently washed with pure water, and then water was removed by air blow to obtain a film-deposition treated throwaway tip.
  • the surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. 14 and the physical properties of the film-deposition treated throw-away tip are shown in Table 3.
  • the surface SEM image of the indexable tip (base material) after the treatment had a rough surface (corrosion) compared to the surface SEM image of the indexable tip (base material) before hard coating.
  • the pressure in the chamber is 4 Pa
  • the work temperature is 420 ° C.
  • the film forming speed is 2 to 4 ⁇ m / hr
  • the bias voltage is 30 V
  • a hard coating was formed on the surface of the film removal indexable tip under the conditions.
  • the film adhesion strength of the throwaway chip that has been hard-filmed and regenerated is compared with the film adhesion strength of the new throwaway chip that has not been subjected to film removal treatment. The result was significantly inferior.
  • the film removal conditions and the film adhesion strength evaluation results are shown in Table 4.
  • Comparative example 5 74 mL of 67.5% nitric acid was added to a 200 mL glass measuring flask, and the volume was adjusted with pure water to prepare a demembraned chemical solution. The entire volume of this solution was charged in a 300 mL glass beaker, and then a cemented carbide tool similar to that of Example 6 in which a hard coating consisting mainly of TiAlN was formed on the throwaway tip was immersed in the decoating solution to make a pressure resistant container. The film was sealed, heated to 80 ° C. in a water bath, and then held for 30 hours for film removal treatment.
  • the throwaway tip was taken out of the beaker, sufficiently washed with pure water, and then water was removed by air blow to obtain a film-deposition treated throwaway tip.
  • the surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. 15, and the physical properties of the film-deposition treated throw-away tip are shown in Table 3.
  • the surface SEM image of the indexable tip (base material) after the treatment had a rough surface (corrosion) compared to the surface SEM image of the indexable tip (base material) before hard coating. When the surface cobalt concentration was measured by the SEM-EDX method, most of it was desorbed by the film removal operation with zero weight%.
  • the cross-sectional analysis result of the throw away tip after this process is shown in FIG.
  • the cobalt desorption depth was desorbed to a depth of about 12.5 ⁇ m from the surface.
  • ion bombard cleaning using argon gas was performed for 75 minutes to clean the surface of the indexable tip.
  • the pressure in the chamber is 4 Pa
  • the work temperature is 420 ° C.
  • the film forming speed is 2 to 4 ⁇ m / hr
  • the bias voltage is 30 V
  • a hard coating was formed on the surface of the film removal indexable tip under the conditions.
  • the film adhesion strength of the throwaway chip with hard coating formed and that of the new throwaway chip not subjected to film removal treatment was compared.
  • the film adhesion strength of the regenerated throwaway chip was 2.0 Newtons compared to that of the new product. The result was significantly inferior.
  • the film removal conditions and the film adhesion strength evaluation results are shown in Table 4.
  • Table 2 shows the list of removal results of hard coatings in Examples 1 to 5 and Comparative Examples 1 to 3 above
  • Table 3 shows the list of removal results of hard coatings on Examples 6 to 10 and Comparative Examples 4 and 5 in Examples.
  • the present invention it is possible to selectively remove the hard coating on the surface of the cemented carbide base material while minimizing the surface deterioration of the cemented carbide base material in the cemented carbide material. Very useful.

Abstract

Disclosed is a method for removing a hard coating film in a superhard material, which can selectively remove a hard coating film provided on the surface of a superhard material such as a superhard tool and a mold, and can minimize the deterioration in a superhard base material. Specifically disclosed is a method for removing a hard coating film in a superhard material in which the surface of a superhard base material is coated with the hard coating film, wherein the superhard base material is produced by sintering superhard alloy particles each comprising a carbide of at least one element selected from the group consisting of Group-4 elements, Group-5 elements and Group-6 elements with a binder metal comprising at least one element selected from the group consisting of Fe, Co, Cu and Ni or an alloy containing any one element selected from the preceding group, and wherein the hard coating film comprises a nitride, a carbide, a carbonitride, an oxide or a boride of at least one element selected from the group consisting of Group-4 elements, Group-5 elements, Group-6 elements, Group-13 elements and Group-14 elements (excluding carbon). The method comprises bringing the superhard material into contact with an alkaline solution at a temperature ranging from 100 to 250°C inclusive.

Description

超硬材における硬質被膜の除去方法及び超硬材の製造方法Method of removing hard film in cemented carbide material and method of producing cemented carbide material
 本発明は、超硬材における硬質被膜の除去方法及び超硬材の製造方法に関する。詳しくは、その表面に硬質被膜が形成されてなる超硬工具類又は金型類などの超硬材において、これらの製作時の規格外品又はこれらを切削加工等に用いた使用劣化品の硬質被膜を除去するための薬液及びこの薬液を用いた硬質被膜の除去方法並びに当該硬質被膜を除去した超硬材に再度硬質被膜を成膜する超硬材の製造方法に関するものである。 The present invention relates to a method of removing a hard coating on a cemented carbide material and a method of manufacturing a cemented carbide material. More specifically, in the case of cemented carbide materials such as cemented carbide tools or molds having a hard coating formed on the surface, the nonstandard products at the time of production of these or hard products of use deterioration using these for cutting etc. The present invention relates to a chemical solution for removing a film, a method for removing a hard film using the chemical solution, and a method for producing a hard material for forming a hard film again on a hard material from which the hard film has been removed.
 超硬材は、超硬母材の表面にCVD法(化学的気相成長法)又はPVD法(物理的気相成長法)などを用いて窒化物などの硬質被膜を形成させた超硬工具類又は金型類のことである。超硬材は、硬度、靭性、耐摩耗性等の特性に優れるため、これらの特性が要求される各種の切削加工や金型などの分野で起用されている。 Cemented carbide is a cemented carbide tool in which a hard coating such as nitride is formed on the surface of a cemented carbide base material using CVD (chemical vapor deposition) or PVD (physical vapor deposition). Class or mold class. Since cemented carbides are excellent in properties such as hardness, toughness, and wear resistance, they are used in fields such as various cuttings and molds where these properties are required.
 超硬母材は、WC(タングステンカーバイド)などの超硬合金粒子を、Fe、Co、Ni、Cu等のバインダー金属を用いて1500℃前後で焼結させたものであり、非常に高い硬度と靭性を有する。超硬母材は、超硬合金粒子の粒径とバインダー金属の量を変化させることにより硬度、靭性などの特性が変化するため、金属加工工具類や金型類などの使用用途の必要性に適したものが用いられている。通常、超硬合金粒子の粒径が小さい又はバインダー金属量が少ないほど超硬母材の硬度は高くなる傾向にある。 The cemented carbide base material is obtained by sintering cemented carbide particles such as WC (tungsten carbide) with a binder metal such as Fe, Co, Ni, and Cu at around 1500 ° C., and has a very high hardness and It has toughness. Since the base material of cemented carbide changes the characteristics such as hardness and toughness by changing the particle size of cemented carbide particles and the amount of binder metal, it is necessary to use metalworking tools, dies, etc. A suitable one is used. Generally, the smaller the particle size of cemented carbide particles or the smaller the amount of binder metal, the higher the hardness of the cemented carbide base material tends to be.
 硬質被膜は、超硬母材の耐摩耗性や耐食性の更なる向上を目的に、その母材表面にCVD法やPVD法を用いて形成した硬質材料からなる被膜のことであり、超硬工具類又は金型類の寿命向上に寄与する。硬質被膜に用いられる化合物としては、TiN、CrN、VN、TiAlN、AlCrN、TiAlCrN、TiSiN等の窒化物、TiC、CrC、VC等の炭化物、TiCN等の炭窒化物があり、これらを含有する物質を単層あるいは複層重ねて被覆して用いられる。 A hard coating is a coating made of a hard material formed on the surface of a base material using a CVD method or a PVD method for the purpose of further improving the wear resistance and corrosion resistance of the base material, and a carbide tool It contributes to the improvement of the life of the mold or mold. The compounds used for the hard coating include nitrides such as TiN, CrN, VN, TiAlN, AlCrN, TiAlCrN, TiSiN, carbides such as TiC, CrC, VC, etc. and carbonitrides such as TiCN. Is coated in a single layer or multiple layers.
 ところで、超硬材はこれらの製作時において硬質被膜の被覆工程で被膜不良を生じた「規格外品」やその使用時に短時間で部分剥離や耐摩耗性不良等を生じた「欠陥品」、更には、通常の長時間使用で硬質被膜が磨耗してしまい寿命に達した「寿命劣化品」などが発生する。この様な「規格外品」「欠陥品」「寿命劣化品」は、資源保護の観点から、これらを粉砕して希少金属のタングステンをWC粉として回収してリサイクル使用されているのが殆どである。
 しかし、現状のリサイクル方法では粉砕、分級、再焼結、形状加工と回収工程が多く、リサイクル費用が嵩んでしまう問題がある。
By the way, carbide materials are “non-standard products” that have coating defects in the coating process of hard coatings at the time of their manufacture, and “defective products” that cause partial peeling and wear resistance defects etc. in a short time when using them. Furthermore, the hard coating wears out in normal long-term use, and the "life-deteriorated product" which has reached the life is generated. Such “non-standard products”, “defective products” and “life-deteriorated products” are mostly crushed from the viewpoint of resource protection, recovered as rare metal tungsten as WC powder and recycled and used. is there.
However, the current recycling methods involve many processes such as crushing, classification, re-sintering, shape processing and recovery, and there is a problem that recycling costs increase.
 一方、不良、欠陥又は寿命劣化した硬質被膜を超硬母材から除去して、硬質被膜を再被覆するリユース方法が効率的、コスト的にも有利である。そのため、従来から種々の除去薬液を用いた硬質被膜の除去方法が試みられている。
 従来技術における薬液を用いた硬質被膜の除去方法として、酸をベースとした薬液を使用する方法や、過酸化水素を含有するアルカリ薬液を使用する方法が知られている。
 酸をベースとした薬液を使用する方法の例として、特許文献1には、ステンレス鋼の表面に被覆されたTiN被膜を除去する方法で、該被膜が形成されたステンレス鋼を70℃以上に加温された15~30体積%の硝酸水溶液に浸漬する方法が開示されている。また、過酸化水素を含有するアルカリ薬液を使用する方法の例として、特許文献2には、過酸化水素を1~60重量%、界面活性剤を0.05~5重量%含有し、かつ、pH7.5~12のアルカリ性水溶液に被膜除去対象の部材を浸漬する方法が開示されている。
On the other hand, a reuse method of recoating a hard coating by removing a defective, defective or life-degraded hard coating from a cemented carbide base material is also advantageous in terms of efficiency and cost. Therefore, attempts have been made to remove hard coatings using various removal chemicals.
As a method of removing a hard film using a chemical solution in the prior art, a method using an acid-based chemical solution and a method using an alkaline chemical solution containing hydrogen peroxide are known.
As an example of a method using an acid-based chemical solution, Patent Document 1 discloses that the stainless steel on which the coating is formed is added to 70 ° C. or more by a method of removing the TiN coating coated on the surface of stainless steel. A method of immersion in a warmed 15-30 volume% nitric acid aqueous solution is disclosed. Further, as an example of a method using an alkaline chemical solution containing hydrogen peroxide, Patent Document 2 contains 1 to 60% by weight of hydrogen peroxide and 0.05 to 5% by weight of a surfactant, and There is disclosed a method of immersing a member to be subjected to film removal in an alkaline aqueous solution having a pH of 7.5 to 12.
特開昭59-41479号公報JP-A-59-41479 特開2005-48248号公報JP 2005-48248 A
 しかしながら、酸をベースとした薬液では、硬質被膜は除去されるが、超硬母材表層からバインダー金属が溶解するため、超硬母材表層が脆化してしまう。そして、この上に硬質被膜を再被覆した再生品は切削加工等を行うと直ぐに母材が破損してしまうため、耐久性が不十分という問題がある。
 また、過酸化水素を含有する薬液では、過酸化水素が直接、WC等の超硬合金粒子を浸食するため、同様に母材の強度の低下をきたし、再生品とした場合の耐久性が不十分である。
However, in the case of an acid-based chemical solution, although the hard film is removed, the binder metal is dissolved from the surface layer of the cemented carbide base material, and the surface layer of the cemented carbide base material becomes brittle. And since a base material will be damaged as soon as a recycled product which recoated the hard film on this is cut etc., there is a problem that endurance is insufficient.
Further, in a chemical solution containing hydrogen peroxide, hydrogen peroxide directly corrodes cemented carbide particles such as WC, so the strength of the base material is similarly lowered, and the durability in the case of a recycled product is not good. It is enough.
 このように従来の薬液を使用した硬質被膜の除去方法では、「硬質被膜の選択的除去」と「超硬母材の劣化防止」の両方を満足できる技術完成には至っていないのが現状であり、工業的に実施するには必ずしも適当なものとはいえなかった。 As described above, with the conventional method for removing a hard film using a chemical solution, it is the present situation that the technology has not been completed which satisfies both "selective removal of hard film" and "prevention of deterioration of cemented carbide base material". It was not necessarily appropriate for industrial implementation.
 かかる状況下、本発明の目的は、超硬材工具類又は金型類等の超硬材表面の硬質被膜を選択的に除去でき、かつ、超硬母材の劣化を最小限に抑制することを可能とする、超硬材における硬質被膜の除去方法を提供することである。 Under such circumstances, it is an object of the present invention to selectively remove hard coatings on the surface of cemented carbide materials such as cemented carbide tools or molds, and to minimize deterioration of the cemented carbide base material. It is an object of the present invention to provide a method of removing a hard film in a cemented carbide material, which makes it possible to
 本発明者らは、上記課題を解決すべく鋭意研究を重ねた結果、下記の発明が上記目的に合致することを見出し、本発明に至った。 MEANS TO SOLVE THE PROBLEM As a result of repeating earnest research so that the said subject might be solved, the present inventors discovered that the following invention met the said objective, and came to this invention.
 すなわち、本発明は、以下の発明に係るものである。
 <1> 第4族元素、第5族元素及び第6族元素からなる群より選ばれた少なくとも1種の元素の炭化物を含有する超硬合金粒子が、Fe、Co、Cu及びNiからなる群より選ばれた少なくとも1種の元素あるいはこれらの元素を含有する合金からなるバインダー金属で焼結された超硬母材の表面を、第4族元素、第5族元素、第6族元素、第13族元素及び第14族元素(但し、炭素は除く。)からなる群より選ばれた少なくとも1種の元素の窒化物、炭化物、炭窒化物、酸化物又はホウ化物を含有する硬質被膜で被覆してなる超硬材における硬質被膜を除去する方法であって、
 前記超硬材を100℃以上250℃以下の温度で、アルカリ薬液に接触させることを特徴とする超硬材における硬質被膜の除去方法。
 <2> 前記アルカリ薬液が、超硬母材の腐食抑制剤を含有する前記<1>記載の硬質被膜の除去方法。
 <3> 前記腐食抑制剤が、前記超硬母材を構成する第4族元素、第5族元素、第6族元素、Fe、Co、Cu及びNiからなる群より選ばれた少なくとも1種の元素からなる群より選ばれた少なくとも1種の元素からなる単体あるいは該元素を含む化合物である前記<1>又は<2>に記載の硬質被膜の除去方法。
 <4> 前記腐食抑制剤が、コバルト化合物である前記<3>記載の硬質被膜の除去方法。
 <5> 前記腐食抑制剤が、タングステン酸コバルト、水酸化コバルト又は酸化コバルト、コバルト金属である前記<4>に記載の硬質被膜の除去方法。
 <6> 前記腐食抑制剤が、還元剤である前記<2>に記載の硬質被膜の除去方法。
 <7> 前記還元剤が、下記一般式(1)で示される化合物である前記<6>記載の硬質被膜の除去方法。
Figure JPOXMLDOC01-appb-C000005
(式中、R1はカルボキシル基、炭素数1~6のアルキル基、アシル基、アルコキシカルボニル基のいずれか、R2は炭素数1~6のアルキル基、アルコキシ基、水酸基のいずれかであり、R1とR2が環構造を形成していてもよい。X1、X2はそれぞれ独立に水素原子、アルカリ金属のいずれかである。)
 <8> 前記還元剤が、ジヒドロキシマレイン酸である前記<7>記載の硬質被膜の除去方法。
 <9> 前記還元剤が、下記一般式(2)で示される化合物である前記<7>記載の硬質被膜の除去方法。
Figure JPOXMLDOC01-appb-C000006
(式中、R3は水素原子若しくは炭素数1~6のアルキル基、アルケニル基、アルキニル基、アシル基、アルコキシカルボニル基であり、nは0又は1、X3、X4はそれぞれ独立に水素原子、アルカリ金属のいずれかである。)
 <10> 前記還元剤が、アスコルビン酸、アスコルビン酸ナトリウム、エリソルビン酸及びエリソルビン酸ナトリウムから選ばれた少なくとも1種である前記<9>記載の硬質被膜の除去方法。
 <11> 前記還元剤が、下記一般式(3-a)、(3-b)で示される化合物及び/又はその塩である前記<6>に記載の硬質被膜の除去方法。
Figure JPOXMLDOC01-appb-C000007

Figure JPOXMLDOC01-appb-C000008
(式(3-a)、(3-b)中、R4はカルボキシル基、アルデヒド基、アルコキシ基、アルコキシカルボニル基、又はアシル基、R5は水素原子又は水酸基である。)
That is, the present invention relates to the following inventions.
<1> A group in which cemented carbide particles containing a carbide of at least one element selected from the group consisting of a group 4 element, a group 5 element and a group 6 element consist of Fe, Co, Cu and Ni The surface of a cemented carbide base material sintered with a binder metal consisting of at least one element selected from the group consisting of at least one element selected from these elements or an alloy containing these elements is a group 4 element, a group 5 element, a group 6 element, a group Coated with a hard film containing a nitride, carbide, carbonitride, oxide or boride of at least one element selected from the group consisting of Group 13 elements and Group 14 elements (with the exception of carbon) A method of removing the hard coating on the resulting cemented carbide material,
A method of removing a hard film on a cemented carbide, comprising bringing the cemented carbide into contact with an alkaline chemical solution at a temperature of 100 ° C. or more and 250 ° C. or less.
<2> The method for removing a hard film according to <1>, wherein the alkaline chemical solution contains a corrosion inhibitor of a cemented carbide base material.
<3> The corrosion inhibitor is at least one selected from the group consisting of Group 4 elements, Group 5 elements, Group 6 elements, Fe, Co, Cu and Ni constituting the cemented carbide base material. The method for removing a hard film according to <1> or <2>, which is a simple substance consisting of at least one element selected from the group consisting of elements or a compound containing the element.
The removal method of the hard film the said <3> description whose <4> above-mentioned corrosion inhibitor is a cobalt compound.
<5> The method for removing a hard film according to <4>, wherein the corrosion inhibitor is cobalt tungstate, cobalt hydroxide or cobalt oxide, or cobalt metal.
The removal method of the hard film as described in said <2> whose <6> above-mentioned corrosion inhibitor is a reducing agent.
The removal method of the hard film the said <6> description whose <7> above-mentioned reducing agent is a compound shown by following General formula (1).
Figure JPOXMLDOC01-appb-C000005
(Wherein, R 1 is any of a carboxyl group, an alkyl group having 1 to 6 carbon atoms, an acyl group and an alkoxycarbonyl group, and R 2 is any of an alkyl group having 1 to 6 carbon atoms, an alkoxy group and a hydroxyl group And R 1 and R 2 may form a ring structure, and X 1 and X 2 each independently represent a hydrogen atom or an alkali metal.
<8> The method for removing a hard film according to <7>, wherein the reducing agent is dihydroxymaleic acid.
The removal method of the hard film the said <7> description whose <9> said reducing agent is a compound shown by following General formula (2).
Figure JPOXMLDOC01-appb-C000006
(Wherein, R 3 is a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, an alkenyl group, an alkynyl group, an acyl group, an alkoxycarbonyl group, n is 0 or 1 and X 3 and X 4 are each independently hydrogen Is either an atom or an alkali metal.)
<10> The method for removing a hard film according to <9>, wherein the reducing agent is at least one selected from ascorbic acid, sodium ascorbate, erythorbic acid and sodium erythorbate.
<11> The method for removing a hard film according to <6>, wherein the reducing agent is a compound represented by the following general formula (3-a) or (3-b) and / or a salt thereof.
Figure JPOXMLDOC01-appb-C000007

Figure JPOXMLDOC01-appb-C000008
(In the formulas (3-a) and (3-b), R 4 is a carboxyl group, an aldehyde group, an alkoxy group, an alkoxycarbonyl group, or an acyl group, and R 5 is a hydrogen atom or a hydroxyl group.)
 <12> 前記還元剤が、没食子酸、m-ガロイル没食子酸、カテコール及びヒドロキノンから選ばれた少なくとも1種である前記<11>記載の硬質被膜の除去方法。
 <13> 前記還元剤が、単糖類、二糖類、三糖類、四糖類、オリゴ糖、多糖類である前記<6>に記載の硬質被膜の除去方法。
 <14> 前記還元剤が、ジヒドロキシアセトン、エリトルロース、エリトロース、キシルロース、リボース、アラビノース、キシロース、デオキシリボース、プシコース、グルコース、フルクトース、ソルボース、タガトース、マンノース、イドース、タロース、フコース、ラムノース、マルトース、ラクトース、スクロース、トレハロース、ツラノース、セロビオース、ラフィノース、マルトトリオース、アカルボース、スタキオース、ガラクトース、リボース、フラクトオリゴ糖、ガラクトオリゴ糖、マンナンオリゴ糖、グリコーゲン、デンプン、セルロース、デキストリン、グルカン、レバン及びイヌリンから選ばれた少なくとも1種である前記<13>記載の硬質被膜の除去方法。
 <15> 前記還元剤が、含リン系還元剤又は含イオウ系還元剤である前記<6>記載の硬質被膜の除去方法。
 <16> 前記還元剤が、亜リン酸水素二ナトリウム又はチオ硫酸ナトリウムである前記<15>記載の硬質被膜の除去方法。
 <17> 前記腐食抑制剤が、アゾール化合物又はその塩、チオ尿素化合物及びアセチレン系化合物からなる群より選ばれた少なくとも1種の化合物である前記<2>に記載の硬質被膜の除去方法。
 <18> 前記アゾール化合物が、ベンゾトリアゾールである前記<17>記載の硬質被膜の除去方法。
 <19> 前記チオ尿素化合物が、チオ尿素である前記<17>記載の硬質被膜の除去方法。
 <20> 前記アセチレン系化合物が、2-プロピン-1-オール、1-ヘキシン-3-オール、3-ブチン-1-オールから選ばれた少なくとも1種である前記<17>記載の硬質被膜の除去方法。
 <21> 超硬合金粒子が、W、Ti、Nb、Ta、V、Crからなる群より選ばれた少なくとも1種の元素の炭化物を含有する前記<1>乃至<20>のいずれかに記載の硬質被膜の除去方法。
<12> The method according to <11>, wherein the reducing agent is at least one selected from gallic acid, m-galoyl gallic acid, catechol and hydroquinone.
<13> The method for removing a hard film according to <6>, wherein the reducing agent is a monosaccharide, a disaccharide, a trisaccharide, a tetrasaccharide, an oligosaccharide, or a polysaccharide.
<14> The reducing agent is dihydroxyacetone, erythrulose, erythrose, xylulose, ribose, arabinose, xylose, deoxyribose, psicose, glucose, fructose, sorbose, tagatose, mannose, idose, talose, fucose, rhamnose, maltose, lactose, At least selected from sucrose, trehalose, tulanose, cellobiose, raffinose, maltotriose, acarbose, stachyose, galactose, ribose, fructooligosaccharide, galactooligosaccharide, mannanoligosaccharide, glycogen, starch, cellulose, dextrin, glucan, levan and inulin The removal method of the hard film of the said <13> description which is 1 type.
<15> The method for removing a hard film according to <6>, wherein the reducing agent is a phosphorus-containing reducing agent or a sulfur-containing reducing agent.
<16> The method according to <15>, wherein the reducing agent is disodium hydrogen phosphite or sodium thiosulfate.
<17> The method for removing a hard film according to <2>, wherein the corrosion inhibitor is at least one compound selected from the group consisting of an azole compound or a salt thereof, a thiourea compound and an acetylenic compound.
<18> The method for removing a hard film according to <17>, wherein the azole compound is benzotriazole.
<19> The method for removing a hard film according to <17>, wherein the thiourea compound is thiourea.
<20> The hard coating according to <17>, wherein the acetylene compound is at least one selected from 2-propyn-1-ol, 1-hex-3-ol, and 3-butyn-1-ol. How to remove
<21> The cemented carbide particle according to any one of the above <1> to <20>, wherein the cemented carbide particles contain a carbide of at least one element selected from the group consisting of W, Ti, Nb, Ta, V, and Cr. How to remove hard coatings.
 <22> バインダー金属が、Coを含有する前記<1>乃至<21>のいずれかに記載の硬質被膜の除去方法。
 <23> 硬質被膜が、Ti、V、Cr、Si及びAlからなる群より選ばれた少なくとも1種の元素の窒化物、炭化物又は炭窒化物を含有することを特徴とする前記<1>乃至<22>のいずれかに記載の硬質被膜の除去方法。
 <24> 硬質被膜が、TiN、TiAlN、TiSiN、TiAlCrN、CrN、TiCrN、VN、TiC及びTiCNからなる群より選ばれた少なくとも1種の化合物を含有する前記<1>乃至<23>のいずれかに載の硬質被膜の除去方法。
 <25> 硬質被膜が、単層あるいは複層の膜で構成されてなる前記<1>乃至<24>のいずれかに記載の硬質被膜の除去方法。
 <26> アルカリ薬液が、1~20mol/L(OH-換算)のアルカリ金属水酸化物及び/又はアルカリ土類金属水酸化物を含有する前記<1>乃至<25>のいずれかに記載の硬質被膜の除去方法。
 <27> アルカリ薬液が、1~20mol/L(OH-換算)の水酸化ナトリウム及び/又は水酸化カリウムを含有する前記<26>記載の硬質被膜の除去方法。
 <28> 気相部分を不活性気体及び/又は還元性気体及び/又はアルカリ薬液から発生する蒸気で置換した気密性処理容器内で、前記超硬材から硬質被膜の除去を行う前記<1>乃至<27>のいずれかに記載の硬質被膜の除去方法。
 <29> 前記<1>乃至<28>のいずれかに記載の硬質被膜の除去方法により硬質被膜を除去し、再度硬質被膜を成膜する、硬質被膜に被覆された超硬材の製造方法。
<22> The method for removing a hard film according to any one of <1> to <21>, wherein the binder metal contains Co.
<23> The hard film comprises a nitride, carbide or carbonitride of at least one element selected from the group consisting of Ti, V, Cr, Si and Al. The removal method of the hard film in any one of <22>.
<24> Any one of the above <1> to <23>, wherein the hard coating contains at least one compound selected from the group consisting of TiN, TiAlN, TiSiN, TiAlCrN, CrN, TiCrN, VN, TiC and TiCN. Hard coating removal method described in.
<25> The method for removing a hard film according to any one of <1> to <24>, wherein the hard film is composed of a single layer or a multilayer film.
<26> alkaline chemical is, 1 ~ 20 mol / L - according to any one of <1> to <25> containing an alkali metal hydroxide and / or alkaline earth metal hydroxide (OH equivalent) Hard coating removal method.
<27> The method for removing a hard film as described in the above <26>, wherein the alkaline chemical solution contains 1 to 20 mol / L (OH - converted) sodium hydroxide and / or potassium hydroxide.
<28> The above-mentioned <1> for removing the hard film from the cemented carbide in an airtight processing container in which the gas phase part is replaced with an inert gas and / or a reducing gas and / or a vapor generated from an alkaline chemical solution. <27> The method for removing a hard film according to any one of <27>.
<29> A method for producing a cemented carbide-coated material coated with a hard coating, wherein the hard coating is removed by the method for removing a hard coating according to any one of <1> to <28>, and the hard coating is formed again.
 本発明により、超硬材工具類又は金型類等の超硬材における超硬母材の表面劣化を最小限に抑制しつつ、超硬母材表面の硬質被膜を選択的に除去することができるため、超硬材の効率的かつ安価なリユースを実現できる。 The present invention selectively removes the hard coating on the surface of the cemented carbide while minimizing the surface deterioration of the cemented carbide in the cemented carbide material such as cemented carbide tools or dies. Because of this, efficient and inexpensive reuse of cemented carbide can be realized.
実施例1の表面SEM像である(中央右側の黒ずみは電子線による焼けであり除膜処理によるダメージではない。)。It is a surface SEM image of Example 1 (darkness at the center right is burnt by electron beam and not damage by film removal treatment). 実施例2の表面SEM像である(中央右側の黒ずみは電子線による焼けであり除膜処理によるダメージではない。)。It is a surface SEM image of Example 2 (darkness on the center right is burnt by electron beam and not damage by film removal treatment). 実施例3の表面SEM像である。7 is a surface SEM image of Example 3. 実施例4の表面SEM像である(中央右側の黒ずみは電子線による焼けであり除膜処理によるダメージではない。)。It is a surface SEM image of Example 4 (darkness in the center right is burnt by electron beam and not damage by film removal treatment). 実施例5の表面SEM像である。7 is a surface SEM image of Example 5. 比較例1の表面SEM像である。7 is a surface SEM image of Comparative Example 1; 比較例2の表面SEM像である。7 is a surface SEM image of Comparative Example 2; 比較例3の表面SEM像である。7 is a surface SEM image of Comparative Example 3; 実施例6の表面SEM像である。7 is a surface SEM image of Example 6. 実施例7の表面SEM像である。7 is a surface SEM image of Example 7. 実施例8の表面SEM像である。21 is a surface SEM image of Example 8. 実施例9の表面SEM像である。21 is a surface SEM image of Example 9. 実施例10の表面SEM像である。21 is a surface SEM image of Example 10. 比較例4の表面SEM像である。7 is a surface SEM image of Comparative Example 4; 比較例5の表面SEM像である。7 is a surface SEM image of Comparative Example 5; 実施例11の表面SEM像である。21 is a surface SEM image of Example 11. 実施例12の表面SEM像である。21 is a surface SEM image of Example 12. 実施例13の表面SEM像である。21 is a surface SEM image of Example 13. 実施例14の表面SEM像である。21 is a surface SEM image of Example 14. 実施例15の表面SEM像である。21 is a surface SEM image of Example 15. 実施例16の表面SEM像である。(中央右側の黒ずみは電子線による焼けであり除膜処理によるダメージではない。)。It is a surface SEM image of Example 16. (The darkening at the center right is burnt by electron beam, not damage by film removal treatment). 実施例17の表面SEM像である。21 is a surface SEM image of Example 17. 実施例18の表面SEM像である。21 is a surface SEM image of Example 18. 実施例19の表面SEM像である。21 is a surface SEM image of Example 19. 実施例7の断面分析結果(左図はSEM像、右図はEDXによるコバルトマッピング像)である。It is a cross-sectional analysis result (the left figure is a SEM image and the right figure is a cobalt mapping image by EDX) of Example 7. FIG. 実施例9の断面分析結果(左図はSEM像、右図はEDXによるコバルトマッピング像)である。It is a cross-sectional analysis result (the left figure is a SEM image and the right figure is a cobalt mapping image by EDX) of Example 9. FIG. 実施例10の断面分析結果(左図はSEM像、右図はEDXによるコバルトマッピング像)である。It is a cross-sectional analysis result (the left figure is a SEM image and the right figure is a cobalt mapping image by EDX) of Example 10. FIG. 実施例11の断面分析結果(左図はSEM像、右図はEDXによるコバルトマッピング像)である。It is a cross-sectional analysis result (the left figure is a SEM image and the right figure is a cobalt mapping image by EDX) of Example 11. FIG. 実施例15の断面分析結果(左図はSEM像、右図はEDXによるコバルトマッピング像)である。It is a cross-sectional analysis result (the left figure is a SEM image and the right figure is a cobalt mapping image by EDX) of Example 15. FIG. 実施例16の断面分析結果(左図はSEM像、右図はEDXによるコバルトマッピング像)である。It is a cross-sectional analysis result (the left figure is a SEM image and the right figure is a cobalt mapping image by EDX) of Example 16. FIG. 実施例18の断面分析結果(左図はSEM像、右図はEDXによるコバルトマッピング像)である。It is a cross-sectional analysis result (the left figure is a SEM image and the right figure is a cobalt mapping image by EDX) of Example 18. FIG. 実施例19の断面分析結果(左図はSEM像、右図はEDXによるコバルトマッピング像)である。It is a cross-sectional analysis result (the left figure is a SEM image and the right figure is a cobalt mapping image by EDX) of Example 19. FIG. 比較例4の断面分析結果(左図はSEM像、右図はEDXによるコバルトマッピング像)である。It is a cross-sectional analysis result (the left figure is a SEM image and the right figure is a cobalt mapping image by EDX) of Comparative Example 4. 比較例5の断面分析結果(左図はSEM像、右図はEDXによるコバルトマッピング像)である。It is a cross-sectional analysis result (the left figure is a SEM image and the right figure is a cobalt mapping image by EDX) of Comparative Example 5. 被膜被覆前のチップ(非研磨面)の表面SEM像である。It is a surface SEM image of the tip (non-abrasive side) before coat coating. 被膜被覆前のチップ(研磨面)の表面SEM像である。It is a surface SEM image of the tip (abrasive surface) before coating coating.
 本発明は、第4族元素、第5族元素及び第6族元素からなる群より選ばれた少なくとも1種の元素の炭化物を含有する超硬合金粒子が、Fe、Co、Cu及びNiからなる群より選ばれた少なくとも1種の元素あるいはこれらの元素を含有する合金からなるバインダー金属で焼結された超硬母材の表面を、第4族元素、第5族元素、第6族元素、第13族元素及び第14族元素(但し、炭素は除く。)からなる群より選ばれた少なくとも1種の元素の窒化物、炭化物、炭窒化物、酸化物又はホウ化物を含有する硬質被膜で被覆してなる超硬材における硬質被膜を除去する方法であって、前記超硬材を100~250℃の温度でアルカリ薬液に接触させる超硬材における硬質被膜の除去方法(以下「本発明の方法」と称す。)に関する。
 なお、本発明において、第4族元素、第5族元素、第6族元素は、それぞれ長周期型周期表の第4族、第5族、第6族に属する元素を意味する。
In the present invention, cemented carbide particles containing carbide of at least one element selected from the group consisting of Group 4 elements, Group 5 elements and Group 6 elements consist of Fe, Co, Cu and Ni. A surface of a cemented carbide base material sintered with a binder metal consisting of at least one element selected from the group or an alloy containing these elements is a group 4 element, a group 5 element, a group 6 element, A hard film containing a nitride, carbide, carbonitride, oxide or boride of at least one element selected from the group consisting of Group 13 elements and Group 14 elements (with the exception of carbon). A method for removing a hard film on a coated hard material, comprising the step of bringing the hard material into contact with an alkaline chemical solution at a temperature of 100 to 250 ° C. It is referred to as “method”.
In the present invention, the group 4 element, the group 5 element and the group 6 element respectively mean elements belonging to the group 4 group 5 group 6 of the long period periodic table.
 本発明の方法の特徴は、前記超硬材と、アルカリ薬液(以下、「本発明の薬液」と称する場合がある。)を、100~250℃、好ましくは170~220℃の温度で接触させることにある。本発明の薬液を用い、上記温度範囲で処理することにより、超硬母材の表層劣化を最小限に抑制すると同時に硬質被膜の選択除去が可能となる。なお、接触させる温度が、低すぎると硬質被膜の除去が不十分となり、また、接触させる温度が高すぎると、加温設備、処理容器などに特別の設備を要することが多く、処理コストがかさむという問題が生じる。 The feature of the method of the present invention is that the cemented carbide is brought into contact with an alkaline chemical solution (hereinafter sometimes referred to as "the chemical solution of the present invention") at a temperature of 100 to 250 ° C, preferably 170 to 220 ° C. It is. By using the chemical solution of the present invention and treating it in the above temperature range, it is possible to minimize the surface deterioration of the cemented carbide base material and at the same time to selectively remove the hard film. If the temperature of contact is too low, removal of the hard coating will be insufficient, and if the temperature of contact is too high, special facilities such as heating equipment and processing containers are often required, resulting in high processing costs. The problem arises.
 以下、本発明を詳細に説明する。
 まず、本発明の方法の対象となる超硬材について説明する。
 超硬材は、バインダー金属を用いて超硬合金粒子を焼結結合してなる超硬母材の表面に硬質被膜を形成させた超硬工具類又は金型類のことである。
Hereinafter, the present invention will be described in detail.
First, a cemented carbide to be subjected to the method of the present invention will be described.
A cemented carbide is a cemented carbide tool or die having a hard coating formed on the surface of a cemented carbide base material formed by sintering cemented carbide particles using a binder metal.
 超硬材の母材となる超硬合金粒子としては、Ti,V,Cr,Zr,Nb,Mo,Hf,Ta,Wなどの第4族元素、第5族元素及び第6族元素からなる群より選ばれた少なくとも1種の元素の炭化物が挙げられ、これらの炭化物は1種又は2種以上を混合して使用することもできる。
 この中でも、特に、W、Ti、Nb、Ta、V、Crからなる群より選ばれた少なくとも1種の元素の炭化物であることが好ましく、特に高強度である点から、WCが特に好適である。また、超硬合金粒子としてWCを使用するには、性能向上のため、他の元素が添加されてもよい。添加元素としては、例えば、耐熱性向上のためのTi、Ta、Nb等が挙げられる。なお、上記超硬合金粒子において、化学式は構成元素を示すものであり、化学式の化学量論比は特に限定されない。
 また、超硬合金粒子の粒径は、特に限定はないが、通常、0.1~20μm程度である。
The cemented carbide particles serving as a base material of cemented carbide are composed of a Group 4 element such as Ti, V, Cr, Zr, Nb, Mo, Hf, Ta, W, etc., a Group 5 element and a Group 6 element. Carbides of at least one element selected from the group can be mentioned, and these carbides can be used alone or in combination of two or more.
Among these, in particular, carbides of at least one element selected from the group consisting of W, Ti, Nb, Ta, V, and Cr are preferable, and WC is particularly preferable in that it has high strength. . In addition, in order to use WC as cemented carbide particles, other elements may be added to improve performance. Examples of the additive element include Ti, Ta, Nb, and the like for improving heat resistance. In the cemented carbide particles, the chemical formula represents a constituent element, and the stoichiometric ratio of the chemical formula is not particularly limited.
The particle size of the cemented carbide particles is not particularly limited, but is usually about 0.1 to 20 μm.
 バインダー金属は、超硬合金粒子を結合する、Fe、Co、Cu及びNiからなる群より選ばれた少なくとも1種の元素あるいはこれらの元素を含有する合金である。これらの中でも、特にCoを含有することが好ましい。
 また、超硬材の粘り強さを高める観点からは、バインダー金属として、CoのみあるいはCoを主成分とした合金が靭性に優れるため好適に使用される。なお、本発明において、「Coを主成分とした合金」とは、Coを80mol%以上含有する合金を意味する。
 また、超硬材の硬度、靭性などの性質を変化させるために、上記金属元素以外の元素をバインダー金属中に含んでもよい。
The binder metal is at least one element selected from the group consisting of Fe, Co, Cu and Ni, or an alloy containing these elements, which binds cemented carbide particles. Among these, it is particularly preferable to contain Co.
Further, from the viewpoint of increasing the toughness of the superhard material, Co alone or an alloy containing Co as a main component is suitably used as a binder metal because it is excellent in toughness. In the present invention, “an alloy containing Co as a main component” means an alloy containing 80 mol% or more of Co.
In addition, in order to change properties such as hardness and toughness of the cemented carbide material, elements other than the above metal elements may be contained in the binder metal.
 硬質被膜は、超硬母材表面にCVD法やPVD法を用いて形成される。硬質被膜の材料は、第4族元素、第5族元素、第6族元素、第13族元素及び第14族元素から成る群より選ばれた少なくとも1種の元素(但し、炭素は除く)の窒化物、炭化物、炭窒化物、酸化物又はホウ化物を主体とする。
 具体的には、TiN、CrN、VN、TiAlN、AlCrN、TiAlCrN、TiSiN等の窒化物、TiC、CrC、VC、BC等の炭化物、TiCN等の炭窒化物、TiO、AlO,ZrO等の酸化物、CrB等のホウ化物などが挙げられる。硬質被膜は、これらの化合物を含有する薄膜を単層あるいは複層重ねて被覆して形成されている。
 これらの中でも硬質被膜が、Ti、V、Cr、Si及びAlからなる群より選ばれた少なくとも1種の元素の窒化物、炭化物又は炭窒化物から成る群より選ばれた少なくとも1種を含有することが好ましく、特に、TiN、TiAlN、TiSiN、TiAlCrN、CrN、TiCrN、VN、TiC及びTiCNからなる群より選ばれた少なくとも1種の化合物が好ましい。硬質被膜が、これらの化合物を含有すると、本発明の薬液によって容易に除去することができる。
 なお、本発明では、上記窒化物、炭化物、炭窒化物、酸化物及びホウ化物において、化学式は構成元素を示すものであり、化学式の化学量論比は特に限定されない。
The hard coating is formed on the surface of the cemented carbide base material using the CVD method or the PVD method. The material of the hard film is at least one element selected from the group consisting of Group 4 elements, Group 5 elements, Group 6 elements, Group 13 elements and Group 14 elements (with the exception of carbon). Mainly composed of nitrides, carbides, carbonitrides, oxides or borides.
Specifically, nitrides such as TiN, CrN, VN, TiAlN, AlCrN, TiAlCrN, TiSiN, carbides such as TiC, CrC, VC, BC, carbonitrides such as TiCN, oxides such as TiO, AlO, ZrO, etc. And borides such as CrB. The hard coating is formed by covering a thin film containing these compounds in a single layer or multiple layers.
Among these, the hard coating contains at least one selected from the group consisting of nitride, carbide or carbonitride of at least one element selected from the group consisting of Ti, V, Cr, Si and Al. In particular, at least one compound selected from the group consisting of TiN, TiAlN, TiSiN, TiAlCrN, CrN, TiCrN, VN, TiC and TiCN is preferable. When the hard coating contains these compounds, it can be easily removed by the chemical solution of the present invention.
In the present invention, in the above nitrides, carbides, carbonitrides, oxides and borides, the chemical formulas indicate constituent elements, and the stoichiometric ratio of the chemical formulas is not particularly limited.
 次いで、本発明の薬液(アルカリ薬液)について説明する。
 本発明の薬液は、pH7以上のアルカリ性水溶液である。本発明の薬液において、pHの調整は、アンモニアの溶解、水酸化物の添加などいかなる方法で行ってもよいが、水酸化アルカリ、すなわち、Li、Na、K、Rb等のアルカリ金属水酸化物又はBe、Mg、Ca、Sr、Ba等のアルカリ土類金属水酸化物を単独あるいは複数種類含有することによって行われることが好ましい。なお、この中でも水への溶解度や比較的安価であることから水酸化ナトリウム、水酸化カリウムを用いることが好ましい。
 これらの水酸化物を、好ましくは1~20mol/L(OH-換算)、特に好ましくは5~15mol/Lの濃度範囲で含有する水溶液で用いると効率的に硬質被膜を除去することができる。
 なお、溶媒として、水以外にも本発明の効果を損なわない範囲で、アルコール類などの水溶性の有機溶媒を含んでいてもよい。
Next, the chemical solution (alkali chemical solution) of the present invention will be described.
The drug solution of the present invention is an alkaline aqueous solution having a pH of 7 or more. In the chemical solution of the present invention, adjustment of pH may be performed by any method such as dissolution of ammonia, addition of hydroxide, etc., but alkali hydroxide, ie, alkali metal hydroxide such as Li, Na, K, Rb, etc. It is preferable to carry out by containing single or multiple types of alkaline earth metal hydroxides such as Be, Mg, Ca, Sr, and Ba. Among these, sodium hydroxide and potassium hydroxide are preferably used because of their solubility in water and relatively low cost.
The hard coating can be efficiently removed by using an aqueous solution containing these hydroxides in a concentration range of preferably 1 to 20 mol / L (OH - equivalent), particularly preferably 5 to 15 mol / L.
In addition to water, a water-soluble organic solvent such as alcohol may be contained as a solvent as long as the effects of the present invention are not impaired.
 本発明の薬液は、超硬母材表層の部分的腐食をより抑制する目的で、腐食抑制剤を含有することが好ましい。 The chemical solution of the present invention preferably contains a corrosion inhibitor for the purpose of further suppressing partial corrosion of the surface layer of the cemented carbide base material.
 腐食抑制剤を含有する本発明の薬液を超硬材に接触させた場合、超硬母材表面に吸着した腐食抑制剤や、超硬母材のバインダー金属と腐食抑制剤との間の反応で生成した表面化合物によって、超硬母材のWC等の超硬合金粒子及びCo等のバインダー金属のアルカリ薬液による酸化などの腐食を抑制、ないしは、腐食速度を低下させ、超硬母材の腐食劣化を抑制することができる。 When the chemical solution of the present invention containing a corrosion inhibitor is brought into contact with a cemented carbide, the corrosion inhibitor adsorbed on the surface of the cemented carbide base material, or the reaction between the binder metal of the cemented carbide base material and the corrosion inhibitor The surface compound thus formed suppresses corrosion such as oxidation of cemented carbide particles such as WC of cemented carbide and binder metals such as Co by alkali chemicals, or reduces the corrosion rate to cause corrosion and deterioration of cemented carbide. Can be suppressed.
 このような腐食抑制剤としては、
 腐食抑制剤(a):超硬母材金属の溶解によって生成する化学種をアルカリ薬液に予め含有させておくことで腐食を抑制する腐食抑制剤、
 腐食抑制剤(b):アルカリ薬液中の溶存酸素等の酸化剤を還元することが可能であり、超硬母材の酸化を防ぐことにより腐食を抑制する腐食抑制剤、
 腐食抑制剤(c):母材金属の表面に保護被膜を形成し腐食を抑制する腐食抑制剤、
が挙げられる。
 なお、これらの腐食抑制剤は、複数種を同時にアルカリ薬液に含有させて用いてもよく、本発明の薬液に適当な腐食抑制剤を複数種含有させることにより、超硬母材の腐食の抑制効果をより向上させることができる場合がある。
 以下、腐食抑制剤(a)、(b)及び(c)について詳細に説明する。
As such a corrosion inhibitor,
Corrosion inhibitor (a): A corrosion inhibitor that suppresses corrosion by previously containing chemical species generated by dissolution of cemented carbide base metal in an alkaline chemical solution,
Corrosion inhibitor (b): A corrosion inhibitor capable of reducing an oxidizing agent such as dissolved oxygen in an alkaline chemical solution and suppressing corrosion by preventing oxidation of a cemented carbide base material,
Corrosion inhibitor (c): A corrosion inhibitor that forms a protective film on the surface of the base metal and suppresses corrosion
Can be mentioned.
These corrosion inhibitors may be used by simultaneously containing a plurality of types in an alkaline chemical solution, and the chemical solution of the present invention may contain a plurality of appropriate corrosion inhibitors to suppress corrosion of the cemented carbide base material. In some cases, the effect can be improved.
The corrosion inhibitors (a), (b) and (c) will be described in detail below.
「腐食抑制剤(a)」
 腐食抑制剤(a)は、薬液中に添加することで超硬母材を構成する母材金属(超硬合金粒子やバインダー金属における金属元素)の溶解によって生成する化学種を予め薬液中に含有させることにより、腐食溶出の抑制を図るものである。
 腐食抑制剤(a)は、前記超硬母材を構成する第4族元素、第5族元素、第6族元素、Fe、Co、Cu及びNiからなる群より選ばれた少なくとも1種の元素をからなる単体あるいは該元素を含む化合物からなり、使用される超硬母材における母材金属及び/又はバインダー金属によって適宜選択される。なお、腐食抑制剤(a)は複数種を同時に本発明の薬液に含有させてもよい。
 アルカリ薬液による超硬材の腐食は、バインダー金属の腐食に主に起因するため、本発明の薬液は、腐食抑制剤(a)として、バインダー金属を構成するFe、Co、Cu及びNiからなる群より選ばれた少なくとも1種の元素を含む金属単体あるいは該元素を含む化合物を含有させることが好ましい。
 特にバインダー金属として好適なCoを含有する合金を使用した超硬母材の場合には、本発明の薬液は、腐食抑制剤(a)として、コバルト化合物を含有することが好ましい。
 このようなコバルト化合物としては、タングステン酸コバルト、水酸化コバルト、酸化コバルト等が挙げられ、この中でもタングステン酸コバルト、水酸化コバルトが好ましく、タングステン酸コバルトが特に好ましい。
 例えば、超硬合金粒子としてWC,バインダー金属として、Coを含有する合金を使用した超硬母材の場合には、腐食抑制剤(a)として、コバルト金属、タングステン金属、酸化コバルト、酸化タングステン、水酸化コバルト、タングステン酸コバルト、タングステン酸ナトリウム、コバルト酸ナトリウム、リン酸コバルトなどが挙げられる。この中でもタングステン酸コバルト、水酸化コバルト、酸化コバルト、コバルト金属が好ましく、タングステン酸コバルトが特に好ましい。
"Corrosion inhibitor (a)"
The corrosion inhibitor (a) contains in advance in the chemical solution chemical species generated by dissolution of a base metal (a cemented carbide particle and a metal element in a binder metal) constituting a cemented carbide base material by being added to the chemical solution. By doing this, it is intended to suppress corrosion and elution.
The corrosion inhibitor (a) is at least one element selected from the group consisting of Group 4 elements, Group 5 elements, Group 6 elements, Fe, Co, Cu and Ni, which constitute the above-mentioned cemented carbide base material. Or a compound containing the element, and is appropriately selected depending on the base metal and / or the binder metal in the cemented carbide base material to be used. In addition, a corrosion inhibitor (a) may be made to contain multiple types simultaneously in the chemical | medical solution of this invention.
Since the corrosion of the superhard material by the alkaline chemical solution is mainly caused by the corrosion of the binder metal, the chemical solution of the present invention is a group consisting of Fe, Co, Cu and Ni constituting the binder metal as a corrosion inhibitor (a) It is preferable to contain a single metal containing at least one selected element or a compound containing the element.
Particularly in the case of a cemented carbide base material using an alloy containing Co suitable as a binder metal, the chemical solution of the present invention preferably contains a cobalt compound as a corrosion inhibitor (a).
As such cobalt compounds, cobalt tungstate, cobalt hydroxide, cobalt oxide and the like can be mentioned. Among these, cobalt tungstate and cobalt hydroxide are preferable, and cobalt tungstate is particularly preferable.
For example, in the case of a cemented carbide base material using WC as cemented carbide particles and an alloy containing Co as a binder metal, cobalt metal, tungsten metal, cobalt oxide, tungsten oxide as a corrosion inhibitor (a), Cobalt hydroxide, cobalt tungstate, sodium tungstate, sodium cobaltate, cobalt phosphate and the like can be mentioned. Among these, cobalt tungstate, cobalt hydroxide, cobalt oxide and cobalt metal are preferable, and cobalt tungstate is particularly preferable.
「腐食抑制剤(b)」
 腐食抑制剤(b)は還元剤であり、アルカリ液系薬液中の溶存酸素等の酸化剤を還元して超硬母材の酸化を防ぐことにより、超硬材の腐食を抑制できる。
"Corrosion inhibitor (b)"
The corrosion inhibitor (b) is a reducing agent, and the corrosion of the cemented carbide can be suppressed by reducing the oxidizing agent such as dissolved oxygen in the alkaline liquid chemical solution to prevent the oxidation of the cemented carbide base material.
 腐食抑制剤(b)の好適な一例として、例えば、一般式(1)で示される化合物が挙げられ、好適な具体例としては、ジヒドロキシマレイン酸が挙げられる。
 なお、一般式(1)で示される化合物は、還元性の水素を供出することによりアルカリ薬液中の酸化剤を還元し、超硬母材の腐食を抑制すると考えられている。
As a suitable example of a corrosion inhibitor (b), the compound shown by General formula (1) is mentioned, for example, A dihydroxy maleic acid is mentioned as a suitable specific example.
The compound represented by the general formula (1) is considered to reduce the oxidizing agent in the alkaline chemical solution by supplying reducing hydrogen and to suppress the corrosion of the cemented carbide base material.
Figure JPOXMLDOC01-appb-C000009
(式中、R1はカルボキシル基、炭素数1~6のアルキル基、アシル基、アルコキシカルボニル基のいずれか、R2は炭素数1~6のアルキル基、アルコキシ基、水酸基のいずれかであり、R1とR2が環構造を形成していてもよい。X1、X2はそれぞれ独立に水素原子、アルカリ金属のいずれかである。)
Figure JPOXMLDOC01-appb-C000009
(Wherein, R 1 is any of a carboxyl group, an alkyl group having 1 to 6 carbon atoms, an acyl group and an alkoxycarbonyl group, and R 2 is any of an alkyl group having 1 to 6 carbon atoms, an alkoxy group and a hydroxyl group And R 1 and R 2 may form a ring structure, and X 1 and X 2 each independently represent a hydrogen atom or an alkali metal.
 また、上記一般式(1)で示される化合物のR1とR2が環構造を形成した場合の一例である一般式(2)で示される化合物も、腐食抑制剤(b)の好適な一例である。 Further, the compound represented by the R 1 and R 2 of the compound represented by the general formula (1) is an example of a case of forming a ring structure formula (2), preferred example of the corrosion inhibitor (b) It is.
Figure JPOXMLDOC01-appb-C000010
(式中、R3は水素原子若しくは炭素数1~6のアルキル基、アルケニル基、アルキニル基、アシル基、アルコキシカルボニル基であり、nは0又は1、X3、X4はそれぞれ独立に水素原子、アルカリ金属のいずれかである。)
Figure JPOXMLDOC01-appb-C000010
(Wherein, R 3 is a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, an alkenyl group, an alkynyl group, an acyl group, an alkoxycarbonyl group, n is 0 or 1 and X 3 and X 4 are each independently hydrogen Is either an atom or an alkali metal.)
 一般式(2)で示される化合物としては、アスコルビン酸、アスコルビン酸ナトリウム、エリソルビン酸、エリソルビン酸ナトリウムが挙げられ、本発明の薬液にこれらの化合物を少なくとも1種含有させることが好ましい。 Examples of the compound represented by the general formula (2) include ascorbic acid, sodium ascorbate, erythorbic acid and sodium erythorbate, and it is preferable that the drug solution of the present invention contain at least one of these compounds.
 また、腐食抑制剤(b)の他の好適な一例として、一般式(3-a)、(3-b)で示される化合物が挙げられる。 In addition, other preferable examples of the corrosion inhibitor (b) include compounds represented by the general formulas (3-a) and (3-b).
Figure JPOXMLDOC01-appb-C000011

Figure JPOXMLDOC01-appb-C000012
(式(3-a)、(3-b)中、R4はカルボキシル基、アルデヒド基、アルコキシ基、アルコキシカルボニル基、又はアシル基、R5は水素原子又は水酸基である。)
Figure JPOXMLDOC01-appb-C000011

Figure JPOXMLDOC01-appb-C000012
(In the formulas (3-a) and (3-b), R 4 is a carboxyl group, an aldehyde group, an alkoxy group, an alkoxycarbonyl group, or an acyl group, and R 5 is a hydrogen atom or a hydroxyl group.)
 一般式(3-a)、(3-b)で示される化合物の中でも、オルト又はパラの位置関係にある水酸基(OH)の組を少なくとも一組持つ化合物は、還元性の水素を供出した後のベンゼン環が安定な共役構造の六員環を形成し、高い還元力を有するため好適である。
 上記化合物の例として、没食子酸、m-ガロイル没食子酸、カテコール、ヒドロキノンが挙げられ、本発明の薬液にこれらの化合物を少なくとも1種含有させることが好ましい。また、これらの中でも没食子酸が特に好適である。
Among the compounds represented by the general formulas (3-a) and (3-b), a compound having at least one set of a hydroxyl group (OH) in an ortho or para positional relationship has a reduction hydrogen after delivery. Is preferable because it forms a six-membered ring of a stable conjugated structure and has a high reducing power.
Examples of the above-mentioned compounds include gallic acid, m-galoyl gallic acid, catechol and hydroquinone, and it is preferable to make the drug solution of the present invention contain at least one of these compounds. Among these, gallic acid is particularly preferred.
 また、腐食抑制剤(b)の他の好適な一例として、単糖類、二糖類、三糖類、四糖類、オリゴ糖又は多糖類が挙げられる。
 なお、還元性を示す糖類は、環式構造が解けて鎖式構造になる際に還元性の官能基であるアルデヒド基が現れることにより還元性を示す。また、一部の糖は鎖式構造になった際に現れるケトン基が構造変化してアルデヒド基となることにより還元性を示す。
 また、その構造上、還元性を持たない二糖類、三糖類、四糖類、オリゴ糖又は多糖類も、薬液中で加水分解が進行することで還元性を持つ糖類が生成し、還元性を示す。これらの例としてスクロースが挙げられる。
 具体的には、ジヒドロキシアセトン、エリトルロース、エリトロース、キシルロース、リボース、アラビノース、キシロース、デオキシリボース、プシコース、グルコース、フルクトース、ソルボース、タガトース、マンノース、イドース、タロース、フコース、ラムノース、マルトース、ラクトース、スクロース、トレハロース、ツラノース、セロビオース、ラフィノース、マルトトリオース、アカルボース、スタキオース、ガラクトース、リボース、フラクトオリゴ糖、ガラクトオリゴ糖、マンナンオリゴ糖、グリコーゲン、デンプン、セルロース、デキストリン、グルカン、レバン及びイヌリン等が挙げられ、本発明の薬液にこれらの糖類を少なくとも1種含有させることが好ましい。
 この中でも、本発明の薬液にマルトース、ラクトース、スクロース、グルコース及びフルクトースを少なくとも1種含有させることが好ましい。
In addition, other suitable examples of the corrosion inhibitor (b) include monosaccharides, disaccharides, trisaccharides, tetrasaccharides, oligosaccharides or polysaccharides.
In addition, the saccharides exhibiting reducibility show reducibility by the appearance of an aldehyde group which is a reducible functional group when the cyclic structure is solved to form a chain structure. In addition, some sugars exhibit reducibility by the structural change of the ketone group that appears when the chain structure is obtained, to form an aldehyde group.
Also, due to its structure, disaccharides, trisaccharides, tetrasaccharides, oligosaccharides or polysaccharides that do not have reducibility also exhibit reducibility due to the progress of hydrolysis in the drug solution to produce saccharides having reducibility. . An example of these is sucrose.
Specifically, dihydroxyacetone, erythrulose, erythrose, xylulose, ribose, arabinose, xylose, deoxyribose, psicose, glucose, fructose, sorbose, tagatose, mannose, idose, talose, fucose, rhamnose, maltose, lactose, sucrose, trehalose Tulanose, cellobiose, raffinose, maltotriose, acarbose, stachyose, galactose, ribose, fructooligosaccharide, galactooligosaccharide, mannanoligosaccharide, glycogen, starch, cellulose, dextrin, glucan, levan, inulin, etc. It is preferable to include at least one of these sugars in a drug solution.
Among these, it is preferable that the drug solution of the present invention contains at least one of maltose, lactose, sucrose, glucose and fructose.
 また、腐食抑制剤(b)の他の好適な一例として、含リン系還元剤又は含イオウ系還元剤が挙げられる。
 含リン系還元剤又は含イオウ系還元剤は、アルカリ液系薬液中の溶存酸素等の酸化剤を還元することが可能であり、超硬母材の酸化を防ぐことにより、腐食抑制できる。含リン系還元剤又は含イオウ系還元剤として、例えば、次亜リン酸ナトリウム、亜リン酸カリウム、チオ硫酸ナトリウム、亜硫酸ナトリウムなどが挙げられ、この中でもチオ硫酸ナトリウムが好適である。
Moreover, a phosphorus containing reducing agent or a sulfur containing reducing agent is mentioned as another suitable example of a corrosion inhibitor (b).
The phosphorus-containing reducing agent or the sulfur-containing reducing agent can reduce an oxidizing agent such as dissolved oxygen in the alkaline liquid chemical solution, and can prevent corrosion by preventing the oxidation of the cemented carbide base material. Examples of the phosphorus-containing reducing agent or the sulfur-containing reducing agent include sodium hypophosphite, potassium phosphite, sodium thiosulfate, sodium sulfite and the like. Among these, sodium thiosulfate is preferable.
「腐食抑制剤(c)」
 腐食抑制剤(c)は、母材金属と結合し表面に保護被膜を形成し腐食を抑制するタイプの腐食抑制剤であり、アゾール化合物又はその塩、チオ尿素化合物及びアセチレン系化合物が挙げられる。
"Corrosion inhibitor (c)"
The corrosion inhibitor (c) is a type of corrosion inhibitor that binds to a base metal and forms a protective film on the surface to suppress corrosion, and includes an azole compound or a salt thereof, a thiourea compound and an acetylene compound.
 腐食抑制剤(c)の一例であるアゾール化合物又はその塩は、アゾール構造に含まれる窒素の孤立電子対が金属に配位することにより超硬母材の表面に安定な被膜を形成し、酸化剤等の侵入を防止して腐食を抑制しているものと考えられる。アゾール化合物又はその塩として具体的には、1H-テトラゾール、5-アミノ-1H-テトラゾール、5-メチル-1H-テトラゾール、1-メチル-5-エチル-テトラゾール、1-メチル-5-メルカプト-テトラゾール、5-(2-アミノフェニル)-1H-テトラゾール、1-シクロヘキシル-5-メルカプト-テトラゾール、1-フェニル-5-メルカプト-テトラゾール、1-カルボキシメチル-5-メルカプト-テトラゾール及びこれらのアルカリ塩、ベンゾトリアゾール、メチルベンゾトリアゾール、ジメチルベンゾトリアゾール、ヒドロキシベンゾトリアゾールなどが挙げられ、この中でもベンゾトリアゾールが好適である。 An azole compound or a salt thereof, which is an example of a corrosion inhibitor (c), forms a stable film on the surface of a cemented carbide base material by the coordination of the lone electron pair of nitrogen contained in the azole structure to a metal, and oxidation It is considered that the corrosion is suppressed by preventing the intrusion of the agent and the like. Specific examples of the azole compound or a salt thereof include 1H-tetrazole, 5-amino-1H-tetrazole, 5-methyl-1H-tetrazole, 1-methyl-5-ethyl-tetrazole, 1-methyl-5-mercapto-tetrazole , 5- (2-aminophenyl) -1H-tetrazole, 1-cyclohexyl-5-mercapto-tetrazole, 1-phenyl-5-mercapto-tetrazole, 1-carboxymethyl-5-mercapto-tetrazole and alkali salts thereof Benzotriazole, methylbenzotriazole, dimethylbenzotriazole, hydroxybenzotriazole and the like can be mentioned, among which benzotriazole is preferred.
 腐食抑制剤(c)の一例であるチオ尿素化合物は、一般式(4)で示される構造を分子中に持つ化合物の総称であり、窒素や硫黄を含む極性基が超硬母材を構成する金属元素にキレート吸着し、酸化剤等の侵入を防ぎ腐食抑制できるものと考えられる。チオ尿素化合物として具体的には、チオ尿素、メチルチオ尿素、ジメチルチオ尿素、エチレンチオ尿素などが挙げられ、この中でもチオ尿素が好適である。
Figure JPOXMLDOC01-appb-C000013
The thiourea compound which is an example of a corrosion inhibitor (c) is a general term for a compound having a structure represented by the general formula (4) in the molecule, and a polar group containing nitrogen or sulfur constitutes a cemented carbide base material It is believed that it can be chelate-adsorbed to metal elements to prevent the entry of oxidants etc. and to inhibit corrosion. Specific examples of the thiourea compound include thiourea, methylthiourea, dimethylthiourea and ethylenethiourea. Among these, thiourea is preferable.
Figure JPOXMLDOC01-appb-C000013
 腐食抑制剤(c)の一例であるアセチレン系化合物は、分子中にC≡C三重結合を含む有機化合物の総称であり、三重結合のπ電子を母材金属元素の空軌道に供出することで母材金属との間に結合を形成し、酸化剤の侵入を防止でき、腐食抑制効果を発揮すると考えられる。例えば、2-プロピン-1-オール、1-ヘキシン-3-オール、3-ブチン-1-オールなどが挙げられ、2-プロピン-1-オールは好適である。 An acetylene compound, which is an example of a corrosion inhibitor (c), is a generic term for organic compounds containing a C≡C triple bond in the molecule, and provides π electrons of the triple bond to the empty orbital of the base metal element. It is believed that a bond can be formed between the base metal and the base metal, thereby preventing the entry of an oxidant and exhibiting a corrosion suppressing effect. For example, 2-propyn-1-ol, 1-hexyn-3-ol, 3-butyn-1-ol and the like can be mentioned, and 2-propyn-1-ol is preferred.
 これらの腐食抑制剤の添加量は、本発明の薬液による硬質被膜を除去する作用を損なわない範囲で適宜決定される。また、上述のように腐食抑制剤は、複数種を同時にアルカリ薬液に含有させて用いてもよい。
 具体的には、腐食抑制剤(a),(b)及び(c)のそれぞれを一種類だけ添加する場合におけるアルカリ薬液中の濃度は、腐食抑制剤(a)の場合で、通常、0.001~10mol/L、好適には0.01~1mol/Lの範囲であり、腐食抑制剤(b)の場合で、通常、0.001~10mol/L、好適には0.01~1mol/Lの範囲であり、腐食抑制剤(c)の場合で、通常、0.001~10mol/L、好適には0.05~2mol/Lの範囲である。
 但し、この範囲に限定されたものではなく、腐食抑制剤量が多過ぎると硬質被膜の除膜が困難となる場合があり、一方、少な過ぎると超硬母材の腐食抑制効果が小さくなる可能性があり、アルカリ薬液の種類や濃度又は処理温度を、硬質被膜の除去速度と超硬母材の腐食抑制効果を考慮して最適な条件に設定する必要がある。
 具体例を挙げると、超硬合金粒子がWC、バインダー金属が、Coを主成分とする合金、硬質被膜が、TiAlN、TiSiN及びTiAlCrNからなる群より選ばれた少なくとも1種の化合物を含有する単層、あるいは複層の膜(厚み:1~5μm程度)で構成されている場合において、温度170~220℃にて、10mol/Lの水酸化ナトリウム水溶液に対して、腐食抑制剤として、タングステン酸コバルト、水酸化コバルト、酸化コバルトを各々単独で使用した場合の好適な濃度範囲は0.01~1mol/L、アスコルビン酸、アスコルビン酸ナトリウム、チオ硫酸ナトリウム、マルトースを各々単独で使用した場合の好適な濃度範囲は0.01~1mol/L、ベンゾトリアゾール、2-プロピン-1-オールを各々単独で使用した場合の各々の好適な濃度範囲は、0.05~2mol/Lである。
The addition amount of these corrosion inhibitors is suitably determined in the range which does not impair the effect | action which removes the hard film by the chemical | medical solution of this invention. Further, as described above, the corrosion inhibitor may be used by simultaneously containing a plurality of types in an alkaline chemical solution.
Specifically, the concentration in the alkali chemical solution in the case where only one type of each of the corrosion inhibitors (a), (b) and (c) is added is usually 0. 5 in the case of the corrosion inhibitor (a). It is in the range of 001 to 10 mol / L, preferably 0.01 to 1 mol / L, and in the case of the corrosion inhibitor (b), usually 0.001 to 10 mol / L, preferably 0.01 to 1 mol / L. In the case of the corrosion inhibitor (c), it is usually in the range of 0.001 to 10 mol / L, preferably 0.05 to 2 mol / L.
However, the amount is not limited to this range, and when the amount of the corrosion inhibitor is too large, it may be difficult to remove the hard coating. On the other hand, when the amount is too small, the corrosion inhibiting effect of the carbide base material may be reduced. It is necessary to set the type and concentration of the alkali chemical solution or the processing temperature under optimum conditions in consideration of the removal rate of the hard film and the corrosion inhibition effect of the cemented carbide base material.
As a specific example, a cemented carbide particle is WC, a binder metal is an alloy containing Co as a main component, and a hard film contains at least one compound selected from the group consisting of TiAlN, TiSiN and TiAlCrN. In the case of a layer or multilayer film (thickness: about 1 to 5 μm), tungstic acid as a corrosion inhibitor for a 10 mol / L sodium hydroxide aqueous solution at a temperature of 170 to 220 ° C. When cobalt, cobalt hydroxide and cobalt oxide are used alone, the preferred concentration range is 0.01 to 1 mol / L, and when ascorbic acid, sodium ascorbate, sodium thiosulfate and maltose are used alone, respectively. Concentration range: 0.01 to 1 mol / L, each of benzotriazole and 2-propyn-1-ol alone Suitable concentration ranges of each of the case of use is 0.05 ~ 2mol / L.
 また、これらの腐食抑制剤を複数種類混合して使用する場合、相乗効果によって単独の腐食抑制剤のみを含有させた場合と比較して、各腐食抑制剤の好適な濃度範囲は減少する傾向にあるため、組み合わせる腐食剤の種類により最適な条件に設定する必要がある。
 他の腐食抑制剤と組み合わせる場合の好適な濃度は、腐食抑制剤(a)の場合で、0.0001~0.1mol/L、腐食抑制剤(b)の場合で、0.0001~0.5mol/L、腐食抑制剤(c)の場合で、0.0005~1mol/Lである。
 具体例を挙げると、超硬合金粒子がWC、バインダー金属が、Coを主成分とする合金、硬質被膜が、TiAlN、TiSiN及びTiAlCrNからなる群より選ばれた少なくとも1種の化合物を含有する単層、あるいは複層の膜(厚み:1~5μm程度)で構成されている場合において、温度170~220℃にて、10mol/Lの水酸化ナトリウム水溶液に対して、腐食抑制剤として、水酸化コバルトとアスコルビン酸を混合して使用する場合、各々の好適な濃度範囲は水酸化コバルトが0.0001~0.1mol/L、アスコルビン酸が0.0001~0.5mol/Lであり、各々を単独で使用した場合に比べて好適な濃度範囲が減少する。
In addition, when a plurality of types of these corrosion inhibitors are mixed and used, the preferred concentration range of each corrosion inhibitor tends to decrease as compared with the case where only a single corrosion inhibitor is contained by a synergetic effect. For this reason, it is necessary to set optimum conditions according to the type of caustic agent to be combined.
Preferred concentrations in the case of combination with other corrosion inhibitors are 0.0001 to 0.1 mol / L in the case of corrosion inhibitors (a) and 0.0001 to 0. 0 in the case of corrosion inhibitors (b). 5 mol / L, and in the case of the corrosion inhibitor (c), 0.0005 to 1 mol / L.
As a specific example, a cemented carbide particle is WC, a binder metal is an alloy containing Co as a main component, and a hard film contains at least one compound selected from the group consisting of TiAlN, TiSiN and TiAlCrN. Hydroxide, as a corrosion inhibitor, for a 10 mol / L sodium hydroxide aqueous solution at a temperature of 170 to 220 ° C. when it is composed of a layer or multilayer film (thickness: about 1 to 5 μm) When cobalt and ascorbic acid are mixed and used, the preferred concentration range of each is 0.0001 to 0.1 mol / L of cobalt hydroxide and 0.0001 to 0.5 mol / L of ascorbic acid, each of The preferred concentration range is reduced compared to when used alone.
 なお、本発明の薬液は、腐食抑制剤以外にも本発明の目的を損なわない範囲で他の添加成分を含んでいてもよい。例えば、pH緩衝剤、安定化剤、界面活性剤、ラジカル捕捉剤などを適宜添加することができる。 In addition, the chemical | medical solution of this invention may contain the other addition component in the range which does not impair the objective of this invention other than a corrosion inhibitor. For example, a pH buffer, a stabilizer, a surfactant, a radical scavenger and the like can be added as appropriate.
 次に本発明の好適な実施方法について説明する。尚、本発明は以下に述べる実施方法に限定されるものではない。 Next, a preferred embodiment of the present invention will be described. The present invention is not limited to the embodiment described below.
1)アルカリ薬液の調製
 上述のように本発明の薬液におけるpH調節には、水酸化アルカリが好適に使用される。所定濃度の水酸化アルカリ水溶液の調製は、以下の手順で行うことができる。
 まず、耐食性のある容器に所定量の水を入れ、これに選定した所定量の水酸化アルカリ化合物を攪拌しながら室温で徐々に添加して溶解又は分散させる。なお、水酸化アルカリ化合物の添加時に発熱を伴い、容器破損又は突沸等が考えられる場合は、冷却しながら添加することが好ましい。また、この様に得られた水酸化アルカリ水溶液に上述の腐食抑制剤を添加する場合は、選定された腐食抑制剤が所定濃度となる量を計量し、計量された腐食抑制剤を前記水酸化アルカリ水溶液に撹拌しながら、徐々に添加して溶解又は分散させて腐食抑制剤含有水酸化アルカリ水溶液を調製すればよい。尚、腐食抑制剤の添加は、水酸化アルカリ化合物の添加と、同時に又は引き続いて行ってもよい。
1) Preparation of Alkaline Chemical Solution As described above, alkali hydroxide is suitably used for pH adjustment in the chemical solution of the present invention. The preparation of an aqueous alkali hydroxide solution of a predetermined concentration can be carried out according to the following procedure.
First, a predetermined amount of water is placed in a corrosion resistant container, and a predetermined amount of the selected alkali hydroxide compound is gradually added thereto at room temperature with stirring to dissolve or disperse. In addition, it is preferable to add while cooling, when generation | occurrence | production is accompanied at the time of addition of an alkali hydroxide compound, and a container failure or bumping etc. are considered. Moreover, when adding the above-mentioned corrosion inhibitor to the alkali hydroxide aqueous solution obtained in this way, the quantity which the selected corrosion inhibitor becomes a predetermined concentration is measured, and the measured corrosion inhibitor is the said hydroxylation. The corrosion inhibitor-containing alkali hydroxide aqueous solution may be prepared by gradually adding and dissolving or dispersing it while stirring in an alkaline aqueous solution. The addition of the corrosion inhibitor may be performed simultaneously with or subsequent to the addition of the alkali hydroxide compound.
2)超硬材とアルカリ薬液との接触
 超硬材とアルカリ薬液との接触は、超硬材をアルカリ薬液に浸漬する方法、超硬材上にアルカリ薬液を滴下する方法などが挙げられるが、通常、超硬材をアルカリ薬液に浸漬する方法で行われる。具体的には、まず、前記アルカリ薬液に対して耐食性を有する耐圧容器に、除膜対象となる超硬材が完全に浸漬できる所定量のアルカリ薬液を入れ、続いて室温で、超硬材をアルカリ薬液に浸漬して耐圧容器の蓋を閉め密閉する。尚、この時に酸化性ガス排除の目的で、耐圧容器気相部の空気を窒素又はアルゴンガス等の不活性ガス、硫化水素等の還元性ガス又はアルカリ薬液から発生する蒸気で置換することが好ましい。
2) Contact between the cemented carbide and the alkali chemical The contact between the cemented carbide and the alkali chemical may be carried out by immersing the cemented carbide in the alkali chemical, dropping the alkali chemical on the cemented carbide, etc. Usually, it is performed by the method of immersing a superhard material in an alkali chemical | medical solution. Specifically, first, a predetermined amount of an alkali chemical solution capable of completely immersing a cemented carbide material to be removed is placed in a pressure vessel having corrosion resistance to the alkali chemical solution, and then the cemented carbide material is removed at room temperature. Immerse in alkaline chemical solution, close the lid of the pressure container and seal it. At this time, it is preferable to replace the air in the gas phase of the pressure vessel with an inert gas such as nitrogen or argon gas, a reducing gas such as hydrogen sulfide or a vapor generated from an alkaline chemical solution for the purpose of removing the oxidizing gas. .
3)除膜処理
 通風型オーブン、オイルバス又は蒸気ジャケット付き加熱機等の加熱装置に、前述の超硬材が浸漬された耐圧容器をセットし、加熱装置を所定の温度まで昇温して所定時間保持することで除膜処理を行なう。尚、加熱装置は、本発明の所定温度で加熱ができるものであれば前記したものに限定されるものではない。なお、処理時間(浸漬時間)は、硬質被膜の膜種(構成元素)、膜厚、処理温度などを考慮して適宜決定されるが、通常、1時間~100時間(好適には5~72時間)である。時間が短すぎると、十分に除膜できない場合があり、100時間で除膜が十分に行われるので、これ以上の時間をかける必要はないことが多い。
3) Film removal treatment A pressure-resistant container in which the above-mentioned cemented carbide material is immersed is set in a heating device such as a ventilation oven, an oil bath, or a heater with a steam jacket, and the heating device is heated to a predetermined temperature. Film removal processing is performed by holding for a while. The heating device is not limited to the one described above as long as it can heat at the predetermined temperature of the present invention. The treatment time (immersion time) is appropriately determined in consideration of the film type (constituting element) of the hard film, the film thickness, the treatment temperature, etc., but usually 1 hour to 100 hours (preferably 5 to 72 hours). Time). If the time is too short, film removal may not be sufficient, and film removal is sufficiently performed in 100 hours, so it is often unnecessary to spend more time.
4)取り出し、水洗
 加熱装置内にセットされた耐圧容器が60℃以下になるまで冷却したのち、耐圧容器から除膜処理された超硬材を取出し、該超硬材を水洗することによりアルカリ薬液を除去する。
4) Taking out and washing with water After the pressure container set in the heating device is cooled to 60 ° C. or less, the film-removed cemented carbide is taken out from the pressure container, and the cemented carbide is washed with water to obtain an alkaline chemical solution. Remove
5)乾燥
 水洗によりアルカリ薬液が除去された超硬材表面の付着水を除去する目的で、通常の乾燥機で水分を乾燥除去して、硬質被膜が除去された超硬材が得られる。尚、この時の乾燥は水分が乾燥除去できるのであれば乾燥機及び乾燥条件は、特に限定されない。
5) Drying In order to remove adhering water on the surface of the cemented carbide material from which the alkaline chemical solution has been removed by washing with water, the moisture is removed by drying using a conventional drier to obtain a cemented carbide material from which the hard coating has been removed. The drying and drying conditions are not particularly limited as long as the drying at this time can remove and remove the water.
6)硬質被膜の再コーティング
 硬質被膜が除去された超硬材表面にアルゴンガスを用いたイオンボンバードクリーニングを実施し、表層に形成される酸化被膜層などの不純物層を除去する。この後にCVD法やPVD法によって、硬質被膜を形成する。又、硬質被膜形成に先立って、油脂分除去のための溶剤洗浄や、超硬母材表面に発生した脆弱層を除去するためのブラストや研磨等の物理的処理を実施しても構わない。
 以上のように、本発明の方法により超硬母材表面を硬質被膜で被覆してなる超硬材において、製造時不良品及び使用劣化による寿命到達品の硬質被膜を選択的に除去し、かつ再度硬質被膜をコーティングすることによりリサイクルすることが可能となる。
6) Recoating of Hard Coating The surface of the cemented carbide from which the hard coating has been removed is subjected to ion bombardment cleaning using argon gas to remove impurity layers such as an oxide coating layer formed on the surface. Thereafter, a hard film is formed by a CVD method or a PVD method. In addition, prior to the formation of the hard coating, physical treatment such as solvent washing for removing oil and fat, or blast or polishing for removing the fragile layer generated on the surface of the cemented carbide base material may be performed.
As described above, in the cemented carbide material in which the surface of the cemented carbide base material is coated with the hard coating by the method of the present invention, the hard coating of the defective product at the time of manufacture and the end of life product due to use deterioration is selectively removed It is possible to recycle by coating the hard coating again.
 以下、実施例により本発明を更に詳細に説明するが、本発明の要旨を越えない限り以下の実施例に限定されるものではない。 Hereinafter, the present invention will be described in more detail by way of examples, but the present invention is not limited to the following examples as long as the gist of the present invention is not exceeded.
 使用した試薬、除膜装置、分析装置は次の通りである。
「試薬」
・水酸化ナトリウム(和光純薬(株)製)
・ベンゾトリアゾール(関東化学(株)製)
・タングステン酸コバルト (三津和化学薬品(株)製)
・水酸化カリウム (和光純薬(株)製)
・アンモニア水 (高杉製薬(株)製)
・過酸化水素水 (三菱瓦斯化学(株)製)
・硝酸 (高杉製薬(株)製)
・2-プロピン-1-オール (和光純薬(株)製)
・没食子酸(和光純薬(株)製)
・亜リン酸水素二ナトリウム(和光純薬(株)製)
・チオ硫酸ナトリウム(和光純薬(株)製)
・マルトース(和光純薬(株)製)
・スクロース(和光純薬(株)製)
・グルコース(和光純薬(株)製)
The reagents, film removing apparatus, and analyzer used are as follows.
"reagent"
-Sodium hydroxide (Wako Pure Chemical Industries, Ltd.)
・ Benzotriazole (Kanto Chemical Co., Ltd.)
-Cobalt tungstate (Mitsuwa Chemical Co., Ltd. product)
-Potassium hydroxide (manufactured by Wako Pure Chemical Industries, Ltd.)
・ Ammonia water (made by Takasugi Pharmaceutical Co., Ltd.)
Hydrogen peroxide water (Mitsubishi Gas Chemical Co., Ltd.)
Nitric acid (manufactured by Takasugi Pharmaceutical Co., Ltd.)
2-Propin-1-ol (manufactured by Wako Pure Chemical Industries, Ltd.)
· Gallic acid (Wako Pure Chemical Industries, Ltd.)
· Disodium hydrogen phosphite (manufactured by Wako Pure Chemical Industries, Ltd.)
Sodium thiosulfate (manufactured by Wako Pure Chemical Industries, Ltd.)
・ Maltose (made by Wako Pure Chemical Industries, Ltd.)
Sucrose (manufactured by Wako Pure Chemical Industries, Ltd.)
Glucose (manufactured by Wako Pure Chemical Industries, Ltd.)
「除膜処理装置」
1)耐圧容器:オーエムラボテック社製(形式:MR98)の仕様
       最高使用温度:250℃、最高使用圧力:5MPa
       容量:98mL
       材質:外筒SUS316/内筒PTFE
2)オーブン:ADVANTEC社製 FS-620の仕様
       内寸法:W610×D525×H500mm(内容積:160L)
       内装材質:SUS304
       使用温度範囲:25~250℃
"Demembrane processing system"
1) Pressure-resistant container: Specification of Oem Labotech (model: MR98) Maximum operating temperature: 250 ° C, maximum operating pressure: 5MPa
Volume: 98 mL
Material: Outer cylinder SUS316 / inner cylinder PTFE
2) Oven: Specification of FS-620 manufactured by ADVANTEC Internal dimensions: W610 x D 525 x H 500 mm (internal volume: 160 L)
Interior material: SUS304
Operating temperature range: 25 to 250 ° C
「分析装置」
1)-1走査型電子顕微鏡(SEM) (日本電子株式会社製、型番:JSM5600)
       加速電圧:5kV
       作動距離:10mm
       スポットサイズ:20
 図1、図2、図3、図4、図5、図6、図7、図8、図16は本機で撮影。
1)-2走査型電子顕微鏡(SEM) (日本電子株式会社製、型番:JSM6510)
       加速電圧:5kV
       作動距離:10mm
       スポットサイズ:20
 図9、図10、図11、図12、図13、図14、図15、図17、図18、図19、図20、図21、図22、図23、図24、図35、図36は本機で撮影。
2)エネルギー分散型X線分析装置(EDX) (EDAX INC.社、型番:Genesis XM2)
 SEM側条件(日本電子株式会社製、型番:JSM6510)
       加速電圧:20kV
       作動距離:10mm
       スポットサイズ:50
 EDX側条件(断面マッピング時)
       マッピング画素数:512×400
       積算回数:64回
3)硬質被膜密着強度測定装置(CSM Instruments S.A.社製、型番:RVT 9-181)
 (測定原理)
 先端120°±30’先端±0.2R±0.02の圧子を使用して、100N/minの速度で荷重を負荷しながら10mm/minの速度でテーブル移動させて膜表面をスクラッチする。
"Analysis equipment"
1) -1 Scanning electron microscope (SEM) (manufactured by Nippon Denshi Co., Ltd., model number: JSM5600)
Acceleration voltage: 5kV
Working distance: 10 mm
Spot size: 20
1, 2, 3, 3, 4, 5, 6, 7, 7, 8 and 16 are taken with this camera.
1) -2 Scanning electron microscope (SEM) (manufactured by Nippon Denshi Co., Ltd., model number: JSM 6510)
Acceleration voltage: 5kV
Working distance: 10 mm
Spot size: 20
9, 10, 11, 12, 13, 14, 15, 17, 18, 19, 20, 21, 22, 23, 24, 24, 35, 36. Shot with this unit.
2) Energy dispersive X-ray analyzer (EDX) (EDAX INC., Model number: Genesis XM2)
SEM side condition (manufactured by Nippon Denshi Co., Ltd., model number: JSM 6510)
Acceleration voltage: 20kV
Working distance: 10 mm
Spot size: 50
EDX side condition (at cross section mapping)
Mapping pixel count: 512 × 400
Accumulated number of times: 64 times 3) Hard film adhesion strength measuring device (manufactured by CSM Instruments SA, model number: RVT 9-181)
(Measurement principle)
The film surface is scratched by moving the table at a speed of 10 mm / min while applying a load at a speed of 100 N / min using an indenter with a tip of 120 ° ± 30 ′ tip ± 0.2 R ± 0.02.
「硬質被膜形成装置」
 アークイオンプレーティング装置 (神戸製鋼所製、型番:AIP70TK)
 (コーティング条件)
 組成Ti:Al=50:50のターゲットを使用して中間層無しの単層膜を生成した。処理中テーブルを自公転させ、条件、ワーク温度420℃、コート時間60分で処理を実施した。
"Hard film forming device"
Arc ion plating system (made by Kobe Steel, model number: AIP70TK)
(Coating conditions)
The target with the composition Ti: Al = 50: 50 was used to form a monolayer film without an intermediate layer. During the treatment, the table was rotated and treated under conditions, a work temperature of 420 ° C., and a coating time of 60 minutes.
 実施例及び比較例に使用した工具を表1に示す。 The tools used in Examples and Comparative Examples are shown in Table 1.
Figure JPOXMLDOC01-appb-T000014
Figure JPOXMLDOC01-appb-T000014
 実施例1
 100mLメスフラスコに水酸化ナトリウム:40gを量り取り、これに純水を徐々に加えて溶解して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した。
 この調製液60mLを前述の耐圧容器に仕込み、続いて、超硬合金粒子がWCであり、かつ、バインダー金属がCoを主体とする合金からなる超硬母材(以下、「WC/Co系超硬母材」と称す場合がある。)の表面に、硬質被膜を構成する化合物として、TiAlNとTiAlCrNとを二層に被覆したエンドミル(φ6mm、長さ50mm、刃部長さ20mm)を、前記アルカリ薬液に浸漬して耐圧容器を密閉した。なお、硬質被膜の膜厚は4μm程度である。
 この耐圧容器を、前述の加熱オーブン内に入れて、200℃まで昇温し、この温度で24時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からエンドミルを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理エンドミルを得た。処理後のエンドミル(母材)の表面SEM像(1000倍)を図1に示す。また、除膜条件及び評価結果を表2に示す。なお、処理後のエンドミル(母材)の表面SEM像において、処理前のエンドミル(母材)の表面SEM像(図示せず)との目立った外観変化はなかった。
Example 1
In a 100 mL volumetric flask, 40 g of sodium hydroxide was weighed, to which pure water was gradually added and dissolved, and the solution was cooled to room temperature and then adjusted to 100 mL to prepare an alkaline chemical solution.
60 mL of this preparation liquid is charged in the above-mentioned pressure container, and subsequently, a cemented carbide base material comprising an alloy in which the cemented carbide particles are WC and the binder metal is mainly Co (hereinafter referred to as “WC / Co based super An end mill (φ 6 mm, length 50 mm, blade length 20 mm) in which two layers of TiAlN and TiAlCrN are coated on the surface of a hard base material) as a compound constituting a hard film, The pressure container was sealed by immersing in a chemical solution. The film thickness of the hard film is about 4 μm.
The pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 200 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven became 60 ° C or less, the end mill was taken out from the pressure container, sufficiently washed with pure water, and then water was removed by air blow to obtain a film removal treatment end mill . The surface SEM image (1000 times) of the end mill (base material) after processing is shown in FIG. The film removal conditions and the evaluation results are shown in Table 2. In addition, in the surface SEM image of the end mill (base material) after the treatment, there was no noticeable change in appearance with the surface SEM image (not shown) of the end mill (base material) before the treatment.
 実施例2
 100mLメスフラスコに水酸化ナトリウム:40gとベンゾトリアゾール:1.2gを量り取り、これに純水を徐々に加えて溶解して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した。この調製液を撹拌しながら60mL分取し、前述の耐圧容器に仕込み、続いてWC/Co系超硬母材の表面に、硬質被膜として、TiSiNとTiAlCrNとを交互に多層被覆したドリル(φ6mm、長さ82mm、刃部長さ42mm)を前記アルカリ薬液に浸漬して耐圧容器を密閉した。なお、硬質被膜の膜厚は4μm程度である。
 この耐圧容器を、前述の加熱オーブン内に入れて、170℃まで昇温し、この温度で24時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からドリルを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理ドリルを得た。処理後のドリル(母材)の表面SEM像(1000倍)を図2に示す。また、除膜条件及び評価結果を表2に示す。なお、処理後のドリル(母材)の表面SEM像において、処理前のドリル(母材)の表面SEM像(図示せず)との目立った外観変化はなかった。
Example 2
40 g of sodium hydroxide and 1.2 g of benzotriazole were weighed in a 100 mL volumetric flask, pure water was gradually added to this, dissolved, cooled to room temperature, and then made constant to 100 mL to prepare an alkaline chemical solution. 60 mL of this preparation solution is taken while stirring, and charged into the above-mentioned pressure-resistant container, and subsequently a drill (φ 6 mm) in which TiSiN and TiAlCrN are alternately multi-layeredly coated as a hard coating on the surface of WC / Co cemented carbide base material. , 82 mm in length and 42 mm in blade length) were immersed in the above alkaline chemical solution to seal the pressure resistant container. The film thickness of the hard film is about 4 μm.
The pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven became 60 ° C or lower, the drill was taken out from the pressure container, sufficiently washed with pure water, and then water was removed by air blow to obtain a film removal treatment drill . The surface SEM image (1000 times) of the drill (base material) after processing is shown in FIG. The film removal conditions and the evaluation results are shown in Table 2. In addition, in the surface SEM image of the drill (base material) after the treatment, there was no noticeable change in appearance with the surface SEM image (not shown) of the drill (base material) before the treatment.
 実施例3
 100mLメスフラスコに水酸化ナトリウム:40gとタングステン酸コバルト:3.4gを量り取り、これに純水を徐々に加えて溶解(タングステン酸コバルトは未溶解分が残るためスラリー液となる)して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した。この調製液を60mL分取し、前述の耐圧容器に仕込み、続いてWC/Co系超硬母材の表面に、硬質被膜として、TiSiNとTiAlCrNとを交互に多層被覆したドリル(φ6mm、長さ82mm、刃部長さ42mm)を前記アルカリ薬液に浸漬して耐圧容器を密閉した。なお、硬質被膜の膜厚は4μm程度である。
 この耐圧容器を、前述の加熱オーブン内に入れて、200℃まで昇温し、この温度で24時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からドリルを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理ドリルを得た。処理後のドリル(母材)の表面SEM像(1000倍)を図3に示す。また、除膜条件及び評価結果を表2に示す。なお、処理後のドリル(母材)の表面SEM像において、処理前のドリル(母材)の表面SEM像(図示せず)との目立った外観変化はなかった。
Example 3
Measure 40 g of sodium hydroxide and 3.4 g of cobalt tungstate in a 100-mL volumetric flask, slowly add pure water to this and dissolve it (cobalt tungstate becomes a slurry because undissolved matter remains), and room temperature After cooling down to a constant volume of 100 mL, an alkaline solution was prepared. 60 mL of this preparation solution is taken and charged in the above-mentioned pressure vessel, and subsequently a drill (φ 6 mm, length) in which TiSiN and TiAlCrN are alternately multi-layered coated as a hard coating on the surface of WC / Co cemented carbide base material The pressure container was sealed by immersing 82 mm, blade length 42 mm) in the alkaline chemical solution. The film thickness of the hard film is about 4 μm.
The pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 200 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven became 60 ° C or lower, the drill was taken out from the pressure container, sufficiently washed with pure water, and then water was removed by air blow to obtain a film removal treatment drill . The surface SEM image (1000 times) of the drill (base material) after processing is shown in FIG. The film removal conditions and the evaluation results are shown in Table 2. In addition, in the surface SEM image of the drill (base material) after the treatment, there was no noticeable change in appearance with the surface SEM image (not shown) of the drill (base material) before the treatment.
 実施例4
 100mLメスフラスコに水酸化カリウム:56gとベンゾトリアゾール:1.2gを量り取り、これに純水を徐々に加えて溶解して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した。この調製液を撹拌しながら60mL分取し、前述の耐圧容器に仕込み、続いてWC/Co系超硬母材の表面に、硬質被膜として、TiAlNを被覆したチップ(厚さ4.8mm、一辺長さ16.5mmの三角形)を前記アルカリ薬液に浸漬して耐圧容器を密閉した。なお、硬質被膜の膜厚は4μm程度である。
 この耐圧容器を、前述の加熱オーブン内に入れて、170℃まで昇温し、この温度で24時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からチップを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理チップを得た。処理後のチップの表面SEM像(1000倍)を図4に示す。また、除膜条件及び評価結果を表2に示す。なお、処理後のチップの表面SEM像において、処理前のチップの表面SEM像(図示せず)との目立った外観変化はなかった。
Example 4
In a 100-mL volumetric flask, 56 g of potassium hydroxide and 1.2 g of benzotriazole were weighed, and pure water was gradually added thereto, dissolved, cooled to room temperature, and adjusted to 100 mL to prepare an alkaline chemical solution. 60 mL of this preparation solution is taken while stirring, and charged into the above-mentioned pressure-resistant container, and subsequently, a chip (thickness 4.8 mm, side) coated with TiAlN as a hard coating on the surface of WC / Co cemented carbide base material The pressure container was sealed by immersing the 16.5 mm long triangle) in the alkaline chemical solution. The film thickness of the hard film is about 4 μm.
The pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven became 60 ° C or lower, the chip was taken out from the pressure container, sufficiently rinsed with pure water, and then water was removed by air blow to obtain a film-removed chip . The surface SEM image (1000 ×) of the chip after treatment is shown in FIG. The film removal conditions and the evaluation results are shown in Table 2. In the surface SEM image of the processed chip, there was no noticeable change in appearance with the surface SEM image (not shown) of the chip before processing.
 実施例5
 100mLメスフラスコに水酸化ナトリウム:40gとベンゾトリアゾール:1.2gを量り取り、これに純水を徐々に加えて溶解して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した。この調製液を撹拌しながら60mL分取し、前述の耐圧容器に仕込み、続いてWC/Co系超硬母材の表面に、硬質被膜として、TiSiNとTiAlCrNとを交互に多層被覆したドリル(φ6mm、長さ82mm、刃部長さ42mm)を前記アルカリ薬液に浸漬して耐圧容器を密閉した。なお、硬質被膜の膜厚は4μm程度である。
 この耐圧容器を、前述の加熱オーブン内に入れて、200℃まで昇温し、この温度で24時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からドリルを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理ドリルを得た。処理後のドリル(母材)の表面SEM像(1000倍)を図5に示す。また、除膜条件及び評価結果を表2に示す。なお、処理後のドリル(母材)の表面SEM像において、処理前のドリル(母材)の表面SEM像(図示せず)との目立った外観変化はなかった。
Example 5
40 g of sodium hydroxide and 1.2 g of benzotriazole were weighed in a 100 mL volumetric flask, pure water was gradually added to this, dissolved, cooled to room temperature, and then made constant to 100 mL to prepare an alkaline chemical solution. 60 mL of this preparation solution is taken while stirring, and charged into the above-mentioned pressure-resistant container, and subsequently a drill (φ 6 mm) in which TiSiN and TiAlCrN are alternately multi-layeredly coated as a hard coating on the surface of WC / Co cemented carbide base material. , 82 mm in length and 42 mm in blade length) were immersed in the above alkaline chemical solution to seal the pressure resistant container. The film thickness of the hard film is about 4 μm.
The pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 200 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven became 60 ° C or lower, the drill was taken out from the pressure container, sufficiently washed with pure water, and then water was removed by air blow to obtain a film removal treatment drill . The surface SEM image (1000 times) of the drill (base material) after processing is shown in FIG. The film removal conditions and the evaluation results are shown in Table 2. In addition, in the surface SEM image of the drill (base material) after the treatment, there was no noticeable change in appearance with the surface SEM image (not shown) of the drill (base material) before the treatment.
 実施例6
 100mLメスフラスコに水酸化ナトリウム:40gを量り取り、これに純水を徐々に加えて溶解して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した。この調製液60mLを前述の耐圧容器に仕込み、続いて超硬母材がWC/Co系超硬母材である、スローアウェイチップ(一辺12mm、厚さ3mmの四角形、コバルト含有量2.5重量%)の表面に、PVD装置を用いてTiAlNを主体とする硬質被膜(膜厚4μm)を形成した超硬工具を前記アルカリ薬液に浸漬して耐圧容器を密閉した。
 この耐圧容器を、前述の加熱オーブン内に入れて、170℃まで昇温し、この温度で24時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からスローアウェイチップを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理スローアウェイチップを得た。処理後のスローアウェイチップの表面SEM像(1000倍)を図9に、除膜処理スローアウェイチップの諸物性を表2に示す。処理後のスローアウェイチップ(母材)の表面SEM像において、硬質被膜被覆前のスローアウェイチップ(母材)の表面SEM像(図35)との目立った外観変化はなかった。除膜処理後、アルゴンガスを用いたイオンボンバードクリーニングを75分間実施し、スローアウェイチップの表面をクリーニングした。クリーニング後、前述のPVD装置で、Ti:Al=50:50のターゲットと、プロセスガスとして窒素を使用し、チャンバー内圧力4Pa、ワーク温度420℃、成膜速度2~4μm/hr、バイアス電圧30Vの条件で除膜スローアウェイチップの表面に硬質被膜を形成した。硬質被膜を形成し再生したスローアウェイチップと除膜処理を行っていない新品のスローアウェイチップの被膜密着強度と比較したところ、新品:60.5ニュートンに比べ、36.0ニュートンであった。除膜条件及び被膜密着強度評価結果を表4に示す。
Example 6
In a 100 mL volumetric flask, 40 g of sodium hydroxide was weighed, to which pure water was gradually added and dissolved, and the solution was cooled to room temperature and then adjusted to 100 mL to prepare an alkaline chemical solution. 60 mL of this preparation liquid is charged in the above-mentioned pressure-resistant container, and subsequently, a throwaway tip (12 mm on a side, 3 mm in thickness, a quadrangle of cobalt content 2.5 weight) where the carbide base material is a WC / Co cemented carbide base material. A cemented carbide tool having a hard coating (film thickness 4 μm) mainly composed of TiAlN formed on a surface of the%) using a PVD apparatus was immersed in the alkali chemical solution to seal the pressure resistant container.
The pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip. The surface SEM image (1000 times) of the throw-away tip after treatment is shown in FIG. 9 and the physical properties of the film-deposition treated throw-away tip are shown in Table 2. In the surface SEM image of the throwaway tip (base material) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG. 35) of the throwaway tip (base material) before hard coating. After film removal treatment, ion bombard cleaning using argon gas was performed for 75 minutes to clean the surface of the indexable tip. After cleaning, using the target of Ti: Al = 50: 50 and nitrogen as the process gas, the pressure in the chamber is 4 Pa, the work temperature is 420 ° C., the film forming speed is 2 to 4 μm / hr, and the bias voltage is 30 V A hard coating was formed on the surface of the film removal indexable tip under the following conditions. It was 36.0 newtons compared with new article: 60.5 newtons when it compared with the film adhesion strength of the new indexable inserts which did not perform coating processing, and the throwaway tips which formed and reproduced hard coating. The film removal conditions and the film adhesion strength evaluation results are shown in Table 4.
 実施例7
 100mLメスフラスコに水酸化ナトリウム:40gとタングステン酸コバルト:3.4gを量り取り、これに純水を徐々に加えて溶解(タングステン酸コバルトは未溶解分が残るためスラリー液となる)して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した。この調製液60mLを前述の耐圧容器に仕込み、続いてスローアウェイチップ上にTiAlNを主体とする硬質被膜を形成させた実施例6と同様の超硬工具を、前記アルカリ薬液に浸漬して耐圧容器を密閉した。
 この耐圧容器を、前述の加熱オーブン内に入れて、170℃まで昇温し、この温度で24時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からスローアウェイチップを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理スローアウェイチップを得た。処理後のスローアウェイチップの表面SEM像(1000倍)を図10に、除膜処理スローアウェイチップの諸物性を表3に示す。処理後のスローアウェイチップ(母材)の表面SEM像において、硬質被膜被覆前のスローアウェイチップ(母材)の表面SEM像(図35)との目立った外観変化はなく、SEM-EDX法による表面コバルト濃度を測定したところ、2.4重量%であった。また、この処理後スローアウェイチップの断面分析結果を図25に示す。SEM-EDX法による表面深さ方向のコバルトマッピング分析の結果、コバルト脱離は認められなかった。除膜処理後、アルゴンガスを用いたイオンボンバードクリーニングを75分間実施し、スローアウェイチップの表面をクリーニングした。クリーニング後、前述のPVD装置で、Ti:Al=50:50のターゲットとプロセスガスとして窒素を使用し、チャンバー内圧力4Pa、ワーク温度420℃、成膜速度2~4μm/hr、バイアス電圧30Vの条件で除膜スローアウェイチップの表面に硬質被膜を形成した。硬質被膜を形成し再生したスローアウェイチップと除膜処理を行っていない新品のスローアウェイチップの被膜密着強度と比較したところ、新品:60.5ニュートンに比べ、65.1ニュートンと同程度であった。除膜条件及び被膜密着強度評価結果を表4に示す。
Example 7
Measure 40 g of sodium hydroxide and 3.4 g of cobalt tungstate in a 100-mL volumetric flask, slowly add pure water to this and dissolve it (cobalt tungstate becomes a slurry because undissolved matter remains), and room temperature After cooling down to a constant volume of 100 mL, an alkaline solution was prepared. The same cemented carbide tool as in Example 6 in which 60 mL of this preparation liquid was charged in the above-described pressure resistant container and then a hard coating mainly composed of TiAlN was formed on the throwaway tip was immersed in the alkali chemical solution to Was sealed.
The pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip. The surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. 10, and the physical properties of the film-deposition treated throw-away tip are shown in Table 3. In the surface SEM image of the throwaway tip (base material) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG. 35) of the throwaway tip (base material) before hard coating, and it was determined by the SEM-EDX method The surface cobalt concentration was measured and found to be 2.4% by weight. Moreover, the cross-sectional analysis result of the throw away tip after this process is shown in FIG. As a result of cobalt mapping analysis in the surface depth direction by the SEM-EDX method, cobalt desorption was not found. After film removal treatment, ion bombard cleaning using argon gas was performed for 75 minutes to clean the surface of the indexable tip. After cleaning, using the target of Ti: Al = 50: 50 and nitrogen as the process gas in the above-mentioned PVD apparatus, the pressure in the chamber is 4 Pa, the work temperature is 420 ° C., the film forming speed is 2 to 4 μm / hr, and the bias voltage is 30 V A hard coating was formed on the surface of the film removal indexable tip under the conditions. The film adhesion strength between a hard coating formed and regenerated indexable insert and a new indexable insert which has not been subjected to a film removal treatment is as good as 65.1 newton compared to 60.5 new. The The film removal conditions and the film adhesion strength evaluation results are shown in Table 4.
 実施例8
 100mLメスフラスコに水酸化ナトリウム40gとベンゾトリアゾール:1.2gを量り取り、これに純水を徐々に加えて溶解して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した。この調製液60mLを前述の耐圧容器に仕込み、続いてスローアウェイチップ上にTiAlNを主体とする硬質被膜を形成させた実施例6と同様の超硬工具を、前記アルカリ薬液に浸漬して耐圧容器を密閉した。
 この耐圧容器を、前述の加熱オーブン内に入れて、170℃まで昇温し、この温度で24時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からスローアウェイチップを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理スローアウェイチップを得た。処理後のスローアウェイチップの表面SEM像(1000倍)を図11に、除膜処理スローアウェイチップの諸物性を表2に示す。処理後のスローアウェイチップ(母材)の表面SEM像において、硬質被膜被覆前のスローアウェイチップ(母材)の表面SEM像(図35)との目立った外観変化はなかった。
Example 8
40 g of sodium hydroxide and 1.2 g of benzotriazole were weighed in a 100 mL volumetric flask, pure water was gradually added to this, dissolved, cooled to room temperature, and then made constant to 100 mL to prepare an alkaline chemical solution. The same cemented carbide tool as in Example 6 in which 60 mL of this preparation liquid was charged in the above-described pressure resistant container and then a hard coating mainly composed of TiAlN was formed on the throwaway tip was immersed in the alkali chemical solution to Was sealed.
The pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip. The surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. 11, and the physical properties of the film-deposition treated throw-away tip are shown in Table 2. In the surface SEM image of the throwaway tip (base material) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG. 35) of the throwaway tip (base material) before hard coating.
 実施例9
 100mLメスフラスコに水酸化ナトリウム:40gとアスコルビン酸:3.5gを量り取り、これに純水を徐々に加えて溶解して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した。この調製液60mLを前述の耐圧容器に仕込み、続いてスローアウェイチップ上にTiAlNを主体とする硬質被膜を形成させた実施例6と同様の超硬工具を、前記アルカリ薬液に浸漬して耐圧容器を密閉した。
 この耐圧容器を、前述の加熱オーブン内に入れて、170℃まで昇温し、この温度で12時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からスローアウェイチップを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理スローアウェイチップを得た。処理後のスローアウェイチップの表面SEM像(1000倍)を図12に、除膜処理スローアウェイチップの諸物性を表3に示す。処理後のスローアウェイチップ(母材)の表面SEM像において、硬質被膜被覆前のスローアウェイチップ(母材)の表面SEM像(図35)との目立った外観変化はなく、SEM-EDX法による表面コバルト濃度を測定したところ、2.1重量%であった。また、この処理後スローアウェイチップの断面分析結果を図26に示す。SEM-EDX法による表面深さ方向のコバルトマッピング分析の結果、コバルト脱離は認められなかった。除膜処理後、アルゴンガスを用いたイオンボンバードクリーニングを75分間実施し、スローアウェイチップの表面をクリーニングした。クリーニング後、前述のPVD装置で、Ti:Al=50:50のターゲットと、プロセスガスとして窒素を使用し、チャンバー内圧力4Pa、ワーク温度420℃、成膜速度2~4μm/hr、バイアス電圧30Vの条件で除膜スローアウェイチップの表面に硬質被膜を形成した。硬質被膜を形成し再生したスローアウェイチップと除膜処理を行っていない新品のスローアウェイチップの被膜密着強度と比較したところ、新品:60.5ニュートンに比べ、72.5ニュートンと同等以上であった。除膜条件及び被膜密着強度評価結果を表4に示す。
Example 9
In a 100 mL volumetric flask, 40 g of sodium hydroxide and 3.5 g of ascorbic acid were weighed, pure water was gradually added to this, dissolved, cooled to room temperature, and then made constant to 100 mL to prepare an alkaline chemical solution. The same cemented carbide tool as in Example 6 in which 60 mL of this preparation liquid was charged in the above-described pressure resistant container and then a hard coating mainly composed of TiAlN was formed on the throwaway tip was immersed in the alkali chemical solution to Was sealed.
The pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 12 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip. The surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. 12, and the physical properties of the film-deposition treated throw-away tip are shown in Table 3. In the surface SEM image of the throwaway tip (base material) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG. 35) of the throwaway tip (base material) before hard coating, and it was determined by the SEM-EDX method The surface cobalt concentration was measured and found to be 2.1% by weight. Moreover, the cross-sectional analysis result of the throw away tip after this process is shown in FIG. As a result of cobalt mapping analysis in the surface depth direction by the SEM-EDX method, cobalt desorption was not found. After film removal treatment, ion bombard cleaning using argon gas was performed for 75 minutes to clean the surface of the indexable tip. After cleaning, using the target of Ti: Al = 50: 50 and nitrogen as the process gas, the pressure in the chamber is 4 Pa, the work temperature is 420 ° C., the film forming speed is 2 to 4 μm / hr, and the bias voltage is 30 V A hard coating was formed on the surface of the film removal indexable tip under the following conditions. When compared with the film adhesion strength of a new indexable insert which has a hard coating formed and regenerated and a new indexable insert which has not been subjected to a film removal treatment, it is equal to or higher than 72.5 Newtons compared to new: 60.5 Newtons. The The film removal conditions and the film adhesion strength evaluation results are shown in Table 4.
 実施例10
 100mLメスフラスコに水酸化ナトリウム:40gと水酸化コバルト:3.5gを量り取り、これに純水を徐々に加えて溶解(水酸化コバルトは未溶解分が残るためスラリー液となる)して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した。この調製液60mLを前述の耐圧容器に仕込み、続いてスローアウェイチップ上にTiAlNを主体とする硬質被膜を形成させた実施例6と同様の超硬工具を、前記アルカリ薬液に浸漬して耐圧容器を密閉した。
 この耐圧容器を、前述の加熱オーブン内に入れて、170℃まで昇温し、この温度で24時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からスローアウェイチップを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理スローアウェイチップを得た。処理後のスローアウェイチップの表面SEM像(1000倍)を図13に、除膜処理スローアウェイチップの諸物性を表3に示す。処理後のスローアウェイチップ(母材)の表面SEM像において、硬質被膜被覆前のスローアウェイチップ(母材)の表面SEM像(図35)との目立った外観変化はなく、SEM-EDX法による表面コバルト濃度を測定したところ、2.5重量%であった。また、この処理後スローアウェイチップの断面分析結果を図27に示す。SEM-EDX法による表面深さ方向のコバルトマッピング分析の結果、コバルト脱離は認められなかった。
Example 10
Measure 40 g of sodium hydroxide and 3.5 g of cobalt hydroxide in a 100-mL volumetric flask, slowly add pure water to this and dissolve it (cobalt hydroxide becomes a slurry because undissolved matter remains), and room temperature After cooling down to a constant volume of 100 mL, an alkaline solution was prepared. The same cemented carbide tool as in Example 6 in which 60 mL of this preparation liquid was charged in the above-described pressure resistant container and then a hard coating mainly composed of TiAlN was formed on the throwaway tip was immersed in the alkali chemical solution to Was sealed.
The pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip. The surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. 13 and the physical properties of the film-deposition treated throw-away tip are shown in Table 3. In the surface SEM image of the throwaway tip (base material) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG. 35) of the throwaway tip (base material) before hard coating, and it was determined by the SEM-EDX method The surface cobalt concentration was measured and found to be 2.5% by weight. Moreover, the cross-sectional analysis result of the throw away tip after this process is shown in FIG. As a result of cobalt mapping analysis in the surface depth direction by the SEM-EDX method, cobalt desorption was not found.
 実施例11
 100mLメスフラスコに水酸化ナトリウム:40gと2-プロピン-1-オール:3.5gを量り取り、これに純水を徐々に加えて溶解して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した。この調製液を撹拌しながら60mL分取し、前述の耐圧容器に仕込み、続いてWC/Co系超硬母材の表面に、硬質被膜として、TiSiNとTiAlCrNとを交互に多層被覆したドリル(φ6mm、長さ82mm、刃部長さ42mm、コバルト含有量6.5重量%)を前記アルカリ薬液に浸漬して耐圧容器を密閉した。なお、硬質被膜の膜厚は4μm程度である。
 この耐圧容器を、前述の加熱オーブン内に入れて、200℃まで昇温し、この温度で24時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からドリルを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理ドリルを得た。処理後のドリル(母材)の表面SEM像(1000倍)を図16に示す。また、除膜条件及び評価結果を表3に示す。なお、処理後のドリル(母材)の表面SEM像において、処理前のドリル(母材)の表面SEM像(図示せず)との目立った外観変化はなく、SEM-EDX法による表面コバルト濃度を測定したところ、6.2重量%であった。また、この処理後ドリルの断面分析結果を図28に示す。SEM-EDX法による表面深さ方向のコバルトマッピング分析の結果、コバルト脱離は認められなかった。
Example 11
Weigh 40 g of sodium hydroxide and 3.5 g of 2-propyn-1-ol in a 100 mL volumetric flask, slowly add pure water to this, dissolve it, cool to room temperature, and then make up to 100 mL and make an alkaline solution Was prepared. 60 mL of this preparation solution is taken while stirring, and charged into the above-mentioned pressure-resistant container, and subsequently a drill (φ 6 mm) in which TiSiN and TiAlCrN are alternately multi-layeredly coated as a hard coating on the surface of WC / Co cemented carbide base material. (The length 82 mm, blade length 42 mm, cobalt content 6.5 wt%) was immersed in the above alkaline chemical solution to seal the pressure resistant container. The film thickness of the hard film is about 4 μm.
The pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 200 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven became 60 ° C or lower, the drill was taken out from the pressure container, sufficiently washed with pure water, and then water was removed by air blow to obtain a film removal treatment drill . The surface SEM image (1000 times) of the drill (base material) after processing is shown in FIG. The film removal conditions and the evaluation results are shown in Table 3. In addition, in the surface SEM image of the drill (base material) after treatment, there is no noticeable change in appearance with the surface SEM image (not shown) of the drill (base material) before treatment, and the surface cobalt concentration by the SEM-EDX method Was measured to be 6.2% by weight. Moreover, the cross-sectional analysis result of the drill after this process is shown in FIG. As a result of cobalt mapping analysis in the surface depth direction by the SEM-EDX method, cobalt desorption was not found.
 実施例12
 100mLメスフラスコに水酸化ナトリウム40gと没食子酸:3.5gを量り取り、これに純水を徐々に加えて溶解して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した。この調製液60mLを前述の耐圧容器に仕込み、続いてスローアウェイチップ上にTiAlNを主体とする硬質被膜を形成させた実施例6と同様の超硬工具を、前記アルカリ薬液に浸漬して耐圧容器を密閉した。
 この耐圧容器を、前述の加熱オーブン内に入れて、170℃まで昇温し、この温度で24時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からスローアウェイチップを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理スローアウェイチップを得た。処理後のスローアウェイチップの表面SEM像(1000倍)を図17に、除膜処理スローアウェイチップの諸物性を表2に示す。処理後のスローアウェイチップ(母材)の表面SEM像において、硬質被膜被覆前のスローアウェイチップ(母材)の表面SEM像(図35)との目立った外観変化はなかった。
Example 12
40 g of sodium hydroxide and 3.5 g of gallic acid were weighed in a 100 mL volumetric flask, pure water was gradually added to this, dissolved, cooled to room temperature, and then made constant to 100 mL to prepare an alkaline chemical solution. The same cemented carbide tool as in Example 6 in which 60 mL of this preparation liquid was charged in the above-described pressure resistant container and then a hard coating mainly composed of TiAlN was formed on the throwaway tip was immersed in the alkali chemical solution to Was sealed.
The pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip. The surface SEM image (1000 times) of the throw-away tip after treatment is shown in FIG. 17 and the physical properties of the film-deposition treated throw-away tip are shown in Table 2. In the surface SEM image of the throwaway tip (base material) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG. 35) of the throwaway tip (base material) before hard coating.
 実施例13
 100mLメスフラスコに水酸化ナトリウム40gと亜リン酸水素二ナトリウム:3.5gを量り取り、これに純水を徐々に加えて溶解して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した。この調製液60mLを前述の耐圧容器に仕込み、続いてスローアウェイチップ上にTiAlNを主体とする硬質被膜を形成させた実施例6と同様の超硬工具を、前記アルカリ薬液に浸漬して耐圧容器を密閉した。
 この耐圧容器を、前述の加熱オーブン内に入れて、170℃まで昇温し、この温度で24時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からスローアウェイチップを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理スローアウェイチップを得た。処理後のスローアウェイチップの表面SEM像(1000倍)を図18に、除膜処理スローアウェイチップの諸物性を表2に示す。処理後のスローアウェイチップ(母材)の表面SEM像において、硬質被膜被覆前のスローアウェイチップ(母材)の表面SEM像(図35)との目立った外観変化はなかった。
Example 13
40 g of sodium hydroxide and 3.5 g of disodium hydrogen phosphite are weighed into a 100 mL volumetric flask, pure water is gradually added to this, dissolved, cooled to room temperature, and made constant to 100 mL to prepare an alkaline chemical solution did. The same cemented carbide tool as in Example 6 in which 60 mL of this preparation liquid was charged in the above-described pressure resistant container and then a hard coating mainly composed of TiAlN was formed on the throwaway tip was immersed in the alkali chemical solution to Was sealed.
The pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip. The surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. 18 and the physical properties of the film-deposition treated throw-away tip are shown in Table 2. In the surface SEM image of the throwaway tip (base material) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG. 35) of the throwaway tip (base material) before hard coating.
 実施例14
 100mLメスフラスコに水酸化ナトリウム40gとチオ硫酸ナトリウム:3.5gを量り取り、これに純水を徐々に加えて溶解して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した。この調製液60mLを前述の耐圧容器に仕込み、続いてスローアウェイチップ上にTiAlNを主体とする硬質被膜を形成させた実施例6と同様の超硬工具を、前記アルカリ薬液に浸漬して耐圧容器を密閉した。
 この耐圧容器を、前述の加熱オーブン内に入れて、170℃まで昇温し、この温度で24時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からスローアウェイチップを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理スローアウェイチップを得た。処理後のスローアウェイチップの表面SEM像(1000倍)を図19に、除膜処理スローアウェイチップの諸物性を表2に示す。処理後のスローアウェイチップ(母材)の表面SEM像において、硬質被膜被覆前のスローアウェイチップ(母材)の表面SEM像(図35)との目立った外観変化はなかった。
Example 14
In a 100-mL volumetric flask, 40 g of sodium hydroxide and 3.5 g of sodium thiosulfate were weighed, pure water was gradually added to this, dissolved, cooled to room temperature, and then made constant to 100 mL to prepare an alkaline chemical solution. The same cemented carbide tool as in Example 6 in which 60 mL of this preparation liquid was charged in the above-described pressure resistant container and then a hard coating mainly composed of TiAlN was formed on the throwaway tip was immersed in the alkali chemical solution to Was sealed.
The pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip. The surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. 19 and the physical properties of the film-deposition treated throw-away tip are shown in Table 2. In the surface SEM image of the throwaway tip (base material) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG. 35) of the throwaway tip (base material) before hard coating.
 実施例15
 100mLメスフラスコに水酸化ナトリウム40gと水酸化コバルト:3.5gを量り取り、これに純水を徐々に加えて溶解(水酸化コバルトは未溶解分が残るためスラリー液となる)して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した。この調製液60mLを前述の耐圧容器に仕込み、続いて片面を鏡面研磨した、超硬母材がWC/Co系超硬母材である、スローアウェイチップ(一辺12mm、厚さ3mmの四角形、コバルト含有量2.5重量%)の表面に、PVD装置を用いてTiAlNを主体とする硬質被膜(膜厚4μm)を形成した超硬工具を、前記アルカリ薬液に浸漬して耐圧容器を密閉した。鏡面研磨を行うことで、後述の、除膜-再コーティング後の被膜密着強度評価の際の測定値のバラツキが小さくなることが期待できる。
 この耐圧容器を、前述の加熱オーブン内に入れて、170℃まで昇温し、この温度で24時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からスローアウェイチップを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理スローアウェイチップを得た。処理後のスローアウェイチップの研磨面の表面SEM像(1000倍)を図20に、除膜処理スローアウェイチップの諸物性を表3に示す。処理後のスローアウェイチップ(母材・研磨面)の表面SEM像において、硬質被膜被覆前のスローアウェイチップ(母材・研磨面)の表面SEM像(図36)との目立った外観変化はなく、SEM-EDX法により表面コバルト濃度を測定したところ、2.2重量%であった。また、この処理後スローアウェイチップの断面分析結果を図29に示す。SEM-EDX法による表面深さ方向のコバルトマッピング分析の結果、コバルト脱離は認められなかった。除膜処理後、アルゴンガスを用いたイオンボンバードクリーニングを75分間実施し、スローアウェイチップの表面をクリーニングした。クリーニング後、前述のPVD装置で、Ti:Al=50:50のターゲットとプロセスガスとして窒素を使用し、チャンバー内圧力4Pa、ワーク温度420℃、成膜速度2~4μm/hr、バイアス電圧30Vの条件で除膜スローアウェイチップの表面に硬質被膜を形成した。硬質被膜を形成し再生したスローアウェイチップと除膜処理を行っていない新品のスローアウェイチップの鏡面研磨した面の被膜密着強度と比較したところ、新品:83.8ニュートンに比べ、78.0ニュートンであった。被膜密着強度測定値のバラツキが平均値からプラスマイナス15N程度の幅を持つことを勘案すれば、再生品の被膜密着強度は新品に比べて遜色ないといえる。除膜条件及び被膜密着強度評価結果を表5に示す。
Example 15
Weigh 40 g of sodium hydroxide and 3.5 g of cobalt hydroxide in a 100-mL volumetric flask and slowly add pure water to this to dissolve it (cobalt hydroxide becomes a slurry because undissolved matter remains) to room temperature After cooling, the volume was adjusted to 100 mL to prepare an alkaline chemical solution. 60 mL of this preparation liquid was charged in the above-mentioned pressure-resistant container, and then one surface was mirror-polished. A throwaway tip (12 mm on a side, 3 mm in thickness, cobalt) whose cemented carbide substrate is a WC / Co cemented carbide substrate. A cemented carbide tool in which a hard coating (film thickness 4 μm) mainly composed of TiAlN was formed on the surface with a content of 2.5% by weight using a PVD apparatus was immersed in the alkaline chemical solution to seal the pressure resistant container. By mirror-polishing, it can be expected that variations in measured values in the evaluation of film adhesion strength after film removal and recoating described later will be reduced.
The pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip. The surface SEM image (1000 times) of the polished surface of the throw away tip after the treatment is shown in FIG. 20, and the physical properties of the film removal treated throw away tip are shown in Table 3. In the surface SEM image of the throwaway tip (base material / polished surface) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG. 36) of the throwaway tip (base material / polished surface) before hard coating. The surface cobalt concentration was measured by the SEM-EDX method to be 2.2% by weight. Moreover, the cross-sectional analysis result of the throw away tip after this process is shown in FIG. As a result of cobalt mapping analysis in the surface depth direction by the SEM-EDX method, cobalt desorption was not found. After film removal treatment, ion bombard cleaning using argon gas was performed for 75 minutes to clean the surface of the indexable tip. After cleaning, using the target of Ti: Al = 50: 50 and nitrogen as the process gas in the above-mentioned PVD apparatus, the pressure in the chamber is 4 Pa, the work temperature is 420 ° C., the film forming speed is 2 to 4 μm / hr, and the bias voltage is 30 V A hard coating was formed on the surface of the film removal indexable tip under the conditions. The film adhesion strength of a new indexable insert which has a hard coating formed and regenerated and a new indexable insert which has not been subjected to a film removal treatment is compared with that of the coating: Met. In consideration of the fact that the variation in the film adhesion strength measurement value has a range of about ± 15 N from the average value, it can be said that the film adhesion strength of the recycled product is comparable to that of a new product. The film removal conditions and the film adhesion strength evaluation results are shown in Table 5.
 実施例16
 100mLメスフラスコに水酸化ナトリウム:40g、アスコルビン酸:0.18gとタングステン酸コバルト:0.17gを量り取り、これに純水を徐々に加えて溶解(タングステン酸コバルトは未溶解分が残るため少量の沈殿が生じる)して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した。この調製液60mLを前述の耐圧容器に仕込み、続いて片面を鏡面研磨した、超硬母材がWC/Co系超硬母材である、スローアウェイチップ(一辺12mm、厚さ3mmの四角形、コバルト含有量2.5重量%)の表面に、PVD装置を用いてTiAlNを主体とする硬質被膜(膜厚4μm)を形成した超硬工具を、前記アルカリ薬液に浸漬して耐圧容器を密閉した。鏡面研磨を行うことで、後述の、除膜-再コーティング後の被膜密着強度評価の際の測定値のバラツキが小さくなることが期待できる。
 この耐圧容器を、前述の加熱オーブン内に入れて、170℃まで昇温し、この温度で24時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からスローアウェイチップを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理スローアウェイチップを得た。処理後のスローアウェイチップの研磨面の表面SEM像(1000倍)を図21に、除膜処理スローアウェイチップの諸物性を表3に示す。処理後のスローアウェイチップ(母材・研磨面)の表面SEM像において、硬質被膜被覆前のスローアウェイチップ(母材・研磨面)の表面SEM像(図36)との目立った外観変化はなく、SEM-EDX法により表面コバルト濃度を測定したところ、2.5重量%であった。また、この処理後スローアウェイチップの断面分析結果を図30に示す。SEM-EDX法による表面深さ方向のコバルトマッピング分析の結果、コバルト脱離は認められなかった。除膜処理後、アルゴンガスを用いたイオンボンバードクリーニングを75分間実施し、スローアウェイチップの表面をクリーニングした。クリーニング後、前述のPVD装置で、Ti:Al=50:50のターゲットとプロセスガスとして窒素を使用し、チャンバー内圧力4Pa、ワーク温度420℃、成膜速度2~4μm/hr、バイアス電圧30Vの条件で除膜スローアウェイチップの表面に硬質被膜を形成した。硬質被膜を形成し再生したスローアウェイチップと除膜処理を行っていない新品のスローアウェイチップの鏡面研磨した面の被膜密着強度と比較したところ、新品:83.8ニュートンに比べ、78.0ニュートンであった。被膜密着強度測定値のバラツキが平均値からプラスマイナス15N程度の幅を持つことを勘案すれば、再生品の被膜密着強度は新品に比べて遜色ないといえる。除膜条件及び被膜密着強度評価結果を表5に示す。
Example 16
Measure 40 g of sodium hydroxide, 0.18 g of ascorbic acid and 0.17 g of cobalt tungstate in a 100-mL volumetric flask, slowly add pure water to this and dissolve it (cobalt tungstate remains small as it remains undissolved. The reaction mixture was cooled to room temperature and then adjusted to 100 mL to prepare an alkaline solution. 60 mL of this preparation liquid was charged in the above-mentioned pressure-resistant container, and then one surface was mirror-polished. A throwaway tip (12 mm on a side, 3 mm in thickness, cobalt) whose cemented carbide substrate is a WC / Co cemented carbide substrate. A cemented carbide tool in which a hard coating (film thickness 4 μm) mainly composed of TiAlN was formed on the surface with a content of 2.5% by weight using a PVD apparatus was immersed in the alkaline chemical solution to seal the pressure resistant container. By mirror-polishing, it can be expected that variations in measured values in the evaluation of film adhesion strength after film removal and recoating described later will be reduced.
The pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip. The surface SEM image (1000 times) of the polished surface of the throw away tip after the treatment is shown in FIG. 21 and the physical properties of the film removal treated throw away tip are shown in Table 3. In the surface SEM image of the throwaway tip (base material / polished surface) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG. 36) of the throwaway tip (base material / polished surface) before hard coating. The surface cobalt concentration was measured by the SEM-EDX method to be 2.5% by weight. Moreover, the cross-sectional analysis result of the throw away tip after this process is shown in FIG. As a result of cobalt mapping analysis in the surface depth direction by the SEM-EDX method, cobalt desorption was not found. After film removal treatment, ion bombard cleaning using argon gas was performed for 75 minutes to clean the surface of the indexable tip. After cleaning, using the target of Ti: Al = 50: 50 and nitrogen as the process gas in the above-mentioned PVD apparatus, the pressure in the chamber is 4 Pa, the work temperature is 420 ° C., the film forming speed is 2 to 4 μm / hr, and the bias voltage is 30 V A hard coating was formed on the surface of the film removal indexable tip under the conditions. The film adhesion strength of a new indexable insert which has a hard coating formed and regenerated and a new indexable insert which has not been subjected to a film removal treatment is compared with that of the coating: Met. In consideration of the fact that the variation in the film adhesion strength measurement value has a range of about ± 15 N from the average value, it can be said that the film adhesion strength of the recycled product is comparable to that of a new product. The film removal conditions and the film adhesion strength evaluation results are shown in Table 5.
 実施例17
 100mLメスフラスコに水酸化ナトリウム40gとマルトース:7.2gを量り取り、これに純水を徐々に加えて溶解して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した。窒素ガスで内部を置換したグローブボックス内で、調製液60mLを前述の耐圧容器に仕込み、続いてスローアウェイチップ上にTiAlNを主体とする硬質被膜を形成させた実施例6と同様の超硬工具を、前記アルカリ薬液に浸漬した。このようにして耐圧容器の気相部分を窒素ガスで置換した形で容器を密閉した。
 この耐圧容器を、前述の加熱オーブン内に入れて、170℃まで昇温し、この温度で24時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からスローアウェイチップを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理スローアウェイチップを得た。処理後のスローアウェイチップの表面SEM像(1000倍)を図22に、除膜処理スローアウェイチップの諸物性を表2に示す。処理後のスローアウェイチップ(母材)の表面SEM像において、硬質被膜被覆前のスローアウェイチップ(母材)の表面SEM像(図35)との目立った外観変化はなかった。
Example 17
40 g of sodium hydroxide and 7.2 g of maltose were weighed in a 100-mL volumetric flask, pure water was gradually added to this, dissolved, cooled to room temperature, and then made constant to 100 mL to prepare an alkaline chemical solution. The same cemented carbide tool as in Example 6 in which 60 mL of the preparation liquid was charged into the above-mentioned pressure-resistant container in a glove box whose inside was replaced with nitrogen gas, and then a hard coating consisting mainly of TiAlN was formed on the throwaway tip. Was immersed in the alkali chemical solution. Thus, the container was sealed in a form in which the gas phase portion of the pressure container was replaced with nitrogen gas.
The pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip. The surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. In the surface SEM image of the throwaway tip (base material) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG. 35) of the throwaway tip (base material) before hard coating.
 実施例18
 100mLメスフラスコに水酸化ナトリウム40gとスクロース:0.34g、水酸化コバルト:0.05gを量り取り、これに純水を徐々に加えて溶解して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した(水酸化コバルトは未溶解分が残るため少量の沈殿が生じる)。窒素ガスで内部を置換したグローブボックス内で、調製液60mLを前述の耐圧容器に仕込み、続いてスローアウェイチップ上にTiAlNを主体とする硬質被膜を形成させた実施例6と同様の超硬工具を、前記アルカリ薬液に浸漬した。このようにして耐圧容器の気相部分を窒素ガスで置換した形で容器を密閉した。
 この耐圧容器を、前述の加熱オーブン内に入れて、170℃まで昇温し、この温度で24時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からスローアウェイチップを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理スローアウェイチップを得た。処理後のスローアウェイチップの表面SEM像(1000倍)を図23に、除膜処理スローアウェイチップの諸物性を表3に示す。処理後のスローアウェイチップ(母材)の表面SEM像において、硬質被膜被覆前のスローアウェイチップ(母材)の表面SEM像(図35)との目立った外観変化はなく、SEM-EDX法による表面コバルト濃度を測定したところ、2.4重量%であった。また、この処理後スローアウェイチップの断面分析結果を図31に示す。SEM-EDX法による表面深さ方向のコバルトマッピング分析の結果、コバルト脱離は認められなかった。
Example 18
40 g of sodium hydroxide, 0.34 g of sucrose, and 0.05 g of cobalt hydroxide are weighed into a 100-mL volumetric flask, pure water is gradually added to this, dissolved, cooled to room temperature, and the volume is adjusted to 100 mL and alkali A drug solution was prepared (cobalt hydroxide produces a small amount of precipitate because undissolved matter remains). The same cemented carbide tool as in Example 6 in which 60 mL of the preparation liquid was charged into the above-mentioned pressure-resistant container in a glove box whose inside was replaced with nitrogen gas, and then a hard coating consisting mainly of TiAlN was formed on the throwaway tip. Was immersed in the alkali chemical solution. Thus, the container was sealed in a form in which the gas phase portion of the pressure container was replaced with nitrogen gas.
The pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip. The surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. 23, and the physical properties of the film-deposition treated throw-away tip are shown in Table 3. In the surface SEM image of the throwaway tip (base material) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG. 35) of the throwaway tip (base material) before hard coating, and it was determined by the SEM-EDX method The surface cobalt concentration was measured and found to be 2.4% by weight. Moreover, the cross-sectional analysis result of the throw away tip after this process is shown in FIG. As a result of cobalt mapping analysis in the surface depth direction by the SEM-EDX method, cobalt desorption was not found.
 実施例19
 100mLメスフラスコに水酸化ナトリウム40gとグルコース:0.18g、水酸化コバルト:0.05gを量り取り、これに純水を徐々に加えて溶解して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した(水酸化コバルトは未溶解分が残るため少量の沈殿が生じる)。窒素ガスで内部を置換したグローブボックス内で、調製液60mLを前述の耐圧容器に仕込み、続いてスローアウェイチップ上にTiAlNを主体とする硬質被膜を形成させた実施例6と同様の超硬工具を、前記アルカリ薬液に浸漬した。このようにして耐圧容器の気相部分を窒素ガスで置換した形で容器を密閉した。
 この耐圧容器を、前述の加熱オーブン内に入れて、170℃まで昇温し、この温度で24時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からスローアウェイチップを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理スローアウェイチップを得た。処理後のスローアウェイチップの表面SEM像(1000倍)を図24に、除膜処理スローアウェイチップの諸物性を表3に示す。処理後のスローアウェイチップ(母材)の表面SEM像において、硬質被膜被覆前のスローアウェイチップ(母材)の表面SEM像(図35)との目立った外観変化はなく、SEM-EDX法による表面コバルト濃度を測定したところ、2.5重量%であった。また、この処理後スローアウェイチップの断面分析結果を図32に示す。SEM-EDX法による表面深さ方向のコバルトマッピング分析の結果、コバルト脱離は認められなかった。
Example 19
40 g of sodium hydroxide, 0.18 g of glucose, and 0.05 g of cobalt hydroxide are weighed into a 100-mL volumetric flask, pure water is gradually added to this, dissolved, cooled to room temperature, and the volume is adjusted to 100 mL and alkali A drug solution was prepared (cobalt hydroxide produces a small amount of precipitate because undissolved matter remains). The same cemented carbide tool as in Example 6 in which 60 mL of the preparation liquid was charged into the above-mentioned pressure-resistant container in a glove box whose inside was replaced with nitrogen gas, and then a hard coating consisting mainly of TiAlN was formed on the throwaway tip. Was immersed in the alkali chemical solution. Thus, the container was sealed in a form in which the gas phase portion of the pressure container was replaced with nitrogen gas.
The pressure-resistant container was placed in the above-described heating oven, the temperature was raised to 170 ° C., and film removal treatment was performed at this temperature for 24 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven has dropped to 60 ° C or lower, take out the throwaway tip from the pressure container, wash it thoroughly with pure water, and then remove moisture by air blow to remove film removal treatment. I got a chip. The surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. 24 and the physical properties of the film-deposition treated throw-away tip are shown in Table 3. In the surface SEM image of the throwaway tip (base material) after treatment, there was no noticeable change in appearance with the surface SEM image (FIG. 35) of the throwaway tip (base material) before hard coating, and it was determined by the SEM-EDX method The surface cobalt concentration was measured and found to be 2.5% by weight. Moreover, the cross-sectional analysis result of the throw away tip after this process is shown in FIG. As a result of cobalt mapping analysis in the surface depth direction by the SEM-EDX method, cobalt desorption was not found.
 比較例1
 300mLポリビーカーに、純水:106g、35%過酸化水素水:86gを量り取り続いて、撹拌しながら室温下で25%アンモニア水:8gを徐々に加えて除膜薬液を調製した。続いてこの薬液にWC/Co系超硬母材の表面に、硬質被膜として、TiAlNとTiAlCrNとを二層に被覆したエンドミル(φ6mm、長さ50mm、刃部長さ20mm)を浸漬して、15℃~25℃で9時間の除膜処理を行なった。なお、硬質被膜の膜厚は4μm程度である。
 所定時間経過後、ビーカーからエンドミルを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理エンドミルを得た。処理後のエンドミル(母材)の表面SEM像(1000倍)を図6に示す。また、除膜条件及び評価結果を表2に示す。なお、処理後のエンドミル(母材)の表面SEM像において、処理前のエンドミル(母材)の表面SEM像(図示せず)との目立った外観変化はなかった。しかしながら、目視観察によると明らかに表面の金属光沢が失われ灰色に変化していた。
Comparative Example 1
In a 300 mL poly beaker, 106 g of pure water and 86 g of 35% hydrogen peroxide water were weighed and subsequently, 8 g of 25% aqueous ammonia at room temperature was gradually added while stirring to prepare a film removing solution. Then, immerse an end mill (φ 6 mm, length 50 mm, edge length 20 mm) coated with TiAlN and TiAlCrN as a hard coating on the surface of WC / Co cemented carbide base material in this chemical solution, 15 The film was removed at 9 ° C. to 25 ° C. for 9 hours. The film thickness of the hard film is about 4 μm.
After a predetermined time elapsed, the end mill was taken out of the beaker, thoroughly washed with pure water, and then water was removed by air blow to obtain a film removal end mill. The surface SEM image (1000 times) of the end mill (base material) after the treatment is shown in FIG. The film removal conditions and the evaluation results are shown in Table 2. In addition, in the surface SEM image of the end mill (base material) after the treatment, there was no noticeable change in appearance with the surface SEM image (not shown) of the end mill (base material) before the treatment. However, according to visual observation, the metallic gloss of the surface was apparently lost and turned to gray.
 比較例2
 200mLガラス製メスフラスコに、67.5%硝酸:74mLを入れ、純水にて定容して除膜薬液を調整した。この液を300mLガラスビーカーに全量仕込み、続いてこの薬液にWC/Co系超硬母材の表面に、硬質被膜として、TiAlNとTiAlCrNとを二層に被覆したエンドミル(φ6mm、長さ50mm、刃部長さ20mm)を浸漬して、ウォーターバス中で80℃まで昇温したのち48時間保持して除膜処理を行った。なお、硬質被膜の膜厚は4μm程度である。所定時間経過後、ビーカーからエンドミルを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理エンドミルを得た。処理後のエンドミルの表面SEM像(1000倍)を図7に示す。また、除膜条件及び評価結果を表2に示す。なお、処理後のエンドミル(母材)の表面SEM像は、処理前のエンドミル(母材)の表面SEM像(図示せず)と比較して、表面あれ(腐食)が激しかった。
Comparative example 2
74 mL of 67.5% nitric acid was placed in a 200 mL glass measuring flask, and the volume was adjusted with pure water to adjust the decoating chemical solution. This solution is charged into a 300 mL glass beaker, and then an end mill (φ 6 mm, length 50 mm, blade) is coated with two layers of TiAlN and TiAlCrN as a hard coating on the surface of WC / Co cemented carbide base material with this chemical solution. The part length was 20 mm, and after raising the temperature to 80 ° C. in a water bath, the film was held for 48 hours for film removal treatment. The film thickness of the hard film is about 4 μm. After a predetermined time elapsed, the end mill was taken out of the beaker, thoroughly washed with pure water, and then water was removed by air blow to obtain a film removal end mill. A surface SEM image (1000 ×) of the end mill after treatment is shown in FIG. The film removal conditions and the evaluation results are shown in Table 2. In addition, the surface SEM image of the end mill (base material) after the treatment had a rough surface (corrosion) compared to the surface SEM image (not shown) of the end mill (base material) before the treatment.
 比較例3
 100mLメスフラスコに水酸化ナトリウム:40gとベンゾトリアゾール:1.2gを量り取り、これに純水を徐々に加えて溶解して室温まで冷却したのち100mLに定容してアルカリ薬液を調製した。この調製液を撹拌しながら60mL分取し、前述の耐圧容器に仕込み、続いてWC/Co系超硬母材の表面に、硬質被膜として、TiSiNとTiAlCrNとを交互に多層被覆したドリル(φ6mm、長さ82mm、刃部長さ42mm)を前記アルカリ薬液に浸漬して耐圧容器を密閉した。なお、硬質被膜の膜厚は4μm程度である。
 この耐圧容器を、前述の加熱オーブン内に入れて、95℃まで昇温し、この温度で48時間の除膜処理を行なった。所定時間経過後、オーブン温度を20℃に設定して冷却した。オーブン内の耐圧容器温度が60℃以下になったことを確認したのち、耐圧容器内からドリルを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理ドリルを得た。処理後のドリル(母材)の表面SEM像(1000倍)を図8に示す。また、除膜条件及び評価結果を表2に示す。なお、処理後のドリル(母材)の表面SEM像は、処理前のドリル(母材)の表面SEM像(図示せず)と比較して、表面あれ(腐食)が激しかった。
Comparative example 3
40 g of sodium hydroxide and 1.2 g of benzotriazole were weighed in a 100 mL volumetric flask, pure water was gradually added to this, dissolved, cooled to room temperature, and then made constant to 100 mL to prepare an alkaline chemical solution. 60 mL of this preparation solution is taken while stirring, and charged into the above-mentioned pressure-resistant container, and subsequently a drill (φ 6 mm) in which TiSiN and TiAlCrN are alternately multi-layeredly coated as a hard coating on the surface of WC / Co cemented carbide base material. , 82 mm in length and 42 mm in blade length) were immersed in the above alkaline chemical solution to seal the pressure resistant container. The film thickness of the hard film is about 4 μm.
The pressure-resistant container was placed in the above-mentioned heating oven, heated to 95 ° C., and subjected to film removal treatment at this temperature for 48 hours. After a predetermined time elapsed, the oven temperature was set to 20 ° C. for cooling. After confirming that the pressure container temperature in the oven became 60 ° C or lower, the drill was taken out from the pressure container, sufficiently washed with pure water, and then water was removed by air blow to obtain a film removal treatment drill . The surface SEM image (1000 times) of the drill (base material) after the treatment is shown in FIG. The film removal conditions and the evaluation results are shown in Table 2. In addition, the surface SEM image of the drill (base material) after the treatment had a rough surface (corrosion) compared to the surface SEM image (not shown) of the drill (base material) before the treatment.
 比較例4
 300mLポリビーカーに、純水:106g、35%過酸化水素水:86gを量り取り続いて、撹拌しながら室温下で25%アンモニア水:8gを徐々に加えて除膜薬液を調製した。続いてスローアウェイチップ上にTiAlNを主体とする硬質被膜を形成させた実施例6と同様の超硬工具を、前記除膜薬液に浸漬して耐圧容器を密閉し、15℃~25℃で39時間の除膜処理を行なった。
 所定時間経過後、ビーカーからスローアウェイチップを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理スローアウェイチップを得た。処理後のスローアウェイチップの表面SEM像(1000倍)を図14に、除膜処理スローアウェイチップの諸物性を表3に示す。処理後のスローアウェイチップ(母材)の表面SEM像は、硬質被膜被覆前のスローアウェイチップ(母材)の表面SEM像(図35)と比較して、表面あれ(腐食)が激しかった。SEM-EDX法による表面コバルト濃度を測定したところ、3.2重量%と除膜前母材より高いことから超硬材のタングステンカーバイトが除膜操作により脱離したと思われる。また、この処理後スローアウェイチップの断面分析結果を図33に示す。SEM-EDX法による表面深さ方向のコバルトマッピング分析の結果、コバルト脱離は認められなかった。除膜処理後、アルゴンガスを用いたイオンボンバードクリーニングを75分間実施し、スローアウェイチップの表面をクリーニングした。クリーニング後、前述のPVD装置で、Ti:Al=50:50のターゲットとプロセスガスとして窒素を使用し、チャンバー内圧力4Pa、ワーク温度420℃、成膜速度2~4μm/hr、バイアス電圧30Vの条件で除膜スローアウェイチップの表面に硬質被膜を形成した。硬質被膜を形成し再生したスローアウェイチップと除膜処理を行っていない新品のスローアウェイチップの被膜密着強度を比較したところ、再生スローアウェイチップの被膜密着強度はゼロニュートンであり、新品に比べて著しく劣る結果であった。除膜条件及び被膜密着強度評価結果を表4に示す。
Comparative example 4
In a 300 mL poly beaker, 106 g of pure water and 86 g of 35% hydrogen peroxide water were weighed and subsequently, 8 g of 25% aqueous ammonia at room temperature was gradually added while stirring to prepare a film removing solution. Subsequently, the same cemented carbide tool as in Example 6 in which a hard coating mainly composed of TiAlN was formed on the indexable tip was immersed in the film removing chemical solution to seal the pressure resistant container, and 39 at 15 ° C to 25 ° C. The film was removed for a while.
After the lapse of a predetermined time, the throwaway tip was taken out of the beaker, sufficiently washed with pure water, and then water was removed by air blow to obtain a film-deposition treated throwaway tip. The surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. 14 and the physical properties of the film-deposition treated throw-away tip are shown in Table 3. The surface SEM image of the indexable tip (base material) after the treatment had a rough surface (corrosion) compared to the surface SEM image of the indexable tip (base material) before hard coating. When the surface cobalt concentration was measured by the SEM-EDX method, it was thought that tungsten carbide of the cemented carbide was detached by the film removing operation because it was higher than the base material before film removal, which is 3.2% by weight. Moreover, the cross-sectional analysis result of the throw away tip after this process is shown in FIG. As a result of cobalt mapping analysis in the surface depth direction by the SEM-EDX method, cobalt desorption was not found. After film removal treatment, ion bombard cleaning using argon gas was performed for 75 minutes to clean the surface of the indexable tip. After cleaning, using the target of Ti: Al = 50: 50 and nitrogen as the process gas in the above-mentioned PVD apparatus, the pressure in the chamber is 4 Pa, the work temperature is 420 ° C., the film forming speed is 2 to 4 μm / hr, and the bias voltage is 30 V A hard coating was formed on the surface of the film removal indexable tip under the conditions. The film adhesion strength of the throwaway chip that has been hard-filmed and regenerated is compared with the film adhesion strength of the new throwaway chip that has not been subjected to film removal treatment. The result was significantly inferior. The film removal conditions and the film adhesion strength evaluation results are shown in Table 4.
 比較例5
 200mLガラス製メスフラスコに、67.5%硝酸:74mLを入れ、純水にて定容して除膜薬液を調製した。この液を300mLガラスビーカーに全量仕込み、続いてスローアウェイチップ上にTiAlNを主体とする硬質被膜を形成させた実施例6と同様の超硬工具を、前記除膜薬液に浸漬して耐圧容器を密閉し、ウォーターバス中で80℃まで昇温したのち30時間保持して除膜処理を行った。
 所定時間経過後、ビーカーからスローアウェイチップを取り出し、純水で十分に水洗し、さらにエアブローで水分を除去して除膜処理スローアウェイチップを得た。処理後のスローアウェイチップの表面SEM像(1000倍)を図15に、除膜処理スローアウェイチップの諸物性を表3に示す。処理後のスローアウェイチップ(母材)の表面SEM像は、硬質被膜被覆前のスローアウェイチップ(母材)の表面SEM像(図35)と比較して、表面あれ(腐食)が激しかった。SEM-EDX法による表面コバルト濃度を測定したところ、ゼロ重量%と除膜操作により、その殆どが脱離していた。また、この処理後スローアウェイチップの断面分析結果を図34に示す。SEM-EDX法による表面深さ方向のコバルトマッピング分析の結果、コバルト脱離深さは表面から12.5μm程度の深さまで脱離していた。除膜処理後、アルゴンガスを用いたイオンボンバードクリーニングを75分間実施し、スローアウェイチップの表面をクリーニングした。クリーニング後、前述のPVD装置で、Ti:Al=50:50のターゲットとプロセスガスとして窒素を使用し、チャンバー内圧力4Pa、ワーク温度420℃、成膜速度2~4μm/hr、バイアス電圧30Vの条件で除膜スローアウェイチップの表面に硬質被膜を形成した。硬質被膜を形成し再生したスローアウェイチップと除膜処理を行っていない新品のスローアウェイチップの被膜密着強度を比較したところ、再生スローアウェイチップの被膜密着強度は2.0ニュートンと新品に比べて著しく劣る結果であった。除膜条件及び被膜密着強度評価結果を表4に示す。
Comparative example 5
74 mL of 67.5% nitric acid was added to a 200 mL glass measuring flask, and the volume was adjusted with pure water to prepare a demembraned chemical solution. The entire volume of this solution was charged in a 300 mL glass beaker, and then a cemented carbide tool similar to that of Example 6 in which a hard coating consisting mainly of TiAlN was formed on the throwaway tip was immersed in the decoating solution to make a pressure resistant container. The film was sealed, heated to 80 ° C. in a water bath, and then held for 30 hours for film removal treatment.
After the lapse of a predetermined time, the throwaway tip was taken out of the beaker, sufficiently washed with pure water, and then water was removed by air blow to obtain a film-deposition treated throwaway tip. The surface SEM image (1000 times) of the throw-away tip after the treatment is shown in FIG. 15, and the physical properties of the film-deposition treated throw-away tip are shown in Table 3. The surface SEM image of the indexable tip (base material) after the treatment had a rough surface (corrosion) compared to the surface SEM image of the indexable tip (base material) before hard coating. When the surface cobalt concentration was measured by the SEM-EDX method, most of it was desorbed by the film removal operation with zero weight%. Moreover, the cross-sectional analysis result of the throw away tip after this process is shown in FIG. As a result of cobalt mapping analysis in the surface depth direction by the SEM-EDX method, the cobalt desorption depth was desorbed to a depth of about 12.5 μm from the surface. After film removal treatment, ion bombard cleaning using argon gas was performed for 75 minutes to clean the surface of the indexable tip. After cleaning, using the target of Ti: Al = 50: 50 and nitrogen as the process gas in the above-mentioned PVD apparatus, the pressure in the chamber is 4 Pa, the work temperature is 420 ° C., the film forming speed is 2 to 4 μm / hr, and the bias voltage is 30 V A hard coating was formed on the surface of the film removal indexable tip under the conditions. The film adhesion strength of the throwaway chip with hard coating formed and that of the new throwaway chip not subjected to film removal treatment was compared. The film adhesion strength of the regenerated throwaway chip was 2.0 Newtons compared to that of the new product. The result was significantly inferior. The film removal conditions and the film adhesion strength evaluation results are shown in Table 4.
 以上の実施例1~5及び比較例1~3における硬質被膜の除去結果一覧を表2に、実施例6~10及び比較例4,5における硬質被膜の除去結果一覧を表3に、実施例6,7,9及び比較例4,5において硬質被膜を除去した後、PVD装置で被膜を形成し、再生したスローアウェイチップの被膜密着強度測定の結果を表4に示す。なお、表2並びに表3中の記号の説明を以下に示す。
<表中記号の説明>
「除膜可否」
 ○:完全除膜、△:一部膜残、×:膜残多い
「目視外観」
 ○:処理前母材と同様(変色なし)、△:一部変色/表面荒れ、×:全面変色/荒れ多い
「SEM外観」
 ○:処理前母材と同様、△:処理前母材と同じ、×:全面荒れ激しい
「総合評価」
 ○:良好(処理前母材並)、△:ほぼ良好、×:全面腐食で不可
Table 2 shows the list of removal results of hard coatings in Examples 1 to 5 and Comparative Examples 1 to 3 above, and Table 3 shows the list of removal results of hard coatings on Examples 6 to 10 and Comparative Examples 4 and 5 in Examples. After removing the hard film in 6, 7 and 9 and Comparative Examples 4 and 5, the film was formed with a PVD apparatus, and the result of the film adhesion strength measurement of the reproduced throw-away tip is shown in Table 4. In addition, description of the symbol in Table 2 and Table 3 is shown below.
<Description of symbols in table>
"Delayering possible"
○: Complete film removal, △: Partial film residue, ×: Large film residue “visual appearance”
○: same as base material before treatment (no discoloration), Δ: partial discoloration / surface roughness, ×: overall discoloration / rough “SEM appearance”
○: same as base material before treatment, :: same as base material before treatment, ×: rough all over, "general evaluation"
:: good (pre-treatment base material grade), :: almost good, x: overall corrosion not possible
Figure JPOXMLDOC01-appb-T000015
Figure JPOXMLDOC01-appb-T000015
Figure JPOXMLDOC01-appb-T000016
Figure JPOXMLDOC01-appb-T000016
Figure JPOXMLDOC01-appb-T000017
Figure JPOXMLDOC01-appb-T000017
Figure JPOXMLDOC01-appb-T000018
Figure JPOXMLDOC01-appb-T000018
 本発明によると、超硬材において超硬母材の表面劣化を最小限に抑制しつつ、超硬母材表面の硬質被膜を選択的に除去できるため、超硬材の製造及び再生利用分野で非常に有用である。 According to the present invention, it is possible to selectively remove the hard coating on the surface of the cemented carbide base material while minimizing the surface deterioration of the cemented carbide base material in the cemented carbide material. Very useful.

Claims (29)

  1.  第4族元素、第5族元素及び第6族元素からなる群より選ばれた少なくとも1種の元素の炭化物を含有する超硬合金粒子が、Fe、Co、Cu及びNiからなる群より選ばれた少なくとも1種の元素あるいはこれらの元素を含有する合金からなるバインダー金属で焼結された超硬母材の表面を、第4族元素、第5族元素、第6族元素、第13族元素及び第14族元素(但し、炭素は除く。)からなる群より選ばれた少なくとも1種の元素の窒化物、炭化物、炭窒化物、酸化物又はホウ化物を含有する硬質被膜で被覆してなる超硬材における硬質被膜を除去する方法であって、
     前記超硬材を100℃以上250℃以下の温度で、アルカリ薬液に接触させることを特徴とする超硬材における硬質被膜の除去方法。
    Cemented carbide particles containing carbides of at least one element selected from the group consisting of Group 4 elements, Group 5 elements and Group 6 elements are selected from the group consisting of Fe, Co, Cu and Ni The surface of a cemented carbide base material sintered with a binder metal consisting of at least one element or an alloy containing these elements is a group 4 element, a group 5 element, a group 6 element, a group 13 element And a hard film containing a nitride, carbide, carbonitride, oxide or boride of at least one element selected from the group consisting of Group 14 elements (with the exception of carbon). A method of removing a hard coating on a cemented carbide material, comprising:
    A method of removing a hard film on a cemented carbide, comprising bringing the cemented carbide into contact with an alkaline chemical solution at a temperature of 100 ° C. or more and 250 ° C. or less.
  2.  前記アルカリ薬液が、超硬母材の腐食抑制剤を含有する請求項1記載の硬質被膜の除去方法。 The method for removing a hard film according to claim 1, wherein the alkaline chemical solution contains a corrosion inhibitor of a cemented carbide base material.
  3.  前記腐食抑制剤が、前記超硬母材を構成する第4族元素、第5族元素、第6族元素、Fe、Co、Cu及びNiからなる群より選ばれた少なくとも1種の元素からなる群より選ばれた少なくとも1種の元素からなる単体あるいは該元素を含む化合物である請求項2記載の硬質被膜の除去方法。 The corrosion inhibitor is composed of at least one element selected from the group consisting of a group 4 element, a group 5 element, a group 6 element, Fe, Co, Cu and Ni constituting the cemented carbide base material. The method for removing a hard film according to claim 2, which is a simple substance consisting of at least one element selected from the group or a compound containing said element.
  4.  前記腐食抑制剤が、コバルト化合物である請求項3記載の硬質被膜の除去方法。 The method for removing a hard film according to claim 3, wherein the corrosion inhibitor is a cobalt compound.
  5.  前記腐食抑制剤が、タングステン酸コバルト、水酸化コバルト、酸化コバルト又はコバルト金属である請求項4に記載の硬質被膜の除去方法。 The method for removing a hard film according to claim 4, wherein the corrosion inhibitor is cobalt tungstate, cobalt hydroxide, cobalt oxide or cobalt metal.
  6.  前記腐食抑制剤が、還元剤である請求項2に記載の硬質被膜の除去方法。 The method for removing a hard film according to claim 2, wherein the corrosion inhibitor is a reducing agent.
  7.  前記還元剤が、下記一般式(1)で示される化合物である請求項6記載の硬質被膜の除去方法。
    Figure JPOXMLDOC01-appb-C000001
    (式中、R1はカルボキシル基、炭素数1~6のアルキル基、アシル基、アルコキシカルボニル基のいずれか、R2は炭素数1~6のアルキル基、アルコキシ基、水酸基のいずれかであり、R1とR2が環構造を形成していてもよい。X1、X2はそれぞれ独立に水素原子、アルカリ金属のいずれかである。)
    The method for removing a hard film according to claim 6, wherein the reducing agent is a compound represented by the following general formula (1).
    Figure JPOXMLDOC01-appb-C000001
    (Wherein, R 1 is any of a carboxyl group, an alkyl group having 1 to 6 carbon atoms, an acyl group and an alkoxycarbonyl group, and R 2 is any of an alkyl group having 1 to 6 carbon atoms, an alkoxy group and a hydroxyl group And R 1 and R 2 may form a ring structure, and X 1 and X 2 each independently represent a hydrogen atom or an alkali metal.
  8.  前記還元剤が、ジヒドロキシマレイン酸である請求項7記載の硬質被膜の除去方法。 The method for removing a hard film according to claim 7, wherein the reducing agent is dihydroxymaleic acid.
  9.  前記還元剤が、下記一般式(2)で示される化合物である請求項7記載の硬質被膜の除去方法。
    Figure JPOXMLDOC01-appb-C000002
    (式中、R3は水素原子若しくは炭素数1~6のアルキル基、アルケニル基、アルキニル基、アシル基、アルコキシカルボニル基であり、nは0又は1、X3、X4はそれぞれ独立に水素原子、アルカリ金属のいずれかである。)
    The method for removing a hard film according to claim 7, wherein the reducing agent is a compound represented by the following general formula (2).
    Figure JPOXMLDOC01-appb-C000002
    (Wherein, R 3 is a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, an alkenyl group, an alkynyl group, an acyl group, an alkoxycarbonyl group, n is 0 or 1 and X 3 and X 4 are each independently hydrogen Is either an atom or an alkali metal.)
  10.  前記還元剤が、アスコルビン酸、アスコルビン酸ナトリウム、エリソルビン酸及びエリソルビン酸ナトリウムから選ばれた少なくとも1種である請求項9記載の硬質被膜の除去方法。 The method for removing a hard film according to claim 9, wherein the reducing agent is at least one selected from ascorbic acid, sodium ascorbate, erythorbic acid and sodium erythorbate.
  11.  前記還元剤が、下記一般式(3-a)、(3-b)で示される化合物及び/又はその塩である請求項6記載の硬質被膜の除去方法。
    Figure JPOXMLDOC01-appb-C000003

    Figure JPOXMLDOC01-appb-C000004
    (式(3-a)、(3-b)中、R4はカルボキシル基、アルデヒド基、アルコキシ基、アルコキシカルボニル基、又はアシル基、R5は水素原子又は水酸基である。)
    The method for removing a hard film according to claim 6, wherein the reducing agent is a compound represented by the following general formula (3-a) or (3-b) and / or a salt thereof.
    Figure JPOXMLDOC01-appb-C000003

    Figure JPOXMLDOC01-appb-C000004
    (In the formulas (3-a) and (3-b), R 4 is a carboxyl group, an aldehyde group, an alkoxy group, an alkoxycarbonyl group, or an acyl group, and R 5 is a hydrogen atom or a hydroxyl group.)
  12.  前記還元剤が、没食子酸、m-ガロイル没食子酸、カテコール及びヒドロキノンから選ばれた少なくとも1種である請求項11記載の硬質被膜の除去方法。 The method for removing a hard film according to claim 11, wherein the reducing agent is at least one selected from gallic acid, m-galoyl gallic acid, catechol and hydroquinone.
  13.  前記還元剤が、単糖類、二糖類、三糖類、四糖類、オリゴ糖又は多糖類である請求項6記載の硬質被膜の除去方法。 The method for removing a hard film according to claim 6, wherein the reducing agent is a monosaccharide, disaccharide, trisaccharide, tetrasaccharide, oligosaccharide or polysaccharide.
  14.  前記還元剤が、ジヒドロキシアセトン、エリトルロース、エリトロース、キシルロース、リボース、アラビノース、キシロース、デオキシリボース、プシコース、グルコース、フルクトース、ソルボース、タガトース、マンノース、イドース、タロース、フコース、ラムノース、マルトース、ラクトース、スクロース、トレハロース、ツラノース、セロビオース、ラフィノース、マルトトリオース、アカルボース、スタキオース、ガラクトース、リボース、フラクトオリゴ糖、ガラクトオリゴ糖、マンナンオリゴ糖、グリコーゲン、デンプン、セルロース、デキストリン、グルカン、レバン及びイヌリンから選ばれた少なくとも1種である請求項13記載の硬質被膜の除去方法。 The reducing agent is dihydroxyacetone, erythrulose, erythrose, xylulose, ribose, arabinose, xylose, deoxyribose, psicose, glucose, fructose, sorbose, tagatose, mannose, idose, talose, fucose, rhamnose, maltose, lactose, sucrose, trehalose , Tulanose, cellobiose, raffinose, maltotriose, acarbose, stachyose, galactose, ribose, fructooligosaccharide, galactooligosaccharide, mannanoligosaccharide, glycogen, starch, cellulose, dextrin, glucan, levan and inulin The method for removing a hard film according to claim 13.
  15.  前記還元剤が、含リン系還元剤又は含イオウ系還元剤である請求項6記載の硬質被膜の除去方法。 The method for removing a hard film according to claim 6, wherein the reducing agent is a phosphorus-containing reducing agent or a sulfur-containing reducing agent.
  16.  前記還元剤が、亜リン酸水素二ナトリウム又はチオ硫酸ナトリウムである請求項15記載の硬質被膜の除去方法。 The method for removing a hard film according to claim 15, wherein the reducing agent is disodium hydrogen phosphite or sodium thiosulfate.
  17.  前記腐食抑制剤が、アゾール化合物又はその塩、チオ尿素化合物及びアセチレン系化合物からなる群より選ばれた少なくとも1種の化合物である請求項2記載の硬質被膜の除去方法。 The method for removing a hard film according to claim 2, wherein the corrosion inhibitor is at least one compound selected from the group consisting of an azole compound or a salt thereof, a thiourea compound and an acetylene compound.
  18.  前記アゾール化合物が、ベンゾトリアゾールである請求項17記載の硬質被膜の除去方法。 The method for removing a hard film according to claim 17, wherein the azole compound is benzotriazole.
  19.  前記チオ尿素化合物が、チオ尿素である請求項17記載の硬質被膜の除去方法。 The method for removing a hard film according to claim 17, wherein the thiourea compound is thiourea.
  20.  前記アセチレン系化合物が、2-プロピン-1-オール、1-ヘキシン-3-オール、3-ブチン-1-オールから選ばれた少なくとも1種である請求項17記載の硬質被膜の除去方法。 The method for removing a hard film according to claim 17, wherein the acetylene-based compound is at least one selected from 2-propyn-1-ol, 1-hexyn-3-ol, and 3-butyn-1-ol.
  21.  超硬合金粒子が、W、Ti、Nb、Ta、V、Crからなる群より選ばれた少なくとも1種の元素の炭化物を含有する請求項1乃至20のいずれか1項に記載の硬質被膜の除去方法。 21. The hard film according to any one of claims 1 to 20, wherein the cemented carbide particles contain a carbide of at least one element selected from the group consisting of W, Ti, Nb, Ta, V and Cr. How to remove
  22.  バインダー金属が、Coを含有する請求項1乃至21のいずれか1項に記載の硬質被膜の除去方法。 The method for removing a hard film according to any one of claims 1 to 21, wherein the binder metal contains Co.
  23.  硬質被膜が、Ti、V、Cr、Si及びAlからなる群より選ばれた少なくとも1種の元素の窒化物、炭化物又は炭窒化物を含有する請求項1乃至22のいずれか1項に記載の硬質被膜の除去方法。 The hard film according to any one of claims 1 to 22, wherein the hard film contains a nitride, carbide or carbonitride of at least one element selected from the group consisting of Ti, V, Cr, Si and Al. Hard coating removal method.
  24.  硬質被膜が、TiN、TiAlN、TiSiN、TiAlCrN、CrN、TiCrN、VN、TiC及びTiCNからなる群より選ばれた少なくとも1種の化合物を含有する請求項1乃至23のいずれか1項に記載の硬質被膜の除去方法。 The hard film according to any one of claims 1 to 23, wherein the hard film contains at least one compound selected from the group consisting of TiN, TiAlN, TiSiN, TiAlCrN, CrN, TiCrN, VN, TiC and TiCN. How to remove the film.
  25.  硬質被膜が、単層あるいは複層の膜で構成されてなる請求項1乃至24のいずれか1項に記載の硬質被膜の除去方法。 The method for removing a hard film according to any one of claims 1 to 24, wherein the hard film is composed of a single layer or a multilayer film.
  26.  アルカリ薬液が、1~20mol/L(OH-換算)のアルカリ金属水酸化物及び/又はアルカリ土類金属水酸化物を含有する請求項1乃至25のいずれか1項に記載の硬質被膜の除去方法。 Alkaline chemical is, 1 ~ 20 mol / L - removal of any one of claims 1 to 25 containing an alkali metal hydroxide and / or alkaline earth metal hydroxide (OH equivalent) hard coating Method.
  27.  アルカリ薬液が、1~20mol/L(OH-換算)の水酸化ナトリウム及び/又は水酸化カリウムを含有する請求項26記載の硬質被膜の除去方法。 The method for removing a hard film according to claim 26, wherein the alkaline chemical solution contains 1 to 20 mol / L (OH - equivalent) of sodium hydroxide and / or potassium hydroxide.
  28.  気相部分を不活性気体及び/又は還元性気体及び/又はアルカリ薬液から発生する蒸気で置換した気密性処理容器内で、前記超硬材から硬質被膜の除去を行う請求項1乃至27のいずれか1項に記載の硬質被膜の除去方法。 28. The method according to any one of claims 1 to 27, wherein the hard coating is removed from the cemented carbide in an airtight processing vessel in which the gas phase part is replaced with an inert gas and / or a reducing gas and / or a vapor generated from an alkaline chemical solution. The method for removing a hard film according to any one of the preceding claims
  29.  請求項1乃至28のいずれか1項に記載の硬質被膜の除去方法により硬質被膜を除去し、再度硬質被膜を成膜することを特徴とする硬質被膜に被覆された超硬材の製造方法。 A method for producing a superhard material coated with a hard coating, comprising removing the hard coating by the method of removing a hard coating according to any one of claims 1 to 28, and forming a hard coating again.
PCT/JP2010/062835 2009-07-31 2010-07-29 Method for removal of hard coating film in superhard material, and method for production of superhard material WO2011013766A1 (en)

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