WO2009078085A1 - コネクタ保持装置、それを備えたインタフェース装置及び電子部品試験装置 - Google Patents

コネクタ保持装置、それを備えたインタフェース装置及び電子部品試験装置 Download PDF

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Publication number
WO2009078085A1
WO2009078085A1 PCT/JP2007/074155 JP2007074155W WO2009078085A1 WO 2009078085 A1 WO2009078085 A1 WO 2009078085A1 JP 2007074155 W JP2007074155 W JP 2007074155W WO 2009078085 A1 WO2009078085 A1 WO 2009078085A1
Authority
WO
WIPO (PCT)
Prior art keywords
electronic component
same
connector holding
component testing
connector
Prior art date
Application number
PCT/JP2007/074155
Other languages
English (en)
French (fr)
Inventor
Shin Sakiyama
Masanori Kaneko
Tomoyuki Takamoto
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to PCT/JP2007/074155 priority Critical patent/WO2009078085A1/ja
Priority to JP2009546099A priority patent/JP5066193B2/ja
Publication of WO2009078085A1 publication Critical patent/WO2009078085A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

　コネクタ保持装置は、互いに嵌合可能な一対のコネクタ(２５,２７)と、一対のコネクタ(２５,２７)のうちの一方のコネクタ(２７)を保持する保持部材(２１)と、保持部材(２１)と一方のコネクタ(２７)との間に介在し、一方のコネクタ(２７)を、押圧方向とは反対の方向に向かって付勢する付勢手段(２９)と、を備えている。
PCT/JP2007/074155 2007-12-14 2007-12-14 コネクタ保持装置、それを備えたインタフェース装置及び電子部品試験装置 WO2009078085A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
PCT/JP2007/074155 WO2009078085A1 (ja) 2007-12-14 2007-12-14 コネクタ保持装置、それを備えたインタフェース装置及び電子部品試験装置
JP2009546099A JP5066193B2 (ja) 2007-12-14 2007-12-14 コネクタ保持装置、それを備えたインタフェース装置及び電子部品試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/074155 WO2009078085A1 (ja) 2007-12-14 2007-12-14 コネクタ保持装置、それを備えたインタフェース装置及び電子部品試験装置

Publications (1)

Publication Number Publication Date
WO2009078085A1 true WO2009078085A1 (ja) 2009-06-25

Family

ID=40795211

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/074155 WO2009078085A1 (ja) 2007-12-14 2007-12-14 コネクタ保持装置、それを備えたインタフェース装置及び電子部品試験装置

Country Status (2)

Country Link
JP (1) JP5066193B2 (ja)
WO (1) WO2009078085A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113030599A (zh) * 2019-12-24 2021-06-25 株式会社爱德万测试 电子部件操作装置、电子部件测试装置以及插座

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102019007618A1 (de) * 2019-10-31 2021-05-06 Yamaichi Electronics Deutschland Gmbh Verbindungssystem, Verfahren und Verwendung eines Verbindungssystems

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01235344A (ja) * 1988-03-16 1989-09-20 Hitachi Ltd 半導体検査装置及び半導体ウェハの検査方法
JP2007003433A (ja) * 2005-06-27 2007-01-11 Micronics Japan Co Ltd 試験装置用テストヘッド
JP2007116085A (ja) * 2006-04-25 2007-05-10 Advantest Corp 電子部品試験装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01235344A (ja) * 1988-03-16 1989-09-20 Hitachi Ltd 半導体検査装置及び半導体ウェハの検査方法
JP2007003433A (ja) * 2005-06-27 2007-01-11 Micronics Japan Co Ltd 試験装置用テストヘッド
JP2007116085A (ja) * 2006-04-25 2007-05-10 Advantest Corp 電子部品試験装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113030599A (zh) * 2019-12-24 2021-06-25 株式会社爱德万测试 电子部件操作装置、电子部件测试装置以及插座

Also Published As

Publication number Publication date
JP5066193B2 (ja) 2012-11-07
JPWO2009078085A1 (ja) 2011-04-28

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