WO2008143429A1 - Method for producing a coating agent for anti-glare coating, and the coating agent and anti-glare film - Google Patents
Method for producing a coating agent for anti-glare coating, and the coating agent and anti-glare film Download PDFInfo
- Publication number
- WO2008143429A1 WO2008143429A1 PCT/KR2008/002728 KR2008002728W WO2008143429A1 WO 2008143429 A1 WO2008143429 A1 WO 2008143429A1 KR 2008002728 W KR2008002728 W KR 2008002728W WO 2008143429 A1 WO2008143429 A1 WO 2008143429A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- silica
- reverse micelles
- coating
- parts
- solution
- Prior art date
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- 239000011248 coating agent Substances 0.000 title claims abstract description 54
- 238000000576 coating method Methods 0.000 title claims abstract description 39
- 238000004519 manufacturing process Methods 0.000 title description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 168
- 239000002245 particle Substances 0.000 claims abstract description 60
- 239000000377 silicon dioxide Substances 0.000 claims abstract description 58
- 239000000693 micelle Substances 0.000 claims abstract description 53
- 238000000034 method Methods 0.000 claims abstract description 47
- 239000004094 surface-active agent Substances 0.000 claims abstract description 24
- 239000008119 colloidal silica Substances 0.000 claims abstract description 23
- 239000003960 organic solvent Substances 0.000 claims abstract description 23
- 150000004756 silanes Chemical class 0.000 claims abstract description 16
- 238000002156 mixing Methods 0.000 claims abstract description 12
- 238000003756 stirring Methods 0.000 claims abstract description 10
- 239000007787 solid Substances 0.000 claims description 14
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 10
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 6
- 238000001914 filtration Methods 0.000 claims description 4
- 238000005406 washing Methods 0.000 claims description 2
- 239000000243 solution Substances 0.000 description 44
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 19
- 239000010410 layer Substances 0.000 description 18
- 239000011247 coating layer Substances 0.000 description 16
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 10
- 239000000463 material Substances 0.000 description 10
- 230000003247 decreasing effect Effects 0.000 description 9
- 239000000758 substrate Substances 0.000 description 7
- 238000001029 thermal curing Methods 0.000 description 7
- 239000011521 glass Substances 0.000 description 6
- 239000011259 mixed solution Substances 0.000 description 6
- 230000000704 physical effect Effects 0.000 description 6
- 239000002244 precipitate Substances 0.000 description 6
- 239000011347 resin Substances 0.000 description 6
- 229920005989 resin Polymers 0.000 description 6
- 238000004528 spin coating Methods 0.000 description 6
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 5
- 229910052731 fluorine Inorganic materials 0.000 description 5
- 239000011737 fluorine Substances 0.000 description 5
- 239000000203 mixture Substances 0.000 description 5
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 4
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 4
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 4
- IMNFDUFMRHMDMM-UHFFFAOYSA-N N-Heptane Chemical compound CCCCCCC IMNFDUFMRHMDMM-UHFFFAOYSA-N 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 229910052708 sodium Inorganic materials 0.000 description 4
- 239000011734 sodium Substances 0.000 description 4
- BDHFUVZGWQCTTF-UHFFFAOYSA-M sulfonate Chemical compound [O-]S(=O)=O BDHFUVZGWQCTTF-UHFFFAOYSA-M 0.000 description 4
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- 239000003945 anionic surfactant Substances 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 239000011148 porous material Substances 0.000 description 3
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 2
- HEDRZPFGACZZDS-UHFFFAOYSA-N Chloroform Chemical compound ClC(Cl)Cl HEDRZPFGACZZDS-UHFFFAOYSA-N 0.000 description 2
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 2
- OFBQJSOFQDEBGM-UHFFFAOYSA-N Pentane Chemical compound CCCCC OFBQJSOFQDEBGM-UHFFFAOYSA-N 0.000 description 2
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 2
- 238000003848 UV Light-Curing Methods 0.000 description 2
- 238000010306 acid treatment Methods 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 239000000356 contaminant Substances 0.000 description 2
- 239000012153 distilled water Substances 0.000 description 2
- 239000000706 filtrate Substances 0.000 description 2
- 229910017604 nitric acid Inorganic materials 0.000 description 2
- BKIMMITUMNQMOS-UHFFFAOYSA-N nonane Chemical compound CCCCCCCCC BKIMMITUMNQMOS-UHFFFAOYSA-N 0.000 description 2
- 239000002736 nonionic surfactant Substances 0.000 description 2
- NMRPBPVERJPACX-UHFFFAOYSA-N octan-3-ol Chemical compound CCCCCC(O)CC NMRPBPVERJPACX-UHFFFAOYSA-N 0.000 description 2
- NKLYMYLJOXIVFB-UHFFFAOYSA-N triethoxymethylsilane Chemical compound CCOC([SiH3])(OCC)OCC NKLYMYLJOXIVFB-UHFFFAOYSA-N 0.000 description 2
- QQQSFSZALRVCSZ-UHFFFAOYSA-N triethoxysilane Chemical compound CCO[SiH](OCC)OCC QQQSFSZALRVCSZ-UHFFFAOYSA-N 0.000 description 2
- WSLDOOZREJYCGB-UHFFFAOYSA-N 1,2-Dichloroethane Chemical compound ClCCCl WSLDOOZREJYCGB-UHFFFAOYSA-N 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- -1 alumina Chemical class 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 239000003093 cationic surfactant Substances 0.000 description 1
- ZMAPKOCENOWQRE-UHFFFAOYSA-N diethoxy(diethyl)silane Chemical compound CCO[Si](CC)(CC)OCC ZMAPKOCENOWQRE-UHFFFAOYSA-N 0.000 description 1
- HZLIIKNXMLEWPA-UHFFFAOYSA-N diethoxy(dipropyl)silane Chemical compound CCC[Si](CCC)(OCC)OCC HZLIIKNXMLEWPA-UHFFFAOYSA-N 0.000 description 1
- VSYLGGHSEIWGJV-UHFFFAOYSA-N diethyl(dimethoxy)silane Chemical compound CC[Si](CC)(OC)OC VSYLGGHSEIWGJV-UHFFFAOYSA-N 0.000 description 1
- BZCJJERBERAQKQ-UHFFFAOYSA-N diethyl(dipropoxy)silane Chemical compound CCCO[Si](CC)(CC)OCCC BZCJJERBERAQKQ-UHFFFAOYSA-N 0.000 description 1
- JJQZDUKDJDQPMQ-UHFFFAOYSA-N dimethoxy(dimethyl)silane Chemical compound CO[Si](C)(C)OC JJQZDUKDJDQPMQ-UHFFFAOYSA-N 0.000 description 1
- JVUVKQDVTIIMOD-UHFFFAOYSA-N dimethoxy(dipropyl)silane Chemical compound CCC[Si](OC)(OC)CCC JVUVKQDVTIIMOD-UHFFFAOYSA-N 0.000 description 1
- ZIDTUTFKRRXWTK-UHFFFAOYSA-N dimethyl(dipropoxy)silane Chemical compound CCCO[Si](C)(C)OCCC ZIDTUTFKRRXWTK-UHFFFAOYSA-N 0.000 description 1
- YYLGKUPAFFKGRQ-UHFFFAOYSA-N dimethyldiethoxysilane Chemical compound CCO[Si](C)(C)OCC YYLGKUPAFFKGRQ-UHFFFAOYSA-N 0.000 description 1
- AVBCBOQFOQZNFK-UHFFFAOYSA-N dipropoxy(dipropyl)silane Chemical compound CCCO[Si](CCC)(CCC)OCCC AVBCBOQFOQZNFK-UHFFFAOYSA-N 0.000 description 1
- SBRXLTRZCJVAPH-UHFFFAOYSA-N ethyl(trimethoxy)silane Chemical compound CC[Si](OC)(OC)OC SBRXLTRZCJVAPH-UHFFFAOYSA-N 0.000 description 1
- 230000004313 glare Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- TVMXDCGIABBOFY-UHFFFAOYSA-N octane Chemical compound CCCCCCCC TVMXDCGIABBOFY-UHFFFAOYSA-N 0.000 description 1
- 239000011146 organic particle Substances 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- LFQCEHFDDXELDD-UHFFFAOYSA-N tetramethyl orthosilicate Chemical compound CO[Si](OC)(OC)OC LFQCEHFDDXELDD-UHFFFAOYSA-N 0.000 description 1
- ZQZCOBSUOFHDEE-UHFFFAOYSA-N tetrapropyl silicate Chemical compound CCCO[Si](OCCC)(OCCC)OCCC ZQZCOBSUOFHDEE-UHFFFAOYSA-N 0.000 description 1
- 230000001988 toxicity Effects 0.000 description 1
- 231100000419 toxicity Toxicity 0.000 description 1
- DENFJSAFJTVPJR-UHFFFAOYSA-N triethoxy(ethyl)silane Chemical compound CCO[Si](CC)(OCC)OCC DENFJSAFJTVPJR-UHFFFAOYSA-N 0.000 description 1
- NBXZNTLFQLUFES-UHFFFAOYSA-N triethoxy(propyl)silane Chemical compound CCC[Si](OCC)(OCC)OCC NBXZNTLFQLUFES-UHFFFAOYSA-N 0.000 description 1
- HQYALQRYBUJWDH-UHFFFAOYSA-N trimethoxy(propyl)silane Chemical compound CCC[Si](OC)(OC)OC HQYALQRYBUJWDH-UHFFFAOYSA-N 0.000 description 1
- TUQLLQQWSNWKCF-UHFFFAOYSA-N trimethoxymethylsilane Chemical compound COC([SiH3])(OC)OC TUQLLQQWSNWKCF-UHFFFAOYSA-N 0.000 description 1
- VUWVDNLZJXLQPT-UHFFFAOYSA-N tripropoxy(propyl)silane Chemical compound CCCO[Si](CCC)(OCCC)OCCC VUWVDNLZJXLQPT-UHFFFAOYSA-N 0.000 description 1
- VALXJBHHKXDBPI-UHFFFAOYSA-N tripropoxymethylsilane Chemical compound CCCOC([SiH3])(OCCC)OCCC VALXJBHHKXDBPI-UHFFFAOYSA-N 0.000 description 1
- 238000000108 ultra-filtration Methods 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D1/00—Coating compositions, e.g. paints, varnishes or lacquers, based on inorganic substances
- C09D1/02—Coating compositions, e.g. paints, varnishes or lacquers, based on inorganic substances alkali metal silicates
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D1/00—Coating compositions, e.g. paints, varnishes or lacquers, based on inorganic substances
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D183/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
- C09D183/04—Polysiloxanes
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D5/00—Coating compositions, e.g. paints, varnishes or lacquers, characterised by their physical nature or the effects produced; Filling pastes
- C09D5/006—Anti-reflective coatings
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D7/00—Features of coating compositions, not provided for in group C09D5/00; Processes for incorporating ingredients in coating compositions
- C09D7/40—Additives
- C09D7/45—Anti-settling agents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D7/00—Features of coating compositions, not provided for in group C09D5/00; Processes for incorporating ingredients in coating compositions
- C09D7/40—Additives
- C09D7/60—Additives non-macromolecular
- C09D7/61—Additives non-macromolecular inorganic
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D7/00—Features of coating compositions, not provided for in group C09D5/00; Processes for incorporating ingredients in coating compositions
- C09D7/40—Additives
- C09D7/66—Additives characterised by particle size
- C09D7/67—Particle size smaller than 100 nm
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K7/00—Use of ingredients characterised by shape
- C08K7/22—Expanded, porous or hollow particles
- C08K7/24—Expanded, porous or hollow particles inorganic
- C08K7/26—Silicon- containing compounds
Definitions
- the present invention relates to a coating agent for antireflection coating, a method of producing the coating agent, and an antireflection film using the coating agent.
- an antireflection film has been increasingly used in the field of displays, such as liquid crystal displays (LCDs), organic light emitting diodes (OLEDs), plasma display panels (PDPs), and the like.
- LCDs liquid crystal displays
- OLEDs organic light emitting diodes
- PDPs plasma display panels
- an antireflection film includes a transparent substrate, a resin layer for imparting hard coatability, and a low refractive coating layer, which is an antireflection layer.
- the low refractive coating layer is formed using a dry coating method or a wet coating method.
- the dry coating method may include vacuum deposition, sputtering, chemical vapor deposition (CVD), and the like.
- This dry coating method is disadvantageous in that, although the low refractive coating layer formed using this dry coating method has high antireflectivity, there is a limitation on producing the low refractive coating layer (antireflection layer) in large quantities, and the production cost thereof is high.
- the wet coating method is a method of applying a low refractive coating agent
- This wet coating method is advantageous in that the low refractive coating layer (antireflection layer) can be produced in large quantities, and the production cost thereof is lower than that of the dry coating method. Therefore, recently, the wet coating method has been widely researched. In particular, in the wet coating method, since the antireflectivity of the produced antireflection film depends on the refractive index of the low refractive coating layer, research for improving the antireflectivity of the antireflection film is being actively conducted.
- this method can be successfully used to prepare porous silica-dispersed particles having a particle size of 100 nm or less, but is problematic in that processes are complicated. Further, this method is problematic in that, since mixed particles of silica and alumina are prepared using precursors of silica and alumina in aqueous solution, alumina is not completely dissolved at the time of dissolving alumina through acid treatment, and thus the remaining high-refractive alumina has a negative influence on transmissivity and refractive index. Disclosure of Invention Technical Problem
- an object of the present invention is to provide porous silica particles having a particle size of 100 nm or less, which do not include metal components, such as alumina, and the like, and are suitable for a low refractive layer, a method of producing the porous silica particles, and an antireflection film using the porous silica particles.
- the present invention provides a coating agent for antireflection coating, produced using a method comprising: (A) mixing and stirring 100 parts by weight of an organic solvent, 0.5 - 5 parts by weight of a surfactant, and 2 - 10 parts by weight of colloidal silica having a particle size of 2 - 50 nm and a concentration of 5 - 40% to form a solution including silica reverse micelles having a particle size of 10 - 100 nm; (B) mixing and stirring 20 - 300 parts by weight, based on 100 parts by weight of the solid content of the colloidal silica, of a silane derivative in the solution including silica reverse micelles to surface-treat the silica reverse micelles; and (Q removing the organic solvent and surfactant from the solution including the surface-treated silica reverse micelles to produce porous silica particles.
- the present invention also provides a method of producing a coating agent for an- tireflection coating, comprising: (A) mixing and stirring an organic solvent, a surfactant, and colloidal silica having a particle size of 2 - 50 nm and a concentration of 5 - 40% to form a solution including silica reverse micelles having a particle size of 10 - 100 nm; (B) mixing and stirring a silane derivative in the solution including silica reverse micelles to surface-treat the silica reverse micelles; and (Q removing the organic solvent and surfactant from the solution including silica reverse micelles to produce porous silica particles having a particle size of 10 - 100 nm.
- an amount of the colloidal silica may be 2 - 10 parts by weight based on 100 parts by weight of the organic solvent, and an amount of the surfactant may be 0.5 - 5 parts by weight based on 100 parts by weight of the organic solvent.
- an amount of the silane derivative may be 20 - 300 parts by weight based on 100 parts by weight of the solid content of the colloidal silica.
- the step (B) of the method may comprise: (a) separating silica particles from the solution including silica reverse micelles obtained in the step (B); (b) washing the silica particles obtained in the step (a) and then dispersing them in water or alcohol; and (c) filtering and concentrating the solution obtained in the step (b) to form a silica particle solution having a concentration of 1 - 10%.
- the step (B) of the method may comprise: (a) dispersing the solution including silica reverse micelles obtained in the step (B) in alcohol to form a silica-dispersed solution; and (b) filtering and concentrating the silica-dispersed solution obtained in the step (a) to form a silica particle solution having a concentration of 1 - 10%.
- the coating agent may be used for an antireflection film, which is used to prevent light from reflecting from a surface of a display.
- a porous coating agent for antireflection coating having a particle size of 100 nm or less, which does not include metal components, such as alumina, and the like, can be produced.
- the antireflection film including the coating agent exhibits high trans- missivity, low turbidity, and an excellent antireflection effect.
- porous silica reverse micelles are formed of silica, and then the silica reverse micelles are surface-treated using a silane derivative such that the pores of the silica reverse micelles are not exposed, thereby producing a coating agent for antireflection coating, that is, pure porous silica particles having a particle size of 100 nm or less, which are suitable for a low refractive coating layer.
- a coating agent for antireflection coating that is, pure porous silica particles having a particle size of 100 nm or less, which are suitable for a low refractive coating layer.
- an organic solvent, a surfactant, and colloidal silica having a particle size of 2 ⁇ 50 nm and a concentration of 5 ⁇ 40% are mixed and stirred, thus forming porous silica reverse micelles having a particle size of 10 ⁇ 100 nm.
- Examples of the organic solvent may include pentane, hexane, heptane, octane, nonane, benzene, toluene, xylene, 1,2-dichloroethane, chloroform, and mixtures thereof.
- hexane and heptane are suitable from the aspects of solubility in water, toxicity and price.
- an anionic surfactant an anionic surfactant, a cationic surfactant, and a nonionic surfactant may be used.
- the anionic surfactant and nonionic surfactant which have high solubility in the organic solvent, be used.
- a sodium sulfonate anionic surfactant may be used in small quantities, and is suitable from the aspects of solubility in the organic solvent and particle size of the formed reverse micelles.
- the amount of the surfactant be 0.5 ⁇ 5 parts by weight based on 100 parts by weight of the organic solvent. When the amount of the surfactant is less than 0.5 parts by weight, it is difficult to form reverse micelles having a particle size of 100 nm or less.
- the colloidal silica may have a particle size of 2 ⁇ 50 nm and a solid content of 5 ⁇
- the amount of the colloidal silica be 2 ⁇ 10 parts by weight based on 100 parts by weight of the organic solvent.
- the amount of the colloidal silica is below 2 parts by weight, the solid content is excessively low, which is not practical.
- the amount of the colloidal silica is above 10 parts by weight, the colloidal silica particles are clustered, thus forming macroparticles.
- a silane derivative is mixed with the solution including the reverse micelles obtained in the process of forming silica reverse micelles, and then the solution is stirred, thereby surface-treating the reverse micelles.
- ammonia may be used as a coating promoter. Due to the surface coating of the reverse micelles, the pores of the reverse micelles are not externally exposed, so that contaminants do not infiltrate into the pores, thereby preventing the refractive index of the reverse micelles from being influenced by the contaminants.
- Examples of the silane derivative may include tetramethoxy silane, tetraethoxysilane, tetrapropoxy silane , trimethoxymethylsilane , trimethoxyethylsilane , trimethoxypropylsilane, triethoxymethylsilane, triethoxyethylsilane, tri- ethoxypropylsilane, tripropoxymethylsilane, tripropoxyethylsilane, tripropoxypropylsilane, dimethoxydimethylsilane, dimethoxydiethylsilane, dimethoxy- dipropylsilane, diethoxydimethylsilane, diethoxydiethylsilane, diethoxydipropylsilane, dipropoxydimethylsilane, dipropoxydiethylsilane, dipropoxydipropylsilane, and the like.
- the amount of the silane derivative be 20-300% of the solid content of the colloidal silica.
- the amount of the silane derivative is below 20%, the reverse micelles cannot be efficiently surface-treated.
- the amount of the silane derivative is above 300%, an excessive amount of silane is bonded on the surface of the reverse micelles, so that the porosity of the reverse micelles is decreased, with the result that the refractive index reduction effect becomes low.
- silica particles are separated from the silica reverse micelle solution obtained in the process of surface-treating reverse micelles, are washed, and are then dispersed in water or alcohol to form a solution, and then the solution is filtered and concentrated to form a silica particle solution having a concentration of 1 ⁇ 10%.
- the silica reverse micelle solution obtained in the process of surface-treating reverse micelles is dispersed in alcohol to form a silica-dispersed solution, and then the silica-dispersed solution is filtered and concentrated to form a silica particle solution having a concentration of 1 ⁇ 10%.
- the silica particle solution may be applied thickly when its concentration is low.
- the concentration of the silica particle solution is below 1%, the silica particle solution is excessively diluted, thus decreasing productivity and coating uniformity.
- the concentration thereof is above 10%, the silica particle solution is excessively concentrated, and thus the thickness of the coating layer cannot be easily controlled.
- the silica particles, prepared as above, do not include metal salts, such as alumina, etc, and exhibit high transmissivity, low turbidity, and an excellent antireflection effect when they are applied on a film or sheet.
- the silica particles may be independently used, or may be used by mixing them with a UV-curing coating material or a thermo-curing coating material.
- a UV-curing coating material a mixed coating material of an acrylic oligomer and a photoinitiator may be used
- a thermo-curing coating material a sol solution, formed by treating tetraethoxysilane with nitric acid, may be used.
- the dispersed precipitate particles were filtered using a filter having a particle size of 0.2 ⁇ m to form a filtrate, and then the filtrate was concentrated to prepare 1.2 kg of a silica particle solution including silica particles having a porosity of 5% and a particle size of 100 nm or less.
- the average particle size of the prepared silica particles was 14 nm.
- the prepared silica particle solution including silica particles having a particle size of 100 nm or less was applied on a glass substrate having a thickness of 1 mm using a spin-coating method, and was then dried at a temperature of 200 0 C for 10 minutes to form an antireflection layer having a thickness of 100 nm.
- the physical properties of the formed antireflection layer were measured, and the results thereof are given in Table 1.
- 1.2 kg of a silica particle solution including silica particles having a porosity of 5% and a particle size of 100 nm or less was prepared using the same method as in Example 1, except that 214.5 g of didodecylsu ⁇ inate sodium sulfonate, which is a surfactant, was additionally put into the reactor.
- the average particle size of the silica particles prepared in Example 2 was 14 nm.
- Example 1 As in Example 1, the prepared silica particle solution including silica particles was applied on a glass substrate having a thickness of 1 mm using a spin-coating method, and was then dried at a temperature of 200 0 C for 10 minutes to form an antireflection layer having a thickness of 100 nm. Subsequently, the physical properties of the formed antireflection layer were measured, and the results thereof are given in Table 1.
- the silica solution was slowly dispersed in hexane and 10 kg of ethylhexyl alcohol to form a mixed solution.
- the mixed solution was filtered using an ultrafiltration method to remove hexane and a surfactant therefrom, and then the mixed solution, from which the hexane and surfactant were removed, was concentrated to prepare 0.3 kg of a silica particle solution including silica particles having a porosity of 2% and a particle size of 100 nm or less.
- the average particle size of the prepared silica particles was 25 nm.
- the amounts of raw materials are the same as in Example 2, but the average particle size of the prepared silica particles was slightly increased compared to that in Example 2.
- the prepared silica particle solution including silica particles was applied on a glass substrate having a thickness of 1 mm using a spin-coating method, and was then dried at a temperature of 200 0 C for 10 minutes to form an antireflection layer having a thickness of 100 nm. Subsequently, the physical properties of the formed antireflection layer were measured, and the results thereof are given in Table 1.
- the silica particle solutions prepared in Examples 1 to 3 were mixed with thermo- curing coating materials such that the mixing ratio of the silica particle solution to the thermo-curing coating material was 1 : 1 by weight, and were then applied on a glass substrate having a thickness of 1 mm using a spin-coating method, and were then dried at a temperature of 200 0 C for 10 minutes to form antireflection layers having a thickness of 100 nm. Subsequently, the physical properties of the respective formed antireflection layers were measured, and the results thereof are given in Table 1.
- Examples corresponding to Examples 1, 2 and 3 are represented by Examples 4-1, 4-2 and 4-3, respectively.
- thermo-curing coating material was prepared as follows.
- thermo-curing coating material prepared in Example 4 was independently applied on a glass substrate having a thickness of 1 mm using a spin-coating method, and was then dried at a temperature of 200 0 C for 10 minutes to form an antireflection layer having a thickness of 100 nm. Subsequently, the physical properties of the formed antireflection layer were measured, and the results thereof are given in Table 1.
- the antireflection layers prepared using the porous silica particles having a particle size of 100 nm or less in Examples 1 to 4, exhibit excellent results from the aspects of turbidity and minimum reflectance, compared to Comparative Examples 1 and 2.
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Abstract
Disclosed herein is a method of producing a coating agent for antireflection coating, comprising: mixing and stirring an organic solvent, a surfactant, and colloidal silica having a particle size of 2 ~ 50 nm and a concentration of 5 ~ 40% to form a solution including silica reverse micelles having a particle size of 10 ~ 100 nm; mixing and stirring a silane derivative in the solution including silica reverse micelles to surface-treat the silica reverse micelles; and removing the organic solvent and surfactant from the solution including silica reverse micelles to produce porous silica particles having a particle size of 10 ~ 100 nm. The antireflection film produced using the method has high transmissivity, low turbidity, and excellent antireflection.
Description
Description
METHOD FOR PRODUCING A COATING AGENT FOR ANTI-GLARE COATING, AND THE COATING AGENT
AND ANTI-GLARE FILM
Technical Field
[1] The present invention relates to a coating agent for antireflection coating, a method of producing the coating agent, and an antireflection film using the coating agent. Background Art
[2] Recently, in order to prevent visibility of a screen from decreasing and to prevent screen glare, an antireflection film has been increasingly used in the field of displays, such as liquid crystal displays (LCDs), organic light emitting diodes (OLEDs), plasma display panels (PDPs), and the like.
[3] Generally, an antireflection film includes a transparent substrate, a resin layer for imparting hard coatability, and a low refractive coating layer, which is an antireflection layer. Here, the low refractive coating layer is formed using a dry coating method or a wet coating method.
[4] First, the dry coating method may include vacuum deposition, sputtering, chemical vapor deposition (CVD), and the like. This dry coating method is disadvantageous in that, although the low refractive coating layer formed using this dry coating method has high antireflectivity, there is a limitation on producing the low refractive coating layer (antireflection layer) in large quantities, and the production cost thereof is high.
[5] Next, the wet coating method is a method of applying a low refractive coating agent
(an antireflection coating agent) on a film or sheet. This wet coating method is advantageous in that the low refractive coating layer (antireflection layer) can be produced in large quantities, and the production cost thereof is lower than that of the dry coating method. Therefore, recently, the wet coating method has been widely researched. In particular, in the wet coating method, since the antireflectivity of the produced antireflection film depends on the refractive index of the low refractive coating layer, research for improving the antireflectivity of the antireflection film is being actively conducted.
[6] As the wet coating method, Korean Unexamined Patent Publication Nos.
2000-0Q59818 and 20Q5-0083890, and U.S. Pat. Nos. 5,74,537, 4,846,650, 6,773,121 and 6,908,647 disclose methods of impregnating a low refractive coating layer with a
fluorine resin having a low refractive index.
[7] These methods are advantageous in that the refractive index of the antireflection film is decreased as the amount of the fluorine resin included in the low refractive coating layer is increased, but are disadvantageous in that there is a limitation on decreasing the refractive index of the antireflection film by increasing the amount of the fluorine resin included in the low refractive coating layer because the inherent refractive index of the fluorine resin is about 1.35-1.40, and in that the adhesivity and hardness of the coating layer are decreased as the amount of the fluorine resin is increased.
[8] In addition, as a method of decreasing the refractive index of a low refractive coating layer, there is a method of adding porous particles to a low refractive coating layer. Since the refractive index of the porous particles is approximately 1, in the method, the refractive index of the low refractive coating layer is decreased by increasing the amount of porous particles included in the low refractive coating layer. For example, U.S. Pat. N). 6,777,069 discloses a method of preparing porous silica particles by forming mixed particles of silica and alumina and then melting the alumina in the mixed particles through acid treatment.
[9] However, this method can be successfully used to prepare porous silica-dispersed particles having a particle size of 100 nm or less, but is problematic in that processes are complicated. Further, this method is problematic in that, since mixed particles of silica and alumina are prepared using precursors of silica and alumina in aqueous solution, alumina is not completely dissolved at the time of dissolving alumina through acid treatment, and thus the remaining high-refractive alumina has a negative influence on transmissivity and refractive index. Disclosure of Invention Technical Problem
[10] Accordingly, the present invention has been made keeping in mind the above problems oxurring in the prior art, and an object of the present invention is to provide porous silica particles having a particle size of 100 nm or less, which do not include metal components, such as alumina, and the like, and are suitable for a low refractive layer, a method of producing the porous silica particles, and an antireflection film using the porous silica particles. Technical Solution
[11] In order to accomplish the above object, the present invention provides a coating agent for antireflection coating, produced using a method comprising: (A) mixing and
stirring 100 parts by weight of an organic solvent, 0.5 - 5 parts by weight of a surfactant, and 2 - 10 parts by weight of colloidal silica having a particle size of 2 - 50 nm and a concentration of 5 - 40% to form a solution including silica reverse micelles having a particle size of 10 - 100 nm; (B) mixing and stirring 20 - 300 parts by weight, based on 100 parts by weight of the solid content of the colloidal silica, of a silane derivative in the solution including silica reverse micelles to surface-treat the silica reverse micelles; and (Q removing the organic solvent and surfactant from the solution including the surface-treated silica reverse micelles to produce porous silica particles.
[12] The present invention also provides a method of producing a coating agent for an- tireflection coating, comprising: (A) mixing and stirring an organic solvent, a surfactant, and colloidal silica having a particle size of 2 - 50 nm and a concentration of 5 - 40% to form a solution including silica reverse micelles having a particle size of 10 - 100 nm; (B) mixing and stirring a silane derivative in the solution including silica reverse micelles to surface-treat the silica reverse micelles; and (Q removing the organic solvent and surfactant from the solution including silica reverse micelles to produce porous silica particles having a particle size of 10 - 100 nm.
[13] In the step (A) of the method, an amount of the colloidal silica may be 2 - 10 parts by weight based on 100 parts by weight of the organic solvent, and an amount of the surfactant may be 0.5 - 5 parts by weight based on 100 parts by weight of the organic solvent.
[14] In the step (B) of the method, an amount of the silane derivative may be 20 - 300 parts by weight based on 100 parts by weight of the solid content of the colloidal silica.
[15] The step (B) of the method may comprise: (a) separating silica particles from the solution including silica reverse micelles obtained in the step (B); (b) washing the silica particles obtained in the step (a) and then dispersing them in water or alcohol; and (c) filtering and concentrating the solution obtained in the step (b) to form a silica particle solution having a concentration of 1 - 10%.
[16] The step (B) of the method may comprise: (a) dispersing the solution including silica reverse micelles obtained in the step (B) in alcohol to form a silica-dispersed solution; and (b) filtering and concentrating the silica-dispersed solution obtained in the step (a) to form a silica particle solution having a concentration of 1 - 10%.
[17] Meanwhile, the coating agent may be used for an antireflection film, which is used to prevent light from reflecting from a surface of a display.
Advantageous Effects
[18] According to the present invention, a porous coating agent for antireflection coating, having a particle size of 100 nm or less, which does not include metal components, such as alumina, and the like, can be produced.
[19] Further, the antireflection film including the coating agent exhibits high trans- missivity, low turbidity, and an excellent antireflection effect. Best Mode for Carrying Out the Invention
[20] Hereinafter, the present invention will be described in detail.
[21] In order to accomplish the above object, in the present invention, porous silica reverse micelles are formed of silica, and then the silica reverse micelles are surface- treated using a silane derivative such that the pores of the silica reverse micelles are not exposed, thereby producing a coating agent for antireflection coating, that is, pure porous silica particles having a particle size of 100 nm or less, which are suitable for a low refractive coating layer. The method of producing the coating agent according to the present invention will be described in detail below.
[22] [Process of forming silica reverse micelles]
[23] In this process, an organic solvent, a surfactant, and colloidal silica having a particle size of 2 ~ 50 nm and a concentration of 5 ~ 40% are mixed and stirred, thus forming porous silica reverse micelles having a particle size of 10 ~ 100 nm.
[24] Examples of the organic solvent may include pentane, hexane, heptane, octane, nonane, benzene, toluene, xylene, 1,2-dichloroethane, chloroform, and mixtures thereof. Among them, hexane and heptane are suitable from the aspects of solubility in water, toxicity and price.
[25] As the surfactant, an anionic surfactant, a cationic surfactant, and a nonionic surfactant may be used. Among them, it is preferred that the anionic surfactant and nonionic surfactant, which have high solubility in the organic solvent, be used. In particular, a sodium sulfonate anionic surfactant may be used in small quantities, and is suitable from the aspects of solubility in the organic solvent and particle size of the formed reverse micelles. It is preferred that the amount of the surfactant be 0.5 ~ 5 parts by weight based on 100 parts by weight of the organic solvent. When the amount of the surfactant is less than 0.5 parts by weight, it is difficult to form reverse micelles having a particle size of 100 nm or less. In contrast, when the amount of the surfactant is more than 5 parts by weight, the surfactant cannot be completely dissolved in the organic solvent.
[26] The colloidal silica may have a particle size of 2 ~ 50 nm and a solid content of 5 ~
40%. When the solid content of the colloidal silica is below 5%, the formed silica reverse micelles have excessively high porosity, so that they do not have good stability, and cannot be easily surface-treated. In contrast, when the solid content of the colloidal silica is above 40%, the porosity of the silica reverse micelles is greatly decreased. Further, it is preferred that the amount of the colloidal silica be 2 ~ 10 parts by weight based on 100 parts by weight of the organic solvent. When the amount of the colloidal silica is below 2 parts by weight, the solid content is excessively low, which is not practical. In contrast, when the amount of the colloidal silica is above 10 parts by weight, the colloidal silica particles are clustered, thus forming macroparticles.
[27] [Process of surface-treating reverse micelles]
[28] In this process, a silane derivative is mixed with the solution including the reverse micelles obtained in the process of forming silica reverse micelles, and then the solution is stirred, thereby surface-treating the reverse micelles. In order to surface- coat the reverse micelles using the silane derivative, ammonia may be used as a coating promoter. Due to the surface coating of the reverse micelles, the pores of the reverse micelles are not externally exposed, so that contaminants do not infiltrate into the pores, thereby preventing the refractive index of the reverse micelles from being influenced by the contaminants.
[29] Examples of the silane derivative may include tetramethoxy silane, tetraethoxysilane, tetrapropoxy silane , trimethoxymethylsilane , trimethoxyethylsilane , trimethoxypropylsilane, triethoxymethylsilane, triethoxyethylsilane, tri- ethoxypropylsilane, tripropoxymethylsilane, tripropoxyethylsilane, tripropoxypropylsilane, dimethoxydimethylsilane, dimethoxydiethylsilane, dimethoxy- dipropylsilane, diethoxydimethylsilane, diethoxydiethylsilane, diethoxydipropylsilane, dipropoxydimethylsilane, dipropoxydiethylsilane, dipropoxydipropylsilane, and the like. It is preferred that the amount of the silane derivative be 20-300% of the solid content of the colloidal silica. When the amount of the silane derivative is below 20%, the reverse micelles cannot be efficiently surface-treated. In contrast, when the amount of the silane derivative is above 300%, an excessive amount of silane is bonded on the surface of the reverse micelles, so that the porosity of the reverse micelles is decreased, with the result that the refractive index reduction effect becomes low.
[30] [Process of removing organic solvent, surfactant, etc from reverse micelle solution]
[31] In this process, an organic solvent, a surfactant, and various impurities are removed
from the reverse micelle solution obtained in the process of surface-treating reverse micelles, thus preparing pure porous silica particles having a particle size of 10 ~ 100 nm.
[32] This process may be performed in the following two ways.
[33] First, silica particles are separated from the silica reverse micelle solution obtained in the process of surface-treating reverse micelles, are washed, and are then dispersed in water or alcohol to form a solution, and then the solution is filtered and concentrated to form a silica particle solution having a concentration of 1 ~ 10%.
[34] Second, the silica reverse micelle solution obtained in the process of surface-treating reverse micelles is dispersed in alcohol to form a silica-dispersed solution, and then the silica-dispersed solution is filtered and concentrated to form a silica particle solution having a concentration of 1 ~ 10%.
[35] The silica particle solution may be applied thickly when its concentration is low.
However, when the concentration of the silica particle solution is below 1%, the silica particle solution is excessively diluted, thus decreasing productivity and coating uniformity. In contrast, when the concentration thereof is above 10%, the silica particle solution is excessively concentrated, and thus the thickness of the coating layer cannot be easily controlled.
[36] [Application of antireflection coating agent]
[37] The silica particles, prepared as above, do not include metal salts, such as alumina, etc, and exhibit high transmissivity, low turbidity, and an excellent antireflection effect when they are applied on a film or sheet.
[38] The silica particles may be independently used, or may be used by mixing them with a UV-curing coating material or a thermo-curing coating material. For example, as the UV-curing coating material, a mixed coating material of an acrylic oligomer and a photoinitiator may be used, and as the thermo-curing coating material, a sol solution, formed by treating tetraethoxysilane with nitric acid, may be used. Mode for the Invention
[39] Hereinafter, Examples of the present invention will be described in more detail.
[40] Example 1
[41] 15L (about 9.905 kg) of n-hexane was put into a reactor, and then 257 g of didode- cylsuocinate sodium sulfonate, which is a surfactant, was additionally put into the reactor to form a mixture, and then the mixture was melted. Subsequently, 495g of aqueous colloidal silica solution having a solid content of 15% was added thereto, and was then stirred for 4 hours to prepare reverse micelles. Subsequently, 58.5 g of tri-
ethoxysilane, which is a silane derivative, was additionally put into the reactor, and was then further stirred for 20 hours.
[42] Thereafter, 1% of aqueous ammonia was put into the reactor and was then stirred for
3 hours, and then 600 g of acetone was added thereto to form a precipitate. Solids were separated from the precipitate using a centrifugal separation method, and the precipitate, from which the solids were separated, was washed two times using acetone. Subsequently, 6 kg of distilled water was added to the precipitate, and then precipitate particles were dispersed in the distilled water using ultrasonic waves.
[43] Thereafter, the dispersed precipitate particles were filtered using a filter having a particle size of 0.2 μm to form a filtrate, and then the filtrate was concentrated to prepare 1.2 kg of a silica particle solution including silica particles having a porosity of 5% and a particle size of 100 nm or less. The average particle size of the prepared silica particles was 14 nm.
[44] Subsequently, the prepared silica particle solution including silica particles having a particle size of 100 nm or less was applied on a glass substrate having a thickness of 1 mm using a spin-coating method, and was then dried at a temperature of 2000C for 10 minutes to form an antireflection layer having a thickness of 100 nm. Subsequently, the physical properties of the formed antireflection layer were measured, and the results thereof are given in Table 1.
[45] Example 2
[46] 1.2 kg of a silica particle solution including silica particles having a porosity of 5% and a particle size of 100 nm or less was prepared using the same method as in Example 1, except that 214.5 g of didodecylsuαinate sodium sulfonate, which is a surfactant, was additionally put into the reactor. The average particle size of the silica particles prepared in Example 2 was 14 nm.
[47] As in Example 1, the prepared silica particle solution including silica particles was applied on a glass substrate having a thickness of 1 mm using a spin-coating method, and was then dried at a temperature of 2000C for 10 minutes to form an antireflection layer having a thickness of 100 nm. Subsequently, the physical properties of the formed antireflection layer were measured, and the results thereof are given in Table 1.
[48] Example 3
[49] 15L (about 9.905 kg) of n-hexane was put into a reactor, and then 257 g of didode- cylsuocinate sodium sulfonate was additionally put into the reactor to form a mixture, and then the mixture was melted. Subsequently, 495g of aqueous colloidal silica solution having a solid content of 15% was added thereto, and was then stirred for 4
hours to prepare reverse micelles. Subsequently, 58.5 g of triethoxysilane, which is a silane derivative, was additionally put into the reactor, and was then further stirred for 20 hours. Thereafter, 1% of aqueous ammonia was put into the reactor and was then stirred for 3 hours to form a silica solution. This procedure is the same as that of Example 1 up to this point.
[50] Subsequently, the silica solution was slowly dispersed in hexane and 10 kg of ethylhexyl alcohol to form a mixed solution. The mixed solution was filtered using an ultrafiltration method to remove hexane and a surfactant therefrom, and then the mixed solution, from which the hexane and surfactant were removed, was concentrated to prepare 0.3 kg of a silica particle solution including silica particles having a porosity of 2% and a particle size of 100 nm or less. The average particle size of the prepared silica particles was 25 nm. Here, the amounts of raw materials are the same as in Example 2, but the average particle size of the prepared silica particles was slightly increased compared to that in Example 2.
[51] Subsequently, the prepared silica particle solution including silica particles was applied on a glass substrate having a thickness of 1 mm using a spin-coating method, and was then dried at a temperature of 2000C for 10 minutes to form an antireflection layer having a thickness of 100 nm. Subsequently, the physical properties of the formed antireflection layer were measured, and the results thereof are given in Table 1.
[52] Example 4
[53] The silica particle solutions prepared in Examples 1 to 3 were mixed with thermo- curing coating materials such that the mixing ratio of the silica particle solution to the thermo-curing coating material was 1 : 1 by weight, and were then applied on a glass substrate having a thickness of 1 mm using a spin-coating method, and were then dried at a temperature of 2000C for 10 minutes to form antireflection layers having a thickness of 100 nm. Subsequently, the physical properties of the respective formed antireflection layers were measured, and the results thereof are given in Table 1. In Table 1, Examples corresponding to Examples 1, 2 and 3 are represented by Examples 4-1, 4-2 and 4-3, respectively.
[54] The thermo-curing coating material was prepared as follows.
[55] That is, 117 g of triethoxymethylsilane was mixed with 177 g of ethanol, and then 81 g of an aqueous 0.1 N nitric acid solution was added thereto to form a mixed solution, and then the mixed solution was stirred for 24 hours. Subsequently, 410 g of ethanol was added to the mixed solution to prepare a thermo-curing coating material having a solid content of 5%.
[56] Comparative Example 1 [57] The colloidal silica used in Example was independently applied on a glass substrate having a thickness of 1 mm using a spin-coating method, and was then dried at a temperature of 2000C for 10 minutes to form an antireflection layer having a thickness of 100 nm. Subsequently, the physical properties of the formed antireflection layer were measured, and the results thereof are given in Table 1.
[58] Comparative Example 2 [59] The thermo-curing coating material prepared in Example 4 was independently applied on a glass substrate having a thickness of 1 mm using a spin-coating method, and was then dried at a temperature of 2000C for 10 minutes to form an antireflection layer having a thickness of 100 nm. Subsequently, the physical properties of the formed antireflection layer were measured, and the results thereof are given in Table 1.
[60] Table 1 [Table 1] [Table ]
[61] As shown in Table 1, it can be seen that the antireflection layers, prepared using the porous silica particles having a particle size of 100 nm or less in Examples 1 to 4, exhibit excellent results from the aspects of turbidity and minimum reflectance, compared to Comparative Examples 1 and 2.
Claims
[1] A coating agent for antireflection coating, produced using a method comprising:
(A) mixing and stirring 100 parts by weight of an organic solvent, 0.5 - 5 parts by weight of a surfactant, and 2 - 10 parts by weight of colloidal silica having a particle size of 2 - 50 nm and a concentration of 5 - 40% to form a solution including silica reverse micelles having a particle size of 10 - 100 nm;
(B) mixing and stirring 20 - 300 parts by weight, based on 100 parts by weight of the solid content of the colloidal silica, of a silane derivative in the solution including silica reverse micelles to surface-treat the silica reverse micelles; and (Q removing the organic solvent and surfactant from the solution including the surface-treated silica reverse micelles to produce porous silica particles.
[2] A method of producing a coating agent for antireflection coating, comprising:
(A) mixing and stirring an organic solvent, a surfactant, and colloidal silica having a particle size of 2 - 50 nm and a concentration of 5 - 40% to form a solution including silica reverse micelles having a particle size of 10 - 100 nm;
(B) mixing and stirring a silane derivative in the solution including silica reverse micelles to surface-treat the silica reverse micelles; and
(Q removing the organic solvent and surfactant from the solution including silica reverse micelles to produce porous silica particles having a particle size of
10 - 100 nm.
[3] The method of producing a coating agent for antireflection coating aαjording to claim 2, wherein, in the step (A), an amount of the colloidal silica is 2 - 10 parts by weight based on 100 parts by weight of the organic solvent.
[4] The method of producing a coating agent for antireflection coating aαjording to claim 2, wherein, in the step (A), an amount of the surfactant is 0.
5 - 5 parts by weight based on 100 parts by weight of the organic solvent. [5] The method of producing a coating agent for antireflection coating aαjording to claim 2, wherein, in the step (B), an amount of the silane derivative is 20 - 300 parts by weight based on 100 parts by weight of the solid content of the colloidal silica.
[6] The method of producing a coating agent for antireflection coating aαjording to claim 2, wherein the step (Q comprises:
(a) separating silica particles from the solution including silica reverse micelles obtained in the step (B);
(b) washing the silica particles obtained in the step (a) and then dispersing them in water or alcohol; and
(c) filtering and concentrating the solution obtained in the step (b) to form a silica particle solution having a concentration of 1 ~ 10%.
[7] The method of producing a coating agent for antireflection coating aαjording to claim 2, wherein the step (Q comprises:
(a) dispersing the solution including silica reverse micelles obtained in the step (B) in alcohol to form a silica-dispersed solution; and
(b) filtering and concentrating the silica-dispersed solution obtained in the step (a) to form a silica particle solution having a concentration of 1 ~ 10%.
[8] An antireflection film, which is used to prevent light from reflecting from a surface of a display, coated with the coating agent of claim 7.
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KR101489860B1 (en) * | 2009-02-05 | 2015-02-06 | (주)동아켐텍 | Preparatory method of tranparent film for antireflection effect |
KR101121207B1 (en) * | 2011-05-03 | 2012-03-22 | 윤택진 | Low-refractive anti-reflection coating composition having excellent corrosion resistance and producing method of the same |
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WO2013174754A2 (en) | 2012-05-22 | 2013-11-28 | Dsm Ip Assets B.V. | Composition and process for making a porous inorganic oxide coating |
WO2013174754A3 (en) * | 2012-05-22 | 2014-02-27 | Dsm Ip Assets B.V. | Composition and process for making a porous inorganic oxide coating |
CN104334652A (en) * | 2012-05-22 | 2015-02-04 | 帝斯曼知识产权资产管理有限公司 | Composition and process for making a porous inorganic oxide coating |
JP2015526531A (en) * | 2012-05-22 | 2015-09-10 | ディーエスエム アイピー アセッツ ビー.ブイ. | Compositions and methods for producing porous inorganic oxide coatings |
CN104334652B (en) * | 2012-05-22 | 2016-08-24 | 帝斯曼知识产权资产管理有限公司 | Manufacture compositions and the method for porous inorganic oxide coating |
US9550161B2 (en) | 2012-05-22 | 2017-01-24 | Dsm Ip Assets B.V. | Composition and process for making a porous inorganic oxide coating |
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US11400430B2 (en) | 2012-05-22 | 2022-08-02 | Covestro (Netherlands) B.V. | Hybrid organic-inorganic nano-particles |
WO2018192910A2 (en) | 2017-04-18 | 2018-10-25 | Dsm Ip Assets B.V. | Process for making an anti-soiling coating composition and a coating made therefrom |
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KR20080103215A (en) | 2008-11-27 |
KR100907357B1 (en) | 2009-07-10 |
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