WO2009101580A2 - Procédé de surveillance de durée de vie d'une lampe à incandescence et ensemble lampe à incandescence - Google Patents

Procédé de surveillance de durée de vie d'une lampe à incandescence et ensemble lampe à incandescence Download PDF

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Publication number
WO2009101580A2
WO2009101580A2 PCT/IB2009/050547 IB2009050547W WO2009101580A2 WO 2009101580 A2 WO2009101580 A2 WO 2009101580A2 IB 2009050547 W IB2009050547 W IB 2009050547W WO 2009101580 A2 WO2009101580 A2 WO 2009101580A2
Authority
WO
WIPO (PCT)
Prior art keywords
filament
lamp
measuring
equation
lifetime
Prior art date
Application number
PCT/IB2009/050547
Other languages
English (en)
Other versions
WO2009101580A3 (fr
Inventor
Jurgen M. A. Willaert
Johannes Moeller
Jean-Sebastien Straetmans
Hans-Alo Dohmen
Original Assignee
Philips Intellectual Property & Standards Gmbh
Koninklijke Philips Electronics N. V.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Intellectual Property & Standards Gmbh, Koninklijke Philips Electronics N. V. filed Critical Philips Intellectual Property & Standards Gmbh
Publication of WO2009101580A2 publication Critical patent/WO2009101580A2/fr
Publication of WO2009101580A3 publication Critical patent/WO2009101580A3/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/44—Testing lamps
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B47/00—Circuit arrangements for operating light sources in general, i.e. where the type of light source is not relevant
    • H05B47/20—Responsive to malfunctions or to light source life; for protection

Definitions

  • the invention relates to the field of filament lamps, by which light may be generated by applying an electrical current to a metal filament. Particularly the invention relates to a method for monitoring the lifetime of a filament lamp as well as a corresponding filament lamp assembly.
  • a filament lamp material may evaporate from the filament during operation. Due to the evaporation and sublimation of the evaporated material bridges resulting from shortcuts between adjacent coils may occur. This leads to a change of the resistance of the filament.
  • I(t) and U(t) are a current I and a voltage U measured at a time t, wherein I(t+1) and U(t+1) are a current I and a voltage U measured at a time t+1, which is later than the time t.
  • the constant k may be in most applications in the range of 1.0 ⁇ 0.1.
  • the relation of U and I according to the invention is not linear. Furthermore the monitoring is mainly independent from an applied electrical Power P rendering the method applicable for filament lamps whose light can be dimmed due to a changing electrical power. Particularly a change to the resistance of the filament for instance due to a melting and fusing of the filament do not lead to a wrongly indicated end of the lifetime.
  • the constant k is mainly a conversation coefficient and can be derived like the constant X by experiments. Measuring I over U at different electric powers P over the lifetime leads for a specific type of lamp to a plot from which k and X can be derived.
  • the error tolerance ⁇ is chosen such that a significant change of the dependency according to the equation can be detected but measuring errors for determining U and I are neglected.
  • the measuring steps and the checking step are repeated as long as the equation is met.
  • This is particularly realized by an electronic circuit so that an automatic and/or constant detecting loop can be provided.
  • An external trigger for starting the monitoring method according to the invention is not necessary.
  • it is possible to store various measurement values into a storing unit so that the development of the measured values over the lifetime of the lamp or over at least a part of the lifetime can be monitored. Suddenly occurring changes of the measured values can be detected for instance in order to adapted the interval width for performing a measuring and checking loop to shorter interval width and vice versa.
  • the measuring steps and the checking step are repeated a predetermined number of times for verifying that the equation is not met.
  • the number of additional measuring and checking steps are particularly chosen with respect to the interval width for performing an additional measuring and checking loop. Due to the additional measuring and checking loop single outliers can be neglected. Such outliers may occur when the lamp is switched on or off or when a melted filament is fused at once.
  • X is chosen with respect to the material of the filament and/or the design of the filament and/or the composition of an atmosphere to which the filament is exposed.
  • X may be a function of the filament material, the specific filament design and/or the atmosphere inside a bulb, where the filament is located. Since this parameters are constant for a specific kind of filament lamp the internal calculations are not complicated, but the same circuit can be used for different type of lamps by just adapting the parameters for X to the different type of lamps. The dependency of X can be derived by experiments.
  • an optical and/or acoustic signal is actuated during the indicating step. Due to the signal the need for changing the filament lamp can be communicated in good time. Most preferred the signal is chosen with respect to the amount of meeting and/or not-meeting the equation. The signal may qualify the need for replacing the lamp. For instance several diodes may be provided for displaying a value between 0% and 100% chance of operability.
  • I(t) and U(t) are a current I and a voltage U measured at a time t, wherein I(t+1) and U(t+1) are a current I and a voltage U measured at a time t+1, which is later than the time t.
  • the constant k may be in most applications in the range of 1.0 ⁇ 0.1.
  • the filament lamp assembly is particularly adapted for carrying out the above mentioned monitoring method. As indicated above not monitoring a predetermined threshold of U or I but monitoring the meeting of a predetermined relation of U to I leads to an increased correctness for detecting the end of the lifetime.
  • I and/or U are measured close to the filament. Due to this arrangement internal additional circuits can not interfere with the measured values.
  • the filament is designed as coil comprising mainly tungsten, wherein the filament is particularly arranged inside a bulb comprising a defined atmosphere. Due to the knowledge about the filament and the bulb atmosphere the parameter X can be accurately determined.
  • the invention further relates to a computer program product comprising a software for carrying out the above mentioned method.
  • the computer program product is preferably adapted to operate the above mentioned filament lamp assembly particularly by using the algorithm of the above mentioned method.
  • one filament lamp or particularly a plurality of filament lamps can be monitored at the same time.
  • FIG. 1 is a schematic flow chart of the monitoring method according to the invention.
  • the monitoring method 10 comprises a first measuring step 11 for measuring a lamp voltage U and a lamp current I of a filament of a filament lamp at at least two different times t and t+1.
  • a first part step 12 of the first measuring step 11 the lamp voltage U(t) and the lamp current I(t) are measured at a time t.
  • the lamp voltage U(t+1) and the lamp current I(t+1) are measured at a time t+1 in a second part step 13 of the first measuring step 11.
  • the values at the time t U(t) and I(t) may be stored values measured at a time t+1 at a preceding measuring step 11, so that it is sufficient to perform only the second part step 13 of the first measuring step 11, when stored values are already present.
  • the equitation can be solved for U(t+1) or I(t+1) and compared with the measured value of U(t+1) or I(t+1), respectively.
  • the loop 17 comprises an incrementing step 18 by which a new time cycle is started. Due to the incrementing step 18 stored values allocated to the time t+1 become allocated to the time t and so on.
  • the branch 16 leads via a further incrementing step 19 to a further measuring step 20 and a subsequent further checking step 21 to verify whether the detected discrepancy of the equation is valid. Due to the further checking step 21 the prior detected mismatch may be confirmed.
  • the further measuring step 20 and the further checking step 21 could be the same subroutine as the measuring step 11 and the checking step 14, respectively.
  • the further measuring step 20 may comprise a first part step 22 for measuring the lamp voltage U(t) and the lamp current I(t) at a time t and a second part step 23 for measuring at a later time t+1 the lamp voltage U(t+1) and the lamp current I(t+1).
  • the further measuring step 20 and the further checking step 21 could be performed a predetermined number of times. If it is detected that the discrepancy is not valid a further branch 24 leads via the incrementing step 18 back to the beginning of the monitoring method 10 so that a further loop 26 is generated.
  • the further branch 24 leads to an indicating step 28 by which a signal is set indicating that the lifetime of the filament lamp is soon over.
  • a last loop 30 may lead via the incrementing step 18 to the beginning of the monitoring method 10 for instance to monitor the amount of the measured discrepancy and/or to calculate an estimated residual lifetime.
  • a computer program may be stored/distributed on a suitable medium, such as an optical storage medium or a solid-state medium supplied together with or as part of other hardware, but may also be distributed in other forms, such as via the Internet or other wired or wireless telecommunication systems.
  • a suitable medium such as an optical storage medium or a solid-state medium supplied together with or as part of other hardware, but may also be distributed in other forms, such as via the Internet or other wired or wireless telecommunication systems.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Circuit Arrangement For Electric Light Sources In General (AREA)
  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)

Abstract

L'invention porte sur un procédé (10) pour surveiller une durée de vie d'une lampe à incandescence consistant à : mesurer (11, 12), à un instant t, un courant de lampe I(t) et une tension U(t), à mesurer (11, 13), à un instant t+1, un courant de lampe I(t+1) et une tension de lampe U(t+1), à vérifier (14) si une équation (I(t+1)/I(t)) = k • (U(t+1)/U(t))x ± ε est satisfaite ou non, équation dans laquelle k et X sont des constantes et ε une tolérance d'erreur admissible, et à indiquer (28) une fin de la durée de vie de la lampe si l'équation n'est pas satisfaite. Ne pas surveiller un seuil prédéterminé de U ou I mais surveiller la vérification d'une relation non linéaire prédéterminée de U à I se traduit par une meilleure précision pour détecter la fin de la durée de vie de la lampe à incandescence.
PCT/IB2009/050547 2008-02-12 2009-02-10 Procédé de surveillance de durée de vie d'une lampe à incandescence et ensemble lampe à incandescence WO2009101580A2 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP08101494.6 2008-02-12
EP08101494 2008-02-12

Publications (2)

Publication Number Publication Date
WO2009101580A2 true WO2009101580A2 (fr) 2009-08-20
WO2009101580A3 WO2009101580A3 (fr) 2010-03-11

Family

ID=40957333

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IB2009/050547 WO2009101580A2 (fr) 2008-02-12 2009-02-10 Procédé de surveillance de durée de vie d'une lampe à incandescence et ensemble lampe à incandescence

Country Status (1)

Country Link
WO (1) WO2009101580A2 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101788652B (zh) * 2010-02-02 2011-12-28 中国计量学院 一种电子节能灯使用寿命的快速检测方法
CN103116139A (zh) * 2013-01-23 2013-05-22 重庆恒又源科技发展有限公司 路灯故障检测方法、检测装置及其检测系统
CN103837763A (zh) * 2012-11-27 2014-06-04 深圳市海洋王照明工程有限公司 灯具使用寿命测试电路和方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007122546A2 (fr) * 2006-04-21 2007-11-01 Koninklijke Philips Electronics N.V. Procede et dispositif pour la surveillance de l'etat d'ampoules a halogene dans des phares de vehicule

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007122546A2 (fr) * 2006-04-21 2007-11-01 Koninklijke Philips Electronics N.V. Procede et dispositif pour la surveillance de l'etat d'ampoules a halogene dans des phares de vehicule

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101788652B (zh) * 2010-02-02 2011-12-28 中国计量学院 一种电子节能灯使用寿命的快速检测方法
CN103837763A (zh) * 2012-11-27 2014-06-04 深圳市海洋王照明工程有限公司 灯具使用寿命测试电路和方法
CN103116139A (zh) * 2013-01-23 2013-05-22 重庆恒又源科技发展有限公司 路灯故障检测方法、检测装置及其检测系统

Also Published As

Publication number Publication date
WO2009101580A3 (fr) 2010-03-11

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