WO2009031179A1 - Mass spectrometer - Google Patents

Mass spectrometer Download PDF

Info

Publication number
WO2009031179A1
WO2009031179A1 PCT/JP2007/000952 JP2007000952W WO2009031179A1 WO 2009031179 A1 WO2009031179 A1 WO 2009031179A1 JP 2007000952 W JP2007000952 W JP 2007000952W WO 2009031179 A1 WO2009031179 A1 WO 2009031179A1
Authority
WO
WIPO (PCT)
Prior art keywords
aperture
ions
chamber
opening
closing mechanism
Prior art date
Application number
PCT/JP2007/000952
Other languages
French (fr)
Japanese (ja)
Inventor
Kiyoshi Ogawa
Hideaki Izumi
Osamu Furuhashi
Original Assignee
Shimadzu Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corporation filed Critical Shimadzu Corporation
Priority to PCT/JP2007/000952 priority Critical patent/WO2009031179A1/en
Priority to JP2009531022A priority patent/JPWO2009031179A1/en
Publication of WO2009031179A1 publication Critical patent/WO2009031179A1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

An opening/closing mechanism (13) for opening/closing an aperture (12) for passage of ions provided in a partition (11) between a first intermediate vacuum chamber (9) and a second intermediate vacuum chamber (14) constituting a differential evacuating system is provided. The opening/closing mechanism (13) is operated in synchronization with the timing of irradiation with pulsed laser beam for ionization by atmospheric pressure MALDI. The aperture (12) is opened during a period required for ions generated from a sample (3) to arrive near the aperture (12) to pass the ions therethrough. The aperture (12) is closed during the other period to cut off the gas stream from the first intermediate chamber (9) to the second intermediate chamber (14). Consequently, the passage efficiency of ions can be improved by increasing the area of the aperture (12) without degrading the vacuum in an analysis chamber (17).
PCT/JP2007/000952 2007-09-04 2007-09-04 Mass spectrometer WO2009031179A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
PCT/JP2007/000952 WO2009031179A1 (en) 2007-09-04 2007-09-04 Mass spectrometer
JP2009531022A JPWO2009031179A1 (en) 2007-09-04 2007-09-04 Mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/000952 WO2009031179A1 (en) 2007-09-04 2007-09-04 Mass spectrometer

Publications (1)

Publication Number Publication Date
WO2009031179A1 true WO2009031179A1 (en) 2009-03-12

Family

ID=40428503

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/000952 WO2009031179A1 (en) 2007-09-04 2007-09-04 Mass spectrometer

Country Status (2)

Country Link
JP (1) JPWO2009031179A1 (en)
WO (1) WO2009031179A1 (en)

Cited By (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010124019A1 (en) 2009-04-21 2010-10-28 Excellims Corporation Intelligently controlled spectrometer methods and apparatus
JP2011512639A (en) * 2008-02-20 2011-04-21 バリアン・インコーポレイテッド Shutter and gate valve assembly for vacuum systems
JP2011159422A (en) * 2010-01-29 2011-08-18 Shimadzu Corp Mass spectroscope
JP2011228072A (en) * 2010-04-19 2011-11-10 Hitachi High-Technologies Corp Analyzer, ionizer and analysing method
JP2011228071A (en) * 2010-04-19 2011-11-10 Hitachi High-Technologies Corp Mass spectroscope
CN102468111A (en) * 2010-11-08 2012-05-23 株式会社日立高新技术 Mass spectrometer
GB2491484A (en) * 2011-06-03 2012-12-05 Micromass Ltd Varying the gas flow rate between two differently pumped chambers in a mass spectrometer
JP2013008606A (en) * 2011-06-27 2013-01-10 Hitachi High-Technologies Corp Mass spectrometer and mass analyzing method
GB2504416A (en) * 2013-10-24 2014-01-29 Micromass Ltd Damping the movement of a solenoid actuated component within a mass spectrometer by the induction of eddy currents
KR101549119B1 (en) * 2013-10-30 2015-09-02 한국과학기술원 APPARATUS AND THE METHOD FOR ANALYZING ION CHARACTERISTICS HAVING ExB FILTER AND RETARDING POTENTIAL ANALYZER
WO2017010163A1 (en) * 2015-07-13 2017-01-19 株式会社島津製作所 Shutter
JP2017503171A (en) * 2013-12-31 2017-01-26 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド Injection injector inlet for differential mobility spectrometer
WO2017104053A1 (en) * 2015-12-17 2017-06-22 株式会社島津製作所 Ion analyzing apparatus
US10392539B2 (en) 2014-12-31 2019-08-27 Dow Global Technologies Llc Crash durable epoxy adhesive compositions having improved low-temperature impact resistance and wash off resistance
WO2020230297A1 (en) * 2019-05-15 2020-11-19 株式会社島津製作所 Ion analyzer
CN112798677A (en) * 2020-12-31 2021-05-14 杭州谱育科技发展有限公司 Multi-mode mass spectrometry system and method
DE112011103599B4 (en) 2010-10-29 2021-08-05 Kabushiki Kaisha Toshiba Laser ion source
WO2022258966A1 (en) * 2021-06-08 2022-12-15 Micromass Uk Limited Vacuum system for a mass spectrometer

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61255649A (en) * 1985-05-07 1986-11-13 オリンパス光学工業株式会社 High frequency inciser
JPH07111143A (en) * 1993-08-18 1995-04-25 Jeol Ltd Slit device
JPH08124518A (en) * 1994-10-24 1996-05-17 Shimadzu Corp Ion mass spectorscope
JPH09210965A (en) * 1996-01-31 1997-08-15 Shimadzu Corp Liquid chromatograph mass-spectroscopic device
JP2001307675A (en) * 2000-04-19 2001-11-02 Hitachi Ltd Mass spectroscope

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61255649A (en) * 1985-05-07 1986-11-13 オリンパス光学工業株式会社 High frequency inciser
JPH07111143A (en) * 1993-08-18 1995-04-25 Jeol Ltd Slit device
JPH08124518A (en) * 1994-10-24 1996-05-17 Shimadzu Corp Ion mass spectorscope
JPH09210965A (en) * 1996-01-31 1997-08-15 Shimadzu Corp Liquid chromatograph mass-spectroscopic device
JP2001307675A (en) * 2000-04-19 2001-11-02 Hitachi Ltd Mass spectroscope

Cited By (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011512639A (en) * 2008-02-20 2011-04-21 バリアン・インコーポレイテッド Shutter and gate valve assembly for vacuum systems
EP2422354B1 (en) * 2009-04-21 2020-12-16 Excellims Corporation Intelligently controlled spectrometer methods and apparatus
EP2422354A4 (en) * 2009-04-21 2015-10-21 Excellims Corp Intelligently controlled spectrometer methods and apparatus
WO2010124019A1 (en) 2009-04-21 2010-10-28 Excellims Corporation Intelligently controlled spectrometer methods and apparatus
JP2011159422A (en) * 2010-01-29 2011-08-18 Shimadzu Corp Mass spectroscope
JP2011228072A (en) * 2010-04-19 2011-11-10 Hitachi High-Technologies Corp Analyzer, ionizer and analysing method
EP2378539A3 (en) * 2010-04-19 2012-10-24 Hitachi High-Technologies Corporation Mass spectrometer
JP2011228071A (en) * 2010-04-19 2011-11-10 Hitachi High-Technologies Corp Mass spectroscope
US8680464B2 (en) 2010-04-19 2014-03-25 Hitachi High-Technologies Corporation Mass spectrometer
DE112011103599B4 (en) 2010-10-29 2021-08-05 Kabushiki Kaisha Toshiba Laser ion source
CN102468111A (en) * 2010-11-08 2012-05-23 株式会社日立高新技术 Mass spectrometer
CN104681391B (en) * 2010-11-08 2017-08-25 株式会社日立高新技术 Quality analysis apparatus
US9171704B2 (en) 2010-11-08 2015-10-27 Hitachi High-Technologies Corporation Mass spectrometer
CN104681391A (en) * 2010-11-08 2015-06-03 株式会社日立高新技术 Mass spectrometer
US8866070B2 (en) 2010-11-08 2014-10-21 Hitachi High-Technologies Corporation Mass spectrometer
WO2012164309A3 (en) * 2011-06-03 2013-03-07 Micromass Uk Limited Aperture for gas flow restriction
US9799502B2 (en) 2011-06-03 2017-10-24 Micromass Uk Limited Aperture gas flow restriction
US9159541B2 (en) 2011-06-03 2015-10-13 Micromass Uk Limited Aperture gas flow restriction
JP2014517475A (en) * 2011-06-03 2014-07-17 マイクロマス ユーケー リミテッド Restriction of gas flow in opening
GB2491484A (en) * 2011-06-03 2012-12-05 Micromass Ltd Varying the gas flow rate between two differently pumped chambers in a mass spectrometer
GB2491484B (en) * 2011-06-03 2016-01-13 Micromass Ltd Aperture gas flow restriction
JP2013008606A (en) * 2011-06-27 2013-01-10 Hitachi High-Technologies Corp Mass spectrometer and mass analyzing method
US9184037B2 (en) 2011-06-27 2015-11-10 Hitachi High-Technologies Corporation Mass spectrometer and mass analyzing method
GB2504416B (en) * 2013-10-24 2014-07-02 Micromass Ltd Method of damping the movement of a solenoid actuated slit within a mass spectrometer by the induction of eddy currents
GB2504416A (en) * 2013-10-24 2014-01-29 Micromass Ltd Damping the movement of a solenoid actuated component within a mass spectrometer by the induction of eddy currents
KR101549119B1 (en) * 2013-10-30 2015-09-02 한국과학기술원 APPARATUS AND THE METHOD FOR ANALYZING ION CHARACTERISTICS HAVING ExB FILTER AND RETARDING POTENTIAL ANALYZER
JP2017503171A (en) * 2013-12-31 2017-01-26 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド Injection injector inlet for differential mobility spectrometer
US10392539B2 (en) 2014-12-31 2019-08-27 Dow Global Technologies Llc Crash durable epoxy adhesive compositions having improved low-temperature impact resistance and wash off resistance
WO2017010163A1 (en) * 2015-07-13 2017-01-19 株式会社島津製作所 Shutter
JPWO2017010163A1 (en) * 2015-07-13 2018-04-19 株式会社島津製作所 shutter
CN108475615A (en) * 2015-12-17 2018-08-31 株式会社岛津制作所 Ion analysis device
JPWO2017104053A1 (en) * 2015-12-17 2018-08-02 株式会社島津製作所 Ion analyzer
US10991565B2 (en) 2015-12-17 2021-04-27 Shimadzu Corporation Ion analyzer
WO2017104053A1 (en) * 2015-12-17 2017-06-22 株式会社島津製作所 Ion analyzing apparatus
WO2020230297A1 (en) * 2019-05-15 2020-11-19 株式会社島津製作所 Ion analyzer
CN112798677A (en) * 2020-12-31 2021-05-14 杭州谱育科技发展有限公司 Multi-mode mass spectrometry system and method
CN112798677B (en) * 2020-12-31 2024-06-21 杭州谱育科技发展有限公司 Multimode mass spectrometry system and method
WO2022258966A1 (en) * 2021-06-08 2022-12-15 Micromass Uk Limited Vacuum system for a mass spectrometer

Also Published As

Publication number Publication date
JPWO2009031179A1 (en) 2010-12-09

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