FR2933199B1 - Procede et dispositif de detection de defauts d'un assemblage electronique - Google Patents

Procede et dispositif de detection de defauts d'un assemblage electronique

Info

Publication number
FR2933199B1
FR2933199B1 FR0803566A FR0803566A FR2933199B1 FR 2933199 B1 FR2933199 B1 FR 2933199B1 FR 0803566 A FR0803566 A FR 0803566A FR 0803566 A FR0803566 A FR 0803566A FR 2933199 B1 FR2933199 B1 FR 2933199B1
Authority
FR
France
Prior art keywords
electronic assembly
detecting defects
defects
detecting
electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0803566A
Other languages
English (en)
Other versions
FR2933199A1 (fr
Inventor
Philippe Perdu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National dEtudes Spatiales CNES
Original Assignee
Centre National dEtudes Spatiales CNES
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National dEtudes Spatiales CNES filed Critical Centre National dEtudes Spatiales CNES
Priority to FR0803566A priority Critical patent/FR2933199B1/fr
Priority to PCT/FR2009/051203 priority patent/WO2010004166A2/fr
Publication of FR2933199A1 publication Critical patent/FR2933199A1/fr
Application granted granted Critical
Publication of FR2933199B1 publication Critical patent/FR2933199B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/265—Contactless testing
    • G01R31/2656—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
FR0803566A 2008-06-25 2008-06-25 Procede et dispositif de detection de defauts d'un assemblage electronique Expired - Fee Related FR2933199B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR0803566A FR2933199B1 (fr) 2008-06-25 2008-06-25 Procede et dispositif de detection de defauts d'un assemblage electronique
PCT/FR2009/051203 WO2010004166A2 (fr) 2008-06-25 2009-06-24 Procédé et dispositif de détection de défauts d'un assemblage électronique

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0803566A FR2933199B1 (fr) 2008-06-25 2008-06-25 Procede et dispositif de detection de defauts d'un assemblage electronique

Publications (2)

Publication Number Publication Date
FR2933199A1 FR2933199A1 (fr) 2010-01-01
FR2933199B1 true FR2933199B1 (fr) 2010-09-10

Family

ID=40417599

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0803566A Expired - Fee Related FR2933199B1 (fr) 2008-06-25 2008-06-25 Procede et dispositif de detection de defauts d'un assemblage electronique

Country Status (2)

Country Link
FR (1) FR2933199B1 (fr)
WO (1) WO2010004166A2 (fr)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4530080A (en) * 1981-04-07 1985-07-16 Tdk Electronics Co., Ltd. Optical recording/reproducing system
ATE117450T1 (de) * 1989-06-30 1995-02-15 Klaus M Moses Vorrichtung zum aufbringen von informationen auf einen optischen aufzeichnungsträger.
US6078183A (en) * 1998-03-03 2000-06-20 Sandia Corporation Thermally-induced voltage alteration for integrated circuit analysis
US7401976B1 (en) * 2000-08-25 2008-07-22 Art Advanced Research Technologies Inc. Detection of defects by thermographic analysis
US20070038969A1 (en) * 2003-09-16 2007-02-15 Invisible Ltd Electronic ultimate defects analyzer detecting all defects in pcb/mcm

Also Published As

Publication number Publication date
FR2933199A1 (fr) 2010-01-01
WO2010004166A2 (fr) 2010-01-14
WO2010004166A3 (fr) 2010-03-18

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