WO2010067159A3 - Integration of a processing bench in an inline coating system - Google Patents

Integration of a processing bench in an inline coating system Download PDF

Info

Publication number
WO2010067159A3
WO2010067159A3 PCT/IB2009/007615 IB2009007615W WO2010067159A3 WO 2010067159 A3 WO2010067159 A3 WO 2010067159A3 IB 2009007615 W IB2009007615 W IB 2009007615W WO 2010067159 A3 WO2010067159 A3 WO 2010067159A3
Authority
WO
WIPO (PCT)
Prior art keywords
coating system
insert element
integration
processing bench
insert
Prior art date
Application number
PCT/IB2009/007615
Other languages
French (fr)
Other versions
WO2010067159A2 (en
Inventor
Edgar Haberkorn
Philipp Maurer
Original Assignee
Applied Materials, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from EP08171573A external-priority patent/EP2197026A1/en
Priority claimed from US12/334,198 external-priority patent/US20100147217A1/en
Application filed by Applied Materials, Inc. filed Critical Applied Materials, Inc.
Priority to CN2009801500613A priority Critical patent/CN102246263A/en
Publication of WO2010067159A2 publication Critical patent/WO2010067159A2/en
Publication of WO2010067159A3 publication Critical patent/WO2010067159A3/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/6719Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67126Apparatus for sealing, encapsulating, glassing, decapsulating or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67207Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67736Loading to or unloading from a conveyor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67748Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a single workpiece
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67775Docking arrangements

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

An insert apparatus for a substrate coating system, the insert apparatus including: an insert element 100 for being operated within a coating system, the insert element including a processing bench, said processing bench being adapted for receiving a coating tool for applying a coating to a substrate, a carrier 1 10 for carrying the insert element 100, a first positioner 130 collaborating with the carrier 110 for inserting said insert element 100 into a processing chamber 150 of the coating system and/or retracting said insert element 100 from said processing chamber 150, and a second positioner 140 for fine positioning of said insert element 100 within said processing chamber 150.
PCT/IB2009/007615 2008-12-12 2009-11-30 Integration of a processing bench in an inline coating system WO2010067159A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2009801500613A CN102246263A (en) 2008-12-12 2009-11-30 Integration of a processing bench in an inline coating system

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
EP08171573.2 2008-12-12
US12/334,198 2008-12-12
EP08171573A EP2197026A1 (en) 2008-12-12 2008-12-12 Integration of a processing bench in an inline coating system
US12/334,198 US20100147217A1 (en) 2008-12-12 2008-12-12 Integration of a processing bench in an inline coating system

Publications (2)

Publication Number Publication Date
WO2010067159A2 WO2010067159A2 (en) 2010-06-17
WO2010067159A3 true WO2010067159A3 (en) 2010-09-10

Family

ID=42243125

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IB2009/007615 WO2010067159A2 (en) 2008-12-12 2009-11-30 Integration of a processing bench in an inline coating system

Country Status (4)

Country Link
KR (1) KR20110096152A (en)
CN (1) CN102246263A (en)
TW (1) TW201030162A (en)
WO (1) WO2010067159A2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10770338B2 (en) * 2018-12-19 2020-09-08 Globalfoundries Inc. System comprising a single wafer, reduced volume process chamber

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5948704A (en) * 1996-06-05 1999-09-07 Lam Research Corporation High flow vacuum chamber including equipment modules such as a plasma generating source, vacuum pumping arrangement and/or cantilevered substrate support
US6273955B1 (en) * 1995-08-28 2001-08-14 Canon Kabushiki Kaisha Film forming apparatus
US20030168948A1 (en) * 2002-02-21 2003-09-11 Takayuki Yamagishi Semiconductor manufacturing equipment and maintenance method
JP2006114461A (en) * 2004-10-18 2006-04-27 Sekisui Chem Co Ltd Atmospheric pressure plasma surface treatment apparatus

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8408023D0 (en) * 1984-03-28 1984-05-10 Gen Eng Radcliffe Ltd Vacuum coating apparatus
US6503379B1 (en) * 2000-05-22 2003-01-07 Basic Research, Inc. Mobile plating system and method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6273955B1 (en) * 1995-08-28 2001-08-14 Canon Kabushiki Kaisha Film forming apparatus
US5948704A (en) * 1996-06-05 1999-09-07 Lam Research Corporation High flow vacuum chamber including equipment modules such as a plasma generating source, vacuum pumping arrangement and/or cantilevered substrate support
US20030168948A1 (en) * 2002-02-21 2003-09-11 Takayuki Yamagishi Semiconductor manufacturing equipment and maintenance method
JP2006114461A (en) * 2004-10-18 2006-04-27 Sekisui Chem Co Ltd Atmospheric pressure plasma surface treatment apparatus

Also Published As

Publication number Publication date
TW201030162A (en) 2010-08-16
WO2010067159A2 (en) 2010-06-17
KR20110096152A (en) 2011-08-29
CN102246263A (en) 2011-11-16

Similar Documents

Publication Publication Date Title
WO2009154903A3 (en) Methods for processing substrates having an antimicrobial coating
WO2008086282A3 (en) Methods and systems for using electrical information for a device being fabricated on a wafer to perform one or more defect-related functions
EP2195827A4 (en) Showerhead, substrate processing apparatus including the showerhead, and plasma supplying method using the showerhead
TW200730583A (en) Siloxane resin composition and the method for manufacturing the same
WO2010053519A3 (en) Alignment for edge field nano-imprinting
WO2010009000A3 (en) Strip connectors for measurement devices
WO2007011331A3 (en) Water-soluble polymeric substrate having metallic nanoparticle coating
EP2052407A4 (en) Methods and devices for forming nanostructure monolayers and devices including such monolayers
WO2008144535A3 (en) Surface coating system and method
TW200737026A (en) Transforming metrology data from a semiconductor treatment system using multivariate analysis
SG171622A1 (en) Polishing composition containing polyether amine
TW200623322A (en) A method to form an interconnect
WO2009042073A3 (en) Polishing composition and method utilizing abrasive particles treated with an aminosilane
EP1939931A3 (en) Method and apparatus for integrating metrology with etch processing
GB2434687B (en) Thin film transistor array substrate system and method for manufacturing
TWI267158B (en) Elongated features for improved alignment process integration
WO2009102502A3 (en) Apparatus and method for batch non-contact material characterization
WO2008109504A3 (en) Processing system and method for performing high throughput non-plasma processing
WO2007106459A3 (en) Improved process for the synthesis and methanolysis of ammonia borane and borazine
SG130125A1 (en) Methods for applying a hybrid thermal barrier coating, and coating articles
EP1869520A4 (en) Antireflective coating for semiconductor devices and method for the same
WO2010080613A3 (en) Coated flow-through substrates and methods for making and using them
WO2007130366A3 (en) Surface interactions to improve retention of medical devices
EP1876634A3 (en) A semiconductor substrate processing method and apparatus
WO2007140173A3 (en) Methods of maintaining and using a high concentration of dissolved copper on the surface of a useful article

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 200980150061.3

Country of ref document: CN

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 09831521

Country of ref document: EP

Kind code of ref document: A2

NENP Non-entry into the national phase

Ref country code: DE

ENP Entry into the national phase

Ref document number: 20117015709

Country of ref document: KR

Kind code of ref document: A

122 Ep: pct application non-entry in european phase

Ref document number: 09831521

Country of ref document: EP

Kind code of ref document: A2