WO2009092911A3 - Procede et capteur de mesure de deformations compensees en temperature - Google Patents

Procede et capteur de mesure de deformations compensees en temperature Download PDF

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Publication number
WO2009092911A3
WO2009092911A3 PCT/FR2008/001557 FR2008001557W WO2009092911A3 WO 2009092911 A3 WO2009092911 A3 WO 2009092911A3 FR 2008001557 W FR2008001557 W FR 2008001557W WO 2009092911 A3 WO2009092911 A3 WO 2009092911A3
Authority
WO
WIPO (PCT)
Prior art keywords
strains
longitudinal
transverse
pattern
compensated
Prior art date
Application number
PCT/FR2008/001557
Other languages
English (en)
Other versions
WO2009092911A2 (fr
Inventor
Christophe Duret
Etienne Vandamme
Original Assignee
Snr Roulements
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Snr Roulements filed Critical Snr Roulements
Priority to EP08871454A priority Critical patent/EP2212667A2/fr
Publication of WO2009092911A2 publication Critical patent/WO2009092911A2/fr
Publication of WO2009092911A3 publication Critical patent/WO2009092911A3/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
    • G01L5/16—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring several components of force
    • G01L5/161—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring several components of force using variations in ohmic resistance
    • G01L5/162—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring several components of force using variations in ohmic resistance of piezoresistors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2268—Arrangements for correcting or for compensating unwanted effects
    • G01L1/2281—Arrangements for correcting or for compensating unwanted effects for temperature variations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2287—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges constructional details of the strain gauges
    • G01L1/2293—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges constructional details of the strain gauges of the semi-conductor type
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L3/00—Measuring torque, work, mechanical power, or mechanical efficiency, in general
    • G01L3/02—Rotary-transmission dynamometers
    • G01L3/04—Rotary-transmission dynamometers wherein the torque-transmitting element comprises a torsionally-flexible shaft
    • G01L3/10—Rotary-transmission dynamometers wherein the torque-transmitting element comprises a torsionally-flexible shaft involving electric or magnetic means for indicating
    • G01L3/108—Rotary-transmission dynamometers wherein the torque-transmitting element comprises a torsionally-flexible shaft involving electric or magnetic means for indicating involving resistance strain gauges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
    • G01L5/0009—Force sensors associated with a bearing
    • G01L5/0019—Force sensors associated with a bearing by using strain gages, piezoelectric, piezo-resistive or other ohmic-resistance based sensors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Abstract

L'invention concerne un procédé de mesure des déformations longitudinales compensées en température d'une zone d'un élément structurel, ledit procédé prévoyant de reporter sur ladite zone le substrat (1) d'une jauge de contrainte sur lequel sont formés un motif (2) de matériau résistif électriquement et deux paires de bornes (3) en contact électrique avec ledit motif, ledit motif formant un milieu résistif continu selon des directions respectivement longitudinale et transversale et lesdites bornes étant formées de part et d'autre du motif (2) selon la direction respectivement longitudinale pour une paire et transversale pour l'autre paire; de mesurer de façon alternée la tension électrique (Vx, Vy) entre les paires de bornes (3); d'établir une relation entre lesdites tensions en fonction des déformations longitudinales et transversales, ladite relation étant indépendante de la température; d'établir les déformations transversales qui correspondent aux tensions électriques mesurées selon la direction transversale; à partir de la relation et des déformations transversales, de calculer les déformations longitudinales compensées en température en fonction des mesures de tension électrique selon les directions longitudinale et transversale.
PCT/FR2008/001557 2007-11-16 2008-11-05 Procede et capteur de mesure de deformations compensees en temperature WO2009092911A2 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP08871454A EP2212667A2 (fr) 2007-11-16 2008-11-05 Procede et capteur de mesure de deformations compensees en temperature

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0708081 2007-11-16
FR0708081A FR2923908B1 (fr) 2007-11-16 2007-11-16 Procede et capteur de mesure de deformations compensees en temperature

Publications (2)

Publication Number Publication Date
WO2009092911A2 WO2009092911A2 (fr) 2009-07-30
WO2009092911A3 true WO2009092911A3 (fr) 2009-10-22

Family

ID=39591679

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/FR2008/001557 WO2009092911A2 (fr) 2007-11-16 2008-11-05 Procede et capteur de mesure de deformations compensees en temperature

Country Status (3)

Country Link
EP (1) EP2212667A2 (fr)
FR (1) FR2923908B1 (fr)
WO (1) WO2009092911A2 (fr)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1202032A1 (fr) * 2000-10-27 2002-05-02 Yazaki Corporation Structure de fixation pour un élément de mesure
WO2002048669A1 (fr) * 2000-12-16 2002-06-20 Senstronics Limited Pont a jauge de contraintes a film mince a compensation de temperature relativement a l'intervalle de mesure et a la derive du zero par resistance en serie
EP1406271A1 (fr) * 2001-02-16 2004-04-07 K-Tech Devices Corp. Element de resistance, capteur de contrainte et procede de fabrication correspondant
US20060179958A1 (en) * 2005-02-14 2006-08-17 Hiroyuki Ohta Rotating body dynamic quantity measuring device and system

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7278319B2 (en) * 2005-11-10 2007-10-09 Honeywell International Inc. Pressure and temperature sensing element

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1202032A1 (fr) * 2000-10-27 2002-05-02 Yazaki Corporation Structure de fixation pour un élément de mesure
WO2002048669A1 (fr) * 2000-12-16 2002-06-20 Senstronics Limited Pont a jauge de contraintes a film mince a compensation de temperature relativement a l'intervalle de mesure et a la derive du zero par resistance en serie
EP1406271A1 (fr) * 2001-02-16 2004-04-07 K-Tech Devices Corp. Element de resistance, capteur de contrainte et procede de fabrication correspondant
US20060179958A1 (en) * 2005-02-14 2006-08-17 Hiroyuki Ohta Rotating body dynamic quantity measuring device and system

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2212667A2 *

Also Published As

Publication number Publication date
WO2009092911A2 (fr) 2009-07-30
EP2212667A2 (fr) 2010-08-04
FR2923908B1 (fr) 2010-01-08
FR2923908A1 (fr) 2009-05-22

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