WO2009001704A1 - 分析装置および分析方法 - Google Patents

分析装置および分析方法 Download PDF

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Publication number
WO2009001704A1
WO2009001704A1 PCT/JP2008/060986 JP2008060986W WO2009001704A1 WO 2009001704 A1 WO2009001704 A1 WO 2009001704A1 JP 2008060986 W JP2008060986 W JP 2008060986W WO 2009001704 A1 WO2009001704 A1 WO 2009001704A1
Authority
WO
WIPO (PCT)
Prior art keywords
analyzing
absorbance
slope
density
relationship
Prior art date
Application number
PCT/JP2008/060986
Other languages
English (en)
French (fr)
Inventor
Osamu Okabayashi
Original Assignee
Olympus Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corporation filed Critical Olympus Corporation
Priority to EP08765669A priority Critical patent/EP2161563A4/en
Priority to CN200880021318A priority patent/CN101711352A/zh
Publication of WO2009001704A1 publication Critical patent/WO2009001704A1/ja
Priority to US12/641,178 priority patent/US20100099194A1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/251—Colorimeters; Construction thereof
    • G01N21/253—Colorimeters; Construction thereof for batch operation, i.e. multisample apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/025—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/78—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator producing a change of colour
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/124—Sensitivity
    • G01N2201/1248—Validating from signal shape, slope, peak
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/12—Condition responsive control

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

　分析装置（１）および分析方法は、測定対象の所望波長を含む波長域に単調な傾斜をもった吸光度特性を有し、２種以上の濃度を持つ特定用サンプルにおける濃度と吸光度との関係を示す直線の傾きと、所望波長に対して予め求められた特定用試料の濃度と吸光度との関係を示す直線の傾きである基準傾きとを用いて、分析対象の検体と試薬との反応液の吸光度を補正するため、キャリブレーターを用いたキャリブレーション処理を行なうことができない分析項目であっても、分析精度の高い分析結果を得ることができる。
PCT/JP2008/060986 2007-06-22 2008-06-16 分析装置および分析方法 WO2009001704A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP08765669A EP2161563A4 (en) 2007-06-22 2008-06-16 ANALYZER AND ANALYSIS PROCEDURE
CN200880021318A CN101711352A (zh) 2007-06-22 2008-06-16 分析装置和分析方法
US12/641,178 US20100099194A1 (en) 2007-06-22 2009-12-17 Analyzer and analysis method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007165485A JP2009002864A (ja) 2007-06-22 2007-06-22 分析装置および分析方法
JP2007-165485 2007-06-22

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/641,178 Continuation US20100099194A1 (en) 2007-06-22 2009-12-17 Analyzer and analysis method

Publications (1)

Publication Number Publication Date
WO2009001704A1 true WO2009001704A1 (ja) 2008-12-31

Family

ID=40185522

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/060986 WO2009001704A1 (ja) 2007-06-22 2008-06-16 分析装置および分析方法

Country Status (5)

Country Link
US (1) US20100099194A1 (ja)
EP (1) EP2161563A4 (ja)
JP (1) JP2009002864A (ja)
CN (1) CN101711352A (ja)
WO (1) WO2009001704A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2287590A3 (en) * 2009-08-20 2012-11-14 Samsung Electronics Co., Ltd. Method and apparatus for calibrating result from test device using a reagent

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4884239B2 (ja) * 2007-01-12 2012-02-29 ベックマン コールター， インコーポレイテッド 波長特定方法および分析装置
JP5193937B2 (ja) * 2009-05-08 2013-05-08 株式会社日立ハイテクノロジーズ 自動分析装置、及び分析方法
JP5193940B2 (ja) * 2009-05-11 2013-05-08 株式会社日立ハイテクノロジーズ 自動分析装置
US11899409B2 (en) * 2021-03-07 2024-02-13 Mitsubishi Electric Research Laboratories, Inc. Extremum seeking control system and a method for controlling a system
CN115060666B (zh) * 2022-08-17 2022-11-15 北京英视睿达科技股份有限公司 水质参数传感器的校准方法及水质参数的测量方法和装置
CN116087124B (zh) * 2023-04-11 2023-07-21 武汉新烽光电股份有限公司 一种调节盘式芯片光反射角度增大吸光度的水质检测方法

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55132923A (en) * 1979-01-30 1980-10-16 Commissariat Energie Atomique Remoteecontrolled measuring spectrophotometer
JPS64461A (en) * 1987-03-09 1989-01-05 Minoru Tada Instrument for measuring nitrogen compound in water
JPH04148829A (ja) * 1990-10-13 1992-05-21 Jasco Corp 吸光度測定装置
JPH08262028A (ja) 1995-03-23 1996-10-11 Hitachi Ltd 自動分析装置
JPH10227742A (ja) * 1997-02-13 1998-08-25 Toppan Printing Co Ltd 塩化第二鉄エッチング液の銅濃度分析方法及び分析装置
JP2001516010A (ja) * 1997-08-29 2001-09-25 チー ネン アーサー ハン 分析物検出システム
JP2005300547A (ja) * 2004-04-14 2005-10-27 Spectromedical Inc 被験物測定のための分光学的測定方法および装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01148829A (ja) * 1987-12-02 1989-06-12 Showa Denko Kk ロッドまたは肉薄物の連続製造方法
US6711516B2 (en) * 1999-11-23 2004-03-23 Spectromedical Inc. Method for calibrating spectrophotometric apparatus
US7449339B2 (en) * 1999-11-23 2008-11-11 Nir Diagnostics Inc. Spectroscopic method and apparatus for total hemoglobin measurement
JP3991267B2 (ja) * 2002-10-08 2007-10-17 アークレイ株式会社 分析装置およびこれの製造方法

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55132923A (en) * 1979-01-30 1980-10-16 Commissariat Energie Atomique Remoteecontrolled measuring spectrophotometer
JPS64461A (en) * 1987-03-09 1989-01-05 Minoru Tada Instrument for measuring nitrogen compound in water
JPH04148829A (ja) * 1990-10-13 1992-05-21 Jasco Corp 吸光度測定装置
JPH08262028A (ja) 1995-03-23 1996-10-11 Hitachi Ltd 自動分析装置
JPH10227742A (ja) * 1997-02-13 1998-08-25 Toppan Printing Co Ltd 塩化第二鉄エッチング液の銅濃度分析方法及び分析装置
JP2001516010A (ja) * 1997-08-29 2001-09-25 チー ネン アーサー ハン 分析物検出システム
JP2005300547A (ja) * 2004-04-14 2005-10-27 Spectromedical Inc 被験物測定のための分光学的測定方法および装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2161563A4

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2287590A3 (en) * 2009-08-20 2012-11-14 Samsung Electronics Co., Ltd. Method and apparatus for calibrating result from test device using a reagent

Also Published As

Publication number Publication date
EP2161563A1 (en) 2010-03-10
EP2161563A4 (en) 2011-12-07
CN101711352A (zh) 2010-05-19
US20100099194A1 (en) 2010-04-22
JP2009002864A (ja) 2009-01-08

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