WO2010004166A3 - Procédé et dispositif de détection de défauts d'un assemblage électronique - Google Patents

Procédé et dispositif de détection de défauts d'un assemblage électronique Download PDF

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Publication number
WO2010004166A3
WO2010004166A3 PCT/FR2009/051203 FR2009051203W WO2010004166A3 WO 2010004166 A3 WO2010004166 A3 WO 2010004166A3 FR 2009051203 W FR2009051203 W FR 2009051203W WO 2010004166 A3 WO2010004166 A3 WO 2010004166A3
Authority
WO
WIPO (PCT)
Prior art keywords
electronic assembly
detecting defects
irradiation
electrical
electrical properties
Prior art date
Application number
PCT/FR2009/051203
Other languages
English (en)
Other versions
WO2010004166A2 (fr
Inventor
Philippe Perdu
Original Assignee
Centre National D'etudes Spatiales (C.N.E.S.)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National D'etudes Spatiales (C.N.E.S.) filed Critical Centre National D'etudes Spatiales (C.N.E.S.)
Publication of WO2010004166A2 publication Critical patent/WO2010004166A2/fr
Publication of WO2010004166A3 publication Critical patent/WO2010004166A3/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/265—Contactless testing
    • G01R31/2656—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

L'invention concerne un procédé et un dispositif de détection de défauts dans un assemblage électronique (39). On alimente au moins une partie du circuit électrique de cet assemblage électronique (39) par des signaux de stimulation électrique prédéterminés, et on irradie une face (38) de l'assemblage électronique (39) à partir d'au moins une source (46) de lumière non cohérente comprenant au moins une LED avec une densité de puissance optique comprise entre 1 μW/μm et 200 mW/μm formant une zone (50) chauffée, par irradiation, de l'assemblage électronique, dont la dimension transversale moyenne est comprise entre 10 μm et 400 μm, et on mesure et/ou on évalue les propriétés électriques de cet assemblage électronique (39) de façon à pouvoir détecter des modifications de ces propriétés électriques induites par cette irradiation.
PCT/FR2009/051203 2008-06-25 2009-06-24 Procédé et dispositif de détection de défauts d'un assemblage électronique WO2010004166A2 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR08.03566 2008-06-25
FR0803566A FR2933199B1 (fr) 2008-06-25 2008-06-25 Procede et dispositif de detection de defauts d'un assemblage electronique

Publications (2)

Publication Number Publication Date
WO2010004166A2 WO2010004166A2 (fr) 2010-01-14
WO2010004166A3 true WO2010004166A3 (fr) 2010-03-18

Family

ID=40417599

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/FR2009/051203 WO2010004166A2 (fr) 2008-06-25 2009-06-24 Procédé et dispositif de détection de défauts d'un assemblage électronique

Country Status (2)

Country Link
FR (1) FR2933199B1 (fr)
WO (1) WO2010004166A2 (fr)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4530080A (en) * 1981-04-07 1985-07-16 Tdk Electronics Co., Ltd. Optical recording/reproducing system
US5189658A (en) * 1989-06-30 1993-02-23 Moses Klaus M Device for recording information on an optical data carrier
US6078183A (en) * 1998-03-03 2000-06-20 Sandia Corporation Thermally-induced voltage alteration for integrated circuit analysis
US20020167987A1 (en) * 2000-08-25 2002-11-14 Art Advanced Research Technologies Inc. Detection of defects by thermographic analysis
WO2005026747A2 (fr) * 2003-09-16 2005-03-24 Jacob Gitman Dispositif d'analyse electrique de defaillances detectant toutes les defaillances dans les pcb/mcm

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4530080A (en) * 1981-04-07 1985-07-16 Tdk Electronics Co., Ltd. Optical recording/reproducing system
US5189658A (en) * 1989-06-30 1993-02-23 Moses Klaus M Device for recording information on an optical data carrier
US6078183A (en) * 1998-03-03 2000-06-20 Sandia Corporation Thermally-induced voltage alteration for integrated circuit analysis
US20020167987A1 (en) * 2000-08-25 2002-11-14 Art Advanced Research Technologies Inc. Detection of defects by thermographic analysis
WO2005026747A2 (fr) * 2003-09-16 2005-03-24 Jacob Gitman Dispositif d'analyse electrique de defaillances detectant toutes les defaillances dans les pcb/mcm

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
BRAHMA ET AL: "Seebeck Effect Detection on Biased Device without OBIRCH Distortion Using FET Readout", MICROELECTRONICS AND RELIABILITY, ELSEVIER SCIENCE LTD, GB, vol. 45, no. 9-11, 1 September 2005 (2005-09-01), pages 1487 - 1492, XP005091114, ISSN: 0026-2714 *
NIKAWA K ET AL: "FAILURE ANALYSIS USING THE INFRARED OPTICAL-BEAM-INDUCED RESISTANCE-CHANGE (IR-OBIRCH) METHOD", NEC RESEARCH AND DEVELOPMENT, NIPPON ELECTRIC LTD. TOKYO, JP, vol. 41, no. 4, 1 October 2000 (2000-10-01), pages 359 - 363, XP000967731, ISSN: 0547-051X *
NIKAWA K ET AL: "HIGHLY SENSITIVE OBIRCH SYSTEM FOR FAULT LOCALIZATION AND DEFECT DETECTION", IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, INFORMATION & SYSTEMS SOCIETY, TOKYO, JP, vol. E81-D, no. 7, 1 July 1998 (1998-07-01), pages 743 - 748, XP000782342, ISSN: 0916-8532 *
RIBES A C ET AL: "Reflected-light, photoluminescence and OBIC imaging of solar cells using a confocal scanning laser MACROscope/microscope", SOLAR ENERGY MATERIALS AND SOLAR CELLS, ELSEVIER SCIENCE PUBLISHERS, AMSTERDAM, NL, vol. 44, no. 4, 15 December 1996 (1996-12-15), pages 439 - 450, XP004065716, ISSN: 0927-0248 *

Also Published As

Publication number Publication date
FR2933199A1 (fr) 2010-01-01
WO2010004166A2 (fr) 2010-01-14
FR2933199B1 (fr) 2010-09-10

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