WO2009034787A1 - Thin film thermophysical property measuring method and thin film thermophysical property measuring apparatus - Google Patents
Thin film thermophysical property measuring method and thin film thermophysical property measuring apparatus Download PDFInfo
- Publication number
- WO2009034787A1 WO2009034787A1 PCT/JP2008/063630 JP2008063630W WO2009034787A1 WO 2009034787 A1 WO2009034787 A1 WO 2009034787A1 JP 2008063630 W JP2008063630 W JP 2008063630W WO 2009034787 A1 WO2009034787 A1 WO 2009034787A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- thin film
- temperature
- property measuring
- intensity
- thermophysical property
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/18—Investigating or analyzing materials by the use of thermal means by investigating thermal conductivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
- G01K11/12—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in colour, translucency or reflectance
- G01K11/125—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in colour, translucency or reflectance using changes in reflectance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K3/00—Thermometers giving results other than momentary value of temperature
- G01K3/08—Thermometers giving results other than momentary value of temperature giving differences of values; giving differentiated values
- G01K3/10—Thermometers giving results other than momentary value of temperature giving differences of values; giving differentiated values in respect of time, e.g. reacting only to a quick change of temperature
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
To provide a surface heating and surface temperature measuring thin film thermal diffusion factor measuring apparatus incorporating an analysis model wherein film thickness is taken into account and to quantitatively and simply measure a thin film formed on a discretionary substrate. The surface of a thin film (2) on a substrate (1) is instantaneously heated by using heating pulse light (3) to instantaneously increase the surface temperature. The heat diffuses into the thin film (2) and permeates inside the substrate (1), and the surface temperature of the thin film (2) is reduced. Temperature measuring pulse light (4) (P2) is applied to the same region where the heating pulse light (3) (P1) is applied (4a), and the intensity of its reflecting light (4b) slightly changes depending on the surface temperature. The temperature change of the surface of the thin film (2) can be detected by detecting such intensity change depending on the temperature by a detector (5). The detector (5) is provided with a light intensity sensor (5a) for measuring intensity of the reflecting light (4b), and an information processor (5b). The information processor (5b) incorporates a calculating section for calculating the thermal diffusion factor of the thin film, based on the analysis model wherein thin film thickness is taken into account.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007235679A JP2009068909A (en) | 2007-09-11 | 2007-09-11 | Method for measuring thin-film thermophysical property, and device for measuring the thin-film thermophysical property |
JP2007-235679 | 2007-09-11 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2009034787A1 true WO2009034787A1 (en) | 2009-03-19 |
Family
ID=40451799
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/063630 WO2009034787A1 (en) | 2007-09-11 | 2008-07-30 | Thin film thermophysical property measuring method and thin film thermophysical property measuring apparatus |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP2009068909A (en) |
WO (1) | WO2009034787A1 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107941850A (en) * | 2017-11-21 | 2018-04-20 | 宁波英飞迈材料科技有限公司 | A kind of apparatus and method of quick measurement thin-film material thermal capacitance |
CN109557129A (en) * | 2018-10-29 | 2019-04-02 | 同济大学 | A kind of measurement method of film thermal diffusion coefficient |
CN114384118A (en) * | 2022-01-28 | 2022-04-22 | 同济大学 | Method and device for measuring thermal diffusion coefficient of film with substrate medium |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2019092898A1 (en) | 2017-11-07 | 2019-05-16 | 株式会社ピコサーム | Physical property value measurement device, physical property value measurement method, and program |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4710030A (en) * | 1985-05-17 | 1987-12-01 | Bw Brown University Research Foundation | Optical generator and detector of stress pulses |
JPH11511240A (en) * | 1995-08-25 | 1999-09-28 | ブラウン ユニバーシティー リサーチ ファウンデーション | Optical techniques for measuring properties of changed materials. |
JP2001083113A (en) * | 1999-09-14 | 2001-03-30 | Agency Of Ind Science & Technol | Method for measuring thermal diffusivity by thermo- reflectance method |
-
2007
- 2007-09-11 JP JP2007235679A patent/JP2009068909A/en active Pending
-
2008
- 2008-07-30 WO PCT/JP2008/063630 patent/WO2009034787A1/en active Application Filing
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4710030A (en) * | 1985-05-17 | 1987-12-01 | Bw Brown University Research Foundation | Optical generator and detector of stress pulses |
JPH11511240A (en) * | 1995-08-25 | 1999-09-28 | ブラウン ユニバーシティー リサーチ ファウンデーション | Optical techniques for measuring properties of changed materials. |
JP2001083113A (en) * | 1999-09-14 | 2001-03-30 | Agency Of Ind Science & Technol | Method for measuring thermal diffusivity by thermo- reflectance method |
Non-Patent Citations (1)
Title |
---|
NAOYUKI TAKETOSHI ET AL.: "Electrical delay technique in the picosecond thermoreflectance method for thermophysical property measurements of thin films", REVIEW OF SCIENTIFIC INSTRUMENTS, vol. 76, 7 September 2005 (2005-09-07), pages P094903-1 - P094903-8 * |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107941850A (en) * | 2017-11-21 | 2018-04-20 | 宁波英飞迈材料科技有限公司 | A kind of apparatus and method of quick measurement thin-film material thermal capacitance |
CN107941850B (en) * | 2017-11-21 | 2020-08-04 | 宁波英飞迈材料科技有限公司 | Device and method for rapidly measuring heat capacity of thin film material |
CN109557129A (en) * | 2018-10-29 | 2019-04-02 | 同济大学 | A kind of measurement method of film thermal diffusion coefficient |
CN114384118A (en) * | 2022-01-28 | 2022-04-22 | 同济大学 | Method and device for measuring thermal diffusion coefficient of film with substrate medium |
CN114384118B (en) * | 2022-01-28 | 2023-08-29 | 同济大学 | Thermal diffusion coefficient measuring method and device for dielectric film with substrate |
Also Published As
Publication number | Publication date |
---|---|
JP2009068909A (en) | 2009-04-02 |
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