WO2009066911A3 - Gan-based light emitting diode having omnidirectional reflector with 3-dimensional structure and method for fabricating the same - Google Patents
Gan-based light emitting diode having omnidirectional reflector with 3-dimensional structure and method for fabricating the same Download PDFInfo
- Publication number
- WO2009066911A3 WO2009066911A3 PCT/KR2008/006760 KR2008006760W WO2009066911A3 WO 2009066911 A3 WO2009066911 A3 WO 2009066911A3 KR 2008006760 W KR2008006760 W KR 2008006760W WO 2009066911 A3 WO2009066911 A3 WO 2009066911A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- gan
- reflector
- emitting diode
- omnidirectional reflector
- same
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 3
- 239000000758 substrate Substances 0.000 abstract 3
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 abstract 2
- 229910002601 GaN Inorganic materials 0.000 abstract 1
- 238000005530 etching Methods 0.000 abstract 1
- 238000000605 extraction Methods 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 abstract 1
- 238000000059 patterning Methods 0.000 abstract 1
- 239000002096 quantum dot Substances 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/10—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a light reflecting structure, e.g. semiconductor Bragg reflector
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02373—Group 14 semiconducting materials
- H01L21/02381—Silicon, silicon germanium, germanium
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/0242—Crystalline insulating materials
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02538—Group 13/15 materials
- H01L21/0254—Nitrides
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02587—Structure
- H01L21/0259—Microstructure
- H01L21/02601—Nanoparticles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
- H01L21/02658—Pretreatments
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/04—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02439—Materials
- H01L21/02455—Group 13/15 materials
- H01L21/02458—Nitrides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
- H01L33/30—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table
- H01L33/32—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table containing nitrogen
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Nanotechnology (AREA)
- Materials Engineering (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Led Devices (AREA)
Abstract
Provided are a gallium nitride (GaN)-based light-emitting diode (LED) having an omnidi¬ rectional reflector with a 3-dimensional (3D) structure and a method of manufacturing the same, capable of increasing light extraction efficiency of the LED by forming an omnidirectional reflector without requiring a patterning process such as etching or a regrowth process. The GaN- based LED having an omnidirectional reflector with a 3D structure includes a substrate; an om¬ nidirectional reflector which is formed on the substrate and has a 3D structure including quantum dots; and a GaN-based semiconductor layer formed on the substrate including the omnidirectional reflector.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2007-0119353 | 2007-11-21 | ||
KR20070119353A KR100990226B1 (en) | 2007-11-21 | 2007-11-21 | GaN-based Light Emitting Diode having omnidirectional reflector with 3-dimensional structure and method for fabricating the same |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2009066911A2 WO2009066911A2 (en) | 2009-05-28 |
WO2009066911A3 true WO2009066911A3 (en) | 2009-08-13 |
Family
ID=40667973
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/KR2008/006760 WO2009066911A2 (en) | 2007-11-21 | 2008-11-17 | Gan-based light emitting diode having omnidirectional reflector with 3-dimensional structure and method for fabricating the same |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR100990226B1 (en) |
WO (1) | WO2009066911A2 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101046086B1 (en) * | 2008-12-03 | 2011-07-01 | 삼성엘이디 주식회사 | Semiconductor light emitting device and manufacturing method thereof |
TWI408746B (en) * | 2011-01-19 | 2013-09-11 | Lextar Electronics Corp | Method of fabricating patterned substrate |
JP6158248B2 (en) | 2014-05-27 | 2017-07-05 | ザ・ボード・オブ・トラスティーズ・オブ・ザ・ユニバーシティ・オブ・イリノイThe Board Of Trustees Of The University Of Illinois | Nanostructured material methods and devices |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005183905A (en) * | 2003-12-20 | 2005-07-07 | Samsung Electro Mech Co Ltd | Method of manufacturing nitride semiconductor and nitride semiconductor utilizing the same |
US6943366B2 (en) * | 2003-03-31 | 2005-09-13 | Ngk Insulators, Ltd. | Substrate for semiconductor light-emitting element, semiconductor light-emitting element and semiconductor light-emitting element fabrication method |
KR20060040923A (en) * | 2004-11-08 | 2006-05-11 | 엘지전자 주식회사 | Light emitting diode of high efficiency for light extraction and method for fabricating the same |
US7294865B2 (en) * | 2004-12-17 | 2007-11-13 | Genesis Photonics Inc. | Light emitting device and the use thereof |
-
2007
- 2007-11-21 KR KR20070119353A patent/KR100990226B1/en not_active IP Right Cessation
-
2008
- 2008-11-17 WO PCT/KR2008/006760 patent/WO2009066911A2/en active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6943366B2 (en) * | 2003-03-31 | 2005-09-13 | Ngk Insulators, Ltd. | Substrate for semiconductor light-emitting element, semiconductor light-emitting element and semiconductor light-emitting element fabrication method |
JP2005183905A (en) * | 2003-12-20 | 2005-07-07 | Samsung Electro Mech Co Ltd | Method of manufacturing nitride semiconductor and nitride semiconductor utilizing the same |
KR20060040923A (en) * | 2004-11-08 | 2006-05-11 | 엘지전자 주식회사 | Light emitting diode of high efficiency for light extraction and method for fabricating the same |
US7294865B2 (en) * | 2004-12-17 | 2007-11-13 | Genesis Photonics Inc. | Light emitting device and the use thereof |
Also Published As
Publication number | Publication date |
---|---|
KR100990226B1 (en) | 2010-10-29 |
WO2009066911A2 (en) | 2009-05-28 |
KR20090052721A (en) | 2009-05-26 |
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